A rapid determination method for rare earth metals in alloys

Abstract

The present invention relates to the field of testing or analyzing materials technology, and specifically to a method for rapidly determining rare earth metals in alloys. The method comprises: obtaining each spectral line of the alloy to be tested, and obtaining each spectral line of each preset metal; determining the metal characteristic expression factor of each spectral line to be tested relative to each reference spectral line; determining the probability of a single metal corresponding to the spectral line to be tested; screening multi-metal combination spectral lines and single metal spectral lines, and determining the probability of each preset metal in each multi-metal combination spectral line based on the metal characteristic expression factor and wavelength of the reference spectral line corresponding to the multi-metal combination spectral line; determining the target presence possibility index of each preset metal in each multi-metal combination spectral line; and determining the metal element composition contained in the alloy to be tested, thereby achieving rapid determination of rare earth metals in the alloy. The present invention improves the accuracy of rare earth metal element detection through material analysis testing.

Description

Technical Field

[0001] The invention relates to the technical field of testing or analyzing materials, and in particular to a method for quickly determining rare earth metals in alloys. Background Art

[0002] Alloys containing different metal elements often have different functional uses. For example, due to the characteristics of titanium alloy such as low density, corrosion resistance, low temperature resistance and good biocompatibility, it is widely used in the aerospace field, medical equipment, chemical industry, automotive industry and military construction field. Different application scenarios often have different requirements for the metal element composition of titanium alloys. Therefore, it is crucial to detect the metal element composition of alloys. At present, when detecting metal elements in alloys, the method commonly used is: if the spectral line range of the metal is within the spectral line range of the alloy, it is determined that the metal exists in the alloy.

[0003] However, if the spectral line range of the rare earth metal is within the spectral line range of the alloy, the following technical problems often arise when determining the presence of the rare earth metal in the alloy:

[0004] Since there may be multiple metal elements that appear as similar elemental spectral lines, that is, there may be multiple elements corresponding to the same spectral line, therefore, directly detecting rare earth metal elements in alloys based on the spectral line range of the metal may lead to misjudgment of the rare earth metal elements in the alloy, resulting in poor accuracy of rare earth metal element detection in the alloy. Summary of the Invention

[0005] In order to solve the technical problem of poor accuracy in detecting rare earth metal elements in alloys, the present invention proposes a method for rapid determination of rare earth metals in alloys.

[0006] In a first aspect, the present invention provides a method for rapid determination of rare earth metals in an alloy, the method comprising:

[0007] Acquire each spectral line of the alloy to be detected as a spectral line to be detected, and acquire each spectral line of each preset metal as a reference spectral line;

[0008] Determining the metal characteristic expression factor of each spectral line to be detected relative to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line;

[0009] Determine the possibility of a single metal corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines, as well as the width of the left and right sides of each spectral line to be detected;

[0010] Based on all single metal possibilities, multi-metal combination spectral lines and single metal spectral lines are screened from all spectral lines to be detected, and the possibility of each preset metal in each multi-metal combination spectral line is determined based on the metal characteristic expression factor and wavelength of all reference spectral lines corresponding to each preset metal;

[0011] Determine the target presence index of each preset metal in each multi-metal combination spectral line based on the presence probability of each preset metal in each multi-metal combination spectral line and the metal characteristic expression factor of each multi-metal combination spectral line relative to the reference spectral line corresponding to each preset metal;

[0012] The metal element composition of the alloy to be tested is determined based on all possible indicators of the presence of the target and all single metal spectral lines.

[0013] In conjunction with the first aspect above, in one possible implementation, determining, based on the wavelengths corresponding to each spectral line to be detected and each reference spectral line, a metal characteristic expression factor of each spectral line to be detected relative to each reference spectral line includes:

[0014] Determine any one of the to-be-detected spectral lines as a marked to-be-detected spectral line, and determine any one of the reference spectral lines as a marked reference spectral line;

[0015] If the total width wavelength range corresponding to the marked reference spectrum line is within the total width wavelength range corresponding to the marked spectrum line to be detected, then determine the metal characteristic expression factor of the marked spectrum line to be detected with respect to the marked reference spectrum line according to the total width wavelength range corresponding to the marked reference spectrum line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectrum line to be detected, wherein the total width wavelength range corresponding to the spectrum line is the wavelength range where the widths on the left and right sides of the spectrum line are located;

[0016] If the total width wavelength range corresponding to the marked reference spectrum line is not within the total width wavelength range corresponding to the marked spectrum line to be detected, the preset value is determined as the metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line.

[0017] In combination with the first aspect above, in one possible implementation, determining the metal characteristic expression factor of the marked spectral line to be detected relative to the marked reference spectral line based on the total width wavelength range corresponding to the marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectral line to be detected includes:

[0018] Determine the wavelength corresponding to the peak value within the total width wavelength range corresponding to the marked reference spectrum line as the target wavelength corresponding to the marked reference spectrum line, and determine the wavelength corresponding to the peak value within the total width wavelength range corresponding to the marked spectrum line to be detected as the target wavelength corresponding to the marked spectrum line to be detected;

[0019] Determine the absolute value of the difference between the target wavelength corresponding to the marked reference spectral line and the target wavelength corresponding to the marked spectral line to be detected as the target wavelength difference between the marked reference spectral line and the marked spectral line to be detected;

[0020] The metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line is determined according to the target wavelength difference between the marked reference spectrum line and the marked spectrum line to be detected, wherein the target wavelength difference is negatively correlated with the metal characteristic expression factor.

[0021] In combination with the first aspect above, in one possible implementation, determining the likelihood of a single metal corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines and the widths on the left and right sides of each spectral line to be detected includes:

[0022] Determine any one of the to-be-detected spectral lines as a marked spectral line to be detected, and select from all reference spectral lines reference spectral lines whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked spectral line to be detected as candidate spectral lines, thereby obtaining a set of candidate spectral lines corresponding to the marked spectral line to be detected;

[0023] Screening out the two largest metal characteristic expression factors from the metal characteristic expression factors of all candidate spectral lines in the set of candidate spectral lines corresponding to the marked spectral line to be detected, and determining the difference between the two screened metal characteristic expression factors as the initial single possible factor corresponding to the marked spectral line to be detected;

[0024] Determine the absolute value of the difference between the left width and the right width corresponding to the marked spectral line to be detected as the target width difference corresponding to the marked spectral line to be detected;

[0025] According to the initial single possible factor and target width difference corresponding to the marked spectral line to be detected, the single metal possibility corresponding to the marked spectral line to be detected is determined, wherein the initial single possible factor is positively correlated with the single metal possibility, and the target width difference is negatively correlated with the single metal possibility.

[0026] In combination with the first aspect above, in a possible implementation, screening out multi-metal combination spectral lines and single metal spectral lines from all spectral lines to be detected based on all single metal possibilities includes:

[0027] If the single metal possibility corresponding to the to-be-detected spectral line is greater than the preset single metal threshold, the to-be-detected spectral line is determined to be a single metal spectral line;

[0028] If the single metal probability corresponding to the to-be-detected spectral line is less than or equal to the preset single metal threshold, the to-be-detected spectral line is determined to be a multi-metal combination spectral line.

[0029] In conjunction with the first aspect above, in one possible implementation, determining the likelihood of each preset metal being present in each multi-metal combination spectral line based on the metal characteristic expression factor and wavelength of all reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line includes:

[0030] Determine any multi-metal combination spectrum line as a marked combination spectrum line, and screen out preset metals from all preset metals that have reference spectrum lines with corresponding total width wavelength ranges that fall within the total width wavelength range corresponding to the marked combination spectrum line as candidate metals, determine all preset metals except the candidate metals as reference metals, and determine any candidate metal as a marked metal;

[0031] According to the spectral line intensities corresponding to all reference spectral lines of the marked metal, sorting them in ascending order to obtain a reference spectral line sequence corresponding to the marked metal;

[0032] Determine a spectral line coincidence factor between the marked combination spectral line and the marked metal according to the sequence numbers and metal characteristic expression factors of all reference spectral lines in the reference spectral line sequence of the marked combination spectral line, wherein the sequence numbers and metal characteristic expression factors of the reference spectral lines are both positively correlated with the spectral line coincidence factor;

[0033] Filter out, from the reference spectral line sequence, a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marker combination spectral line as a target spectral line between the marker combination spectral line and the marker metal;

[0034] Determining the metal characteristic expression factor of the marked combination spectral line to the target spectral line as the metal representative expression factor of the marked combination spectral line to the marked metal;

[0035] Determining the possibility of the marker metal being present in the marker combination spectrum line according to the sequence number of the target spectrum line in the reference spectrum line sequence, the spectrum line coincidence factor between the marker combination spectrum line and the marker metal, and the metal representative performance factor of the marker combination spectrum line for the marker metal;

[0036] The preset value is determined as the possibility of the reference metal existing in the marker combination spectrum line.

[0037] In combination with the first aspect above, in a possible implementation, the formula corresponding to the possibility of the presence of the marker metal in the marker combination spectrum line is:

[0038] ;

[0039] ;in, is the possibility of the presence of the marker metal in the marker combination spectrum; is the normalization function; It is the metal representative performance factor of the metal marked by the marked combination spectral line pair; It is the serial number of the target spectral line between the marked combination spectral line and the marked metal in the reference spectral line sequence to which it belongs; is the line coincidence factor between the marker combination line and the marker metal line; is the number of reference spectral lines in the reference spectral line sequence corresponding to the marked metal; is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the marked metal; It is the first in the reference spectrum sequence corresponding to the metal marked by the combined spectrum. The metal characteristic expression factor of the reference spectral line.

[0040] In conjunction with the first aspect above, in one possible implementation, determining the target presence possibility indicator of each preset metal in each multi-metal combination spectral line based on the presence possibility of each preset metal in each multi-metal combination spectral line and the metal characteristic expression factor of each multi-metal combination spectral line relative to the reference spectral line corresponding to each preset metal includes:

[0041] Determine any multi-metal combination spectrum line as a marked combination spectrum line, and screen out preset metals from all preset metals that have reference spectrum lines with corresponding total width wavelength ranges that fall within the total width wavelength range corresponding to the marked combination spectrum line as candidate metals, determine all preset metals except the candidate metals as reference metals, and determine any candidate metal as a marked metal;

[0042] According to the spectral line intensities corresponding to all reference spectral lines of the marked metal, sorting them in ascending order to obtain a reference spectral line sequence corresponding to the marked metal;

[0043] Filter out, from the reference spectral line sequence, a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marker combination spectral line as a target spectral line between the marker combination spectral line and the marker metal;

[0044] Determining the metal characteristic expression factor of the marked combination spectral line to the target spectral line as the metal representative expression factor of the marked combination spectral line to the marked metal;

[0045] Determining a target presence possibility index of the marked metal in the marked combination spectrum line based on a metal representative performance factor of the marked metal by the marked combination spectrum line and the presence possibility of the marked metal in the marked combination spectrum line, wherein both the metal representative performance factor and the presence possibility are positively correlated with the target presence possibility index;

[0046] A preset value is determined as a possible target presence indicator of the reference metal in the marked combination spectrum line.

[0047] In combination with the first aspect above, in one possible implementation, judging the metal element composition of the alloy to be detected based on all target possible presence indicators and all single metal spectral lines includes:

[0048] Determine the preset metal represented by the reference spectrum line with the maximum metal characteristic expression factor corresponding to each single metal spectrum line as the target metal corresponding to each single metal spectrum line;

[0049] Determine any multi-metal combination spectrum line as a marked combination spectrum line, and select the preset metals with the largest and smallest target presence possible indicators in the marked combination spectrum line from all preset metals, and use them as the first metal and the second metal respectively;

[0050] Clustering all preset metals according to the target presence possible index in the labeled combination spectrum line, wherein the first metal and the second metal are respectively used as two initial cluster centers in the clustering process, and all preset metals in the cluster with the largest target presence possible index are grouped to form the undetermined metal set corresponding to the labeled combination spectrum line;

[0051] The metal element composition of the alloy to be tested is obtained based on the target metal corresponding to all single metal spectral lines and the set of undetermined metals corresponding to all multi-metal combination spectral lines.

[0052] In a second aspect, the present invention provides a rapid determination system for rare earth metals in alloys, the system comprising:

[0053] A spectrum line acquisition module is used to acquire each spectrum line of the alloy to be detected as a spectrum line to be detected, and to acquire each spectrum line of each preset metal as a reference spectrum line;

[0054] A factor determination module, for determining a metal characteristic expression factor of each to-be-detected spectral line relative to each reference spectral line based on the wavelengths corresponding to each to-be-detected spectral line and each reference spectral line;

[0055] A metal possibility determination module is used to determine the single metal possibility corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines and the width of the left and right sides of each spectral line to be detected;

[0056] The existence possibility determination module is used to screen out multi-metal combination spectral lines and single metal spectral lines from all spectral lines to be detected based on all single metal possibilities, and determine the existence possibility of each preset metal in each multi-metal combination spectral line based on the metal characteristic expression factor and wavelength of all reference spectral lines corresponding to each preset metal;

[0057] a possible indicator determination module, configured to determine a target presence possible indicator for each preset metal in each multi-metal combination spectral line based on the presence possibility of each preset metal in each multi-metal combination spectral line and a metal characteristic expression factor of each multi-metal combination spectral line relative to a reference spectral line corresponding to each preset metal;

[0058] The metal element composition judgment module is used to judge the metal element composition contained in the alloy to be tested based on all possible target presence indicators and all single metal spectral lines.

[0059] In a third aspect, a server is provided, comprising a memory and a processor. The memory is configured to store executable program code, and the processor is configured to call and execute the executable program code from the memory, so that the device executes the method of the first aspect or any possible implementation of the first aspect.

[0060] In a fourth aspect, a computer program product is provided, comprising: a computer program code, which, when executed on a computer, enables the computer to execute the method in the first aspect or any possible implementation of the first aspect.

[0061] In a fifth aspect, a computer-readable storage medium is provided, which stores a computer program code. When the computer program code runs on a computer, the computer executes the method in the above-mentioned first aspect or any possible implementation of the first aspect.

[0062] The present invention has the following beneficial effects:

[0063] The present invention provides a rapid determination method for rare earth metals in alloys. This method, through material analysis and testing, enables the detection of metallic element composition in titanium alloys, resolving the technical issue of poor accuracy in metallic element detection in titanium alloys and improving the accuracy of metallic element detection in titanium alloys. Compared to directly detecting metallic elements in titanium alloys based on the range of metal spectral lines, the present invention quantifies the likelihood of a single metal corresponding to each detected spectral line. A larger value indicates a higher likelihood of a single metallic element being represented by the detected spectral line, and a lower likelihood of the absence of multiple metallic elements in the detected spectral line. This, to a certain extent, avoids misjudgment of metallic elements represented by similar element spectral lines. Furthermore, the present invention analyzes multi-metal combination spectral lines that exhibit multiple metallic elements, quantifying the target presence probability index for each pre-determined metal in each multi-metal combination spectral line. A larger value indicates a higher likelihood that the multi-metal combination spectral line range contains the spectral line range of the pre-determined metal, and a higher likelihood of the presence of the pre-determined metal in the detected alloy. This improves the accuracy of metallic element detection in the detected alloy and, if the pre-determined metal is a rare earth metal, enables rapid determination of rare earth metals in the alloy. BRIEF DESCRIPTION OF THE DRAWINGS

[0064] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0065] Figure 1 This is a flow chart of a method for rapid determination of rare earth metals in an alloy according to the present invention;

[0066] Figure 2 This is a schematic diagram of the structure of a rapid determination system for rare earth metals in alloys according to the present invention;

[0067] Figure 3 The figure is a structural diagram of a computer device of the present invention. DETAILED DESCRIPTION

[0068] To further illustrate the technical means and effects employed by the present invention to achieve its intended objectives, the following, in conjunction with the accompanying drawings and preferred embodiments, describes in detail the specific implementations, structures, features, and effects of the technical solutions proposed by the present invention. In the following description, references to "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics of one or more embodiments may be combined in any suitable manner.

[0069] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0070] refer to Figure 1 , shows the process of some embodiments of a method for rapid determination of rare earth metals in an alloy of the present invention. The method for rapid determination of rare earth metals in an alloy comprises the following steps:

[0071] Step S1, obtaining each spectral line of the alloy to be detected as a spectral line to be detected, and obtaining each spectral line of each preset metal as a reference spectral line.

[0072] The alloy to be tested may be a titanium alloy for metal element composition testing. Spectral lines, also referred to as spectral lines, can be characterized by wavelength. The preset metal may be a pre-set metal that typically constitutes a titanium alloy. For example, the preset metal may include, but is not limited to, aluminum, vanadium, chromium, magnesium, and manganese. When rare earth metals in a titanium alloy need to be detected, the preset metal may include a rare earth metal. For example, the preset metal may also include, but is not limited to, cerium, lanthanum, yttrium, praseodymium, europium, gadolinium, terbium, and holmium.

[0073] For example, a target alloy can be tested using LIBS (Laser-Induced Breakdown Spectroscopy), with the resulting spectrum being recorded as the target spectrum. LIBS can also be used to test a predetermined metal, with the resulting spectrum being recorded as the reference spectrum.

[0074] Step S2: determining the metal characteristic expression factor of each to-be-detected spectral line relative to each reference spectral line according to the wavelengths corresponding to each to-be-detected spectral line and each reference spectral line.

[0075] As an example, this step may include the following steps:

[0076] In the first step, any spectral line to be detected is determined as a marked spectral line to be detected, and any reference spectral line is determined as a marked reference spectral line.

[0077] In the second step, if the total width wavelength range corresponding to the above-mentioned marked reference spectrum line is within the total width wavelength range corresponding to the above-mentioned marked spectrum line to be detected, then the metal characteristic expression factor of the above-mentioned marked spectrum line to be detected relative to the above-mentioned marked reference spectrum line is determined based on the total width wavelength range corresponding to the above-mentioned marked reference spectrum line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the above-mentioned marked spectrum line to be detected.

[0078] The total width wavelength range corresponding to the spectral line can be the wavelength range of the widths on the left and right sides of the spectral line, that is, the spectral line range. In actual situations, the spectral line can often expand on both sides of the center to form Doppler broadening, thereby obtaining the widths on the left and right sides of the spectral line.

[0079] For example, determining the metal characteristic performance factor may specifically include the following sub-steps:

[0080] In the first sub-step, the wavelength corresponding to the peak value within the total width wavelength range corresponding to the above-mentioned marked reference spectrum line is determined as the target wavelength corresponding to the above-mentioned marked reference spectrum line, and the wavelength corresponding to the peak value within the total width wavelength range corresponding to the above-mentioned marked spectrum line to be detected is determined as the target wavelength corresponding to the above-mentioned marked spectrum line to be detected.

[0081] The wavelength corresponding to the peak value within the total width wavelength range corresponding to the spectral line is often the wavelength represented by the spectral line.

[0082] The second sub-step is to determine the absolute value of the difference between the target wavelength corresponding to the marked reference spectrum line and the target wavelength corresponding to the marked spectrum line to be detected as the target wavelength difference between the marked reference spectrum line and the marked spectrum line to be detected.

[0083] The third sub-step is to determine the metal characteristic expression factor of the marked reference spectrum line relative to the marked reference spectrum line according to the target wavelength difference between the marked reference spectrum line and the marked spectrum line to be detected.

[0084] Among them, the target wavelength difference can be negatively correlated with the metal characteristic performance factor.

[0085] For example, if the marked reference spectrum line is within the marked spectrum line to be detected, the formula for determining the metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line can be:

[0086] ;in, It is the metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line. is a natural exponential function. It is the absolute value function. It is the target wavelength corresponding to the spectral line to be detected, and can be represented by the wavelength represented by the spectral line to be detected. It is the target wavelength corresponding to the marked reference spectrum line and can be expressed by the wavelength represented by the marked reference spectrum line. Characterize target wavelength differences.

[0087] It should be noted that when The smaller the value is, the smaller the wavelength difference between the marked spectrum to be detected and the marked reference spectrum is, and the closer the metal element represented by the marked spectrum to be detected is to the metal element represented by the marked reference spectrum. The larger the value is, the closer the metal element represented by the detected spectrum line is to the metal element represented by the reference spectrum line.

[0088] In the third step, if the total width wavelength range corresponding to the above-mentioned marked reference spectrum line is not within the total width wavelength range corresponding to the above-mentioned marked spectrum line to be detected, the preset value is determined as the metal characteristic expression factor of the above-mentioned marked spectrum line to be detected to the above-mentioned marked reference spectrum line.

[0089] The preset value may be a pre-set value, and its value may be 0.

[0090] Step S3, determining the single metal possibility corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines and the widths of the left and right sides of each spectral line to be detected.

[0091] As an example, this step may include the following steps:

[0092] In the first step, any spectral line to be detected is determined as the marked spectral line to be detected, and the reference spectral lines whose corresponding total width wavelength range is within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected are screened out from all reference spectral lines as candidate spectral lines, thereby obtaining a set of candidate spectral lines corresponding to the above-mentioned marked spectral line to be detected.

[0093] In the second step, the two largest metal characteristic expression factors are screened out from the metal characteristic expression factors of all candidate spectral lines in the candidate spectral line set corresponding to the above-mentioned marked spectral line to be detected, and the difference between the two screened metal characteristic expression factors is determined as the initial single possible factor corresponding to the above-mentioned marked spectral line to be detected.

[0094] In the third step, the absolute value of the difference between the left width and the right width corresponding to the marked spectral line to be detected is determined as the target width difference corresponding to the marked spectral line to be detected.

[0095] The fourth step is to determine the single metal possibility corresponding to the above-mentioned marked spectral line to be detected based on the initial single possible factor and the target width difference corresponding to the above-mentioned marked spectral line to be detected.

[0096] The initial single possibility factor may be positively correlated with the single metal possibility, and the target width difference may be negatively correlated with the single metal possibility.

[0097] For example, the formula for determining the probability of a single metal corresponding to the marked spectral line to be detected can be:

[0098] ;in, It is the possibility of a single metal corresponding to the spectral line to be detected. is the normalization function. It is the maximum value of the metal characteristic expression factors of all candidate spectral lines corresponding to the spectral line to be detected. It is the second largest metal feature expression factor among the metal feature expression factors of all candidate spectral lines corresponding to the spectral line to be detected. represents the initial single possible factor. It is the absolute value function. It is the left width corresponding to the spectral line to be detected. It is the right width corresponding to the spectral line to be detected. Characterize target width differences. It is a pre-set factor greater than 0, mainly used to prevent the denominator from being 0, such as, It can be 0.001.

[0099] It should be noted that metal atoms often cause the spectral line to expand symmetrically on both sides of the center to form Doppler broadening, which leads to the consistency of the width of the left and right sides of the spectral line. The stronger the consistency, the more likely the spectral line is to show a single metal component. On the contrary, if there are multiple metal elements in the spectral line range, the spectral lines may overlap. The wavelength corresponding to the peak value in the spectral line range may not be in the center of the spectral line range due to the interference of the spectral lines of multiple metal elements, resulting in the spectral line not being in the center position, and then the symmetry is destroyed. Therefore, when The smaller it is, the closer the widths of the left and right sides of the spectral line to be detected are, and the more consistent the widths of the left and right sides of the spectral line to be detected are. This often means that the spectral line to be detected is more likely to represent a single metal element. When the value is larger, it often means that there is a metal characteristic expression factor that is much larger than other metal characteristic expression factors among the metal characteristic expression factors of the marked spectrum line corresponding to all candidate spectrum lines, which often means that the marked spectrum line is more likely to represent a single metal element. The larger the value is, the more likely it is that the spectral line to be detected represents a single metal element.

[0100] Step S4, based on all single metal possibilities, multi-metal combination spectral lines and single metal spectral lines are screened out from all spectral lines to be detected, and based on the metal characteristic expression factors and wavelengths of all reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line, the possibility of each preset metal in each multi-metal combination spectral line is determined.

[0101] As an example, this step may include the following steps:

[0102] In the first step, if the single metal possibility corresponding to the to-be-detected spectral line is greater than a preset single metal threshold, the to-be-detected spectral line is determined to be a single metal spectral line.

[0103] The preset single metal threshold may be a pre-set threshold, for example, 0.5.

[0104] In the second step, if the single metal probability corresponding to the to-be-detected spectral line is less than or equal to the preset single metal threshold, the to-be-detected spectral line is determined to be a multi-metal combination spectral line.

[0105] The third step is to determine any multi-metal combination spectrum line as a marked combination spectrum line, and screen out preset metals from all preset metals that have reference spectrum lines with corresponding total width wavelength ranges belonging to the total width wavelength range corresponding to the marked combination spectrum line as candidate metals, determine all preset metals except the candidate metals as reference metals, and determine any candidate metal as a marked metal.

[0106] For example, if there is a reference spectrum line among multiple reference spectrum lines corresponding to a preset metal whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked combination spectrum line, the preset metal can be determined as a candidate metal.

[0107] It should be noted that, among the multiple reference spectral lines corresponding to a metal, there is usually at most one reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the spectral line to be detected.

[0108] The fourth step is to sort all the reference spectral lines corresponding to the above-mentioned marked metals in ascending order according to their spectral line intensities to obtain a reference spectral line sequence corresponding to the above-mentioned marked metals.

[0109] Spectral line intensity typically refers to the increase or decrease in light intensity at a specific wavelength relative to the baseline. The calculation of this intensity can vary depending on the spectroscopic technique and application. For example, spectral line intensity can be measured by the height of a spectral line peak or the maximum value on a spectrum graph.

[0110] The fifth step is to determine the spectral line coincidence factor between the above-mentioned marked combination spectral line and the above-mentioned marked metal according to the sequence number and metal characteristic expression factor of the above-mentioned marked combination spectral line to all reference spectral lines in the above-mentioned reference spectral line sequence.

[0111] Among them, the serial number of the reference spectral line and the metal characteristic expression factor can be positively correlated with the spectral line coincidence factor.

[0112] The sixth step is to select from the reference spectral line sequence a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the above-mentioned marked combination spectral line as the target spectral line between the above-mentioned marked combination spectral line and the above-mentioned marked metal.

[0113] It should be noted that among the multiple reference spectral lines corresponding to a metal, there is often at most one reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the spectral line to be detected. Therefore, there is often only one target spectral line between the marked combination spectral line and the marked metal.

[0114] In the seventh step, the metal characteristic expression factor of the above-mentioned marked combination spectrum line to the above-mentioned target spectrum line is determined as the metal representative expression factor of the above-mentioned marked combination spectrum line to the above-mentioned marked metal.

[0115] The eighth step is to determine the possibility of the existence of the above-mentioned marked metal in the above-mentioned marked combination spectrum line based on the serial number of the above-mentioned target spectrum line in the above-mentioned reference spectrum line sequence, the spectrum line coincidence factor between the above-mentioned marked combination spectrum line and the above-mentioned marked metal, and the metal representative performance factor of the above-mentioned marked combination spectrum line to the above-mentioned marked metal.

[0116] For example, the formula for determining the possibility of the presence of the marker metal in the marker combination spectrum can be:

[0117] ;

[0118] ;in, is the possibility of the presence of the marker metal in the marker combination spectrum. is the normalization function. It is the metal representative performance factor of the metal marked by the marked combination spectral line pair. It is the serial number of the target spectral line between the marked combination spectral line and the marked metal in the reference spectral line sequence to which it belongs. is the spectral line coincidence factor between the marker combination spectral line and the marker metal. is the number of reference spectral lines in the reference spectral line sequence corresponding to the marked metal. It is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the marked metal. It is the first in the reference spectrum sequence corresponding to the metal marked by the combined spectrum. The metal characteristic expression factor of the reference spectral line.

[0119] It should be noted that when The larger the value is, the higher the intensity of the reference spectrum line is, and the more important the reference spectrum line may be. The larger the The metal element represented by the reference spectrum line is likely to be closer to the metal element represented by the marker combination spectrum line. The larger the The higher the degree of overlap between the reference spectrum and the marker combination spectrum, the higher the probability. It can represent the average degree of overlap between the marker combination spectrum and the reference spectrum sequence corresponding to the marker metal. The larger the value, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal. When the value is larger, it often indicates that the intensity of the target spectrum line between the marker combination spectrum line and the marker metal is higher, and it often indicates that the target spectrum line between the marker combination spectrum line and the marker metal may be more important. The larger the value is, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal. The larger the value is, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal.

[0120] In the ninth step, the preset value is determined as the possibility of the reference metal existing in the above-mentioned marked combination spectrum line.

[0121] The preset value may be a pre-set value, and its value may be 0.

[0122] Step S5, determining the target presence possibility index of each preset metal in each multi-metal combination spectrum line based on the presence possibility of each preset metal in each multi-metal combination spectrum line and the metal characteristic expression factor of each multi-metal combination spectrum line relative to the reference spectrum line corresponding to each preset metal.

[0123] As an example, this step may include the following steps:

[0124] In the first step, any multi-metal combination spectrum line is determined as a marked combination spectrum line, and preset metals having a reference spectrum line within a corresponding total width wavelength range belonging to the total width wavelength range corresponding to the marked combination spectrum line are screened out from all preset metals as candidate metals, and all preset metals except the candidate metals are determined as reference metals, and any candidate metal is determined as a marked metal.

[0125] The second step is to sort all the reference spectral lines corresponding to the above-mentioned marked metals in ascending order according to their spectral line intensities to obtain a reference spectral line sequence corresponding to the above-mentioned marked metals;

[0126] The third step is to select from the reference spectral line sequence a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the above-mentioned marked combination spectral line as the target spectral line between the above-mentioned marked combination spectral line and the above-mentioned marked metal.

[0127] The fourth step is to determine the metal characteristic expression factor of the above-mentioned marked combination spectrum line to the above-mentioned target spectrum line as the metal representative expression factor of the above-mentioned marked combination spectrum line to the above-mentioned marked metal.

[0128] The fifth step is to determine the target existence possibility index of the above-mentioned marked metal in the above-mentioned marked combination spectrum line based on the metal representative expression factor of the above-mentioned marked metal and the possibility of the above-mentioned marked metal in the above-mentioned marked combination spectrum line.

[0129] Among them, the metal representative performance factor and existence possibility can be positively correlated with the target existence possibility indicator.

[0130] For example, the formula corresponding to the target presence possible indicator for determining the presence of the marker metal in the marker combination spectrum line can be:

[0131] ;in, It is a possible indicator of the target presence of the marker metal in the marker combination spectrum. It is the metal representative performance factor of the metal marked by the marked combination spectral line pair. is the possibility of the presence of the marker metal in the marker combination spectrum.

[0132] It should be noted that when The larger the value is, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal. The larger the value is, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal. The larger the value is, the more likely it is that the metal element composition represented by the marker combination spectrum contains the marker metal.

[0133] In the sixth step, the preset value is determined as a possible indicator of the target presence of the reference metal in the above-mentioned marked combination spectrum line.

[0134] The preset value may be a pre-set value, and its value may be 0.

[0135] Step S6: judging the metal element composition of the alloy to be tested based on all target possible presence indicators and all single metal spectral lines.

[0136] As an example, this step may include the following steps:

[0137] In the first step, the preset metal represented by the reference spectrum line of the maximum metal characteristic expression factor corresponding to each single metal spectrum line is determined as the target metal corresponding to each single metal spectrum line.

[0138] The maximum metal characteristic expression factor corresponding to a single metal spectral line is the maximum value of the metal characteristic expression factors of the single metal spectral line relative to all reference spectral lines. The target metal corresponding to a single metal spectral line is the metal represented by the single metal spectral line.

[0139] In the second step, any multi-metal combination spectrum line is determined as a marked combination spectrum line, and the preset metals with the largest and smallest target existence possible indicators in the above marked combination spectrum line are screened out from all preset metals, and used as the first metal and the second metal respectively.

[0140] The third step is to cluster all preset metals according to their target presence possible indicators in the above-mentioned marked combination spectrum. In the clustering process, the first metal and the second metal are used as the two initial cluster centers respectively, and all the preset metals in the cluster with the largest target presence possible indicator are combined to form the undetermined metal set corresponding to the above-mentioned marked combination spectrum.

[0141] The fourth step is to obtain the metal element composition contained in the alloy to be tested based on the target metal corresponding to all single metal spectral lines and the set of undetermined metals corresponding to all multi-metal combination spectral lines.

[0142] For example, the metal elements characterizing the target metal corresponding to all single metal spectral lines and the metal elements characterizing all preset metals in the to-be-determined metal set corresponding to all multi-metal combination spectral lines can be used to constitute the metal element composition contained in the alloy to be detected.

[0143] Optionally, the present invention can also utilize content detection to complete the composition detection of the alloy. Specifically, a content detection algorithm for the metal components of the sample can be constructed based on the existing metal components, such as a spectral analysis algorithm, to obtain the content of the metal components, thereby completing the composition analysis of the titanium alloy. Specifically, the following steps are included:

[0144] The first step is model selection: choosing an appropriate model to establish the relationship between spectral data and metal content. Common models include linear regression, principal component analysis (PCA), partial least squares regression (PLSR), etc.

[0145] The second step is algorithm training: using the extracted features and known metal content data to train the model. This process may require the use of techniques such as cross-validation to optimize model parameters.

[0146] The third step is model evaluation: the predictive ability of the model is evaluated, usually using indicators such as mean square error (MSE) and coefficient of determination (R²).

[0147] The fourth step is algorithm optimization: Optimize the algorithm based on the results of model evaluation, which may include adjusting feature extraction methods, improving model structure or parameters, etc.

[0148] Step 5, algorithm verification: Use an independent validation set to test the accuracy and generalization ability of the algorithm.

[0149] Step 6: Algorithm application: Apply the trained algorithm to actual metal component content detection.

[0150] refer to Figure 2 Based on the same inventive concept as the above method embodiment, the present invention provides a system for rapid determination of rare earth metals in alloys. The system includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, the steps of a method for rapid determination of rare earth metals in alloys may specifically include:

[0151] The spectrum line acquisition module 201 is used to acquire each spectrum line of the alloy to be detected as a spectrum line to be detected, and to acquire each spectrum line of each preset metal as a reference spectrum line;

[0152] A factor determination module 202 is configured to determine a metal characteristic expression factor of each to-be-detected spectral line relative to each reference spectral line based on the wavelengths corresponding to each to-be-detected spectral line and each reference spectral line;

[0153] The metal possibility determination module 203 is used to determine the single metal possibility corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines and the width of the left and right sides of each spectral line to be detected;

[0154] The presence possibility determination module 204 is configured to screen out multi-metal combination spectral lines and single metal spectral lines from all spectral lines to be detected based on all single metal possibilities, and determine the presence possibility of each preset metal in each multi-metal combination spectral line based on the metal characteristic expression factor and wavelength of all reference spectral lines corresponding to each preset metal.

[0155] Possible indicator determination module 205, for determining a target presence possible indicator of each preset metal in each multi-metal combination spectral line based on the presence possibility of each preset metal in each multi-metal combination spectral line and the metal characteristic expression factor of each multi-metal combination spectral line relative to the reference spectral line corresponding to each preset metal;

[0156] The metal element composition determination module 206 is used to determine the metal element composition of the alloy to be detected based on all target possible presence indicators and all single metal spectral lines.

[0157] Figure 3 FIG. 1 is a schematic diagram of the structure of a computer device provided by an embodiment of the present invention. For example, Figure 3As shown, the computer device 300 includes: a memory 301, a processor 302, and a computer program 303 stored in the memory 301 and running on the processor 302, wherein when the processor 302 executes the computer program 303, the computer device can execute any of the aforementioned methods for rapid determination of rare earth metals in alloys.

[0158] Based on the same inventive concept as the above-described method embodiment, the present invention provides a server comprising a memory and a processor. The memory is configured to store executable program code, and the processor is configured to retrieve and execute the executable program code from the memory, thereby enabling the device to perform any of the above-described methods for rapid determination of rare earth metals in alloys.

[0159] Based on the same inventive concept as the above method embodiment, the present invention provides a computer program product, which includes: computer program code, which, when running on a computer, enables the computer to execute any of the above-mentioned methods for rapid determination of rare earth metals in alloys.

[0160] Based on the same inventive concept as the above-mentioned method embodiment, the present invention provides a computer-readable storage medium, which stores computer program code. When the computer program code is run on a computer, the computer executes any one of the above-mentioned methods for rapid determination of rare earth metals in the alloy.

[0161] In summary, compared to directly detecting the metal elements of titanium alloys based on the spectral line range of the metal, the present invention quantifies the possibility of a single metal corresponding to each spectral line to be detected. The larger the value, the more likely it is that the metal element represented by the spectral line to be detected is single, and the more likely it is that there are no multiple metal elements expressed as spectral lines to be detected, thereby avoiding the misjudgment of metal elements expressed as similar element spectral lines to a certain extent. Secondly, the present invention analyzes the multi-metal combination spectral lines that are expressed by multiple metal elements, and quantifies the target existence possibility index of each preset metal in each multi-metal combination spectral line. The larger the value, the more likely it is that the multi-metal combination spectral line range contains the spectral line range of the preset metal, and the more likely it is that the preset metal exists in the alloy to be detected, thereby improving the accuracy of metal element detection for the alloy to be detected.

[0162] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present invention, and should all be included in the scope of protection of the present invention.

Claims

1. A method for rapid determination of rare earth metals in alloys, characterized in that: The following steps are involved: Acquire each spectral line of the alloy to be detected as a spectral line to be detected, and acquire each spectral line of each preset metal as a reference spectral line; Determining the metal characteristic expression factor of each spectral line to be detected relative to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line; Determine the possibility of a single metal corresponding to each spectral line to be detected based on the metal characteristic expression factor of each spectral line to be detected relative to all reference spectral lines, as well as the width of the left and right sides of each spectral line to be detected; Based on all single metal possibilities, multi-metal combination spectral lines and single metal spectral lines are screened from all spectral lines to be detected, and the possibility of each preset metal in each multi-metal combination spectral line is determined based on the metal characteristic expression factor and wavelength of all reference spectral lines corresponding to each preset metal; Determine the target presence index of each preset metal in each multi-metal combination spectral line based on the presence probability of each preset metal in each multi-metal combination spectral line and the metal characteristic expression factor of each multi-metal combination spectral line relative to the reference spectral line corresponding to each preset metal; Determine the metal element composition of the alloy to be tested based on all possible indicators of the target and all single metal spectral lines; The method for obtaining the target existence possibility indicator is as follows: Determine any multi-metal combination spectrum line as a marked combination spectrum line, and screen out preset metals from all preset metals that have reference spectrum lines with corresponding total width wavelength ranges that fall within the total width wavelength range corresponding to the marked combination spectrum line as candidate metals, determine all preset metals except the candidate metals as reference metals, and determine any candidate metal as a marked metal; According to the spectral line intensities corresponding to all reference spectral lines of the marked metal, sorting them in ascending order to obtain a reference spectral line sequence corresponding to the marked metal; Filter out, from the reference spectral line sequence, a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marker combination spectral line as a target spectral line between the marker combination spectral line and the marker metal; Determining the metal characteristic expression factor of the marked combination spectral line to the target spectral line as the metal representative expression factor of the marked combination spectral line to the marked metal; Determining a target presence possibility index of the marked metal in the marked combination spectrum line based on a metal representative performance factor of the marked metal by the marked combination spectrum line and the presence possibility of the marked metal in the marked combination spectrum line, wherein both the metal representative performance factor and the presence possibility are positively correlated with the target presence possibility index; determining a preset value as a possible target presence indicator of a reference metal in the marked combination spectrum line; The method for obtaining the metal characteristic performance factor includes: Determine any one of the to-be-detected spectral lines as a marked to-be-detected spectral line, and determine any one of the reference spectral lines as a marked reference spectral line; If the total width wavelength range corresponding to the marked reference spectrum line is within the total width wavelength range corresponding to the marked spectrum line to be detected, then determine the metal characteristic expression factor of the marked spectrum line to be detected with respect to the marked reference spectrum line according to the total width wavelength range corresponding to the marked reference spectrum line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectrum line to be detected, wherein the total width wavelength range corresponding to the spectrum line is the wavelength range where the widths on the left and right sides of the spectrum line are located; If the total width wavelength range corresponding to the marked reference spectrum line is not within the total width wavelength range corresponding to the marked spectrum line to be detected, a preset value is determined as the metal characteristic expression factor of the marked spectrum line to be detected with respect to the marked reference spectrum line; The method for obtaining the single metal possibility includes: Determine any one of the to-be-detected spectral lines as a marked spectral line to be detected, and select from all reference spectral lines reference spectral lines whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked spectral line to be detected as candidate spectral lines, thereby obtaining a set of candidate spectral lines corresponding to the marked spectral line to be detected; Screening out the two largest metal characteristic expression factors from the metal characteristic expression factors of all candidate spectral lines in the set of candidate spectral lines corresponding to the marked spectral line to be detected, and determining the difference between the two screened metal characteristic expression factors as the initial single possible factor corresponding to the marked spectral line to be detected; Determine the absolute value of the difference between the left width and the right width corresponding to the marked spectral line to be detected as the target width difference corresponding to the marked spectral line to be detected; Determining the single metal possibility corresponding to the marked spectral line to be detected based on the initial single possible factor and the target width difference corresponding to the marked spectral line to be detected, wherein the initial single possible factor is positively correlated with the single metal possibility and the target width difference is negatively correlated with the single metal possibility; The method for obtaining the existence possibility includes: Determine any multi-metal combination spectrum line as a marked combination spectrum line, and screen out preset metals from all preset metals that have reference spectrum lines with corresponding total width wavelength ranges that fall within the total width wavelength range corresponding to the marked combination spectrum line as candidate metals, determine all preset metals except the candidate metals as reference metals, and determine any candidate metal as a marked metal; According to the spectral line intensities corresponding to all reference spectral lines of the marked metal, sorting them in ascending order to obtain a reference spectral line sequence corresponding to the marked metal; Determine a spectral line coincidence factor between the marked combination spectral line and the marked metal according to the sequence numbers and metal characteristic expression factors of all reference spectral lines in the reference spectral line sequence of the marked combination spectral line, wherein the sequence numbers and metal characteristic expression factors of the reference spectral lines are both positively correlated with the spectral line coincidence factor; Filter out, from the reference spectral line sequence, a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marker combination spectral line as a target spectral line between the marker combination spectral line and the marker metal; Determining the metal characteristic expression factor of the marked combination spectral line to the target spectral line as the metal representative expression factor of the marked combination spectral line to the marked metal; Determining the possibility of the marker metal being present in the marker combination spectrum line according to the sequence number of the target spectrum line in the reference spectrum line sequence, the spectrum line coincidence factor between the marker combination spectrum line and the marker metal, and the metal representative performance factor of the marker combination spectrum line for the marker metal; The preset value is determined as the possibility of the reference metal existing in the marker combination spectrum line.

2. The method for rapid determination of rare earth metals in an alloy according to claim 1, characterized in that: The determining, based on the total width wavelength range corresponding to the marked reference spectrum line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectrum line to be detected, a metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line includes: Determine the wavelength corresponding to the peak value within the total width wavelength range corresponding to the marked reference spectrum line as the target wavelength corresponding to the marked reference spectrum line, and determine the wavelength corresponding to the peak value within the total width wavelength range corresponding to the marked spectrum line to be detected as the target wavelength corresponding to the marked spectrum line to be detected; Determine the absolute value of the difference between the target wavelength corresponding to the marked reference spectral line and the target wavelength corresponding to the marked spectral line to be detected as the target wavelength difference between the marked reference spectral line and the marked spectral line to be detected; The metal characteristic expression factor of the marked spectrum line to be detected relative to the marked reference spectrum line is determined according to the target wavelength difference between the marked reference spectrum line and the marked spectrum line to be detected, wherein the target wavelength difference is negatively correlated with the metal characteristic expression factor.

3. The method for rapid determination of rare earth metals in an alloy according to claim 1, characterized in that: The method of screening out multi-metal combination spectral lines and single metal spectral lines from all spectral lines to be detected based on all single metal possibilities includes: If the single metal possibility corresponding to the to-be-detected spectral line is greater than the preset single metal threshold, the to-be-detected spectral line is determined to be a single metal spectral line; If the single metal probability corresponding to the to-be-detected spectral line is less than or equal to the preset single metal threshold, the to-be-detected spectral line is determined to be a multi-metal combination spectral line.

4. The method for rapid determination of rare earth metals in an alloy according to claim 1, characterized in that: The formula corresponding to the possibility of the presence of the marker metal in the marker combination spectrum is: ； ;in, is the possibility of the presence of the marker metal in the marker combination spectrum; is the normalization function; It is the metal representative performance factor of the metal marked by the marked combination spectral line pair; It is the serial number of the target spectral line between the marked combination spectral line and the marked metal in the reference spectral line sequence to which it belongs; is the line coincidence factor between the marker combination line and the marker metal line; is the number of reference spectral lines in the reference spectral line sequence corresponding to the marked metal; is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the marked metal; It is the first in the reference spectrum sequence corresponding to the metal marked by the combined spectrum. The metal characteristic expression factor of the reference spectral line.

5. The method for rapid determination of rare earth metals in an alloy according to claim 1, characterized in that: The determination of the metal element composition of the alloy to be tested based on all possible target indicators and all single metal spectral lines includes: Determine the preset metal represented by the reference spectrum line with the maximum metal characteristic expression factor corresponding to each single metal spectrum line as the target metal corresponding to each single metal spectrum line; Determine any multi-metal combination spectrum line as a marked combination spectrum line, and select the preset metals with the largest and smallest target presence possible indicators in the marked combination spectrum line from all preset metals, and use them as the first metal and the second metal respectively; Clustering all preset metals according to the target presence possible index in the labeled combination spectrum line, wherein the first metal and the second metal are respectively used as two initial cluster centers in the clustering process, and all preset metals in the cluster with the largest target presence possible index are grouped to form the undetermined metal set corresponding to the labeled combination spectrum line; The metal element composition of the alloy to be tested is obtained based on the target metal corresponding to all single metal spectral lines and the set of undetermined metals corresponding to all multi-metal combination spectral lines.

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