Method for testing broken wire of film covered wire

Abstract

The invention provides a method for testing breakage of a film covered wire. The method comprises the following steps of: 1, respectively sampling a section of a wire with the length of 1m and a section of a wire with the length of 10m; step 2, respectively measuring weight values and direct-current resistance values of the 1-meter sampling line and the 10-meter sampling line to obtain a weight value G1 of the 1-meter sampling line, a direct-current resistance value R1 of the 1-meter sampling line, a weight value G2 of the 10-meter sampling line and a direct-current resistance value R2 of the 10-meter sampling line; step 3, calculating the direct current resistance change rate according to a formula delta R = {R2 / [R1 * (G2 / G1)]-1} * 100%; 4, when the direct-current resistance change rate delta R is smaller than a set percentage, the wire is judged to be qualified; and when the direct-current resistance change rate delta R is greater than or equal to a set percentage, judging that the wire has the wire breakage defect. According to the invention, the resistance abnormity caused by broken line and non-broken line factors can be effectively distinguished, and the misjudgment rate is reduced; and meanwhile, quantitative line breakage degree evaluation can be realized, and a technical basis is provided for formulating an industrial line breakage detection standard.

Description

Technical Field

[0001] The present invention belongs to the technical field of electrical detection, and particularly relates to a method for testing broken wires of film-coated wires. Background Art

[0002] Currently, in the prior art, the detection of broken wires in film-coated wires mainly relies on the resistance measurement method, such as: DCR test. However, the traditional method has the following defects:

[0003] (1) High misjudgment rate of single parameter: The change in resistance may be caused by non-uniform materials, small cross-sectional area changes (such as local oxidation or cracks), or temperature fluctuations, rather than broken wires.

[0004] (2) Unable to quantify the degree of broken wires: It can only judge "open or closed", and it is difficult to evaluate the impact of partial broken wires on performance. Summary of the Invention

[0005] The purpose of the present invention is to provide a method for testing broken wires of film-coated wires, which can solve the problems of high misjudgment rate and inability to quantify the degree of broken wires in traditional detection.

[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is as follows:

[0007] A method for testing broken wires of film-coated wires, which includes the following steps:

[0008] Step 1, sampling: Sampling one section of wire with a length of 1 meter and one section of wire with a length of 10 meters respectively;

[0009] Step 2, parameter measurement: Measuring the weight value and direct current resistance value of the 1-meter sampling wire and the 10-meter sampling wire respectively, and obtaining the weight value G1 of the 1-meter sampling wire, the direct current resistance value R1 of the 1-meter sampling wire, the weight value G2 of the 10-meter sampling wire, and the direct current resistance value R2 of the 10-meter sampling wire;

[0010] Step 3, calculating the change rate of direct current resistance:

[0011] According to the formula ΔR = {R2 / [R1 * (G2 / G1)] - 1} * 100%, calculate the change rate of direct current resistance;

[0012] Step 4, broken wire determination:

[0013] When the change rate of direct current resistance ΔR is less than the set percentage, it is determined that the wire is qualified; when the change rate of direct current resistance ΔR is greater than or equal to the set percentage, it is determined that the wire has a broken wire defect.

[0014] As a preferred solution of the present invention, in the step 1, solder treatment is respectively performed at both ends of the 1-meter sampling wire and both ends of the 10-meter sampling wire, so that each conductor at the end of the film-coated wire is welded into one body.

[0015] As a preferred embodiment of the present invention, the solder covering length of the solder treatment is 5 mm, and the thickness of the tin layer is 0.1 - 0.3 mm.

[0016] As a preferred embodiment of the present invention, in the second step, the difference between the weight value G2 of the 10 - meter sampling wire and 10 times the weight value G1 of the 1 - meter sampling wire is within the range of ±5 g.

[0017] As a preferred embodiment of the present invention, in the second step, the measurement of the DC resistance value is carried out in a constant - temperature environment of 25 ± 1°C.

[0018] As a preferred embodiment of the present invention, in the fourth step, the set percentage is 2%.

[0019] Implementing a method for testing broken wires of a film - covered wire provided by the present invention, compared with the prior art, its beneficial effects are as follows:

[0020] The technical solution of the embodiment of the present invention calculates the DC resistance change rate through a weight - resistance correlation model, which can effectively distinguish the resistance anomalies caused by broken - wire and non - broken - wire factors (such as wire - diameter fluctuations, material oxidation), reducing the misjudgment rate; at the same time, setting the DC resistance change rate ΔR to be greater than or equal to the set percentage (preferably 2%) realizes the quantitative evaluation of the degree of wire breakage, providing a technical basis for formulating industry standards for broken - wire detection. Specific Embodiments

[0021] The following provides a specific embodiment of the present invention. It should be understood that the present invention is not limited to this embodiment described below, and the technical concept of the present invention can be implemented in combination with other well - known technologies or other technologies with the same functions as those well - known technologies.

[0022] The method for testing broken wires of a film - covered wire in the embodiment of the present invention includes the following steps:

[0023] Step 1, Sampling: Sampling one section of 1 - meter and one section of 10 - meter sampling wires respectively;

[0024] Step 2, Parameter Measurement: Measuring the weight values and DC resistance values of the 1 - meter sampling wire and the 10 - meter sampling wire respectively, obtaining the weight value G1 of the 1 - meter sampling wire, the DC resistance value R1 of the 1 - meter sampling wire, the weight value G2 of the 10 - meter sampling wire, and the DC resistance value R2 of the 10 - meter sampling wire;

[0025] Step 3, Calculating the DC Resistance Change Rate:

[0026] Calculating the DC resistance change rate according to the formula ΔR = {R2 / [R1*(G2 / G1)] - 1}*100%;

[0027] Step 4, Broken - wire Judgment:

[0028] When the DC resistance change rate ΔR is less than the set percentage (preferably 2%), the wire is determined to be qualified; when the DC resistance change rate ΔR is greater than or equal to the set percentage, it is determined that the wire has a broken wire defect.

[0029] It can be understood that when the set DC resistance change rate ΔR≥2% is set as unqualified, secondary defect classification can also be carried out, such as: when ΔR = 2% - 5%, it is a minor defect, and when it is greater than 5%, it is a serious defect.

[0030] Therefore, according to the broken wire test method of the film-covered wire in the embodiment of the present invention, by calculating the DC resistance change rate through the weight-resistance correlation model, it can effectively distinguish the resistance anomalies caused by broken wire and non-broken wire factors (such as wire diameter fluctuations, material oxidation), reduce the misjudgment rate; at the same time, setting the DC resistance change rate ΔR to be greater than or equal to the set percentage (preferably 2%) realizes the quantitative evaluation of the broken wire degree and provides a technical basis for formulating the industry broken wire detection standard.

[0031] Exemplarily, in the first step, soldering treatment is carried out at both ends of the 1-meter sampling wire and both ends of the 10-meter sampling wire, so that each conductor at the end of the film-covered wire is welded into one body, ensuring that each conductor at the end of the wire is in full contact with the micro-ohmmeter during the resistance test, eliminating the interference of the parallel effect, and ensuring the stability and accuracy of the resistance test.

[0032] Further, the solder coverage length of the soldering treatment is 5 mm, and the tin layer thickness is 0.1 - 0.3 mm. It should be noted that the solder coverage length of 5 mm ensures that each conductor of the film-covered wire is wrapped by solder, eliminating the contact resistance fluctuation caused by local poor contact; at the same time, the fixed coverage length (such as 5 mm) makes the solder joint sizes of all samples the same, reducing the resistance measurement error introduced by the contact area difference; the tin layer thickness ≥0.1 mm ensures that the solder layer fully fills the conductor gap to form a low-resistance path; the tin layer thickness ≤0.3 mm avoids the too high proportion of solder weight and reduces the interference to the G1 / G2 measurement.

[0033] Exemplarily, in the second step, the difference between the weight value G2 of the 10-meter sampling wire and 10 times the weight value G1 of the 1-meter sampling wire is within the range of ±5 g. Therefore, the batch density difference can be automatically filtered through the weight difference threshold, avoiding misjudgment caused by raw material fluctuations.

[0034] Exemplarily, in the second step, the measurement of the DC resistance value is carried out in a constant temperature environment of 25±1°C to offset the influence of temperature on the resistivity (ρ).

[0035] In summary, the broken wire test method of the film-covered wire in the embodiment of the present invention significantly improves the accuracy, efficiency and applicability of the broken wire detection of the film-covered wire by introducing the weight-resistance correlation model and combining process optimization and algorithm design.

[0036] The above are only the preferred embodiments of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the technical principle of the present invention, several improvements and substitutions can be made, and these improvements and substitutions should also be regarded as the protection scope of the present invention.

Claims

1. A method for testing the breakage of film-coated wire, characterized in that, It includes the following steps: Step 1, sampling: respectively sample a section of sampling wire with a length of 1 meter and a section of 10 meters; Step 2, parameter measurement: respectively measure the weight value and the DC resistance value of the 1-meter sampling wire and the 10-meter sampling wire, and obtain the weight value G1 of the 1-meter sampling wire, the DC resistance value R1 of the 1-meter sampling wire, the weight value G2 of the 10-meter sampling wire, and the DC resistance value R2 of the 10-meter sampling wire; Step 3, calculate the DC resistance change rate: According to the formula ΔR = {R2 / [R1*(G2 / G1)] - 1} * 100%, calculate the DC resistance change rate; Step 4, breakage determination: When the DC resistance change rate ΔR is less than the set percentage, it is determined that the wire is qualified; when the DC resistance change rate ΔR is greater than or equal to the set percentage, it is determined that the wire has a breakage defect.

2. The method for testing the breakage of the film-coated wire according to claim 1, wherein, In the said Step 1, solder treatment is respectively carried out at both ends of the 1-meter sampling wire and both ends of the 10-meter sampling wire, so that each conductor at the end of the film-covered wire is welded into one body.

3. The film-covered wire breakage test method according to claim 2, wherein, The covering length of the solder for the said solder treatment is 5 mm, and the tin layer thickness is 0.1 - 0.3 mm.

4. The method for testing the breakage of the film-coated wire according to claim 1, characterized in that, In the said Step 2, the difference between the weight value G2 of the 10-meter sampling wire and 10 times the weight value G1 of the 1-meter sampling wire is within the range of ±5 g.

5. The method for testing the broken wire of the film-coated wire according to claim 1, characterized in that, In the said Step 2, the measurement of the DC resistance value is carried out in a constant temperature environment of 25 ± 1°C.

6. The method for testing the broken wire of the film-covered wire according to claim 1, wherein, In the said Step 4, the set percentage is 2%.