Chip quality detection method and device, electronic equipment and storage medium
CN120344992APending Publication Date: 2025-07-18SHENZHEN HUADA SANJIAN QIFA TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202280102319.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-28
- Publication Date
- 2025-07-18
AI Technical Summary
Technical Problem
Existing chip quality detection methods are inefficient and unstable in accuracy. They mainly rely on manual sampling and observation, making it difficult to achieve automated and standardized testing.
Method used
Automatic detection of chip quality is achieved by dividing the chip into at least one field of view, and performing numbering processing, image feature analysis and preset threshold combination determination based on at least two channels of images.
Benefits of technology
It improves the accuracy and efficiency of chip quality detection, reduces the influence of artificial factors, and achieves standardized detection.
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Smart Images
Figure CN120344992A_ABST
Abstract
The invention provides a chip quality detection method and device, electronic equipment and a storage medium, and the method comprises the steps: carrying out the numbering of at least one field of view in each chip, and obtaining the identification information of each field of view; based on the identification information, respectively acquiring a first channel image and a second channel image of the at least one field of view; based on the image features of the first channel image and the second channel image, performing image processing analysis on the at least one field of view; and judging the quality of the chip according to a preset threshold combination and an image processing analysis result. According to the embodiment of the invention, the chip is divided into at least one field of view and then is processed, and different channel images of each field of view are analyzed, so that the quality of the chip is detected; in the prior art, various parameters of a chip image are mainly recorded by manual sampling observation; according to the invention, automatic detection of chip flaws can be realized, the detection accuracy can be improved, and standardized detection can be realized.
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