Star flashover signal comprehensive analysis device and method

Abstract

The invention provides a satellite flashover signal comprehensive analysis device and method, and relates to the technical field of communication signal testing, the device comprises a test instrument and PC comprehensive analysis software in communication connection with the test instrument, and the test instrument comprises a radio frequency front end and a baseband in communication connection with the radio frequency front end. According to the technical scheme, the problem that the satellite flashover signal cannot be efficiently and comprehensively analyzed in the prior art is solved.

Description

Technical Field

[0001] The present invention relates to the field of communication signal testing, and in particular to a device and method for comprehensive analysis of star flash signals. Background Art

[0002] With the continuous development of wireless communication technology, NearLink, as an emerging wireless short-range communication technology, has the characteristics of low power consumption, high speed, low latency, stable connection, wide coverage, and large networking capabilities. It has broad application prospects in many fields such as consumer electronics, smart cars, smart manufacturing, and smart homes. However, in the research and development, production, and maintenance of NearLink equipment, accurate and comprehensive analysis of signal quality is crucial. When targeting the characteristics of NearLink signals, existing signal analysis devices and test methods have problems such as insufficient test accuracy, single analysis function, and inability to obtain multiple key indicators in real time and efficiently, making it difficult to meet the demand for in-depth analysis of NearLink signals.

[0003] Therefore, there is a need for a testing device and method that can perform efficient and comprehensive analysis on star flash signals. Summary of the Invention

[0004] The main purpose of the present invention is to provide a device and method for comprehensive analysis of star flash signals to solve the problem in the prior art that star flash signals cannot be efficiently and comprehensively analyzed.

[0005] To achieve the above objectives, the present invention provides a star flash signal comprehensive analysis device, a test instrument and PC comprehensive analysis software connected to the test instrument. The test instrument includes: a radio frequency front end and a baseband connected to the radio frequency front end.

[0006] Furthermore, the chip module under test is connected to a test instrument via a radio frequency line, and the test instrument is connected to a PC comprehensive analysis software via a network cable.

[0007] Furthermore, the baseband communicates with the PC comprehensive analysis software via the TCP / IP protocol.

[0008] The present invention also provides a method for comprehensive analysis of star flash signals, which specifically includes the following steps:

[0009] S1, the chip module under test emits a star flash signal and inputs it into the test instrument.

[0010] S2, IQ data is obtained after being processed by the test instrument.

[0011] S3, inputting the IQ data into the PC comprehensive analysis software, analyzing the IQ data through the data analysis algorithm module embedded in the PC comprehensive analysis software and displaying it in real time in the form of a chart.

[0012] Furthermore, step S2 specifically includes the following steps:

[0013] S2.1, after the RF front end of the test instrument receives the star flash signal, it amplifies, filters and frequency converts the star flash signal.

[0014] S2.2 then inputs the baseband and performs ADC analog-to-digital conversion on the signal processed by the RF front end, converting the analog signal into a digital signal, namely IQ data.

[0015] Furthermore, the frequency conversion in step S2.1 is specifically down-conversion to 983 MHz.

[0016] Furthermore, in step S3, the average power, error vector magnitude (EVM) and adjacent channel leakage power ratio (ACLR) are calculated by a data analysis algorithm module.

[0017] The present invention has the following beneficial effects:

[0018] The present invention combines the test instrument with the comprehensive analysis software on the PC, deeply customizes the characteristics of star flash signals, and realizes an integrated and efficient process from signal acquisition to data processing, analysis and visual display.

[0019] The parameter configuration interface design of the PC comprehensive analysis software supports users to flexibly modify multiple key test parameters such as frequency, level, mode, etc., which can meet the diverse testing needs of star flash signals in different scenarios, making the test device highly versatile and adaptable.

[0020] The present invention moves complex algorithm processing to the higher-performance X86 platform. The FPGA+ARM on the baseband is only responsible for the FFT, synchronization and transmission of IQ data. At the same time, it supports the overall issuance of test case configuration instructions in list form, shortening the process control cycle and improving overall test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for the specific embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0022] Figure 1 The figure shows a connection diagram of a star flash signal comprehensive analysis device of the present invention.

[0023] Figure 2 Shown is a connection diagram of the test instrument module of the present invention.

[0024] Figure 3 A flow chart of a method for comprehensive analysis of star flash signals of the present invention is shown.

[0025] Figure 4 Shown is a diagram of the PC comprehensive analysis software interface of the present invention. DETAILED DESCRIPTION

[0026] The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0027] like Figure 1 A comprehensive analysis device for star flash signals shown in the figure includes: a test instrument and a PC comprehensive analysis software connected to the test instrument for communication. The test instrument includes: a radio frequency front end and a baseband connected to the radio frequency front end for communication. Test instrument: As the core part of signal acquisition, its internal structure includes a radio frequency front end and a baseband board. Radio frequency front end: Responsible for receiving, amplifying, filtering, and frequency conversion of star flash signals to ensure that the received signals meet the requirements of subsequent processing. It uses high-performance radio frequency devices with characteristics such as wide bandwidth, high gain stability, and low noise coefficient, and can adapt to the multi-band and high-bandwidth working characteristics of star flash signals. Baseband board: Mainly used to perform ADC analog-to-digital conversion on the signal processed by the radio frequency front end, converting the analog signal into a digital signal, namely IQ data. The baseband board is equipped with a high-speed ADC chip with a high sampling rate, which can accurately capture subtle changes in the star flash signal and provide a high-quality data source for subsequent in-depth analysis.

[0028] Specifically, if Figure 2 As shown, the chip module under test is connected to the test instrument through a radio frequency line, and the test instrument is connected to the PC comprehensive analysis software through a network cable.

[0029] Specifically, the baseband communicates with the PC comprehensive analysis software via the TCP / IP protocol. PC comprehensive analysis software: installed on a terminal device such as a computer connected to the test instrument, it receives the IQ data collected by the test instrument through the network. The software has a built-in professional data analysis algorithm module, which can perform in-depth processing of IQ data based on the characteristics of star flash signals and calculate a variety of key technical indicators, including but not limited to average power, error vector magnitude EVM, adjacent channel leakage power ratio ACLR, etc. These algorithms are optimized based on a large number of communication theoretical models and actual measurement data, and can accurately reflect the quality status of star flash signals. The analysis software has powerful visualization functions and can present the calculated technical indicators in the form of intuitive charts, allowing users to quickly and accurately understand the signal status and facilitate further troubleshooting, performance evaluation, and other work.

[0030] like Figure 3 As shown, the present invention also provides a method for comprehensive analysis of star flash signals, which specifically includes the following steps:

[0031] S1, the chip module under test emits a star flash signal and inputs it into the test instrument.

[0032] S2, IQ data is obtained after being processed by the test instrument.

[0033] S3, inputting the IQ data into the PC comprehensive analysis software, analyzing the IQ data through the data analysis algorithm module embedded in the PC comprehensive analysis software and displaying it in real time in the form of a chart.

[0034] The present invention uses the radio frequency front end of the test instrument to capture the target star flash signal, and after preliminary amplification, filtering and other processing, transmits it to the baseband board. On the baseband board, the analog signal is converted into digital IQ data through analog-to-digital conversion operation, and the data is precisely synchronized. Subsequently, the test instrument transmits the synchronized IQ data to the comprehensive analysis software via the network stably and efficiently. After receiving the data, the comprehensive analysis software performs real-time calculations on the IQ data based on the preset data analysis algorithm, calculates various technical indicators such as average power, EVM, ACLR, and synchronously displays them dynamically in the form of charts on the software interface. The entire test process has a high degree of automation, and can track changes in star flash signals in real time.

[0035] Specifically, step S2 includes the following steps:

[0036] S2.1, after the RF front end of the test instrument receives the star flash signal, it amplifies, filters and frequency converts the star flash signal.

[0037] S2.2 then inputs the baseband and performs ADC analog-to-digital conversion on the signal processed by the RF front end, converting the analog signal into a digital signal, namely IQ data.

[0038] Specifically, the frequency conversion in step S2.1 is down-conversion to 983 MHz.

[0039] Specifically, in step S3, the average power, error vector magnitude (EVM) and adjacent channel leakage power ratio (ACLR) are calculated by a data analysis algorithm module.

[0040] The device and method provided by the present invention are described in detail below:

[0041] (1) Hardware construction and connection. Place the test instrument in a stable test environment. Connect its RF front end to the signal output port of the device that transmits the star flash signal (such as the star flash transmitter module, star flash communication equipment, etc.) through RF cables and other connecting devices to ensure that the signal can be reliably transmitted to the test instrument. Use a network cable to connect the test instrument to a computer terminal device installed with comprehensive analysis software to establish a stable data transmission channel for the real-time transmission of subsequent IQ data.

[0042] (2) Parameter configuration. Open the comprehensive analysis software and, in the parameter configuration interface, set the frequency according to the actual test requirements and select an appropriate center frequency range to cover the operating frequency band of the target star flash signal. At the same time, adjust the level parameters and determine a reasonable signal input power range to ensure that the signal is in the optimal measurement range of the test instrument. Select other parameters reasonably according to the signal characteristics, including protocol mode, frame type, modulation type, synchronization mode, etc.

[0043] (3) Test execution and data analysis. After the test is started, the RF front end of the test instrument begins to receive the star flash signal. After internal processing, the baseband board converts it into digital IQ data and transmits it to the comprehensive analysis software in real time through the established network connection. After receiving the data, the software automatically runs the built-in algorithm to quickly calculate technical indicators such as average power, EVM, ACLR, etc., and presents them in real time in the form of a chart at the corresponding position on the interface. Users can observe the changes in the chart and make a comprehensive assessment of the quality of the star flash signal.

[0044] Of course, the above description is not a limitation of the present invention, and the present invention is not limited to the above examples. Changes, modifications, additions or substitutions made by technicians in this technical field within the essential scope of the present invention should also fall within the scope of protection of the present invention.

Claims

1. A device for comprehensive analysis of star flash signals, characterized in that: include: The test instrument and the PC comprehensive analysis software connected to the test instrument, the test instrument includes: a radio frequency front end and a baseband connected to the radio frequency front end.

2. A star flash signal comprehensive analysis device according to claim 1, characterized in that: The chip module under test is connected to the test instrument through a radio frequency line, and the test instrument is connected to the PC comprehensive analysis software through a network cable.

3. A star flash signal comprehensive analysis device according to claim 2, characterized in that: The baseband communicates with the PC comprehensive analysis software via TCP / IP protocol.

4. A method for comprehensive analysis of star flash signals, using the device according to any one of claims 1 to 3, characterized in that: The specific steps include: S1, the chip module under test transmits a star flash signal and inputs it into the test instrument; S2, IQ data is obtained after being processed by the test instrument; S3, inputting the IQ data into the PC comprehensive analysis software, analyzing the IQ data through the data analysis algorithm module embedded in the PC comprehensive analysis software and displaying it in real time in the form of a chart.

5. A method for comprehensive analysis of star flash signals according to claim 4, characterized in that: Step S2 specifically includes the following steps: S2.1, after the RF front end of the test instrument receives the star flash signal, it amplifies, filters and frequency converts the star flash signal; S2.2 then inputs the baseband and performs ADC analog-to-digital conversion on the signal processed by the RF front end, converting the analog signal into a digital signal, namely IQ data.

6. A method for comprehensive analysis of star flash signals according to claim 5, characterized in that: The frequency conversion in step S2.1 is specifically down-conversion to 983 MHz.

7. A method for comprehensive analysis of star flash signals according to claim 4, characterized in that: In step S3, the average power, error vector magnitude (EVM), and adjacent channel leakage power ratio (ACLR) are calculated by the data analysis algorithm module.

Images