Optical module two-way opposite transmission aging test system

Abstract

The invention discloses an optical module two-way opposite transmission aging test system, which is characterized in that three groups of spatially symmetrical test units (including EXT / DUT / DSP) are arranged on a circuit substrate, and are matched with an optical path switching device and a micro-structure heat dissipation structure, so that 1) multi-channel parallel two-way opposite transmission aging is realized; 2) closed-loop power and attenuation control based on temperature / BER; and 3) cooperatively monitoring the opening degree of the eye diagram and the multi-stage BER. The problems that in the prior art, signal interaction between modules cannot be truly simulated, and performance monitoring is not comprehensive are solved.

Description

Technical Field

[0001] The present invention relates to the field of optical communication testing technology, and in particular to an optical module bidirectional transmission aging system supporting multi-channel parallel testing and a performance monitoring method. Background Art

[0002] Current optical module aging tests primarily use a single-module self-loopback mode, which has the following drawbacks:

[0003] 1. Unable to simulate real-world interaction scenarios: Only the transmit-receive self-consistency of a single module is tested, ignoring the collaborative degradation effect of signal transmission between modules;

[0004] 2. Single performance monitoring indicator: Only basic BER parameters can be obtained, and key performance drifts such as timing jitter and eye closure cannot be captured.

[0005] 3. Low testing efficiency: The single-module serial testing cycle is long and cannot meet the needs of mass production. Summary of the Invention

[0006] In view of the technical defects and drawbacks in the prior art, the embodiments of the present invention provide a bidirectional transmission aging test system for optical modules that overcomes or at least partially solves the above problems. The specific solution is as follows:

[0007] An optical module bidirectional transmission aging test system, comprising:

[0008] A circuit substrate, and at least one set of test units, arranged on the circuit substrate, wherein the test units include:

[0009] The first optical interface connector Connector1 is used for pluggably connecting to the external light source module EXT;

[0010] The second optical interface connector Connector2 is used for pluggably connecting to the optical module under test DUT;

[0011] A digital signal processor (DSP) is soldered to the circuit substrate and includes:

[0012] A test code stream generating unit, configured to inject a PRBS test signal into the electrical input port of the EXT module;

[0013] The bit error analysis unit is used to receive the signal returned from the electrical loopback port of the DUT module and calculate the real-time bit error rate; the optical signal transmission link connects the optical output port of the EXT and the optical input port of the DUT through an optical fiber to form a unidirectional optical signal transmission path; the electrical signal loopback link connects the electrical loopback port of the DUT and the bit error analysis unit of the DSP through PCB traces to form an electrical signal monitoring loop.

[0014] Further:

[0015] The number of the test units is three groups;

[0016] Three groups of test units are arranged on the circuit substrate in a spatially symmetrical layout;

[0017] The optical signal transmission link of each group of test units achieves signal independence through an isolation structure, allowing each group of units to perform aging tests in parallel.

[0018] Further:

[0019] The bit error analysis unit of the digital signal processor DSP performs multi-level precision bit error statistics;

[0020] The multi-level precision bit error statistics include:

[0021] First-level bit error rate calculation based on the first data scale;

[0022] A second-level bit error rate calculation based on a second data scale, the second data scale being larger than the first data scale;

[0023] When the second-level bit error rate calculation result deteriorates statistically relative to the historical benchmark value, the system protection action is triggered.

[0024] Furthermore, it also includes:

[0025] An optical path switching device, connected to the optical output port of the optical module DUT to be tested;

[0026] a reference receiver, signal-connected to the optical path switching device;

[0027] The optical path switching device switches the optical signal output by the DUT to the reference receiver in response to an instruction of the digital signal processor DSP;

[0028] The reference receiver performs time domain waveform analysis, generates an eye opening performance index, and feeds back the index to the DSP.

[0029] Further:

[0030] The reference receiver comprises:

[0031] The photoelectric conversion module converts the optical signal output by the optical module under test (DUT) into an electrical signal;

[0032] Signal reconstruction module, which reconstructs the waveform of the converted electrical signal;

[0033] Timing deviation analysis module, extracts eye opening characteristics based on the reconstructed waveform;

[0034] The eye opening characteristic includes a timing deviation characteristic related to signal integrity and is fed back to the digital signal processor DSP.

[0035] Furthermore: it also includes a heat dissipation structure for conducting the heat generated during the aging test. The heat dissipation structure is made of a high thermal conductivity metal material, and a microstructure heat dissipation layer is provided on its surface to increase the heat dissipation surface area; the heat dissipation structure is fixed to the bottom of the circuit substrate by a detachable installation method to form a directional heat conduction path.

[0036] The present invention has the following beneficial effects:

[0037] 1. Improved test authenticity: EXT-DUT bidirectional transmission simulates a real optical link, and the fault detection rate is increased by ≥40%;

[0038] 2. Parallel efficiency advantage: Three units can be tested simultaneously, increasing production capacity by 200% compared to traditional solutions;

[0039] 3. Comprehensive dynamic monitoring: Synchronously acquire multi-dimensional parameters such as BER, eye opening, and timing jitter. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 The figure is a schematic diagram of the framework of a bidirectional transmission aging test system for optical modules. DETAILED DESCRIPTION

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0042] To enable those skilled in the art to better understand the technical solutions of the present invention, exemplary embodiments of the present invention are described below in conjunction with the accompanying drawings, including various details of the embodiments of the present invention to facilitate understanding. These details should be considered merely exemplary. Therefore, those skilled in the art should recognize that various changes and modifications may be made to the embodiments described herein without departing from the scope and spirit of the present invention. Similarly, for the sake of clarity and conciseness, descriptions of well-known functions and structures are omitted in the following description.

[0043] In the absence of conflict, the various embodiments of the present invention and the various features therein may be combined with each other.

[0044] As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0045] The terms used herein are only used to describe specific embodiments and are not intended to limit the present invention. As used herein, the singular forms "a" and "the" are also intended to include the plural forms, unless the context clearly indicates otherwise. It will also be understood that when the terms "comprising" and / or "made of" are used in this specification, the presence of the features, wholes, steps, operations, elements and / or components is specified, but the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or groups thereof is not excluded. Similar words such as "connected" or "connected" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect.

[0046] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art. It will also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant art and the present invention, and will not be interpreted as having an idealized or overly formal meaning unless expressly defined as such herein.

[0047] In the technical solution of the present invention, the collection, storage, use, processing, transmission, provision and disclosure of user personal information involved are in compliance with the provisions of relevant laws and regulations and do not violate public order and good morals. The use of user data in this technical solution complies with relevant national laws and regulations (for example, the "Information Security Technology Personal Information Security Specification", etc.). For example: corresponding prescribed measures are taken to control access to personal information; the display of personal information is subject to prescribed restrictions; the purpose of using personal information does not exceed the scope of direct or reasonable connection; when using personal information, clear identity reference is eliminated to avoid precise positioning of specific individuals.

[0048] In order to solve at least one of the technical problems existing in the above-mentioned related technologies, the present invention provides a bidirectional transmission aging test system for optical modules. Figure 1 A schematic diagram of a framework of a bidirectional transmission aging test system for an optical module provided by an embodiment of the present invention includes:

[0049] A circuit substrate, and at least one set of test units, arranged on the circuit substrate, wherein the test units include:

[0050] The first optical interface connector Connector1 is used for pluggably connecting to the external light source module EXT;

[0051] The second optical interface connector Connector2 is used for pluggably connecting to the optical module under test DUT;

[0052] A digital signal processor (DSP) is soldered to the circuit substrate and includes:

[0053] A test code stream generating unit, configured to inject a PRBS test signal into the electrical input port of the EXT module;

[0054] The bit error analysis unit is used to receive the signal returned from the electrical loopback port of the DUT module and calculate the real-time bit error rate; the optical signal transmission link connects the optical output port of the EXT and the optical input port of the DUT through an optical fiber to form a unidirectional optical signal transmission path; the electrical signal loopback link connects the electrical loopback port of the DUT and the bit error analysis unit of the DSP through PCB traces to form an electrical signal monitoring loop.

[0055] In the above embodiment, the optical signal is transmitted through EXT, the DUT receives and electrically loops back, and the DSP analyzes the BER to achieve bidirectional transmission; after the DUT receives the EXT signal, it does not directly loop back the optical signal, but loops the electrical signal back to the DSP to achieve electrical loopback monitoring and expose collaborative degradation: the present invention monitors the performance of the DUT in the actual receiving state (the existing technology self-loopback cannot simulate signal attenuation), and the electrical loopback path captures the collaborative failure of the CDR (clock recovery) and TIA (transimpedance amplifier) ​​inside the DUT, thereby improving the efficiency of bit error location.

[0056] In some embodiments:

[0057] The number of the test units is three groups;

[0058] Three groups of test units are arranged on the circuit substrate in a spatially symmetrical layout;

[0059] The optical signal transmission link of each group of test units achieves signal independence through an isolation structure, allowing each group of units to perform aging tests in parallel.

[0060] In the above embodiment, the three groups of test units are distributed in a 120° ring shape (eliminating electromagnetic interference superposition), achieving a spatially symmetrical layout, which can improve the test throughput (the existing technology only supports single-module serial testing). A grounded shielding wall is set between each unit to isolate crosstalk, reduce crosstalk noise, and ensure the independence of multi-channel testing.

[0061] In some embodiments:

[0062] The digital signal processor DSP is integrated with a temperature sensing module;

[0063] The temperature sensing module monitors the operating temperature of the test unit in real time;

[0064] When the operating temperature exceeds a preset threshold, the DSP dynamically adjusts the optical output power intensity of the external light source module EXT to maintain the stability of the test signal.

[0065] In the above embodiment, the NTC thermistor is mounted on the DUT housing to achieve temperature sensing, and the DSP adjusts the EXT laser bias current according to the temperature-BER mapping table (pre-calibrated) to achieve power regulation. The present invention can maintain BER stability (fluctuation <±0.2dB) at high temperatures and suppress thermal drift; it avoids laser overdrive damage caused by traditional constant power aging and extends the module life.

[0066] In some embodiments:

[0067] Arranging a variable optical attenuator (VOA) in the optical signal transmission link;

[0068] The adjustable optical attenuator is signal-connected to the digital signal processor DSP;

[0069] The DSP dynamically controls the optical signal attenuation intensity of the adjustable optical attenuator according to real-time bit error rate data.

[0070] In the above embodiment, dynamic attenuation (adjustable in steps of 0.1-5dB) is used to accelerate the exposure of DUT receiving sensitivity defects and simulate link degradation; automation replaces the existing manual adjustment of the optical attenuator to reduce human intervention.

[0071] In some embodiments:

[0072] The digital signal processor DSP controls the attenuation intensity of the variable optical attenuator VOA through a proportional adjustment mechanism;

[0073] The proportional regulation mechanism dynamically adjusts the attenuation intensity variation according to the deviation between the real-time bit error rate and the preset target level;

[0074] The deviation amount is positively correlated with the amplitude of change of the attenuation intensity.

[0075] In the above embodiment, a smooth attenuation is achieved through a proportional coefficient (the step attenuation in the prior art causes a sudden change in the bit error rate), thereby avoiding overshoot and shortening the BER stabilization time.

[0076] In some embodiments:

[0077] The bit error analysis unit of the digital signal processor DSP performs multi-level precision bit error statistics;

[0078] The multi-level precision bit error statistics include:

[0079] First-level bit error rate calculation based on the first data scale;

[0080] A second-level bit error rate calculation based on a second data scale, the second data scale being larger than the first data scale;

[0081] When the second-level bit error rate calculation result deteriorates statistically relative to the historical benchmark value, the system protection action is triggered.

[0082] For example, at the first level, the data size is 10 9 bit, the monitoring target is sudden bit error, the second level, the data scale is 10 ¹² bits, the monitoring target is gradual performance degradation.

[0083] In the above embodiment, by identifying the traditional BER statistics (fixed 10 ¹² bit) missing transient errors (such as clock transient loss of lock), capture intermittent faults, and trigger system protection actions when the second-level bit error rate calculation result deteriorates statistically compared to the historical benchmark value. For example, when the second-level BER slope is greater than 10 -15 / hour (24 hours earlier than traditional solutions).

[0084] In some embodiments, the system further comprises:

[0085] An optical path switching device, connected to the optical output port of the optical module DUT to be tested;

[0086] a reference receiver, signal-connected to the optical path switching device;

[0087] The optical path switching device switches the optical signal output by the DUT to the reference receiver in response to an instruction of the digital signal processor DSP;

[0088] The reference receiver performs time domain waveform analysis, generates an eye opening performance index, and feeds back the index to the DSP.

[0089] In the above embodiment, online diagnosis is achieved by obtaining eye height and eye width in real time during the aging process (the existing technology requires shutdown testing). Performance degradation is quantified by capturing eye diagram collapse (such as 15% eye height shrinkage) that cannot be reflected by traditional BER.

[0090] In some embodiments:

[0091] The reference receiver comprises:

[0092] The photoelectric conversion module converts the optical signal output by the optical module under test (DUT) into an electrical signal;

[0093] Signal reconstruction module, which reconstructs the waveform of the converted electrical signal;

[0094] Timing deviation analysis module, extracts eye opening characteristics based on the reconstructed waveform;

[0095] The eye opening characteristic includes a timing deviation characteristic related to signal integrity and is fed back to the digital signal processor DSP.

[0096] In the above embodiment, signal reconstruction is achieved through ADC sampling waveform reconstruction. Jitter sources are located by calculating TJ / RJ / DJ based on the SJ-BER model (IEEE 802.3 standard). By separating RJ (random jitter) from DJ (deterministic jitter), module design improvements are guided. When the RJ growth rate threshold is reached, the end of life is determined.

[0097] In some embodiments, the system also includes a heat dissipation structure for conducting heat generated during the aging test. The heat dissipation structure is made of a high thermal conductivity metal material, and a microstructured heat dissipation layer is provided on its surface to increase the heat dissipation surface area; the heat dissipation structure is fixed to the bottom of the circuit substrate by a detachable installation method to form a directional heat conduction path.

[0098] In the above embodiment, directional heat conduction is formed through the copper alloy substrate → micro-groove layer → heat dissipation duct, thereby reducing the DUT junction temperature, and the detachable design shortens the module replacement time.

[0099] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A bidirectional transmission aging test system for optical modules, characterized in that: include: A circuit substrate, and at least one set of test units, arranged on the circuit substrate, wherein the test units include: The first optical interface connector Connector1 is used for pluggably connecting to the external light source module EXT; The second optical interface connector Connector2 is used for pluggably connecting to the optical module under test DUT; A digital signal processor (DSP) is soldered to the circuit substrate and includes: A test code stream generating unit, configured to inject a PRBS test signal into the electrical input port of the EXT module; The bit error analysis unit is used to receive the signal returned from the electrical loopback port of the DUT module and calculate the real-time bit error rate; the optical signal transmission link connects the optical output port of the EXT and the optical input port of the DUT through an optical fiber to form a unidirectional optical signal transmission path; the electrical signal loopback link connects the electrical loopback port of the DUT and the bit error analysis unit of the DSP through PCB traces to form an electrical signal monitoring loop.

2. The optical module bidirectional transmission aging test system according to claim 1, wherein: The number of the test units is three groups; Three groups of test units are arranged on the circuit substrate in a spatially symmetrical layout; The optical signal transmission link of each group of test units achieves signal independence through an isolation structure, allowing each group of units to perform aging tests in parallel.

3. The optical module bidirectional transmission aging test system according to claim 1, wherein: The bit error analysis unit of the digital signal processor DSP performs multi-level precision bit error statistics; The multi-level precision bit error statistics include: First-level bit error rate calculation based on the first data scale; A second-level bit error rate calculation based on a second data scale, the second data scale being larger than the first data scale; When the second-level bit error rate calculation result deteriorates statistically relative to the historical benchmark value, the system protection action is triggered.

4. The optical module bidirectional transmission aging test system according to claim 1, characterized in that: Also includes: An optical path switching device, connected to the optical output port of the optical module DUT to be tested; a reference receiver, signal-connected to the optical path switching device; The optical path switching device switches the optical signal output by the DUT to the reference receiver in response to an instruction of the digital signal processor DSP; The reference receiver performs time domain waveform analysis, generates an eye opening performance index, and feeds back the index to the DSP.

5. The optical module bidirectional transmission aging test system according to claim 4, characterized in that: The reference receiver comprises: The photoelectric conversion module converts the optical signal output by the optical module under test (DUT) into an electrical signal; Signal reconstruction module, which reconstructs the waveform of the converted electrical signal; Timing deviation analysis module, extracts eye opening characteristics based on the reconstructed waveform; The eye opening characteristic includes a timing deviation characteristic related to signal integrity and is fed back to the digital signal processor DSP.

6. The optical module bidirectional transmission aging test system according to claim 1, wherein: It also includes a heat dissipation structure for conducting the heat generated during the aging test. The heat dissipation structure is made of a high-thermal-conductivity metal material, and a microstructured heat dissipation layer is provided on its surface to increase the heat dissipation surface area. The heat dissipation structure is fixed to the bottom of the circuit substrate in a detachable installation manner to form a directional heat conduction path.

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