Method and system for testing performance of hybrid integrated photonic chip

Abstract

The invention relates to the technical field of performance testing, in particular to a performance testing method and system for a hybrid integrated photonic chip, and the method specifically comprises the steps: firstly constructing a trend consistency factor of a same temperature data set according to the temperature change trend of the same temperature data in different states in a previous period of time; constructing a current consistency factor according to the consistency of the light source driving current data corresponding to the same temperature data group; and finally, calculating an average value of the accurate optical power data in each optical power data sequence, representing the accurate optical power in each state by the average value, reducing optical power deviation caused by instability of a light source, and calculating the polarization dependent loss of the photon chip by using the accurate optical power in each state. The measurement accuracy of the polarization dependent loss is improved, and the problem that the performance test precision of the photon chip is affected due to the deviation of the collection of the optical power caused by the instability of the light source is avoided.

Description

Technical Field

[0001] The present application relates to the technical field of performance testing, and in particular to a performance testing method and system for a hybrid integrated photonic chip. Background Art

[0002] Hybrid integrated photonic chip is a new type of optoelectronic integrated chip that integrates photonic devices and electronic devices on the same chip. It realizes high-speed data transmission and processing, and has the advantages of high speed, low power consumption, and small size. Performance testing in the production process of photonic chips is crucial to controlling product quality.

[0003] Polarization-dependent loss (PDL) is one of the important indicators in the performance test of photonic chips. The polarization-dependent loss of a photonic chip refers to the maximum change in the output optical power of each output port of the photonic chip during the 360° change of the polarization state of the transmitted optical signal. It is a parameter that measures the sensitivity of the device to the polarization state of the transmitted optical signal. In practical applications, since the change of the polarization state of the optical signal often occurs, the device is required to have a sufficiently small polarization-dependent loss, otherwise it will directly affect the use effect of the photonic chip. Common PDL measurement methods include scrambling / scanning measurement method, maximum / minimum search method and Mueller matrix method. Among them, the maximum / minimum search method needs to traverse each polarization state, which takes a lot of time and has low efficiency; the Mueller matrix method measures the input and output light transmission characteristics under four different polarization states, obtains a matrix after calculation, and then calculates the polarization-dependent loss value according to the matrix. Although this method is efficient, it has low accuracy. In addition, in the process of measuring polarization-dependent loss, the instability of the light source will affect the measurement accuracy of polarization-dependent loss. Therefore, a method that can accurately measure the polarization-dependent loss of a photonic chip is needed. Summary of the invention

[0004] In order to solve the above technical problems, the purpose of this application is to provide a performance testing method and system for a hybrid integrated photonic chip. The technical solutions adopted are as follows: In a first aspect, an embodiment of the present application provides a performance testing method for a hybrid integrated photonic chip, the method comprising the following steps: Obtaining optical power data at each time in each state, temperature data of components inside the light source, and driving current data of the light source; wherein each state includes a state of being connected to the photon chip to be tested and a state of being not connected to the photon chip to be tested under each polarization state; constructing an optical power data sequence and a temperature data sequence in each state; Constructing each same temperature data group based on the occurrence of temperature values ​​in all temperature data sequences; analyzing the change of adjacent data of each temperature data in the temperature data sequence, and constructing the trend consistency factor of each same temperature data group based on the difference between the adjacent data change of different temperature data in the same temperature data group; Based on the mode and variance of the driving current corresponding to all the temperature data in the same temperature data group, a current consistency factor of each same temperature data group is constructed, and combined with the trend consistency factor, a comparable weight of the optical power data corresponding to each same temperature data group is constructed; based on the comparable weight, accurate optical power data in the optical power data sequence is screened; Based on the precise optical power data in all optical power data sequences and combined with the polarization analysis algorithm, the polarization-dependent loss of the photonic chip to be tested is obtained.

[0005] In one embodiment, the process of acquiring each temperature data group is as follows: For any temperature value, if the temperature value appears in all temperature data sequences, all elements in all temperature data sequences having the same value as the temperature value are taken as a same-temperature data group.

[0006] In one embodiment, the process of obtaining the trend consistency factor of each temperature data group is as follows: For any temperature data in each temperature data sequence, a sequence consisting of a preset number of temperature data before the any temperature data is recorded as a neighboring temperature sequence of the any temperature data, and the mean of all elements in the first-order difference sequence of the neighboring temperature sequence of each temperature data is recorded as a first mean; based on the first mean and the number of positive and negative numbers in the first-order difference sequence, a trend increase weight of each temperature data is constructed; Calculate the variance of the trend rising weights of all temperature data in each same temperature data group, recorded as the first variance; calculate the DTW distance between each temperature data in each same temperature data group and the adjacent temperature sequence of the subsequent temperature data; calculate the trend consistency factor of each same temperature data group based on the first variance and the DTW distance.

[0007] In one embodiment, the expression of the trend rising weight is: , where It represents the trend rising weight of the sth temperature data in the jth group of data with the same temperature; represents the first mean value of the sth temperature data in the jth group of data with the same temperature; , They respectively represent the number of positive numbers and the number of negative numbers in the first-order difference sequence of the adjacent temperature sequence of the sth temperature data in the jth group of same temperature data.

[0008] In one embodiment, the expression of the trend consistency factor is: , where represents the trend consistency factor of the jth group of temperature data; represents the first variance of the jth group of data with the same temperature; , Respectively represent the adjacent temperature sequences of the sth and s+1th temperature data in the jth group of temperature data; Indicates calculation of DTW distance.

[0009] In one embodiment, the process of obtaining the current consistency factor of each temperature data group is as follows: The sequence of driving currents corresponding to all temperature data in each group of the same temperature data is recorded as the first current sequence; the total number of modes in the first current sequence of the jth group of the same temperature data is recorded as ; The variance of all elements in the first current sequence of the jth group of data with the same temperature is recorded as ; The current consistency factor of the jth group of data with the same temperature is recorded as , The expression is: .

[0010] In one embodiment, the comparable weight of the optical power data corresponding to each of the same-temperature data groups is: the product of the trend consistency factor of each of the same-temperature data groups and the current consistency factor.

[0011] In one embodiment, the process of obtaining the precise optical power data is as follows: The comparable weights of all groups of same-temperature data groups are used as the input of the threshold segmentation algorithm, and the output is the segmentation threshold. Each same-temperature data group whose comparable weight is greater than the segmentation threshold is used as a valid same-temperature data group. All temperature data in each group of valid same-temperature data groups are used as final temperature data, and the optical power data corresponding to the final temperature data is used as precise optical power data.

[0012] In one embodiment, the process of obtaining the polarization-dependent loss of the photonic chip to be tested is: The average value of all precise optical power data in each optical power data sequence is taken as the precise optical power of the corresponding state of each optical power data sequence, and the precise optical power in all states is taken as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. All the coefficients of the Mueller matrix method are substituted into the calculation formula of polarization-dependent loss to obtain the polarization-dependent loss of the photonic chip to be tested.

[0013] In a second aspect, an embodiment of the present application also provides a performance testing system for a hybrid integrated photonic chip, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the steps of any one of the above methods when executing the computer program.

[0014] The embodiments of the present application have at least the following beneficial effects: The present application first constructs a trend consistency factor for the same temperature data group according to the temperature change trend of the same temperature data under different states in the previous period of time, so that the optical power data with consistent temperature and similar temperature change trend can be screened out, so that the obtained optical power data can be more comparable, which is beneficial to improving the detection accuracy of the photonic chip; then, according to the consistency of the light source driving current data corresponding to the same temperature data group, a current consistency factor is constructed, so that the final optical power data is more comparable; finally, by calculating the average value of the precise optical power data in each optical power data sequence, the average value is used to represent the precise optical power in each state, thereby reducing the optical power deviation caused by the instability of the light source, and using the precise optical power in each state to calculate the polarization-related loss of the photonic chip, thereby improving the measurement accuracy of the polarization-related loss, and avoiding the deviation in the collection of optical power due to the instability of the light source, thereby affecting the performance test accuracy of the photonic chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present application or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0016] Figure 1 A flowchart of a method for testing the performance of a hybrid integrated photonic chip provided in one embodiment of the present application; Figure 2 A schematic diagram of the component connection method when connecting a photonic chip; Figure 3 Schematic diagram of component connection method when the photonic chip is not connected. DETAILED DESCRIPTION

[0017] In order to further explain the technical means and effects adopted by the present application to achieve the predetermined invention purpose, the following is a detailed description of the performance testing method and system of a hybrid integrated photonic chip proposed in the present application, its specific implementation method, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0018] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0019] The following is a detailed description of a performance testing method and system for a hybrid integrated photonic chip provided by the present application in conjunction with the accompanying drawings.

[0020] See also Figure 1 , which shows a flow chart of the steps of a performance testing method of a hybrid integrated photonic chip provided by an embodiment of the present application, the method comprising the following steps: Step S1, obtaining the optical power data at each moment in each state, the temperature data of the internal components of the light source and the driving current data of the light source; wherein each state includes the state of being connected to the photon chip to be tested and not connected to the photon chip to be tested under each polarization state; constructing the optical power data sequence and the temperature data sequence in each state.

[0021] The polarization state generator can generate four fixed polarization states, including linear horizontal polarization (LHP), linear vertical polarization (LVP), linear +45° polarization (L+45°) and right-hand circular polarization (RHC).

[0022] Connect the light source to the polarization state generator, and use the optical power meter to collect the optical power data of the polarization state generator when it is connected to the photon chip to be tested and when it is not connected to the photon chip to be tested in each polarization state. The schematic diagram of the component connection method when connecting the photon chip is as follows: Figure 2 As shown in the figure, the schematic diagram of the component connection method when the photonic chip is not connected is as follows Figure 3 As shown; at the same time, when collecting the light power data in each state, a temperature sensor is set at the light source to collect the temperature data of the internal components of the light source in that state, and a current sensor is installed in the driving circuit of the light source to collect the driving current data of the light source in that state.

[0023] For the collection of optical power data in each state, preferably, in the embodiment of the present application, the data collection time length is set to 10 seconds, and the data collection frequency is set to 15kHz. For the collection of temperature data and drive current data in each state, preferably, in the embodiment of the present application, the data collection frequency is set to 50Hz, and the collection time lengths of temperature data and drive current data are the same as the collection time length of optical power data. As other embodiments of the present application, the implementer can set the data collection time length and data collection frequency according to actual conditions.

[0024] Thus, the optical power data under 8 states, as well as the temperature data of the internal components of the light source and the driving current data of the light source under each state are obtained. The sequence of all optical power data under each state in ascending time order is recorded as each optical power data sequence, among which the optical power data sequences obtained when the photon chip to be tested is not connected under the four polarization states are recorded as , , and , the optical power data sequences obtained when connecting the photonic chip to be tested under four polarization states are recorded as , , and .

[0025] At the same time, the time series of all temperature data in each state is recorded as each temperature data series, and the time series of all driving current data in each state is recorded as each current data series.

[0026] Each temperature data sequence and each current data sequence are interpolated by linear interpolation, so that the number of data in each temperature data sequence and the number of data in each current data sequence are the same as the number of data in each optical power data sequence, so that each optical power data in each state has a corresponding temperature data and driving current data. The linear interpolation method is a well-known technology, and the specific process is not repeated here.

[0027] Step S2, constructing each same temperature data group based on the occurrence of temperature values ​​in all temperature data sequences; analyzing the changes in adjacent data of each temperature data in the temperature data sequence, and constructing the trend consistency factor of each same temperature data group based on the difference between the changes in adjacent data of different temperature data in the same temperature data group.

[0028] In each optical power data sequence, the optical power data will fluctuate over time, and the characteristics of the fluctuation depend on the characteristics of the light source. The reason for the instability of the light source is usually due to temperature fluctuations and current fluctuations inside the light source. Temperature fluctuations will cause changes in the performance of the light-emitting elements inside the light source, thereby affecting the optical power output. When the temperature rises, the optical power of the light source will decrease. This is because the thermal expansion of the material and the photon attenuation of the luminescent material in a high temperature environment will reduce the optical power of the light source. Therefore, when comparing the optical power data in different optical power data sequences, if the temperature data corresponding to the optical power data being compared are inconsistent, the optical power data are not comparable. Therefore, it is necessary to select optical power data at the same temperature level from each optical power data sequence. In addition, for two optical power data at the same temperature, if the temperature change trends of the two data in the previous period are different, then the two optical power data are not comparable. For example, when the temperatures corresponding to the optical power data e1 and the optical power data e2 are equal, if the temperature of e1 in the previous period is from 20 degrees to 30 degrees, and the temperature of e2 in the previous period is from 40 degrees to 30 degrees, then although the temperatures corresponding to the two optical power data are equal, the two optical power data have experienced different temperature change trends in the previous period, so the two optical power data may not be equal. Therefore, when comparing whether the two optical power data under two polarization states are comparable, it is necessary not only to see whether the temperatures corresponding to the two optical power data are equal, but also to see whether the temperature change trends of the two optical power data in the previous period are similar.

[0029] Therefore, firstly, according to the occurrence of temperature values ​​in all temperature data sequences, each temperature data group is constructed, specifically: The sequence consisting of all temperature values ​​that have appeared in all temperature data sequences is recorded as the first sequence. For each temperature value in the first sequence, if the temperature value appears in all eight temperature data sequences, all elements in the eight temperature data sequences that have the same value as the temperature value are regarded as a same-temperature data group.

[0030] Then, in each same temperature data group, it is determined whether the change trends of different temperature data in the previous period are similar, and the trend consistency factor of each same temperature data group is constructed to characterize the consistency of the change trends of the temperature data of the elements in each same temperature data group in the previous period, specifically: For each temperature data in each temperature data sequence, take the yth temperature data in the xth temperature data sequence as For example, the temperature data The sequence composed of the first N data is recorded as temperature data The neighboring temperature sequence is obtained, and the mean of all elements in the first-order difference sequence of the neighboring temperature sequence is obtained, which is recorded as the first mean; wherein, if the number of data before each temperature data in the temperature data sequence is less than N, the sequence composed of the data actually existing before each temperature data is recorded as the neighboring temperature sequence of each temperature data.

[0031] Calculate the trend rising weight of each temperature data in each temperature data group. The expression is: In the formula, It represents the trend rising weight of the sth temperature data in the jth group of the same temperature data, which is used to characterize the possibility that the temperature change trend of the temperature data in the previous period is an upward trend; represents the first mean value of the sth temperature data in the jth group of data with the same temperature; Represents the number of positive numbers in the first-order difference sequence of the adjacent temperature sequence of the s-th temperature data in the j-th group of same temperature data; Represents the number of negative numbers in the first-order difference sequence of the adjacent temperature sequence of the sth temperature data in the jth group of same temperature data.

[0032] when The larger the value of is, the more obvious the temperature rising trend of the sth temperature data in the jth temperature data group is in the previous period of time. The larger the value of , it means that the sth temperature data in the jth temperature data group has more temperature rising moments and fewer temperature falling moments in the previous period of time, so the temperature change trend of the sth temperature data in the jth temperature data group is more likely to be an upward trend in the previous period of time. The larger the value is, the more likely it is that the temperature of the sth temperature data in the jth temperature data group is on an upward trend in the previous period. The smaller the value is, the more likely it is that the temperature of the sth temperature data in the jth group of temperature data has been on a downward trend in the previous period.

[0033] Further, the variance of the trend rising weights of all temperature data in each same temperature data group is calculated, recorded as the first variance; the DTW distance between each temperature data in each same temperature data group and the adjacent temperature sequence of the subsequent temperature data is calculated; wherein the calculation of the DTW distance is a well-known technology, and the specific process is not repeated here; The expression for calculating the trend consistency factor of each temperature data group is: In the formula, represents the trend consistency factor of the jth group of temperature data; represents the first variance of the jth group of data with the same temperature; Represents the adjacent temperature sequence of the s-th temperature data in the j-th group of same temperature data; Represents the adjacent temperature sequence of the s+1th temperature data in the jth group of same temperature data; Indicates calculation of DTW distance.

[0034] The smaller the variance of the trend increase weights of all temperature data in the jth group of same temperature data, the more similar the trend increase weights of all temperature data in the group of same temperature data are, and the more similar the change trends of the temperature data in the group of same temperature data in the previous period are, the more comparable the optical power data corresponding to the jth group of same temperature data are. The smaller the value is, the more similar the adjacent temperature sequences of the temperature data in the j-th group of temperature data are, and the more comparable the optical power data corresponding to the j-th group of temperature data are.

[0035] Step S3, constructing a current consistency factor for each temperature data group based on the mode and variance of the driving current corresponding to all temperature data in the temperature data group, and constructing comparable weights of the optical power data corresponding to each temperature data group in combination with the trend consistency factor; and screening accurate optical power data in the optical power data sequence based on the comparable weights.

[0036] Since the quality of the optical components inside the light source will affect the stability of the driving current, and external electromagnetic interference and vibration may also affect the stability of the driving current, the driving current of the light source will fluctuate randomly. The fluctuation of the driving current will cause the measured optical power to deviate, and the measured optical power will be different under different driving currents. There is usually a linear relationship between the driving current and the optical power of the light source. When the driving current increases, the optical power will also increase. Conversely, when the driving current decreases, the optical power will also decrease. If the optical power in one polarization state with a larger current is compared with the optical power in another polarization state with a smaller current, it is obviously not comparable. Therefore, when selecting the optical power data in each polarization state, we should not only consider the consistency of the temperature change trend, but also the consistency of the driving current data.

[0037] Each temperature data corresponds to a driving current data in the same state and at the same acquisition time, and a sequence consisting of driving current data corresponding to all temperature data in each group of same temperature data is recorded as a first current sequence; obtaining the total number of modes in the first current sequence of each group of same temperature data, and recording it as the first mode number; Recording the variance of all elements in the first current sequence of each group of data with the same temperature as the first current variance; Based on the above analysis, a current consistency factor of each same-temperature data group is constructed to characterize the consistency of the driving current data corresponding to each temperature data in each same-temperature data group, wherein the current consistency factor of each same-temperature data group is positively correlated with the first mode number and negatively correlated with the first current variance.

[0038] Preferably, in the embodiment of the present application, the expression of the current consistency factor of each temperature data group is: , where represents the current consistency factor of the jth group of data with the same temperature; represents the number of the first mode of the jth group of data with the same temperature; The first current sequence representing the jth group of data of the same temperature; is the variance function.

[0039] when The smaller the value of is, the more consistent the driving current data corresponding to the jth group of temperature data is, and the more comparable the optical power data corresponding to the jth group of temperature data is. The larger the value of , the more identical values ​​there are in the driving current data corresponding to the j-th group of data with the same temperature, and the more comparable the optical power data corresponding to the j-th group of data with the same temperature are.

[0040] Furthermore, based on the trend consistency factor and current consistency factor of each same-temperature data group, comparable weights of the optical power data corresponding to each same-temperature data group are constructed to characterize the comparability of the optical power data corresponding to the jth group of same-temperature data groups, wherein the comparable weights of each same-temperature data group are positively correlated with the trend consistency factor and the current consistency factor, respectively.

[0041] Preferably, in the embodiment of the present application, the expression of the comparable weight of the optical power data corresponding to each data group with the same temperature is: , where is the comparable weight of the optical power data corresponding to the jth group of data with the same temperature; represents the trend consistency factor of the jth group of temperature data; Represents the current consistency factor of the jth group of data with the same temperature.

[0042] The more consistent the temperature change trend of each group of data with the same temperature is, and the more consistent the driving current data corresponding to the group of data with the same temperature is, the more comparable the optical power data corresponding to the group of data with the same temperature is.

[0043] Further, the comparable weights of all groups of same-temperature data groups are used as inputs of the Otsu method, and the output is the segmentation threshold, and each group of same-temperature data groups whose comparable weights are greater than the segmentation threshold are used as each group of valid same-temperature data groups, and all temperature data in each group of valid same-temperature data groups are used as final temperature data. Among them, the Otsu method is a well-known technology, and the specific process is not repeated here.

[0044] It should be noted that for obtaining segmentation thresholds with comparable weights for all groups of temperature data groups, this application only provides one threshold segmentation method. There are many existing threshold segmentation methods, and implementers can also use other threshold segmentation algorithms to obtain segmentation thresholds with comparable weights. This application does not make specific restrictions.

[0045] The optical power data corresponding to the final temperature data is used as the accurate optical power data. Thus, the accurate optical power data of each optical power data sequence is obtained.

[0046] Step S4, based on the precise optical power data in all optical power data sequences and in combination with a polarization analysis algorithm, the polarization-dependent loss of the photonic chip to be tested is obtained.

[0047] The average value of all accurate optical power data in each optical power data sequence is taken as the accurate optical power in the corresponding state of each optical power data sequence, where the optical power sequence , , , , , , and The precise optical power of the corresponding state is recorded as , , , , , , and By calculating the average value, the error caused by the large deviation in the original optical power data can be reduced, so that the precise optical power can more accurately represent the optical power in each state.

[0048] Furthermore, the precise optical power in all states is used as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. The coefficient calculation method of the Mueller matrix method is: In the formula, , , and They represent the four coefficients of the Mueller matrix method; , , and They represent the precise optical power of the optical power meter in four polarization states when it is connected to the photonic chip to be measured; , , and They represent the precise optical power of the optical power meter in four polarization states when it is not connected to the photonic chip to be measured. The Mueller matrix method and the calculation method of its coefficients are well-known technologies, and the specific process will not be repeated here.

[0049] Furthermore, the polarization dependent loss (PDL) can be obtained: , where is the polarization-dependent loss of the photonic chip to be measured. The calculation of the polarization-dependent loss is a well-known technique, and the specific acquisition process will not be described in detail.

[0050] At this point, the polarization-dependent loss of the photonic chip to be tested is obtained.

[0051] A performance test system for a hybrid integrated photonic chip includes: a data acquisition module, a data processing module, an optical power calculation module, and a PDL calculation module. The data acquisition module uses an optical power meter, a temperature sensor, and a current sensor to collect optical power data, temperature data, and current data in different polarization states; the data processing module is responsible for aligning the collected data using an interpolation method so that one optical power data corresponds to one temperature data and one current data; the optical power calculation module is responsible for selecting the data that can most accurately represent the optical power in each polarization state from the entire optical power data sequence based on the temperature data and the current data, and calculating the precise optical power; the PDL calculation module is responsible for calculating the polarization-dependent loss of each photonic chip to be tested using the Mueller matrix method.

[0052] Based on the same inventive concept as the above method, an embodiment of the present application also provides a performance testing system for a hybrid integrated photonic chip, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the processor executes the computer program, the steps of any one of the above-mentioned performance testing methods for a hybrid integrated photonic chip are implemented.

[0053] In summary, the embodiment of the present application provides a performance testing method for a hybrid integrated photonic chip. First, according to the temperature change trend of the same temperature data under different states in the previous period of time, a trend consistency factor of the same temperature data group is constructed, so that the optical power data with consistent temperature and similar temperature change trend can be screened out, so that the obtained optical power data can be more comparable, which is beneficial to improving the detection accuracy of the photonic chip; then, according to the consistency of the light source driving current data corresponding to the same temperature data group, a current consistency factor is constructed, so that the final optical power data is more comparable; finally, by calculating the average value of the precise optical power data in each optical power data sequence, the average value is used to represent the precise optical power in each state, thereby reducing the optical power deviation caused by the instability of the light source, and using the precise optical power in each state to calculate the polarization-related loss of the photonic chip, thereby improving the measurement accuracy of the polarization-related loss, and avoiding the deviation in the collection of optical power due to the instability of the light source, thereby affecting the performance test accuracy of the photonic chip.

[0054] It should be noted that the above-mentioned sequence of the embodiments of the present application is only for description and does not represent the advantages and disadvantages of the embodiments. The above-mentioned specific embodiments of the present application are described. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0055] The various embodiments in the present application are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

[0056] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present application should be included in the protection scope of the present application.

Claims

1. A performance testing method for a hybrid integrated photonic chip, characterized in that: The method comprises the following steps: Obtaining optical power data at each time in each state, temperature data of components inside the light source, and driving current data of the light source; wherein each state includes a state of being connected to the photon chip to be tested and a state of being not connected to the photon chip to be tested under each polarization state; constructing an optical power data sequence and a temperature data sequence in each state; Constructing each same temperature data group based on the occurrence of temperature values ​​in all temperature data sequences; analyzing the change of adjacent data of each temperature data in the temperature data sequence, and constructing the trend consistency factor of each same temperature data group based on the difference between the adjacent data change of different temperature data in the same temperature data group; Based on the mode and variance of the driving current corresponding to all the temperature data in the same temperature data group, a current consistency factor of each same temperature data group is constructed, and combined with the trend consistency factor, a comparable weight of the optical power data corresponding to each same temperature data group is constructed; based on the comparable weight, accurate optical power data in the optical power data sequence is screened; Based on the precise optical power data in all optical power data sequences and combined with the polarization analysis algorithm, the polarization-dependent loss of the photonic chip to be tested is obtained.

2. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The acquisition process of each same temperature data group is as follows: For any temperature value, if the temperature value appears in all temperature data sequences, all elements in all temperature data sequences having the same value as the temperature value are taken as a same-temperature data group.

3. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The process of obtaining the trend consistency factor of each temperature data group is as follows: For any temperature data in each temperature data sequence, a sequence consisting of a preset number of temperature data before the any temperature data is recorded as a neighboring temperature sequence of the any temperature data, and the mean of all elements in the first-order difference sequence of the neighboring temperature sequence of each temperature data is recorded as a first mean; based on the first mean and the number of positive and negative numbers in the first-order difference sequence, a trend increase weight of each temperature data is constructed; Calculate the variance of the trend increase weights of all temperature data in each temperature data group, and record it as the first variance; The DTW distance between each temperature data in each temperature data group and the adjacent temperature sequence of subsequent temperature data is calculated; and the trend consistency factor of each temperature data group is calculated based on the first variance and the DTW distance.

4. A performance testing method for a hybrid integrated photonic chip as claimed in claim 3, characterized in that: The expression of the trend rising weight is: , where It represents the trend rising weight of the sth temperature data in the jth group of data with the same temperature; represents the first mean value of the sth temperature data in the jth group of data with the same temperature; , They respectively represent the number of positive numbers and the number of negative numbers in the first-order difference sequence of the adjacent temperature sequence of the sth temperature data in the jth group of same temperature data.

5. A performance testing method for a hybrid integrated photonic chip as claimed in claim 3, characterized in that: The expression of the trend consistency factor is: , where represents the trend consistency factor of the jth group of temperature data; represents the first variance of the jth group of data with the same temperature; , Respectively represent the adjacent temperature sequences of the sth and s+1th temperature data in the jth group of temperature data; Indicates calculation of DTW distance.

6. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The process of obtaining the current consistency factor of each temperature data group is as follows: The sequence of driving currents corresponding to all temperature data in each group of the same temperature data is recorded as the first current sequence; the total number of modes in the first current sequence of the jth group of the same temperature data is recorded as ; The variance of all elements in the first current sequence of the jth group of data with the same temperature is recorded as ; The current consistency factor of the jth group of data with the same temperature is recorded as , The expression is: .

7. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The comparable weight of the optical power data corresponding to each of the same-temperature data groups is: the product of the trend consistency factor and the current consistency factor of each of the same-temperature data groups.

8. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The process of obtaining the precise optical power data is as follows: The comparable weights of all groups of same-temperature data groups are used as the input of the threshold segmentation algorithm, and the output is the segmentation threshold. Each same-temperature data group whose comparable weight is greater than the segmentation threshold is used as a valid same-temperature data group. All temperature data in each group of valid same-temperature data groups are used as final temperature data, and the optical power data corresponding to the final temperature data is used as precise optical power data.

9. A performance testing method for a hybrid integrated photonic chip as claimed in claim 1, characterized in that: The process of obtaining the polarization-dependent loss of the photonic chip to be measured is: The average value of all precise optical power data in each optical power data sequence is taken as the precise optical power of the corresponding state of each optical power data sequence, and the precise optical power in all states is taken as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. All the coefficients of the Mueller matrix method are substituted into the calculation formula of polarization-dependent loss to obtain the polarization-dependent loss of the photonic chip to be tested.

10. A performance test system for a hybrid integrated photonic chip, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 9 are implemented.

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