Method and system for determining sampling inspection time interval, electronic equipment and storage medium
By establishing a functional relationship between the sampling inspection cost and the sampling inspection time interval, the problem of difficult to control the production cost of sampling inspection time interval selection in cigarette roll production is solved, and the time interval determination with the lowest sampling inspection cost is achieved, reducing production cost.
Patent Information
- Application Number
- CN202510177567.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-18
- Publication Date
- 2025-06-10
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
During the cigarette roll production process, it is difficult to effectively control the production cost by choosing the sampling inspection time interval, and too short or too long time intervals will increase the production cost.
By establishing a functional relationship between the identification cost and the sampling time interval, and a functional relationship between the loss cost and the sampling time interval, a functional relationship between the sampling cost and the sampling time interval are obtained, so as to determine the sampling time interval with the lowest sampling cost.
It is realized that the appropriate sampling time interval is determined without increasing production costs, thereby reducing production costs.
Smart Images
Figure CN120123615A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of production cost control, and particularly to a method, a system, an electronic device and a storage medium for determining a sampling inspection time interval. Background Art
[0002] As is well known, in the production process of cigarettes, it is necessary to conduct sampling inspections on the cigarettes on the production line to obtain the qualification rate data of the cigarettes, so as to guide quality control. It is easy to understand that the sampling inspection process will increase the production cost. The reasons are as follows: For example, sampling inspection requires manual participation, which increases the labor cost; for example, the sampled cigarettes need to be subjected to destructive inspection, resulting in waste products; for example, if unqualified cigarettes are detected during sampling inspection, a certain number of cigarettes need to be traced back for destructive inspection, resulting in waste products. The longer the inspection time interval, the more cigarettes traced back for destructive inspection. Since both the increase and decrease of the sampling inspection time interval will increase certain costs. For example, if the inspection time interval is reduced, it will increase the labor cost and the amount of waste products generated by the current samples, resulting in an increase in production cost. For example, if the inspection time interval is increased, it will increase the number of traced-back cigarettes, resulting in an increase in production cost. Therefore, it is difficult for technicians to obtain a sampling inspection time interval that can control the production cost caused by the sampling inspection process at a relatively low level.
[0003] Currently, the sampling inspection time interval (or frequency) is mainly obtained based on experience. Summary of the Invention
[0004] In view of the above problems, the present invention provides a method, a system, an electronic device and a storage medium for determining a sampling inspection time interval.
[0005] The technical solution adopted by the present invention to solve its technical problems is as follows: A method for determining a sampling inspection time interval, comprising: S10: Establish a functional relationship between the appraisal cost and the sampling inspection time interval: ; S20: Establish a functional relationship between the loss cost and the sampling inspection time interval: ; S30: Based on the functional relationships between the appraisal cost, the loss cost and the sampling inspection time interval, obtain a functional relationship between the sampling inspection cost and the sampling inspection time interval: ; S40: Obtain the sampling inspection time interval value when the sampling inspection cost is the lowest; Wherein: represents the sampling inspection cost; represents the appraisal cost; represents the loss cost; is the sampling inspection time interval.
[0006] Preferably, the establishment of the functional relationship between the appraisal cost and the sampling inspection time interval includes: S11: Establish the functional relationship between the labor cost and the number of sampling inspections: ; S12: Establish the functional relationship between the inspection cost and the number of sampling inspections: ; S13: Establish the functional relationship between the scrap cost and the number of sampling inspections: ; S14: Based on the functional relationships between the labor cost, the inspection cost, and the scrap cost and the number of sampling inspections, obtain the functional relationship between the appraisal cost and the number of sampling inspections: ; S15: Based on the formula:
[0007] Obtain the functional relationship between the appraisal cost and the sampling inspection time interval: ; Where: represents the labor cost; represents the inspection cost; represents the scrap cost; represents the initial labor cost; represents the additional labor cost for adding one person; represents the number of sampling inspections; represents the value of the number of sampling inspections allowed under the initial labor condition. When the number of sampling inspections exceeds this value, new personnel will be added; represents how many additional sampling inspections can be added by adding one person; represents the number of cigarette sticks inspected per single inspection; represents the cost of a single cigarette stick; represents the recovery rate; is the production time; is the production speed.
[0008] Preferably, the establishment of the functional relationship between the loss cost and the sampling inspection time interval includes: S21: Establish the functional relationship between the scrap cost and the sampling inspection time interval: ; S22: Obtain the calculation formula for the labor-hour loss cost: ; S23: Obtain the rework cost and the fault adjustment cost ; S24: Based on the functional relationship between the scrap cost and the sampling inspection time interval, the calculation formula for the labor-hour loss cost, the rework cost, and the fault adjustment cost, obtain the functional relationship between the loss cost and the sampling inspection time interval: ; Where: represents the scrap cost; represents the labor-hour loss cost; is a constant used to represent the rework cost and the fault adjustment cost; represents the number of cigarette sticks inspected each time; represents the cost of a single cigarette stick; represents the recovery rate; is the production time; is the production speed; represents the number of rework rounds; represents the downtime.
[0009] Meanwhile, the present invention also provides a system for determining the sampling inspection time interval, including: A first processing module for establishing a functional relationship between the appraisal cost and the sampling inspection time interval; A second processing module for establishing a functional relationship between the loss cost and the sampling inspection time interval; A third processing module for obtaining a functional relationship between the sampling inspection cost and the sampling inspection time interval based on the functional relationships between the appraisal cost, the loss cost, and the sampling inspection time interval; A determination module for obtaining the sampling inspection time interval value when the sampling inspection cost is the lowest based on the functional relationship between the sampling inspection cost and the sampling inspection time interval.
[0010] Meanwhile, the present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the method for determining the sampling inspection time interval as described above are implemented.
[0011] Meanwhile, the present invention also provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the steps of the method for determining the sampling inspection time interval as described above are implemented.
[0012] Compared with the prior art, the beneficial effects of the method and system for determining the sampling inspection time interval disclosed by the present invention are: The present invention summarizes and classifies the components of the sampling inspection cost, and establishes a functional relationship between the sampling inspection cost and the sampling time interval. Based on this functional relationship, a sampling time interval can be obtained to control the production cost caused by the sampling inspection process at a relatively low level. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.
[0014] Figure 1 It is a schematic flow chart of the method of the present invention; Figure 2 It is a schematic flow chart of step S10 of the present invention; Figure 3 It is a schematic flow chart of step S20 of the present invention; Figure 4 It is a schematic diagram of a method example of the present invention; Figure 5 It is a schematic diagram of the system module structure of the present invention; Figure 6 It is a schematic diagram of the structure of an electronic device of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the embodiments and the drawings of the present invention. It should be understood that the foregoing general description and the following detailed description are only exemplary and explanatory, and are not used to limit the present invention. The summary of various implementations or examples of the technologies described in the present invention is not a complete disclosure of all the scope or all the features of the disclosed technologies. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.
[0016] Unless otherwise defined, the technical terms or scientific terms used in the present invention shall have the ordinary meanings understood by those of ordinary skill in the art to which the present invention pertains. The "first", "second" and similar terms used in the present invention do not denote any order, quantity or importance, but are only used to distinguish different components. The terms such as "comprising" or "including" mean that the elements or objects appearing before the term cover the elements or objects listed after the term and their equivalents, without excluding other elements or objects. The terms such as "connected" or "coupled" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The terms such as "upper", "lower", "left" and "right" are only used to represent relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationship may also change accordingly.
[0017] To keep the following description of the embodiments of the present invention clear and concise, the detailed descriptions of known functions and known modules and components are omitted in the present invention.
[0018] This embodiment first provides a method for determining the sampling inspection time interval, and this method aims to: when performing sampling inspection on cigarettes, obtain a sampling inspection time interval (or the number of sampling inspections) that controls the production cost caused by the sampling inspection process at the lowest level. The production cost caused by the sampling inspection process may be referred to as the sampling inspection cost.
[0019] This embodiment also divides the sampling inspection cost into two parts, that is, the sampling inspection cost includes the appraisal cost and the loss cost. The appraisal cost is divided into three parts, that is, the appraisal cost includes the labor cost, the inspection cost and the scrap part cost. The loss cost is divided into three parts, that is, the loss cost includes: the scrap cost, the man-hour loss cost, the repair and fault adjustment cost.
[0020] In the appraisal cost: the labor cost refers to the cost of the sampling inspection operator generated during the sampling inspection process of cigarettes. Generally, the larger the number of sampling inspections, the smaller the time interval, the more sampling inspection operators are required, and the greater the labor cost; the inspection cost refers to the use and consumption cost of relevant detection equipment, etc. during the sampling inspection process of cigarettes. The larger the number of sampling inspections, the smaller the time interval, the greater the inspection cost; the scrap part cost refers to the cost generated due to the scrapping of cigarettes caused by the sampling inspection during the sampling inspection process of cigarettes. It should be noted that not all the sampled cigarettes are scrapped, and a part of them can be recycled.
[0021] Among the loss costs, the scrap cost refers to: when it is found that the cigarettes are unqualified after sampling inspection, a certain number of rounds of cigarettes are retrieved forward to ensure the quality of the cigarettes. If it is found that there are still unqualified cigarettes among the retrieved cigarettes, continue to trace forward until there are no problems. During this process, the cost generated by the scrapping of cigarettes; therefore, the larger the number of sampling inspections and the smaller the time interval, the fewer the scrapped cigarettes and the lower the scrap cost, and vice versa. The man-hour loss cost is the cost caused by the production stop due to the downtime. Therefore, the longer the downtime, the higher the cigarette production rate, and the higher the cigarette price, the higher the man-hour loss cost. The rework and fault adjustment cost refers to the cost required to process the sampled cigarettes and the cost required to adjust the relevant equipment faults. Usually, this cost does not change with the sampling time interval and is an empirical constant.
[0022] Referring to Figure 1 , the method for determining the sampling time interval disclosed in this embodiment includes: S10: Establish a functional relationship between the appraisal cost and the sampling time interval: .
[0023] Based on the above, it can be known that: There is an inverse function relationship between the labor cost and the number of sampling inspections, an inverse function relationship between the scrap cost and the number of sampling inspections, and an inverse function relationship between the scrap cost and the number of sampling inspections. Therefore, there is an inverse function relationship between the appraisal cost and the sampling time interval.
[0024] When establishing the functional relationship between the scrap cost and the number of sampling inspections, it is necessary to introduce a certain recovery rate of the sampled cigarettes into the functional relationship to match the actual sampling process.
[0025] Referring to Figure 2 , step S10 specifically includes: S11: Establish a functional relationship between the labor cost and the number of sampling inspections: ; S12: Establish a functional relationship between the inspection cost and the number of sampling inspections: ; S13: Establish a functional relationship between the scrap cost and the number of sampling inspections: ; S14: Based on the functional relationships between the labor cost, the inspection cost, and the scrap cost and the number of sampling inspections, obtain the functional relationship between the appraisal cost and the number of sampling inspections: ; S15: Based on the formula: ; Obtain the functional relationship between the identification cost and the sampling inspection time interval: .
[0026] Where: represents the sampling inspection cost; represents the identification cost; represents the loss cost; is the sampling inspection time interval; represents the labor cost; represents the inspection cost; represents the scrap cost; represents the initial labor cost; represents the increased labor cost for adding one person; represents the number of sampling inspections; represents the allowable number of sampling inspections under the initial labor condition. When the number of sampling inspections exceeds this number, new personnel will be added; represents how many additional sampling inspection times can be added by adding one person; represents the number of cigarette sticks for a single inspection; represents the cost of a single cigarette stick; represents the recovery rate; is the production time; is the production speed.
[0027] S20: Establish the functional relationship between the loss cost and the sampling inspection time interval: .
[0028] Based on the above, it can be known that: The relationship between the scrap cost and the sampling inspection time interval is a linear function and an increasing function. Therefore, the relationship between the scrap cost and the sampling inspection time interval is a linear function and an increasing function.
[0029] When establishing the functional relationship between the scrap cost and the sampling inspection time interval, the fact that the traced-back cigarettes have a certain recovery rate needs to be introduced into the functional relationship to match the actual sampling inspection process.
[0030] Refer to Figure 3 , step S20 specifically includes: S21: Establish the functional relationship between the scrap cost and the sampling inspection time interval: ; S22: Obtain the calculation formula for the labor hour loss cost: ; S23: Obtain the rework cost and the fault adjustment cost ; S24: Based on the function relation between the scrap cost and the sampling inspection time interval, the calculation formula for the labor hour loss cost, the rework cost, and the fault adjustment cost, obtain the function relation between the loss cost and the sampling inspection time interval: ; Where: represents the scrap cost; represents the labor hour loss cost; is a constant used to represent the rework cost and the fault adjustment cost; represents the number of cigarette sticks for a single inspection; represents the cost of a single cigarette stick; represents the recovery rate; is the production time; is the production speed; represents the number of rework rounds; represents the downtime.
[0031] S30: Based on the function relations between the appraisal cost, the loss cost and the sampling inspection time interval, obtain the function relation between the sampling inspection cost and the sampling inspection time interval: = + .
[0032] S40: Obtain the value of the sampling inspection time interval when the sampling inspection cost is the lowest.
[0033] Specifically, it can be seen from the function relation between the sampling inspection cost and the sampling inspection time interval established above that based on the minimum value of the sampling inspection cost of this relation, the sampling inspection time interval when the sampling inspection cost is the lowest can be obtained through this relation.
[0034] The function relation described in this embodiment can also be understood as a data model.
[0035] This embodiment will also compare the lowest sampling inspection cost calculated by the above method and the corresponding sampling inspection time interval with the results obtained from the sampling inspection process in the actual production.
[0036] The given values of the relevant parameters are as follows: Yuan Yuan times times sticks
[0037] h pieces per minute = 1 yuan Based on the above given parameters, the minimum sampling inspection cost obtained by using the above method is: yuan; the corresponding sampling inspection time interval is: s
[0038] The corresponding data between the actual sampling inspection cost generated in the actual sampling inspection process and the sampling inspection time interval can be seen from Figure 4 that the actual sampling inspection cost in the area where the sampling inspection time interval is 300s - 350s is the lowest, and the corresponding lowest actual sampling inspection cost is about 15,000 yuan. It is basically not much different from the lowest sampling inspection cost of 14,318 yuan and the time interval of 323s determined according to the present invention
[0039] Referring to Figure 5 , this embodiment also proposes a system for determining the sampling inspection time interval, including: The first processing module 21, which is used to establish a functional relationship between the appraisal cost and the sampling inspection time interval; The second processing module 22, which is used to establish a functional relationship between the loss cost and the sampling inspection time interval; The third processing module 23, which is used to obtain a functional relationship between the sampling inspection cost and the sampling inspection time interval based on the functional relationships between the appraisal cost, the loss cost and the sampling inspection time interval; The determination module 24, which is used to obtain the sampling inspection time interval value in the case of the lowest sampling inspection cost based on the functional relationship between the sampling inspection cost and the sampling inspection time interval
[0040] In a specific embodiment, the first processing module 21 establishes a functional relationship between the appraisal cost and the sampling inspection time interval: First, establish a functional relationship between the labor cost and the number of sampling inspections: ; Secondly, establish a functional relationship between the inspection cost and the number of sampling inspections: ; Subsequently, establish a functional relationship between the scrap cost and the number of sampling inspections: ; Furthermore, based on the functional relationships between the labor cost, the inspection cost and the scrap cost and the number of sampling inspections, obtain a functional relationship between the appraisal cost and the number of sampling inspections: ; Finally, based on the formula: ; Obtain the functional relationship between the identification cost and the sampling inspection time interval: .
[0041] In a specific embodiment, the second processing module 22 is to establish the functional relationship between the identification cost and the sampling inspection time interval: First, establish the functional relationship between the scrap cost and the sampling inspection time interval: ; Secondly, obtain the calculation formula for the labor hour loss cost: ; Furthermore, obtain the rework cost and the fault adjustment cost ; Finally, based on the functional relationship between the scrap cost and the sampling inspection time interval, the calculation formula for the labor hour loss cost, the rework cost, and the fault adjustment cost, obtain the functional relationship between the loss cost and the sampling inspection time interval: .
[0042] In a specific embodiment, the third processing module 23 obtains the functional relationship between the sampling inspection cost and the sampling inspection time interval based on the functional relationships between the identification cost, the loss cost, and the sampling inspection time interval: = + .
[0043] In a specific embodiment, the determination module 24 obtains the sampling inspection time interval in the case of the lowest sampling inspection cost through this relationship based on the minimum value of the sampling inspection cost in the functional relationship between the sampling inspection cost and the sampling inspection time interval established by the third processing module 23.
[0044] Figure 6 It is a schematic diagram of the electronic device 30 provided by an embodiment of the present invention. As Figure 6 shown, the electronic device 30 of this embodiment includes: a processor 31, a memory 32, and a computer program 33 stored in the memory 32 and operable on the processor 31, such as a method program for determining the sampling inspection time interval. When the processor 31 executes the computer program 33, the steps in the above-mentioned method embodiments for determining the sampling inspection time interval are implemented, such as Figure 1 the steps S10 to S40 shown. Or, when the processor 31 executes the computer program 33, the functions of the respective modules in the above-mentioned system embodiments for determining the sampling inspection time interval are implemented, such as Figure 5Functions of the modules 21 to 24 shown
[0045] Exemplarily, the computer program 33 can be divided into one or more modules / units. One or more modules / units are stored in the memory 32 and executed by the processor 31 to implement the present invention. One or more modules / units can be a series of computer program instruction segments capable of performing specific functions, and these instruction segments are used to describe the execution process of the computer program 33 in the electronic device 30.
[0046] The electronic device 30 can be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The electronic device 30 may include, but is not limited to, a processor 31 and a memory 32. Those skilled in the art can understand that Figure 6 merely examples of the electronic device 30, which do not constitute a limitation to the electronic device 30. It may include more or fewer components than shown in the figure, or combine certain components, or different components. For example, the electronic device 30 may further include input / output devices, network access devices, a bus, etc.
[0047] The so-called processor 31 may be a central processing unit (CPU), or may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc.
[0048] The memory 32 may be an internal storage unit of the electronic device 30, such as the hard disk or memory of the electronic device 30. The memory 32 may also be an external storage device of the electronic device 30, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 30. Further, the memory 32 may also include both the internal storage unit and the external storage device of the electronic device 30. The memory 32 is used to store computer programs and other programs and data required by the electronic device 30. The memory 32 may also be used to temporarily store data that has been output or will be output.
[0049] Those skilled in the art can clearly understand that, for the convenience and conciseness of description, only the above division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules according to needs, that is, the internal structure of the system device is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment can be integrated into a processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit. In addition, the specific names of each functional unit and module are only for the convenience of mutual distinction and do not limit the protection scope of this application. The specific working process of the units and modules in the above system can refer to the corresponding process in the foregoing method embodiment and will not be elaborated here.
[0050] In the above embodiments, the descriptions of each embodiment have their own emphases. For the parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0051] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or by a combination of computer software and electronic hardware. Whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.
[0052] In the embodiments provided by the present invention, it should be understood that the disclosed system device / electronic device and method can be implemented in other ways. For example, the system device / electronic device embodiments described above are only illustrative. For example, the division of modules or units is only a logical function division. In actual implementation, there can be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces, and the indirect coupling or communication connection of devices or units can be in electrical, mechanical or other forms.
[0053] In addition, each functional unit in the various embodiments of the present invention can be integrated into a processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit.
[0054] When the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-described embodiment methods of the present invention, it can also be completed by a computer program instructing relevant hardware. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-described method embodiments for determining the sampling inspection time interval can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disc, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium, etc.
[0055] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included within the protection scope of the present invention.
Claims
1. A method for determining a sampling inspection time interval, characterized in that: include S10: Establish the functional relationship between the identification cost and the sampling time interval: ； S20: Establish the functional relationship between loss cost and sampling time interval: ； S30: Based on the functional relationship between the appraisal cost, the loss cost and the sampling inspection time interval, the functional relationship between the sampling inspection cost and the sampling inspection time interval is obtained: ； S40: Obtaining the sampling inspection time interval value when the sampling inspection cost is the lowest; in: represents the sampling inspection cost; represents the cost of identification; represents the loss cost; The sampling time interval.
2. The method for determining the sampling inspection time interval according to claim 1, characterized in that: The functional relationship between the identification cost and the sampling inspection time interval includes: S11: Establish the functional relationship between labor cost and number of random inspections: ； S12: Establish the functional relationship between the inspection cost and the number of random inspections: ； S13: Establish the functional relationship between the scrap cost and the number of random inspections: ； S14: Based on the functional relationship between labor cost, inspection cost, scrap cost and the number of random inspections, the functional relationship between the appraisal cost and the number of random inspections is obtained: ； S15: Based on the formula: The functional relationship between the identification cost and the sampling time interval is obtained: ； in: represents labor cost; represents the inspection cost; represents the cost of scrap parts; represents the initial labor cost; It indicates the increased labor cost of adding one more person; Indicates the number of random inspections; Indicates the number of random inspections allowed in the initial manual situation. When the number of random inspections exceeds this number, additional personnel will be added; It indicates how many additional sampling times can be added if one person is added; Indicates the number of cigarettes tested in a single test; Indicates the cost of a single cigarette; represents the recovery rate; For production time; For production speed.
3. The method for determining the sampling inspection time interval according to claim 1, characterized in that: The functional relationship between the loss cost and the sampling inspection time interval includes: S21: Establish the functional relationship between scrapping cost and sampling time interval: ； S22: Obtain the calculation formula for the cost of lost working time: ； S23: Obtaining the repair cost and failure adjustment cost ; S24: Based on the established functional relationship between scrapping cost and sampling inspection time interval, the calculation formula of man-hour loss cost, rework cost and failure adjustment cost, the functional relationship between loss cost and sampling inspection time interval is obtained: ； in: represents the scrapping cost; represents the cost of lost working time; is a constant used to represent the repair cost and failure adjustment cost; Indicates the number of cigarettes tested in a single test; Indicates the cost of a single cigarette; represents the recovery rate; For production time; For production speed; Represents the number of repair rounds; Indicates downtime.
4. A system for determining the time interval for random inspections, characterized in that: include The first processing module is used to establish a functional relationship between the identification cost and the sampling inspection time interval; The second processing module is used to establish a functional relationship between the loss cost and the sampling inspection time interval; A third processing module is used to obtain a functional relationship between the sampling inspection cost and the sampling inspection time interval based on the functional relationship between the identification cost, the loss cost and the sampling inspection time interval; The determination module is used to obtain the sampling inspection time interval value under the condition of the lowest sampling inspection cost based on the functional relationship between the sampling inspection cost and the sampling inspection time interval.
5. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the steps of the method for determining the sampling time interval as described in any one of claims 1 to 3 are implemented.
6. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method for determining the sampling time interval as described in any one of claims 1 to 3 are implemented.