A leakage monitoring and protection method and system for a high-voltage power supply of a mass spectrometer

Abstract

The present invention relates to the technical field of leakage monitoring and protection, and specifically discloses a leakage monitoring and protection method and system for a high-voltage power supply of a mass spectrometer. A layer of gold nanorod array thin film is embedded in the vacuum coating layer of the high-voltage power supply electrode of the mass spectrometer, and a group of gold nanorod arrays are arranged near the output electrode of the high-voltage power supply of the mass spectrometer. The plasma resonance effect of the local surface of the gold nanorod array is utilized to detect the micro-area electric field on the surface of the corresponding electrode of the high-voltage power supply of the mass spectrometer; thereby, a real-time electric field distortion signal with a high signal-to-noise ratio is obtained; and the leakage evaluation coefficient of each future time point is further predicted. When the leakage evaluation coefficient at a certain future time point is about to reach a set threshold coefficient, the system triggers a protection mechanism in advance within milliseconds to cut off the high-voltage power supply output, which can significantly improve the safety and reliability of the high-voltage power supply of the mass spectrometer and provide a solid foundation for the safe operation of high-precision analytical instruments.

Description

Technical Field

[0001] The present invention belongs to the technical field of leakage monitoring and protection, and relates to a leakage monitoring and protection method and system for a high-voltage power supply of a mass spectrometer. Background Art

[0002] Mass spectrometers, as high-precision analytical instruments, are widely used in fields such as life sciences, environmental monitoring, and materials analysis. Their core component, the high-voltage power supply, typically operates at voltages of several thousand volts or even higher. If leakage occurs, it can not only damage the device's internal circuits or components but can also cause safety incidents such as high-voltage discharges and short circuits, posing a threat to the operator's life. Furthermore, leakage is often an early sign of equipment aging, dielectric breakdown, or elevated humidity. Real-time monitoring of the high-voltage power supply's leakage status can promptly identify potential hazards and prevent sudden equipment failures during operation, thereby reducing downtime and maintenance costs.

[0003] However, current technologies still have many technical defects and drawbacks in the leakage monitoring of high-voltage power supplies for mass spectrometers. First, most traditional leakage monitoring methods rely on direct measurement of leakage current, and this method usually requires direct coupling of the monitoring circuit with the high-voltage power supply, which poses a large safety risk. Especially in high-voltage environments, the measuring equipment itself may be damaged by high-voltage shocks, or even cause more serious electrical accidents. Secondly, existing technologies mostly use a single current or voltage monitoring indicator, lacking the ability to fully perceive changes in the spatial distribution of the electric field, and are unable to accurately locate the specific area where leakage occurs or predict the trend of leakage, resulting in a large lag and blindness in the handling of leakage problems. Summary of the Invention

[0004] In view of the above problems in the prior art, the present invention provides a leakage monitoring and protection method and system for a high-voltage power supply of a mass spectrometer, which are used to solve the above technical problems.

[0005] In order to achieve the above-mentioned and other purposes, the technical solutions adopted by the present invention are as follows:

[0006] In one aspect, the present invention provides a method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer, the method comprising the following steps:

[0007] A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode, and a group of gold nanorod arrays are arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area corresponding to the surface of the mass spectrometer's high-voltage power supply electrode.

[0008] When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio.

[0009] Based on the real-time electric field distortion signal with high signal-to-noise ratio, the leakage assessment coefficient at each future time point is predicted; when the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

[0010] When a change in the electric field in the micro area is detected, the implementation logic is:

[0011] Collect the LSPR resonance wavelength of the gold nanorod array, record the initial wavelength λ0 and the wavelength λ at the current time point, calculate the difference between the wavelength λ at the current time point and the initial wavelength λ0, and obtain the wavelength offset △λ at the current time point;

[0012] The wavelength offset Δλ at the current time point is integrated with the wavelength offsets at previous time points, and the time derivatives of all time points are calculated to obtain the wavelength offset rate λ' at all time points;

[0013] Obtaining experimentally calibrated sensitivity of gold nanorod arrays to changes in local electric fields , the dielectric constant of the coating layer ε and the dielectric constant of the vacuum ε0, and the static electric field distortion in the micro-area electric field is calculated respectively and dynamic electric field distortion ;

[0014] The static electric field distortion α1 and the dynamic electric field distortion α2 in the micro-area electric field are summed to obtain the total electric field distortion in the micro-area electric field;

[0015] Compare the total electric field distortion in the micro-area electric field with the set distortion threshold:

[0016] If the former is greater than the latter, it is determined that the electric field in the micro-area has changed;

[0017] Otherwise, it is determined that the electric field in the micro-region has not changed.

[0018] By modulating the light source to emit laser, the logic is as follows:

[0019] Extracting Plasmon Frequencies of Gold Nanorod Materials from the Gold Nanorod Database , and then calculate the intrinsic plasma wavelength of the gold nanorod material , where c is the speed of light;

[0020] Simultaneous calculation of the equivalent dielectric constant of the dielectric layer surrounding the gold nanorods ,in represent the refractive index and thickness of the silicon dioxide layer in the dielectric layer surrounding the gold nanorods; represent the refractive index and thickness of the tantalum pentoxide layer in the dielectric layer around the gold nanorods, is the total thickness of the dielectric layer;

[0021] The real part of the dielectric parameter ε1 of the gold nanorod material in the optical frequency band is calculated based on the Drude model, so as to calculate the optimal incident laser wavelength to excite the LSPR effect of the gold nanorod array. , where Γ is the plasma frequency correction value caused by the finite size of the gold nanorods, , R is the aspect ratio of the gold nanorod, R=L / D, L and D represent the length and diameter of the gold nanorod respectively; P is the depolarization factor, which characterizes the correction value of the gold nanorod geometry to the electric field distribution. .

[0022] Obtain real-time electric field distortion signals with high signal-to-noise ratio, including:

[0023] Assume that the real-time electric field distortion signal consists of the distortion signal and environmental noise:

[0024] , is the amplitude of the distorted signal, is the frequency of the distorted signal, is the initial phase of the distorted signal, is the environmental noise signal;

[0025] A sine wave with a base frequency of f1 = 1 kHz and a sub-frequency of f2 = 2.5 kHz is selected as the laser modulation signal. Two sinusoidal reference signals are generated by dual-frequency modulation of the laser of the modulated light source:

[0026] ;

[0027] The real-time electric field distortion signal Mixed with two sinusoidal reference signals respectively, two mixed signals are obtained:

[0028] ;

[0029] Perform low-pass filtering on the mixed signals V1 and V2 respectively to remove the high-frequency components and retain only the frequency and Signal:

[0030] ;

[0031] The low-pass filtered signals V1' and V2' are phase-weighted and summed to obtain the final real-time electric field distortion signal with high signal-to-noise ratio. .

[0032] Predict the leakage assessment coefficient at each future time point, including:

[0033] The total electric field distortion in the micro-area electric field at M consecutive historical time points is collected to form a total electric field distortion sequence:

[0034] , △τ is the historical data sampling interval, M is the historical data window length, t is the current time point, and α is the total electric field distortion in the micro-area electric field;

[0035] The time decay weight of each historical time point is calculated from this , e is a natural constant, ρ is a decay rate constant, which is determined by fitting the autocorrelation function of historical data, j is the reverse index of the historical time point, j=1 represents the most recent moment, and j=M represents the earliest moment;

[0036] The current time point is recorded as t, and each future time point is defined as , where i is the number of each future time point, i=1,2,...N, N is the total number of future time points, is the time interval difference between each future time point and the current time point;

[0037] Calculate the leakage assessment coefficient at each future time point Where η1 is the contribution weight of historical electric field distortion data, , They respectively represent the fluctuation degree of the electric field distortion signal and the system noise within the length of the historical data window;

[0038] η2 is the sensitivity coefficient of the electric field change rate, γ is the time inertia of the leakage development process, exp(·) represents the exponential function with the natural number e as the base, is the total electric field distortion in the micro-area electric field at the jth historical time point, is the distortion change rate at each future time point in the micro-area electric field.

[0039] The calculation formula for the distortion change rate in the micro-area electric field is as follows:

[0040] ;

[0041] In the above formula is the total electric field distortion in the micro-area electric field at the i-th future time point.

[0042] Another aspect of the present invention provides a leakage monitoring and protection system for a high-voltage power supply of a mass spectrometer, comprising: an electric field detection module, a signal acquisition module, and a leakage protection module, wherein the modules are connected via wired and / or wireless connections to achieve data transmission between the modules;

[0043] Electric field detection module: A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode. A group of gold nanorod arrays is arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area of ​​the surface of the mass spectrometer's high-voltage power supply corresponding electrode.

[0044] Signal acquisition module: When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio.

[0045] Leakage protection module: Based on real-time electric field distortion signals with a high signal-to-noise ratio, it predicts the leakage assessment coefficient at each future time point. When the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

[0046] As described above, the present invention provides a method and system for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer, which has at least the following beneficial effects:

[0047] The present invention utilizes the localized surface plasmon resonance (LSPR) effect of gold nanorod arrays to detect electric fields in micro-regions, enabling highly sensitive monitoring of electric field changes. This is crucial for timely identification of potential leakage risks, especially in precision equipment such as mass spectrometers, where any slight electric field change can significantly degrade device performance or pose a safety hazard.

[0048] By modulating the light source to emit laser light, the LSPR effect of the gold nanorod array can be precisely stimulated, thereby capturing the electric field distortion signal in real time. The working state of the mass spectrometer's high-voltage power supply may change in an instant. Rapidly capturing the electric field change signal can provide an accurate data basis for subsequent leakage trend prediction;

[0049] A predictive model for leakage assessment based on real-time electric field distortion signals with a high signal-to-noise ratio can quantify leakage risks at future points by establishing a mathematical model. This allows the system to take protective measures and shut off the high-voltage power supply before the leakage risk reaches a dangerous threshold, thus achieving comprehensive monitoring and intelligent management of the mass spectrometer's high-voltage power supply. This integrated system not only improves the safety and stability of the equipment, but also reduces the need for manual intervention and lowers operational risks. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0051] Figure 1 It is a schematic diagram of the connection of each step of the method of the present invention.

[0052] Figure 2 Schematic diagram of the connection of various modules of the system of the present invention. DETAILED DESCRIPTION

[0053] The above contents described below in conjunction with the implementation of the present invention are merely examples and explanations of the concept of the present invention. Those skilled in the art may make various modifications or additions to the described specific embodiments or replace them in a similar manner. As long as they do not deviate from the concept of the invention or exceed the scope defined by the claims, they shall fall within the scope of protection of the present invention.

[0054] Example 1

[0055] See also Figure 1 As shown, a leakage monitoring and protection method for a high-voltage power supply of a mass spectrometer comprises the following steps:

[0056] A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode, and a group of gold nanorod arrays are arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area corresponding to the surface of the mass spectrometer's high-voltage power supply electrode.

[0057] A periodic gold nanorod array is embedded in the vacuum coating layer on the surface of the high-voltage electrode. The gold nanorods have a length of 120±5nm, a diameter of 25±2nm, an array spacing of 300nm, and a coating thickness not exceeding 5μm. The array forms full-surface equipotential contact with the high-voltage electrode through a magnetron sputtering process, and utilizes the localized surface plasmon resonance (LSPR) effect of the gold nanorods to sense in real time the electric field distortion caused by trace adsorbents or structural defects within 5μm of the electrode surface.

[0058] When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio.

[0059] When a change in the electric field in the micro area is detected, the implementation logic is:

[0060] Collect the LSPR resonance wavelength of the gold nanorod array, record the initial wavelength λ0 and the wavelength λ at the current time point, calculate the difference between the wavelength λ at the current time point and the initial wavelength λ0, and obtain the wavelength offset △λ at the current time point;

[0061] The wavelength offset Δλ at the current time point is integrated with the wavelength offsets at previous time points, and the time derivatives of all time points are calculated to obtain the wavelength offset rate λ' at all time points;

[0062] Obtaining experimentally calibrated sensitivity of gold nanorod arrays to changes in local electric fields , the dielectric constant of the coating layer ε and the dielectric constant of vacuum ε0, and the static electric field distortion in the micro-area electric field is calculated respectively and dynamic electric field distortion ;

[0063] The calculation formula of α1 reflects the intensity of static electric field distortion. The LSPR effect of gold nanorods responds directly to changes in local electric field. The resonant wavelength shift Δλ is linearly related to the electric field change, and the proportional coefficient is Therefore, through experimental calibration △λ can be directly converted into electric field distortion intensity;

[0064] The calculation formula for α2 incorporates the influence of dynamic electric field variations. Electric field distortion is often accompanied by temporal dynamics, and the rate of change of the LSPR resonant wavelength shift, λ', can describe this dynamic trend. To account for the amplification of electric field variations by the dielectric properties of the coating, a correction factor is introduced: the ratio of the coating's dielectric constant to the vacuum's dielectric constant.

[0065] The static electric field distortion α1 and the dynamic electric field distortion α2 in the micro-area electric field are summed to obtain the total electric field distortion in the micro-area electric field;

[0066] Compare the total electric field distortion in the micro-area electric field with the set distortion threshold:

[0067] If the former is greater than the latter, it is determined that the electric field in the micro-area has changed;

[0068] Otherwise, it is determined that the electric field in the micro-region has not changed.

[0069] The calculation process for the total electric field distortion in a micro-area electric field combines static electric field distortion and dynamic electric field distortion. By linking the LSPR resonance wavelength shift of the gold nanorod array with the electric field change, the formula can sensitively detect static changes in the electric field. This sensitivity comes from the high sensitivity of gold nanorods to electric field changes, which can produce a measurable resonance wavelength shift under small electric field perturbations. Experiments have shown that the LSPR effect of gold nanorods responds linearly to electric field changes, making △λ a reliable indicator of electric field changes.

[0070] Secondly, dynamic electric field changes are reflected by the wavelength shift rate λ', which captures the temporal dynamics of electric field changes and provides real-time monitoring of electric field distortion trends. By introducing the dielectric constant ε of the coating layer, the formula takes into account the dielectric's amplification of electric field changes, making the calculation more realistic. In reality, rapid changes in the electric field may indicate potential leakage risks, so dynamic monitoring is key to achieving predictive and protective measures.

[0071] In practical applications, the sensitivity coefficient and dielectric constant of gold nanorods can be calibrated experimentally. In summary, by integrating static and dynamic electric field variations and taking into account dielectric properties, a highly efficient and accurate method for detecting electric field distortion is provided. This is particularly important in precision equipment such as mass spectrometers, as timely and accurate detection of electric field distortion can effectively prevent leakage risks and ensure safe operation and long-term stability of the equipment.

[0072] By modulating the light source to emit laser, the logic is as follows:

[0073] Extracting Plasmon Frequencies of Gold Nanorod Materials from the Gold Nanorod Database , and then calculate the intrinsic plasma wavelength of the gold nanorod material , where c is the speed of light;

[0074] Simultaneous calculation of the equivalent dielectric constant of the dielectric layer surrounding the gold nanorods ,in represent the refractive index and thickness of the silicon dioxide layer in the dielectric layer surrounding the gold nanorods; represent the refractive index and thickness of the tantalum pentoxide layer in the dielectric layer around the gold nanorods, is the total thickness of the dielectric layer;

[0075] The refractive index of the silicon dioxide layer and the refractive index of the tantalum pentoxide layer are both dimensionless values ​​used to describe the change in the speed of light when it propagates through the material. It is defined as the ratio of the speed of light in vertical space to the speed of light in the material.

[0076] ≈1.46, indicating that within the wavelength range of light, the speed of light in the silicon dioxide layer is about 68.5% of the speed of light in a vacuum;

[0077] ≈2.18, indicating that the speed of light propagating in the tantalum pentoxide layer is slower, and the speed of light is about 45.9% of its speed in a vacuum.

[0078] The real part of the dielectric parameter ε1 of the gold nanorod material in the optical frequency band is calculated based on the Drude model, so as to calculate the optimal incident laser wavelength to excite the LSPR effect of the gold nanorod array. , where Γ is the plasma frequency correction value caused by the finite size of the gold nanorods, , R is the aspect ratio of the gold nanorod, R=L / D, L and D represent the length and diameter of the gold nanorod respectively; P is the depolarization factor, which characterizes the correction value of the gold nanorod geometry to the electric field distribution. .

[0079] The aspect ratio (R) plays an important role in the optical properties of nanomaterials, especially in the localized surface plasmon resonance (LSPR) phenomenon. Variations in the aspect ratio affect the resonance wavelength and electric field enhancement characteristics, making it a key parameter in the design and optimization of sensors and optical devices based on gold nanorods.

[0080] The aspect ratio (R) is calculated as R=L / D, which describes the geometry of nanorods and indicates the relationship between their lengthwise extension and their diameter. A larger aspect ratio means a more slender nanorod, which has a significant impact on its optical properties, especially the localized surface plasmon resonance (LSPR).

[0081] In the formula for calculating the depolarization factor P, the form (D / L)^1.7 is used. Here P represents the depolarization factor, which is a correction factor used to describe the effect of the nanorod geometry on the electric field distribution and resonance characteristics. The depolarization factor reflects the effect of the nanorod's slenderness on its electric field intensity distribution. Since the geometry of the nanorod affects the distribution of its local electric field, a smaller diameter (relative to the length) will lead to a stronger electric field concentration effect, so the ratio of diameter to length is introduced in the calculation;

[0082] In this case, the form (D / L)^1.7 is derived based on empirical and theoretical models, showing that the depolarization effect of the electric field increases significantly as the diameter increases relative to the length. This exponent (1.7) is derived from experimental data and theoretical analysis and reflects the nonlinear effects of geometry on optical properties.

[0083] Obtain real-time electric field distortion signals with high signal-to-noise ratio, including:

[0084] Assume that the real-time electric field distortion signal consists of the distortion signal and environmental noise:

[0085] , is the amplitude of the distorted signal, is the frequency of the distorted signal, is the initial phase of the distorted signal, is the environmental noise signal;

[0086] A sine wave with a base frequency of f1 = 1 kHz and a sub-frequency of f2 = 2.5 kHz is selected as the laser modulation signal. Two sinusoidal reference signals are generated by dual-frequency modulation of the laser of the modulated light source:

[0087] ;

[0088] The real-time electric field distortion signal Mixed with two sinusoidal reference signals respectively, two mixed signals are obtained:

[0089] ;

[0090] By expanding the two mixing signals through trigonometric functions, the two mixing signals can be expressed as:

[0091]

[0092] Perform low-pass filtering on the mixed signals V1 and V2 respectively to remove the high-frequency components and retain only the frequency and Signal:

[0093] ;

[0094] The low-pass filtered signals V1' and V2' are phase-weighted and summed to obtain the final real-time electric field distortion signal with high signal-to-noise ratio. .

[0095] The detection of electric field distortion signals is often interfered with by complex environmental factors, such as electromagnetic noise, broadband interference signals, and noise generated by the high-voltage power supply itself. These interference signals often have strong randomness and broadband characteristics, which directly affect the accurate extraction of electric field distortion signals. The dual-frequency phase-locked amplification technology introduces two sinusoidal reference signals (base frequency and sub-frequency), mixes them with the input signal, and combines them with a low-pass filter to effectively remove high-frequency noise and environmental interference, retaining only specific harmonic components related to the electric field distortion signal, thereby significantly improving the signal-to-noise ratio. The necessity of this method lies in that only under high signal-to-noise ratio conditions can weak electric field distortion signals be accurately captured, avoiding false alarms or missed alarms in the leakage prediction system due to noise interference;

[0096] By utilizing dual-frequency lock-in amplification technology to generate a real-time electric field distortion signal with a high signal-to-noise ratio, and through real-time mixing and filtering, the system can extract the amplitude and phase information of the electric field distortion signal within milliseconds, ensuring rapid response for leakage prediction. This real-time performance is particularly important in mass spectrometer high-voltage power supplies, as leakage risks can develop rapidly in a very short period of time. Only by capturing the electric field distortion signal in real time can millisecond-level proactive protection be achieved.

[0097] In summary, the dual-frequency phase-locked amplification technique, which generates a real-time electric field distortion signal with a high signal-to-noise ratio, not only theoretically demonstrates significant anti-interference and real-time advantages but has also been fully validated in experimental data and practical applications. This method provides an accurate and reliable electric field distortion signal input for the leakage prediction system, significantly improving the system's sensitivity and safety.

[0098] Based on the real-time electric field distortion signal with high signal-to-noise ratio, the leakage assessment coefficient at each future time point is predicted; when the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

[0099] Predict the leakage assessment coefficient at each future time point, including:

[0100] The total electric field distortion in the micro-area electric field at M consecutive historical time points is collected to form a total electric field distortion sequence:

[0101] , △τ is the historical data sampling interval, M is the historical data window length, t is the current time point, and α is the total electric field distortion in the micro-area electric field;

[0102] The time decay weight of each historical time point is calculated from this , e is a natural constant, ρ is a decay rate constant, which is determined by fitting the autocorrelation function of historical data, j is the reverse index of the historical time point, j=1 represents the most recent moment, and j=M represents the earliest moment;

[0103] The current time point is recorded as t, and each future time point is defined as , where i is the number of each future time point, i=1,2,...N, N is the total number of future time points, is the time interval difference between each future time point and the current time point;

[0104] Calculate the leakage assessment coefficient at each future time point Where η1 is the contribution weight of historical electric field distortion data, , They respectively represent the fluctuation degree of the electric field distortion signal and the system noise within the length of the historical data window;

[0105] The above calculation formula combines historical electric field distortion trends with the current rate of electric field change to predict the leakage risk assessment coefficient at a future point in time. The formula weightedly integrates past electric field distortion signals (historical trend term) with current dynamic changes (dynamic response term), taking into account both long-term trends and the impact of short-term changes on future risks, thereby achieving an accurate prediction of leakage risk.

[0106] The historical trend of electric field distortion signals often reflects the cumulative effect of leakage risk. If electric field distortion continues to increase over a period of time, it indicates that the leakage risk may be gradually increasing. The introduction of time decay weights can reduce the interference of older data on current predictions and highlight the importance of recent data.

[0107] The change in leakage risk is often closely related to the rate of electric field distortion. If the current rate of change of the electric field is high, the leakage risk may increase dramatically in the short term. The exponential decay factor ensures that the impact of the dynamic response term gradually decreases with the increase in prediction time, which is consistent with the laws of physics (i.e., the short-term nature of dynamic effects).

[0108] The dynamic response term can quickly capture dramatic changes in electric field distortion over a short period of time, compensating for the historical trend term's inadequate response to sudden events. An exponential decay factor prevents the dynamic response term from significantly impacting long-term forecasts, maintaining forecast stability. The historical trend term captures long-term accumulated trends in electric field distortion, providing a stable baseline forecast. The dynamic response term captures rapid changes in current electric field distortion, enhancing sensitivity to sudden risks.

[0109] The exponential decay factor in the dynamic response term in the above calculation formula is and the forecast time span Related:

[0110] Assume that the electric field distortion at the current moment is at a rate Continuous development, but due to the thermal inertia of dielectric materials, the growth rate of leakage risk will gradually slow down over time:

[0111] when =1s, exp(-1 / 8.5)≈0.89; γ is represented by 8.5s;

[0112] when =5s, exp(-5 / 8.5)≈0.54;

[0113] Import it into a dynamic response item In the case of the same electric field change rate, the dynamic response contribution is reduced by about 39% due to exponential decay;

[0114] η2 is the sensitivity coefficient of the electric field change rate, γ is the time inertia of the leakage development process, exp(·) represents the exponential function with the natural number e as the base, is the total electric field distortion in the micro-area electric field at the jth historical time point, is the distortion change rate at each future time point in the micro-area electric field.

[0115] The calculation formula for the distortion change rate in the micro-area electric field is as follows:

[0116] ;

[0117] In the above formula is the total electric field distortion in the micro-area electric field at the i-th future time point.

[0118] It should be added that when the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, it means: when the set threshold coefficient is subtracted from the leakage assessment coefficient at a certain future time point, the leakage assessment difference coefficient at a certain future time point is obtained. If the leakage assessment difference coefficient at a certain future time point is less than the maximum allowable threshold, it is determined that there is a leakage risk at the future time point, and the system triggers the protection mechanism in advance within milliseconds to cut off the high-voltage power output.

[0119] Example 2

[0120] See also Figure 2 As shown, a leakage monitoring and protection system for a high-voltage power supply of a mass spectrometer includes: an electric field detection module, a signal acquisition module, and a leakage protection module. The above modules are connected by wired and / or wireless connections to achieve data transmission between the modules;

[0121] Electric field detection module: A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode. A group of gold nanorod arrays is arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area of ​​the surface of the mass spectrometer's high-voltage power supply corresponding electrode.

[0122] Signal acquisition module: When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio.

[0123] Leakage protection module: Based on real-time electric field distortion signals with a high signal-to-noise ratio, it predicts the leakage assessment coefficient at each future time point. When the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

[0124] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0125] It should be understood that determining B based on A does not mean determining B based solely on A. B can also be determined based on A and / or other information.

[0126] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

[0127] Finally: The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer, characterized in that: include: A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode, and a group of gold nanorod arrays are arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area corresponding to the surface of the mass spectrometer's high-voltage power supply electrode. When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio. Based on the real-time electric field distortion signal with high signal-to-noise ratio, the leakage assessment coefficient at each future time point is predicted; when the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

2. A method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer according to claim 1, characterized in that: When a change in the electric field in the micro area is detected, the implementation logic is: Collect the LSPR resonance wavelength of the gold nanorod array, record the initial wavelength λ0 and the wavelength λ at the current time point, calculate the difference between the wavelength λ at the current time point and the initial wavelength λ0, and obtain the wavelength offset △λ at the current time point; The wavelength offset Δλ at the current time point is integrated with the wavelength offsets at previous time points, and the time derivatives of all time points are calculated to obtain the wavelength offset rate λ' at all time points; Obtaining experimentally calibrated sensitivity of gold nanorod arrays to changes in local electric fields , the dielectric constant of the coating layer ε and the dielectric constant of vacuum ε0, and the static electric field distortion in the micro-area electric field is calculated respectively and dynamic electric field distortion ; The static electric field distortion α1 and the dynamic electric field distortion α2 in the micro-area electric field are summed to obtain the total electric field distortion in the micro-area electric field; Compare the total electric field distortion in the micro-area electric field with the set distortion threshold: If the former is greater than the latter, it is determined that the electric field in the micro-area has changed; Otherwise, it is determined that the electric field in the micro-region has not changed.

3. The method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer according to claim 1, wherein: By modulating the light source to emit laser, the logic is as follows: Extracting Plasmon Frequencies of Gold Nanorod Materials from the Gold Nanorod Database , and then calculate the intrinsic plasma wavelength of the gold nanorod material , where c is the speed of light; Simultaneous calculation of the equivalent dielectric constant of the dielectric layer surrounding the gold nanorods ,in represent the refractive index and thickness of the silicon dioxide layer in the dielectric layer surrounding the gold nanorods; represent the refractive index and thickness of the tantalum pentoxide layer in the dielectric layer around the gold nanorods, is the total thickness of the dielectric layer; The real part of the dielectric parameter ε1 of the gold nanorod material in the optical frequency band is calculated based on the Drude model, so as to calculate the optimal incident laser wavelength to excite the LSPR effect of the gold nanorod array. , where Γ is the plasma frequency correction value caused by the finite size of the gold nanorods, , R is the aspect ratio of the gold nanorod, R=L / D, L and D represent the length and diameter of the gold nanorod respectively; P is the depolarization factor, which characterizes the correction value of the gold nanorod geometry to the electric field distribution. .

4. The method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer according to claim 1, wherein: Obtain real-time electric field distortion signals with high signal-to-noise ratio, including: Assume that the real-time electric field distortion signal consists of the distortion signal and environmental noise: , is the amplitude of the distorted signal, is the frequency of the distorted signal, is the initial phase of the distorted signal, is the environmental noise signal; A sine wave with a base frequency of f1 = 1 kHz and a sub-frequency of f2 = 2.5 kHz is selected as the laser modulation signal. Two sinusoidal reference signals are generated by dual-frequency modulation of the laser of the modulated light source: ； The real-time electric field distortion signal Mixed with two sinusoidal reference signals respectively, two mixed signals are obtained: ； Perform low-pass filtering on the mixed signals V1 and V2 respectively to remove the high-frequency components and retain only the frequency and Signal: ； The low-pass filtered signals V1' and V2' are phase-weighted and summed to obtain the final real-time electric field distortion signal with high signal-to-noise ratio. .

5. The method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer according to claim 1, wherein: Predict the leakage assessment coefficient at each future time point, including: The total electric field distortion in the micro-area electric field at M consecutive historical time points is collected to form a total electric field distortion sequence: , △τ is the historical data sampling interval, M is the historical data window length, t is the current time point, and α is the total electric field distortion in the micro-area electric field; The time decay weight of each historical time point is calculated from this , e is a natural constant, ρ is a decay rate constant, which is determined by fitting the autocorrelation function of historical data, j is the reverse index of the historical time point, j=1 represents the most recent moment, and j=M represents the earliest moment; The current time point is recorded as t, and each future time point is defined as , where i is the number of each future time point, i=1,2,...N, N is the total number of future time points, is the time interval difference between each future time point and the current time point; Calculate the leakage assessment coefficient at each future time point Where η1 is the contribution weight of historical electric field distortion data, , They respectively represent the fluctuation degree of the electric field distortion signal and the system noise within the length of the historical data window; η2 is the sensitivity coefficient of the electric field change rate, γ is the time inertia of the leakage development process, exp(·) represents the exponential function with the natural number e as the base, is the total electric field distortion in the micro-area electric field at the jth historical time point, is the distortion change rate at each future time point in the micro-area electric field.

6. A method for monitoring and protecting leakage of a high-voltage power supply for a mass spectrometer according to claim 5, characterized in that: The calculation formula for the distortion change rate in the micro-area electric field is as follows: ； In the above formula is the total electric field distortion in the micro-area electric field at the i-th future time point.

7. A leakage monitoring and protection system for a high-voltage power supply of a mass spectrometer, characterized in that: The method is implemented by a leakage monitoring and protection method for a high-voltage power supply of a mass spectrometer according to any one of claims 1 to 6, comprising: an electric field detection module, a signal acquisition module, and a leakage protection module, wherein the modules are connected by wired and / or wireless connections to achieve data transmission between the modules; Electric field detection module: A gold nanorod array thin film is embedded in the vacuum coating layer of the mass spectrometer's high-voltage power supply electrode. A group of gold nanorod arrays is arranged near the mass spectrometer's high-voltage power supply output electrode. The plasmon resonance effect of the localized surface of the gold nanorod array is used to detect the electric field in the micro-area of ​​the surface of the mass spectrometer's high-voltage power supply corresponding electrode. Signal acquisition module: When a change in the electric field in a micro-area is detected, the laser is emitted by modulating the light source to capture the real-time electric field distortion signal. The harmonic component of the real-time electric field distortion signal is extracted using a dual-frequency lock-in amplifier, thereby obtaining a real-time electric field distortion signal with a high signal-to-noise ratio. Leakage protection module: Based on real-time electric field distortion signals with a high signal-to-noise ratio, it predicts the leakage assessment coefficient at each future time point. When the leakage assessment coefficient at a certain future time point is about to reach the set threshold coefficient, the system triggers the protection mechanism in advance within milliseconds and cuts off the high-voltage power output.

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