Temperature sensor verification method and device, electronic equipment and storage medium

Abstract

The invention discloses a temperature sensor verification method and device, electronic equipment and a storage medium. The method is applied to a verification platform, and comprises the following steps: receiving a code stream configuration parameter transmitted by a global configurator through a code stream generator, generating a code stream to be tested based on the code stream configuration parameter, and transmitting the code stream to be tested to a temperature sensor to be tested and a first reference module, the code stream to be tested comprises a code stream in a random mode or a code stream in a set mode; a to-be-measured code stream is processed through a to-be-measured temperature sensor based on a digital processing algorithm to obtain a first result, and the first result is transmitted to a comparison module; a second result is obtained by simulating the function of the to-be-tested temperature sensor through the first reference module, and the second result is transmitted to the comparison module; and verification of the to-be-tested temperature sensor is realized based on the first result and the second result through a comparison module. According to the scheme, the verification flexibility of the temperature sensor can be improved.

Description

Technical Field

[0001] Embodiments of the present invention relate to the field of computer technology, and in particular, to a method, device, electronic device, and storage medium for verifying a temperature sensor. Background Art

[0002] A temperature sensor can convert the temperature of an object or environment into an electrical signal or digital signal that can be measured, recorded, or controlled. Verifying the temperature sensor is crucial to determine the accuracy of the measurement results of the temperature sensor, so that the temperature sensor can work normally and stably.

[0003] In practical applications, temperature data of the temperature sensor can be collected through a laboratory environment, and the collected temperature data can be used for verifying the temperature sensor. However, the temperature data collected in the laboratory is difficult to reach the working limit of the temperature sensor, the time for collecting the temperature data is too long, and the collected temperature data is related to the laboratory environment, resulting in poor flexibility in verifying the temperature sensor. Summary of the Invention

[0004] The present invention provides a method, device, electronic device, and storage medium for verifying a temperature sensor, which can improve the flexibility of verifying the temperature sensor.

[0005] In a first aspect, an embodiment of the present invention provides a method for verifying a temperature sensor, which is applied to a verification platform. The verification platform includes a global configurator, a bitstream generator, and a temperature sensor to be tested that are communicatively connected to each other, and a first reference module and a comparison module that are communicatively connected to the bitstream generator in sequence; the method includes:

[0006] Receiving, by the bitstream generator, bitstream configuration parameters transmitted by the global configurator, generating a bitstream to be tested based on the bitstream configuration parameters, and transmitting the bitstream to be tested to the temperature sensor to be tested and the first reference module, where the bitstream to be tested includes a bitstream in a random mode or a bitstream in a set mode;

[0007] Processing, by the temperature sensor to be tested, the bitstream to be tested based on a digital processing algorithm to obtain a first result, and transmitting the first result to the comparison module;

[0008] Simulating, by the first reference module, the function of the temperature sensor to be tested to obtain a second result, and transmitting the second result to the comparison module;

[0009] Verifying, by the comparison module, the temperature sensor to be tested based on the first result and the second result.

[0010] Second aspect, an embodiment of the present invention provides a temperature sensor verification device configured on a verification platform. The verification platform includes a global configurator, a bitstream generator, and a temperature sensor to be tested that are communicatively connected to each other, and a first reference module and a comparison module that are communicatively connected to the bitstream generator in sequence; the device includes:

[0011] A generation module, configured to receive bitstream configuration parameters transmitted by the global configurator through the bitstream generator, generate a to-be-tested bitstream based on the bitstream configuration parameters, and transmit the to-be-tested bitstream to the temperature sensor to be tested and the first reference module, where the to-be-tested bitstream includes a bitstream in a random mode or a bitstream in a set mode;

[0012] A first processing module, configured to process the to-be-tested bitstream through the temperature sensor to be tested based on a digital processing algorithm to obtain a first result, and transmit the first result to the comparison module;

[0013] A second processing module, configured to simulate the function of the temperature sensor to be tested through the first reference module to obtain a second result, and transmit the second result to the comparison module;

[0014] A comparison module, configured to verify the temperature sensor to be tested through the comparison module based on the first result and the second result.

[0015] Third aspect, an embodiment of the present invention provides an electronic device as a verification platform. The electronic device includes:

[0016] At least one processor; and

[0017] A memory communicatively connected to the at least one processor; wherein,

[0018] The memory stores a computer program executable by the at least one processor. The computer program is executed by the at least one processor so that the at least one processor can execute the method described in the first aspect.

[0019] Fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, the method described in the first aspect is implemented.

[0020] In the technical solution of the embodiment of the present invention, a bitstream generator receives bitstream configuration parameters transmitted by a global configurator, generates a bitstream to be measured based on the bitstream configuration parameters, and verifies the temperature sensor to be measured based on the generated bitstream to be measured. According to different bitstream configuration parameters, the bitstream to be measured can be configured to include a bitstream in a random mode or a bitstream in a set mode. The generation of the bitstream to be measured is not affected by the working limit of the temperature sensor to be measured, the laboratory environment, or the temperature acquisition time, which can improve the flexibility of verifying the temperature sensor.

[0021] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present invention, nor is it used to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0023] Figure 1 is a flowchart of a temperature sensor verification method provided in Embodiment 1 of the present invention;

[0024] Figure 2 is a schematic structural diagram of a verification platform provided in Embodiment 1 of the present invention;

[0025] Figure 3 is a schematic diagram of using a FIFO to implement communication between a detector and a scoreboard provided in Embodiment 1 of the present invention;

[0026] Figure 4 is a schematic structural diagram of another verification platform provided in Embodiment 1 of the present invention;

[0027] Figure 5 is a flowchart of a temperature sensor verification method provided in Embodiment 2 of the present invention;

[0028] Figure 6 is a flowchart of generating a bitstream to be measured in a random mode provided in Embodiment 2 of the present invention;

[0029] Figure 7 is a schematic structural diagram of a temperature sensor verification device provided in Embodiment 3 of the present invention;

[0030] Figure 8 is a schematic structural diagram of an electronic device implementing the embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0031] In order to enable those skilled in the art to better understand the solution of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0032] It should be noted that the terms "first", "second", etc. in the present invention are used to distinguish similar objects, and do not necessarily need to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0033] Before explaining the technical solutions of the embodiments of the present invention, the working principle of the temperature sensor to be measured involved in the embodiments of the present invention is explained as follows:

[0034] The temperature sensor to be measured may be a temperature sensor to be verified. Among them, verification can be understood as the process of judging the accuracy of the measurement result of the temperature sensor. Verification can be performed through the intermediate process of generating the measurement result by the temperature sensor, or directly through the measurement result of the temperature sensor, or through a combination of the above two methods, which is not limited herein. The measurement result of the temperature sensor may be the temperature value output by the temperature sensor.

[0035] The temperature sensor can convert the temperature of an object or environment into an electrical signal or digital signal that can be measured, recorded or controlled. The temperature sensor includes two parts, sampling by the analog-to-digital converter (ADC) in the analog part, and data processing in the digital part.

[0036] Principle of the analog part: Use multiple current sources to supply different currents to two identical triodes, thereby generating two different voltages Vbe, denoted as Vbe0 and Vbe1 respectively; input Vbe0 and Vbe1 into the selection network, and access the subsequent integrator through the gating control of the selection network; the output of the integrator is connected to a 1-bit quantizer; the result output by the quantizer is a bit stream composed of digital signals with values of 0 and 1, which is used for the input of the subsequent digital part.

[0037] Principle of the digital part: Process the bit stream composed of digital signals with values of 0 and 1 obtained from the analog part and convert it into an actual temperature value.

[0038] Embodiment 1

[0039] Figure 1 is a flowchart of a temperature sensor verification method provided in Embodiment 1 of the present invention. This embodiment is applicable to the situation of verifying a temperature sensor. This method can be executed by a temperature sensor verification device, which can be implemented in the form of software and / or hardware and integrated in an electronic device serving as a verification platform. Further, the electronic device includes, but is not limited to: a computer, a laptop computer, etc. As Figure 1 shown, this method includes S110 - S140.

[0040] A temperature sensor verification method provided in an embodiment of the present invention is applied to a verification platform. Figure 2 is a schematic structural diagram of a verification platform provided in Embodiment 1 of the present invention. As Figure 2 shown, the verification platform includes a global configurator, a bit stream generator, and a temperature sensor to be tested that are communicatively connected to each other, and a first reference module and a comparison module that are communicatively connected to the bit stream generator in sequence. Each part included in the verification platform can be understood as different components in the same verification environment, and the verification environment is used to drive the bit stream in the environment and automatically collect data in the environment. The verification platform can be a platform built based on the Universal Verification Methodology (UVM).

[0041] The following is combined with Figure 2 to illustrate a temperature sensor verification method provided in an embodiment of the present invention:

[0042] S110. Receive the bit stream configuration parameters transmitted by the global configurator through the bit stream generator, generate a to-be-tested bit stream based on the bit stream configuration parameters, and transmit the to-be-tested bit stream to the temperature sensor to be tested and the first reference module. The to-be-tested bit stream includes a bit stream in the random mode or a bit stream in the set mode.

[0043] The global configurator can be a configurator used to configure the parameters required for the verification platform to implement verification. The bitstream configuration parameters can be the parameters used to configure the bitstream in the verification environment and are configured by the global configurator.

[0044] The bitstream generator can be a generator used to generate the bitstream under test. The bitstream under test can be the bitstream required to implement verification and can be used as the excitation for the temperature sensor under test. The bitstream under test can be a bitstream composed of digital signals with values of 0 and 1, and the number of 1s in the bitstream can be used to reflect the actual temperature value corresponding to the bitstream under test.

[0045] The temperature sensor under test can be the temperature sensor to be verified and can be understood as the device under test (DUT) in the verification platform. The first reference module can be a module that simulates the temperature sensor under test and has the same function as the temperature sensor under test.

[0046] The bitstream generator receives the bitstream configuration parameters transmitted by the global configurator, parses the bitstream configuration parameters, and configures the bitstream under test according to different bitstream configuration parameters, including the bitstream in the random mode or the bitstream in the set mode.

[0047] The random mode can be a mode of randomly generating the bitstream under test. In the random mode, two temperature boundaries can be set, such as the minimum temperature boundary and the maximum temperature boundary corresponding to the working limit of the temperature sensor under test. The bitstream under test generated in the random mode can be the bitstream corresponding to the temperature boundary or the bitstream corresponding to the random temperature. The bitstream corresponding to the temperature boundary can be the bitstream corresponding to the minimum temperature boundary or the bitstream corresponding to the maximum temperature boundary, and either of them can be randomly selected. The bitstream corresponding to the random temperature can be the bitstream corresponding to the temperature randomly selected between the minimum temperature boundary and the maximum temperature boundary. In the random mode, the generation of the bitstream under test can be implemented through a certain algorithm, and the algorithm can be a linear interpolation algorithm or a random function algorithm, which is not limited here.

[0048] The set mode can be a mode of generating the bitstream under test by the pre-set bitstream. In the set mode, the bitstream pre-stored in the data file can be read as the bitstream under test. The bitstream pre-stored in the data file can be the bitstream obtained by collecting the temperature in the actual environment in advance, and the data file can be a text format txt file, which is not limited here.

[0049] In this step, the test code stream can be generated one or more times by the code stream generator based on the code stream configuration parameters, and the test code stream is transmitted to the temperature sensor under test and the first reference module. In the case of generating the test code stream multiple times, the generated test code stream can be continuously transmitted to the temperature sensor under test at a certain time interval. Each time the test code stream is transmitted to the temperature sensor under test, the transmitted test code stream is simultaneously transmitted to the first reference module.

[0050] S120. The temperature sensor under test processes the test code stream based on a digital processing algorithm to obtain a first result, and transmits the first result to the comparison module.

[0051] The digital processing algorithm can be an algorithm for processing the test code stream to convert it into an actual temperature value, and the digital processing algorithm is not limited. The first result can be the result obtained by the temperature sensor under test processing the test code stream based on the digital processing algorithm. The comparison module can be a module for comparing the output result of the temperature sensor under test and the output result of the first reference module.

[0052] In one embodiment, the number of the test code streams is multiple, and the digital processing algorithm includes a sampling algorithm, an averaging algorithm, and a trimming algorithm;

[0053] The sampling algorithm is used to determine the number of set values in each test code stream based on a sampling method, and the number of data in the test code stream obtained by different sampling methods is different;

[0054] The averaging algorithm is used to perform an averaging process on the number of set values determined in each test code stream based on an averaging method to obtain an average value, and different averaging methods correspond to different averaging times;

[0055] The trimming algorithm is used to determine the actual temperature corresponding to the test code stream based on a proportionality coefficient, a temperature gain coefficient, and a temperature offset coefficient, and the proportionality coefficient is determined based on the average value and the number of data in the test code stream.

[0056] The sampling algorithm can be an algorithm for sampling set values from the test code stream. The set value can be the value 1 of the digital signal. The sampling algorithm can be executed once for a test code stream. The sampling method can be a method for sampling the test code stream. For example, the sampled test code stream contains 4096 data (taking values 0 or 1), or the sampled test code stream contains 2048 data. In the case where the sampling method indicates that the sampled test code stream contains 4096 data, the sampling algorithm counts the number of 1s in the 4096 data as N according to the control signal generated by the controller. In the case where the sampling method indicates that the sampled test code stream contains 2048 data, the operation of the sampling algorithm is the same.

[0057] The averaging algorithm can be an algorithm that obtains an average value by averaging the results of multiple executions of the extraction algorithm, that is, averaging the results obtained by executing the extraction algorithm on different code streams to be measured. The averaging method can be a method indicating the number of averaging times. For example, averaging the results of executing the extraction algorithm twice, or averaging the results of executing the extraction algorithm four times, etc., which is not limited here. The purpose of the averaging algorithm is to reduce the temperature data jitter caused by noise. Attention should be paid to data overflow and operations of signed and unsigned numbers.

[0058] The trimming algorithm can be an algorithm that determines the actual temperature corresponding to the code stream to be measured based on the result obtained by the averaging algorithm. The trimming algorithm can be implemented by the following formula:

[0059] T = A * μ + B

[0060] Where, T is the actual temperature value corresponding to the code stream to be measured determined by the trimming algorithm; A is the temperature gain coefficient; B is the temperature offset coefficient; μ is the proportionality coefficient. The proportionality coefficient can be the ratio of the average value and the number of data in the code stream to be measured (such as 4096 or 2048). The temperature gain coefficient and the temperature offset coefficient can be coefficients obtained through modeling according to actual needs, which is not limited here.

[0061] Optionally, if the number of code streams to be measured is 1, there is no need to execute the averaging algorithm after executing the extraction algorithm, and the trimming algorithm can be directly executed. In the trimming algorithm, the proportionality coefficient can be the ratio of the number of set values in the code stream to be measured determined by the extraction algorithm to the number of data in the code stream to be measured.

[0062] In this step, the first result obtained by the temperature sensor to be measured for processing the code stream to be measured can be the result obtained by the temperature sensor to be measured executing the extraction algorithm, or the result obtained by the temperature sensor to be measured executing the averaging algorithm, or the result obtained by the temperature sensor to be measured executing the trimming algorithm.

[0063] The first result can be transmitted to the comparison module by the temperature sensor to be measured in the following way: In the verification platform, the code stream generator can integrate the function of the agent (also called agent) in the UVM architecture. The agent can include a detector (also called monitor). The UVM monitor can detect and obtain the port output of the temperature sensor to be measured, convert it into a packet (also called transaction) for data exchange, and then transmit it to the first reference module and further to the comparison module. The comparison module can be considered as the scoreboard (also called scoreboard) in the UVM architecture.

[0064] Due to the mechanism of the transaction level modeling (TLM) of the Universal Verification Methodology (UVM), a FIFO can be used to implement the communication between the monitor and the scoreboard. A FIFO is a communication mechanism, which can be understood as "First In, First Out", meaning that the data that enters first comes out first, and the data that enters later comes out later. Figure 3 It is a schematic diagram showing the implementation of the communication between the monitor and the scoreboard using a FIFO according to Embodiment 1 of the present invention. As Figure 3 shown, the monitor actively transmits the data stream to the FIFO through the control flow; the FIFO passively receives the data stream transmitted by the monitor; the scoreboard actively obtains the data stream from the FIFO through the control flow; the FIFO passively transmits the data stream to the scoreboard.

[0065] S130. Simulate the function of the temperature sensor under test through the first reference module to obtain a second result, and transmit the second result to the comparison module.

[0066] The first reference module can simulate the temperature sensor under test and achieve the same function as the temperature sensor under test. The first reference module can process the code stream under test based on a digital processing algorithm to obtain a second result, and transmit the second result to the comparison module. Among them, the second result can be the result obtained by the first reference module processing the code stream under test based on the digital processing algorithm.

[0067] It should be noted that when the first result is the result obtained by the temperature sensor under test executing the extraction algorithm, the second result is the result obtained by the first reference module executing the extraction algorithm; when the first result is the result obtained by the temperature sensor under test executing the averaging algorithm, the second result is the result obtained by the first reference module executing the averaging algorithm; when the first result is the result obtained by the temperature sensor under test executing the trimming algorithm, the second result is the result obtained by the first reference module executing the trimming algorithm.

[0068] S140. Implement the verification of the temperature sensor under test through the comparison module based on the first result and the second result.

[0069] In this step, the first result can be understood as the result actually output by the temperature sensor under test, and the second result can be understood as the expected result given by the verification platform. The comparison module compares the first result and the second result to determine whether the actual behavior of the temperature sensor under test is consistent with the expectation of the first reference module. If they are consistent, it indicates that the verification of the temperature sensor under test is successful.

[0070] In the technical solution of the embodiment of the present invention, a bitstream generator receives bitstream configuration parameters transmitted by a global configurator, generates a bitstream to be measured based on the bitstream configuration parameters, and verifies the temperature sensor to be measured based on the generated bitstream to be measured. According to different bitstream configuration parameters, the bitstream to be measured can be configured to include a bitstream in a random mode or a bitstream in a set mode. The generation of the bitstream to be measured is not affected by the working limit of the temperature sensor to be measured, the laboratory environment, or the temperature acquisition time, which can improve the flexibility of verifying the temperature sensor.

[0071] In one embodiment, the method further includes:

[0072] The temperature sensor to be measured receives port configuration parameters transmitted by the global configurator, and configures the port of the temperature sensor to be measured based on the port configuration parameters.

[0073] The port configuration parameters may be parameters for configuring the port of the temperature sensor to be measured, which are not limited herein. The temperature sensor to be measured receives port configuration parameters transmitted by the global configurator, and configures the port of the temperature sensor to be measured based on the port configuration parameters, such as configuring the signal of a certain port to be always high, or configuring the signal of a certain port to be always low.

[0074] In one embodiment, the verification platform further includes a bus function module communicatively connected to the global configurator and the temperature sensor to be measured, and a second reference module communicatively connected to the bus function module and the comparison module. The method further includes:

[0075] The bus function module receives communication configuration parameters transmitted by the global configurator, and communicates with the temperature sensor to be measured based on the communication configuration parameters;

[0076] The bus function module transmits register configuration parameters to the temperature sensor to be measured and the second reference module. The register configuration parameters are used to configure the sampling method corresponding to the extraction algorithm or the averaging method corresponding to the averaging algorithm;

[0077] The temperature sensor to be measured configures the corresponding algorithm based on the register configuration parameters to obtain a third result, and transmits the third result to the comparison module;

[0078] The second reference module simulates the temperature sensor to be measured to configure the corresponding algorithm to obtain a fourth result, and transmits the fourth result to the comparison module;

[0079] The comparison module verifies the temperature sensor to be measured based on the third result and the fourth result.

[0080] Figure 4It is a schematic structural diagram of another verification platform provided by Embodiment 1 of the present invention. As Figure 4 shown, the verification platform further includes a bus function module communicatively connected to the global configurator and the temperature sensor under test, and a second reference module communicatively connected to the bus function module and the comparison module.

[0081] The bus function module may be a module that implements bus functions. The communication configuration parameters may be parameters for configuring the communication method. In the embodiments of the present invention, the bus function module receives the communication configuration parameters transmitted by the global configurator, and configures the verification work based on the communication configuration parameters through the Serial Peripheral Interface (SPI) communication protocol. The bus function module communicates with the temperature sensor under test through the SPI communication protocol. Optionally, different communication protocols may be adopted according to the differences of the temperature sensors under test and the different high and low speed performance application scenarios, which are not limited herein.

[0082] The register configuration parameters may be parameters for configuring the registers corresponding to the temperature sensor under test. For example, configure the sampling method corresponding to the extraction algorithm, configure that the measured code stream obtained by sampling contains 4,096 data or the measured code stream obtained by sampling contains 2,048 data; or configure the averaging method corresponding to the averaging algorithm, configure to average the results of executing the extraction algorithm twice, or average the results of executing the extraction algorithm four times, etc. The register configuration parameters are transmitted to the temperature sensor under test and the second reference module through the bus function module, so that the temperature sensor under test and the second reference module realize the configuration of the corresponding registers. Among them, the second reference module may be a module that simulates the temperature sensor under test and realizes the same register configuration as the temperature sensor under test.

[0083] The third result may be the result obtained by the temperature sensor under test based on the register configuration parameters to realize the configuration of the corresponding algorithm. The third result is transmitted to the comparison module by the temperature sensor under test, which can be achieved in the following way: in the verification platform, the bus function module may integrate the function of the agent in the UVM architecture, and the agent may include a monitor. The UVM monitor can detect and obtain the third result of the temperature sensor under test, convert it into a transaction for data exchange, and then transmit it to the second reference module and further to the comparison module.

[0084] The second reference module may simulate the temperature sensor under test, realize the configuration of the corresponding algorithm based on the register configuration parameters to obtain a fourth result, and transmit the fourth result to the comparison module. The fourth result may be the result obtained by the second reference module simulating the same register configuration as the temperature sensor under test based on the register configuration parameters.

[0085] The third result can be understood as the configuration of the register actually implemented by the temperature sensor to be measured, and the fourth result can be understood as the expected result given by the verification platform. By comparing the third result and the fourth result through the comparison module, it is judged whether the configuration of the register actually implemented by the temperature sensor to be measured is consistent with that expected by the third reference module. If they are consistent, it indicates that the verification of the temperature sensor to be measured is successful.

[0086] Embodiment 2

[0087] Figure 5 is a flowchart of a temperature sensor verification method provided according to Embodiment 2 of the present invention. This embodiment further refines the generation of the code stream to be measured based on the code stream configuration parameters on the basis of the above Embodiment 1. As Figure 5 shown, the method includes:

[0088] S111. Receive the code stream configuration parameters transmitted by the global configurator through the code stream generator.

[0089] It should be noted that after executing S111, the execution order of S112 and S113 is not limited.

[0090] S112. When it is determined that the code stream configuration parameters include the function variables corresponding to the set mode through the code stream generator, generate the code stream to be measured based on the data file corresponding to the function variables.

[0091] In the verification platform, a function variable can be set through a coefficient function defined by a hardware description language, and this function variable indicates generating the code stream to be measured in the set mode. Specifically, a data file for simulating ADC sampling is specified through this function variable, and the code stream in the data file is read by calling the function for reading files in the system function and used as the code stream to be measured. Among them, calling the function for reading files can solve the problem of excessive server reading and writing occupation during text writing operations and can directly provide simulation data for the verification environment.

[0092] S113. When it is determined that the code stream configuration parameters do not include the function variables corresponding to the set mode through the code stream generator, generate the code stream to be measured in the random mode based on the code stream configuration parameters.

[0093] In one embodiment, generating the code stream to be measured in the random mode based on the code stream configuration parameters includes:

[0094] Determine, through the code stream generator, the bit data sequence, the first temperature boundary, and the second temperature boundary included in the code stream configuration parameters, where the first temperature boundary is lower than the second temperature boundary;

[0095] When the first bit included in the bit data sequence is a first value through the bitstream generator, it is determined that the temperature boundary bitstream corresponding to the first temperature boundary or the second temperature boundary needs to be used to generate the bitstream to be tested; otherwise, it is determined that the temperature random bitstream between the first temperature boundary and the second temperature boundary needs to be used to generate the bitstream to be tested.

[0096] When the second bit included in the bit data sequence is a second value through the bitstream generator, the bitstream to be tested is generated based on the bitstream determined to be used for generating the bitstream to be tested through the linear interpolation algorithm; otherwise, the bitstream to be tested is generated based on the bitstream determined to be used for generating the bitstream to be tested through the random interpolation algorithm.

[0097] The bitstream configuration parameters may include a bit data sequence, a first temperature boundary, and a second temperature boundary. The bit data sequence may be a data sequence for configuring the bitstream, such as a data sequence defining a 12-bit width and named random_mode[11:0]. The first temperature boundary may be the minimum temperature boundary corresponding to the working limit of the temperature sensor to be tested, such as -40°C. The second temperature boundary may be the maximum temperature boundary corresponding to the working limit of the temperature sensor to be tested, such as 150°C.

[0098] There are no restrictions on the first bit and the first value. For example, when the bitstream generator determines that random_mode

[11] is 'h0, it is determined to enter the temperature boundary mode, and the temperature boundary bitstream corresponding to the first temperature boundary or the second temperature boundary is used to generate the bitstream to be tested. The temperature boundary bitstream is the bitstream generated through the temperature boundary; conversely, enter the temperature random mode, and the temperature random bitstream between the first temperature boundary and the second temperature boundary is used to generate the bitstream to be tested. The temperature random bitstream is the bitstream generated through the random temperature between the first temperature boundary and the second temperature boundary.

[0099] There are no restrictions on the second bit and the second value. For example, when the bitstream generator determines that random_mode

[10] is 'h0, it is determined to enter the linear interpolation mode, and the bitstream to be tested is generated based on the bitstream determined to be used for generating the bitstream to be tested through the linear interpolation algorithm; conversely, it is determined to enter the random mode, and the bitstream to be tested is generated based on the bitstream determined to be used for generating the bitstream to be tested through the random interpolation algorithm. Among them, the bitstream to be tested obtained by the linear interpolation algorithm is close to the normal distribution, while the bitstream to be tested obtained by the random interpolation algorithm is different from the normal distribution and can be randomly set. The specific implementation method of the random interpolation algorithm is not limited here.

[0100] In an embodiment of the present invention, a 1-bit data symbol bit can also be defined in the bit data sequence. When random_mode[9] is 'h0, it is determined that the current temperature is positive; otherwise, the current temperature is negative. The temperature value can also be defined by random_mode[8:0] in the bit data sequence. The defined temperature value can also be used to configure the generation of the code stream to be measured. If the configured temperature exceeds the temperature boundary, it is all regarded as the boundary temperature for processing, where the minimum change in the temperature step is 1°C.

[0101] In one embodiment, the number of set values in the code stream to be measured generated in the random mode is the same as the number of set values required when interpolating using the linear interpolation algorithm or the random interpolation algorithm;

[0102] The number of set values required when interpolating using the linear interpolation algorithm is related to at least one of the first temperature boundary, the second temperature boundary, and the temperature required for interpolation.

[0103] In an embodiment of the present invention, there is a watchdog mode for generating the code stream to be measured in the random mode. The number of 1s in the generated code stream to be measured needs to be the same as the number of 1s required when interpolating using the linear interpolation algorithm or the random interpolation algorithm. If they are inconsistent, an error is reported and the simulation cannot be successfully performed.

[0104] The number of set values required when interpolating using the linear interpolation algorithm can be determined by the following formula:

[0105]

[0106] Where tsr_num is the number of set values (such as 1) required when interpolating using the linear interpolation algorithm; tsr_min is the first temperature boundary; tsr_max is the second temperature boundary; tsr_tmp is the temperature required for interpolation; tsr_avg = tsr_max_num - tsr_min_num, tsr_min_num is the quantity corresponding to the first temperature boundary during interpolation. For example, when the first temperature boundary is 1, tsr_min_num can be 10, and tsr_max_num is the quantity corresponding to the second temperature boundary during interpolation. For example, when the second temperature boundary is 100, tsr_max_num can be 1000, and there is no limitation here.

[0107] As another implementation of S113, the bit data sequence can also be determined not by the bitstream configuration parameters, but by the sequencer (also known as sequencer) included in the agent in the UVM architecture. The system can retrieve the bit data sequence configured by the UVM sequencer, and generate the bitstream under test through the bit data sequence configured by the sequencer. Among them, the structure of the bit data sequence configured by the sequencer is the same as the bit data sequence in the above-mentioned bitstream configuration parameters. In this case, the bitstream under test generated by the sequencer can be driven to the temperature sensor under test through the driver (also known as driver) included in the agent in the UVM architecture.

[0108] S114. Transmit the bitstream under test to the temperature sensor under test and the first reference module through the bitstream generator.

[0109] S120. Process the bitstream under test by the temperature sensor under test based on the digital processing algorithm to obtain a first result, and transmit the first result to the comparison module.

[0110] S130. Simulate the function of the temperature sensor under test by the first reference module to obtain a second result, and transmit the second result to the comparison module.

[0111] S140. Verify the temperature sensor under test through the comparison module based on the first result and the second result.

[0112] The technical solution of the embodiment of the present invention can determine whether the bitstream configuration parameters include the function variables corresponding to the set mode through the bitstream generator, and determine whether to generate the bitstream under test in the set mode or in the random mode; generate the bitstream under test based on the data file corresponding to the function variables in the set mode, which can directly provide simulation data for the verification environment; generate the bitstream under test through the bit data sequence, the first temperature boundary and the second temperature boundary included in the bitstream configuration parameters in the random mode, so that the generated bitstream under test has randomness. It supports sending any temperature bitstream, random bitstream format and loading the bitstream of a specific data file, and successfully solves the problems such as difficult verification of temperature limits, too long time for simulating and generating temperature bitstreams, and lack of randomness of bitstreams.

[0113] The following is an exemplary description of the process of generating the bitstream under test in the random mode:

[0114] Figure 6 is a flowchart of generating the bitstream under test in the random mode according to the second embodiment of the present invention, as Figure 6 shown, including the following steps:

[0115] Bitstream configuration input;

[0116] Is the mode set? If so, generate a test bitstream in the set mode, store the test bitstream in the memory, and send the test bitstream after the bitstream generator starts and the digital-to-analog port is synchronized; if not, generate a test bitstream in the random mode.

[0117] Generate a test bitstream in the random mode, specifically:

[0118] Determine whether the temperature is random. If so, enter the temperature random mode and generate the test bitstream using the temperature random bitstream; if not, enter the temperature boundary mode and generate the test bitstream using the temperature boundary bitstream.

[0119] Determine whether the algorithm is random. If so, generate the test bitstream using the random interpolation algorithm; if not, generate the test bitstream using the linear interpolation algorithm.

[0120] After the algorithm output, judge through the watchdog mode. If the number of 1s in the generated test bitstream is the same as the number of 1s required during the interpolation of the linear interpolation algorithm or the random interpolation algorithm, store the test bitstream in the memory, and send the test bitstream after the bitstream generator starts and the digital-to-analog port is synchronized; if not, report an error and the simulation cannot be successfully performed.

[0121] Embodiment III

[0122] Figure 7 FIG. is a schematic structural diagram of a temperature sensor verification device provided according to Embodiment III of the present invention. This embodiment is applicable to the situation of verifying a temperature sensor. A temperature sensor verification device provided by an embodiment of the present invention is configured on a verification platform. The verification platform includes a global configurator, a bitstream generator, and a temperature sensor to be tested that are communicatively connected to each other, and a first reference module and a comparison module that are communicatively connected to the bitstream generator in sequence; as Figure 7 shown, the device includes:

[0123] A generation module 71, configured to receive bitstream configuration parameters transmitted by the global configurator through the bitstream generator, generate a test bitstream based on the bitstream configuration parameters, and transmit the test bitstream to the temperature sensor to be tested and the first reference module. The test bitstream includes a bitstream in the random mode or a bitstream in the set mode;

[0124] A first processing module 72, configured to process the test bitstream through the temperature sensor to be tested based on a digital processing algorithm to obtain a first result, and transmit the first result to the comparison module;

[0125] A second processing module 73, configured to simulate the function of the temperature sensor to be tested through the first reference module to obtain a second result, and transmit the second result to the comparison module;

[0126] A comparison module 74, configured to verify the temperature sensor to be tested based on the first result and the second result by means of the comparison module.

[0127] For the temperature sensor verification device provided in this embodiment, a generation module receives, through the bitstream generator, bitstream configuration parameters transmitted by the global configurator, generates a bitstream to be tested based on the bitstream configuration parameters, and transmits the bitstream to be tested to the temperature sensor to be tested and the first reference module. The bitstream to be tested includes a bitstream in a random mode or a bitstream in a set mode. A first processing module processes the bitstream to be tested through the temperature sensor to be tested based on a digital processing algorithm to obtain a first result, and transmits the first result to the comparison module. A second processing module simulates the function of the temperature sensor to be tested through the first reference module to obtain a second result, and transmits the second result to the comparison module. A comparison module verifies the temperature sensor to be tested based on the first result and the second result through the comparison module. According to different bitstream configuration parameters, the bitstream to be tested can be configured to include a bitstream in a random mode or a bitstream in a set mode. The generation of the bitstream to be tested is not affected by the working limit of the temperature sensor to be tested, the laboratory environment, or the temperature acquisition time, which can improve the flexibility of verifying the temperature sensor.

[0128] Further, the generation module 71 is specifically configured to:

[0129] When the bitstream generator determines that the bitstream configuration parameters include function variables corresponding to the set mode, generate a bitstream to be tested based on the data file corresponding to the function variables.

[0130] When the bitstream generator determines that the bitstream configuration parameters do not include function variables corresponding to the set mode, generate a bitstream to be tested in the random mode based on the bitstream configuration parameters.

[0131] Further, the generation module 71 is specifically configured to:

[0132] The bitstream generator determines the bit data sequence, the first temperature boundary, and the second temperature boundary included in the bitstream configuration parameters, where the first temperature boundary is lower than the second temperature boundary.

[0133] When the first bit in the bit data sequence is a first value, the bitstream generator determines that the temperature boundary bitstream corresponding to the first temperature boundary or the second temperature boundary needs to be used to generate the bitstream to be tested; otherwise, it is determined that the temperature random bitstream between the first temperature boundary and the second temperature boundary needs to be used to generate the bitstream to be tested.

[0134] When the second bit included in the bit data sequence is the second value, the bit stream generator generates a bit stream to be measured based on the bit stream determined to be used for generating the bit stream to be measured through a linear interpolation algorithm; otherwise, a bit stream to be measured is generated based on the bit stream determined to be used for generating the bit stream to be measured through a random interpolation algorithm.

[0135] Further, the number of set values in the bit stream to be measured generated in the random mode is the same as the number of set values required during interpolation by the linear interpolation algorithm or the random interpolation algorithm;

[0136] The number of set values required during interpolation by the linear interpolation algorithm is related to at least one of the first temperature boundary, the second temperature boundary, and the temperature required during interpolation.

[0137] Further, the device further includes a port configuration module for:

[0138] Receiving port configuration parameters transmitted by the global configurator through the temperature sensor to be measured, and configuring the ports of the temperature sensor to be measured based on the port configuration parameters.

[0139] Further, the number of bit streams to be measured is multiple, and the digital processing algorithms include a decimation algorithm, an averaging algorithm, and a trimming algorithm;

[0140] The decimation algorithm is used to determine the number of set values in each bit stream to be measured based on the sampling method, and the number of data in the bit stream to be measured obtained by different sampling methods is different;

[0141] The averaging algorithm is used to perform an averaging process on the number of set values determined in each bit stream to be measured based on the averaging method to obtain an average value, and different averaging methods correspond to different averaging times;

[0142] The trimming algorithm is used to determine the actual temperature corresponding to the bit stream to be measured based on a proportionality coefficient, a temperature gain coefficient, and a temperature offset coefficient, and the proportionality coefficient is determined based on the average value and the number of data in the bit stream to be measured.

[0143] Further, the verification platform further includes a bus function module communicatively connected to the global configurator and the temperature sensor to be measured, and a second reference module communicatively connected to the bus function module and the comparison module. The device further includes:

[0144] A communication configuration module for receiving communication configuration parameters transmitted by the global configurator through the bus function module and communicating with the temperature sensor to be measured based on the communication configuration parameters;

[0145] A transmission module, configured to transmit register configuration parameters to the temperature sensor under test and the second reference module through the bus function module, where the register configuration parameters are used to configure a sampling method corresponding to the decimation algorithm or an averaging method corresponding to the averaging algorithm;

[0146] A third processing module, configured to implement configuration of a corresponding algorithm based on the register configuration parameters through the temperature sensor under test to obtain a third result, and transmit the third result to the comparison module;

[0147] A fourth processing module, configured to simulate the temperature sensor under test through the second reference module to implement configuration of a corresponding algorithm to obtain a fourth result, and transmit the fourth result to the comparison module;

[0148] A register configuration comparison module, configured to implement verification of the temperature sensor under test through the comparison module based on the third result and the fourth result.

[0149] The temperature sensor verification device provided in an embodiment of the present invention can execute the temperature sensor verification method provided in any embodiment of the present invention, and has functional modules and beneficial effects corresponding to the execution of the method.

[0150] Embodiment 4

[0151] Figure 8 It is a schematic structural diagram of an electronic device implementing an embodiment of the present invention. The electronic device is intended to represent various forms of digital computers, such as, a laptop computer, a desktop computer, a workbench, a personal digital assistant, a server, a blade server, a mainframe computer, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as, a personal digital processor, a cellular phone, a smart phone, a wearable device (such as a helmet, glasses, a watch, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are only for illustration and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0152] Such as Figure 8As shown, the electronic device 10 includes at least one processor 11 and a memory communicatively connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc. The memory stores a computer program executable by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 into the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0153] Multiple components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disc, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0154] The processor 11 can be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the processor 11 include but are not limited to a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the temperature sensor verification method.

[0155] In some embodiments, the temperature sensor verification method can be implemented as a computer program tangibly embodied in a computer-readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the temperature sensor verification method described above can be executed. Alternatively, in other embodiments, the processor 11 can be configured to execute the temperature sensor verification method by any other appropriate means (e.g., by means of firmware).

[0156] The various embodiments of the systems and techniques described above in this specification can be implemented in digital electronic circuitry, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on a chip (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include: being implemented in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be a special-purpose or general-purpose programmable processor that receives data and instructions from, and transmits data and instructions to, a storage system, at least one input device, and at least one output device.

[0157] The computer programs for implementing the methods of the present invention can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions / operations specified in the flowchart and / or block diagram to be implemented. The computer programs can be executed entirely on the machine, partly on the machine, as a stand-alone software package partly on the machine and partly on a remote machine or entirely on the remote machine or server.

[0158] In the context of the present invention, a computer-readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer-readable storage medium can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. Alternatively, the computer-readable storage medium can be a machine-readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0159] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and a pointing device (e.g., a mouse or a trackball) through which the user can provide input to the electronic device. Other kinds of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0160] The systems and techniques described herein can be implemented in a computing system including backend components (e.g., as a data server), or a computing system including middleware components (e.g., an application server), or a computing system including frontend components (e.g., a user computer having a graphical user interface or a web browser through which the user can interact with an implementation of the systems and techniques described herein), or a computing system including any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected to each other by digital data communication in any form or medium (e.g., a communication network). Examples of communication networks include: local area network (LAN), wide area network (WAN), blockchain network, and the Internet.

[0161] The computing system can include a client and a server. The client and the server are generally far from each other and usually interact through a communication network. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or a cloud host, which is a host product in the cloud computing service system and solves the defects of difficult management and weak business scalability existing in traditional physical hosts and VPS services.

[0162] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps recited in the present invention can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved, and no limitation is made herein.

[0163] The above specific embodiments do not constitute a limitation on the protection scope of the present invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A temperature sensor verification method, characterized in that: The method is applied to a verification platform, the verification platform includes a global configurator, a code stream generator and a temperature sensor to be measured which are communicatively connected to each other, and a first reference module and a comparison module which are communicatively connected to the code stream generator in sequence; the method includes: Receiving the code stream configuration parameters transmitted by the global configurator through the code stream generator, generating a code stream to be tested based on the code stream configuration parameters, and transmitting the code stream to be tested to the temperature sensor to be tested and the first reference module, wherein the code stream to be tested includes a code stream in a random mode or a code stream in a set mode; Processing the code stream to be tested based on a digital processing algorithm by the temperature sensor to be tested to obtain a first result, and transmitting the first result to the comparison module; Simulating the function of the temperature sensor to be measured by the first reference module to obtain a second result, and transmitting the second result to the comparison module; The comparison module verifies the temperature sensor to be tested based on the first result and the second result.

2. The method according to claim 1, characterized in that Generating a bitstream to be tested based on the bitstream configuration parameters includes: When determining, by the code stream generator, that the code stream configuration parameters include the function variables corresponding to the setting mode, generating a code stream to be tested based on a data file corresponding to the function variables; When it is determined by the code stream generator that the code stream configuration parameters do not include the function variables corresponding to the setting mode, a code stream to be tested is generated in the random mode based on the code stream configuration parameters.

3. The method according to claim 2, characterized in that Generating a bitstream to be tested in the random mode based on the bitstream configuration parameters includes: Determine, by the code stream generator, a bit data sequence, a first temperature boundary, and a second temperature boundary included in the code stream configuration parameters, wherein the first temperature boundary is lower than the second temperature boundary; When the first bit position included in the bit data sequence is a first value, determining by the code stream generator that a temperature boundary code stream corresponding to the first temperature boundary or the second temperature boundary needs to be used to generate the code stream to be tested; otherwise, determining that a temperature random code stream between the first temperature boundary and the second temperature boundary needs to be used to generate the code stream to be tested; When the second bit position included in the bit data sequence is a second value, the code stream generator generates the code stream to be tested based on the determined code stream to be used to generate the code stream to be tested by using a linear interpolation algorithm; otherwise, the code stream to be tested is generated based on the determined code stream to be used to generate the code stream to be tested by using a random interpolation algorithm.

4. The method according to claim 3, characterized in that: The number of set values ​​in the bit stream to be tested generated in the random mode is consistent with the number of set values ​​required to be generated when the linear interpolation algorithm or the random interpolation algorithm is interpolated; The number of set values ​​required to be generated when the linear interpolation algorithm is interpolated is related to at least one of the first temperature boundary, the second temperature boundary and the temperature required to be generated during the interpolation.

5. The method according to claim 1, characterized in that Also includes: The port configuration parameters transmitted by the global configurator are received through the temperature sensor to be measured, and the port of the temperature sensor to be measured is configured based on the port configuration parameters.

6. The method according to claim 1, characterized in that The number of the code streams to be tested is multiple, and the digital processing algorithm includes an extraction algorithm, an averaging algorithm and a trimming algorithm; The extraction algorithm is used to determine the number of set values ​​in each bitstream to be tested based on a sampling method, and different sampling methods may result in different numbers of data in the bitstream to be tested; The averaging algorithm is used to average the number of set values ​​in each bitstream to be tested based on an averaging method to obtain an average value, and different averaging methods correspond to different averaging times; The adjustment algorithm is used to determine the actual temperature corresponding to the code stream to be tested based on a proportionality coefficient, a temperature gain coefficient and a temperature offset coefficient, and the proportionality coefficient is determined based on the average value and the number of data in the code stream to be tested.

7. The method according to claim 6, characterized in that The verification platform further includes a bus function module that is communicatively connected to the global configurator and the temperature sensor to be measured, and a second reference module that is communicatively connected to the bus function module and the comparison module. The method further includes: Receiving the communication configuration parameters transmitted by the global configurator through the bus function module, and communicating with the temperature sensor to be measured based on the communication configuration parameters; Transmitting register configuration parameters to the temperature sensor to be measured and the second reference module through the bus function module, wherein the register configuration parameters are used to configure a sampling mode corresponding to the extraction algorithm or an averaging mode corresponding to the averaging algorithm; A third result is obtained by configuring a corresponding algorithm based on the register configuration parameters by the temperature sensor to be measured, and the third result is transmitted to the comparison module; Simulating the temperature sensor to be measured by the second reference module to implement the configuration of the corresponding algorithm to obtain a fourth result, and transmitting the fourth result to the comparison module; The comparison module verifies the temperature sensor to be tested based on the third result and the fourth result.

8. A temperature sensor verification device, characterized in that: The device is configured on a verification platform, the verification platform includes a global configurator, a code stream generator and a temperature sensor to be measured which are communicatively connected to each other, and a first reference module and a comparison module which are communicatively connected to the code stream generator in sequence; the device includes: A generating module, configured to receive the code stream configuration parameters transmitted by the global configurator through the code stream generator, generate a code stream to be tested based on the code stream configuration parameters, and transmit the code stream to be tested to the temperature sensor to be tested and the first reference module, wherein the code stream to be tested includes a code stream in a random mode or a code stream in a set mode; A first processing module, configured to obtain a first result by processing the code stream to be tested based on a digital processing algorithm through the temperature sensor to be tested, and transmit the first result to the comparison module; A second processing module, configured to obtain a second result by simulating the function of the temperature sensor to be measured through the first reference module, and transmit the second result to the comparison module; A comparison module is used to verify the temperature sensor to be tested based on the first result and the second result through the comparison module.

9. An electronic device, characterized in that: As a verification platform, the electronic device includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

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