Voltage tester operating status monitoring method and system for multiple application scenarios

Abstract

The present invention provides a method and system for monitoring the operating status of a voltage tester for multiple application scenarios, and relates to the field of operating status supervision of a voltage tester. The method includes: obtaining usage information and scenario environment information, estimating the fluctuation deviation rate of the scenario environment on the detection data based on the historical data fitting curve; calculating the device abnormal interference risk based on the usage information, and analyzing the fault tolerance deviation fluctuation rate in combination with the fluctuation deviation rate; analyzing the operating status fault risk value in combination with the usage information and historical maintenance data, and then deriving the fault repair risk probability in combination with the device abnormal interference risk; evaluating the detection status risk based on the fault tolerance deviation fluctuation rate and the fault repair risk probability, and generating operating status early warning feedback information. The present invention integrates the voltage tester usage information, scenario environment information, and the aging of the device in the historical data, predicts risks such as device abnormal interference, evaluates the current detection status risk, and realizes multi-scenario operating status supervision.

Description

Technical Field

[0001] The present invention relates to the field of voltage tester operation status supervision, and in particular to a voltage tester operation status monitoring method and system for multiple application scenarios. Background Art

[0002] In today's industrial production, power system maintenance, electronic equipment research and development, and various scientific research experiments, voltage testers are widely used as key equipment for accurately measuring voltage parameters of different electrical systems and equipment to ensure their normal operation.

[0003] The existing monitoring system for the operating status of voltage testers only monitors the internal parameters of the voltage testers and then determines the operating status of the voltage testers; however, it does not take into account the interference of the environmental differences in the application scenarios targeted by the voltage testers on the operating status of the corresponding voltage testers, and thus the existing voltage tester operating status monitoring system has major defects. Summary of the Invention

[0004] Purpose of the invention: To propose a method and system for monitoring the operating status of a voltage tester for multiple application scenarios, so as to solve the above-mentioned problems existing in the prior art.

[0005] In order to solve the above technical problems, the present invention provides the following technical solutions:

[0006] A method for monitoring the operating status of a voltage tester for multiple application scenarios includes the following steps:

[0007] S1. Obtain usage information of the voltage tester and scene environment information in the current application scenario, fit a curve between the electromagnetic interference intensity and the detection result deviation rate based on historical data, and estimate the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data based on the curve;

[0008] S2. Calculate the device abnormal interference risk of the voltage tester at the current time based on the usage information of the voltage tester; and analyze the fault tolerance deviation fluctuation rate of the voltage tester at the current time in combination with the fluctuation deviation rate described in step S1;

[0009] S3. Analyze the current operating state failure risk value of the voltage tester based on the voltage tester usage information and the voltage tester maintenance data in the historical data; and obtain the current fault maintenance risk probability of the voltage tester based on the abnormal interference risk of the device of the voltage tester.

[0010] S4. Based on the fault tolerance deviation fluctuation rate of the current voltage tester and the fault repair risk probability of the current voltage tester, a detection status risk assessment is performed on the current voltage tester, and based on the obtained detection status risk assessment result, operation status warning feedback information is generated.

[0011] Furthermore, fitting a curve between the electromagnetic interference intensity and the detection result deviation rate based on historical data specifically includes:

[0012] Construct a data pair that binds the electromagnetic interference intensity of each scene environment information to the corresponding detection result deviation rate. The detection result deviation rate in each data pair is equal to the average of the deviation rates of the respective detection results under the corresponding electromagnetic interference intensity. The relationship between the electromagnetic interference intensity and the detection result deviation rate is the function corresponding to the broken line obtained by connecting the coordinate points of each constructed data pair in the same coordinate system in ascending order of the horizontal coordinate.

[0013] The electromagnetic interference intensity in the scene environment information of the voltage tester in the current application scenario is substituted into the horizontal axis parameter of the obtained function, and the obtained function value is used as the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data.

[0014] Furthermore, the detection result deviation rate is calculated according to the following formula:

[0015]

[0016] Where, Indicates the detection voltage of the voltage tester on the detection object under the electromagnetic interference intensity; Indicates the detection voltage of the voltage tester on the test object in the electromagnetic shielding state.

[0017] Furthermore, based on the usage information of the voltage tester itself, the device abnormal interference risk AE of the voltage tester at the current time is calculated according to the following formula:

[0018]

[0019] Where, T represents the usage time of the device in the usage information of the voltage tester itself; Q t Indicates the usage intensity corresponding to the usage time t in the usage information of the voltage tester itself; QY indicates the maximum usage intensity of the voltage tester corresponding to the preset single use; represents the intensity analysis function, when When ,when When .

[0020] Furthermore, in the process of analyzing the current time voltage tester fault tolerance deviation fluctuation rate, the current time voltage tester fault tolerance deviation fluctuation rate is recorded as BP:

[0021]

[0022] Where BC represents the fluctuation deviation rate of the voltage tester detection data caused by the scene environment information in the current application scenario; V{AE} represents the average value of the deviation of the detection data of each voltage tester when the device abnormal interference risk of the voltage tester is AE in the historical data divided by the usage intensity at the corresponding time point; QD represents the usage intensity of the voltage tester at the current time.

[0023] Furthermore, step S3 specifically includes:

[0024] S31, obtaining a current operating state fault risk value FR of the voltage tester and a current device abnormal interference risk of the voltage tester;

[0025] S32. Calculate the fault repair risk probability PX of the voltage tester at the current time:

[0026]

[0027] Where H{AE} represents the ratio of the number of maintenances in the historical maintenance data in which the voltage tester had an operational fault and the device abnormal interference risk of the corresponding voltage tester at the time of maintenance was less than or equal to AE to the total number of all maintenances.

[0028] Furthermore, the calculation formula of the fault risk value FR of the current operating state of the voltage tester is as follows:

[0029]

[0030] In the formula, SP represents the average value of the storage environment humidity corresponding to each time point in the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; SF represents the average value of the dust concentration of the storage environment corresponding to each time point in the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; ST represents the total duration corresponding to the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; MR{SP, SF, ST} represents the proportion of maintenance times in which the voltage tester has operational faults among the maintenance times in which the average storage environment humidity corresponding to the maintenance data of the voltage tester in the historical data is less than or equal to SP, the average storage environment dust concentration is less than or equal to SF, and the total duration corresponding to the storage information when the voltage tester is not in use is less than or equal to ST.

[0031] Furthermore, step S4 specifically includes:

[0032] If the fault tolerance deviation fluctuation rate of the voltage tester at the current time is less than or equal to the preset fault tolerance deviation fluctuation threshold, and the fault repair risk probability of the voltage tester at the current time is less than or equal to the preset fault repair risk threshold, then it is determined that the voltage tester is in a normal state of detection at the current time; otherwise, it is determined that the voltage tester is in an abnormal state of detection at the current time, and an operation status warning feedback message is generated;

[0033] The operation status early warning feedback information includes the fault tolerance deviation fluctuation rate of the voltage tester at the current time, the fault repair risk probability of the voltage tester at the current time, and the detection status risk assessment result of the voltage tester at the current time.

[0034] In addition, the present invention also provides a voltage tester operation status monitoring system that can execute the above voltage tester operation status monitoring method. The monitoring system includes a detection status information acquisition module, a device interference risk analysis module, a fault repair risk analysis module, and a status warning feedback management module.

[0035] The detection status information acquisition module is used to obtain the usage information of the voltage tester and the scene environment information in the current application scenario, fit the curve between the electromagnetic interference intensity and the detection result deviation rate based on historical data, and estimate the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data based on the curve;

[0036] The device interference risk analysis module calculates the device abnormal interference risk of the voltage tester at the current time based on the usage information of the voltage tester; and analyzes the fault tolerance deviation fluctuation rate of the voltage tester at the current time in combination with the fluctuation deviation rate;

[0037] The fault repair risk analysis module is used to combine the voltage tester's usage information and the voltage tester repair data in the historical data to analyze the current voltage tester's operating status fault risk value; combined with the current voltage tester's device abnormal interference risk, to obtain the current voltage tester's fault repair risk probability;

[0038] The status warning feedback management module is used to perform a risk assessment on the detection status of the voltage tester at the current time based on the fault tolerance deviation fluctuation rate of the voltage tester at the current time and the fault repair risk probability of the voltage tester at the current time, and generate operating status warning feedback information based on the obtained detection status risk assessment results.

[0039] Furthermore, the device interference risk analysis module includes a device anomaly analysis unit and a fault tolerance deviation fluctuation analysis unit. The device anomaly analysis unit obtains the usage information of the voltage tester itself, combines the aging and wear of the corresponding devices of the voltage tester at different usage stages in the historical data, and calculates the device anomaly interference risk of the voltage tester at the current time;

[0040] The fault tolerance deviation fluctuation analysis unit analyzes the fault tolerance deviation fluctuation rate of the voltage tester at the current time by combining the fluctuation deviation rate of the voltage tester detection data with the scene environment information in the current application scene.

[0041] Furthermore, the fault repair risk analysis module includes an operating state fault risk calculation unit and a fault repair risk probability analysis unit.

[0042] The operation state fault risk calculation unit combines the usage information of the voltage tester itself and the maintenance data of the voltage tester in the historical data to analyze the operation state fault risk value of the voltage tester at the current time;

[0043] The fault repair risk probability analysis unit obtains the fault repair risk probability of the voltage tester at the current time by combining the abnormal interference risk of the components of the voltage tester at the current time.

[0044] Beneficial effect: Compared with the existing technology, the present invention not only takes into account the use information of the voltage tester itself and the scene environment information in the current application scenario. The fluctuation influence on the detection data of the voltage tester is also combined with the aging and wear of the corresponding components of the voltage tester at different use stages in the historical data, so as to realize the prediction of the abnormal interference risk, fault tolerance deviation fluctuation and fault repair risk probability of the components corresponding to the use information of the voltage tester itself, and then realizes the risk assessment and judgment of the detection status of the voltage tester at the current time, ensuring the effective supervision of the operating status of the voltage tester in multiple application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 It is a structural diagram of a voltage tester operation status monitoring system for multiple application scenarios in an embodiment.

[0046] Figure 2 It is a flow chart of a method for supervising the operation status of a voltage tester for multiple application scenarios in an embodiment. DETAILED DESCRIPTION

[0047] In the following description, numerous specific details are provided to provide a more thorough understanding of the present invention. However, it will be apparent to those skilled in the art that the present invention may be practiced without one or more of these details. In other instances, certain technical features well known in the art have not been described to avoid confusion with the present invention.

[0048] Example 1

[0049] See also Figure 1This embodiment discloses a feasible implementation plan for a voltage tester operating status monitoring system for multiple application scenarios. Under this solution, the voltage tester operating status monitoring system consists of four components: a detection status information acquisition module, a device interference risk analysis module, a fault repair risk analysis module, and a status warning feedback management module.

[0050] The detection status information acquisition module obtains the usage information of the voltage tester itself and the scene environment information in the current application scenario, combines the impact of the scene information in the historical data on the detection results of the voltage tester, and analyzes the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data.

[0051] The device interference risk analysis module includes a device anomaly analysis unit and a fault tolerance deviation fluctuation analysis unit. The device anomaly analysis unit obtains usage information of the voltage tester itself and combines it with historical data on the aging and wear of the corresponding components at different stages of use to calculate the current device anomaly interference risk of the voltage tester. The fault tolerance deviation fluctuation analysis unit analyzes the current fault tolerance deviation fluctuation rate of the voltage tester by combining the fluctuation deviation rate generated by the voltage tester's detection data with the scene environment information of the current application scenario.

[0052] The fault repair risk analysis module includes an operating state fault risk calculation unit and a fault repair risk probability analysis unit. The operating state fault risk calculation unit combines the voltage tester's usage information and historical maintenance data to analyze the current operating state fault risk value of the voltage tester. The fault repair risk probability analysis unit combines the voltage tester's component abnormal interference risk at the current time to determine the current fault repair risk probability of the voltage tester.

[0053] The status warning feedback management module performs a risk assessment on the current voltage tester's detection status based on the current voltage tester's fault tolerance deviation fluctuation rate and the current voltage tester's fault repair risk probability, and generates operating status warning feedback information based on the obtained detection status risk assessment results.

[0054] Example 2

[0055] like Figure 2 As shown, this embodiment discloses a method for monitoring the operating status of a voltage tester for multiple application scenarios, and the steps are as follows:

[0056] S1. Obtain the usage information of the voltage tester itself and the scene environment information in the current application scenario, combine the impact of the scene information in the historical data on the detection results of the voltage tester, and analyze the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data.

[0057] In this embodiment, the usage information of the voltage tester itself includes the usage time of the device, the usage intensity corresponding to different usage times, and the storage information when not in use; the storage information when not in use includes the storage environment humidity and the dust concentration of the storage environment corresponding to each time point; the usage intensity of the device corresponding to different usage times indicates the continuous usage time of the voltage tester device corresponding to the corresponding time point from the last time of use.

[0058] In this embodiment, if the voltage tester has been used continuously since the last time point r (the method for determining continuous use is that the interval between each use of the voltage tester to perform a detection task is less than or equal to the interval preset in the database; if the interval between performing a detection task is greater than the interval preset in the database, the two detection tasks performed are divided into different times of use), then the usage intensity corresponding to the time point r1 during use is equal to r1-r.

[0059] In this embodiment, the scene environment information includes the electromagnetic interference intensity in the application scene.

[0060] In this embodiment, the implementation scheme for analyzing the fluctuation deviation rate of the voltage tester detection data caused by the scene environment information in the current application scenario is as follows:

[0061] S11, obtaining scene environment information of the voltage tester in the current application scene, and the influence of the scene information in the historical data on the detection result of the voltage tester;

[0062] S12. Statistically analyze the relationship between the electromagnetic interference intensity of the corresponding scene information and the deviation rate of the detection result during each detection process of the voltage tester in the historical data, and construct a data pair binding the electromagnetic interference intensity of each scene information and the corresponding detection result deviation rate. The detection result deviation rate in each data pair is equal to the average value of the deviation rates of the respective detection results corresponding to the corresponding electromagnetic interference intensity. The detection result deviation rate is equal to the absolute value of the difference between the detection voltage of the same voltage tester for the detection object under the corresponding electromagnetic interference intensity and the detection voltage for the detection object under the electromagnetic shielding state, divided by the quotient of the detection voltage for the detection object under the electromagnetic shielding state. The relationship between the electromagnetic interference intensity and the deviation rate of the detection result is a function corresponding to the broken line obtained by connecting the coordinate points corresponding to each constructed data pair in the same coordinate system in ascending order of the horizontal coordinate.

[0063] S13. Substitute the electromagnetic interference intensity in the scene environment information of the voltage tester in the current application scenario into the horizontal axis parameter of the function obtained in step S12, and use the obtained function value as the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data.

[0064] The present invention takes into account the differences in electromagnetic interference intensity that the voltage tester is exposed to in the application scenarios in which it is located, and combines historical data to analyze the relationship between the influence of electromagnetic interference intensity on the data deviation caused by the detection results of the voltage tester. Through the fitting function relationship, the fluctuation deviation rate of the voltage tester detection data caused by the scene environment information in the current application scenario is predicted, which provides data support for the subsequent steps of analyzing the fault tolerance deviation fluctuation rate of the voltage tester at the current time.

[0065] S2. Obtain the usage information of the voltage tester itself, and calculate the abnormal interference risk of the components of the voltage tester at the current time based on the aging and wear of the components of the voltage tester at different usage stages in the historical data; and analyze the fault tolerance deviation fluctuation rate of the voltage tester at the current time based on the fluctuation deviation rate of the voltage tester detection data generated by the scene environment information in the current application scenario.

[0066] In this embodiment, the specific implementation plan of step S2 is as follows:

[0067] S21. The formula for calculating the abnormal interference risk of the device of the voltage tester at the current time is as follows:

[0068]

[0069] Among them, AE represents the abnormal interference risk of the voltage tester's device at the current time; T represents the usage information of the voltage tester itself including the usage time of the device; Q t Indicates the usage intensity corresponding to the usage time t in the usage information of the voltage tester itself; QY indicates the maximum usage intensity of the voltage tester corresponding to the preset single use; G{*} indicates the intensity analysis function, when Q t ≥QY, then determine G{Q t -QY}=Q t -QY, otherwise, it is determined that G{Q t -QY}=0;

[0070] S22. In the process of analyzing the current time voltage tester fault tolerance deviation fluctuation rate, the current time voltage tester fault tolerance deviation fluctuation rate is recorded as BP:

[0071]

[0072] Among them, BC represents the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data; V{AE} represents the average value of the quotient of the deviation of the detection data of each voltage tester when the device abnormal interference risk of the voltage tester is AE in the historical data divided by the usage intensity at the corresponding time point; QD represents the usage intensity of the voltage tester at the current time.

[0073] In this embodiment, in the process of obtaining V{AE}, because 0 cannot be used as a divisor, if the usage intensity at the corresponding time point is 0, the deviation amount of the detection data of each voltage tester with a usage intensity of 0 at the corresponding time point when the device abnormal interference risk of the voltage tester in the historical data is AE is replaced by the quotient of the usage intensity at the corresponding time point with 0 and substituted into the calculation.

[0074] S3. Combine the voltage tester's own usage information and the voltage tester maintenance data in the historical data to analyze the current operating status fault risk value of the voltage tester; combine the current device abnormal interference risk of the voltage tester to obtain the current fault maintenance risk probability of the voltage tester.

[0075] In this embodiment, the specific implementation plan of step S3 is as follows:

[0076] S31. Obtaining a current operating state failure risk value of the voltage tester and a current device abnormal interference risk of the voltage tester;

[0077] S32. The formula for calculating the fault repair risk probability of the voltage tester at the current time is as follows:

[0078]

[0079] Where PX represents the fault repair risk probability of the voltage tester at the current time; FR represents the operational fault risk value of the voltage tester at the current time; H{AE} represents the ratio of the number of maintenances in the historical maintenance data in which the voltage tester had operational faults when the device abnormal interference risk of the corresponding voltage tester was less than or equal to AE, to the total number of maintenances.

[0080] The calculation formula for the fault risk value of the operating status of the voltage tester at the current time is as follows:

[0081]

[0082] Among them, SP represents the average value of the storage environment humidity corresponding to each time point in the storage information when not in use in the usage information of the voltage tester itself; SF represents the average value of the dust concentration of the storage environment corresponding to each time point in the storage information when not in use in the usage information of the voltage tester itself; ST represents the total duration corresponding to the storage information when not in use in the usage information of the voltage tester itself; MR{SP, SF, ST} represents the proportion of the number of maintenance times in which the voltage tester has operational failures in the maintenance data of the voltage tester in the historical data, in which the average storage environment humidity corresponding to the maintenance data of the voltage tester is less than or equal to SP, the average storage environment dust concentration is less than or equal to SF, and the total duration corresponding to the storage information when not in use is less than or equal to ST.

[0083] S4. Based on the fault tolerance deviation fluctuation rate of the current voltage tester and the fault repair risk probability of the current voltage tester, a detection status risk assessment is performed on the current voltage tester, and based on the obtained detection status risk assessment result, operation status warning feedback information is generated.

[0084] In this embodiment, the specific implementation plan of step S4 is as follows:

[0085] If the fault tolerance deviation fluctuation rate of the voltage tester at the current time is less than or equal to the preset fault tolerance deviation fluctuation threshold, and the fault repair risk probability of the voltage tester at the current time is less than or equal to the preset fault repair risk threshold, then it is determined that the detection status of the voltage tester at the current time is normal; otherwise, it is determined that the detection status of the voltage tester at the current time is abnormal, and the corresponding voltage tester needs to be repaired and maintained.

[0086] In this embodiment, the operation status warning feedback information includes the fault tolerance deviation fluctuation rate of the voltage tester at the current time, the fault repair risk probability of the voltage tester at the current time, and the detection status risk assessment result of the voltage tester at the current time.

[0087] In the process of evaluating and determining the detection status risk of the current voltage tester, the present invention comprehensively considers two factors: the fault tolerance deviation fluctuation rate of the current voltage tester (the risk in its own detection accuracy) and the fault repair risk probability of the current voltage tester (the probability risk of failure of the internal components of the voltage tester during the detection process), so as to achieve accurate determination of the detection status of the current voltage tester.

[0088] It should be noted that the above embodiments can be implemented in whole or in part via software, hardware, firmware, or any other combination thereof. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product comprises one or more computer instructions or computer programs. When loaded or executed on a computer, the processes or functions described in the embodiments of this application are fully or partially generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired means (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium accessible by a computer or a data storage device such as a server or data center that contains a collection of one or more available media. The available medium can be magnetic media (e.g., floppy disks, hard disks, tapes), optical media (e.g., DVDs), or semiconductor media. The semiconductor media can be a solid-state drive.

[0089] When implemented in hardware, the entire process of the method for monitoring the operating status of a voltage tester for multiple application scenarios disclosed in the above embodiments can be embedded in a single electronic device for execution. This electronic device includes a processor, a memory, a communication interface, and a communication bus. The processor, memory, and communication interface communicate with each other via the communication bus. The memory is used to store at least one executable instruction, which causes the processor to execute all steps of the method for monitoring the operating status of a voltage tester for multiple application scenarios disclosed in the above embodiments. Detailed description is omitted here.

[0090] The electronic device may also communicate with one or more external devices (e.g., a keyboard, pointing device, Bluetooth device, etc.), one or more devices that enable a user to interact with the electronic device, and / or any device that enables the electronic device to communicate with one or more other computing devices (e.g., a router, modem, etc.). This communication may occur via an input / output (I / O) interface. Furthermore, the electronic device may communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network such as the Internet) via a network adapter. The network adapter communicates with other modules of the electronic device via a bus. It should be understood that, although not shown in the figures, other hardware and / or software modules may be used in conjunction with the electronic device, including but not limited to microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0091] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0092] As described above, although the present invention has been shown and described with reference to specific preferred embodiments, it should not be construed as limiting the present invention itself. Various changes may be made to it in form and detail without departing from the spirit and scope of the present invention as defined in the appended claims.

Claims

1. A method for monitoring the operating status of a voltage tester for multiple application scenarios, characterized in that: The steps include: S1. Obtain usage information of the voltage tester and scene environment information in the current application scenario, wherein the usage information includes the device usage time, usage intensity corresponding to different usage times, and storage information when not in use, and the scene environment information includes the electromagnetic interference intensity in the application scenario; fit a curve between the electromagnetic interference intensity and the detection result deviation rate based on historical data, and estimate the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data based on the curve; specifically including: S11, obtaining scene environment information of the voltage tester in the current application scene, and the influence of the scene information in the historical data on the detection result of the voltage tester; S12. Statistically analyze the relationship between the electromagnetic interference intensity of the corresponding scene information and the deviation rate of the detection result during each detection process of the voltage tester in the historical data, and construct a data pair binding the electromagnetic interference intensity of each scene information and the corresponding detection result deviation rate. The detection result deviation rate in each data pair is equal to the average value of the deviation rates of the respective detection results corresponding to the corresponding electromagnetic interference intensity. The detection result deviation rate is equal to the absolute value of the difference between the detection voltage of the same voltage tester for the detection object under the corresponding electromagnetic interference intensity and the detection voltage for the detection object under the electromagnetic shielding state, divided by the quotient of the detection voltage for the detection object under the electromagnetic shielding state. The relationship between the electromagnetic interference intensity and the deviation rate of the detection result is a function corresponding to the broken line obtained by connecting the coordinate points corresponding to each constructed data pair in the same coordinate system in ascending order of the horizontal coordinate. S13, substituting the electromagnetic interference intensity in the scene environment information of the voltage tester in the current application scenario into the horizontal axis parameter of the function obtained in step S12, and using the obtained function value as the fluctuation deviation rate caused by the scene environment information in the current application scenario to the detection data of the voltage tester; S2. Calculate the device abnormal interference risk of the voltage tester at the current time based on the usage information of the voltage tester; and analyze the fault tolerance deviation fluctuation rate of the voltage tester at the current time in combination with the fluctuation deviation rate described in step S1; S3. Analyze the current operating state failure risk value of the voltage tester based on the voltage tester usage information and the voltage tester maintenance data in the historical data; and obtain the current fault maintenance risk probability of the voltage tester based on the abnormal interference risk of the device of the voltage tester. S4. Based on the fault tolerance deviation fluctuation rate of the current voltage tester and the fault repair risk probability of the current voltage tester, a detection status risk assessment is performed on the current voltage tester, and based on the obtained detection status risk assessment result, operation status warning feedback information is generated.

2. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 1, characterized in that: The curve fitting between the electromagnetic interference intensity and the detection result deviation rate according to the historical data specifically includes: Construct a data pair that binds the electromagnetic interference intensity of each scene environment information to the corresponding detection result deviation rate. The detection result deviation rate in each data pair is equal to the average of the deviation rates of the respective detection results under the corresponding electromagnetic interference intensity. The relationship between the electromagnetic interference intensity and the detection result deviation rate is the function corresponding to the broken line obtained by connecting the coordinate points of each constructed data pair in the same coordinate system in ascending order of the horizontal coordinate. The electromagnetic interference intensity in the scene environment information of the voltage tester in the current application scenario is substituted into the horizontal axis parameter of the obtained function, and the obtained function value is used as the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data.

3. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 1, characterized in that: Based on the usage information of the voltage tester itself, the device abnormal interference risk AE of the voltage tester at the current time is calculated according to the following formula: Where, T represents the usage time of the device in the usage information of the voltage tester itself; Q t Indicates the usage intensity corresponding to the usage time t in the usage information of the voltage tester itself; QY indicates the maximum usage intensity of the voltage tester corresponding to the preset single use; represents the intensity analysis function, when When ,when When .

4. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 3, characterized in that: In the process of analyzing the current time voltage tester fault tolerance deviation fluctuation rate, the current time voltage tester fault tolerance deviation fluctuation rate is recorded as BP: Where BC represents the fluctuation deviation rate of the voltage tester detection data caused by the scene environment information in the current application scenario; V{AE} represents the average value of the deviation of the detection data of each voltage tester when the device abnormal interference risk of the voltage tester is AE in the historical data divided by the usage intensity at the corresponding time point; QD represents the usage intensity of the voltage tester at the current time.

5. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 1, characterized in that: Step S3 specifically includes: S31, obtaining a current operating state fault risk value FR of the voltage tester and a current device abnormal interference risk of the voltage tester; S32. Calculate the fault repair risk probability PX of the voltage tester at the current time: Where H{AE} represents the ratio of the number of maintenances in the historical maintenance data in which the voltage tester had an operational fault and the device abnormal interference risk of the corresponding voltage tester at the time of maintenance was less than or equal to AE to the total number of all maintenances.

6. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 5, characterized in that: The calculation formula of the fault risk value FR of the current operating status of the voltage tester is as follows: In the formula, SP represents the average value of the storage environment humidity corresponding to each time point in the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; SF represents the average value of the dust concentration of the storage environment corresponding to each time point in the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; ST represents the total duration corresponding to the storage information when the voltage tester is not in use in the usage information of the voltage tester itself; MR{SP, SF, ST} represents the proportion of maintenance times in which the voltage tester has operational faults among the maintenance times in which the average storage environment humidity corresponding to the maintenance data of the voltage tester in the historical data is less than or equal to SP, the average storage environment dust concentration is less than or equal to SF, and the total duration corresponding to the storage information when the voltage tester is not in use is less than or equal to ST.

7. The method for monitoring the operating status of a voltage tester for multiple application scenarios according to claim 1, characterized in that: Step S4 specifically includes: If the fault tolerance deviation fluctuation rate of the voltage tester at the current time is less than or equal to the preset fault tolerance deviation fluctuation threshold, and the fault repair risk probability of the voltage tester at the current time is less than or equal to the preset fault repair risk threshold, then it is determined that the voltage tester is in a normal state of detection at the current time; otherwise, it is determined that the voltage tester is in an abnormal state of detection at the current time, and an operation status warning feedback message is generated; The operation status early warning feedback information includes the fault tolerance deviation fluctuation rate of the voltage tester at the current time, the fault repair risk probability of the voltage tester at the current time, and the detection status risk assessment result of the voltage tester at the current time.

8. A voltage tester operating status monitoring system, configured to execute the voltage tester operating status monitoring method for multiple application scenarios according to any one of claims 1 to 7, characterized in that: The monitoring system includes: Detection status information acquisition module; the detection status information acquisition module is used to obtain the usage information of the voltage tester and the scene environment information in the current application scenario, fit the curve between the electromagnetic interference intensity and the detection result deviation rate based on historical data, and estimate the fluctuation deviation rate of the scene environment information in the current application scenario on the voltage tester detection data based on the curve; Device interference risk analysis module; the device interference risk analysis module calculates the device abnormal interference risk of the voltage tester at the current time based on the usage information of the voltage tester; and analyzes the fault tolerance deviation fluctuation rate of the voltage tester at the current time in combination with the fluctuation deviation rate; Fault repair risk analysis module; the fault repair risk analysis module is used to combine the usage information of the voltage tester and the voltage tester repair data in the historical data to analyze the fault risk value of the current operating state of the voltage tester; combined with the abnormal interference risk of the device of the voltage tester at the current time, obtain the fault repair risk probability of the voltage tester at the current time; Status warning feedback management module; the status warning feedback management module is used to perform a detection status risk assessment and judgment on the current voltage tester based on the fault tolerance deviation fluctuation rate of the current voltage tester and the fault repair risk probability of the current voltage tester, and generate operating status warning feedback information based on the obtained detection status risk assessment and judgment results.

9. The voltage tester operation status monitoring system according to claim 8, characterized in that: The device interference risk analysis module includes a device anomaly analysis unit and a fault tolerance deviation fluctuation analysis unit; The device abnormality analysis unit obtains the usage information of the voltage tester itself, combines the aging and wear of the corresponding devices of the voltage tester at different usage stages in the historical data, and calculates the device abnormality interference risk of the voltage tester at the current time; The fault tolerance deviation fluctuation analysis unit analyzes the current time voltage tester fault tolerance deviation fluctuation rate by combining the scene environment information under the current application scene with the fluctuation deviation rate of the voltage tester detection data; The fault repair risk analysis module includes an operating state fault risk calculation unit and a fault repair risk probability analysis unit; The operation state fault risk calculation unit combines the usage information of the voltage tester itself and the maintenance data of the voltage tester in the historical data to analyze the operation state fault risk value of the voltage tester at the current time; The fault repair risk probability analysis unit obtains the fault repair risk probability of the voltage tester at the current time by combining the abnormal interference risk of the components of the voltage tester at the current time.

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