Thin film for preventing capacitor core from being damaged and method for aging by adopting thin film

Abstract

The invention discloses a film for preventing a capacitor core from being damaged and a method for aging by adopting the film, which can effectively isolate the core with large leakage current in time, do not need a specially-assigned person to find and remove the capacitor core with large leakage current, and improve the production efficiency by 50%. And the core is prevented from burning to influence the surrounding core as shown in the figure, so that the product percent of pass can be effectively improved by 12%. Compared with the prior art, the efficiency is improved by 50%, the product percent of pass is improved by 12%, and the method is simple, easy to operate and remarkable in effect.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of capacitors, and particularly relates to a film for preventing damage of a capacitor core and a method for aging by using the film. BACKGROUND

[0002] Capacitor aging is a repair and screening process by applying certain temperature and voltage. For example, capacitor core aging refers to, in the production process of conductive polymer laminated aluminum capacitors, repairing the aluminum core after impregnation of graphite and silver paste by applying electricity (currently, carbon felt is used), and removing the core that fails in the early stage to improve the stability of leakage performance. Figure 1 Figure 1-1 Figure 1-1-1 For the aging mechanism of capacitors, it can be seen that the main purpose of the capacitor core in the aging process is to repair or screen the capacitor core or capacitor by applying voltage and temperature to the capacitor. The current technology has two main disadvantages:

[0003] 1. When the capacitor core is broken down, it will burn and burn or break down the adjacent capacitor core, resulting in a large number of defective products, low yield, and high production cost.

[0004] 2. When the product has a large leakage and is not broken down, it will cause the power supply to alarm and cannot be boosted, and the operator needs to find and remove the core with large leakage one by one, which is extremely troublesome and results in low production efficiency.

[0005] The Chinese invention patent with the publication number CN110676054B discloses a method for improving capacitor aging efficiency and inhibiting capacitor leakage current rebound, which aims to solve the problem of high leakage current rebound speed of existing aluminum electrolytic capacitors after aging. High heat is generated by high current boosting to promote the formation of stable crystal type oxide film, and subsequent high temperature and pressure make the oxide film thicker to inhibit the rebound of leakage current. At the same time, the large current improves the aging efficiency and shortens the overall aging time. However, the operation process is complex. SUMMARY

[0006] In order to solve the above problems, the present application aims to provide a film for preventing damage of a capacitor core and a method for aging by using the film.

[0007] In order to achieve the above purpose, the present application adopts the following technical solution: a film for preventing damage of a capacitor core, comprising a conductive surface and an insulating surface opposite to the conductive surface, the electrical conductivity and melting point of the conductive surface can be selected according to actual needs.

[0008] Preferably, the film can be folded.

[0009] ​​A capacitor aging method, a film is folded and placed at the contact between the capacitor core and the negative electrode, the conductive surface of the film is in contact with the capacitor core and the negative electrode, and then power is supplied for aging.

[0010] Preferably, the film is folded to ensure electrical connection between the capacitor core and the negative electrode.

[0011] Preferably, the film is provided with a soft insulator, and the elasticity of the soft insulator increases the contact stability of the film with the capacitor core and the negative electrode.

[0012] Preferably, the capacitor core includes but is not limited to the core of an aluminum electrolytic capacitor, a tantalum electrolytic capacitor, and a niobium electrolytic capacitor, and also includes the capacitor body to be aged.

[0013] Preferably, the aging includes but is not limited to burn-in, primary aging, secondary aging, and other power-on screening and repair procedures.

[0014] Preferably, the film meets the fuse isolation function of the conductive surface, and the film material includes but is not limited to a metal film and a polymer film.

[0015] Preferably, the film can be placed at the positive electrode or the negative electrode of the capacitor core according to the product shape, and the purpose is to isolate the faulty core after fusing.

[0016] Preferably, in the aging, the core with large leakage current is effectively isolated, and the core does not burn to affect the surrounding cores, the efficiency is improved by 50%, and the product pass rate is improved by 12%.

[0017] Compared with the prior art, the present application has the following advantages: the defects in the capacitor core aging are solved in principle, and an efficient and feasible operation method is provided. Using the present application, the core with large leakage current can be effectively isolated in time, and there is no need to find and remove the capacitor core with large leakage current, the production efficiency is improved by 50%; and the core does not burn to affect the surrounding cores, which can effectively improve the product pass rate by 12%. Compared with the prior art, the efficiency is improved by 50%, the product pass rate is improved by 12%, the method is simple and easy to operate, and the effect is remarkable. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the specific embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0019] Figure 1 Prior art capacitor aging mechanism Figure 1;

[0020] Figure 1-1 Fig. 1 is a schematic diagram of the aging mechanism of a capacitor in the prior art Figure 2 ;

[0021] Figure 1-1-1 Fig. 2 is a schematic diagram of the capacitor in the present application Figure 1-1 ;

[0022] Figure 2 Fig. 3 is a schematic diagram of the thin film in the present application

[0023] Figure 3 Fig. 4 is a schematic diagram of the capacitor core aging in the present application Figure 1 ;

[0024] Figure 3-1 Fig. 5 is a schematic diagram of the capacitor core aging in the present application Figure 2 ;

[0025] In the figure, 1 is a conductive surface; 2 is an insulating surface; 3 is a capacitor core; 4 is a negative electrode; 5 is a positive electrode; and 6 is a thin film. DETAILED DESCRIPTION

[0026] The present application will be further described below in conjunction with the accompanying drawings and specific embodiments, but should not be understood as limiting the scope of the subject matter described herein to the following embodiments. Any modifications, substitutions and changes made according to the ordinary technical knowledge and common practices in the art without departing from the technical idea of the present application are included in the scope of the present application.

[0027] Referring to Figure 3 and Figure 3-1 , Fig. 1 is a schematic diagram of the aging of an aluminum capacitor core, with a thin film 6 between the core and the negative electrode. The conductive surface of the thin film is folded back to ensure electrical connection between the capacitor core 3 and the negative electrode 4. The thin film 6 will heat and melt when the current is large, thereby effectively isolating the core 3 with large leakage current, and without causing the core 3 to burn and affect the surrounding cores. This method can effectively improve the qualification rate of the bare core aging process and solve the problem of low production efficiency caused by the operator searching for and removing cores with large leakage current one by one.

[0028] Referring to Figure 2The thin film includes a conductive surface 1 and an insulating surface 2 opposite to the conductive surface 1, the conductivity and melting point of the conductive surface 1 can be selected according to actual requirements, and the thin film can be folded, the thin film 6 has different physical properties on two sides, one side is the conductive surface 1, the conductivity is higher, and the conductive surface 1 will melt when a large current flows. The other side is insulating, 2, when the conductive surface 1 melts, the core contacts the insulating surface 2, and the surface can isolate the capacitor core in time to ensure that short circuit does not occur. Different conductivity and melting point conductive surfaces can be made according to different formulations, and the fuse current can be controlled by controlling the resistivity and melting point of the conductive surface. Generally, the fuse current is controlled to be 0.5A-5A, and is selected according to the actual situation of the product.

[0029] In order to ensure that the thin film contacts the negative electrode of the capacitor core, the thin film is attached to the soft insulator, and the elasticity of the soft insulator increases the contact between the thin film and the negative electrode of the capacitor core.

[0030] The application solves the problems of low aging qualified rate and low efficiency of the capacitor core.

[0031] From the principle, the existing aging technology is analyzed, and it is found that the existing aging technology cannot effectively block the large leakage current of the product in time, which can cause power alarm and reduce production efficiency. When the leakage current is too large, the product will burn, damage the adjacent product, and reduce the qualified rate of the capacitor. The method is low in efficiency and low in qualified rate.

[0032] The capacitor core referred to in the application is not limited to the capacitor core as an example, and any capacitor core or capacitor that needs to be aged is within the scope, including but not limited to aluminum electrolytic capacitors, tantalum electrolytic capacitors, niobium electrolytic capacitors, etc. The aging referred to is not a specific process in the capacitor, but any process of selecting and repairing the capacitor by applying electricity, including but not limited to the commonly named aging, primary aging, secondary aging, and spare part aging in the industry; the thin film used is not limited to the above conditions, and can be selected according to the production process requirements. Metal thin film, high molecular thin film, etc. can meet the conditions; the purpose of the thin film is to isolate the capacitor core after melting, so it is not necessarily placed at the negative electrode of the capacitor core, and can be placed at the positive electrode according to the product shape.

[0033] Comparison of effects between the application and the prior art

[0034] Number of input Number of defective leakage Pass rate Operation time (h) The present invention 90000 12600 86％ 72 Prior art 90000 1800 98％ 36

[0035] Compared with the prior art, the capacitor core aging defects are solved in principle, and a high-efficiency and feasible operation method is provided. By using the application, the capacitor core with large leakage current can be effectively isolated in time, and the production efficiency is improved by 50% without special personnel to find and remove the capacitor core with large leakage current; and the burning of the core does not affect the surrounding cores, as shown in the figure, and the product qualified rate can be effectively improved by 12%. Compared with the prior art, the efficiency is improved by 50%, the product qualified rate is improved by 12%, the method is simple and easy to operate, and the effect is remarkable.

[0036] The film for preventing capacitor core damage and the method for aging by using the film are described in detail above, specific examples are applied to describe the structure and working principle of the application, and the above examples are only used to help understand the method and core idea of the application. It should be pointed out that for ordinary skilled persons in the art, some improvements and modifications can be made to the application without departing from the principles of the application, and these improvements and modifications also fall within the scope of protection of the claims of the application.

Claims

1. A film for preventing damage to a capacitor core, characterized in that: It comprises a conductive surface (1) and an insulating surface (2) opposite to the conductive surface (1); the conductivity and melting point of the conductive surface (1) can be selected according to actual needs.

2. The film for preventing capacitor core damage according to claim 1, characterized in that: The film is foldable.

3. A method for capacitor aging according to any one of claims 1 to 2, characterized in that: The film is folded and placed at the contact point between the capacitor core (3) and the negative electrode (4), with the conductive surface (1) of the film in contact with the capacitor core (3) and the negative electrode (4) to ensure electrical connection between the capacitor core and the negative electrode, and then powered on for aging.

4. The capacitor aging method according to claim 3, wherein: The film is folded in such a way that the conductive surface (1) is folded back to ensure electrical connection between the capacitor core and the negative electrode (4).

5. The container aging method according to claim 3, characterized in that: The insulating surface of the film is equipped with a soft insulator, and the elasticity of the soft insulator increases the contact stability between the film and the capacitor core and the negative electrode.

6. The container aging method according to claim 3, characterized in that: The capacitor core (3) includes but is not limited to the core of an aluminum electrolytic capacitor, a tantalum electrolytic capacitor, and a niobium electrolytic capacitor, and also includes a capacitor body that needs to be aged.

7. The container aging method according to claim 3, characterized in that: The aging process includes but is not limited to burn-in, primary aging, secondary aging, parts aging and other power-on screening and repair processes.

8. The container aging method according to claim 3, characterized in that: The film satisfies the conductive surface fusing and isolating function, and the film material includes but is not limited to metal film and polymer film.

9. The container aging method according to claim 3, characterized in that: The film can be placed at the positive electrode or the negative electrode of the capacitor core according to the product shape, and its purpose is to isolate the faulty core after melting.

10. The container aging method according to claim 3, characterized in that: The aging process effectively isolates cores with large leakage currents without causing the cores to burn and affecting surrounding cores, thereby increasing efficiency by 50% and product qualification rate by 12%.

Images