Full-automatic test method for integrated circuit single-chip microcomputer

Abstract

The invention discloses a full-automatic testing method for an integrated circuit single-chip microcomputer, and relates to the field of circuit testing. The full-automatic test method for the integrated circuit single-chip microcomputer comprises the following steps: assembling a detection device, connecting a power supply, starting up to enter a starting-up interface, starting up to confirm whether self-inspection of a test machine is passed or not, entering the next step by clicking an OS (Operating System) test only when the self-inspection PASS is passed, re-operating if fail, entering a next-step interface to select a product test channel, and entering the next-step interface to select a product test channel. And after the number of channels needing to be selected is clicked, entering a lower test mode selection, selecting all items to enter a pin diode to scan the GND, and if a scanning result is normal, clicking and determining to enter the next step, otherwise, checking reasons, clicking and determining to enter a test interface, and displaying a test result. According to the full-automatic test method for the integrated circuit single-chip microcomputer, the whole circuit detection method and process are simple, carrying is easy, the device size is small, the detection program is simple, the detection method is convenient and rapid, time and labor are saved during operation, and rapid detection of multiple pin positions is provided.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit testing, and specifically to a full-automatic testing method for integrated circuit single-chip microcomputers. Background Art

[0002] In integrated circuits, with the continuous reduction of the process size and the increase in the chip operating speed, the number of pins of the chip is increasing, and the pitch between them is getting smaller. The design levels such as the signal continuity of each pin and the power integrity of the circuit directly affect the overall performance of the system. Electrostatic discharge is the main cause of excessive electrical stress damage to all components or integrated circuit systems. At the same time, due to the reduction of devices, the PN junction depth becomes shallower, and the introduction of silicides makes ESD electrostatic breakdown extremely likely to occur. To deal with the ESD electrostatic phenomenon, in addition to shielding static electricity during testing and changing the hardware layout, diodes are generally set inside the chip pins during chip manufacturing.

[0003] Regardless of whether it is testing the power integrity, signal continuity, or whether the diode is working properly in an integrated circuit, it is necessary to detect through a testing device to ensure the normal operation of the circuit. In traditional circuit detection methods, general testing devices are usually large in volume, not convenient to carry, and the detection procedures are complex. The detection methods are not convenient and fast, and the operation is time-consuming and laborious. With the increasingly complex process development of integrated circuits, manual touch-type measurement often has a huge workload, increasing difficulty, and is prone to omission. There are errors in testing. In view of the deficiencies of the prior art, the present invention provides a full-automatic testing method for integrated circuit single-chip microcomputers to solve the above problems. Summary of the Invention

[0004] (1) Technical Problems to be Solved

[0005] In view of the deficiencies of the prior art, the present invention provides a full-automatic testing method for integrated circuit single-chip microcomputers. The overall circuit detection method and process are simple, easy to carry, the device is small in volume, and moreover, the detection procedure is simple, the detection method is convenient and fast, the operation is time-saving and laborious, and it provides rapid detection of multiple pin positions. Compared with the traditional manual multi-touch measurement method using a multimeter, the workload is small, the difficulty is reduced, it is not easy to omit, there is no error in measurement, and a variety of detection results are directly displayed through the detection device, meeting the usage requirements.

[0006] (2) Technical Solutions

[0007] To achieve the above object, the present invention is realized through the following technical solutions: A full-automatic testing method for integrated circuit single-chip microcomputers, the full-automatic testing method for integrated circuit single-chip microcomputers includes the following steps:

[0008] Step S1: Assemble the detection device, connect the power supply and turn it on to enter the startup interface;

[0009] Step S2: Power on the machine and confirm whether the self - test of the testing machine passes. Only when the self - test passes can you click on the OS test to enter the next step. If it fails, operate again.

[0010] Step S3: Enter the next interface and select the product test channel.

[0011] Step S4: After clicking on the number of channels to be selected, it will enter the next test mode selection. Generally, select to test all items, that is, all channels test the diodes to GND and VDD and the adjacent pin short - circuit test.

[0012] Step S5: Select to test all items and enter the scan of the pin diodes to GND.

[0013] Step S6: If the scan result is normal, click OK to enter the next step. Otherwise, troubleshoot the reasons.

[0014] Step S7: After clicking OK, enter the test interface and display the test results.

[0015] Preferably, the detection device includes a circuit board, a signal line interface, a single - chip microcomputer power interface, a test channel interface, and a display screen. The circuit board is used to carry the signal line interface, the single - chip microcomputer power interface, the test channel interface, and the display screen. The display screen is used to display the operation interface and test data.

[0016] Preferably, the signal line interface in the detection device is connected to a sorting machine signal connector, and the test channel interface is connected to a sorting machine test connector. The sorting machine test connector is used to detect products.

[0017] Preferably, a power supply is connected to the single - chip microcomputer power interface, and the power supply is a 9V DC power supply.

[0018] Preferably, a power switch is provided on the single - chip microcomputer power interface, and the power switch is used to control the on - off of the 9V DC power supply.

[0019] Preferably, when powering on, the product pins cannot be connected to the test machine channels, otherwise the self - test will fail.

[0020] Preferably, during the process of selecting the number of product test channels, the minimum is 6PIN and the maximum is 40PIN. Select according to the number of product pins. There are marks at positions 1, 20, 21, and 40 channels at the test machine channels. Confirm the position according to the selected number of channels. 1 is the position marking bit of PIN1 channel. No matter how many channels are selected, pin1 is always channel 1.

[0021] Preferably, in the schematic diagram of the GND scan result of the test device, 1 indicates normal result, 0 indicates ground pin, and 2 indicates open circuit.

[0022] Preferably, in the schematic diagram of the VDD scanning result by the test device, 1 indicates normal result, 3 indicates the VDD power pin, and 2 indicates open circuit.

[0023] For the full-automatic test method of this integrated circuit single-chip microcomputer, when selecting to test all items and entering the pin diode to scan GND, the product wire bonding diagram is as Figure 3 shown. For those with multiple VDDs like this, a multimeter needs to be used to confirm whether the internal VDDs of the chip are shorted together or a certain pin is a false VDD. Here, when the black probe of the multimeter is connected to pin 3 (VDD) and the red probe is connected to pin 1, a normal diode value can be measured, while there is no value for pin 4. So, here it is determined that pin 3 is VDD.

[0024] The method for measuring the diode value against GND is as follows: the red probe is connected to pin 2 (GND), and the black probe is connected to other pins. Normal diode values can be measured for the other 5 pins (the display value of 0.3 - 0.9 is the normal value, lower than 0.3 is determined as short circuit, and higher than 0.9 is determined as open circuit). The scanning result of the tester is as Figure 4 shown.

[0025] The scanning result against GND is consistent with that measured by the multimeter. In the scanning result, 0 for pin 2 indicates GND, and 1 indicates that the diodes of pins 1, 3, 4(38)

[0026] 5(39), 6(40) are normal. If the scanning result is normal, click OK to enter the next step; otherwise, check the reasons.

[0027] The method for measuring the diode value against VDD: the black probe is connected to pin 3 (VDD), and the diode value is measured for other pins. The display value of 0.3 - 0.9V is the normal value, lower than 0.3 is determined as short circuit, and higher than 0.9 is determined as open circuit. When measured by the multimeter, the values of all pins except 1 and 2 are normal, and the others are open. The scanning result of the tester is as Figure 5 shown.

[0028] The present invention discloses a full-automatic test method for an integrated circuit single-chip microcomputer, and its beneficial effects are as follows:

[0029] 1. For the full-automatic test method of this integrated circuit single-chip microcomputer, the overall circuit detection method and process are simple, easy to carry, the device has a small volume, and moreover, the detection program is simple, the detection method is convenient and fast, the operation saves time and effort, provides fast detection for multiple pins. Compared with the traditional manual multiple-point contact detection method using a multimeter, the workload is small, the difficulty is reduced, it is not easy to miss, there is no measurement error, and various detection results are directly displayed through the detection device, meeting the usage requirements.

[0030] 2. For the full-automatic test method of this integrated circuit single-chip microcomputer, the self-check program is adopted to ensure the normal state of each part of the program and avoid unstable phenomena during the detection process. The set number of product test channels is convenient to adjust according to the test channels of the product. Therefore, it ensures a fast detection speed and convenient detection of the product. Brief Description of the Drawings

[0031] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0032] Figure 1 It is a schematic diagram of the test structure of the present invention;

[0033] Figure 2 It is a schematic diagram of the test process of the present invention;

[0034] Figure 3 It is a schematic diagram of the wire bonding detection of the product of the present invention;

[0035] Figure 4 It is a schematic diagram of the scanning result of the GND by the test device of the present invention;

[0036] Figure 5 It is a schematic diagram of the scanning result of the VDD by the test device of the present invention. Detailed Embodiments

[0037] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention are clearly and completely described. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

[0038] By providing a full-automatic test method for an integrated circuit single-chip microcomputer in the embodiments of the present application, the problems in the traditional circuit detection method are solved. Generally, the general detection device is usually large in size, not convenient to carry, and the detection program is complex. The detection method is not convenient and fast, time-consuming and laborious to operate. With the development of more complex processes of integrated circuits, manual touch measurement often has a huge workload, increasing difficulty, and is prone to omission, and there are errors in testing.

[0039] To better understand the above technical solutions, the above technical solutions will be described in detail below in combination with the accompanying drawings of the specification and specific embodiments.

[0040] The embodiments of the present invention disclose a full-automatic test method for an integrated circuit single-chip microcomputer. According to the attached Figures 1-5 As shown, the full-automatic test method for the integrated circuit single-chip microcomputer includes the following steps:

[0041] Step S1: Assemble the detection device, connect the power supply and turn it on to enter the startup interface;

[0042] Step S2: After turning on the machine, confirm whether the self-check of the testing machine passes. Only when the self-check is PASS can you click on the OS test to enter the next step. If it fails, operate again;

[0043] Step S3: Enter the next interface to select the product test channel;

[0044] Step S4: After clicking on the number of channels to be selected, it will enter the next test mode selection. Generally, select to test all items, that is, all channels test the diode to GND and VDD and the adjacent pins for short circuit test;

[0045] Step S5: Select to test all items and enter the scanning of the pin diodes to GND;

[0046] Step S6: If the scanning result is normal, click OK to enter the next step. Otherwise, troubleshoot the reasons;

[0047] Step S7: After clicking OK, enter the test interface and display the test results.

[0048] Specifically, the detection device includes a circuit board, a signal line interface, a single-chip microcomputer power interface, a test channel interface and a display screen. The circuit board is used to carry the signal line interface, the single-chip microcomputer power interface, the test channel interface and the display screen. The display screen is used to display the operation interface and test data.

[0049] Further, the signal line interface in the detection device is connected to a sorting machine signal connector, and the test channel interface is connected to a sorting machine test connector. The sorting machine test connector is used to detect the product.

[0050] Furthermore, a power supply is connected to the single-chip microcomputer power interface, and the power supply is a 9V DC power supply.

[0051] Specifically disclosed, a power switch is provided on the single-chip microcomputer power interface. The power switch is used to control the on / off of the 9V DC power supply. The set power switch facilitates cutting off or supplying power to the overall power supply of the detection device, ensuring convenient control of the power on and off of the device.

[0052] Further, when starting up, the product pins cannot be connected to the test machine channels, otherwise the self-check will fail. The self-check program is used to ensure the normal state of each part of the program and avoid unstable phenomena during the detection process.

[0053] Further, during the process of selecting the number of product test channels, the minimum is 6 PINs and the maximum is 40 PINs. Select according to the number of pins of the product. There are marks for the 1st, 20th, 21st, and 40th channel positions at the test machine channels. Confirm the position according to the selected number of channels. 1 is the marking position of the PIN1 channel. No matter how many channels are selected, pin1 is always the 1st channel. The set number of product test channels is convenient for adjustment according to the test channels of the product. Therefore, it ensures fast detection speed and convenient detection of the product.

[0054] Specifically, in the schematic diagram of the GND scan result by the test device, 1 indicates normal result, 0 indicates the ground pin, and 2 indicates open circuit. In the schematic diagram of the VDD scan result by the test device, 1 indicates normal result, 3 indicates the VDD power pin, and 2 indicates open circuit. The final display result is visually shown on the display screen, making it convenient to view the detection results of electronic products.

[0055] In this fully automatic test method for the integrated circuit single-chip microcomputer, when selecting to measure all items and entering the pin diode to scan GND, the product wire bonding diagram is as Figure 3 shown. For those with multiple VDDs like this, a multimeter needs to be used to confirm whether the VDDs inside the chip are shorted together or a certain pin is a false VDD. Here, when the black probe of the multimeter is connected to the 3rd pin VDD and the red probe is connected to the 1st pin, a normal diode value can be measured, while there is no such value for the 4th pin. So here, the 3rd pin is determined to be VDD.

[0056] The method for measuring the diode value for GND is: connect the red probe to the 2nd pin (GND), and the black probe to other pins. Normal diode values can be measured for the other 5 pins (the normal value shown on the meter is 0.3 - 0.9, less than 0.3 is determined as short circuit, and higher than 0.9 is determined as open circuit). The test machine scan result is as Figure 4 shown.

[0057] The GND scan result is consistent with that measured by the multimeter. In the scan result, 0 for the 2nd pin indicates GND, and 1 indicates that the diodes of pins 1, 3, 4 (38)

[0058] 5 (39), 6 (40) are normal. If the scan result is normal, click OK to enter the next step; otherwise, check the reasons.

[0059] The method for measuring the diode value for VDD: connect the black probe to the 3rd pin VDD and measure the diode value for other pins. The normal value shown on the meter is 0.3 - 0.9V. Less than 0.3 is determined as short circuit, and higher than 0.9 is determined as open circuit. When measured by the multimeter, the values of pins 1 and 2 are normal, and the others are open. The test machine scan result is as Figure 5 shown.

[0060] The full-automatic testing method for the integrated circuit single-chip microcomputer has a simple overall circuit detection method and process, is easy to carry, has a small device volume, and moreover, the detection program is simple, the detection method is convenient and fast, the operation saves time and effort, provides rapid detection for multiple pin positions, and compared with the traditional manual multi-point contact detection method using a multimeter, the workload is small, the difficulty is reduced, it is not easy to miss, there is no measurement error, and various detection results are directly displayed through the detection device, meeting the usage requirements.

[0061] It should be noted that in this text, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the said element.

[0062] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art of this industry should understand that the present invention is not limited by the above embodiments. What is described in the above embodiments and the specification only illustrates the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements fall within the scope of the present invention claimed. The scope of protection claimed by the present invention is defined by the appended claims and their equivalents.

Claims

1. Full-automatic testing method for integrated circuit single-chip microcomputer, Characterized in that: The full-automatic testing method for integrated circuit single-chip microcomputer includes the following steps: Step S1: Assemble the detection device, connect the power supply and turn on the machine to enter the startup interface; Step S2: After turning on the machine, confirm whether the self-check of the tester passes. Only when the self-check PASS can be used, click on the OS test to enter the next step. If it fails, operate again; Step S3: Enter the next interface to select the product test channel; Step S4: After clicking on the number of channels to be selected, it will enter the selection of the next test mode. Generally, select to test all items, that is, all channels test the diodes to GND and VDD and the short circuit test between adjacent pins; Step S5: Select to test all items and enter the scanning of the pin diodes to GND; Step S6: If the scanning result is normal, click OK to enter the next step, otherwise troubleshoot the cause; Step S7: After clicking OK, enter the test interface and display the test results.

2. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 1, Characterized in that: The detection device includes a circuit board, a signal line interface, a single-chip microcomputer power interface, a test channel interface and a display screen. The circuit board is used to carry the signal line interface, the single-chip microcomputer power interface, the test channel interface and the display screen. The display screen is used to display the operation interface and test data.

3. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 2, Characterized in that: A sorting machine signal connector is connected to the signal line interface in the detection device, and a sorting machine test connector is connected to the test channel interface. The sorting machine test connector is used to detect the product.

4. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 2, Characterized in that: A power supply is connected to the single-chip microcomputer power interface, and the power supply is a 9V DC power supply.

5. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 4, Characterized in that: A power switch is provided on the single-chip microcomputer power interface, and the power switch is used to control the on / off of the 9V DC power supply.

6. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 1, Characterized in that: When starting up, the product pins cannot be connected to the tester channels, otherwise the self-check will fail.

7. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 1, Characterized in that: During the process of selecting the number of product test channels, the minimum is 6PIN and the maximum is 40PIN. Select according to the number of product pins. There are marks at positions 1, 20, 21, and 40 channels at the tester channels. Confirm the position according to the selected number of channels. 1 is the position marking bit of the PIN1 channel. No matter how many channels are selected, pin1 is always channel 1.

8. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 7, Characterized in that: In the schematic diagram of the GND scanning result of the testing device, 1 indicates normal result, 0 indicates the ground pin, and 2 indicates open circuit.

9. The full-automatic testing method for integrated circuit single-chip microcomputer according to claim 7, Characterized in that: In the schematic diagram of the VDD scanning result of the testing device, 1 indicates normal result, 3 indicates the VDD power pin, and 2 indicates open circuit.

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