Mass and in-situ infrared spectroscopy coupled multi-dimensional thermal analysis method for organic material
Patent Information
- Application Number
- CN202510873607.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-27
- Publication Date
- 2025-10-17
AI Technical Summary
Existing thermal analysis and spectroscopy technologies make it difficult to achieve in-situ infrared analysis of the thermal decomposition process of organic materials. The traditional TGA furnace design hinders in-situ monitoring of infrared spectra, and trace gases are easily adsorbed by gas pipelines, making detection complicated.
A test system is constructed using a resonant cantilever chip, a sealed test chamber, a Fourier transform infrared spectrometer, and a data synchronization module. Through the synchronous measurement of the frequency changes of the cantilever chip and the infrared spectrum data, a comprehensive characterization of the thermal decomposition process of organic materials can be achieved.
It realizes real-time in-situ analysis of the thermal decomposition process of organic materials with high sensitivity and selectivity, and can simultaneously correlate thermal behavior with changes in chemical composition, breaking through the limits of trace sample analysis and being suitable for the precise analysis of trace synthetic materials.
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