High-power red light semiconductor laser pulse water-cooling testing and aging system and application thereof

Abstract

The invention relates to a high-power red light semiconductor laser pulse water-cooling testing and aging system and application thereof, and belongs to the technical field of lasers. The aging system comprises a power supply, an aging plate, a fixing clamp, a cooling pipeline, a cooling liquid storage tank and a water pump, the fixing clamp is arranged on the upper side of the aging plate, a socket is arranged on the aging plate on the bottom side of the fixing clamp and connected with the power supply through a test wire, a cooling water channel is arranged in the aging plate, and the water inlet end of the cooling water channel is connected with the water pump through the cooling pipeline. The water pump and the water outlet end of the cooling water channel are connected with a cooling liquid storage tank. According to the invention, the power supply is matched with water cooling for cooperative work, when the laser generates too high heat, the heat is taken away in time, and the heat dissipation requirement of the high-power red light semiconductor laser is met.

Description

Technical Field

[0001] The present invention relates to a pulsed water-cooling test and aging system for high-power red semiconductor lasers and its application, belonging to the technical field of lasers. Background Art

[0002] With the expansion of the application scope of high-power red semiconductor lasers, they are frequently used in fields such as material processing and medical equipment, and the requirements for their performance stability and reliability are also increasing day by day. When high-power red semiconductor lasers are working, they will generate a large amount of heat. If the heat cannot be dissipated in time, it will lead to a decline in the performance of the lasers, a shortening of their lifespan, and even damage. Traditional heat dissipation methods such as air cooling are difficult to meet the heat dissipation requirements when facing the large amount of heat generated by high-power lasers during long-term operation.

[0003] Chinese patent document CN105988069A discloses a test and aging device and method for semiconductor lasers, including a test section and a device to be tested section; the test section includes a spring piece and a fixed block for driving the spring piece to move up and down; the spring piece includes an open-ended loop-shaped bending section and an L-shaped test section; an insulating block is connected to the end of the L-shaped test section; two mutually insulated spring pins are arranged on the insulating block to connect the positive and negative electrodes of the laser COS or the device respectively; the fixed block includes a C-shaped opening, and the open-ended loop-shaped bending section of the spring piece is arranged in the C-shaped opening, and the open-ended loop-shaped bending section is squeezed or released by a screw passing through the C-shaped opening to realize the distance adjustment between the L-shaped test section and the device to be tested section. Although this device is also applied to the test and aging of lasers, its cooling design is conventional and cannot meet the heat dissipation requirements. Summary of the Invention

[0004] Aiming at the deficiencies of the prior art, the present invention provides a pulsed water-cooling test and aging system for high-power red semiconductor lasers, which uses a power supply to cooperate with water cooling to work together. When the laser generates excessive heat, the heat can be taken away in time to meet the heat dissipation requirements of high-power red semiconductor lasers.

[0005] The present invention also provides the application of the above-mentioned pulsed water-cooling test and aging system for high-power red semiconductor lasers.

[0006] The technical solution of the present invention is as follows:

[0007] A pulsed water-cooling test and aging system for high-power red semiconductor lasers includes a power supply, an aging board, a fixed fixture, a cooling pipeline, a coolant storage tank, and a water pump. Among them,

[0008] A fixing fixture is provided on the upper side of the aging board. A socket is provided on the aging board at the bottom side of the fixing fixture. The socket is connected to a power supply through a test wire. A cooling water channel is provided inside the aging board. The water inlet end of the cooling water channel is connected to a water pump through a cooling pipe. The water pump and the water outlet end of the cooling water channel are connected to a coolant storage tank.

[0009] Preferably according to the present invention, the power supply adopts a pulse power supply to realize the setting of the output of pulse currents with different duty cycles, pulse widths, and frequencies, and to achieve less heat dissipation under the working conditions of large currents.

[0010] Preferably according to the present invention, a heat exchanger is provided on the pipeline between the water outlet end of the cooling water channel and the coolant storage tank to improve the heat dissipation efficiency of the coolant.

[0011] Preferably according to the present invention, the fixing fixture is an L-shaped block. A break is provided in the middle of the L-shaped block. A through screw is provided on one side of the break. A laser is placed in the break, and the break can be clamped by tightening the screw, thereby clamping the laser.

[0012] Preferably according to the present invention, at least 1 fixing fixture is provided, and the aging tests of multiple lasers can be realized at one time by using multiple fixing fixtures.

[0013] Preferably according to the present invention, the water pump is connected to a controller to adjust the flow rate of the water pump by using the controller.

[0014] Preferably according to the present invention, a protective cover is provided on the outside of the aging board to protect the internal devices.

[0015] The application of the above high-power red semiconductor laser pulse water cooling test and aging system is as follows:

[0016] (1) Clamp the laser in the fixing fixture, and then connect the laser to the socket;

[0017] (2) The power supply sets the duty cycle, pulse width, and frequency to supply power to the laser. At the same time, the water pump is started to drive the coolant to circulate in the cooling water channel of the aging board for cooling;

[0018] (3) After the aging test is completed, the power supply is powered off and the laser is taken out.

[0019] The beneficial effects of the present invention are as follows:

[0020] 1. The present invention utilizes a pulsed power supply in cooperation with water cooling to work together. When the laser generates excessive heat, the heat can be taken away in a timely manner to meet the heat dissipation requirements of high-power red semiconductor lasers. The principle of the pulsed current achieving less heat dissipation is that when the laser is working, the efficiency of converting electrical energy into light energy is not 100%. The part that is not converted into light energy will be dissipated in the form of heat. The pulsed current can make the population inversion in the active region of the laser more efficient, allowing more electrons to transition from high energy levels to low energy levels and emit photons, improving the electro-optical conversion efficiency, reducing the heat generated due to wasted electrical energy. A suitable pulsed current can make electrons and holes recombine and emit light more effectively, reducing non-radiative recombination, thereby reducing heat generation.

[0021] 2. The present invention can simulate various different working environmental temperature conditions to conduct an accelerated aging test on the laser to examine the performance changes and reliability of the laser during long-term use. Through this test, potential problems of the laser can be discovered in advance, providing a basis for product improvement and optimization. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 is a schematic structural diagram of the present invention;

[0023] Figure 2 is a schematic structural diagram of the aging board of the present invention;

[0024] Figure 3 is a three-dimensional schematic diagram of the aging board of the present invention;

[0025] Wherein: 1. Power supply, 2. Power supply control panel, 3. Test wire, 4. Aging board, 5. Socket, 6. Protective cover, 7. Cooling pipe, 8. Coolant storage tank, 9. Controller, 10. Water pump, 11. Heat exchanger, 12. Fixing fixture, 13. Screw. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0026] The present invention will be further described below through embodiments in conjunction with the drawings, but is not limited thereto.

[0027] Embodiment 1:

[0028] As Figures 1-3 shown, this embodiment provides a pulsed water cooling test and aging system for high-power red semiconductor lasers, including a power supply 1, an aging board 4, a fixing fixture 12, a cooling pipe 7, a coolant storage tank 8, and a water pump 10. Among them,

[0029] A fixing fixture 12 is arranged on the upper side of the aging board 4. A socket 5 is arranged on the aging board 4 at the bottom side of the fixing fixture 12. The socket 5 is connected to the power supply 1 through a test wire 3. A cooling water channel is arranged inside the aging board 4. The water inlet end of the cooling water channel is connected to the water pump 10 through a cooling pipe 7. The water pump 10 and the water outlet end of the cooling water channel are connected to the coolant storage tank 8.

[0030] The power supply 1 adopts a pulse power supply to achieve the setting of pulse current output with different duty cycles, pulse widths, and frequencies, and to achieve less heat dissipation under the working conditions of high current.

[0031] A heat exchanger 11 is provided on the pipeline between the water outlet end of the cooling water channel and the coolant storage tank to improve the heat dissipation efficiency of the coolant.

[0032] The fixing fixture 12 is an L-shaped block. A notch is provided in the middle of the L-shaped block. A through screw 13 is provided on one side of the notch. A laser is placed in the notch, and the notch can be clamped by tightening the screw, thereby clamping the laser.

[0033] There are 10 fixing fixtures 12, which can realize the aging test of 10 lasers at a time.

[0034] The water pump 10 is connected to a controller 9, and the flow rate of the water pump is adjusted by the controller.

[0035] A protective cover 6 is provided outside the aging board 4 to protect the internal devices.

[0036] The application of the above high-power red semiconductor laser pulse water cooling test and aging system is as follows:

[0037] (1) Clamp the laser in the fixing fixture 12, and then connect the laser to the socket 5;

[0038] (2) The power supply 1 sets the duty cycle, pulse width, and frequency, and supplies power to the laser. At the same time, the water pump starts to drive the coolant to circulate in the cooling water channel of the aging board for cooling;

[0039] (3) After the aging test is completed, the power supply is powered off and the laser is taken out.

[0040] The above are only the preferred embodiments of the present invention and are not used to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A high-power red light semiconductor laser pulse water cooling test and aging system, characterized in that: It includes power supply, aging board, fixing fixture, cooling pipe, coolant tank and water pump, among which, A fixing fixture is provided on the upper side of the aging board, and a socket is provided on the aging board on the bottom side of the fixing fixture. The socket is connected to a power supply through a test wire. A cooling water channel is provided in the aging board. The water inlet end of the cooling water channel is connected to a water pump through a cooling pipe, and the water pump and the water outlet end of the cooling water channel are connected to a coolant storage tank.

2. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 1, characterized in that: The power supply adopts pulse power supply to realize pulse current output setting with different duty cycle, pulse width and frequency.

3. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 2, characterized in that: A heat exchanger is arranged on the pipeline between the water outlet of the cooling water channel and the coolant storage tank.

4. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 3, characterized in that: The fixing fixture is an L-shaped block, a fracture is arranged in the middle of the L-shaped block, and a penetrating screw is arranged on one side of the fracture.

5. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 1, characterized in that: At least one fixing fixture is provided.

6. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 1, characterized in that: The water pump is connected to a controller.

7. The high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 1, characterized in that: A protective cover is provided on the outside of the aging board.

8. The application of the high-power red light semiconductor laser pulse water cooling test and aging system as claimed in claim 4, characterized in that: Here are the steps: (1) Clamp the laser in the fixture and then connect the laser to the socket; (2) The power supply sets the duty cycle, pulse width, and frequency to power the laser. At the same time, the water pump starts to drive the coolant to circulate in the cooling water channel of the aging board to cool it down; (3) After the aging test is completed, turn off the power and remove the laser.

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