Device support for fusion facilities and dynamic performance testing method
By designing a device support for fusion facilities, employing a sliding plate made of radiation-resistant material, and using dynamic performance testing methods, the challenges of applying spherical vibration damping supports in nuclear facilities and conducting dynamic performance testing were solved, thereby improving seismic performance and service life.
Patent Information
- Application Number
- CN202511019563.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-23
- Publication Date
- 2025-11-21
- Estimated Expiration
- 2045-07-23
AI Technical Summary
Existing spherical vibration damping bearings cannot be used in nuclear facilities, and performance testing is mainly static, making it difficult to understand their dynamic performance in vibration environments.
Design a device support for a fusion facility, employing support components and damping components, including an upper support, a spherical crown structure, and a lower support, using a plane sliding plate and a spherical crown sliding plate made of radiation-resistant materials, and combining dynamic performance testing methods to simulate seismic environments to test the support performance.
It improves the seismic performance and service life of the device support in nuclear facilities, ensures safety and stability under dynamic loads, reduces radiation impact, and enhances vibration reduction effect.
Smart Images

Figure CN120527042B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of seismic resistance technology for nuclear fusion devices, and in particular to a device support for fusion facilities and a method for dynamic performance testing. Background Technology
[0002] Spherical bearings are mainly used for vibration reduction and load bearing in bridges and buildings. As one of the four major mechanical structural bearings, they are ideal shock absorbers due to their unique spherical contact surface design.
[0003] However, there is room for improvement in the structure of spherical damping bearings, and spherical bearings used in ordinary buildings or facilities cannot be used in nuclear facilities; moreover, most performance tests of spherical bearings are static tests, making it difficult to understand the dynamic performance parameters of spherical bearings in vibration environments. Summary of the Invention
[0004] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a device for fusion facilities and a dynamic performance testing method. The device for fusion facilities, while meeting structural design requirements for good seismic performance, utilizes radiation-resistant materials for both the spherical and planar sliding plates, enabling its use in nuclear facilities and extending its service life. Furthermore, the dynamic performance testing method for the device's supports helps simulate seismic environments, allowing for testing of the dynamic performance of the supports and thus understanding their seismic resistance.
[0005] According to an embodiment of the present invention, a device support for a fusion facility includes: a support assembly and a vibration damping assembly; the support assembly is adapted to be installed on a mounting surface; the vibration damping assembly includes an upper support, a spherical crown structure, and a lower support, the lower support being installed above the support assembly, the top of the lower support having a spherical groove, the bottom of the spherical crown structure having a mating spherical surface, the spherical crown structure being installed on the top of the lower support, and the mating spherical surface extending into the spherical groove, a spherical crown sliding plate being provided between the mating spherical surface and the inner wall of the spherical groove to form a spherical sliding fit, the upper support being installed on the top of the spherical crown structure, and a planar sliding plate being provided between the upper support and the spherical crown structure to form a planar sliding fit, the planar sliding plate and the spherical crown sliding plate being made of radiation-resistant material.
[0006] According to an embodiment of the present invention, a device support for a fusion facility can support the main fusion-related facilities on top of the device support, and connect to the ground or other foundation surface below the device support. The main fusion-related facilities can translate relative to the planar sliding plate, and the upper support can rotate relative to the spherical crown structure, which can play a role in shock absorption and vibration isolation. Furthermore, both the planar sliding plate and the spherical crown sliding plate are made of radiation-proof materials, thereby resisting the radiation influence of the main fusion-related facilities and extending the service life of the device support for the fusion facility.
[0007] According to an embodiment of the present invention, the device support for a fusion facility further includes a first sealing ring and a second sealing ring, wherein the first sealing ring is disposed on the outer periphery of the spherical cap sliding plate and the second sealing ring is disposed on the outer periphery of the planar sliding plate.
[0008] According to an embodiment of the present invention, a device support for a fusion facility has a lower support with an outer diameter larger than the outer diameter of the spherical crown structure. The spherical crown structure is positioned by a snap fastener, one end of which is connected to the edge of the lower support, and the other end of which presses against the upper edge of the spherical crown structure. The device support is adapted to remove the snap fastener during use.
[0009] According to an embodiment of the present invention, a device support for a fusion facility includes a plurality of fasteners, which are spaced apart circumferentially along the spherical cap structure and the lower support.
[0010] According to an embodiment of the present invention, a device support for a fusion facility has a planar sliding plate embedded in the spherical cap structure, and the thickness of the embedded plate is at least 1 / 2 of the thickness of the planar sliding plate.
[0011] According to an embodiment of the present invention, a device support for a fusion facility includes a lower support plate, an annular ring, a first flange, and a second flange. The lower support plate has an annular groove, in which the annular ring is engaged and extends axially outward. The first flange is disposed on the outer periphery of the annular ring, and the second flange abuts against the annular ring and the first flange in the axial direction of the first flange. The first flange, the second flange, and the lower support plate are connected by a second connector. A spherical crown structure is disposed on the inner periphery of the annular ring and the second flange.
[0012] According to an embodiment of the present invention, the device support for a fusion facility is wherein the annular ring is constructed by splicing together multiple arc-shaped metal blocks, and each of the arc-shaped blocks is installed in the annular groove after being cooled by liquid nitrogen.
[0013] According to an embodiment of the present invention, the device support for a fusion facility, wherein the planar sliding plate and the spherical sliding plate are made of a multilayer composite material of plastic and metal.
[0014] This invention also discloses a method for testing the dynamic performance of a device support, including: testing the dynamic compression parameters of the device support and testing the dynamic shear parameters of the device support.
[0015] The dynamic performance testing method for the device support in this embodiment of the invention verifies the bearing capacity and vibration reduction effect under dynamic loads by testing the dynamic compression parameters and dynamic shear parameters of the device support, thereby ensuring that the device support meets the safety and stability requirements under dynamic loads such as earthquakes and wind loads.
[0016] The dynamic performance testing method for a device support according to an embodiment of the present invention includes testing the dynamic compression parameters and dynamic shear parameters of the device support. Testing the dynamic compression parameters of the device support includes: measuring the average initial thickness of the device support; connecting the device support to a compression testing machine; pre-compressing the device support with the compression testing machine and then unloading it; continuing to apply sinusoidal compression loads for multiple cycles; plotting the force-displacement hysteresis curve of the device support for at least one cycle; calculating the dynamic compression modulus and dynamic compression damping based on the force-displacement hysteresis curve, and comparing them with the design rated values.
[0017] The dynamic performance testing method for the device support according to an embodiment of the present invention, wherein the continuous application of sinusoidal compressive loads for multiple cycles includes: applying sinusoidal compressive loads. , It's the loading frequency. This is the loading time, and it is compressed to a preset number of cycles.
[0018] The dynamic performance testing method for the device support according to this embodiment of the invention, wherein the calculation of the dynamic compression modulus and dynamic compression damping based on the force-displacement hysteresis curve and the comparison with the design rated values includes: calculating the dynamic compression modulus as follows: The formula for calculating dynamic compression damping is: ,in The difference between the maximum compressive load and the minimum compressive load, The difference between the maximum and minimum compression caused by compression. The area under the hysteresis curve.
[0019] The dynamic performance testing method for a device support according to an embodiment of the present invention includes testing the dynamic compression parameters and dynamic shear parameters of the device support. Testing the dynamic shear parameters of the device support includes: connecting the device support to a compression testing machine; measuring the average initial outer diameter of the upper support and calculating the area of the upper support; applying an axial preload; applying a horizontal sinusoidal shear load for multiple cycles; plotting the force-displacement hysteresis curve of the cyclic shear test of the device support for at least one cycle; calculating the dynamic shear modulus and dynamic shear damping, and comparing them with the design rated values.
[0020] The dynamic performance testing method for the device support according to this embodiment of the invention, wherein the calculation of dynamic shear modulus and dynamic shear damping, and the comparison with the design rated values, includes: the formula for dynamic shear modulus: The formula for calculating dynamic shear damping is: ,in Curved triangle and The area corresponds to twice the change in form energy of the sample in one cycle. The initial total thickness of the support for the device in the sample is given. The initial planar area of the upper support of the specimen. Shear displacement amplitude, The area under the hysteresis curve.
[0021] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description
[0022] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:
[0023] Figure 1 This is a three-dimensional structural schematic diagram of the device support according to an embodiment of the present invention;
[0024] Figure 2 This is a top view of the device support according to an embodiment of the present invention;
[0025] Figure 3 This is the device support of the embodiment of the present invention. Figure 2 A cross-sectional view along the AA direction;
[0026] Figure 4 This is a side view of the device support according to an embodiment of the present invention;
[0027] Figure 5 This is the device support of the embodiment of the present invention. Figure 3 Enlarged view of point A;
[0028] Figure 6 This is an exploded view of the device support according to an embodiment of the present invention;
[0029] Figure 7 This is a schematic diagram showing the relationship between the compression testing machine, the device support, and the control module during dynamic performance testing of the device support according to an embodiment of the present invention.
[0030] Figure 8 This is a schematic diagram of the force-displacement hysteresis curve of the device support during dynamic performance testing according to an embodiment of the present invention.
[0031] Figure 9 This is a schematic diagram of the process for performing dynamic compression performance testing on the device support according to an embodiment of the present invention;
[0032] Figure 10 This is a schematic diagram of the process for performing dynamic shear performance testing on the device support according to an embodiment of the present invention.
[0033] Figure label:
[0034] The device includes: support 100, compression testing machine 101, upper pressure plate 1011, lower bearing plate 1012, electrical control system 102, computer 1021, data acquisition and processing module 1022, test module 103, vertical displacement measuring device 104, horizontal displacement measuring device 105, average value curve 106, first load curve 107, second load curve 108, upper support 1, fastener 2, first connecting part 21, vertical limiting part 22, second connecting part 23, lower support 3, spherical groove 31, snap-fit groove 32, second flange 4, second connecting hole 41, first flange 5, first connecting hole 51, spherical crown structure 6, mating spherical surface 61, flat sliding plate 7, spherical crown sliding plate 8, annular ring 9, arc block 91, second connector 10, second sealing ring 11, first sealing ring 12, lower support plate 13, annular groove 131, third connecting hole 132, and first connector 14. Detailed Implementation
[0035] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.
[0036] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, features defined with "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, unless otherwise stated, "a plurality of" means two or more.
[0037] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.
[0038] The following is for reference. Figures 1-6 The device support 100 for a fusion facility according to an embodiment of the present invention is described. While meeting the structural design requirements to achieve good seismic performance, the spherical cap sliding plate 8 and the planar sliding plate 7 are made of radiation-resistant materials that can be used in nuclear facilities to extend their service life. Furthermore, the dynamic performance testing method of the device support 100 helps to simulate the scenario in an earthquake environment, test and calculate the dynamic performance of the device support 100, thereby understanding the seismic performance of the device support 100.
[0039] like Figure 1-6 As shown, a device support 100 for a fusion facility according to an embodiment of the present invention includes: a support assembly and a shock-absorbing assembly.
[0040] The support assembly is suitable for installation on the mounting surface; the damping assembly includes an upper support 1, a spherical crown structure 6, and a lower support 3. The lower support 3 is installed above the support assembly, and a spherical groove 31 is formed on the top of the lower support 3. The bottom of the spherical crown structure 6 has a mating spherical surface 61. The spherical crown structure 6 is installed on the top of the lower support 3, and the mating spherical surface 61 extends into the spherical groove 31. A spherical crown sliding plate 8 is provided between the mating spherical surface 61 and the inner wall of the spherical groove 31 to form a spherical sliding fit. The upper support 1 is installed on the top of the spherical crown structure 6. A planar sliding plate 7 is provided between the upper support 1 and the spherical crown structure 6 to form a planar sliding fit. The planar sliding plate 7 and the spherical crown sliding plate 8 are made of radiation-resistant material.
[0041] In practice, the support component is connected below the shock absorber component, and the bottom of the support component is connected to the mounting surface or other base surface. The upper support 1 of the shock absorber component is used to connect the main facilities related to nuclear fusion. The support component is used to fix and support the shock absorber component to maintain its stability. The upper part of the shock absorber component is the upper support 1, which can be constructed as an upper support plate to facilitate the connection and support of the main facilities related to nuclear fusion.
[0042] When earthquakes or wind loads occur, the main facilities related to nuclear fusion will vibrate. A planar sliding plate 7 is installed between the upper support 1 of the device support 100 and the spherical crown structure 6. The surface of the planar sliding plate 7 is relatively smooth, allowing a translational friction pair to form between the upper support 1 and the planar sliding plate 7. If the coefficient of friction between the planar sliding plate 7 and the spherical crown sliding plate 8 is maintained at 0.02-0.25, and the upper support 1 has translational freedom relative to the planar sliding plate 7, and the spherical crown structure 6 is located within the spherical groove 31 containing the spherical crown sliding plate 8, the spherical crown structure 6, the upper support 1, and the main facilities related to nuclear fusion connected to the upper support 1 can also have rotational freedom relative to the spherical crown sliding plate 8. Therefore, during vibrations, the vibration can be mitigated or even isolated. In other words, the device support 100 prevents earthquake vibrations from being directly transmitted to the main facilities related to nuclear fusion through rigid transmission.
[0043] Furthermore, the compressive strength of the materials of the flat slide plate 7 and the spherical crown slide plate 8 can be set to 200MPa, which means that the flat slide plate 7 and the spherical crown slide plate 8 can withstand greater stress without failure when subjected to compressive load, thereby improving the load-bearing capacity of the entire device support 100.
[0044] Additionally, it should be noted that the flat sliding plate 7 and the dome-shaped sliding plate 8 can be made of radiation-resistant materials. Radiation-resistant materials can reduce the radiation of the device support 100 in the nuclear fusion environment. When the flat sliding plate 7 and the dome-shaped sliding plate 8 are exposed to radiation, it may cause changes in the internal structure of the flat sliding plate 7 and the dome-shaped sliding plate 8, making them fragile and brittle. Radiation can also cause discoloration of the surface of the flat sliding plate 7 and the dome-shaped sliding plate 8, cracks and expansion, as well as a decrease in durability and stability. Therefore, by making the flat sliding plate 7 and the dome-shaped sliding plate 8 into radiation-resistant materials, the seismic resistance of the device support 100 is ensured, which means that the lifespan of the flat sliding plate 7 and the dome-shaped sliding plate 8 is improved, thereby improving the service life of the entire device support 100.
[0045] Therefore, in this embodiment of the invention, by allowing the upper support 1 and the nuclear fusion-related facilities to have translational freedom relative to the planar sliding plate 7, and the spherical cap structure 6 to have rotational freedom relative to the spherical cap sliding plate 8, a vibration reduction effect can be achieved. Furthermore, the planar sliding plate 7 and the spherical cap sliding plate 8 are made of materials with a low coefficient of friction, which improves the smoothness of translation of the upper support 1 and the nuclear fusion-related facilities relative to the planar sliding plate 7, and improves the smoothness of rotation of the spherical cap structure 6 relative to the spherical cap sliding plate 8, thereby improving the vibration reduction effect. In addition, the planar sliding plate 7 and the spherical cap sliding plate 8 are also made of radiation-resistant materials, which can reduce the radiation effect of the nuclear fusion-related facilities on the materials of the planar sliding plate 7 and the spherical cap sliding plate 8, and improve the lifespan of the planar sliding plate 7 and the spherical cap sliding plate 8.
[0046] In some embodiments, the device support 100 for a fusion facility further includes a first sealing ring 12 and a second sealing ring 11, wherein the first sealing ring 12 is disposed on the outer periphery of the spherical cap slide plate 8 and the second sealing ring 11 is disposed on the outer periphery of the planar slide plate 7.
[0047] In practice, the arc of the spherical crown slide plate 8 matches that of the spherical groove 31 of the lower support 3, and the spherical crown slide plate 8 is placed in the spherical groove 31. A first sealing ring 12 is set on the outer periphery of the spherical crown slide plate 8. After the first sealing ring 12 is set, the spherical crown structure 6 can be placed on the spherical crown slide plate 8 and maintain the freedom of rotation with the spherical crown slide plate 8. Then, a flat slide plate 7 is set on the upper part of the spherical crown structure 6, and a second sealing ring 11 is set on the outer periphery of the flat slide plate 7. This realizes the protection of the spherical crown slide plate 8 by the first sealing ring 12 and the protection of the flat slide plate 7 by the second sealing ring 11, preventing dust from entering the flat slide plate 7 or the spherical crown slide plate 8 and wearing down the surface of the flat slide plate 7 and the spherical crown slide plate 8.
[0048] Dust entering the flat slide plate 7 or the spherical slide plate 8 may affect the degree of freedom of translation of the upper support 1 and nuclear fusion-related facilities relative to the flat slide plate 7, and also affect the degree of freedom of rotation of the spherical structure 6 relative to the spherical slide plate 8. Therefore, by setting the first sealing ring 12 and the second sealing ring 11, the entry of dust into the spherical slide plate 8 and the flat slide plate 7 can be reduced, thereby improving the protection of the spherical slide plate 8 and the flat slide plate 7, ensuring that the degree of freedom of translation of the upper support 1 and nuclear fusion-related facilities relative to the flat slide plate 7 is within the required range, and also ensuring that the degree of freedom of rotation of the spherical structure 6 relative to the spherical slide plate 8 is within the required range, thereby improving the seismic resistance of the device support 100.
[0049] It should be noted that after the spherical crown slide plate 8 is directly placed into the spherical groove 31 of the lower support 3, since the structure of the spherical groove 31 is concave and the first sealing ring 12 is provided on the outside, the first sealing ring 12 will expand to both sides when it is compressed, which will further hinder the movement of the spherical crown slide plate 8. Therefore, the stability of the spherical crown slide plate 8 installed in the spherical groove 31 of the lower support 3 can be guaranteed.
[0050] In some embodiments, the outer diameter of the lower support 3 is larger than the outer diameter of the spherical crown structure 6. The spherical crown structure 6 is positioned by a snap fastener 2. One end of the snap fastener 2 is connected to the edge of the lower support 3, and the other end presses against the upper edge of the spherical crown structure 6. The device support 100 is suitable for removing the snap fastener 2 when in use.
[0051] In actual installation, after the support components are installed, the lower support 3 is installed, the spherical crown slide plate 8 is placed in the spherical groove 31 of the lower support 3, and the first sealing ring 12 is installed. Then the spherical crown structure 6 is installed, and the flat slide plate 7 is installed above the spherical crown structure 6. Then the second sealing ring 11 is installed around the flat slide plate 7. One end of the fastener 2 is connected to the upper edge of the lower support 3, and the other end of the fastener 2 is pressed against the upper edge of the spherical crown structure 6. By setting the fastener 2, the installation and positioning of the spherical crown structure 6, the flat slide plate 7, and the spherical crown slide plate 8 are achieved, correcting the offset phenomenon that occurs in the aforementioned installation process. In addition, during subsequent transportation, the rotation phenomenon of the spherical crown structure 6 relative to the lower support 3 and the translational sliding phenomenon of the upper support 1 relative to the flat slide plate 7 can also be reduced. In actual use, the fastener 2 can be removed, and then the bottom of the device support 100 is connected to the foundation installation surface, and the upper part of the upper support 1 is used to connect the nuclear fusion related facilities.
[0052] Specifically, the cross-sectional structure of the fastener 2 is similar to that of a Z-shaped fastener 2, as shown in the reference. Figure 3 and Figure 4 As shown, the Z-shaped fastener 2 includes a first connecting part 21, a vertical limiting part 22, and a second connecting part 23 connected together. The first connecting part 21 and the second connecting part 23 are parallel. The vertical limiting part 22 abuts against the outer surface of the spherical crown structure 6. The first connecting part 21 is connected to the upper edge of the lower support 3 through a first connecting member 14. The first connecting member 14 is an internal hex bolt. Internal hex bolts can withstand greater loads, making tightening more secure. Moreover, disassembling internal hex bolts requires the use of a special wrench, which makes it difficult for ordinary personnel to disassemble easily, thereby increasing the safety of use to a certain extent. In addition, the fastener 2 can extend along the circumference of the lower support 3 to increase the contact area of the fastener 2 with the spherical crown structure 6, thereby achieving better positioning of the side and top surfaces of the spherical crown structure 6 and improving the stability of the spherical crown structure 6.
[0053] In some embodiments, multiple fasteners 2 are provided, and the multiple fasteners 2 are spaced apart along the circumferential direction of the spherical crown structure 6 and the lower support 3.
[0054] In practice, the fasteners 2 can be set to four, five, six, etc. In this embodiment of the invention, four fasteners 2 are set. The four fasteners 2 are distributed at equal intervals along the circumference of the lower support 3 and the spherical crown structure 6. First, two fasteners 2 can be set to be distributed opposite each other. Both fasteners 2 are connected to the upper edge of the lower support 3 through the first connector 14, and the line connecting the centers of the two fasteners 2 passes through the center of the spherical crown structure 6 and the lower support 3. At this time, the position of the spherical crown structure 6 and the lower support 3 can be kept in a relatively stable state. Then, the other two fasteners 2 are connected to the lower support 3 through the first connector 14. At this time, the four fasteners 2 are distributed at 90 degrees in pairs at four positions around the circumference of the spherical crown structure 6 and the lower support 3. The vertical limiting part 22 of the fastener 2 presses against the outer peripheral wall of the spherical crown structure 6, thereby improving the stability of the spherical crown structure 6, reducing the offset problem during the installation of the spherical crown structure 6, the spherical crown slide plate 8, and the flat slide plate 7, and also ensuring that no offset occurs during transportation.
[0055] In some embodiments, the flat slide plate 7 is embedded in the spherical crown structure 6, and the thickness of the embedded part is at least 1 / 2 of the thickness of the flat slide plate 7.
[0056] Specifically, in combination Figure 3 and Figure 5 As shown, the upper end of the spherical crown structure 6 is provided with a snap-fit groove 32. The size of the snap-fit groove 32 is adapted to the size of the flat slide plate 7. The flat slide plate 7 is snapped into the snap-fit groove 32, thereby improving the convenience of installation of the flat slide plate 7 and the spherical crown structure 6, and making it easy to replace when the flat slide plate 7 needs to be replaced.
[0057] The thickness of the flat plate 7 embedded in the spherical crown structure 6 is set to at least 1 / 2 of the thickness of the flat plate 7. For example, the thickness of the flat plate 7 embedded in the spherical crown structure 6 can be 1 / 2, 3 / 4, etc., which can improve the stability and reliability of the installation of the flat plate 7 and the spherical crown structure 6. When nuclear fusion-related facilities are pressed against the flat plate 7 by the upper support 1, and when the flat plate 7 has a horizontal degree of freedom, the risk of the flat plate 7 loosening can be reduced.
[0058] In some embodiments, refer to Figure 3 As shown, the support assembly includes a lower support plate 13, an annular ring 9, a first flange 5, and a second flange 4. The lower support plate 13 has an annular groove 131, in which the annular ring 9 is engaged and extends axially out of the annular groove 131. The first flange 5 is located on the outer periphery of the annular ring 9, and the second flange 4 abuts against the annular ring 9 and the first flange 5 in the axial direction of the first flange 5. The first flange 5, the second flange 4, and the lower support plate 13 are connected by a first connector 14. A spherical crown structure 6 is located on the inner periphery of the annular ring 9 and the second flange 4.
[0059] In practice, combined with Figure 3and Figure 6 As shown, when connecting the support assembly, firstly, the lower support plate 13 is placed on the mounting surface of the foundation. Then, the annular ring 9 is inserted into the annular groove 131 of the lower support plate 13. At this time, the annular ring 9 extends axially upward from the annular groove 131. Next, the first flange 5 is placed on the outer periphery of the annular ring 9, and the lower support 3 is installed. Then, the second flange 4 is fitted onto the outer periphery of the lower support 3 and presses against the annular ring 9 and the upper end face of the first flange 5. The first flange 5 has a first connecting hole 51, the second flange 4 has a second connecting hole 41, and the upper end face of the lower support plate 13 has a third connecting hole 132. The second connecting piece 10 passes through the second connecting hole 132. The second connecting hole 41 of the first flange 4, the first connecting hole 51 of the first flange 5, and the third connecting hole 132 of the lower support plate 13 are connected. At this time, the inner circumference of the first flange 5 presses against the inner circumference of the annular ring 9. The inner circumference of the annular ring 9 is used to limit the circumferential and radial directions of the lower support 3. That is, the lower support 3 can be tightened by the action of the first flange 5, the annular ring 9, and the second flange 4, thereby improving the stability of the lower support 3. At the same time, when the spherical crown structure 6 has the freedom of rotation relative to the spherical crown sliding plate 8 connected to the lower support 3, the lower support 3 always remains stable. That is, while reducing vibration, it can also improve the support stability of the device support 100.
[0060] Specifically, the lower support plate 13, the first flange 5, the second flange 4, the lower support 3, and the spherical crown structure 6 are all made of metal materials. If they are made of stainless steel, their strength and durability will be improved.
[0061] In some embodiments, such as Figure 6 As shown, the annular ring 9 is constructed by splicing together multiple arc-shaped metal blocks 91, and each arc-shaped block 91 is installed in the annular groove 131 after being cooled by liquid nitrogen.
[0062] In practice, liquid nitrogen has a very low temperature, typically between -182.9622℃ and -222.65℃. The annular ring 9 is made of metal. Before installing the annular ring 9, multiple arc-shaped blocks 91 can be cooled by liquid nitrogen, so that the arc-shaped blocks 91 can be installed in the annular groove 131 of the lower support plate 13. The multiple arc-shaped blocks 91 are spliced together, so that the annular ring 9 formed by splicing multiple arc-shaped blocks 91 matches the circumferential and radial dimensions of the annular groove 131. In other words, the multiple arc-shaped blocks 91 are manufactured with positive tolerances. After being installed in the annular groove 131, they will naturally tighten once the temperature returns to room temperature. Facing the continuous heat release and cooling of nuclear fusion, such as when a fusion experiment is initiated and the internal temperature is heated to a very high level, and then decreasing as the experiment progresses, this continuous heat release and cooling can cause the second connector 10 to face the risk of preload loss, making the bolts prone to failure under thermal shock and vibration. The nuclear fusion reaction generates heat, and when the multiple arc-shaped blocks 91 expand due to heat, they can tighten radially, pressing against the outer wall of the lower support 3 and the second flange 4. Therefore, even when the bolts face failure, the thermally expanded annular ring 9 can still improve the stability of the support assembly for the lower support 3. It should be noted that the arc-shaped blocks 91 are installed at a very low temperature, exhibiting thermal expansion compared to the external environment and the temperature of the fusion reaction.
[0063] In some embodiments, the flat slide plate 7 and the spherical slide plate 8 are made of a multilayered plastic-metal composite material. Specifically, both the flat slide plate 7 and the spherical slide plate 8 are made of DU metal polymer composite material. DU metal polymer composite material refers to a sliding friction-reducing material with plastic as a solid lubricant, thus giving the flat slide plate 7 and the spherical slide plate 8 a self-lubricating effect. For example, both the flat slide plate 7 and the spherical slide plate 8 can be configured to consist of a steel backing layer, a porous bronze sintered layer, and a sliding layer. The sliding layer can be a PTFE-based self-lubricating composite material with added lead (Pb). Using this material, the flat slide plate 7 and the spherical slide plate 8 can resist radiation of 106 Gy. Table 1 below compares the coefficient of friction, compressive strength, radiation resistance, and other parameters of the DU metal polymer composite material with those of other existing materials.
[0064] Table 1. Parameter Performance Comparison Table
[0065]
[0066] This demonstrates that PTFE materials are sensitive to radiation, meaning they exhibit adverse reactions when exposed to radiation. DU metal polymer composites, on the other hand, have low radiation sensitivity, making them suitable for nuclear facilities. Furthermore, the friction coefficient of DU metal polymer composites can range from 0.02 to 0.25, which is a wider range than that of PTFE, encompassing the friction coefficient range of PTFE. Additionally, DU materials have higher compressive strength than PTFE, resulting in better load-bearing capacity. Therefore, DU metal polymer composites offer even more advantages when used in nuclear fusion facilities.
[0067] The present invention also proposes a dynamic performance testing method for a device support 100, including: testing the dynamic compression parameters and dynamic shear parameters of the device support 100.
[0068] In practice, dynamic compression parameters include dynamic compression modulus and dynamic compression damping, while dynamic shear parameters include dynamic shear modulus and dynamic shear damping.
[0069] Firstly, the dynamic compressive modulus and dynamic compressive damping of the device support 100 are important parameters for evaluating its seismic resistance. The dynamic compressive modulus refers to the elastic modulus of the material of the device support 100 under dynamic loads, reflecting its deformation and recovery capabilities under dynamic loads. A higher dynamic compressive modulus means that the device support 100 can better resist deformation and maintain structural stability under dynamic loads such as earthquakes. By testing the dynamic compressive modulus, the performance of the device support 100 under extreme conditions such as earthquakes can be evaluated, ensuring that the selected device support 100 can function normally under dynamic loads and protect the safety of the building.
[0070] Furthermore, dynamic compressive damping refers to the energy dissipation capability of the support 100 under dynamic loads. The greater the dynamic compressive damping, the more energy the support 100 dissipates during vibration, thereby reducing the amplitude and frequency of structural vibrations and improving structural stability. Dynamic compressive damping is crucial for mitigating the impact of earthquakes. By testing the dynamic compressive damping of the support 100, its seismic reduction effect during earthquakes can be evaluated, ensuring that the structure can better withstand vibrations during earthquakes and protecting the safety of the building.
[0071] Furthermore, the dynamic shear modulus refers to the ratio of the in-phase shear stress component to the shear strain. It is an indicator for evaluating the mechanical properties of a material under dynamic shear stress. The magnitude of the dynamic shear modulus reflects the material's ability to resist deformation under dynamic shear stress. Its value reveals the material's elastic properties, viscoelastic behavior, and structural stability, that is, it represents the ability of the device support 100 material to resist shear deformation under shear stress. The dynamic shear modulus directly affects the rigidity and energy dissipation capacity of the device support 100. A higher dynamic shear modulus means that the device support 100 can better resist deformation under seismic loading, thereby reducing the vibration and displacement of the nuclear fusion-related facilities supported by the device support 100.
[0072] Dynamic shear damping refers to the ability of the device support 100 to dissipate energy during shear deformation, which is mainly achieved through the damping effect. The damping effect can reduce the transmission of seismic energy to the nuclear fusion-related facilities supported by the device support 100, thereby reducing the acceleration response and seismic force of the nuclear fusion-related facilities. The greater the dynamic shear damping, the stronger the energy dissipation capacity of the device support 100 in an earthquake, which can effectively reduce the vibration and damage to the nuclear fusion-related facilities.
[0073] Therefore, the dynamic compression modulus and dynamic shear modulus can be used to evaluate the stiffness of the device support 100 in different directions, while the dynamic compression damping and dynamic shear damping can be used to evaluate the energy consumed by the device support 100 during vibration in different directions, thereby comprehensively evaluating the seismic resistance of the device support 100.
[0074] In some embodiments, the dynamic compression parameters and dynamic shear parameters of the test device support 100 include: the dynamic compression parameters of the test device support 100, referring to... Figure 9 The following are included:
[0075] S1: The average initial thickness of the measuring device support 100; Since it is necessary to observe the change in thickness of the entire structure of the device support 100 when subjected to compressive force when measuring the compression-related parameters of the device support 100, the average initial thickness of the device support 100 can be used as the initial amount of thickness. Then, when pressure is applied, it is convenient to measure the effect of pressure on the thickness, thereby measuring the thickness change. For example, multiple measurements can be taken from different positions, and then the average thickness can be taken to improve the accuracy of the initial thickness measurement.
[0076] S2: Connect the device support 100 and the compression testing machine 101; refer to... Figure 7 As shown, Figure 7The test module 103 includes a compression testing machine 101, which includes an upper pressure plate 1011 and a lower support plate 1012. The upper pressure plate 1011 can be connected to the upper support 1 of the device support 100, and the lower support plate 1012 can be connected to the lower support plate 13 of the device support 100. This prepares the device support 100 for the compression testing machine 101 to apply pressure vertically, which facilitates the control of the applied pressure.
[0077] S3: Compression testing machine 101 preloads the device support 100 and then unloads it. In practice, before preloading, it is necessary to check the accuracy of the vertical displacement measuring device 104. The vertical displacement measuring device 104 is used to measure the thickness of the device support 100 each time to obtain the compression amount, ensuring the accuracy of the vertical displacement measuring device 104, thereby improving the accuracy of parameters throughout the testing process. Then, a preload check is performed at 5% of the rated bearing capacity of the device support 100, applying an axial preload to reach the rated load. F The load remains constant at 0 for 30 seconds, then is unloaded. The purpose of preloading is to eliminate inelastic compression and inelastic settlement deformation of the device support 100 under load, thereby ensuring the stability and accuracy of the device support 100. Furthermore, preloading allows for the collection of deformation data of the device support 100 and the foundation. This data is crucial for subsequent construction and maintenance, preventing settlement problems caused by uneven foundation conditions; preloading allows for the early detection and resolution of these issues.
[0078] S4: Continue applying sinusoidal compressive loads over multiple cycles. Sinusoidal compressive loads can be used to conduct fatigue tests on the material of the device support 100, studying its fatigue performance and strength under alternating loads. Furthermore, sinusoidal loads can simulate periodic vibrations in actual earthquakes. By applying sinusoidal loads, the performance of the device support 100 during earthquakes can be better evaluated. Sinusoidal loads have periodicity and cyclicity, reflecting the dynamic characteristics of seismic waves.
[0079] S5: Plot the force-displacement hysteresis curve of the device support 100 for at least one cycle; record and observe the relationship between the applied load and the compression curve. For example, during actual compression, a sinusoidal load can be applied for five cycles. By setting five cycles, we can understand whether it has stability under cyclic load. For example, whether the load cycle curves of different cycles are consistent can determine whether it is stable. We can select the middle cycle, that is, the data of the third cycle, to plot the force-displacement curve and calculate the dynamic compression modulus and dynamic compression damping. Of course, the fifth cycle can also be selected. We can also calculate the data of each cycle and take the average value.
[0080] It should be noted that in engineering design, hysteresis curves are used to evaluate the seismic performance and energy dissipation capacity of a structure. A hysteresis curve is a closed curve representing the force-displacement (or stress-strain) relationship of a structure or material under cyclic loading. It reflects the displacement and restoring force characteristics generated under a certain force. The area enclosed by the hysteresis curve represents energy loss, i.e., the damping effect; the larger the area, the greater the energy loss and the more pronounced the damping effect. The compressive modulus is the ratio of stress to strain in the elastic stage of a material, representing its stiffness. In the hysteresis curve, the slope in the elastic stage is the elastic modulus of the material.
[0081] S6: Calculate the dynamic compression modulus and dynamic compression damping based on the force-displacement hysteresis curve and compare them with the design ratings. Specifically, the dynamic compression modulus can be calculated from the slope of the force-displacement hysteresis curve. The hysteresis curve reflects the relationship between force and deformation under cyclic loading, and the area enclosed by the curve represents the energy dissipation of the structure within one vibration cycle. More specifically, the larger the area enclosed by the hysteresis curve, the more energy the device support 100 consumes during vibration, which directly affects the damping characteristics of the device support 100. Furthermore, by calculating the dynamic compression modulus and dynamic compression damping using the formula and comparing them with relevant data showing good seismic resistance, the seismic performance of the device support 100 can be understood. This facilitates the selection of a safer device support 100 or further research and improvement of the seismic performance of the device support 100.
[0082] Additionally, it should be noted that the first sealing ring 12 and the second sealing ring 11 are elastic materials, the flat sliding plate 7 and the spherical crown sliding plate 8 are non-metallic materials, which also have a certain degree of elasticity, and the others can all be made of metallic materials, such as stainless steel. Metallic materials also have elasticity, while the first sealing ring 12 and the second sealing ring 11 are hyperelastic materials. In this embodiment of the invention, the compression of the entire device support 100 is recorded and observed in order to calculate the dynamic compression modulus and dynamic compression damping.
[0083] In some embodiments, continuing to apply a sinusoidal compressive load for multiple cycles includes: applying a sinusoidal compressive load. , It's the loading frequency. This is the loading time, and it is compressed to a preset number of cycles.
[0084] in, This represents the superposition of a constant compressive force and a periodic fluctuating force. F 0 represents the static part of the load, indicating a constant compressive force that provides a basic compressive effect, ensuring that the device support 100 is always under pressure. Represents a dynamic force that varies with a sine wave. The rate of change of dynamic force is related to the period. By setting the applied load to the sine function setting, the force can be controlled more precisely, and the force can be gradually increased or decreased. This can better simulate the periodic vibration in actual earthquakes and better evaluate the performance of the device support 100 in earthquakes. The sine function load has periodicity and cyclicity, which can reflect the dynamic characteristics of seismic waves.
[0085] In some embodiments, calculating the dynamic compression modulus and dynamic compression damping based on the force-displacement hysteresis curve and comparing them with the design rated values includes: calculating the dynamic compression modulus as follows: The formula for calculating dynamic compression damping is: ,in The difference between the maximum compressive load and the minimum compressive load, The difference between the maximum and minimum compression caused by compression. The area under the hysteresis curve.
[0086] Specifically, the dynamic compression modulus is calculated based on the force-displacement curve. The compression modulus is related to the maximum compression load, minimum compression load, maximum compression amount, and minimum compression amount. The compression amount is recorded by recording the thickness change through the vertical displacement measuring device 104. The vertical displacement measuring device 104 transmits the calculation results to the data acquisition and processing module 1022 of the electronic control system 102 and the computer 1021, thereby realizing the automatic transmission, recording, and processing of data, and obtaining the required data more intuitively.
[0087] When calculating dynamic compression damping, dynamic compression damping The area enclosed by the force-displacement hysteresis curve can be used as a measure, or the following formula can be used: Among them, refer to Figure 8 As shown, The area enclosed by the first load curve 107 and the second load curve 108 is calculated. The hysteresis curve corresponds to the loading and unloading processes. Although the compression amounts during loading and unloading are the same, they correspond to different processes. Therefore, when the device support 100 is subjected to sinusoidal load compression, the load corresponding to the same displacement (compression amount) will have two different values. Moreover, because the material consumes energy during loading and unloading, the first load curve 107 and the second load curve 108 do not coincide, forming a closed hysteresis loop. The area of this hysteresis loop (i.e., the area enclosed by the first load curve 107 and the second load curve 108) is calculated. Figure 8 The area enclosed by the first load curve 107 and the second load curve 108 represents the energy consumed by the device support 100 under repeated loads. Curved triangle and The area of the triangle, the sum of the areas of the two triangles, is the elastic strain energy stored during loading and unloading, that is... Figure 8 By calculating the areas of the two shaded regions, the dynamic compressive damping can be determined, allowing us to assess whether the support 100 possesses good seismic resistance in a simulated earthquake environment.
[0088] because , combined as well as , then Substitute into the formula achievable , combined as well as , can also be Converted to In other words, dynamic compression damping can also be achieved through... calculate.
[0089] It should be noted that calculating the shaded area... and At that time, one side of the curved triangle is the average value curve 106 of the corresponding positions of the first load curve 107 and the second load curve 108. If the stress-strain curve is not perfectly linear, but the change is relatively gentle, and It represents the energy consumed repeatedly. The area can be approximated by taking the average curve 106, which simplifies the calculation process and improves the accuracy of the calculation.
[0090] In some embodiments, the dynamic compression parameters and dynamic shear parameters of the test device support 100 include: the dynamic shear parameters of the test device support 100, referring to... Figure 10 As shown, it includes:
[0091] S10: Connect the device support 100 and the compression testing machine 101; for example, the lower support plate 13 can be connected to the lower bearing plate 1012 of the compression testing machine 101 to facilitate the application of a horizontally moving load to the device support 100, thereby preparing for the measurement of shear-related parameters, that is, the shear at this time is mainly horizontal shear.
[0092] S20: Measure the average initial outer diameter of the upper support 1 and calculate the area of the upper support 1; that is, measure the outer diameter of the upper support 1 multiple times, average the results of the multiple measurements to obtain the average initial outer diameter, and then calculate the area of the upper support 1. Since the shear modulus is the ratio of shear stress to shear strain when calculating the shear modulus, and the magnitude of the stress is related to the contact area, pressure, etc., the area of the upper support 1 is first calculated. This is so that the shear modulus can be calculated later.
[0093] S30: Axial preload preset load; the rated load is achieved by applying axial preload through a testing machine. The purpose of the circumferential preload is the same as that of the axial preload before testing the compression modulus and compression damping, which is to eliminate the inelastic compression, inelastic settlement and other deformations of the device support 100 under load, thereby ensuring the stability and accuracy of the device support 100.
[0094] S40: Apply horizontal sinusoidal shear loads for multiple cycles; the sinusoidal function can simulate the changes in dynamic horizontal loads, making the test results closer to the application scenario of device support 100 in earthquakes. Furthermore, by applying the sinusoidal function, the material response of device support 100 at different frequencies can be analyzed in detail. This helps to understand the shear performance of device support 100 material at different frequencies, thereby optimizing the design and selecting appropriate material parameters.
[0095] S50: Plot the force-displacement hysteresis curve of the cyclic shear test of the device support 100 for at least one cycle; conduct 5 cycles of cyclic loading test for each shear displacement amplitude-frequency combination; if the dynamic shear modulus and dynamic shear damping can be calculated by plotting the shear load and shear displacement hysteresis curve of the third cycle, the seismic performance of the device support 100 in the dynamic environment can be obtained, thereby selecting or designing a device support 100 with better seismic performance.
[0096] S60: Calculate the dynamic shear modulus and dynamic shear damping, and compare them with the design ratings. The dynamic shear modulus of the device support 100 refers to the ratio of shear stress to shear strain of the material of the device support 100 under dynamic load. The magnitude of the dynamic shear modulus directly affects the stiffness and seismic performance of the device support 100. A higher dynamic shear modulus can provide greater stiffness and stability of the device support 100 under seismic loading, reducing the vibration and displacement of the structure supported by the device support 100. However, an excessively high dynamic shear modulus may also cause the device support 100 to fail prematurely during an earthquake. Therefore, the dynamic shear modulus and dynamic shear damping are calculated to make trade-offs in the design and selection of the device support 100.
[0097] Dynamic shear damping is the ability of the support device 100 to dissipate energy through internal friction and material viscosity when subjected to shear deformation, thereby reducing the vibration of the supported structure. The magnitude of dynamic shear damping directly affects the energy dissipation effect and seismic performance of the support device 100. Higher dynamic shear damping allows the support device 100 to absorb more energy during an earthquake, reducing the seismic force transmitted to the supported structure and thus protecting it from damage. The characteristics of dynamic shear damping enable the support device 100 to return to equilibrium more quickly during an earthquake, reducing the impact of the earthquake on the supported structure.
[0098] In some embodiments, calculating the dynamic shear modulus and dynamic shear damping, and comparing them with design ratings, includes: the formula for the dynamic shear modulus: The formula for calculating dynamic shear damping is: ,in Curved triangle and The area corresponds to twice the change in form energy of the sample in one cycle. This represents the initial total thickness of the support 100 in the sample. The initial planar area of the upper support 1 of the specimen. Shear displacement amplitude, The area under the hysteresis curve. It can be measured by the horizontal displacement measuring device 105.
[0099] In practice, the formula for calculating the dynamic shear modulus... According to the stress-strain relationship, , For stress With strain The ratio can be calculated using the following formula. :
[0100] .
[0101] Stress is the force per unit area within an object, and its calculation formula is: , The area under stress is the load-bearing surface. Strain is the change in displacement compared to the original thickness; that is, shear strain is the change in horizontal displacement compared to the original thickness, and compressive strain is the change in vertical displacement compared to the original thickness. Here, we are calculating shear strain. It is the difference between the maximum shear load and the minimum shear load. Given the initial total thickness of the support 100 in the sample, then corresponding to... Figure 8 In the middle, the stress in one direction is Similarly, the strain should be... , for Figure 8 medium curve triangle and The area is calculated by taking the curve triangle, where one side is the average value curve 106 corresponding to the positions of the first load curve 107 and the second load curve 108. This improves the accuracy of the calculated area, thereby improving the accuracy of the final calculated dynamic shear modulus. Therefore, the dynamic shear modulus is obtained. , This represents the initial planar area of the upper support 1 in this embodiment of the invention.
[0102] In addition, dynamic shear damping The area enclosed by the force-displacement hysteresis curve is used as the metric, and the formula is as follows:
[0103] , Curved triangle and area, The area under the hysteresis curve ( Figure 8 (The area enclosed between the first load curve 107 and the second load curve 108). This makes it easier to calculate the dynamic shear damping of the device support 100, thus allowing for a final comparison of the shear damping of the device support 100 with the specified shear damping, selecting the ultimately required dynamic shear damping, or improving the relevant parameters of the current device support 100 to change its dynamic shear damping and dynamic shear modulus.
[0104] Therefore, the embodiments of the present invention make up for the deficiency of existing testing methods that only have static testing methods, and provide a method for calculating dynamic stiffness (modulus) and dynamic damping, which more realistically simulates the seismic environment. The calculated dynamic parameters can be compared with the rated design values to determine whether the design requirements are met. They can also be used as important parameter inputs when performing vibration analysis on the main structure of the supported nuclear fusion facility, and accurately verify the dynamic response of the main structure.
[0105] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0106] Although embodiments of the invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
Claims
1. A device support for a fusion facility, characterized in that, include: Support assembly, the support assembly being adapted to be mounted on a mounting surface; A vibration damping assembly includes an upper support, a spherical crown structure, and a lower support. The lower support is installed above the support assembly, and a spherical groove is formed on the top of the lower support. The bottom of the spherical crown structure has a mating spherical surface. The spherical crown structure is installed on the top of the lower support, and the mating spherical surface extends into the spherical groove. A spherical crown sliding plate is provided between the mating spherical surface and the inner wall of the spherical groove to form a spherical sliding fit. The upper support is installed on the top of the spherical crown structure, and a planar sliding plate is provided between the upper support and the spherical crown structure to form a planar sliding fit. The planar sliding plate and the spherical crown sliding plate are made of radiation-resistant material. The support assembly includes a lower support plate, an annular ring, a first flange, and a second flange. The lower support plate has an annular groove, in which the annular ring is engaged and extends axially outward. The first flange is located on the outer periphery of the annular ring, and the second flange abuts against the annular ring and the first flange axially. The first flange, the second flange, and the lower support plate are connected by a second connector. The spherical crown structure is located on the inner periphery of the annular ring and the second flange. The annular ring is constructed by splicing together multiple arc-shaped metal blocks, and each arc-shaped block is installed in the annular groove after being cooled by liquid nitrogen.
2. The device support for a fusion facility according to claim 1, characterized in that, It also includes a first sealing ring and a second sealing ring, the first sealing ring being disposed on the outer periphery of the spherical crown slide plate, and the second sealing ring being disposed on the outer periphery of the planar slide plate.
3. The device support for a fusion facility according to claim 2, characterized in that, The outer diameter of the lower support is larger than the outer diameter of the spherical crown structure. The spherical crown structure is positioned by a fastener. One end of the fastener is connected to the edge of the lower support, and the other end presses against the upper edge of the spherical crown structure. The device support is suitable for removing the fastener during use.
4. The device support for a fusion facility according to claim 3, characterized in that, The fasteners are provided in multiple ways, and the multiple fasteners are spaced apart along the circumference of the spherical crown structure and the lower support.
5. The device support for a fusion facility according to claim 1, characterized in that, The planar sliding plate is embedded in the spherical crown structure, and the thickness of the embedding is at least 1 / 2 of the thickness of the planar sliding plate.
6. The device support for a fusion facility according to claim 1, characterized in that, The flat slide and the crown slide are made of a multi-layered composite material of plastic and metal.
7. A method for testing the dynamic performance of a device support, characterized in that, include: The dynamic compression parameters and dynamic shear parameters of the device support were tested. When testing the dynamic compression parameters of the device support, a sinusoidal compression load of multiple cycles is applied for testing. When testing the dynamic shear parameters of the device support, a horizontal sinusoidal shear load of multiple cycles is applied for testing.
8. The dynamic performance testing method for the device support according to claim 7, characterized in that, The testing of the dynamic compression parameters and dynamic shear parameters of the device support includes: testing the dynamic compression parameters of the device support, including: Measure the average initial thickness of the support of the device; Connect the device support and the compression testing machine; The compression testing machine preloads the support of the device and then unloads it. Continue applying sinusoidal compressive loads for multiple cycles; Plot the force-displacement hysteresis curve of the device support for at least one cycle; The dynamic compression modulus and dynamic compression damping are calculated based on the force-displacement hysteresis curve and compared with the design rated values.
9. The dynamic performance testing method for the device support according to claim 8, characterized in that, The continued application of sinusoidal compressive loads over multiple cycles includes: applying sinusoidal compressive loads. , F 0 represents the static part of the load, indicating a constant compressive force. It's the loading frequency. This is the loading time, and it is compressed to a preset number of cycles.
10. The dynamic performance testing method for the device support according to claim 8, characterized in that, The calculation of dynamic compression modulus and dynamic compression damping based on the force-displacement hysteresis curve, and the comparison with the design rated values, includes: The dynamic compressive modulus is calculated as follows: The formula for calculating dynamic compressive damping is: ,in The difference between the maximum compressive load and the minimum compressive load, The difference between the maximum and minimum compression caused by compression. The area under the hysteresis curve.
11. The dynamic performance testing method for the device support according to claim 8, characterized in that, The testing of the dynamic compression parameters and dynamic shear parameters of the device support includes: testing the dynamic shear parameters of the device support, including: Connect the device support and the compression testing machine; Measure the average initial outer diameter of the upper support and calculate the area of the upper support; Axial preload preset load; Apply a horizontal sinusoidal shear load for multiple cycles; Plot the force-displacement hysteresis curves of the cyclic shear test of the device support for at least one cycle. Calculate the dynamic shear modulus and dynamic shear damping, and compare them with the design ratings.
12. The dynamic performance testing method for the device support according to claim 11, characterized in that, The calculation of dynamic shear modulus and dynamic shear damping, and the comparison with the design rated values, includes: Formula for dynamic shear modulus: The formula for calculating dynamic shear damping is: ,in Curved triangle and The area of the triangle, the sum of the areas of the two triangles, is the elastic strain energy stored during loading and unloading, corresponding to twice the strain energy of the sample in one cycle. The initial total thickness of the support for the device in the sample is given. The initial planar area of the upper support of the specimen. Shear displacement amplitude, The area under the hysteresis curve.
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