Circuit board test terminal

Abstract

The invention relates to a circuit board test terminal. Provided is a circuit board test terminal including a board portion and an extension portion extending from the board portion and connected to a test point of the circuit board, in which the board portion includes: a board unit supporting a lower portion; a partition unit divided into a plurality of compartments on the plate unit and formed to a predetermined height; and a terminal unit, which is provided in the divided compartments, and which is in contact with a test probe for testing the circuit board.

Description

Technical Field

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to Korean Patent Application No. 10-2022-0133602, filed on October 17, 2022, which is incorporated herein by reference in its entirety. Technical Field

[0003] The invention relates to a circuit board test terminal, in particular to a terminal used for testing electronic components assembled with a circuit board. Background Art

[0004] Printed circuit boards (PCBs) are essential components for almost every electronic device, and are wired and arranged on an insulating board so that the circuit connects the electrical / electronic components. PCBs each have a structure in which conductors and insulators are stacked in the form of a board, and a plurality of electrical / electronic components such as semiconductors, capacitors, or resistors can be mounted thereon. The mounted electrical / electronic components can be electrically connected to each other through the wire circuits printed on the PCB. In the PCB, the wires can be efficiently designed to reduce the size of the electronic device, and to improve its performance and productivity.

[0005] The plurality of electrical / electronic components mounted on the PCB can transmit or receive electrical signals. However, when the amount of electrical signals to be transmitted or received increases or when high-speed signal processing is required, a phenomenon of reduced signal processing speed occurs, which leads to performance degradation of the PCB. In order to solve the problem of reduced signal processing speed, methods such as increasing the number of layers of the PCB to increase the accommodating capacity of the components are used.

[0006] At the same time, since it is difficult to visually check whether the electronic components such as semiconductors, capacitors or resistors mounted on the PCB are correctly mounted on the PCB, a separate test device can be used to test whether the electronic components are operating normally. When the test device is one, the worker can immediately test with both hands in the following manner: by grasping the test probe with one hand so that the test probe contacts the target point on the circuit board, and grasping the grounding probe with the other hand so that the grounding probe contacts the grounding point on the circuit board. However, if there are various types of test devices, the use of the test device to test one by one as described above will cause the problem of spending a lot of time to perform the test, and the result of the test device output cannot be seen at a glance. In addition, when the test probes are connected to the test points set on the PCB respectively by using methods such as welding to connect various types of test devices to the target points on the circuit board at one time to perform the test at one time, there is a problem that the probes may contact each other to cause an electrical short circuit, and a separate process is performed after the test is performed to remove the test probes that have been connected by welding, etc., which is inconvenient.

[0007] Therefore, technological development is needed to solve the above problems. Summary of the invention

[0008] Technical Solution

[0009] The object of the present invention for solving the above-mentioned problems is to provide a circuit board test terminal which can be tested quickly at one time without causing electrical short circuits between various types of test equipment when electronic components, circuits, etc. mounted on the circuit board are tested for correct operation.

[0010] Technical Solution

[0011] As one embodiment of the present invention, the present invention provides a circuit board test terminal, which includes a board portion and an extension portion, wherein the extension portion extends from the board portion to connect to a test point of a circuit board, wherein the board portion includes: a board unit, which supports a lower portion; a partition unit, which is arranged on the board unit to divide the board unit into a plurality of areas and has a predetermined height; and a terminal unit, which is arranged on each divided area, wherein a test probe for testing the circuit board contacts the terminal unit.

[0012] A retaining groove having a predetermined depth may be defined in an upper end of the partition unit along an edge of the partition unit.

[0013] An inclined guide groove may be defined in a top surface of the terminal unit, wherein the inclined guide groove is a groove having a predetermined inclination so as to be inclined toward a holding groove defined in a separation unit adjacent thereto.

[0014] A vertical guide groove into which an end of the test probe is vertically inserted may be defined in the terminal unit.

[0015] A vertical guide groove may be defined in a central portion of the terminal unit.

[0016] The separation unit may include an electrically insulating material.

[0017] The extending portion may include an extending unit, wherein one end of the extending unit is connected to the terminal unit, and a coupling unit is coupled to the other end of the extending unit and coupled to the test point.

[0018] The coupling unit may be detachable from and coupled to the extending unit.

[0019] The coupling unit may have an annular end.

[0020] The extension unit may be provided in plurality, one end of each of the plurality of extension units may be connected to a different terminal unit, and the connection unit may be connected to the other end of each of the extension units so as to be connected to a plurality of test points.

[0021] The circuit board test terminal may further include a connection unit electrically connecting the terminal unit to the extending unit, wherein the connection unit is coupled to one side of the terminal unit.

[0022] As another embodiment of the present invention, the present invention may include a circuit board test terminal and a test device, the test device including a test probe and a grounding probe, wherein the test probe has an end that contacts the circuit board test terminal, and the grounding probe is connected to a circuit board to be grounded, wherein the circuit board test terminal includes a board portion and an extension portion, the extension portion extends from the board portion to connect to a test point of the circuit board, wherein the board portion includes: a board unit that supports a lower portion; a partition unit that is arranged on the board unit to divide the board unit into a plurality of areas and has a predetermined height; and a terminal unit that is arranged on each divided area, wherein a test probe for testing the circuit board contacts the terminal unit.

[0023] Beneficial effects

[0024] According to the present invention, when an electronic component mounted on a circuit board is tested whether it operates normally, various types of test equipment can be simply connected to perform the test at one time, thereby quickly performing the test. The test can be performed at one time by various types of test equipment to easily compare the values ​​measured by the test equipment. In addition, even after the test is performed, the test equipment required to perform the test can be quickly separated. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a schematic plan view showing a plate portion according to the present invention.

[0026] Figure 2 is shown as the test probe remains on Figure 1 A perspective view of the state of each of the inclined guide grooves and the retaining grooves in part A of FIG.

[0027] Figure 3 (a) shows the Figure 1 A schematic cross-sectional view taken along line BB' in FIG. Figure 3 (b) shows the Figure 1 Schematic cross-sectional view taken along line CC' in FIG.

[0028] Figure 4is a schematic perspective view showing a state in which a terminal unit and an extension portion are connected to each other through a connection unit according to the present invention.

[0029] Figure 5 (a) to (d) are schematic diagrams illustrating a coupling unit according to various embodiments of the present invention.

[0030] Figure 6 is a schematic perspective view showing a state in which an extending portion according to the present invention is connected to an electronic component mounted on a circuit board.

[0031] Figure 7 is a schematic plan view showing a circuit board testing assembly according to an embodiment of the present invention. DETAILED DESCRIPTION

[0032] Hereinafter, the preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art to which the present invention belongs can easily perform the present invention. However, the present invention can be implemented in different forms and should not be construed as being limited to the embodiments set forth herein.

[0033] In order to clearly describe the present invention, parts that are irrelevant to the description or detailed description of related well-known technologies that may unnecessarily obscure the subject matter of the present invention will be excluded. Throughout the specification, the same reference numerals denote the same elements.

[0034] Furthermore, the terms or words used in the present specification and claims should not be restrictively interpreted as ordinary meanings or dictionary-based meanings, but should be interpreted as meanings and concepts consistent with the scope of the present invention, based on the principle that the inventor can appropriately define the concepts of the terms in order to best describe and explain his or her invention.

[0035] Circuit board test terminals (10)

[0036] As an embodiment of the present invention, the present invention relates to a circuit board test terminal 10 (hereinafter referred to as “test terminal”), which may include a plate portion 100 and an extension portion 150 .

[0037] The board part 100 is a component to which the test probe 210 is connected, and the board part 100 may include a board unit 110 , a separation unit 120 , and a terminal unit 130 .

[0038] The board unit 110 may have a flat shape having a predetermined area and thickness, and provide a bottom of the test terminal 10 .

[0039] The planar shape of the panel unit 110 may be, for example, a rectangle, a circle, etc., but is not limited thereto.

[0040] The board unit 110 may be disposed below the separation unit 120 and the terminal unit 130 .

[0041] The board unit 110 may be made of an electrically insulating material to prevent current from flowing between the lower portion of the board unit 110 and the terminal unit 130. Therefore, the board unit 110 may prevent electrical noise from being introduced into the terminal unit 130 from the lower portion of the board unit 100 even when the board portion 100 moves to any position.

[0042] The partition unit 120 may be a wall having a small thickness, which is disposed on the top surface of the board unit 110 and disposed in a direction perpendicular to the top surface to divide the board unit 110 into a plurality of regions.

[0043] The separation unit 120 may be made of an electrically insulating material to shield the plurality of terminal units 130 from each other, thereby preventing a short circuit from occurring.

[0044] As an embodiment, the partition unit 120 may include a horizontal portion 120 a and a vertical portion 120 b .

[0045] The horizontal portion 120 a may be disposed parallel to the top surface of the board unit 110 and an edge of one surface of the board unit 110 , and divide the top surface of the board unit 110 into a plurality of regions.

[0046] The horizontal portion 120 a may be provided in one or more, and a plurality of the horizontal portions 120 a may be provided on the top surface of the board unit 110 according to a predetermined interval or arrangement.

[0047] The vertical portion 120 b may be disposed in a direction perpendicular to the horizontal portion 120 a , or disposed to cross the horizontal portion 120 a at a predetermined angle.

[0048] The partition unit 120 defines a holding groove 121 at an upper end thereof.

[0049] The holding groove 121 may be a groove having a predetermined depth, which is provided along the edge of the upper end of the partition unit 120 in at least a partial region of the edge.

[0050] The shape of the holding groove 121 may be, for example, a facet shape, a curved shape, etc., but is not limited thereto.

[0051] The test probe 210 can be held in the holding groove 121. Since one end of the test probe 210 contacts the terminal unit 130 and the side surface portion of the test probe 210 contacts the holding groove 121, the test probe 210 can be held in the holding groove 121 while forming a predetermined angle at one time. The circuit board can be tested by the test probe 210 held in the holding groove 121, and when the test probe 210 is held in the holding groove 121, the worker can perform other work, thereby improving work efficiency.

[0052] The terminal unit 130 may be disposed in each region divided by the partition unit 120 on the board unit 130 .

[0053] The terminal unit 130 may include a conductive metal material so as to be in contact with the test probe 210 and electrically connected to the test probe 210. For example, the conductive metal material may be copper, aluminum, gold, silver, or the like.

[0054] The terminal unit 130 may have an area and a shape corresponding to the shape of the area divided by the separation unit 120 .

[0055] The terminal unit 130 may be provided in a plate shape having a predetermined thickness and width in order to solve the inconvenience caused by a test in which the test probe 210 is in direct contact with the pins, etc. of a very small electronic component 320 mounted on the circuit board 300 according to the related art. Therefore, a worker may individually contact the test probe 210 with the terminal unit 130 to obtain the same effect as when the test probe 210 is in direct contact with the pins, printed circuits, etc. of the very small electronic component 320 connected to the terminal unit 130 through the extension 150. In addition, the test may be simply performed to significantly improve work efficiency.

[0056] An inclined guide groove 131 and a vertical guide groove 132 may be defined in the terminal unit 130 .

[0057] Reference Figure 2 and Figure 3 (b) The end of the test probe 210 may be inserted into the inclined guide groove 131 to increase the contact area between the test probe 210 and the terminal unit 130 and provide an inclination in the setting direction of the test probe 210 so that the test probe 210 is held in the holding groove 121 .

[0058] The inclined guide groove 131 may be defined to be spaced apart from the partition unit 120 by a predetermined distance on the top surface of the terminal unit 130 , and may be disposed closer to an edge of the terminal unit 130 than the vertical guide groove 132 .

[0059] Reference Figure 2 and Figure 3(b), the inclined guide groove 131 may have a predetermined inclination so that a virtual center line connecting the center of the open top surface of the inclined guide groove 131 and the vertex of the lower end thereof faces the holding groove 121. Therefore, since the end of the test probe 210 is inserted into the inclined guide groove 131 and its side portion is held in the holding groove 121, the test probe 210 can stand at a predetermined angle. That is, the inclined guide groove 131 and the holding groove 210 corresponding to the inclined guide groove 131 can be arranged to be close to each other at a certain distance, so that the test probe 210 is easily held.

[0060] The inclined guide groove 131 may be provided in plurality to be provided along the edge of the terminal unit 130. When a plurality of inclined guide grooves 131 are provided, multiple types of test probes 210 measuring different values ​​from each other may be inserted into different inclined guide grooves 131 in one terminal unit 130 at one time, and the value of the same electronic component 320 electrically connected to the terminal unit 130 may be measured at one time.

[0061] Since the end of the test probe 210 is inserted into and fixed to the inclined guide groove 131 , the position of the test probe 210 held in the holding groove 121 can also be stably fixed.

[0062] refer to Figure 3 (a), the vertical guide groove 132 may be defined in the central portion of the top surface of the terminal unit 130. The vertical guide groove 132 may be disposed such that a virtual center line connecting the center of the open top surface of the vertical guide groove 132 to the vertex of the lower end thereof faces the center of the open top surface.

[0063] Compared with the inclined guide groove 131, the vertical guide groove 132 can have a deeper depth, and the open top surface of the vertical guide groove 132 can have a smaller area, so that when the end of the test probe 210 is inserted into the vertical guide groove 132, even if the test probe 210 is not held in the retaining groove 121, the test probe 210 stands in a direction perpendicular to the top surface of the terminal unit 130.

[0064] Since the vertical guide groove 132 and the inclined guide groove 131 are defined in one terminal unit 130, multiple types of test probes 210 measuring different values ​​from each other can be inserted into the inclined guide groove 131 and the vertical guide groove 132 at one time, respectively, and the value of the same electronic component 320 electrically connected to the terminal unit 130 can be measured at one time.

[0065] The vertical guide groove 132 and the inclined guide groove 131 may be spaced apart from each other by a predetermined distance so that the test probes 210 respectively inserted into the vertical guide groove 132 and the inclined guide groove 131 do not contact each other. When contact occurs between the test probes 210, current may even flow between the test probes 210 to cause an electrical short circuit problem. Since the vertical guide groove 132 and the inclined guide groove 131 are spaced apart from each other by a predetermined distance to separate the test probes 210, the above problem may be prevented.

[0066] Since the end of the test probe 210 is inserted into the vertical guide groove 132 and its position is fixed, the position of the test probe 210 can also be stably fixed.

[0067] The connection unit 140 may be disposed on one side of the terminal unit 130 and connect the terminal unit 130 to the extension part 150 .

[0068] The connection unit 140 may be coupled to the one side of the terminal unit 130. The coupling method may be, for example, a method of welding the lower end of the connection unit 140 to one side of the top surface of the terminal unit 130; threading the connection unit 140 to one side of the terminal unit 130 by a screw thread provided on the body of the connection unit 140, etc. However, the coupling method is not limited thereto.

[0069] The connection unit 140 may electrically connect the terminal unit 130 to the extension 150. The connection unit 140 may include a conductive metal material to electrically connect the terminal unit 130 to the extension 150. For example, the connection unit 140 may include copper, aluminum, silver, gold, or tungsten, but is not limited thereto.

[0070] Reference Figure 4 , the connection unit 140 may include a body portion 141 disposed in a direction perpendicular to the top surface of the terminal unit 130 and a head portion 142 disposed on an upper end of the body portion 141. The body portion 141 may have a shape such as a cylinder, a rectangular column, or a faceted column, and is coupled to the extension unit 151 of the extension portion 150 so that the terminal unit 130 is coupled to the extension portion 150.

[0071] The extending portion 150 may include an extending unit 151 and a coupling unit 152 .

[0072] The extension portion 150 may freely space the board portion 100 from the circuit board 300 , so that the electronic components 320 and the like mounted on the circuit board 300 are tested using the test device 200 regardless of the position.

[0073] The extension unit 151 may have one end connected to the terminal unit 130 and the other end connected to the coupling unit 152. Specifically, the one end of the extension unit 151 may be connected to a body portion of the coupling unit 140 coupled to the terminal unit 130.

[0074] Reference Figure 4 , an annular structure made of a conductive metal material may be provided on one end of the extension unit 151. The annular structure may hook the body portion 141 of the connection unit 140 to quickly connect the extension unit 151 to the connection unit 140.

[0075] The extension unit 151 may include an extension line extending in a direction from the annular structure provided on the one end to the other end. The extension line may include a metal layer (not shown) made of a conductive material and an electrical insulation layer (not shown), wherein the metal layer is connected to the annular structure provided on the one end of the extension unit 151, and the electrical insulation layer is coated with an electrical insulation material in its longitudinal direction on the outer surface of the metal layer. The material of each of the metal layer and the electrical insulation layer of the extension line may be a plastic deformation material that is easily bent when subjected to force or has a curved surface provided thereon. For example, the material of the metal layer may be copper, aluminum, etc., and the material of the electrical insulation layer may be natural rubber, synthetic rubber, synthetic resin, etc.

[0076] The coupling unit 152 may be coupled to the other end of the extension unit 151 .

[0077] The coupling unit 152 may be coupled to the extension unit 151 through a detachable and coupleable structure.

[0078] The coupling unit 152 may include: a coupling portion 153; a support 154; and one of the ring portions 152a, 152b, 152c, and 152d.

[0079] A coupling portion 153 that can be coupled to the other end of the extension unit 151 may be provided on one end of the coupling unit 152. The coupling portion 153 may be, for example, a bolt, etc., and may be coupled to the other end of the extension unit 151 by a detachable and coupleable bolt coupling.

[0080] The support member 154 may be provided with a coupling portion 153 at one end and a ring portion 152a, 152b, 152c and 152d at the other end.

[0081] The support member 154 may be provided in the form of a faceted column, such as a rectangular column, a pentagonal column, etc. Since the support member 154 has the shape of a faceted column, the support member 154 may be stably positioned without rolling on the circuit board 300. Therefore, the position where each of the ring portions 152a, 152b, 152c, and 152d is coupled to the electronic component 320 on the circuit board 300 and the position adjacent thereto may be stably supported.

[0082] Since the support member 154 includes an electrically insulating material, even when the support member 154 is in contact with other printed circuits or the like on the circuit board 300 , current may not be allowed to flow to the coupling unit 152 through the support member 154 .

[0083] In the following, reference will be made to Figure 5 The ring portions 152a, 152b, 152c, and 152d are described according to various embodiments.

[0084] refer to Figure 5 (a) and Figure 6 As one embodiment of the present invention, the first ring portion 152a may be provided on the other end of the coupling unit 152. The first ring portion 152a may have a shape in which its outer circumference is at most half of the outer circumference of a circular ring. However, the first ring portion 152a is not limited to a circular ring, and may have the shape of an elliptical ring or other closed curved rings. The first ring portion 152a may have a structure that can be easily hooked with the pins of the electronic components 320 of the circuit board 300, etc., so that the first ring portion 152a is quickly connected. The first ring portion 152a may be made of a conductive metal material, and its outer surface except the inner surface of the ring in contact with the pin may be coated with an electrically insulating material to prevent a short circuit due to contact with another pin adjacent to the pin.

[0085] refer to Figure 5 (b), as another embodiment of the present invention, a second ring portion 152b may be provided on the other end of the coupling unit 152. The second ring portion 152b may have a circular ring shape. The second ring portion 152b may be made of a conductive metal material, and its outer surface except the inner surface of the circular ring that contacts the pin of the electronic component 320 may be coated with an electrically insulating material to prevent a short circuit caused by contact with another pin adjacent to the pin.

[0086] refer to Figure 5(c), as another embodiment of the present invention, a third ring portion 152c may be provided on the other end of the coupling unit 152. The third ring portion 152c may have a "V" or "Y" ring shape. The third ring portion 152c may be made of a conductive metal material, and its outer surface except the inner surface of the "V" or "Y" ring contacting the pin of the electronic component 320 may be coated with an electrically insulating material to prevent a short circuit caused by contact with another pin adjacent to the pin.

[0087] refer to Figure 5 (d), as another embodiment of the present invention, a fourth ring portion 152d may be provided on the other end of the coupling unit 152. The fourth ring portion 152d may have a shape in which its outer circumference is greater than half of the outer circumference of a circular ring. However, the fourth ring portion 152d is not limited to a circular ring, and may have the shape of an elliptical ring or other closed curved ring. The fourth ring portion 152d may be made of a conductive metal material, and its outer surface, except for the inner surface of the ring that contacts the pin of the electronic component 320, may be coated with an electrically insulating material to prevent a short circuit due to contact with another pin adjacent to the pin.

[0088] Circuit board test kit 20

[0089] Reference Figure 7 , the circuit board test assembly 20 may include a circuit board test terminal 10 and a test device 200. The test device 200 may include a test probe 210 and a grounding probe 220, one end of which contacts the terminal unit 130 of the circuit board test terminal 10, and one end of which is connected to the grounding point 310 of the circuit board 300 for grounding.

[0090] Since the ground probe 220 is grounded, the test apparatus 200 can set a reference value for a value measured by the test probe 210 and reduce noise introduced into the test probe 210. Therefore, the reliability of the value measured by the test probe 210 can be improved.

[0091] The test probe 210 may come into contact with the terminal unit 130 to test whether the electronic component 320 , the printed circuit, etc., which are electrically connected to the circuit board test terminal 10 , operate normally on the circuit board 300 .

[0092] The circuit board 300 may include various types of circuit boards, such as a printed circuit board (PCB), a flexible printed circuit board (FPCB), a rigid-flexible printed circuit board (RF-PCB), and a high density interconnect (HDI) board, and preferably, the circuit board 100 may be a PCB circuit board. However, the circuit board 100 is not limited thereto.

[0093] Each electronic component 320 in which a circuit is printed by printed electronics may be mounted at a predetermined position on the circuit board 300 .

[0094] The detailed description of the circuit board test terminal 10 may be replaced with the above contents.

[0095] Although the present invention has been described with reference to limited embodiments and drawings, the present invention is not limited thereto and may be variously implemented by those skilled in the art to which the present invention pertains within the technical concept of the present invention and equivalents of the appended claims.

[0096] Reference numerals list

[0097] 10: Circuit board test terminal

[0098] 20: Circuit board test assembly

[0099] 100: Board

[0100] 110: Plate element

[0101] 120: Separation unit

[0102] 120: Horizontal

[0103] 120: vertical part

[0104] 121 Keep Groove

[0105] 130: Terminal unit

[0106] 131 inclined guide groove

[0107] 132: Vertical guide groove

[0108] 140: Connection unit

[0109] 150: Extension

[0110] 151: Extension unit

[0111] 152: Connection unit

[0112] 200: Test equipment

[0113] 210: Test probe

[0114] 300: Circuit board

[0115] 310: Grounding point

[0116] 320: Electronic components

Claims

1. A circuit board test terminal, comprising: Plate Department; as well as an extension portion extending from the plate portion to be connected to a test point of a circuit board, Wherein, the plate portion comprises: a plate unit configured to support the lower portion; a partition unit provided on the plate unit to divide the plate unit into a plurality of regions and having a predetermined height; and a terminal unit, wherein the terminal unit is arranged on each of the divided areas, A test probe contacts the terminal unit, and the test probe is configured to test the circuit board.

2. The circuit board test terminal according to claim 1, wherein: A retaining groove having a predetermined depth is defined at an upper end of the partition unit along an edge of the partition unit.

3. The circuit board test terminal according to claim 2, wherein: An inclined guide groove is defined on a top surface of the terminal unit, the inclined guide groove being a groove having a predetermined inclination so as to be inclined toward a holding groove defined in the separation unit adjacent thereto.

4. The circuit board test terminal according to claim 1, wherein: A vertical guide groove is defined in the terminal unit, and one end of the test probe is vertically inserted into the vertical guide groove.

5. The circuit board test terminal according to claim 4, wherein: The vertical guide groove is defined in a central portion of the terminal unit.

6. The circuit board test terminal according to claim 1, wherein: The separation unit includes an electrically insulating material.

7. The circuit board test terminal according to claim 1, wherein: The extension portion comprises: An extension unit, one end of which is connected to the terminal unit; A connecting unit is connected to the other end of the extending unit and connected to the testing point.

8. The circuit board test terminal according to claim 7, wherein: The coupling unit is detachable from and coupleable to the extending unit.

9. The circuit board test terminal according to claim 7, wherein: The coupling unit has a ring-shaped end.

10. The circuit board test terminal according to claim 7, wherein: The extension unit is provided in plurality, one end of each of the plurality of extension units is connected to a different terminal unit, and The coupling unit is coupled to the other end of each of the extending units to couple a plurality of test points.

11. The circuit board test terminal according to claim 7, further comprising a connection unit configured to electrically connect the terminal unit to the extension unit, in, The connection unit is coupled to one side of the terminal unit.

12. A circuit board testing assembly, comprising: Circuit board test terminals; and A test device, the test device comprising a test probe and a grounding probe, wherein one end of the test probe contacts the circuit board test terminal, and the grounding probe is connected to the circuit board to be grounded, Wherein, the circuit board test terminal comprises: Plate; and an extension portion extending from the plate portion to be connected to a test point of a circuit board, Wherein, the plate portion comprises: a plate unit configured to support the lower portion; a partition unit provided on the plate unit to divide the plate unit into a plurality of regions and having a predetermined height; and a terminal unit, wherein the terminal unit is arranged on each of the divided areas, A test probe contacts the terminal unit, and the test probe is configured to test the circuit board.

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