Voltage calibration method, pre-charge controller and related device

Abstract

The embodiment of the invention provides a voltage calibration method, a pre-charge controller and a related device. The method comprises the following steps: acquiring voltage information; determining a plurality of voltage calibration intervals according to the DC voltage range; determining a plurality of sampling voltages corresponding to each voltage calibration interval; determining calibration parameters according to the plurality of sampling voltages; determining a voltage calibration formula according to the calibration parameters; and determining a target voltage after the current sampling voltage is calibrated according to a voltage calibration formula and the current sampling voltage. The direct-current voltage range is divided into a plurality of voltage calibration intervals, and it is ensured that the sampling voltage in each voltage calibration interval and the actual output voltage of the voltage source are in the linear relation, so that the missing actual output voltage data of the voltage source can be complemented by calibrating the sampling voltage, and the accuracy of direct-current high-voltage sampling voltage calibration is improved.

Description

Technical Field

[0001] This application belongs to the technical field of DC high-voltage calibration, and specifically relates to a voltage calibration method, a pre-charge controller, and related devices. Background Art

[0002] Currently, in the actual application of pre-charge controllers, there are often situations where data of the actual output voltage of the voltage source or the sampled voltage is missing or discontinuous. Using a single linear relationship to estimate the accuracy of the output voltage or the sampled voltage is poor, resulting in poor performance during the actual use of the pre-charge controller. Summary of the Invention

[0003] Embodiments of this application provide a voltage calibration method, a pre-charge controller, and related devices. By dividing the DC voltage range into multiple voltage calibration intervals, it is ensured that the sampled voltage and the actual output voltage of the voltage source are in a linear relationship in each voltage calibration interval. In this way, the missing data of the actual output voltage of the voltage source can be supplemented by calibrating the sampled voltage, which is beneficial to improving the accuracy of DC high-voltage sampled voltage calibration.

[0004] In a first aspect, embodiments of this application provide a voltage calibration method applied to a pre-charge controller. The method includes:

[0005] Obtain voltage information, where the voltage information includes a DC voltage range;

[0006] Determine multiple voltage calibration intervals according to the DC voltage range;

[0007] Determine multiple sampled voltages corresponding to each voltage calibration interval;

[0008] Determine calibration parameters for each voltage calibration interval according to the multiple sampled voltages;

[0009] Determine a voltage calibration formula for each voltage calibration interval according to the calibration parameters;

[0010] Determine the target voltage after calibration of the current sampled voltage according to the voltage calibration formula and the current sampled voltage.

[0011] In a possible example, the calibration parameters include a first sub-calibration parameter and a second sub-calibration parameter; the step of determining calibration parameters for each voltage calibration interval according to the multiple sampled voltages includes:

[0012] Determine a first sampled voltage corresponding to the lower voltage limit value and a second sampled voltage corresponding to the upper voltage limit value of each voltage calibration interval;

[0013] Determine the first sub-calibration parameter according to the lower voltage limit value, the upper voltage limit value, the first sampled voltage, and the second sampled voltage;

[0014] Determine the second sub-calibration parameter according to the first sampled voltage, the first sub-calibration parameter, and the lower voltage limit value.

[0015] In a possible example, after determining the calibration parameter of each voltage calibration interval according to the multiple sampled voltages, it includes:

[0016] Obtain the first voltage sampling data of the first voltage calibration interval, where the first voltage calibration interval is any one of the multiple voltage calibration intervals;

[0017] Determine the first error of the first voltage calibration interval according to the first voltage sampling data;

[0018] If it is determined that the first error is greater than a preset threshold, determine the target voltage value according to the first error;

[0019] Divide the first voltage calibration interval into a first sub-voltage calibration interval and a second sub-voltage calibration interval according to the target voltage value.

[0020] In a possible example, the determining the first error of the first voltage calibration interval according to the first voltage sampling data includes:

[0021] Fit the first voltage sampling data to obtain a fitting result;

[0022] Determine multiple residuals according to the fitting result and the voltage calibration formula;

[0023] Take the maximum residual among the multiple residuals as the first error.

[0024] In a possible example, after determining the calibration parameter of each voltage calibration interval according to the multiple sampled voltages, it includes:

[0025] Obtain the second voltage sampling data of the second target voltage calibration interval, where the second voltage calibration interval is any one of the multiple voltage calibration intervals;

[0026] Determine the second error of the second target voltage calibration interval;

[0027] Determine an error threshold according to the second error;

[0028] Determine the sensitivity corresponding to each sampled voltage in the second voltage sampling data to obtain multiple sensitivities;

[0029] Determine the target voltage corresponding to the maximum sensitivity among multiple sensitivities;

[0030] Determine a third sub-voltage calibration interval and a fourth sub-voltage calibration interval according to the target voltage and the second target voltage calibration interval;

[0031] Respectively determine a third error of the third sub-voltage calibration interval and a fourth error of the fourth sub-voltage calibration interval;

[0032] If it is determined that the third error is less than the error threshold and the fourth error is less than the error threshold, then determine to divide the second target voltage calibration interval into the third sub-voltage calibration interval and the fourth sub-voltage calibration interval.

[0033] In a possible example, the determining the sensitivity corresponding to each sampling voltage in the second voltage sampling data to obtain multiple sensitivities includes:

[0034] Determine the perturbation value of the second voltage sampling data;

[0035] According to the perturbation value and the second voltage sampling data, determine a first set of voltage data for positive perturbation;

[0036] According to the perturbation value and the second voltage sampling data, determine a second set of voltage data for negative perturbation;

[0037] According to the first set of voltage data, the second set of voltage data and the perturbation value, determine the sensitivity of each voltage to obtain multiple sensitivities.

[0038] In a possible example, the determining multiple voltage calibration intervals according to the DC voltage range includes:

[0039] Determine the target number of segments required for the DC voltage range;

[0040] Divide the DC voltage range evenly according to the target number to obtain the multiple voltage calibration intervals.

[0041] In a second aspect, an embodiment of the present application provides a pre-charge controller, and the pre-charge controller is used to execute the method in the first aspect. The pre-charge controller includes:

[0042] High-voltage input voltage;

[0043] High-voltage output voltage;

[0044] A resistor sampling board, and the resistor sampling board is respectively connected to the high-voltage input voltage and the high-voltage output voltage;

[0045] A first comparator, and the first comparator is connected to the resistor sampling board;

[0046] A second comparator, the second comparator being connected to the resistor sampling board;

[0047] A first follower, the first follower being connected to the first comparator;

[0048] A second follower, the second follower being connected to the second comparator;

[0049] A sampling chip, the sampling chip being respectively connected to the first follower and the second follower, and the sampling chip being configured to sample the voltage input by the voltage source.

[0050] In a possible example, the pre-charge controller further includes a first resistor, a second resistor, a first capacitor, a second capacitor, a third capacitor, and a fourth capacitor;

[0051] One end of the first resistor is respectively connected to the resistor sampling board, one end of the first capacitor, one end of the second capacitor, and the non-inverting input terminal of the first comparator, and the other end of the first resistor is connected to the other end of the first capacitor and the other end of the second capacitor. One end of the second resistor is respectively connected to the resistor sampling board, one end of the third capacitor, one end of the fourth capacitor, and the non-inverting input terminal of the second comparator, and the other end of the second resistor is connected to the other end of the third capacitor and the other end of the fourth capacitor.

[0052] In a third aspect, an embodiment of the present application provides a voltage calibration device, the device including an acquisition unit, a judgment unit, and a determination unit; wherein,

[0053] The acquisition unit is configured to acquire voltage information, and the voltage information includes a DC voltage range;

[0054] The determination unit is configured to determine a plurality of voltage calibration intervals according to the DC voltage range;

[0055] The determination unit is further configured to determine a plurality of sampling voltages corresponding to each voltage calibration interval;

[0056] The determination unit is further configured to determine a calibration parameter for each voltage calibration interval according to the plurality of sampling voltages;

[0057] The determination unit is further configured to determine a voltage calibration formula for each voltage calibration interval according to the calibration parameter;

[0058] The determination unit is further configured to determine a target voltage after calibration of the current sampling voltage according to the voltage calibration formula and the current sampling voltage.

[0059] A fourth aspect of the present application provides an electronic device, including: a processor and a memory; and one or more programs, where the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for performing some or all of the steps described in the first aspect.

[0060] A fifth aspect of the embodiments of the present application provides a computer-readable storage medium, where the computer-readable storage medium is used to store a computer program, and the computer program enables a computer to execute instructions for performing some or all of the steps described in the first aspect of the embodiments of the present application.

[0061] A sixth aspect of the embodiments of the present application provides a computer program product, where the computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to enable a computer to execute some or all of the steps described in the first aspect of the embodiments of the present application. The computer program product can be a software installation package.

[0062] It can be seen that in the embodiments of the present application, the pre-charge controller first obtains voltage information, where the voltage information includes a DC voltage range, then determines a plurality of voltage calibration intervals according to the DC voltage range, then determines a plurality of sampling voltages corresponding to each voltage calibration interval, further determines calibration parameters for each voltage calibration interval according to the plurality of sampling voltages, and further determines a voltage calibration formula for each voltage calibration interval according to the calibration parameters. Finally, according to the voltage calibration formula and the current sampling voltage, the target voltage after calibration of the current sampling voltage is determined. By dividing the DC voltage range into a plurality of voltage calibration intervals, it is ensured that the sampling voltage in each voltage calibration interval has a linear relationship with the actual output voltage of the voltage source, so that the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampling voltage, which is beneficial to improving the accuracy of DC high-voltage sampling voltage calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0064] Figure 1 is a schematic diagram of the architecture of a pre-charge controller provided by an embodiment of the present application;

[0065] Figure 2 is a circuit diagram of a pre-charge controller provided by an embodiment of the present application;

[0066] Figure 3 It is a schematic flowchart of a voltage calibration method provided by an embodiment of the present application;

[0067] Figure 4 It is a schematic flowchart of a process for determining calibration parameters provided by an embodiment of the present application;

[0068] Figure 5 It is a schematic flowchart of a process for dividing calibration intervals provided by an embodiment of the present application;

[0069] Figure 6 It is another schematic flowchart of a process for dividing calibration intervals provided by an embodiment of the present application;

[0070] Figure 7 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application;

[0071] Figure 8 It is a block diagram of the functional units of a voltage calibration device provided by an embodiment of the present application. Detailed implementation manners

[0072] In order to enable those skilled in the art to better understand the solution of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present application.

[0073] The terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products or devices.

[0074] Referring to "embodiment" in this context means that a specific feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0075] In the embodiments of the present application, "and / or" describes the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent the following three situations: A exists alone; A and B exist simultaneously; B exists alone. Among them, A and B can be singular or plural.

[0076] In the embodiments of the present application, the symbol " / " can indicate that the front and rear associated objects have an "or" relationship. Additionally, the symbol " / " can also represent a division sign, that is, perform a division operation. For example, A / B can represent A divided by B.

[0077] "At least one (piece)" or its similar expressions in the embodiments of the present application refer to any combination of these items, including any combination of single item (piece) or plural items (pieces), referring to one or more, and multiple referring to two or more. For example, at least one (piece) of a, b, or c can represent the following seven situations: a, b, c, a and b, a and c, b and c, a, b, and c. Among them, each of a, b, and c can be an element or a set containing one or more elements.

[0078] "Equal to" in the embodiments of the present application can be used in combination with "greater than", applicable to the technical solutions adopted when it is greater than, and can also be used in combination with "less than", applicable to the technical solutions adopted when it is less than. When "equal to" is used in combination with "greater than", it is not used in combination with "less than"; when "equal to" is used in combination with "less than", it is not used in combination with "greater than".

[0079] To better understand the solutions of the embodiments of the present application, the electronic devices, related concepts, and backgrounds that may be involved in the embodiments of the present application will be introduced first below.

[0080] The electronic device in the application embodiment is a device with wireless communication function, which can be called a terminal, user equipment (UE), mobile station (MS), mobile terminal (MT), access terminal device, in-vehicle terminal device, industrial control terminal device, UE unit, UE station, mobile station, remote station, remote terminal device, mobile device, UE terminal device, wireless communication device, UE agent or UE device, etc. The terminal device can be fixed or mobile. It should be noted that the terminal device can support at least one wireless communication technology, such as LTE, new radio (NR), wideband code division multiple access (WCDMA), etc. For example, the terminal device can be a mobile phone, tablet (pad), desktop computer, laptop computer, all-in-one computer, in-vehicle terminal, virtual reality (VR) terminal device, augmented reality (AR) terminal device, wireless terminal in industrial control, wireless terminal in self-driving, wireless terminal in remote medical surgery, wireless terminal in smart grid, wireless terminal in transportation safety, wireless terminal in smart city, wireless terminal in smart home, cellular phone, cordless phone, session initiation protocol (SIP) phone, wireless local loop (WLL) station, personal digital assistant (PDA), handheld device with wireless communication function, electronic device or other processing devices connected to a wireless modem, wearable device, terminal device in a future mobile communication network or terminal device in a future evolved public land mobile network (PLMN), etc. The electronic device can be a pre-charge controller.

[0081] Please refer to Figure 1 , Figure 1 which is a schematic architecture diagram of a pre-charge controller provided by an embodiment of the present application. As Figure 1As shown, the pre-charge controller 1 includes: a high-voltage input voltage Vin, a high-voltage output voltage Vout, a resistor sampling board 10, a first comparator 20, a second comparator 30, a first follower 40, a second follower 50, and a sampling chip 60.

[0082] Among them, the resistor sampling board 10 is respectively connected to the high-voltage input voltage Vin and the high-voltage output voltage Vout. The first comparator 20 is connected to the resistor sampling board 10, the second comparator 30 is connected to the resistor sampling board 10, the first follower 40 is connected to the first comparator 20, the second follower 50 is connected to the second comparator 30, and the sampling chip 60 is respectively connected to the first follower 40 and the second follower 50. The sampling chip 60 is used to sample the voltage input by the voltage source.

[0083] Among them, the voltage source can output a voltage to the high-voltage input voltage Vin.

[0084] Please refer to Figure 2 , Figure 2 is the circuit diagram of a pre-charge controller provided by an embodiment of the present application. The pre-charge controller 1 further includes a first resistor R1, a second resistor R2, a first capacitor C1, a second capacitor C2, a third capacitor C3, and a fourth capacitor C4. One end of the first resistor R1 is respectively connected to the resistor sampling board 10, one end of the first capacitor C1, one end of the second capacitor C2, and the non-inverting input terminal of the first comparator 20. The other end of the first resistor R1 is connected to the other end of the first capacitor C1 and the other end of the second capacitor C2. One end of the second resistor R2 is respectively connected to the resistor sampling board 10, one end of the third capacitor C3, one end of the fourth capacitor C4, and the non-inverting input terminal of the second comparator 30. The other end of the second resistor R2 is connected to the other end of the third capacitor C3 and the other end of the fourth capacitor C4. The resistor sampling board 10 includes a third resistor R3 and a fourth resistor R4. The third resistor R3 is obtained by connecting four 1MΩ resistors in series, and the fourth resistor R4 is obtained by connecting four 1MΩ resistors in series. The first resistor R1 and the third resistor R3 form a voltage division, and the second resistor R2 and the fourth resistor R4 form a voltage division. The voltage after voltage division is within the range of 2V and will not exceed the reference of 2.048V of the sampling chip 60. The reason for adding the follower is that the input impedance of the follower is large and the output impedance is small. Therefore, the voltage obtained by voltage division passes through the follower and then enters the comparator, and the voltage will not be affected by the input impedance of the sampling chip 60 in terms of accuracy.

[0085] Among them, the sampling chip 60 can be an ADC sampling chip, which is not limited herein.

[0086] Among them, the inverting input terminal of the first comparator 20 is connected to the other end of the first follower 40, the non-inverting input terminal of the first comparator 20 is connected to the other end of the second capacitor C2, and the output terminal of the first comparator 20 is connected to one end of the first follower 40; the inverting input terminal of the second comparator 30 is connected to the other end of the second follower 50, the non-inverting input terminal of the second comparator 30 is connected to the other end of the fourth capacitor C4, and the output terminal of the second comparator 30 is connected to one end of the second follower 50.

[0087] Among them, the first resistor R1 is connected to the analog circuit ground terminal AGND, and the second resistor R2 is connected to the analog circuit ground terminal AGND.

[0088] In a possible example, the pre-charge controller 1 first obtains voltage information, where the voltage information includes the DC voltage range. Then, the pre-charge controller 1 determines multiple voltage calibration intervals according to the DC voltage range. Next, the pre-charge controller 1 determines multiple sampling voltages corresponding to each voltage calibration interval. Further, the pre-charge controller 1 determines the calibration parameters for each voltage calibration interval according to the multiple sampling voltages. Still further, the pre-charge controller 1 determines the voltage calibration formula for each voltage calibration interval according to the calibration parameters. Finally, the pre-charge controller 1 determines the target voltage after calibration of the current sampling voltage according to the voltage calibration formula and the current sampling voltage. By dividing the DC voltage range into multiple voltage calibration intervals, it is ensured that the sampling voltage and the actual output voltage of the voltage source are linearly related in each voltage calibration interval. In this way, the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampling voltage, which is beneficial to improving the accuracy of DC high-voltage sampling voltage calibration.

[0089] Please refer to Figure 3 , Figure 3 which is a schematic flow chart of a voltage calibration method provided by an embodiment of the present application and is applied to a pre-charge controller; the method includes:

[0090] Step S301: Obtain voltage information, where the voltage information includes the DC voltage range.

[0091] Among them, the DC voltage range refers to the voltage range of the high-voltage input voltage Vin and the high-voltage output voltage Vout, for example, 150V - 950V, or it can be other voltage ranges, which are not limited here.

[0092] Among them, the voltage source can output voltage to the high-voltage input voltage Vin. For example, a standard voltage source can output voltage 150V to the high-voltage input voltage Vin, and the standard voltage source can output voltage 350V to the high-voltage input voltage Vin.

[0093] Step S302: Determine multiple voltage calibration intervals according to the DC voltage range.

[0094] Among them, multiple voltage calibration intervals are obtained by dividing the DC voltage range, and the division method is not limited. For example: it can be an equal division method. If the DC voltage range is 150V - 950V and the DC voltage range is divided into four voltage calibration intervals, then the four voltage calibration intervals are [150V, 350V], [350V, 550V], [550V, 750V], and [750V, 950V].

[0095] Among them, the sampling voltage corresponding to each voltage calibration interval has a linear relationship with the actual output voltage of the voltage source. For example: the sampling voltage and the actual output voltage of the voltage source are in a direct proportional relationship.

[0096] Among them, the linear relationship between the sampling voltage corresponding to each voltage calibration interval and the actual output voltage of the voltage source is the same or different, which is not limited here.

[0097] Step S303: Determine multiple sampling voltages corresponding to each voltage calibration interval.

[0098] Among them, each voltage calibration interval can correspond to multiple sampling voltages. Taking the voltage calibration interval [150V, 350V] as an example, when a standard voltage source outputs 150V voltage to the high-voltage input voltage Vin, the sampling voltage at this time is 150.502. When a standard voltage source outputs 200V voltage to the high-voltage input voltage Vin, the sampling voltage at this time is 200.5894. When a standard voltage source outputs 350V voltage to the high-voltage input voltage Vin, the sampling voltage at this time is 350.143.

[0099] Step S304: Determine the calibration parameters for each voltage calibration interval according to the multiple sampling voltages.

[0100] Among them, the calibration parameter is the linear relationship parameter between the sampling voltage and the actual output voltage of the voltage source.

[0101] Among them, the calibration parameter includes a first sub-calibration parameter and a second sub-calibration parameter. The first sub-calibration parameter is the proportional coefficient, and the second sub-calibration parameter is the constant.

[0102] Step S305: Determine the voltage calibration formula for each voltage calibration interval according to the calibration parameters.

[0103] Among them, the voltage calibration formula is used to characterize the linear relationship between the sampling voltage and the actual output voltage of the voltage source.

[0104] Step S306: Determine the target voltage after calibration of the current sampling voltage according to the voltage calibration formula and the current sampling voltage.

[0105] Among them, the target voltage is actually the actual output voltage of the voltage source corresponding to the current sampled voltage. For example, when the current sampled voltage is 150.502, the target voltage obtained after calibration is 150V.

[0106] It can be seen that in the embodiment of the present application, the pre-charge controller first obtains voltage information, where the voltage information includes the DC voltage range. Then, according to the DC voltage range, multiple voltage calibration intervals are determined. Next, multiple sampled voltages corresponding to each voltage calibration interval are determined. Further, according to the multiple sampled voltages, the calibration parameters for each voltage calibration interval are determined. Still further, according to the calibration parameters, the voltage calibration formula for each voltage calibration interval is determined. Finally, according to the voltage calibration formula and the current sampled voltage, the target voltage after calibration of the current sampled voltage is determined. By dividing the DC voltage range into multiple voltage calibration intervals, it is ensured that the relationship between the sampled voltage and the actual output voltage of the voltage source in each voltage calibration interval is linear. In this way, the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampled voltage, which is beneficial to improving the accuracy of DC high-voltage sampled voltage calibration.

[0107] In a possible example, please refer to Figure 4 , Figure 4 is a schematic flow chart of a process for determining calibration parameters provided by an embodiment of the present application. The calibration parameters include a first sub-calibration parameter and a second sub-calibration parameter. In terms of determining the calibration parameters for each voltage calibration interval according to the multiple sampled voltages, the above method may include the following steps: S401, determining a first sampled voltage corresponding to the lower voltage limit value and a second sampled voltage corresponding to the upper voltage limit value of each voltage calibration interval; S402, determining the first sub-calibration parameter according to the lower voltage limit value, the upper voltage limit value, the first sampled voltage, and the second sampled voltage; S403, determining the second sub-calibration parameter according to the first sampled voltage, the first sub-calibration parameter, and the lower voltage limit value.

[0108] For example, if the voltage calibration interval is [150V, 350V], then the lower voltage limit value is 150, the upper voltage limit value is 350V, the first sampled voltage corresponding to the lower voltage limit value is 150.502, and the second sampled voltage corresponding to the upper voltage limit value is 350.143.

[0109] Among them, the first sub-calibration parameter = (the second sampled voltage - the first sampled voltage) / (the upper voltage limit value - the lower voltage limit value).

[0110] Among them, the second sub-calibration parameter = the lower voltage limit value - (the first sampled voltage × the first sub-calibration parameter).

[0111] Exemplarily, if the voltage calibration range is [150V, 350V], the first sampled voltage corresponding to the lower voltage limit value is 150.502, the second sampled voltage corresponding to the upper voltage limit value is 350.143, the first sub-calibration parameter K1 = (350 - 150) / (350.143 - 150.502) = 0.998255, and the second sub-calibration parameter B1 = 150 - (150.502 × K1) = -0.23937401. Then, at this time, the voltage calibration formula corresponding to [150V, 350V] is the actual output voltage f1(x) of the voltage source = K1 × sampled voltage + B1 = 0.998255 × x + B1, where x is the sampled voltage. Similarly, for [350V, 550V], [550V, 750V], and [750V, 950V], the corresponding calibration parameters are also calculated. For [350V, 550V], the third sub-calibration parameter K2 and the fourth sub-calibration parameter B2 can be calculated correspondingly. For [550V, 750V], the fifth sub-calibration parameter K3 and the sixth sub-calibration parameter B3 can be calculated correspondingly. For [750V, 950V], the seventh calibration parameter K4 and the eighth sub-calibration parameter B4 can be calculated correspondingly. Then, at this time, the voltage calibration formula corresponding to [350V, 550V] is the actual output voltage f2(x) of the voltage source = K2 × x + B2, the voltage calibration formula corresponding to [550V, 750V] is the actual output voltage f3(x) of the voltage source = K3 × x + B3, and the voltage calibration formula corresponding to [750V, 950V] is the actual output voltage f4(x) of the voltage source = K4 × x + B4.

[0112] It can be seen that in this example, by calculating the calibration parameters corresponding to each voltage calibration range, the calibration formula corresponding to each voltage calibration range can be obtained, and by calibrating the sampled voltage, the missing actual output voltage data of the voltage source can be supplemented, which is beneficial to improving the accuracy of DC high-voltage sampled voltage calibration.

[0113] In a possible example, please refer to Figure 5 , Figure 5 is a schematic flowchart of a process for dividing a calibration range provided by an embodiment of the present application. In terms of determining the first calibration parameter of the target camera according to the first coordinate and the second coordinate, the above method may include the following steps: S501, obtaining the first voltage sampling data of the first voltage calibration range, where the first voltage calibration range is any one of the multiple voltage calibration ranges; S502, determining the first error of the first voltage calibration range according to the first voltage sampling data; S503, if it is determined that the first error is greater than a preset threshold, determining a target voltage value according to the first error; S504, dividing the first voltage calibration range into a first sub-voltage calibration range and a second sub-voltage calibration range according to the target voltage value.

[0114] Among them, considering that some actual output voltage values in a single first voltage calibration interval may deviate from the calibrated target voltage, it is possible to analyze whether the first error in the first voltage calibration interval deviates excessively, and then select whether to divide the first voltage calibration interval, and recalculate the calibration parameters of the divided first sub-voltage calibration interval and the calibration parameters of the second sub-voltage calibration interval to improve the calibration accuracy.

[0115] Among them, the first voltage sampling data includes multiple third sampling voltages corresponding to multiple voltage values in the first voltage calibration interval.

[0116] Among them, the first error is the maximum residual in the first voltage calibration interval. A residual can be calculated for each group of sampling voltages and the corresponding voltage values in the first voltage calibration interval. Therefore, multiple residuals can be calculated for the first voltage calibration interval, and the largest residual among the multiple residuals is the first error.

[0117] Among them, the preset threshold can be set manually or by default in the system, and no limitation is made here.

[0118] Among them, the target voltage value is the voltage value corresponding to the first error in the first voltage calibration interval. For example: if the first voltage calibration interval is [150V, 350V], and the voltage value corresponding to the first error in the first voltage calibration interval is 200V, then the target voltage value is 200V. At this time, [150V, 350V] is divided into a first sub-voltage calibration interval [150V, 200V] and a second sub-voltage calibration interval [200V, 350V].

[0119] It can be seen that in this example, by determining the first error of the first voltage calibration interval, and when the first error is greater than the preset threshold, that is, when it deviates excessively, determining the target voltage value of the first error, and dividing the first voltage calibration interval into a first sub-voltage calibration interval and a second sub-voltage calibration interval based on the target voltage value, it is beneficial to improve the calibration accuracy of the DC high-voltage sampling voltage.

[0120] In a possible example, the determining the first error of the first voltage calibration interval according to the first voltage sampling data includes: fitting the first voltage sampling data to obtain a fitting result; determining multiple residuals according to the fitting result and the voltage calibration formula; and taking the largest residual among the multiple residuals as the first error.

[0121] Among them, a fitting data set can be determined according to the first voltage sampling data and the first voltage calibration interval. The fitting data set includes multiple data points, and a single data point is (x j , y j ), where x j represents the third sampling voltage, and y jRepresents the actual value of the output voltage of the voltage source corresponding to the third sampling voltage. The least squares method can be used to fit multiple data points to obtain the polynomial F(x) = ax 2 + bx + c, which is the fitting result. A system of equations can be established to solve for the coefficients a, b, and c.

[0122] Among them, the residual = |F(x) - f(x)|. The residual of each data point can be calculated according to the aforementioned formula to obtain multiple residuals.

[0123] Among them, the first error = max|F(x) - f(x)|. The maximum residual among multiple residuals can be calculated according to the aforementioned formula, and this maximum residual is used as the first error.

[0124] It can be seen that in this example, the first voltage sampling data can be fitted to obtain the fitting result, and further, according to the fitting result and the voltage calibration formula, the residual of each data point can be determined. Finally, the maximum residual is used as the first error, and the first error is analyzed to determine whether to divide the first voltage calibration interval, which is beneficial to improving the accuracy of DC high-voltage sampling voltage calibration.

[0125] In a possible example, please refer to Figure 6 , Figure 6 which is a schematic flow chart of another method for dividing the calibration interval provided by an embodiment of the present application. After determining the calibration parameters of each voltage calibration interval according to the multiple sampling voltages, the above method may include the following steps: S601, obtaining the second voltage sampling data of the second target voltage calibration interval, where the second voltage calibration interval is any one of the multiple voltage calibration intervals; S602, determining the second error of the second target voltage calibration interval; S603, determining the error threshold according to the second error; S604, determining the sensitivity corresponding to each sampling voltage in the second voltage sampling data to obtain multiple sensitivities; S605, determining the target voltage corresponding to the maximum sensitivity among the multiple sensitivities; S606, determining the third sub-voltage calibration interval and the fourth sub-voltage calibration interval according to the target voltage and the second target voltage calibration interval; S607, respectively determining the third error of the third sub-voltage calibration interval and the fourth error of the fourth sub-voltage calibration interval; S608, if it is determined that the third error is less than the error threshold and the fourth error is less than the error threshold, then it is determined to divide the second target voltage calibration interval into the third sub-voltage calibration interval and the fourth sub-voltage calibration interval.

[0126] Among them, the second error = max|F(x) - f(x)|. The maximum residual among the multiple residuals in the second voltage calibration interval can be calculated according to the foregoing formula, and this maximum residual is used as the second error; the maximum residual among the multiple residuals in the third sub-voltage calibration interval can be calculated according to the foregoing formula, and this maximum residual is used as the third error; the maximum residual among the multiple residuals in the fourth sub-voltage calibration interval can be calculated according to the foregoing formula, and this maximum residual is used as the second error.

[0127] Among them, the error threshold = the second error × the first preset proportionality coefficient. The first preset proportionality coefficient can be set manually or default by the system and is not limited here. For example, the first preset proportionality coefficient is 0.895.

[0128] Among them, the sensitivity is used to characterize the influence degree of the small change of a single sampling voltage on the error of the entire second target voltage calibration interval. The greater the sensitivity, the greater the influence of the small change of a single sampling voltage on the error of the entire second target voltage calibration interval; the smaller the sensitivity, the smaller the influence of the small change of a single sampling voltage on the error of the entire second target voltage calibration interval.

[0129] Among them, the target voltage can be any voltage value in the second target voltage calibration interval except the upper voltage limit value and the lower voltage limit value.

[0130] Exemplarily, the second target voltage calibration interval is [550V, 750V], and the target voltage corresponding to the maximum sensitivity among the multiple sensitivities is 680V. Then the second target voltage calibration interval [550V, 750V] can be divided into a third sub-voltage calibration interval [550V, 680V] and a fourth sub-voltage calibration interval [680V, 750V].

[0131] Among them, when the third error is less than the error threshold and the fourth error is less than the error threshold, it indicates that after the second target voltage calibration interval is divided, the error of the interval is greatly reduced, indicating that the division of the second target voltage calibration interval will be beneficial to improving the calibration accuracy. When the third error is greater than or equal to the error threshold or the fourth error is greater than or equal to the error threshold, it indicates that after the second target voltage calibration interval is divided, the error reduction of the interval is not obvious or there is no reduction. At this time, even if the second target voltage calibration interval is divided, it is not beneficial to improving the calibration accuracy.

[0132] It can be seen that in this example, the sensitivity corresponding to each sampling voltage can be determined, the target voltage corresponding to the maximum sensitivity can be determined, and when verifying the division of the second target voltage calibration interval with the target voltage, by judging whether the errors of the third sub-voltage calibration interval and the fourth sub-voltage calibration interval are both less than the error threshold, to determine whether to finally divide the second target voltage calibration interval with the target voltage, which is beneficial to improving the accuracy of the DC high-voltage sampling voltage calibration.

[0133] In a possible example, in the aspect of determining the sensitivity corresponding to each sampled voltage in the second voltage sampled data to obtain multiple sensitivities, the above method may include the following steps: determining the perturbation value of the second voltage sampled data; determining a first set of voltage data of forward perturbation according to the perturbation value and the second voltage sampled data; determining a second set of voltage data of reverse perturbation according to the perturbation value and the second voltage sampled data; and determining the sensitivity of each voltage according to the first set of voltage data, the second set of voltage data, and the perturbation value to obtain multiple sensitivities.

[0134] Wherein, each sampled voltage corresponds to a perturbation value, and multiple perturbation values can be correspondingly determined from the second voltage sampled data.

[0135] Wherein, the perturbation value = the second preset proportionality coefficient × the sampled voltage.

[0136] Wherein, the second preset proportionality coefficient can be set manually or defaulted by the system, and is not limited herein. For example, the second preset proportionality coefficient is 0.001.

[0137] Wherein, the first set of voltage data includes multiple first voltage values. The voltage value obtained by adding the perturbation value corresponding to the target third sampled voltage in the second voltage sampled data to the target third sampled voltage is used as the first voltage value, that is, the first voltage value = the target third sampled voltage + the perturbation value. The third sampled voltages other than the target third sampled voltage are directly used as the first voltage values, and the obtained multiple first voltage values are used as the first set of voltage data. The target third sampled voltage is any one of the third sampled voltages in the second voltage sampled data. In this way, multiple first sets of voltage data can be obtained.

[0138] Wherein, the second set of voltage data includes multiple second voltage values. The voltage value obtained by subtracting the perturbation value corresponding to the target third sampled voltage in the second voltage sampled data from the target third sampled voltage is used as the second voltage value, that is, the second voltage value = the target third sampled voltage + the perturbation value. The third sampled voltages other than the target third sampled voltage are directly used as the second voltage values, and the obtained multiple second voltage values are used as the first set of voltage data. The target third sampled voltage is any one of the third sampled voltages in the second voltage sampled data. In this way, multiple second sets of voltage data can be obtained.

[0139] Specifically, the fourth error of the first set of voltage data corresponding to the same perturbation value and the fifth error of the second set of voltage data can be calculated respectively, and further the sensitivity corresponding to each third sampled voltage can be calculated according to the sensitivity formula. The sensitivity formula is as follows: (the fourth error - the fifth error) / 2 × the perturbation value.

[0140] It can be seen that in this example, the sensitivity corresponding to each sampling voltage can be determined, and by analyzing the sensitivity to determine whether to divide the second target voltage calibration interval, it is beneficial to improve the accuracy of DC high-voltage sampling voltage calibration.

[0141] In a possible example, in terms of determining a plurality of voltage calibration intervals according to the DC voltage range, determine the target number of segments required for the DC voltage range; divide the DC voltage range evenly according to the target number to obtain the plurality of voltage calibration intervals.

[0142] Among them, the number of segments to be divided can be determined according to the size of the DC voltage range. The larger the DC voltage range, the more segments; the smaller the DC voltage range, the fewer segments. For example: if the DC voltage range is greater than or equal to the first preset voltage threshold and less than the second preset voltage threshold, it is divided into four segments; if the DC voltage range is greater than or equal to the second preset voltage threshold and less than the third preset voltage threshold, it is divided into five segments; if the DC voltage range is greater than or equal to the fourth preset voltage threshold, it is divided into six segments.

[0143] Exemplarily, if the DC voltage range is 150V - 950V, the first preset voltage threshold is 600, and the second preset voltage threshold is 1000, then the DC voltage range is divided into four voltage calibration intervals, and the four voltage calibration intervals obtained are [150V, 350V], [350V, 550V], [550V, 750V], and [750V, 950V].

[0144] It can be seen that in this example, by reasonably dividing the DC voltage range into multiple voltage calibration intervals, the sampling voltage in each voltage calibration interval has a linear relationship with the actual output voltage of the voltage source. In this way, the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampling voltage, which is beneficial to improving the accuracy of DC high-voltage sampling voltage calibration.

[0145] Please refer to Figure 7 , Figure 7 which is a schematic structural diagram of an electronic device provided by an embodiment of the present application and is applied to a pre-charge controller; as Figure 7 shown, the electronic device includes a processor, a memory, a communication interface, and one or more programs. Among them, the above one or more programs are stored in the above memory, and the above one or more programs are configured with instructions for the above processor to execute the following steps:

[0146] Obtain voltage information, where the voltage information includes a DC voltage range;

[0147] Determine a plurality of voltage calibration intervals according to the DC voltage range;

[0148] Determine a plurality of sampling voltages corresponding to each voltage calibration interval;

[0149] Determine calibration parameters for each voltage calibration interval according to the multiple sampled voltages;

[0150] Determine a voltage calibration formula for each voltage calibration interval according to the calibration parameters;

[0151] Determine the target voltage after calibration of the current sampled voltage according to the voltage calibration formula and the current sampled voltage.

[0152] It can be seen that in the embodiments of the present application, the electronic device can first obtain voltage information, where the voltage information includes the DC voltage range. Then, according to the DC voltage range, determine multiple voltage calibration intervals. Next, determine multiple sampled voltages corresponding to each voltage calibration interval. Further, according to the multiple sampled voltages, determine calibration parameters for each voltage calibration interval. Still further, according to the calibration parameters, determine a voltage calibration formula for each voltage calibration interval. Finally, according to the voltage calibration formula and the current sampled voltage, determine the target voltage after calibration of the current sampled voltage. By dividing the DC voltage range into multiple voltage calibration intervals, it is ensured that the sampled voltage in each voltage calibration interval has a linear relationship with the actual output voltage of the voltage source. In this way, the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampled voltage, which is beneficial to improving the accuracy of DC high-voltage sampled voltage calibration.

[0153] In a possible example, the calibration parameters include a first sub-calibration parameter and a second sub-calibration parameter; in terms of determining calibration parameters for each voltage calibration interval according to the multiple sampled voltages, the above program includes instructions for performing the following steps:

[0154] Determine a first sampled voltage corresponding to the lower voltage limit value and a second sampled voltage corresponding to the upper voltage limit value of each voltage calibration interval;

[0155] Determine the first sub-calibration parameter according to the lower voltage limit value, the upper voltage limit value, the first sampled voltage, and the second sampled voltage;

[0156] Determine the second sub-calibration parameter according to the first sampled voltage, the first sub-calibration parameter, and the lower voltage limit value.

[0157] In a possible example, after determining calibration parameters for each voltage calibration interval according to the multiple sampled voltages, the above program includes instructions for performing the following steps:

[0158] Obtain first voltage sampling data of a first voltage calibration interval, where the first voltage calibration interval is any one of the multiple voltage calibration intervals;

[0159] Determine a first error of the first voltage calibration interval according to the first voltage sampling data;

[0160] If it is determined that the first error is greater than a preset threshold, determine a target voltage value according to the first error;

[0161] Divide the first voltage calibration interval into a first sub-voltage calibration interval and a second sub-voltage calibration interval according to the target voltage value.

[0162] In a possible example, in terms of determining the first error of the first voltage calibration interval according to the first voltage sampling data, the above program includes instructions for performing the following steps:

[0163] Fit the first voltage sampling data to obtain a fitting result;

[0164] Determine a plurality of residuals according to the fitting result and the voltage calibration formula;

[0165] Take the maximum residual among the plurality of residuals as the first error.

[0166] In a possible example, after determining the calibration parameters of each voltage calibration interval according to the plurality of sampled voltages, the above program includes instructions for performing the following steps:

[0167] Obtain second voltage sampling data of a second target voltage calibration interval, where the second voltage calibration interval is any one of the plurality of voltage calibration intervals;

[0168] Determine a second error of the second target voltage calibration interval;

[0169] Determine an error threshold according to the second error;

[0170] Determine the sensitivity corresponding to each sampled voltage in the second voltage sampling data to obtain a plurality of sensitivities;

[0171] Determine the target voltage corresponding to the maximum sensitivity among the plurality of sensitivities;

[0172] Determine a third sub-voltage calibration interval and a fourth sub-voltage calibration interval according to the target voltage and the second target voltage calibration interval;

[0173] Respectively determine a third error of the third sub-voltage calibration interval and a fourth error of the fourth sub-voltage calibration interval;

[0174] If it is determined that the third error is less than the error threshold and the fourth error is less than the error threshold, determine to divide the second target voltage calibration interval into the third sub-voltage calibration interval and the fourth sub-voltage calibration interval.

[0175] In a possible example, in the aspect of determining the sensitivity corresponding to each sampled voltage in the second voltage sampling data to obtain multiple sensitivities, the above program further includes instructions for performing the following steps:

[0176] Determine the perturbation value of the second voltage sampling data;

[0177] According to the perturbation value and the second voltage sampling data, determine multiple first voltage data sets for forward perturbation;

[0178] According to the perturbation value and the second voltage sampling data, determine multiple second voltage data sets for reverse perturbation;

[0179] According to the first voltage data set, the second voltage data set and the perturbation value, determine the sensitivity of each voltage to obtain multiple sensitivities.

[0180] In a possible example, in the aspect of determining multiple voltage calibration intervals according to the DC voltage range, the above program further includes instructions for performing the following steps:

[0181] Determine the target number of segments required for the DC voltage range;

[0182] Divide the DC voltage range evenly according to the target number to obtain the multiple voltage calibration intervals.

[0183] The above mainly introduces the solution of the embodiment of the present application from the perspective of the execution process on the method side. It can be understood that in order for an electronic device to implement the above functions, it includes the corresponding hardware structure and / or software module for executing each function. Those skilled in the art should easily realize that, combining the units and algorithm steps of each example described in the embodiments provided in this article, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a certain function is executed in the way of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0184] The embodiment of the present application can divide the functional units of the electronic device according to the above method examples. For example, each functional unit can be divided corresponding to each function, or two or more functions can be integrated into one processing unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit. It should be noted that the division of units in the embodiment of the present application is illustrative, only a logical function division, and there can be other division methods in actual implementation.

[0185] In the case of dividing each functional module according to each function, Figure 8 a block diagram of the functional unit composition of a voltage calibration device is given, which is applied to a pre-charge controller, as Figure 8 shown. The device includes an acquisition unit 801 and a determination unit 802; wherein,

[0186] the acquisition unit 801 is configured to acquire voltage information, and the voltage information includes a DC voltage range;

[0187] the determination unit 802 is configured to determine a plurality of voltage calibration intervals according to the DC voltage range;

[0188] the determination unit 802 is further configured to determine a plurality of sampling voltages corresponding to each voltage calibration interval;

[0189] the determination unit 802 is further configured to determine a calibration parameter for each voltage calibration interval according to the plurality of sampling voltages;

[0190] the determination unit 802 is further configured to determine a voltage calibration formula for each voltage calibration interval according to the calibration parameter;

[0191] the determination unit 802 is further configured to determine a target voltage after calibration of the current sampling voltage according to the voltage calibration formula and the current sampling voltage.

[0192] It can be seen that in the embodiment of the present application, the voltage calibration device can first acquire voltage information, where the voltage information includes a DC voltage range, then determine a plurality of voltage calibration intervals according to the DC voltage range, then determine a plurality of sampling voltages corresponding to each voltage calibration interval, further determine a calibration parameter for each voltage calibration interval according to the plurality of sampling voltages, then determine a voltage calibration formula for each voltage calibration interval according to the calibration parameter, and finally determine a target voltage after calibration of the current sampling voltage according to the voltage calibration formula and the current sampling voltage. By dividing the DC voltage range into a plurality of voltage calibration intervals, it is ensured that the sampling voltage in each voltage calibration interval has a linear relationship with the actual output voltage of the voltage source, so that the missing actual output voltage data of the voltage source can be supplemented by calibrating the sampling voltage, which is beneficial to improving the accuracy of DC high-voltage sampling voltage calibration.

[0193] In a possible example, the calibration parameter includes a first sub-calibration parameter and a second sub-calibration parameter; in terms of determining the calibration parameter for each voltage calibration interval according to the plurality of sampling voltages, the determination unit 802 is specifically configured to:

[0194] determine a first sampling voltage corresponding to the lower voltage limit value and a second sampling voltage corresponding to the upper voltage limit value of each voltage calibration interval;

[0195] Determine the first sub-calibration parameter according to the lower voltage limit value, the upper voltage limit value, the first sampled voltage, and the second sampled voltage;

[0196] Determine the second sub-calibration parameter according to the first sampled voltage, the first sub-calibration parameter, and the lower voltage limit value.

[0197] In a possible example, after determining the calibration parameter of each voltage calibration interval according to the multiple sampled voltages, the determining unit 802 is specifically configured to:

[0198] Obtain first voltage sampling data of a first voltage calibration interval, where the first voltage calibration interval is any one of the multiple voltage calibration intervals;

[0199] Determine a first error of the first voltage calibration interval according to the first voltage sampling data;

[0200] If it is determined that the first error is greater than a preset threshold, determine a target voltage value according to the first error;

[0201] Divide the first voltage calibration interval into a first sub-voltage calibration interval and a second sub-voltage calibration interval according to the target voltage value.

[0202] In a possible example, in terms of determining the first error of the first voltage calibration interval according to the first voltage sampling data, the determining unit 802 is specifically configured to:

[0203] Fit the first voltage sampling data to obtain a fitting result;

[0204] Determine a plurality of residuals according to the fitting result and the voltage calibration formula;

[0205] Take the maximum residual among the plurality of residuals as the first error.

[0206] In a possible example, after determining the calibration parameter of each voltage calibration interval according to the multiple sampled voltages, the determining unit 802 is further specifically configured to:

[0207] Obtain second voltage sampling data of a second target voltage calibration interval, where the second voltage calibration interval is any one of the multiple voltage calibration intervals;

[0208] Determine a second error of the second target voltage calibration interval;

[0209] Determine an error threshold according to the second error;

[0210] Determine the sensitivity corresponding to each sampled voltage in the second voltage sampling data to obtain multiple sensitivities;

[0211] Determine the target voltage corresponding to the maximum sensitivity among the multiple sensitivities;

[0212] Determine a third sub-voltage calibration interval and a fourth sub-voltage calibration interval according to the target voltage and the second target voltage calibration interval;

[0213] Respectively determine the third error of the third sub-voltage calibration interval and the fourth error of the fourth sub-voltage calibration interval;

[0214] If it is determined that the third error is less than the error threshold and the fourth error is less than the error threshold, then determine to divide the second target voltage calibration interval into the third sub-voltage calibration interval and the fourth sub-voltage calibration interval.

[0215] In a possible example, in terms of determining the sensitivity corresponding to each sampled voltage in the second voltage sampling data to obtain multiple sensitivities, the determining unit 802 is specifically configured to:

[0216] Determine the perturbation value of the second voltage sampling data;

[0217] According to the perturbation value and the second voltage sampling data, determine multiple first voltage data sets for positive perturbation;

[0218] According to the perturbation value and the second voltage sampling data, determine multiple second voltage data sets for negative perturbation;

[0219] According to the first voltage data set, the second voltage data set and the perturbation value, determine the sensitivity of each voltage to obtain multiple sensitivities.

[0220] In a possible example, in terms of determining multiple voltage calibration intervals according to the DC voltage range, the determining unit 802 is further specifically configured to:

[0221] Determine the target number of segments required for the DC voltage range;

[0222] Divide the DC voltage range evenly according to the target number to obtain the multiple voltage calibration intervals.

[0223] It should be noted that all relevant contents of each step involved in the above method embodiments can be cited in the function descriptions of the corresponding functional modules, and will not be repeated here.

[0224] The electronic device provided in this embodiment is used to execute the above voltage calibration method, and thus can achieve the same effect as the above implementation method.

[0225] In the case of adopting integrated units, an electronic device may include a processing module, a storage module, and a communication module. Among them, the processing module may be used to control and manage the operations of the electronic device. For example, it may be used to support the electronic device in executing the steps performed by the above-mentioned functional units. The storage module may be used to support the electronic device in executing the storage of program codes and data, etc. The communication module may be used to support the communication between the electronic device and other devices.

[0226] Among them, the processing module may be a processor or a controller. It may implement or execute various exemplary logic blocks, modules, and circuits described in connection with the disclosure of the present application. The processor may also be a combination that realizes computing functions, such as a combination including one or more microprocessors, a combination of digital signal processing (DSP) and a microprocessor, and so on. The storage module may be a memory. The communication module may specifically be a device for interacting with other electronic devices, such as a radio frequency circuit, a Bluetooth chip, a Wi-Fi chip, etc.

[0227] An embodiment of the present application also provides a computer storage medium. Among them, the computer storage medium stores a computer program for electronic data exchange, and the computer program enables the computer to execute some or all of the steps of any of the methods described in the above method embodiments. The above computer includes an electronic device.

[0228] An embodiment of the present application also provides a computer program product. The above computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the above computer program is operable to enable the computer to execute some or all of the steps of any of the methods described in the above method embodiments. The computer program product may be a software installation package, and the above computer includes a control platform.

[0229] It should be noted that for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps may be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to the present application.

[0230] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0231] In several embodiments provided by the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the above-mentioned units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical or other form.

[0232] The units described above as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0233] In addition, in each embodiment of the present application, the functional units can be integrated into a processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0234] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to enable a computer device (which can be a personal computer, a server or a network device, etc.) to execute all or part of the steps of the above-mentioned methods in each embodiment of the present application. The aforementioned memory includes: USB flash drives, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), mobile hard disks, magnetic disks or optical disks and other media that can store program codes.

[0235] Those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing relevant hardware through a program. This program can be stored in a computer-readable memory. The memory can include: flash drives, read-only memories, random access memories, magnetic disks or optical disks, etc.

[0236] The above has introduced the embodiments of the present application in detail. Specific examples are used herein to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those of ordinary skill in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A voltage calibration method, characterized in that: Applied to a pre-charge controller; the method comprises: Acquiring voltage information, wherein the voltage information includes a DC voltage range; Determining a plurality of voltage calibration intervals according to the DC voltage range; Determine a plurality of sampling voltages corresponding to each voltage calibration interval; Determining calibration parameters for each voltage calibration interval according to the plurality of sampled voltages; Determining a voltage calibration formula for each voltage calibration interval according to the calibration parameters; According to the voltage calibration formula and the current sampling voltage, a target voltage after calibration of the current sampling voltage is determined.

2. The method according to claim 1, characterized in that The calibration parameter includes a first sub-calibration parameter and a second sub-calibration parameter; and determining the calibration parameter of each voltage calibration interval according to the multiple sampled voltages includes: Determine a first sampling voltage corresponding to a voltage lower limit value and a second sampling voltage corresponding to a voltage upper limit value of each voltage calibration interval; determining the first sub-calibration parameter according to the voltage lower limit value, the voltage upper limit value, the first sampled voltage, and the second sampled voltage; The second sub-calibration parameter is determined according to the first sampled voltage, the first sub-calibration parameter and the voltage lower limit value.

3. The method according to claim 1, characterized in that After determining the calibration parameters of each voltage calibration interval according to the multiple sampled voltages, the method further includes: Acquire first voltage sampling data of a first voltage calibration interval, where the first voltage calibration interval is any one of the multiple voltage calibration intervals; determining a first error in the first voltage calibration interval according to the first voltage sampling data; If it is determined that the first error is greater than a preset threshold, determining a target voltage value according to the first error; According to the target voltage value, the first voltage calibration interval is divided into a first sub-voltage calibration interval and a second sub-voltage calibration interval.

4. The method according to claim 3, characterized in that The determining, according to the first voltage sampling data, a first error in the first voltage calibration interval includes: Fitting the first voltage sampling data to obtain a fitting result; Determining a plurality of residuals according to the fitting result and the voltage calibration formula; The maximum residual among the plurality of residuals is taken as the first error.

5. The method according to claim 1, characterized in that After determining the calibration parameters of each voltage calibration interval according to the multiple sampled voltages, the method further includes: Acquire second voltage sampling data of a second target voltage calibration interval, where the second voltage calibration interval is any one of the multiple voltage calibration intervals; determining a second error of the second target voltage calibration interval; determining an error threshold according to the second error; Determine the sensitivity corresponding to each sampling voltage in the second voltage sampling data to obtain multiple sensitivities; determining a target voltage corresponding to a maximum sensitivity among a plurality of sensitivities; Determining a third sub-voltage calibration interval and a fourth sub-voltage calibration interval according to the target voltage and the second target voltage calibration interval; respectively determining a third error of the third sub-voltage calibration interval and a fourth error of the fourth sub-voltage calibration interval; If it is determined that the third error is smaller than the error threshold and the fourth error is smaller than the error threshold, it is determined to divide the second target voltage calibration interval into the third sub-voltage calibration interval and the fourth sub-voltage calibration interval.

6. The method according to claim 5, characterized in that The step of determining the sensitivity corresponding to each sampled voltage in the second voltage sampled data to obtain a plurality of sensitivities includes: Determining a disturbance value of the second voltage sampling data; Determining a plurality of first voltage data sets of forward disturbance according to the disturbance value and the second voltage sampling data; Determining a plurality of second voltage data sets of reverse disturbance according to the disturbance value and the second voltage sampling data; The sensitivity of each voltage is determined according to the first voltage data set, the second voltage data set and the disturbance value to obtain a plurality of sensitivities.

7. The method according to claim 1, characterized in that Determining a plurality of voltage calibration intervals according to the DC voltage range includes: determining a target number of segments required for the DC voltage range; The DC voltage range is evenly divided according to the target number to obtain the multiple voltage calibration intervals.

8. A pre-charge controller, characterized in that: The pre-charge controller is used to execute the method according to any one of claims 1 to 7, and the pre-charge controller includes: High voltage input voltage; High voltage output voltage; A resistance sampling board, wherein the resistance sampling board is connected to the high voltage input voltage and the high voltage output voltage respectively; A first comparator, wherein the first comparator is connected to the resistance sampling board; A second comparator, wherein the second comparator is connected to the resistance sampling board; a first follower, wherein the first follower is connected to the first comparator; a second follower, wherein the second follower is connected to the second comparator; A sampling chip, wherein the sampling chip is connected to the first follower and the second follower respectively, and the sampling chip is used for sampling the voltage input by the voltage source.

9. The pre-charge controller according to claim 8, characterized in that: The pre-charge controller also includes a first resistor, a second resistor, a first capacitor, a second capacitor, a third capacitor and a fourth capacitor; One end of the first resistor is respectively connected to the resistor sampling board, one end of the first capacitor, one end of the second capacitor and the non-inverting input end of the first comparator, the other end of the first resistor is connected to the other end of the first capacitor and the other end of the second capacitor, one end of the second resistor is respectively connected to the resistor sampling board, one end of the third capacitor, one end of the fourth capacitor and the non-inverting input end of the second comparator, and the other end of the second resistor is connected to the other end of the third capacitor and the other end of the fourth capacitor.

10. A voltage calibration device, characterized in that: Applied to a pre-charge controller; the voltage calibration device comprises an acquisition unit and a determination unit, wherein: The acquisition unit is used to acquire voltage information, wherein the voltage information includes a DC voltage range; The determining unit is used to determine a plurality of voltage calibration intervals according to the DC voltage range; The determining unit is further used to determine a plurality of sampling voltages corresponding to each voltage calibration interval; The determining unit is further configured to determine a calibration parameter of each voltage calibration interval according to the plurality of sampled voltages; The determining unit is further used to determine a voltage calibration formula for each voltage calibration interval according to the calibration parameters; The determining unit is further used to determine a target voltage after the current sampling voltage is calibrated according to the voltage calibration formula and the current sampling voltage.

Images