Inspection device, die cutting equipment and inspection method

Abstract

The invention provides an inspection device, die cutting equipment and an inspection method, the inspection device comprises a guide assembly and at least two sets of inspection assemblies arranged at intervals in the first direction, and the guide assembly comprises a first guide part extending in the first direction; each inspection assembly comprises a locking structure movably connected with the corresponding first guide part, a second guide part extending in the second direction and an inspection structure connected with the second guide part, the inspection structures in every two adjacent inspection assemblies are arranged in a staggered mode in the second direction, and the first direction is perpendicular to the second direction; the locking structure has an unlocking state and a locking state, in the unlocking state, the locking structure can move relative to the first guiding piece in the first direction, and in the locking state, the locking structure and the first guiding piece are relatively fixed. According to the inspection device, the die cutting equipment and the inspection method, missing inspection can be effectively avoided, and the yield of products is increased.

Description

Technical Field

[0001] This application relates to the technical field of die-cutting inspection, and specifically relates to an inspection device, a die-cutting device and an inspection method. Background Art

[0002] When producing brightening products such as brightening patches, it is usually necessary to perform die-cutting and punching on the brightening products. After die-cutting and punching, if the remaining waste materials block the holes, it will cause product defects, and such defective products need to be removed during production. Currently, it is usually necessary to manually inspect each brightening product one by one to remove defective products. However, manual inspection for a long time is prone to fatigue, resulting in missed inspections, and it is difficult to ensure the pass rate of the products after die-cutting and punching. Summary of the Invention

[0003] This application aims to solve at least one of the technical problems existing in the prior art. For this purpose, this application provides an inspection device that can effectively avoid missed inspections and improve the pass rate of products.

[0004] This application also provides a die-cutting device with the above inspection device.

[0005] This application also provides an inspection method.

[0006] According to the inspection device of the embodiment of this application, it includes a guiding component and at least two groups of inspection components; The guiding component includes a first guiding member arranged along a first direction; At least two groups of inspection components are arranged at intervals along the first direction. The inspection component includes a locking structure, an inspection structure and a second guiding member. The second guiding member is arranged along a second direction. The locking structure is movably connected to the first guiding member, and the locking structure is connected to the second guiding member. The inspection structure is connected to the second guiding member. The inspection structures in adjacent two groups of inspection components are arranged in a staggered manner along the second direction. The first direction is perpendicular to the second direction; Wherein, the locking structure has an unlocked state and a locked state. In the unlocked state, the locking structure can move relative to the first guiding member along the first direction. In the locked state, the locking structure and the first guiding member are relatively fixed.

[0007] The inspection device according to the embodiments of the present application has at least the following beneficial effects: Each group of inspection components is arranged at intervals in the first direction, so that each inspection structure is arranged at intervals in the first direction, and the inspection structure is connected to the second guiding member, and the second guiding member is connected to the locking structure. When the locking structure is in the unlocked state, the locking structure can move relative to the first guiding member in the first direction. In this way, the interval of the inspection structure in the first direction can be further adjusted. In addition, the inspection structures in two adjacent groups of inspection components are arranged offset in the second direction. In this way, each group of inspection structures is arranged at intervals, so that each inspection structure can respectively correspond to the hole positions of the light-enhancing patch to check whether there is a defective phenomenon of waste leakage at the hole positions. Through the inspection device of the present application, continuous detection can be carried out for light-enhancing products of various sizes, leakage detection can be effectively avoided, and the yield rate of products can be improved.

[0008] According to some embodiments of the present application, in the second direction, the inspection structure is movably connected to the second guiding member.

[0009] According to some embodiments of the present application, in the unlocked state, in the second direction, the locking structure is movably connected to the second guiding member, and in the locked state, the locking structure is fixedly connected to the second guiding member.

[0010] According to some embodiments of the present application, the inspection structure includes a mounting seat and an inspection unit. In the first direction, the mounting seat extends in a direction away from the second guiding member, and the inspection unit is movably connected to the mounting seat.

[0011] According to some embodiments of the present application, the mounting seat is provided with a guiding groove, and the guiding groove extends in the first direction, and at least a part of the inspection unit is located in the guiding groove.

[0012] According to some embodiments of the present application, the inspection unit includes an inspection probe and a limiting portion. In the third direction, the limiting portion is movably connected to the inspection probe. The guiding groove penetrates through the mounting seat. The inspection probe penetrates into the guiding groove from the first side of the mounting seat and exits from the second side of the mounting seat. The limiting portion abuts against the first side of the mounting seat. The first direction, the second direction, and the third direction are perpendicular to each other in pairs.

[0013] According to some embodiments of the present application, in the first direction, the mounting seats in two adjacent groups of inspection components extend in opposite directions.

[0014] The die-cutting equipment according to the embodiments of the present application includes a die-cutting machine and the inspection device in any of the above embodiments. In the first direction, the inspection device is arranged on the outlet side of the die-cutting machine.

[0015] The die-cutting device according to the embodiments of the present application has at least the following beneficial effects: The die-cutting machine is used for die-cutting brightening products, and the inspection device is used for inspecting the hole positions of the brightening products. Through the coordinated operation of the die-cutting machine and the inspection device, the hole positions of the brightening products can be inspected in a timely manner, which is beneficial to ensuring the yield rate of the brightening products.

[0016] According to some embodiments of the present application, the die-cutting device further includes a control module, which is electrically connected to the die-cutting machine and electrically connected to the inspection device; Wherein, the control module is configured to feedback a shutdown signal to the die-cutting machine when the inspection structure detects a defective product.

[0017] According to the inspection method of the embodiments of the present application, the length direction of the brightening product is arranged obliquely relative to the conveying direction. When die-cutting the brightening product, the hole positions of the die-cut brightening product are inspected, and the die-cutting operation is stopped when defective hole positions are detected.

[0018] The die-cutting device according to the embodiments of the present application has at least the following beneficial effects: Through this inspection method, the hole positions of the brightening products can be inspected, and the die-cutting operation can be stopped in a timely manner when defects are detected, effectively avoiding the continuous production of defective products, thereby ensuring the yield rate of the brightening products.

[0019] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The following further describes the present application with reference to the drawings and embodiments, wherein: Figure 1 It is a top view of the inspection device according to the embodiment of the present application; Figure 2 It is a structural schematic diagram of the inspection device according to the embodiment of the present application; Figure 3 For Figure 2 The partial enlarged schematic diagram at A in Figure 4 It is a side view of the inspection device according to the embodiment of the present application; Figure 5 It is a front view of the inspection device according to the embodiment of the present application; Figure 6 It is a structural schematic diagram of the die-cutting machine according to the embodiment of the present application.

[0021] Reference numerals: guiding assembly 100, first guiding member 110; Inspection assembly 200, locking structure 210, inspection structure 220, inspection base 221, mounting base 222, guiding groove 2221, inspection unit 223, inspection probe 2231, limiting portion 2232, second guiding member 230; Die cutting machine 300, control module 310, and brightening patch 320. Specific implementation manner

[0022] The embodiments of the present application will be described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and should not be construed as a limitation of the present application.

[0023] In the description of the present application, it should be understood that the orientation or positional relationship indicated by terms such as up, down, front, back, left, right, etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present application.

[0024] In the description of the present application, the meaning of several is more than one, and the meaning of multiple is two or more. Understandings such as greater than, less than, exceeding, etc. do not include the present number, and understandings such as above, below, within, etc. include the present number. If there is a description of first and second, it is only for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or the sequence relationship of the indicated technical features.

[0025] In the description of the present application, unless otherwise clearly defined, words such as setting, installing, connecting, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in the present application in combination with the specific content of the technical solution.

[0026] In the description of the present application, the description referring to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples", etc. means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0027] The embodiments of the present application will be introduced below in conjunction with the accompanying drawings of the specification: Refer to Figure 1, the inspection device of the present application is used to inspect brightening products such as the brightening patch 320. Taking the brightening patch 320 as an example, the brightening patch 320 is generally formed by laminating multiple layers such as a substrate layer (such as polyethylene terephthalate) and a microprism layer. The microprisms of the brightening patch 320 are continuously arranged along the length direction of the material. This structural feature causes the tensile strength and elastic modulus of the brightening patch 320 in the length direction to be higher than those in the width direction. Based on this structure of the brightening patch 320, when die-cutting the brightening patch 320, the length direction of the brightening patch 320 is usually set at a certain angle with the conveying direction (refer to Figure 1). Such an inclined setting can make the cutting path not perpendicular to the prism direction, which is beneficial to dispersing the stress generated during die-cutting, maintaining the integrity of the microstructure of the brightening patch 320, and thus ensuring the performance of the brightening patch 320.

[0028] It should be noted that because the length direction of the brightening patch 320 is inclined relative to the conveying direction, when multiple rows of brightening patches 320 are arranged in a direction perpendicular to the conveying direction, since holes will be die-cut at the same position for each brightening patch 320, the connecting line of the hole positions of two adjacent rows of brightening patches 320 will form an angle with the conveying direction, and at the same time, there is also an angle between this connecting line and the vertical direction of the conveying direction.

[0029] Refer to Figures 1 to 3 , according to the inspection device of the embodiment of the present application, it is applicable to inspect the brightening patch 320 using the above-mentioned conveying method. The inspection device includes a guiding component 100 and at least two groups of inspection components 200. The guiding component 100 includes a first guiding member 110 extending along a first direction, and the brightening patch 320 is conveyed along the first direction. At least two groups of inspection components 200 are arranged at intervals along the first direction. Each group of inspection components 200 includes a locking structure 210, an inspection structure 220, and a second guiding member 230. The inspection structure 220 is used to correspond to the hole positions of the brightening patch 320 to inspect the residue of waste and debris in the holes. If there is residue of waste and debris such as the brightening patch 320 at the hole positions, that is, the brightening patch 320 is a defective product with missed waste discharge and needs to be removed.

[0030] The second guiding member 230 extends along a second direction, and the first direction is perpendicular to the second direction. The locking structure 210 is movably connected to the first guiding member 110, and the locking structure 210 is connected to the second guiding member 230. The inspection structure 220 is connected to the second guiding member 230. The inspection structures 220 in two adjacent groups of inspection components 200 are arranged in a staggered manner along the second direction. With such a setting, the two inspection structures 220 can respectively correspond to the hole positions of two rows of juxtaposed brightening patches 320 being conveyed. That is to say, during the inspection process, the connecting line of the hole positions of the juxtaposed brightening patches 320 can coincide with the connecting line of the two inspection structures 220.

[0031] The locking structure 210 has an unlocked state and a locked state. In the unlocked state, the locking structure 210 can move relative to the first guiding member 110 in the first direction, for adjusting the interval between two adjacent sets of inspection components 200 in the first direction. Since there is an interval in the first direction for the hole positions of the two rows of light-enhancing patches 320 conveyed side by side, by adjusting the interval between two adjacent sets of inspection components 200 in the first direction, it can ensure that the inspection structure 220 better corresponds to the hole positions of the two rows of light-enhancing patches 320 conveyed side by side, so as to realize the inspection of the situation of missing or defective hole positions. In the locked state, the locking structure 210 is relatively fixed with the first guiding member 110, so that the relative position between the first guiding member 110 and the second guiding member 230 is determined. And because the inspection structure 220 is connected to the second guiding member 230, each inspection structure 220 thus has a determined position, which is beneficial to making the inspection operation more stable.

[0032] Reference Figures 1 to 3 , specifically, the locking structure 210 is composed of a locking base and a locking bolt. The locking base is provided with a first through hole, the axis of which extends along the first direction, and at the same time is also provided with a first locking hole communicating with the first through hole. A part of the first guiding member 110 can penetrate into the first through hole. The hole wall of the first locking hole has a threaded structure, and the locking bolt penetrates into the first locking hole and forms a threaded connection with the locking base. When the locking bolt is screwed in and extends into the first through hole and abuts against the first guiding member 110, it can limit the relative movement between the locking base and the first guiding member 110. At this time, the locking structure 210 is in the locked state. On the contrary, rotate the locking bolt so that it withdraws and separates from the position where it abuts against the first guiding member 110, then the locking base can move relative to the first guiding member 110 in the first direction. At this time, the locking structure 210 is in the unlocked state.

[0033] The inspection methods of the inspection structure 220 include but are not limited to infrared detection, visual scanning detection, laser scanning detection, etc. When carrying out the inspection operation, the inspection structure 220 is arranged above the light-enhancing patch 320, and its inspection part faces the direction where the light-enhancing patch 320 is located. The light-enhancing patches 320 are conveyed in a step-by-step manner. Each light-enhancing patch 320 is conveyed along the first direction and is arranged side by side in the second direction. In the first direction, the conveying step distance of the light-enhancing patches 320 is set as the distance between the hole positions of two adjacent light-enhancing patches 320. In this way, taking the hole position of any light-enhancing patch 320 as the inspection starting point, every time the light-enhancing patch 320 is conveyed step by step, it can make the hole position of the light-enhancing patch 320 correspond to the position of the inspection structure 220 (that is, the hole position of the light-enhancing patch 320 is directly below the inspection structure 220), so that the inspection structure 220 can inspect the hole position of the light-enhancing patch 320.

[0034] Taking the infrared inspection method as an example, a substrate is provided on the side of the light-enhancing patch 320 facing away from the inspection structure 220, and the substrate can be made of a metal material. When the hole position is a through hole, infrared rays pass through the hole position, and the infrared rays reflected by the substrate are weak; if the light-enhancing patch 320 remains at the hole position, the infrared rays are reflected on the light-enhancing patch 320, and the reflected infrared rays are strong. According to the strength of the reflected infrared rays, it is possible to screen whether the light-enhancing patch 320 is a defective product, which helps to effectively avoid missed inspections and thus improve the yield of the product.

[0035] It should be noted that during the process of transporting the light-enhancing patch 320 in the first direction, multiple rows of light-enhancing patches 320 can be transported side by side in the second direction. The number of inspection components 200 is not less than the number of rows of the light-enhancing patches 320, and the number of inspection structures 220 turned on can be adaptively adjusted according to the number of rows of the transported light-enhancing patches 320. The inspection operation method is more flexible and also helps to save resources.

[0036] Reference Figures 1 to 3 , in some other embodiments, the guiding component 100 includes two first guiding members 110 extending along the first direction, and the two first guiding members 110 are spaced apart along the second direction. The two groups of inspection components 200 are spaced apart along the first direction. Along the second direction, one end of the two groups of inspection components 200 is connected to one of the first guiding members 110, and the opposite ends of the two groups of inspection components 200 are connected to the other first guiding member 110. The two first guiding members 110 can provide a more stable support for the two groups of inspection components 200, and the two first guiding members 110 can also guide the position adjustment of the two groups of inspection components 200 along the first direction, effectively avoiding the skew of the inspection components 200 relative to the second direction.

[0037] Specifically, the inspection component 200 includes two locking structures 210. In the second direction, one end of the second guiding member 230 is connected to one of the locking structures 210, and the other end is connected to the other locking structure 210, and the two locking structures 210 are connected to the two first guiding members 110 in a one-to-one correspondence. When the locking structure 210 is in the unlocked state, in the first direction, the two locking structures 210 can move relative to the first guiding members 110 connected thereto respectively, thereby realizing the adjustment of the position of the second guiding member 230. In addition, the two first guiding members 110 are arranged at opposite ends of the second guiding member 230, which can ensure that the second guiding member 230 always remains perpendicular to the first guiding members 110 when moving along the first direction. On the one hand, it makes the sliding of the locking structure 210 relative to the first guiding member 110 smoother, and on the other hand, it also makes the position of the inspection structure 220 more accurate, facilitating the inspection structure 220 to accurately align with the hole position of the light-enhancing patch 320.

[0038] Reference Figures 1 to 3, in some embodiments, along the second direction, the inspection structure 220 is movably connected to the second guide member 230. This connection method is used to adjust the position of the inspection structure 220 in the second direction, and the second guide member 230 plays a guiding role for the movement of the inspection structure 220. Since there are different sizes of the light enhancement patch 320, the distances of the hole positions of the juxtaposed light enhancement patches 320 along the second direction are also different. By adjusting the position of the inspection structure 220 in the second direction, the inspection structure 220 can be accurately aligned with the hole positions of the light enhancement patch 320, which is beneficial to improving the adaptability of the inspection device to light enhancement patches 320 of different sizes.

[0039] It should be noted that for each light enhancement patch 320 conveyed side by side along the first direction, there are intervals between the hole positions of adjacent light enhancement patches 320 in both the first direction and the second direction. When the locking structure 210 is in the unlocked state, the locking structure 210 can move along the first guide member 110 to adjust the position of each inspection structure 220 in the first direction. At the same time, the inspection structure 220 can also move along the second guide member 230 to realize the position adjustment of the inspection structure 220 in the second direction. In this way, the position adjustment of the inspection structure 220 in the first direction and the second direction is realized, which facilitates the accurate correspondence between the inspection structure 220 and the hole positions.

[0040] Specifically, the inspection structure 220 includes an inspection base 221 and an inspection bolt. The inspection base 221 is provided with a first inspection hole penetrating along the second direction and a second inspection hole communicating with the first inspection hole. The second inspection hole is provided with internal threads. A part of the second guide member 230 is located in the first inspection hole, and the inspection bolt penetrates into the second inspection hole and is threadedly connected to the inspection base 221. When the inspection bolt is screwed in and extends into the first inspection hole and abuts against the second guide member 230, the inspection structure 220 is fixed relative to the second guide member 230; when the inspection bolt is screwed out and separated from the second guide member 230, the inspection structure 220 can move relative to the second guide member 230 in the second direction, thereby completing the position adjustment of the inspection structure 220 in the second direction.

[0041] Reference Figures 1 to 3 , in some other embodiments, a scale is provided on the surface of the second guide member 230. This scale can be used as a reference for the position adjustment of the inspection structure 220 along the second direction. The scale can intuitively understand the moving distance of the inspection structure 220 and realize more precise position adjustment of the inspection structure 220. This can not only improve the position accuracy of the inspection structure 220, but also reduce the repeated debugging work caused by position adjustment deviation and improve the inspection efficiency. At the same time, the precise position adjustment enables the inspection structure 220 to quickly and accurately align with the hole positions when facing light enhancement patches 320 of different batches, similar sizes but with slight differences, enhancing the universality of the inspection device for the inspection work of various light enhancement patches 320.

[0042] Reference Figures 1 to 3 Figures 1 to 3 In some other embodiments, the inspection structure 220 and the second guide member 230 are rotatably connected. When the inspection bolt is separated from the second guide member 230, the inspection base 221 can rotate around the connection with the second guide member 230, thereby adjusting the orientation of the inspection structure 220. When the inspection bolt is screwed in and abuts against the second guide member 230, the inspection base 221 and the second guide member 230 are relatively fixed. By rotating the inspection base 221, the inspection of the inclined hole positions on the light-enhancing patch 320 can be achieved. On the one hand, it is beneficial to improve the applicability of the inspection base 221, enabling it to meet the detection requirements of hole positions at different angles. On the other hand, it also expands the application scenarios of the inspection device. For example, in the light-enhancing patch 320 manufactured by some special processes, the hole positions may be irregularly inclined due to process characteristics, and the rotation of the inspection base 221 can ensure the detection of the inclined hole positions.

[0043] Reference Figures 1 to 3 Figures 1 to 3 In some embodiments, in the unlocked state, along the second direction, the locking structure 210 and the second guide member 230 are movably connected. In the locked state, the locking structure 210 and the second guide member 230 are fixedly connected. The relative movement between the second guide member 230 and the locking structure 210 can adjust the relative position of the second guide member 230 in the second direction. Since the inspection structure 220 is connected to the second guide member 230, as the position of the second guide member 230 changes, the position of the inspection structure 220 along the second direction will also change. In this way, the inspection structures 220 in two adjacent inspection assemblies 200 can change their relative positions along the second direction, so as to be able to adapt to the inspection requirements of light-enhancing patches 320 of different sizes, and further improve the flexibility of position adjustment of the inspection structure 220.

[0044] Specifically, the locking base is provided with a second through hole extending along the second direction and a second locking hole communicating with the second through hole. A part of the second guide member 230 can penetrate into the second through hole. The hole wall of the second locking hole has a threaded structure. The locking bolt penetrates into the second locking hole and forms a threaded connection with the locking base. When the locking bolt is screwed in and extends into the second through hole to abut against the second guide member 230, the relative movement between the locking base and the second guide member 230 can be restricted, and at this time the locking structure 210 is in the locked state. On the contrary, by rotating the locking bolt so that it withdraws from and separates from the position where it abuts against the second guide member 230, the second guide member 230 and the locking base can move relative to each other along the second direction, and at this time the locking structure 210 is in the unlocked state.

[0045] Reference Figures 1 to 3, in some embodiments, the inspection structure 220 includes a mounting base 222 and an inspection unit 223. Along the first direction, the mounting base 222 extends away from the second guide member 230, and the inspection unit 223 is movably connected to the mounting base 222. Among them, the inspection unit 223 can be an infrared unit. By the relative movement between the inspection unit 223 and the mounting base 222, fine adjustment of the position of the inspection unit 223 in the first direction can be achieved, which helps to more precisely adjust the position of the inspection unit 223, enabling the inspection operation to better adapt to the precise detection requirements of the hole positions of the light-enhancing patch 320, reducing inspection errors caused by position deviation, and improving the reliability of the overall inspection.

[0046] Specifically, the principle of inspecting the hole positions in this application is as follows: The infrared unit integrates an infrared emitter and an infrared receiver, and the infrared emitter faces the side where the light-enhancing patch 320 is located. When the light-enhancing patch 320 is conveyed in a step-by-step manner, the hole positions of the light-enhancing patch 320 can correspond to the position of the infrared emitter. If there is no waste residue in the hole position, the infrared rays will irradiate the substrate carrying the light-enhancing patch 320, and the infrared rays will be reflected by the substrate; if there is residual light-enhancing patch 320 or other debris at the hole position, the infrared rays will be blocked by these debris, and at this time, the infrared rays will be reflected by the light-enhancing patch 320 or other debris. Since there are differences in the infrared reflection intensities received by the infrared receiver in these two different situations, it can be used to determine whether there is a problem of missing waste discharge in the light-enhancing patch 320.

[0047] It should be noted that the difference in infrared reflection intensities in these two situations can be measured in advance, and the infrared reflection intensity range corresponding to the detection of residual light-enhancing patch 320 and other debris in the hole position can be set as a reference. In addition, when the color or material of the light-enhancing patch 320 changes, the infrared reflection intensity will also change accordingly. Therefore, the sensitivity of the inspection can be improved by adjusting the sensitivity of the receiver, the wavelength of the infrared rays, the emission power of the infrared rays, etc. This can not only ensure the accuracy of the inspection, effectively prevent missed inspection and mis-inspection of the light-enhancing patch 320, but also flexibly adjust the inspection parameters when facing light-enhancing patches 320 with different characteristics, expand the applicable range of the inspection device, and reduce the inspection problems caused by product diversity.

[0048] Reference Figures 1 to 3In other embodiments, the inspection structure 220 includes an inspection base 221, a mounting base 222, and an inspection unit 223. The inspection base 221 is connected to the second guide member 230, while the mounting base 222 is detachably connected to the inspection base 221 to facilitate adjustment of the mounting base 222's position. The mounting base 222 extends in a first direction away from the inspection base 221. The inspection unit 223 is connected to the mounting base 222, providing the necessary mounting space for adjusting the position of the inspection unit 223, ensuring fine-tuning of the position of the inspection unit 223 along the first direction. Furthermore, if the inspection unit 223 or the mounting base 222 becomes damaged during long-term use, the detachable connection facilitates the independent replacement of either component, reducing maintenance costs and extending the overall service life of the device. It also facilitates the flexible replacement of mounting bases 222 and inspection units 223 of different specifications according to different inspection requirements.

[0049] refer to Figures 1 to 3 In some embodiments, the mounting base 222 is provided with a guide slot 2221 extending along a first direction. At least a portion of the inspection unit 223 is located within the guide slot 2221. The guide slot 2221 serves to provide a guide path for the inspection unit 223 to move relative to the mounting base 222. This design effectively prevents deflection of the inspection unit 223 during position adjustment, thereby enabling more precise adjustment of the inspection unit 223 along the first direction. This helps improve the accuracy of hole position detection on the brightening patch 320 and reduces detection errors caused by positional deviation of the inspection unit 223. It should be noted that the portion of the inspection unit 223 used for hole position detection is located outside the guide slot 2221. This layout ensures that the inspection unit 223 can directly contact the holes of the brightening patch 320, while also providing a stable constraint on the movement direction of the inspection unit 223.

[0050] refer to Figures 1 to 5, in some embodiments, the inspection unit 223 includes an inspection probe 2231 and a limiting portion 2232. Along the third direction, the limiting portion 2232 is movably connected to the inspection probe 2231. The guiding groove 2221 penetrates through the mounting base 222. The inspection probe 2231 penetrates into the guiding groove 2221 from the first side of the mounting base 222 and exits the guiding groove 2221 from the second side of the mounting base 222. The limiting portion 2232 abuts against the first side of the mounting base 222. The first direction, the second direction, and the third direction are perpendicular to each other pairwise. The limiting portion 2232 abuts against the mounting base 222 to limit the length of the inspection probe 2231 penetrating into the guiding groove 2221, thereby controlling the distance between the inspection probe 2231 and the light enhancement patch 320. In addition, the limiting portion 2232 can move relative to the inspection probe 2231, and can further adjust the length of the inspection probe 2231 penetrating into the guiding groove 2221, so that a proper distance is maintained between the inspection probe 2231 and the light enhancement patch 320, which is beneficial to improving the accuracy of inspection. For example, when inspecting light enhancement patches 320 of different thicknesses, the distance can be flexibly adjusted in this way to ensure that the inspection probe 2231 obtains more accurate detection data.

[0051] Specifically, the third direction is the vertical direction. The inspection probe 2231 extends along the third direction. The limiting portion 2232 can be a nut. The outer peripheral wall of the inspection probe 2231 is provided with threads. The limiting portion 2232 is threadedly connected to the inspection probe 2231. In this way, the limiting portion 2232 can adjust its position relative to the inspection probe 2231 along the third direction. The mounting base 222 is provided with a guiding groove 2221 penetrating vertically up and down. The light enhancement patch 320 is conveyed on the lower side of the mounting base 222. The inspection probe 2231 penetrates into the guiding groove 2221 from the first side (i.e., the upper side) of the mounting base 222 and exits from the second side (i.e., the lower side) of the mounting base 222. The limiting portion 2232 abuts against the mounting base 222 on the first side to limit the exposed length of the inspection probe 2231 on the second side, thereby realizing the adjustment of the distance between the inspection probe 2231 and the light enhancement patch 320.

[0052] Reference Figures 1 to 5, in some embodiments, along the first direction, the mounting seats 222 in two adjacent sets of inspection components 200 extend in opposite directions, so that the two sets of inspection components 200 are closer, and the structure of the inspection device is more compact. Specifically, the inspection device includes two sets of inspection components 200. Each set of inspection components 200 includes a locking structure 210, an inspection structure 220, and a second guiding member 230 extending along the second direction. The second guiding member 230 is connected to the first guiding member 110 by means of the locking structure 210, and the inspection structure 220 is connected to the second guiding member 230. In the inspection structure 220, in the first direction, the two mounting seats 222 extend away from the second guiding member 230 in the other adjacent set of inspection components 200 relative to the second guiding member 230 to which they are connected respectively. That is to say, the two mounting seats 222 are respectively located on the opposite sides of the two second guiding members 230. The inspection unit 223 is installed on the mounting seat 222. Thus, while ensuring that the inspection unit 223 has sufficient moving stroke along the first direction to meet the inspection requirements for different hole positions of the light-enhancing patch 320, the two second guiding members 230 can be closer, further optimizing the spatial layout of the inspection device and improving the structural compactness.

[0053] Reference Figures 1 to 5 , in some embodiments, at least one of the inspection components 200 is provided with a plurality of inspection structures 220. Along the second direction, the inspection structures 220 in the same set of inspection components 200 are arranged at intervals, and along the first direction, the adjacent two inspection structures 220 extend in opposite directions relative to the second guiding member 230. Thus, each set of inspection components 200 includes at least two inspection positions, and the connection line between the adjacent two inspection structures 220 has an angle relative to both the first direction and the second direction to correspond to the hole positions of the light-enhancing patch 320. Further, the hole positions of the light-enhancing patch 320 can be inspected by a single set of inspection components 200. Further, when multiple sets of inspection components 200 work together, the hole positions of the light-enhancing patch 320 can be inspected multiple times, greatly improving the accuracy of the inspection results.

[0054] Specifically, the inspection structure 220 includes a mounting base 222, an inspection base 221, and an inspection unit 223. The inspection base 221 is connected to the second guide member 230, and the mounting base 222 is connected to the inspection base 221. Along the second direction, within the same set of inspection components 200, two adjacent mounting bases 222 extend in opposite directions to the second guide member 230 in the first direction. This causes the connection line of the inspection units 223 mounted on the two mounting bases 222 to be inclined with respect to both the first direction and the second direction. In this way, the two inspection units 223 can respectively correspond to the hole positions of the light-enhancing patch 320 conveyed side by side, so as to realize the inspection of whether there is any omission or waste of the hole positions. Cooperating with multiple sets of inspection components 200, multiple re-inspections of the hole positions can be realized, further improving the accuracy of inspection, effectively reducing the defective rate of products, improving product quality, reducing subsequent production problems caused by undetected hole position defects, and saving production costs.

[0055] Reference Figures 1 to 6 , according to the die-cutting device of the embodiment of the present application, it includes a die-cutting machine 300 and the inspection device in any of the above embodiments. Along the first direction, the inspection device is arranged on the outlet side of the die-cutting machine 300. The light-enhancing patch 320 is conveyed along the first direction and passes through the die-cutting machine 300 and the inspection device in sequence. The die-cutting machine 300 includes an upper template and a lower template. Along the third direction, a die is connected to the upper template, and the upper and lower templates approach each other to die-cut the light-enhancing patch 320. The inspection device is used to inspect the hole positions of the die-cut light-enhancing patch 320. By this means, defective products are screened out and removed, forming a coherent production process from die-cutting to inspection. Defective products are discovered and processed in a timely manner during the production process, effectively reducing the waste of resources caused by the inflow of defective products in subsequent processes. For example, in the subsequent assembly process, it is avoided that the entire product assembly fails due to the use of the light-enhancing patch 320 with hole position defects, thereby improving production efficiency and product quality and reducing the comprehensive production cost.

[0056] Reference Figures 1 to 6 , in some other embodiments, the die-cutting device further includes a control module 310. The control module 310 is electrically connected to the die-cutting machine 300 and is also electrically connected to the inspection device. The control module 310 is configured to, when the inspection structure 220 detects a defective product, feedback a stop signal to the die-cutting machine 300 so that the die-cutting machine 300 stops die-cutting operations, timely blocking the continuous output of defective products, avoiding the accumulation of a large number of unqualified light-enhancing patches 320, and reducing waste of raw materials.

[0057] It should be noted that Figure 6 the dotted line in indicates that the control module 310 is electrically connected to the die-cutting machine 300 and the inspection device.

[0058] Reference Figures 1 to 6, The inspection method according to the embodiments of the present application is used to detect the hole positions of the light-enhancing products through the inspection device in any of the above embodiments, so as to screen and eliminate the light-enhancing products with missing or defective arrangements, and ensure the yield of the light-enhancing products. When operating this inspection method, the length direction of the light-enhancing product is arranged obliquely relative to the conveying direction. When die-cutting the light-enhancing product, the hole positions of the die-cut light-enhancing product are inspected, and when the hole positions are found to be defective, the die-cutting operation is stopped. Thus, on the one hand, this inspection method realizes the synchronous development of die-cutting and inspection, greatly improving the production efficiency; on the other hand, it can stop the machine immediately when the hole position defects are found, effectively avoiding the generation of a large number of defective products and ensuring the yield of the light-enhancing products.

[0059] Specifically, the light-enhancing product is conveyed in the first direction. During the conveying process, the length direction of the light-enhancing product forms a certain angle with the first direction, and at the same time, its width direction also has an angle relative to the first direction, that is, the light-enhancing product is conveyed in an inclined posture. When the light-enhancing product is conveyed, it moves a step distance each time, and this distance can be precisely controlled by the PLC (programmable logic controller) of the die-cutting machine 300. For each such distance conveyed, the light-enhancing product will be stationary for a period of time, and the distance between the hole positions of two adjacent light-enhancing products is equal to this step distance.

[0060] During the period when the light-enhancing product pauses, the die-cutting machine 300 performs a die-cutting operation on the light-enhancing product in the to-be-die-cut state, and at the same time, the inspection device detects the hole positions of the die-cut light-enhancing product. Since the light-enhancing product can reflect infrared rays well, if there is light-enhancing product remaining at the hole position, it will reflect infrared rays, causing the red light of the inspection device to turn on, which indicates that the inspection device has received strong infrared reflection. At this time, the corresponding light-enhancing product is determined to be a defective product, and then the die-cutting operation is stopped, and a shutdown feedback is sent to the operator. On the contrary, when there is no light-enhancing product remaining at the hole position, the infrared reflection is weak, and the red light of the inspection device does not turn on, and the die-cutting and inspection operations continue.

[0061] The above has described the embodiments of the present application in detail with reference to the drawings, but the present application is not limited to the above embodiments. Within the knowledge scope of those of ordinary skill in the art to which the present application pertains, various changes can be made without departing from the purpose of the present application. In addition, without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

Claims

1. A testing device, characterized in that, Comprising: A guiding component, including a first guiding member arranged to extend along a first direction; At least two groups of inspection components, arranged at intervals along the first direction. The inspection component includes a locking structure, an inspection structure, and a second guiding member. The second guiding member is arranged to extend along a second direction. The locking structure is movably connected to the first guiding member and is connected to the second guiding member. The inspection structure is connected to the second guiding member. The inspection structures in two adjacent groups of the inspection components are arranged offset in the second direction. The first direction is perpendicular to the second direction; Wherein, the locking structure has an unlocked state and a locked state. In the unlocked state, the locking structure can move relative to the first guiding member along the first direction. In the locked state, the locking structure is relatively fixed to the first guiding member.

2. The inspection device according to claim 1, characterized in that, Along the second direction, the inspection structure is movably connected to the second guiding member.

3. The inspection device according to claim 1 or 2, characterized in that In the unlocked state, along the second direction, the locking structure is movably connected to the second guiding member. In the locked state, the locking structure is fixedly connected to the second guiding member.

4. The inspection device according to claim 1, characterized in that The inspection structure includes a mounting base and an inspection unit. Along the first direction, the mounting base is arranged to extend in a direction away from the second guiding member, and the inspection unit is movably connected to the mounting base.

5. The inspection device according to claim 4, characterized in that, The mounting base is provided with a guiding groove, which is arranged to extend along the first direction, and at least a part of the inspection unit is located in the guiding groove.

6. The inspection device according to claim 5, characterized in that, The inspection unit includes an inspection probe and a limiting portion. Along a third direction, the limiting portion is movably connected to the inspection probe. The guiding groove penetrates through the mounting base. The inspection probe penetrates into the guiding groove from a first side of the mounting base and penetrates out of the guiding groove from a second side of the mounting base. The limiting portion abuts against the first side of the mounting base. The first direction, the second direction, and the third direction are perpendicular to each other in pairs.

7. The inspection device according to claim 4, wherein Along the first direction, the mounting bases in two adjacent groups of the inspection components are arranged to extend in opposite directions.

8. A die-cutting device, characterized in that, Comprising: A die-cutting machine; The inspection device according to any one of claims 1 to 7, arranged on the outlet side of the die-cutting machine along the first direction.

9. The die-cutting equipment according to claim 8, further comprising a control module, which is communicatively connected to the die-cutting machine and electrically connected to the inspection device; Among them, The control module is configured to feed back a shutdown signal to the die-cutting machine when the inspection structure detects a defective product.

10. A testing method, characterized in that, Arrange the length direction of the light-enhancing product to be inclined relative to the conveying direction. When die-cutting the light-enhancing product, inspect the hole positions of the die-cut light-enhancing product, and stop the die-cutting operation when defective hole positions are detected.

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