Spectrometer device and method for classifying sample

Abstract

The invention relates to a spectrometer arrangement (100) for classifying a sample (200), comprising at least one evaluation device (118), where the at least one evaluation device (118) is configured for performing a physical classification of the sample (200) and a chemical classification of the sample (200) by taking into account a first detector module (106) signal and a second detector module (112) signal. The invention further relates to a method for classifying a sample, a computer program and a non-transitory computer-readable storage medium. The spectrometer device for classifying a sample, the method for classifying a sample, the computer program, and the non-transitory computer-readable storage medium provide a compact spectrometer device that can enable reliable, easy, versatile, and rapid classification of a sample.

Description

Technical Field

[0001] The present invention relates to a spectrometer device for classifying samples, a method for classifying samples, a computer program, and a non-transitory computer-readable storage medium. Such a spectrometer device can generally be used for investigation or monitoring purposes, specifically for classification purposes. Background Art

[0002] Due to the huge amount of plastic waste generated, plastic recycling has become a closely related topic. To cope with this waste, time- and cost-effective plastic sorting has become increasingly important.

[0003] Using spectrometers, specifically near-infrared wavelengths greater than 800 nm, to identify and / or classify material properties particularly according to the needs of plastic sorting is generally considered a common practice. However, depending on the wavelength considered, some materials to be classified are opaque or very opaque. In an example, HDPE can typically show a greater reflectance at 1300 nm than PETE. For this wavelength, HDPE can be considered a less opaque material. For the sorting of these materials, primary sorting, typically visual inspection, may generally be required before classification can be carried out. Usually, classification can be based on the chemical properties of the sample that can be determined by using transmission- and / or reflection-based spectroscopy. The disadvantage of such a system is that, due to the required additional visual sensor (which can typically be a high-resolution CCD camera), systems with automatic visual inspection are generally complex and bulky.

[0004] Various devices and methods for material classification using NIR spectroscopy may be known. These devices and methods can generally be based on the application of techniques for analyzing the spectra generated by the spectrometer device. Here, the spectrometer device can be used in a reflection configuration or a transmission configuration depending on the specific application. In an application involving an opaque material (such as a piece of textile), a spectrometer device with a reflection configuration can generally be used. In another application involving the classification of transparent materials, particularly glass or plastic materials (such as PET, PP, PE), a transmission configuration can generally be used. In yet another application involving both a reflection configuration and a transmission configuration, sequential classification can generally be adopted.

[0005] WO 2015 / 121070 A1 relates to a device, system and method for determining a subject's vital signs. To improve accuracy and reliability, the device includes a detection unit for non-contact detection of light in at least two different wavelength ranges from an area of interest of the subject, wherein the detection unit is configured to detect a first light portion in a first wavelength range in the light reflected from the area of interest in response to irradiation by a first light source, and to detect a second light portion in a second wavelength range in the light transmitted through the area of interest in response to irradiation by a second light source, wherein the detection unit is configured to simultaneously detect the first light portion and the second light portion in response to at least temporarily simultaneous irradiation, and wherein the first wavelength range and the second wavelength range are different. A processing unit is provided for deriving a photoplethysmogram (PPG) signal from the detected light in the at least two different wavelength ranges. An analysis unit is provided for deriving the desired vital signs from the PPG signals in at least two different wavelength ranges.

[0006] US2017 / 0202493A1 relates to a device and method for non-invasively determining a hematocrit value of a subject. The device includes: a light source for emitting light onto a skin area of the subject, the light including first light of a first wavelength in a first wavelength range between 500 and 1000 nm and second light of a second wavelength in a second wavelength range between 1000 and 2000 nm; a reflection detector for detecting light reflected from the skin area of the subject in response to irradiation by the light source; a transmission detector for detecting light transmitted through the skin area of the subject in response to irradiation by the light source; a processing unit for deriving photoplethysmogram PPG signals of the first wavelength and the second wavelength from the light detected by the reflection detector and the transmission detector; and an analysis unit for determining the hematocrit value of the subject based on the PPG signals.

[0007] GB 2604346 A discloses a method for measuring the concentration of an analyte, such as in vivo blood, the method including using an optical source to irradiate a biological material with optical radiation having a wavelength between 400 nanometers and 25 micrometers, and using a radio frequency (RF) radiation source to irradiate with a wavelength between 1 millimeter and 30 centimeters. An optical detector and an RF detector detect signals from the biological material. The concentration of glucose in the biological material is determined based on the two detected signals. This can be done sequentially or simultaneously, with the detectors placed on the same or opposite sides of the biological material as the emitter, for example on both sides of the skin between the finger and thumb, for example positioned by a wearable strap clip placed around the circumference of the hand. Detecting signals at both infrared and RF can increase sensitivity and specificity.

[0008] Problems to be Solved

[0009] Accordingly, it is desirable to provide a spectrometer device, a method for classifying a sample, a computer program, and a non-transitory computer-readable storage medium that at least partially overcome the problems of the prior art. It is further desirable to provide a compact spectrometer device that can perform reliable, easy, versatile, and fast sample classification. SUMMARY OF THE INVENTION

[0010] This problem is solved by a spectrometer device, a method for classifying a sample, a computer program, and a non-transitory computer-readable storage medium having the features of the independent claims. Advantageous embodiments that can be implemented in an independent manner or in any combination are set forth in the dependent claims and in the description.

[0011] In a first aspect of the present invention, a spectrometer device for classifying a sample is disclosed. The spectrometer device comprises:

[0012] - at least one radiation source, wherein the at least one radiation source is configured to emit radiation;

[0013] - at least one sample holder, wherein the at least one sample holder is configured to hold a sample;

[0014] - at least one detector module,

[0015] ○ wherein the at least one detector module is arranged to detect at least a part of the emitted radiation reflected by the sample, such that a first detector module signal is generated;

[0016] ○ wherein the at least one detector module is further arranged to detect at least a part of the emitted radiation transmitted through the sample, such that a second detector module signal is generated;

[0017] - at least one evaluation device, wherein the at least one evaluation device is configured to perform a physical classification and a chemical classification of the sample by taking into account the first detector module signal and the second detector module signal.

[0018] As used herein, the term "spectrometer device" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a device capable of classifying a sample, particularly considering signals from at least one integrated detector module and / or signals from at least one wavelength-resolved detector module. Thereby, signal intensities can be recorded, particularly the signal intensities corresponding to wavelengths, such as wavelength ranges, of a spectrum or its partitions. As used herein, the term "spectrum" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, partitions of a spectral range, particularly partitions of incident radiation. Each partition of the spectrum can be constituted by a detector signal, which can be defined by a signal wavelength and a corresponding signal intensity.

[0019] As used herein, the term "classification" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the process of grouping a plurality of objects, particularly a plurality of samples, into at least two different classes. These classes can together form a classification. Sorting can be performed by applying at least one sorting criterion. Thereby, a first object can exhibit a first criterion, such as a first criterion related to the sorting process, and can thus be sorted into a first class, while a second object can exhibit a second criterion, such as a second criterion related to the sorting process, and can thus be sorted into a second class that can be different from the first class, particularly because the first criterion exhibited can be different from the second criterion exhibited. For the purposes of the present invention, classification can be performed by applying physical criteria (such as in physical classification). Additionally or alternatively, classification can be performed by applying chemical criteria (such as in chemical classification).

[0020] As used herein, the term "radiation" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, waves and / or particles carrying energy. The radiation can be electromagnetic radiation. The electromagnetic radiation can be formed by at least one electromagnetic field wave. The electromagnetic radiation can be selected from at least one of the following: radio waves; microwaves; infrared; visible light; ultraviolet light; X-rays; or gamma rays. For the purposes of the present invention, particularly electromagnetic radiation, such as infrared radiation specifically having a wavelength of 780 nm to 15 μm, preferably 1 μm to 5 μm, more preferably 1 μm to 3 μm, and particularly 2 μm to 3 μm, can be particularly advantageous.

[0021] As used herein, the term "radiation source" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a unit, entity, or device that generates radiation, particularly radiation as defined above, specifically electromagnetic radiation. The radiation source can be configured to expose a sample to at least a portion of the radiation. Thus, at least a portion of the generated radiation can be generated in such a way that it can impinge on the sample, particularly when the sample can be arranged, specifically as intended, in a sample holder. The radiation that can be generated can propagate, particularly due to the corresponding guidance in a spectrometer device, to the sample arranged, particularly as intended, in the sample holder.

[0022] Typical radiation sources can be thermal radiators, particularly black bodies and / or incandescent lamps, and / or MEMS-based emitters. As used herein, the term "thermal radiator" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a radiation source that emits radiation from a heated material. As used herein, the term "incandescent lamp" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a radiation source, particularly an electromagnetic radiation source, that includes a heatable element, such as a filament, that can potentially be heated to a temperature at which it emits radiation, particularly electromagnetic radiation, specifically infrared radiation. Since an incandescent lamp can thus be considered a thermal emitter in the infrared spectral range, the emission power of an incandescent lamp decreases with increasing wavelength. As used herein, the term "black body" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a physical body that absorbs and / or emits all incident electromagnetic radiation, regardless of frequency, wavelength, or angle of incidence. The spectrum of light emitted by a heated object can be considered a black body spectrum. The spectral intensity of black body radiation can peak at a frequency that increases with the temperature of the emitter. As used herein, the term "MEMS-based emitter" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a microelectromechanical-based emitter.

[0023] Alternatively, a typical radiation source can be a semiconductor-based radiation source, in particular a radiation source selected from the following: light-emitting diodes LED and / or lasers, such as laser diodes; VCSELs; quantum wells / dots; plasma radiation sources, such as low-pressure / high-pressure sources or xenon sources; gas lasers; or solid-state lasers. As used herein, the term "semiconductor-based radiation source" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a radiation source that emits radiation from it by using a semiconductor. The term "light-emitting diode" as used herein is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a semiconductor device that emits light when current flows in the forward direction. In the opposite direction, the LED can block the current. The wavelength of the emitted light can depend on the semiconductor material included in the LED and / or the doping of the diode. As used herein, the term "laser" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a device for generating a laser beam, in particular a coherent light laser beam. A laser can utilize the effect that electromagnetic radiation can be generated and / or amplified by stimulated emission. A laser typically can include an active medium, a pump, and a resonator.

[0024] As used herein, the term "sample" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, any object that can be a living object and / or a non-living object. A typical sample of interest to the present invention can be a polymer sample containing a polymer material. It should still be emphasized that the present invention can be not limited to polymer samples, but can affect any kind of sample having any kind of material. Exemplarily, the sample can be a pharmaceutical material; and / or an organic material, in particular an organic material contained in food, beverage or skin, in particular human skin.

[0025] The sample can reflect and / or transmit and / or absorb radiation incident on the sample with a specific intensity depending on the chemical composition of the sample and / or the material of the sample. The wavelength-unresolved intensity of the detected reflected radiation and / or the detected transmitted radiation can be evaluated, such as the wavelength-unresolved intensity provided by considering the integrated detector module signal of the at least one detector module, in particular the first detector and / or the second detector module, in particular for performing physical classification.

[0026] Additionally, the sample can further absorb at least a portion of the incident radiation, depending on the chemical composition of the sample and / or the material of the sample. Thus, the spectrum of the sample can be evaluated, particularly during chemical classification, especially for determining the composition of the material of the sample. The spectrum can be provided by considering the wavelength-resolved detector module signals of the at least one detector module, specifically the first detector module and / or the second detector module.

[0027] Any sample can be placed, particularly as expected, in the sample holder. Thus, the sample holder can be configured to arrange the sample such that the radiation generated by the at least one radiation source is incident on the at least one sample, particularly such that the incident radiation can be reflected and / or transmitted. The reflected and / or transmitted radiation can propagate, particularly due to the corresponding guidance in the spectrometer device, to the corresponding detector module for detecting the corresponding radiation.

[0028] As used herein, the term "detector module" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, an arrangement of one sensor or detector or at least one sensor or detector or a plurality of sensors or detectors for detecting radiation. The detected radiation can be generated by the at least one radiation source and can be reflected and / or transmitted by the sample.

[0029] The at least one detected radiation can generate at least one detector module signal. The detector module signal can be evaluated, particularly by using an evaluation device to consider the integrated detector module signal, such as the detector module signal generated by any detected radiation, particularly the radiation incident on the detector module. The integrated detector module signal can include a piece of information, which can be the total intensity of any radiation detected by the corresponding detector module. In the case where the detector module can include a plurality of detectors, particularly where at least two of the plurality of detectors detect different wavelengths, the integrated detector module signal can be the sum of the signals generated by at least two detectors or by each of the plurality of detectors.

[0030] Alternatively or additionally, the detector module signal can be further evaluated, in particular by using an evaluation device to consider the wavelength-resolved detector module signal, in particular in such a way that the spectrum of the sample can be recorded and / or determined, particularly for evaluation in chemical classification. The wavelength-resolved detector module signal can include at least two pieces of information, in particular a first piece of information of the radiation intensity included in a first wavelength range and a second piece of information of the radiation intensity included in a second wavelength range different from the first wavelength information. In the case where the detector module can include a plurality of detectors, in particular where at least two of the plurality of detectors detect different wavelengths, the first detector can generate the first piece of information and the second detector can generate the second piece of information. To generate a spectrum, at least one optical filter can be used.

[0031] Typically, the detectors included in the at least one detector module, particularly the first detector module and / or the second detector module, can include at least one detector having a photoconductive material selected from at least one of lead sulfide (PbS), lead selenide (PbSe), germanium (Ge), indium gallium arsenide (InGaAs, including but not limited to ext.InGaAs), indium antimonide (InSb), or mercury cadmium telluride (HgCdTe or MCT). As used herein, the term "photoconductive" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the optical and / or electrical properties of a material, which increase the conductivity of the material due to the absorption of radiation, particularly electromagnetic radiation.

[0032] As used herein, the term "arranged to detect at least a portion of the radiation reflected by the sample" is a broad term and will be given its ordinary and conventional meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, positioning the at least one detector module such that the radiation generated by the radiation source and further reflected by the sample is incident, particularly due to corresponding guiding, on the at least one detector module. The term "reflection" or any of its grammatical variants (particularly including "reflected") refers to the bouncing back of at least one wave, particularly a radiation wave, at an interface where the characteristic impedance or refractive index of the propagation medium changes. The sample may not necessarily reflect radiation, so the first detector module signal can indicate and / or include information that no radiation is reflected.

[0033] As used herein, the term "arranged to detect at least a portion of the emitted radiation transmitted by the sample" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. This term can specifically refer to, but is not limited to, positioning the at least one detector module such that radiation generated by a radiation source and further transmitted by the sample (particularly by propagating through the sample) impinges, in particular due to a corresponding guidance, on the detector module. The term "transmission" or any of its grammatical variants (particularly including "transmitted") refers to the amount of passage of a medium for waves, such as for electromagnetic waves. The sample may not necessarily transmit radiation, and thus the second detector module signal can indicate and / or include information that no radiation is transmitted.

[0034] As used herein, the term "detector module signal" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. This term can specifically refer to, but is not limited to, a signal generated by a corresponding detector module. As discussed elsewhere herein, the detector module signal can be evaluated, particularly by using an evaluation device to consider an integrated detector module signal, such as a detector module signal generated by any detected radiation, particularly radiation impinging on the detector module. Alternatively or additionally, the detector module signal can be further evaluated, particularly by using an evaluation device to consider a wavelength-resolved detector module signal, particularly in a manner that the spectrum of the incident radiation, particularly the spectrum of the sample in the sample holder, can be determined.

[0035] As used herein, the terms "first", "second", "third" (and so on) are broad terms and will be given their ordinary and customary meaning to a person of ordinary skill in the art and are not limited to a special or custom meaning. This term can specifically refer to, but is not limited to, a description of an element without specifying an order or time sequence and does not exclude the possibility that other elements of it may exist. The "first" element can be different from the "second" element and the "third" element. The "second" element can be different from the "first" element and the "third" element. The "third" element can be different from the "first" element and the "second" element.

[0036] As used herein, the term "evaluation device" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term may refer to, but is not limited to, any functional element configured to analyze and / or process data. The evaluation device may specifically analyze and / or process measurement data, such as the first detector module signal and the second detector module signal. The evaluation device may particularly include at least one processor. The processor may specifically be configured to perform one or more evaluation operations on the measurement results, such as physical classification and / or chemical classification, for example, by software programming. The evaluation device may be connected via a signal connection member (specifically a wire) to the at least one detector module, specifically the first detector module and / or the second detector module, for transmitting at least one electrical signal and / or at least one optical signal, particularly the respective detector module signals.

[0037] As used herein, the term "physical classification" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term may refer to, but is not limited to, sorting a plurality of objects based on at least one physical property. Physical classification may be performed based on physical optical properties, such as physical optical properties determined by evaluating the at least one integrated detector module signal of the at least one detector module. To perform physical classification, the fraction of radiation reflected and / or transmitted by the sample, particularly radiation generated by a radiation source, may be determined.

[0038] As used herein, the term "chemical classification" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term may refer to, but is not limited to, sorting a plurality of objects based on at least one chemical property. In such classification, the objects may be classified by at least one element and / or a compound or mixture of multiple elements, particularly by evaluating the spectrum of the sample. Chemical classification may be performed based on the evaluation of at least one wavelength-resolved detector module signal of the at least one detector module.

[0039] As used herein, the term "considering the first detector module signal and the second detector module signal" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, analyzing the first detector module signal and / or the second detector module signal. Thus, the two detector module signals can be compared to each other, particularly as part of a physical classification. The first detector module signal or the second detector module can be further considered or analyzed to determine the spectrum generated by the sample, particularly as part of a chemical classification. In a chemical classification, the wavelength-resolved detector module signal with a greater intensity of the first detector module signal or the second detector module signal can be considered. Since the sample can completely reflect and / or transmit the incident radiation, the detector module signal can indicate that no radiation is transmitted and / or reflected by the sample. Exemplarily, the corresponding at least one integrated detector module signal can be zero.

[0040] For further details regarding a spectrometer device involved in classifying a sample, reference can be made to any aspect or definition according to the present invention as disclosed elsewhere herein.

[0041] Physical classification can further be based on an integrated detector module signal provided by considering the first detector module signal and / or the second detector module signal, wherein the integrated detector module signal is configured to determine the intensity of the radiation incident on the at least one detector module. As used herein, the term "integrated detector module signal" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the evaluation of the corresponding detector module signal to consider any specifically detected radiation incident on the corresponding detector module. As long as the detector module and / or at least one detector included by the detector module is sensitive to the wavelength of the radiation, the radiation can be detected. Thus, radiation of any wavelength or frequency detected by the corresponding detector module can be considered by and / or contribute to the integrated detector module signal. Alternatively or additionally, at least two or each detector included by the detector module can contribute to the integrated detector module signal. The integrated detector module signal can be the sum of at least two detector signals or any detector signal respectively generated by at least two detectors or any detector included by the detector module.

[0042] The first detector module signal and the second detector module signal can be considered for performing physical classification by at least one of the following:

[0043] - determining the ratio of the first detector module signal to the second detector module signal, or vice versa; or

[0044] - Determine the difference between the first detector module signal and the second detector module signal, or vice versa.

[0045] The first detector module signal can be proportional to at least a part of the radiation generated by the at least one radiation source and reflected by the sample onto the at least one detector module. Thus, the first detector module signal can be proportional to the intensity of the reflected radiation. The second detector module signal can be proportional to at least a part of the radiation generated by the at least one radiation source and transmitted by the sample onto the at least one detector module. Thus, the second detector module signal can be proportional to the intensity of the transmitted radiation. To determine the "ratio" of the first detector module signal and the second detector module signal, or vice versa, they can be divided. Based on the quotient determined by dividing the two detector module signals, the fraction of the radiation, in particular the radiation generated by the radiation source, that is reflected and transmitted can be determined. To determine the "difference" between the first detector module signal and the second detector module signal, or vice versa, the two detector module signals can be subtracted.

[0046] The sample can be classified according to physical classification by at least one of the following:

[0047] - A reflection value related to the sample; or

[0048] - A transmittance value related to the sample.

[0049] As used herein, the term "reflection value" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term can refer to, but is not limited to, the measured degree of reflection of an object (in particular a sample). The reflection value can be used for physical classification of the sample. Thus, multiple samples can be sorted into different categories by treating the reflection value as a sorting criterion. Since the reflection value of the sample is within the acceptable range of the reflection values of a specific category, the sample can be assigned to a specific category. Exemplarily, when the sample has a reflection value within a first range, the sample can be assigned to a first category. When the sample has a reflection value within a second range, the sample can be assigned to a second category.

[0050] As used herein, the term "transmittance value" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term can refer to, but is not limited to, the measured degree of transmission or transparency of an object (particularly a sample). Transmittance values can be used to physically classify samples. Thus, multiple samples can be sorted into different categories by treating the transmittance value as a sorting criterion. Since the transmittance value of a sample is within the acceptable range of transmittance values for a particular category, the sample can be assigned to that particular category. Exemplarily, when a sample has a transmittance value within a first range, the sample can be assigned to a first category. When a sample has a transmittance value within a second range, the sample can be assigned to a second category. Both reflectance values and transmittance values can be considered for classifying samples.

[0051] Both transmittance values and reflectance values can be taken into account in physical classification. This combination can be considered transflexion.

[0052] Chemical classification can be based on at least one wavelength-resolved detector module signal provided by considering a first detector module signal and / or a second detector module signal, where the wavelength-resolved detector module signal is configured to determine the spectrum of a sample. As used herein, the term "wavelength-resolved detector module signal" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, the term can refer to, but is not limited to, the evaluation of the corresponding detector module signal to consider the spectrum of the detected radiation incident on the detector module, such that, exemplarily, the spectrum of a sample can be determined by evaluating the corresponding wavelength-resolved detector module signal. As already discussed above, the radiation can be detectable radiation as long as the detector module and / or at least one detector included by the detector module is sensitive to the wavelength of the radiation. The wavelength-resolved detector module signal can include information regarding at least two different intensities associated with at least two different wavelengths and / or at least two different wavelength ranges.

[0053] The at least one detector module, particularly the first detector module and / or the second detector module, can include at least a first detector that generates a first detector signal and a second detector that generates a second detector signal, where the first detector and the second detector can detect at least one intensity of at least one different wavelength. By using multiple detectors for the detector module, the spectrum of a sample can be recorded. The first detector module can generate a first piece of information regarding the intensities in a first specific wavelength range. The second detector module can generate a second piece of information regarding the intensities in a second specific wavelength range. The detector module can include additional detectors. To generate the spectrum of a sample, an optical filter can be used.

[0054] The first detector signal and the second detector signal of the first detector module can be considered for performing chemical classification of a sample by at least one of the following:

[0055] - Determining at least a part of a spectrum;

[0056] - Considering at least one chemometric technique.

[0057] As used herein, the term "at least a part of a spectrum" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a spectral range that can be particularly detected by a detector module, since the detector module is sensitive to incident wavelengths. As used herein, the term "chemometrics" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the chemical discipline, in particular using logic to design and / or select an optimal measurement process and / or experiment by using at least one mathematical method and / or statistical method, specifically for providing chemical information by analyzing chemical data. Classical algorithms (especially supervised or unsupervised algorithms) or regression algorithms (specifically linear or non-linear algorithms) can be considered chemometric techniques.

[0058] Chemometric techniques, in particular the corresponding algorithms, can be implemented into a machine learning model. As used herein, the term "machine learning model" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, a trainable computer-implemented architecture that applies artificial intelligence to automatically determine a representative result, in particular a confidence value, specifically a trainable statistical model. For this purpose, the machine learning model may have to be trained. As used herein, the term "training" (or any grammatical variant thereof, especially "trained") is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the process of determining the tunable parameters of a machine learning model by using training data to generate a trained machine learning model. Training can include at least one optimization or tuning process in which the best combination of parameters is determined. Training can be performed to improve the ability of the machine learning model to determine representative results, especially by analyzing the training data. The training data can include spectra and known chemical information.

[0059] The at least one evaluation device can be configured to determine the chemical properties of a sample to perform chemical classification of the sample, in particular where the chemical properties of the sample are the chemical composition of the sample.

[0060] As used herein, the term "chemical composition" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the arrangement, type, and / or ratio of at least one atom and / or at least one molecule contained in a chemical substance (specifically a sample). When a chemical substance, particularly a sample, has at least one atom and / or molecule added and / or subtracted, particularly when the ratio of at least two chemical substances is modified and / or changed, the chemical composition can generally vary. For the purposes of the present invention, the chemical composition can be evaluated to determine the material of the sample, particularly for chemically classifying the sample, specifically by considering the chemical composition of the sample and / or the material of the sample as a sorting criterion.

[0061] The evaluation device is configured to combine

[0062] - the evaluated physical classification of the sample with

[0063] - the evaluated chemical classification of the sample,

[0064] in order to eliminate ambiguities in the evaluated physical classification by considering the evaluated chemical classification; or vice versa. As used herein, the term "combine" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, the process of connecting at least two instances by applying logic in such a way as to establish at least one connection between at least two instances. The physical classification of the sample can be performed in a first step of the overall classification of the sample. The chemical classification of the sample can be performed in a second step of the overall classification of the sample. The first step and the second step can then be performed in a given order, in a different order, particularly such that the second step is performed before or simultaneously with the first step. In the overall classification considering the physical classification and the chemical classification, the chemical composition or material of the sample can be determined and / or the sample can be classified. The evaluated physical classification can particularly allow narrowing down the options for the possible chemical composition or possible material of the sample. Then, the narrowed-down or remaining options can be analyzed in the chemical classification in such a way as to determine the chemical composition or material of the sample, particularly in the case of a confidence level below a certain value. Thus, the evaluated chemical classification can be used to determine the final chemical composition of the sample. Thereby, ambiguities regarding the chemical composition of the sample or the material of the sample can be eliminated, particularly by considering the physical classification.

[0065] At least one of the following:

[0066] - a first detector module signal; or

[0067] - a second detector module signal;

[0068] It can be configured to detect only at least one selected feature in the spectrum provided by the sample in the chemical classification, and the at least one selected feature is required to exclude the ambiguity points in the evaluated physical classification. As used herein, the term "selected feature in the spectrum" is a broad term and will be given its ordinary and conventional meaning to those of ordinary skill in the art and is not limited to a special or custom meaning. Specifically, this term can refer to, but is not limited to, the predetermined characteristics of the spectrum generated by a specific sample. The detector module can be configured to detect only the at least one wavelength range assigned to the at least one selected feature, specifically by detecting only the wavelength range covered by the at least one selected feature. Therefore, the at least one detector module (specifically the first detector module and / or the second detector module) can be specifically set by providing only the corresponding detector to detect at least one wavelength required to detect the at least one selected feature.

[0069] The corresponding detector module can include at least one first detector, and the at least one first detector is specifically sensitive only in the first wavelength range covered by at least one first feature. The corresponding detector module can include at least one second detector, and the at least one second detector is specifically sensitive only in the second wavelength range covered by at least one second feature. The corresponding detector module can even further include at least one additional detector, and the at least one additional detector is specifically sensitive only in the additional wavelength range covered by at least one additional feature. The first wavelength range, the second wavelength range, and the additional wavelength range can be different. The corresponding detector module may not include any additional detectors. Alternatively or additionally, the at least one radiation source can be configured to emit only the radiation required to detect at least one selected feature in the spectrum provided by the sample in the chemical classification, and the at least one selected feature is used to exclude the ambiguity points in the evaluated physical classification.

[0070] The at least one detector module can include a first detector module and a second detector module, wherein the first detector module can be configured to generate a first detector module signal, and wherein the second detector module can be configured to generate a second detector module signal.

[0071] The first detector module and the second detector module can be configured to detect the same wavelength range, specifically by

[0072] - arranging the first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0073] - arranging the second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0074] Among them, the first optical filter and the second optical filter are the same. As used herein, the term "optical filter" is a broad term and will be given its ordinary and conventional meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. Specifically, this term can refer to, but is not limited to, a filter that modifies and / or selects the radiation depending on at least one parameter (specifically the wavelength, polarization state, and / or direction of the incident radiation). The optical filter can generate the spectrum of the radiation incident on the optical filter, in particular by separating the incident radiation into at least two different wavelength signals. These at least two different wavelength signals can be transmitted to different detectors, which are specifically included by the corresponding detector modules and generate separate detector signals.

[0075] The first detector module and the second detector module can be configured to detect different wavelength ranges, in particular by

[0076] - arranging the first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0077] - arranging the second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0078] Among them, in particular, the first optical filter and the second optical filter can be different from each other. Thus, the first detector module and the second detector module can generate different spectra.

[0079] The first detector module and the second detector module can be configured to perform optimized chemical classification on at least two different samples, in particular by

[0080] - arranging the first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0081] - arranging the second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0082] Among them, the first optical filter and the second optical filter can be different and are selected for detecting at least two different samples.

[0083] At least one of the following:

[0084] - the first optical filter; or

[0085] - the second optical filter;

[0086] can be at least one of the following:

[0087] - at least one optical filter;

[0088] - at least one polarization filter;

[0089] - at least one band - pass filter;

[0090] - at least one liquid - crystal filter, in particular a liquid - crystal tunable filter;

[0091] - at least one short - pass filter;

[0092] - at least one long - pass filter;

[0093] - at least one notch filter;

[0094] - at least one interference filter;

[0095] - at least one transmission grating;

[0096] - at least one nonlinear optical element, in particular at least one birefringent optical element or at least one tunable Fabry - Perot interferometer;

[0097] - at least one tunable Michelson interferometer;

[0098] - at least one linear variable filter;

[0099] - at least one band - pass filter;

[0100] - at least one quantum dot; or

[0101] - at least one well filter.

[0102] The at least one light source and the first detector module can be arranged on a first side of the sample holder such that radiation emitted by the at least one light source can be detected by the at least one first detector module after being reflected by a sample in the sample holder; and the at least one second detector module can be arranged on a second side of the sample holder that can be opposite to the first side such that radiation emitted by the at least one light source can be detected by the at least one second detector module after passing through the sample in the sample holder.

[0103] The at least one light source and the first detector module may be arranged on a first side of the sample holder such that radiation emitted by the at least one light source can be detected by the at least one first detector module after being reflected by a sample in the sample holder; and the at least one second detector module may be further arranged on the first side of the sample holder, and at least one reflector may be arranged on a second side of the sample holder opposite to the first side such that radiation emitted by the at least one light source can be detected by the at least one second detector module after passing through the sample in the sample holder, being reflected on the at least one reflector and passing through the sample in the sample holder again.

[0104] The reflector may be at least one of the following:

[0105] - A reflective coating, in particular a mirror;

[0106] - A beam splitter device;

[0107] - An interference layer; or

[0108] - A dichroic filter.

[0109] The first radiation source and the at least one detector module may be arranged on a first side of the sample holder such that radiation emitted by the first radiation source can be detected by the at least one detector module after being reflected by a sample in the sample holder; and a second radiation source may be arranged on a second side of the sample holder opposite to the first side such that radiation emitted by the second radiation source can be detected by the at least one detector module after passing through the sample in the sample holder. The radiation emitted by the first radiation source may have at least one wavelength different from the radiation emitted by the first radiation source. Alternatively or additionally, the radiation emitted by the first radiation source may be emitted in a first time interval, and the radiation emitted by the second radiation source may be emitted in a second time interval, wherein the first time interval may be different from the first time interval. Thus, the detected radiation emitted by the first radiation source and the second radiation source may be distinguishable.

[0110] According to another aspect of the present invention, a method for classifying a sample is disclosed. The method includes the following steps that may be performed in a given order. However, different orders are also feasible. Further, two or more of these method steps may be performed simultaneously. Thus, these method steps may at least partially overlap in time. Further, these method steps may be performed once or repeated. Further, one or more steps or even all steps of these method steps may be performed once or repeated. The method may include additional method steps not listed herein.

[0111] The method for classifying a sample includes the following steps:

[0112] (a) Provide a spectrometer device as explained elsewhere herein;

[0113] (b) Place the sample in a sample holder;

[0114] (c) Classify the sample by considering the signals of a first detector module and a second detector module, wherein the physical properties of the sample are determined as the physical classification of the sample, and the chemical properties of the sample are determined as the chemical classification of the sample.

[0115] In step (c),

[0116] - the evaluated physical classification of the sample is combined with

[0117] - the evaluated chemical classification of the sample

[0118] to exclude ambiguities in the physical classification by considering the chemical classification; or vice versa.

[0119] For further details regarding the method of classifying a sample, reference may be made to any aspect or definition according to the invention as disclosed elsewhere herein.

[0120] According to another aspect of the invention, a computer program is disclosed. The computer program includes instructions that, when executed by at least one evaluation device included in a spectrometer device as explained elsewhere herein, cause the at least one evaluation device to perform step (c) of the method for classifying a sample as explained elsewhere herein.

[0121] As used herein, the term "computer program" is a broad term and will be given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. The term can specifically refer to, but is not limited to, at least one executable instruction for at least one programmable device, specifically a computer, preferably a sequence of executable instructions, for processing and / or solving at least one function and / or at least one task and / or at least one problem by using at least one programmable device, specifically a computer, preferably for performing some or all of the steps of any method according to any aspect or embodiment described within the present invention. Typically, the instructions are combined into computer program code and / or provided in a programming language. A computer program is generally processed by using a processing device included in at least one computer. For this purpose, the computer program can be run on a computer. The computer program code can be provided on a data storage medium or a separate device, such as an optical storage medium, for example provided on an optical disc, directly provided on a computer or a data processing device, or provided via a network (such as an internal network or the Internet).

[0122] For further details regarding the computer program, reference can be made to any aspect or definition according to the present invention as disclosed elsewhere herein.

[0123] According to another aspect of the present invention, a non-transitory computer-readable storage medium is disclosed. The non-transitory computer-readable storage medium includes instructions that, when executed by at least one evaluation device included in a spectrometer device as explained elsewhere herein, cause the at least one evaluation device to perform step (c) of the method for classifying a sample as explained elsewhere herein.

[0124] Specifically, the computer program can be stored on a computer-readable data carrier and / or a computer-readable storage medium. As used herein, the terms "computer-readable data carrier" and "computer-readable storage medium" can specifically refer to a non-transitory data storage unit, such as a hardware storage medium on which computer-executable instructions are stored. The computer-readable data carrier or storage medium can specifically be or can include storage media such as random access memory (RAM) and / or read-only memory (ROM). For example, at least one database such as a server or a cloud server can be used to store the computer program.

[0125] For further details regarding the non-transitory computer-readable storage medium, reference can be made to any aspect or definition according to the present invention as disclosed elsewhere herein.

[0126] The above-described spectrometer device for classifying a sample, the method for classifying a sample, the computer program, and the non-transitory computer-readable storage medium may have significant advantages over the prior art. Thus, a compact spectrometer device that may be capable of reliable, easy, general, and rapid sample classification is provided. The combination of physical classification and chemical classification can further provide an opportunity for rapid pre-sorting of, for example, plastics. Alternatively or additionally, due to the determination of reflection and / or transmission characteristics, detection and / or sorting of metals, glass, and / or at least a portion of any material may be possible.

[0127] Thus, the combination of physical and chemical classification can provide the opportunity to specifically configure the components of the spectrometer device (such as the at least one radiation source and / or the first detector module and / or the second detector module) in a way that this combination can be considered. Accordingly, the spectrometer device can be compact, particularly cost-effective and robust, since the components required may be less complex. Thus, for the overall system, the optical components required can be simplified. Exemplarily, the number of detectors can be reduced, particularly since a detector array may not be required. Alternatively or additionally, simpler filters can be implemented, particularly without prisms and / or gratings. Alternatively or additionally, simpler light sources can be used and / or the control of the spectrometer and / or the readout of the spectrometer and / or the analysis of the measured data and / or the footprint of the device can be reduced.

[0128] As used herein, the terms "having", "including", or "comprising" or any arbitrary grammatical variants thereof are used in a non-exclusive manner. Thus, these terms can refer both to a situation where no additional features are present in the entity described in the context other than the features introduced by these terms, and to a situation where one or more additional features are present. As an example, the expressions "A has B", "A includes B", and "A comprises B" can refer both to a situation where no other elements are present in A other than B (i.e., the situation where A consists solely and exclusively of B), and to a situation where one or more additional elements (such as element C, elements C and D, or even additional elements) are present in entity A in addition to B.

[0129] Furthermore, it should be noted that the terms "at least one", "one or more", or similar expressions indicating that a feature or element can occur once or more than once will typically be used only once when introducing the corresponding feature or element. In most cases, the expressions "at least one" or "one or more" are not repeated when referring to the corresponding feature or element, but in fact, the corresponding feature or element may occur once or more than once.

[0130] As further used herein, the terms "preferably", "more preferably", "particularly", "more particularly", "specifically", "more specifically", or similar terms are used in conjunction with optional features without restricting the alternative possibilities. Thus, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As those skilled in the art will recognize, the present invention can be implemented by using alternative features. Similarly, the features introduced by "in an embodiment of the present invention" or similar expressions are intended to be optional features, without any limitation with respect to alternative embodiments of the present invention, without any limitation with respect to the scope of the present invention, and without any limitation with respect to the possibility of combining the features introduced in this way with other optional or non-optional features of the present invention.

[0131] Summarizing the above findings, the following embodiments are preferred within the scope of the present invention:

[0132] Embodiment 1: A spectrometer device for classifying a sample, the spectrometer device comprising

[0133] - at least one radiation source, wherein the at least one radiation source is configured to emit radiation;

[0134] - at least one sample holder, wherein the at least one sample holder is configured to hold a sample;

[0135] - at least one detector module,

[0136] ○ wherein the at least one detector module is arranged to detect at least a part of the emitted radiation that is reflected or transmitted by the sample, such that a first detector module signal is generated;

[0137] ○ wherein the at least one detector module is further arranged to detect at least a part of the emitted radiation that is transmitted or reflected through the sample, such that a second detector module signal is generated;

[0138] - at least one evaluation device, wherein the at least one evaluation device is configured to perform a physical classification and a chemical classification of the sample by considering the first detector module signal and the second detector module signal.

[0139] Embodiment 2: The spectrometer device according to the previous embodiment, wherein the physical classification is based on an integrated detector module signal provided by considering at least one of the following:

[0140] - the first detector module signal; or

[0141] - the second detector module signal,

[0142] wherein the integrated detector module signal is configured to determine the radiation intensity incident on the at least one detector module.

[0143] Embodiment 3: The spectrometer device according to any one of the previous embodiments, wherein the first detector module signal and the second detector module signal are considered for performing a physical classification by at least one of the following:

[0144] - determining the ratio of the first detector module signal to the second detector module signal, or vice versa; or

[0145] - determining the difference between the first detector module signal and the second detector module signal, or vice versa.

[0146] Example 4: The spectrometer device according to any one of the foregoing examples, wherein the sample is classified according to this physical classification by at least one of the following:

[0147] - The reflection value associated with the sample; or

[0148] - The transmittance value associated with the sample.

[0149] Example 5: The spectrometer device according to any one of the foregoing examples, wherein the chemical classification is based on at least one wavelength-resolved detector module signal provided by considering at least one of the following:

[0150] - The first detector module signal; or

[0151] - The second detector module signal,

[0152] wherein the wavelength-resolved detector module signal is configured to determine the spectrum of the sample.

[0153] Example 6: The spectrometer device according to any one of the foregoing examples, wherein the at least one detector module includes at least a first detector that generates a first detector signal and a second detector that generates a second detector signal, wherein the first detector and the second detector detect at least one intensity of at least one different wavelength.

[0154] Example 7: The spectrometer device according to any one of the foregoing examples, wherein the first detector signal and the second detector signal of the first detector module are considered for performing chemical classification of the sample by at least one of the following:

[0155] - Determining at least a part of the spectrum;

[0156] - Considering at least one chemometric technique.

[0157] Example 8: The spectrometer device according to any one of the foregoing examples, wherein the at least one evaluation device is configured to determine the chemical properties of the sample to perform chemical classification of the sample, in particular wherein the chemical properties of the sample are the chemical composition of the sample.

[0158] Example 9: The spectrometer device according to any one of the foregoing examples, wherein the evaluation device is configured to combine

[0159] - The evaluated physical classification of the sample with

[0160] - The evaluated chemical classification of the sample,

[0161] in particular to exclude ambiguities in the evaluated physical classification by considering the evaluated chemical classification; or vice versa.

[0162] Example 10: The spectrometer device according to any one of the foregoing examples, wherein at least one of the following:

[0163] - the first detector module signal; or

[0164] - the second detector module signal;

[0165] is configured to detect only at least one selected feature in the spectrum provided by the sample in the chemical classification, the at least one selected feature being required to exclude ambiguities in the evaluated physical classification.

[0166] Example 11: The spectrometer device according to any one of the foregoing examples, wherein the at least one radiation source is configured to emit only the radiation required to detect at least one selected feature in the spectrum provided by the sample in the chemical classification, the at least one selected feature being used to exclude ambiguities in the evaluated physical classification.

[0167] Example 12: The spectrometer device according to any one of the foregoing examples, wherein the at least one radiation source is at least one of the following:

[0168] - a thermal radiator, the thermal radiator being particularly selected from at least one of the following:

[0169] ○ a black body;

[0170] ○ an incandescent lamp, or

[0171] ○ a MEMS-based emitter; or

[0172] - a semiconductor-based radiation source, the semiconductor-based radiation source being particularly selected from at least one of the following:

[0173] ○ a light-emitting diode (LED);

[0174] ○ a laser, the laser being particularly selected from at least one of the following:

[0175] ■ a laser diode;

[0176] ■ a VCSEL;

[0177] ■ a quantum well / dot;

[0178] ■ a plasma radiation source, such as a low-pressure / high-pressure source or a xenon source;

[0179] ■ a gas laser; or

[0180] ■ a solid-state laser.

[0181] Example 13: The spectrometer device according to any one of the preceding examples, wherein the at least one radiation source emits infrared radiation having a wavelength in the range from 780 nm to 15 μm, preferably from 1 μm to 5 μm, more preferably from 1 μm to 3 μm, particularly from 2 μm to 3 μm.

[0182] Example 14: The spectrometer device according to any one of the preceding examples, wherein the at least one detector module comprises a first detector module and a second detector module, wherein the first detector module is configured to generate a first detector module signal, and wherein the second detector module is configured to generate a second detector module signal.

[0183] Example 15: The spectrometer device according to any one of the preceding examples, wherein the at least one detector module, in particular the first detector module and / or the second detector module, comprises at least one detector having a photoconductive material selected from at least one of lead sulfide (PbS), lead selenide (PbSe), germanium (Ge), indium gallium arsenide (InGaAs, including but not limited to ext.InGaAs), indium antimonide (InSb), or mercury cadmium telluride (HgCdTe or MCT).

[0184] Example 16: The spectrometer device according to any one of the preceding examples, wherein the first detector module and the second detector module are configured to detect the same wavelength range, in particular by

[0185] - arranging a first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0186] - arranging a second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0187] wherein the first optical filter and the second optical filter are the same.

[0188] Example 17: The spectrometer device according to any one of the preceding examples, wherein the first detector module and the second detector module are configured to detect different wavelength ranges, in particular by

[0189] - arranging a first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0190] - arranging a second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0191] Wherein, the first optical filter and the second optical filter are different.

[0192] Example 18: The spectrometer device according to any one of the foregoing examples, wherein the first detector module and the second detector module are configured for optimized chemical classification of at least two different samples, in particular by

[0193] - Arranging the first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and

[0194] - Arranging the second optical filter such that the transmitted radiation propagates through the optical filter onto the at least one second detector module;

[0195] Wherein, the first optical filter and the second optical filter are different from each other, particularly and are selected for detecting the at least two different samples.

[0196] Example 19: The spectrometer device according to any one of the foregoing examples, wherein at least one of the following:

[0197] - The first optical filter; or

[0198] - The second optical filter;

[0199] is at least one of the following:

[0200] - At least one optical filter;

[0201] - At least one polarization filter;

[0202] - At least one band - pass filter;

[0203] - At least one liquid - crystal filter, particularly a liquid - crystal tunable filter;

[0204] - At least one short - pass filter;

[0205] - At least one long - pass filter;

[0206] - At least one notch filter;

[0207] - At least one interference filter;

[0208] - At least one transmission grating;

[0209] - At least one nonlinear optical element, particularly at least one birefringent optical element or at least one tunable Fabry - Perot interferometer;

[0210] - At least one tunable Michelson interferometer;

[0211] - at least one linear variable filter;

[0212] - at least one band - pass filter;

[0213] - at least one quantum dot; or

[0214] - at least one well filter.

[0215] Example 20: The spectrometer device according to any one of the foregoing examples, wherein,

[0216] - The at least one light source and the first detector module are arranged on a first side of the sample holder such that radiation emitted by the at least one light source is detected by the at least one first detector module after being reflected by a sample in the sample holder; and wherein,

[0217] - The at least one second detector module is arranged on a second side of the sample holder opposite to the first side such that radiation emitted by the at least one light source is detected by the at least one second detector module after passing through the sample in the sample holder.

[0218] Example 21: The spectrometer device according to any one of the foregoing examples, wherein,

[0219] - The at least one light source and the first detector module are arranged on a first side of the sample holder such that radiation emitted by the at least one light source is detected by the at least one first detector module after being reflected by a sample in the sample holder; and wherein,

[0220] - The at least one second detector module is further arranged on the first side of the sample holder, and at least one reflector is arranged on a second side of the sample holder opposite to the first side such that radiation emitted by the at least one light source is detected by the at least one second detector module after passing through the sample in the sample holder, being reflected on the at least one reflector, and passing through the sample in the sample holder again.

[0221] Example 22: The spectrometer device according to any one of the foregoing examples, wherein the reflector is at least one of the following:

[0222] - A reflective coating, in particular a mirror;

[0223] - A beam - splitting device;

[0224] - An interference layer; or

[0225] - A dichroic filter.

[0226] Example 23: The spectrometer device according to any one of the foregoing examples, wherein,

[0227] - The first radiation source and the at least one detector module are arranged on a first side of the sample holder such that radiation emitted by the first radiation source is detected by the at least one detector module after being reflected by a sample in the sample holder; and wherein,

[0228] - A second radiation source is arranged on a second side of the sample holder opposite the first side such that radiation emitted by the second radiation source is detected by the at least one detector module after passing through the sample in the sample holder.

[0229] Example 24: A spectrometer device according to any one of the preceding examples, wherein the sample comprises a sample material selected from at least one of the following:

[0230] - A polymeric material;

[0231] - A pharmaceutical material;

[0232] - An organic material, in particular an organic material contained in food, beverages or skin, in particular human skin.

[0233] Example 25: A method for classifying a sample, the method comprising the steps of:

[0234] (a) Providing a spectrometer device according to any one of the preceding device examples;

[0235] (b) Placing the sample in the sample holder;

[0236] (c) Classifying the sample by considering a first detector module signal and a second detector module signal, wherein a physical property of the sample is determined as a physical classification of the sample, and a chemical property of the sample is determined as a chemical classification of the sample.

[0237] Example 26: The method according to the previous example, wherein in step (c),

[0238] - The evaluated physical classification of the sample is combined with

[0239] - The evaluated chemical classification of the sample,

[0240] in particular to exclude ambiguities in the physical classification by considering the chemical classification; or vice versa.

[0241] Example 27: A computer program comprising instructions which, when executed by at least one evaluation device comprised in a spectrometer device according to any one of the preceding device embodiments, cause the at least one evaluation device to carry out step (c) of the method for classifying a sample according to any one of the preceding method embodiments.

[0242] Example 28: A non-transitory computer-readable storage medium comprising instructions which, when executed by at least one evaluation device comprised in a spectrometer device according to any one of the preceding device embodiments, cause the at least one evaluation device to carry out step (c) of the method for classifying a sample according to any one of the preceding method embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0243] Further optional features and embodiments will preferably be disclosed in more detail in the following description of the embodiments in connection with the dependent claims. Wherein, as will be recognized by those skilled in the art, the corresponding optional features may be implemented independently and in any feasible combination. The scope of the present invention is not limited by the preferred embodiments. Embodiments are schematically depicted in the drawings. Wherein, the same reference numerals in these drawings denote identical or functionally equivalent elements.

[0244] In the drawings:

[0245] Figure 1 An exemplary spectrometer device for classifying a sample according to the present invention is shown;

[0246] Figure 2 An alternative exemplary spectrometer device for classifying a sample according to the present invention is shown;

[0247] Figure 3 Another alternative exemplary spectrometer device for classifying a sample according to the present invention is shown; and

[0248] Figure 4 An exemplary method for classifying a sample according to the present invention is shown.

[0249] Exemplary Embodiment

[0250] Figure 1 An exemplary spectrometer device 100 for classifying a sample 200 is shown. The classification of the sample 200 may in particular include a chemical classification of the sample 200 to determine the material composition of the sample 200.

[0251] The exemplary spectrometer device 100 includes at least one radiation source 102 configured to emit radiation (indicated by the arrow). The at least one radiation source 102 can emit electromagnetic radiation, in particular infrared radiation having a wavelength of 780 nm to 15 μm, preferably 1 μm to 5 μm, more preferably 1 μm to 3 μm, and particularly 2 μm to 3 μm.

[0252] The at least one radiation source 102 can be a thermal radiator, in particular a black body, and / or an incandescent lamp, and / or a MEMS-based emitter. Alternatively or additionally, the at least one radiation source 102 can be a semiconductor-based radiation source 102, in particular a light-emitting diode (LED), and / or a laser, in particular a laser diode, and / or a VCSEL, and / or a quantum well / dot, and / or a plasma radiation source 102, such as a low-pressure / high-pressure source, or a xenon source, and / or a gas laser, and / or a solid-state laser.

[0253] The exemplary spectrometer device 100 further includes at least one sample holder 104, wherein the at least one sample holder 104 is configured to hold a sample 200. The sample 200 can include sample 200 material, such as a polymer material. Alternatively or additionally, the sample 200 can include sample material selected from pharmaceutical materials and / or organic materials, in particular sample material composed of food, beverage or skin, in particular human skin.

[0254] The exemplary spectrometer device 100 further includes at least one detector module 106, 112, the at least one detector module including a first detector module 106, wherein the first detector module 106 is arranged to detect at least a part of the emitted radiation reflected by the sample 200 such that a first detector module 106 signal is generated.

[0255] The first detector module 106 can include at least one detector 108 having a photoconductive material selected from at least one of lead sulfide (PbS), lead selenide (PbSe), germanium (Ge), indium gallium arsenide (InGaAs, including but not limited to ext.InGaAs), indium antimonide (InSb), or mercury cadmium telluride (HgCdTe or MCT).

[0256] A first optical filter 110 can be arranged such that the reflected radiation propagates through the first optical filter 110 onto the at least one first detector module 106, in particular onto the at least one detector 108. The first optical filter 110 can generate a spectrum of the sample 200.

[0257] The at least one detector module 106, 112 of the exemplary spectrometer device 100 further includes at least one second detector module 112, wherein the at least one second detector module 112 is arranged to detect at least a part of the transmitted radiation through the sample 200 such that a second detector module 112 signal is generated.

[0258] The second detector module 112 may include at least one detector 114 having a photoconductive material selected from at least one of lead sulfide (PbS), lead selenide (PbSe), germanium (Ge), indium gallium arsenide (InGaAs, including but not limited to ext. InGaAs), indium antimonide (InSb), or mercury cadmium telluride (HgCdTe or MCT).

[0259] The second optical filter 116 may be arranged such that the reflected radiation propagates through the optical filter 116 onto the at least one second detector module 112, in particular onto the at least one detector 114. The second optical filter 116 may generate a spectrum of the sample 200.

[0260] The first optical filter and / or the second optical filter 116 may be at least one polarization filter, and / or at least one bandpass filter, and / or at least one liquid crystal filter, in particular a liquid crystal tunable filter, and / or at least one shortpass filter, and / or at least one longpass filter, and / or at least one notch filter, and / or at least one interference filter, and / or at least one transmission grating, and / or at least one nonlinear optical element, in particular at least one birefringent optical element or at least one tunable Fabry - Perot interferometer, and / or at least one tunable Michelson interferometer, and / or at least one linear variable filter, and / or at least one bandpass filter, and / or at least one quantum dot, and / or at least one well filter.

[0261] The exemplary spectrometer device 100 further includes at least one evaluation device 118, wherein the at least one evaluation device 118 is configured to perform a physical classification of the sample 200 by considering the first detector module 106 signal and the second detector module 112 signal, in particular performing a physical classification in addition to a chemical classification of the sample 200. The evaluation device 118 may be connected to the first detector module 106 and / or the second detector module 112 via a signal connection 126 (specifically a wire) for transmitting at least one electrical signal and / or at least one optical signal.

[0262] Physical classification may be based on an integrated detector module signal provided by considering the signals of the respective detector modules, where the wavelength-resolved detector module signals may be configured to determine the spectrum of the sample. The first detector module 106 signal and the second detector module 112 signal may be considered for performing physical classification by at least one of the following:

[0263] - Determining the ratio of the first detector module 106 signal to the second detector module 112 signal, or vice versa, or

[0264] - Determining the difference between the first detector module 106 signal and the second detector module 112 signal, or vice versa.

[0265] The sample 200 may be classified by physical classification by at least one of the following:

[0266] - The reflectance value associated with the sample 200, or

[0267] - The transmittance and / or transparency value associated with the sample 200.

[0268] Chemical classification may be based on at least one wavelength-resolved detector module signal provided by considering the signals of the respective detector modules, the at least one wavelength-resolved detector module signal being specifically configured to determine the spectrum of the sample 200.

[0269] The at least one detector module 106, 112, specifically the first detector module 106 and / or the second detector module 112, may at least include a first detector that generates a first detector signal and a second detector that generates a second detector signal, where the first detector and the second detector may detect at least one intensity of at least one different wavelength. A first optical filter may be arranged to direct different wavelength ranges to different detectors included in the first detector module 106.

[0270] The first detector signal and the second detector signal of the first detector module 106 may be considered for chemical classification of the sample 200 by at least one of the following:

[0271] - Determining at least a portion of the spectrum,

[0272] - Considering at least one chemometric technique.

[0273] The evaluation device 118 is configured to combine

[0274] - The evaluated physical classification of the sample 200 with

[0275] - The evaluated chemical classification of the sample 200,

[0276] To exclude ambiguities in the evaluated physical classification by considering the evaluated chemical classification, or vice versa.

[0277] The first detector module 106 signal and / or the second detector module 112 signal can be configured to detect only at least one selected feature in the spectrum provided by the sample 200 in the chemical classification, and the at least one selected feature may be required to exclude ambiguities in the evaluated physical classification.

[0278] The at least one radiation source 102 can be configured to emit only the radiation required to detect at least one selected feature in the spectrum provided by the sample 200 in the chemical classification, and the at least one selected feature can be used to exclude ambiguities in the evaluated physical classification.

[0279] The first detector module 106 and the second detector module 112 can be configured to detect the same wavelength range, especially by

[0280] - Arranging the first optical filter such that the reflected radiation propagates through the optical filter onto the at least one first detector module 106, and

[0281] - Arranging the second optical filter 116 such that the transmitted radiation propagates through the optical filter onto the at least one second detector module 112,

[0282] wherein the first optical filter and the second optical filter 116 can be the same.

[0283] The first detector module 106 and the second detector module 112 can be configured to detect different wavelength ranges, especially by

[0284] - Arranging the first optical filter such that the reflected radiation can propagate through the optical filter onto the at least one first detector module 106, and

[0285] - Arranging the second optical filter 116 such that the transmitted radiation can propagate through the optical filter onto the at least one second detector module 112,

[0286] wherein the first optical filter and the second optical filter 116 can be different.

[0287] The first detector module 106 and the second detector module 112 can be configured to perform optimized chemical classification on at least two different samples 200, especially by

[0288] - Arranging the first optical filter such that the reflected radiation can propagate through the optical filter onto the at least one first detector module 106, and

[0289] - Arrange the second optical filter 116 such that the transmitted radiation can propagate through the optical filter onto the at least one second detector module 112.

[0290] Wherein, the first optical filter and the second optical filter 116 can be different and are selected for detecting the at least two different samples 200.

[0291] In Figure 1 In an exemplary embodiment, the at least one light source and the first detector module 106 are arranged on a first side of the sample 200 holder 104 such that the radiation emitted by the at least one light source can be detected by the at least one first detector module 106 after being reflected on the sample 200 in the sample 200 holder 104. The at least one second detector module 112 can be arranged on a second side of the sample 200 holder 104 that can be opposite to the first side such that the radiation emitted by the at least one light source can be detected by the at least one second detector module 112 after passing through the sample 200 in the sample 200 holder 104.

[0292] In Figure 2 In an exemplary embodiment, the at least one light source and the first detector module 106 can be arranged on a first side of the sample 200 holder 104 such that the radiation emitted by the at least one light source can be detected by the at least one first detector module 106 after being reflected on the sample 200 in the sample 200 holder 104. The at least one second detector module 112 can be further arranged on the first side of the sample 200 holder 104, and at least one reflector 124 can be arranged on a second side of the sample 200 holder 104 that can be opposite to the first side such that the radiation emitted by the at least one light source can be detected by the at least one second detector module 112 after passing through the sample 200 in the sample 200 holder 104, being reflected on the at least one reflector 124, and passing through the sample 200 in the sample 200 holder 104 again.

[0293] The reflector 124 can be a reflective coating, particularly a mirror, and / or a beam splitter device, and / or an interference layer, and / or a dichroic filter.

[0294] In Figure 3In an exemplary embodiment, the first radiation source 120 and the at least one detector module 106, 112 are arranged on a first side of the sample 200 holder 104 such that radiation emitted by the first radiation source 120 can be detected by the at least one detector module 106, 112 after being reflected by the sample 200 in the sample 200 holder 104. The second radiation source 122 may be arranged on a second side of the sample 200 holder 104 opposite to the first side such that radiation emitted by the second radiation source 122 can be detected by the at least one detector module 106, 112 after passing through the sample 200 in the sample 200 holder 104.

[0295] In Figure 4 it shows a method 300 for classifying a sample. The method 300 includes the following steps:

[0296] (a) Providing a spectrometer device 302 according to any one of the preceding device claims,

[0297] (b) Placing a sample 304 in the sample 200 holder 104,

[0298] (c) Classifying the sample 306 by considering the signal of the first detector module 106 and particularly further considering the signal of the second detector module 112, wherein the physical properties of the sample 200 are determined as the physical classification of the sample 200, and the chemical properties of the sample 200 are determined as the chemical classification of the sample 200.

[0299] In step (c) 306

[0300] - The evaluated physical classification of the sample 200 is compared with

[0301] - The evaluated chemical classification of the sample 200

[0302] are combined to eliminate ambiguities in the physical classification by considering the chemical classification, or vice versa.

[0303] List of Reference Numerals

[0304] 100 Spectrometer device

[0305] 102 Radiation source

[0306] 104 Sample holder

[0307] 106 First detector module

[0308] 108 Detector

[0309] 110 First optical filter

[0310] 112 Second detector module

[0311] 114 Detector

[0312] 116 Second optical filter

[0313] 118 Evaluation device

[0314] 120 First radiation source

[0315] 122 Second radiation source

[0316] 124 Reflector

[0317] 126 Signal connection element

[0318] 200 Sample

[0319] 300 Method for classifying a sample

[0320] 302 Step (a): Provide a spectrometer device

[0321] 304 Step (b): Place the sample

[0322] 306 Step (c): Classify the sample

Claims

1. A spectrometer device (100) for classifying a sample (200), the spectrometer device comprising - at least one radiation source (102), wherein, The at least one radiation source (102) is configured to emit radiation; - At least one sample holder (104), wherein the at least one sample holder (104) is configured to hold the sample (200); - At least one detector module (106, 112), ○ wherein the at least one detector module (106, 112) is arranged to detect at least a part of the emitted radiation reflected by the sample (200) such that a first detector module (106) signal is generated; and ○ wherein the at least one detector module (106, 112) is further arranged to detect at least a part of the emitted radiation transmitted through the sample (200) such that a second detector module signal is generated; - At least one evaluation device (118), wherein the at least one evaluation device (118) is configured to perform a physical classification of the sample (200) and a chemical classification of the sample (200) by considering the first detector module signal and the second detector module signal, wherein the evaluation device (118) is configured to combine ○ the evaluated physical classification of the sample (200) with ○ the evaluated chemical classification of the sample (200) to eliminate ambiguities in the evaluated physical classification by considering the evaluated chemical classification; or vice versa.

2. The spectrometer device (100) according to the previous claim, wherein, The physical classification is based on an integrated detector module signal provided by considering at least one of the following: - The first detector module signal; or - The second detector module signal, wherein the integrated detector module signal is configured to determine the radiation intensity incident on the at least one detector module (106, 112).

3. The spectrometer device (100) according to any one of the preceding claims, wherein, The sample (200) is classified according to the physical classification by at least one of the following: - A reflection value associated with the sample (200); or - A transmittance value associated with the sample (200).

4. The spectrometer device (100) according to any one of the preceding claims, wherein, The chemical classification is based on at least one wavelength-resolved detector module signal provided by considering at least one of the following: - The first detector module signal; or - The second detector module signal, wherein the wavelength-resolved detector module signal is configured to determine the spectrum of the sample (200).

5. The spectrometer device (100) according to any one of the preceding claims, wherein, The at least one detector module (106, 112) at least includes a first detector that generates a first detector signal and a second detector that generates a second detector signal, wherein the first detector and the second detector detect the intensity of at least one different wavelength.

6. The spectrometer device (100) according to any one of the preceding claims, wherein, The at least one evaluation device (118) is configured to determine the chemical properties of the sample (200) to perform the chemical classification of the sample (200), wherein the chemical properties of the sample (200) are the chemical composition of the sample (200).

7. The spectrometer device (100) according to the previous claim, wherein the following at least one of: - The first detector module (106) signal; or - The second detector module (112) signal; configured to detect only at least one selected feature in the spectrum provided by the sample (200) in the chemical classification, the at least one selected feature being required to exclude ambiguities in the evaluated physical classification.

8. The spectrometer device (100) according to any one of the preceding two claims, wherein, The at least one radiation source (102) is configured to emit only the radiation required to detect at least one selected feature in the spectrum provided by the sample (200) in the chemical classification, the at least one selected feature being used to exclude ambiguities in the evaluated physical classification.

9. The spectrometer device (100) according to any one of the preceding claims, wherein, The at least one detector module includes a first detector module (106) and a second detector module (112), wherein the first detector module (106) generates the first detector module signal, wherein the second detector module (112) generates the second detector module signal, and wherein the first detector module (106) and the second detector module (112) are configured to detect different wavelength ranges.

10. The spectrometer device (100) according to the previous claim, wherein, The first optical filter is arranged such that the reflected radiation propagates through the optical filter onto the at least one first detector module; and wherein the second optical filter is arranged such that the transmitted radiation propagates through the optical filter onto the at least one second detector module; wherein the first optical filter and the second optical filter are different from each other.

11. A method for classifying a sample (200), the method comprising the steps of: (a) providing a spectrometer device (100) according to any one of the preceding apparatus claims; (b) placing the sample (200) in a sample (200) holder (104); (c) classifying the sample (200) by considering the first detector module (106) signal and the second detector module (112) signal, wherein the physical properties of the sample (200) are determined as the physical classification of the sample (200), and the chemical properties of the sample (200) are determined as the chemical classification of the sample (200), wherein in step (c) - the evaluated physical classification of the sample (200) is combined with - the evaluated chemical classification of the sample (200) to exclude ambiguities in the physical classification by considering the chemical classification; or vice versa.

12. A computer program comprising instructions which, when executed by at least one evaluation device (118) comprised in a spectrometer device (100) according to any one of the preceding apparatus claims, cause the at least one evaluation device (118) to perform step (c) of the method for classifying a sample (200) according to any one of the preceding method claims.

13. A non-transitory computer-readable storage medium comprising instructions which, when executed by at least one evaluation device (118) comprised in a spectrometer device (100) according to any one of the preceding apparatus claims, cause the at least one evaluation device (118) to perform step (c) of the method for classifying a sample (200) according to any one of the preceding method claims.

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