Frequency-adjustable directional probe testing device and method

Abstract

The invention relates to the technical field of well logging, in particular to a frequency-adjustable directional probe testing device and method. Comprising a power supply module, a rotating speed module and a signal conversion module, a power signal output end of the power supply module is connected with a power signal input end of the rotating speed module, and the rotating speed module is used for simulating a rotor rotating speed signal. A simulated rotor rotating speed signal output end of the rotating speed module is connected with a simulated rotor rotating speed signal input end of the directional probe, and a probe instruction signal output end of the directional probe is connected with a pulse signal input end of the signal conversion module. And the signal conversion module is used for converting the pulse signal into a current analog signal and outputting the current analog signal. The directional exploring tube can be tested on the ground, and convenience is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of well logging, and in particular to a frequency-adjustable directional probe testing device and method. Background Art

[0002] Directional probes are essential downhole instruments in the exploration and development of underground resources like oil and natural gas. They are often used to measure drilling trajectories, assisting in drilling operations and ultimately locating high-quality underground resources. However, traditional directional probe testing methods are complex to connect to surface systems and require downhole testing, which not only increases testing difficulty but also hinders ease of use.

[0003] A directional well measurement and control circuit was developed in the paper "Development of Directional Well Measurement and Control Circuit" by the School of Electronic Engineering of Heilongjiang University. However, the circuit needs to be measured in a non-magnetic well casing, which means that it cannot be tested on the ground.

[0004] Chinese patent publication number CN104880959A discloses a measurement-while-drilling (MWD) sensor simulator that can realistically simulate eight sensor operating positions, as well as the transmission data and power characteristics of a resistivity gamma tool. However, this requires MWD and cannot be used for surface testing.

[0005] Chinese patent publication number CN109931049A discloses a rotational testing device and method for a measurement while drilling probe. The device, in conjunction with a probe test bench, can implement testing of a measurement while drilling probe in a rotating state, but cannot implement ground testing.

[0006] In summary, a directional probe testing device capable of performing tests on the ground is needed. Summary of the Invention

[0007] The purpose of the present invention is to address the defects of the existing technology and provide a frequency-adjustable directional probe testing device and method, which can test directional probes on the ground and improve convenience.

[0008] The present invention provides a frequency-adjustable directional probe testing device, comprising a power supply module, a speed module and a signal conversion module. The power signal output end of the power supply module is connected to the power signal input end of the speed module. The speed module is used to simulate a rotor speed signal. The simulated rotor speed signal output end of the speed module is connected to the simulated rotor speed signal input end of the directional probe. The probe instruction signal output end of the directional probe is connected to the pulse signal input end of the signal conversion module. The signal conversion module is used to convert the pulse signal into a current analog signal output.

[0009] Preferably, the power module includes a diode D2 and a voltage stabilizing chip U5, wherein the anode of the diode D2 is connected to a DC power supply, and the cathode is connected to a voltage input terminal of the voltage stabilizing chip U5.

[0010] Preferably, the power supply module includes capacitors C2 and C13, one end of each of the capacitors C2 and C13 is connected to the voltage input end of the voltage stabilizing chip U5, and the other end is grounded.

[0011] More preferably, the power supply module includes a magnetic bead Z1 and capacitors C14 and C29, the voltage output end of the voltage regulator chip U5 is connected to one end of the magnetic bead Z1 and the capacitor C14, the other end of the magnetic bead Z1 is connected to the power signal input end of the speed module and one end of the capacitor C29, and the other end of the capacitor C29 and the capacitor C14 are grounded.

[0012] Preferably, the speed module includes a timer U1, resistors R1, R5, R8, an adjustable resistor Ra, capacitors C3, C4, and C5, the OUT pin of the timer U1 is connected to one end of the resistor R5, and the other end of the resistor R5 is connected to a voltage source, the CONT pin of the timer U1 is connected to one end of the capacitor C5, and the other end of the capacitor C5 is grounded, the THRES pin of the timer U1 is connected to one end of the resistor R8 and the capacitor C4, and the other end of the capacitor C4 is grounded, the other end of the resistor R8 is connected to one end of the adjustable resistor Ra, the TRIG pin of the timer U1 is connected to the THRES pin, the VDD pin of the timer U1 is connected to the power signal output end of the power module, and is connected to one end of the resistor R1 and the capacitor C3, the other end of the capacitor C3 is grounded, the other end of the resistor R1 is connected to the other end of the adjustable resistor Ra, the RESET pin of the timer U1 is connected to the VDD pin, and the GND pin of the timer U1 is grounded.

[0013] More preferably, the speed module includes resistors R10, R16, R9, R14 and a transistor Q1, one end of the resistor R10 is connected to the OUT pin of the timer U1, and the other end is connected to one end of the resistor R16 and the base of the transistor Q1, the other end of the resistor R16 and the emitter of the transistor Q1 are grounded, the collector of the transistor Q1 is connected to one end of the resistor R14 and the resistor R9, the other end of the resistor R14 is connected to the voltage input end of the power module, and the other end of the resistor R9 is connected to the speed signal output port.

[0014] Preferably, the OUT pin of the timer U1 is connected to a terminal TP2 for testing.

[0015] Preferably, the adjustable resistor Ra is used to adjust the square wave frequency F and the high level time t of the square wave period of the output signal of the OUT pin of the timer U1.H , Square wave period low level time t L , the adjustment is achieved by the following formula:

[0016] t H =0.693(R1+R8+Ra)C4

[0017] t L =0.693(R8+Ra)C4

[0018]

[0019] More preferably, the signal conversion module includes a diode D1, a relay K1, a transistor Q2, and resistors R2 and R3. The base of the transistor Q2 is connected to the probe instruction signal output end of the directional probe, the emitter of the transistor Q2 is grounded, the collector of the transistor Q2 is connected to one end of the coil of the relay K1, the cathode of the diode D1 is connected to the other end of the coil of the relay K1, the anode of the diode D1 is connected to a DC power supply, one end of the normally open contact of the relay K1 is connected to one end of the resistor R3, the other end of the normally open contact is connected to the other end of the resistor R3, one end of the resistor R2 is connected to the other end of the resistor R3, and the other end of the resistor R2 is the current analog signal output end of the signal conversion module.

[0020] More preferably, the signal conversion module includes capacitors C1, C6 and a self-recovery fuse resistor F1, one end of the capacitors C1 and C6 is connected to the cathode of the diode D1 and one end of the self-recovery fuse resistor F1, and the other ends are grounded, and the other end of the self-recovery fuse resistor F1 is connected to the other end of the coil of the relay K1.

[0021] Preferably, the signal conversion module includes resistors R6 and R7, one end of the resistor R6 is connected to the probe command signal output end of the directional probe, and the other end is connected to one end of the resistor R7 and the base of the transistor Q2, and the other end of the resistor R7 is grounded.

[0022] The present invention also provides a frequency-adjustable directional probe testing method, comprising:

[0023] Sending a simulated rotor speed signal to the directional probe;

[0024] The directional probe receives the simulated rotor speed signal and outputs a probe instruction signal;

[0025] The probe command signal is converted into a current analog signal for output.

[0026] decoding the current analog signal;

[0027] Directional probe testing is achieved by comparing the decoded information with the preset information.

[0028] The beneficial effects of the present invention are as follows: the device includes a power module, a speed module, and a signal conversion module; the power module converts the power supply voltage to provide a stable +5V DC power supply to the speed module; the speed module generates a TTL square wave signal to provide to the directional probe to simulate the rotor speed signal; and the signal conversion module converts the pulser signal emitted by the directional probe into a current analog signal, which is then connected to the surface system for decoding. By simulating the rotor speed signal through the speed module, the device can simulate the signal transmission mode of the directional probe during underground operation, enabling surface testing and greatly improving testing convenience. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic diagram of the connection principle of the present invention;

[0030] Figure 2 Schematic diagram of the circuit of the power module of the present invention;

[0031] Figure 3 This is a circuit diagram of the speed module of the present invention;

[0032] Figure 4 Schematic diagram of the circuit of the signal conversion module of the present invention. DETAILED DESCRIPTION

[0033] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0034] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0035] In the following description, specific details such as specific system structures and techniques are provided for purposes of illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obscuring the description of the present application with unnecessary detail.

[0036] References to "one embodiment" or "some embodiments" in this specification mean that one or more embodiments of the present application include a particular feature, structure, or characteristic described in conjunction with that embodiment. Thus, phrases such as "in one embodiment," "in some embodiments," "in other embodiments," and "in other embodiments" appearing in various places in this specification do not necessarily refer to the same embodiment, but rather mean "one or more but not all embodiments," unless otherwise specifically emphasized. The terms "including," "comprising," "having," and variations thereof all mean "including but not limited to," unless otherwise specifically emphasized. "Multiple" means "two or more."

[0037] Figure 1 The following is a schematic diagram showing the structure of a frequency-adjustable directional probe test device provided by a preferred embodiment of the present application. For ease of explanation, only the parts related to this embodiment are shown, which are described in detail as follows:

[0038] A frequency-adjustable directional probe 4 testing device includes a power supply module 1, a speed module 2, and a signal conversion module 3. The power signal output of the power supply module 1 is connected to the power signal input of the speed module 2 to provide a +5V DC power supply to the speed module 2. The speed module 2 is used to simulate a rotor speed signal. The simulated rotor speed signal output of the speed module 2 is connected to the simulated rotor speed signal input of the directional probe 4. The probe command signal output of the directional probe 4 is connected to the pulse signal input of the signal conversion module 3. The signal conversion module 3 is used to convert the pulse signal into a current analog signal output. The current analog signal is then connected to the ground system for decoding. Finally, the ground system decoding is used to determine whether the various performance characteristics of the directional probe are normal, thereby achieving the purpose of comprehensively testing the directional probe. By simulating the rotor speed signal through the speed module, this device can simulate the signal transmission mode of the directional probe when working underground, realize ground testing, and greatly improve the convenience of testing.

[0039] In one embodiment, Figure 2 As shown, the power module 1 includes a diode D2 and a voltage regulator chip U5. The diode D2 is a 1N4007 and the U5 is a BD450M5FP2-CZE2. The anode of the diode D2 is connected to the +24V DC power supply, and the cathode is connected to the voltage input terminal (pin 1) of the voltage regulator chip U5. The voltage regulator chip U5 is used to stabilize the +24V DC power supply to +5V, which is then used to power the speed module.

[0040] The power module 1 includes capacitors C2 and C13. One end of each of the capacitors C2 and C13 is connected to the voltage input end of the voltage stabilizing chip U5, and the other end is grounded.

[0041] The power supply module 1 includes a magnetic bead Z1 and capacitors C14 and C29. The model of the magnetic bead Z1 is BLM31PG121SN1L. The voltage output end of the voltage regulator chip U5 is connected to one end of the magnetic bead Z1 and the capacitor C14. The other end of the magnetic bead Z1 is connected to the power signal input end of the speed module 2 (pin 8 of the timer U1) and one end of the capacitor C29. The other ends of the capacitor C29 and the capacitor C14 are grounded.

[0042] The input voltage range of the power module U5 is between 3V and 42V, which has a wide voltage range. A rectifier diode D2 is designed before the voltage input terminal (pin 1) to stabilize the input power supply, and capacitors C2 and C13 are used to stabilize the input power supply and perform filtering.

[0043] Pin 3 of the power module U5 outputs a stable 5V voltage to power the speed module clock chip U1. Before connecting to pin 8 of U1, the design adds a ferrite bead Z1 to resist the interference generated by the circuit. Capacitors C14 and C29 are used to filter and reduce noise of the 5V DC power supply.

[0044] In one embodiment, Figure 3 As shown, the speed module 2 includes a timer U1, resistors R1, R5, R8, an adjustable resistor Ra, capacitors C3, C4, and C5. The model of the timer U1 is TLC555QDRQ1. The OUT pin of the timer U1 is connected to one end of the resistor R5, the other end of the resistor R5 is connected to a voltage source, the CONT pin of the timer U1 is connected to one end of the capacitor C5, the other end of the capacitor C5 is grounded, the THRES pin of the timer U1 is connected to one end of the resistor R8 and capacitor C4, the other end of the capacitor C4 is grounded, the other end of the resistor R8 is connected to one end of the adjustable resistor Ra, the TRIG pin of the timer U1 is connected to the THRES pin, the VDD pin of the timer U1 is connected to the power signal output end of the power module 1, and is connected to one end of the resistor R1 and capacitor C3, the other end of the capacitor C3 is grounded, the other end of the resistor R1 is connected to the other end of the adjustable resistor Ra, the RESET pin of the timer U1 is connected to the VDD pin, and the GND pin of the timer U1 is grounded.

[0045] Among them, resistor R5 is a pull-up resistor, which is used to prevent the square wave signal output from pin 3 of U1 from being weakened due to voltage division.

[0046] Speed ​​module 2 includes resistors R10, R16, R9, and R14, and transistor Q1 (model ZTX85). One end of resistor R10 is connected to the OUT pin of timer U1, and the other end is connected to one end of resistor R16 and the base of transistor Q1. The other end of resistor R16 and the emitter of transistor Q1 are grounded. The collector of transistor Q1 is connected to one end of resistor R14 and resistor R9. The other end of resistor R14 is connected to the voltage input of power module 1, and the other end of resistor R9 is connected to speed signal output port J10. Resistor R16 divides the supply voltage of the ground equipment, reducing the pressure on transistor Q1 and preventing damage from excessive voltage.

[0047] The OUT pin of the timer U1 is connected to a terminal TP2 for testing.

[0048] The adjustable resistor Ra is used to adjust the square wave frequency F and the high level time t of the square wave cycle of the output signal of the OUT pin of the timer U1. H , Square wave period low level time t L , the adjustment is achieved by the following formula:

[0049] t H =0.693(R1+R8+Ra)C4

[0050] t L =0.693(R8+Ra)C4

[0051]

[0052] By adjusting the resistance value of Ra, the square wave signal output from U1's pin 3 is controlled. This, in turn, provides a digital electrical signal with a rotational speed of 1000 to 4000 rpm to the directional probe under test. The speed module receives a stable +5V power supply from the power module. U1, in conjunction with the adjustable resistor Ra, generates an adjustable square wave signal, which provides a digital electrical signal with a rotational speed of 1000 to 4000 rpm to the directional probe. The signal conversion module collects the directional probe's command signal, decodes the rotational speed value, and compares the preset rotational speed value with the decoded rotational speed value to test the directional probe's rotational speed signal acquisition function.

[0053] In one embodiment, Figure 4As shown, the signal conversion module 3 includes a diode D1, a relay K1, a transistor Q2, and resistors R2 and R3. The model of the relay K1 is HE721A2400, the model of the diode D1 is 1N4007, and the model of the transistor Q2 is ZTX857. The base of the transistor Q2 is connected to the probe command signal output terminal of the directional probe 4, the emitter of the transistor Q2 is grounded, the collector of the transistor Q2 is connected to one end of the coil of the relay K1, the cathode of the diode D1 is connected to the other end of the coil of the relay K1, the anode of the diode D1 is connected to a DC power supply, one end of the normally open contact of the relay K1 is connected to one end of the resistor R3, and the other end of the normally open contact is connected to the other end of the resistor R3. One end of the resistor R2 is connected to the other end of the resistor R3. The other end of the resistor R2 serves as the current analog signal output terminal of the signal conversion module 3.

[0054] After the signal conversion module collects the directional probe command signal from the Pulse end of resistor R6, the base and emitter of transistor Q2 are turned on, causing forward conduction from pin 2 to pin 6 of relay K1. The relay starts working, and pin 14 and pin 8 are turned on. Resistor R3 is short-circuited, causing the VSP end of resistor R2 to generate a current signal wave (i.e., a current analog signal) that increases from 6mA to 8mA. This signal wave will be collected and decoded by the ground system.

[0055] Signal conversion module 3 includes capacitors C1, C6, and a self-recovering fuse resistor F1. The self-recovering fuse resistor F1 is model MF-MSMF020. One end of capacitors C1 and C6 is connected to the cathode of diode D1 and one end of the self-recovering fuse resistor F1. The other ends are both grounded. The other end of the self-recovering fuse resistor F1 is connected to the other end of the coil of relay K1. Capacitors C1 and C6 are used for power supply filtering and safety protection. The capacitance value of C1 is 0.1uF, and the capacitance value of C6 is 10uF. C6 has a voltage resistance of 50V to prevent excessive voltage from damaging relay K1. The circuit also includes a self-recovering fuse resistor F1 to prevent excessive current from damaging relay K1.

[0056] Signal conversion module 3 includes resistors R6 and R7. One end of resistor R6 is connected to the probe command signal output terminal of directional probe 4. The other end is connected to one end of resistor R7 and the base of transistor Q2. The other end of resistor R7 is grounded. Resistor R7 divides the voltage of the directional probe signal, reducing the pressure on transistor Q2 and preventing damage to transistor Q2 due to excessive voltage.

[0057] The present invention also provides a frequency-adjustable directional probe testing method, comprising:

[0058] Sending a simulated rotor speed signal to the directional probe 4;

[0059] The directional probe 4 receives the simulated rotor speed signal and outputs a probe instruction signal;

[0060] Converting the probe command signal into a current analog signal for output;

[0061] decoding the current analog signal;

[0062] Directional probe testing is achieved by comparing the decoded information with the preset information.

[0063] It should be understood that the specific order or hierarchy of steps in the disclosed processes is an example of an exemplary method. Based on design preferences, it should be understood that the specific order or hierarchy of steps in the process can be rearranged without departing from the scope of the present disclosure. The accompanying method claims present elements of the various steps in an exemplary order and are not intended to be limited to the specific order or hierarchy described.

[0064] In the foregoing detailed description, various features are grouped together in a single embodiment to simplify the disclosure. This method of disclosure should not be interpreted as reflecting an intention that embodiments of the claimed subject matter require more features than are expressly recited in each claim. On the contrary, as reflected in the appended claims, the invention comprises less than all the features of any individual disclosed embodiment. The appended claims are hereby expressly incorporated into the detailed description, with each claim standing on its own as a separate preferred embodiment of the invention.

[0065] The above description of the disclosed embodiments is intended to enable any person skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other embodiments without departing from the spirit and scope of the present disclosure. Therefore, the present disclosure is not limited to the embodiments presented herein but is intended to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0066] The foregoing description includes examples of one or more embodiments. Of course, it is not possible to describe all possible combinations of components or methods for the purposes of describing the above embodiments, but one of ordinary skill in the art will recognize that the various embodiments may be further combined and arranged. Therefore, the embodiments described herein are intended to encompass all such changes, modifications and variations that fall within the scope of the appended claims. Furthermore, to the extent that the term "comprising" is used in the specification or claims, the term is intended to be encompassed in a manner similar to the term "including," as explained in terms of "including," when used as a transitional word in the claims. Furthermore, any use of the term "or" in the specification of the claims is intended to mean a "non-exclusive or."

[0067] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A frequency-adjustable directional probe test device, characterized by: It includes a power supply module, a speed module and a signal conversion module. The power signal output end of the power supply module is connected to the power signal input end of the speed module. The speed module is used to simulate the rotor speed signal. The simulated rotor speed signal output end of the speed module is connected to the simulated rotor speed signal input end of the directional probe. The probe instruction signal output end of the directional probe is connected to the pulse signal input end of the signal conversion module. The signal conversion module is used to convert the pulse signal into a current analog signal output.

2. The frequency-adjustable directional probe test device according to claim 1, characterized in that: The power supply module includes a diode D2 and a voltage stabilizing chip U5. The anode of the diode D2 is connected to a DC power supply, and the cathode is connected to a voltage input terminal of the voltage stabilizing chip U5.

3. The frequency-adjustable directional probe test device according to claim 2, characterized in that: The power supply module includes capacitors C2 and C13. One end of each of the capacitors C2 and C13 is connected to the voltage input end of the voltage stabilizing chip U5, and the other end is grounded.

4. The frequency-adjustable directional probe test device according to claim 2, characterized in that: The power supply module includes a magnetic bead Z1 and capacitors C14 and C29. The voltage output end of the voltage regulator chip U5 is connected to one end of the magnetic bead Z1 and the capacitor C14. The other end of the magnetic bead Z1 is connected to the power signal input end of the speed module and one end of the capacitor C29. The other ends of the capacitor C29 and the capacitor C14 are grounded.

5. The frequency-adjustable directional probe test device according to claim 1, characterized in that: The speed module includes a timer U1, resistors R1, R5, R8, an adjustable resistor Ra, capacitors C3, C4, and C5. The OUT pin of the timer U1 is connected to one end of the resistor R5, and the other end of the resistor R5 is connected to a voltage source. The CONT pin of the timer U1 is connected to one end of the capacitor C5, and the other end of the capacitor C5 is grounded. The THRES pin of the timer U1 is connected to one end of the resistor R8 and the capacitor C4, and the other end of the capacitor C4 is grounded. The other end of the resistor R8 is connected to one end of the adjustable resistor Ra. The TRIG pin of the timer U1 is connected to the THRES pin. The VDD pin of the timer U1 is connected to the power signal output end of the power module and to one end of the resistor R1 and the capacitor C3. The other end of the capacitor C3 is grounded. The other end of the resistor R1 is connected to the other end of the adjustable resistor Ra. The RESET pin of the timer U1 is connected to the VDD pin, and the GND pin of the timer U1 is grounded.

6. The frequency-adjustable directional probe test device according to claim 5, characterized in that: The speed module includes resistors R10, R16, R9, R14 and a transistor Q1. One end of the resistor R10 is connected to the OUT pin of the timer U1, and the other end is connected to one end of the resistor R16 and the base of the transistor Q1. The other end of the resistor R16 and the emitter of the transistor Q1 are grounded. The collector of the transistor Q1 is connected to one end of the resistor R14 and the resistor R9. The other end of the resistor R14 is connected to the voltage input end of the power module, and the other end of the resistor R9 is connected to the adjustable resistor Ra.

7. The frequency-adjustable directional probe test device according to claim 5, characterized in that: The OUT pin of the timer U1 is connected to a terminal TP2 for testing.

8. The frequency-adjustable directional probe testing device according to claim 5, characterized in that: The adjustable resistor Ra is used to adjust the square wave frequency F and the high level time t of the square wave period of the output signal of the OUT pin of the timer U1. H , Square wave period low level time t L , the adjustment is achieved by the following formula: t H =0.693(R1+R8+Ra)C4 t L =0.693(R8+Ra)C4 9. The frequency-adjustable directional probe testing device according to claim 1, characterized in that: The signal conversion module includes a diode D1, a relay K1, a transistor Q2, and resistors R2 and R3. The base of the transistor Q2 is connected to the probe instruction signal output end of the directional probe, the emitter of the transistor Q2 is grounded, the collector of the transistor Q2 is connected to one end of the coil of the relay K1, the cathode of the diode D1 is connected to the other end of the coil of the relay K1, the anode of the diode D1 is connected to a DC power supply, one end of the normally open contact of the relay K1 is connected to one end of the resistor R3, the other end of the normally open contact is connected to the other end of the resistor R3, one end of the resistor R2 is connected to the other end of the resistor R3, and the other end of the resistor R2 is the current analog signal output end of the signal conversion module.

10. The frequency-adjustable directional probe testing device according to claim 9, characterized in that: The signal conversion module includes capacitors C1, C6 and a self-recovery fuse resistor F1. One end of the capacitors C1 and C6 is connected to the cathode of the diode D1 and one end of the self-recovery fuse resistor F1, and the other ends are grounded. The other end of the self-recovery fuse resistor F1 is connected to the other end of the coil of the relay K1.

11. The frequency-adjustable directional probe testing device according to claim 9, characterized in that: The signal conversion module includes resistors R6 and R7. One end of the resistor R6 is connected to the probe instruction signal output end of the directional probe, and the other end is connected to one end of the resistor R7 and the base of the transistor Q2. The other end of the resistor R7 is grounded.

12. A frequency-adjustable directional probe testing method, characterized by: include Sending a simulated rotor speed signal to the directional probe; The directional probe receives the simulated rotor speed signal and outputs a probe instruction signal; Converting the probe command signal into a current analog signal for output; decoding the current analog signal; Directional probe testing is achieved by comparing the decoded information with the preset information.

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