Device for testing working characteristics of power device

Abstract

The invention relates to a power device working characteristic testing device. The device comprises a test module, a power supply module, a processing module and a driving module. The test module is used for connecting a to-be-tested power device, accessing an external current test probe and accessing an external high-voltage direct-current source required by test; the power supply module is used for being connected with an external low-voltage direct current source and outputting a negative polarity driving voltage, and the magnitude of the negative polarity driving voltage is matched with the type of a power device to be tested; the processing module is used for outputting a pulse signal required for testing the working characteristics of the to-be-tested power device; the driving module is respectively connected with the processing module, the power supply module and the test module, is connected with an external low-voltage direct-current source, and is used for receiving the negative polarity driving voltage and the positive polarity driving voltage output by the external low-voltage direct-current source, and driving the test module to test the working characteristics of the power device to be tested according to the pulse signal.

Description

Technical Field

[0001] The present application relates to the technical field of power device testing, and in particular to a device for testing the operating characteristics of a power device. Background Art

[0002] At present, the switching characteristics and reverse recovery characteristics of power devices are often tested using a double-pulse test platform.

[0003] In related technologies, a dual-pulse test platform is usually equipped with a Rogowski coil, which is required to sense the reverse recovery current of a power device. This is not only expensive but also has a low bandwidth, with a maximum bandwidth of only 16 MHz, making it difficult to accurately measure the reverse recovery current of the power device. Summary of the Invention

[0004] Based on this, it is necessary to provide a power device operating characteristic testing device that is low in cost and can accurately measure the reverse recovery current of the power device.

[0005] The embodiment of the present application provides a power device operating characteristic testing device, which includes a testing module, a power supply module, a processing module and a driving module;

[0006] The test module is used to connect the power device to be tested, access the external current test probe and access the external high-voltage DC source required for the test;

[0007] The power supply module is used to connect to an external low-voltage DC source and output a negative polarity driving voltage, wherein the magnitude of the negative polarity driving voltage is adapted to the type of the power device to be tested;

[0008] The processing module is used to output the pulse signal required for testing the working characteristics of the power device to be tested;

[0009] The driving module is respectively connected to the processing module, the power supply module, and the testing module, and is connected to the external low-voltage DC source. The driving module is used to receive the negative polarity driving voltage and the positive polarity driving voltage output by the external low-voltage DC source, and drive the testing module according to the pulse signal to test the working characteristics of the power device to be tested.

[0010] The above-mentioned power device operating characteristic test device adopts a test module, a power supply module, a processing module and a drive module connected to each other to obtain a new dual-pulse test platform. In the new dual-pulse test platform, the high-voltage DC source and the low-voltage DC source required for the power device operating characteristic test can directly use the high-voltage DC source and the low-voltage DC source outside the test device, such as directly connecting to the high-voltage DC source and the low-voltage DC source already in the actual application field laboratory, so that the new dual-pulse test platform does not need to integrate the high-voltage DC source and the low-voltage DC source, and the test of the reverse recovery current of the power device can also directly use the external current test probe, such as directly connecting to the high-frequency AC and DC probe or differential probe already in the actual application field laboratory, so that the new dual-pulse test platform does not need to integrate the current test probe, let alone the Rogowski coil and the Rogowski coil current probe, and There is no need to integrate an oscilloscope, and the oscilloscope already available in the actual application field laboratory can be directly connected. The embodiment of the present application thus reduces the cost of the dual-pulse test platform. The cost of the new dual-pulse test platform is much lower than the cost of the entire test system integrated and shipped in the related technology, and the utilization rate of high / low voltage DC sources, high-frequency AC / DC probes, differential probes and other equipment in the actual application field laboratory is improved; and, the reverse recovery current is measured using the high-frequency AC / DC probes already available in the actual application field laboratory, and the bandwidth can reach 120MHz, so that the peak value, time, slope and reverse recovery loss and other characteristics of the reverse recovery current can be tested more accurately; and, the power supply module of the embodiment of the present application can output a negative polarity drive voltage with adjustable size, so that it can adapt to the type and type of the power device to be tested, and realize the working characteristic test of more types and types of power devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the conventional technology, the following briefly introduces the drawings required for use in the embodiments or the conventional technology descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0012] Figure 1 This is a schematic diagram of the structure of a power device operating characteristics testing device according to an embodiment;

[0013] Figure 2 This is one of the structural diagrams of a power module according to an embodiment;

[0014] Figure 3 This is a second structural diagram of a power module according to an embodiment;

[0015] Figure 4 This is one of the structural diagrams of a driving module according to an embodiment;

[0016] Figure 5 This is a second structural diagram of a driving module according to an embodiment;

[0017] Figure 6 This is one of the structural diagrams of a test module according to an embodiment;

[0018] Figure 7 This is a second structural diagram of a power device operating characteristics testing device according to an embodiment;

[0019] Figure 8 This is a structural diagram of a high-voltage filter module according to an embodiment;

[0020] Figure 9 This is a structural diagram of a high-voltage detection module according to an embodiment;

[0021] Figure 10 is a structural diagram of a processing module according to an embodiment;

[0022] Figure 11 A physical diagram of a power device operating characteristics testing device according to an embodiment;

[0023] Figure 12 For Figure 4 A schematic diagram of the structure of the circuit shown after independent packaging;

[0024] Figure 13 For Figure 10 A schematic diagram of the structure of the circuit shown after independent packaging;

[0025] Figure 14 For Figure 2 Schematic diagram of the structure after the circuit shown is independently packaged. DETAILED DESCRIPTION

[0026] To facilitate understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The accompanying drawings provide embodiments of the present application. However, the present application may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to make the disclosure of the present application more thorough and comprehensive.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application.

[0028] It will be understood that the terms "first," "second," etc., used herein may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor without departing from the scope of this application. The first resistor and the second resistor are both resistors, but they are not the same resistor.

[0029] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if there is transmission of electrical signals or data between the connected circuits, modules, units, etc.

[0030] It is understood that “at least one” refers to one or more, “a plurality” refers to two or more, and “at least a portion of an element” refers to a portion or all of an element.

[0031] As used herein, the singular forms "a," "an," and "the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include," "comprising," "having," and the like specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Furthermore, the term "and / or" as used in this specification includes any and all combinations of the relevant listed items.

[0032] As mentioned in the background technology, in the related art, a dual-pulse test platform is usually assembled with a Rogowski coil, which is required to sense the reverse recovery current of the power device. This is not only costly but also has a low bandwidth, with the maximum bandwidth being only 16 MHz, making it difficult to accurately measure the reverse recovery current of the power device. At the same time, the inventors of this application have found through research that the dual-pulse test platform in the related art is usually sold as a complete set of integrated test systems. The integrated test system includes at least an optical isolation probe, a high-voltage differential probe, a Rogowski coil current probe, an oscilloscope, a dual-pulse signal generator, a medium- and low-voltage DC power supply, a high-voltage DC power supply, a driver board, a test board, and system software, resulting in a cost of more than one million yuan. This high cost increases the difficulty of testing the reverse recovery characteristics of power devices. Therefore, how to reduce the investment cost of testing the reverse recovery characteristics of power devices has become a technical problem that needs to be solved urgently.

[0033] In view of this, an embodiment of the present application provides a power device operating characteristic testing device that is low in cost and can accurately measure the reverse recovery current of the power device.

[0034] In an exemplary embodiment, referring to Figure 1 , provides a power device operating characteristics testing device, which includes a testing module 10, a power supply module 20, a processing module 30 and a driving module 40.

[0035] The test module 10 is used to connect to the power device to be tested, access an external current test probe, and access an external high-voltage DC source required for the test.

[0036] The test module 10 is the core test equipment of the power device operating characteristics test device, and can be understood as the base of the power device operating characteristics test device, which is used to implement double pulse testing and test the operating characteristics of the power device to be tested, such as switching characteristics or reverse recovery characteristics.

[0037] The power device under test can be a power device with an operating voltage equal to or less than 2000V and operating characteristics to be tested, such as an IGBT (Insulated Gate Bipolar Transistor), a MOSFET (Metal Oxide Semiconductor Field Effect Transistor), or a silicon nitride power device. During the testing of the power device under test, the power device under test can be referred to as the power device under test.

[0038] External current test probes are used to sense line current, such as the reverse recovery current of the power device under test. Examples of external current test probes include high-frequency AC / DC probes and differential probes, which are commonly found in actual field applications outside the test setup. High-frequency AC / DC probes are used to measure reverse recovery current, with bandwidths up to 120MHz.

[0039] The external high-voltage DC source is used to provide the high voltage required for testing the operating characteristics of the power device. For example, the external high-voltage DC source is a high-voltage DC source already available at an actual application site outside the test device, and the voltage of the high-voltage DC source is greater than or equal to 1000V. Of course, the test module 10 can also be connected to an external low-voltage DC power supply, an external medium-voltage DC power supply, or other external DC power supply.

[0040] The power module 20 is used to connect to an external low-voltage DC source and output a negative polarity driving voltage VSS, and the magnitude of the negative polarity driving voltage VSS is adapted to the type and type of the power device to be tested.

[0041] The external low-voltage DC source is, for example, a low-voltage DC source available at an actual application site outside the test device, and the voltage of the low-voltage DC source is less than or equal to 20V, such as 15V, 10V, etc. The low-voltage DC source can provide a supply voltage DC+ to the power module 20 .

[0042] The power module 20 may be internally equipped with components such as an adjustable resistor. By adjusting the resistance of the adjustable resistor, different negative polarity drive voltages VSS can be output. Operating characteristic tests of different types, models, and power devices require different negative polarity drive voltages VSS. Based on the adjustable resistor, the power module 20 can output a negative polarity drive voltage VSS that is compatible with the type, model, and power device under test, thereby enabling operating characteristic tests of a wider range of power devices.

[0043] The processing module 30 is used to output a pulse signal required for testing the operating characteristics of the power device to be tested.

[0044] The pulse signal is, for example, a PWM (Pulse Width Modulation) wave. The processing module 30 may include a device such as an MCU (Micro Controller Unit) chip, and the MCU chip may be programmed with a program for implementing a power device operating characteristic test.

[0045] The driving module 40 is connected to the processing module 30, the power supply module 20, and the test module 10 respectively, and the driving module 40 is also connected to an external low-voltage DC source; the driving module 40 is used to receive the negative polarity driving voltage VSS and the positive polarity driving voltage VDD output by the external low-voltage DC source, and receive the pulse signal output by the processing module 30. Based on this, the driving module 40 drives the test module 10 according to the pulse signal to test the working characteristics of the power device to be tested.

[0046] The above-mentioned power device operating characteristics test device uses a test module, a power supply module, a processing module and a drive module to be interconnected to obtain a new dual-pulse test platform. In this new dual-pulse test platform, the high and low voltage DC sources required for the power device operating characteristics test can directly utilize the high and low voltage DC sources outside the test device, such as directly connecting to the high and low voltage DC sources already in the actual application site laboratory, so that the new dual-pulse test platform does not need to integrate high and low voltage DC sources, and the test of the power device reverse recovery current can also directly utilize an external current test probe, such as directly connecting to the high-frequency AC and DC probes or differential probes already in the actual application site laboratory, so that the new dual-pulse test platform does not need to integrate current test probes, let alone Rogowski coils and Rogowski coil current probes, and also does not need to integrate oscilloscopes. , or it can be directly connected to an oscilloscope already available in a laboratory for actual application, thereby reducing the cost of the dual-pulse test platform. The cost of the new dual-pulse test platform is much lower than the cost of a complete set of test systems integrated and shipped in related technologies, and the utilization rate of high / low voltage DC sources, high-frequency AC / DC probes, differential probes and other equipment in the laboratory for actual application is improved; and, by using high-frequency AC / DC probes already available in the laboratory for actual application, the reverse recovery current is measured, and the bandwidth can reach 120MHz, thereby enabling more accurate testing of characteristics such as the peak value, time, slope and reverse recovery loss of the reverse recovery current; and, the power supply module of the embodiment of the present application can output a negative polarity drive voltage of adjustable size, thereby being able to adapt to the type and type of the power device to be tested, thereby enabling working characteristic tests of more types and types of power devices.

[0047] In an exemplary embodiment, referring to Figure 2 The power module 20 includes a series voltage stabilizing circuit 210 , a negative voltage generating circuit 220 and a rectifier output circuit 230 .

[0048] The input of the series voltage regulator circuit 210 is connected to an external low-voltage DC source for receiving the supply voltage DC+. The output of the series voltage regulator circuit 210 is connected to the input of the negative voltage generating circuit 220, which in turn is connected to the input of the rectifier output circuit 230. The output of the rectifier output circuit 230 is connected to the driver module 40 for outputting a negative polarity drive voltage VSS to the driver module 40. The series voltage regulator circuit 210, the negative voltage generating circuit 220, and the rectifier output circuit 230 are all connected to the reference ground PGND.

[0049] Among them, the series voltage regulator circuit 210 is used to generate an adjustable initial negative voltage based on the power supply voltage DC+ provided by an external low-voltage DC source, the negative voltage generating circuit 220 is used to generate a negative polarity driving voltage based on the adjustable initial negative voltage, and the rectifier output circuit 230 is used to rectify and output the negative polarity driving voltage to the driving module 40, that is, the driving module 40 can receive the negative polarity driving voltage VSS from the rectifier output circuit 230.

[0050] In an exemplary embodiment, referring to Figure 3 The series voltage stabilization circuit 210 includes a first adjustable resistance unit 211 , a comparator unit 212 and a transistor unit 213 .

[0051] The first end of the transistor unit 213 is connected to an external low-voltage DC source for receiving a supply voltage DC+. The second end of the transistor unit 213 is connected to the first end of the first adjustable resistor unit 211. The second end of the transistor unit 213 is connected to the first input terminal of the negative voltage generating circuit 220, which may be, for example, the positive electrode +. The control end of the transistor unit 213 is connected to the first end of the comparator unit 212.

[0052] The second terminal of the comparator unit 212 is connected to the reference ground. The second terminal of the comparator unit 212 is connected to the second terminal of the input terminal of the negative voltage generating circuit 220. The second terminal of the input terminal of the negative voltage generating circuit 220 is, for example, the negative terminal -. The third terminal of the comparator unit 212 is connected to the second terminal of the first adjustable resistor unit 211.

[0053] The equivalent resistance value of the first adjustable resistor unit 211 is adjustable, and the magnitude of the adjustable initial negative voltage varies with the magnitude of the equivalent resistance value of the first adjustable resistor unit 211. That is, the magnitude of the adjustable initial negative voltage output by the series voltage regulator circuit 210 can be adjusted by adjusting the equivalent resistance value of the first adjustable resistor unit 211, thereby adjusting the magnitude of the negative polarity driving voltage output by the negative voltage generating circuit 220, thereby achieving the output of negative polarity driving voltages VSS of different magnitudes.

[0054] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3 In the embodiment, the first adjustable resistance unit 211 may include a potentiometer R17. Exemplarily, the resistance value of the potentiometer R17 is adjustable, and the maximum resistance value of the potentiometer R17 is 20KΩ. Exemplarily, the first end of the potentiometer R17 serves as the first end of the first adjustable resistance unit 211, and the second end of the potentiometer R17 serves as the second end of the first adjustable resistance unit 211. The resistance adjustment end of the potentiometer R17 is connected to the first end of the potentiometer R17.

[0055] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3 In the embodiment, the comparator unit 212 may include a three-terminal adjustable shunt regulator U4, a capacitor C1, a capacitor C12, a resistor R15, and a resistor R20. For example, the model of the three-terminal adjustable shunt regulator U4 is TL431, the capacitance value of the capacitor C1 is 100nF, the capacitance value of the capacitor C12 is 33pF, the resistance value of the resistor R15 is 3KΩ, and the resistance value of the resistor R20 is 3KΩ. For example, the first terminal of the three-terminal adjustable shunt regulator U4 serves as the first terminal of the comparator unit 212, and the second terminal of the three-terminal adjustable shunt regulator U4 serves as the comparator. The second end of the comparator unit 212, the first end of the capacitor C1 is connected to the first end of the three-terminal adjustable shunt regulator U4, the second end of the capacitor C1 is connected to the third end of the three-terminal adjustable shunt regulator U4, the first end of the capacitor C12 is connected to the third end of the three-terminal adjustable shunt regulator U4, the second end of the capacitor C12 is connected to the second end of the three-terminal adjustable shunt regulator U4, the resistor R15 is connected in parallel with the capacitor C12, the first end of the resistor R20 is connected to the third end of the three-terminal adjustable shunt regulator U4, and the second end of the resistor R20 serves as the third end of the comparator unit 212.

[0056] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3 In the embodiment, the transistor unit 213 may include a transistor Q1 and a resistor R4. Exemplarily, the resistance value of the resistor R4 is 5.6KΩ. Exemplarily, the first end of the transistor Q1 serves as the first end of the transistor unit 213, the second end of the transistor Q1 serves as the second end of the transistor unit 213, the control end of the transistor Q1 serves as the control end of the transistor unit 213, the first end of the resistor R4 is connected to the first end of the transistor Q1, and the second end of the resistor R4 is connected to the control end of the transistor Q1.

[0057] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3 In the embodiment, the series voltage regulator circuit 210 may further include a diode D2, a capacitor C3, a resistor R9 and a capacitor EC1. For example, the capacitance value of the capacitor C3 is 1 μF, the resistance value of the resistor R9 is 15 KΩ, and the capacitance value of the capacitor EC1 is 100 μF / 35 V. For example, the anode of the diode D2 is connected to an external low-voltage DC source for receiving the power supply voltage DC+, the cathode of the diode D2 is connected to the first end of the transistor unit 213, that is, the first end of the transistor unit 213 is connected to the external low-voltage DC source through the diode D2, the first end of the capacitor C3 is connected to the first end of the transistor unit 213, the second end of the capacitor C3 is connected to the second end of the comparator unit 212, the first end of the resistor R9 is connected to the first end of the first adjustable resistor unit 211, the second end of the resistor R9 is connected to the second end of the comparator unit 212, and the capacitor EC1 is connected in parallel with the resistor R9.

[0058] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3 In the embodiment, the negative voltage generating circuit 220 may include a 555 timer U2, a resistor R6, a resistor R7, a resistor R8, a capacitor C2, a capacitor C9 and a capacitor EC2. For example, the resistance value of the resistor R6 is 10KΩ, the resistance value of the resistor R7 is 30KΩ, the resistance value of the resistor R8 is 10KΩ, the capacitance value of the capacitor C2 is 1nF, the capacitance value of the capacitor C9 is 100nF, and the capacitance value of the capacitor EC2 is 22μF / 35V. The VCC pin of the 555 timer U2 is used to receive the series stabilizer. The adjustable initial negative voltage output by the series voltage regulator circuit 210, the OUT pin of the 555 timer U2 is used to output a negative polarity driving voltage to the rectifier output circuit 230. Exemplarily, the first end of the resistor R6 is connected to the first electrode (e.g., the positive electrode +) of the output end of the series voltage regulator circuit 210, the second end of the resistor R6 is connected to the first end of the resistor R7, the second end of the resistor R7 is connected to the first end of the capacitor C2, and the second end of the capacitor C2 is connected to the second electrode (e.g., the negative electrode -) of the output end of the series voltage regulator circuit 210, wherein, A first electrode of the output end of the series voltage regulator circuit 210 is connected to a first electrode of the input end of the negative voltage generating circuit 220, a second electrode of the output end of the series voltage regulator circuit 210 is connected to a second electrode of the input end of the negative voltage generating circuit 220, a first end of the resistor R8 is connected to a first end of the resistor R6, a second end of the resistor R8 is connected to the RESET pin of the 555 timer U2, a first end of the capacitor C9 is connected to the CONT pin of the 555 timer U2, a second end of the capacitor C9 is connected to the second end of the capacitor C2, a first end of the capacitor C2 is also connected to the TRIG pin of the 555 timer U2, a first end of the capacitor C2 is also connected to the THRES pin of the 555 timer U2, a second end of the resistor R6 is also connected to the DISCH pin of the 555 timer U2, a first end of the resistor R6 is also connected to the VCC pin of the 555 timer U2, a GND pin of the 555 timer U2 is connected to the second end of the capacitor C2, and an OUT pin of the 555 timer U2 is connected to the input end of the rectifier output circuit 230 via the capacitor EC2.

[0059] In an exemplary embodiment, referring to Figure 3 ,exist Figure 3In the figure, the rectifier output circuit 230 may include a diode D6, a diode D7, a capacitor C10 and a capacitor EC3. Exemplarily, the capacitance value of capacitor C10 is 1μF, and the capacitance value of capacitor EC3 is 22μF / 35V. Exemplarily, the cathode of diode D6 serves as the input end of the rectifier output circuit 230, the anode of diode D6 is connected to the first end of capacitor EC3, the anode of diode D7 is connected to the cathode of diode D6, the cathode of diode D7 is connected to the second end of capacitor EC3, the second end of capacitor EC3 is connected to the reference ground PGND, capacitor C10 is connected to capacitor EC3 in parallel, and the anode of diode D6 serves as the output end of the rectifier output circuit 230, for outputting a negative polarity drive voltage VSS.

[0060] In an exemplary embodiment, referring to Figure 4 The driving module 40 includes a dual-way switch circuit 410 and a gate driving circuit 420 .

[0061] The first input terminal of the gate drive circuit 420 is connected to the processing module 30 for receiving a pulse signal, such as a PWM signal. The second input terminal of the gate drive circuit 420 is connected to the power module 20 for receiving a negative polarity drive voltage VSS. The third input terminal of the gate drive circuit 420 is connected to an external low-voltage DC source for receiving a positive polarity drive voltage VDD.

[0062] The first output terminal of the gate driving circuit 420 is connected to the input terminal of the dual-way switch circuit 410 , the second output terminal of the gate driving circuit 420 is connected to the output terminal of the dual-way switch circuit 410 , and the output terminal of the dual-way switch circuit 410 is connected to the input terminal GATE of the test module 10 .

[0063] Among them, the gate drive circuit 420 is used to control the conduction or disconnection between different contacts of the dual-way switching circuit 410 according to the pulse signal, so as to drive the test module 10 to test different working characteristics of the power device to be tested, such as testing the reverse recovery current of different slopes of the power device to be tested, testing the different reverse recovery times of the power device to be tested, testing the different reverse recovery current peaks of the power device to be tested, and testing the different reverse recovery losses of the power device to be tested.

[0064] In an exemplary embodiment, referring to Figure 5 ,exist Figure 5 In the embodiment, the dual-way switch circuit 410 includes a second adjustable resistance unit 411 and a dual-way switch unit 412. Figure 5In the embodiment, the dual-way switch unit 412 includes a first resistor subunit and a dual-way switch S1. The dual-way switch S1 includes a first contact 1, a second contact 2, a third contact 3, a fourth contact 4, a fifth contact 5, and a sixth contact 6. The first contact 1 is connected to the first end of the first resistor subunit, the sixth contact 6 is connected to the first end of the first resistor subunit, and the second end of the first resistor subunit is connected to the input terminal GATE of the test module 10, that is, the second end of the first resistor subunit serves as the output terminal of the dual-way switch circuit 410, the second contact 2 is connected to the first output terminal of the gate drive circuit 420, and the fifth contact 5 is connected to the gate drive circuit. The first output end of the gate drive circuit 420 is connected, the third contact 3 is connected to the first end of the second adjustable resistance unit 411, the fourth contact 4 is connected to the first end of the second adjustable resistance unit 411, the second end of the second adjustable resistance unit 411 is connected to the second end of the first resistance sub-unit, the second end of the second adjustable resistance unit 411 is connected to the second output end of the gate drive circuit 420, and the resistance adjustment end of the second adjustable resistance unit 411 is connected to the second end of the second adjustable resistance unit 411, wherein the slope of the reverse recovery current of the power device to be tested is adjusted by adjusting the equivalent resistance value of the second adjustable resistance unit 411.

[0065] In an exemplary embodiment, referring to Figure 5 ,exist Figure 5 In the embodiment, the second adjustable resistance unit 411 may include a potentiometer R14. Exemplarily, the resistance value of the potentiometer R14 is adjustable, and the maximum resistance value of the potentiometer R14 is IK. Exemplarily, the first end of the potentiometer R14 serves as the first end of the second adjustable resistance unit 411, the second end of the potentiometer R14 serves as the second end of the second adjustable resistance unit 411, and the resistance adjustment end of the potentiometer R14 serves as the resistance adjustment end of the second adjustable resistance unit 411.

[0066] In an exemplary embodiment, referring to Figure 5 ,exist Figure 5 In the embodiment, the first resistance subunit may include a resistor R5, which is marked with "R on" and serves as a driving resistor during a reverse recovery current test.

[0067] In an exemplary embodiment, referring to Figure 5 ,exist Figure 5 In the embodiment, the dual-way switch circuit 410 may further include a resistor R10. For example, the resistance value of the resistor R10 is 10KΩ. For example, the first end of the resistor R10 is connected to the second end of the second adjustable resistor unit 411, and the second end of the resistor R10 is connected to the reference ground PGND.

[0068] Among them, the gate drive circuit 420 is used to control the conduction or disconnection between different contacts among the first contact 1, the second contact 2, the third contact 3, the fourth contact 4, the fifth contact 5 and the sixth contact 6 in the dual switch S1 according to the PWM signal, so as to drive the test module 10 to test different working characteristics of the power device to be tested, such as testing the reverse recovery current of different slopes of the power device to be tested, testing the different reverse recovery times of the power device to be tested, testing the different reverse recovery current peaks of the power device to be tested, and testing the different reverse recovery losses of the power device to be tested.

[0069] In an exemplary embodiment, referring to Figure 5 ,exist Figure 5In the embodiment, the gate drive circuit 420 may include a gate driver U3, a resistor R1, a resistor R2, a resistor R3, a resistor R12, a resistor R13, a capacitor C5, a capacitor C6, a capacitor C7, a capacitor C8, a capacitor C15 and a diode D2. For example, the capacitance value of the capacitor C5 is 33pF, the capacitance value of the capacitor C6 is 4.7μF, the capacitance value of the capacitor C7 is 100nF, the capacitance value of the capacitor C8 is 4.7μF, and the capacitance value of the capacitor C15 is 4.7Mf. For example, the first end of the resistor R2 is connected to the processing module 30 for receiving a pulse signal (for example, a PWM signal). ), the second end of the resistor R2 is connected to the IN+ pin of the gate driver U3, the first end of the resistor R12 is connected to the power supply voltage +3.3V (specifically, the first end of the resistor R12 can be connected to another external low-voltage DC power supply for receiving the power supply voltage +3.3V), the second end of the resistor R12 is connected to the VCC1 pin of the gate driver U3, the first end of the capacitor C5 is connected to the second end of the resistor R2, the second end of the capacitor C5 is connected to the reference ground GND, the first end of the capacitor C7 is connected to the second end of the resistor R12, the second end of the capacitor C7 is connected to the reference ground GND, the I The N-pin and the GND1 pin are both connected to the reference ground GND, the first end of the resistor R1 is connected to the power module 20 for receiving the negative polarity drive voltage VSS, the second end of the resistor R1 is connected to the VEE2 pin of the gate driver U3, the first end of the capacitor C6 is connected to the second end of the resistor R1, the second end of the capacitor C6 is connected to the reference ground PGND, the first end of the capacitor C8 is connected to the reference ground PGND, the second end of the capacitor C8 is connected to the VCC2 pin of the gate driver U3, the first end of the capacitor C15 is connected to the first end of the capacitor C8, and the second end of the capacitor C15 is connected to the second end of the capacitor C8 The first end of the resistor R3 is connected to the second end of the capacitor C8, the second end of the resistor R3 is connected to the cathode of the diode D2, the anode of the diode D2 is connected to the external low-voltage DC power supply for receiving the positive polarity driving voltage VDD, the resistor R13 is marked with "R off", the first end of the resistor R13 is connected to the OUT1- pin of the gate driver U3, the second end of the resistor R13 is connected to the input terminal GATE of the test module 10, and the OUT1+ pin of the gate driver U3 is connected to the input terminal of the dual-way switch circuit 410, wherein the resistor R13 serves as a turn-off resistor during the reverse recovery current test.

[0070] In an exemplary embodiment, referring to Figure 6 ,exist Figure 6 In the embodiment, the test module 10 includes a first connection terminal, a second connection terminal, a third connection terminal, a current test port IRR, an air-core inductor unit LM, an auxiliary power device Q2 (lower tube), a diode unit 110 , a first resistance unit 120 and a capacitance unit 130 .

[0071] refer to Figure 6 ,exist Figure 6 In the figure, the first connecting terminal, the second connecting terminal and the third connecting terminal are respectively used to connect the three ends of the power device Q1 (upper tube) to be tested, the first pole (for example, the negative pole -) of the current test port IRR is connected to the second connecting terminal, the second pole (for example, the positive pole +) of the current test port IRR is connected to the first end BVDSS of the capacitor unit, the current test port IRR is used to connect to an external current test probe, the first pole (for example, the negative pole -) of the air-core inductor unit LM is connected to the second pole of the current test port IRR, and the second pole (for example, the positive pole -) of the air-core inductor unit LM is connected to the first connecting terminal.

[0072] refer to Figure 6 ,exist Figure 6 In the embodiment, the first end of the auxiliary power device Q2 (lower tube) is connected to the first connection terminal, the second end of the auxiliary power device Q2 (lower tube) is connected to the reference ground PGND, and the third end GATE of the auxiliary power device Q2 (lower tube) is connected to the driving module 40 to receive the driving signal output by the driving module 40. The test module 10 tests the operating characteristics of the power device to be tested Q1 (upper tube) according to the driving signal.

[0073] refer to Figure 6 ,exist Figure 6 In the figure, the first end of the diode unit 110 is connected to the third end GATE of the auxiliary power device Q2 (lower tube), the second end of the diode unit 110 is connected to the reference ground PGND, the first end of the first resistor unit 120 is connected to the first connection terminal, the second end of the first resistor unit 120 is connected to the third connection terminal, the first end BVDSS of the capacitor unit 130 is connected to the external high-voltage DC source, and the second end of the capacitor unit 130 is connected to the reference ground PGND. Exemplarily, the capacitor unit 130 includes multiple high-voltage capacitors, such as but not limited to 4 high-voltage capacitors (C1, C2, C3 and C4), and the multiple high-voltage capacitors are connected in parallel. The external high-voltage DC source connected to the first end BVDSS of the capacitor unit 130 is used to charge the multiple high-voltage capacitors, and the multiple high-voltage capacitors store electrical energy for the needs of working characteristic testing.

[0074] In an exemplary embodiment, referring to Figure 6 ,exist Figure 6In the embodiment, the diode unit 110 may include a diode D3 and a diode D4. Exemplarily, the operating voltages of the diodes D3 and D4 are both 24V. The first resistor unit 120 may include a resistor R10 and a resistor R12. Exemplarily, the resistance values ​​of the resistor R10 and the resistor R12 are both 10KΩ. The capacitor unit 130 may include a capacitor C1, a capacitor C2, a capacitor C3, and a capacitor C4. Exemplarily, the cathode of the diode D3 is connected to the third terminal GATE of the auxiliary power device Q2 (lower tube), the anode of the diode D3 is connected to the anode of the diode D4, and the cathode of the diode D4 is connected to the reference ground PGND. The first end of the resistor R10 is connected to the first connection terminal, the second end of the resistor R10 is connected to the third connection terminal, and the resistor R12 is connected in parallel with the resistor R10. Exemplarily, the capacitance values ​​of the capacitors C1, C2, C3, and C4 are all 30μF / 1.1KV, and the capacitors C1, C2, C3, and C4 are connected in parallel in sequence.

[0075] In an exemplary embodiment, in combination Figure 7 、 Figure 8 and Figure 9 The testing device further includes a high-voltage filtering module 50 and a high-voltage detection module 60 .

[0076] The first terminal BVDSS of the capacitor unit 130 in the test module 10 is connected to an external high-voltage DC source through a high-voltage filter module 50 . The high-voltage filter module 50 is used to filter the DC power output from the external high-voltage DC source to the capacitor unit 130 .

[0077] The high-voltage detection module 60 is connected to the high-voltage filter module 50 . The high-voltage detection module 60 is used to detect the voltage of the capacitor unit 130 to ensure that the voltage of the capacitor unit 130 is within a safe voltage range.

[0078] In an exemplary embodiment, referring to Figure 8 ,exist Figure 8In the embodiment, the high-voltage filter module 50 may include an optocoupler isolator U2, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R6, a resistor R7, a resistor R8, a resistor R9, a capacitor EC2, a capacitor EC3, a capacitor EC4, a capacitor EC5, a resistor R13, a resistor R14, an inductor L1, an inductor L2, an inductor L3, a diode D1 and a diode D2. For example, the resistors R2, R3, R4, R5, R6, R7, R8 and R9 are The resistance values ​​are all 300KΩ, the capacitance values ​​of capacitors EC2, EC3, EC4 and EC5 are all 4.7μF / 550V, the resistance values ​​of resistors R13 and R14 are all 1MEG, the models of diodes D1 and D2 are all ES3M, the inductance values ​​of inductors L1, L2 and L3 are all 5μH, and the model of optocoupler isolator U2 is PC817. Among them, each resistor can be used for, but is not limited to, high voltage detection, and each capacitor can be used for, but is not limited to, filtering.

[0079] refer to Figure 8 ,exist Figure 8In the embodiment, the first terminal 1 of the optocoupler isolator U2 is connected to the first end of the resistor R2, the second end of the resistor R2 is connected to the first end of the resistor R3, the second end of the resistor R3 is connected to the first end of the resistor R4, the second end of the resistor R4 is connected to the first end of the resistor R5, the second end of the resistor R5 is connected to the first end BVDSS of the capacitor unit 130, the first end of the resistor R6 is connected to the first end of the resistor R2, the second end of the resistor R6 is connected to the first end of the resistor R7, the second end of the resistor R7 is connected to the first end of the resistor R8, the second end of the resistor R8 is connected to the first end of the resistor R9, the second end of the resistor R9 is connected to the second end of the resistor R5, the first end of the capacitor EC3 is connected to the reference ground PGND, the second end of the capacitor EC3 is connected to the first end of the capacitor EC2, the second end of the capacitor EC2 is connected to the second end of the resistor R9, the first end of the inductor L1 is connected to the second end of the resistor R9, and the second end of the inductor L1 is connected to the first end of the capacitor EC4. The first end of the inductor L2 is connected to the first end of the capacitor EC3, the second end of the inductor L2 is connected to the second end of the capacitor EC5, the first end of the inductor L3 is connected to the second end of the inductor EC5, the first end of the inductor L3 is connected to the second end of the resistor R14, the second end of the inductor L3 is connected to the positive electrode 2 of the output end of the external high-voltage DC source, the cathode of the diode D1 is connected to the first end of the resistor R13, the anode of the diode D1 is connected to the cathode of the diode D2, the anode of the diode D2 is connected to the negative electrode 1 of the output end of the external high-voltage DC source, the second terminal 2 of the optocoupler isolator U2 is connected to the reference ground PGND, the third terminal 3 of the optocoupler isolator U2 is connected to the reference ground GND, and the fourth terminal 4 of the optocoupler isolator U2 is connected to the high-voltage detection module 60.

[0080] In an exemplary embodiment, referring to Figure 9 ,exist Figure 9In the embodiment, the high-voltage detection module 60 may include a resistor R18, a resistor R27, a resistor R26, a resistor R29, a resistor R25, a resistor R30, a resistor R28, a resistor R16, a capacitor EC4, a capacitor C32, a capacitor C31, a capacitor C30, a power supply battery BAT, a start-up diode, a high-voltage indication diode, a chip U6 and a switch S2. For example, the model of the chip U6 is GS321-TR, the power supply voltage output by the power supply battery BAT may be +3.3V, the capacitance value of the capacitor EC4 is 1500μF / 6.3V, the resistance value of the resistor R18 is 2.4K, the capacitance value of the capacitor C32 is 1μF, and the resistance value of the resistor R25 is 300Ω. The resistance value of resistor R26 is 10KΩ, the resistance value of resistor R29 is 10KΩ, the capacitance value of capacitor C31 is 100pF, the resistance value of resistor R30 is 10KΩ, the resistance value of resistor R28 is 24KΩ, the resistance value of resistor R16 is 18KΩ, and the capacitance value of capacitor C30 is 100pF. Exemplarily, a first end of switch S2 is connected to the positive electrode BAT+ of the power supply battery BAT, a second end of switch S2 is connected to the first end of capacitor EC4, a second end of capacitor EC4 is connected to the negative electrode BAT- of the power supply battery BAT, a first end of resistor R18 is connected to the first end of capacitor EC4, a second end of resistor R18 is connected to the anode of the start-up diode, and the start-up diode is connected to the positive electrode BAT+ of the power supply battery BAT. The cathode of the diode is connected to the negative electrode BAT-, the first end of the resistor R27 is connected to the first end of the resistor R18, the second end of the resistor R27 is connected to the first end of the capacitor C32, the second end of the capacitor C32 is connected to the negative electrode BAT-, the first end of the capacitor C32 is connected to the VDD pin of the chip U6, the first end of the resistor R26 is connected to the first end of the capacitor C32, the second end of the resistor R26 is connected to the first end of the resistor R28, the second end of the resistor R28 is connected to the negative electrode BAT-, the first end of the resistor R29 is connected to the first end of the capacitor C32, the first end of the resistor R29 is connected to the first end of the resistor R30, the second end of the resistor R30 is connected to the negative electrode BAT-, and the first end of the resistor R29 is connected to the first end of the capacitor C32. The second end of resistor R29 is connected to the IN+ pin of chip U6, the first end of capacitor C31 is connected to the IN+ pin of chip U6, the negative electrode BAT- of capacitor C31 is connected, the VSS pin of chip U6 is connected to the negative electrode BAT-, the first end of resistor R25 is connected to the OUT pin of chip U6, the second end of resistor R25 is connected to the anode of the high-voltage indicator diode, the cathode of the high-voltage indicator diode is connected to the negative electrode BAT-, resistor R16 is connected in parallel with resistor R28, capacitor C30 is connected in parallel with resistor R28, the first end of capacitor C30 is connected to the high-voltage filter module 50, the second end of capacitor C30 is connected to the negative electrode BAT-, and the negative electrode BAT- is connected to the reference ground GND.

[0081] In an exemplary embodiment, referring to Figure 10 ,exist Figure 10In the embodiment, the processing module 30 includes a single-chip microcomputer U1, a second resistor unit 310, a third resistor unit 320, a first switch K2, and a second switch K3; the pulse output pin of the single-chip microcomputer U1 is connected to the driving module 40 for outputting a pulse signal, the first characteristic test modulation pin of the single-chip microcomputer U1 is connected to the GND pin of the single-chip microcomputer U1 through the second resistor unit 310 and the first switch K2 in sequence, the second characteristic test modulation pin of the single-chip microcomputer U1 is connected to the GND pin of the single-chip microcomputer U1 through the third resistor unit 320 and the second switch K3 in sequence, and the power supply voltage received by the single-chip microcomputer U1 is The voltage is +4.5V, wherein the first switch K2 and the second switch K3 receive different triggering actions, corresponding to different working characteristics of the power device to be tested; for example, the triggering action is, for example, long pressing the switch, short pressing the switch, pressing the switch at a relatively high frequency, or pressing the switch at a relatively low frequency; the working characteristics tested are different, for example, but not limited to testing reverse recovery currents with different slopes; the single-chip microcomputer U1 is configured with a program for testing the working characteristics of the power device to be tested, such as a program for measuring switching characteristics or a program for measuring reverse recovery characteristics; when measuring the switching characteristics, Figure 6 The lower tube Q2 is removed, and the power device Q1 to be tested is set in the position where the lower tube Q2 is set, and the switching characteristics of the power device Q1 to be tested are tested.

[0082] In an exemplary embodiment, referring to Figure 10 ,exist Figure 10 In the embodiment, the second resistance unit 310 may include a resistor R3, and the third resistance unit 320 may include a resistor R4. For example, the resistance values ​​of the resistor R3 and the resistor R4 are both 1KΩ. Figure 10 In the embodiment, the processing module 30 may further include a resistor R1, a capacitor C1, a switch S1 and a light-emitting diode LED1. Exemplarily, the resistance value of the resistor R1 is 2.2KΩ. Exemplarily, the first end of the capacitor C1 is connected to the GND pin of the microcontroller U1, the second end of the capacitor C1 is connected to the VCC pin of the microcontroller U1, the second end of the capacitor C1 is connected to the first end of the switch S1, the second end of the switch S1 is connected to the power supply voltage +4.5V, the first end of the resistor R1 is connected to the VCC pin of the microcontroller U1, the second end of the resistor R1 is connected to the anode of the light-emitting diode LED1, the cathode of the light-emitting diode LED1 is connected to the GND pin of the microcontroller U1, and the GND pin of the microcontroller U1 is connected to the reference ground.

[0083] In an exemplary embodiment, a power device operating characteristic testing apparatus includes a first printed circuit board, a second printed circuit board, a third printed circuit board, and a fourth printed circuit board.

[0084] refer to Figure 11 The actual picture of the power device operating characteristics test device shown in the figure, of course, Figure 11Only some components of the power device operating characteristics test device are shown in the figure, and other components are not shown, such as Figure 11 The trigger button of the main circuit is not shown in the figure. In actual application, Figure 11 All components of the power device operating characteristics test device are integrated on the circuit board; among them, exemplarily, the test module 10 is integrated on the first printed circuit board; the power module 20 is integrated on the second printed circuit board, and the second printed circuit board is arranged on the first printed circuit board; the processing module 30 is integrated on the third printed circuit board, and the third printed circuit board is arranged on the first printed circuit board; the driving module 40 is integrated on the fourth printed circuit board, and the fourth printed circuit board is arranged on the first printed circuit board.

[0085] In the embodiment of the present application, relatively speaking, the second printed circuit board, the third printed circuit board and the fourth printed circuit board are all small boards arranged on the first printed circuit board (large board).

[0086] It should be noted that: after configuring the specific air-core inductor conditions, the external access requires high voltage conditions and drive voltage amplitude; through Figure 10 The K2 / K3 button in the middle adjusts the conduction time width of the auxiliary power device Q2 (lower tube); Figure 4 In the test, the R14 potentiometer adjusts the reverse recovery slope of the pulse current to achieve the initial current of the test condition; then Figure 11 The trigger button on the Figure 13 ), input two pulse signals with the above conditions to the auxiliary power device Q2 (lower tube). The first signal charges the circuit to the initial current, and the second pulse is the formal reverse recovery pulse. The reverse recovery current characteristics and time of the rising process of the second pulse are tested; the turn-on and turn-off times record the falling process of the first pulse and the turning-on process of the second pulse.

[0087] in addition, Figure 12 The figure also shows the remaining circuits that the driving module 40 may include, that is, the driving module 40 may also include Figure 12 U4 and its surrounding circuits, the surrounding circuits at least include capacitors C7 and C6; Figure 12 U4 and its surrounding circuits are used to drive the auxiliary power device Q2 (lower tube).

[0088] Figure 13 The processing module 30 may also include other circuits, that is, the processing module 30 may also include Figure 13 U1 and its surrounding circuits in the circuit, the surrounding circuits at least include capacitor C32, resistor R1 and a trigger switch.

[0089] Figure 14The power module 20 also shows other circuits that may be included, that is, the power module 20 may also include Figure 14 The chip and its surrounding circuits.

[0090] In the description of this specification, reference to the terms "some embodiments" or "other embodiments" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0091] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0092] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A power device operating characteristics testing device, characterized in that: The device includes a testing module, a power supply module, a processing module and a driving module; The test module is used to connect the power device to be tested, access the external current test probe and access the external high-voltage DC source required for the test; The power supply module is used to connect to an external low-voltage DC source and output a negative polarity driving voltage, wherein the magnitude of the negative polarity driving voltage is adapted to the type of the power device to be tested; The processing module is used to output the pulse signal required for testing the working characteristics of the power device to be tested; The driving module is respectively connected to the processing module, the power supply module, and the testing module, and is connected to the external low-voltage DC source. The driving module is used to receive the negative polarity driving voltage and the positive polarity driving voltage output by the external low-voltage DC source, and drive the testing module according to the pulse signal to test the working characteristics of the power device to be tested.

2. The device according to claim 1, characterized in that The power supply module includes a series voltage stabilization circuit, a negative voltage generation circuit and a rectification output circuit; The input end of the series voltage stabilization circuit is connected to the external low-voltage DC source, the output end of the series voltage stabilization circuit is connected to the input end of the negative voltage generating circuit, the output end of the negative voltage generating circuit is connected to the input end of the rectifier output circuit, and the output end of the rectifier output circuit is connected to the driving module, wherein the series voltage stabilization circuit, the negative voltage generating circuit, and the rectifier output circuit are all connected to a reference ground; The series voltage stabilization circuit is used to generate an adjustable initial negative voltage according to the voltage provided by the external low-voltage DC source, the negative voltage generating circuit is used to generate the negative polarity driving voltage according to the adjustable initial negative voltage, and the rectifier output circuit is used to rectify the negative polarity driving voltage and output it to the driving module.

3. The device according to claim 2, characterized in that The series voltage stabilization circuit includes a first adjustable resistance unit, a comparator unit and a triode unit; The first end of the triode unit is connected to the external low-voltage DC source, the second end of the triode unit is connected to the first end of the first adjustable resistor unit, the second end of the triode unit is connected to the first electrode of the input end of the negative voltage generating circuit, and the control end of the triode unit is connected to the first end of the comparator unit; The second end of the comparator unit is connected to the reference ground, the second end of the comparator unit is connected to the second electrode of the input end of the negative voltage generating circuit, and the third end of the comparator unit is connected to the second end of the first adjustable resistance unit; The magnitude of the adjustable initial negative voltage varies with the magnitude of the equivalent resistance value of the first adjustable resistance unit.

4. The device according to claim 1, characterized in that The driving module includes a dual-way switch circuit and a gate driving circuit; The first input terminal of the gate drive circuit is connected to the processing module for receiving the pulse signal; the second input terminal of the gate drive circuit is connected to the power supply module for receiving the negative polarity drive voltage; the third input terminal of the gate drive circuit is connected to the external low-voltage DC source for receiving the positive polarity drive voltage; The first output end of the gate drive circuit is connected to the input end of the dual-way switch circuit, the second output end of the gate drive circuit is connected to the output end of the dual-way switch circuit, and the output end of the dual-way switch circuit is connected to the input end of the test module; The gate drive circuit is used to control the conduction or disconnection between different contacts of the dual-way switch circuit according to the pulse signal, so as to drive the test module to test different operating characteristics of the power device to be tested.

5. The device according to claim 4, characterized in that The dual-way switch circuit includes a second adjustable resistance unit and a dual-way switch unit, and the dual-way switch unit includes a first resistance sub-unit, a first contact, a second contact, a third contact, a fourth contact, a fifth contact and a sixth contact; The first contact is connected to the first end of the first resistance subunit, the sixth contact is connected to the first end of the first resistance subunit, and the second end of the first resistance subunit is connected to the input end of the test module; The second contact is connected to the first output terminal of the gate drive circuit, and the fifth contact is connected to the first output terminal of the gate drive circuit; The third contact is connected to the first end of the second adjustable resistance unit, and the fourth contact is connected to the first end of the second adjustable resistance unit; The second end of the second adjustable resistance unit is connected to the second end of the first resistance sub-unit, the second end of the second adjustable resistance unit is connected to the second output end of the gate drive circuit, and the resistance adjustment end of the second adjustable resistance unit is connected to the second end of the second adjustable resistance unit.

6. The device according to claim 5, characterized in that The second adjustable resistance unit includes a potentiometer; the first end of the potentiometer serves as the first end of the second adjustable resistance unit, the second end of the potentiometer serves as the second end of the second adjustable resistance unit, and the resistance adjustment end of the potentiometer serves as the resistance adjustment end of the second adjustable resistance unit.

7. The device according to claim 1, characterized in that The test module includes a first connection terminal, a second connection terminal, a third connection terminal, a current test port, an air-core inductor unit, an auxiliary power device, a diode unit, a first resistance unit and a capacitance unit; The first connecting terminal, the second connecting terminal and the third connecting terminal are respectively used to connect three terminals of the power device to be tested; The first pole of the current test port is connected to the second connection terminal, the second pole of the current test port is connected to the first end of the capacitor unit, and the current test port is used to connect to the external current test probe; The first pole of the air-core inductor unit is connected to the second pole of the current test port, and the second pole of the air-core inductor unit is connected to the first connection terminal; A first end of the auxiliary power device is connected to the first connection terminal, a second end of the auxiliary power device is connected to a reference ground, and a third end of the auxiliary power device is connected to the driving module; The first end of the diode unit is connected to the third end of the auxiliary power device, and the second end of the diode unit is connected to the reference ground; A first end of the first resistor unit is connected to the first connection terminal, and a second end of the first resistor unit is connected to the third connection terminal; A first end of the capacitor unit is connected to the external high-voltage DC source, and a second end of the capacitor unit is connected to a reference ground.

8. The device according to claim 7, characterized in that The device also includes a high-voltage filtering module and a high-voltage detection module; The first end of the capacitor unit is connected to the external high-voltage DC source through the high-voltage filter module, and the high-voltage filter module is used to filter the DC power output by the external high-voltage DC source to the capacitor unit; The high-voltage detection module is connected to the high-voltage filter module, and the high-voltage detection module is used to detect the voltage of the capacitor unit.

9. The device according to claim 1, characterized in that The processing module includes a single chip microcomputer, a second resistance unit, a third resistance unit, a first switch and a second switch; The pulse output pin of the single chip microcomputer is connected to the driving module for outputting the pulse signal; The first characteristic test modulation pin of the single chip microcomputer is connected to the ground pin of the single chip microcomputer through the second resistance unit and the first switch in sequence; The second characteristic test modulation pin of the single chip microcomputer is connected to the ground pin of the single chip microcomputer through the third resistance unit and the second switch in sequence; The first switch and the second switch receive different triggering actions, corresponding to different working characteristics tested on the power device to be tested.

10. The device according to claim 1, characterized in that The device includes a first printed circuit board, a second printed circuit board, a third printed circuit board, and a fourth printed circuit board; The test module is integrated on the first printed circuit board; The power module is integrated on the second printed circuit board, and the second printed circuit board is arranged on the first printed circuit board; The processing module is integrated on the third printed circuit board, and the third printed circuit board is arranged on the first printed circuit board; The driving module is integrated on the fourth printed circuit board, and the fourth printed circuit board is arranged on the first printed circuit board.

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