Sample analyzer and semiconductor refrigeration part online monitoring method and system

Abstract

The invention discloses a sample analyzer and a semiconductor refrigeration part on-line monitoring method and system. The sample analyzer comprises a bearing part, a dispensing mechanism; a reaction mechanism; a detection mechanism; a refrigeration device; the controller is used for detecting the internal resistance value of the semiconductor refrigeration part through the detection assembly in the refrigeration device and determining the variation state of the semiconductor refrigeration part according to the obtained internal resistance value, so that the semiconductor refrigeration part can be monitored on line, and normal work of the sample analyzer is not influenced; and the timeliness of monitoring the variation state of the semiconductor refrigeration part can be effectively improved under the condition that the quality control material or the calibration material is frozen and stored at the temperature below zero.

Description

Technical Field

[0001] The present application relates to the technical field of medical devices, and particularly to a sample analyzer, an on-line monitoring method and system for a semiconductor refrigeration unit. Background Art

[0002] In biochemical experiments and medical clinical diagnoses, sample analyzers are usually used to add various reagents to samples (such as body fluids like blood and urine) to cause chemical reactions, and then detect and analyze the component ratios in the samples. According to the requirements of test conditions, for the reagents, quality control products or calibration products placed in the sample analyzer, a refrigeration device is needed to store the reagents, quality control products or calibration products at low temperature.

[0003] In some existing sample analyzers, a semiconductor refrigeration chip is used as a refrigeration device to store reagents or quality control products at low temperature. Since the semiconductor refrigeration chip has advantages such as no noise, small volume and light weight, for example, the semiconductor refrigeration chip can be installed at the bottom of the reagent tray for placing reagents or quality control products, and then a driving circuit is used to supply power to make the semiconductor refrigeration chip work, and the reagents or quality control products are stored frozen in a low-temperature environment of 2-8°C. However, the stability of many dry powder quality control products and calibration products is poor in the 2-8°C environment, and it is necessary to adjust the working temperature of the semiconductor refrigeration chip below zero to provide a stable storage environment for the quality control products or calibration products. However, the existing sample analyzers in the prior art cannot monitor whether the semiconductor refrigeration chip with a working temperature below zero is faulty. If the fault of the semiconductor refrigeration chip cannot be detected in time, it will cause damage to the quality control products or calibration products in the sample analyzer. In addition, when a fault of the refrigeration device is found, it takes a lot of time to disassemble the machine to check the cause of the fault (which may be a fault of the semiconductor refrigeration chip, the driving circuit or the installation structure of the semiconductor refrigeration), and it requires a large amount of manpower, material resources and financial resources. Summary of the Invention

[0004] The following is an overview of the subject matter described in detail in this application. This overview is not intended to limit the scope of protection of the claims.

[0005] Embodiments of the present application provide a sample analyzer, an on-line monitoring method and system for a semiconductor refrigeration unit, which can monitor the semiconductor refrigeration unit on-line to timely determine the variation state of the semiconductor refrigeration unit.

[0006] In a first aspect, embodiments of the present application provide a sample analyzer, including:

[0007] A carrying component, including a bin body for carrying quality control products and / or calibration products;

[0008] A dispensing mechanism for sucking reagents or samples and discharging them into reaction cups;

[0009] A reaction mechanism having at least one placement position for placing the reaction cup and incubating the reaction solution in the reaction cup, the reaction solution being prepared from at least the sample and the reagent;

[0010] A detection mechanism for detecting the incubated reaction solution to obtain a detection result, the detection mechanism is also used to detect a mixture containing the quality control product and / or the calibration product and the reagent in the reaction container to obtain a quality control and / or calibration result;

[0011] A refrigeration device for refrigerating the chamber to make the temperature of the chamber reach the target working temperature, the refrigeration device includes a thermoelectric refrigeration part for refrigeration and a detection component for detecting the internal resistance value of the thermoelectric refrigeration part, wherein the target working temperature is lower than zero degrees Celsius;

[0012] A controller for obtaining the internal resistance value through the detection component and determining the variation state of the thermoelectric refrigeration part according to the internal resistance value.

[0013] In one embodiment, the controller is further configured to compare the internal resistance value with a first preset condition, and if the internal resistance value does not meet the first preset condition, confirm that the thermoelectric refrigeration part has a variation.

[0014] In one embodiment, the first preset condition includes at least one of the following:

[0015] The calibrated internal resistance value or the calibrated internal resistance value range of the thermoelectric refrigeration part;

[0016] The normal internal resistance value or the normal internal resistance value range of the thermoelectric refrigeration part at room temperature;

[0017] The normal internal resistance value or the normal internal resistance value range of the thermoelectric refrigeration part at the target working temperature;

[0018] The normal internal resistance value or the normal internal resistance value range obtained according to the historical data of the internal resistance value of the thermoelectric refrigeration part.

[0019] In one embodiment, the controller is further configured to give a fault prompt and / or control the sample analyzer to stop when it is confirmed that the thermoelectric refrigeration part has a variation.

[0020] In one embodiment, when it is confirmed that the thermoelectric refrigeration part has a variation and the internal resistance value meets the second preset condition, the controller is further configured to keep the sample analyzer working normally and give a fault prompt; or, when it is confirmed that the thermoelectric refrigeration part has a variation and the internal resistance value does not meet the second preset condition, the controller is further configured to stop the sample analyzer and give a fault prompt.

[0021] In one embodiment, the controller is further configured to record the currently obtained internal resistance value to generate historical internal resistance data, so as to predict the variation trend of the internal resistance value of the semiconductor refrigeration unit; or the controller is further configured to record the internal resistance values that do not meet the first preset condition to generate historical internal resistance data, so as to predict the variation trend of the internal resistance value of the semiconductor refrigeration unit.

[0022] In one embodiment, the controller is further configured to keep the sample analyzer working normally and give a fault prompt when the variation trend meets the third preset condition.

[0023] In one embodiment, the refrigeration device further includes a drive module for outputting working electrical parameters to the refrigeration unit; the controller is further configured to control the drive module according to the internal resistance value to adjust the working electrical parameters output by the drive module.

[0024] In one embodiment, the controller obtains the internal resistance value when the sample analyzer is powered on or within a first preset time after power-on; or, the controller obtains the internal resistance value after a second preset time has elapsed since the last shutdown of the sample analyzer; or, the controller obtains the internal resistance value when the semiconductor refrigeration unit is at room temperature; or, the controller obtains the internal resistance value when the semiconductor refrigeration unit is at the target working temperature.

[0025] In one embodiment, the controller is further configured to obtain the initial internal resistance value of the semiconductor refrigeration unit through the detection component when the semiconductor refrigeration unit is used for the first time; if the initial internal resistance value meets the standard range of the semiconductor refrigeration unit, the controller obtains the working internal resistance value of the semiconductor refrigeration unit after the semiconductor refrigeration unit reaches the target working temperature, and obtains the first preset condition according to the working internal resistance value.

[0026] In one embodiment, the refrigeration device further includes a drive module for outputting working electrical parameters to the semiconductor refrigeration unit, and the controller obtains the internal resistance value through the detection component before the drive module works or after controlling the drive module to stop working.

[0027] In one embodiment, the detection component includes an AC signal source and a signal detection module. The controller controls the AC signal source to send an AC detection signal to the semiconductor refrigeration unit, obtains the feedback signal fed back by the semiconductor refrigeration unit in response to the AC detection signal through the signal detection module, and obtains the internal resistance value according to the feedback signal.

[0028] In one embodiment, the refrigeration device further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration part. The driving module includes a driving circuit and a feedback detection circuit. The controller controls the driving circuit to output the working electrical parameters to the semiconductor refrigeration part, so that the semiconductor refrigeration part enters the refrigeration working state. The controller also controls the driving circuit to output a DC detection signal to the semiconductor refrigeration part, and obtains the detection parameters of the semiconductor refrigeration part through the feedback detection circuit, and obtains the internal resistance value according to the detection parameters.

[0029] In one embodiment, the controller controls the driving circuit to output DC detection signals with different electrical parameters to the semiconductor refrigeration part, obtains a plurality of detection parameters corresponding to different DC detection signals through the feedback detection circuit, calculates the first internal resistance values corresponding to the respective detection parameters, and obtains the internal resistance value of the semiconductor refrigeration part according to the respective first internal resistance values.

[0030] In one embodiment, it further includes a temperature detection component for detecting the temperature of the semiconductor refrigeration part and / or in the chamber body, and the controller is further configured to control the driving module to output the working electrical parameters to the semiconductor refrigeration part according to the temperature parameters detected by the temperature detection component.

[0031] In one embodiment, the refrigeration device further includes a heat conduction part and a heat dissipation part. The semiconductor refrigeration part cools the chamber body through the heat conduction part, and discharges the heat in the chamber body through the heat dissipation part.

[0032] In one embodiment, the driving module includes a control circuit, a first switch module, a second switch module and an energy storage module. The control circuit is connected to the energy storage module through the first switch module and the second switch module. The control circuit is configured to control the first switch module to conduct and the second switch module to turn off, so that the energy storage module is energized and stored through the first switch module, and is further configured to control the first switch module to turn off and the second switch module to conduct, so that the energy storage module discharges through the second switch module. The energy storage module outputs the working electrical parameters to the semiconductor refrigeration part during the charging and discharging processes. The control circuit adjusts the working electrical parameters output to the semiconductor refrigeration part by controlling the conduction time of the first switch module and the second switch module.

[0033] In one embodiment, the operating electrical parameters include an operating current and an operating voltage. The driving module further includes a current detection module for detecting the operating current and a voltage detection module for detecting the operating voltage. The control circuit adjusts the operating electrical parameters output to the semiconductor refrigeration unit by adjusting the conduction time of the first switch module and the second switch module according to the current detection parameters fed back by the current detection module and / or the voltage detection parameters fed back by the voltage detection module, so that the output operating current or operating voltage is constant.

[0034] In one embodiment, it further includes a forward and reverse switching circuit composed of a plurality of switching tubes. The operating current output by the driving module is output to the semiconductor refrigeration unit through the forward and reverse switching circuit. The controller controls the direction of the operating current flowing through the semiconductor refrigeration unit through the plurality of switching tubes based on the temperature parameter. When the operating current flows through the semiconductor refrigeration unit in a first direction, the semiconductor refrigeration unit is in a refrigeration state. When the operating current flows through the semiconductor refrigeration unit in a second direction, the semiconductor refrigeration unit is in a heating and defrosting state.

[0035] In one embodiment, the controller obtains a defrosting temperature difference value according to the temperature parameter and a preset defrosting temperature. When the defrosting temperature difference value is less than a first preset temperature value, the controller controls the operating current to flow through the semiconductor refrigeration unit in a second direction through the plurality of switching tubes in the forward and reverse switching circuit, so that the semiconductor refrigeration unit is in a heating and defrosting state.

[0036] In a second aspect, an embodiment of the present application provides a sample analyzer, including:

[0037] A carrying component, including a bin for carrying quality control products and / or calibration products;

[0038] A dispensing mechanism for sucking reagents or samples and discharging them into reaction cups;

[0039] A reaction mechanism having at least one placement position for placing the reaction cups and incubating the reaction liquid in the reaction cups. The reaction liquid is prepared at least from the samples and the reagents;

[0040] A detection mechanism for detecting the incubated reaction liquid to obtain a detection result. The detection mechanism is also used to detect a mixture containing the quality control product and / or the calibration product and the reagent in a reaction container to obtain a quality control and / or calibration result;

[0041] A refrigeration device is used to refrigerate the bin body so that the temperature of the bin body reaches the target working temperature, and the target working temperature is lower than zero degrees Celsius. The refrigeration device includes a semiconductor refrigeration part for refrigeration, a drive module for outputting working electrical parameters to the semiconductor refrigeration part, and a detection component for detecting the internal resistance value of the semiconductor refrigeration part.

[0042] A controller is used to obtain the internal resistance value through the detection component and control the drive module according to the internal resistance value to adjust the working electrical parameters output by the drive module.

[0043] In a third aspect, an embodiment of the present application provides an on-line monitoring method for the semiconductor refrigeration part of a sample analyzer. The semiconductor refrigeration part is used to refrigerate the quality control product and / or calibration product of the sample analyzer. The sample analyzer further includes a detection component for detecting the internal resistance value of the semiconductor refrigeration part. The control method includes:

[0044] Obtain the internal resistance value of the semiconductor refrigeration part through the detection component;

[0045] Determine the variation state of the semiconductor refrigeration part according to the internal resistance value.

[0046] In one embodiment, the determining the variation state of the semiconductor refrigeration part according to the internal resistance value includes:

[0047] Compare the internal resistance value with a first preset condition. If the internal resistance value does not meet the first preset condition, confirm that the semiconductor refrigeration part has a variation.

[0048] In one embodiment, the first preset condition includes at least one of the following:

[0049] The calibrated internal resistance value or internal resistance value range of the semiconductor refrigeration part;

[0050] The normal internal resistance value or internal resistance value range of the semiconductor refrigeration part at room temperature;

[0051] The normal internal resistance value or internal resistance value range of the semiconductor refrigeration part at the target working temperature;

[0052] The normal internal resistance value or internal resistance value range obtained according to the historical data of the internal resistance value of the semiconductor refrigeration part.

[0053] In one embodiment, the following steps are further included:

[0054] When it is confirmed that the semiconductor refrigeration part has a variation, control the sample analyzer to give a fault prompt and / or stop.

[0055] In one embodiment, when it is confirmed that the semiconductor refrigeration unit has a variation, controlling the sample analyzer to give a fault prompt and / or shut down includes at least one of the following:

[0056] When it is confirmed that the semiconductor refrigeration unit has a variation and the internal resistance value meets the second preset condition, keep the sample analyzer working normally and give a fault prompt;

[0057] When it is confirmed that the semiconductor refrigeration unit has a variation and the internal resistance value does not meet the second preset condition, stop the sample analyzer from working and give a fault prompt.

[0058] In one embodiment, it further includes the following steps:

[0059] Record the currently obtained internal resistance value to generate historical internal resistance data; or the controller is further configured to record the internal resistance values that do not meet the first preset condition to generate historical internal resistance data.

[0060] In one embodiment, the controller is further configured to predict the variation trend of the semiconductor refrigeration unit according to the historical internal resistance data.

[0061] In one embodiment, obtaining the internal resistance value of the semiconductor refrigeration unit by the detection component includes one of the following:

[0062] Obtain the internal resistance value when the sample analyzer is powered on or within the first preset time after being powered on;

[0063] Obtain the internal resistance value after the time since the last shutdown of the sample analyzer exceeds the second preset time;

[0064] Obtain the internal resistance value when the semiconductor refrigeration unit is at room temperature;

[0065] Obtain the internal resistance value when the semiconductor refrigeration unit is at the target working temperature.

[0066] Fourthly, an on-line monitoring system for the semiconductor refrigeration unit of a sample analyzer provided by an embodiment of the present application includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements the on-line monitoring method for the semiconductor refrigeration unit of the sample analyzer in any one of the above embodiments.

[0067] On the other hand, an embodiment of the present application further provides an electronic device, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements the on-line monitoring method for the semiconductor refrigeration unit of the sample analyzer in any one of the above embodiments.

[0068] On the other hand, an embodiment of the present application further provides a computer-readable storage medium storing a computer program, and the computer program is executed by a processor to implement the online monitoring method for the semiconductor refrigeration unit of the sample analyzer in any one of the above embodiments.

[0069] On the other hand, an embodiment of the present application further provides a computer program product, which includes a computer program stored in a computer-readable storage medium. The processor of the computer device reads the computer program from the computer-readable storage medium, and the processor executes the computer program, so that the computer device executes the online monitoring method for the semiconductor refrigeration unit of the sample analyzer in any one of the above embodiments.

[0070] The sample analyzer, the online monitoring method and system for the semiconductor refrigeration unit provided by the embodiments of the present application have at least the following beneficial effects: by detecting the internal resistance value of the semiconductor refrigeration unit through the detection component in the refrigeration device, and determining the variation state of the semiconductor refrigeration unit according to the obtained internal resistance value, it is possible to perform online monitoring on the semiconductor refrigeration unit. Without affecting the normal operation of the sample analyzer and being able to maintain a sub-zero temperature for freezing and storing quality control products or calibration products, the timeliness of monitoring the variation state of the semiconductor refrigeration unit is effectively improved.

[0071] Other features and advantages of the present application will be described in the following specification, and, in part, will be obvious from the specification, or will be understood by implementing the present application. Description of the Drawings

[0072] The drawings are used to provide a further understanding of the technical solutions of the present application, and constitute a part of the specification. Together with the embodiments of the present application, they are used to explain the technical solutions of the present application, and do not constitute a limitation to the technical solutions of the present application.

[0073] Figure 1 It is a schematic diagram of the system architecture of the sample analyzer provided by an embodiment of the present application;

[0074] Figure 2 It is a schematic diagram of the panel structure of the sample analyzer provided by an embodiment of the present application;

[0075] Figure 3 It is a schematic diagram of the refrigeration device structure of the sample analyzer provided by an embodiment of the present application;

[0076] Figure 4 It is a block diagram of the drive module structure of the sample analyzer provided by an embodiment of the present application;

[0077] Figure 5 It is a block diagram of the drive module structure of the sample analyzer provided by another embodiment of the present application;

[0078] Figure 6 Schematic diagram of the connection structure of the drive module of the sample analyzer provided by an embodiment of the present application;

[0079] Figure 7 Block diagram of the drive module of the sample analyzer provided by another embodiment of the present application;

[0080] Figure 8 Schematic diagram of the connection structure of the forward and reverse switching circuit of the sample analyzer provided by an embodiment of the present application;

[0081] Figure 9 Schematic flow chart of the on-line monitoring method for the semiconductor refrigeration part of the sample analyzer provided by an embodiment of the present application;

[0082] Figure 10 Schematic flow chart of the specific process of step S300 provided by an embodiment of the present application;

[0083] Figure 11 Schematic flow chart of the on-line monitoring method for the semiconductor refrigeration part of the sample analyzer provided by another embodiment of the present application. Detailed implementation manners

[0084] In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0085] In the following descriptions, "some embodiments" are involved, which describe subsets of all possible embodiments. However, it can be understood that "some embodiments" can be the same subsets or different subsets of all possible embodiments, and can be combined with each other without conflict.

[0086] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present application belongs. The terms used herein are only for the purpose of describing the embodiments of the present application and are not intended to limit the present application.

[0087] In the description of this application and the above-mentioned drawings, terms such as "first", "second", "third", "fourth", etc. (if any) are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances so as to describe the embodiments of this application. For example, it can be implemented in an order other than those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that comprises a series of steps or units does not necessarily limit to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products, or devices.

[0088] It should be understood that in this application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects and indicates that there can be three relationships. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist simultaneously. Among them, A and B can be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. "At least one (one) of the following" or its similar expression refers to any combination of these items, including any combination of single item (one) or plural items (ones). For example, at least one (one) of a, b, or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0089] It should be understood that in the description of the embodiments of this application, the meaning of "a plurality (or multiple items)" is more than two. Understandings such as greater than, less than, exceeding, etc. do not include the present number, and understandings such as above, below, within, etc. include the present number.

[0090] In the embodiments of this application, a sample analyzer refers to an instrument used to detect and analyze a sample to be tested to obtain the test result of the sample to be tested. Specifically, it can be a hematology analyzer, a film reader, a biochemical analyzer, an immunoassay analyzer, a blood analyzer, and other sample analysis instruments. Before specifically describing this application, first describe the structure of the sample analyzer.

[0091] Please refer to Figure 1 , an embodiment discloses a sample analyzer, including at least one functional module 10, an input module 20, a display module 30, a memory 40, a controller 50, an alarm module 60, and a refrigeration device 70, which will be described separately below.

[0092] Each functional module 10 is used to complete at least one function required in the sample analysis process. These functional modules 10 cooperate together to complete the sample analysis and obtain the result of the sample analysis. Please refer toFigure 2 This is a sample analyzer of an embodiment, in which some examples of the functional module 10 are given. For example, the functional module 10 may include a sample component 11, a sample dispensing mechanism 12, a reagent component 13, a reagent dispensing mechanism 14, a mixing mechanism 15, a reaction mechanism 16, an optical measurement component 17, etc.

[0093] The sample component 11 is used to carry samples. In some examples, the sample component 11 may include a sample distribution module (SDM, Sample Delivery Module) and a front-end track; in other examples, the sample component 11 may also be a sample tray, which includes a plurality of sample positions for placing sample tubes such as sample tubes. By rotating its disc structure, the sample tray can schedule the samples to corresponding positions, such as the position for the sample dispensing mechanism 12 to aspirate the samples.

[0094] The sample dispensing mechanism 12 is used to aspirate samples and discharge them into the reaction cups to be loaded with samples. For example, the sample dispensing mechanism 12 may include a sample needle, which moves in two or three dimensions in space through a two-dimensional or three-dimensional drive mechanism, so that the sample needle can move to aspirate the samples carried by the sample component 11, and move to the reaction cups to be loaded with samples and discharge the samples into the reaction cups.

[0095] The sample dispensing mechanism 12 may include a sample needle, which is used to aspirate samples and discharge them into the dilution cups to be loaded with samples. In some embodiments, a capacitance sensor is provided at the tip of the sample needle. When the sample needle touches the liquid surface, the capacitance sensor will send a liquid surface signal to the controller so that the controller can obtain the liquid surface position. That is to say, the sample needle can be used as a liquid surface monitoring device to detect the liquid surface height of the dilution cup.

[0096] The reagent component 13 is used to carry reagents. In one embodiment, the reagent component 13 may be a reagent tray, which is arranged in a disc shape and is used to store reagent containers with reagents. It has a plurality of positions for carrying reagent containers, and at least one quality control product or calibration product storage position is provided in the reagent tray for storing quality control products or calibration products. The reagent component 13 can rotate and drive the reagent containers carried by it to rotate, so as to rotate the reagent containers to specific positions, such as the position for the reagent dispensing mechanism 14 to aspirate reagents. The number of reagent components 13 can be one or more.

[0097] The reagent dispensing mechanism 14 is used to aspirate reagents and discharge them into the reaction cups to be loaded with reagents. In one embodiment, the reagent dispensing mechanism 14 may include a reagent needle, which moves in two or three dimensions in space through a two-dimensional or three-dimensional drive mechanism, so that the reagent needle can move to aspirate the reagents carried by the reagent component 13, and move to the reaction cups to be loaded with reagents and discharge the reagents into the reaction cups.

[0098] For the convenience of description, in the following description, the sample dispensing mechanism 12 and the reagent dispensing mechanism 14 will be classified into the function module of the dispensing mechanism, and the sample needle and the reagent needle will be collectively referred to as the pipetting needle; in addition, the dispensing mechanism may further include a moving component, and the moving component corresponds to the driving mechanism of the pipetting needle, and is used to drive the pipetting needle to move between different operating positions to aspirate or discharge the target liquid. The moving component can be a two-dimensional or three-dimensional driving mechanism, and the target liquid includes samples or reagents, quality control products or calibration products.

[0099] When the dispensing mechanism includes the sample dispensing mechanism 12, the pipetting needle is the sample needle, the target liquid is the sample, and the moving component drives the sample needle to move between the sample positions. When the dispensing mechanism includes the reagent dispensing mechanism 14, the pipetting needle is the reagent needle, the target liquid is the reagent, and the moving component drives the reagent needle to move between the reagent positions; the pipetting needle of the dispensing mechanism aspirates the quality control product or calibration product stored in the reagent tray and transfers it to the quality control or calibration station. After the pipetting needle of the dispensing mechanism aspirates the quality control product or calibration product, the reagent tray rotates again to rotate the next reagent container to be detected to the aspirating position; alternatively, the controller controls the pipetting needle of the dispensing mechanism to move to the storage position where the quality control product or calibration product is located to aspirate the quality control product or calibration product, and then transfers it to the reaction container or reaction cup.

[0100] The mixing mechanism 15 is used to mix the reaction liquid that needs to be mixed in the reaction cup of the reaction component. The number of the mixing mechanisms 15 can be one or more.

[0101] The reaction mechanism 16 has at least one placement position, and the placement position is used to place the reaction cup and incubate the reaction liquid in the reaction cup. For example, the reaction mechanism 16 can be a reaction disk, which is arranged in a disk-shaped structure and has one or more placement positions for placing the reaction cup. The reaction disk can rotate and drive the reaction cup in its placement position to rotate, and is used to schedule the reaction cup in the reaction disk and incubate the reaction liquid in the reaction cup.

[0102] The optical measurement component 17 is used to perform optical measurement on the reaction liquid after incubation to obtain the reaction data of the sample. For example, the optical measurement component 17 detects the luminescence intensity of the reaction liquid to be measured, and calculates the concentration of the component to be measured in the sample through the calibration curve. In one embodiment, the optical measurement component 17 is separately arranged outside the reaction mechanism 16.

[0103] The above are some examples of the function module 10. Next, other components and structures in the sample analyzer will be described. The sample analyzer further includes the following components:

[0104] The refrigeration device 70 is used to refrigerate the chamber that holds the quality control product and / or calibration product, so that the temperature of the chamber reaches the target operating temperature. It includes a thermoelectric refrigeration part and a detection component. The thermoelectric refrigeration part is used to refrigerate the chamber that holds the quality control product and / or calibration product; the detection component is used to detect the internal resistance value of the thermoelectric refrigeration part. The refrigeration device 70 can be arranged below the chamber or reagent tray that stores the quality control product or calibration product. Since refrigerating and storing the quality control product and / or calibration product in the chamber by the refrigeration device 70 can prevent the quality control product or calibration product from deteriorating, thereby improving the accuracy of the test results. The specific composition of the refrigeration device 70 will be given in detail in the following embodiments for explanation in cooperation with the on-line monitoring of the thermoelectric refrigeration part.

[0105] The controller 50 can be the nerve center and command center of the sample analyzer, or the command center in the sample analyzer responsible for monitoring the variation of the refrigeration part. The controller 50 can generate operation control signals according to the instruction operation code and timing signal to complete the control of fetching instructions and executing instructions. For example, it receives the operation instruction of monitoring the internal resistance of the thermoelectric refrigeration part input by the user, and controls the detection component to detect the internal resistance of the thermoelectric refrigeration part according to the operation instruction. In some embodiments, the controller 50 can receive the internal resistance value of the thermoelectric refrigeration part measured by the detection component and perform corresponding calculations to obtain the variation state of the thermoelectric refrigeration part; or, the controller 50 can output a control signal to control the sample dispensing mechanism 12 to add the quality control product or calibration product to the reaction container; or, the controller 50 can receive the liquid level signal monitored by the sample needle. The functions and execution steps of the controller 50 will be further described below.

[0106] The input module 20 is used to receive the input of the user. Commonly, the input module 20 can be a mouse, keyboard, etc. In some cases, it can also be a touch display screen. The touch display screen brings the functions of allowing the user to input and display content. Therefore, in this example, the input module 20 and the display module 30 are integrated. Of course, in some examples, the input module 20 can even be a voice input device that can recognize voices, etc.

[0107] The display module 30 can be used to display information, and can be used to display the sample analysis results and / or display relevant information of the reagent and / or quality control product or calibration product, such as characteristic information, type information, location information, etc. and is used to receive the setting and control instructions of the user, such as the quality control / calibration test instruction. In some embodiments, the sample analyzer itself can integrate the display module. In some embodiments, the sample analyzer can also be connected to a computer device (such as a computer), and the information is displayed through the display unit (such as a display screen) of the computer device. These all fall within the scope defined and protected by the display module 30 in this article.

[0108] The alarm module 60 can be used for output. In some embodiments, the alarm module 60 can include a sound alarm device, a light alarm device, or an integrated sound and light alarm device integrating the two; in other embodiments, the alarm module 60 can also be integrated with the display module 30, that is, the display module 30 is used to display alarm prompt information.

[0109] It should be noted that the structure of the sample analyzer described in the embodiments of the present invention is for more clearly explaining the technical solutions of the embodiments of the present invention, and does not constitute a limitation on the technical solutions provided by the embodiments of the present invention. Those skilled in the art can know that with the evolution of the device architecture and the emergence of new application scenarios, the technical solutions provided by the embodiments of the present invention are equally applicable to similar technical problems.

[0110] Those skilled in the art can understand that Figure 1 and Figure 2 the sample analyzer shown in

[0111] does not constitute a limitation on the embodiments of the present invention, and may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0112] Therefore, the sample analyzer according to the embodiments of the present application obtains the internal resistance value of the semiconductor refrigeration part detected by the detection component through the controller 50, and determines the variation state of the semiconductor refrigeration part according to the obtained internal resistance value, and can perform online monitoring on the semiconductor refrigeration part. Without affecting the normal operation of the sample analyzer and being able to maintain the quality control product or calibration product frozen at a sub-zero temperature, the timeliness of monitoring the variation state of the semiconductor refrigeration part is effectively improved.

[0113] In one embodiment, the embodiment of the present application provides a sample analyzer, including:

[0114] A carrying component, including a bin for carrying quality control products and / or calibration products;

[0115] A dispensing mechanism for sucking reagents or samples and discharging them into reaction cups;

[0116] A reaction mechanism 16 having at least one placement position for placing reaction cups and incubating the reaction solution in the reaction cups, where the reaction solution is prepared from at least a sample and a reagent;

[0117] A detection mechanism for detecting the incubated reaction solution to obtain a detection result, and the detection mechanism is also used to detect a mixture of a quality control product and / or a calibration product and a reagent in a reaction container to obtain a quality control and / or calibration result;

[0118] A refrigeration device 70 for refrigerating the bin to make the temperature of the bin reach a target working temperature. The refrigeration device 70 includes a thermoelectric refrigeration part for refrigeration and a detection component for detecting the internal resistance value of the thermoelectric refrigeration part, where the target working temperature is lower than zero degrees Celsius;

[0119] A controller 50 for obtaining the internal resistance value through the detection component and determining the variation state of the thermoelectric refrigeration part according to the internal resistance value.

[0120] It should be noted that the quality control product is a standard substance with a known concentration, used to check whether the sample analyzer is normal. By detection, a quality control result can be obtained to verify the reliability of the sample analyzer. The calibration product is also a standard substance with a known concentration. By using the calibration product to calibrate the item reagent, a calibration result can be obtained to obtain a calibration curve for a specific item. In some embodiments, multiple reagent storage positions are provided in the bin, and at least one of the multiple reagent storage positions can be set as a quality control product or calibration product storage position, that is, the quality control product or calibration product storage position constitutes at least one of the multiple reagent storage positions; or a quality control product or calibration product storage position independent of the multiple reagent storage positions is constructed in the sample analyzer in advance, that is, the quality control product or calibration product storage position constitutes a storage position independent of the multiple reagent storage positions. Specifically, it can be set according to the actual situation, and the embodiments of the present application do not make specific limitations.

[0121] It can be understood that while the controller 50 controls the dispensing mechanism to dispatch the quality control product or calibration product in the carrier component to the detection mechanism to detect the reaction solution after incubation is completed, it is possible to obtain the internal resistance value of the semiconductor refrigeration part for freezing and storing the quality control product or calibration product through the detection component, so as to determine the variation state of the semiconductor refrigeration part according to this internal resistance value, realize online monitoring of the semiconductor refrigeration part, and be able to timely detect whether the semiconductor refrigeration part has a variation state when the sample analyzer maintains a sub-zero temperature for freezing and storing the quality control product or calibration product.

[0122] In some embodiments, the controller 50 is further configured to compare the internal resistance value with a first preset condition. If the internal resistance value does not meet the first preset condition, it is confirmed that the semiconductor refrigeration part has a variation.

[0123] It can be understood that after the controller 50 obtains the internal resistance value of the semiconductor refrigeration part detected by the detection component, it simultaneously obtains the pre-stored first preset condition. Then, the controller 50 compares the internal resistance value with the first preset condition to determine whether the internal resistance value meets the first preset condition. If it does not meet the first preset condition, it can be confirmed that the semiconductor refrigeration part has a variation. If the internal resistance value meets the first preset condition, the controller 50 confirms that the semiconductor refrigeration part is in a normal working state, and the semiconductor refrigeration part can continue to maintain a normal working state.

[0124] In some embodiments, the first preset condition includes at least one of the following:

[0125] The calibrated internal resistance value or calibrated internal resistance range of the semiconductor refrigeration part;

[0126] The normal internal resistance value or normal internal resistance range of the semiconductor refrigeration part at room temperature;

[0127] The normal internal resistance value or normal internal resistance range of the semiconductor refrigeration part at the target working temperature;

[0128] The normal internal resistance value or normal internal resistance range obtained according to the historical data of the internal resistance value of the semiconductor refrigeration part.

[0129] It can be understood that the semiconductor refrigeration unit may include multiple semiconductor refrigeration chips. The internal resistance values of each semiconductor refrigeration chip will change with the change of the ambient temperature. The normal internal resistance value or the normal internal resistance value range measured in advance at room temperature or at the temperature during normal refrigeration operation can be used as the first preset condition. Among them, the calibrated internal resistance value is the factory nominal internal resistance value of a single semiconductor refrigeration chip. The calibrated internal resistance values or the calibrated internal resistance value ranges of each semiconductor refrigeration chip are recorded in the corresponding product specification or technical manual. The specific calibrated internal resistance value may vary due to different semiconductor refrigeration chip models, production batches, and actual test conditions. For example, if the calibrated internal resistance value or the normal internal resistance value of the semiconductor refrigeration unit is between 0.3 and 0.5 ohms, then the first preset condition can be set to less than 0.3 ohms or greater than 0.5 ohms. When it is detected that the internal resistance value is outside this range, it can be confirmed that the semiconductor refrigeration unit has a variation.

[0130] In one embodiment, when the controller 50 determines that the internal resistance value of the semiconductor refrigeration unit conforms to the normal internal resistance value and / or the calibrated internal resistance value, or when it is determined that the internal resistance value of the semiconductor refrigeration unit is within the normal internal resistance value range, the controller 50 confirms that the semiconductor refrigeration unit is in a normal working state, and the semiconductor refrigeration unit can continue to maintain the normal working state. In another embodiment, when the controller 50 determines that the internal resistance value of the semiconductor refrigeration unit does not conform to the normal internal resistance value and / or the calibrated internal resistance value, or when it is determined that the internal resistance value of the semiconductor refrigeration unit exceeds the calibrated internal resistance value range and / or the normal internal resistance value range, the controller 50 confirms that the semiconductor refrigeration unit has a variation. It should be noted that the above various types of first preset conditions can be set by the user to the sample analyzer through the input module 20. The application embodiment does not make a specific limitation on the device type of the input module 20.

[0131] In some embodiments, the controller 50 is further configured to give a fault prompt and / or control the sample analyzer to stop when it is confirmed that the semiconductor refrigeration unit has a variation.

[0132] It can be understood that when the controller 50 confirms that a variation occurs in the semiconductor refrigeration unit, it sends a fault prompt message to the alarm module 60, and the alarm module 60 issues an alarm message. The alarm module may include a sound alarm device, a light alarm device, or an acoustic-optic alarm device integrating both. Further, the alarm module 60 may also be integrated with the display module 30, that is, the display module 30 is used to display the alarm message, which can timely notify the staff to take measures to prevent the fault from expanding or causing more serious consequences. In some embodiments, when the controller 50 confirms that a variation occurs in the semiconductor refrigeration unit and the alarm module 60 issues an alarm message, the controller 50 controls the sample analyzer to stop working through the corresponding output interface, for example, by cutting off the power supply, sending a shutdown instruction, or taking other shutdown measures, so as to prevent the influence of the fault from expanding and facilitate the staff to further check and analyze the cause of the fault.

[0133] In some embodiments, the controller 50 is further configured to keep the sample analyzer working normally and give a fault prompt when it confirms that a variation occurs in the semiconductor refrigeration unit and the internal resistance value meets the second preset condition; or, the controller 50 is further configured to stop the sample analyzer from working and give a fault prompt when it confirms that a variation occurs in the semiconductor refrigeration unit and the internal resistance value does not meet the second preset condition.

[0134] It can be understood that when the controller 50 confirms that the semiconductor refrigeration unit has a variation, and after obtaining the internal resistance value of the semiconductor refrigeration unit detected by the detection component, it compares the internal resistance value with a pre-stored second preset condition to determine whether the internal resistance value meets the second preset condition. If the internal resistance value meets the second preset condition, it controls the sample analyzer to maintain the normal working state and sends a fault prompt message to the alarm module 60 for alarm, prompting the staff to maintain or replace the semiconductor refrigeration unit as soon as possible. In another embodiment, when the controller 50 confirms that the semiconductor refrigeration unit has a variation and the internal resistance value does not meet the second preset condition, it controls the sample analyzer to stop working through the corresponding output interface and triggers the alarm module 60 to send an alarm message for fault prompt, so that the staff can check and analyze the cause of the fault subsequently. It should be understood that the second preset condition in the embodiments of the present application is set based on the variation of the semiconductor refrigeration unit. When the semiconductor refrigeration unit has a variation, the internal resistance value usually becomes very large, for example, greater than 10 ohms. Then the second preset condition can be set to be greater than 10 ohms. When the detected internal resistance value is above 10 ohms, the controller 50 controls the sample analyzer to stop working and gives a fault prompt. Therefore, the numerical range of the second preset condition is much larger than that of the first preset condition. The controller 50 first compares the internal resistance value of the semiconductor refrigeration unit with the first preset condition. If the internal resistance value does not meet the first preset condition, it confirms that the semiconductor refrigeration unit has a variation, and then compares the internal resistance value of the semiconductor refrigeration unit with the second preset condition to further determine whether to give a fault prompt and / or control the sample analyzer to stop, so as to avoid affecting the normal operation of the sample analyzer.

[0135] In some embodiments, the second preset condition includes at least one of the following:

[0136] The abnormal internal resistance value or abnormal internal resistance value range of the semiconductor refrigeration unit at room temperature;

[0137] The abnormal internal resistance value or abnormal internal resistance value range of the semiconductor refrigeration unit at the target working temperature;

[0138] The abnormal internal resistance value or abnormal internal resistance value range obtained according to the historical data of the internal resistance value of the semiconductor refrigeration unit.

[0139] In some embodiments, the controller 50 is further configured to record the currently obtained internal resistance value to generate historical data of the internal resistance value to predict the variation trend of the internal resistance value of the semiconductor refrigeration unit; or the controller 50 is further configured to record the internal resistance value that does not meet the first preset condition to generate historical data of the internal resistance value to predict the variation trend of the internal resistance value of the semiconductor refrigeration unit.

[0140] It can be understood that the variation trend of the internal resistance value is the change direction or change law of the internal resistance value of the semiconductor refrigeration unit within a certain period of time. The controller 50 records multiple internal resistance values of the semiconductor refrigeration unit detected by the detection component during the variation period, or can fixedly record multiple internal resistance values detected each time. These internal resistance values can be the internal resistance values within the first preset condition, such as the calibrated internal resistance value of the semiconductor refrigeration unit, the normal internal resistance value of the semiconductor refrigeration unit at room temperature, or the normal internal resistance value at the target operating temperature. Then, based on these internal resistance values, historical data of the internal resistance value is generated. Further, this part of the historical data can be used as historical data of the normal internal resistance value and stored. After that, by calculating the change trend of the historical data of the normal internal resistance value, the variation trend of the internal resistance value of the semiconductor refrigeration unit is predicted. The staff can refer to the prediction result to judge whether it is necessary to maintain or replace the semiconductor refrigeration unit in the future. In another embodiment, the controller 50 can also compare the internal resistance values obtained within a period with the first preset condition, record the internal resistance values that do not meet the first preset condition, and generate historical data of the internal resistance value based on these internal resistance values. Further, this part of the historical data can be used as historical data of the variant internal resistance value and stored. After that, by calculating, the variation trend of the internal resistance value of the semiconductor refrigeration unit is predicted, which helps the staff judge whether the variation of the semiconductor refrigeration unit will continue to deteriorate according to the prediction result, so as to determine the location of the fault before maintaining or replacing the semiconductor refrigeration unit.

[0141] It should be noted that the variation trend of the internal resistance value of the semiconductor refrigeration unit can be analyzed and predicted by recording and storing the historical data of the internal resistance value, such as establishing a historical data set of the internal resistance value and then using data analysis methods. In one embodiment, the internal resistance value of the general semiconductor refrigeration unit usually changes with parameters such as temperature and current. Therefore, a non-linear fitting method, such as polynomial fitting or exponential fitting, can be used to fit the historical data set of the internal resistance value and predict the non-linear variation trend of the internal resistance value of the semiconductor refrigeration unit. In addition, machine learning algorithms, such as support vector machines, decision trees or neural networks, can also be used to predict the variation trend of the internal resistance value of the semiconductor refrigeration unit by training models, which is beneficial to improving the accuracy of prediction.

[0142] In some embodiments, the controller 50 is further configured to keep the sample analyzer working normally and give a fault prompt when the variation trend meets the third preset condition.

[0143] It can be understood that the controller 50 can control the working state of the sample analyzer according to the variation trend of the internal resistance value of the semiconductor refrigeration unit and accordingly give a fault prompt. The controller 50 predicts the variation trend of the internal resistance value of the semiconductor refrigeration unit based on the recorded and stored historical data of the internal resistance value, and compares the prediction result with a third preset condition stored in advance to determine whether the variation trend meets the third preset condition. If the variation trend of the internal resistance value of the semiconductor refrigeration unit meets the third preset condition, at this time, the controller 50 controls the sample analyzer to maintain a normal working state and sends a fault prompt message to the alarm module 60 to control the alarm module 60 to give an alarm.

[0144] In one embodiment, alternatively, the controller 50 is further configured to stop the operation of the sample analyzer and give a fault prompt when the variation trend does not meet the third preset condition. If the variation trend of the internal resistance value of the semiconductor refrigeration unit does not meet the third preset condition, the controller 50 controls the sample analyzer to stop operating through a corresponding output interface, such as by cutting off the power supply, sending a shutdown instruction, etc., and at the same time sends a fault prompt message and triggers the alarm module 60 to give an alarm.

[0145] It should be noted that when the semiconductor refrigeration unit is working normally, its internal resistance value will be affected by many factors, including working temperature, material characteristics, and use environment, etc. Therefore, the variation trend of the internal resistance value is not fixed. By setting the third preset condition, it is possible to prevent misjudging the variation trend of the internal resistance value and avoid affecting the normal operation of the sample analyzer. Specifically, the normal working temperature of the semiconductor refrigeration unit is generally a sub-zero temperature, and low temperature will affect its internal resistance value. The lower the working temperature, the variation trend is that the internal resistance value will increase to form a positive variation trend. In addition, or due to abnormal conditions such as overload or short circuit of the refrigeration chip during operation, it will also affect the variation trend of the internal resistance value. For example, the variation trend can be a positive variation trend caused by overload resulting in an increase in the internal resistance value, or a negative variation trend caused by short circuit resulting in a decrease in the internal resistance value.

[0146] Accordingly, the third preset condition that can cover different direction variation trends can be set according to the normal internal resistance value historical data, or the third preset condition for judging the positive variation trend and the third preset condition for judging the negative variation trend can be set respectively according to the end values of the normal internal resistance value historical data. The normal internal resistance value historical data in both cases are recorded by the semiconductor refrigeration chip under different working conditions, such as the normal internal resistance value historical data recorded at room temperature, the normal internal resistance value historical data recorded at the target working temperature, etc. When judging the variation trend, the third preset condition corresponding to the working condition is automatically selected for comparison. It should be understood that the third preset condition serves as a reference for the normal change of the internal resistance value of the semiconductor refrigeration unit under different working conditions. If the variation trend of the internal resistance value does not meet the third preset condition, it indicates that the internal resistance value of the semiconductor refrigeration unit has a continuous abnormal change at this time.

[0147] In some embodiments, the refrigeration device 70 further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration unit; the controller 50 is further configured to control the driving module according to the internal resistance value to adjust the working electrical parameters output by the driving module.

[0148] It can be understood that the controller 50 detects the internal resistance value of the semiconductor refrigeration unit in real time according to the detection component, and obtains the input power supply voltage, calculates the corresponding working electrical parameters, and then adjusts the working electrical parameters output by the driving module, so that the working electrical parameters output to the semiconductor refrigeration unit reach the required value, thereby extending the service life. In one embodiment, the controller 50 can also obtain the historical data of the internal resistance value according to the above embodiment and obtain the input power supply in real time. By calculating the working electrical parameters corresponding to multiple internal resistance values in the historical data of the internal resistance value, the working electrical parameters output by the driving module can be adjusted, and the refrigeration effect of the semiconductor refrigeration unit can be controlled more precisely, and the power consumption can be reduced while keeping the semiconductor refrigeration unit working normally.

[0149] In some embodiments, the controller 50 obtains the internal resistance value when the sample analyzer is powered on or at the first preset time after power-on; alternatively, the controller 50 obtains the internal resistance value when the time since the last shutdown of the sample analyzer exceeds the second preset time; alternatively, the controller 50 obtains the internal resistance value when the semiconductor refrigeration unit is at room temperature; alternatively, the controller 50 obtains the internal resistance value when the semiconductor refrigeration unit is at the target working temperature.

[0150] It can be understood that the controller 50 obtains the internal resistance value of the semiconductor refrigeration unit through the detection component when the sample analyzer is powered on or at the first preset time after power-on, and can detect the internal resistance value before the driving module outputs working electrical parameters to the semiconductor refrigeration unit to drive normal operation, and can timely detect possible faults or abnormal conditions of the semiconductor refrigeration unit, thereby avoiding more serious problems during the operation of the sample analyzer.

[0151] In one embodiment, the controller 50 can obtain the last shutdown time when powering on, compare it with a second preset time, and determine whether the last shutdown time exceeds the second preset time. If it exceeds, the controller can obtain the internal resistance value of the semiconductor refrigeration unit through the detection component. Herein, the second preset time can be set as the time required for the sample analyzer to return from the normal working low temperature state to the normal temperature state, or a relatively long time can be set according to actual usage requirements to prevent the time interval for restarting the sample analyzer from being too short and repeatedly detecting the internal resistance value of the semiconductor refrigeration unit within a short time, resulting in inaccurate detection results. Further, when the semiconductor refrigeration unit is in the normal temperature state, the controller 50 can obtain the internal resistance value of the semiconductor refrigeration unit through the detection component to determine possible variation conditions of the semiconductor refrigeration unit in the normal temperature state. In another embodiment, the internal resistance value of the semiconductor refrigeration unit in the low temperature environment can also be obtained through the detection component when the semiconductor refrigeration unit is at the target working temperature.

[0152] In some embodiments, the controller 50 is further configured to obtain the initial internal resistance value of the semiconductor refrigeration unit through the detection component when the semiconductor refrigeration unit is used for the first time. If the initial internal resistance value meets the first preset condition, the controller 50 obtains the working internal resistance value of the semiconductor refrigeration unit after the semiconductor refrigeration unit reaches the target working temperature, and updates the first preset condition according to the working internal resistance value.

[0153] It can be understood that when the sample analyzer is powered on, the controller 50 obtains the initial internal resistance value of the semiconductor refrigeration unit used for the first time through the detection component and compares it with the first preset condition. If the initial internal resistance value meets the first preset condition, after the controller 50 controls the semiconductor refrigeration unit to perform normal refrigeration work through the driving module and reaches the target working temperature, the controller obtains the internal resistance value of the semiconductor refrigeration unit at the working temperature again as the working internal resistance value, and then resets the first preset condition according to the working internal resistance value to determine possible variation conditions of the semiconductor refrigeration unit in the normal working low temperature environment.

[0154] In some embodiments, the refrigeration device 70 further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration unit. The controller 50 obtains the internal resistance value through the detection component before the driving module works or after controlling the driving module to stop working.

[0155] It can be understood that the controller 50 can detect the internal resistance value of the semiconductor refrigeration unit through the detection component before the driving module outputs working electrical parameters to drive the semiconductor refrigeration unit to work normally, or after the controller 50 stops the driving module, which can timely detect possible faults or abnormal conditions of the semiconductor refrigeration unit, thereby avoiding more serious problems during the operation of the sample analyzer.

[0156] In some embodiments, the detection component includes an AC signal source and a signal detection module. The controller 50 controls the AC signal source to send an AC detection signal to the semiconductor refrigeration unit, obtains the feedback signal fed back by the semiconductor refrigeration unit in response to the AC detection signal through the signal detection module, and obtains the internal resistance value according to the feedback signal.

[0157] It can be understood that the controller 50 can control the detection component to detect the internal resistance value of the semiconductor refrigeration unit before the driving module outputs working electrical parameters to drive the semiconductor refrigeration unit to work normally, or after the controller 50 driving module stops working. Specifically, in the state where the driving module stops working, the controller 50 first controls the AC signal source to inject an AC detection signal into the positive and negative electrodes of the semiconductor refrigeration unit, and then controls the signal detection module to obtain the feedback signal fed back by the semiconductor refrigeration unit in response to the AC detection signal. Among them, the AC detection signal includes a sine wave current signal, and the feedback signal includes a sine wave voltage signal. Further, the controller 50 calculates the internal resistance value of the semiconductor refrigeration unit based on the sine wave current signal output by the AC signal source and the sine wave voltage signal obtained by the signal detection module.

[0158] In some embodiments, the refrigeration device 70 further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration unit. The driving module includes a driving circuit and a feedback detection circuit. The controller 50 controls the driving circuit to output working electrical parameters to the semiconductor refrigeration unit to make the semiconductor refrigeration unit enter the refrigeration working state. The controller 50 also controls the driving circuit to output a DC detection signal to the semiconductor refrigeration unit, and obtains the detection parameters of the semiconductor refrigeration unit through the feedback detection circuit, and obtains the internal resistance value according to the detection parameters.

[0159] It can be understood that after the controller 50 controls the driving circuit to output working electrical parameters to the semiconductor refrigeration unit to make the semiconductor refrigeration unit enter the refrigeration working state, it can also detect the internal resistance value of the semiconductor refrigeration unit through the feedback detection circuit. Specifically, the controller 50 can control the driving circuit to output a DC detection signal to the semiconductor refrigeration unit, and then the controller 50 obtains the detection parameters of the semiconductor refrigeration unit through the feedback detection circuit. Among them, the DC detection signal includes a constant current signal and a constant voltage signal, and the detection parameter can be a feedback current or a feedback voltage. In one embodiment, the controller 50 controls the driving circuit to output a constant current signal to the semiconductor refrigeration unit, and then obtains the feedback voltage of the semiconductor refrigeration unit in response to the constant current signal through the feedback detection circuit, so as to calculate the internal resistance value of the semiconductor refrigeration unit based on the constant current signal and the feedback voltage. In another embodiment, the controller 50 controls the driving circuit to output a constant voltage signal to the semiconductor refrigeration unit, and then obtains the feedback current of the semiconductor refrigeration unit in response to the constant voltage signal through the feedback detection circuit, so as to calculate the internal resistance value of the semiconductor refrigeration unit based on the constant voltage signal and the feedback current.

[0160] In some embodiments, the controller 50 controls the driving circuit to output DC detection signals with different electrical parameters to the semiconductor refrigeration unit, obtains a plurality of detection parameters corresponding to different DC detection signals through the feedback detection circuit, calculates the first internal resistance values corresponding to the respective detection parameters, and obtains the internal resistance value of the semiconductor refrigeration unit based on the respective first internal resistance values.

[0161] It can be understood that after the controller 50 controls the driving circuit to output operating electrical parameters to the semiconductor refrigeration unit to enable the semiconductor refrigeration unit to enter the refrigeration operating state, it also outputs DC detection signals with different electrical parameters to the semiconductor refrigeration unit and detects the internal resistance value of the semiconductor refrigeration unit through the feedback detection circuit. Among them, the DC detection signals with different electrical parameters include constant current signals and constant voltage signals, and the detection parameter can be the feedback current or the feedback voltage. Specifically, the controller 50 controls the driving circuit to output a constant current signal to the semiconductor refrigeration unit, then obtains the feedback voltages of the semiconductor refrigeration unit corresponding to different constant current signals through the feedback detection circuit, then calculates the first internal resistance values corresponding to the respective feedback voltages, and obtains the internal resistance value of the semiconductor refrigeration unit based on the respective first internal resistance values. In addition, the controller 50 can also control the driving circuit to output a constant voltage signal to the semiconductor refrigeration unit, then obtains the feedback currents of the semiconductor refrigeration unit corresponding to different constant voltage signals through the feedback detection circuit, then calculates the first internal resistance values corresponding to the respective feedback currents, and obtains the internal resistance value of the semiconductor refrigeration unit based on the respective first internal resistance values.

[0162] In some embodiments, it further includes a temperature detection component for detecting the temperature of the semiconductor refrigeration unit and / or inside the chamber, and the controller 50 is further configured to control the driving module to output operating electrical parameters to the semiconductor refrigeration unit according to the temperature parameters detected by the temperature detection component.

[0163] It can be understood that the sample analyzer further includes a temperature detection component for detecting the temperature in the semiconductor refrigeration part and / or the chamber. The controller 50 can detect the temperature parameters in the semiconductor refrigeration part and / or the chamber through the temperature detection component, and then control the drive module to output working electrical parameters to the semiconductor refrigeration part according to the temperature parameters, including working current and working voltage. Specifically, when the temperature detection component detects that the temperature in the semiconductor refrigeration part and / or the chamber is higher than the preset normal temperature, the controller 50 controls the drive module to reduce the working voltage or working current output to the semiconductor refrigeration part, so as to reduce the power of the semiconductor refrigeration part and lower the temperature. It should be noted that while freeze-storing dry powder quality control products and calibration products at sub-zero temperatures, it is necessary to cooperate with the dispensing mechanism of the sample analyzer to pick up and place the stored quality control products or calibration products. However, the temperature of the low-temperature freezing environment will increase during the picking-up and placing process, which may affect the stability of the quality control products or calibration products. Therefore, the temperature in the semiconductor refrigeration part and / or the chamber can be monitored through the temperature detection component. When the temperature rises, the working electrical parameters output by the semiconductor refrigeration part can be accurately adjusted to cool down to the set temperature. For example, when the set temperature is lowered to -20°C, the stability of freeze-storing dry powder quality control products and calibration products can be ensured.

[0164] In another embodiment, if the temperature detection component detects that the temperature in the semiconductor refrigeration part and / or the chamber is too low, the controller 50 can control the drive module to increase the working voltage or working current output to the semiconductor refrigeration part, so as to increase the power of the semiconductor refrigeration part and raise the temperature to reach the set temperature. It should be noted that in an environment where dry powder quality control products and calibration products are freeze-stored at a set temperature, for example, the set temperature can be -20°C. When the set temperature for freeze-storing reaches about -20°C, frost is likely to form due to the too low temperature in the semiconductor refrigeration part and / or the chamber. Therefore, the temperature in the semiconductor refrigeration part and / or the chamber can be monitored through the temperature detection component. When the temperature is too low, the working electrical parameters output by the semiconductor refrigeration part can be adjusted, and the semiconductor refrigeration part can be used to heat up and defrost. On the one hand, the freezing effect of the quality control products or calibration products can be maintained, and on the other hand, frost connection between the container for placing the quality control products or calibration products in the chamber and the support frame can be prevented, ensuring that the dispensing mechanism of the sample analyzer can smoothly pick up and place the quality control products or calibration products for detection.

[0165] In one embodiment, when the temperature detection component detects that the temperature in the semiconductor refrigeration part and / or the chamber gradually reaches the set temperature, the controller 50 controls the drive module to gradually reduce the constant input working electrical parameters. When the set temperature is reached, for example, the set temperature is -20°C, the power is then maintained to achieve precise temperature control of the semiconductor refrigeration part and provide a stable freeze-storage environment for the quality control products or calibration products.

[0166] In some embodiments, the refrigeration device 70 further includes a heat conduction part and a heat dissipation part. The semiconductor refrigeration part cools the chamber through the heat conduction part and discharges the heat in the chamber through the heat dissipation part. Refer to Figure 3 As shown, when the controller 50 controls the drive module to output working electrical parameters to the semiconductor refrigeration part for refrigeration, Figure 3 the semiconductor refrigeration part 301 in it transfers heat to the chamber 302 through the heat conduction part 303. At the same time, the heat dissipation part 304 can effectively dissipate the heat generated by the semiconductor refrigeration part 301, thereby reducing the temperature of the semiconductor refrigeration part 301 and improving the refrigeration effect, providing a stable frozen storage environment for the quality control products or calibration products stored in the chamber.

[0167] Refer to Figure 4 As shown, in some embodiments, the drive module includes a control circuit, a first switch module, a second switch module, and an energy storage module. The control circuit is connected to the energy storage module through the first switch module and the second switch module. The control circuit is used to control the first switch module to conduct and the second switch module to turn off, so that the energy storage module is energized and stored through the first switch module, and is also used to control the first switch module to turn off and the second switch module to conduct, so that the energy storage module discharges through the second switch module. The energy storage module outputs working electrical parameters to the semiconductor refrigeration part during the charging and discharging processes. The control circuit adjusts the working electrical parameters output to the semiconductor refrigeration part by controlling the conduction time of the first switch module and the second switch module.

[0168] Refer to Figure 5 As shown, in one embodiment, the working electrical parameters include a working current and a working voltage. The drive module further includes a current detection module for detecting the working current and a voltage detection module for detecting the working voltage. The control circuit adjusts the working electrical parameters output to the semiconductor refrigeration part by adjusting the conduction time of the first switch module and the second switch module according to the current detection parameters fed back by the current detection module and / or the voltage detection parameters fed back by the voltage detection module, so that the output working current or working voltage is constant.

[0169] Specifically, refer to Figure 6 As shown, the control circuit controls the switches of MOS transistors Q1 and Q2 to charge and discharge the inductor L1 and stabilize the voltage of the capacitor C1, so as to achieve stable output voltage and current. When the load voltage is lower than the set voltage, the current feedback loop is the main control loop of the power supply. The voltage drop on the sampling output resistor R1 is sampled, passed through the amplification circuit in the current detection module, and compared with the AD reference signal output by the MCU to control the duty cycle, thereby keeping the output current constant. When the load voltage reaches the set voltage, the voltage feedback loop comes into play. By sampling the voltage division of the output resistors R2 and R3, passing through the amplification circuit in the voltage detection module and comparing it with the AD reference signal output by the MCU, the effect of stable output voltage is achieved.

[0170] Refer toFigure 7 As shown, in some embodiments, it further includes a forward and reverse switching circuit composed of multiple switching tubes. The working current output by the driving module is output to the semiconductor refrigeration part through the forward and reverse switching circuit. The controller 50 controls the direction of the working current flowing through the semiconductor refrigeration part through multiple switching tubes based on the temperature parameter. When the working current flows through the semiconductor refrigeration part in the first direction, the semiconductor refrigeration part is in the refrigeration state. When the working current flows through the semiconductor refrigeration part in the second direction, the semiconductor refrigeration part is in the heating and defrosting state. Specifically, referring to Figure 8 As shown, the forward and reverse switching circuit can use an H-bridge circuit to control the current direction of the semiconductor refrigeration part, so as to realize the refrigeration and heating control of the semiconductor refrigeration part. Further, an OVP protection circuit can be added to the input end of the energy storage module, and an OCP protection detection can be added between the MOS tubes Q4 and Q6 to achieve the function of protecting the load.

[0171] In some embodiments, the controller 50 obtains a defrosting temperature difference value according to the temperature parameter and the preset defrosting temperature. When the defrosting temperature difference value is less than the first preset temperature value, the controller controls the working current to flow through the semiconductor refrigeration part in the second direction through multiple switching tubes in the forward and reverse switching circuit, so that the semiconductor refrigeration part is in the heating and defrosting state.

[0172] In some embodiments, the embodiment of the present application further provides a sample analyzer, including:

[0173] A carrying component, including a bin body for carrying quality control products and / or calibration products;

[0174] A dispensing mechanism for sucking reagents or samples and discharging them into reaction cups;

[0175] A reaction mechanism 16 having at least one placement position for placing reaction cups and incubating the reaction liquid in the reaction cups. The reaction liquid is prepared from at least a sample and a reagent;

[0176] A detection mechanism for detecting the incubated reaction liquid to obtain a detection result, and the detection mechanism is also used for detecting a mixture of a quality control product and / or a calibration product and a reagent in a reaction container to obtain a quality control and / or calibration result;

[0177] A refrigeration device 70 for refrigerating the bin body to make the temperature of the bin body reach the target working temperature, and the target working temperature is lower than zero degrees Celsius. The refrigeration device 70 includes a semiconductor refrigeration part for refrigeration, a driving module for outputting working electrical parameters to the semiconductor refrigeration part, and a detection component for detecting the internal resistance value of the semiconductor refrigeration part;

[0178] A controller 50 for obtaining the internal resistance value through the detection component and controlling the driving module according to the internal resistance value to adjust the working electrical parameters output by the driving module.

[0179] It can be understood that while the controller 50 controls the dispensing mechanism to dispatch the quality control product or calibration product in the carrier component to the detection mechanism to detect the reaction solution after incubation is completed, the controller 50 can obtain the internal resistance value of the semiconductor refrigeration part for freezing and storing the quality control product or calibration product through the detection component, so as to control and adjust the working electrical parameters output by the driving module to the semiconductor refrigeration part according to the internal resistance value, so that the working electrical parameters output to the semiconductor refrigeration part reach the required value, which can not only extend the service life of the semiconductor refrigeration part, but also more precisely control the refrigeration effect of the semiconductor refrigeration part, and provide a stable frozen storage environment for the quality control product or calibration product.

[0180] Refer to Figure 9 As shown, based on the above sample analyzer with the refrigeration device 70, the embodiment of the present application further provides an on-line monitoring method for the semiconductor refrigeration part of the sample analyzer. Among them, the semiconductor refrigeration part of the refrigeration device 70 is used to refrigerate the quality control product and / or calibration product of the sample analyzer, and the internal resistance value of the semiconductor refrigeration part is detected by the detection component of the refrigeration device 70. The on-line monitoring method includes but is not limited to steps S100 to S200:

[0181] Step S100, obtain the internal resistance value of the semiconductor refrigeration part through the detection component.

[0182] Step S200, determine the variation state of the semiconductor refrigeration part according to the internal resistance value.

[0183] It can be understood that the sample analyzer in the embodiment of the present application obtains the internal resistance value detected by the detection component for the semiconductor refrigeration part used to freeze and store the quality control product or calibration product by the controller 50, so as to determine the variation state of the semiconductor refrigeration part according to the internal resistance value, realize on-line monitoring of the semiconductor refrigeration part, and can detect whether the semiconductor refrigeration part has a variation state in time without affecting the normal operation of the sample analyzer and while being able to maintain the quality control product or calibration product frozen and stored at a sub-zero temperature.

[0184] In some embodiments, determining the variation state of the semiconductor refrigeration part according to the internal resistance value in the above step S200 includes:

[0185] Step S210, compare the internal resistance value with the first preset condition. If the internal resistance value does not meet the first preset condition, confirm that the semiconductor refrigeration part has a variation.

[0186] In some embodiments, the first preset condition in the above step S210 includes at least one of the following:

[0187] The calibrated internal resistance value or calibrated internal resistance value range of the semiconductor refrigeration part;

[0188] The normal internal resistance value or the normal internal resistance value range of the semiconductor refrigeration unit at normal temperature;

[0189] The normal internal resistance value or the normal internal resistance value range of the semiconductor refrigeration unit at the target operating temperature;

[0190] The normal internal resistance value or the normal internal resistance value range obtained based on the historical data of the internal resistance value of the semiconductor refrigeration unit.

[0191] In some embodiments, the on-line monitoring method for the semiconductor refrigeration unit provided by the embodiments of the present application further includes the following steps:

[0192] Step S300, when it is confirmed that the semiconductor refrigeration unit has a variation, controlling the sample analyzer to give a fault prompt and / or stop.

[0193] Refer to Figure 10 As shown, in some embodiments, the above step S300 controls the sample analyzer to give a fault prompt and / or stop when it is confirmed that the semiconductor refrigeration unit has a variation, including at least one of the following steps:

[0194] Step S310, when it is confirmed that the semiconductor refrigeration unit has a variation and the internal resistance value meets the second preset condition, keeping the sample analyzer working normally and giving a fault prompt.

[0195] Step S320, when it is confirmed that the semiconductor refrigeration unit has a variation and the internal resistance value does not meet the second preset condition, stopping the operation of the sample analyzer and giving a fault prompt.

[0196] In some embodiments, the on-line monitoring method for the semiconductor refrigeration unit provided by the embodiments of the present application further includes the following steps:

[0197] Step S410, recording the currently obtained internal resistance value to generate historical data of the internal resistance value.

[0198] Step S420, or recording the internal resistance value that does not meet the first preset condition to generate historical data of the internal resistance value.

[0199] Refer to Figure 11 As shown, in some embodiments, after generating the historical data of the internal resistance value in the above step S410 or step S420, the following steps are further included:

[0200] Step S500, predicting the variation trend of the semiconductor refrigeration unit based on the historical data of the internal resistance value.

[0201] In some embodiments, the above step S100 obtains the internal resistance value of the semiconductor refrigeration unit through the detection component, including one of the following steps:

[0202] Step S110, obtaining the internal resistance value when the sample analyzer is powered on or within the first preset time after power-on.

[0203] Step S120: Obtain the internal resistance value after the time since the last shutdown of the sample analyzer exceeds a second preset time.

[0204] Step S130: Obtain the internal resistance value when the semiconductor refrigeration unit is at room temperature.

[0205] Step S140: Obtain the internal resistance value when the semiconductor refrigeration unit is at the target operating temperature.

[0206] In some embodiments, the present application also provides an on-line monitoring system for the semiconductor refrigeration unit of a sample analyzer, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements the on-line monitoring method for the semiconductor refrigeration unit of the sample analyzer in any of the above embodiments.

[0207] In several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling, direct coupling, or communication connection between each other can be through some interfaces, indirect coupling, or communication connection of devices or units, and can be in electrical, mechanical, or other forms.

[0208] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they can be located in one place, or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0209] In addition, each functional unit in various embodiments of the present application can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0210] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of various embodiments of this application. The foregoing storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROM for short), random access memories (RAM for short), magnetic disks, or optical discs.

[0211] It should also be understood that the various embodiments provided in the embodiments of this application can be combined arbitrarily to achieve different technical effects.

[0212] The above has specifically described the preferred embodiments of this application, but this application is not limited to the above embodiments. Those skilled in the art can also make various equivalent deformations or substitutions without violating the spirit of this application, and these equivalent deformations or substitutions are all included within the scope defined by the claims of this application.

Claims

1. A sample analyzer, characterized in that, it includes: a carrying component, including a bin for carrying quality control products and / or calibration products; a dispensing mechanism for sucking reagents or samples and discharging them into reaction cups; a reaction mechanism having at least one placement position for placing the reaction cups and incubating the reaction solution in the reaction cups, and the reaction solution is prepared from at least the sample and the reagent; a detection mechanism for detecting the incubated reaction solution to obtain a detection result, and the detection mechanism is also used to detect a mixture of the quality control product and / or the calibration product and the reagent in the reaction container to obtain a quality control and / or calibration result; a refrigeration device for refrigerating the bin to make the temperature of the bin reach the target working temperature, and the refrigeration device includes a semiconductor refrigeration part for refrigeration and a detection component for detecting the internal resistance value of the semiconductor refrigeration part, wherein the target working temperature is lower than zero degrees Celsius; a controller for obtaining the internal resistance value through the detection component and determining the variation state of the semiconductor refrigeration part according to the internal resistance value.

2. The sample analyzer according to claim 1, characterized in that, the controller is further configured to compare the internal resistance value with a first preset condition, and if the internal resistance value does not meet the first preset condition, it is confirmed that the semiconductor refrigeration part has a variation.

3. The sample analyzer according to claim 2, characterized in that, the first preset condition includes at least one of the following: the calibrated internal resistance value or calibrated internal resistance value range of the semiconductor refrigeration part; the normal internal resistance value or normal internal resistance value range of the semiconductor refrigeration part at room temperature; the normal internal resistance value or normal internal resistance value range of the semiconductor refrigeration part at the target working temperature; the normal internal resistance value or normal internal resistance value range obtained according to the historical data of the internal resistance value of the semiconductor refrigeration part.

4. The sample analyzer according to claim 2 or 3, characterized in that, the controller is further configured to give a fault prompt and / or control the sample analyzer to stop when it is confirmed that the semiconductor refrigeration part has a variation.

5. The sample analyzer according to claim 2 or 3, characterized in that, the controller is further configured to keep the sample analyzer working normally and give a fault prompt when it is confirmed that the semiconductor refrigeration part has a variation and the internal resistance value meets a second preset condition; or, the controller is further configured to stop the sample analyzer from working and give a fault prompt when it is confirmed that the semiconductor refrigeration part has a variation and the internal resistance value does not meet the second preset condition.

6. The sample analyzer according to claim 1 or 2, characterized in that, the controller is further configured to record the currently obtained internal resistance value to generate historical data of the internal resistance value to predict the variation trend of the internal resistance value of the semiconductor refrigeration part; or the controller is further configured to record the internal resistance value that does not meet the first preset condition to generate historical data of the internal resistance value to predict the variation trend of the internal resistance value of the semiconductor refrigeration part.

7. The sample analyzer according to claim 6, It is characterized in that the controller is further configured to keep the sample analyzer working properly and give a fault prompt when the mutation trend meets the third preset condition.

8. The sample analyzer according to claim 1, It is characterized in that the refrigeration device further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration part; the controller is further configured to control the driving module according to the internal resistance value to adjust the working electrical parameters output by the driving module.

9. The sample analyzer according to any one of claims 1 to 3, 6 to 8, It is characterized in that the controller obtains the internal resistance value when the sample analyzer is powered on or within the first preset time after being powered on; or, the controller obtains the internal resistance value after the time since the last shutdown of the sample analyzer exceeds the second preset time; or, the controller obtains the internal resistance value when the semiconductor refrigeration part is at room temperature; or, the controller obtains the internal resistance value when the semiconductor refrigeration part is at the target working temperature.

10. The sample analyzer according to claim 2, It is characterized in that the controller is further configured to obtain the initial internal resistance value of the semiconductor refrigeration part through the detection component when the semiconductor refrigeration part is used for the first time; if the initial internal resistance value meets the standard range of the semiconductor refrigeration part, the controller obtains the working internal resistance value of the semiconductor refrigeration part after the semiconductor refrigeration part reaches the target working temperature, and obtains the first preset condition according to the working internal resistance value.

11. The sample analyzer according to claim 1, It is characterized in that the refrigeration device further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration part, and the controller obtains the internal resistance value through the detection component before the driving module works or after controlling the driving module to stop working.

12. The sample analyzer according to claim 1 or 12, It is characterized in that the detection component includes an AC signal source and a signal detection module, the controller controls the AC signal source to send an AC detection signal to the semiconductor refrigeration part, obtains the feedback signal fed back by the semiconductor refrigeration part in response to the AC detection signal through the signal detection module, and obtains the internal resistance value according to the feedback signal.

13. The sample analyzer according to claim 1, It is characterized in that the refrigeration device further includes a driving module for outputting working electrical parameters to the semiconductor refrigeration part, the driving module includes a driving circuit and a feedback detection circuit, the controller controls the driving circuit to output the working electrical parameters to the semiconductor refrigeration part to make the semiconductor refrigeration part enter the refrigeration working state, the controller also controls the driving circuit to output a DC detection signal to the semiconductor refrigeration part, and obtains the detection parameters of the semiconductor refrigeration part through the feedback detection circuit, and obtains the internal resistance value according to the detection parameters.

14. The sample analyzer according to claim 13, It is characterized in that The controller controls the drive circuit to output DC detection signals with different electrical parameters to the semiconductor refrigeration unit, obtains a plurality of detection parameters corresponding to different DC detection signals through the feedback detection circuit, calculates the first internal resistance values corresponding to the respective detection parameters, and obtains the internal resistance value of the semiconductor refrigeration unit based on the respective first internal resistance values.

15. The sample analyzer according to claim 9 or 12, wherein, it further includes a temperature detection component for detecting the temperature of the semiconductor refrigeration unit and / or the temperature inside the chamber, and the controller is further configured to control the drive module to output working electrical parameters to the semiconductor refrigeration unit according to the temperature parameters detected by the temperature detection component.

16. The sample analyzer according to claim 1, wherein, the refrigeration device further includes a heat conduction part and a heat dissipation part, the semiconductor refrigeration unit cools the chamber through the heat conduction part, and discharges the heat in the chamber through the heat dissipation part.

17. A sample analyzer, wherein, it includes: a carrying component including a chamber for carrying quality control products and / or calibration products; a dispensing mechanism for aspirating reagents or samples and discharging them into reaction cups; a reaction mechanism having at least one placement position for placing the reaction cups and incubating the reaction liquid in the reaction cups, and the reaction liquid is prepared from at least the sample and the reagent; a detection mechanism for detecting the incubated reaction liquid to obtain a detection result, and the detection mechanism is further configured to detect a mixture containing the quality control product and / or the calibration product and the reagent in the reaction container to obtain a quality control and / or calibration result; a refrigeration device for cooling the chamber to make the temperature of the chamber reach a target working temperature, and the target working temperature is lower than zero degree Celsius; the refrigeration device includes a semiconductor refrigeration unit for refrigeration, a drive module for outputting working electrical parameters to the semiconductor refrigeration unit, and a detection component for detecting the internal resistance value of the semiconductor refrigeration unit; a controller for obtaining the internal resistance value through the detection component and controlling the drive module according to the internal resistance value to adjust the working electrical parameters output by the drive module.

18. An on-line monitoring method for a semiconductor refrigeration unit of a sample analyzer, the semiconductor refrigeration unit is used for refrigerating quality control products and / or calibration products of the sample analyzer, and the sample analyzer further includes a detection component for detecting the internal resistance value of the semiconductor refrigeration unit, and the control method includes: obtaining the internal resistance value of the semiconductor refrigeration unit through the detection component; determining the variation state of the semiconductor refrigeration unit according to the internal resistance value.

19. An on-line monitoring system for a semiconductor refrigeration unit of a sample analyzer, including a memory and a processor, the memory stores a computer program, and when the processor executes the computer program, it implements the on-line monitoring method for the semiconductor refrigeration unit according to claim 18 above.

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