Test circuit, test fixture, open circuit voltage measurement system and method

Abstract

The present application relates to a test circuit, test fixture, open-circuit voltage measurement system, and method. The test circuit includes a resistor, a switch assembly, and a connection terminal; the switch assembly includes a first switch group and a second switch group; the connection terminal is connected to the resistor via the first switch group to form a resistance test circuit, which is used to form a resistance test loop; the connection terminal is also connected to the second switch group to form a zeroing test circuit, which is used to form a zeroing test loop. This method can improve the timeliness of calibration of an open-circuit voltage measurement device.

Description

Technical Field

[0001] The present application relates to the field of new energy technology, and in particular to a test circuit, a test tool, an open-circuit voltage measurement system and a method. Background Art

[0002] After battery production is complete, an open-circuit voltage (OCV) measurement device is used to measure the battery's internal resistance and open-circuit voltage. To improve the accuracy of the OCV measurement device, the OCV measurement device is periodically tested using a test fixture for calibration.

[0003] However, using the test tool in the related art to test the open circuit voltage measuring device is time-consuming, resulting in low test efficiency of the open circuit voltage measuring device and inability to calibrate the open circuit voltage measuring device in a timely manner. Summary of the Invention

[0004] Based on this, the present application provides a test circuit, a test tool, an open-circuit voltage measurement system and a method, which can improve the timeliness of calibration of the open-circuit voltage measurement device.

[0005] In a first aspect, the present application provides a test circuit, which includes a resistor, a switch component and a connection end; the switch component includes a first switch group and a second switch group; the connection end is connected to the resistor through the first switch group to form a resistor test circuit, which is used to form a resistor test loop; the connection end is also connected to the second switch group to form a zero test circuit, which is used to form a zero test loop.

[0006] In the technical solution provided by the embodiment of the present application, the test circuit can include not only a resistance test circuit but also a zeroing test circuit, thereby forming not only a resistance test loop but also a zeroing test loop, and further, not only can the calibration of the open-circuit voltage measuring device be realized through the resistance test loop but also the calibration of the open-circuit voltage measuring device can be realized through the zeroing test loop, so that the resistance test function and the zeroing test function can be realized by a single movement of the test circuit, without the need to move the resistance test fixture and the zeroing test fixture separately, not only avoiding the delay in calibration caused by multiple movements of the test fixtures, but also avoiding the need to clear the occupied objects in the remaining positions when the test circuit is moved to the measurement area of ​​the open-circuit voltage measuring device, avoiding the long time consumed in clearing the occupied objects and further causing the delay in calibration of the open-circuit voltage measuring device, thereby improving the timeliness of calibration of the open-circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application does not need to set a zeroing block to realize the function of the zeroing test, thereby reducing the cost of the test circuit.

[0007] In some embodiments, the switch component is used to switch between a first working state and a second working state; when the switch component is in the first working state, the first switch group is turned on and the second switch group is turned off, so that the resistance test circuit is turned on and the clearing test circuit is turned off; when the switch component is in the second working state, the first switch group is turned off and the second switch group is turned on, so that the resistance test circuit is turned off and the clearing test circuit is turned on.

[0008] In the technical solution provided in the embodiment of the present application, a switch component is used to switch between a first working state and a second working state to realize the conduction of the resistance test circuit or the conduction of the zero test circuit. There will be no situation where two circuits are simultaneously conducted or both circuits are not conducted, thereby improving the effectiveness of circuit switching; and, different circuits can be flexibly conducted as needed, effectively avoiding mutual interference between two different measurement circuits, thereby improving the accuracy of the calibration and calibration of the open circuit voltage measurement device.

[0009] In some embodiments, when the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, when the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned off and the second switch group is turned on; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned on and the second switch group is turned off.

[0010] In the technical solution provided in the embodiment of the present application, the change in the working state of the first switch group and the second switch group is controlled by powering on and off the power-on end. No additional control circuit is required to control the working state of the first switch group and the second switch group, which simplifies the circuit design of the test circuit and reduces the complexity of the test circuit.

[0011] In some embodiments, the switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches; or, the switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

[0012] In the technical solution provided in the embodiment of the present application, the first switch group is a normally closed switch and the second switch group is a normally open switch, so that the resistance test circuit can be turned on without powering on the first switch group and the second switch group. The frequency of use of the resistance test circuit is much greater than the frequency of use of the zero test circuit, and thus the conduction of the resistance test circuit can be avoided by additionally powering on the test circuit, which not only improves the conduction efficiency of the resistance test circuit, but also reduces the test power consumption.

[0013] In some embodiments, the connection terminal includes a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal and a negative current connection terminal; the positive voltage connection terminal and the negative voltage connection terminal are both connected to the resistor through the first switch group to form a voltage test circuit in the resistance test circuit; the positive current connection terminal and the negative current connection terminal are both connected to the resistor through the first switch group to form a current test circuit in the resistance test circuit; the positive voltage connection terminal is also connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zero test circuit; the positive current connection terminal is also connected to the negative current connection terminal through the second switch group to form a current test circuit in the zero test circuit.

[0014] In the technical solution provided in the embodiment of the present application, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal and the negative current connection terminal are respectively connected to the four test probes of the open circuit voltage measuring device, which can not only form a voltage test loop and a current test loop in the resistance test loop, but also form a voltage test loop and a current test loop in the zeroing test loop. Through the voltage test loop and the current test loop in the resistance test loop, the accuracy of the open circuit voltage measuring device in measuring resistance is improved. Through the voltage test loop and the current test loop in the zeroing test loop, the accuracy of the zeroing of the open circuit voltage measuring device is improved, thereby improving the accuracy of the calibration and calibration of the open circuit voltage measuring device.

[0015] In some embodiments, the first switch group includes a first switch, a second switch, and a third switch; the second switch group includes a fourth switch and a fifth switch; the positive voltage connection terminal is connected to the first end of the resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch; the positive current connection terminal is connected to the first end of the resistor through the third switch, and the second end of the resistor is connected to the negative current connection terminal through the second switch; the positive current connection terminal is connected to the negative current connection terminal through the fourth switch, the negative current connection terminal is connected to the negative voltage connection terminal through the second switch, and the negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

[0016] In the technical solution provided in the embodiment of the present application, the positive voltage connection terminal and the positive current connection terminal are connected to the negative voltage connection terminal and the negative current connection terminal through the first switch, the second switch, the third switch and the resistor, and the positive voltage connection terminal and the positive current connection terminal are also connected to the negative voltage connection terminal and the negative current connection terminal through the fourth switch and the fifth switch, so that the resistance test circuit is turned on or the zeroing test circuit is turned on by controlling the on and off of the first switch to the fifth switch, thereby improving the effectiveness of the control, and each two elements are isolated by the switch, so that mutual interference between the resistance test circuit and the zeroing test circuit can be avoided, thereby improving the accuracy of the test.

[0017] In some embodiments, the second switch includes a first relay and a second relay; the normally open end of the first relay is connected to the normally open end of the second relay; the common end and the normally closed end of the first relay are respectively connected to the negative voltage connection end and the second end of the resistor; the common end and the normally closed end of the second relay are respectively connected to the negative current connection end and the second end of the resistor.

[0018] In the technical solution provided in the embodiment of the present application, the normally open end of the first relay is connected to the normally open end of the second relay, so that when the first relay and the second relay are disconnected, the negative voltage connection end and the negative current connection end form a path through the normally open end of the first relay and the normally open end of the second relay, and then when the first relay and the second relay are closed, the resistance test circuit is turned on, and when the first relay and the second relay are disconnected, the clearing test circuit is turned on. In this way, the first relay and the second relay can be reused in the resistance test circuit and the clearing test circuit, thereby improving the utilization efficiency of the first relay and the second relay.

[0019] In some embodiments, the second switch includes a third relay and a fourth relay, and the second switch group also includes a fifth relay; the third relay is connected between the second end of the resistor and the negative voltage connection end; the fourth relay is connected between the second end of the resistor and the negative current connection end; and the fifth relay is connected between the negative voltage connection end and the negative current connection end.

[0020] In the technical solution provided in the embodiment of the present application, the conduction or disconnection of the resistance test circuit is controlled by the third relay and the fourth relay, and the conduction or disconnection of the zero test circuit is controlled by the fifth relay, so that the on-off state of each relay will only determine the on-off state of one of the resistance test circuit and the zero test circuit, and has nothing to do with the on-off state of the other circuit, thereby avoiding mutual interference between the resistance test circuit and the zero test circuit and providing reliability of circuit control.

[0021] In some embodiments, the connection end includes a first connection end and a second connection end; the relative position between the first connection end and the second connection end is the same as the relative position between the positive electrical parameter terminal and the negative electrical parameter terminal in the battery tray; wherein the positive electrical parameter terminal and the negative electrical parameter terminal are respectively connected to the positive pole and negative pole of the battery to be tested in the battery tray.

[0022] In the technical solution provided in the embodiment of the present application, the relative position between the first connection terminal and the second connection terminal is the same as the relative position between the positive electrical parameter terminal and the negative electrical parameter terminal in the battery tray, so that the connection method between the test probe of the open circuit voltage measuring device and the first connection terminal and the second connection terminal is the first method, and the connection method between the test probe of the open circuit voltage measuring device and the positive electrical parameter terminal and the negative electrical parameter terminal is the second method. The first method and the second method are the same, thereby simplifying the connection method of the test probe, eliminating the need for additional adaptation or adjustment during testing of the open circuit voltage measuring device, and improving the versatility of the open circuit voltage measuring device.

[0023] In a second aspect, the present application provides a test tool, which includes a base and a bottom plate arranged on the base, and at least one test circuit as described in any one of the first aspects is provided on the bottom plate.

[0024] In the technical solution provided in the embodiment of the present application, by integrating multiple test circuits on the base plate, multiple test loops can be tested through one test tool, thereby improving test efficiency; in addition, by sharing a base and base plate with the resistance test circuit and the zeroing test circuit, the base and base plate can be reused, thereby reducing the cost of the test tool.

[0025] In some embodiments, a power-on interface is also provided on the base plate, which is connected to the control end of the switch component in each test circuit; the switching of power on and power off of the power-on interface controls the switching of the working state of the switch component in each test circuit.

[0026] In the technical solution provided in the embodiment of the present application, the switch components of all test circuits are controlled by a power-on interface, and there is no need to configure control signals for each test circuit separately, which simplifies the design of the circuit on the baseboard. Moreover, by switching the power on and off of the power-on interface, the working status of the switch components in all test circuits can be uniformly switched, thereby improving the switching efficiency of the switch components.

[0027] In a third aspect, the present application provides an open-circuit voltage measurement system, which includes a test tool as described in any one of the second aspects, an open-circuit voltage measurement device, and a battery tray carrying a battery to be tested; the open-circuit voltage measurement device is used to measure the battery to be tested in the battery tray when the test tool is successfully calibrated.

[0028] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measuring device is used to indicate that the measurement accuracy of the open-circuit voltage measuring device meets the requirements when the test tool calibration is successful, and then the battery to be tested in the battery tray is measured by the open-circuit voltage measuring device whose measurement accuracy meets the requirements, thereby avoiding the problem of inaccurate measurement of the battery to be tested caused by measuring the battery to be tested when the measurement accuracy of the open-circuit voltage measuring device does not meet the requirements. Therefore, the embodiment of the present application can improve the accuracy of measurement of the battery to be tested.

[0029] In some embodiments, the open circuit voltage measurement system also includes a transfer device; the transfer device is used to move the test tool to the measurement area of ​​the open circuit voltage measurement device; the transfer device is also used to move the test tool out of the measurement area and move the battery tray to the measurement area when the open circuit voltage measurement device is successfully calibrated, so that the open circuit voltage measurement device can measure the battery to be tested in the battery tray.

[0030] In the technical solution provided in the embodiment of the present application, the transfer device cooperates with the open circuit voltage measuring device to automatically complete the test of the open circuit voltage measuring device and the measurement of the battery to be tested without manual intervention, thereby improving the measurement efficiency of the open circuit voltage measuring device.

[0031] In some embodiments, the open circuit voltage measuring device includes a measuring instrument and at least one set of test probes connected to the measuring instrument; each set of test probes is used to connect to a connection end of each test circuit in the test tool.

[0032] In the technical solution provided in the embodiment of the present application, each group of test probes connected to the measuring instrument is used to connect the connection ends of each test circuit in the test tool, so that each resistance test loop and each zeroing test loop can be formed through each test circuit, thereby improving the effectiveness of the test of the open circuit voltage measurement device.

[0033] In some embodiments, the open circuit voltage measuring device also includes a power supply interface; the open circuit voltage measuring device is also used to connect the power supply interface to the power-on interface in the test tooling, and power on the power-on interface through the power supply interface to switch the state of the switch component in the test tooling.

[0034] In the technical solution provided in the embodiment of the present application, power is supplied to the power-on interface in the test tooling through the power supply interface of the open-circuit voltage measuring device, without the need to introduce other additional power supply devices, thereby avoiding the need to set up additional power supply devices and causing cost increases, thereby reducing the layout cost of the open-circuit voltage measurement system, and the open-circuit voltage measuring device can provide stable power to each test circuit in the test tooling, avoiding test errors caused by power supply fluctuations or instability, and improving the accuracy of testing the open-circuit voltage measuring device.

[0035] In some embodiments, the open-circuit voltage measuring device is also used to respond to the test signal and determine that the calibration of the open-circuit voltage measuring device is successful when the calibration results of each resistance test loop are all successful; wherein the resistance test loop is a closed path formed by connecting the open-circuit voltage measuring device to the resistance test circuit in the test tooling.

[0036] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measurement device is calibrated separately using each resistance test circuit in the test fixture, and the calibration of the open-circuit voltage measurement device is determined to be successful only when the calibration results of each resistance test circuit are all successful, thereby improving the comprehensiveness and accuracy of the calibration of the open-circuit voltage measurement circuit.

[0037] In some embodiments, the open-circuit voltage measuring device is further used to respond to a test signal. When the calibration result of calibration through any resistance test circuit is calibration failure, after calibrating the open-circuit voltage measuring device through each zeroing test circuit, when the calibration results of calibration through each resistance test circuit are all calibration success, it is determined that the calibration of the open-circuit voltage measuring device is successful; wherein the resistance test circuit is a closed path formed by connecting the open-circuit voltage measuring device to the resistance test circuit in the test tooling, and the zeroing test circuit is a closed path formed by connecting the open-circuit voltage measuring device to the zeroing test circuit in the test tooling.

[0038] In the technical solution provided in the embodiment of the present application, by introducing a zero test loop calibration mechanism, when the open-circuit voltage measurement device fails to calibrate, the open-circuit voltage measurement device can also solve the problem through self-calibration, thereby avoiding the situation where the voltage measurement device cannot be calibrated and can only use the open-circuit voltage measurement device that fails to calibrate to measure the battery to be tested, thereby improving the reliability of the open-circuit voltage measurement device in measuring the battery to be tested.

[0039] In a fourth aspect, the present application provides an open circuit voltage measurement method, which is applied to an open circuit voltage measurement device, and the method includes: detecting that a test tool is moved to a measurement area of ​​the open circuit voltage measurement device, and controlling each group of test probes of the open circuit voltage measurement device to be respectively connected to the connection ends of each test circuit in the test tool; calibrating the open circuit voltage measurement device by controlling each zeroing test circuit to be turned on; the zeroing test circuit is a closed path formed by connecting the open circuit voltage measurement device to the zeroing test circuit in the test tool; calibrating the open circuit voltage measurement device by controlling each resistance test circuit to be turned on; the resistance test circuit is a closed path formed by connecting the open circuit voltage measurement device to the resistance test circuit in the test tool; when the open circuit voltage measurement device is calibrated successfully, detecting that the battery tray is moved to the measurement area, and measuring the battery to be tested in the battery tray.

[0040] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measuring device first controls the conduction of each zeroing test circuit, and then controls the conduction of each resistance test circuit, so that the open-circuit voltage measuring device can automatically perform the calibration and calibration steps, thereby improving the efficiency of the calibration and calibration of the open-circuit voltage measuring device. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following briefly introduces the drawings required for use in the embodiments of the present application or related technical descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying any creative work.

[0042] Figure 1 A schematic diagram of a resistance test loop provided for some embodiments;

[0043] Figure 2 A schematic diagram of a zeroing test loop provided in some embodiments;

[0044] Figure 3 A schematic diagram illustrating the connection between an internal resistance meter and a resistor in an open circuit voltage measurement device provided in some embodiments;

[0045] Figure 4 A schematic diagram of an open circuit voltage measurement system provided in some embodiments;

[0046] Figure 5 A schematic structural diagram of a test circuit provided in the first embodiment;

[0047] Figure 6 A schematic structural diagram of a test circuit provided in the second embodiment;

[0048] Figure 7A schematic structural diagram of a test circuit provided in the third embodiment;

[0049] Figure 8 A schematic structural diagram of a test circuit provided in a fourth embodiment;

[0050] Figure 9 A schematic structural diagram of a test circuit provided in a fifth embodiment;

[0051] Figure 10 A schematic diagram of the structure of a test tool provided in some embodiments;

[0052] Figure 11 A schematic structural diagram of an open circuit voltage measurement system provided in some embodiments;

[0053] Figure 12 A schematic flow chart of an open circuit voltage measurement method provided in some embodiments.

[0054] The accompanying drawings in the specific implementation manner are as follows:

[0055] Test fixture 100 ; test circuit 110 ; base 120 ; bottom plate 130 . DETAILED DESCRIPTION

[0056] The following embodiments of the technical solution of the present application will be described in detail with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application and are therefore only examples and are not intended to limit the scope of protection of the present application.

[0057] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0058] In the description of the embodiments of the present application, the technical terms "first" and "second" are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined. In the description of the embodiments of the present application, "each" means each or each of a plurality, unless otherwise clearly and specifically defined.

[0059] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0060] In the description of the embodiments of this application, the term "and / or" is simply a description of the association relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent the following three situations: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this document generally indicates that the associated objects are in an "or" relationship.

[0061] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0062] In the description of the embodiments of the present application, unless otherwise expressly specified or limited, technical terms such as "installed," "connected," "connected," and "fixed" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integration; mechanical connections or electrical connections; direct connections or indirect connections through an intermediate medium; internal connections between two components or interactions between two components. Those skilled in the art can understand the specific meanings of the above terms in the embodiments of the present application based on specific circumstances.

[0063] An open-circuit voltage measurement device (also known as an OCV machine, OCV equipment, or OCV device) is a widely used measurement device in the battery industry. It is primarily used to measure batteries to detect key parameters such as open-circuit voltage and internal resistance, thereby assessing the battery's state of health (SOH) and performance. In practical applications, the open-circuit voltage measurement device must be tested and calibrated before measuring the battery, or if the test results are inaccurate.

[0064] In any embodiment of the present application, calibration refers to the process of testing the accuracy of a standard measuring instrument (e.g., an internal resistance meter for an open-circuit voltage measuring device) during measurement to determine whether the instrument is qualified. In some embodiments, calibrating the open-circuit voltage measuring device can determine whether the measurement accuracy of the open-circuit voltage measuring device meets the requirements. For example, if the calibration of the open-circuit voltage measuring device is successful, the measurement accuracy of the open-circuit voltage measuring device is determined to meet the requirements. For another example, if the calibration of the open-circuit voltage measuring device fails, the measurement accuracy of the open-circuit voltage measuring device is determined to not meet the requirements.

[0065] In any embodiment of the present application, calibration is a set of operations that determines the relationship between the indication of a measuring instrument or measuring system (or the nominal value of a physical measuring instrument) and the corresponding value reproduced by a standard under specified conditions. In some embodiments, calibrating an open-circuit voltage measuring device may include clearing the circuit line resistance of the open-circuit voltage measuring device. By clearing the circuit line resistance of the open-circuit voltage measuring device, the influence of the circuit line resistance on the internal resistance measurement of the battery under test can be avoided. Exemplarily, the circuit line resistance of the open-circuit voltage measuring device and the test probe connected to the internal resistance meter refer to the line resistance of the test loop between the internal resistance meter and the test probe when the test probe is short-circuited, or the line resistance of the test loop between the internal resistance meter and the clearing block or the internal resistance meter and the clearing test circuit when the test probe is connected to the clearing block or the test probe is connected to the clearing test circuit described below. In some implementation scenarios, deformation or damage of the line connection part in the test loop will affect the line resistance of the test loop. If the line resistance of the test loop changes, it is necessary to calibrate the open circuit voltage measurement device and clear the line resistance to zero to avoid the line resistance in the test loop affecting the measurement results of the battery to be tested.

[0066] The resistors in the embodiments of the present application may be standard resistors. A standard resistor is used to measure other resistors or devices with resistors, serving as a reference or comparison for a standard resistance value. A standard resistor is a resistor with high precision and high stability, typically made of a material with a low temperature coefficient and high resistivity. Its resistance value is precisely calibrated and determined, and it can be used as a standard gauge for resistance measurement or in precision electronic circuits to provide a stable resistance value.

[0067] Among them, testing the open circuit voltage measuring device is actually to calibrate the open circuit voltage measuring device through a resistance test loop formed between the internal resistance meter and the resistor in the open circuit voltage measuring device, and to calibrate the open circuit voltage measuring device through a zero test loop formed between the internal resistance meter in the open circuit voltage measuring device and a short-circuited test probe, a zero block or a zero test circuit.

[0068] When the open-circuit voltage measuring device is put into production and debugged for the first time, it is necessary to first use the zeroing block to clear the line resistance of the open-circuit voltage measuring device to calibrate the open-circuit voltage measuring device. After the line resistance of the open-circuit voltage measuring device is calibrated, the open-circuit voltage measuring device measures the resistance to calibrate the open-circuit voltage measuring device.

[0069] Figure 1 Schematic diagram of a resistance test loop provided for some embodiments, such as Figure 1 As shown, the first end of the resistor (master) is connected to the positive voltage terminal (V+) and the positive current terminal (I+) of the internal resistance meter, and the second end of the resistor is connected to the negative voltage terminal (V-) and the negative current terminal (I-) of the internal resistance meter, so that a resistance test loop is formed between the resistor and the internal resistance meter.

[0070] Figure 2 Schematic diagram of a zeroing test circuit provided in some embodiments, such as Figure 2 As shown, the first end of the first clearing block is connected to the positive voltage terminal (V+) of the internal resistance meter, the second end of the first clearing block is connected to the negative voltage terminal (V-) of the internal resistance meter, the first end of the second clearing block is connected to the positive current terminal (I+) of the internal resistance meter, the second end of the second clearing block is connected to the negative current terminal (I-) of the internal resistance meter, and the second end of the first clearing block is also connected to the second end of the second clearing block. In this way, a clearing test loop is formed between the first clearing block, the second clearing block and the internal resistance meter.

[0071] Figure 3 A schematic diagram of the connection between the internal resistance meter and the resistor in the open circuit voltage measurement device provided in some embodiments, such as Figure 3 As shown, the open-circuit voltage measuring device includes an internal resistance meter, 4 switching boards, N groups of relays and N groups of test probes, each group of relays includes 4 relays, and each group of test probes includes 4 test probes, wherein the positive voltage terminal (V+), positive current terminal (I+), negative voltage terminal (V-) and negative current terminal (I-) of the internal resistance meter are respectively connected to the 4 switching boards, and the four switching boards are respectively connected to the 4 relays in each group, and the 4 relays in each group are correspondingly connected to the 4 test probes in each group, and the 4 test probes in each group are used to connect to a resistor, and different groups of test probes are used to connect to different resistors, and the resistance values ​​of different resistors can be the same or at least partially different. For example, the 4 relays in the first group are connected to the first resistor (resistor 1) through the 4 test probes in the first group, and the 4 relays in the Nth group are connected to the Nth resistor (resistor N) through the 4 test probes in the Nth group.

[0072] Among them, the four switching boards are used to connect the internal resistance meter with each group of relays. For example, one switching board is equivalent to the function of a single-pole N-throw switch. Among them, the four relays in each group are used to connect the corresponding resistance test circuit. For example, the four relays in the first group are used to connect the resistance test circuit corresponding to the first resistor (resistor 1).

[0073] Figure 4 A schematic diagram of an open circuit voltage measurement system provided in some embodiments, such as Figure 4 The open circuit voltage measurement system includes an open circuit voltage measurement device, a processor (not shown in the figure), a transfer device (not shown in the figure), a resistance test tool, a zeroing test tool, and a battery tray in the production line, on which there are batteries to be tested.

[0074] Exemplarily, a resistance test fixture includes a base, a bottom plate mounted on the base, and a resistor mounted on the bottom plate. Calibration of the open-circuit voltage measurement device is achieved by measuring the resistance using an open-circuit voltage measurement device. Exemplarily, a zeroing test fixture includes a base, a bottom plate mounted on the base, and a zeroing block mounted on the bottom plate. Calibration of the open-circuit voltage measurement device is achieved by measuring the zeroing block using an open-circuit voltage measurement device.

[0075] In the case where it is determined that the open circuit voltage measuring device needs to be tested, for example, the processor can control the transfer device to operate in response to the test signal, so that the transfer device moves the resistance test tool from position 1, position 2 and position 3 to position 4 (the position where the open circuit voltage measuring device is located, that is, the measurement area of ​​the open circuit voltage measuring device) in sequence, and the processor sends a test signal to the open circuit voltage measuring device so that the open circuit voltage measuring device responds to the test signal and uses the resistance test tool for calibration. If the calibration is successful, the open circuit voltage measuring device sends a calibration success signal to the processor, and the processor controls the transfer device to operate so that the transfer device moves the resistance test tool from position 4 through position 3 to position 5, and continues to control the resistance test tool to move forward, and controls one on the first production line. The battery tray (for example, battery tray 1) moves from position 3 to position 4 so that the open-circuit voltage measuring device measures the batteries to be tested in the battery tray. After the measurement is completed, the battery tray is controlled to move from position 4 through position 3 to position 5, and the battery tray is continuously controlled to move forward, and the battery tray on the second production line (for example, battery tray 2) is controlled to move through positions 2 and 3 to position 4 so that the open-circuit voltage measuring device measures the batteries to be tested in the battery tray. In this way, the transfer device continuously transfers the battery trays on the two production lines to the measurement area of ​​the open-circuit voltage measuring device in an alternating manner. For example, battery tray 3 and battery tray 4 are then controlled to enter the measurement area of ​​the open-circuit voltage measuring device, so that the open-circuit voltage measuring device detects the batteries in the battery trays in the measurement area.

[0076] When the calibration result of the open circuit voltage measuring device using the resistance test fixture is calibration failure, the open circuit voltage measuring device sends a calibration failure signal to the processor. In response to the calibration failure signal, the processor controls the zeroing test fixture to move to position 4 through position 1, position 2 and position 3, and sends a calibration signal to the open circuit voltage measuring device so that the open circuit voltage measuring device is calibrated using the zeroing test fixture. After the calibration is completed, the open circuit voltage measuring device sends a calibration completion signal to the processor, and the processor controls the transfer device to operate so that the transfer device moves the resistance test fixture at position 5 or after position 5 through position 1, position 2 and position 3 to position 4, so that the open circuit voltage measuring device is recalibrated using the resistance test fixture.

[0077] However, since the moving routes of the resistance test jig and the zeroing test jig are both position 1, position 2, position 3 to position 4, when the calibration result of the open circuit voltage measuring device using the resistance test jig is calibration failure, the moving device needs to move the resistance test jig to position 5 or after position 5 before it can vacate the positions 3 and 4. If position 5 is occupied by the battery tray, the transfer device will not be able to move the zeroing test jig to position 4. Or, if the resistance test jig is moved to position 5 or after position 5, at least one of positions 2 and 3 is occupied (for example, occupied by a battery tray), the transfer device will also be unable to move the zeroing test jig to position 4, and thus the open circuit voltage measuring device cannot be calibrated. Only after positions 2, 3 and 4 are all cleared can the zeroing test jig be moved to position 4 to calibrate the open circuit voltage measuring device.

[0078] therefore, Figure 4 In the technical solution, if the calibration of the resistance test fixture fails, all positions 2 to 4 need to be emptied before the open circuit voltage measuring device can be calibrated and recalibrated. If positions 2 to 4 are occupied, the open circuit voltage measuring device cannot be calibrated and recalibrated, resulting in the inability to calibrate the open circuit voltage measurement system in a timely manner.

[0079] Based on this, through research, it was found that if there is a test circuit that can not only realize the function of the resistance test fixture, but also realize the function of the zeroing test fixture, then as long as the test circuit is moved to the measurement area of ​​the open-circuit voltage measuring device, then through the test circuit, not only the calibration of the open-circuit voltage measuring device can be realized, but also the calibration of the open-circuit voltage measuring device can be realized, without moving the resistance test fixture and the zeroing test fixture separately. This not only avoids the delay in calibration and calibration caused by multiple movement of the test fixtures, but also makes it possible to clear the occupied objects in other positions when the test circuit is moved to the measurement area of ​​the open-circuit voltage measuring device, avoiding the long time consumed in clearing the occupied objects and further causing delays in calibration and calibration of the open-circuit voltage measuring device. Therefore, the embodiment of the present application improves the timeliness of calibration and calibration of the open-circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application does not need to set a zeroing block to realize the function of zeroing test, thereby reducing the cost of the test circuit.

[0080] Based on the above considerations, the present application provides a test circuit, which includes a resistor, a switch component and a connecting end; the switch component includes a first switch group and a second switch group; the connecting end is connected to the resistor through the first switch group to form a resistor test circuit, which is used to form a resistor test loop; the connecting end is also connected to the second switch group to form a clear test circuit, which is used to form a clear test loop. In this way, the test circuit can include not only a resistance test circuit but also a zeroing test circuit, thereby forming not only a resistance test loop but also a zeroing test loop, and furthermore, not only the calibration of the open circuit voltage measuring device can be realized through the resistance test loop but also the calibration of the open circuit voltage measuring device can be realized through the zeroing test loop, so that the resistance test function and the zeroing test function can be realized through one movement of the test circuit, without the need to move the resistance test tool and the zeroing test tool separately, which not only avoids the delay in calibration caused by multiple movements of the test tool, but also avoids the need to clear the occupied objects in the remaining positions when the test circuit is moved to the measurement area of ​​the open circuit voltage measuring device, avoiding the long time consumed in clearing the occupied objects and further causing delays in calibration of the open circuit voltage measuring device, thereby improving the timeliness of calibration of the open circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application does not need to set a zeroing block to realize the function of zeroing test, thereby reducing the cost of the test circuit.

[0081] Figure 5 A schematic diagram of the structure of the test circuit provided in the first embodiment, as shown in FIG. Figure 5 As shown, the test circuit includes a resistor, a switch component and a connection terminal; the switch component includes a first switch group and a second switch group.

[0082] The connection end is connected to the resistor through the first switch group to form a resistance test circuit, which is used to form a resistance test loop; the connection end is also connected to the second switch group to form a reset test circuit, which is used to form a reset test loop.

[0083] Exemplarily, the resistance test loop is a closed path formed by connecting an open-circuit voltage measuring device to a resistance test circuit in a test fixture. For example, the open-circuit voltage measuring device connected to the resistance test circuit in the test fixture may include an internal resistance meter of the open-circuit voltage measuring device connected to test probes, and the test probes connected to the resistance test circuit. For example, the positive voltage terminal (V+), positive current terminal (I+), negative voltage terminal (V-), and negative current terminal (I-) of the internal resistance meter are connected to the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal of the resistance test circuit through four test probes, respectively, and the first switch group in the resistance test circuit is turned on and the second switch group is turned off.

[0084] Exemplarily, the zeroing test loop is a closed path formed by connecting an open-circuit voltage measuring device to a zeroing test circuit in a test fixture. For example, the open-circuit voltage measuring device connected to a resistance test circuit in the test fixture may include connecting an internal resistance meter of the open-circuit voltage measuring device to test probes, and the test probes to the resistance test circuit. For example, the positive voltage terminal (V+), positive current terminal (I+), negative voltage terminal (V-), and negative current terminal (I-) of the internal resistance meter are connected to the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal of the resistance test circuit through four test probes, respectively, and the first switch group in the resistance test circuit is open, and the second switch group is closed.

[0085] The conducting end of the first switch group is used to connect the resistor and the connection end, and the conducting end of the second switch group is used to connect the connection end.

[0086] Illustratively, by controlling the working state of the switch component, when the resistance test circuit is turned on, the test circuit is used to perform the resistance test function; when the reset test circuit is turned on, the test circuit is used to perform the reset test function.

[0087] By switching the operating state of each switch in the switch assembly, the on / off control of each switch is controlled to change the operating state of the switch assembly. For example, when the first switch group is closed (also called on or closed), the second switch group is opened (also called open), and when the first switch group is opened, the second switch group is closed.

[0088] In some embodiments, the connection terminal includes a first connection terminal and a second connection terminal. In some embodiments, the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, and the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal. In other embodiments, the first connection terminal includes a positive voltage connection terminal, and the second connection terminal includes a negative voltage connection terminal. In still other embodiments, the first connection terminal includes a positive current connection terminal, and the second connection terminal includes a negative current connection terminal. Exemplarily, the first connection terminal and the second connection terminal may not need to be distinguished between positive and negative, for example, either one of the first connection terminal and the second connection terminal may be a positive electrical parameter connection terminal, and the other may be a negative electrical parameter connection terminal. Again exemplarily, the first connection terminal and the second connection terminal need to be distinguished between positive and negative, for example, the first connection terminal is designated as a positive electrical parameter connection terminal, and the second connection terminal is designated as a negative electrical parameter connection terminal.

[0089] In some embodiments, in a scenario where the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, and the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal, the positive voltage connection terminal, the negative voltage connection terminal, the positive current connection terminal, and the negative current connection terminal are all connected to the resistor through a first switch group, the positive voltage connection terminal is connected to the negative voltage connection terminal through a second switch group, and the positive current connection terminal is connected to the negative current connection terminal through the second switch group.

[0090] Exemplarily, the first connection terminal and the second connection terminal are both connected to a resistor via a first switch group, forming a resistance test circuit. The first connection terminal is also connected to the second connection terminal via a second switch group, forming a zeroing test circuit. The resistance test circuit and the zeroing test circuit are different circuits; the zeroing test circuit does not pass through the resistor. The resistance measurement circuit and the zeroing test circuit reuse the first connection terminal and the second connection terminal.

[0091] For example, when the operating state of the control switch assembly is in the first operating state, the resistance test circuit is turned on and the clearing test circuit is turned off. When the operating state of the control switch assembly is in the second operating state, the resistance test circuit is turned off and the clearing test circuit is turned on. The operating state of the switch assembly in the first operating state may include a state where the first switch group is closed and the second switch group is turned off. The operating state of the switch assembly in the second operating state may include a state where the first switch group is turned off and the second switch group is turned on.

[0092] When the resistance test circuit in the test circuit is turned on, the open-circuit voltage measurement device can use the test circuit to measure resistance for calibration. When the zeroing test circuit in the test circuit is turned on, the open-circuit voltage measurement device can use the test circuit to clear the circuit line resistance for calibration. The circuit line resistance includes the line resistance of the internal resistance meter in the open-circuit voltage measurement device and the circuit in which the zeroing test circuit is located.

[0093] By turning on the resistance test circuit in the test circuit and disconnecting the clearing test circuit in the test circuit, the test circuit is used to realize the function of the resistance test tooling. By disconnecting the resistance test circuit in the test circuit and turning on the clearing test circuit in the test circuit, the test circuit is used to realize the function of the clearing test tooling.

[0094] In the technical solution provided by the embodiment of the present application, the test circuit can include not only a resistance test circuit but also a zeroing test circuit, thereby forming not only a resistance test loop but also a zeroing test loop, and further, not only can the calibration of the open-circuit voltage measuring device be realized through the resistance test loop but also the calibration of the open-circuit voltage measuring device can be realized through the zeroing test loop, so that the resistance test function and the zeroing test function can be realized by a single movement of the test circuit, without the need to move the resistance test fixture and the zeroing test fixture separately, not only avoiding the delay in calibration caused by multiple movements of the test fixtures, but also avoiding the need to clear the occupied objects in the remaining positions when the test circuit is moved to the measurement area of ​​the open-circuit voltage measuring device, avoiding the long time consumed in clearing the occupied objects and further causing the delay in calibration of the open-circuit voltage measuring device, thereby improving the timeliness of calibration of the open-circuit voltage measuring device; in addition, the test circuit in the embodiment of the present application does not need to set a zeroing block to realize the function of the zeroing test, thereby reducing the cost of the test circuit.

[0095] In some embodiments, the switch component is used to switch between a first working state and a second working state; when the switch component is in the first working state, the first switch group is turned on and the second switch group is turned off, so that the resistance test circuit is turned on and the clearing test circuit is turned off; when the switch component is in the second working state, the first switch group is turned off and the second switch group is turned on, so that the resistance test circuit is turned off and the clearing test circuit is turned on.

[0096] In the technical solution provided in the embodiment of the present application, a switch component is used to switch between a first working state and a second working state to realize the conduction of the resistance test circuit or the conduction of the zero test circuit. There will be no situation where two circuits are simultaneously conducted or both circuits are not conducted, thereby improving the effectiveness of circuit switching; and, different circuits can be flexibly conducted as needed, effectively avoiding mutual interference between two different measurement circuits, thereby improving the accuracy of the calibration and calibration of the open circuit voltage measurement device.

[0097] In some embodiments, when the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, when the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned off and the second switch group is turned on; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned on and the second switch group is turned off.

[0098] In the technical solution provided in the embodiment of the present application, the change in the working state of the first switch group and the second switch group is controlled by powering on and off the power-on end. No additional control circuit is required to control the working state of the first switch group and the second switch group, which simplifies the circuit design of the test circuit and reduces the complexity of the test circuit.

[0099] Figure 6 A schematic diagram of the structure of the test circuit provided in the second embodiment, as shown in FIG. Figure 6 As shown, Figure 6 Example compared to Figure 5 The difference between the embodiments is that the test circuit further includes a power-on terminal, and the control terminal of the first switch group and the control terminal of the second switch group are both connected to the power-on terminal.

[0100] In some embodiments, when the power-up terminal is powered on, the first switch group is turned on and the second switch group is turned off; when the power-up terminal is powered off, the first switch group is turned off and the second switch group is turned on.

[0101] In some other embodiments, when the power-on terminal is powered on, the first switch group is turned off and the second switch group is turned on; when the power-on terminal is powered off, the first switch group is turned on and the second switch group is turned off.

[0102] Powering on in any embodiment of the present application can be understood as obtaining power.

[0103] Wherein, when the first switch group includes at least two switches, the control terminals of at least two switches in the first switch group are both connected to the power-on terminal. When the second switch group includes at least two switches, the control terminals of at least two switches in the second switch group are both connected to the power-on terminal.

[0104] In some embodiments, the switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches. In other embodiments, the switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

[0105] A normally closed switch is a switch that is normally closed. A normally open switch is a switch that is normally open.

[0106] For example, a normally closed switch refers to a switch that is in a closed state when there is no power or external force applied, and a normally open switch refers to a switch that is in an open state when there is no power or external force applied.

[0107] Exemplarily, the normally closed switch may include a normally closed relay, and the normally open switch may include a normally open relay. Furthermore, exemplary embodiments include a normally closed switch including a P-type metal-oxide-semiconductor (MOS) switch, and an normally open switch including an N-type MOS switch.

[0108] In the technical solution provided in the embodiment of the present application, the first switch group is a normally closed switch and the second switch group is a normally open switch, so that the resistance test circuit can be turned on without powering on the first switch group and the second switch group. The frequency of use of the resistance test circuit is much greater than the frequency of use of the zero test circuit, and thus the conduction of the resistance test circuit can be avoided by additionally powering on the test circuit, which not only improves the conduction efficiency of the resistance test circuit, but also reduces the test power consumption.

[0109] Figure 7 A schematic diagram of the structure of the test circuit provided in the third embodiment is shown in FIG. Figure 7 As shown, Figure 7 Example compared to Figure 5 The difference between the embodiments is that the connection terminal includes a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal and a negative current connection terminal; the positive voltage connection terminal and the negative voltage connection terminal are both connected to the resistor through the first switch group to form a voltage test circuit in the resistance test circuit; the positive current connection terminal and the negative current connection terminal are both connected to the resistor through the first switch group to form a current test circuit in the resistance test circuit; the positive voltage connection terminal is also connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zero test circuit; the positive current connection terminal is also connected to the negative current connection terminal through the second switch group to form a current test circuit in the zero test circuit.

[0110] Exemplarily, the voltage test circuit in the resistance test circuit is used to form a voltage test loop in the resistance test loop, the current test circuit in the resistance test circuit is used to form a current test loop in the resistance test loop, the voltage test circuit in the zeroing test circuit is used to form a voltage test loop in the zeroing test loop, and the current test circuit in the zeroing test circuit is used to form a current test loop in the zeroing test loop.

[0111] In the technical solution provided in the embodiment of the present application, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal and the negative current connection terminal are respectively connected to the four test probes of the open circuit voltage measuring device, which can not only form a voltage test loop and a current test loop in the resistance test loop, but also form a voltage test loop and a current test loop in the zeroing test loop. Through the voltage test loop and the current test loop in the resistance test loop, the accuracy of the open circuit voltage measuring device in measuring resistance is improved. Through the voltage test loop and the current test loop in the zeroing test loop, the accuracy of the zeroing of the open circuit voltage measuring device is improved, thereby improving the accuracy of the calibration and calibration of the open circuit voltage measuring device.

[0112] Figure 7 Example compared to Figure 5 The embodiment also differs in that the first switch group includes a first switch, a second switch, and a third switch; and the second switch group includes a fourth switch and a fifth switch.

[0113] The positive voltage connection terminal is connected to the first end of the resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch, thereby forming a voltage test circuit in the resistance test circuit.

[0114] The positive current connection terminal is connected to the first terminal of the resistor through the third switch, and the second terminal of the resistor is connected to the negative current connection terminal through the second switch, thereby forming a current test circuit in the resistance test circuit.

[0115] The positive current connection terminal is connected to the negative current connection terminal through the fourth switch, thereby forming a voltage test circuit in the zero test circuit, the negative current connection terminal is connected to the negative voltage connection terminal through the second switch, thereby forming a current test circuit in the zero test circuit, and the negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

[0116] In some embodiments, the negative voltage connection terminal and the negative current connection terminal may be short-circuited by a second switch.

[0117] In some embodiments, the first switch, the second switch, and the third switch are all normally closed relays, and the fourth switch and the fifth switch are all normally open relays. In other embodiments, the first switch, the second switch, and the third switch are all normally open relays, and the fourth switch and the fifth switch are all normally closed relays.

[0118] Among them, the positive voltage connection terminal and the positive current connection terminal are respectively used to connect the positive voltage terminal and the positive current terminal of the internal resistance meter, and the negative voltage connection terminal and the negative current connection terminal are respectively used to connect the negative voltage terminal and the negative current terminal of the internal resistance meter.

[0119] In any embodiment of the present application, a positive voltage may be understood as a high voltage, and a negative voltage may be understood as a low voltage.

[0120] Exemplarily, the first and second switch groups are both single-pole, double-throw switches, and each switch in the first and second switch groups includes a common terminal, a normally open terminal, and a normally closed terminal. When the switches are de-energized, the normally closed terminal of each normally closed switch is connected to the common terminal, and the normally open terminal of each normally open switch is connected to the common terminal. Conversely, when the switches are powered on, the normally open terminal of each normally closed switch is connected to the common terminal, and the normally closed terminal of each normally open switch is connected to the common terminal. Each switch in the first and second switch groups also includes a power connection terminal, which is connected to the power-on terminal.

[0121] The following describes the connection between the first switch and the fifth switch, taking as an example a case where the first switch is a first normally closed relay, the second switch is a second normally closed relay, the third switch is a third normally closed relay, the fourth switch is a first normally open relay, and the fifth switch is a second normally open relay.

[0122] The normally closed contact of the first normally closed relay is connected to the positive voltage connection terminal, and the common contact of the first normally closed relay is connected to the first end of the resistor, or the common contact of the first normally closed relay is connected to the positive voltage connection terminal, and the normally closed contact of the first normally closed relay is connected to the first end of the resistor.

[0123] The common contact of the second normally closed relay is connected to the negative voltage connection terminal and the negative current connection terminal, and the normally closed contact of the second normally closed relay is connected to the second end of the resistor, or the normally closed contact of the second normally closed relay is connected to the negative voltage connection terminal and the negative current connection terminal, and the common contact of the second normally closed relay is connected to the second end of the resistor.

[0124] The normally closed contact of the third normally closed relay is connected to the positive current connection terminal, and the common contact of the first normally closed relay is connected to the first end of the resistor, or the common contact of the first normally closed relay is connected to the positive current connection terminal, and the normally closed contact of the first normally closed relay is connected to the first end of the resistor.

[0125] The normally open contact of the first normally open relay is connected to the positive current connection terminal, and the common contact of the first normally open relay is connected to the negative current connection terminal, or the common contact of the first normally open relay is connected to the positive current connection terminal, and the normally open contact of the first normally open relay is connected to the negative current connection terminal.

[0126] The normally open contact of the second normally open relay is connected to the positive voltage connection terminal, and the common contact of the second normally open relay is connected to the negative voltage connection terminal, or the common contact of the second normally open relay is connected to the positive voltage connection terminal, and the normally open contact of the second normally open relay is connected to the negative voltage connection terminal.

[0127] The power connection ends of the first normally closed relay, the second normally closed relay, the third normally closed relay, the first normally open relay and the second normally open relay are all connected to the power-on end.

[0128] In the technical solution provided in the embodiment of the present application, the positive voltage connection terminal and the positive current connection terminal are connected to the negative voltage connection terminal and the negative current connection terminal through the first switch, the second switch, the third switch and the resistor, and the positive voltage connection terminal and the positive current connection terminal are also connected to the negative voltage connection terminal and the negative current connection terminal through the fourth switch and the fifth switch, so that the resistance test circuit is turned on or the zeroing test circuit is turned on by controlling the on and off of the first switch to the fifth switch, thereby improving the effectiveness of the control, and each two elements are isolated by the switch, so that mutual interference between the resistance test circuit and the zeroing test circuit can be avoided, thereby improving the accuracy of the test.

[0129] Figure 8 This is a schematic diagram of the structure of the test circuit provided in the fourth embodiment, as shown in FIG. Figure 8 As shown, Figure 8 Example compared to Figure 7 The difference between the embodiments is that the second switch includes a first relay K1 and a second relay K2.

[0130] The normally open terminal (also called the normally open contact) of the first relay K1 is connected to the normally open terminal (also called the normally open contact) of the second relay K2; the common terminal (also called the common contact) and the normally closed terminal (also called the normally closed contact) of the first relay K1 are connected to the negative voltage connection terminal and the second end of the resistor, respectively; the common terminal and the normally closed terminal of the second relay K2 are connected to the negative current connection terminal and the second end of the resistor, respectively.

[0131] Exemplarily, the power connection terminals of the first relay K1 and the second relay K2 are both connected to the power-on terminal.

[0132] When the first relay K1 and the second relay K2 are closed, the normally open contacts of the first relay K1 and the second relay K2 are no longer connected to the negative voltage connection terminal and the negative current connection terminal, and thus the zero-clearing test circuit cannot be turned on.

[0133] Exemplarily, the first relay K1 is a first sub-normally closed relay, and the second relay K2 is a second sub-normally closed relay. The normally open contact of the first sub-normally closed relay is connected to the normally open contact of the second sub-normally closed relay; the common terminal and the normally closed contact of the first sub-normally closed relay are respectively connected to the negative voltage connection terminal and the second end of the resistor; the common terminal and the normally closed contact of the second sub-normally closed relay are respectively connected to the negative current connection terminal and the second end of the resistor.

[0134] In the technical solution provided in the embodiment of the present application, the normally open end of the first relay is connected to the normally open end of the second relay, so that when the first relay and the second relay are disconnected, the negative voltage connection end and the negative current connection end form a path through the normally open end of the first relay and the normally open end of the second relay, and then when the first relay and the second relay are closed, the resistance test circuit is turned on, and when the first relay and the second relay are disconnected, the clearing test circuit is turned on. In this way, the first relay and the second relay can be reused in the resistance test circuit and the clearing test circuit, thereby improving the utilization efficiency of the first relay and the second relay.

[0135] Figure 9 A schematic diagram of the structure of the test circuit provided in the fifth embodiment is shown in FIG. Figure 9 As shown, Figure 9 Example compared to Figure 7 The difference between the embodiments is that the second switch includes a third relay K3 and a fourth relay K4, and the second switch group further includes a fifth relay K5.

[0136] The third relay K3 is connected between the second end of the resistor and the negative voltage connection terminal; the fourth relay K4 is connected between the second end of the resistor and the negative current connection terminal; and the fifth relay K5 is connected between the negative voltage connection terminal and the negative current connection terminal.

[0137] Exemplarily, the power connection terminals of the third relay K3 , the fourth relay K4 , and the fifth relay K5 are all connected to the power-on terminal.

[0138] Exemplarily, the third relay K3 is a third sub-normally closed relay, the fourth relay K4 is a third sub-normally closed relay, and the fifth relay K5 is a third normally open relay.

[0139] The common contact of the third sub-normally closed relay is connected to the negative voltage connection terminal, and the normally closed contact of the third sub-normally closed relay is connected to the second end of the resistor, or the normally closed contact of the third sub-normally closed relay is connected to the negative voltage connection terminal, and the common contact of the third sub-normally closed relay is connected to the second end of the resistor.

[0140] The common contact of the fourth sub-normally closed relay is connected to the negative current connection terminal, and the normally closed contact of the fourth sub-normally closed relay is connected to the second end of the resistor, or the normally closed contact of the fourth sub-normally closed relay is connected to the negative current connection terminal, and the common contact of the fourth sub-normally closed relay is connected to the second end of the resistor.

[0141] The common contact of the third normally open relay is connected to the negative voltage connection terminal, and the normally closed contact of the fourth sub-normally closed relay is connected to the negative current connection terminal, or the normally closed contact of the third normally open relay is connected to the negative voltage connection terminal, and the common contact of the fourth sub-normally closed relay is connected to the negative current connection terminal.

[0142] In the technical solution provided in the embodiment of the present application, the conduction or disconnection of the resistance test circuit is controlled by the third relay and the fourth relay, and the conduction or disconnection of the zero test circuit is controlled by the fifth relay, so that the on-off state of each relay will only determine the on-off state of one of the resistance test circuit and the zero test circuit, and has nothing to do with the on-off state of the other circuit, thereby avoiding mutual interference between the resistance test circuit and the zero test circuit and providing reliability of circuit control.

[0143] In some embodiments, the connection terminals include a first connection terminal and a second connection terminal; the relative position between the first connection terminal and the second connection terminal is the same as the relative position between the positive and negative electrical parameter terminals in the battery tray. The positive and negative electrical parameter terminals are connected to the positive and negative terminals of the battery to be tested in the battery tray, respectively.

[0144] Exemplarily, the first connection terminal includes a positive voltage connection terminal and a positive current connection terminal, the second connection terminal includes a negative voltage connection terminal and a negative current connection terminal, the positive electrical parameter terminal includes a positive voltage connection terminal and a positive current connection terminal, and the negative electrical parameter terminal includes a negative voltage connection terminal and a negative current connection terminal. The relative positions between any two of the four terminals, namely, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal, are the same as the relative positions between any two of the four terminals, namely, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal, and the negative current connection terminal.

[0145] For example, the positive voltage connection terminal, the positive current connection terminal, the negative voltage connection terminal and the negative current connection terminal are the four vertices of the first rectangle, the positive voltage terminal, the positive current terminal, the negative voltage terminal and the negative current terminal are the four vertices of the second rectangle, and the length and width of the first rectangle are the same as the length and width of the second rectangle.

[0146] In the technical solution provided in the embodiment of the present application, the relative position between the first connection terminal and the second connection terminal is the same as the relative position between the positive electrical parameter terminal and the negative electrical parameter terminal in the battery tray, so that the connection method between the test probe of the open circuit voltage measuring device and the first connection terminal and the second connection terminal is the first method, and the connection method between the test probe of the open circuit voltage measuring device and the positive electrical parameter terminal and the negative electrical parameter terminal is the second method. The first method and the second method are the same, thereby simplifying the connection method of the test probe, eliminating the need for additional adaptation or adjustment during testing of the open circuit voltage measuring device, and improving the versatility of the open circuit voltage measuring device.

[0147] The test circuit in the embodiments of this application is designed by combining the resistance test fixture and the zeroing test fixture in the existing open-circuit voltage measurement system. Without modifying the open-circuit voltage measurement system externally or adding mechanical structures, a switching circuit board is designed that automatically switches between the resistance test circuit and the zeroing test circuit.

[0148] For example, the resistance test fixture and the zeroing test fixture can be combined into one by automatically switching the switch in the circuit board.

[0149] When the resistance test fixture and the zeroing test fixture in the open circuit voltage measurement system are integrated into one, it becomes a resistance and zeroing test integrated test circuit, which can solve the problem that the two separate fixtures easily cause blockage of the automatic logistics line.

[0150] By changing the switch state via the switch board inside the fixture, the external structure (i.e., the size of the test fixture and the baseplate) remains unchanged, while the test circuit on the baseplate changes (for example, switching between the resistance test circuit and the zero test circuit). The integrated test fixture formed by this test circuit can eliminate the need to change the fixture to switch between the resistance test function and the zero test function.

[0151] In any embodiment of the present application, tooling refers to tools, fixtures and equipment used to produce, test, debug or maintain circuits.

[0152] The measurement current provided in the embodiment of the present application, compared with the separate resistance test tooling and zeroing test tooling in the related art, uses an integrated tooling to solve the problem of being unable to promptly repair (or calibrate) the open circuit voltage measurement device when a resistance test loop test fails.

[0153] Figure 10 A schematic diagram of the structure of the test tooling provided in some embodiments, such as Figure 10 As shown, the test fixture 100 includes N test circuits 110 provided in any of the above embodiments. The test fixture 100 also includes a base 120 and a bottom plate 130 disposed on the base, and the N test circuits 110 are disposed on the bottom plate 130.

[0154] Exemplarily, N is an integer greater than or equal to 1, for example, the value range of N can be 1 to 50. Exemplarily, the value of N can be 1, 5, 10, 20 or 50, etc., which is not limited in the embodiment of the present application.

[0155] exist Figure 10 In the embodiment, N is an integer greater than 1, Figure 10 In another embodiment, N is equal to 1.

[0156] In some embodiments, the value of N can be the same as the maximum number of batteries to be tested that can be placed in the battery tray. Figure 3 , the number of test circuits 110 in a test fixture can be Figure 3 The number of relay groups or test probe groups is the same. Thus, the internal resistance meter, each group of relays, each group of test probes and each test circuit 110 can form a resistance test loop and a zero test loop to calibrate and calibrate the loop where each group of relays and each group of test probes are located.

[0157] In the technical solution provided in the embodiment of the present application, by integrating multiple test circuits on the base plate, multiple test loops can be tested through one test tool, thereby improving test efficiency; in addition, by sharing a base and base plate with the resistance test circuit and the zeroing test circuit, the base and base plate can be reused, thereby reducing the cost of the test tool.

[0158] In some embodiments, as Figure 10 As shown, 130 is also provided with a power-on interface 140, which is connected to the control end of the switch component in each test circuit 110; by switching the power-on interface 140 on and off, the switching of the working state of the switch component in each test circuit 110 is controlled.

[0159] In the technical solution provided in the embodiment of the present application, the switch components of all test circuits are controlled by a power-on interface, and there is no need to configure control signals for each test circuit separately, which simplifies the design of the circuit on the baseboard. Moreover, by switching the power on and off of the power-on interface, the working status of the switch components in all test circuits can be uniformly switched, thereby improving the switching efficiency of the switch components.

[0160] See also Figure 7 and Figure 10 , explaining the working principle of the open circuit voltage measurement device:

[0161] For example, when a daily shift begins (or a production line begins operation), the open circuit voltage measuring device enters a test mode, which can be a zero test mode or a resistance test mode.

[0162] When the open circuit voltage measuring device enters the zero test mode, the power supply port (also called power supply interface) in the open circuit voltage measuring device starts to supply power to the integrated test fixture (i.e. Figure 10 The power supply is provided through the power-on interface (also called the power-taking port) of the corresponding test tool.

[0163] When the power-on interface of the integrated test fixture is energized, the first, second, and third switches inside the integrated test fixture are energized and enter the disconnected state, while the fourth and fifth switches are energized and enter the conductive state. As a result, the test loop current begins to flow from the current loop (SOURCE) high (corresponding to the positive current connection terminal mentioned above) through the fourth switch. Since the fourth switch is energized, the current loop high and the current loop low (corresponding to the negative current connection terminal mentioned above) are connected, the current in the test loop flows from the current loop high to the current loop low.

[0164] When the second switch is energized, the current loop low is connected to the voltage loop (SENSE) low (corresponding to the negative voltage connection terminal mentioned above), so that the current in the test loop flows from the current loop low to the voltage loop low.

[0165] When the fifth switch is energized, the low voltage loop is connected to the high voltage loop, so that the current in the test loop flows from the low voltage loop to the high voltage loop (corresponding to the positive voltage connection terminal mentioned above).

[0166] Finally, the current in the test circuit returns to the instrument (i.e., the internal resistance meter mentioned above, also called the internal resistance test instrument) through the voltage circuit high. The open circuit voltage measurement device software controls the internal resistance meter to perform a zero reset operation.

[0167] When the open circuit voltage measuring device enters the resistance test mode, the power supply port in the open circuit voltage measuring device stops supplying power to the power-on interface of the integrated test fixture.

[0168] If the power interface on the integrated test fixture loses power (or loses power), the first, second, and third switches within the integrated test fixture lose power and enter the on state, while the fourth and fifth switches enter the off state. Consequently, the test loop current flows from the high current loop through the third switch into the resistor. De-energizing the first switch connects the high voltage loop with the resistor and the low voltage loop. De-energizing the second switch connects the high current loop with the resistor and the low current loop. De-energizing the fourth switch decouples the high current loop from the low current loop. De-energizing the fifth switch decouples the high voltage loop from the low voltage loop. Ultimately, the current in the test loop flows from the resistor to the low current loop, and the voltage loop in the test loop connects the high voltage loop through the resistor to the low voltage loop.

[0169] Figure 11 A schematic diagram of the structure of an open circuit voltage measurement system provided in some embodiments, such as Figure 11 As shown, the open circuit voltage measurement system includes the test fixture in any of the above embodiments, the open circuit voltage measurement device, and a battery tray carrying the battery to be tested;

[0170] The open circuit voltage measuring device is used to measure the battery to be tested in the battery tray when it has been successfully calibrated by the test fixture.

[0171] In some embodiments, the open-circuit voltage measurement device is configured to measure the battery to be tested in the battery tray when the resistance test loop in at least one test circuit in the test fixture is successfully calibrated. Where the test fixture includes one test circuit, the open-circuit voltage measurement device is configured to determine that the calibration of the open-circuit voltage measurement device is successful when the resistance test loop in the one test circuit is successfully calibrated. Where the test fixture includes at least two test circuits, the open-circuit voltage measurement device is configured to determine that the calibration of the open-circuit voltage measurement device is successful when the resistance test loop in each test circuit is successfully calibrated.

[0172] In some embodiments, at least one battery to be tested can be placed in the battery tray, and the positive pole and negative pole of each battery to be tested are respectively connected to the positive electrical parameter terminal and the negative electrical parameter terminal. The open circuit voltage measuring device connects each positive electrical parameter terminal with each negative electrical parameter terminal through each group of test probes to achieve measurement of each battery to be tested in the battery tray.

[0173] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measuring device is used to indicate that the measurement accuracy of the open-circuit voltage measuring device meets the requirements when the test tool calibration is successful, and then the battery to be tested in the battery tray is measured by the open-circuit voltage measuring device whose measurement accuracy meets the requirements, thereby avoiding the problem of inaccurate measurement of the battery to be tested caused by measuring the battery to be tested when the measurement accuracy of the open-circuit voltage measuring device does not meet the requirements. Therefore, the embodiment of the present application can improve the accuracy of measurement of the battery to be tested.

[0174] In some embodiments, as Figure 11 As shown, the open circuit voltage measurement system further includes a transfer device;

[0175] The transfer device is used to move the test tooling to the measurement area of ​​the open-circuit voltage measuring device; the transfer device is also used to move the test tooling out of the measurement area and move the battery tray to the measurement area when the open-circuit voltage measuring device is successfully calibrated, so that the open-circuit voltage measuring device can measure the batteries to be tested in the battery tray.

[0176] The transfer device is a device for transferring the test fixture and the battery tray. For example, the test fixture and the battery tray are placed on a mobile assembly. The open circuit voltage measurement system may further include a processor that controls the movement of the transfer device to move the test fixture and the battery tray accordingly.

[0177] In some embodiments, the processor can control the operation of the transfer device in response to a test signal, so that the transfer device moves the test fixture to the measurement area of ​​the open-circuit voltage measurement device. The test signal can be sent by a host computer to the processor. For example, the test signal can be generated by a host computer connected to the processor based on a user's operation and sent to the processor. Alternatively, the test signal can be sent to the processor by the host computer when it determines that the test result of the open-circuit voltage measurement device on the battery under test differs from a preset result by more than a preset threshold. For example, the test signal can include a start-of-shift signal.

[0178] In some embodiments, when the transfer device moves the test tool to the measurement area of ​​the open circuit voltage measuring device, the processor can send a test signal to the open circuit voltage measuring device, and the open circuit voltage measuring device responds to the test signal and calibrates the open circuit voltage measuring device through the test tool.

[0179] In some embodiments, the open circuit voltage measuring device is also used to send a calibration success signal to the processor when the open circuit voltage measuring device is calibrated successfully. In response to the calibration success signal, the processor controls the operation of the transfer device so that the transfer device moves the test tooling out of the measurement area and moves the battery tray to the measurement area. The processor sends a battery measurement signal to the open circuit voltage measuring device. In response to the battery measurement signal, the open circuit voltage measuring device measures the battery to be tested in the battery tray.

[0180] Exemplarily, the number of test circuits in the test fixture is the same as the maximum number of batteries to be tested that can be placed in the battery tray.

[0181] In the technical solution provided in the embodiment of the present application, the transfer device cooperates with the open circuit voltage measuring device to automatically complete the test of the open circuit voltage measuring device and the measurement of the battery to be tested without manual intervention, thereby improving the measurement efficiency of the open circuit voltage measuring device.

[0182] In some embodiments, the open circuit voltage measuring device includes a measuring instrument and at least one set of test probes connected to the measuring instrument; each set of test probes is used to connect to a connection end of each test circuit in the test tool.

[0183] For example, please refer to Figure 11 and Figure 3, the measuring instrument may include an internal resistance meter. Exemplarily, the measuring instrument may be connected to N groups of test probes, each group of test probes including a first test probe and a second test probe, the first test probe may include a positive voltage test probe and a positive current test probe for respectively connecting to the positive voltage terminal and the positive current terminal of the internal resistance meter, and the second test probe may include a negative voltage test probe and a negative current test probe for respectively connecting to the negative voltage terminal and the negative current terminal of the internal resistance meter. The first connection end of each test circuit includes a positive voltage connection end and a positive current connection end, and the second connection end of each test circuit includes a negative voltage connection end and a negative current connection end. The positive voltage test probe, positive current test probe, negative voltage test probe, and negative current test probe in each group of test probes are respectively used to connect to the positive voltage connection end, positive current connection end, negative voltage connection end, and negative current connection end in each corresponding test circuit. The positive voltage test probe, positive current test probe, negative voltage test probe, and negative current test probe in each group of test probes are respectively used to connect the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal in each corresponding test circuit to form a resistance test circuit and a zeroing test circuit for each group, and the open circuit voltage measurement device is tested through the resistance test circuit and the zeroing test circuit for each group.

[0184] In the technical solution provided in the embodiment of the present application, each group of test probes connected to the measuring instrument is used to connect the connection ends of each test circuit in the test tool, so that each resistance test loop and each zeroing test loop can be formed through each test circuit, thereby improving the effectiveness of the test of the open circuit voltage measurement device.

[0185] In some embodiments, the open circuit voltage measuring device also includes a power supply interface; the open circuit voltage measuring device is also used to connect the power supply interface to the power-on interface in the test tooling, and power on the power-on interface through the power supply interface to switch the state of the switch component in the test tooling.

[0186] In some embodiments, when the test fixture is moved to the measurement area of ​​the open-circuit voltage measurement device, the open-circuit voltage measurement device controls the first test probe and the second test probe of each group of test probes to connect to the first connection end and the second connection end of each test circuit respectively. The open-circuit voltage measurement device can be used to control the power supply interface to be connected to the power-on interface when it is determined that the open-circuit voltage measurement device has been calibrated successfully. In some embodiments, the open-circuit voltage measurement device can be used to control the power supply interface to be connected to the power-on interface when it is determined that the open-circuit voltage measurement device has been calibrated unsuccessfully, so as to power on the upper power interface through the power supply interface, so that the test circuit in the test fixture is switched from the resistance test circuit to the zeroing test circuit.

[0187] In other embodiments, when the test tool is moved to the measurement area of ​​the open circuit voltage measuring device, the open circuit voltage measuring device controls the first test probe and the second test probe of each group of test probes to connect to the first connection end and the second connection end of each test circuit respectively, and controls the power supply interface to be connected to the power-on interface, and then performs the calibration step of the open circuit voltage measuring device.

[0188] In the technical solution provided in the embodiment of the present application, power is supplied to the power-on interface in the test tooling through the power supply interface of the open-circuit voltage measuring device, without the need to introduce other additional power supply devices, thereby avoiding the need to set up additional power supply devices and causing cost increases, thereby reducing the layout cost of the open-circuit voltage measurement system, and the open-circuit voltage measuring device can provide stable power to each test circuit in the test tooling, avoiding test errors caused by power supply fluctuations or instability, and improving the accuracy of testing the open-circuit voltage measuring device.

[0189] In some embodiments, the open-circuit voltage measuring device is also used to respond to the test signal and determine that the calibration of the open-circuit voltage measuring device is successful when the calibration results of each resistance test loop are all successful; wherein the resistance test loop is a closed path formed by connecting the open-circuit voltage measuring device to the resistance test circuit in the test tooling.

[0190] Exemplarily, when the test fixture includes one test circuit, if the open-circuit voltage measurement device is successfully calibrated using the one test circuit, then the open-circuit voltage measurement device is determined to have been calibrated successfully. Furthermore, exemplarily, when the test fixture includes at least two test circuits, if the open-circuit voltage measurement device is successfully calibrated using each of the test circuits, then the open-circuit voltage measurement device is determined to have been calibrated successfully.

[0191] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measurement device is calibrated separately using each resistance test circuit in the test fixture, and the calibration of the open-circuit voltage measurement device is determined to be successful only when the calibration results of each resistance test circuit are all successful, thereby improving the comprehensiveness and accuracy of the calibration of the open-circuit voltage measurement circuit.

[0192] In some embodiments, the open-circuit voltage measuring device is further configured to respond to a test signal. When the calibration result of calibration through any resistance test circuit (hereinafter referred to as the target resistance test circuit) is a calibration failure, after calibrating the open-circuit voltage measuring device through each zeroing test circuit, when the calibration results of calibration through each resistance test circuit are all calibration successes, it is determined that the calibration of the open-circuit voltage measuring device is successful; wherein the resistance test circuit is a closed path formed by connecting the open-circuit voltage measuring device to the resistance test circuit in the test tooling, and the zeroing test circuit is a closed path formed by connecting the open-circuit voltage measuring device to the zeroing test circuit in the test tooling.

[0193] In some embodiments, calibrating the open circuit voltage measurement device through each zeroing test loop may include: calibrating the open circuit voltage measurement device through a target zeroing test loop; wherein the target zeroing test loop is a zeroing test loop with the same connection end as the target resistance test loop.

[0194] In the technical solution provided in the embodiment of the present application, by introducing a zero test loop calibration mechanism, when the open-circuit voltage measurement device fails to calibrate, the open-circuit voltage measurement device can also solve the problem through self-calibration, thereby avoiding the situation where the voltage measurement device cannot be calibrated and can only use the open-circuit voltage measurement device that fails to calibrate to measure the battery to be tested, thereby improving the reliability of the open-circuit voltage measurement device in measuring the battery to be tested.

[0195] The following describes an implementation method for testing the open circuit voltage measurement device in the open circuit voltage measurement system using a test fixture: first, when the test fixture is moved to the measurement area of ​​the open circuit voltage measurement device, the open circuit voltage measurement device controls the positive voltage test probe, positive current test probe, negative voltage test probe, and negative current test probe in each group of test probes to respectively connect the positive voltage connection terminal, positive current connection terminal, negative voltage connection terminal, and negative current connection terminal in each corresponding test circuit. In this way, each resistance test loop is formed by connecting the resistance meter to the resistance measurement circuit in each test circuit; then the internal resistance meter detects the resistance value of each resistance test loop. If the detected resistance value is the same as the resistance value of the resistor in each test circuit, or the difference value is less than the preset threshold value, the calibration results of each resistance test loop are all successful.

[0196] However, if the resistance value corresponding to the target resistance test circuit is different from the resistance value of the resistance in the corresponding target test circuit, or the difference value is greater than or equal to the preset threshold value, the calibration result of the calibration through the target resistance test circuit is a calibration failure. In this way, the open circuit voltage measurement device controls the power supply interface to connect to the power-on interface, and powers on the power-up interface through the power supply interface. In this way, through the connection of the resistance meter with the zeroing measurement circuit in each test circuit, each zeroing test circuit is formed, and the internal resistance meter can detect the resistance value of the zeroing test circuit in the target test circuit and reset the detected resistance value to zero, thereby realizing the calibration of the open circuit voltage measurement device through the target zeroing test circuit. Then, the open circuit voltage measurement device controls the power supply interface to disconnect from the power-on interface, and re-performs the calibration operation through each resistance test circuit. When the calibration results of the calibration through each resistance test circuit are all successful, it is determined that the calibration of the open circuit voltage measurement device is successful.

[0197] Figure 12 A flow chart of a method for measuring open circuit voltage provided in some embodiments, such as Figure 12 As shown, the method is applied to an open circuit voltage measuring device, and the method includes:

[0198] S1201: Detecting that the test fixture moves to the measurement area of ​​the open-circuit voltage measuring device, controlling each group of test probes of the open-circuit voltage measuring device to be connected to the connection terminals of each test circuit in the test fixture.

[0199] S1202: Calibrate the open circuit voltage measuring device by controlling the conduction of each zero-clearing test circuit.

[0200] Among them, the zeroing test loop is a closed path formed by connecting the open circuit voltage measuring device to the zeroing test circuit in the test fixture.

[0201] In some embodiments, before S1202 , the method further includes: a calibration result of the open circuit voltage measurement device being calibrated through the target resistance test loop is calibration failure.

[0202] In some embodiments, S1202 may include: the open circuit voltage measuring device controls the power supply interface to connect to the power-up interface, and powers up the power-up interface through the power supply interface, so that each clearing test circuit is turned on.

[0203] S1203. Calibrate the open circuit voltage measuring device by controlling the conduction of each resistance test circuit.

[0204] The resistance test loop is a closed path formed by connecting the open-circuit voltage measuring device to the resistance test circuit in the test fixture.

[0205] In some embodiments, S1203 may include: the open circuit voltage measuring device controls the power supply interface to be disconnected from the power-on interface, so that each test circuit is switched to each resistance test loop being conductive.

[0206] S1204: When the open circuit voltage measuring device is successfully calibrated, it is detected that the battery tray has moved to the measurement area, and the batteries to be tested in the battery tray are measured.

[0207] In the technical solution provided in the embodiment of the present application, the open-circuit voltage measuring device first controls the conduction of each zeroing test circuit, and then controls the conduction of each resistance test circuit, so that the open-circuit voltage measuring device can automatically perform the calibration and calibration steps, thereby improving the efficiency of the calibration and calibration of the open-circuit voltage measuring device.

[0208] In an exemplary embodiment, some embodiments of the present application use an open circuit voltage measuring device, which includes a connection control module, a calibration module, a demarcation module and a measurement module. The connection control module is used to detect that the test tool is moved to the measurement area of ​​the open circuit voltage measuring device, and control each group of test probes of the open circuit voltage measuring device to be connected to the connection end of each test circuit in the test tool; the calibration module is used to calibrate the open circuit voltage measuring device by controlling each zeroing test loop to be turned on; the zeroing test loop is a closed path formed by the open circuit voltage measuring device connecting to the zeroing test circuit in the test tool; the demarcation module is used to calibrate the open circuit voltage measuring device by controlling each resistance test loop to be turned on; the resistance test loop is a closed path formed by the open circuit voltage measuring device connecting to the resistance test circuit in the test tool; the measurement module is used to detect that the battery tray is moved to the measurement area when the open circuit voltage measuring device is calibrated successfully, and measure the battery to be tested in the battery tray.

[0209] In some embodiments, the open circuit voltage measurement device includes a memory and a processor, the memory stores a computer program, and the processor implements the steps of the method of any of the above embodiments when executing the computer program.

[0210] In one embodiment, a computer-readable storage medium is provided, and when a computer program is executed by a processor, the computer program implements the steps of the method provided in any of the above embodiments.

[0211] In one embodiment, a computer program product is provided, including a computer program. When the computer program is executed by a processor, the steps of the method provided in any of the above embodiments are implemented.

[0212] The technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0213] The above embodiments merely illustrate several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art may make various modifications and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A test circuit, characterized in that: The test circuit includes a resistor, a switch component and a connection terminal; the switch component includes a first switch group and a second switch group; the connection terminal includes a positive voltage connection terminal, a positive current connection terminal, a negative voltage connection terminal and a negative current connection terminal; The positive voltage connection terminal and the negative voltage connection terminal are both connected to the resistor through the first switch group, forming a voltage test circuit in the resistance test circuit; the positive current connection terminal and the negative current connection terminal are both connected to the resistor through the first switch group, forming a current test circuit in the resistance test circuit; the resistance test circuit is used to form a resistance test loop; The positive voltage connection terminal is further connected to the negative voltage connection terminal through the second switch group to form a voltage test circuit in the zero-clearing test circuit; the positive current connection terminal is further connected to the negative current connection terminal through the second switch group to form a current test circuit in the zero-clearing test circuit; the zero-clearing test circuit is used to form a zero-clearing test loop; The control ends of the first switch group and the second switch group are both connected to the power-on end of the test circuit. The power-on end is powered on or off. The on-off states of the first switch group and the second switch group are different. When the power-on end is powered on or off, the on-off state of the first switch group is switched, and the on-off state of the second switch group is switched.

2. The test circuit according to claim 1, wherein: The switch assembly is used to switch between a first working state and a second working state; When the switch assembly is in the first working state, the first switch group is turned on and the second switch group is turned off, so that the resistance test circuit is turned on and the zero test circuit is turned off; When the switch assembly is in the second working state, the first switch group is disconnected and the second switch group is connected, so that the resistance test loop is disconnected and the zeroing test loop is connected.

3. The test circuit according to claim 2, wherein: When the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is turned on and the second switch group is turned off; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned off and the second switch group is turned on; or, When the control end of the first switch group and the control end of the second switch group are both powered on, the first switch group is disconnected and the second switch group is turned on; when the control end of the first switch group and the control end of the second switch group are both powered off, the first switch group is turned on and the second switch group is disconnected.

4. The test circuit according to claim 2, wherein: The switches in the first switch group are normally closed switches, and the switches in the second switch group are normally open switches; or The switches in the first switch group are normally open switches, and the switches in the second switch group are normally closed switches.

5. The test circuit according to any one of claims 1 to 4, characterized in that: The connection end is used to connect to the open circuit voltage measuring device through a test probe of the open circuit voltage measuring device. When the resistance test circuit is turned on, the connection between the resistance test circuit and the open circuit voltage measuring device forms the resistance test loop. When the zeroing test circuit is turned on, the connection between the zeroing test circuit and the open circuit voltage measuring device forms the zeroing test loop.

6. The test circuit according to any one of claims 1 to 4, characterized in that: The first switch group includes a first switch, a second switch, and a third switch; the second switch group includes a fourth switch and a fifth switch; The positive voltage connection terminal is connected to the first end of the resistor through the first switch, and the second end of the resistor is connected to the negative voltage connection terminal through the second switch; the positive current connection terminal is connected to the first end of the resistor through the third switch, and the second end of the resistor is connected to the negative current connection terminal through the second switch; The positive current connection terminal is connected to the negative current connection terminal through the fourth switch, the negative current connection terminal is connected to the negative voltage connection terminal through the second switch, and the negative voltage connection terminal is connected to the positive voltage connection terminal through the fifth switch.

7. The test circuit according to claim 6, characterized in that: The second switch includes a first relay and a second relay; The normally open end of the first relay is connected to the normally open end of the second relay; The common terminal and the normally closed terminal of the first relay are connected to the negative voltage connection terminal and the second terminal of the resistor respectively; The common terminal and the normally closed terminal of the second relay are connected to the negative current connection terminal and the second terminal of the resistor respectively.

8. The test circuit according to claim 6, characterized in that: The second switch includes a third relay and a fourth relay, and the second switch group also includes a fifth relay; The third relay is connected between the second end of the resistor and the negative voltage connection end; The fourth relay is connected between the second end of the resistor and the negative current connection end; The fifth relay is connected between the negative voltage connection terminal and the negative current connection terminal.

9. The test circuit according to any one of claims 1 to 4, characterized in that: The connection end includes a first connection end and a second connection end; the relative position between the first connection end and the second connection end is the same as the relative position between the positive electrical parameter terminal and the negative electrical parameter terminal in the battery tray; The positive electrical parameter terminal and the negative electrical parameter terminal are respectively connected to the positive electrode and the negative electrode of the battery to be tested in the battery tray.

10. A test tool, characterized in that: The test fixture includes a base and a bottom plate arranged on the base, and at least one test circuit according to any one of claims 1 to 9 is provided on the bottom plate.

11. The test fixture according to claim 10, characterized in that: The base plate is also provided with a power-on interface, which is connected to the control end of the switch component in each test circuit; the switching of power on and power off of the power-on interface controls the switching of the working state of the switch component in each test circuit.

12. An open circuit voltage measurement system, characterized in that: The open circuit voltage measurement system comprises the test fixture according to claim 10 or 11, an open circuit voltage measurement device, and a battery tray carrying a battery to be tested; The open circuit voltage measuring device is used to measure the battery to be tested in the battery tray when the test fixture calibration is successful.

13. The open circuit voltage measurement system according to claim 12, characterized in that: The open circuit voltage measurement system further includes a transfer device; The transfer device is used to move the test fixture to the measurement area of ​​the open circuit voltage measuring device; The transfer device is also used to move the test fixture out of the measurement area and move the battery tray to the measurement area when the open circuit voltage measuring device is calibrated successfully, so that the open circuit voltage measuring device can measure the batteries to be tested in the battery tray.

14. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device includes a measuring instrument and at least one set of test probes connected to the measuring instrument; Each group of the test probes is used to connect to the connection end of each test circuit in the test fixture.

15. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device also includes a power supply interface; the open circuit voltage measuring device is also used to connect the power supply interface to the power-on interface in the test tool, and power on the power-on interface through the power supply interface to switch the state of the switch component in the test tool.

16. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device is further configured to respond to the test signal and determine that the calibration of the open circuit voltage measuring device is successful when the calibration results of the calibration through each resistance test loop are all successful; The resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test fixture.

17. The open circuit voltage measurement system according to claim 12 or 13, characterized in that: The open circuit voltage measuring device is further configured to, in response to a test signal, determine that the calibration of the open circuit voltage measuring device is successful after calibrating the open circuit voltage measuring device through each zeroing test circuit if a calibration result obtained through any resistance test circuit is a calibration failure, and if the calibration results obtained through each resistance test circuit are all calibration successes; Among them, the resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test tool, and the zero test loop is a closed path formed by connecting the open circuit voltage measuring device to the zero test circuit in the test tool.

18. A method for measuring open circuit voltage, characterized in that: The method is applied to an open circuit voltage measuring device, and the method includes: detecting that the test fixture according to claim 10 or 11 moves to the measurement area of ​​the open circuit voltage measuring device, and controlling each group of test probes of the open circuit voltage measuring device to be connected to the connection end of each test circuit in the test fixture; The open circuit voltage measuring device is calibrated by controlling each of the zeroing test circuits to be turned on so as to turn on each of the zeroing test loops; the zeroing test loop is a closed path formed by connecting the open circuit voltage measuring device to the zeroing test circuit in the test fixture; The open circuit voltage measuring device is calibrated by controlling each of the resistance test circuits to be turned on so that each resistance test loop is turned on; the resistance test loop is a closed path formed by connecting the open circuit voltage measuring device to the resistance test circuit in the test fixture; When the open circuit voltage measuring device is successfully calibrated, it is detected that the battery tray has moved to the measuring area, and the batteries to be tested in the battery tray are measured.

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