Fault detection circuit and fault detection method of relay
By designing a relay fault detection circuit, using test signals to control the alternate conduction of relay lines, and forming multiple test paths in combination with impedance units and external test ends, the problems of low efficiency and high cost of fault detection in the prior art relay are solved, fast and accurate fault detection is achieved, and maintenance costs are reduced.
Patent Information
- Application Number
- CN202510155789.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-12
- Publication Date
- 2025-05-13
AI Technical Summary
The existing relay fault detection methods are inefficient and costly, making them difficult to achieve automated inspection, and rely on the experience and technical level of the operator, making misjudgments prone to occur.
A fault detection circuit for relays is designed, and the test signal is output by the test machine, and the first and second lines of the relay to be detected are controlled to conduct alternately, and multiple test paths are formed through the impedance unit and the external test end to determine whether there is a fault in the relay.
It realizes rapid and accurate detection of relay failures, reduces maintenance costs, improves production efficiency, and avoids misjudgment of manual inspection.
Smart Images
Figure CN119986349A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the field of semiconductor testing technology, and in particular to a fault detection circuit and a fault detection method for a relay. Background Art
[0002] In the semiconductor testing process, the test interface board, as part of the peripheral circuit, usually uses relays to switch between different resources to meet various test requirements. However, in actual production testing, relays may have faults such as poor contact and coil damage, resulting in test abnormalities. When such problems occur, it is usually necessary to stop the test and troubleshoot, which not only affects production efficiency but also increases maintenance costs. The existing relay fault detection methods mainly include the following: Manual detection: Detection is performed by manually checking the appearance of the relay, the contact condition of the contacts, and measuring the impedance unit value using a multimeter. This method is inefficient and depends on the operator's experience and technical level, and is prone to misjudgment. Online monitoring: Use sensors or special instruments to monitor the working parameters of the relay (such as current, voltage, etc.) in real time, and judge whether the relay is working properly through data analysis. Although this method can achieve automatic detection, it requires additional hardware equipment and complex algorithm support, which is costly. Summary of the invention
[0003] In view of the above-mentioned shortcomings of the prior art, the purpose of the present disclosure is to provide a fault detection circuit and a fault detection method for a relay to solve the problems in the related art.
[0004] A first aspect of the present disclosure provides a fault detection circuit for a relay, comprising:
[0005] A testing machine, used to output a test signal for detecting whether the relay to be tested has a fault;
[0006] a relay to be tested, comprising a first circuit for connecting the test machine and the test circuit in a controlled manner and a second circuit for connecting a peripheral circuit and the test circuit, and configured to control the first circuit and the second circuit to be alternately turned on according to the test signal;
[0007] The test circuit comprises a third line connected to the external test terminal and a fourth line grounded through an impedance unit, and the test circuit is configured to turn on the fourth line according to the test signal;
[0008] Among them, the conduction of the fourth circuit forms a first test path from the test machine to the ground through the first circuit and the fourth circuit, so as to determine whether the relay to be detected is faulty by testing the correctness of the alternating conduction; the conduction of the first circuit forms a second test path from the test machine to the test end through the first circuit and the third circuit for testing the material under test; the conduction of the second circuit forms a third test path from the peripheral circuit to the material under test through the second circuit, the third circuit and the external test end for testing the material under test.
[0009] In an embodiment of the first aspect, the relay to be detected further includes:
[0010] A relay switch module is provided between the first circuit and the second circuit and is connected to the test machine in a controlled manner. The relay switch module is configured to conduct the first circuit or the second circuit correspondingly based on the test signal.
[0011] In an embodiment of the first aspect, the relay switch module includes: a single-pole double-throw switch element, including a common end connected to the test circuit, and a switch control end connected to the test machine or the peripheral circuit; the single-pole double-throw switch element switches the first circuit or the second circuit to conduct based on the test signal received by the switch control end.
[0012] In an embodiment of the first aspect, the relay to be detected further includes:
[0013] A control module is coupled to the test machine and the relay switch module respectively, and is used to control the relay switch module to switch the conduction of the first circuit or the second circuit according to the test signal.
[0014] In an embodiment of the first aspect, the test circuit includes a test switch unit, which is disposed in the fourth circuit and connected to the test machine in a controlled manner, and is used to control the on and off of the fourth circuit according to the test signal.
[0015] In an embodiment of the first aspect, the test switch unit includes a jumper module, which is respectively connected to the relay to be tested and the test machine; the jumper module includes a first end connected to the external test end and the relay to be tested and a second end connected to the impedance unit; the jumper module is configured to drive a jumper cap to connect or disconnect the first end and the second end according to a test signal.
[0016] In an embodiment of the first aspect, the test machine further includes a signal output module connected to the relay to be detected, and configured to control the relay to be detected to correspondingly turn on or off the first circuit or the second circuit according to the test signal.
[0017] In an embodiment of the first aspect, the impedance unit is one or more resistors.
[0018] A second aspect of the present disclosure provides a fault detection method for a relay, wherein the fault detection circuit described in any one of the above items is used to test the relay to be detected; the fault detection method comprises:
[0019] When the relay to be detected is tested, the fourth circuit is turned on correspondingly according to the test signal generated by the test machine;
[0020] According to the test signal, the relay to be detected is controlled to alternately conduct the first circuit and the second circuit to obtain the corresponding conduction condition of the first circuit;
[0021] A fault detection result is generated according to the conduction condition.
[0022] In an embodiment of the second aspect of the present disclosure, the fault detection result includes:
[0023] When the relay to be detected is normal, the first circuit switches between an on state and an off state;
[0024] When the relay to be detected is abnormal, the first circuit is always in an on state\off state.
[0025] The beneficial effects of the present disclosure are as follows: by controlling the conduction state of the internal circuit of the relay and combining the impedance unit and the external test terminal to form multiple test paths, it is ensured that the fault of the relay can be captured. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] Figure 1 A structural block diagram of a fault detection circuit in an embodiment of the present disclosure is shown.
[0027] Figure 2 A structural block diagram of a relay to be detected in a fault detection circuit in an embodiment of the present disclosure is shown.
[0028] Figure 3 A structural block diagram of a relay to be detected in a fault detection circuit in another embodiment of the present disclosure is shown.
[0029] Figure 4 A structural block diagram of a test circuit in a fault detection circuit in an embodiment of the present disclosure is shown.
[0030] Figure 5 A structural block diagram of a test switch unit in a fault detection circuit in an embodiment of the present disclosure is shown.
[0031] Figure 6 A structural block diagram of a test machine in a fault detection circuit in an embodiment of the present disclosure is shown.
[0032] Figure 7 A flowchart of a fault detection method in an embodiment of the present disclosure is shown. DETAILED DESCRIPTION
[0033] The following is an explanation of the embodiments of the present disclosure by specific examples, and those skilled in the art can easily understand other advantages and effects of the present disclosure from the information disclosed by the present disclosure. The present disclosure can also be implemented or applied through other different specific embodiments, and the details in the present disclosure can also be modified or changed in various ways according to different viewpoints and application modules without departing from the spirit of the present disclosure. It should be noted that the embodiments in the present disclosure and the features in the embodiments can be combined with each other without conflict.
[0034] The following is a detailed description of the embodiments of the present disclosure with reference to the accompanying drawings so that those skilled in the art can easily implement the present disclosure. The present disclosure can be embodied in many different forms and is not limited to the embodiments described herein.
[0035] In the representations of the present disclosure, the reference terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" and the like mean that the specific features, structures, materials or characteristics represented in conjunction with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials or characteristics represented may be combined in any one or a group of embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine different embodiments or examples represented in the present disclosure and the features of different embodiments or examples, unless they are mutually contradictory.
[0036] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the representation of the present disclosure, "a group" means two or more, unless otherwise clearly and specifically defined.
[0037] In order to clearly describe the present disclosure, components not related to the description are omitted, and the same reference numerals are given to the same or similar components throughout the specification.
[0038] Throughout the specification, when a device is said to be "connected" to another device, this includes not only the case of "direct connection" but also the case of "indirect connection" by placing other elements therebetween. In addition, when a device is said to "include" a certain component, unless otherwise stated, it does not exclude other components, but means that other components may be included.
[0039] Although the terms first, second, etc. are used to represent various elements in this article in some examples, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, the first interface and the second interface, etc. are represented. Moreover, as used in this article, the singular forms "one", "one" and "the" are intended to also include plural forms, unless there is an opposite indication in the context. It should be further understood that the terms "comprising" and "including" indicate the existence of features, steps, operations, elements, modules, projects, kinds, and / or groups, but do not exclude the existence, occurrence or addition of one or a group of other features, steps, operations, elements, modules, projects, kinds, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or mean any one or any combination. Therefore, "A, B or C" or "A, B and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B and C". Only when the combination of elements, functions, steps or operations is inherently mutually exclusive in some way, will there be an exception to this definition.
[0040] The technical terms used herein are only used to refer to specific embodiments and are not intended to limit the present disclosure. The singular form used herein also includes the plural form unless the sentence clearly indicates the contrary meaning. The meaning of "including" used in the specification is to specify specific characteristics, regions, integers, steps, operations, elements and / or components, and does not exclude the existence or addition of other characteristics, regions, integers, steps, operations, elements and / or components.
[0041] Although not defined differently, all terms, including technical and scientific terms used herein, have the same meaning as those generally understood by those skilled in the art to which the present disclosure belongs. Terms defined in commonly used dictionaries are additionally interpreted as having meanings consistent with relevant technical literature and the message of the present disclosure, and shall not be overly interpreted as ideal or very formal meanings unless defined.
[0042] In the semiconductor testing process, the test interface board, as part of the peripheral circuit, usually uses relays to switch between different resources to meet various test requirements. However, in actual production testing, relays may have faults such as poor contact and coil damage, resulting in test abnormalities. When such problems occur, it is usually necessary to stop the test and perform troubleshooting, which not only affects production efficiency but also increases maintenance costs.
[0043] In view of the above problems, a fault detection circuit of a relay is provided in one embodiment of the present disclosure, wherein a test machine outputs a test signal for detecting whether the relay has a fault, and feeds back through a fourth circuit in the test circuit. During the test, the relay to be detected controls the first circuit and the second circuit to be alternately turned on according to the test signal, and the test machine confirms whether the relay to be detected can be switched according to the conduction state of the first circuit to determine whether the relay to be detected is normal. If the first circuit can switch between the on and off states, it is determined that the relay is working normally. If the first circuit is always in the on or off state, it is determined that the relay has a fault.
[0044] An embodiment of the present disclosure provides a relay fault detection circuit, which includes: a test machine 100 and a relay to be detected 200.
[0045] The test machine 100 is used to output a test signal for detecting whether the relay 200 to be tested has a fault;
[0046] The relay to be tested 200 includes a first circuit 201 for connecting the test machine 100 and the test circuit 400 in a controlled manner and a second circuit 202 for connecting the peripheral circuit 300 and the test circuit 400, and is configured to control the first circuit 201 and the second circuit 202 to be alternately turned on according to the test signal;
[0047] The test circuit 400 includes a third line 401 connected to an external test terminal 403 and a fourth line 402 grounded through an impedance unit 405, and the test circuit 400 is configured to turn on the fourth line 402 according to the test signal;
[0048] Among them, the conduction of the fourth circuit 402 forms a first test path from the test machine 100 to the ground via the first circuit 201 and the fourth circuit 402, so as to determine whether the relay 200 to be detected is faulty by testing whether the alternating conduction is correct; the conduction of the first circuit 201 forms a second test path for testing the material under test from the test machine 100 to the test end via the first circuit 201 and the third circuit 401; the conduction of the second circuit 202 forms a third test path for testing the material under test from the peripheral circuit 300 to the material under test via the second circuit 202, the third circuit 401 and the external test end 403.
[0049] Specifically, in some embodiments, when the relay is tested, the test circuit 400 will conduct the fourth line 402 according to the test signal, thereby forming a first test path from the test machine 100 to the ground via the first line 201 and the fourth line 402, and the first test path is used to verify whether the relay can correctly conduct the first line 201 and the second line 202 alternately as expected, so as to determine whether the relay fails. When the material to be tested is tested, the first line 201 is in a conducting state, forming another second test path from the test machine 100 to the external test terminal 403 via the first line 201 and the third line 401, which can be used to test the material to be tested. Similarly, when the second line 202 is turned on, a third test path from the peripheral circuit 300 to the material to be tested via the second line 202, the third line 401 and the external test terminal 403 will be formed, which is also used in the test process of the material to be tested. Since the entire detection process can be carried out without affecting the normal operation of the original circuit, real-time online monitoring of the relay state can be achieved, and potential problems can be discovered and handled in a timely manner.
[0050] Further, in some embodiments, when fault detection is performed on a relay, detection is usually performed without material. When the relay is not connected to any actual load or peripheral circuit 300, the influence of these external factors on the test results can be avoided. For example, characteristics such as load resistance and inductance may change the working state of the relay, thereby concealing its own fault. In the absence of material, the test machine 100 can directly control and monitor the switching behavior of the relay, making the detection process more direct and pure, and helping to more accurately determine whether there is an internal problem with the relay. On the other hand, if the relay has a short circuit or other serious faults, detection under load may cause excessive current, thereby damaging the connected load equipment or causing safety hazards. In the absence of material conditions, a series of preset test signals can be used to quickly verify whether the basic functions of the relay are working properly, such as whether the contact closure / disconnection is correct, the coil response speed, etc.
[0051] Optionally, the relay to be detected 200 further includes:
[0052] A relay switch module 203 is disposed between the first circuit 201 and the second circuit 202 and connected to the test machine 100 in a controlled manner. The relay switch module 203 is configured to conduct the first circuit 201 or the second circuit 202 based on the test signal.
[0053] Specifically, in some embodiments, when the test machine 100 sends a test signal indicating that the first line 201 is turned on, the relay switch module 203 connects the first line 201 with the test circuit 400, forming a first test path from the test machine 100 to the ground via the first line 201 and the fourth line 402. When the second line 202 needs to be turned on, it switches to the second line 202. The relay switch module 203 can execute the instructions of the test signal to ensure that the first line 201 and the second line 202 are alternately turned on in a predetermined order, and then the test machine 100 determines whether the relay has poor contact or other internal faults by monitoring the current or voltage changes in the first test path.
[0054] Optionally, the relay switch module 203 includes: a single-pole double-throw switch element, including a common end connected to the test circuit 400, and a switch control end connected to the test machine 100 or the peripheral circuit 300; the single-pole double-throw switch element switches the first line 201 or the second line 202 to conduct based on the test signal received by the switch control end.
[0055] In some embodiments, the SPDT switch element can switch between two different states through a simple control signal, reducing the need for complex control logic. Compared with multiple independent switches, the SPDT switch element has a more compact design, reduces failure points, and improves the overall reliability of the system.
[0056] Optionally, the relay to be detected 200 further includes:
[0057] A control module 204 is coupled to the test machine 100 and the relay switch module 203 , respectively, and is used to control the relay switch module 203 to switch the conduction of the first circuit 201 or the second circuit 202 according to the test signal.
[0058] Specifically, in some embodiments, if the test signal indicates "connecting the test machine 100", the control module 204 instructs the relay switch module 203 to connect the switch control end to the test machine 100, so that the first line 201 is turned on and the second line 202 is turned off, so that the first test path is turned on. If the test signal indicates "connecting the peripheral circuit 300", the control module 204 instructs the relay switch module 203 to connect the switch control end to the peripheral circuit 300, so that the second line 202 is turned on and the first line 201 is turned off, so that the first test path is turned off. If the control module 204 can correctly instruct the relay switch module 203 to switch the line according to the test signal, and the fourth line 402 can be correctly turned on, it is determined that the relay and its switch module are working normally. If the control module 204 fails to correctly instruct the switching, or the fourth line 402 cannot be turned on as expected, it is determined that there is a fault.
[0059] Optionally, the test circuit 400 includes a test switch unit 404, which is disposed in the fourth line 402 and connected to the test machine 100 in a controlled manner, and is used to control the on-off of the fourth line 402 according to the test signal.
[0060] In some embodiments, the test switch unit 404 can disconnect the fourth line 402 when the relay 200 to be tested does not need to be tested, thereby isolating the lines in different test scenarios. When it is necessary to detect whether the relay is switched correctly, a complete current path (i.e., the fourth line 402) can be formed by closing the test switch unit 404. In some embodiments, the connection between the external test terminal 403 and the material to be tested is disconnected, and the first line 201 should be in a short-circuit state when it is turned on (i.e., the current path is formed, but there is no external load). When the first line 201 is disconnected, it should be in an open circuit state (i.e., no current passes). In some embodiments, when the third line 401 is connected to the material to be tested, when the first line 201 is turned on, if the current path through the material to be tested is normal (such as measuring the expected resistance value or current level of the impedance unit 405), it means that the relay and the material to be tested connected to it are normal. When the first line 201 is disconnected, if no current passes, it means that the relay is normal. If the first line 201 is always turned on, the possible reasons include that the coil is continuously energized, causing the contacts connected to the test motor to be unable to reset, or the mechanical part is stuck. The first line 201 is always disconnected, which may be due to the coil not receiving enough driving signals or the poor contact between the contacts of the relay 200 to be detected.
[0061] Optionally, the test switch unit 404 includes a jumper module 4041, which is respectively connected to the relay to be tested 200 and the test machine 100; the jumper module 4041 includes a first end connected to the external test end 403 and the relay to be tested 200 and a second end connected to the impedance unit 405; the jumper module 4041 is configured to drive a jumper cap to connect or disconnect the first end and the second end according to a test signal.
[0062] Specifically, in some embodiments, the jumper cap is used as a movable conductive element to physically connect or disconnect the circuit between the first end and the second end. When the test machine 100 sends a test signal indicating conduction, the control device in the jumper module 4041 drives the jumper cap to connect the first end and the second end; and when disconnection is required, the jumper cap is restored to the initial position to disconnect the connection between the two.
[0063] Optionally, the test machine 100 further includes a signal output module 101, connected to the relay 200 to be tested, and used to control the relay 200 to be tested to connect or disconnect the first circuit 201 or the second circuit 202 according to the test signal. The signal output module 101 generates a specific electrical signal (such as a voltage pulse, a current pulse, etc.) to indicate the action of the relay. When the signal output module 101 sends a control signal, it causes the coil of the relay 200 to be tested to be energized or de-energized, so that the moving contact and the static contact are in contact or separated, and the first circuit 201 is connected or disconnected.
[0064] Optionally, the impedance unit 405 is one or more resistors for controlling the electrical characteristics of the fourth line 402 and ensuring the stability and consistency of the current and voltage during the test. The simplest configuration is a fixed value resistor for providing a stable impedance characteristic. Multiple resistors can also be used in series or in parallel to achieve more sophisticated impedance adjustment. In order to meet different test requirements, an adjustable resistor (such as a potentiometer) can also be used to allow the user to manually or automatically adjust the impedance value according to actual conditions. Appropriate selection of the resistance value can limit the maximum current and prevent equipment damage or safety hazards caused by overload.
[0065] In another embodiment of the present disclosure, a fault detection method for a relay is provided, wherein the fault detection circuit described in any one of the above items is used to test the relay 200 to be detected; the fault detection method comprises:
[0066] Step S1: when testing the relay 200 to be tested, the fourth line 402 is turned on according to the test signal generated by the test machine 100;
[0067] Step S2: controlling the relay to be detected 200 to alternately conduct the first circuit 201 and the second circuit 202 according to the test signal to obtain the corresponding conduction status of the first circuit 201;
[0068] Step S3: generating a fault detection result according to the conduction condition.
[0069] Optionally, the fault detection result includes:
[0070] When the relay 200 to be detected is normal, the first circuit 201 switches between the on state and the off state;
[0071] When the relay 200 to be detected is abnormal, the first line 201 is always in the on state\off state.
[0072] Specifically, the test machine 100 generates a test signal according to a preset program, indicating that the fourth line 402 is turned on. The fourth line 402 is grounded through the impedance unit 405, forming a first test path from the test machine 100 to the ground via the first line 201 and the fourth line 402. The test machine 100 continues to output a test signal, indicating that the relay 200 to be tested alternately turns on the first line 201 and the second line 202. After receiving the signal, the relay switch module 203 sequentially turns on the first line 201 and the second line 202 in a predetermined order to simulate the working state in the actual application scenario. At each switch, the test machine 100 monitors and records the conduction condition (i.e., the on state or the off state) of the first line 201. According to the monitored conduction condition of the first line 201, the test machine 100 generates the final fault detection result: when the relay is normal: the first line 201 can switch smoothly between the on state and the off state, indicating that the relay contacts are operating normally, without poor contact or other internal faults. When the relay is abnormal: If the first line 201 is always in the on state or the off state, it means that the relay is faulty, which may be caused by contact adhesion, coil failure, etc. After completing the above detection steps, the test machine 100 will present the fault detection results to the user, for example, by displaying a prompt message of "normal" or "abnormal" on the display screen. If any abnormal situation is found, the test machine will generate an alarm message and prompt the user to take further measures, such as replacing the relay.
Claims
1. A fault detection circuit for a relay, characterized in that: include: A testing machine, used to output a test signal for detecting whether the relay to be tested has a fault; a relay to be tested, comprising a first circuit for connecting the test machine and the test circuit in a controlled manner and a second circuit for connecting a peripheral circuit and the test circuit, and configured to control the first circuit and the second circuit to be alternately turned on according to the test signal; The test circuit comprises a third line connected to the external test terminal and a fourth line grounded through an impedance unit, and the test circuit is configured to turn on the fourth line according to the test signal; Among them, the conduction of the fourth circuit forms a first test path from the test machine to the ground through the first circuit and the fourth circuit, so as to determine whether the relay to be detected is faulty by testing the correctness of the alternating conduction; the conduction of the first circuit forms a second test path from the test machine to the test end through the first circuit and the third circuit for testing the material under test; the conduction of the second circuit forms a third test path from the peripheral circuit to the material under test through the second circuit, the third circuit and the external test end for testing the material under test.
2. The fault detection circuit according to claim 1, characterized in that: The relay to be detected also includes: A relay switch module is provided between the first circuit and the second circuit and is connected to the test machine in a controlled manner. The relay switch module is configured to conduct the first circuit or the second circuit correspondingly based on the test signal.
3. The fault detection circuit according to claim 2, characterized in that: The relay switch module includes: a single-pole double-throw switch element, including a common end connected to the test circuit, and a switch control end connected to the test machine or the peripheral circuit; the single-pole double-throw switch element switches the first circuit or the second circuit to conduct based on the test signal received by the switch control end.
4. The fault detection circuit according to claim 2, characterized in that: The relay to be detected also includes: A control module is coupled to the test machine and the relay switch module respectively, and is used to control the relay switch module to switch the conduction of the first circuit or the second circuit according to the test signal.
5. The fault detection circuit according to claim 1, characterized in that: The test circuit includes a test switch unit, which is arranged in the fourth circuit and connected to the test machine in a controlled switch state, and is used for controlling the on and off of the fourth circuit according to the test signal.
6. The fault detection circuit according to claim 5, characterized in that: The test switch unit includes a jumper module, which is respectively connected to the relay to be tested and the test machine; the jumper module includes a first end connected to the external test end and the relay to be tested and a second end connected to the impedance unit; the jumper module is configured to drive a jumper cap to connect or disconnect the first end and the second end according to a test signal.
7. The fault detection circuit according to claim 1, characterized in that: The test machine further includes a signal output module connected to the relay to be detected, and used for controlling the relay to be detected to correspondingly turn on or off the first circuit or the second circuit according to the test signal.
8. The fault detection circuit according to claim 1, characterized in that: The impedance unit is one or more impedance units.
9. A method for detecting a fault of a relay, characterized in that: Using the fault detection circuit as described in any one of claims 1 to 8 to test the relay to be detected; The fault detection method comprises: When the relay to be detected is tested, the fourth circuit is turned on correspondingly according to the test signal generated by the test machine; According to the test signal, the relay to be tested is controlled to alternately conduct the first circuit and the second circuit to obtain the conduction condition of the corresponding first test path; A fault detection result is generated according to the conduction condition.
10. The fault detection method according to claim 9, characterized in that: The fault detection result includes: When the relay to be detected is normal, the first test path switches between an on state and an off state; When the relay to be detected is abnormal, the first test path is always in an on state\off state.