Power supply testing device and method

Abstract

The invention provides a power supply testing device and method which can be applied to the technical field of power supply testing. The power supply testing device comprises a control unit, the output end of the control unit is connected with the input end of a redundancy control module and the input end of a load simulation module, and the control unit is used for responding to a test item execution request for a to-be-tested power supply when it is detected that the to-be-tested power supply is connected to the power supply testing device. Sending a test item execution instruction to the redundancy control module or the load simulation module; the redundancy control module is used for controlling a main power supply in the to-be-tested power supplies to stop receiving the power supply of the external power supply under the condition that the test item execution instruction is received; the load simulation module is used for simulating a load state corresponding to the test item execution instruction under the condition that the test item execution instruction is received; and the data acquisition module is used for acquiring test data of the to-be-tested power supply under the condition that the load simulation module or the redundancy control module finishes executing the test item execution instruction.

Description

Technical Field

[0001] The present application relates to the field of power supply testing technology, and in particular to a power supply testing device and method. Background Art

[0002] Overtemperature testing and fan failure testing are two crucial steps in server CRPS (Common Redundant Power Supplies) power supply testing. However, existing technologies for server CRPS testing still suffer from issues such as insufficient test coverage, limited analysis capabilities, and slow response speeds. These issues directly lead to low fault identification rates and low testing efficiency. Summary of the Invention

[0003] In view of the above problems, the present application provides a power supply testing device and method.

[0004] According to a first aspect of the present application, a power supply testing device is provided, comprising: a control unit, wherein the output end of the control unit is connected to the input end of a redundant control module and the input end of a load simulation module, and is configured to send a test item execution instruction to the redundant control module or the load simulation module in response to a test item execution request for the power supply to be tested when it is detected that the power supply to be tested is connected to the power supply testing device; the redundant control module is configured to control the main power supply in the power supply to be tested to stop receiving power from an external power supply when the test item execution instruction is received; the load simulation module is configured to simulate a load state corresponding to the test item execution instruction when the test item execution instruction is received; and a data acquisition module is configured to acquire test data of the power supply to be tested when the load simulation module or the redundant control module completes execution of the test item execution instruction.

[0005] A second aspect of the present application provides a power supply testing method, comprising: in response to a test item execution request for the above-mentioned power supply to be tested, the control unit sends a test item execution instruction to the above-mentioned redundant control module or the above-mentioned load simulation module when it detects that the power supply to be tested is connected to the power supply testing device; when the above-mentioned test item execution instruction is received, the redundant control module controls the main power supply in the above-mentioned power supply to be tested to stop receiving power from the external power supply; when the above-mentioned test item execution instruction is received, the load simulation module simulates the load state corresponding to the above-mentioned test item execution instruction; when the above-mentioned load simulation module or the above-mentioned redundant control module completes execution of the above-mentioned test item execution instruction, the data acquisition module acquires test data of the above-mentioned power supply to be tested.

[0006] According to the power supply testing device and method provided by the present application, the power supply testing device may include a control unit, a redundant control module, a load simulation module and a data acquisition module, and the control unit is used to send a test item execution instruction to the redundant control module or the load simulation module, so that the redundant control module or the load simulation module executes the test item execution instruction. Thus, by simulating different load states and main power supply failures, different test items are tested on the voltage to be tested, which improves the test coverage of the power supply to be tested and is conducive to improving the test quality of the power supply to be tested. In addition, the data acquisition module is used to collect test data of the power supply to be tested, so as to determine whether the test of the power supply to be tested has passed based on the test data, which is conducive to discovering faults in the power supply to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] The above contents and other objects, features and advantages of the present application will become more apparent through the following description of the embodiments of the present application with reference to the accompanying drawings, in which:

[0008] Figure 1 A schematic diagram of a power supply testing device according to an embodiment of the present application is schematically shown;

[0009] Figure 2 Schematically shows a schematic diagram of a power supply testing device according to another embodiment of the present application;

[0010] Figure 3 A schematic diagram of a device for testing a first power supply to be tested and a second power supply to be tested according to an embodiment of the present application is shown;

[0011] Figure 4 A schematic diagram schematically shows a power supply testing device including n testing modules according to an embodiment of the present application; and

[0012] Figure 5 The flowchart of the power supply testing method according to an embodiment of the present application is schematically shown. DETAILED DESCRIPTION

[0013] Hereinafter, embodiments of the present application will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present application. In the detailed description below, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present application. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessarily confusing the concepts of the present application.

[0014] The terms used herein are only for describing specific embodiments and are not intended to limit this application. The terms "comprise," "include," etc. used herein indicate the presence of the features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0015] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0016] When expressions such as "at least one of A, B, and C, etc." are used, they should generally be interpreted in accordance with the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0017] Figure 1 The figure schematically shows a power supply testing device according to an embodiment of the present application.

[0018] like Figure 1 As shown, the power supply testing device may include a control unit 110 , a load simulation module 120 , a redundancy control module 130 and a data acquisition module 140 .

[0019] According to an embodiment of the present application, when a power supply to be tested is to be tested, it is necessary to first connect the power supply to be tested to a power supply testing device so as to test the power supply to be tested using the power supply testing device.

[0020] like Figure 1 As shown, in the power supply testing device, the output end of the control unit 110 is connected to the input end of the redundancy control module 130 and the input end of the load simulation module 120 .

[0021] In one embodiment, the power supply to be tested is connected to the power supply testing device. The connection of the power supply to be tested in the power supply testing device can be as follows: Figure 1 As shown in . Figure 1 In the embodiment, the output end of the redundant control module 130 is connected to the input end of the power supply under test 150, the output end of the load simulation module 120 is connected to the output end of the power supply under test 150, and the input end of the data acquisition module 140 is connected to the output end of the power supply under test 150.

[0022] According to an embodiment of the present application, the control unit 110 can also be used to detect the presence status of the power supply to be tested to determine whether the power supply to be tested has been connected to the power supply testing device. When the power supply to be tested 150 is connected to the power supply testing device, the control unit 110 can detect that the power supply to be tested 150 has been connected to the power supply testing device. Based on this, the power supply testing device can be used to test the power supply to be tested 150.

[0023] According to an embodiment of the present application, the control unit 110 can send a test item execution instruction to the redundancy control module 130 or the load simulation module 120 in response to a test item execution request for the power supply under test 150. In the power supply testing device, multiple test items can be tested on the power supply under test 150, but when the control unit 110 responds to the test item execution request, only one test item is tested on the power supply under test 150. When the power supply under test 150 completes the test item test, another test item can be tested on the power supply under test 150. Thus, the power supply testing device is used to test the power supply under test 150 one test item at a time.

[0024] According to an embodiment of the present application, the redundant control module 130 and the load simulation module 120 in the power supply testing device can each be used to perform different test items on the power supply under test 150. Therefore, when the control unit 110 responds to a test item execution request, it first determines the test item to be tested on the power supply under test 150 based on the test item execution request. Based on the determined test item, it determines whether the test item is to be tested by the redundant control module 130 or the load simulation module 120, and sends a test item execution instruction to the redundant control module 130 or the load simulation module 120. The control unit 110 can integrate multiple automated testing tools.

[0025] In one embodiment, the control unit 110 may send test item execution instructions to the load simulation module 120 and the redundancy control module 130 via a CAN bus (Controller Area Network). The CAN bus uses twisted-pair cables and a shielded layer, and the terminals are matched with 120Ω resistors.

[0026] Among them, test items may include basic performance test, dynamic response test, redundancy test, protection function test and aging test.

[0027] exist Figure 1 In the example, the external power supply supplies power to the power supply under test 150 through the redundancy control module 130. The power supply under test 150 includes a main power supply and a backup power supply, both of which receive power from the external power supply. Thus, the redundancy control module 130 can be used to perform a redundancy test on the power supply under test 150. The external power supply can include an AC power supply and a DC power supply.

[0028] Specifically, when control unit 110 sends a test item execution instruction to redundancy control module 130, redundancy control module 130 is configured to, upon receiving the test item execution instruction, control the main power supply in power supply under test 150 to stop receiving power from the external power supply, thereby simulating a main power supply failure. The backup power supply in power supply under test 150 continues to receive power from the external power supply normally. Based on this, a redundancy test is performed on power supply under test 150 to verify whether the backup power supply can continue to provide power normally.

[0029] When the control unit 110 sends a test item execution instruction to the load simulation module 120, the load simulation module 120 is configured to simulate the load state corresponding to the test item execution instruction upon receiving the test item execution instruction, so as to test the power supply 150 under different load states. The load simulation module 120 may include a programmable electronic load.

[0030] When the load simulation module 120 or the redundancy control module 130 completes executing the test item execution instruction, the data acquisition module 140 will acquire the test data of the power supply to be tested, thereby completing the test of the power supply to be tested 150 .

[0031] According to an embodiment of the present application, a power supply testing device may include a control unit, a redundant control module, a load simulation module, and a data acquisition module, wherein the control unit is configured to send a test item execution instruction to the redundant control module or the load simulation module, thereby causing the redundant control module or the load simulation module to execute the test item execution instruction. Thus, by simulating different load states and main power failures, different test items can be tested on the voltage to be tested, thereby improving the test coverage of the power supply to be tested, and facilitating improving the test quality of the power supply to be tested. Furthermore, the data acquisition module is configured to collect test data of the power supply to be tested, so as to determine whether the test of the power supply to be tested has passed based on the test data, which is conducive to discovering faults in the power supply to be tested.

[0032] According to an embodiment of the present application, the redundant control module includes a solid-state relay and a pre-charging circuit; the solid-state relay is used to control the main power supply in the power supply to be tested to stop receiving power from the external power supply in response to the test item execution instruction; the pre-charging circuit is connected in series with the solid-state relay, and is used to limit the current supplied by the external power supply to the power supply to be tested when the power supply to be tested is connected to the power supply testing device.

[0033] According to an embodiment of the present application, the redundant control module may include a solid-state relay and a pre-charging circuit, and the solid-state relay and the pre-charging circuit are connected in series.

[0034] exist Figure 1In the embodiment, the power supply under test 150 is connected to the power supply testing device, and the input end of the power supply under test 150 is connected to the output end of the redundancy control module 130. The input end of the redundancy control module 130 is used to introduce an external power supply to power the power supply under test 150. Based on this, the redundancy control module 130 can be used to control whether the power supply under test can be powered.

[0035] Specifically, when the redundant control module 130 receives a test item execution instruction sent by the control unit 110, the solid-state relay in the redundant control module 130 will respond to the test item execution instruction by disconnecting the switch in the relay corresponding to the main power supply in the power supply under test 150, thereby cutting off the path for the external power supply to supply power to the main power supply in the power supply under test 150, that is, controlling the main power supply in the power supply under test to stop receiving power from the external power supply.

[0036] When the power supply under test 150 is just connected to the power supply test device, without a pre-charging circuit, the power supply under test 150 may generate excessive current due to the instantaneous charging of the capacitor, causing damage to the power supply under test or other components. Therefore, the pre-charging circuit limits the current supplied by the external power supply to the power supply under test, preventing inrush current and device damage.

[0037] According to embodiments of the present application, the use of solid-state relays in the redundant control module reduces the switching delay between the closed and open states of the solid-state relays upon receiving a test item execution instruction. The use of a precharge circuit in the redundant control module protects both the power supply under test and the power supply test device, preventing damage to components during the connection process between the power supply under test and the power supply test device.

[0038] According to an embodiment of the present application, the data acquisition module includes a signal acquisition submodule and a noise reduction submodule; the signal acquisition submodule is used to collect test data and send the test data to the noise reduction submodule; the noise reduction submodule is used to electrically isolate the test data to remove power supply noise in the test data.

[0039] According to an embodiment of the present application, when the load simulation module 120 or the redundancy control module 130 completes executing the test item execution instruction, the data acquisition module 140 can acquire test data of the power supply under test 150 .

[0040] According to an embodiment of the present application, power supply noise may exist in the test data collected directly from the output end of the power supply 150 to be tested. The power supply noise in the test data may cause signal distortion, thereby reducing the accuracy of the collected test data and causing large data fluctuations.

[0041] Based on this, the data acquisition module 140 may include a signal acquisition submodule and a noise reduction submodule, and the noise reduction submodule is arranged after the signal acquisition submodule.

[0042] In one embodiment, the input end of the signal acquisition submodule is connected to the output end of the power supply to be tested, and the output end of the signal acquisition submodule is connected to the input end of the noise reduction submodule.

[0043] According to an embodiment of the present application, the signal acquisition submodule can directly collect test data from the output of the power supply under test 150 and send the collected test data to the noise reduction submodule. The noise reduction submodule electrically isolates the test data to remove power supply noise from the test data, thereby providing cleaner output data.

[0044] The noise reduction submodule may be a magnetic isolation amplifier.

[0045] According to the embodiments of the present application, the use of the noise reduction submodule in the data acquisition module can remove the power supply noise in the test data, thereby improving the accuracy of the collected data, which is conducive to the subsequent accurate judgment of the test results of the power supply to be tested based on the test data with the power supply noise removed.

[0046] According to an embodiment of the present application, the power supply testing device also includes: an input interface module, the input end of the input interface module is connected to the external power supply, and is used to provide an electrical signal from the external power supply to the power supply to be tested; a protection circuit, the input end of the protection circuit is connected to the output end of the input interface module, and the output end of the protection circuit is connected to the input end of the redundant control module; the protection circuit is used to disconnect the connection between the input interface module and the redundant control module when an abnormality is detected in the electrical signal, so as to stop supplying power to the power supply to be tested.

[0047] Figure 2 The figure schematically shows a power supply testing device according to another embodiment of the present application.

[0048] like Figure 2 As shown, the power supply testing device may further include an input interface module 220 and a protection circuit 210 .

[0049] Specifically, the input end of the input interface module 220 is connected to the external power supply, the output end of the input interface module 220 is connected to the input end of the protection circuit 210 , and the output end of the protection circuit 210 is connected to the input end of the redundancy control module 130 .

[0050] According to an embodiment of the present application, when the power supply to be tested 150 is connected to a power supply testing device, the input interface module 220 can be used to provide an electrical signal from an external power supply to the power supply to be tested 150, that is, the electrical signal of the external power supply is supplied to the power supply to be tested 150 via the input interface module 220, the protection circuit 210 and the redundant control module 130.

[0051] According to an embodiment of the present application, when the power supply to be tested is connected to the power supply test device, the power supply to be tested is powered by an external power supply. The safe operating range of the power supply to be tested includes the maximum voltage, the maximum current, and the maximum operating temperature. Within the safe operating range, the power supply to be tested can operate normally. Once this range is exceeded, the power supply to be tested may be damaged or its performance may be degraded. Therefore, in order to protect the power supply to be tested during the process of testing the power supply to be tested, a protection circuit 210 is connected between the input interface module 220 and the redundant control module 130.

[0052] Specifically, the electrical signal of the external power supply passes through the protection circuit 210, which detects whether the electrical signal is abnormal. If the protection circuit 210 detects an abnormality in the electrical signal, it disconnects the input interface module 220 and the redundancy control module 130, and stops supplying power to the power supply under test 150.

[0053] In one embodiment, the abnormality of the electrical signal may include at least one of the following: the voltage of the electrical signal exceeds the safe operating range of the power supply under test, and the current of the electrical signal exceeds the safe operating range of the power supply under test.

[0054] Among them, the protection circuit may include an overvoltage protection circuit, an overcurrent protection circuit and an overheat protection circuit.

[0055] According to an embodiment of the present application, when the voltage of the electrical signal exceeds the safe operating range of the power supply to be tested, the overvoltage protection circuit can cut off the input of the external power supply by disconnecting the connection between the input interface module and the redundant control module, thereby stopping power supply to the power supply to be tested; when the current of the electrical signal exceeds the safe operating range of the power supply to be tested, the overcurrent protection circuit can cut off the input of the external power supply by disconnecting the connection between the input interface module and the redundant control module, thereby stopping power supply to the power supply to be tested.

[0056] Similarly, the overheat protection circuit can detect the operating temperature of the power supply under test, and when the operating temperature exceeds the safe operating range, it disconnects the input interface module from the redundant control module, cuts off the input of the external power supply, and stops supplying power to the power supply under test.

[0057] According to an embodiment of the present application, a protection circuit disposed between an external power supply and a power supply under test in a power supply testing device can detect whether the external power supply's electrical signal exceeds a safe operating range and whether the operating temperature of the power supply under test exceeds a safe operating range. If these conditions are exceeded, the circuit disconnects the input interface module from the redundant control module, thereby protecting the power supply under test and preventing damage to the power supply under test or other components by promptly cutting off the external power supply input.

[0058] According to an embodiment of the present application, the control unit and the data acquisition module are grounded via a single point.

[0059] According to an embodiment of the present application, the control unit 110 and the data acquisition module 140 in the power supply testing device are grounded via a single point to avoid ground loop interference.

[0060] According to an embodiment of the present application, the input end of the control unit is connected to the output end of the data acquisition module; the control unit is further configured to generate a test report for the power supply to be tested based on the test data from the data acquisition module.

[0061] According to an embodiment of the present application, the output of a data acquisition module in a power supply testing device can be connected to the input of a control unit to transmit test data from the data acquisition module to the control unit. The control unit can generate a test report for the power supply under test based on the test data from the data acquisition module.

[0062] Specifically, the test items to be tested on the power supply to be tested may include at least one of the following: basic performance test, dynamic response test, redundancy test, protection function test and aging test.

[0063] In one embodiment, the control unit may analyze the test data from the data acquisition module to determine the test results of each test item tested on the power supply to be tested, and generate a test report based on the test results of each test item.

[0064] The test report may include test items that failed for the power supply under test, and improvement suggestions for the power supply under test based on the test items that failed for the power supply under test.

[0065] According to an embodiment of the present application, the control unit can also generate a test report for the power supply to be tested based on the test data from the data acquisition module, so that according to the test report, it can be prompted that there are faults, life problems, etc. in the power supply to be tested, and the power supply to be tested can be improved according to the improvement suggestions, which is conducive to significantly improving the test quality and production efficiency of the product.

[0066] According to an embodiment of the present application, the redundant control module includes a first redundant control module and a second redundant control module, the load simulation module includes a first load simulation module and a second load simulation module, the data acquisition module includes a first data acquisition module and a second data acquisition module, and the power supply to be tested includes a first power supply to be tested and a second power supply to be tested; the control unit is also used to send a test item execution instruction to the first redundant control module or the first load simulation module to test the first power supply to be tested; the first data acquisition module is used to collect test data of the first power supply to be tested; the control unit is also used to send a test item execution instruction to the second redundant control module or the second load simulation module to test the second power supply to be tested; the second data acquisition submodule is used to collect test data of the second power supply to be tested.

[0067] According to an embodiment of the present application, the power supply to be tested includes a main power supply and a backup power supply, and the control unit 110 can test the two power supplies.

[0068] Figure 3 A schematic diagram of a device for testing a first power supply to be tested and a second power supply to be tested according to an embodiment of the present application is schematically shown.

[0069] Wherein, any one of the first power supply to be tested and the second power supply to be tested can be a main power supply, and the other can be a backup power supply.

[0070] like Figure 3 As shown, the control unit 110 may have two power supplies, namely a first power supply to be tested 361 and a second power supply to be tested 362 , so that the first power supply to be tested 361 and the second power supply to be tested 362 can be tested by the control unit 110 .

[0071] Specifically, the redundant control module 130 may include a first redundant control module 331 and a second redundant control module 332, the load simulation module 120 includes a first load simulation module 311 and a second load simulation module 312, the data acquisition module 140 includes a first data acquisition module 321 and a second data acquisition module 322, the power supply to be tested 150 includes a first power supply to be tested 361 and a second power supply to be tested 362, the protection circuit 210 may include a first protection circuit 341 and a second protection circuit 342, and the input interface module 220 may include a first input interface module 351 and a second input interface module 352.

[0072] Among them, the first redundant control module 331 and the second redundant control module 332 are the same, the first load simulation module 311 and the second load simulation module 312 are the same, the first data acquisition module 321 and the second data acquisition module 322 are the same, the first power supply to be tested 361 and the second power supply to be tested 362 are the same, the first protection circuit 341 and the second protection circuit 342 are the same, and the first input interface module 351 and the second input interface module 352 are the same.

[0073] Thus, one control unit 110 can test the first power supply to be tested 361 and the second power supply to be tested 362 , but the first power supply to be tested 361 and the second power supply to be tested 362 each correspond to an independent test path.

[0074] In one embodiment, for the test path of the first power supply to be tested 361, the control unit 110 is used to send a test item execution instruction to the first redundant control module 331 or the first load simulation module 311 to test the first power supply to be tested; the first data acquisition module 321 is used to collect test data of the first power supply to be tested 361.

[0075] Among them, the first input interface module 351 is used to provide an electrical signal from an external power supply to the first power supply to be tested 361; the first protection circuit 341 is used to disconnect the connection between the first input interface module 351 and the first redundant control module 331 when an abnormality is detected in the electrical signal, so as to stop supplying power to the first power supply to be tested 361.

[0076] In one embodiment, for the test path of the second power supply to be tested 362, the control unit 110 is used to send a test item execution instruction to the second redundant control module 332 or the second load simulation module 312 to test the second power supply to be tested; the second data acquisition module 322 is used to collect test data of the second power supply to be tested 362.

[0077] Among them, the second input interface module 352 is used to provide an electrical signal from an external power supply to the second power supply to be tested 362; the second protection circuit 342 is used to disconnect the second input interface module 352 and the second redundant control module 332 when an abnormality is detected in the electrical signal, so as to stop supplying power to the second power supply to be tested 362.

[0078] According to an embodiment of the present application, the control unit 110 may generate a test report for the power supply under test 150 based on the test data from the first data acquisition module 321 and the test data from the second data acquisition module 322 .

[0079] According to an embodiment of the present application, a control unit 110 in the power supply testing device issues a test item execution instruction, and the main power supply and the backup power supply in the power supply to be tested correspond to independent test paths to test the first power supply to be tested 361 and the second power supply to be tested 362 respectively, avoiding the same test path to test the first power supply to be tested 361 and the second power supply to be tested 362, thereby causing interference.

[0080] Figure 4 The figure schematically shows a power supply testing device including n testing modules according to an embodiment of the present application.

[0081] like Figure 4 As shown, the power supply test device may include n test modules, namely, test module 1 to test module n, where n is an integer greater than or equal to 2.

[0082] Each test module in the power supply test device can be specifically Figure 3 As shown in .

[0083] The power supply test device may further include an interactive interface 410 , which is used to send a test item execution request to the control unit in the test module. At the same time, the interactive interface 410 may also be used to display a generated test report.

[0084] Therefore, the power supply testing device can perform parallel testing on multiple power supplies to be tested at the same time.

[0085] In one embodiment, the sampling clocks of multiple test modules may be synchronized using PTP (Precision Time Protocol) so that the error between the modules is less than or equal to 10 μs.

[0086] According to the embodiment of the present application, PTP is used to ensure that the time of issuing requests, instructions, etc. and the time of data collection in each test module are consistent. Therefore, synchronization is carried out to control the accuracy of collection.

[0087] In addition, the power supply test device can perform parallel testing on multiple power supplies to be tested at the same time, which greatly shortens the test time and improves the test response speed.

[0088] Figure 5 The flowchart of the power supply testing method according to an embodiment of the present application is schematically shown.

[0089] like Figure 5 As shown, the power supply testing method 500 includes operations S510 to S540.

[0090] According to the embodiments of the present application, it can be applied to Figures 1 to 4 In the power supply testing apparatus shown, a power supply testing method 500 is executed.

[0091] In operation S510 , in response to a test item execution request for a power supply under test, the control unit sends a test item execution instruction to a redundancy control module or a load simulation module when detecting that the power supply under test is connected to a power supply testing device.

[0092] According to an embodiment of the present application, before connecting the power supply to be tested to the power supply testing device, the input voltage range of the external power supply is configured, such as 100V to 240V AC or 48V DC. The input voltage range is configured based on the model of the power supply to be tested.

[0093] In addition, before sending a test item execution request through the interactive interface, it is necessary to first configure the test parameters through the interactive interface. The test parameters may include redundant trigger conditions, rated load, etc., for testing various test items on the power supply under test.

[0094] According to an embodiment of the present application, various test items can be displayed in an interactive interface for selection. Once the test parameters are configured, a test item for the power supply to be tested is selected in the interactive interface, and a test item execution request for the test item is issued to the control unit. The test item execution request carries the test parameters required to execute the test item.

[0095] In operation S520 , when a test item execution instruction is received, the redundancy control module controls the main power supply in the power supply under test to stop receiving power from the external power supply.

[0096] In operation S530 , in case of receiving the test item execution instruction, the load simulation module simulates a load state corresponding to the test item execution instruction.

[0097] In operation S540 , when the load simulation module or the redundancy control module completes executing the test item execution instruction, the data acquisition module acquires test data of the power supply to be tested.

[0098] According to an embodiment of the present application, a power supply testing device may include a control unit, a redundant control module, a load simulation module, and a data acquisition module, wherein the control unit is configured to send a test item execution instruction to the redundant control module or the load simulation module, thereby causing the redundant control module or the load simulation module to execute the test item execution instruction. Thus, by simulating different load states and main power supply failures, different test items can be tested on the voltage to be tested, thereby improving the test coverage of the power supply to be tested, and facilitating improving the test quality of the power supply to be tested. Furthermore, the data acquisition module is configured to collect test data of the power supply to be tested, so as to determine whether the test of the power supply to be tested has passed based on the test data, which is conducive to discovering faults in the power supply to be tested.

[0099] According to an embodiment of the present application, the test items corresponding to the test item execution instructions include at least one of the following: basic performance test, dynamic response test, redundancy test, protection function test and aging test; simulating the load state corresponding to the test item execution instruction includes at least one of the following: simulating the static load state to perform a basic performance test on the power supply under test, wherein the static load state includes a constant current load state, a constant voltage load state and a constant power load state; simulating the dynamic load state based on a preset waveform to perform a dynamic response test on the power supply under test; simulating the overload state to perform a protection function test on the power supply under test; simulating the aging load state to perform an aging test on the power supply under test.

[0100] According to an embodiment of the present application, when the test items are basic performance tests, dynamic response tests, protection function tests and aging tests, the control unit can send the test item execution instructions to the load simulation module; when the test items are redundant tests, the control unit can send the test item execution instructions to the redundant control module.

[0101] For basic performance testing, the load simulation module can simulate the static load state based on the test items and test parameters indicated by the test item execution instruction, where the static load state can include constant current load state, constant voltage load state and constant power load state; basic performance testing can include constant current test, constant voltage test and constant power test.

[0102] In one embodiment, when the test item execution instruction indicates a constant current test and a rated load (e.g., 50A) in a basic performance test, the load simulation module simulates a constant current load state according to the rated load, wherein the test parameters include the rated load.

[0103] For dynamic response testing, the load simulation module can simulate a dynamic load state based on the test items and test parameters indicated by the test item execution instruction, wherein the dynamic load state can represent a state of dynamic load change.

[0104] Specifically, the preset waveform may include a step waveform, a sinusoidal waveform, and a pulse waveform. Thus, the dynamic response test may include a step load change test, a sinusoidal load change test, and a pulse load change test.

[0105] In one embodiment, when the test item execution instruction indicates a step load change test within a dynamic response test and includes step load change data, the load simulation module simulates a dynamic load state under a step load change based on the step load change data. For example, the test parameters may include a simulated step load change, where the simulated step load change is 20%-80%-20%.

[0106] For protection function testing, the load simulation module can simulate an overload condition based on the test items and test parameters indicated by the test item execution instruction. Overload conditions can include overvoltage, overcurrent, and overtemperature conditions, while protection function testing can include overvoltage protection testing, overcurrent protection testing, and overtemperature protection testing.

[0107] In one embodiment, when the test item execution instruction indicates an overvoltage protection test and a voltage test value in a protection function test, the load simulation module simulates an overvoltage state according to the voltage test value, wherein the test parameter may include the voltage test value.

[0108] Among them, the voltage test value can be 120%~150% of the rated voltage, and the current test value and temperature test value for overcurrent protection test and overtemperature protection test can also be 120%~150% of the rated load.

[0109] For the aging test, the load simulation module can simulate the aging load state based on the test items and test parameters indicated by the test item execution instruction.

[0110] In one embodiment, when the test item execution instruction can indicate an aging test and aging test data, the load simulation module simulates an aging load state according to the aging test data.

[0111] In one embodiment, the load simulation module can simulate the power supply under test operating continuously for eight hours in a high-temperature environment (40°C). The load simulation module can initiate the high-temperature environment simulation using an external incubator or a PTC (Positive Temperature Coefficient) heater. Test parameters can include the high-temperature environment temperature and the duration of the continuous operation.

[0112] According to an embodiment of the present application, the order of the test items for testing the power supply to be tested may be arbitrary, and the number of the test items for testing the power supply to be tested may also be arbitrary.

[0113] According to the embodiments of the present application, basic performance tests, dynamic response tests, redundancy tests, protection function tests and aging tests of the power supply to be tested are introduced, so that the real-time working conditions of the power supply to be tested can be fully simulated to detect the power supply to be tested under different load states, thereby achieving a comprehensive improvement in test coverage.

[0114] According to an embodiment of the present application, the data acquisition module also includes an isolated current probe; test data of the power supply to be tested is collected, including at least one of the following: for basic performance testing, the output voltage, ripple voltage and output current of the power supply to be tested are collected; for dynamic response testing, the voltage recovery time and peak voltage of the power supply to be tested are collected; for protection function testing, the response time of the power supply to be tested to execute protection measures is collected; for aging testing, the ambient temperature of the power supply to be tested, the output voltage of the power supply to be tested and the output current of the power supply to be tested are collected; for redundancy testing, the isolated current probe is controlled to collect the current waveform of the power supply to be tested during a preset time period.

[0115] The middle moment in the preset time period represents the moment when the main power supply in the power supply to be tested stops receiving power from the external power supply.

[0116] For basic performance testing, taking constant current testing as an example, the data acquisition module can collect the output voltage, ripple voltage and output current of the power supply under test at a sampling rate of 1kHz.

[0117] The control unit can calculate the conversion efficiency based on the output voltage and output current, and analyze the ripple voltage through FFT (Fast Fourier Transform).

[0118] conversion efficiency It can be calculated by the following formula (1).

[0119] (1);

[0120] in, It can indicate the output power of the power supply under test, which is calculated based on the output voltage and output current; It can indicate the input power of the power supply under test, and the input power can be calculated based on the external power supply.

[0121] In one embodiment, when the control unit analyzes that the conversion efficiency is greater than or equal to 90% and the ripple is less than or equal to 2%, it can be determined that the constant current test of the power supply to be tested has passed.

[0122] The ripple being less than or equal to 2% means that the maximum amplitude of the ripple voltage cannot exceed 2% of the DC output voltage.

[0123] For dynamic response testing, taking the step load change test as an example, the data acquisition module collects the voltage recovery time of the power supply under test. For example, the voltage recovery time can be the time from the output voltage dropping to 20% and recovering to 80% within the range of ±2%.

[0124] In the step load change test, the control unit can also calculate the overshoot. It can be calculated by the following formula (2).

[0125] (2);

[0126] in, It can represent the steady-state output voltage value of the power supply under test. It can indicate the highest value reached by the output voltage of the power supply under test during the step load change test.

[0127] The control unit can measure the stability and response of the power supply under test according to the voltage recovery time and overshoot, and determine whether the step load change test of the power supply under test is passed.

[0128] In one embodiment, when the voltage recovery time is less than or equal to 50 ms and the overshoot is less than a preset threshold, it can be determined that the step load change test of the power supply to be tested has passed.

[0129] For protection function testing, the data acquisition module can collect the response time of the power supply under test executing protective measures. The response time represents the interval from triggering a protective measure to actually executing it when the power supply under test detects that a protective condition has been met. Protection conditions include overcurrent, overvoltage, and overtemperature.

[0130] The control unit can determine whether the power supply under test has passed the protection function test based on the protection action threshold and response time. The protection action threshold can indicate that the power supply under test can initiate a protection action if any of the voltage, current, and temperature reaches the corresponding protection action threshold. Therefore, based on the protection action threshold, the control unit can determine whether the power supply under test initiates a protection action if the protection action threshold is reached.

[0131] For aging tests, the data acquisition module can collect the output voltage, output current and ambient temperature of the power supply under test before and after the aging test is performed.

[0132] The control unit may calculate the efficiency attenuation rate based on the output voltage and the output current, and calculate the temperature drift rate based on the ambient temperature.

[0133] Efficiency decay rate It can be calculated by the following formula (3).

[0134] (3);

[0135] in, It can indicate the conversion efficiency of the power supply under test before the aging test begins. It can represent the conversion efficiency of the power supply under test after the aging test is completed, and t can represent the execution time of the aging test, such as 8 hours.

[0136] in, It can be calculated based on the above formula (1) according to the output voltage and output current of the power supply under test before the aging test; It can be calculated based on the above formula (1) according to the output voltage and output current of the power supply under test after the aging test.

[0137] Temperature drift rate It can be calculated by the following formula (4).

[0138] (4);

[0139] in, It can indicate the maximum temperature of the power supply under test during aging test; It can represent the ambient temperature of the power supply under test before the aging test. The ambient temperature collected by the data acquisition module can include the maximum temperature and the ambient temperature of the power supply under test before the aging test.

[0140] The control unit can determine whether the power supply to be tested passes the aging test based on the efficiency attenuation rate and the temperature drift rate.

[0141] For redundancy testing, the data acquisition module can collect the output voltage drop waveform when the main power supply is disconnected in the relay switch to verify whether the time from cutting off the main power input to the backup voltage supporting normal operation is less than or equal to 15ms, and whether there is any power interruption.

[0142] The isolated current probe in the data acquisition module can also collect the current waveform of the power supply under test during a preset period of time. For example, the current waveforms of the main power supply and the backup power supply are collected 10ms before and after the switches in the relays corresponding to the main power supply are disconnected.

[0143] The bandwidth of the isolated current probe can be greater than or equal to 20 MHz, and the sampling rate is set to 10 MS / s (10 MegaSamples per second).

[0144] The isolated current probe can also collect the current waveforms of the main power supply and backup voltage at the moment when the switch in the relay corresponding to the main power supply is disconnected based on the trigger condition.

[0145] The trigger condition may be characterized by a rising edge trigger of a main power disconnection signal, ensuring that the disconnection moment and the moment of collecting the current waveform are aligned with an accuracy of less than or equal to 1 μs.

[0146] The control unit can perform instantaneous power outage and oscillation analysis based on the current waveforms of the main power supply and backup power supply.

[0147] In one embodiment, based on the main power current waveform, it is determined that when the relay switch is disconnected, the current drops below 10% of the rated value and lasts for more than 100 μs. Based on this, a momentary power outage abnormality can be determined.

[0148] The rated value may be preset.

[0149] In one embodiment, FFT transformation is performed on the current waveforms of the main power supply and the backup power supply, and if the average value of the oscillation energy is greater than 5% of the rated value, it can be determined as oscillation. The rated value is also preset.

[0150] Oscillation energy ( ) can be calculated by the following formula (5).

[0151] (5);

[0152] in, , It can represent the amplitude corresponding to frequency k after FFT transformation, and the value of k is .

[0153] The average value of the oscillation energy is calculated based on the oscillation energy and ~ The frequency range is calculated.

[0154] The control unit can determine whether the power supply to be tested passes the redundancy test according to whether there is a momentary power outage and whether there is oscillation.

[0155] In one embodiment, the output voltage drop monitoring of the power supply under test in the redundancy test may also be processed in hard real time using an FPGA (Field-Programmable Gate Array), so that the response time is less than 1 μs.

[0156] According to an embodiment of the present application, the data acquisition module collects different data for different test items, so that the control unit analyzes the test items of the power supply to be tested based on the test data from the data acquisition module, and determines whether the power supply to be tested passes the test items, which is conducive to discovering fault problems in the power supply to be tested.

[0157] Based on the above, the control unit is further configured to generate a test report for the power supply under test based on the test data from the data acquisition module, wherein the test data from the data acquisition module is time-series.

[0158] When the test of the power supply to be tested is completed, the power supply to be tested may be labeled and stored in the database according to the production batch and production date, and the test data of the power supply to be tested will also be stored accordingly.

[0159] The control unit can also be used to compare batch consistency of power supplies of the same model to be tested.

[0160] Specifically, as different power supplies to be tested are tested, relevant data of the power supplies to be tested are updated in the database, so that more and more samples are included in the database.

[0161] For the power supplies to be tested of batch A and batch B of the same model in the database, after the power supplies to be tested belonging to batch B are tested and updated in the database, similarity calculation can be performed on the power supplies to be tested of batch A and batch B already in the database.

[0162] The similarity calculation can be achieved by the following formula (6).

[0163] (6);

[0164] Where n is the number of power supplies to be tested selected from different batches. Can indicate the A power supply under test, and The test data of the power supplies to be tested in different batches, such as conversion efficiency, ripple voltage, etc.

[0165] In one embodiment, when the similarity is less than a threshold, the updated batch can be determined to be an abnormal batch. The threshold can be set as needed, such as 0.85.

[0166] For multiple power supplies under test in an abnormal batch, capacitance value distribution statistics and MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) on-resistance box plot analysis are performed to identify the abnormal power supplies under test in the abnormal batch.

[0167] In one embodiment, for the statistical analysis of capacitance values, if the capacitance value of the power supply to be tested is outside the range of ±3σ of the capacitance mean, it is considered abnormal, and the power supply to be tested with abnormal capacitance can be determined; for the box plot analysis of the MOSFET on-resistance, if the on-resistance of the power supply to be tested exceeds the quartile ±1.5IQR (Interquartile Range) as an outlier, it can be determined that the power supply to be tested has abnormal resistance.

[0168] Among them, the parameters σ and IQR are set as needed.

[0169] According to an embodiment of the present application, the control unit can input the test data from the data acquisition module into the trained model to obtain the output result of the model.

[0170] Among them, the trained models may include life prediction models, fault identification models, potential fault prediction models, efficiency attenuation models, etc., thereby, the data of the corresponding model in the test data can be input into the corresponding module.

[0171] For the life prediction model, the life prediction model may predict the remaining useful life based on regression. For example, the life prediction model may be XGBoost (eXtreme Gradient Boosting, extreme gradient boosting tree).

[0172] The life prediction module's input data can include time series data such as temperature drift rate, efficiency decay rate, and ripple voltage change rate. Environmental parameters can include burn-in test duration and ambient temperature. Based on this, the life prediction model can output a predicted remaining lifespan of the power supply under test, expressed in hours.

[0173] For the fault identification model, the fault identification model can perform anomaly detection based on time series classification. For example, the fault identification model can be an LSTM (Long Short-Term Memory) network.

[0174] The input data for the fault identification model can include voltage / current waveforms during dynamic response testing and instantaneous current drop waveforms during redundancy testing. Based on this, the fault identification model can be used to classify output fault types, such as MOSFET breakdown and capacitor capacitance degradation.

[0175] For the potential fault prediction model, the fault prediction model may perform anomaly detection based on unsupervised learning. For example, the potential fault prediction model may be an isolation forest.

[0176] The input data for the potential fault prediction model can include the standard deviation of ripple voltage, switching delay jitter, and the distribution of test data for the same model of power supply under test, including the mean, variance, and skewness. Based on this, the potential fault prediction model can output an anomaly score and identify the power supply under test with potential defects.

[0177] For the efficiency decay model, the efficiency decay model can be subjected to degradation analysis based on multivariate regression. For example, the efficiency decay model can be Support Vector Regression (SVR).

[0178] The efficiency decay model's independent variable inputs can include operating time, load factor, ambient temperature, and input voltage fluctuation, while the dependent variable input can include conversion efficiency. Based on this, the efficiency decay model can be used to output an efficiency decay curve fit and confidence interval, thereby guiding the optimization of the heat dissipation design of the power supply under test.

[0179] Based on the above content, an intelligent testing paradigm for life prediction, fault identification, and optimization guidance has been established for the power supply under test through various models. It is suitable for scenarios with high reliability requirements such as cloud computing centers and edge servers, and promotes the transformation of power supply testing from "passive detection" to "active health management."

[0180] Therefore, the test report may include the test items that the power supply under test failed, improvement suggestions for the power supply under test, fault types and potential defects in the power supply under test, etc.

[0181] In one embodiment, during burn-in testing of a power supply under test, transfer efficiency linearly decayed from 92% to 88%, and the temperature drift rate was 0.4°C / h. These data can be input into a lifespan prediction model to output a remaining lifespan of 650 hours. Based on this lifespan prediction, a replacement recommendation can be issued 200 hours in advance for the power supply under test, thus avoiding unexpected data center downtime.

[0182] In one example, the conversion efficiency of a batch of tested power supplies had a discrete distribution (88% to 92%), with a consistency score of 0.72. SHAP (SHapley Additive exPlanations) analysis showed that load factor fluctuations contributed 58% of the total efficiency, which was traced back to batch-specific delay variations in the PWM (Pulse Width Modulation) controllers within a batch. Therefore, the recommended approach for the tested power supplies was to adjust the driver circuit RC constants to reduce the efficiency dispersion to 90±0.5% for the new batch.

[0183] Based on the above content, it can be seen that the power supply testing device and method of the present application introduce dynamic response testing and aging testing to more comprehensively simulate the actual working conditions of the power supply to be tested, thereby improving the test coverage; adopt multimodal machine learning technology, combined with life prediction model, fault identification model, and potential fault prediction model, to enhance the in-depth analysis and defect identification capabilities of test data; adopt multi-test module parallel testing and FPGA accelerated acquisition technology to improve the response speed and significantly shorten the test time; through SHAP feature contribution quantification and root cause tracing technology, the transparency and interpretability of the model are improved; solid-state relays are used in combination with pre-charging circuits to reduce switching delays and improve system reliability.

[0184] Those skilled in the art will appreciate that the features described in the various embodiments of this application may be combined and / or coupled in various ways, even if such combinations or couplings are not explicitly described in this application. In particular, the features described in the various embodiments of this application may be combined and / or coupled in various ways without departing from the spirit and teachings of this application. All such combinations and / or couplings fall within the scope of this application.

[0185] The embodiments of the present application have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present application. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be advantageously used in combination. Without departing from the scope of the present application, those skilled in the art may make various substitutions and modifications, and these substitutions and modifications should all fall within the scope of the present application.

Claims

1. A power supply testing device, characterized in that: The device comprises: a control unit, wherein an output end of the control unit is connected to an input end of the redundant control module and an input end of the load simulation module, and is configured to send a test item execution instruction to the redundant control module or the load simulation module in response to a test item execution request for the power supply to be tested, when detecting that the power supply to be tested is connected to the power supply testing device; The redundancy control module is configured to control the main power supply in the power supply to be tested to stop receiving power from the external power supply when receiving the test item execution instruction; The load simulation module is configured to simulate a load state corresponding to the test item execution instruction when the test item execution instruction is received; The data acquisition module is used to acquire the test data of the power supply to be tested when the load simulation module or the redundant control module completes executing the test item execution instruction.

2. The device according to claim 1, characterized in that The redundant control module includes a solid-state relay and a pre-charging circuit; the solid-state relay is used to control the main power supply in the power supply under test to stop receiving power from the external power supply in response to the test item execution instruction; the pre-charging circuit is connected in series with the solid-state relay, and is used to limit the current supplied by the external power supply to the power supply under test when the power supply under test is connected to the power supply testing device.

3. The device according to claim 1, characterized in that The data acquisition module includes a signal acquisition submodule and a noise reduction submodule; The signal acquisition submodule is used to collect the test data and send the test data to the noise reduction submodule; The noise reduction submodule is used to electrically isolate the test data to remove power supply noise in the test data.

4. The device according to claim 1, characterized in that The device further comprises: An input interface module, wherein an input end of the input interface module is connected to an external power supply and is used to provide an electrical signal from the external power supply to the power supply under test; A protection circuit, wherein the input end of the protection circuit is connected to the output end of the input interface module, and the output end of the protection circuit is connected to the input end of the redundant control module; the protection circuit is used to disconnect the input interface module and the redundant control module when an abnormality is detected in the electrical signal, so as to stop supplying power to the power supply under test.

5. The device according to claim 1, characterized in that The control unit and the data acquisition module are grounded via a single point.

6. The device according to any one of claims 1 to 5, characterized in that The input end of the control unit is connected to the output end of the data acquisition module; the control unit is further used to generate a test report for the power supply to be tested based on the test data from the data acquisition module.

7. The device according to any one of claims 1 to 5, characterized in that The redundant control module includes a first redundant control module and a second redundant control module, the load simulation module includes a first load simulation module and a second load simulation module, the data acquisition module includes a first data acquisition module and a second data acquisition module, and the power supply to be tested includes a first power supply to be tested and a second power supply to be tested; The control unit is further configured to send a test item execution instruction to the first redundant control module or the first load simulation module to test the first power supply to be tested; The first data acquisition module is used to collect test data of the first power supply to be tested; The control unit is further configured to send a test item execution instruction to the second redundant control module or the second load simulation module to test the second power supply to be tested; The second data acquisition submodule is used to acquire test data of the second power supply to be tested.

8. A power supply testing method, characterized in that: Applicable to a power supply testing device according to any one of claims 1 to 7; the method comprising: In response to a test item execution request for the power supply to be tested, the control unit sends a test item execution instruction to the redundancy control module or the load simulation module when detecting that the power supply to be tested is connected to the power supply testing device; When receiving the test item execution instruction, the redundancy control module controls the main power supply in the power supply to be tested to stop receiving power from the external power supply; When receiving the test item execution instruction, the load simulation module simulates the load state corresponding to the test item execution instruction; When the load simulation module or the redundant control module completes executing the test item execution instruction, the data acquisition module acquires the test data of the power supply to be tested.

9. The method according to claim 8, characterized in that The test items corresponding to the test item execution instructions include at least one of the following: basic performance test, dynamic response test, redundancy test, protection function test and aging test; The simulation of the load state corresponding to the test item execution instruction includes at least one of the following: Simulating a static load state to perform the basic performance test on the power supply to be tested, wherein the static load state includes a constant current load state, a constant voltage load state, and a constant power load state; Simulating a dynamic load state based on a preset waveform to perform the dynamic response test on the power supply to be tested; Simulating an overload state to perform the protection function test on the power supply to be tested; An aging load state is simulated to perform the aging test on the power supply to be tested.

10. The method according to claim 9, characterized in that The data acquisition module further includes an isolated current probe; and the acquisition of test data of the power supply to be tested includes at least one of the following: For the basic performance test, collecting the output voltage, ripple voltage and output current of the power supply under test; For the dynamic response test, collecting the voltage recovery time and peak voltage of the power supply under test; For the protection function test, collecting the response time of the power supply under test executing the protection measures; For the aging test, collecting the ambient temperature of the power supply to be tested, the output voltage of the power supply to be tested, and the output current of the power supply to be tested; For the redundancy test, the isolated current probe is controlled to collect the current waveform of the power supply under test during a preset period, wherein the middle moment within the preset period represents the moment when the main power supply in the power supply under test stops receiving power from the external power supply.

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