Power electronic device state evaluation method and device
By collecting the electrical and temperature signals of power electronic devices, using deep learning and wavelet transform analysis for signal processing, and combining phase-locked loop technology, a precise assessment of the status of power electronic devices is achieved, solving the problems of low assessment accuracy and precision in existing technologies, and ensuring the stability and reliability of the DC transmission system.
Patent Information
- Application Number
- CN202510542546.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-28
- Publication Date
- 2025-09-05
AI Technical Summary
The accuracy and precision of power electronic device status assessment in existing technologies are low, and cannot effectively guarantee the stability and reliability of direct current transmission systems.
The electrical and temperature signals of power electronic devices are collected, denoised and fitted through deep learning and wavelet transform analysis, the temperature amplitude and phase are calculated, and state assessment is performed in combination with phase-locked loop technology.
The accuracy and precision of power electronic device status assessment are improved, ensuring the stable operation of the DC transmission system.
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Figure CN120594967A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of direct current transmission technology, and in particular to a method and apparatus for evaluating the status of power electronic devices. Background Art
[0002] Power electronic devices play a crucial role in UHV / HVDC transmission systems. Their stability and reliability directly impact the efficiency and safety of the entire DC transmission system. Because power electronic devices are subject to transient changes, effective state assessment is crucial to ensuring the proper operation of the DC transmission system.
[0003] Related technologies typically use sensors to collect the temperature of power electronic devices and compare the collected temperature with a preset temperature threshold to assess the device's condition. However, these technologies can only provide a rough assessment of the device's condition. This crude assessment method results in low accuracy and precision. Summary of the Invention
[0004] In order to solve the problem of low evaluation accuracy and precision in the prior art, the present application provides a method and apparatus for evaluating the status of a power electronic device.
[0005] In a first aspect, the present application provides a method for assessing the status of a power electronic device, which may include: collecting electrical signals and temperature signals from the power electronic device, and processing the electrical signals and temperature signals; calculating the amplitude and phase of the temperature of the power electronic device based on the processed digital signals; and assessing the status of the power electronic device based on the amplitude and phase of the temperature.
[0006] In some possible implementations, collecting electrical signals and temperature signals of power electronic devices and processing the electrical signals and temperature signals include:
[0007] The power electronic devices are stimulated according to a preset evaluation period.
[0008] An electrical signal is collected, and denoised and fitted to obtain a first digital signal.
[0009] A temperature signal is collected, and denoised and fitted to obtain a second digital signal.
[0010] The digital signal includes a first digital signal and a second digital signal.
[0011] Optionally, a deep learning method can be used to denoise and fit the electrical signal to obtain a first digital signal, including: filtering and smoothing the electrical signal, and using a nonlinear regression analysis method to process the smoothed signal to obtain the first digital signal.
[0012] A deep learning method can be used to denoise and fit the temperature signal to obtain a second digital signal, including: filtering and smoothing the temperature signal, and using a nonlinear regression analysis method to process the smoothed signal to obtain the second digital signal.
[0013] In some other possible implementations, calculating the amplitude and phase of the temperature of the electronic device based on the processed digital signal includes: extracting a reference signal for a phase-locked loop from a first digital signal using a wavelet transform analysis method; extracting an input signal for the phase-locked loop from a second digital signal using a wavelet transform analysis method; and inputting the reference signal and the input signal into the phase-locked loop to obtain the amplitude and phase of the temperature.
[0014] For example, the amplitude and phase of temperature satisfy:
[0015]
[0016] Where R represents the temperature amplitude, Φ represents the temperature phase, and t0 represents the evaluation period. u(t) represents the first digital signal at time t, satisfying u(t) = u0sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t). u(t+t0) represents the first digital signal at time t+1. T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
[0017] In yet another possible implementation, evaluating the state of the power electronic device based on the magnitude and phase of the temperature includes:
[0018] When the temperature amplitude does not exceed a preset amplitude threshold and the temperature phase does not exceed a preset phase threshold, it is determined that the power electronic device operates normally.
[0019] If the temperature amplitude exceeds a temperature threshold, it is determined that the power electronic device has a temperature anomaly. If the temperature phase exceeds a phase threshold, it is determined that the power electronic device has a defect.
[0020] In a second aspect, the present application provides a power electronic device status assessment device, which may include:
[0021] Processing module: used to collect electrical signals and temperature signals from power electronic devices and process them.
[0022] The calculation module is used to calculate the amplitude and phase of the temperature of the electronic device according to the processed digital signal.
[0023] An evaluation module is used to evaluate the status of power electronic devices based on the magnitude and phase of temperature.
[0024] In a possible implementation, the processing module is specifically configured to:
[0025] The power electronic devices are stimulated according to a preset evaluation period.
[0026] An electrical signal is collected, and denoised and fitted to obtain a first digital signal.
[0027] A temperature signal is collected, and denoised and fitted to obtain a second digital signal.
[0028] The digital signal includes a first digital signal and a second digital signal.
[0029] Optionally, the processing module is specifically configured to:
[0030] The electric signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain a first digital signal.
[0031] The processing module is specifically used to:
[0032] The temperature signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain a second digital signal.
[0033] In another possible implementation, the calculation module is specifically configured to:
[0034] A wavelet transform analysis method is used to extract a reference signal of a phase-locked loop from the first digital signal.
[0035] The input signal of the phase-locked loop is extracted from the second digital signal by using a wavelet transform analysis method.
[0036] The reference signal and the input signal are input into the phase-locked loop to obtain the amplitude and phase of the temperature.
[0037] Optionally, the temperature amplitude and phase satisfy:
[0038]
[0039] Where R represents the temperature amplitude, Φ represents the temperature phase, and t0 represents the evaluation period. u(t) represents the first digital signal at time t, satisfying u(t) = u0sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t). u(t+t0) represents the first digital signal at time t+1. T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
[0040] In another possible implementation, the evaluation module is specifically configured to:
[0041] When the temperature amplitude does not exceed a preset amplitude threshold and the temperature phase does not exceed a preset phase threshold, it is determined that the power electronic device operates normally.
[0042] If the temperature amplitude exceeds a temperature threshold, it is determined that the power electronic device has a temperature anomaly. If the temperature phase exceeds a phase threshold, it is determined that the power electronic device has a defect.
[0043] On the other hand, the present application also provides a computer device, including: one or more processors.
[0044] A processor is used to execute one or more programs.
[0045] When one or more programs are executed by one or more processors, the above-described evaluation method is implemented.
[0046] In another aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed, implements the above-mentioned evaluation method.
[0047] Compared with the prior art, the present invention has the following advantages:
[0048] In the power electronic device status assessment method provided in this application, the electrical and temperature signals of the power electronic device are collected and processed. The amplitude and phase of the temperature of the power electronic device are calculated based on the processed digital signals. The status of the power electronic device is assessed based on the amplitude and phase of the temperature. As can be seen, this application implements the assessment of the status of the power electronic device based on the amplitude and phase of the temperature of the power electronic device. Compared with related technologies, the assessment method is more sophisticated and can improve the accuracy and precision of the assessment.
[0049] The present application can use deep learning methods to denoise and fit electrical signals and temperature signals, thereby improving the accuracy of the first digital signal and the second digital signal, and providing a basis for accurate evaluation of the status of power electronic devices.
[0050] This application uses the wavelet transform method to extract the reference signal of the phase-locked loop from the first digital signal and the input signal of the phase-locked loop from the second digital signal, and then the amplitude and phase of the temperature can be obtained through the phase-locked loop to ensure reliable evaluation of the state of the power electronic device.
[0051] The present application can be used to obtain the status of power electronic devices, which helps determine the operating status of the converter where the power electronic devices are located. BRIEF DESCRIPTION OF THE DRAWINGS
[0052] In order to more clearly illustrate the technical solutions in the present application or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.
[0053] Figure 1 This is a schematic flow chart of a method for evaluating the state of a power electronic device in an embodiment of the present application.
[0054] Figure 2 This is another schematic flow chart of the power electronic device status assessment method in an embodiment of the present application.
[0055] Figure 3 This is a schematic structural diagram of a power electronic device status assessment device in an embodiment of the present application. DETAILED DESCRIPTION
[0056] The technical solution in this application will be described below with reference to the accompanying drawings.
[0057] The terms "first," "second," and the like in the description, embodiments, claims, and drawings of this application are used solely for descriptive purposes and are not to be construed as indicating or implying relative importance or order. Furthermore, the terms "including," "having," and any variations thereof are intended to cover non-exclusive inclusions, such as, for example, inclusion of a series of steps or units. A method, system, product, or apparatus is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0058] It should be understood that in this application, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.
[0059] Example 1:
[0060] The present application provides a method for evaluating the state of a power electronic device. Figure 1 The evaluation method 100 includes the following steps:
[0061] Step S1: collecting electrical signals and temperature signals of power electronic devices, and processing the electrical signals and temperature signals.
[0062] Step S2: Calculate the amplitude and phase of the electronic device temperature based on the processed digital signal.
[0063] Step S3: Evaluate the status of the power electronic device according to the temperature amplitude and phase.
[0064] In some embodiments, collecting the electrical signal and temperature signal of the power electronic device and processing the electrical signal and temperature signal in step S1 include:
[0065] The power electronic device is stimulated according to a preset evaluation period. An electrical signal is collected, de-noised, and fitted to obtain a first digital signal. A temperature signal is collected, de-noised, and fitted to obtain a second digital signal. The digital signals include the first digital signal and the second digital signal.
[0066] It is conceivable that in the process of state assessment, there is an optimal frequency for defect identification at a specific depth. Too low or too high a frequency will lead to reduced accuracy of the assessment. For example, if the frequency of excitation is too low, the thermal action time is long, the thermal penetration depth is large, the pipeline as a whole tends to the regular stage of non-steady-state heat conduction, the heat conduction unevenness is reduced, and the surface phase difference detection value is small, and the widening of the crack defect on the phase diagram is not obvious. If the frequency of excitation is too high and the thermal action time is short, on the one hand, the thermal penetration depth is small, and the surface temperature change is insensitive to deeper defects, which may lead to missed defects; on the other hand, part of the boundary area is not fully heated, and the high-temperature area inside the pipeline transfers heat to the low-temperature area at the boundary. The lateral asymmetric heat conduction effect is obvious, which may produce "pseudo-defects" near the boundary area. Therefore, the optimal frequency can be determined with the help of computational simulation and other methods to provide necessary reference for the assessment.
[0067] Specifically, such as Figure 2 As shown, denoising and fitting the electrical signal to obtain the first digital signal includes: filtering and smoothing the electrical signal, and processing the smoothed signal using a nonlinear regression analysis method to obtain the first digital signal.
[0068] Denoising and fitting the temperature signal to obtain a second digital signal includes: filtering and smoothing the temperature signal, and processing the smoothed signal using a nonlinear regression analysis method to obtain the second digital signal.
[0069] In the embodiment of the present application, an extended Kalman filter (EKF) may be used to filter the electrical signal or the temperature signal.
[0070] In other embodiments, the step S2 of calculating the amplitude and phase of the temperature of the electronic device based on the processed digital signal includes: extracting a reference signal of the phase-locked loop from the first digital signal using a wavelet transform analysis method. Extracting an input signal of the phase-locked loop from the second digital signal using a wavelet transform analysis method. Inputting the reference signal and the input signal into the phase-locked loop to obtain the amplitude and phase of the temperature, such as Figure 2 shown.
[0071] For example, the amplitude and phase of temperature satisfy:
[0072]
[0073] Where R represents the temperature amplitude, Φ represents the temperature phase, and t0 represents the evaluation period. u(t) represents the first digital signal at time t, satisfying u(t) = u0sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t). u(t+t0) represents the first digital signal at time t+1. T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
[0074] In another embodiment, the step S3 of evaluating the state of the power electronic device according to the amplitude and phase of the temperature includes:
[0075] like Figure 2 As shown, if the temperature amplitude does not exceed the preset amplitude threshold and the temperature phase does not exceed the preset phase threshold, the power electronic device is determined to be operating normally. If the temperature amplitude exceeds the temperature threshold, the power electronic device is determined to have a temperature anomaly. If the temperature phase exceeds the phase threshold, the power electronic device is determined to have a defect.
[0076] Optionally, the temperature amplitude can be represented as an amplitude graph. Since power electronic devices experience normal temperature increases during operation, the temperature increase provided by the phase-locked loop's periodic excitation may be insignificant in comparison. Since the normal area and the area under test typically share the same spatial and electrical environment, the temperature increase due to normal operation is essentially the same in both areas. Therefore, by subtracting the temperatures of the two areas, the effect of periodic excitation can be further emphasized to eliminate environmental noise.
[0077] Phase images are used to detect surface and internal defects in the test area, as well as the thickness of the external coating. For a given phase-locked frequency, different coating thicknesses will exhibit different temperature phases. Similarly, defects will exhibit similar phase deviations. Therefore, by comparing the phase images of the test area with those of a normal area, defects can be located in the test area.
[0078] As you can imagine, converter valves, including power electronic components, are often installed outdoors and may be subject to impact, resulting in surface damage and even internal cracks. Both damage and cracks can be interpreted as defects in the electronic components. At cracked or damaged locations, the temperature increases compared to the surrounding normal area due to increased thermal resistance. Furthermore, if a periodic heat source is used to excite the corresponding area, the temperature amplitude and phase will deviate to a certain extent.
[0079] Example 2:
[0080] Based on the same inventive concept, the present application also provides a device for evaluating the state of a power electronic device. Figure 3As shown, the evaluation device 200 may include a processing module 201, a calculation module 202, and an evaluation module 203. The processing module 201 may be configured to collect and process electrical and temperature signals from power electronic devices. The calculation module 202 may be configured to calculate the amplitude and phase of the temperature of the power electronic device based on the processed digital signals. The evaluation module 203 may be configured to evaluate the status of the power electronic device based on the amplitude and phase of the temperature.
[0081] In a possible implementation, the processing module 201 is specifically configured to:
[0082] The power electronic devices are stimulated according to a preset evaluation period.
[0083] An electrical signal is collected, and denoised and fitted to obtain a first digital signal.
[0084] A temperature signal is collected, and denoised and fitted to obtain a second digital signal.
[0085] The digital signal includes a first digital signal and a second digital signal.
[0086] Optionally, the processing module 201 is specifically configured to:
[0087] The electric signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain a first digital signal.
[0088] The processing module 201 is specifically used for:
[0089] The temperature signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain a second digital signal.
[0090] In another possible implementation, the calculation module 202 is specifically configured to:
[0091] A wavelet transform analysis method is used to extract a reference signal of a phase-locked loop from the first digital signal.
[0092] The input signal of the phase-locked loop is extracted from the second digital signal by using a wavelet transform analysis method.
[0093] The reference signal and the input signal are input into the phase-locked loop to obtain the amplitude and phase of the temperature.
[0094] Optionally, the temperature amplitude and phase satisfy:
[0095]
[0096] Where R represents the temperature amplitude, Φ represents the temperature phase, and t0 represents the evaluation period. u(t) represents the first digital signal at time t, satisfying u(t) = u0sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t). u(t+t0) represents the first digital signal at time t+1. T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
[0097] In another possible implementation, the evaluation module 203 is specifically configured to:
[0098] When the temperature amplitude does not exceed a preset amplitude threshold and the temperature phase does not exceed a preset phase threshold, it is determined that the power electronic device operates normally.
[0099] If the temperature amplitude exceeds a temperature threshold, it is determined that the power electronic device has a temperature anomaly. If the temperature phase exceeds a phase threshold, it is determined that the power electronic device has a defect.
[0100] Example 3:
[0101] Based on the same inventive concept, an embodiment of the present application further provides a computer device, comprising a processor and a memory, the memory being used to store a computer program, the computer program comprising program instructions, and the processor being used to execute the program instructions stored in the computer storage medium. The processor may be a central processing unit (CPU), or may be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc., which are the computing core and control core of the terminal, and are suitable for implementing one or more instructions, specifically suitable for loading and executing one or more instructions in a computer storage medium to implement a corresponding method flow or corresponding function, so as to implement the steps of the evaluation method provided in the above embodiment.
[0102] Example 4:
[0103] Based on the same inventive concept, an embodiment of the present application further provides a computer-readable storage medium, specifically a computer-readable storage medium (Memory), which is a memory device in a computer device for storing programs and data. It is understandable that the computer-readable storage medium herein may include both a built-in storage medium in a computer device and, of course, an extended storage medium supported by the computer device. The computer-readable storage medium provides a storage space that stores the operating system of the terminal. Furthermore, one or more instructions suitable for being loaded and executed by a processor are also stored in the storage space, and these instructions may be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium herein may be a high-speed RAM memory or a non-volatile memory, such as at least one disk memory. The processor may load and execute one or more instructions stored in the computer-readable storage medium to implement the steps of the evaluation method provided in the above embodiment.
[0104] Those skilled in the art will appreciate that embodiments of the application may be provided as methods, systems, or computer program products. Thus, the application may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the application may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0105] The application is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as a combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0106] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1The function specified in one or more boxes.
[0107] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.
[0108] The above are merely embodiments of the application and are not intended to limit the application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the application are included in the scope of the claims of the pending application.
Claims
1. A method for evaluating the state of a power electronic device, characterized in that: include: Collecting electrical signals and temperature signals of power electronic devices and processing the electrical signals and temperature signals; calculating the amplitude and phase of the temperature of the electronic device according to the processed digital signal; The state of the power electronic device is evaluated according to the magnitude and phase of the temperature.
2. The evaluation method according to claim 1, wherein: The collecting of electrical signals and temperature signals of the power electronic device and processing of the electrical signals and temperature signals includes: stimulating the power electronic device according to a preset evaluation period; Collecting the electrical signal, and performing denoising and fitting on the electrical signal to obtain a first digital signal; Collecting the temperature signal, and performing denoising and fitting on the temperature signal to obtain a second digital signal; The digital signal includes the first digital signal and the second digital signal.
3. The evaluation method according to claim 2, wherein: The performing denoising and fitting on the electrical signal to obtain a first digital signal includes: The electrical signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain the first digital signal.
4. The evaluation method according to claim 2, wherein: The step of performing denoising and fitting on the temperature signal to obtain a second digital signal includes: The temperature signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain the second digital signal.
5. The evaluation method according to claim 2, wherein: Calculating the amplitude and phase of the temperature of the electronic device according to the processed digital signal includes: extracting a reference signal of a phase-locked loop from the first digital signal using a wavelet transform analysis method; extracting an input signal of a phase-locked loop from the second digital signal using a wavelet transform analysis method; The reference signal and the input signal are input into a phase-locked loop to obtain the amplitude and phase of the temperature.
6. The evaluation method according to claim 2, wherein: The amplitude and phase of the temperature satisfy: Wherein, R represents the amplitude of the temperature, Φ represents the phase of the temperature, and t0 represents the evaluation period; u(t) represents the first digital signal at time t, satisfying u(t) = u0 sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t); u(t+t0) represents the first digital signal at time t+1; T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
7. The evaluation method according to claim 1, wherein: The evaluating the state of the power electronic device according to the amplitude and phase of the temperature includes: When the amplitude of the temperature does not exceed a preset amplitude threshold and the phase of the temperature does not exceed a preset phase threshold, determining that the power electronic device is operating normally; When the temperature amplitude exceeds the temperature threshold, it is determined that the power electronic device has a temperature abnormality; when the temperature phase exceeds the phase threshold, it is determined that the power electronic device has a defect.
8. A power electronic device status assessment device, characterized in that: include: Processing module: used to collect electrical signals and temperature signals of power electronic devices and process the electrical signals and temperature signals; a calculation module, configured to calculate the amplitude and phase of the temperature of the electronic device according to the processed digital signal; An evaluation module is used to evaluate the state of the power electronic device according to the amplitude and phase of the temperature.
9. The evaluation device according to claim 8, characterized in that The processing module is specifically used for: stimulating the power electronic device according to a preset evaluation period; Collecting the electrical signal, and performing denoising and fitting on the electrical signal to obtain a first digital signal; Collecting the temperature signal, and performing denoising and fitting on the temperature signal to obtain a second digital signal; The digital signal includes the first digital signal and the second digital signal.
10. The evaluation device according to claim 9, characterized in that The processing module is specifically used for: The electrical signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain the first digital signal.
11. The evaluation method according to claim 8, wherein: The processing module is specifically used for: The temperature signal is filtered and smoothed, and the smoothed signal is processed using a nonlinear regression analysis method to obtain the second digital signal.
12. The evaluation device according to claim 9, characterized in that The calculation module is specifically used for: extracting a reference signal of a phase-locked loop from the first digital signal using a wavelet transform analysis method; extracting an input signal of a phase-locked loop from the second digital signal using a wavelet transform analysis method; The reference signal and the input signal are input into a phase-locked loop to obtain the amplitude and phase of the temperature.
13. The evaluation device according to claim 9, characterized in that The amplitude and phase of the temperature satisfy: Wherein, R represents the amplitude of the temperature, Φ represents the phase of the temperature, and t0 represents the evaluation period; u(t) represents the first digital signal at time t, satisfying u(t) = u0 sinω1t, u0 represents the amplitude of u(t), and ω1 represents the angular frequency of u(t); u(t+t0) represents the first digital signal at time t+1; T(t) represents the second digital signal at time t, satisfying T N (t) represents the non-periodic component of T(t), represents the periodic component, T0 represents the amplitude of the periodic component, ω2 represents the angular frequency of the periodic component, Represents the phase of the periodic component.
14. The evaluation device according to claim 8, characterized in that The evaluation module is specifically used for: When the amplitude of the temperature does not exceed a preset amplitude threshold and the phase of the temperature does not exceed a preset phase threshold, determining that the power electronic device is operating normally; When the temperature amplitude exceeds the temperature threshold, determining that a temperature abnormality occurs in the power electronic device; When the phase of the temperature exceeds the phase threshold, it is determined that the power electronic device has a defect.
15. A computer device, characterized in that: include: one or more processors; The processor is configured to store one or more programs; When the one or more programs are executed by the one or more processors, the evaluation method according to any one of claims 1 to 7 is implemented.
16. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed, the evaluation method according to any one of claims 1 to 7 is implemented.