LED module aging detection method and LED module aging detection system

Abstract

The invention relates to the technical field of LED module aging detection, and particularly discloses an LED module aging detection method and a detection system thereof, and the method comprises the steps: analyzing the luminous flux of an LED module to obtain a luminous flux characterization value, carrying out the abnormality judgment of the LED module based on the luminous flux characterization value, and carrying out the analysis of the number of times of an abnormal signal based on the abnormal signal. The LED module luminous flux batch qualification is judged, based on the LED module luminous flux batch disqualification, the production time of the LED module generating the abnormal signal is analyzed, the periodic judgment result of the production time interval when the LED module generates the abnormal signal is obtained, and based on the periodic judgment result, the optimal time interval is obtained through analysis; according to the method, the production time interval corresponding to the abnormal signal generation of the LED module is analyzed to obtain the optimal time interval, so that the detection time interval of the LED module can be optimized by detection personnel, and the detection accuracy of the LED module is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of LED module aging detection, and in particular to an LED module aging detection method and a detection system thereof. Background Art

[0002] LED (light emitting diode) is the core component of modern lighting and display technology, with advantages such as high efficiency, long life, environmental protection and energy saving. LED module is a product composed of a certain number of light emitting diodes arranged together according to rules and then packaged, plus some waterproof treatment. In today's increasingly competitive market, product quality and reliability are the key to winning the market for enterprises. For LED modules, their quality and reliability are directly related to the performance and user satisfaction of the entire lighting or display system; However, in order to ensure that the LED modules can maintain stable performance and extend their service life in actual applications, it is generally necessary to conduct random inspections and aging tests on the LED modules after production. This detection method can easily lead to the omission of unqualified LED modules, affecting product quality. To this end, we propose a LED module aging detection method and a detection system thereof. Summary of the invention

[0003] The object of the present invention is to provide an LED module aging detection method and a detection system thereof to solve the technical problems in the above background.

[0004] The purpose of the present invention can be achieved by the following technical solutions: In a first aspect, the present invention provides a method for testing LED module aging, comprising: step 1: analyzing the luminous flux of the LED module to obtain a luminous flux characterization value, and making an abnormality judgment on the LED module based on the luminous flux characterization value, wherein the judgment result includes an abnormal signal and a normal signal; Step 2: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the abnormal number ratio, and based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged; Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged, and the judgment result includes periodic signals and non-periodic signals; Step 4: Based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval.

[0005] As a further solution of the present invention: the luminous flux characterization value is obtained in the following manner: Construct the luminous flux variation curve, and analyze the ratio of the number of abnormal sub-curves and the slope deviation degree; The proportion of abnormal sub-curves and the slope deviation ratio are weighted to obtain the luminous flux characterization value.

[0006] As a further solution of the present invention: the method for obtaining the proportion of the number of abnormal sub-curves is: During the detection period, the luminous flux of the LED module is obtained, and an XY two-dimensional coordinate system is constructed with time as the X-axis and luminous flux as the Y-axis. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve; Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction processing on the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation; Compare the slope deviation to the slope deviation threshold: If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve; If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve; The number of abnormal sub-curve segments is counted and the ratio is processed with the total number of sub-curves to obtain the proportion of abnormal sub-curves.

[0007] As a further solution of the present invention: the slope deviation ratio is obtained as follows: The slope deviation of the abnormal sub-curve is obtained, and the slope deviation is subtracted from the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve. All slope relative deviations are summed and averaged to obtain the mean of the slope relative deviations. The mean of the slope relative deviation is compared with the slope deviation threshold to obtain the slope deviation degree ratio.

[0008] As a further solution of the present invention: the method for obtaining the abnormal number ratio is: The number of times normal signals and abnormal signals are generated is counted and summed to obtain the total number of signals. The number of times abnormal signals are generated is ratioed to the total number of signals to obtain the proportion of abnormal times.

[0009] As a further solution of the present invention: the period performance value ZB is obtained as follows: Obtain the production time of the LED module that generates the abnormal signal, and analyze to obtain the acceptable time interval quantity ratio KS and the acceptable time interval relative deviation ratio KC; The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed by the formula: The period performance value ZB is calculated, wherein a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0.

[0010] As a further solution of the present invention: the method for obtaining the percentage of the number of acceptable time intervals KS is as follows: Obtain the production time of the LED module that generates the abnormal signal, calculate the difference between the production times of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value; Compare the time interval deviation value to the time interval deviation threshold: If the time interval deviation value is less than or equal to the time interval deviation threshold, it means that the time interval value is less different from the time interval mean, and the corresponding time interval is marked as an acceptable time interval; If the time interval deviation value is greater than the time interval deviation threshold, it means that the time interval value is significantly different from the time interval mean, and the corresponding time interval is marked as an unacceptable time interval; The number of acceptable time intervals and the number of unacceptable time intervals are counted and summed to obtain the total number of time intervals. The number of acceptable time intervals is processed with the total number of time intervals and the retrograde ratio to obtain the percentage of acceptable time intervals KS.

[0011] As a further solution of the present invention: the method for obtaining the acceptable time interval relative deviation ratio KC is: Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC.

[0012] As a further solution of the present invention: the preferred method for obtaining the detection time interval is: Based on the periodic signal, it is explained that the reason causing the abnormality of the LED module aging test is likely to be periodic. The mean time interval when the periodic signal is generated is obtained, and the mean time interval is used as the preferred detection time interval; Based on the non-periodic signal, it means that the reason causing the abnormality of the LED module aging test is less likely to be periodic. The time interval for generating the non-periodic signal is obtained, all time intervals are sorted from small to large, and the minimum time interval is used as the preferred interval.

[0013] In a second aspect, the present invention provides an LED module aging detection system, comprising: Abnormality judgment module: analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and makes abnormality judgment on the LED module based on the luminous flux characterization value. The judgment result includes abnormal signal and normal signal; Qualification judgment module: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the proportion of the abnormal number of times, and based on the proportion of the abnormal number of times, the qualification of the LED module luminous flux batch is judged; Periodicity judgment module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged. The judgment results include periodic signals and non-periodic signals. Optimal detection time interval determination module: based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and the LED module detection time interval is optimized based on the optimal time interval.

[0014] Beneficial effects of the present invention: (1) The present invention analyzes the luminous flux of the LED module to obtain a luminous flux characterization value, and makes an abnormal judgment on the LED module based on the luminous flux characterization value. The judgment result includes an abnormal signal and a normal signal. Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the abnormal number ratio. Based on the abnormal number ratio, the luminous flux batch qualification of the LED module is judged. By analyzing the luminous flux of the LED module, the present invention is helpful to judge the luminous flux batch qualification of the LED module, thereby facilitating further control of the luminous flux qualification of the LED module; (2) Based on the unqualified batch of luminous flux of LED modules, the present invention analyzes the production time of LED modules that generate abnormal signals, obtains the periodic judgment result of the production time interval when the LED modules generate abnormal signals, analyzes and obtains the optimal time interval based on the periodic judgment result of the production time interval when the LED modules generate abnormal signals, and optimizes the detection time interval of the LED modules based on the optimal time interval. The present invention obtains the optimal time interval by analyzing the production time interval corresponding to the generation of abnormal signals of LED modules, which is beneficial for detection personnel to optimize the detection time interval of LED modules, thereby improving the detection accuracy of LED modules. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The present invention will be further described below in conjunction with the accompanying drawings.

[0016] Figure 1 It is a flowchart of an LED module aging detection method according to an embodiment of the present invention; Figure 2 The system block diagram of an LED module aging detection system according to an embodiment of the present invention. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] Embodiment 1: See also Figure 1 As shown, a method for testing LED module aging according to an embodiment of the present invention includes the following steps: Step 1: placing the LED module in an aging detection box, obtaining the monitoring parameters of the LED module in real time, wherein the monitoring parameters include luminous flux, analyzing the monitoring parameters of the LED module to obtain a luminous flux characterization value, and making an abnormal judgment on the LED module based on the luminous flux characterization value, wherein the judgment result includes an abnormal signal and a normal signal; During the detection period, the luminous flux of the LED module is obtained, and an XY two-dimensional coordinate system is constructed with time as the X-axis and luminous flux as the Y-axis. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve; Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction processing on the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation; It should be noted that the standard slope is set by those skilled in the art based on the actual requirements of the luminous flux of the previous LED module; Compare the slope deviation to the slope deviation threshold: If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve; If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve; Count the number of abnormal sub-curve segments, and compare it with the total number of sub-curves to obtain the proportion of abnormal sub-curves. Obtain the slope deviation of the abnormal sub-curve, perform subtraction processing on it and the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve, sum and average all the slope relative deviations to obtain the slope relative deviation mean, perform ratio processing on the slope relative deviation mean and the slope deviation threshold to obtain the slope deviation degree ratio; The ratio of the number of abnormal sub-curves and the slope deviation ratio are weighted to obtain the luminous flux characterization value; Compare the Luminous Flux Characterization Value to the Luminous Flux Characterization Threshold: If the luminous flux characterization value is greater than or equal to the luminous flux characterization threshold, it means that the luminous flux of the current LED module is unqualified and an abnormal signal is generated; If the luminous flux characterization value is less than the luminous flux characterization threshold, it means that the luminous flux of the current LED module is qualified and a normal signal is generated; Step 2: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the abnormal number ratio, and based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged; The number of times normal signals and abnormal signals are generated is counted and summed to obtain the total number of signals. The number of times abnormal signals are generated is ratioed to the total number of signals to obtain the abnormal number ratio. Compare the anomaly count percentage to the anomaly count percentage threshold: If the abnormal number ratio is greater than or equal to the abnormal number ratio threshold, it means that the luminous flux of the LED modules in this batch is unqualified; If the abnormal number ratio is less than the abnormal number ratio threshold, it means that the luminous flux of the LED modules in this batch is qualified; The technical solution of the embodiment of the present invention is mainly as follows: analyzing the luminous flux of the LED module to obtain a luminous flux characterization value, making an abnormal judgment on the LED module based on the luminous flux characterization value, wherein the judgment result includes an abnormal signal and a normal signal, and based on the abnormal signal, analyzing the number of times the abnormal signal is generated to obtain a proportion of the abnormal number of times, and judging the batch qualification of the luminous flux of the LED module based on the proportion of the abnormal number of times. The present invention helps to judge the batch qualification of the luminous flux of the LED module by analyzing the luminous flux of the LED module, thereby facilitating further control of the luminous flux qualification of the LED module.

[0019] Embodiment 2: Based on Example 1, please refer to Figure 1 As shown, the LED module aging detection method described in the embodiment of the present invention also includes the following steps: Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged, and the judgment result includes periodic signals and non-periodic signals; Obtain the production time of the LED module that generates the abnormal signal, calculate the difference between the production times of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value; Compare the time interval deviation value to the time interval deviation threshold: If the time interval deviation value is less than or equal to the time interval deviation threshold, it means that the time interval value is less different from the time interval mean, and the corresponding time interval is marked as an acceptable time interval; If the time interval deviation value is greater than the time interval deviation threshold, it means that the time interval value is significantly different from the time interval mean, and the corresponding time interval is marked as an unacceptable time interval; Count the number of acceptable time intervals and the number of unacceptable time intervals, and sum them up to get the total number of time intervals. The number of acceptable time intervals is processed with the total number of time intervals and the retrograde ratio to get the percentage of acceptable time intervals KS. Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold value to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold value to obtain the acceptable time interval relative deviation degree ratio KC; The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed by the formula: The period performance value ZB is calculated, wherein a1 and a2 are both preset proportional coefficients, and a1 and a2 are both greater than 0; It should be noted that the cycle performance value ZB is obtained by processing the acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC. The cycle performance value ZB reflects whether the production time interval when the LED module generates an abnormal signal is periodic. The acceptable time interval ratio KS reflects the number of acceptable time intervals with a small difference between the time interval value and the time interval mean. The more acceptable time intervals, the greater the possibility of periodicity. The acceptable time interval relative deviation ratio KC reflects the difference between the time interval value and the time interval mean. The smaller the difference, the greater the possibility of periodicity. Compare the period performance value ZB with the period performance threshold: If the period performance value ZB is greater than or equal to the period performance threshold, a periodic signal is generated; If the periodic performance value ZB is less than the periodic performance threshold, a non-periodic signal is generated; Step 4: Based on the periodicity judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval; Based on the periodic signal, it is explained that the reason causing the abnormality of the LED module aging test is likely to be periodic. The mean time interval when the periodic signal is generated is obtained, and the mean time interval is used as the preferred detection time interval; Based on the non-periodic signal, it means that the reason causing the abnormality of the LED module aging test is less likely to be periodic. The time interval for generating the non-periodic signal is obtained, all time intervals are sorted from small to large, and the minimum time interval is taken as the preferred time interval; The technical solution of the embodiment of the present invention is mainly as follows: based on the unqualified batch of luminous flux of the LED module, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB; based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged, and the judgment result includes periodic signals and non-periodic signals; based on the periodic judgment result of the production time interval when the LED module generates the abnormal signal, the preferred time interval is analyzed to obtain the preferred time interval; based on the preferred time interval, the detection time interval of the LED module is optimized; the present invention obtains the preferred time interval by analyzing the production time interval corresponding to the generation of the abnormal signal of the LED module, which is beneficial for the detection personnel to optimize the detection time interval of the LED module, thereby improving the detection accuracy of the LED module.

[0020] Embodiment 3: Based on Example 1 and Example 2, please refer to Figure 1 , Figure 2 As shown, an LED module aging detection system according to an embodiment of the present invention includes: Abnormality judgment module: analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and makes abnormality judgment on the LED module based on the luminous flux characterization value. The judgment result includes abnormal signal and normal signal; Qualification judgment module: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the proportion of the abnormal number of times, and based on the proportion of the abnormal number of times, the qualification of the LED module luminous flux batch is judged; Periodicity judgment module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged. The judgment results include periodic signals and non-periodic signals. Optimal detection time interval determination module: based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and the LED module detection time interval is optimized based on the optimal time interval.

[0021] The above shows and describes the basic principles, main features and advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A method for testing LED module aging, characterized in that: include: Step 1: Analyze the luminous flux of the LED module to obtain a luminous flux characterization value, and make an abnormal judgment on the LED module based on the luminous flux characterization value. The judgment result includes an abnormal signal and a normal signal; Step 2: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the abnormal number ratio, and based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged; Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged, and the judgment result includes periodic signals and non-periodic signals; Step 4: Based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval.

2. The LED module aging detection method according to claim 1, characterized in that: The luminous flux characterization value is obtained in the following manner: Construct the luminous flux variation curve, and analyze the ratio of the number of abnormal sub-curves and the slope deviation degree; The proportion of abnormal sub-curves and the slope deviation ratio are weighted to obtain the luminous flux characterization value.

3. The LED module aging detection method according to claim 2, characterized in that: The method for obtaining the ratio of the number of abnormal sub-curves is as follows: During the detection period, the luminous flux of the LED module is obtained, and an XY two-dimensional coordinate system is constructed with time as the X-axis and luminous flux as the Y-axis. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve; Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction processing on the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation; Compare the slope deviation to the slope deviation threshold: If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve; If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve; The number of abnormal sub-curve segments is counted and the ratio is processed with the total number of sub-curves to obtain the proportion of abnormal sub-curves.

4. The LED module aging detection method according to claim 3, characterized in that: The slope deviation ratio is obtained as follows: The slope deviation of the abnormal sub-curve is obtained, and the slope deviation is subtracted from the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve. All slope relative deviations are summed and averaged to obtain the mean of the slope relative deviations. The mean of the slope relative deviation is compared with the slope deviation threshold to obtain the slope deviation degree ratio.

5. The LED module aging detection method according to claim 1, characterized in that: The method for obtaining the abnormal number ratio is as follows: The number of times normal signals and abnormal signals are generated is counted and summed to obtain the total number of signals. The number of times abnormal signals are generated is ratioed to the total number of signals to obtain the proportion of abnormal times.

6. The LED module aging detection method according to claim 1, characterized in that: The period performance value ZB is obtained as follows: Obtain the production time of the LED module that generates the abnormal signal, and analyze to obtain the acceptable time interval quantity ratio KS and the acceptable time interval relative deviation ratio KC; The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed by the formula: The period performance value ZB is calculated, wherein a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0.

7. The LED module aging detection method according to claim 6, characterized in that: The method for obtaining the acceptable time interval quantity proportion KS is as follows: Obtain the production time of the LED module that generates the abnormal signal, calculate the difference between the production times of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value; Compare the time interval deviation value to the time interval deviation threshold: If the time interval deviation value is less than or equal to the time interval deviation threshold, it means that the time interval value is less different from the time interval mean, and the corresponding time interval is marked as an acceptable time interval; If the time interval deviation value is greater than the time interval deviation threshold, it means that the time interval value is significantly different from the time interval mean, and the corresponding time interval is marked as an unacceptable time interval; The number of acceptable time intervals and the number of unacceptable time intervals are counted and summed to obtain the total number of time intervals. The number of acceptable time intervals is processed with the total number of time intervals and the retrograde ratio to obtain the percentage of acceptable time intervals KS.

8. The LED module aging detection method according to claim 7, characterized in that: The method for obtaining the relative deviation ratio KC of the acceptable time interval is as follows: Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC.

9. The LED module aging detection method according to claim 1, characterized in that: The preferred detection time interval is obtained in the following manner: Based on the periodic signal, it is explained that the reason causing the abnormality of the LED module aging test is likely to be periodic. The mean time interval when the periodic signal is generated is obtained, and the mean time interval is used as the preferred detection time interval; Based on the non-periodic signal, it means that the reason causing the abnormality of the LED module aging test is less likely to be periodic. The time interval for generating the non-periodic signal is obtained, all time intervals are sorted from small to large, and the minimum time interval is used as the preferred interval.

10. A LED module aging detection system, characterized in that: The system is used to execute the method described in any one of claims 1 to 9, and the system comprises: Abnormality judgment module: analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and makes abnormality judgment on the LED module based on the luminous flux characterization value. The judgment result includes abnormal signal and normal signal; Qualification judgment module: Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the proportion of the abnormal number of times, and the qualification of the LED module luminous flux batch is judged based on the proportion of the abnormal number of times; Periodicity judgment module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB. Based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged. The judgment results include periodic signals and non-periodic signals. Optimal detection time interval determination module: based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and the LED module detection time interval is optimized based on the optimal time interval.

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