A chip test socket that facilitates loading and unloading.

Abstract

This invention relates to the field of chip testing technology, and more particularly to a chip test socket that facilitates loading and unloading. The socket includes a base, a test socket body, a flip cover, and a multimeter. The test socket body is mounted on top of the base, and the flip cover is hinged to the top of the test socket body. A torsion spring connects the flip cover and the test socket body. The multimeter is mounted on top of the test socket body and is electrically connected to it. This invention uses a motorized suction cup to move downwards, placing the chip onto the test socket body for automatic loading. The test socket body can then test the chip. The motorized suction cup can move upwards, removing the chip from the test socket body for automatic unloading. Repeated operation allows for automatic and continuous chip testing, thereby improving overall testing efficiency and facilitating large-scale production.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a chip testing socket that facilitates loading and unloading. Background Technology

[0002] In modern semiconductor manufacturing, it is crucial to ensure that every test semiconductor chip (integrated circuit) meets the specifications. To screen out defective products, improve product quality, and verify the functionality and performance of chips, the industry typically uses flip-top chip test sockets for testing.

[0003] The basic principle of a flip-type chip test socket is as follows: Open the flip cover of the test socket, place the chip under test inside, and then make electrical connections through internal contacts or spring pins corresponding to the chip pins. Subsequently, close the flip cover and press down on the chip to ensure good contact. Finally, analyze the chip's various performance indicators, such as electrical characteristics, reliability, and stability, through externally connected test instruments.

[0004] Each test requires staff to use tweezers to remove the chip from the chip tray and carefully place it into the test socket. After the test is completed, the chip is manually retrieved. The whole process is time-consuming and repetitive, lacks automation, and cannot achieve continuous and batch chip testing. This greatly affects the overall testing efficiency, limits the speed of the production line, and is not conducive to large-scale production and quality control. Summary of the Invention

[0005] To overcome the shortcomings of current test sockets, which lack automation and cannot achieve continuous, batch chip testing, greatly affecting overall testing efficiency, limiting production line speed, and hindering large-scale production and quality control, the technical problem to be solved is to provide a chip test socket that facilitates loading and unloading.

[0006] The technical solution is as follows: A chip test socket for easy loading and unloading includes a base, a test socket body, a flip cover, a multimeter, an indicator light, a stepper motor, a mounting bracket, a hexagonal rod, a hexagonal sleeve, a rotating plate, an electric suction cup, and a conveying mechanism. The test socket body is mounted on the top of the base, and the flip cover is hinged to the top of the test socket body. A torsion spring connects the flip cover and the test socket body. The multimeter is mounted on the top of the test socket body and is electrically connected to the test socket body. An indicator light is mounted on the multimeter and is electrically connected to the multimeter. The stepper motor is mounted on the top of the test socket body, and the mounting bracket is connected to the top of the test socket body. A hexagonal rod is rotatably connected to the mounting bracket, and the lower end of the hexagonal rod is connected to the output shaft of the stepper motor. A hexagonal sleeve is slidably connected to the hexagonal rod, and a rotating plate is connected to the hexagonal sleeve. An electric suction cup is mounted on the rotating plate. The base is provided with a conveying mechanism for conveying the chip to the area below the electric suction cup.

[0007] As a further preferred embodiment, the conveying mechanism includes a vertical guide rod, a sliding plate, a first spring, a contact plate, an L-shaped frame, a first slider, a lead screw motor, a push block, a conveying wheel, a dual-axis motor, a disc, and a connecting rod. The vertical guide rod is connected to the top of the mounting frame, and a sliding plate is slidably connected to the vertical guide rod. The sliding plate and a hexagonal sleeve are rotatably connected. A first spring connects the mounting frame and the sliding plate. A contact plate is connected to the sliding plate. An L-shaped frame is connected to the top of the base, and a first slider is slidably connected within the L-shaped frame. A lead screw motor is mounted on the L-shaped frame, and the lead screw of the lead screw motor is slidably connected to the first slider. A push block is connected to the first slider. The top of the base is rotatably connected to... There are six conveyor wheels, divided into two groups of three. The two groups of conveyor wheels are arranged in a front-to-back configuration and are driven by gears. The conveyor wheels are used to transport the chip tray to the right, delivering the chip to the area below the electric suction cup. The pusher block is used to push the contact plate downwards, which in turn drives the electric suction cup downwards. The electric suction cup contacts and holds the chip as it moves downwards. A dual-axis motor is installed inside the base. The output shaft above the dual-axis motor is connected to the lower end of the conveyor wheels. A disc is connected to the lower end of the conveyor wheels and the output shaft below the dual-axis motor. The discs on the three conveyor wheels in the same group are connected to a connecting rod that rotates together.

[0008] As a further preferred embodiment, a collection frame is also included, with a collection frame for collecting defective chips placed on top of the base.

[0009] As a further preferred embodiment, a pressing mechanism is also included. The pressing mechanism includes a horizontal guide rod, a second slider, a second spring, a pressure plate, a moving plate, a contact shaft, and a push plate. The horizontal guide rod is connected to the L-shaped frame, and the second slider is slidably connected to the L-shaped frame. The second slider and the horizontal guide rod are slidably connected. The top of the second slider passes through the top of the L-shaped frame. A second spring is connected between the L-shaped frame and the second slider. A pressure plate is connected to the second slider. A moving plate is bolted to the top of the second slider. A contact shaft is connected to the top of the moving plate. A push plate is connected to the top of the push block. The push plate is used to push the contact shaft forward. The contact shaft drives the pressure plate forward. The pressure plate pushes the flip cover to rotate downward, so that the flip cover presses the chip on the test socket body.

[0010] As a further preferred embodiment, it also includes a U-shaped rod. The U-shaped rod is connected to the pressure plate. As the U-shaped rod moves forward, it contacts the switch of the test base body and presses the switch of the test base body to open the test base body.

[0011] As a further preferred embodiment, it also includes a mounting plate, a vision sensor, and a controller. The mounting plate is connected to the top of the base, and the vision sensor and controller are mounted on the mounting plate. The vision sensor faces the multimeter, and the controller and vision sensor are electrically connected.

[0012] As a further preferred embodiment, it also includes a first limiting plate and a second limiting plate, with the first limiting plate and the second limiting plate connected to the top of the base. The first limiting plate and the second limiting plate are used to limit the chip tray.

[0013] As a further preferred embodiment, it also includes pressure rollers, with the top of the base rotatably connected to the pressure rollers for pressing down the chip tray.

[0014] The beneficial effects are as follows: 1. The present invention can place the chip on the test stand body by moving the electric suction cup downward, and automatically load the chip. The test stand body can test the chip. The electric suction cup can pick up the chip from the test stand body by moving the electric suction cup upward, and automatically unload the chip. Repeated operation can automatically and continuously test the chip, thereby improving the overall testing efficiency and facilitating large-scale production.

[0015] 2. The pressure plate can push the flip cover downward to press the chip on the test socket body, and the automatic pressing of the flip cover can reduce manual intervention and further improve testing efficiency. Attached Figure Description

[0016] Figure 1 A three-dimensional structural schematic diagram of the present invention is shown.

[0017] Figure 2 A three-dimensional structural schematic diagram of the stepper motor, mounting bracket, rotating plate, and electric suction cup of the present invention is shown.

[0018] Figure 3 A three-dimensional structural schematic diagram of the hexagonal rod and hexagonal sleeve of the present invention is shown.

[0019] Figure 4 A three-dimensional structural schematic diagram of the conveying mechanism of the present invention is shown.

[0020] Figure 5 A three-dimensional structural schematic diagram of the vertical guide rod, sliding plate, first spring, and contact plate of the present invention is shown.

[0021] Figure 6 A cross-sectional view of the L-shaped frame of the present invention is shown.

[0022] Figure 7 A three-dimensional structural schematic diagram of the dual-axis motor, disk, and connecting rod of the present invention is shown.

[0023] Figure 8 A three-dimensional structural schematic diagram of the conveyor wheel, dual-axis motor, disc, and connecting rod of the present invention is shown.

[0024] Figure 9 A three-dimensional structural schematic diagram of the first type of pressing mechanism of the present invention is shown.

[0025] Figure 10A schematic diagram of a second three-dimensional structure of the pressing mechanism of the present invention is shown.

[0026] Figure 11 A three-dimensional structural schematic diagram of the mounting plate, vision sensor, and controller of the present invention is shown.

[0027] Figure 12 A three-dimensional structural schematic diagram of the first limiting plate, the second limiting plate, and the pressure roller of the present invention is shown.

[0028] The components are: 1. Base, 2. Test base body, 3. Flip cover, 4. Multimeter, 5. Indicator light, 6. Stepper motor, 7. Mounting bracket, 8. Hexagonal rod, 9. Hexagonal sleeve, 10. Rotating plate, 11. Electric suction cup, 121. Vertical guide rod, 122. Slide plate, 123. First spring, 124. Contact plate, 125. L-shaped frame, 126. First slider, 127. Lead screw motor, 128. Push block, 129. Conveyor wheel. 1210_Dual-axis motor, 1211_Disc, 1212_Connecting rod, 13_Collection frame, 141_Horizontal guide rod, 142_Second slider, 143_Second spring, 144_Pressure plate, 145_Moving plate, 146_Contact shaft, 147_Push plate, 15_U-shaped rod, 161_Mounting plate, 162_Vision sensor, 163_Controller, 171_First limit plate, 172_Second limit plate, 18_Pressure roller. Detailed Implementation

[0029] The preferred technical solution of the present invention will be described in detail below with reference to the accompanying drawings.

[0030] Reference Figures 1-8 A chip test socket for easy loading and unloading includes a base 1, a test socket body 2, a flip cover 3, a multimeter 4, an indicator light 5, a stepper motor 6, a mounting bracket 7, a hexagonal rod 8, a hexagonal sleeve 9, a rotating plate 10, an electric suction cup 11, and a conveying mechanism. The test socket body 2 is bolted to the top rear side of the base 1. The flip cover 3 is hinged to the top center of the test socket body 2. A torsion spring connects the flip cover 3 and the test socket body 2. The multimeter 4 is bolted to the top rear side of the test socket body 2 and is electrically connected to the test socket body 2. The test base 2 is equipped with an indicator light 5, which is electrically connected to a multimeter 4. A stepper motor 6 is bolted to the top front side of the test base 2. A mounting bracket 7 is bolted to the top front side of the test base 2. A hexagonal rod 8 is rotatably connected to the middle of the mounting bracket 7. The lower end of the hexagonal rod 8 is connected to the output shaft of the stepper motor 6. A hexagonal sleeve 9 is slidably connected to the hexagonal rod 8. A rotating plate 10 is connected to the upper part of the hexagonal sleeve 9. An electric suction cup 11 is installed on the front side of the rotating plate 10. The base 1 is equipped with a conveying mechanism for conveying the chip to the area below the electric suction cup 11.

[0031] Reference Figures 4-8The conveying mechanism includes vertical guide rods 121, a sliding plate 122, a first spring 123, a contact plate 124, an L-shaped frame 125, a first slider 126, a lead screw motor 127, a push block 128, a conveying wheel 129, a dual-axis motor 1210, a disc 1211, and a connecting rod 1212. Two vertical guide rods 121 are connected to the top front side of the mounting frame 7. The rotating plate 10 has openings at positions corresponding to the two vertical guide rods 121. When the rotating plate 10 moves downwards, the two vertical guide rods 121... 1. It will pass through the opening on the rotating plate 10 to avoid collision between the rotating plate 10 and the two vertical guide rods 121. The two vertical guide rods 121 are slidably connected to the slide plate 122. The slide plate 122 and the hexagonal sleeve 9 are rotatably connected. The hexagonal rod 8 is fitted with a first spring 123. The two ends of the first spring 123 are respectively connected to the mounting bracket 7 and the slide plate 122. The first spring 123 is fitted on the hexagonal rod 8 to prevent the first spring 123 from bending. The front side of the slide plate 122 is connected to the contact plate 12 by bolts. 4. An L-shaped frame 125 is bolted to the top of the base 1. A first slider 126 is slidably connected to the front side of the L-shaped frame 125. A lead screw motor 127 is mounted on the front side of the L-shaped frame 125. The lead screw of the lead screw motor 127 is slidably connected to the first slider 126. A push block 128 is connected to the rear side of the first slider 126. The left side of the push block 128 is inclined. Six conveyor wheels 129 are rotatably connected to the front top of the base 1. The six conveyor wheels 129 are arranged in a rectangular array, with every three conveyor wheels 129 forming a rectangular array. The system consists of two groups of conveyor wheels 129 arranged in a front-to-back configuration. The two front-to-back conveyor wheels 129 are driven by gears. A dual-axis motor 1210 is bolted to the top front side of the base 1. The output shaft of the dual-axis motor 1210 is connected to the lower end of the conveyor wheel 129. A disc 1211 is connected to the lower end of the conveyor wheel 129 and the output shaft below the dual-axis motor 1210. The bottom of the discs 1211 on the three conveyor wheels 129 in the same group is connected to a connecting rod 1212 for rotation.

[0032] Reference Figure 1 and Figure 2 It also includes a collection box 13, which is placed on the top left side of the base 1.

[0033] Reference Figure 9 and Figure 10It also includes a pressing mechanism, which includes a horizontal guide rod 141, a second slider 142, a second spring 143, a pressure plate 144, a moving plate 145, a contact shaft 146, and a push plate 147. The horizontal guide rod 141 is connected to the right side of the L-shaped frame 125, and the second slider 142 is slidably connected to the right side of the L-shaped frame 125. The second slider 142 and the horizontal guide rod 141 are slidably connected, and the top of the second slider 142 passes through the top of the L-shaped frame 125. A spring is sleeved on the horizontal guide rod 141. The second spring 143 is connected at both ends to the L-shaped frame 125 and the second slider 142 respectively. The second spring 143 is sleeved on the horizontal guide rod 141 to prevent the second spring 143 from bending. The left side of the second slider 142 is connected to the pressure plate 144. The top of the second slider 142 is connected to the moving plate 145 by bolts. The front side of the top of the moving plate 145 is connected to the contact shaft 146. The top of the push block 128 is connected to the push plate 147 by bolts. The right side of the push plate 147 is an inclined surface.

[0034] Reference Figure 9 It also includes a U-shaped rod 15. The U-shaped rod 15 is connected to the front right side of the pressure plate 144. The U-shaped rod 15 will contact the switch of the test base body 2 during the forward movement.

[0035] The operator places the chip tray containing the chips between two sets of conveyor rollers 129, then starts the dual-axis motor 1210. The output shaft above the dual-axis motor 1210 drives the conveyor rollers 129 to rotate, and the output shaft below the dual-axis motor 1210 drives the disc 1211 to rotate. The disc 1211 drives the conveyor rollers 129 to rotate via the connecting rod 1212. The two opposing conveyor rollers 129 are driven by gears, enabling all conveyor rollers 129 to rotate synchronously. The conveyor rollers 129 convey the chip tray to the right, transporting the chips to below the electric suction cup 11. Then, the operator controls the lead screw motor 127 to move the first slider 126 to the left. The first slider 126 drives the push block 128 to the left, and the inclined surface on the push block 128 will contact the contact plate 124. The contact plate 124 is pushed downwards, causing the sliding plate 122 to move downwards. The first spring 123 is compressed, and the sliding plate 122 causes the hexagonal sleeve 9 and the rotating plate 10 to move downwards. The rotating plate 10 causes the electric suction cup 11 to move downwards. The electric suction cup 11 moves downwards and contacts the chip, holding it in place. Then, the control screw motor 127 drives the first slider 126 and the push block 128 to move to the right. The push block 128 no longer pushes the contact plate 124. Under the action of the first spring 123, the sliding plate 122 moves upwards, causing the hexagonal sleeve 9 and the rotating plate 10 to move upwards. The rotating plate 10 causes the electric suction cup 11 to move upwards, sucking the chip out of the chip tray. At this time, the output shaft of the control stepper motor 6 rotates. The output shaft of stepper motor 6 rotates the hexagonal rod 8 180 degrees, which in turn rotates the hexagonal sleeve 9 and rotating plate 10 180 degrees. The rotating plate 10 then rotates the electric suction cup 11 180 degrees, which in turn rotates the chip 180 degrees, positioning it above the test base body 2. Next, the lead screw motor 127 moves the first slider 126 and push block 128 to the left. Push block 128 pushes the contact plate 124 downwards, which in turn moves the electric suction cup 11 downwards, placing the chip onto the test base body 2 for automatic loading. Then, the lead screw motor 127 moves the first slider 126 and push block 128 to the right, and push block 128 stops pushing the contact plate 124. The first spring 123... Under the action of [unclear], the electric suction cup 11 moves upward, removing the electric suction cup 11 to prevent the flip cover 3 from colliding with it. At this time, the push block 128 is still moving to the right, which will drive the push plate 147 to move to the right. The inclined surface on the push plate 147 will contact the contact shaft 146 and push the contact shaft 146 forward. The contact shaft 146 will drive the moving plate 145 to move forward, and the moving plate 145 will drive the second slider 142 to move forward. The second spring 143 is compressed, and the second slider 142 will drive the pressure plate 144 and the U-shaped rod 15 to move forward. The pressure plate 144 will push the flip cover 3 to rotate downward, so that the flip cover 3 presses the chip on the test base body 2. The torsion spring deforms, and then the U-shaped rod 15 will contact the switch of the test base body 2.Press the switch on the test socket body 2 to open it and test the chip. The chip's data will be displayed on the multimeter 4. If the chip is qualified, indicator light 5 will show as faulty; otherwise, if the chip is unqualified, indicator light 5 will light up. The operator can determine whether the chip is qualified by using indicator light 5. After the test is completed, control the lead screw motor 127 to drive the first slider 126 and push block 128 to move to the left. Push block 128 drives push plate 147 to move to the left. Push plate 147 no longer pushes contact shaft 146. Under the action of the second spring 143, the second slider 142 moves backward. The second slider 142 drives pressure plate 144 and U-shaped rod 15 to move backward. Pressure plate 144 no longer pushes flip cover 3. Under the action of torsion spring, flip cover 3 rotates upward to reset. Then, U-shaped rod 15 presses the switch on the test socket body 2 again to close the test socket body 2. At this time, push block 128 is still moving to the left. Push block 128 will push electric suction cup 11 towards The electric suction cup 11 moves downwards and contacts the chip on the test holder body 2, holding the chip in place. Then, the lead screw motor 127 drives the first slider 126 and push block 128 to move to the right. The push block 128 stops pushing the electric suction cup 11, and the electric suction cup 11 moves upwards, picking up the chip from the test holder body 2 for automatic unloading. If the chip is qualified, the output shaft of the stepper motor 6 is rotated 180 degrees to rotate the tested chip to the top of the chip tray and place it back into the chip tray. Conversely, if the chip is unqualified, the output shaft of the stepper motor 6 is rotated 90 degrees to rotate the tested chip to the top of the collection frame 13 and place it into the collection frame 13 for collection and subsequent centralized processing. This operation can be repeated to continue testing the chips. Automatic and continuous chip testing improves overall testing efficiency and is beneficial for large-scale production.

[0036] Reference Figure 11 It also includes a mounting plate 161, a vision sensor 162, and a controller 163. The mounting plate 161 is bolted to the front top of the base 1. The vision sensor 162 is bolted to the upper rear side of the mounting plate 161. The vision sensor 162 faces the multimeter 4. The controller 163 is bolted to the upper front side of the mounting plate 161. The controller 163 and the vision sensor 162 are electrically connected. The vision sensor 162 can capture the data displayed on the multimeter 4 and record the data in the controller 163 for subsequent statistical analysis of the chip's pass rate.

[0037] Reference Figure 12It also includes a first limiting plate 171 and a second limiting plate 172. The top front side of the base 1 is connected to two first limiting plates 171 and two second limiting plates 172. The two first limiting plates 171 are arranged opposite each other from left to right, and the two second limiting plates 172 are arranged opposite each other from left to right. The first limiting plate 171 is located in front of the second limiting plate 172. The first limiting plate 171 and the second limiting plate 172 can limit the chip tray and prevent the chip tray from shifting position.

[0038] Reference Figure 12 It also includes pressure rollers 18. Four pressure rollers 18 are evenly spaced and rotatably connected to the top front side of the base 1. The pressure rollers 18 can press down the chip tray to prevent the chip tray from tilting upward and ensure that the chip tray can always keep in contact with the conveyor rollers 129.

[0039] The above description is merely an embodiment of the present invention and is not intended to limit the present invention. All equivalent substitutions made within the principles of the present invention should be included within the scope of protection of the present invention. Contents not described in detail in this invention are existing technologies known to those skilled in the art.

Claims

1. A chip test socket for easy loading and unloading, comprising a base (1), a test socket body (2), a flip cover (3), a multimeter (4), and an indicator light (5), wherein the test socket body (2) is mounted on the top of the base (1), the flip cover (3) is hinged to the top of the test socket body (2), a torsion spring connects the flip cover (3) and the test socket body (2), the multimeter (4) is mounted on the top of the test socket body (2), the multimeter (4) is electrically connected to the test socket body (2), and an indicator light (5) is mounted on the multimeter (4), the indicator light (5) is electrically connected to the multimeter (4), characterized in that: It also includes a stepper motor (6), a mounting bracket (7), a hexagonal rod (8), a hexagonal sleeve (9), a rotating plate (10), an electric suction cup (11), and a conveying mechanism. The test base body (2) is equipped with a stepper motor (6) on top, and the test base body (2) is connected to a mounting bracket (7). The mounting bracket (7) is rotatably connected to a hexagonal rod (8). The lower end of the hexagonal rod (8) is connected to the output shaft of the stepper motor (6). The hexagonal sleeve (9) is slidably connected to the hexagonal rod (8). The rotating plate (10) is connected to the hexagonal sleeve (9). The electric suction cup (11) is installed on the rotating plate (10). The base (1) is provided with a conveying mechanism for conveying the chip to the electric suction cup (11). The conveying mechanism includes a vertical guide rod (121), a sliding plate (122), a first spring (123), a contact plate (124), an L-shaped frame (125), a first slider (126), a lead screw motor (127), a push block (128), a conveying wheel (129), a dual-axis motor (1210), a disc (1211), and a connecting rod (1212). The top of the mounting frame (7) is connected to the vertical guide rod (121), and the sliding plate (122) is slidably connected to the vertical guide rod (121). 22) and the hexagonal sleeve (9) are rotatably connected. A first spring (123) is connected between the mounting bracket (7) and the slide plate (122). A contact plate (124) is connected to the slide plate (122). An L-shaped frame (125) is connected to the top of the base (1). A first slider (126) is slidably connected inside the L-shaped frame (125). A lead screw motor (127) is installed on the L-shaped frame (125). The lead screw of the lead screw motor (127) and the first slider (126) are slidably connected. The first slider (126) A push block (128) is connected to the top, and six conveyor wheels (129) are rotatably connected to the top of the base (1). There are two groups of three conveyor wheels (129). The two groups of conveyor wheels (129) are arranged in a front-to-back manner. The two front-to-back conveyor wheels (129) are driven by gears. The conveyor wheels (129) are used to convey the chip tray to the right and transport the chip to the underside of the electric suction cup (11). The push block (128) is used to push the contact plate (124) to move downward. The contact plate (124) drives the electric suction cup (11). The suction cup (11) moves downward. The electric suction cup (11) will contact the chip and hold the chip. A dual-axis motor (1210) is installed in the base (1). The output shaft above the dual-axis motor (1210) is connected to the lower end of the conveyor wheel (129). A disc (1211) is connected to the lower end of the conveyor wheel (129) and the output shaft below the dual-axis motor (1210). The bottom of the discs (1211) on the three conveyor wheels (129) in the same group is connected to the connecting rod (1212) for rotation.

2. The chip testing socket for easy loading and unloading as described in claim 1, characterized in that: It also includes a collection box (13), with a collection box (13) placed on top of the base (1) for collecting defective chips.

3. A chip testing socket for easy loading and unloading as described in claim 2, characterized in that: It also includes a pressing mechanism, which includes a horizontal guide rod (141), a second slider (142), a second spring (143), a pressure plate (144), a moving plate (145), a contact shaft (146), and a push plate (147). The horizontal guide rod (141) is connected inside the L-shaped frame (125), and the second slider (142) is slidably connected inside the L-shaped frame (125). The second slider (142) and the horizontal guide rod (141) are slidably connected. The top of the second slider (142) passes through the top of the L-shaped frame (125). The L-shaped frame (125) and the second slider (147) are connected. 2) A second spring (143) is connected between them. A pressure plate (144) is connected to the second slider (142). A moving plate (145) is connected to the top of the second slider (142) by bolts. A contact shaft (146) is connected to the top of the moving plate (145). A push plate (147) is connected to the top of the push block (128). The push plate (147) is used to push the contact shaft (146) to move forward. The contact shaft (146) drives the pressure plate (144) to move forward. The pressure plate (144) will push the flip cover (3) to rotate downward, so that the flip cover (3) presses the chip on the test base body (2).

4. A chip testing socket for easy loading and unloading as described in claim 3, characterized in that: It also includes a U-shaped rod (15), which is connected to the pressure plate (144). When the U-shaped rod (15) moves forward, it will contact the switch of the test base body (2) and press the switch of the test base body (2) to open the test base body (2).

5. A chip testing socket for easy loading and unloading as described in claim 4, characterized in that: It also includes a mounting plate (161), a vision sensor (162) and a controller (163). The mounting plate (161) is connected to the top of the base (1). The vision sensor (162) and the controller (163) are mounted on the mounting plate (161). The vision sensor (162) faces the multimeter (4). The controller (163) and the vision sensor (162) are electrically connected.

6. A chip testing socket for easy loading and unloading as described in claim 5, characterized in that: It also includes a first limiting plate (171) and a second limiting plate (172). The first limiting plate (171) and the second limiting plate (172) are connected to the top of the base (1). The first limiting plate (171) and the second limiting plate (172) are used to limit the chip tray.

7. A chip testing socket for easy loading and unloading as described in claim 6, characterized in that: It also includes a pressure roller (18), and the top of the base (1) is rotatably connected to the pressure roller (18) for pressing the chip tray.

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