A computer motherboard thermal cycle detection device

Abstract

The present invention relates to the technical field of detection devices, and specifically discloses a thermal cycle detection device for a computer motherboard, including a test chamber body, and further including: a detection component, which is arranged in the chamber, and the motherboard to be detected is installed on the detection component, and the detection component detects the deformation amount of the motherboard; an adjustment component, which is arranged in the chamber, and when the sizes of motherboards in different batches become larger, the adjustment component increases the size of the motherboard clamped by the detection component and simultaneously increases the detection range of the deformation degree of the motherboard by the detection component. Through the detection component, the present invention can detect the deformation of the computer motherboard, directly screen out the computer motherboards that do not meet the requirements, and through the adjustment component, it can be used in cooperation with the detection component to adjust the detection component according to the different lengths of the computer motherboards; through the auxiliary component, the detection component can be adjusted according to different temperature change ranges and different sizes of the motherboards.

Description

Technical Field

[0001] The present invention relates to the technical field of detection devices, and particularly to a thermal cycle detection device for a computer motherboard. Background Art

[0002] A thermal cycle detection device for a computer motherboard is a device specifically used to test the reliability and stability of a computer motherboard in an environment with temperature changes. This device helps detect the working performance and durability of the motherboard in such an environment by simulating an environment with drastic temperature changes. Therefore, a high and low temperature test chamber is usually used to detect the computer motherboard. A high and low temperature test chamber is a device that can simulate extreme temperature environments. By precisely controlling the temperature range and change rate, it provides strong support for the performance testing and reliability evaluation of various products. It can conduct high-temperature aging tests, low-temperature cold start tests, and temperature cycle tests on electronic components, circuit boards, etc., to ensure the stability of products in various environments.

[0003] When performing thermal cycle detection on a computer motherboard through a high and low temperature test chamber, the computer motherboard is placed in the high and low temperature test chamber and undergoes cyclic changes from high temperature to low temperature (or from low temperature to high temperature) to simulate the temperature changes that may be encountered in the actual use environment, so as to evaluate the performance, reliability, and adaptability of the computer motherboard at different temperatures and ensure that it can still work properly under various extreme temperature conditions. However, after completing the detection of multiple computer motherboards through the high and low temperature test chamber at the same time, the multiple computer motherboards will be taken out, and then each one will be inspected one by one to determine whether the computer motherboard meets the detection requirements. Such a one-by-one inspection of the circuit board after the test may affect the detection efficiency of the computer motherboard and may also be inconvenient for the inspectors to use. For this reason, we propose a thermal cycle detection device for a computer motherboard. Summary of the Invention

[0004] The purpose of the present invention is to provide a thermal cycle detection device for a computer motherboard to solve the problem proposed in the above background art that after completing the detection of multiple computer motherboards through a high and low temperature test chamber, the multiple computer motherboards will be taken out, and then each one will be inspected one by one to determine whether the computer motherboard meets the detection requirements. Such a one-by-one inspection of the circuit board after the test may affect the detection efficiency of the computer motherboard and may also be inconvenient for the inspectors to use.

[0005] To achieve the above purpose, the present invention provides the following technical solution: A thermal cycle detection device for a computer motherboard, comprising: a test chamber body, on which a chamber is provided,

[0006] It further comprises: a detection component, which is arranged in the chamber, and the motherboard to be detected is installed on the detection component, and the detection component detects the deformation amount of the motherboard;

[0007] Adjusting component, the adjusting component is arranged in the chamber. When the sizes of main boards in different batches increase, the adjusting component increases the size of the main board clamped by the detecting component, and at the same time increases the detection range of the deformation degree of the main board by the detecting component. When the sizes of main boards in different batches decrease, the adjusting component decreases the size of the main board clamped by the detecting component, and at the same time reduces the detection range of the deformation degree of the main board by the detecting component;

[0008] Auxiliary component, the auxiliary component is arranged in the chamber. When the temperature in the chamber rises, the auxiliary component synchronously increases the detection range of the deformation degree of the main board by the detecting component according to the size of the main board. When the temperature in the chamber drops, the auxiliary component synchronously reduces the detection range of the deformation degree of the main board by the detecting component according to the size of the main board.

[0009] Among them, the detecting component includes a mounting plate fixedly arranged on the inner side of the chamber of the test chamber body. A screw member is rotatably arranged on one side of the mounting plate, a guide rod is fixedly arranged on the other side of the mounting plate. A moving plate that is threadedly arranged on one side of the screw member and slidably arranged on the guide rod. A plurality of sliding brackets are fixedly arranged at equal intervals on the lower side of the moving plate. A clamping member is slidably arranged on the upper side of the sliding bracket. A plurality of clamping plates are fixedly arranged at equal intervals on one side of the mounting plate. A plurality of indicator lights are installed at equal intervals on the outer side of the moving plate.

[0010] Among them, support blocks are arranged on one side of the screw member and the guide rod where they are located relative to the moving plate. The support block on the screw member is rotatably arranged with the screw member, and the support block on the guide rod is fixedly arranged with the guide rod. The two support blocks are respectively fixedly arranged on the inner wall of the chamber of the test chamber body. A first spring is fixedly arranged between the clamping member and the moving plate. A pull rod member is rotatably arranged on the lower side of the clamping member. A convex block is fixedly arranged at one end of the pull rod member close to the clamping member.

[0011] Among them, a connecting plate is fixedly arranged on one side of the sliding bracket. Sliding members are slidably arranged on both sides of the connecting plate. Chutes adapted to the sliding members are opened on both sides of the connecting plate. The two sliding members slide along the two chutes respectively. Mounting blocks are fixedly arranged on the upper sides of the two sliding members. Switches electrically connected to the indicator lights are installed on one side of the two mounting blocks close to each other. A pressing block is arranged between the two mounting blocks. A fixing rod fixedly arranged with the clamping member is fixedly arranged on the upper side of the pressing block.

[0012] Among them, the adjusting component includes a stopper slidably arranged on the lower side of the sliding bracket. The stopper is located below the convex block. Guide grooves are symmetrically opened on both sides of the sliding bracket where the stopper is located. The stopper slides along the guide grooves. A second spring fixedly arranged with the sliding bracket is fixedly arranged on the lower side of the stopper.

[0013] Among them, a plurality of balls are movably arranged at equal intervals on the upper side of the stopper. A first conductive block is fixedly embedded on one side of the stopper close to the clamping member. A second conductive block is fixedly embedded on one side of the clamping member close to the stopper. An indicating rod is fixedly arranged on the outer side of the pull rod member.

[0014] Among them, a first rack is provided on one side of the sliding frame. On the lower side of the first rack, struts fixedly arranged on the bottom of the chamber of the test chamber body are symmetrically fixed. On one side of the first rack, a first gear is meshingly connected. On the upper side of the first gear, a second gear is fixedly arranged. In the middle of the first gear and the second gear, a connecting rod fixedly arranged at the bottom of the connecting plate is rotationally arranged.

[0015] Among them, on both sides of the second gear, second racks are meshingly connected. On one side of each of the two second racks, a pillar movably penetrating the connecting plate is fixedly arranged. The upper ends of the two pillars are respectively fixedly arranged with sliding members on both sides.

[0016] Among them, the auxiliary component includes two L-shaped plates respectively fixedly arranged on one side of the two sliding members. On one side of each of the two L-shaped plates, a metal strip is provided. On both sides of the metal strip, limiting balls are fixedly arranged. On the side of the mounting block and the L-shaped plate close to the metal strip, mounting grooves adapted to the limiting balls are provided. The limiting balls are movably arranged in the mounting grooves. On the lower side of each of the two mounting blocks, a limiting block is fixedly arranged. On the upper side of each of the two sliding members, a limiting groove adapted to the limiting block is provided. The limiting block slides along the limiting groove.

[0017] Among them, on one side of each of the two metal strips, a bracket is provided. On the upper and lower sides of the metal strip, a toothed block member is slidably arranged. A third spring is fixedly arranged between the toothed block member and the bracket. On the side of the two toothed block members close to each other, electromagnetic blocks are symmetrically fixedly arranged. The outer bracket is fixedly arranged with the connecting plate. The lower end of the inner bracket is fixedly arranged with a toothed condition slidably arranged with the connecting plate. A guiding groove adapted to the toothed condition is provided on the connecting plate. On one side of the toothed condition, a third gear is meshingly connected. On one side of the third gear, a fixed toothed block fixedly arranged with the connecting plate is meshingly connected. In the middle of the third gear, a support rod fixedly arranged with the inner sliding member is rotationally arranged.

[0018] The present invention has at least the following beneficial effects:

[0019] Through the detection component, the present invention can detect the deformation of the computer motherboard. If the deformation exceeds the high and low temperature tolerance of the computer motherboard, it means that the computer motherboard exceeds the allowable deformation limit range, indicating that the detection does not meet the requirements. Thus, the computer motherboards that do not meet the requirements can be directly screened out, and there is no need to check each computer motherboard one by one after the test is completed. Furthermore, the workload of the detection personnel can be effectively reduced, assisting the detection personnel in detecting the computer motherboard, improving the detection efficiency of the computer motherboard, facilitating the detection by the detection personnel. Through the adjustment component, it can be used in cooperation with the detection component to adjust the detection component according to the different lengths and sizes of the computer motherboards, so that the detection component can adapt to the detection of computer motherboards of different sizes; through the auxiliary component, it can assist the adjustment component in adjusting the detection component. During the detection process, the detection range of the detection component can be adjusted according to different temperature change ranges and different sizes of the computer motherboards to detect whether the deformation degree of the computer motherboard within different temperature change ranges meets the requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a schematic three-dimensional structure diagram of the present invention;

[0021] Figure 2 is a schematic structure diagram of the detection component and the adjustment component inside the chamber of the present invention;

[0022] Figure 3 is a schematic structure diagram of the connection between the clip and the clamping plate of the present invention;

[0023] Figure 4 is of the present invention Figure 3 is an enlarged schematic structure diagram of part A in;

[0024] Figure 5 is a schematic structure diagram of the connection between the sliding rack and the clip of the present invention;

[0025] Figure 6 is an exploded schematic structure diagram of the sliding rack and the clip of the present invention;

[0026] Figure 7 is a sectional schematic structure diagram of the sliding rack and the clip of the present invention;

[0027] Figure 8 is of the present invention Figure 7 is an enlarged schematic structure diagram of part B in;

[0028] Figure 9 is a schematic structure diagram of the clip, the pull rod member and the convex block of the present invention;

[0029] Figure 10 is a schematic structure diagram of the sliding rack and the clip of the present invention from another perspective;

[0030] Figure 11Schematic diagram of the connection between the first gear and the second gear of the present invention;

[0031] Figure 12 Schematic diagram of the explosion of the sliding member and the connecting plate of the present invention;

[0032] Figure 13 Schematic diagram of the auxiliary component in the second embodiment of the present invention;

[0033] Figure 14 Schematic diagram of another perspective of the auxiliary component of the present invention;

[0034] Figure 15 For the present invention Figure 14 Enlarged schematic diagram of the structure at C;

[0035] Figure 16 Schematic diagram of the explosion of the limiting ball and the installation groove of the present invention;

[0036] Figure 17 Schematic diagram of the sectional view of the bracket of the present invention.

[0037] In the figure: 11, test chamber body; 12, chamber; 13, box door; 2, detection component; 21, mounting plate; 22, screw member; 23, guide rod; 24, moving plate; 25, sliding frame; 26, clamping member; 27, clamping plate; 28, support block; 29, first spring; 210, connecting plate; 211, sliding member; 212, mounting block; 213, switch; 214, fixed rod; 215, pressing block; 216, tension rod member; 217, convex block; 218, sliding groove; 219, indicator light; 3, adjustment component; 31, stop block; 32, guiding groove; 33, second spring; 34, indicating rod; 35, first conductive block; 36, second conductive block; 37, ball; 38, first rack; 39, support rod; 310, first gear; 311, second gear; 312, connecting rod; 313, second rack; 314, support pillar; 4, auxiliary component; 41, L-shaped plate; 42, metal strip; 43, limiting ball; 44, installation groove; 45, limiting block; 46, limiting groove; 47, bracket; 48, tooth block member; 49, electromagnetic block; 410, third spring; 411, tooth condition; 412, orientation groove; 413, fixed tooth block; 414, third gear; 415, support bar. Detailed implementation manners

[0038] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0039] Embodiment 1

[0040] Please refer to Figures 1 to 17 , the present invention provides a technical solution: a computer motherboard thermal cycle detection device, including: a test chamber body 11, a chamber 12 is provided on the test chamber body 11, and a chamber door 13 is rotatably provided outside the chamber 12 of the test chamber body 11.

[0041] It further includes: a detection component 2, the detection component 2 is arranged in the chamber 12, the motherboard to be detected is installed on the detection component 2, and the detection component 2 detects the deformation amount of the motherboard.

[0042] An adjustment component 3, the adjustment component 3 is arranged in the chamber 12. When the sizes of different batches of motherboards increase, the adjustment component 3 increases the clamping size of the motherboard by the detection component 2, and at the same time increases the detection range of the deformation degree of the motherboard by the detection component 2. When the sizes of different batches of motherboards decrease, the adjustment component 3 reduces the clamping size of the motherboard by the detection component 2, and at the same time reduces the detection range of the deformation degree of the motherboard by the detection component 2.

[0043] An auxiliary component 4, the auxiliary component 4 is arranged in the chamber 12. When the temperature in the chamber 12 rises, the auxiliary component 4 synchronously increases the detection range of the deformation degree of the motherboard by the detection component 2 according to the motherboard size. When the temperature in the chamber 12 drops, the auxiliary component 4 synchronously reduces the detection range of the deformation degree of the motherboard by the detection component 2 according to the motherboard size.

[0044] When performing thermal cycle detection on a computer motherboard through the main body 11 of a high and low temperature test chamber, the chamber door 13 can be opened, the computer motherboard can be placed into the chamber 12 inside the test chamber main body 11, and the relevant parameters of the test chamber main body 11 can be set to detect the computer motherboard. During the detection process, if the high and low temperature tolerance of the computer motherboard is exceeded, the computer motherboard will undergo changes such as bending, swelling, softening, and shrinking. This indicates that the detection of the computer motherboard does not meet the requirements. Through the detection component 2, the deformation of the computer motherboard can be detected. If the high and low temperature tolerance of the computer motherboard is exceeded, the computer motherboard will exceed the allowable deformation limit range, indicating that the detection does not meet the requirements. Thus, the computer motherboards that do not meet the requirements can be directly screened out without having to check each computer motherboard one by one after the test is completed. This can effectively reduce the workload of the detection personnel, assist the detection personnel in detecting the computer motherboard, improve the detection efficiency of the computer motherboard, and facilitate the detection use of the detection personnel. Through the adjustment component 3, it can be used in cooperation with the detection component 2 to adjust the detection component 2 according to the different length dimensions of the computer motherboard, so that the detection component 2 can adapt to the detection of computer motherboards of different sizes; through the auxiliary component 4, it can assist the adjustment component 3 in adjusting the detection component 2. During the detection process, the detection range of the detection component 2 can be adjusted according to different temperature change ranges and the different sizes of the computer motherboard to detect whether the deformation degree of the computer motherboard within different temperature change ranges meets the requirements.

[0045] The detection component 2 includes a mounting plate 21 fixedly arranged on the inner side of the chamber 12 of the test chamber main body 11. A screw member 22 is rotatably arranged on one side of the mounting plate 21, and a guide rod 23 is fixedly arranged on the other side of the mounting plate 21. A moving plate 24 is threadedly arranged on one side of the screw member 22 and slidably arranged on the guide rod 23. A plurality of sliding brackets 25 are fixedly arranged at equal intervals on the lower side of the moving plate 24. A clamping member 26 is slidably arranged on the upper side of the sliding bracket 25, and the sliding bracket 25 can support and guide and limit the sliding of the clamping member 26. A plurality of clamping plates 27 are fixedly arranged at equal intervals on one side of the mounting plate 21. A plurality of indicating lights 219 are installed at equal intervals on the outer side of the moving plate 24. Each clamping member 26, clamping plate 27, and indicating light 219 correspond to each other. Clamping grooves are provided on the sides of the clamping member 26 and the clamping plate 27 that are close to each other to clamp and support the computer motherboard.

[0046] On one side of the moving plate 24, support blocks 28 are provided both on the screw member 22 and the guide rod 23. The support block 28 on the screw member 22 is rotatably arranged with the screw member 22, and the support block 28 on the guide rod 23 is fixedly arranged with the guide rod 23. The two support blocks 28 are respectively fixedly arranged with the inner wall of the chamber 12 of the test chamber body 11. The two support blocks 28 can respectively support the screw member 22 and the moving plate 24. A first spring 29 is fixedly arranged between the clamping member 26 and the moving plate 24. A pull rod member 216 is rotatably arranged on the lower side of the clamping member 26. A convex block 217 is fixedly arranged at one end of the pull rod member 216 close to the clamping member 26. The convex block 217 is eccentrically fixed with the pull rod member 216. The clamping member 26 is provided with a receiving groove at the position of the convex block 217. The convex block 217 is located in the receiving groove of the clamping member 26, and by rotating the pull rod member 216, the convex block 217 can rotate in the receiving groove of the clamping member 26;

[0047] When placing the computer main board into the chamber 12, the pull rod member 216 can be pulled outward. Through the convex block 217, the clamping member 26 is driven to slide outward along the sliding frame 25, and the first spring 29 is compressed. The computer main board is placed between the clamping member 26 and the clamping plate 27. Then the pull rod member 216 is released. Under the elastic force of the first spring 29, the two sides of the computer main board are clamped by the clamping member 26 and the clamping plate 27, and are located in the clamping grooves on the side where the clamping member 26 and the clamping plate 27 are close to each other, so as to firmly clamp the computer main board.

[0048] A connecting plate 210 is fixedly arranged on one side of the sliding frame 25. Sliding members 211 are slidably arranged on both sides of the connecting plate 210. Chutes 218 adapted to the sliding members 211 are provided on both sides of the connecting plate 210. The two sliding members 211 are respectively slidably arranged along the two chutes 218, which can play a role in guiding and limiting the sliding of the sliding members 211. Mounting blocks 212 are fixedly arranged on the upper sides of the two sliding members 211. Switches 213 electrically connected to the indicator lights 219 are installed on one side of the two mounting blocks 212 close to each other. A pressing block 215 is arranged between the two mounting blocks 212. A fixing rod 214 fixedly arranged with the clamping member 26 is fixedly arranged on the upper side of the pressing block 215;

[0049] During the detection process, if the high and low temperature tolerance of the computer motherboard is exceeded, the computer motherboard will undergo changes such as bending, swelling, softening, and shrinking. As a result, the size of the computer motherboard will become longer, causing the pressing clip 26 to move outward, or the size of the computer motherboard will become shorter. Under the elastic force of the first spring 29, the clip 26 will move closer to the clamping plate 27. Furthermore, the clip 26 will drive the fixed rod 214 and the pressing block 215 to move towards the mounting block 212 on one side. If the high and low temperature tolerance of the computer motherboard is exceeded, the deformation of the computer motherboard will exceed the allowable limit range. As a result, the switch 213 on one side will be pressed, causing the indicator light 219 corresponding to this computer motherboard to be powered on and lit. Therefore, after the test is completed, if the indicator light 219 corresponding to the computer motherboard is observed to be lit, it indicates that the detection of this computer motherboard does not meet the requirements. Thus, the computer motherboards that do not meet the requirements can be directly screened out, effectively reducing the workload of the detection personnel, facilitating the detection work of the detection personnel, and improving the detection efficiency.

[0050] The adjusting component 3 includes a stopper 31 slidably arranged on the lower side of the sliding frame 25. The stopper 31 is located below the convex block 217. Guide grooves 32 are symmetrically formed on both sides of the sliding frame 25 where the stopper 31 is located. The stopper 31 is slidably arranged along the guide grooves 32, which can play a role in guiding and limiting the up and down sliding of the stopper 31. A second spring 33 fixedly arranged with the sliding frame 25 is fixedly arranged on the lower side of the stopper 31. A plurality of balls 37 are movably arranged at equal intervals on the upper side of the stopper 31. The stopper 31 is provided with a spherical limiting groove adapted to the balls 37 at the position of the balls 37. The balls 37 are movably arranged in the spherical limiting groove on the stopper 31. A first conductive block 35 is fixedly embedded on the side of the stopper 31 close to the clip 26. A second conductive block 36 is fixedly embedded on the side of the clip 26 close to the stopper 31. The first conductive block 35, the second conductive block 36 and the indicator light 219 are electrically connected. Initially, under the elastic force of the second spring 33, the stopper 31 is located in the receiving groove of the clip 26 and abuts against the inner end of the receiving groove of the clip 26 close to the indicating rod 34. At this time, the first conductive block 35 is in contact with the second conductive block 36, and the indicator light 219 is powered on and lit; An indicating rod 34 is fixedly arranged on the outer side of the pull rod member 216. The indicating rod 34 can play an indicating role. When the indicating rod 34 faces upward, it means that the convex block 217 is located above the eccentric part of the pull rod member 216. On the contrary, when the indicating rod 34 faces downward, the convex block 217 is located below the eccentric part of the pull rod member 216. Thus, it is convenient to judge whether the convex block 217 presses the stopper 31 downward into the sliding frame 25;

[0051] When clamping computer motherboards of different lengths, to ensure the detection of computer motherboards, the screw member 22 can be rotated first to move the moving plate 24 away from the clamping plate 27, thereby driving multiple sliding frames 25 to move synchronously outward. Through the stopper 31, multiple clamping members 26 can be driven to move synchronously outward, so that the computer motherboard can be placed between the clamping member 26 and the clamping plate 27. First, place a computer motherboard between the clamping member 26 and the clamping plate 27, and rotate the screw member 22 in the reverse direction to move the moving plate 24, multiple sliding frames 25 and the clamping member 26 in the reverse direction. When the clamping member 26 moves to contact one side of the computer motherboard, as the screw member 22 continues to rotate, the other side of the computer motherboard will contact the clamping plate 27. At this time, if the screw member 22 is continued to be rotated, the clamping member 26 will not move further, and the first spring 29 will be further compressed. The stopper 31 will no longer abut against the inner end of the receiving groove of the clamping member 26 near the indicating rod 34, that is, the first conductive block 35 will be separated from the second conductive block 36, causing the indicator light 219 to turn off, indicating that the screw member 22 has been rotated excessively. At this time, the screw member 22 should be rotated in the opposite direction to move the moving plate 24 and multiple sliding frames 25 outward. When the stopper 31 moves outward to make the first conductive block 35 contact the second conductive block 36 again, the indicator light 219 is powered on and lights up, then stop rotating the screw member 22. At this time, the position adjustment of the moving plate 24 and the clamping member 26 is completed, so that after the adjustment is completed, the initial compression degree of the first spring 29 is the same, so that the clamping force for computer motherboards of different lengths is the same, to meet the detection of the deformation of the computer motherboard, and prevent the clamping force from being too large or too small, which affects the deformation detection of the computer motherboard;

[0052] Subsequently, rotate the pull rod member 216 downward by 180 degrees to drive the convex block 217 to rotate downward by 180 degrees, so that the convex block 217 presses the stopper 31 downward into the inner side of the sliding frame 25, so that the first conductive block 35 is separated from the second conductive block 36, so as not to affect the subsequent lighting of the indicator light 219 for detecting that the computer motherboard does not meet the requirements. At the same time, the stopper 31 can be moved downward out of the receiving groove under the clamping member 26 to not block the sliding of the clamping member 26 along the sliding frame 25 outward or inward. When the clamping member 26 slides outward or inward, the ball 37 on the upper side of the stopper 31 will roll along the bottom side of the clamping member 26 or the bottom side of the convex block 217, and both ends of the bottom side of the clamping member 26 are provided with protrusions, and the stopper 31 moves between the protrusions on both sides of the bottom of the clamping member 26; thus, when continuing to place multiple computer motherboards subsequently, only need to slightly pull the pull rod member 216 outward to move the clamping member 26 away from the clamping plate 27, so as to facilitate placing the computer motherboard between the clamping member 26 and the clamping plate 27, and then release the pull rod member 216 and rotate the pull rod member 216 downward to make the convex block 217 rotate downward to press the stopper 31 downward and move it to the inner side of the sliding frame 25.

[0053] On one side of the sliding frame 25, a first rack 38 is provided. Symmetrically fixed to the lower side of the first rack 38 are support rods 39 fixedly provided at the bottom of the chamber 12 of the test chamber body 11. One side of the first rack 38 is meshed with a first gear 310. Fixedly provided on the upper side of the first gear 310 is a second gear 311. Rotatably provided in the middle of the first gear 310 and the second gear 311 is a connecting rod 312 fixedly provided at the bottom of the connecting plate 210. The connecting rod 312 can play a role in supporting and stabilizing the first gear 310 and the second gear 311. Both sides of the second gear 311 are meshed with second racks 313. Fixedly provided on one side of each of the two second racks 313 is a support column 314 movably penetrating the connecting plate 210, and the support column 314 is slidably arranged through the connecting plate 210. The upper ends of the two support columns 314 are respectively fixedly provided with sliding members 211 on both sides;

[0054] When adjusting the positions of the moving plate 24 and the clamping member 26 by rotating the screw member 22, the outward movement of the moving plate 24, the sliding frame 25 and the clamping member 26 will drive the synchronous outward movement of the connecting plate 210, the fixed rod 214 and the pressing block 215, so that the first gear 310 rotates during the process of moving outward along the first rack 38, causing the second gear 311 to rotate. As a result, the two second racks 313 move relatively, causing the two support columns 314 and the sliding members 211 to move away from each other, and further driving the two mounting blocks 212 to move away from each other. For a computer motherboard with a larger length dimension, the allowable deformation limit range is larger than that of a computer motherboard with a smaller size. Therefore, the distance between the two mounting blocks 212 and the pressing block 215 can be adjusted according to different sizes of computer motherboards, so that the detection component 2 can be adapted to detect computer motherboards of different sizes through the adjustment component 3.

[0055] Embodiment 2

[0056] As Figures 13 to 17 shown, with other structures remaining unchanged, the difference from Embodiment 1 is:

[0057] The auxiliary component 4 includes two L-shaped plates 41 fixedly arranged on one side of each of the two sliding members 211, and the two L-shaped plates 41 are respectively located on the side of the two sliding members 211 close to the clamping plate 27, that is, on the inner sides of the two sliding members 211. Metal strips 42 are arranged on one side of the two L-shaped plates 41. Limit balls 43 are fixedly arranged on both sides of the metal strip 42. Mounting grooves 44 adapted to the limit balls 43 are arranged on the sides of the mounting block 212 and the L-shaped plate 41 close to the metal strip 42. The limit balls 43 are movably arranged in the mounting grooves 44. Limit blocks 45 are fixedly arranged on the lower sides of the two mounting blocks 212. Limit grooves 46 adapted to the limit blocks 45 are formed on the upper sides of the two sliding members 211. The limit blocks 45 on both sides slide along the limit grooves 46 on the two sliding members 211 respectively. That is, in this embodiment, the mounting block 212 is no longer fixedly arranged with the sliding member 211, but the mounting block 212 is slidably arranged along the limit groove 46 on the upper side of the sliding member 211 through the limit block 45. And initially, for the mounting block 212 on the side (inner side) close to the clamping plate 27, the limit block 45 fixed on its lower side is located at the outer end in the limit groove 46, so that the inner mounting block 212 can slide inwards through the limit block 45 and the outward sliding of the inner mounting block 212 is restricted. For the mounting block 212 on the side (outer side) far from the clamping plate 27, the limit block 45 fixed on its lower side is located at the inner end in the other limit groove 46, so that the outer mounting block 212 can slide outwards through the limit block 45 and the inward sliding of the outer mounting block 212 is restricted;

[0058] When detecting the computer motherboard through the main body 11 of the high and low temperature test chamber, the change in temperature will simultaneously cause the expansion and contraction of the metal strip 42. When the temperature rises, the end of the metal strip 42 far from the clamping plate 27 and away from the L-shaped plate 41 will elongate, pushing the outer mounting block 212 to move away from the pressure block 215. The computer motherboard also shows an outward expansion change, causing the clamping member 26 to drive the fixing rod 214 and the pressure block 215 to move closer to the outer mounting block 212. Conversely, when the temperature drops, the end of the metal strip 42 close to the clamping plate 27 and away from the L-shaped plate 41 will shorten. Through the limiting ball 43 and the mounting groove 44, the inner mounting block 212 can be pulled to move away from the pressure block 215. The computer motherboard also shows an inward contraction change. Under the elastic force of the first spring 29, the clamping member 26, the fixing rod 214 and the pressure block 215 move inward, that is, move closer to the inner mounting block 212. Thus, the distance between the two mounting blocks 212 and the pressure block 215 can be adjusted as an auxiliary according to different temperature change ranges to detect whether the deformation degree of the computer motherboard within different temperature change ranges meets the requirements. If during the detection process, the pressure block 215 presses against the switch 213, it means that the deformation degree of the computer motherboard within the temperature change range exceeds the allowable limit range, that is, the detection does not meet the requirements. At this time, the corresponding indicator light 219 will light up. The switch 213 can adopt a self-locking switch 213. When the temperature returns to normal and the metal strip 42 resumes, when the mounting block 212 and the pressure block 215 may separate, the switch 213 will not reset but keep the indicator light 219 powered on and lit to indicate that the detection of this computer motherboard does not meet the requirements. For the reset of the switch 213, after the computer motherboard test is completed and taken out, by moving the pull rod member 216 outward or inward, the clamping member 26, the fixing rod 214 and the pressure block 215 can be moved outward or inward so that the pressure block 215 presses against the switch 213 on one side again to reset the switch 213, and the closing of the corresponding indicator light 219 can be used as a guide for judgment.

[0059] On one side of each of the two metal strips 42, there are brackets 47. On the upper and lower sides of the metal strip 42, there are sliding tooth block members 48. A third spring 410 is fixedly arranged between the tooth block member 48 and the bracket 47. On the upper and lower sides of the metal strip 42, there are tooth grooves that cooperate with the tooth block member 48. Initially, the upper and lower tooth block members 48 are separated from the metal strip 42. On the symmetrically fixed sides of the two tooth block members 48 that are close to each other, there are electromagnetic blocks 49. After being energized, the electromagnetic blocks 49 on the upper and lower tooth block members 48 generate an attractive force on each other. The outer bracket 47 is fixedly arranged with the connecting plate 210. At the lower end of the inner bracket 47, there is a tooth condition member 411 that is slidably arranged with the connecting plate 210. On the connecting plate 210, there is a guiding groove 412 that is adapted to the tooth condition member 411. The tooth condition member 411 is slidably arranged along the guiding groove 412, which can play a role in positioning and guiding the movement of the tooth condition member 411. One side of the tooth condition member 411 is meshed with a third gear 414. One side of the third gear 414 is meshed with a fixed tooth block 413 that is fixedly arranged with the connecting plate 210. In the middle of the third gear 414, there is a support rod 415 that is rotatably arranged and fixedly arranged with the inner sliding member 211;

[0060] When detecting a computer motherboard with a relatively large length dimension, by adjusting the adjusting component 3, the struts 314 on both sides can move away from the sliding members 211, thereby driving the synchronous movement of the L-shaped plate 41, the metal strip 42 and the mounting block 212. When the outer metal strip 42 moves outward, the length of the outer metal strip 42 between the outer mounting block 212 and the upper and lower two toothed block members 48 on the outside can be made larger. When the inner sliding member 211, L-shaped plate 41, metal strip 42 and mounting block 212 move inward, through the support rod 415, the third gear 414 can be driven to move inward, and can rotate meshingly along the fixed toothed block 413, thereby driving the toothed bar 411 to move inward in multiples along the guiding groove 412, and further driving the inner bracket 47 and the toothed block members 48 on both sides thereof to move synchronously, so that the length of the inner metal strip 42 between the inner mounting block 212 and the upper and lower two toothed block members 48 on the inside can be made larger. After the computer motherboard is placed in the test chamber body 11 and the chamber door 13 is closed, when controlling the test chamber body 11 to work for detecting the computer motherboard, at the same time, the electromagnet 49 can be controlled to be energized, so that the electromagnets 49 on the toothed block members 48 on the upper and lower sides of the inner and outer two metal strips 42 generate mutually attracting forces respectively, causing the upper and lower two toothed block members 48 to move closer to each other, so that the upper and lower two toothed block members 48 are respectively clamped into the tooth grooves on the upper and lower sides of the metal strip 42. Thus, for a computer motherboard with a relatively large length dimension, after the metal strip 42 is clamped and fixed by the upper and lower two toothed block members 48, the length of the metal strip 42 between the mounting block 212 and the toothed block member 48 can be made larger. Therefore, when detecting, the effective length of the expansion and contraction change of the metal strip 42 can be made larger to adapt to the relatively large size of the computer motherboard, enabling the auxiliary component 4 to adjust the distance between the two mounting blocks 212 and the pressing block 215 according to different temperature change ranges and according to the size of the computer motherboard, that is, adjusting the detection range of the detection component 2 for the deformation degree of the motherboard; after the detection of the computer motherboard is completed, the test chamber body 11 stops working, and at the same time, the electromagnet 49 can be controlled to be powered off. Under the elastic force of the third spring 410, the upper and lower two toothed block members 48 move away from each other and disengage from the metal strip 42.

[0061] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device.

[0062] Although embodiments of the present invention have been shown and described, those of ordinary skill in the art will appreciate that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A computer motherboard thermal cycle detection device, comprising: A test box body (11), wherein the test box body (11) is provided with a chamber (12), The invention is characterized in that it further comprises: a detection component (2), the detection component (2) being arranged in the chamber (12), the mainboard to be detected being mounted on the detection component (2), the detection component (2) detecting the deformation amount of the mainboard, the detection component (2) comprising a sliding frame (25), a clamp (26) being slidably arranged on the upper side of the sliding frame (25); An adjusting component (3), wherein the adjusting component (3) is arranged in the chamber (12); when the size of the mainboards of different batches increases, the adjusting component (3) increases the size of the mainboards clamped by the detection component (2), and at the same time increases the detection range of the mainboard deformation degree of the detection component (2); when the size of the mainboards of different batches decreases, the adjusting component (3) decreases the size of the mainboards clamped by the detection component (2), and at the same time reduces the detection range of the mainboard deformation degree of the detection component (2); An auxiliary component (4), the auxiliary component (4) being arranged in the chamber (12); when the temperature in the chamber (12) increases, the auxiliary component (4) synchronously increases the detection range of the detection component (2) for the degree of deformation of the mainboard according to the size of the mainboard; when the temperature in the chamber (12) decreases, the auxiliary component (4) synchronously decreases the detection range of the detection component (2) for the degree of deformation of the mainboard according to the size of the mainboard; A connecting plate (210) is fixedly provided on one side of the sliding frame (25), sliding members (211) are slidably provided on both sides of the connecting plate (210), sliding grooves (218) adapted to the sliding members (211) are provided on both sides of the connecting plate (210), the two sliding members (211) are slidably provided along the two sliding grooves (218) respectively, mounting blocks (212) are fixedly provided on the upper sides of the two sliding members (211), switches (213) electrically connected to the indicator light (219) are installed on the sides of the two mounting blocks (212) close to each other, a pressing block (215) is provided between the two mounting blocks (212), and a fixing rod (214) fixedly provided on the upper side of the pressing block (215) and fixed to the clamp (26); The auxiliary component (4) comprises two L-shaped plates (41) respectively fixedly arranged on one side of the two sliding members (211); a metal strip (42) is arranged on one side of the two L-shaped plates (41); limiting balls (43) are fixedly arranged on both sides of the metal strip (42); a mounting groove (44) matching the limiting balls (43) is arranged on the mounting block (212) and the side of the L-shaped plate (41) close to the metal strip (42); the limiting balls (43) are movably arranged in the mounting groove (44); limiting blocks (45) are fixedly arranged on the lower sides of the two mounting blocks (212); limiting grooves (46) matching the limiting blocks (45) are opened on the upper sides of the two sliding members (211); and the limiting blocks (45) slide along the limiting grooves (46); A bracket (47) is provided on one side of the two metal strips (42); tooth blocks (48) are slidably provided on the upper and lower sides of the bracket (47) located on the metal strip (42); a third spring (410) is fixedly provided between the tooth block (48) and the bracket (47); an electromagnetic block (49) is symmetrically fixedly provided on the sides of the two tooth blocks (48) close to each other; the outer bracket (47) is fixedly provided with a connecting plate (210); and the lower end of the inner bracket (47) is fixedly provided with a third spring (410) connected to the tooth block (48). A toothed condition (411) is slidably arranged on the connecting plate (210), and an orientation groove (412) matching the toothed condition (411) is provided on the connecting plate (210); a third gear (414) is meshedly connected to one side of the toothed condition (411); a fixed tooth block (413) fixedly arranged to the connecting plate (210) is meshedly connected to one side of the third gear (414); a support rod (415) fixedly arranged to the inner sliding member (211) is rotatably arranged in the middle of the third gear (414).

2. The computer motherboard thermal cycle detection device according to claim 1, characterized in that: The detection assembly (2) comprises a mounting plate (21) fixedly arranged on the inner side of a chamber (12) of a test box body (11); a screw member (22) is rotatably arranged on one side of the mounting plate (21); a guide rod (23) is fixedly arranged on the other side of the mounting plate (21); a movable plate (24) is threadedly arranged on one side of the screw member (22) and is slidably arranged with the guide rod (23); the sliding frame (25) is fixedly arranged at equal intervals on the lower side of the movable plate (24); a clamping plate (27) is fixedly arranged at equal intervals on one side of the mounting plate (21); and indicator lights (219) are installed at equal intervals on the outer side of the movable plate (24).

3. The computer motherboard thermal cycle detection device according to claim 2, characterized in that: The screw member (22) and the guide rod (23) are both provided with a support block (28) on one side of the movable plate (24); the support block (28) on the screw member (22) is rotatably arranged with the screw member (22); the support block (28) on the guide rod (23) is fixedly arranged with the guide rod (23); the two support blocks (28) are respectively fixedly arranged with the inner wall of the chamber (12) of the test box body (11); a first spring (29) is fixedly arranged between the clamp (26) and the movable plate (24); a pull rod member (216) is rotatably arranged on the lower side of the clamp (26); and a protrusion (217) is fixedly arranged at one end of the pull rod member (216) close to the clamp (26).

4. The computer motherboard thermal cycle detection device according to claim 3, characterized in that: The adjustment assembly (3) comprises a stopper (31) slidably arranged on the lower side of the sliding frame (25), the stopper (31) being located on the lower side of the protrusion (217), the sliding frame (25) being symmetrically provided with guide grooves (32) on both sides of the stopper (31), the stopper (31) being slidably arranged along the guide grooves (32), and a second spring (33) fixedly arranged on the lower side of the stopper (31) and being fixedly arranged with the sliding frame (25).

5. The computer motherboard thermal cycle detection device according to claim 4, characterized in that: Ball bearings (37) are movably arranged at equal intervals on the upper side of the stop block (31); a first conductive block (35) is fixedly embedded on a side of the stop block (31) close to the clamp (26); a second conductive block (36) is fixedly embedded on a side of the clamp (26) close to the stop block (31); and an indicator rod (34) is fixedly arranged on the outer side of the pull rod (216).

6. The computer motherboard thermal cycle detection device according to claim 5, characterized in that: A first rack (38) is provided on one side of the sliding frame (25); a support rod (39) is symmetrically fixedly provided on the lower side of the first rack (38) and is fixedly provided on the bottom of the chamber (12) of the test box body (11); a first gear (310) is meshingly connected to one side of the first rack (38); a second gear (311) is fixedly provided on the upper side of the first gear (310); and a connecting rod (312) is rotatably provided in the middle of the first gear (310) and the second gear (311) and is fixedly provided on the bottom of the connecting plate (210).

7. The computer motherboard thermal cycle detection device according to claim 6, characterized in that: The second gear (311) is meshedly connected to the second racks (313) on both sides, and a support (314) movably penetrating the connecting plate (210) is fixedly provided on one side of the two second racks (313), and the upper ends of the two support (314) are respectively fixedly provided to the sliding members (211) on both sides.

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