Mass and in-situ infrared spectroscopy coupled multi-dimensional thermal analysis method for organic material

CN120801237APending Publication Date: 2025-10-17SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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Patent Information

Application Number
CN202510873607.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-06-27
Publication Date
2025-10-17

AI Technical Summary

Technical Problem

Existing thermal analysis and spectroscopy technologies make it difficult to achieve in-situ infrared analysis of the thermal decomposition process of organic materials. The traditional TGA furnace design hinders in-situ monitoring of infrared spectra, and trace gases are easily adsorbed by gas pipelines, making detection complicated.

Method used

A test system is constructed using a resonant cantilever chip, a sealed test chamber, a Fourier transform infrared spectrometer, and a data synchronization module. Through the synchronous measurement of the frequency changes of the cantilever chip and the infrared spectrum data, a comprehensive characterization of the thermal decomposition process of organic materials can be achieved.

Benefits of technology

It realizes real-time in-situ analysis of the thermal decomposition process of organic materials with high sensitivity and selectivity, and can simultaneously correlate thermal behavior with changes in chemical composition, breaking through the limits of trace sample analysis and being suitable for the precise analysis of trace synthetic materials.

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Abstract

The invention relates to an organic material multi-dimensional thermal analysis method coupled with mass and in-situ infrared spectroscopy, which comprises the following steps: detecting the frequency change in the heating process in real time through a cantilever beam MEMS device with a self-heating function to obtain a sample mass change curve in the thermal treatment process; meanwhile, focusing the infrared light beam to the surface of the to-be-detected sample through a diamond window so as to collect the reflection infrared spectrum of the to-be-detected sample in the heating process, and extracting the structure change information of the to-be-detected sample in real time. According to the invention, the comprehensive characterization of the thermal decomposition process of the organic material is realized, and the method has the core advantages of real-time in-situ analysis capability, high sensitivity and selectivity, synchronous association of thermal behaviors and chemical components and the like.
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