Test equipment and test system

Abstract

The invention relates to the technical field of system storage, and discloses a test device and a test system.The test device comprises a channel switching module, a main control module and at least two test modules, and the test scenes of the test modules are different; the main control module is used for determining a test scene of the to-be-tested solid state disk according to a test instruction when the test instruction is received; the main control module is also used for determining a test module which needs to test the to-be-tested solid state disk according to the test scene and outputting a channel switching signal corresponding to the test module to the channel switching module; the channel switching module is used for establishing connection between the test module and the solid state disk to be tested according to the channel switching signal; and the test module is used for performing a power failure test on the to-be-tested solid state disk when the test module is connected with the to-be-tested solid state disk. Compared with the prior art that only one test device can simulate the power-down test in one test scene, the test process can be simplified, and the user experience is improved.

Description

Technical Field

[0001] The present application relates to the field of system storage technology, and in particular to a test device and a test system. Background Art

[0002] At present, Solid-State Drive (SSD) is a key device for data storage. In today's digital age, its performance, reliability and compatibility have attracted much attention.

[0003] However, when performing power-off tests on solid-state drives using existing test equipment, one test device can generally only simulate a power-off test corresponding to one test scenario (for example, simulating a synchronous power-off test scenario or an asynchronous power-off test scenario). In order to perform a comprehensive power-off test, the user needs to switch between different test devices, which makes the test process cumbersome. Summary of the Invention

[0004] The main purpose of this application is to provide a test device and a test system, aiming to solve the technical problem that an existing test device can only simulate a power-off test corresponding to one test scenario, resulting in a cumbersome test process.

[0005] To achieve the above object, the present application provides a testing device, comprising: a channel switching module, a main control module, and at least two testing modules, each of which has a different testing scenario;

[0006] The main control module is connected to the channel switching module and each of the test modules respectively, and the channel switching module is also connected to the solid-state drive to be tested and each of the test modules;

[0007] The main control module is configured to determine a test scenario for the solid-state drive to be tested according to a test instruction upon receiving the test instruction;

[0008] The main control module is further configured to determine a test module that needs to be used to test the solid-state drive to be tested according to the test scenario, and output a channel switching signal corresponding to the test module to the channel switching module;

[0009] The channel switching module is configured to establish a connection between the test module and the solid-state drive to be tested according to the channel switching signal;

[0010] The testing module is configured to perform a power-off test on the solid-state hard disk to be tested when establishing a connection with the solid-state hard disk to be tested.

[0011] In one embodiment, the testing module includes: a voltage drop module;

[0012] The voltage drop module is connected to the main control module and the channel switching module;

[0013] The voltage drop module is configured to drop the received first supply voltage and the received second supply voltage when establishing a connection with the solid-state drive to be tested, and transmit the dropped first supply voltage and the dropped second supply voltage to the solid-state drive to be tested for a power failure test;

[0014] The drop includes synchronous drop and asynchronous drop.

[0015] In one embodiment, when the drop is the asynchronous drop, the voltage drop module is further configured to asynchronously drop the first supply voltage and the second supply voltage according to a preset asymmetric power-off strategy;

[0016] The preset asymmetric power-off strategy includes at least one of the following:

[0017] In the absence of power ripple interference, controlling the first supply voltage and the second supply voltage to drop asynchronously according to a first preset time difference;

[0018] Controlling the first supply voltage and the second supply voltage to drop asynchronously according to a second preset time difference in the presence of the power ripple interference;

[0019] In the absence of the power ripple interference, the first supply voltage and the second supply voltage are controlled to drop asynchronously according to a random time difference.

[0020] In one embodiment, the test module further includes: a capacitor bank module;

[0021] The capacitor bank module is connected to the main control module and the channel switching module;

[0022] The main control module is further configured to control the channel switching module to establish a connection between the capacitor bank module and the solid-state drive to be tested when the voltage drop module drops the first supply voltage and the second supply voltage;

[0023] The capacitor group module is used to supply power to the solid state drive to be tested when establishing a connection with the solid state drive to be tested, so that the solid state drive to be tested performs a power failure test.

[0024] In one embodiment, the test module further includes: a capacitor aging module;

[0025] The capacitor aging module is connected to the main control module and the capacitor group module respectively;

[0026] The capacitor aging module is configured to charge and discharge the capacitor group module when the main control module receives the aging test instruction, so as to simulate aging of the capacitor group module.

[0027] In one embodiment, the capacitor group module includes: a first capacitor group unit and a second capacitor group unit;

[0028] The first capacitor group unit and the second capacitor group unit are both connected to the main control module, the capacitor aging module and the channel switching module;

[0029] The main control module is further configured to control the first capacitor group unit and the second capacitor group unit to supply power to the solid-state hard disk to be tested according to a preset switching strategy;

[0030] The preset switching strategy includes at least one of the following:

[0031] Randomly adjusting the discharge voltage difference between the first capacitor group unit and the second capacitor group unit before switching;

[0032] Randomly delay switching is performed on the first capacitor group unit and the second capacitor group unit.

[0033] In one embodiment, the testing module further comprises: a monitoring module;

[0034] The monitoring module is connected to the capacitor bank module, the main control module and the capacitor aging module;

[0035] The monitoring module is used to collect the current temperature and current voltage of the capacitor group module when the capacitor group module is charging and discharging, determine the current aging degree of the capacitor group module according to the current temperature and the current voltage, and adjust the charging and discharging of the capacitor group module through the capacitor aging module based on the current aging degree.

[0036] In one embodiment, the test module further includes: a load simulation module;

[0037] The load simulation module is connected to the main control module and the channel switching module;

[0038] The load simulation module is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request;

[0039] The voltage drop module is further configured to transmit the first supply voltage after the drop and the second supply voltage after the drop to the solid-state hard disk to be tested that processes the queue request for performing a load power-off test.

[0040] In one embodiment, the load simulation module includes: a dynamic load unit and a protocol interaction unit;

[0041] The dynamic load unit is connected to the main control module and the channel switching module respectively, and the protocol interaction unit is connected to the main control module and the channel switching module respectively;

[0042] The protocol interaction unit is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request;

[0043] The dynamic load unit is used to adjust the power supply current received by the solid state drive to be tested when establishing a connection with the solid state drive to be tested, and transmit the adjusted power supply current to the solid state drive to be tested for load power-off testing.

[0044] In one embodiment, the protocol interaction unit is further configured to monitor the operating status of the solid-state drive to be tested during the power-off test, and transmit the monitoring result to the main control module for display.

[0045] In one embodiment, the test module further includes: a wide voltage input module and a multi-channel output module;

[0046] The multi-channel output module is connected to the wide voltage input module and the voltage drop module respectively, and the wide voltage input module is also connected to an external power supply;

[0047] The wide voltage input module is used to transmit the external voltage provided by the external power supply to the multi-channel output module;

[0048] The multi-channel output module is configured to convert the external voltage into a first supply voltage and a second supply voltage, and transmit the first supply voltage and the second supply voltage to the voltage drop module.

[0049] In addition, to achieve the above objectives, the present application also provides a testing system, wherein the device includes the testing equipment as described above.

[0050] The present application provides a test device and a test system, which includes: a channel switching module, a main control module and at least two test modules, and the test scenarios of each test module are different; the main control module is respectively connected to the channel switching module and each test module, and the channel switching module is also connected to the solid-state hard disk to be tested and each test module; the main control module is used to determine the test scenario of the solid-state hard disk to be tested according to the test instruction when receiving the test instruction; the main control module is also used to determine the test module that needs to be tested on the solid-state hard disk to be tested according to the test scenario, and output the channel switching signal corresponding to the test module to the channel switching module; the channel switching module is used to establish a connection between the test module and the solid-state hard disk to be tested according to the channel switching signal; the test module is used to perform a power-off test on the solid-state hard disk to be tested when establishing a connection with the solid-state hard disk to be tested.

[0051] Since the test equipment of the present application may be provided with a channel switching module, a main control module and test modules corresponding to different test scenarios. When conducting a test, after receiving the test instruction, the main control module may determine the test scenario according to the test instruction, and then select the corresponding test module according to the test scenario, and output the channel switching signal corresponding to the test module to the channel switching module. After receiving the channel switching signal, the channel switching module establishes a connection between the test module and the solid-state drive to be tested. When the test module establishes a connection with the solid-state drive to be tested, it may perform a power-off test on the solid-state drive to be tested. Compared to an existing test equipment that can only simulate a power-off test under one test scenario, the present application may set test modules for different test scenarios in the test equipment, and establish a connection between the test module and the solid-state drive to be tested through the channel switching module to perform a power-off test corresponding to the test scenario, thereby simplifying the test process and improving the user experience. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0053] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0054] Figure 1 This is a schematic structural diagram of the first embodiment of the testing device of this application;

[0055] Figure 2 This is a schematic structural diagram of the second embodiment of the testing device of this application;

[0056] Figure 3 This is a structural diagram of the third embodiment of the testing equipment of this application.

[0057] The realization of the objectives, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0058] It should be understood that the specific embodiments described herein are merely used to explain the technical solutions of the present application and are not intended to limit the present application.

[0059] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0060] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0061] In addition, the descriptions of "first", "second", etc. in this application are for descriptive purposes only and should not be understood as indicating or implying their relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined as "first" or "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0062] It is understandable that at present, as a key device for data storage, the performance, reliability and compatibility of solid-state drives (SSDs) have attracted much attention in today's digital age.

[0063] However, when performing power-off tests on solid-state drives using existing test equipment, one test device can generally only simulate a power-off test corresponding to one test scenario (for example, simulating a synchronous power-off test scenario or an asynchronous power-off test scenario). In order to perform a comprehensive power-off test, the user needs to switch between different test devices, which makes the test process cumbersome.

[0064] Therefore, in order to solve the above-mentioned defects, the present embodiment provides a test device, because the test device of the present embodiment can be provided with a channel switching module, a main control module and test modules corresponding to different test scenarios. When conducting a test, after receiving the test instruction, the main control module can determine the test scenario according to the test instruction, and then select the corresponding test module according to the test scenario, and output the channel switching signal corresponding to the test module to the channel switching module. After receiving the channel switching signal, the channel switching module establishes a connection between the test module and the solid-state hard disk to be tested. When the test module establishes a connection with the solid-state hard disk to be tested, it can perform a power-off test on the solid-state hard disk to be tested. Compared with the existing test device that can only simulate a power-off test under one test scenario, the present embodiment can set test modules for different test scenarios in the test device, and establish a connection between the test module and the solid-state hard disk to be tested through the channel switching module to perform a power-off test corresponding to the test scenario, which simplifies the test process and improves the user experience.

[0065] For ease of understanding, the following Figures 1 to 3 The test equipment provided in the embodiments of the present application is introduced in detail.

[0066] Reference Figure 1 , Figure 1 This is a structural diagram of the first embodiment of the test device of this application. The first embodiment of the test device of this application is proposed. Figure 1 As shown, in this embodiment, the test device includes: a channel switching module, a main control module and at least two test modules, and each of the test modules has a different test scenario;

[0067] The main control module is connected to the channel switching module and each of the test modules respectively. The channel switching module is also connected to the solid state drive to be tested and each of the test modules.

[0068] It should be noted that the test device described above in this embodiment can be used in a scenario of testing a solid-state drive, and of course can also be used in scenarios of testing other devices, and this embodiment does not limit this. This embodiment uses the scenario of performing a power-off test on a solid-state drive for illustration.

[0069] It should also be noted that in this embodiment, the number of the above test modules can be set according to the test scenario requirements, that is, if the test scenario requires a corresponding power-off test, the corresponding test module can be set. Figure 1 As shown, this embodiment uses three test modules (i.e. Figure 1 The invention is described with reference to test module 1, test module 2 and test module 3, but is not limited thereto.

[0070] It is understood that the channel switching module in this embodiment can be a module with multiple channels, such as a channel selector, and this embodiment is not limited to this. In this embodiment, the main control module can control the channel switching module to connect the corresponding channels, thereby establishing a connection between the test module required for the test scenario and the solid-state drive under test.

[0071] The main control module is configured to determine a test scenario for the solid-state drive to be tested according to a test instruction upon receiving the test instruction;

[0072] The main control module is further configured to determine a test module that needs to be used to test the solid-state drive to be tested according to the test scenario, and output a channel switching signal corresponding to the test module to the channel switching module;

[0073] The channel switching module is configured to establish a connection between the test module and the solid-state drive to be tested according to the channel switching signal;

[0074] The testing module is configured to perform a power-off test on the solid-state hard disk to be tested when establishing a connection with the solid-state hard disk to be tested.

[0075] It should be understood that the test instructions may be user-input instructions for performing corresponding test items on the SSD under test. The test items may correspond to test scenarios, and the test instructions may be followed by test parameters for setting the test module to perform related operations. The specific test parameters may be set according to the test scenario, and this embodiment does not limit this. For example, if a power-off test is currently required, the current test scenario may be a power-off test scenario, and the test instructions may be instructions for performing the power-off test.

[0076] The above-mentioned main control module can be any module with data processing and program execution functions, such as a microprocessor, etc., and considering that in order to achieve synchronous control of multiple modules under different test scenarios, the above-mentioned main control module in this embodiment can also be provided with a high-speed clock chip and a synchronization circuit to ensure that the signals output to each module are synchronized, thereby ensuring the synchronization of the operations of each module. At the same time, the above-mentioned main control module in this embodiment can be connected to other modules through a serial peripheral interface (SPI) and a general purpose input / output (GPIO) interface. Of course, it can also be connected through other interfaces, and this embodiment does not limit this.

[0077] To control the test module to execute the test corresponding to the test scenario, in this embodiment, after receiving the test instruction, the main control module can generate a test signal corresponding to the test module based on the test instruction and transmit it to the test module. The test signal can be a signal that causes the test module to execute the corresponding test. The channel switching signal can be a signal that connects the test module to the solid-state drive under test.

[0078] In actual use, the user can output the test instructions corresponding to the current test scenario to the main control module. After obtaining the test instructions, the main control module can determine the corresponding test scenario according to the test instructions, and then determine the test module required to complete the current test project based on the test scenario, and generate the corresponding test signal according to the test instruction, and generate the corresponding channel switching signal to the channel switching module according to the test module.

[0079] Upon receiving a channel switching signal, the channel switching module can connect the channel between the test module and the SSD under test, establishing a connection between the test module and the SSD under test. The main control module can then transmit the test signal to the test module. Once the connection with the SSD under test is established, the test module can begin executing the corresponding test items based on the test signal to perform a power-off test on the SSD under test. Therefore, this embodiment allows test modules for different test scenarios to be set up in the test device, and the channel switching module is used to establish a connection between the test module and the SSD under test to perform the power-off test corresponding to the test scenario, simplifying the testing process and improving the user experience.

[0080] Reference Figure 2 , Figure 2 This is a structural diagram of the second embodiment of the testing device of the present application. Based on the above-mentioned first embodiment, the second embodiment of the testing device of the present application is proposed.

[0081] Considering that when performing power-off test, it is generally necessary to perform standard power-off test (i.e. the above synchronous power-off) and asymmetric power-off test (i.e. the above asynchronous power-off), so Figure 2 As shown, in this embodiment, the above-mentioned test module includes: a voltage drop module;

[0082] The voltage drop module is connected to the main control module and the channel switching module;

[0083] The voltage drop module is configured to drop the received first supply voltage and the received second supply voltage when establishing a connection with the solid-state drive to be tested, and transmit the dropped first supply voltage and the dropped second supply voltage to the solid-state drive to be tested for a power failure test;

[0084] The drop includes synchronous drop and asynchronous drop.

[0085] It should be noted that the voltage drop module can be a module that controls voltage drop, specifically a module that controls the voltage drop slope, which can be set within a range of 0.1 to 10V / µs to simulate different power-off conditions. The voltage drop module can be composed of any component capable of controlling voltage drop, such as a high-speed switching transistor, and this embodiment is not limited to this.

[0086] It should also be noted that to cause the voltage drop module to perform a voltage drop, in this embodiment, the user can input a test instruction corresponding to a power-down test (referred to as a drop test instruction) into the main control module. Based on the drop test instruction, the main control module determines the test scenario requiring the power-down test and the voltage drop module to be tested. The main control module then generates a corresponding drop test signal and simultaneously outputs a channel switching signal corresponding to the voltage drop module to the channel switching module.

[0087] The drop test signal may be a signal corresponding to a voltage drop and power failure test. The first supply voltage and the second supply voltage may be voltages used to simulate a voltage drop. The voltage values of the first supply voltage and the second supply voltage may be set according to actual conditions. In this embodiment, the first supply voltage is 12V and the second supply voltage is 5V. That is, during a drop, the first supply voltage may drop from 12V to 0V, and the second supply voltage may drop from 5V to 0V.

[0088] It is understood that upon receiving the channel switching signal, the channel switching module establishes a connection between the voltage drop module and the SSD under test. The main control module can then transmit the drop test signal to the voltage drop module. The voltage drop module can then perform a voltage drop on the first and second supply voltages based on the drop test signal, and transmit the dropped first and second supply voltages to the SSD under test via the channel switching module.

[0089] In actual use, since power-down tests generally include standard power-down tests and asymmetric power-down tests, the power-down tests in this embodiment include synchronous power-down tests and asynchronous power-down tests. Test instructions may include synchronous power-down tests and asynchronous power-down tests. Power-down test signals may include synchronous power-down tests and asynchronous power-down tests. The synchronous power-down test may involve simultaneous power-down tests on the first and second supply voltages, while the asynchronous power-down test may involve non-simultaneous power-down tests on the first and second supply voltages.

[0090] When the current test scenario is a standard power-off test scenario, the user can input a synchronous drop instruction to the main control module. The main control module can select the voltage drop module according to the synchronous drop instruction, generate a synchronous drop signal to control the voltage drop module to perform a standard power-off test, and output a corresponding channel switching signal to the channel switching module. The channel switching module can establish a connection between the voltage drop module and the solid-state drive under test. At the same time, the main control module can transmit the synchronous drop signal to the voltage drop module. After receiving the synchronous drop signal, the voltage drop module can synchronously drop the first supply voltage and the second supply voltage, and transmit the first supply voltage after the synchronous drop and the second supply voltage after the synchronous drop to the solid-state drive under test through the power supply channel, thereby completing the standard power-off test of the solid-state drive under test.

[0091] When the current test scenario is an asymmetric power failure, the user can input an asynchronous drop instruction to the main control module. The main control module can select the voltage drop module according to the asynchronous drop instruction, generate an asynchronous drop signal to control the voltage drop module to perform an asymmetric power failure test, and output a corresponding channel switching signal to the channel switching module. The channel switching module can establish a connection between the voltage drop module and the solid-state drive to be tested. At the same time, the main control module can transmit the asynchronous drop signal to the voltage drop module. After receiving the asynchronous drop signal, the voltage drop module can asynchronously drop the first supply voltage and the second supply voltage. The first supply voltage can drop earlier than the second supply voltage, etc., and the first supply voltage after the asynchronous drop and the second supply voltage after the asynchronous drop are transmitted to the solid-state drive to be tested through the power supply channel, thereby completing the asymmetric power failure test of the solid-state drive to be tested.

[0092] It should be emphasized that, when performing the asynchronous drop, the asynchronous drop time difference between the first supply voltage and the second supply voltage can be set arbitrarily, for example, 100ns to 1ms, and this embodiment does not impose any limitation on this.

[0093] Furthermore, in order to enable the voltage drop module to receive the first supply voltage and the second supply voltage, continue as follows Figure 2 As shown, in this embodiment, the test module further includes: a wide voltage input module and a multi-channel output module;

[0094] The multi-channel output module is connected to the wide voltage input module and the voltage drop module respectively, and the wide voltage input module is also connected to an external power supply;

[0095] The wide voltage input module is used to transmit the external voltage provided by the external power supply to the multi-channel output module;

[0096] The multi-channel output module is configured to convert the external voltage into a first supply voltage and a second supply voltage, and transmit the first supply voltage and the second supply voltage to the voltage drop module.

[0097] It should be understood that the external power supply can be any power supply for powering the device, and this embodiment does not impose any restrictions thereon. The wide voltage input module can be any unit with a wide voltage input function. In this embodiment, the wide voltage input module can support a 0-12V DC wide voltage input, thereby being compatible with the 5V / 12V power supply requirements of Serial Advanced Technology Attachment (SATA) and the 12V power supply requirements of Non-Volatile Memory Express (NVMe).

[0098] The multi-channel output module can be any module with voltage conversion capabilities, such as a power adapter, and this embodiment is not limited thereto. In this embodiment, the multi-channel output module can output various voltages, such as 12V, 5V, and 3V, to power modules in the test equipment. It should be emphasized that any location requiring power in this embodiment can be connected to the multi-channel output module to receive power, and this embodiment does not elaborate on this aspect.

[0099] Furthermore, in actual use, the wide voltage input module in this embodiment can receive the external voltage provided by an external power supply and transmit the external voltage to the multi-channel output module. The multi-channel output module converts the external voltage into a first supply voltage and a second supply voltage, and transmits the first supply voltage and the second supply voltage to the voltage drop module.

[0100] Furthermore, considering that when an asynchronous drop is performed, in order to perform a more comprehensive test, in this embodiment, when the drop is the asynchronous drop, the voltage drop module is further configured to asynchronously drop the first supply voltage and the second supply voltage according to a preset asymmetric power-off strategy;

[0101] The preset asymmetric power-off strategy includes at least one of the following:

[0102] In the absence of power ripple interference, controlling the first supply voltage and the second supply voltage to drop asynchronously according to a first preset time difference;

[0103] Controlling the first supply voltage and the second supply voltage to drop asynchronously according to a second preset time difference in the presence of the power ripple interference;

[0104] In the absence of the power ripple interference, the first supply voltage and the second supply voltage are controlled to drop asynchronously according to a random time difference.

[0105] It should be noted that the first preset time difference and the second preset time difference can be set according to actual conditions, and this embodiment does not limit this. For asymmetric power failure, this embodiment can use at least one of the preset asymmetric power failure strategies to perform testing.

[0106] For example, as a preset asymmetric power-off strategy, this embodiment can control the first power supply voltage (i.e., the aforementioned 12V) to asynchronously drop earlier than the second power supply voltage (i.e., the aforementioned 5V) by a first preset time difference in the absence of power ripple interference. The preset time difference can be 500ns, 1us, or 2us, etc. The expected expectation at 500ns can be that the hard disk under test enters a safe reset without firmware hangs; the expected expectation at 1us can be that the solid-state hard disk under test enters a safe reset, the data integrity check pass rate is not less than 99%, there is no firmware hang and media damage; the expected expectation at 2us can be that the solid-state hard disk under test can complete a safe reset within 10ms, the data integrity check pass rate is not less than 98%, there is no firmware hang and media damage.

[0107] That is, in actual use, the user can input "no power ripple interference, the first supply voltage is earlier than the second supply voltage X (first preset time difference)" to the main control module, and the main control module can generate a corresponding channel switching signal and a corresponding asynchronous drop signal, transmit the channel switching signal to the channel switching module to establish a connection between the voltage drop module and the solid-state drive to be tested, and transmit the asynchronous drop signal to the voltage drop module. The voltage drop module can asynchronously drop the first supply voltage and the second supply voltage according to the requirements in the asynchronous drop signal (that is, the above-mentioned no power ripple interference, the first supply voltage is earlier than the second supply voltage X (first preset time difference)), and transmit the first supply voltage after the drop and the second supply voltage after the drop to the test module for power failure test.

[0108] As another preset asymmetric power-off strategy, this embodiment can control the first supply voltage (i.e., the aforementioned 12V) to asynchronously drop earlier than the second supply voltage (i.e., the aforementioned 5V) by a second preset time difference in the presence of power ripple interference. This preset time difference can be 5µs. Specifically, the power ripple can be a ripple interference with an amplitude of 10% of the rated voltage and a frequency of 100kHz superimposed on both the first and second supply voltages. At 5µs, the expected performance can be that the hard drive under test completes a safe reset within 15ms, with a data integrity check pass rate of no less than 95%, and with no firmware hangs or media damage.

[0109] Similarly, in actual use, the user can input "power ripple interference, the first supply voltage is earlier than the second supply voltage by X (second preset time difference)" to the main control module, which generates a corresponding channel switching signal and a corresponding asynchronous voltage drop signal. The channel switching module then establishes a connection according to the channel switching signal, and the voltage drop module performs an asynchronous voltage drop according to the asynchronous voltage drop signal, completing the test of the SSD.

[0110] As another preset asymmetric power-off strategy, this embodiment can also control the first supply voltage (i.e., the aforementioned 12V) to asynchronously drop earlier than the second supply voltage (i.e., the aforementioned 5V) by a random time difference in the absence of power ripple interference. The random time difference can be a random time between 0.5 and 5us, and the number of repeated tests can be set according to actual conditions. This embodiment uses 100 times for illustration. The expected results achieved with the random time difference can be an average safe reset time of no more than 20ms for the hard drive under test, a data integrity check pass rate of no less than 90%, and no firmware hangs or media damage.

[0111] Similarly, in actual use, the user can input "no power ripple interference, the first supply voltage is earlier than the second supply voltage by a random time difference" to the main control module. The main control module generates the corresponding channel switching signal and the corresponding asynchronous voltage drop signal. The channel switching module then establishes a connection according to the channel switching signal, and the voltage drop module performs an asynchronous voltage drop according to the asynchronous voltage drop signal, completing the test of the SSD.

[0112] Furthermore, this embodiment can implement a power-off test on the solid-state drive to be tested through different preset asymmetric power-off strategies, thereby improving the accuracy and comprehensiveness of the test.

[0113] Furthermore, considering that after the SSD to be tested loses power, a backup power supply is required to temporarily power it, thereby completing the power failure test, the following steps are continued: Figure 2 As shown, in this embodiment, the test module further includes: a capacitor group module;

[0114] The capacitor bank module is connected to the main control module and the channel switching module;

[0115] The main control module is further configured to control the channel switching module to establish a connection between the capacitor bank module and the solid-state drive to be tested when the voltage drop module drops the first supply voltage and the second supply voltage;

[0116] The capacitor group module is used to supply power to the solid state drive to be tested when establishing a connection with the solid state drive to be tested, so that the solid state drive to be tested performs a power failure test.

[0117] It should be noted that the capacitor bank module can be any module with an energy storage function, such as a capacitor, and this embodiment does not limit this. In this embodiment, the capacitor bank module can provide temporary power supply to the solid-state drive under test.

[0118] In actual use, after receiving the drop test instruction input by the user, the main control module can generate a corresponding drop test signal according to the drop test instruction and transmit it to the capacitor bank module, and generate a corresponding channel switching signal to the channel switching module. The channel switching module can connect the capacitor bank module and the solid-state drive under test according to the channel switching signal. Since the voltage drop module is dropping the first supply voltage and the second supply voltage at this time, the capacitor bank module can transmit a temporary power supply to the solid-state drive under test when receiving the drop test signal, thereby completing the power failure test of the solid-state drive under test.

[0119] It should be emphasized that in order to test the capacity of the capacitor bank module, the main control module in this embodiment is also used to measure the energy storage time of the capacitor bank module at a preset voltage. The preset voltage can be 5V. In this scenario, the expected estimated energy storage time can be no less than 10ms.

[0120] Furthermore, considering that the power-off test may also require a loaded power-off test, that is, a power-off test simulating the solid-state drive to be tested under a high-load scenario, continue as follows Figure 2 As shown, in this embodiment, the test module further includes: a load simulation module;

[0121] The load simulation module is connected to the main control module and the channel switching module;

[0122] The load simulation module is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request;

[0123] The voltage drop module is further configured to transmit the first supply voltage after the drop and the second supply voltage after the drop to the solid-state hard disk to be tested that processes the queue request for performing a load power-off test.

[0124] It is understood that the load simulation module can be any module with load regulation, such as a power transistor, and this embodiment does not impose any restrictions on this. In this embodiment, when a load power-off test is required, the user can input the corresponding load test instruction to the main control module. The main control module can determine that the current test scenario is a load drop test scenario and further determine that the test modules to be used can be the load simulation module and voltage drop module. The main control module can then generate the corresponding voltage drop signal and load simulation signal. The load simulation signal can be a signal used to control the load simulation module to perform high-load simulation.

[0125] It is also understandable that in order to simulate a high load situation, in this embodiment, queue requests can be generated and sent to the solid state drive to be tested, where the number of queue requests can be set according to actual conditions. This embodiment uses 32 for illustration.

[0126] That is, in actual use, after the main control module determines that the test modules to be used may be the above-mentioned load simulation module and voltage drop module, it can generate a corresponding channel switching signal, and the channel switching module can establish a connection between the voltage drop module and the solid-state hard disk to be tested, as well as a connection between the load simulation module and the solid-state hard disk to be tested, and transmit the generated voltage drop signal to the voltage drop module, and transmit the generated load simulation signal to the load simulation module. The load simulation module can then issue 32 queue requests and transmit them to the solid-state hard disk to be tested through the load simulation channel. After receiving the queue signal, the solid-state hard disk to be tested needs to queue up and wait for processing, thereby completing the simulation of a high-load working scenario;

[0127] Then, the voltage drop module can transmit the dropped first supply voltage and the dropped second supply voltage to the solid-state drive to be tested that is processing the request queue, thereby completing the load power-off test.

[0128] It should be emphasized that because the supply current required by the SSD under test increases when simulating a high-load operating scenario through a request queue, to further simulate high-load scenarios, the load simulation module in this embodiment can also adjust the supply current transmitted to the SSD under test upon receiving a load adjustment signal. The range can be 0-50A, the step size can be 0.1A, and the response time can be 10us. In order to determine the magnitude of the supply current, the load simulation module in this embodiment can also be equipped with a current sensor for collecting the supply current.

[0129] In this embodiment, the voltage drop module and the capacitor group module can be used to simulate a power failure scenario, and then combined with the load simulation module to simulate a load power failure scenario of the solid state drive to be tested under high load.

[0130] Reference Figure 3 , Figure 3This is a structural diagram of the third embodiment of the testing device of the present application. Based on the above-mentioned first embodiment, the third embodiment of the testing device of the present application is proposed.

[0131] In order to simulate the power failure test under the condition of power aging, such as Figure 3 As shown, in this embodiment, the test module further includes: a capacitor group module;

[0132] The capacitor bank module is connected to the main control module and the channel switching module;

[0133] The main control module is further configured to control the channel switching module to establish a connection between the capacitor bank module and the solid-state drive to be tested when the voltage drop module drops the first supply voltage and the second supply voltage;

[0134] The capacitor group module is used to supply power to the solid state drive to be tested when establishing a connection with the solid state drive to be tested, so that the solid state drive to be tested performs a power failure test.

[0135] It should be noted that the capacitor aging module in this embodiment can be any module with charging and discharging functions, such as an RC charging and discharging circuit, etc., and this embodiment does not limit this. In this embodiment, the capacitor aging module can be used to simulate the capacity attenuation of the capacitor in the capacitor group module, thereby simulating the aging situation. And in order to facilitate the adjustment of the aging degree, the resistor in the capacitor aging module in this embodiment can use an adjustable resistor to adjust the current during the charging and discharging process to adjust the aging degree. The resistance value can be adjusted between 0 and 100Ω, and the accuracy can be ±1%. And in order to control whether it is currently charging or discharging, a relay can also be provided in the above-mentioned capacitor aging module in this embodiment. The relay can be connected to the main control module and the above-mentioned charging and discharging circuit. When the main control module controls the relay to be closed, it can be charging, and when it is disconnected, it can be discharging.

[0136] It should also be noted that the aging object of the capacitor aging module can be a capacitor bank module, and the capacitor bank module in this embodiment can be a 10mf / 16V electrolytic capacitor. Of course, other capacitors can also be used, and this embodiment does not limit this.

[0137] It is understandable that after receiving the aging test instruction input by the user for performing the aging test, the main control module can generate a corresponding aging test signal and transmit it to the capacitor group module. The above-mentioned aging test signal can be a signal for controlling charging and discharging, that is, the signal for controlling the opening and closing of the above-mentioned control relay.

[0138] In actual use, since the capacitor group module is needed to power the solid-state hard disk to be tested during the power-off test, the main control module of this embodiment can output an aging test signal and transmit it to the capacitor aging module. The capacitor aging module can charge and discharge the capacitor group module, thereby simulating the aging of the capacitor group module. Then, when the solid-state hard disk to be tested is provided with backup power supply, the aged capacitor group module is used to power it, thereby realizing the power-off performance test of the solid-state hard disk to be tested under the condition of capacitor aging.

[0139] Furthermore, considering that the test equipment in this embodiment has both capacitor aging capability and load simulation capability, in this embodiment, in order to further improve the comprehensiveness of the test, in this embodiment, in order to perform aging discreteness testing, the above-mentioned main control module is also used to control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the first preset load strategy, and control the capacitor aging module to charge and discharge the capacitor group module according to the first preset aging strategy.

[0140] It should be understood that the above-mentioned first preset load strategy can be a strategy that simulates a high load, such as sending request queues with a number of 32 and a random write ratio of 90%. The above-mentioned first preset aging strategy can be a strategy that simulates discrete aging, such as aging the capacitor group module to a degree of 80%±0.1%, that is, the resistance of the adjustable resistor fluctuates randomly by ±0.05Ω each time. In this case, the expected data integrity check pass rate of the solid-state hard disk to be tested is ≥99%, and the standard deviation of the remaining charging voltage is <0.2V. The above-mentioned first preset load strategy and the first preset aging strategy can both be set according to the test instructions input by the user, and this embodiment does not limit this.

[0141] Furthermore, in order to perform aging mutation testing, the above-mentioned main control module is also used to control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the second preset load strategy, and control the capacitor aging module to charge and discharge the capacitor group module according to the second preset aging strategy.

[0142] It should be noted that the above-mentioned second preset load strategy can be a strategy for simulating load mutation, for example, the number of sending request queues is 32, and the queue saturation increases linearly from 50% to 90%. The above-mentioned second preset aging strategy can be a simulated aging step strategy, for example, the capacitor group module is stepped from 70% to 80%, and the aging can be increased by 2% every 5 tests. Then, the aging and load can be increased synchronously, thereby simulating the scenario under aging mutation. In this case, the load fluctuation that triggers data loss of the solid-state hard disk to be tested is expected to be less than 5%, and there is no sudden data loss. The above-mentioned second preset load strategy and the second preset aging strategy can both be set according to the test instructions input by the user, and this embodiment does not limit this.

[0143] Furthermore, in order to perform load burst testing, the above-mentioned main control module is also used to control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the third preset load strategy, and control the capacitor aging module to charge and discharge the capacitor group module according to the third preset aging strategy.

[0144] It should be noted that the above-mentioned third preset load strategy can be a strategy for simulating paroxysmal loads, for example, satisfying an average number of 16 sending request queues, 64 burst sending request queues, and a random sending interval within 0.1 to 1 ms. The above-mentioned third preset aging strategy can be a simulated aging strategy, for example, simulating the aging degree of the capacitor group module to be 60%. In this case, the expected data integrity check error rate of the solid-state hard disk to be tested is <1ppm, and there is no memory leak in the firmware. The above-mentioned third preset load strategy and the third preset aging strategy can both be set according to the test instructions input by the user, and this embodiment does not impose any restrictions on this.

[0145] Furthermore, in order to simulate the load frequency coupling situation, the above-mentioned main control module is also used to control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the fourth preset load strategy, and control the capacitor aging module to charge and discharge the capacitor group module according to the fourth preset aging strategy.

[0146] It is understandable that the fourth preset load strategy can be a strategy for simulating aging, for example, the frequency of sending requests resonates with the frequency of charging and discharging of the capacitor bank; the fourth preset aging strategy can be a strategy for simulating load frequency coupling, for example, simulating a 50% aging degree of the capacitor bank module. In this case, the expected ripple of the solid-state drive to be tested is less than 50mV, and the data integrity check pass rate is 100%. Both the fourth preset load strategy and the fourth preset aging strategy can be set according to the test instructions input by the user, and this embodiment does not impose any restrictions on this.

[0147] Furthermore, in order to realize the redundant design of the capacitor bank module, Figure 3 As shown, in this embodiment, the capacitor group module includes: a first capacitor group unit and a second capacitor group unit;

[0148] The first capacitor group unit and the second capacitor group unit are both connected to the main control module, the capacitor aging module and the channel switching module;

[0149] The main control module is further configured to control the first capacitor group unit and the second capacitor group unit to supply power to the solid-state hard disk to be tested according to a preset switching strategy;

[0150] The preset switching strategy includes at least one of the following:

[0151] Randomly adjusting the discharge voltage difference between the first capacitor group unit and the second capacitor group unit before switching;

[0152] Randomly delay switching is performed on the first capacitor group unit and the second capacitor group unit.

[0153] It should be noted that, in this embodiment, the first capacitor group unit can be any unit with an energy storage function. In this embodiment, a 10mF / 16V capacitor is used as the first capacitor group unit for illustration. The second capacitor group unit can also be any unit with an energy storage function. In this embodiment, a 5mF / 16V capacitor is used as the second capacitor group unit for illustration.

[0154] Furthermore, when powering, this embodiment can power the solid-state drive under test via the first capacitor group unit and the second capacitor group unit. Simultaneously, when simulating aging, the first capacitor group unit and the second capacitor group unit can both be connected to the simulated aging module, so that the simulated aging module can charge and discharge the first capacitor group unit and the second capacitor group unit, respectively, to simulate aging.

[0155] It should be emphasized that in this embodiment, the main control module can also control the first capacitor group unit and the second capacitor group unit to perform a drop. Specifically, the main control module can also be used to output a backup power drop signal to the first capacitor group and the second capacitor group unit according to the backup power drop instruction input by the user, so that the first capacitor group unit and the second capacitor group unit perform a backup power drop.

[0156] The backup power drop instruction may be an instruction for performing a backup power drop test. For example, when performing a capacitor failure simulation, a user may input a backup power drop test instruction of "the time error of the first capacitor group unit and the second capacitor group unit dropping from 4.5V to 0V is less than 5%". The main control module may generate a backup power drop signal to the first capacitor group unit and the second capacitor group unit according to the backup power drop test instruction, and control the time error of the first capacitor group unit and the second capacitor group unit dropping from 4.5V to 0V to be less than 5%.

[0157] It is understandable that, considering that this embodiment involves a redundant capacitor group module, it can be used to simulate the scenario of switching to the second capacitor group unit when the first capacitor group unit fails. In order to improve the comprehensiveness of the test, in this embodiment, when the capacitor group module is used to provide backup power to the solid-state hard disk under test, the above-mentioned main control module can output a switching signal to the first capacitor group unit and the second capacitor group unit, so that the first capacitor group unit and the second capacitor group unit are switched according to the preset switching strategy to power the solid-state hard disk under test.

[0158] It should be noted that the switching signal may also be generated according to a corresponding test instruction input by a user. The preset switching strategy may be a strategy for simulating a switching scenario. In this embodiment, the preset switching strategy includes at least one of the following: randomly adjusting the discharge voltage difference between the first capacitor group unit and the second capacitor group unit before switching; and randomly delaying the switching of the first capacitor group unit and the second capacitor group unit.

[0159] Specifically, the discharge voltage difference between the first capacitor group unit and the second capacitor group unit is randomly adjusted before switching, and the voltage difference between the first capacitor group unit and the second capacitor group unit can be randomly adjusted within 50mV±10mV during switching.

[0160] And since aging simulation can be performed through the simulated aging unit in this embodiment, in this embodiment, in order to simulate the switching voltage difference perturbation, the main control module is also used to control the capacitor aging module to charge and discharge the first capacitor group unit and the second capacitor group unit according to the fifth preset aging strategy.

[0161] It should be emphasized that the fifth preset aging strategy can be a strategy for controlling the degree of aging, specifically a strategy in which the main control module controls the first capacitor group unit to age by 80% and controls the second capacitor group unit to be brand new. Furthermore, in this case, the desired expectation is that the instantaneous current of the solid-state hard disk under test is less than 2A when the first capacitor group unit switches to the second capacitor group unit, and the solid-state hard disk under test after the switch can identify the correct backup power voltage, that is, the voltage provided by the second capacitor group. Both the fifth preset load strategy and the fifth preset aging strategy can be set according to the test instructions input by the user, and this embodiment does not impose any restrictions on this.

[0162] As for the random delay switching of the first capacitor group unit and the second capacitor group unit, the main control module can specifically add a random delay to the output switching signal, and the random delay can be 10 to 100ns, and transmit the switching signal with the added random delay to the first capacitor group unit and the second capacitor group unit, so that the first capacitor group unit and the second capacitor group unit perform random delay switching.

[0163] It should be emphasized that, in order to age the capacitors, the main control module is further configured to control the capacitor aging module to charge and discharge the first capacitor group unit and the second capacitor group unit according to a sixth preset aging strategy.

[0164] The sixth preset aging strategy can be a strategy for controlling the degree of aging, specifically, the main control module can control the aging of the first capacitor group unit and the second capacitor group unit by 70%. Furthermore, in this case, the expected expectation is that the switching failure rate of the first capacitor group unit and the second capacitor group unit is less than 0.01%, and there is no firmware crash caused by timing problems. The sixth preset load strategy and the sixth preset aging strategy can both be set according to the test instructions input by the user, and this embodiment is not limited to this.

[0165] Furthermore, in order to determine the current simulated aging degree, in this embodiment, continue as follows Figure 3 As shown, the test module further includes: a monitoring module;

[0166] The monitoring module is connected to the capacitor bank module, the main control module and the capacitor aging module;

[0167] The monitoring module is used to collect the current temperature and current voltage of the capacitor group module when the capacitor group module is charging and discharging, determine the current aging degree of the capacitor group module according to the current temperature and the current voltage, and adjust the charging and discharging of the capacitor group module through the capacitor aging module based on the current aging degree.

[0168] It should be noted that the above-mentioned monitoring module can be connected to the first capacitor group unit and the second capacitor group unit respectively. The above-mentioned monitoring module can be a module with the ability to monitor the degree of capacitor aging. For example, a processor, a voltage sensor and a temperature sensor (such as a thermistor). The voltage sensor can be used to collect the current voltage at both ends of the first capacitor group unit and the current voltage at both ends of the second capacitor group unit during charging and discharging, and the temperature sensor can be used to collect the current temperature of the first capacitor group unit and the second capacitor group unit. The processor can then determine the current degree of aging of the first capacitor group unit and the current degree of aging of the second capacitor group unit based on the current temperature and the current voltage. In this embodiment, the sampling rate of the monitoring module can be 1MHz, and the accuracy can be ±0.1%.

[0169] After obtaining the current aging degree, the current aging degree can be transmitted to the main control module, and the main control module can adjust the capacitor aging module according to the current aging degree, thereby adjusting the charging and discharging of the first capacitor group unit and the second capacitor group unit, and completing the aging degree adjustment of the first capacitor group unit and the second capacitor group unit.

[0170] It should also be noted that in this embodiment, the monitoring module may also be provided with an indicator light, and the processor may be connected to the indicator light. When the monitoring module is in the charging state, the indicator light may turn green; when the monitoring module is in the discharging state, the indicator light may turn yellow; when the monitoring module is in the fault state, the indicator light may turn red.

[0171] Furthermore, since the monitoring module in this embodiment can realize the temperature acquisition function through thermistors, and in order to simulate the situation of accelerated temperature aging, in this embodiment, the above-mentioned main control module is used to control the capacitor aging module to charge and discharge the first capacitor group unit and the second capacitor group unit according to the seventh preset aging strategy, control the monitoring module to adjust the temperature according to the first heating strategy, and control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the seventh preset load strategy.

[0172] It should be noted that the seventh preset aging strategy can be a strategy for controlling the degree of aging, specifically, aging the first capacitor group unit and the second capacitor group unit by 30%, and the aging rate increases by 10% for every 5°C increase in the current temperature. The first temperature rise strategy can be a strategy for adjusting the current temperature of the thermistor, specifically, adjusting it to 10°C, that is, adjusting the resistance of the thermistor from 10KΩ to 5KΩ. The seventh preset load strategy can be a strategy for controlling the number of queue requests sent, specifically, sending 32 queue requests to the solid-state drive to be tested. Furthermore, in this scenario, the expectation that the solid-state drive to be tested is expected to achieve is a critical time slope with temperature change of <5% / °C and no sudden failure caused by temperature. The seventh preset load strategy, the first temperature rise strategy and the seventh preset aging strategy can all be set according to the test instructions input by the user, and this embodiment does not limit this.

[0173] Furthermore, in order to simulate the thermal runaway scenario, the above-mentioned main control module is used to control the capacitor aging module to charge and discharge the first capacitor group unit and the second capacitor group unit according to the eighth preset aging strategy, control the monitoring module to adjust the temperature according to the second heating strategy, and control the load simulation module to send a queue request to the solid-state hard disk to be tested according to the eighth preset load strategy.

[0174] It is understandable that the above-mentioned eighth preset aging strategy can be a strategy for controlling the degree of aging, specifically, it can be aging the first capacitor group unit and the second capacitor group unit by 90%. The above-mentioned second temperature rise strategy can be a strategy for adjusting the current temperature of the thermistor, specifically, it can be adjusted to >85°C. The above-mentioned eighth preset load strategy can be a strategy for controlling the number of queue requests sent, specifically, it can be sending 64 queue requests and 100% write bandwidth. Furthermore, in this scenario, the expectation that the solid-state hard disk to be tested is to be cut off within 100ms when the current temperature reaches the threshold, and there is no physical explosion or fire in the capacitor. The above-mentioned eighth preset load strategy, the second temperature rise strategy and the eighth preset aging strategy can all be set according to the test instructions input by the user, and this embodiment does not limit this.

[0175] Furthermore, in order to realize load simulation, continue as follows Figure 3 As shown, in this embodiment, the load simulation module includes: a dynamic load unit and a protocol interaction unit;

[0176] The dynamic load unit is connected to the main control module and the channel switching module respectively, and the protocol interaction unit is connected to the main control module and the channel switching module respectively;

[0177] The protocol interaction unit is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request;

[0178] The dynamic load unit is used to adjust the power supply current received by the solid state drive to be tested when establishing a connection with the solid state drive to be tested, and transmit the adjusted power supply current to the solid state drive to be tested for load power-off testing.

[0179] It should be noted that the above-mentioned protocol interaction unit can be any module capable of interacting with the solid-state drive to be tested, including the above-mentioned queue request sending, parsing NVMe2.0 and SATA3.3 protocols, etc. For example, a Field-Programmable Gate Array (FPGA) and an Advanced RISCMachine (ARM), etc., which are not limited in this embodiment. The above-mentioned dynamic load unit can be a unit that adjusts the power supply current of the solid-state drive to be tested, such as a digital power management chip, etc., which are not limited in this embodiment.

[0180] It should also be noted that in this embodiment, when a load power-off test is required, the user can input the corresponding load test command into the main control module. The main control module can determine that the current test scenario is a load drop test scenario, and then determine that the test modules to be used can be the dynamic load unit, protocol interaction unit, and voltage drop module described above. The main control module can then generate corresponding voltage drop signals and load simulation signals, and generate corresponding channel switching signals, thereby establishing a connection between the protocol interaction unit and the solid-state drive under test, a connection between the dynamic load unit and the solid-state drive under test, and a connection between the voltage drop module and the solid-state drive under test.

[0181] The load simulation signal may be a signal for the protocol interaction unit to send a queue request and for the dynamic load unit to perform current adjustment.

[0182] In actual use, the main control module in this embodiment can output a load simulation signal to the protocol interaction unit and the dynamic load unit. After receiving the load simulation signal, the protocol interaction unit can send a corresponding number of queue requests to the solid-state hard disk to be tested, so that the solid-state hard disk to be tested can process these queue requests, thereby simulating a high load situation.

[0183] In order to further simulate high load, the load simulation module can adjust the power supply current transmitted to the solid-state drive under test after receiving the load simulation signal. The power supply current can also be output from the multi-channel output module, and then the adjusted power supply current is transmitted to the solid-state drive under test, thereby further simulating high load conditions.

[0184] Furthermore, in order to enable the main control module to monitor the operating status of the solid-state hard disk to be tested, so that the user can determine whether the solid-state hard disk to be tested meets the expected requirements under various test scenarios, in this embodiment, the protocol interaction unit is also used to monitor the operating status of the solid-state hard disk to be tested during the power-off test, and transmit the monitoring results to the main control module for display.

[0185] It is understood that the operating state may be any of the states required for testing during the power-off test, such as the safety reset time, data integrity check pass rate, firmware hang, media damage, and other parameters previously mentioned in the above embodiments, which are not further described in this embodiment. In this embodiment, the operating state may also include all input / output commands within 10ms before and 50ms after the solid-state drive under test loses power.

[0186] It should be emphasized that, since the present embodiment can implement tests in different scenarios through the combination of modules or units, it improves the comprehensiveness of the test while reducing equipment costs and further improving the user experience.

[0187] Furthermore, since the protocol interaction unit can parse NVMe 2.0 and SATA 3.3 protocols, in this embodiment, the channel switching module is further provided with a compliance detection channel, and the main control module can use the compliance detection channel to test the protocol compliance of the solid-state drive under test through the protocol interaction unit. Specifically, the main control module can send an Identify Controller command to the solid-state drive under test through the protocol interaction unit, and verify through the protocol interaction unit that the solid-state drive under test supports power-off data protection (APST=1).

[0188] In addition, to achieve the above-mentioned purpose, an embodiment of the present application further provides a testing system, which includes the testing device as described above.

[0189] Other embodiments or specific implementations of the electronic device of the present application can refer to the embodiments of the above-mentioned testing devices and will not be repeated here.

[0190] The above are only preferred embodiments of the present application and do not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A testing device, characterized in that: The test device includes: a channel switching module, a main control module and at least two test modules, each of which has a different test scenario; The main control module is connected to the channel switching module and each of the test modules respectively, and the channel switching module is also connected to the solid-state drive to be tested and each of the test modules; The main control module is configured to determine a test scenario for the solid-state drive to be tested according to a test instruction upon receiving the test instruction; The main control module is further configured to determine a test module that needs to be used to test the solid-state drive to be tested according to the test scenario, and output a channel switching signal corresponding to the test module to the channel switching module; The channel switching module is configured to establish a connection between the test module and the solid-state drive to be tested according to the channel switching signal; The testing module is configured to perform a power-off test on the solid-state hard disk to be tested when establishing a connection with the solid-state hard disk to be tested.

2. The test device according to claim 1, wherein The test module includes: a voltage drop module; The voltage drop module is connected to the main control module and the channel switching module; The voltage drop module is configured to drop the received first supply voltage and the received second supply voltage when establishing a connection with the solid-state drive to be tested, and transmit the dropped first supply voltage and the dropped second supply voltage to the solid-state drive to be tested for a power failure test; The drop includes synchronous drop and asynchronous drop.

3. The test device according to claim 2, wherein: When the drop is the asynchronous drop, the voltage drop module is further configured to perform asynchronous drops on the first supply voltage and the second supply voltage according to a preset asymmetric power-off strategy; The preset asymmetric power-off strategy includes at least one of the following: In the absence of power ripple interference, controlling the first supply voltage and the second supply voltage to drop asynchronously according to a first preset time difference; Controlling the first supply voltage and the second supply voltage to drop asynchronously according to a second preset time difference in the presence of the power ripple interference; In the absence of the power ripple interference, the first supply voltage and the second supply voltage are controlled to drop asynchronously according to a random time difference.

4. The testing device according to claim 2, wherein: The test module further includes: a capacitor bank module; The capacitor bank module is connected to the main control module and the channel switching module; The main control module is further configured to control the channel switching module to establish a connection between the capacitor bank module and the solid-state drive to be tested when the voltage drop module drops the first supply voltage and the second supply voltage; The capacitor group module is used to supply power to the solid state drive to be tested when establishing a connection with the solid state drive to be tested, so that the solid state drive to be tested performs a power failure test.

5. The testing device according to claim 4, wherein: The test module also includes: a capacitor aging module; The capacitor aging module is connected to the main control module and the capacitor group module respectively; The capacitor aging module is configured to charge and discharge the capacitor group module when the main control module receives the aging test instruction, so as to simulate aging of the capacitor group module.

6. The testing device according to claim 5, wherein: The capacitor group module includes: a first capacitor group unit and a second capacitor group unit; The first capacitor group unit and the second capacitor group unit are both connected to the main control module, the capacitor aging module and the channel switching module; The main control module is further configured to control the first capacitor group unit and the second capacitor group unit to supply power to the solid-state hard disk to be tested according to a preset switching strategy; The preset switching strategy includes at least one of the following: Randomly adjusting the discharge voltage difference between the first capacitor group unit and the second capacitor group unit before switching; Randomly delay switching is performed on the first capacitor group unit and the second capacitor group unit.

7. The testing device according to claim 5, wherein: The test module also includes: a monitoring module; The monitoring module is connected to the capacitor bank module, the main control module and the capacitor aging module; The monitoring module is used to collect the current temperature and current voltage of the capacitor group module when the capacitor group module is charging and discharging, determine the current aging degree of the capacitor group module according to the current temperature and the current voltage, and adjust the charging and discharging of the capacitor group module through the capacitor aging module based on the current aging degree.

8. The testing device according to claim 2, wherein: The test module also includes: a load simulation module; The load simulation module is connected to the main control module and the channel switching module; The load simulation module is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request; The voltage drop module is further configured to transmit the first supply voltage after the drop and the second supply voltage after the drop to the solid-state hard disk to be tested that processes the queue request for performing a load power-off test.

9. The testing device according to claim 8, wherein The load simulation module includes: a dynamic load unit and a protocol interaction unit; The dynamic load unit is connected to the main control module and the channel switching module respectively, and the protocol interaction unit is connected to the main control module and the channel switching module respectively; The protocol interaction unit is configured to send a queue request to the solid-state drive to be tested when establishing a connection with the solid-state drive to be tested, so that the solid-state drive to be tested processes the queue request; The dynamic load unit is used to adjust the power supply current received by the solid state drive to be tested when establishing a connection with the solid state drive to be tested, and transmit the adjusted power supply current to the solid state drive to be tested for load power-off testing.

10. The testing device according to claim 9, wherein The protocol interaction unit is further configured to monitor the operating status of the solid-state hard disk to be tested during the power-off test, and transmit the monitoring result to the main control module for display.

11. The testing device according to claim 2, wherein: The test module also includes: a wide voltage input module and a multi-channel output module; The multi-channel output module is connected to the wide voltage input module and the voltage drop module respectively, and the wide voltage input module is also connected to an external power supply; The wide voltage input module is used to transmit the external voltage provided by the external power supply to the multi-channel output module; The multi-channel output module is configured to convert the external voltage into a first supply voltage and a second supply voltage, and transmit the first supply voltage and the second supply voltage to the voltage drop module.

12. A testing system, characterized in that: The test system comprises the test device according to any one of claims 1 to 11.

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