Supercapacitor System Testing Method and System for Thermal Power Unit Based on Hybrid Energy Storage

Abstract

The present invention relates to the technical field of supercapacitor testing, and particularly to a supercapacitor system testing method and system based on a hybrid energy storage thermal power unit, including: obtaining the interference degree suffered by each process according to the voltage difference between voltages on the voltage fitting curve of each process; obtaining the mutation temperature of each process according to the distribution difference of data in the resistance data sequence; obtaining the corrected voltage at each moment in each process according to the interference degree suffered by each process, the difference between the temperature at each moment in each process and the reference temperature, the difference between corresponding voltages at all moments, and the mutation temperature; and completing the measurement of the electric quantity of the supercapacitor system through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system. The present invention improves the accuracy of the electric quantity measurement of the capacitor system by correcting the measured voltage.

Description

Technical Field

[0001] The present invention relates to the technical field of supercapacitor testing, and particularly to a supercapacitor system testing method and system based on a hybrid energy storage thermal power unit. Background Art

[0002] The testing of a supercapacitor system based on a hybrid energy storage thermal power unit is a comprehensive experiment involving power systems, energy storage technologies, and the performance evaluation of electrical equipment. The purpose of such testing is to evaluate the application effect of supercapacitors in thermal power generating units, especially their performance in aspects such as load fluctuations, frequency regulation, and standby power supply. A hybrid energy storage system usually consists of multiple energy storage devices (such as supercapacitors, batteries, flywheel energy storage, etc.) to make full use of the advantages of different energy storage technologies and achieve the optimal operation of the system.

[0003] During the testing process of the supercapacitor system of a thermal power unit, the measurement of the electric quantity of the supercapacitor plays a very important role in the analysis of the stability and efficiency conversion of the system; however, during the conventional measurement of the electric quantity of the supercapacitor, the electric quantity of the supercapacitor can be obtained through voltage and capacitance; due to the interference of temperature and external noise, the collected voltage signal has errors, resulting in a large error in the measured electric quantity of the supercapacitor system and reducing the accuracy of the testing of the supercapacitor system. Summary of the Invention

[0004] The present invention provides a supercapacitor system testing method and system based on a hybrid energy storage thermal power unit to solve the existing problems.

[0005] The object of the present invention can be achieved by the following technical solutions:

[0006] In the first aspect of the present invention, a supercapacitor system testing method based on a hybrid energy storage thermal power unit is provided, including:

[0007] Obtaining voltage data and resistance data at all moments in each process of the supercapacitor system; each process of the supercapacitor system is a charging process or a discharging process;

[0008] Performing exponential curve fitting on the voltage data at all moments in each process to obtain a voltage fitting curve for each process; obtaining the degree of interference suffered in each process according to the differences between the voltages on the voltage fitting curve of each process;

[0009] Obtain the sequential temperature data of the supercapacitor system, sort the resistance data at all moments in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; adjust the voltage at all moments according to the difference between the temperature at each moment and the reference temperature in each process, the difference between the voltages corresponding to all moments, and the mutation temperature to obtain the adjusted voltage; where the reference temperature is a preset temperature;

[0010] Perform curve fitting on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; perform interpolation of missing data according to all the adjusted voltages in each process to obtain the adjusted voltage at each moment; correct the adjusted voltage at each moment according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the degree of interference received by each process to obtain the corrected voltage at each moment in each process;

[0011] Obtain the supercapacitor charge at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; use the supercapacitor charge at each moment in each process as the measured value of the supercapacitor system charge.

[0012] Furthermore, perform exponential curve fitting on the voltage data at all moments in each process to obtain the voltage fitting curve of each process; obtain the degree of interference received by each process according to the difference between the voltages on the voltage fitting curve of each process, including:

[0013] Perform exponential curve fitting on the voltage data at all moments in each process by the least squares method to obtain the voltage fitting curve of each process;

[0014] Calculate the voltage residual values at all moments in each process respectively according to the fitting value and the obtained voltage value at each moment in the voltage fitting curve of each process; calculate the standard deviation and determination coefficient of the voltage residual values in each process according to the voltage residual values at all moments in each process;

[0015] Obtain the degree of interference received by each process through the standard deviation and determination coefficient of the voltage residual values of each process; the degree of interference is specifically expressed by the formula:

[0016]

[0017] In the formula, represents the standard deviation of the voltage residual values of each process, represents the determination coefficient of the voltage residual values of each process, Indicates the degree of interference suffered by each process.

[0018] Further, selecting a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and denoting it as the final segmentation data includes:

[0019] Select any data in the resistance data sequence, denote it as the segmentation data, and denote the segmentation data and the resistance data at all previous moments as the front resistance set; denote the resistance data at all moments after the segmentation data as the back resistance set; obtain the segmentation degree of the segmentation data according to the data distribution difference between the front resistance set and the back resistance set; the segmentation degree is specifically expressed by the formula:

[0020]

[0021] In the formula, represents the mean value of all data in the front resistance set, represents the mean value of all data in the back resistance set, represents the standard deviation of all data in the front resistance set, represents the standard deviation of all data in the back resistance set, represents the exponential function with the natural constant as the base, is the absolute value symbol, represents the segmentation degree of the segmentation data;

[0022] Take each resistance data in the resistance data sequence as the segmentation data in turn, calculate the segmentation degree of each resistance data in the resistance data sequence respectively, and take the resistance data with the largest segmentation degree in the resistance data sequence as the final segmentation data.

[0023] Further, adjusting the voltages at all moments according to the difference between the temperature at each moment and the reference temperature, the difference between the corresponding voltages at all moments, and the abrupt temperature in each process to obtain the adjusted voltages includes:

[0024]

[0025]

[0026] In the formula, represents the reference temperature, represents any temperature in each process, represents the abrupt temperature in each process, represents the temperature corresponding voltage in each process, represents the reference temperature corresponding voltage in each process, represents the temperature coefficient of the voltage, Indicates the temperature in each process The corresponding adjusted voltage Indicates the temperature The difference from the reference temperature ; wherein, the reference temperature Is a preset temperature

[0027] Furthermore, curve fitting is performed on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve for each process; interpolation of missing data is performed based on all the adjusted voltages in each process to obtain the adjusted voltage at each moment, including:

[0028] Based on the adjusted voltages corresponding to all the temperatures in each process, interpolation of missing data is performed using a linear interpolation algorithm to obtain the adjusted voltage at each moment;

[0029] Based on the adjusted voltages corresponding to all the temperatures in each process, curve fitting is performed by the least squares method to obtain the adjusted voltage fitting curve for each process

[0030] Furthermore, based on the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve, and the degree of interference received by each process, the adjusted voltage at each moment is corrected to obtain the corrected voltage at each moment in each process, including:

[0031]

[0032] In the formula Represents the adjusted voltage at each moment in each process Represents the fitted voltage at each moment in each process Represents the corrected voltage at each moment in each process Represents the degree of interference received by each process Represents a linear normalization function

[0033] Wherein, the fitted voltage at each moment in each process is the voltage corresponding to each moment on the adjusted voltage fitting curve

[0034] Furthermore, based on the corrected voltage at each moment in each process and the capacitance of the supercapacitor system, the supercapacitor charge at each moment in each process is obtained, including:

[0035]

[0036] In the formula Represents the capacitance of the supercapacitor system Represents the corrected voltage at each moment in each process Represents the supercapacitor charge at each moment in each process.

[0037] The second aspect of the present invention is to provide a supercapacitor system test system based on a hybrid energy storage thermal power unit, including:

[0038] Data acquisition module: used to obtain voltage data and resistance data of the supercapacitor system at all moments in each process; each process of the supercapacitor system is a charging process or a discharging process;

[0039] Interference analysis module: used to perform exponential curve fitting on the voltage data at all moments in each process to obtain the voltage fitting curve of each process; according to the differences between the voltages on the voltage fitting curve of each process, obtain the degree of interference received by each process;

[0040] Voltage adjustment module: used to obtain the sequential temperature data of the supercapacitor system, sort the resistance data at all moments in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; according to the difference between the temperature at each moment in each process and the reference temperature, the difference between the corresponding voltages at all moments, and the mutation temperature, adjust the voltages at all moments to obtain the adjusted voltages; where the reference temperature is a preset temperature;

[0041] Voltage correction module: used to perform curve fitting on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; perform interpolation of missing data according to all the adjusted voltages in each process to obtain the adjusted voltage at each moment; according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve, and the degree of interference received by each process, correct the adjusted voltage at each moment to obtain the corrected voltage at each moment in each process;

[0042] Measurement test module: used to obtain the supercapacitor charge at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; take the supercapacitor charge at each moment in each process as the measured value of the supercapacitor system charge.

[0043] The third aspect of the present invention is to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, it implements the supercapacitor system test method based on the hybrid energy storage thermal power unit.

[0044] The fourth aspect of the present invention is to provide a computer-readable storage medium storing a computer program, which when executed by a processor implements the method for testing a supercapacitor system based on a hybrid energy storage thermal power unit.

[0045] Compared with the prior art, the beneficial effects of the present invention are as follows: According to the differences between voltages on the voltage fitting curves of each process, the degree of interference received by each process is obtained, improving the accuracy of the analysis of voltage data affected by noise interference; According to the distribution differences of data in the resistance data sequence, the mutation temperature is obtained; According to the differences between the temperature at each moment and the reference temperature in each process, the differences between the voltages corresponding to all moments, and the mutation temperature, the voltages at all moments are adjusted to obtain the adjusted voltages, compensating for the influence of temperature on voltage through the change of temperature; Curve fitting is performed on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; Interpolation of missing data is performed according to all the adjusted voltages in each process to obtain the adjusted voltage at each moment; According to the differences between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve, and the degree of interference received by each process, the adjusted voltage at each moment is corrected to obtain the corrected voltage at each moment in each process, reducing the error of the voltage; Through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system, the supercapacitor charge at each moment in each process is obtained; The supercapacitor charge at each moment in each process is used as the measured value of the supercapacitor system charge; The accuracy of the supercapacitor system for charge measurement is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following described drawings are only some embodiments of the present invention, and those of ordinary skill in the art can also obtain other drawings based on these drawings without creative efforts.

[0047] Figure 1 It is a schematic flowchart of the steps of the method for testing a supercapacitor system based on a hybrid energy storage thermal power unit provided by the present invention;

[0048] Figure 2 It is a schematic module flowchart of the system for testing a supercapacitor system based on a hybrid energy storage thermal power unit provided by the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0049] To enable those skilled in the art to better understand the solution of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the scope of protection of the present invention.

[0050] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present invention described herein can be implemented in an order different from those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0051] In view of the problems existing in the background technology, researching and designing a supercapacitor system test method and system based on a hybrid energy storage thermal power unit has important practical significance.

[0052] As Figure 1 shown, the first aspect of the present invention is to provide a supercapacitor system test method based on a hybrid energy storage thermal power unit, including the following steps:

[0053] Step S001: Collect voltage and resistance data of the supercapacitor system at all times during each process.

[0054] It should be noted that in order to analyze and obtain the power data of the supercapacitor system at each moment, it is necessary to obtain all the voltage and resistance data of the supercapacitor system during the charge and discharge processes, and analyze the power data of each moment in the supercapacitor through the voltage and resistance data.

[0055] Specifically, at a preset time interval obtain the voltage data of the supercapacitor system at all times during each process through a digital multimeter; at a preset time interval obtain the resistance data of the supercapacitor system at all times during each process through an alternating current impedance spectrometer. Wherein, each process of the supercapacitor system is a charging process or a discharging process. Wherein, in this embodiment, the preset time interval seconds, wherein the preset time interval is not specifically limited, and the implementer can determine it according to the specific situation.

[0056] So far, the voltage data and resistance data of the supercapacitor system at all times in each process are obtained.

[0057] Step S002: According to the differences between the voltages on the voltage fitting curves of each process, obtain the degree of interference suffered by each process; according to the distribution differences of the data in the resistance data sequence, obtain the mutation temperature of each process, and according to the degree of interference suffered by each process, the differences between the temperature at each moment and the reference temperature in each process, the differences between the corresponding voltages at all times, and the mutation temperature, obtain the corrected voltage at each moment in each process.

[0058] It should be noted that since the voltage data gradually increases during the charging and discharging processes of the capacitor and finally approaches the external power supply voltage, the voltage shows an exponential growth during the charging process; while during the discharging process of the capacitor, the voltage data gradually decreases and finally approaches zero, and the voltage shows an exponential decay during the discharging process. When the voltage data is interfered during the charging and discharging processes, the trend characteristics of the collected voltage data may show a weaker exponential change trend. Therefore, the degree of interference suffered can be analyzed by the change characteristics of the obtained voltage data.

[0059] Specifically, use the least squares method to perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; among them, the least squares method is a well-known technology and will not be specifically described here.

[0060] According to the fitting values and the obtained voltage values at each moment in the voltage fitting curve of each process, calculate the voltage residuals at all times in each process respectively; calculate the standard deviation and determination coefficient of the voltage residuals in each process according to the voltage residuals at all times in each process; among them, the processes of obtaining the standard deviation and determination coefficient are both well-known technologies and will not be specifically described here.

[0061] Obtain the degree of interference suffered by each process through the standard deviation and determination coefficient of the voltage residuals of each process; the degree of interference is specifically expressed by the formula:

[0062]

[0063] In the formula, represents the standard deviation of the voltage residuals of each process, represents the determination coefficient of the voltage residuals of each process, represents the degree of interference suffered by each process.

[0064] Among them, the larger the standard deviation of each process, the greater the data fluctuation, and the greater the degree of interference suffered by each process; conversely, the smaller the degree of interference suffered by each process. The coefficient of determination of each process represents the fitting effect of each process. When the coefficient of determination is close to 1, it indicates that the fitting effect of each process is better, that is, the degree of interference suffered by each process is smaller; when the coefficient of determination is smaller, that is, the farther away from 1, it indicates that the fitting effect of each process is worse, that is, the degree of interference suffered by each process is greater.

[0065] So far, the degree of interference suffered by each process is obtained by the above method.

[0066] It should be noted that during the charging process of the supercapacitor, the current is large at the beginning and gradually decreases as the charging progresses; while during the discharging process of the supercapacitor, the current is large at the beginning and gradually decreases as the voltage decreases. Therefore, at the beginning of both the charging process and the discharging process, the current is very large and gradually decreases over time. Since heat is generated in each process, the more heat is generated, the higher the temperature, which leads to an increase in resistance and a decrease in voltage.

[0067] Furthermore, it should be noted that since the temperature in each process is relatively low, when the temperature is relatively low, it has little effect on the resistance of the supercapacitor. However, when the temperature rises to a certain value, the resistance will be affected by the temperature and change. Moreover, the higher the temperature, the greater the resistance of the supercapacitor. Therefore, first, the temperature corresponding to the resistance mutation point is determined through the change of resistance. For the resistance mutation point, the resistance data can be divided into two data sets for differential analysis to obtain the resistance mutation point.

[0068] Specifically, the sequential temperature data of the supercapacitor system is collected through a temperature sensor; the resistance data in each process is sorted according to the time sequence to form a resistance data sequence; any data in the resistance data sequence is selected and denoted as the segmentation data, and the segmentation data and all previous resistance data are denoted as the front resistance set; the resistance data at all subsequent times after the segmentation data is denoted as the back resistance set; according to the difference in data distribution between the front resistance set and the back resistance set, the segmentation degree of the segmentation data is obtained; the segmentation degree is specifically expressed by the formula:

[0069]

[0070] In the formula, represents the mean value of all data in the front resistance set, represents the mean value of all data in the back resistance set, represents the standard deviation of all data in the front resistance set, represents the standard deviation of all data in the back resistance set, represents the exponential function with the base of the natural constant is the absolute value symbol represents the degree of segmentation of the segmented data

[0071] Each resistance data in the resistance data sequence is sequentially used as the segmented data, and the degree of segmentation of each resistance data in the resistance data sequence is calculated respectively; the resistance data with the largest degree of segmentation in the resistance data sequence is used as the final segmented data. Among them, when each resistance data in the resistance data sequence is used as the segmented data in sequence, the last resistance data is not analyzed as the segmented data

[0072] Among them, the greater the data difference between the current resistance set and the subsequent resistance set, the more suitable the segmented data is as the final segmented data; and the more concentrated the data in the current resistance set and the more concentrated the data in the subsequent resistance set, the more the two sets divided by the segmented data can determine the mutation point of the resistance, that is, when the temperature reaches a certain value, the resistance increases with the increase of the temperature

[0073] So far, the final segmented data in the resistance data sequence of each process is obtained through the above method

[0074] The temperature corresponding to the final segmented data is recorded as the mutation temperature of each process

[0075] According to the difference between the temperature at each moment and the reference temperature in each process, the difference between the voltages corresponding to all moments, and the mutation temperature, the voltages at all moments are adjusted to obtain the adjusted voltages; specifically, it is expressed by the formula:

[0076]

[0077]

[0078] In the formula, represents the reference temperature represents any temperature in each process represents the mutation temperature of each process represents the temperature in each process corresponding voltage represents the reference temperature in each process corresponding voltage represents the temperature coefficient of the voltage represents the temperature in each process corresponding adjusted voltage represents the temperature and the reference temperature difference between; among them, the reference temperature is a preset temperature, and in this embodiment, the reference temperature for In this embodiment, the reference temperature is not specifically limited and can be determined by the implementer according to the specific situation.

[0079] It should be noted that during the data processing process, data may be missing due to equipment failure or network delay, so the missing data needs to be filled through interpolation method.

[0080] According to the adjusted voltage corresponding to all temperatures in each process, the missing data is interpolated using a linear interpolation algorithm to obtain the adjusted voltage at each moment; wherein the linear interpolation algorithm is a well-known technology and will not be described in detail here. According to the adjusted voltage corresponding to all temperatures in each process, the least squares method is used to perform curve fitting to obtain the adjusted voltage fitting curve of each process; wherein the least squares method is a well-known technology and will not be described in detail here.

[0081] It should be noted that when the interference degree of each process is greater, the data fluctuation is more drastic, that is, the interference degree of external noise is greater, and the degree of correction required is greater; conversely, when the interference degree of each process is smaller, the interference degree of external noise is smaller, that is, the degree of correction required is smaller. Therefore, the voltage can be corrected according to the interference degree.

[0082] Specifically, according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve and the interference degree of each process, the adjusted voltage at each moment is corrected to obtain the corrected voltage at each moment in each process; the corrected voltage is specifically expressed by the formula:

[0083]

[0084] In the formula, Indicates the adjusted voltage at each moment in each process, represents the fitted voltage at each moment in each process, Indicates the corrected voltage at each moment in each process, Indicates the degree of interference to each process, Represents a linear normalized function, where the fitting voltage at each moment in each process is the voltage corresponding to the voltage fitting curve at each moment.

[0085] in, It represents the difference between the adjusted voltage and the fitted voltage, which indicates the range of the correction adjustment. for The adjustment coefficient is, that is, the greater the interference, the greater the correction adjustment, and vice versa.

[0086] So far, the corrected voltage at each moment in each process is obtained by the above method.

[0087] Step S003: Measure the charge of the supercapacitor through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system.

[0088] The charge of the supercapacitor at each moment in each process is obtained through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; specifically, it is expressed by the formula:

[0089]

[0090] In the formula, represents the capacitance of the supercapacitor system, represents the corrected voltage at each moment in each process, represents the charge of the supercapacitor at each moment in each process.

[0091] So far, the charge of the supercapacitor at each moment in each process is obtained.

[0092] It should be noted that in order to verify the accuracy of the charge of the supercapacitor at each moment in each process obtained by using the innovative method, a generator set model is constructed through a power system simulation software (MATLAB / Simulink). The charging / discharging process is simulated in the simulation model, and the charge of the supercapacitor at several moments is obtained by using the traditional conventional method to form a sequence, denoted as the conventional charge sequence; then the charge of the supercapacitor at several moments is obtained by using the innovative method of the present invention to form a sequence, denoted as the innovative charge sequence; then the measurement results of the charge of the supercapacitor at several moments are obtained by a high-precision reference device (such as a laboratory-level charge analyzer) to form a sequence, denoted as the comparison charge sequence; the errors between the comparison charge sequence and the conventional charge sequence and the innovative charge sequence are calculated respectively, and the improvement effect of the innovative method on the real-time acquisition accuracy of the supercapacitor charge is evaluated by comparing the errors of the charge measurement.

[0093] As Figure 2 shown, the second aspect of the present invention is to provide a supercapacitor system test system based on a hybrid energy storage thermal power unit, including the following modules:

[0094] Data acquisition module 101: used to obtain the voltage data and resistance data of the supercapacitor system at all moments in each process; each process of the supercapacitor system is a charging process or a discharging process;

[0095] Interference analysis module 102: used to perform exponential curve fitting on the voltage data at all times in each process to obtain the voltage fitting curve of each process; based on the differences between the voltages on the voltage fitting curve of each process, obtain the degree of interference suffered by each process;

[0096] Voltage adjustment module 103: used to obtain the timing temperature data of the supercapacitor system, sort the resistance data at all times in each process in chronological order to form a resistance data sequence, select a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and record it as the final segmentation data; record the temperature corresponding to the final segmentation data as the mutation temperature of each process; adjust the voltages at all times according to the differences between the temperatures at each time and the reference temperature, the differences between the corresponding voltages at all times, and the mutation temperature in each process to obtain the adjusted voltages; where the reference temperature is a preset temperature;

[0097] Voltage correction module 104: used to perform curve fitting on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; perform interpolation of missing data based on all the adjusted voltages in each process to obtain the adjusted voltage at each time; correct the adjusted voltage at each time according to the differences between the adjusted voltage at each time and the corresponding voltage on the adjusted voltage fitting curve, and the degree of interference suffered by each process to obtain the corrected voltage at each time in each process;

[0098] Measurement and test module 105: used to obtain the supercapacitor charge at each time in each process through the corrected voltage at each time in each process and the capacitance of the supercapacitor system; use the supercapacitor charge at each time in each process as the measured value of the supercapacitor system charge.

[0099] The third aspect of the present invention is to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the supercapacitor system test method based on a hybrid energy storage thermal power unit.

[0100] The fourth aspect of the present invention is to provide a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, it implements the supercapacitor system test method based on a hybrid energy storage thermal power unit.

[0101] Those skilled in the art should understand that the embodiments of the present invention can be provided as a method, a system, or a computer program product. Therefore, the present invention can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk memory, optical memory, etc.) that contain computer-usable program code.

[0102] The present invention is described with reference to the flowcharts and / or block diagrams of methods, systems, and computer program products according to the embodiments of the present invention. It should be understood that each flow and / or block in the flowchart and / or block diagram, as well as the combination of flows and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0103] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing devices to work in a specific manner, such that the instructions stored in the computer-readable memory generate a manufactured article including instruction means that implement the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0104] These computer program instructions can also be loaded onto a computer or other programmable data processing devices, such that a series of operation steps are executed on the computer or other programmable devices to generate a computer-implemented process, and thus the instructions executed on the computer or other programmable devices provide steps for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0105] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: still, the specific implementation manners of the present invention can be modified or equivalently replaced, and any modification or equivalent replacement without departing from the spirit and scope of the present invention shall be covered by the protection scope of the present invention.

Claims

1. A test method for a supercapacitor system based on a hybrid energy storage thermal power unit, characterized in that, Including: Obtaining voltage data and resistance data of the supercapacitor system at all moments in each process; each process of the supercapacitor system is a charging process or a discharging process; Performing exponential curve fitting on the voltage data at all moments in each process to obtain the voltage fitting curve of each process; Obtaining the degree of interference suffered by each process according to the difference between voltages on the voltage fitting curve of each process; Obtaining the timing temperature data of the supercapacitor system, sorting the resistance data at all moments in each process in chronological order to form a resistance data sequence, and selecting a data from the resistance data sequence according to the distribution difference of the data in the resistance data sequence, and recording it as the final segmentation data; recording the temperature corresponding to the final segmentation data as the mutation temperature of each process; the specific process of obtaining the final segmentation data is: Selecting any data in the resistance data sequence and recording it as the segmentation data, recording the segmentation data and the resistance data at all previous moments as the previous resistance set; recording the resistance data at all moments after the segmentation data as the subsequent resistance set; obtaining the segmentation degree of the segmentation data according to the difference in data distribution between the previous resistance set and the subsequent resistance set; the segmentation degree is specifically expressed by the formula: wherein, represents the mean value of all data in the front resistance set, represents the mean value of all data in the back resistance set, represents the standard deviation of all data in the front resistance set, represents the standard deviation of all data in the back resistance set, represents the exponential function with the natural constant as the base, is the absolute value symbol, represents the degree of segmentation of the segmentation data; Taking each resistance data in the resistance data sequence as the segmentation data in turn, calculating the segmentation degree of each resistance data in the resistance data sequence respectively, and taking the resistance data with the largest segmentation degree in the resistance data sequence as the final segmentation data; Adjusting the voltages at all moments according to the difference between the temperature at each moment and the reference temperature in each process, the difference between the corresponding voltages at all moments, and the mutation temperature to obtain the adjusted voltages; wherein, the reference temperature is a preset temperature; Performing curve fitting on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; performing interpolation of missing data on all the adjusted voltages in each process to obtain the adjusted voltage at each moment; correcting the adjusted voltage at each moment according to the difference between the adjusted voltage at each moment and the voltage corresponding to the adjusted voltage fitting curve, and the degree of interference suffered by each process to obtain the corrected voltage at each moment in each process; Obtaining the supercapacitor charge at each moment in each process through the corrected voltage at each moment in each process and the capacitance of the supercapacitor system; taking the supercapacitor charge at each moment in each process as the measured value of the supercapacitor system charge.

2. The test method for the supercapacitor system of the hybrid energy storage thermal power unit according to claim 1, wherein Performing exponential curve fitting on the voltage data at all moments in each process to obtain the voltage fitting curve of each process; Obtaining the degree of interference suffered by each process according to the difference between voltages on the voltage fitting curve of each process, including: Performing exponential curve fitting on the voltage data at all moments in each process by the least squares method to obtain the voltage fitting curve of each process; Calculating the voltage residual values at all moments in each process respectively according to the fitting value and the obtained voltage value at each moment in the voltage fitting curve of each process; calculating the standard deviation and the coefficient of determination of the voltage residual values in each process according to the voltage residual values at all moments in each process; The degree of interference suffered by each process is obtained through the standard deviation and coefficient of determination of the voltage residual values of each process; the degree of interference is specifically expressed by the formula: In the formula, represents the standard deviation of the voltage residual value of each process, represents the coefficient of determination of the voltage residual value of each process, represents the degree of interference received by each process.

3. The test method of the supercapacitor system based on the hybrid energy storage thermal power unit according to claim 1, characterized in that, Adjusting the voltages at all times according to the difference between the temperature and the reference temperature at each time in each process, the difference between the voltages corresponding to all times, and the sudden change temperature to obtain the adjusted voltages, including: In the formula, represents the reference temperature, represents any one temperature in each process, represents the mutation temperature in each process, represents the temperature in each process corresponding voltage, represents the voltage corresponding to the reference temperature in each process corresponding voltage, represents the temperature coefficient of voltage, represents the temperature in each process corresponding adjusted voltage, represents the temperature and the reference temperature the difference between; among them, the reference temperature is a preset temperature.

4. The test method of the supercapacitor system based on a hybrid energy storage thermal power unit according to claim 3, characterized in that, Performing curve fitting on all the adjusted voltages in each process to obtain the adjusted voltage fitting curve of each process; interpolating the missing data according to all the adjusted voltages in each process to obtain the adjusted voltage at each time, including: Interpolating the missing data by using the linear interpolation algorithm according to the adjusted voltages corresponding to all the temperatures in each process to obtain the adjusted voltage at each time; Performing curve fitting by using the least squares method according to the adjusted voltages corresponding to all the temperatures in each process to obtain the adjusted voltage fitting curve of each process.

5. The method for testing a supercapacitor system of a thermal power unit based on hybrid energy storage according to claim 1, wherein Correcting the adjusted voltage at each time according to the difference between the adjusted voltage at each time and the voltage corresponding to the adjusted voltage fitting curve, and the degree of interference suffered by each process to obtain the corrected voltage at each time in each process, including: Wherein, represents the adjusted voltage at each moment in each process, represents the fitted voltage at each moment in each process, represents the corrected voltage at each moment in each process, represents the degree of interference received by each process, represents the linear normalization function; Among them, the fitted voltage at each time in each process is the voltage corresponding to each time on the adjusted voltage fitting curve.

6. The test method for the supercapacitor system of a thermal power unit based on hybrid energy storage according to claim 1, wherein Obtaining the supercapacitor charge at each time in each process through the corrected voltage at each time in each process and the capacitance of the supercapacitor system, including: In the formula, represents the capacitance of the supercapacitor system, represents the corrected voltage at each moment in each process, represents the supercapacitor charge at each moment in each process.

7. A supercapacitor system test system for a thermal power unit with hybrid energy storage, characterized in that, Including a data acquisition module, an interference analysis module, a voltage adjustment module, a voltage correction module, and a measurement and testing module. When the data acquisition module, the interference analysis module, the voltage adjustment module, the voltage correction module, and the measurement and testing module are executed, the testing method for the supercapacitor system based on a hybrid energy storage thermal power unit described in claim 1 is implemented.

8. An electronic device, characterized in that, Including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the testing method for the supercapacitor system based on a hybrid energy storage thermal power unit described in any one of claims 1-6 is implemented.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the testing method for the supercapacitor system based on a hybrid energy storage thermal power unit described in any one of claims 1-6 is implemented.

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