Circuit for calculating impedance and phase

Abstract

The invention discloses a circuit for calculating impedance and phase, which comprises a voltage output module, a current acquisition module, a delay module and a calculation module, one end of the to-be-tested element is connected with the first end of the voltage output module; the second end of the voltage output module is connected with the calculation module and is also connected with the calculation module through the delay module; the voltage output module is used for providing voltage for the to-be-tested element and providing voltage information for the calculation module; the delay module is used for outputting delayed voltage information to the calculation module; the other end of the to-be-tested element is connected with the first end of the current acquisition module, the second end of the current acquisition module is grounded, and the third end of the current acquisition module is connected with the calculation module; the current acquisition module is used for acquiring current information of the to-be-measured element, and the calculation module is used for calculating impedance and phase of the to-be-measured element according to the voltage information, the current information and the delayed voltage information. According to the technical scheme, the impedance and the phase can be calculated at a time, and the testing efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of digital circuits, and in particular to a circuit for calculating impedance and phase. Background Art

[0002] In the audio driver and motor control fields, it is often necessary to measure the impedance and phase information of speaker resistors and motor coils. Traditional testing methods generally use single-point spectrum analysis and low-frequency DC analysis. Spectrum analysis is computationally complex, slow, and costly. Low-frequency DC analysis only provides impedance information, but not phase information. Summary of the Invention

[0003] The present invention provides a circuit for calculating impedance and phase, which can obtain impedance information and phase information in a one-time test, thereby improving test efficiency and reducing test costs.

[0004] According to one aspect of the present invention, there is provided a circuit for calculating impedance and phase, comprising a voltage output module, a current acquisition module, a delay module and a calculation module;

[0005] One end of the DUT is connected to the first end of the voltage output module, the second end of the voltage output module is connected to the calculation module, and the second end of the voltage output module is further connected to the calculation module via the delay module; the voltage output module is used to provide voltage to the DUT and provide voltage information to the calculation module; the delay module is used to output delayed voltage information to the calculation module;

[0006] The other end of the element under test is connected to the first end of the current acquisition module, the second end of the current acquisition module is grounded, and the third end of the current acquisition module is connected to the calculation module; the current acquisition module is used to obtain current information of the element under test, and the calculation module is used to calculate the impedance and phase of the element under test based on the voltage information, the current information and the delayed voltage information.

[0007] Optionally, the circuit for calculating impedance and phase further includes: a first conversion unit and a second conversion unit; one end of the first conversion unit is connected to the second end of the voltage output module, the second end of the first conversion unit is connected to the calculation module, and is further connected to the calculation module through the delay module; the first conversion unit is used to convert the analog voltage information output by the voltage output module into digital voltage information;

[0008] One end of the second conversion unit is connected to the current acquisition module, and the other end is connected to the calculation module; the second conversion unit is used to convert the analog current information output by the current acquisition module into digital current information.

[0009] Optionally, the delay module is used to perform a phase delay on the digital voltage information, and the phase delay includes T / 4.

[0010] Optionally, the calculation module includes: a first calculation unit, a second calculation unit, a third calculation unit, a fourth calculation unit, and a fifth calculation unit; an input end of the first calculation unit is connected to the first conversion unit, and an output end of the first calculation unit is connected to a first input end of the fifth calculation unit; the first calculation unit is configured to calculate the first component according to the voltage information;

[0011] The input end of the second calculation unit is connected to the first conversion unit and to the second conversion unit, and the output end of the second calculation unit is connected to the first input end of the fourth calculation unit; the second calculation unit is used to calculate the second component according to the voltage information and the current information;

[0012] The input end of the third calculation unit is connected to the second conversion unit and to the delay module, and the output end of the third calculation unit is connected to the second input end of the fourth calculation unit; the third calculation unit is used to calculate the third component according to the delayed voltage information and the current information;

[0013] The first output terminal of the fourth calculation unit is connected to the second input terminal of the fifth calculation unit; the fourth calculation unit is used to calculate the angle between the second component and the third component, and the radius of the second component and the third component according to the second component and the third component;

[0014] The fifth calculation unit is configured to calculate the impedance of the DUT according to the radii of the second component and the third component and the first component.

[0015] Optionally, the first calculation unit includes: a first multiplier and a first accumulator; the input end of the first multiplier is connected to the first conversion unit, the output end of the first multiplier is connected to the input end of the first accumulator, and the output end of the first accumulator is connected to the first input end of the fifth calculation unit;

[0016] The second calculation unit includes: a second multiplier and a second accumulator; an input end of the second multiplier is connected to the first conversion unit and to the second conversion unit, an output end of the second multiplier is connected to the input end of the second accumulator, and an output end of the second accumulator is connected to the first input end of the fourth calculation unit;

[0017] The third calculation unit includes: a third multiplier and a third accumulator; the input end of the third multiplier is connected to the second conversion unit and to the delay module, the output end of the third multiplier is connected to the input end of the third accumulator, and the output end of the third accumulator is connected to the second input end of the fourth calculation unit;

[0018] The fourth calculation unit includes a Cordic algorithm calculation circuit.

[0019] Optionally, the voltage output module is used to provide a sinusoidal voltage signal to the device under test;

[0020] The expression of the sinusoidal voltage signal is:

[0021] V(t)=a·sinωt.

[0022] Optionally, the delayed voltage signal is expressed as:

[0023] V′(t)=a·cosωt.

[0024] Optionally, the expression of the first component is:

[0025]

[0026] Wherein, A is the first component, V is the sinusoidal voltage signal, and T is the time period.

[0027] Optionally, the expression of the second component is:

[0028]

[0029] Wherein, B is the second component, V is the sinusoidal voltage signal, I is the current information, T is the time period, and Rz is the impedance of the device under test.

[0030] Optionally, the expression of the third component is:

[0031]

[0032] Wherein, C is the third component, V' is the delayed voltage signal, I is the current information, T is the time period, and Rz is the impedance of the device under test.

[0033] The circuit for calculating impedance and phase provided by an embodiment of the present invention provides a sinusoidal voltage signal to the component under test through a voltage output module. After the sinusoidal voltage is applied to the component under test, the current signal flowing through the component under test will lag behind the voltage signal. The current information flowing through the component under test can be obtained through the current acquisition module and input into the calculation module; the delay module can phase-delay the sinusoidal voltage signal output by the voltage output module and input the delayed voltage information into the calculation module, so that the calculation module can calculate the impedance and phase of the component under test based on the voltage information provided by the voltage output module, the current information provided by the current acquisition module, and the delayed voltage information provided by the delay module. The circuit for calculating impedance and phase provided by an embodiment of the present invention can obtain impedance information and phase information through a one-time test, has a simple circuit structure, can significantly improve test efficiency, and reduce test costs.

[0034] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present invention, nor is it intended to limit the scope of the present invention. Other features of the present invention will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0036] Figure 1 A schematic structural diagram of a circuit for calculating impedance and phase provided by an embodiment of the present invention;

[0037] Figure 2 A schematic structural diagram of another circuit for calculating impedance and phase provided by an embodiment of the present invention;

[0038] Figure 3 A schematic structural diagram of another circuit for calculating impedance and phase provided by an embodiment of the present invention;

[0039] Figure 4 A schematic structural diagram of another circuit for calculating impedance and phase provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0040] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0041] It should be noted that the terms "first", "second", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0042] Figure 1 A schematic diagram of a circuit for calculating impedance and phase provided by an embodiment of the present invention. Figure 1 The circuit for calculating impedance and phase includes a voltage output module 100, a current acquisition module 200, a delay module 300 and a calculation module 400; one end of the DUT 10 is connected to the first end of the voltage output module 100, the second end of the voltage output module 100 is connected to the calculation module 400, and the second end of the voltage output module 100 is further connected to the calculation module 400 through the delay module 300; the voltage output module 100 is used to provide voltage to the DUT 10 and provide voltage information to the calculation module 400; the delay module 300 is used to output delayed voltage information to the calculation module 400; the other end of the DUT 10 is connected to the first end of the current acquisition module 200, the second end of the current acquisition module 200 is grounded, and the third end of the current acquisition module 200 is connected to the calculation module 400; the current acquisition module 200 is used to obtain current information of the DUT 10, and the calculation module 400 is used to calculate the impedance and phase of the DUT 10 based on the voltage information, current information and delayed voltage information.

[0043] Specifically, the DUT 10 may be a device such as a speaker resistor or motor coil, for which impedance and phase information need to be measured. The speaker resistor or motor coil can be equivalently considered a circuit structure consisting of a resistor and an inductor in series. The voltage output module 100 may be a circuit capable of outputting a sinusoidal voltage signal to the DUT 10. The current acquisition module 200 may be a current sensor, configured to acquire current information flowing through the DUT 10 and input the acquired current information flowing through the DUT 10 into the calculation module 400. The voltage output module 100 outputs a sinusoidal voltage to the DUT 10, which flows through the DUT 10 and is then connected to ground through the current acquisition module 200 to form a loop structure. The second end of the voltage output module 100 inputs the voltage information it outputs into the delay module 300 and the calculation module 400, respectively. The delay module 300 may phase-delay the voltage information flowing through the delay module 300, which then inputs the delayed voltage information into the calculation module 400. The calculation module 400 may be a microprocessor unit. The microprocessing unit can calculate the impedance and phase of the device under test 10 according to the voltage information provided by the voltage output module 100 , the current information provided by the current acquisition module 200 , and the delayed voltage information provided by the delay module 300 .

[0044] The circuit for calculating impedance and phase provided by an embodiment of the present invention provides a sinusoidal voltage signal to the component under test through a voltage output module. After the sinusoidal voltage is applied to the component under test, the current signal flowing through the component under test will lag behind the voltage signal. The current information flowing through the component under test can be obtained through the current acquisition module and input into the calculation module; the delay module can phase-delay the sinusoidal voltage signal output by the voltage output module and input the delayed voltage information into the calculation module, so that the calculation module can calculate the impedance and phase of the component under test based on the voltage information provided by the voltage output module, the current information provided by the current acquisition module, and the delayed voltage information provided by the delay module. The circuit for calculating impedance and phase provided by an embodiment of the present invention can obtain impedance information and phase information through a one-time test, has a simple circuit structure, can significantly improve test efficiency, and reduce test costs.

[0045] Optionally, Figure 2 A schematic diagram of the structure of another circuit for calculating impedance and phase provided by an embodiment of the present invention. Figure 2The circuit for calculating impedance and phase also includes: a first conversion unit 500 and a second conversion unit 600; one end of the first conversion unit 500 is connected to the second end of the voltage output module 100, the second end of the first conversion unit 500 is connected to the calculation module 400, and is also connected to the calculation module 400 through the delay module 300; the first conversion unit 500 is used to convert the analog voltage information output by the voltage output module 500 into digital voltage information; one end of the second conversion unit 600 is connected to the current acquisition module 200, and the other end is connected to the calculation module 400; the second conversion unit 600 is used to convert the analog current information acquired by the current acquisition module 200 into digital current information.

[0046] Specifically, the first conversion unit 500 and the second conversion unit 600 can be analog-to-digital converters. The voltage output module 100 can be an analog voltage source for providing an analog voltage signal to the device under test 10. The current acquisition module 200 acquires an analog current signal flowing through the device under test 10. The analog voltage information output by the voltage output module 100 can be converted into digital voltage information by the first conversion unit 500. After being delayed by the delay module 300, the digital voltage information and the delayed digital voltage information are input into the calculation module 400. The analog current information acquired by the current acquisition module 200 is converted into digital current information by the second conversion unit 600 and input into the calculation module 400. The calculation module 400 calculates the impedance and phase of the device under test 10 based on the voltage information, current information, and delayed voltage information converted into digital quantities.

[0047] Optionally, based on the above embodiment, see Figure 2 The delay module 300 is used to perform phase delay on the digital voltage information, and the phase delay includes T / 4.

[0048] Specifically, the voltage output module 100 can serve as a power supply to output a sinusoidal AC voltage to the DUT 10, and the delay module 300 can perform a phase delay on the sinusoidal AC voltage output by the voltage output module 100. For example, the sinusoidal voltage signal output by the voltage output module 100 to the DUT 10 can be expressed by formula (1):

[0049] V(t)=a·sinωt Formula (1)

[0050] Correspondingly, the current information acquired by the current acquisition module 200 can be expressed by formula (2):

[0051]

[0052] Wherein, Rz is the impedance information of the component under test, α is the phase information of the component under test, I(t) is the current information obtained by the current acquisition module, E(t) is the noise component, and a is a constant.

[0053] To calculate Rz, we need to eliminate the sinwt component to obtain the coefficients mentioned above. Since the square of a sine wave is a fixed value when integrated over a unit period, we can multiply two sine waves and then calculate the coefficients. To calculate α, we can obtain cosα or sinα, so it's natural to obtain a coswt-related quantity. This requires a signal delay circuit to phase-delay the voltage V.

[0054] Taking the delay time of the sinusoidal voltage signal output by the voltage output module 100 as T / 4 as an example, the delayed voltage information can be expressed by formula (3) as follows:

[0055]

[0056] Wherein, V'(t) is the delayed voltage information, a is a constant, and T is the time period. In other embodiments, the delay time of the sinusoidal voltage signal output by the delay module 300 to the voltage output module 100 can also be nT / 2+T / 4, where n is a positive integer.

[0057] Optionally, Figure 3 A schematic diagram of the structure of another circuit for calculating impedance and phase provided by an embodiment of the present invention. Figure 3The calculation module 400 includes: a first calculation unit 410, a second calculation unit 420, a third calculation unit 430, a fourth calculation unit 440 and a fifth calculation unit 450; the input end of the first calculation unit 410 is connected to the first conversion unit 500, and the output end of the first calculation unit 410 is connected to the first input end of the fifth calculation unit 450; the first calculation unit 410 is used to calculate the first component A according to the voltage information; the input end of the second calculation unit 420 is connected to the first conversion unit 500 and to the second conversion unit 600, and the output end of the second calculation unit 420 is connected to the first input end of the fourth calculation unit 440; the second calculation unit 420 is used to calculate the first component A according to the voltage information and the current information Calculate the second component; the input end of the third calculation unit 430 is connected to the second conversion unit 600 and to the delay module 300, and the output end of the third calculation unit 430 is connected to the second input end of the fourth calculation unit 440; the third calculation unit 430 is used to calculate the third component based on the delayed voltage information and current information; the first output end of the fourth calculation unit 440 is connected to the second input end of the fifth calculation unit 450; the fourth calculation unit 440 is used to calculate the angle between the second component and the third component, and the radius of the second component and the third component based on the second component and the third component; the fifth calculation unit 450 is used to calculate the impedance of the element under test 10 based on the radii of the second component and the third component and the first component A.

[0058] Specifically, the first calculation unit 410 can calculate the first component A according to the voltage information. The first component A calculated by the first calculation unit 410 can be expressed by formula (4):

[0059]

[0060] Wherein, A is the first component, V(i) is the voltage information, T is the period of the voltage signal, N is the number of periods, and a is a constant.

[0061] The second calculation unit 420 can calculate the second component B according to the voltage information and the current information. The second component B calculated by the second calculation unit 420 can be expressed by formula (5):

[0062]

[0063] Wherein, B is the second component, V(i) is the voltage information, I(i) is the current information, T is the period of the voltage signal, N is the number of periods, Rz is the impedance information of the device under test, α is the phase information of the device under test, and a is a constant.

[0064] The third calculation unit 430 can calculate the third component C according to the delayed voltage information and current information. The third component C calculated by the third calculation unit 430 can be expressed by formula (6):

[0065]

[0066] Wherein, C is the third component, V'(i) is the voltage information, I(i) is the current information, T is the period of the voltage signal, N is the number of periods, Rz is the impedance information of the DUT, α is the phase information of the DUT, and a is a constant.

[0067] The fourth calculation unit 440 can calculate the phase of the DUT and the radius of the second component B and the third component C based on the second component B and the third component C. The expressions of the radius of the second component B and the third component C calculated by the fourth calculation unit 440 can be expressed by formula (7):

[0068]

[0069] Wherein, radius(B,C) is the radius of the second component B and the third component C, Rz is the impedance information of the device under test, and a is a constant.

[0070] The angle between the second component B and the third component C calculated by the fourth calculation unit 440 can be expressed by formula (8):

[0071] angle(B, C) = -α Formula (8)

[0072] Where α is the phase information of the DUT, and angle(B,C) is the angle between the second component B and the third component C. It can be seen that the inverse of the angle between the second component B and the third component C is the phase angle of the DUT.

[0073] The fifth calculation unit 450 can calculate the impedance of the DUT 10 according to the radius of the second component B and the third component C and the first component A. The impedance of the DUT calculated by the fifth calculation unit 450 can be expressed by formula (9):

[0074]

[0075] Among them, A is the first component, radius(B,C) is the radius of the second component B and the third component C.

[0076] Optionally, Figure 4 A schematic diagram of the structure of another circuit for calculating impedance and phase provided by an embodiment of the present invention. Figure 4The first calculation unit 410 includes: a first multiplier 411 and a first accumulator 412; the input end of the first multiplier 411 is connected to the first conversion unit 500, the output end of the first multiplier 411 is connected to the input end of the first accumulator 412, and the output end of the first accumulator 412 is connected to the first input end of the fifth calculation unit 450; the second calculation unit 420 includes: a second multiplier 421 and a second accumulator 422; the input end of the second multiplier 421 is connected to the first conversion unit 500 and to the second conversion unit 600, and the output end of the second multiplier 421 is connected to the first input end of the fifth calculation unit 450. The end is connected to the input end of the second accumulator 422, and the output end of the second accumulator 422 is connected to the first input end of the fourth calculation unit 440; the third calculation unit 430 includes: a third multiplier 431 and a third accumulator 432; the input end of the third multiplier 431 is connected to the second conversion unit 600 and to the delay module 300, the output end of the third multiplier 431 is connected to the input end of the third accumulator 432, and the output end of the third accumulator 432 is connected to the second input end of the fourth calculation unit 440; the fourth calculation unit includes a Cordic algorithm calculation circuit.

[0077] Specifically, the first multiplier 411 may obtain the first power information by multiplying the voltage information using the following formula:

[0078]

[0079] Wherein, P1(t) is the first power information, V(t) is the voltage information, and a is a constant.

[0080] The first accumulator 412 can calculate the first power information per unit period using the following formula to obtain the integral of the first component per unit time period:

[0081]

[0082] in, is the integral of the first component in the unit time period, T is the period, and a is a constant.

[0083] The second multiplier 421 can multiply the voltage information and the current information to obtain the second power information using the following formula:

[0084]

[0085] Wherein, P2(t) is the second power information, V(t) is the voltage information, I(t) is the current information, a is a constant, Rz is the impedance of the device under test, a is a constant, and E(t) is the noise component.

[0086] The second accumulator 422 can calculate the second power information per unit period using the following formula to obtain the integral of the second component per unit time period:

[0087]

[0088] in, is the integral of the second component in the unit time period, T is the period, a is a constant, Rz is the impedance of the device under test, and the result of E(t) after integration is 0.

[0089] The third multiplier 431 can multiply the delayed voltage information and current information by the following formula to obtain the third power information:

[0090]

[0091] Where P3(t) is the second power information, V'(t) is the delayed voltage information, I(t) is the current information, a is a constant, Rz is the impedance of the device under test, a is a constant, and E(t) is the noise component.

[0092] The third accumulator 432 can calculate the third power information per unit period using the following formula to obtain the integral of the second component per unit time period:

[0093]

[0094] in, is the integral of the third component in the unit time period, T is the period, a is a constant, Rz is the impedance of the device under test, and the result of E(t) after integration is 0.

[0095] An embodiment of the present invention also provides a calculation device for calculating impedance and phase, including the impedance and phase circuit provided by any embodiment of the present invention, which is used to perform impedance and phase testing on the component to be tested, and has the corresponding functional modules and beneficial effects of the impedance and phase circuit provided by any embodiment of the present invention.

[0096] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in the present invention can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved. This is not limited herein.

[0097] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A circuit for calculating impedance and phase, characterized in that: Including voltage output module, current acquisition module, delay module and calculation module; One end of the DUT is connected to the first end of the voltage output module, the second end of the voltage output module is connected to the calculation module, and the second end of the voltage output module is further connected to the calculation module via the delay module; the voltage output module is used to provide voltage to the DUT and provide voltage information to the calculation module; the delay module is used to output delayed voltage information to the calculation module; The other end of the element under test is connected to the first end of the current acquisition module, the second end of the current acquisition module is grounded, and the third end of the current acquisition module is connected to the calculation module; the current acquisition module is used to obtain current information of the element under test, and the calculation module is used to calculate the impedance and phase of the element under test based on the voltage information, the current information and the delayed voltage information.

2. The circuit for calculating impedance and phase according to claim 1, characterized in that Also includes: a first conversion unit and a second conversion unit; one end of the first conversion unit is connected to the second end of the voltage output module, the second end of the first conversion unit is connected to the calculation module, and is also connected to the calculation module through the delay module; the first conversion unit is used to convert the analog voltage information output by the voltage output module into digital voltage information; One end of the second conversion unit is connected to the current acquisition module, and the other end is connected to the calculation module; the second conversion unit is used to convert the analog current information output by the current acquisition module into digital current information.

3. The circuit for calculating impedance and phase according to claim 2, characterized in that: The delay module is used to perform phase delay on the digital voltage information, and the phase delay includes T / 4.

4. The circuit for calculating impedance and phase according to claim 2, characterized in that: The calculation module includes: a first calculation unit, a second calculation unit, a third calculation unit, a fourth calculation unit, and a fifth calculation unit; the input end of the first calculation unit is connected to the first conversion unit, and the output end of the first calculation unit is connected to the first input end of the fifth calculation unit; the first calculation unit is used to calculate the first component according to the voltage information; The input end of the second calculation unit is connected to the first conversion unit and to the second conversion unit, and the output end of the second calculation unit is connected to the first input end of the fourth calculation unit; the second calculation unit is used to calculate the second component according to the voltage information and the current information; The input end of the third calculation unit is connected to the second conversion unit and to the delay module, and the output end of the third calculation unit is connected to the second input end of the fourth calculation unit; the third calculation unit is used to calculate the third component according to the delayed voltage information and the current information; The first output terminal of the fourth calculation unit is connected to the second input terminal of the fifth calculation unit; the fourth calculation unit is used to calculate the angle between the second component and the third component, and the radius of the second component and the third component according to the second component and the third component; The fifth calculation unit is configured to calculate the impedance of the DUT according to the radii of the second component and the third component and the first component.

5. The circuit for calculating impedance and phase according to claim 4, characterized in that: The first calculation unit includes: a first multiplier and a first accumulator; the input end of the first multiplier is connected to the first conversion unit, the output end of the first multiplier is connected to the input end of the first accumulator, and the output end of the first accumulator is connected to the first input end of the fifth calculation unit; The second calculation unit includes: a second multiplier and a second accumulator; an input end of the second multiplier is connected to the first conversion unit and to the second conversion unit, an output end of the second multiplier is connected to the input end of the second accumulator, and an output end of the second accumulator is connected to the first input end of the fourth calculation unit; The third calculation unit includes: a third multiplier and a third accumulator; the input end of the third multiplier is connected to the second conversion unit and to the delay module, the output end of the third multiplier is connected to the input end of the third accumulator, and the output end of the third accumulator is connected to the second input end of the fourth calculation unit; The fourth calculation unit includes a Cordic algorithm calculation circuit.

6. The circuit for calculating impedance and phase according to claim 5, characterized in that: The voltage output module is used to provide a sinusoidal voltage signal to the device under test; The expression of the sinusoidal voltage signal is: V(t)=a·sinωt.

7. The circuit for calculating impedance and phase according to claim 6, characterized in that: The expression of the delayed voltage signal is: V′(t)=a·cosωt.

8. The circuit for calculating impedance and phase according to claim 6, characterized in that: The expression of the first component is: Wherein, A is the first component, V is the sinusoidal voltage signal, and T is the time period.

9. The circuit for calculating impedance and phase according to claim 6, characterized in that: The expression of the second component is: Wherein, B is the second component, V is the sinusoidal voltage signal, I is the current information, T is the time period, and Rz is the impedance of the device under test.

10. The circuit for calculating impedance and phase according to claim 6, characterized in that: The expression of the third component is: Wherein, C is the third component, V' is the delayed voltage signal, I is the current information, T is the time period, and Rz is the impedance of the device under test.

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