Data line production performance test system and test method

Abstract

The invention discloses a data line production performance testing system and a testing method, relates to the technical field of data line production performance testing, and solves the problems of rapid data emergency processing and abnormal reason troubleshooting when data line contacts are abnormal. And then an emergency fault processing mechanism is started, and the problem of loss in the data transmission process caused by contact abnormity is timely controlled. Meanwhile, the same data transmission is carried out on the abnormal contacts and the normal contacts, waveform signals are obtained through an oscilloscope, and through CEEMDAN decomposition, I MF classification weighted summation and energy threshold value judgment, the reasons for the abnormal contacts can be quickly found, so that effective measures can be taken.

Description

Technical Field

[0001] The present invention relates to the technical field of data cable production performance testing, and specifically to a data cable production performance testing system and a testing method. Background Art

[0002] In the current era of highly popular electronic devices, the data cable, as a key bridge for data exchange and power transmission between different electronic devices, its performance directly affects the normal operation of the devices and the user experience. Especially the contacts of the data cable, as the core parts for signal transmission and current conduction, it is crucial to accurately control their performance.

[0003] The traditional testing means for data cable contacts have far been unable to meet the current requirements. Most conventional tests only focus on whether the contacts are basically conducting or not. Such a rough detection method is difficult to detect the deep - level performance hidden dangers of the contacts. Under actual working conditions, due to factors such as frequent plugging and unplugging, environmental temperature and humidity fluctuations, and current thermal effects, the possibility of contact damage becomes greater. When an abnormal situation occurs in a certain contact, if no effective emergency measures are taken, a large amount of data in transmission may be lost, and more seriously, the entire contact component may be damaged. In addition, the reason for the abnormal contact should be found in time so that maintenance and data transmission can be carried out in time. Summary of the Invention

[0004] In view of the deficiencies of the prior art, the present invention provides a data cable production performance testing system and a testing method, which solve the problems of timely data emergency handling when an abnormality occurs in the data cable contacts and quickly troubleshooting the cause of the abnormality.

[0005] To achieve the above - mentioned purposes, the present invention is realized through the following technical solutions: A data cable production performance testing system includes:

[0006] A data transmission testing module, which is used to separately send a data volume Dj to each contact j of the data cable, record the time Tj used at the end of each transmission, calculate the transmission rate of each contact according to the formula Rj = D / Tj, and transmit Rj to the task assignment and adjustment module;

[0007] A task assignment and adjustment module, which compares Rj with a preset threshold Rth and Rmin, finds out the abnormal contacts, triggers an emergency fault handling mechanism, and transmits the abnormal contacts to the comparison contact collection module;

[0008] A comparison contact collection module, after initially determining that a contact is abnormal, calculates the similarity S(j, kt) of the characteristic attributes between the abnormal contact j and the normal contacts kt (t = 1, 2,..., g). If S(j, kt)>nbd, the normal contact kt is added to the comparison contact set Q, and the comparison contact set Q is transmitted to the abnormal cause analysis module;

[0009] The abnormal cause analysis module performs the same data transmission on the abnormal contact j and the comparison contact set Q respectively, obtains waveform signals using an oscilloscope, and determines the cause of the abnormality of contact j by taking the difference between the waveform signal of the abnormal contact j and the average waveform signal of the comparison contact set Q.

[0010] As a further solution of the present invention, the data transmission test module further includes:

[0011] A high-precision timing unit that accurately records the time Tj from when the data is sent to the contact until the transmission ends, with a timing accuracy at the nanosecond level, ensuring the accuracy of the transmission rate calculation;

[0012] A data volume control unit that accurately controls the data volume Dj sent to each contact, ensuring that the data volume sent each time is stable and without deviation;

[0013] A threshold storage unit that stores the preset transmission rate thresholds Rth and Rmin.

[0014] As a further solution of the present invention, if Rj < Rth, it is preliminarily determined that the contact is abnormal, and an emergency fault handling mechanism is triggered.

[0015] As a further solution of the present invention, the emergency fault handling mechanism specifically includes:

[0016] If Rj < Rmin, immediately stop the data transmission task of this contact, and evenly distribute the transmission task originally assigned to this contact to other normally working contacts;

[0017] If Rmin < Rj < Rth, perform a data retransmission operation on this contact, record the transmission rate after retransmission as Rj’, if Rj’ < Rmin, stop the data transmission task of this contact, and reassign its data transmission task;

[0018] If Rj’ >= Rth, adaptively adjust the data transmission volume of this contact according to Rj’.

[0019] As a further solution of the present invention, the data transmission volume of the abnormal contact is adaptively adjusted according to the formula Dj’ = Dj * (1 - (|Rj’ - Rarg| / r * σ)), where Rarg and σ represent the average value and standard deviation of the transmission rates of normal contacts, and r is an adjustment factor.

[0020] As a further solution of the present invention, the specific steps for obtaining the comparison contact set Q include:

[0021] Denote the characteristic attribute vectors of the abnormal contact j and the normal contacts kt (t ∈ [1, g]) as Aj and Bkt;

[0022] Calculate the similarity of characteristic attributes between Aj and Bkt according to the formula S(j, kt) = (Aj * Bkt) / (|Aj| * |Bkt|);

[0023] If S(j, kt) > nbd, add the normal contact kt to the comparison contact set Q;

[0024] Among them, the characteristic attributes in the characteristic attribute vector include the number of historical abnormal times of the contact, the historical maintenance time, the historical maintenance cost, and the total duration from the first use to the present, and the characteristic attribute values have been normalized.

[0025] As a further solution of the present invention, the specific method for processing the waveform signals of the abnormal contact j and the comparison contact set Q is as follows:

[0026] Perform the same data transmission on the abnormal contact j and the comparison contact set Q respectively, and the waveform signals obtained by the oscilloscope are Pj and P Qh (h ∈ [1, f]), where f is the number of contacts in the comparison contact set Q;

[0027] According to the formula Obtain the average waveform signal of Q;

[0028] According to the formula Obtain the absolute difference waveform signal;

[0029] Perform CEEMDAN decomposition on the absolute difference waveform signal P dis Divide IM Fq (q ∈ [1, w]) into high, medium, and low categories and sum them to obtain IM Fh, IM Fm, and IM Fl, where w is the number of decomposed IM Fs;

[0030] Calculate the energies of IM Fh, IM Fm, and IM Fl.

[0031] As a further solution of the present invention, the specific steps for dividing IM Fq into high, medium, and low categories include:

[0032] Perform Fourier transform on IM Fq respectively and calculate the spectral mean and variance as Meanq and Varq;

[0033] If Meanq > Thmax and Varq < Th1, classify IM Fq as high frequency;

[0034] If Thmin < Meanq < Thmax and Varq < Th1, classify IM Fq as medium frequency;

[0035] If Meanq < Thmin and Varq > Th1, classify IM Fq as low frequency;

[0036] Among them, Thmin and Thmax are the minimum and maximum thresholds of the spectral mean, and Th1 is the spectral variance threshold.

[0037] As a further solution of the present invention, the specific method for judging the cause of contact abnormality according to the energies of IMFh, IMFm, and IMFl is as follows:

[0038] Let the set of high-frequency IMFs be {IMFh1, IMFh2,..., IMFha}, the set of medium-frequency IMFs be {IMFm1, IMFm2,..., IMFmb}, and the set of low-frequency IMFs be {IMFl1, IMFl2,..., IMFlc}, where a + b + c = q;

[0039] Sum them up for the high, medium, and low categories respectively to obtain

[0040] According to the formula Calculate the energies of IMFh, IMFm, and IMFl to be E H 、E M 、E L ;

[0041] If E H > E1, E M < E2, E L < E3, it indicates that the microstructures inside the abnormal contact are damaged or loose. If E H < E1, E M > E2, E L < E3, it indicates that there is electromagnetic interference around the abnormal contact. If E H < E1, E M < E2, E L > E3, it indicates that the abnormal contact is oxidized or contaminated, where E1, E2, and E3 are energy thresholds.

[0042] A method for testing the production performance of a data cable, the production test method includes:

[0043] S1. Send the data volume Dj to each contact j of the data cable and record the transmission time Tj, calculate the transmission rate Rj, and compare Rj with Rth to judge whether the contact is abnormal;

[0044] S2. If the contact is abnormal, according to the relationship between Rj and Rmin, perform corresponding task assignment adjustment operations through the emergency fault handling mechanism, including stopping tasks, reassigning tasks, and adaptively adjusting the output transmission volume;

[0045] S3. Calculate the similarity of the characteristic attributes of the abnormal contact and the normal contact, and add the normal contact with a high similarity of characteristic attributes to the comparison contact set Q;

[0046] S4. Perform the same data transmission on the abnormal contact and the comparison contact set Q, obtain their respective corresponding waveform signals through an oscilloscope, calculate the absolute difference between the abnormal contact waveform signal and the average waveform signal of the comparison contact set to obtain the absolute difference waveform signal, perform CEEMDAN decomposition on the absolute difference waveform signal, divide the IMF into three categories: high, medium, and low, and sum them up. Determine whether the cause of the abnormality belongs to external environmental reasons, internal physical damage, or surrounding electromagnetic interference based on their energy magnitudes.

[0047] The present invention provides a data line production performance test system and a test method, which have the following beneficial effects compared with the prior art:

[0048] (1) By performing the same data transmission on each contact of the data line, the present invention initially determines the abnormal contact according to the transmission rate. When an abnormal contact is found, an emergency fault handling mechanism is triggered, and it is determined whether to stop transmitting data on this contact or adaptively adjust the amount of data transmitted on this contact according to the current transmission rate. This method effectively reduces the data loss problem caused during the data transmission of the abnormal contact. At the same time, it avoids further damage to the abnormal contact;

[0049] (2) The present invention performs the same data transmission on the abnormal contact and the comparison contact set Q, obtains their respective corresponding waveform signals through an oscilloscope, calculates the absolute difference waveform signal between the abnormal contact waveform signal and the average waveform signal of the comparison contact set Q, performs CEEMDAN decomposition on the absolute difference waveform signal, divides the IMF into high, medium, and low, sums them up, and calculates the energy of these three parts to accurately trace the cause of the contact abnormality. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] Figure 1 is the system principle block diagram of the present invention;

[0051] Figure 2 is the step flow chart of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0053] For example Figure 1 , the present application provides a data line production performance test system, including:

[0054] The data transmission test module is customized for each contact j of the data cable. It can accurately control the transmission of the data volume Dj, and precisely record the transmission time Tj with a high-precision timing unit. Then, it accurately calculates the transmission rate Rj according to the formula Rj = Dj / Tj, and then transmits it to the task allocation and adjustment module, where:

[0055] The high-precision timing unit can adopt atomic clock timing technology, and its timing accuracy can reach the nanosecond level. For example, the atomic clock developed by the National Institute of Standards and Technology in the United States has an error of no more than one second in decades, providing extremely high precision for the measurement of data transmission time. In the data cable test, it can accurately capture every time node of the data from the source end to the contact and back, ensuring the accuracy of the transmission rate calculation and avoiding misjudgment of the transmission performance due to timing deviation;

[0056] The data volume control unit, through a high-precision digital-to-analog conversion chip and a stable signal modulation circuit, can flexibly set the value of Dj according to the test requirements, and the stability of the transmitted data volume reaches ±0.01%. For example, when testing a high-speed data transmission cable, it can output a large data block as needed; for the data cable of a low-power device, it precisely controls the transmission of a small amount of data to ensure that the data volume in each test is accurately constant;

[0057] The threshold storage unit, relying on a non-volatile memory, can store multiple groups of preset transmission rate thresholds Rth and Rmin (Rmin < Rth). For example, for a USB2.0 data cable, Rth can be set to 480 Mbps and Rmin can be set to 240 Mbps; for a USB3.0 data cable, Rth can be set to 5 Gbps and Rmin can be set to 2.5 Gbps, and it can be updated immediately according to the new data cable standard;

[0058] The task allocation and adjustment module, after receiving Rj, quickly compares it with the preset thresholds Rth and Rmin, accurately identifies abnormal contacts and activates the emergency fault handling mechanism, and then transmits the abnormal contacts to the comparison contact collection module. The details of the emergency fault handling mechanism are as follows:

[0059] If Rj < Rmin, immediately cut off the data transmission link of this contact, and use the intelligent load balancing algorithm and the real-time bandwidth monitoring system to allocate the original task to other normal contacts in proportion. For example, in the test of a data cable with 10 contacts, when an abnormal contact appears, the transmitted data volume of the abnormal contact is evenly distributed to the remaining 9 normal contacts, effectively curbing the risk of data loss and maintaining the stability of the system transmission;

[0060] If Rmin <Rj<Rth,即刻启动数据重传流程,记录重传后的传输速率Rj’,当Rj’<Rmin时,果断终止该触点任务并重新分配给其他正常触点;若Rj’> =Rth, then the data transmission volume of the abnormal contact is adaptively adjusted according to the function Dj'=Dj*(1-(|Rj'-Rarg| / r*σ)). The core idea of ​​this function is to adjust the data volume according to the degree of deviation between the transmission rate of the abnormal contact and the average transmission rate of the normal contact. When Rj' is close to Rarg, |Rj'-Rarg| is small, and the allocated data volume is close to the original data volume Dj, indicating that although the performance of the contact has declined, it can still undertake more data transmission tasks; if Rj' differs greatly from Rarg, the allocated data volume will be reduced accordingly to avoid excessive impact on the overall transmission efficiency and data integrity due to poor performance of the contact. Among them, Rarg and σ represent the average and standard deviation of the transmission rate of normal contacts, and r is the adjustment factor used to control the sensitivity of data volume adjustment. The larger r is, the more conservative the adjustment is, and the smaller r is, the more radical the adjustment is.

[0061] Compared with the contact collection module, after the contact is initially judged to be abnormal, this module deeply mines the feature attribute association between the abnormal contact j and the normal contact kt (t∈[1,g]) and calculates the feature attribute similarity S(j,kt). The specific steps are as follows:

[0062] First, the feature attribute vectors of the two are recorded as Aj, Bkt, where the feature attributes include the number of historical abnormalities of the contact, historical maintenance time, historical maintenance cost, and the total time from the first use to the present, and these feature attribute values ​​are all normalized by Min-Max;

[0063] Then calculate the feature attribute similarity between Aj and Bkt according to the formula S(j,kt)=(Aj*Bkt) / (|Aj|*|Bkt|);

[0064] If S(j,kt)>nbd, the normal contact kt is added to the comparison contact set Q and transmitted to the abnormal cause analysis module, where nbd is the similarity threshold;

[0065] The abnormal cause analysis module is used for the data transmission scenario of abnormal contact j and comparison contact set Q. The module uses a high-bandwidth oscilloscope to capture the waveform signal, and then deeply analyzes the waveform difference to diagnose the abnormal cause. The specific processing flow is as follows:

[0066] First obtain the waveform signals Pj and Pj of the abnormal contact j and the comparison contact set Q Qh (h∈[1,f], f is the number of contacts in Q), the average waveform signal of Q is calculated by the weighted average algorithm, that is, Then the absolute difference waveform signal P is obtained by the difference algorithm dis Right now

[0067] To further analyze the absolute difference waveform signal in more detail, the CEEMDAN decomposition can be used to decompose the complex absolute difference waveform signal into multiple Intrinsic Mode Function (IMF) components. Each IMF represents the signal's different time scale and frequency characteristics from high frequency to low frequency. For example, the original waveform contains high-frequency spikes caused by electromagnetic interference, low-frequency fluctuations caused by poor contact, and normal transmission signal components. After CEEMDAN decomposition, the high-frequency IMF accurately captures the spike signal, indicating the existence of local high-frequency oscillations or noise interference around. The middle-frequency IMF is extremely vulnerable to the influence of surrounding electromagnetic interference sources, and the low-frequency IMF highlights the fluctuations caused by poor contact. Therefore, it is crucial to accurately find the demarcation points of the high, middle, and low types of IMFs;

[0068] Perform CEEMDAN decomposition on P dis to obtain IM Fq (q ∈ [1, w], where w is the number of decomposed IMFs). Calculate the spectral mean Meanq and variance Varq through the Fast Fourier Transform. Based on the thresholds Thmin, Thmax (spectral mean threshold) and Th1 (spectral variance threshold) optimized through a large number of experiments. Among them, Meanq can reflect the approximate quantity of the high, middle, and low types in the spectrum, while Varq can reflect the degree of concentration of these quantities;

[0069] If Meanq > Thmax and Varq < Th1, then classify IMFq as high frequency. If Thmin < Meanq < Thmax and Varq < Th1, then classify IMFq as middle frequency. If Meanq < Thmin and Varq > Th1, then classify IMFq as low frequency;

[0070] For example, in the test of a certain communication data line, through FFT analysis of the spectral characteristics of IMFq, classify IMFq with Meanq > 5 kHz and Varq < 100 as high frequency, classify those with 2 kHz < Meanq < 5 kHz and Varq < 100 as middle frequency, and classify those with Meanq < 2 kHz and Varq > 100 as low frequency;

[0071] Let the set of high-frequency IMFs be {IMFh1, IMFh2,..., IMFha}, the set of middle-frequency IMFs be {IMFm1, IMFm2,..., IMFmb}, and the set of low-frequency IMFs be {IMFl1, IMFl2,..., IMFlc}, where a + b + c = q;

[0072] Perform summation on the high, middle, and low types respectively to obtain

[0073] According to the formula Calculate that the energies of I MFh, I MFm, and I MF l are E H , E M , E L ;

[0074] If E H > E1, E M < E2, E L < E3, it indicates that there is local high - frequency oscillation or noise interference in the abnormal contact. This may be due to the damage or looseness of the micro - structure inside the contact, resulting in the generation of additional high - frequency components during signal transmission. For example, the intermittent short - circuit caused by the shedding of metal particles on the contact surface generates high - frequency noise;

[0075] If E H < E1, E M > E2, E L < E3, it indicates that there is signal distortion or abnormal modulation in a certain frequency range. This may be due to an electromagnetic interference source near the data line, whose frequency happens to be in the intermediate - frequency range and interferes with the contact signal, or the parameters of components such as capacitors and inductors inside the contact change, affecting the transmission characteristics of the signal in the intermediate - frequency part;

[0076] If E H < E1, E M < E2, E L > E3, it indicates that there is a large signal deviation in the low - frequency band. This may be due to signal attenuation or delay caused by poor contact. For example, contact oxidation or dirt increases the contact resistance, reducing the amplitude of the signal in the low - frequency part and changing the waveform shape, thus reflected in the increase of low - frequency I MF energy. Among them, E1, E2, and E3 represent energy thresholds;

[0077] For example Figure 2 , a production performance test method for a data line. This production test method includes:

[0078] S1. Test preparation stage. The test engineer sets core indicators such as the data volume Dj range, transmission rate thresholds Rth and Rmin, number of tests, sampling frequency, etc. according to the model of the data line to be tested, application scenarios, and industry standards. Select a sample of the data line to be tested to ensure it is in a standard working condition (such as temperature 25°C, humidity 50%RH). The system automatically identifies and addresses each contact. After starting the test, the data volume control unit accurately outputs the data volume Dj according to the preset rules. At the same time, the timing unit synchronizes the timing with atomic clock accuracy. After the data transmission is completed, immediately calculate the transmission rate Rj and compare it with Rth.

[0079] S2. If the contact is abnormal, the intelligent decision-making mechanism is immediately activated. If Rj < Rmin, the instruction to cut off the transmission task is immediately executed. At the system hardware level, the high-speed electronic switch cuts off the circuit connection of the abnormal contact within nanoseconds, and evenly distributes the transmission task of the abnormal contact to other normal contacts.

[0080] S3. After the preliminary judgment of the abnormal contact, extract the characteristic data of the surrounding normal contacts required from the distributed database cluster (covering multi-source data such as the number of times of historical failures of each contact, the time used for historical maintenance, the cost of maintenance, and the total time from the first use to the present), construct the characteristic attribute vector and perform operations according to the similarity algorithm.

[0081] S4. Initiate data transmission tests for the abnormal contact j and the Q set simultaneously. After the oscilloscope captures the waveform, obtain the average waveform signal of the Q set, calculate the absolute difference waveform signal between the waveform signal of j and the average waveform signal, and through CEEMDAN decomposition, IMF classification weighted summation, and energy threshold discrimination, intelligently diagnose the cause of the abnormality.

[0082] Some of the data in the above formula are numerically calculated after removing their dimensions, and the content not described in detail in this specification belongs to the prior art well-known to those skilled in the art.

[0083] The above embodiments are only used to illustrate the technical method of the present invention and not to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical method of the present invention can be modified or equivalently replaced without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A data line production performance test system, characterized in that: Including: A data transmission test module, which is used to separately send a data volume Dj to each contact j of the data cable, record the time Tj used at the end of each transmission, calculate the transmission rate Rj of each contact, and transmit Rj to the task allocation and adjustment module; A task allocation and adjustment module, which compares Rj with a preset threshold Rth and Rmin, finds the contacts with anomalies, triggers an emergency fault handling mechanism, and transmits the abnormal contacts to the comparison contact collection module; A comparison contact collection module, after initially determining that a contact is abnormal, calculates the similarity S(j,kt) of the characteristic attributes between the abnormal contact j and the normal contacts kt (t = 1, 2,..., g). If S(j,kt) > nbd, then add the normal contact kt to the comparison contact set Q, and transmit the comparison contact set Q to the abnormal cause analysis module; An abnormal cause analysis module, which performs the same data transmission on the abnormal contact j and the comparison contact set Q respectively, obtains waveform signals using an oscilloscope, and determines the cause of the anomaly of contact j by taking the difference between the waveform signal of the abnormal contact j and the average waveform signal of the comparison contact set Q.

2. A data line production performance test system according to claim 1, characterized in that: The data transmission test module further includes: A high-precision timing unit, which accurately records the time Tj from when the data is sent to the contact to the end of the transmission, and the timing accuracy is at the nanosecond level; A data volume control unit, which accurately controls the data volume Dj sent to each contact to ensure that the data volume sent each time is stable and without deviation; A threshold storage unit, which stores the preset transmission rate thresholds Rth and Rmin.

3. A data line production performance test system according to claim 1, characterized in that: If Rj < Rth, then initially judge that this contact has an anomaly and trigger an emergency fault handling mechanism.

4. A data line production performance test system according to claim 3, characterized in that: The emergency fault handling mechanism specifically includes: If Rj < Rmin, then immediately stop the data transmission task of this contact, and evenly distribute the transmission task originally assigned to this contact to other normally working contacts; If Rmin < Rj < Rth, then perform a data retransmission operation on this contact, record the transmission rate after retransmission as Rj’, if Rj’ < Rmin, then stop the data transmission task of this contact and reallocate its data transmission task; If Rj’ >= Rth, then adaptively adjust the data transmission volume of this contact according to Rj’.

5. A data line production performance test system according to claim 4, characterized in that: Adaptively adjust the data transmission volume of the abnormal contact according to the formula Dj’ = Dj * (1 - (|Rj’ - Rarg| / r * σ)), where Rarg and σ represent the average value and standard deviation of the transmission rates of normal contacts, and r is an adjustment factor.

6. A data line production performance test system according to claim 1, characterized in that: The specific steps to obtain the comparison contact set Q include: Denote the characteristic attribute vectors of the abnormal contact j and the normal contacts kt (t ∈ [1, g]) as Aj and Bkt; Calculate the similarity of the characteristic attributes between Aj and Bkt according to the formula S(j,kt) = (Aj * Bkt) / (|Aj| * |Bkt|); If S(j,kt) > nbd, then add the normal contact kt to the comparison contact set Q; Among them, the characteristic attributes in the characteristic attribute vector include the number of historical anomalies of the contact, historical maintenance time, historical maintenance cost, and the total duration from the first use to the present, and the characteristic attribute values are all normalized.

7. A data line production performance test system according to claim 1, characterized in that: The specific method for processing the waveform signals of the abnormal contact j and the comparison contact set Q is as follows: The abnormal contact j and the comparison contact set Q are respectively transmitted with the same data, and the waveform signals obtained by the oscilloscope are Pj and P Qh (h∈[1,f]), where f is the number of contacts in the comparison contact set Q; According to the formula Get the average waveform signal of Q; According to the formula Obtaining an absolute difference waveform signal; For the absolute difference waveform signal P dis Perform CEEMDAN decomposition, divide IMFq (q∈[1,w]) into three categories: high, medium, and low, and sum them up to get IMFh, IMFm, and IMFl, where w is the number of decomposed IMFs; Calculate the energies of IMFh, IMFm, and IMFl.

8. A data line production performance test system according to claim 7, characterized in that: The specific steps for classifying IMFq into high, medium, and low categories include: Perform Fourier transform on IMFq respectively and calculate the spectral mean and variance as Meanq and Varq; If Meanq > Thmax and Varq < Th1, then classify IMFq as high frequency; If Thmin < Meanq < Thmax and Varq < Th1, then classify IMFq as medium frequency; If Meanq < Thmin and Varq > Th1, then classify IMFq as low frequency; Among them, Thmin and Thmax are the minimum and maximum thresholds of the spectral mean, and Th1 is the spectral variance threshold.

9. A data line production performance test system according to claim 8, characterized in that: The specific method for judging the cause of contact abnormality according to the energies of IMFh, IMFm, and IMFl is as follows: Let the set of high-frequency IMFs be {IMFh1, IMFh2,..., IMFha}, the set of medium-frequency IMFs be {IMFm1, IMFm2,..., IMFmb}, and the set of low-frequency IMFs be {IMFl1, IMFl2,..., IMFlc}, where a + b + c = q; The high, medium and low categories are summed up to get According to the formula The energies of IMFh, IMFm, and IMFl are calculated as E H 、E M 、E L ; If E H > E1, E M < E2, E L < E3, it indicates that there is damage or looseness in the micro - structure inside the abnormal contact. If E H < E1, E M > E2, E L < E3, it indicates that there is electromagnetic interference around the abnormal contact. If E H < E1, E M < E2, E L > E3, it indicates that the abnormal contact is oxidized or contaminated. Among them, E1, E2, and E3 represent energy thresholds.

10. A data line production performance test method, used to execute a data line production performance test system according to any one of claims 1 to 9, characterized in that: This test method includes: S1. Send the data volume Dj to each contact j of the data line and record the transmission time Tj, calculate the transmission rate Rj, and compare Rj with Rth to judge whether the contact is abnormal; S2. If the contact is abnormal, according to the relationship between Rj and Rmin, perform corresponding task assignment adjustment operations through the emergency fault handling mechanism, including stopping tasks, reassigning tasks, and adaptively adjusting the output transmission volume; S3. Calculate the similarity of the characteristic attributes of the abnormal contact and the normal contact, and add the normal contact with high similarity of characteristic attributes to the comparison contact set Q; S4. Perform the same data transmission on the abnormal contact and the comparison contact set Q, obtain the respective corresponding waveform signals through an oscilloscope, calculate the absolute difference between the abnormal contact waveform signal and the average waveform signal of the comparison contact set to obtain the absolute difference waveform signal, and perform intelligent diagnosis of the abnormal cause through CEEMDAN decomposition, IMF classification weighted summation, and energy threshold discrimination.

Images