Method and device for testing performance of single-photon detector

Abstract

The invention relates to a single-photon detector performance test method and device. The method comprises the following steps: selecting a target performance test system corresponding to to-be-tested performance from candidate performance test systems according to the performance type of the to-be-tested performance of a to-be-tested detector; wherein the to-be-detected detector is a single-photon detector; placing the to-be-tested detector in a target performance test system to construct a test environment for the to-be-tested detector; according to the performance test requirement of the to-be-tested performance, applying a preset optical signal to the to-be-tested detector in the test environment, and obtaining pulse detection information generated in the process of detecting the preset optical signal by the to-be-tested detector; and determining a test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information. By adopting the method, the test cost in the performance test process of the single-photon detector can be reduced, and the stability of the test process and the accuracy of a test result are ensured.

Description

Technical Field

[0001] The present application relates to the technical field of detectors, and particularly to a method and device for testing the performance of a single-photon detector. Background Art

[0002] A single-photon detector is a highly sensitive detector that can detect only one photon under extremely weak optical signals. It not only plays a key role in encryption and decryption in quantum communication, providing physical security for the absolute security of information, but also helps to achieve precise control and measurement of quantum bits in the field of quantum computing, driving a revolutionary leap in computing power. Therefore, it is necessary to test the performance of a single-photon detector.

[0003] Currently, the testing methods for single-photon detectors are not unified. There are two mainstream simple testing methods, namely the method using a single-photon source as the light source and the method using multi-stage attenuation. However, the method using a single-photon source as the light source has a high cost, and the method using multi-stage attenuation may be affected by environmental factors during long-term use, resulting in changes in the attenuation amount, which will affect the stability and accuracy of the test. Summary of the Invention

[0004] Based on this, in view of the above technical problems, it is necessary to provide a method and device for testing the performance of a single-photon detector, which can reduce the test cost during the performance test of the single-photon detector and ensure the stability of the test process and the accuracy of the test results.

[0005] In a first aspect, the present application provides a method for testing the performance of a single-photon detector, including:

[0006] Select a target performance test system corresponding to the to-be-tested performance from candidate performance test systems according to the performance type of the to-be-tested performance of the to-be-tested detector; wherein, the to-be-tested detector is a single-photon detector;

[0007] Place the to-be-tested detector in the target performance test system to construct a test environment for the to-be-tested detector;

[0008] Apply a preset optical signal to the to-be-tested detector placed in the test environment according to the performance test requirements of the to-be-tested performance, and obtain pulse detection information generated during the process of the to-be-tested detector detecting the preset optical signal;

[0009] Determine the test result of the to-be-tested performance of the to-be-tested detector according to the pulse detection information.

[0010] In one of the embodiments, the step of selecting a target performance test system corresponding to the to-be-tested performance from candidate performance test systems according to the performance type of the to-be-tested performance of the to-be-tested detector includes:

[0011] If the performance type of the performance to be measured of the detector to be measured is time delay performance, then the time delay test system is used as the target performance system;

[0012] If the performance type of the performance to be measured of the detector to be measured is floodlight performance, then the floodlight performance test system is used as the target performance system;

[0013] If the performance type of the performance to be measured of the detector to be measured is focusing performance, then the focusing performance test system is used as the target performance system.

[0014] In one embodiment, the time delay test system includes: a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a mirror, and a focusing optical element;

[0015] The output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the mirror is placed at a first preset orientation with respect to the output end of the optical system; a focusing optical element is placed vertically above the mirror;

[0016] Placing the detector to be measured in the target performance test system includes:

[0017] Placing the detector to be measured vertically above the focusing optical element.

[0018] In one embodiment, when the target performance system is the time delay test system, the step of applying a preset optical signal to the target performance test system including the detector to be measured according to the performance test requirements of the performance to be measured includes:

[0019] Configuring a first time delay parameter of the digital delay line and a second time delay parameter of the optical fiber delay line according to the performance test requirements of the performance to be measured;

[0020] According to the performance test requirements, controlling the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay line, and the preset optical signal passes through the configured optical fiber delay line and the optical system in sequence, is reflected by the mirror and reaches the focusing optical element, and is focused by the focusing optical element and then reaches the detector to be measured;

[0021] Correspondingly, the step of determining the test result of the performance to be measured of the detector to be measured according to the pulse detection information includes:

[0022] Determine the test result of the performance to be measured of the detector to be tested according to the pulse arrival time in the pulse detection information, the first time delay parameter, and the second time delay parameter.

[0023] In one embodiment, the omnidirectional light performance test system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineering diffuser;

[0024] The output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the collimator; the reflector is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the reflector;

[0025] Correspondingly, placing the detector to be tested in the target performance test system includes:

[0026] Place the detector to be tested vertically above the engineering diffuser.

[0027] In one embodiment, when the target performance test system is an omnidirectional light performance test system, the process of applying a preset optical signal to the target performance test system including the detector to be tested according to the performance test requirements of the performance to be measured, and obtaining the pulse detection information generated during the process of the detector to be tested detecting the preset optical signal includes:

[0028] According to the performance test requirements of the performance to be measured, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the collimator in sequence, is reflected by the reflector and reaches the engineering diffuser, and is scattered by the engineering diffuser and then reaches the detector to be tested.

[0029] In one embodiment, the pulse detection information includes the intensity information and time information of the output signals of each pixel;

[0030] The process of determining the test result of the performance to be measured of the detector to be tested according to the pulse detection information includes:

[0031] Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel;

[0032] Determine the test result of the performance to be measured of the detector to be tested according to the maximum deviation, intensity information, and time information of each pixel.

[0033] In one embodiment, the focusing performance test system includes: a waveform generator, a pulsed light source, an attenuator, a beam expander tube, a mirror, and a focusing optical element;

[0034] The output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander tube; the mirror is placed at a third preset orientation with respect to the output end of the beam expander tube; a focusing optical element is placed vertically above the mirror;

[0035] Correspondingly, placing the detector under test in the target performance test system includes:

[0036] Placing the detector under test vertically above the engineering scatter plate.

[0037] In one embodiment, when the target performance test system is a focusing performance test system, applying a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance to be measured includes:

[0038] According to the performance test requirements of the performance to be measured, controlling the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the beam expander tube in sequence, is reflected by the mirror and reaches the focusing optical element, and after being focused by the focusing optical element, reaches the detector under test;

[0039] Correspondingly, the pulsed detection information includes the output signals of each pixel. Determining the test result of the performance to be measured of the detector under test according to the pulsed detection information includes:

[0040] For each pixel, according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel, determining the crosstalk information of the pixel;

[0041] According to the crosstalk information of each pixel, determining the test result of the performance to be measured of the detector under test.

[0042] In a second aspect, the present application also provides a single-photon detector performance test device, including:

[0043] A system selection module, configured to select the target performance test system corresponding to the performance to be measured from the candidate performance test systems according to the performance type of the performance to be measured of the detector under test; wherein, the detector under test is a single-photon detector;

[0044] An environment construction module, configured to place the detector under test in the target performance test system to construct a test environment for the detector under test;

[0045] An information acquisition module, configured to apply a preset optical signal to a detector under test placed in the test environment according to the performance test requirements of the performance to be measured, and acquire pulse detection information generated during the process of the detector under test detecting the preset optical signal;

[0046] A performance test module, configured to determine a test result of the performance to be measured of the detector under test according to the pulse detection information.

[0047] In a third aspect, the present application further provides a computer device, including a memory and a processor, where the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0048] Select a target performance test system corresponding to the performance to be measured from candidate performance test systems according to the performance type of the performance to be measured of the detector under test; wherein, the detector under test is a single-photon detector;

[0049] Place the detector under test in the target performance test system to construct a test environment for the detector under test;

[0050] Apply a preset optical signal to the detector under test placed in the test environment according to the performance test requirements of the performance to be measured, and acquire pulse detection information generated during the process of the detector under test detecting the preset optical signal;

[0051] Determine a test result of the performance to be measured of the detector under test according to the pulse detection information.

[0052] In a fourth aspect, the present application further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0053] Select a target performance test system corresponding to the performance to be measured from candidate performance test systems according to the performance type of the performance to be measured of the detector under test; wherein, the detector under test is a single-photon detector;

[0054] Place the detector under test in the target performance test system to construct a test environment for the detector under test;

[0055] Apply a preset optical signal to the detector under test placed in the test environment according to the performance test requirements of the performance to be measured, and acquire pulse detection information generated during the process of the detector under test detecting the preset optical signal;

[0056] Determine a test result of the performance to be measured of the detector under test according to the pulse detection information.

[0057] Fifth aspect, the present application further provides a computer program product, including a computer program, which when executed by a processor implements the following steps: wherein, the detector to be tested is a single-photon detector;

[0058] According to the performance type of the performance to be tested of the detector to be tested, select the target performance test system corresponding to the performance to be tested from the candidate performance test systems;

[0059] Place the detector to be tested in the target performance test system to construct a test environment for the detector to be tested;

[0060] According to the performance test requirements of the performance to be tested, apply a preset optical signal to the detector to be tested placed in the test environment, and obtain the pulse detection information generated during the process of the detector to be tested detecting the preset optical signal;

[0061] According to the pulse detection information, determine the test result of the performance to be tested of the detector to be tested.

[0062] The above single-photon detector performance test method and device, by constructing multiple candidate performance test systems, and according to the performance type of the performance to be tested of the detector to be tested, select the target performance test system corresponding to the performance to be tested from the candidate performance test systems, ensuring the adaptability and accuracy of the determined target performance test system; further, place the detector to be tested in the target performance test system to construct a test environment for the detector to be tested, and according to the performance test requirements of the performance to be tested, apply a preset optical signal to the detector to be tested placed in the test environment, ensuring the accuracy of the simulation process of the detector to be tested, and further ensuring the accuracy of the pulse detection information generated during the process of the detector to be tested detecting the preset optical signal; finally, according to the pulse detection information, determine the test result of the performance to be tested of the detector to be tested, further ensuring the accuracy of the test result and the stability of the test process. In addition, the above solution reduces the test cost of the test process by pre-building candidate performance test systems. Description of the Drawings

[0063] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0064] Figure 1 It is an application environment diagram of the single-photon detector performance test method in an embodiment;

[0065] Figure 2 Schematic flow chart of the performance test method for a single - photon detector in one embodiment;

[0066] Figure 3 Schematic flow chart of the test environment diagram of the time - delay test system in one embodiment;

[0067] Figure 4 Schematic flow chart of the test environment diagram of the flood - light performance test system in one embodiment;

[0068] Figure 5 Schematic flow chart of the test results for determining the performance to be measured of the detector to be tested in one embodiment;

[0069] Figure 6 Schematic flow chart of the test environment diagram of the focusing performance test system in one embodiment;

[0070] Figure 7 Schematic flow chart of the test results for determining the performance to be measured of the detector to be tested in another embodiment;

[0071] Figure 8 Schematic flow chart of the performance test method for a single - photon detector in another embodiment;

[0072] Figure 9 Block diagram of the structure of the single - photon detector performance test device in one embodiment;

[0073] Figure 10 Internal structure diagram of a computer device in one embodiment. Detailed implementation manners

[0074] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0075] The single - photon detector performance test method provided by the embodiments of the present application can be applied to, for example Figure 1In the application environment shown. Among them, the detector to be tested 101 is the detector that needs to be tested for performance. In the embodiment of the present application, the detector to be tested can be a single-photon detector; the target performance test system 102 is a system for testing the performance to be tested of the detector to be tested; the control device 103 is used to execute the single-photon detector performance test method provided by the embodiment of the present application, that is, to control the detector to be tested and the target performance test system. Optionally, the control device 103 selects the target performance test system 102 corresponding to the performance to be tested from the candidate performance test systems according to the performance type of the performance to be tested of the detector to be tested; among them, the detector to be tested is a single-photon detector; the detector to be tested 101 is placed in the target performance test system 102 to construct a test environment for the detector to be tested; according to the performance test requirements of the performance to be tested, a preset optical signal is applied to the detector to be tested placed in the test environment, and the pulse detection information generated during the detection of the preset optical signal by the detector to be tested is obtained; according to the pulse detection information, the test result of the performance to be tested of the detector to be tested is determined.

[0076] In one embodiment, as Figure 2 shown, a single-photon detector performance test method is provided. Taking the control device 103 in Figure 1 as an example, the specific steps are as follows:

[0077] S201, according to the performance type of the performance to be tested of the detector to be tested, select the target performance test system corresponding to the performance to be tested from the candidate performance test systems.

[0078] Among them, the detector to be tested is the detector that needs to be tested for performance. In the embodiment of the present application, the detector to be tested is a single-photon detector; the performance to be tested is the performance of the detector to be tested that needs to be tested, and the performance type includes but is not limited to time delay performance, floodlight performance, and focusing performance, etc.; the candidate performance test system is a system pre-built for testing the performance of the detector to be tested. In the embodiment of the present application, the candidate performance test systems include but are not limited to delay performance test systems, floodlight performance test systems, and focusing performance test systems, etc.

[0079] Among them, the time delay performance test aims to verify the time resolution ability of the detector to be tested, that is, to accurately distinguish the time intervals of continuously arriving photons. The floodlight performance test aims to evaluate the response uniformity, sensitivity, and signal-to-noise ratio of the detector to be tested within a wide field of view. The focusing performance test aims to measure the spatial resolution of the detector to be tested for the position of photons and the recognition ability of the spot shape.

[0080] It should be noted that since the performance types of the performance to be tested of the detector to be tested are different, the corresponding test environments are also different. That is to say, each performance type of the performance to be tested can correspond to a performance test system for building a test environment, and all the performance test systems corresponding to the performance types are used as candidate performance test systems.

[0081] On this basis, if it is necessary to test the performance to be tested of the detector to be tested, the target performance test system corresponding to the performance to be tested can be selected from the candidate performance test systems according to the performance type of the performance to be tested and the corresponding relationship between the performance type and the performance test system.

[0082] Exemplarily, if the performance type of the performance to be tested of the detector to be tested is the time delay performance, the time delay test system is used as the target performance system; if the performance type of the performance to be tested of the detector to be tested is the floodlight performance, the floodlight performance test system is used as the target performance system; if the performance type of the performance to be tested of the detector to be tested is the focusing performance, the focusing performance test system is used as the target performance system. It can be understood that selecting the corresponding target performance system according to the performance type of the performance to be tested ensures the accuracy and adaptability of the determined target performance system.

[0083] S202, Place the detector to be tested in the target performance test system to construct a test environment for the detector to be tested.

[0084] Optionally, based on the design layout of the target performance test system, the detector to be tested can be placed in the corresponding position and connected to other devices in the target performance test system to build a test environment for the detector to be tested.

[0085] S203, According to the performance test requirements of the performance to be tested, apply a preset optical signal to the detector to be tested placed in the test environment, and obtain the pulse detection information generated during the process of the detector to be tested detecting the preset optical signal.

[0086] Among them, the performance test requirements characterize the test standards of the performance to be tested, that is, the light source type required during the performance test process, the processing requirements during the transmission process of the optical signal, etc. The pulse detection information is the information generated during the process of the detector to be tested detecting the preset optical signal.

[0087] Generally, a specified optical signal is generated as the preset optical signal according to the performance test requirements of the performance to be tested, and the preset optical signal is processed by various optical elements in the target performance test system and irradiated on the detector to be tested; further, the detector to be tested detects the preset optical signal and generates pulse detection information.

[0088] S204. Determine the test result of the performance to be measured of the detector to be measured according to the pulse detection information.

[0089] Optionally, parameter information reflecting the degradation degree of the performance to be measured can be extracted from the pulse detection information; further, the extracted parameter information is analyzed and compared with the parameter information of the preset optical signal to evaluate whether the performance to be measured of the detector to be measured degrades.

[0090] In the above single-photon detector performance test method, by constructing multiple candidate performance test systems and selecting the target performance test system corresponding to the performance to be measured from the candidate performance test systems according to the performance type of the performance to be measured of the detector to be measured, the adaptability and accuracy of the determined target performance test system are ensured; further, the detector to be measured is placed in the target performance test system to construct a test environment for the detector to be measured, and a preset optical signal is applied to the detector to be measured placed in the test environment according to the performance test requirements of the performance to be measured, ensuring the accuracy of the simulation process of the detector to be measured, and further ensuring the accuracy of the pulse detection information generated during the process of the detector to be measured detecting the preset optical signal; finally, the test result of the performance to be measured of the detector to be measured is determined according to the pulse detection information, further ensuring the accuracy of the test result and the stability of the test process. In addition, the above solution reduces the test cost of the test process by pre-building the candidate performance test system.

[0091] It can be analyzed from the above embodiments that different performance types of the performance to be measured correspond to different target performance test systems. In the embodiments of the present application, taking the time delay test system, the floodlight performance test system, and the focusing performance test system as examples of the target performance test systems respectively, the process of placing the detector to be measured in the target performance test system and the process of applying a preset optical signal to the target performance test system including the detector to be measured according to the performance test requirements of the performance to be measured are described in detail.

[0092] Optionally, when the target performance test system is a time delay test system, as Figure 3 shown, a schematic diagram of the test environment of the detector to be measured is provided. Among them, the time delay test system includes a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a reflector, and a focusing optical element. The output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the reflector is placed at a first preset orientation with respect to the output end of the optical system; a focusing optical element is placed vertically above the reflector. Further, the detector to be measured can be placed vertically above the focusing optical element. As Figure 3The avalanche photodiode (APD) in it is placed on the focal plane array (FPA). For the convenience of subsequent calculations, a coordinate system can be constructed based on the focal plane. As shown in Figure 3 X / Y and Z in it, which are the X-direction, Y-direction, and Z-direction of the coordinate system respectively. Among them, the avalanche photodiode is the detector to be measured.

[0093] Among them, the active pulse light source has high stability and high repeatability and can be a laser for generating optical signals; the digital delay line and the fiber optic delay line are used to achieve precise delay functions; the detector to be measured can be an avalanche focal plane detector.

[0094] On this basis, according to the performance test requirements of the performance to be measured, applying a preset optical signal to the target performance test system including the detector to be measured can be achieved in the following way: according to the performance test requirements of the performance to be measured, configure the first delay parameter of the digital delay line and the second delay parameter of the fiber optic delay line; according to the performance test requirements, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal passes through the configured digital delay line to trigger the active pulse light source to generate a preset optical signal, and after the preset optical signal passes through the configured fiber optic delay line and the optical system in sequence, it is reflected by the mirror to reach the focusing optical element, and after being focused by the focusing optical element, it reaches the detector to be measured.

[0095] Among them, the first delay parameter is the parameter used by the digital delay line to simulate the delay of the preset optical signal; the second delay parameter is the parameter used by the fiber optic delay line to simulate the delay of the preset optical signal.

[0096] Optionally, as shown in Figure 3 It can be determined according to the performance test requirements of the performance to be measured the waveform signal required in the performance test process of the performance to be measured as the preset waveform signal, and the parameters of the waveform generator are adjusted so that the waveform generator interprets the preset waveform signal. Further, after the preset waveform signal is delayed by the digital delay line, it triggers the active pulse light source to generate a preset optical signal; the preset optical signal generated by the active pulse light source passes through the configured fiber optic delay line and the optical system in sequence and then reaches the focusing optical element, and after being focused by the focusing optical element, it reaches the detector to be measured.

[0097] Further, the detector to be measured detects the preset optical signal after a series of processes and generates pulse detection information. In the embodiments of the present application, the pulse detection information includes but is not limited to the pulse arrival time. On this basis, according to the pulse detection information, determining the test result of the performance to be measured of the detector to be measured can be achieved in the following way: according to the pulse arrival time, the first delay parameter, and the second delay parameter in the pulse detection information, determine the test result of the performance to be measured of the detector to be measured.

[0098] Exemplarily, the pulse arrival time can be converted into corresponding actual time information or actual distance information, and the expected time information or expected distance information can be determined according to the first time delay parameter and the second time delay parameter. Further, the test result of the performance to be measured of the detector to be tested can be determined according to the comparison result between the actual time information and the expected time information, or according to the comparison result between the actual distance information and the expected distance information.

[0099] Optionally, in the case where the target performance test system is a floodlight performance test system, as Figure 4 shown, a schematic diagram of the test environment for the detector to be tested is provided. Among them, the floodlight performance test system includes a waveform generator, a pulse light source, an attenuator, a collimator (such as a large-aperture collimator), a reflector, and an engineering diffuser. The output end of the waveform generator is connected to the input end of the pulse light source; an attenuator is placed between the output end of the pulse light source and the input end of the collimator; the reflector is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the reflector. Further, the detector to be tested is placed vertically above the engineering diffuser.

[0100] Among them, the pulse light source can be a pulsed surface light source or a shaped laser light source, and can perform floodlight illumination on the detector array to be tested.

[0101] On this basis, according to the performance test requirements of the performance to be measured, applying a preset optical signal to the target performance test system including the detector to be tested can be achieved in the following way: according to the performance test requirements of the performance to be measured, controlling the waveform generator to generate a preset waveform signal, so that the waveform signal triggers the pulse light source to generate a preset optical signal, and after the preset optical signal passes through the attenuator and the collimator in sequence, it is reflected by the reflector and reaches the engineering diffuser, and is scattered by the engineering diffuser and then reaches the detector to be tested.

[0102] Optionally, as Figure 4 shown, after the performance test environment is set up, the performance test environment can be initially calibrated, and the calibration parameters include but are not limited to light source intensity, light source uniformity, response characteristics of the detector array, etc. According to the performance test requirements, the pulsed surface light source or the shaped laser light source can be adjusted to floodlight irradiate the detector array to be tested with a collimated and uniform laser radiation flux. Ensure good alignment between the light source and the detector array to avoid the influence of optical errors on the test results. In the floodlight performance test system, the detector to be tested is placed in a uniformly distributed photon environment.

[0103] After calibration, according to the performance test requirements of the performance to be measured, the waveform generator can be controlled to generate a preset waveform signal. The preset waveform signal triggers a pulsed light source to generate a preset optical signal. Further, after the preset optical signal passes through an attenuator and a collimator in sequence, it is reflected by a reflector and reaches an engineering diffuser, and after being scattered by the engineering diffuser, it reaches the detector under test.

[0104] Further, the detector under test detects the preset optical signal after a series of processes and generates pulsed detection information. Exemplarily, the output signals of each pixel can be collected, including intensity information and time information. In the embodiments of the present application, the pulsed detection information includes, but is not limited to, the intensity information and time information of the output signals of each pixel. On this basis, as Figure 5 shown, a method for determining the test result of the performance to be measured of the detector under test is provided, which specifically includes the following steps:

[0105] S501, determine the maximum deviation of each pixel according to the intensity information and time information of each pixel.

[0106] Among them, the intensity information characterizes the signal intensity of the preset optical signal received by the detector under test; the time information characterizes the time when the detector under test receives the preset optical signal. It should be noted that the intensity information and time information output by the detector under test change with the output optical power or delay time of the preset optical signal, and the linearity is calculated from the deviation of the relationship curve from the fitted straight line.

[0107] Optionally, according to the intensity information and time information of each pixel, based on statistical theory, the outputs of each pixel can be statistically analyzed, and the maximum deviation of each pixel can be calculated.

[0108] S502, determine the test result of the performance to be measured of the detector under test according to the maximum deviation, intensity information and time information of each pixel.

[0109] Optionally, according to the maximum deviation, intensity information and time information of each pixel, parameters such as the minimum detectable power, photon detection efficiency and its uniformity, and in-frame time jitter can be calculated; further, according to the calculated index values of each parameter, the test result of the performance to be measured of the detector under test can be determined.

[0110] In this embodiment, by introducing the intensity information and time information of each pixel, the accuracy of the determined maximum deviation of each pixel is ensured; further, according to the introduced maximum deviation, the test result of the performance to be measured of the detector under test can be accurately determined.

[0111] Optionally, in the case where the target performance test system is a focusing performance test system, as Figure 6As shown in the figure, a schematic diagram of the test environment for the detector to be tested is provided. Among them, the focusing performance test system includes a waveform generator, a pulsed light source, an attenuator, a beam expander (or collimator), a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander; the mirror is placed at a third preset orientation with respect to the output end of the beam expander; a focusing optical element is placed vertically above the mirror; further, the detector to be tested can be placed vertically above the engineering scatter sheet. Among them, the pulsed light source can be a high-precision focusing light source, such as a laser beam.

[0112] On this basis, according to the performance test requirements of the performance to be measured, applying a preset optical signal to the target performance test system including the detector to be tested can be achieved in the following way: according to the performance test requirements of the performance to be measured, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers the pulsed light source to generate a preset optical signal, and after the preset optical signal passes through the attenuator and the beam expander in sequence, it is reflected by the mirror and reaches the focusing optical element, and after being focused by the focusing optical element, it reaches the detector to be tested.

[0113] Exemplarily, as Figure 6 shown, a mathematical model can be used to describe the optical system composed of a laser beam, a collimator tube, and a focusing optical element, and by analyzing the optical system, the optimal spot size and position can be determined to ensure that the spot can be accurately focused on the pixel center. Conduct in-depth research on key optical elements, evaluate the possible aberrations and distortions, as well as the final focusing performance. Further, perform initial calibration on the performance test environment, including the light source intensity, the position and angle of the optical elements, etc. Use a microscope or similar equipment to ensure that the laser beam can be accurately focused on a single pixel of the detector to be tested. Select a pixel as the test object and adjust the laser beam to focus on this pixel.

[0114] Further, the detector to be tested detects the preset optical signal after a series of processes and generates pulsed detection information. Exemplarily, the output signal of the focused pixel can be collected, and the signals of adjacent pixels can be monitored simultaneously. In the embodiments of the present application, the pulsed detection information includes, but is not limited to, the output signals of each pixel. On this basis, as Figure 7 shown, a method for determining the test result of the performance to be measured of the detector to be tested is provided, which specifically includes the following steps:

[0115] S701, for each pixel, determine the crosstalk information of this pixel according to the output signal of this pixel and the output signals of the adjacent pixels of this pixel.

[0116] Among them, the crosstalk information characterizes the measure of the signal from adjacent pixels when this pixel is irradiated by a focused small spot.

[0117] Optionally, for each pixel, the output signal of the pixel and the output signals of the adjacent pixels of the pixel can be extracted; further, the crosstalk level of the pixel is evaluated according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel, and the crosstalk information of the pixel is generated.

[0118] S702. Determine the test result of the performance to be measured of the detector to be tested according to the crosstalk information of each pixel.

[0119] Optionally, the crosstalk information of each pixel can be combined, and the crosstalk situation of the detector to be tested can be comprehensively statistically evaluated, and the test result of the performance to be measured of the detector to be tested can be determined.

[0120] It should be noted that the focused light spot can also be two-dimensionally scanned on the surface of the detector by controlling the x-y scanning range. During the scanning process, the signal intensity at each position is continuously recorded to draw the optical fill factor map. Analyze the optical fill factor map to determine the effective photosensitive area and calculate the value of the optical fill factor. During the entire test process, all relevant data are continuously collected and recorded, including pixel signals, light spot positions, laser intensities, etc. Further, combining the crosstalk information of each pixel, the performance to be measured of the detector to be tested is comprehensively evaluated to determine the test result of the performance to be measured of the detector to be tested.

[0121] In this embodiment, by introducing the crosstalk information and evaluating the crosstalk level of the detector to be tested according to the crosstalk information of each pixel, since the crosstalk level reflects the floodlight ability of the detector to be tested, therefore, the test result of the performance to be measured of the detector to be tested can be accurately determined.

[0122] Figure 8 FIG. is a schematic flowchart of a method for testing the performance of a single-photon detector in another embodiment. On the basis of the above embodiment, this embodiment provides an optional example of a method for testing the performance of a single-photon detector. Combining Figure 8 , the specific implementation process is as follows:

[0123] S801. Determine the performance type of the performance to be measured of the detector to be tested; if the performance type of the performance to be measured of the detector to be tested is the time delay performance, then use the time delay test system as the target performance system and execute S802; if the performance type of the performance to be measured of the detector to be tested is the floodlight performance, then use the floodlight performance test system as the target performance system and execute S807; if the performance type of the performance to be measured of the detector to be tested is the focusing performance, then use the focusing performance test system as the target performance system and execute S811.

[0124] Wherein, the detector to be tested is a single-photon detector.

[0125] S802, Place the detector under test vertically above the focusing optical element in the time delay test system to construct a test environment for the detector under test.

[0126] S803, Configure the first time delay parameter of the digital time delay device and the second time delay parameter of the fiber optic delay line according to the performance test requirements of the performance to be measured.

[0127] S804, According to the performance test requirements, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers an active pulse light source to generate a preset optical signal through the configured digital time delay device, and make the preset optical signal pass through the configured fiber optic delay line and optical system in sequence, then be reflected by the mirror and reach the focusing optical element, and reach the detector under test after being focused by the focusing optical element.

[0128] S805, Obtain the pulse detection information generated during the process of the detector under test detecting the preset optical signal.

[0129] S806, Determine the test result of the performance to be measured of the detector under test according to the first time delay parameter, the second time delay parameter and the pulse arrival time in the pulse detection information.

[0130] S807, Place the detector under test vertically above the engineering diffuser in the floodlight performance test system to construct a test environment for the detector under test.

[0131] S808, According to the performance test requirements of the performance to be measured, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers a pulse light source to generate a preset optical signal, and make the preset optical signal pass through the attenuator and collimator in sequence, then be reflected by the mirror and reach the engineering diffuser, and reach the detector under test after being scattered by the engineering diffuser.

[0132] S809, Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel in the pulse detection information.

[0133] S810, Determine the test result of the performance to be measured of the detector under test according to the maximum deviation, intensity information and time information of each pixel.

[0134] S811, Place the detector under test vertically above the engineering diffuser in the focusing performance test system to construct a test environment for the detector under test.

[0135] S812, According to the performance test requirements of the performance to be measured, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers a pulse light source to generate a preset optical signal, and make the preset optical signal pass through the attenuator and beam expander in sequence, then be reflected by the mirror and reach the focusing optical element, and reach the detector under test after being focused by the focusing optical element.

[0136] S813. Determine the crosstalk information of each pixel according to the output signals of each pixel in the pulse detection information and the output signals of the adjacent pixels of each pixel.

[0137] S814. Determine the test result of the performance to be measured of the detector to be measured according to the crosstalk information of each pixel.

[0138] For the specific processes of the above S801 - S814, reference can be made to the description of the method embodiments above. Their implementation principles and technical effects are similar, and will not be elaborated here.

[0139] It should be understood that although each step in the flowcharts involved in the above - mentioned embodiments is sequentially shown according to the indication of the arrows, these steps do not necessarily need to be executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above - mentioned embodiments may include multiple steps or multiple stages. These steps or stages do not necessarily need to be executed at the same moment, but can be executed at different moments. The execution order of these steps or stages is not necessarily sequential either, but can be executed alternately or in turn with at least a part of other steps or steps or stages in other steps.

[0140] Based on the same inventive concept, an embodiment of the present application also provides a single - photon detector performance testing device for implementing the single - photon detector performance testing method involved above. The implementation solution for solving the problem provided by this device is similar to the implementation solution recorded in the above - mentioned method. Therefore, the specific limitations in one or more embodiments of the single - photon detector performance testing device provided below can refer to the limitations on the single - photon detector performance testing method in the above text, and will not be elaborated here.

[0141] In an exemplary embodiment, as Figure 9 shown, a single - photon detector performance testing device 900 is provided, including: a system selection module 910, an environment construction module 920, an information acquisition module 930, and a performance testing module 940, where:

[0142] The system selection module 910 is configured to select a target performance testing system corresponding to the performance to be measured from the candidate performance testing systems according to the performance type of the performance to be measured of the detector to be measured; where the detector to be measured is a single - photon detector.

[0143] The environment construction module 920 is configured to place the detector to be measured in the target performance testing system to construct a test environment for the detector to be measured.

[0144] An information acquisition module 930 is configured to apply a preset optical signal to a detector under test placed in a test environment according to the performance test requirements of the performance to be measured, and acquire pulse detection information generated during the process of the detector under test detecting the preset optical signal.

[0145] A performance test module 940 is configured to determine the test result of the performance to be measured of the detector under test according to the pulse detection information.

[0146] For the above single-photon detector performance test device, by constructing multiple candidate performance test systems and selecting the target performance test system corresponding to the performance to be measured from the candidate performance test systems according to the performance type of the performance to be measured of the detector under test, the adaptability and accuracy of the determined target performance test system are ensured; further, the detector under test is placed in the target performance test system to construct a test environment for the detector under test, and a preset optical signal is applied to the detector under test placed in the test environment according to the performance test requirements of the performance to be measured, which ensures the accuracy of the simulation process of the detector under test and further ensures the accuracy of the pulse detection information generated during the process of the detector under test detecting the preset optical signal; finally, according to the pulse detection information, the test result of the performance to be measured of the detector under test is determined, which further ensures the accuracy of the test result and the stability of the test process. In addition, the above solution reduces the test cost of the test process by pre-building candidate performance test systems.

[0147] In one embodiment, the system selection module 910 is specifically configured to:

[0148] If the performance type of the performance to be measured of the detector under test is time delay performance, the time delay test system is used as the target performance system; if the performance type of the performance to be measured of the detector under test is floodlight performance, the floodlight performance test system is used as the target performance system; if the performance type of the performance to be measured of the detector under test is focusing performance, the focusing performance test system is used as the target performance system.

[0149] In one embodiment, the time delay test system includes: a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the mirror is placed at a first preset orientation with respect to the output end of the optical system; the focusing optical element is placed vertically above the mirror;

[0150] Correspondingly, the environment building module 920 is specifically configured to:

[0151] Place the detector under test vertically above the focusing optical element.

[0152] In one embodiment, the information acquisition module 930 may be configured to:

[0153] Configure the first time delay parameter of the digital delay line and the second time delay parameter of the optical fiber delay line according to the performance test requirements of the performance to be measured; control the waveform generator to generate a preset waveform signal according to the performance test requirements, so that the preset waveform signal passes through the configured digital delay line to trigger the active pulse light source to generate a preset optical signal, and make the preset optical signal pass through the configured optical fiber delay line and the optical system in sequence, and then reach the focusing optical element after being reflected by the mirror, and reach the detector to be measured after being focused by the focusing optical element;

[0154] Correspondingly, the performance test module 940 is specifically configured to:

[0155] Determine the test result of the performance to be measured of the detector to be measured according to the first time delay parameter, the second time delay parameter and the pulse arrival time in the pulse detection information.

[0156] In one embodiment, the omnidirectional light performance test system includes: a waveform generator, a pulse light source, an attenuator, a collimator, a mirror and an engineering diffuser; the output end of the waveform generator is connected to the input end of the pulse light source; an attenuator is placed between the output end of the pulse light source and the input end of the collimator; the mirror is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the mirror;

[0157] Correspondingly, the environment construction module 920 may be configured to:

[0158] Place the detector to be measured vertically above the engineering diffuser.

[0159] In one embodiment, the information acquisition module 930 may be configured to:

[0160] Control the waveform generator to generate a preset waveform signal according to the performance test requirements of the performance to be measured, so that the preset waveform signal triggers the pulse light source to generate a preset optical signal, and make the preset optical signal pass through the attenuator and the collimator in sequence, and then reach the engineering diffuser after being reflected by the mirror, and reach the detector to be measured after being scattered by the engineering diffuser.

[0161] In one embodiment, the performance test module 940 may be configured to:

[0162] Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel; determine the test result of the performance to be measured of the detector to be measured according to the maximum deviation, intensity information and time information of each pixel.

[0163] In one embodiment, the focusing performance test system includes: a waveform generator, a pulsed light source, an attenuator, a beam expander tube, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander tube; the mirror is placed at a third preset orientation with respect to the output end of the beam expander tube; the focusing optical element is placed vertically above the mirror;

[0164] Correspondingly, the environment building module 920 can be used to:

[0165] Place the detector under test vertically above the engineering scatter plate.

[0166] In one embodiment, the information acquisition module 930 can be used to:

[0167] According to the performance test requirements of the performance to be measured, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers the pulsed light source to generate a preset optical signal, and after the preset optical signal passes through the attenuator and the beam expander tube in sequence, it is reflected by the mirror and reaches the focusing optical element, and after being focused by the focusing optical element, it reaches the detector under test;

[0168] Correspondingly, the pulsed detection information includes the output signals of each pixel. The performance test module 940 can be used to:

[0169] For each pixel, according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel, determine the crosstalk information of the pixel; according to the crosstalk information of each pixel, determine the test result of the performance to be measured of the detector under test.

[0170] Each module in the above single-photon detector performance test device can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor of the computer device in hardware form or be independent of it, or can be stored in the memory of the computer device in software form, so that the processor can call and execute the operations corresponding to the above respective modules.

[0171] In one embodiment, a computer device is provided. The computer device can be a terminal, and its internal structure diagram can be as Figure 10As shown in the figure. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it implements a method for testing the performance of a single-photon detector.

[0172] Those skilled in the art can understand that Figure 10 the structure shown in the figure is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0173] In an exemplary embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented:

[0174] According to the performance type of the performance to be measured of the detector to be measured, select the target performance test system corresponding to the performance to be measured from the candidate performance test systems; wherein, the detector to be measured is a single-photon detector;

[0175] Place the detector to be measured in the target performance test system to construct a test environment for the detector to be measured;

[0176] According to the performance test requirements of the performance to be measured, apply a preset optical signal to the detector to be measured placed in the test environment, and obtain the pulse detection information generated during the process of the detector to be measured detecting the preset optical signal;

[0177] According to the pulse detection information, determine the test result of the performance to be measured of the detector to be measured.

[0178] In an embodiment, when the processor executes the computer program to select the target performance test system corresponding to the performance to be measured from the candidate performance test systems according to the performance type of the performance to be measured of the detector to be measured, the following steps are also implemented:

[0179] If the performance type of the performance to be measured of the detector to be measured is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is focusing performance, then the focusing performance test system is used as the target performance system.

[0180] In one embodiment, the time delay test system includes: a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the mirror is placed at a first preset orientation with respect to the output end of the optical system; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector to be measured in the target performance test system, the following steps are further implemented:

[0181] Place the detector to be measured vertically above the focusing optical element.

[0182] In one embodiment, when the target performance system is a time delay test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector to be measured according to the performance test requirements of the performance to be measured, the following steps are further implemented:

[0183] Configure the first time delay parameter of the digital delay line and the second time delay parameter of the optical fiber delay line according to the performance test requirements of the performance to be measured; according to the performance test requirements, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal after passing through the configured digital delay line, and the preset optical signal passes through the configured optical fiber delay line and optical system in sequence, is reflected by the mirror and reaches the focusing optical element, and reaches the detector to be measured after being focused by the focusing optical element;

[0184] Correspondingly, when the processor executes a computer program to determine the test result of the performance to be measured of the detector to be measured according to the pulse detection information, the following steps are further implemented:

[0185] Determine the test result of the performance to be measured of the detector to be measured according to the first time delay parameter, the second time delay parameter, and the pulse arrival time in the pulse detection information.

[0186] In one embodiment, the omnidirectional light performance test system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineering diffuser; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the collimator; the reflector is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0187] Place the detector under test vertically above the engineering diffuser.

[0188] In one embodiment, when the target performance test system is an omnidirectional light performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0189] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the collimator in sequence, is reflected by the reflector and reaches the engineering diffuser, and is scattered by the engineering diffuser and then reaches the detector under test.

[0190] In one embodiment, the pulsed detection information includes the intensity information and time information of the output signals of each pixel; when the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulsed detection information, the following steps are further implemented:

[0191] Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel; determine the test result of the performance under test of the detector under test according to the maximum deviation, intensity information and time information of each pixel.

[0192] In one embodiment, the focusing performance test system includes: a waveform generator, a pulsed light source, an attenuator, a beam expander, a reflector, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander; the reflector is placed at a third preset orientation with respect to the output end of the beam expander; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0193] Place the detector under test vertically above the engineering diffuser.

[0194] In one embodiment, when the target performance test system is a focusing performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0195] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers a pulse light source to generate a preset optical signal, and after the preset optical signal passes through an attenuator and a beam expander in sequence, it is reflected by a mirror and reaches a focusing optical element, and after being focused by the focusing optical element, it reaches the detector under test;

[0196] Correspondingly, the pulse detection information includes the output signals of each pixel. When the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulse detection information, the following steps are further implemented:

[0197] For each pixel, determine the crosstalk information of the pixel according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel; determine the test result of the performance under test of the detector under test according to the crosstalk information of each pixel.

[0198] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0199] According to the performance type of the performance under test of the detector under test, select the target performance test system corresponding to the performance under test from the candidate performance test systems; wherein, the detector under test is a single-photon detector;

[0200] Place the detector under test in the target performance test system to construct a test environment for the detector under test;

[0201] According to the performance test requirements of the performance under test, apply a preset optical signal to the detector under test placed in the test environment, and obtain the pulse detection information generated during the process of the detector under test detecting the preset optical signal;

[0202] Determine the test result of the performance under test of the detector under test according to the pulse detection information.

[0203] In one embodiment, when the processor executes a computer program to select the target performance test system corresponding to the performance under test from the candidate performance test systems according to the performance type of the performance under test of the detector under test, the following steps are further implemented:

[0204] If the performance type of the performance to be measured of the detector to be measured is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is focusing performance, then the focusing performance test system is used as the target performance system.

[0205] In one embodiment, the time delay test system includes: a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the mirror is placed at a first preset orientation with respect to the output end of the optical system; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector to be measured in the target performance test system, the following steps are further implemented:

[0206] Place the detector to be measured vertically above the focusing optical element.

[0207] In one embodiment, when the target performance system is a time delay test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector to be measured according to the performance test requirements of the performance to be measured, the following steps are further implemented:

[0208] Configure the first time delay parameter of the digital delay line and the second time delay parameter of the optical fiber delay line according to the performance test requirements of the performance to be measured; according to the performance test requirements, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal after passing through the configured digital delay line, and the preset optical signal passes through the configured optical fiber delay line and optical system in sequence, is reflected by the mirror and reaches the focusing optical element, and reaches the detector to be measured after being focused by the focusing optical element;

[0209] Correspondingly, when the processor executes a computer program to determine the test result of the performance to be measured of the detector to be measured according to the pulse detection information, the following steps are further implemented:

[0210] Determine the test result of the performance to be measured of the detector to be measured according to the first time delay parameter, the second time delay parameter, and the pulse arrival time in the pulse detection information.

[0211] In one embodiment, the omnidirectional light performance test system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineering diffuser; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the collimator; the reflector is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0212] Place the detector under test vertically above the engineering diffuser.

[0213] In one embodiment, when the target performance test system is an omnidirectional light performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0214] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the collimator in sequence, is reflected by the reflector and reaches the engineering diffuser, and is scattered by the engineering diffuser and then reaches the detector under test.

[0215] In one embodiment, the pulsed detection information includes the intensity information and time information of the output signals of each pixel; when the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulsed detection information, the following steps are further implemented:

[0216] Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel; determine the test result of the performance under test of the detector under test according to the maximum deviation, intensity information and time information of each pixel.

[0217] In one embodiment, the focusing performance test system includes: a waveform generator, a pulsed light source, an attenuator, a beam expander, a reflector, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander; the reflector is placed at a third preset orientation with respect to the output end of the beam expander; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0218] Place the detector under test vertically above the engineering diffuser.

[0219] In one embodiment, when the target performance test system is a focusing performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0220] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers a pulse light source to generate a preset optical signal, and after the preset optical signal passes through an attenuator and a beam expander in sequence, it is reflected by a mirror and reaches a focusing optical element, and after being focused by the focusing optical element, it reaches the detector under test;

[0221] Correspondingly, the pulse detection information includes the output signals of each pixel. When the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulse detection information, the following steps are further implemented:

[0222] For each pixel, determine the crosstalk information of the pixel according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel; determine the test result of the performance under test of the detector under test according to the crosstalk information of each pixel.

[0223] In one embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0224] According to the performance type of the performance under test of the detector under test, select the target performance test system corresponding to the performance under test from the candidate performance test systems; wherein, the detector under test is a single-photon detector;

[0225] Place the detector under test in the target performance test system to construct a test environment for the detector under test;

[0226] According to the performance test requirements of the performance under test, apply a preset optical signal to the detector under test placed in the test environment, and obtain the pulse detection information generated during the process of the detector under test detecting the preset optical signal;

[0227] Determine the test result of the performance under test of the detector under test according to the pulse detection information.

[0228] In one embodiment, when the processor executes a computer program to select the target performance test system corresponding to the performance under test from the candidate performance test systems according to the performance type of the performance under test of the detector under test, the following steps are further implemented:

[0229] If the performance type of the performance to be measured of the detector to be measured is time delay performance, then the time delay test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is floodlight performance, then the floodlight performance test system is used as the target performance system; if the performance type of the performance to be measured of the detector to be measured is focusing performance, then the focusing performance test system is used as the target performance system.

[0230] In one embodiment, the time delay test system includes: a waveform generator, an active pulse light source, a digital delay line, an optical fiber delay line, an optical system, a mirror, and a focusing optical element; the output end of the waveform generator is connected to the input end of the digital delay line; the output end of the digital delay line is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the mirror is placed at a first preset orientation with respect to the output end of the optical system; a focusing optical element is placed vertically above the mirror; when the processor executes a computer program to place the detector to be measured in the target performance test system, the following steps are further implemented:

[0231] Place the detector to be measured vertically above the focusing optical element.

[0232] In one embodiment, when the target performance system is a time delay test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector to be measured according to the performance test requirements of the performance to be measured, the following steps are further implemented:

[0233] Configure the first time delay parameter of the digital delay line and the second time delay parameter of the optical fiber delay line according to the performance test requirements of the performance to be measured; according to the performance test requirements, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal after passing through the configured digital delay line, and the preset optical signal passes through the configured optical fiber delay line and optical system in sequence, is reflected by the mirror and reaches the focusing optical element, and is focused by the focusing optical element and then reaches the detector to be measured;

[0234] Correspondingly, when the processor executes a computer program to determine the test result of the performance to be measured of the detector to be measured according to the pulse detection information, the following steps are further implemented:

[0235] Determine the test result of the performance to be measured of the detector to be measured according to the first time delay parameter, the second time delay parameter, and the pulse arrival time in the pulse detection information.

[0236] In one embodiment, the omnidirectional light performance test system includes: a waveform generator, a pulsed light source, an attenuator, a collimator, a reflector, and an engineering diffuser; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the collimator; the reflector is placed at a second preset orientation with respect to the output end of the collimator; an engineering diffuser is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0237] Place the detector under test vertically above the engineering diffuser.

[0238] In one embodiment, when the target performance test system is an omnidirectional light performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0239] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the preset waveform signal triggers the pulsed light source to generate a preset optical signal, and the preset optical signal passes through the attenuator and the collimator in sequence, is reflected by the reflector and reaches the engineering diffuser, and is scattered by the engineering diffuser and then reaches the detector under test.

[0240] In one embodiment, the pulsed detection information includes the intensity information and time information of the output signals of each pixel; when the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulsed detection information, the following steps are further implemented:

[0241] Determine the maximum deviation of each pixel according to the intensity information and time information of each pixel; determine the test result of the performance under test of the detector under test according to the maximum deviation, intensity information and time information of each pixel.

[0242] In one embodiment, the focusing performance test system includes: a waveform generator, a pulsed light source, an attenuator, a beam expander, a reflector, and a focusing optical element; the output end of the waveform generator is connected to the input end of the pulsed light source; an attenuator is placed between the output end of the pulsed light source and the input end of the beam expander; the reflector is placed at a third preset orientation with respect to the output end of the beam expander; a focusing optical element is placed vertically above the reflector; when the processor executes a computer program to place the detector under test in the target performance test system, the following steps are further implemented:

[0243] Place the detector under test vertically above the engineering diffuser.

[0244] In one embodiment, when the target performance test system is a focusing performance test system, when the processor executes a computer program to apply a preset optical signal to the target performance test system including the detector under test according to the performance test requirements of the performance under test, the following steps are further implemented:

[0245] According to the performance test requirements of the performance under test, control the waveform generator to generate a preset waveform signal, so that the waveform signal triggers a pulse light source to generate a preset optical signal, and after the preset optical signal passes through an attenuator and a beam expander in sequence, it is reflected by a reflector and reaches a focusing optical element, and after being focused by the focusing optical element, it reaches the detector under test;

[0246] Correspondingly, the pulse detection information includes the output signals of each pixel. When the processor executes a computer program to determine the test result of the performance under test of the detector under test according to the pulse detection information, the following steps are further implemented:

[0247] For each pixel, determine the crosstalk information of the pixel according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel; determine the test result of the performance under test of the detector under test according to the crosstalk information of each pixel.

[0248] It should be noted that the data involved in this application (including but not limited to the data for analysis, the stored data, the displayed data, etc.) are all information and data that have been fully authorized by all parties, and the collection, use, and processing of the relevant data need to comply with the relevant regulations.

[0249] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0250] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0251] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A single photon detector performance testing method, characterized in that: The method comprises: According to the performance type of the performance to be tested of the detector to be tested, selecting a target performance test system corresponding to the performance to be tested from the candidate performance test systems; wherein the detector to be tested is a single photon detector; Placing the detector to be tested in the target performance test system to construct a test environment for the detector to be tested; According to the performance test requirements of the performance to be tested, applying a preset optical signal to the detector to be tested placed in the test environment, and obtaining pulse detection information generated by the detector to be tested in the process of detecting the preset optical signal; A test result of the performance to be tested of the detector to be tested is determined according to the pulse detection information.

2. The method according to claim 1, characterized in that The step of selecting a target performance test system corresponding to the performance to be tested from candidate performance test systems according to the performance type of the performance to be tested of the detector to be tested comprises: If the performance type of the performance to be tested of the detector to be tested is time delay performance, then the time delay test system is used as the target performance system; If the performance type of the performance to be tested of the detector to be tested is floodlight performance, then the floodlight performance test system is used as the target performance system; If the performance type of the performance to be tested of the detector to be tested is focusing performance, the focusing performance test system is used as the target performance system.

3. The method according to claim 2, characterized in that The time delay test system comprises: a waveform generator, an active pulse light source, a digital delay device, an optical fiber delay line, an optical system, a reflector and a focusing optical element; The output end of the waveform generator is connected to the input end of the digital delay device; the output end of the digital delay device is connected to the input end of the active pulse light source; the output end of the active pulse light source is connected to one end of the optical fiber delay line; the other end of the optical fiber delay line is connected to the input end of the optical system; the reflector and the output end of the optical system are placed in a first preset orientation; a focusing optical element is placed vertically above the reflector; Placing the detector to be tested in the target performance test system includes: The detector to be tested is placed vertically above the focusing optical element.

4. The method according to claim 3, characterized in that In the case where the target performance system is the time delay test system, applying a preset optical signal to the target performance test system including the detector to be tested according to the performance test requirements of the performance to be tested includes: According to the performance test requirements of the performance to be tested, configuring the first delay parameter of the digital delay device and the second delay parameter of the optical fiber delay line; According to the performance test requirements, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the active pulse light source to generate a preset optical signal through the configured digital delay device, and the preset optical signal passes through the configured optical fiber delay line and the optical system in sequence, is reflected by the reflector and reaches the focusing optical element, and is focused by the focusing optical element and reaches the detector to be tested; Correspondingly, determining the test result of the performance to be tested of the detector to be tested according to the pulse detection information includes: The test result of the performance to be tested of the detector to be tested is determined according to the first delay parameter, the second delay parameter and the pulse arrival time in the pulse detection information.

5. The method according to claim 2, characterized in that: The floodlight performance test system comprises: a waveform generator, a pulse light source, an attenuator, a collimator, a reflector and an engineering scattering sheet; The output end of the waveform generator is connected to the input end of the pulse light source; an attenuator is placed between the output end of the pulse light source and the input end of the collimator; the reflector and the output end of the collimator are placed in a second preset orientation; an engineering scattering sheet is placed vertically above the reflector; Accordingly, placing the detector to be tested in the target performance test system includes: The detector to be tested is placed vertically above the engineering scattering sheet.

6. The method according to claim 5, characterized in that In the case where the target performance test system is a floodlight performance test system, applying a preset optical signal to the target performance test system including the detector to be tested according to the performance test requirements of the performance to be tested includes: According to the performance test requirements of the performance to be tested, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the collimator in sequence, is reflected by the reflector and reaches the engineering scattering plate, and is scattered by the engineering scattering plate to reach the detector to be tested.

7. The method according to claim 6, characterized in that The pulse detection information includes intensity information and time information of the output signal of each pixel; Determining the test result of the performance to be tested of the detector to be tested according to the pulse detection information includes: According to the intensity information and time information of each pixel, the maximum deviation of each pixel is determined; The test result of the performance to be tested of the detector to be tested is determined according to the maximum deviation, intensity information and time information of each pixel.

8. The method according to claim 2, characterized in that: The focusing performance test system comprises: a waveform generator, a pulse light source, an attenuator, a beam expansion tube, a reflector and a focusing optical element; The output end of the waveform generator is connected to the input end of the pulse light source; an attenuator is placed between the output end of the pulse light source and the input end of the beam expansion tube; the reflector and the output end of the beam expansion tube are placed in a third preset orientation; a focusing optical element is placed vertically above the reflector; Accordingly, placing the detector to be tested in the target performance test system includes: The detector to be tested is placed vertically above the engineering scattering sheet.

9. The method according to claim 8, characterized in that In the case where the target performance test system is a focusing performance test system, applying a preset optical signal to the target performance test system including the detector to be tested according to the performance test requirements of the performance to be tested includes: According to the performance test requirements of the performance to be tested, the waveform generator is controlled to generate a preset waveform signal, so that the preset waveform signal triggers the pulse light source to generate a preset light signal, and the preset light signal passes through the attenuator and the beam expansion tube in sequence, is reflected by the reflector and reaches the focusing optical element, and is focused by the focusing optical element and reaches the detector to be tested; Correspondingly, the pulse detection information includes the output signal of each pixel, and the test result of the performance to be tested of the detector to be tested is determined according to the pulse detection information, including: For each pixel, determining the crosstalk information of the pixel according to the output signal of the pixel and the output signals of the adjacent pixels of the pixel; According to the crosstalk information of each pixel, the test result of the performance to be tested of the detector to be tested is determined.

10. A single photon detector performance test device, characterized in that: The device comprises: A system selection module, used to select a target performance test system corresponding to the performance to be tested from candidate performance test systems according to the performance type of the performance to be tested of the detector to be tested; wherein the detector to be tested is a single photon detector; An environment building module, used to place the detector to be tested in the target performance test system to build a test environment for the detector to be tested; An information acquisition module, used to apply a preset optical signal to the detector to be tested placed in the test environment according to the performance test requirements of the performance to be tested, and to obtain pulse detection information generated in the process of the detector to be tested detecting the preset optical signal; The performance testing module is used to determine the test result of the performance to be tested of the detector to be tested according to the pulse detection information.

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