Gate testing equipment, method and device and storage medium

The gateway testing device enhances testing efficiency and accuracy by measuring impact force and speed on-site, addressing the inefficiencies of traditional disassembly-based testing methods.

CN120313682AActive Publication Date: 2025-07-15HANGZHOU METRO TECH CO LTD
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Patent Information

Application Number
CN202510805084.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-06-17
Publication Date
2025-07-15
Estimated Expiration
2045-06-17

AI Technical Summary

Technical Problem

In the prior art, when performing performance testing of the gate pendulum of the gate, the disassembly and testing process takes a long time, resulting in low testing efficiency.

Method used

A gate testing equipment is designed, including support components, force measuring components and speed measuring components, which can be fixed on the inside of the gate, directly measure the impact force and rotation speed of the gate pendulum to meet the gate testing needs of different spacings.

Benefits of technology

On-site testing is carried out without manual disassembly of the gate, which improves testing efficiency and accuracy and reduces testing time.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides gate testing equipment, method and device and a storage medium. Relates to the field of machinery and automation. Comprising a supporting part, a force measuring part and a speed measuring part, the force measuring part is connected with the supporting part, the speed measuring part is connected with the supporting part, and the supporting part is connected with a first gate and a second gate; the force measuring part is used for measuring the hitting force of the first gate and the second gate, the speed measuring part is used for measuring the speed of the first gate and the second gate, and the gate testing efficiency and the gate testing accuracy are improved.
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Description

Technical Field

[0001] This application relates to the field of machinery and automation, and particularly to a turnstile testing device, method, apparatus, and storage medium. Background Art

[0002] In the rail transit industry, turnstile devices are widely used in access areas such as subways and airports. To ensure the safety of the operation of turnstile devices, it is necessary to test the performance of the gate swings.

[0003] In the related art, when testing the performance of the gate swing of a turnstile, the staff needs to replace the gate swing to be tested and perform performance testing on it through a professional testing platform.

[0004] However, in the above process, it usually takes a long time to disassemble the gate swing to be tested, and it also takes a long time to perform performance testing on it. This process is time-consuming and results in low efficiency in testing the gate swing. Summary of the Invention

[0005] This application provides a turnstile testing device, method, apparatus, and storage medium to solve the problem of low efficiency in testing the gate swing.

[0006] In a first aspect, this application provides a turnstile testing device, including a support component, a force measuring component, and a speed measuring component, where:

[0007] The force measuring component is connected to the support component, the speed measuring component is connected to the support component, and the support component is connected to the first turnstile and the second turnstile;

[0008] The force measuring component is used to measure the striking force of the first turnstile and the second turnstile, and the speed measuring component is used to measure the speed of the first turnstile and the second turnstile.

[0009] In a possible implementation manner, the speed measuring component is a photosensitive component, the speed measuring component is installed on the support component, and the speed measuring component corresponds to the gate swings of the first turnstile and the second turnstile.

[0010] In a possible implementation manner, the turnstile testing device further includes a sliding component, the sliding component is connected to the support component, the sliding component corresponds to the gate swings of the first turnstile and the second turnstile, and the force measuring component is installed on the sliding component.

[0011] In a possible implementation manner, the turnstile testing device further includes a first suction cup and a second suction cup, the support component includes a first end and a second end, where:

[0012] The first suction cup is connected to the first end, and the second suction cup is connected to the second end. The first suction cup adsorbs on the inner side of the first turnstile, and the second suction cup adsorbs on the inner side of the second turnstile.

[0013] In a possible implementation manner, the turnstile testing device further includes a screw rod. The first suction cup and the second suction cup are connected to the support member through the screw rod.

[0014] Second, this application provides a turnstile testing method, including:

[0015] Determine the first striking force and / or the first duration of the turnstile swing. The first duration is used to indicate the speed of the turnstile swing.

[0016] Based on the first striking force and / or the first duration, determine the state of the turnstile. The state is an alarm state or a non-alarm state.

[0017] In a possible implementation manner, determining the first duration of the turnstile swing includes:

[0018] Determine the first parameter of the speed measurement component. The first parameter is used to indicate the degree of occlusion of the speed measurement component.

[0019] Based on the first parameter, determine the first duration.

[0020] Third, this application provides a turnstile testing device, including: a determination module and a processing module, where

[0021] The determination module is configured to determine the first striking force and / or the first duration of the turnstile swing. The first duration is used to indicate the speed of the turnstile swing.

[0022] The processing module is configured to determine the state of the turnstile based on the first striking force and / or the first duration. The state is an alarm state or a non-alarm state.

[0023] In a possible implementation manner, the determination module is specifically configured to:

[0024] Determine the first parameter of the speed measurement component. The first parameter is used to indicate the degree of occlusion of the speed measurement component.

[0025] Based on the first parameter, determine the first duration.

[0026] Fourth, an embodiment of this application provides an electronic device, including: at least one processor and a memory; the memory stores computer execution instructions; at least one processor executes the computer execution instructions stored in the memory, so that at least one processor executes the turnstile testing method as described in the second aspect and any possible implementation manner of the second aspect above.

[0027] In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the turnstile testing method as described in the second aspect above and any possible turnstile testing method related to the second aspect.

[0028] In a sixth aspect, an embodiment of the present application provides a computer program product including a computer program, which, when executed by a processor, implements the turnstile testing method as described in the second aspect above and any possible turnstile testing method related to the second aspect.

[0029] The turnstile testing device, method, apparatus, and storage medium provided by the present application. The turnstile testing device may include a support component, a force-measuring component, and a speed-measuring component. Among them, the force-measuring component is connected to the support component, and the speed-measuring component is also connected to the support component. The support component may be connected to the first turnstile and the second turnstile. The force-measuring component can measure the striking force of the turnstile swing, and the speed-measuring component can measure the rotational speed of the turnstile swing. In the above structure, since the turnstile testing device can be fixed inside the first turnstile and the second turnstile, the turnstile testing device can perform on-site testing on the turnstile swing without manual disassembly of the turnstile swing or sending it for inspection. Moreover, the terminal device can accurately determine whether the motion performance of the turnstile swing meets the requirements based on the striking force and speed measured by the turnstile testing device. In this case, the turnstile testing device can adapt to the turnstile testing requirements with different spacings, and this process takes less time, improving the efficiency and accuracy of turnstile testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings herein are incorporated into the specification and form a part of the specification, showing embodiments consistent with the present application, and are used together with the specification to explain the principles of the present application.

[0031] Figure 1 Schematic diagram of an application scenario provided by an embodiment of the present application;

[0032] Figure 2 Schematic diagram of the structure of a turnstile testing device provided by an embodiment of the present application;

[0033] Figure 3 Schematic diagram of the testing process of the turnstile testing device provided by an embodiment of the present application;

[0034] Figure 4 Schematic diagram of the structure of another turnstile testing device provided by an embodiment of the present application;

[0035] Figure 5 is Figure 4 side view of the turnstile testing device;

[0036] Figure 6 Schematic diagram of the testing process of the turnstile testing device provided by an embodiment of the present application;

[0037] Figure 7 Schematic structural diagram of another gate testing device provided by an embodiment of the present application;

[0038] Figure 8 Schematic structural diagram of a support component provided by an embodiment of the present application;

[0039] Figure 9 Schematic structural diagram of yet another gate testing device provided by an embodiment of the present application;

[0040] Figure 10 Schematic structural diagram of a control device provided by an embodiment of the present application;

[0041] Figure 11 Schematic flow diagram of a gate testing method provided by an embodiment of the present application;

[0042] Figure 12 Schematic structural diagram of a gate testing device provided by an embodiment of the present application;

[0043] Figure 13 Schematic structural diagram of an electronic device provided by an embodiment of the present application.

[0044] Explanation of reference numerals:

[0045] 100 - Gate testing device;

[0046] 101 - First gate;

[0047] 102 - Second gate;

[0048] 103 - First gate swing;

[0049] 104 - Second gate swing;

[0050] 200 - Support component;

[0051] 201 - First suction cup;

[0052] 202 - Second suction cup;

[0053] 203 - Screw;

[0054] 204 - First screw;

[0055] 205 - Second screw;

[0056] 300 - Force measuring component;

[0057] 301 - Sliding component;

[0058] 400 - Speed measuring component;

[0059] 401 - Photosensitive component;

[0060] 500 - Control device.

[0061] Through the above - mentioned drawings, specific embodiments of the present application have been shown, and there will be a more detailed description hereinafter. These drawings and written descriptions are not intended to limit the scope of the concept of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. Detailed Description of the Embodiments

[0062] Here, the exemplary embodiments will be described in detail, and the examples are shown in the drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0063] It should be noted that in the embodiments of the present application, some industry - existing solutions such as certain software, components, models, etc. may be mentioned. They should be considered exemplary, and their purpose is only to illustrate the feasibility in the implementation of the technical solution of the present application, but it does not mean that the applicant has already or necessarily used this solution.

[0064] For the sake of easy understanding, the following combines Figure 1 , to illustrate the application scenarios applicable to the embodiments of the present application.

[0065] Figure 1 It is a schematic diagram of the application scenario provided for the embodiments of the present application. Please refer to Figure 1 , including a first turnstile 101, a second turnstile 102, a first swing gate 103, and a second swing gate 104. One side of the first swing gate 103 is fixed inside the first turnstile 101, and one side of the second swing gate 104 is fixed inside the second turnstile 102.

[0066] The first turnstile 101 can control the opening and closing of the first swing gate 103, and the second turnstile 102 can control the opening and closing of the second swing gate 104. For example, the initial positional relationship between the turnstile and the swing gate is a vertical relationship. When the first turnstile 101 controls the first swing gate 103 to open, the positional relationship between the first turnstile 101 and the first swing gate 103 becomes a parallel relationship; when the first turnstile 101 controls the first swing gate 103 to close, the positional relationship between the first turnstile 101 and the first swing gate 103 becomes a vertical relationship.

[0067] The turnstile test device can be on the other side of the opening and closing of the first swing gate 103 and the second swing gate 104, that is, at the position corresponding to the closing of the first swing gate 103 and the second swing gate 104 (drawn as a dotted - line rectangular frame in the figure).

[0068] In the related art, when performing a performance test on the swing gate of a turnstile, the staff needs to replace the swing gate to be tested and perform a performance test on it through a professional test platform. However, in the above process, it usually takes a long time to disassemble the swing gate to be tested, and it also takes a long time to perform a performance test on it. This process is time-consuming and results in low efficiency in testing the swing gate.

[0069] In view of the above technical problems, in an embodiment of the present application, the turnstile test device includes a support component, a force measuring component, and a speed measuring component. The force measuring component can measure the striking force of the swing gate, and the speed measuring component can measure the rotational speed of the swing gate. For example, when the swing gate is closed, the force measuring component can measure the striking force of the swing gate, and the speed measuring component can measure the duration from when the swing gate opens to when it closes. Among them, the duration from when the swing gate opens to when it closes is used to indicate the rotational speed of the swing gate. In the above process, since the turnstile test device can be fixed inside the first turnstile and the second turnstile, the turnstile test device can perform an on-site test on the swing gate without manual disassembly of the swing gate or sending it for inspection. Moreover, the terminal device can accurately determine whether the motion performance of the swing gate meets the requirements based on the striking force and speed measured by the turnstile test device. In this case, the turnstile test device can adapt to the turnstile test requirements with different spacings, and this process takes less time, improving the efficiency and accuracy of turnstile testing.

[0070] The technical solution of the present application and how the technical solution of the present application solves the above technical problems will be described in detail below with specific embodiments. These specific embodiments below can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below with reference to the accompanying drawings.

[0071] Figure 2 It is a schematic structural diagram of a turnstile test device provided by an embodiment of the present application. Please refer to Figure 2 As shown, the turnstile test device 100 provided by an embodiment of the present application is applied to the first turnstile 101 and the second turnstile 102, and includes a support component 200, a force measuring component 300, and a speed measuring component 400.

[0072] The force measuring component 300 is connected to the support component 200, the speed measuring component 400 is connected to the support component 200, and the support component 200 is connected to the first turnstile 101 and the second turnstile 102.

[0073] The support component 200 can be used to support the force measuring component 300 and the speed measuring component 400. For example, the support component 200 can be a frame, a support rod, etc.

[0074] In some embodiments, the structure of the support component 200 can be a telescopic structure. For example, the support component 200 can be a telescopic frame, a telescopic rod, etc.

[0075] In some embodiments, the support member 200 can adapt to different distances between the first turnstile 101 and the second turnstile 102 based on a telescopic structure. For example, when the distance between the first turnstile 101 and the second turnstile 102 is 80 cm, the support member 200 can extend or retract to 80 cm based on the telescopic structure, so as to match the distance between the first turnstile 101 and the second turnstile 102.

[0076] Optionally, the force measuring member 300 can be adhered to the support member 200 or sleeved on the support member 200. The embodiments of the present application do not limit this.

[0077] Exemplarily, one side of the support member 200 can include a slide rail with a preset length, and the force measuring member 300 can move left and right along the slide rail of the support member 200. Herein, the preset length is used to indicate the single - movement length of the force measuring member 300. For example, the preset length of the slide rail is 60 cm, and the force measuring member 300 can move from one end of the slide rail to the other end based on this slide rail, and the single - movement length is 60 cm.

[0078] In some embodiments, the force measuring member 300 can further include a motor. The motor can drive the force measuring member 300 to move to different positions based on a preset movement mode. For example, the preset movement mode can be intermittent movement, that is, the motor drives the force measuring member 300 to move on the support member 200 at a constant speed, and the motor can stop driving the force measuring member 300 at the same time interval, so that the force measuring member 300 can measure the impact force on the gate swing.

[0079] Exemplarily, the motor can drive the force measuring member to move on the support member at a constant speed. After the motor drives the force measuring member to move for 5 seconds, the motor stops driving the force measuring member 300, that is, the force measuring member 300 stops moving on the support member. In this way, the force measuring member 300 can measure the impact force on the gate swing at this position of the support member. And after the force measuring member 300 measures the impact force on the gate swing at this position, the motor can drive the force measuring member to continue moving at a constant speed for 5 seconds. Based on this driving mode, the force measuring member can measure the impact force on the gate swing at multiple positions multiple times, improving the measurement accuracy of the impact force, and further improving the accuracy of the gate swing test.

[0080] The force measuring member 300 is used to measure the impact force between the first turnstile 101 and the second turnstile 102. For example, the force measuring member 300 can be a dynamometer, a pressure sensor, etc.

[0081] In some embodiments, the force measuring component 300 may include one or more components, and the shape of each component is not limited in the embodiments of the present application. When the force measuring component 300 includes one component, the force measuring component 300 can be considered as an integrally formed device.

[0082] In some embodiments, when the force measuring component 300 is a pressure sensor, the force measuring component 300 can measure the striking forces of the first turnstile 101 and the second turnstile 102 based on the collected pressure signals, and the force measuring component 300 can convert the pressure signals into electrical signals, and the terminal device can determine whether the striking forces meet the requirements based on the electrical signals.

[0083] In some embodiments, the force measuring component 300 can measure the striking forces of the first turnstile 101 and the second turnstile 102 according to the degree of deformation of the surface structure. For example, the surface structure of the force measuring component 300 can be an elastic structure. When the gate swing is closed, the elastic structure deforms and displaces, and the force measuring component 300 can convert the deformation displacement of the elastic structure into the striking force value of the gate swing.

[0084] The speed measuring component 400 is used to measure the speeds of the first turnstile 101 and the second turnstile 102. For example, the speed measuring component 400 can be a photosensitive component 401.

[0085] The speed measuring component 400 is installed on the support component 200, and the speed measuring component 400 corresponds to the gate swings of the first turnstile 101 and the second turnstile 102.

[0086] Optionally, the speed measuring component 400 can be pasted on the support component 200, or can be inserted through the support component 200, and the exposed part of the speed measuring component 400 can correspond to the gate swings of the first turnstile 101 and the second turnstile 102 to ensure that the speed measuring component 400 can accurately measure the speed of the gate swing.

[0087] The photosensitive component 401 can determine the gate swing speed of the turnstile according to the degree of being blocked.

[0088] In some embodiments, the photosensitive component 401 can be a grating roller. The grating roller is a cylindrical device including a plurality of gratings, and the grating roller realizes the emission and reception of light through unilateral diffuse reflection.

[0089] Exemplarily, when the gate swing starts to run, the photosensitive component 401 can emit multiple light rays towards the gate swing. Among them, some light rays will be periodically blocked by the gate swing. The photosensitive component 401 can determine the degree of being blocked based on the reflected light rays, and then obtain the speed of the gate swing.

[0090] In some embodiments, the photosensitive component 401 may be a grating sensor, and the grating sensor may determine the speed of the gate swing according to the change of the optical signal. For example, the speed measuring component 400 may include a plurality of grating sensors, where the grating sensor may be located at the connection between the support component 200 and the first turnstile 101, or the grating sensor may be located at the connection between the support component 200 and the second turnstile 102, and may also be located at other positions of the support component 200.

[0091] Exemplarily, the speed measuring component 400 may include two grating sensors. Among them, the first grating sensor is located at the connection between the support component 200 and the first turnstile 101, and the second grating sensor is located at the first position of the support component 200. The first position may be the position corresponding to the edge of the gate swing when the gate swing is closed. The speed measuring component 400 may obtain the speed of the gate swing based on the change of the optical signals of the first grating sensor and the second grating sensor.

[0092] It should be noted that the first position may be a position where the second grating sensor is 5 cm, 10 cm or 15 cm away from one end of the support component. The embodiments of the present application do not make any limitations. Preferably, it is the position corresponding to the edge of the gate swing on the support component.

[0093] Exemplarily, when the second grating sensor is at the first position 1, it means that the distance between the second grating sensor and one end of the support component is 5 cm. When the second grating sensor is at the first position 2, it means that the distance between the second grating sensor and one end of the support component is 10 cm. When the second grating sensor is at the first position 3, it means that the distance between the second grating sensor and one end of the support component is 15 cm.

[0094] Next, in combination with Figure 3 , through specific examples, the test process of the turnstile test device will be described.

[0095] Figure 3 For the schematic diagram of the test process of the turnstile test device provided by the embodiments of the present application, please refer to Figure 3 , which includes a support component 200, a force measuring component 300, a speed measuring component 400, a first turnstile 101 and a second turnstile 102.

[0096] Based on the support component 200, the turnstile test device 100 is connected to the first turnstile 101 and the second turnstile 102. After the turnstile test device 100 determines that the force measuring component 300 and the speed measuring component 400 are turned on, if the force measuring component 300 does not receive the impact force, the force measuring component 300 may remain in the standby state. If the speed measuring component 400 does not receive the information blocked by the gate swing, the speed measuring component 400 may remain in the standby state.

[0097] If the force measuring component 300 receives the impact force of the brake pendulum, the turnstile testing device 100 can obtain the impact force measured by the force measuring component 300. If the force measuring component 300 receives the information blocked by the brake pendulum, the turnstile testing device 100 can obtain the speed of the brake pendulum measured by the speed measuring component 400. For any one test, the force measuring component 300 can be moved to different positions to measure the impact force of the brake pendulum.

[0098] In the embodiment of the present application, the turnstile testing device includes a support component, a force measuring component and a speed measuring component. The force measuring component can measure the impact force of the brake pendulum, and the speed measuring component can measure the rotational speed of the brake pendulum. In the above process, since the turnstile testing device can be fixed inside the first turnstile and the second turnstile, the turnstile testing device can perform on-site testing on the brake pendulum without manual disassembly of the brake pendulum or sending it for inspection. Moreover, the terminal device can accurately determine whether the motion performance of the brake pendulum meets the requirements based on the impact force and speed measured by the turnstile testing device. In this case, the turnstile testing device can adapt to the turnstile testing requirements with different spacings, and this process takes less time, improving the efficiency and accuracy of turnstile testing.

[0099] On the basis of any one of the above embodiments, hereinafter, in combination with Figure 4 , Figure 5 and Figure 6 , the structure of the turnstile testing device will be described in detail.

[0100] Figure 4 FIG. is a schematic structural diagram of another turnstile testing device provided by an embodiment of the present application, Figure 5 is Figure 4 a side view of the turnstile testing device.

[0101] The turnstile testing device 100 further includes a sliding component 301. The sliding component 301 is connected to the support component 200. The sliding component 301 corresponds to the brake pendulums of the first turnstile 101 and the second turnstile 102, and the force measuring component 300 is installed on the sliding component 301.

[0102] The sliding component 301 can be used to fix the force measuring component 300. For example, the sliding component 301 can be a slider.

[0103] The sliding component 301 can be sleeved on the support component 200. The force measuring component 300 can be fixed on one side of the sliding component 301, and the force measuring component 300 is aligned with the brake pendulum.

[0104] In some embodiments, there is a groove, that is, a chute, on the side of the support component 200 close to the brake pendulum. Correspondingly, there is a protruding part on the inner surface (close to the brake pendulum) of the sliding component 301. Among them, the protruding part of the sliding component 301 matches the groove of the support component 200, and the protruding part slides in the chute.

[0105] Exemplarily, the sliding member 301 can move within the sliding groove on the surface of the support member 200, that is, the force measuring member 300 can move on the support member 200 based on the sliding member 301 to measure the impact force at multiple positions on the brake pendulum. Moreover, the sliding member 301 can be fixed to the support member through a latch to avoid measurement deviation during the force measurement process. For example, the latch can be located at the bottom of the sliding member 301.

[0106] Optionally, the sliding member 301 can include a motor, that is, the motor can drive the sliding member 301 and the force measuring member 300 to move on the support member 200.

[0107] Figure 6 It is a schematic diagram of the test process of the turnstile test device provided by the embodiment of the present application.

[0108] Next, the working process of the turnstile test device 100 will be described through the sliding member 301:

[0109] As Figure 6 shown, when the turnstile test device 100 conducts the first test, the force measuring member 300 can slide to the first position of the support member 200 based on the sliding member 301, and the force measuring member 300 can measure the impact force of the brake pendulum at this first position. When the turnstile test device 100 conducts the second test, the force measuring member can slide to the second position of the support member 200 based on the sliding member 301, and the force measuring member 300 measures the impact force on the brake pendulum at this second position, and so on. The force measuring member can measure the impact force at multiple positions on the brake pendulum, improving the accuracy of the brake pendulum test.

[0110] In the embodiment of the present application, since the force measuring member can move on the support member based on the sliding member, the force measuring member can measure the impact force at multiple positions of the brake pendulum without repeated disassembly and assembly, which can reduce the human error during the measurement process. In the above structure, while improving the reliability of the turnstile test device, the accuracy of the impact force measurement result is also improved.

[0111] Based on any of the above embodiments, next, in combination with Figure 7 the structure of the turnstile test device will be described in detail.

[0112] Figure 7 It is a schematic diagram of the structure of another turnstile test device provided by the embodiment of the present application. The turnstile test device 100 further includes a first suction cup 201 and a second suction cup 202. The support member 200 includes a first end and a second end, where:

[0113] The first suction cup 201 is connected to the first end, and the second suction cup 202 is connected to the second end. The first suction cup adsorbs on the inner side of the first turnstile 101, and the second suction cup 202 adsorbs on the inner side of the second turnstile 102.

[0114] The turnstile testing device 100 can be connected to the first turnstile 101 and the inner side of the first turnstile 101 based on the first suction cup 201 and the second suction cup 202.

[0115] The first suction cup 201 can be used to fix the first end of the support member 200 on the first turnstile 101. Among them, one end of the first suction cup 201 is adsorbed and connected to the first turnstile 101, and the other end of the first suction cup 201 is connected to the first end of the support member 200 to ensure that the turnstile testing device is easy to disassemble.

[0116] The second suction cup 202 can be used to fix the second end of the support member 200 on the second turnstile 102. Among them, one end of the second suction cup 202 is adsorbed and connected to the second turnstile 102, and the other end of the second suction cup 202 is connected to the second end of the support member 200. In this way, the disassembly complexity of the turnstile testing device can be reduced, and the disassembly efficiency of the turnstile testing device can be improved.

[0117] Optionally, the first suction cup 201 and the second suction cup 202 can be pasted on the support member 200 or fixedly connected to the support member. The embodiments of the present application do not limit this.

[0118] Next, in combination with Figure 8 , through specific examples, the structure of the support member will be described.

[0119] Figure 8 For the structural schematic diagram of the support member provided by the embodiments of the present application, please refer to Figure 5 , the first end of the support member 200 is connected to the first turnstile 101 through the first suction cup 201, and the second end of the support member 200 is connected to the second turnstile 102 through the second suction cup 202. Among them, the first end and the second end of the support member 200 are represented by a dotted rectangular frame.

[0120] The turnstile testing device 100 further includes a screw 203. The first suction cup 201 and the second suction cup 202 are connected to the support member 200 through the screw 203. For example, the turnstile testing device 100 can include multiple screws 203 to adjust the length in real time.

[0121] The screw 203 can be used to adjust the length of the turnstile testing device 100.

[0122] Exemplarily, the turnstile testing device 100 includes a first screw 204 and a second screw 205. The first screw 204 and the second screw 205 can be passed through the support member 200. The first end of the support member 200 has a first threaded hole, and the second end has a second threaded hole. Among them, one end of the first screw 204 is sleeved in the first threaded hole and is matched with the first threaded hole, and the other end of the first screw 204 is connected to the first suction cup 201; one end of the second screw 205 is sleeved in the second threaded hole and is matched with the second threaded hole, and the other end of the second screw 205 is connected to the second suction cup 202.

[0123] In the embodiment of the present application, since the first suction cup and the second suction cup can fix the turnstile testing device on the inner sides of the first turnstile and the second turnstile, the rapid installation and disassembly of the turnstile testing device are realized. Moreover, due to the telescopic characteristic of the screw, this characteristic can change the length of the turnstile testing device to adapt to double turnstile channels with different spacings. In the above structure, it is possible to quickly install and disassemble the turnstile testing device on-site, thereby reducing the time for installing and disassembling the gate swing. Furthermore, based on the telescopic characteristic of the screw, the turnstile testing device can meet different turnstile testing requirements, improving the efficiency and accuracy of the turnstile testing device.

[0124] On the basis of any one of the above embodiments, hereinafter, in combination with Figure 9 , the structure of the turnstile testing device will be described in detail.

[0125] Figure 9 FIG. is a schematic structural diagram of another turnstile testing device provided by an embodiment of the present application. The turnstile testing device 100 further includes a control device 500.

[0126] Optionally, the control device 500 can be connected to the support member 200.

[0127] Exemplarily, the control device 500 is located inside the support member 200 and is laid at the bottom of the support member 200 to ensure communication connection with other components.

[0128] In some embodiments, the control device 500 can be connected to the force measuring component 300 and the speed measuring component 400, and the control device 500 can also be connected to an external terminal device. For example, the control device 500 can be connected to the terminal device through interfaces such as RS485 and Wife.

[0129] Next, in combination with Figure 10 , the structure of the control device will be described through specific examples.

[0130] Figure 10 FIG. is a schematic structural diagram of the control device provided by an embodiment of the present application. Please refer to Figure 10, the control device 500 includes a first interface, a second interface, a third interface, and a power interface.

[0131] Among them, the first interface of the control device 500 is connected to the force measuring component 300 to receive the information of the impact force measured by the force measuring component 300; the second interface of the control device 500 is connected to the speed measuring component 400 to receive the information of the speed measured by the speed measuring component 400; for the information of the impact force measured by the control device 500 and the force measuring component 300 and the information of the speed measured by the speed measuring component 400, the terminal device can send a control instruction to the control device 500; the control device 500 can be connected to a power supply of 24V DC (DC24V) through the power interface.

[0132] Next, the working process of the turnstile testing device will be described through the control device:

[0133] The turnstile testing device 100 is connected to the first turnstile 101 and the second turnstile 102 based on the first suction cup 201 and the second suction cup 202. The force measuring component 300 can move to positions 1, 2, 3, etc. of the support component 200 based on the sliding component 301.

[0134] For any position of the support component 200, after the turnstile testing device 100 determines that the force measuring component 300, the sliding component 301, and the speed measuring component 400 are in the open state, the force measuring component 300 can measure the impact force and send the impact force to the control device 500. The control device 500 can send the impact force to the terminal device. Based on the impact force, the terminal device can determine whether the impact force of the gate swing meets the requirements. The speed measuring component 400 can measure the information associated with the duration from the opening to the closing of the gate swing and send the information to the control device 500. The control device 500 can determine the duration from the opening to the closing of the gate swing based on the information and send the duration to the terminal device. The terminal device can determine whether the speed of the gate swing meets the requirements based on the duration.

[0135] In the embodiment of the present application, the turnstile testing device can be connected to the inner sides of the first turnstile and the second turnstile based on the first suction cup and the second suction cup. Moreover, based on the telescopic characteristic of the screw, the turnstile testing device can adapt to double turnstile channels with different spacings. And the control device can obtain the impact force measured by the force measuring component and determine the speed of the gate swing based on the information measured by the speed measuring component, and send these data to the terminal device. In the above process, the effect of quickly installing and disassembling the turnstile testing device on-site can be achieved, without manual disassembly of the gate swing or sending it for inspection. Moreover, the terminal device can accurately determine whether the motion performance of the gate swing meets the requirements based on the impact force and the speed of the gate swing, improving the efficiency and accuracy of turnstile testing.

[0136] Based on any of the above embodiments, next, in combination withFigure 11 A method for testing the state of a turnstile by the above turnstile testing device will be described in detail.

[0137] Figure 11 It is a schematic flowchart of a turnstile testing method provided by an embodiment of the present application. Please refer to Figure 11 This method may include:

[0138] S1101. Determine the first striking force and / or the first duration of the turnstile swing.

[0139] The first striking force can be used to indicate the striking force generated when the turnstile swing rotates. Among them, the unit of the first striking force is Newton (N).

[0140] In some embodiments, the first striking force may include multiple striking forces. For example, the turnstile testing device can test the striking forces at multiple positions on the turnstile swing. The terminal device can obtain the striking forces at multiple positions on the turnstile swing and determine the striking forces at multiple positions on the turnstile swing as the first striking force. For example, the positions on the turnstile swing may include Position 1, Position 2, and Position 3. The terminal device can obtain the striking force A corresponding to Position 1, the striking force B corresponding to Position 2, and the striking force C corresponding to Position 3. The terminal device can determine the striking force A, the striking force B, and the striking force C as the first striking force.

[0141] In some embodiments, the terminal device can determine the first striking force based on the signal measured by the force measuring component. For example, the force measuring component is a pressure sensor. When the turnstile swing strikes the pressure sensor, the pressure sensor can receive a pressure signal. After the pressure sensor converts the pressure signal into an electrical signal, it can send the electrical signal to the control device, and the control device can send the electrical signal to the terminal device. The terminal device can determine the first striking force of the turnstile swing based on the electrical signal. For example, the terminal device can determine the correspondence between the electrical signal and the striking force, and determine the first striking force of the turnstile swing based on the received electrical signal and the correspondence.

[0142] In some embodiments, the terminal device can determine the first striking force of the turnstile swing based on the pressure measured by the force measuring component. For example, when the turnstile swing strikes the force measuring component, the elastic structure on the surface of the force measuring component deforms. The force measuring component can determine the pressure value based on its deformation degree and send the pressure value to the control device. The control device can send the pressure value to the terminal device. The terminal device can determine the striking force of the turnstile swing based on the pressure value. For example, the force measuring component can be a dynamometer. When the turnstile swing strikes the dynamometer, if the pressure measured by the dynamometer is 10 N, the terminal device can determine the first striking force of the turnstile swing as 10 N.

[0143] The first duration can be used to indicate the speed of the brake pendulum. For example, the first duration can be used to indicate the speed of the rotation of the brake pendulum. For example, the first duration can be used to indicate the angular velocity of the brake pendulum. For example, after the terminal device determines the first duration, it can determine the speed of the brake pendulum based on the angle that the brake pendulum rotates within the first duration and the first duration.

[0144] It should be noted that when the brake pendulum rotates through the same angle, the shorter the duration required for the brake pendulum, the faster the speed of the brake pendulum, and the longer the duration required for the brake pendulum, the slower the speed of the brake pendulum.

[0145] In some embodiments, the unit of the first duration is milliseconds (ms). It should be noted that the unit of the first duration can also be any time unit such as seconds, and the embodiments of the present disclosure do not limit this.

[0146] The terminal device can determine the first duration of the brake pendulum based on the following feasible implementation methods: determining the first parameter of the speed measurement component; and determining the first duration based on the first parameter.

[0147] Among them, the first parameter can be used to indicate the degree of occlusion of the speed measurement component. For example, the degree of occlusion can be the degree of occlusion of the speed measurement component by the brake pendulum. In other words, the degree of occlusion can be the area of the speed measurement component occluded by the brake pendulum.

[0148] In some embodiments, the first parameter can be the number of reflected light points, and the speed measurement component is a grating roller. The control device can judge the number of occluded light points on the grating roller by analyzing the change of the unilateral diffuse reflection light points on the grating roller, and send the number of occluded light points to the terminal device. The terminal device can determine the number of occluded light points as the first parameter.

[0149] In some embodiments, the number of reflected light points is proportional to the degree of occlusion of the speed measurement component. For example, the fewer the number of reflected light points, it means that the area of the brake pendulum reflecting light is smaller, that is, the area of the speed measurement component occluded by the brake pendulum is smaller, and the more the number of reflected light points, it means that the area of the brake pendulum reflecting light is larger, that is, the area of the speed measurement component occluded by the brake pendulum is larger.

[0150] In some embodiments, the speed measurement component may include a sensor, and the first parameter can indicate the state of the indicator light of the sensor. The terminal device can determine whether the sensor is occluded by the brake pendulum based on the state of the indicator light of the sensor. For example, if the state of the indicator light of the sensor is on, the terminal device can determine that the position where the sensor is located is occluded by the brake pendulum. If the state of the indicator light of the sensor is off, the terminal device can determine that the position where the sensor is located is not occluded by the brake pendulum.

[0151] In some embodiments, a speed measurement component may include multiple sensors, and the terminal device may determine the degree of occlusion of the speed measurement component based on the status of the indicator lights of the multiple sensors.

[0152] Exemplarily, the speed measurement component includes Sensor 1, Sensor 2, Sensor 3, and Sensor 4. The length of the speed measurement component is 40 cm. Sensor 1 is located 10 cm from the left edge of the speed measurement component, Sensor 2 is located 20 cm from the left edge of the speed measurement component, Sensor 3 is located 30 cm from the left edge of the speed measurement component, and Sensor 4 is located 40 cm from the left edge of the speed measurement component (Sensor 4 is at the right edge of the speed measurement component). When the status of the indicator light of Sensor 1 changes from the off state to the on state, the terminal device may determine that the speed measurement component is occluded by 25%. When the status of the indicator light of Sensor 2 changes from the off state to the on state, the terminal device may determine that the speed measurement component is occluded by 50%. When the status of the indicator light of Sensor 3 changes from the off state to the on state, the terminal device may determine that the speed measurement component is occluded by 75%. When the status of the indicator light of Sensor 4 changes from the off state to the on state, the terminal device may determine that the speed measurement component is occluded by 100%.

[0153] It should be noted that the terminal device may determine the first parameter of the speed measurement component based on any feasible implementation manner, and the embodiments of the present disclosure do not limit this.

[0154] In some embodiments, the terminal device may determine the first duration based on the degree of occlusion of the speed measurement component indicated by the first parameter. For example, the first duration may be the duration required for the speed measurement component to be completely occluded by the brake pendulum. For example, the first duration may also be the duration from when the brake pendulum opens to when it closes. In other words, the first duration may be the duration required for the brake pendulum to perform maximum occlusion on the speed measurement component (the maximum area of the speed measurement component occluded by the brake pendulum).

[0155] Exemplarily, if the brake pendulum can completely occlude the speed measurement component when it closes, the first duration may be the duration between the moment when the speed measurement component starts to be occluded by the brake pendulum and the moment when the speed measurement component is completely occluded by the brake pendulum. If the brake pendulum cannot completely occlude the speed measurement component when it closes, the first duration may be the duration between the moment when the speed measurement component starts to be occluded by the brake pendulum and the moment when the brake pendulum performs maximum occlusion on the speed measurement component.

[0156] In some embodiments, the first duration may also be the duration required for the speed measurement component to be occluded by 50%, the duration required for the speed measurement component to be occluded by 75%, etc. The embodiments of the present disclosure do not limit this.

[0157] In some embodiments, the terminal device may determine the moment corresponding to the degree of occlusion based on the moment when the speed measurement component determines the first parameter. For example, if the speed measurement component determines the first parameter A at moment 1 and the first parameter B at moment 2, and if the first parameter A indicates that the speed measurement component is occluded by 50% and the first parameter B indicates that the speed measurement component is occluded by 100%, then the terminal device may determine that the speed measurement component is occluded by the gate swing by 50% at moment 1 and 100% at moment 2.

[0158] Exemplarily, the first duration may be the duration required for the speed measurement component to be completely occluded by the gate swing. Among them, the first parameter A indicates that the speed measurement component is occluded by 1%, and the first parameter B indicates that the speed measurement component is occluded by 100%. The speed measurement component determines the first parameter A at the 1st ms and the first parameter B at the 10th ms. The terminal device may determine that the duration required for the speed measurement component to be completely occluded is 9 ms, that is, the terminal device may determine that the first duration is 9 ms.

[0159] S1102. Determine the state of the turnstile based on the first striking force and / or the first duration.

[0160] Among them, the state is an alarm state or a non-alarm state.

[0161] When the state of the turnstile is the alarm state, the terminal device may determine that the test of the turnstile fails. For example, if the state of the turnstile is the alarm state, it means that the first striking force and / or the first duration of the gate swing of the turnstile do not meet the requirements.

[0162] The non-alarm state may indicate that the test of this turnstile passes.

[0163] In some embodiments, the terminal device may determine the state of the turnstile based on the first striking force. Among them, if the difference between the first striking force and the standard striking force is greater than the first preset deviation, the terminal device may determine that the state of the turnstile is the alarm state. If the difference between the first striking force and the standard striking force is less than or equal to the first preset deviation, the terminal device may determine that the state of the turnstile is the non-alarm state, where the standard striking force is used to indicate the maximum striking force value that the gate swing can reach as preset.

[0164] In some embodiments, the terminal device may determine the state of the turnstile based on multiple first striking forces. Among them, if there is at least one first striking force exceeding the preset threshold among the multiple first striking forces, the terminal device may determine that the state of the turnstile is the alarm state. If all the first striking forces do not exceed the preset threshold, the terminal device may determine that the state of the turnstile is the non-alarm state, where the preset threshold is used to indicate the maximum striking force reached by the gate swing as preset.

[0165] Optionally, among multiple first striking forces, if the number of first striking forces exceeding a preset threshold exceeds a preset quantity, the terminal device may determine that the state of the turnstile is an alarm state; if the number of first striking forces exceeding the threshold does not exceed the preset quantity, the terminal device may determine that the state of the turnstile is a non-alarm state, where the preset quantity is used to indicate the maximum quantity of first striking forces that do not meet the requirements and are preset in advance.

[0166] In some embodiments, the terminal device may determine the state of the turnstile based on a first duration. Among them, if the difference between the first duration and a standard duration is greater than a second preset deviation, the terminal device may determine that the state of the turnstile is an alarm state; if the difference between the first duration and the standard duration is less than or equal to the second preset deviation, the terminal device may determine that the state of the turnstile is a non-alarm state, where the standard duration is used to indicate the speed that the turnstile needs to reach and is preset in advance.

[0167] In some embodiments, the terminal device may determine the state of the turnstile based on a first striking force and a first duration. Among them, if the difference between the first striking force and a standard striking force is greater than a first preset deviation, or the difference between the first duration and the standard duration is greater than a second preset deviation, the terminal device may determine that the state of the turnstile is an alarm state; if the difference between the first striking force and the standard striking force is less than or equal to the first preset deviation and the difference between the first duration and the standard duration is less than or equal to the second preset deviation, the terminal device may determine that the state of the turnstile is a non-alarm state.

[0168] In some embodiments, the terminal device may also display a prompt message, where the prompt message may be associated with the alarm state. For example, the prompt message may be used to indicate that the state of the turnstile is an alarm state or a non-alarm state. For example, after the terminal device determines the state of the turnstile, it may determine the prompt message based on the state of the turnstile and display the prompt message.

[0169] Exemplarily, when the terminal device determines that the state of the turnstile is an alarm state, the terminal device generates a text message, the text content is that the first duration is 2 ms, and it displays that the first duration has exceeded the preset duration by 5 ms, alarm.

[0170] In some embodiments, after the terminal device determines the state of the turnstile, it may indicate the state of the turnstile based on an alarm light. For example, when it is green, it means that the state of the turnstile is a non-alarm state; when it is red, it means that the state of the turnstile is an alarm state; when it is flashing, it means that the state of the turnstile is an alarm state.

[0171] In the actual application process, the terminal device may increase the rotation speed of the turnstile swing, thereby increasing the first duration, and may increase the torque of the turnstile swing, thereby increasing the first striking force.

[0172] In an embodiment of the present application, the terminal device determines the state of the turnstile by obtaining the first striking force and / or the first duration from when the turnstile swing opens to when it closes, and based on the first striking force and / or the first duration. Moreover, the terminal device can determine whether the movement performance of the turnstile swing meets the requirements based on the state of the turnstile. In the above process, the terminal device can analyze the striking force and speed of the turnstile swing through a turnstile testing device to ensure the reliability and safety of the turnstile swing, improving the efficiency and accuracy of turnstile testing.

[0173] Figure 12 FIG. is a schematic structural diagram of a turnstile testing device provided by an embodiment of the present application. Please refer to Figure 12 , the turnstile testing device 10 includes: a determination module 11 and a processing module 12, where

[0174] The determination module 11 is configured to determine the first striking force and / or the first duration of the turnstile swing, and the first duration is used to indicate the speed of the turnstile swing;

[0175] The processing module 12 is configured to determine the state of the turnstile based on the first striking force and / or the first duration, and the state is an alarm state or a non-alarm state.

[0176] In a possible implementation manner, the determination module 11 is specifically configured to:

[0177] Determine the first parameter of the speed measurement component, where the first parameter is used to indicate the degree of occlusion of the speed measurement component;

[0178] Determine the first duration based on the first parameter.

[0179] The turnstile testing device provided by the embodiment of the present application can execute the method shown in the above method embodiment, and its implementation principle and beneficial effects are similar, which will not be elaborated here.

[0180] Figure 13 FIG. is a schematic structural diagram of an electronic device provided by an embodiment of the present application. As Figure 13 shown, the electronic device 20 may include: a transceiver 21, a processor 22, and a memory 23.

[0181] The processor 22 executes the computer execution instructions stored in the memory, so that the processor 22 executes the solutions in the above embodiments. The processor 22 may be a general-purpose processor, including a central processing unit CPU, a network processor (NP), etc.; it may also be a digital signal processor DSP, an application-specific integrated circuit ASIC, a field-programmable gate array FPGA, or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0182] The memory 23 is connected to the processor 22 via the system bus and completes the communication therebetween. The memory 23 is used to store computer program instructions.

[0183] The transceiver 21 can be used to obtain the task to be run and the configuration information of the task to be run.

[0184] The system bus can be a peripheral component interconnect (PCI) bus, an extended industry standard architecture (EISA) bus, etc. The system bus can be divided into an address bus, a data bus, a control bus, etc. For the convenience of representation, only a thick line is used in the figure, but it does not mean that there is only one bus or one type of bus. The transceiver is used to implement the communication between the database access device and other computers (such as clients, read-write libraries, and read-only libraries). The memory may include a random access memory (RAM), and may also include a non-volatile memory.

[0185] The electronic device provided by the embodiment of the present application can be the terminal device in the above embodiment.

[0186] The embodiment of the present application also provides a chip for running instructions. The chip is used to execute the technical solution of the gate testing method in the above embodiment.

[0187] The embodiment of the present application also provides a computer-readable storage medium. Computer instructions are stored in the computer-readable storage medium. When the computer instructions are run on a computer, the computer is made to execute the technical solution of the gate testing method in the above embodiment.

[0188] The embodiment of the present application also provides a computer program product. The computer program product includes a computer program which is stored in a computer-readable storage medium. At least one processor can read the computer program from the computer-readable storage medium. When at least one processor executes the computer program, the technical solution of the gate testing method in the above embodiment can be implemented.

[0189] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be indirect couplings or communication connections through some interfaces, devices or modules, and can be in electrical, mechanical or other forms.

[0190] The modules described as separate components may or may not be physically separated. The components shown as modules may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to implement the solution of this embodiment.

[0191] In addition, the functional modules in each embodiment of the present application can be integrated in a processing unit, or each module can exist physically alone, or two or more modules can be integrated in a unit. The units formed by the above modules can be implemented in the form of hardware or in the form of a combination of hardware and software functional units.

[0192] The integrated modules implemented in the form of software functional modules can be stored in a computer-readable storage medium. The above software functional modules are stored in a storage medium and include several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor to execute some steps of the methods in the various embodiments of the present application.

[0193] It should be understood that the above processor can be a central processing unit (Central Processing Unit, abbreviated as CPU), and can also be other general-purpose processors, digital signal processors (Digital Signal Processor, abbreviated as DSP), application specific integrated circuits (Application Specific Integrated Circuit, abbreviated as ASIC), etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in combination with the invention can be directly embodied as being executed by a hardware processor, or executed by a combination of hardware and software modules in the processor.

[0194] The memory may include high-speed RAM memory and may also include non-volatile storage NVM, such as at least one disk memory, and can also be a USB flash drive, a mobile hard disk, a read-only memory, a magnetic disk or an optical disc, etc.

[0195] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, or the like. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, the buses in the drawings of this application are not limited to only one bus or one type of bus.

[0196] The above storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as a static random access memory (SRAM), an electrically erasable programmable read-only memory (EEPROM), an erasable programmable read-only memory (EPROM), a programmable read-only memory (PROM), a read-only memory (ROM), a magnetic memory, a flash memory, a magnetic disk, or an optical disc. The storage medium can be any available medium that can be accessed by a general-purpose or special-purpose computer.

[0197] An exemplary storage medium is coupled to the processor, enabling the processor to read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an Application Specific Integrated Circuits (ASIC). Of course, the processor and the storage medium can also exist as discrete components in an electronic control unit or a master control device.

[0198] Those of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions. The foregoing program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps including the above method embodiments; and the foregoing storage medium includes: various media such as ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0199] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some or all of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A turnstile testing device is applied to a first turnstile and a second turnstile, characterized in that, It includes a support component, a force measuring component and a speed measuring component, wherein: The force measuring component is connected to the support component, the speed measuring component is connected to the support component, and the support component is connected to the first turnstile and the second turnstile; The force measuring component is used to measure the striking force of the first turnstile and the second turnstile, and the speed measuring component is used to measure the speed of the first turnstile and the second turnstile.

2. The turnstile testing device according to claim 1, wherein The speed measuring component is a photosensitive component, the speed measuring component is installed on the support component, and the speed measuring component corresponds to the gate swings of the first turnstile and the second turnstile.

3. The gate testing device according to claim 1, characterized in that, The turnstile testing device further includes a sliding component, the sliding component is connected to the support component, the sliding component corresponds to the gate swings of the first turnstile and the second turnstile, and the force measuring component is installed on the sliding component.

4. The turnstile testing device according to any one of claims 1-3, characterized in that, The turnstile testing device further includes a first suction cup and a second suction cup, and the support component includes a first end and a second end, wherein: The first suction cup is connected to the first end, the second suction cup is connected to the second end, the first suction cup adsorbs on the inner side of the first turnstile, and the second suction cup adsorbs on the inner side of the second turnstile.

5. The turnstile testing device according to claim 4, wherein The turnstile testing device further includes a screw, and the first suction cup and the second suction cup are connected to the support component through the screw.

6. A ticket gate testing method, characterized in that, For detecting the state of a turnstile by using the turnstile testing device according to any one of claims 1-5, the method includes: Determining a first striking force and / or a first duration of the gate swing, where the first duration is used to indicate the speed of the gate swing; Based on the first striking force and / or the first duration, determining the state of the turnstile, where the state is an alarm state or a non-alarm state.

7. The method according to claim 6, wherein Determining the first duration of the gate swing includes: Determining a first parameter of the speed measuring component, where the first parameter is used to indicate the degree of occlusion of the speed measuring component; Based on the first parameter, determining the first duration.

8. A ticket gate testing device, characterized in that, It includes: A determination module and a processing module, wherein: The determination module is configured to determine a first striking force and / or a first duration of the gate swing, where the first duration is used to indicate the speed of the gate swing; The processing module is configured to determine the state of the turnstile based on the first striking force and / or the first duration, where the state is an alarm state or a non-alarm state.

9. An electronic device, characterized in that, It includes: A processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 6-7.

10. A computer-readable storage medium, characterized in that, Computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, they are used to implement the method according to any one of claims 6-7.

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