Diffraction stress analyzer

Abstract

The diffraction stress analyzer comprises a shell, an X-ray source and a detection device, the shell is provided with a containing cavity and a detection opening, and the detection opening is communicated with the containing cavity; the X-ray source is contained in the containing cavity and used for emitting X-rays to the detection opening, and the X-rays are emitted out of the shell through the detection opening and are diffracted to form diffracted X-rays; the detection device is contained in the containing cavity and exposed through the detection opening, and the detection device is used for detecting the diffracted X-rays and converting the diffracted X-rays into electric signals. Therefore, the detection device can be used for directly detecting the diffracted X-rays and converting the diffracted X-rays into the electric signals, so that the stress condition of the detection part of the detected object can be quickly obtained, the stress detection time is shortened, and the stress detection efficiency is improved.

Description

TECHNICAL FIELD

[0001] The embodiment of the present application relates to the field of stress detection, in particular to a diffraction stress analyzer. BACKGROUND

[0002] In the production process or use process, the product or at least one part of the product is stressed by production processing or external force, and the stress usually affects whether the product can be normally used. If the stress exceeds the safety standard, the service life of the product will be affected, and even the normal use of the product will be affected. Therefore, it is usually necessary to use a stress analyzer to detect stress. There are various types of stress analyzers, one type of stress analyzer is a diffraction stress analyzer which detects stress by using X-ray diffraction technology. SUMMARY

[0003] In order to solve the above technical problems, the embodiment of the present application provides a convenient diffraction stress analyzer.

[0004] The embodiment of the present application solves the technical problem by adopting the following technical scheme: A diffraction stress analyzer, comprising a shell, an X-ray source and a detection device, the shell is provided with a containing cavity and a detection opening, the detection opening is communicated with the containing cavity; the X-ray source is accommodated in the containing cavity, and the X-ray source is used for emitting X-rays to the detection opening, wherein the X-rays are emitted out of the shell via the detection opening and are diffracted to form diffracted X-rays; the detection device is accommodated in the containing cavity and is exposedly arranged through the detection opening, and the detection device is used for detecting the diffracted X-rays and converting the diffracted X-rays into electrical signals.

[0005] In some embodiments, the detection device comprises a plurality of detectors, the plurality of detectors are spaced around the travel path of the X-rays and do not intersect the travel path of the X-rays, wherein the travel path of the X-rays is the path traveled by the X-rays from the X-ray source to the time of being diffracted, The area surrounded by the plurality of detectors is a penetration area through which the X-rays pass, and the surface of the effective detection area of the plurality of detectors is directed towards the detection opening and is exposedly arranged through the detection opening, and the effective detection area is used for detecting the diffracted X-rays.

[0006] In some embodiments, the plurality of detectors can rotate around the travel path of the X-rays.

[0007] In some embodiments, the detection device comprises at least four detectors.

[0008] In some embodiments, the surfaces of the effective detection regions of the plurality of detectors are arranged in rotational symmetry, and a center of rotation of the surfaces of the effective detection regions of the plurality of detectors is located on the path of travel of the X-rays.

[0009] In some embodiments, the surfaces of the effective detection regions of the plurality of detectors are located on a same plane, and the path of travel of the X-rays is perpendicular to the plane.

[0010] In some embodiments, the surfaces of the effective detection regions of the plurality of detectors are arranged in axial symmetry, and an axis of symmetry of the surfaces of the effective detection regions of the plurality of detectors intersects the path of travel of the X-rays.

[0011] In some embodiments, the detection device comprises eight detectors, the surfaces of the effective detection regions of the eight detectors are arranged in a square, and the penetration region is located in a geometric center region of the square.

[0012] In some embodiments, the detection device comprises eight detectors, the eight detectors form four detection groups, each detection group comprises two detectors, the arrangement direction of the two detectors of each detection group is perpendicular to the arrangement direction of the two detectors of an adjacent detection group, the surfaces of the effective detection regions of the eight detectors are arranged in a square, and the penetration region is located in a geometric center region of the square.

[0013] In some embodiments, the surfaces of the effective detection regions of the plurality of detectors are not coplanar, and the regions of the surfaces of the effective detection regions that are farther from the penetration region are closer to the detection opening than the regions of the surfaces of the effective detection regions that are adjacent to the penetration region.

[0014] In some embodiments, the diffraction stress analyzer further comprises an integrated board received in the receiving cavity, the plurality of detectors of the detection device are mounted on a surface of the integrated board that faces the detection opening, and the integrated board is provided with a first through hole for the X-rays to pass through before passing through the penetration region.

[0015] In some embodiments, the diffraction stress analyzer further comprises a circuit board received in the receiving cavity, the plurality of detectors of the detection device are electrically connected to the circuit board, the circuit board is provided with a through opening, and the integrated board is arranged in the through opening of the circuit board.

[0016] In some embodiments, the diffraction stress analyzer further comprises a main support plate received in the receiving cavity, the integrated board and the circuit board are mounted on a surface of the main support plate that faces the detection opening, the main support plate is provided with a second through hole for the X-rays to pass through before passing through the first through hole.

[0017] In some embodiments, the diffractometer further comprises a heat-conducting insulating member disposed between the main support plate and the integrated plate, and covering a surface of the integrated plate facing away from the detection opening, wherein the heat-conducting insulating member is provided with a third through hole for the X-rays to pass through, and the X-rays pass through the second through hole, the third through hole, the first through hole and the transmission area in sequence.

[0018] In some embodiments, the diffractometer further comprises a collimator for adjusting the X-rays emitted by the X-ray source into a straight line shape, the collimator comprising a cylindrical portion and a flange portion connected to an outer periphery of one end of the cylindrical portion, the other end of the cylindrical portion being farther away from the X-ray source than the one end of the cylindrical portion, the flange portion being mounted to the main support plate, and the cylindrical portion passing through the second through hole, the first through hole and the transmission area in sequence, and the X-rays passing through the cylindrical portion.

[0019] In some embodiments, the main support plate is further provided with a positioning recess on a surface thereof facing away from the detection opening, the positioning recess being in communication with the second through hole, and the flange portion abutting against the positioning recess.

[0020] In some embodiments, the diffractometer further comprises a heat-conducting insulating member disposed between the main support plate and the integrated plate, and covering a surface of the integrated plate facing away from the detection opening, wherein the heat-conducting insulating member is provided with a third through hole for the X-rays to pass through, and the cylindrical portion passes through the second through hole, the third through hole, the first through hole and the transmission area in sequence, and the X-rays pass through the cylindrical portion.

[0021] In some embodiments, the cylindrical portion of the collimator is provided with a lateral opening; the diffractometer further comprises a calibration system comprising a calibration light source, the calibration light source being capable of entering or exiting the cylindrical portion via the lateral opening, and the calibration light source being capable of emitting calibration light along a path of travel of the X-rays when the calibration light source is located in the cylindrical portion.

[0022] In some embodiments, the diffractometer further comprises a power supply module housed in the accommodation cavity or disposed outside the housing, the power supply module being electrically connected to the X-ray source for supplying power to the X-ray source. The beneficial effect of the embodiment of the present application is that the diffraction stress analyzer provided by the embodiment of the present application comprises a shell, an X-ray source and a detection device, the shell is provided with a containing cavity and a detection opening, the detection opening is communicated with the containing cavity; the X-ray source is accommodated in the containing cavity, the X-ray source is used for emitting X-rays to the detection opening, the X-rays are emitted to the outside of the shell through the detection opening and are diffracted to form diffracted X-rays; the detection device is accommodated in the containing cavity and is exposedly arranged through the detection opening, the detection device is used for detecting the diffracted X-rays and converting the diffracted X-rays into electrical signals. In this way, the diffracted X-rays can be directly detected by the detection device and converted into electrical signals, so that the stress condition of the detection position of the measured object can be quickly obtained, the stress detection time is shortened, and the stress detection efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0023] One or more embodiments are illustrated by way of example in the figures that are part of this disclosure and which are illustrative, but not restrictive, of the present embodiments, wherein elements having the same reference number designates like elements throughout the various figures, and wherein the figures are not necessarily drawn to scale.

[0024] Figure 1 is a schematic view of the appearance of the diffraction stress analyzer of one of the embodiments of the present application; Figure 2 is a schematic view of another perspective of Figure 1 ; Figure 3 is a schematic view of the appearance of a part of the diffraction stress analyzer in Figure 1 ; Figure 4 is a structural exploded view of Figure 3 ; Figure 5 is a structural schematic view of a detector; Figure 6a is a structural schematic view of the detection device of one of the embodiments; Figure 6b is a distribution schematic view of a plurality of detectors of the detection device of another embodiment; Figure 6c is a distribution schematic view of a plurality of detectors of the detection device of yet another embodiment; Figure 6d is a distribution schematic view of a plurality of detectors of the detection device of still another embodiment; Figure 6e is a distribution schematic view of a plurality of detectors of the detection device of another embodiment; Figure 6f is a distribution schematic view of a plurality of detectors of the detection device of yet another embodiment; Figure 7 is Figure 3a sectional view of Figure 8 is Figure 4 a schematic view of a part of the structure in Figure 9 is Figure 8 a structure exploded view of Figure 10 is Figure 8 a sectional view of Figure 11 is Figure 10 a schematic view of a part of the calibration system in Figure 12 is Figure 11 a structure exploded view of Figure 13 is Figure 8 a bottom view of Figure 14 a probe according to an embodiment is schematically illustrated.

[0025] Figure 15 a simplified sectional view of a probe according to an embodiment is schematically illustrated.

[0026] Figure 16 a detailed sectional view of a probe according to an embodiment is schematically illustrated.

[0027] Figure 17 a detailed sectional view of a probe according to an alternative embodiment is schematically illustrated. In the figure: 1, diffractometer; 2, housing; 3, X-ray source; 4, detection device; 5, integrated board; 6, circuit board; 7, main support plate; 8, heat-conducting insulating piece; 9, collimator; 10, calibration system; 11, auxiliary support plate; 12, heat dissipation system; 13, power module; 16, display screen; 17, main control board; 18, working indicator light; 19, emergency brake switch; 20, handle; 30, mechanical arm; 201, accommodating cavity; 202, detection opening; 203, display opening; 204, shooting window; 21, shell body; 22, shell cover; 41, probe; 42, detection group; 401, penetration area; 41a, effective detection area; 51, first through hole; 61, through hole; 71, second through hole; 72, positioning recess; 73, through area; 81, third through hole; 91, cylindrical portion; 92, flange portion; 911, lateral opening; 101 extension rod; 102 driving mechanism; 103 image capturing device; 104 position detecting device; 105 mounting block; 106 guide rod; 1011 calibration light source; 1021 driving motor; 1022 screw rod; 1023 driven part; 10231 connecting piece; 10232 transmission piece; 1041 shielding piece; 1042 first infrared sensor; 1043 second infrared sensor; 10241 guide hole; 121 heat sink; 122 air blower; 121a first groove; 121b second groove; 1211 cover part; 1212 fin part. DETAILED DESCRIPTION

[0028] For the purpose of facilitating the understanding of the present application, the present application will be described in more detail below with reference to the attached drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element or one or more intervening elements can be present therebetween. When an element is described as being "connected to" another element, it can be directly connected to the other element or one or more intervening elements can be present therebetween. The terms "upper", "lower", "inner", "outer", "vertical", "horizontal", and the like as used in the present specification indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are used only for the purpose of facilitating the description of the present application and simplifying the description, and thus cannot be construed as indicating or implying that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus cannot be construed as limiting the present application. In addition, the terms "first", "second", and the like are used only for the purpose of description and cannot be construed as indicating or implying relative importance.

[0029] Unless otherwise defined, all technical and scientific terms used in the present specification have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs. The terms used in the specification of the present application are only for the purpose of describing specific embodiments and are not intended to limit the present application. The term "and / or" used in the present specification includes any and all combinations of one or more of the associated listed items.

[0030] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0031] The existing diffraction stress analyzer mainly includes an X-ray emitter, an imaging plate, a driving mechanism for driving the imaging plate to move and rotate, a detection device for detecting a diffraction ring (Debye ring) formed on the imaging plate, and an elimination device for eliminating the diffraction ring. When detecting the stress of a sample, the X-ray emitter emits X-rays to the sample, and the X-rays diffracted by the sample cause the formation of a diffraction ring on the imaging plate. When the diffraction ring is formed, the imaging plate does not rotate. After the diffraction ring is formed, the driving mechanism drives the imaging plate to move from an imaging position to a detection position, and then drives the imaging plate to rotate, while the detection device detects the shape of the diffraction ring to obtain relevant data. After the detection is completed, the driving mechanism drives the imaging plate to move to an elimination position, and then drives the imaging plate to rotate, while the elimination device eliminates the diffraction ring. After the diffraction ring is eliminated, the driving mechanism drives the imaging plate to return to the imaging position, preparing for the next detection. Since the existing diffraction stress analyzer needs to perform imaging, detection, and elimination at the imaging position, the detection position, and the elimination position respectively, and must be provided with the detection device, the elimination device, and the driving mechanism for driving the imaging plate to move and rotate, the diffraction stress analyzer has many components, devices, modules, and mechanisms inside, resulting in a large volume of the diffraction stress analyzer and poor portability. Moreover, it is difficult to integrate a power module (for supplying power to the X-ray emitter) into the diffraction stress analyzer, so when using the diffraction stress analyzer, an external power module must be electrically connected to the diffraction stress analyzer, which is not convenient for outdoor mobile use.

[0032] The diffraction stress analyzer of the present application adopts a detection device composed of a plurality of detectors having the following structure, which can detect the diffracted X-rays after the X-rays emitted by an X-ray source irradiate the object to be detected, and convert the diffracted X-rays into electrical signals, so as to obtain the stress condition of the object to be detected according to the obtained electrical signals. Compared with the existing diffraction stress analyzer, the driving mechanism for driving the imaging plate to move and rotate, the detection device for detecting the diffraction ring formed on the imaging plate, and the elimination device for eliminating the diffraction ring can be omitted, so as to reduce the number of components, devices, modules, and mechanisms inside the diffraction stress analyzer, and further reduce the volume of the diffraction stress analyzer and improve the portability.

[0033] In order to facilitate understanding of how the detector converts the diffracted X-rays into electrical signals, the structure of the detector will be described in detail below.

[0034] As an example, Figure 14 The detector 41 is schematically shown. The detector 41 can include an array of pixels 150 (also referred to as sensing elements). The array can be a rectangular array (as shown), a honeycomb array, a hexagonal array, or any other suitable array. Figure 14 The array can be a rectangular array (as shown), a honeycomb array, a hexagonal array, or any other suitable array. Figure 14The array of pixels 150 in the example has 4 rows and 7 columns; however, in general, the array of pixels 150 can have any number of rows and any number of columns.

[0035] Each pixel 150 can be configured to detect radiation incident thereon from a radiation source (not shown) and can be configured to measure a characteristic of the radiation (e.g., energy, wavelength, and frequency of the particles). The radiation can include particles, such as photons and subatomic particles. Each pixel 150 can be configured to count, over a period of time, the number of radiation particles incident thereon that fall in a plurality of energy bins. All pixels 150 can be configured to count, over the same period of time, the number of radiation particles incident thereon within the plurality of energy bins. When the incident radiation particles have similar energies, the pixels 150 can simply be configured to count, over a period of time, the number of radiation particles incident thereon without measuring the energy of each radiation particle.

[0036] Each pixel 150 can have its own analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident radiation particle into a digital signal or to digitize an analog signal representing the total energy of a plurality of incident radiation particles into a digital signal.

[0037] The pixels 150 can be configured to operate in parallel. For example, while one pixel 150 is measuring an incident radiation particle, another pixel 150 can be waiting for a radiation particle to arrive. The pixels 150 can not necessarily be individually addressable.

[0038] The detectors described herein can be applied, for example, to X-ray diffractometers, X-ray telescopes, X-ray mammography, industrial X-ray defect detection, X-ray microscopy or micro-radiography, X-ray casting inspection, X-ray non-destructive testing, X-ray weld inspection, X-ray digital subtraction angiography, etc. It can also be appropriate to use this detector instead of photographic plates, photographic films, photo-stimulated phosphor plates (PSP plates), X-ray image intensifiers, scintillators, or other semiconductor X-ray detectors.

[0039] Figure 15 A simplified cross-sectional view of the detector of Figure 14 along line 2-2 is schematically illustrated. In particular, the detector can include a radiation absorption layer 110 and an electronic circuit layer 120 (which can include one or more ASICs or application-specific integrated circuits) for processing or analyzing electrical signals generated in the radiation absorption layer 110 by incident radiation. The detector can or can not include a scintillator (not shown). The radiation absorption layer 110 can contain a semiconductor material, such as silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof. The semiconductor material can have a high mass attenuation coefficient for the radiation of interest.

[0040] Figure 16 A detailed cross-sectional view of the detector of Figure 14 is shown schematically as an example. Specifically, the radiation absorption layer 110 can include one or more diodes (e.g., p-i-n or p-n) formed by the first doped region 111, the second doped region 113, and one or more discrete regions 114. The second doped region 113 can be separated from the first doped region 111 by an optional intrinsic region 112. The discrete regions 114 can be separated from each other by the first doped region 111 or the intrinsic region 112. The first doped region 111 and the second doped region 113 can have opposite types of doping (e.g., the first doped region 111 is p-type and the second doped region 113 is n-type, or, the first doped region 111 is n-type and the second doped region 113 is p-type). In Figure 16 , each discrete region 114 of the second doped region 113 forms a diode with the first doped region 111 and the optional intrinsic region 112. That is, in Figure 16 , the radiation absorption layer 110 has multiple diodes (more specifically, 7 diode pairs corresponding to 7 pixels 150 in a row of the array of Figure 14 , for simplicity, Figure 16 only two of the pixels 150 in the array are labeled in the figure). The multiple diodes can have an electrical contact 119A as a common (shared) electrode. The first doped region 111 can also have multiple discrete portions.

[0041] The electronic circuit layer 120 can include an electronic system 121 suitable for processing or interpreting signals generated by radiation incident on the radiation absorption layer 110. The electronic system 121 can include analog circuits such as filter networks, amplifiers, integrators, and comparators, or digital circuits such as microprocessors and memories. The electronic system 121 can include one or more ADCs (analog-to-digital converters). The electronic system 121 can include components that are shared by the pixels 150 or components that are dedicated to individual pixels 150. For example, the electronic system 121 can include an amplifier dedicated to each pixel 150 and a microprocessor shared among all of the pixels 150. The electronic system 121 can be electrically connected to the pixels 150 through interconnect channels 131. Spaces between the interconnect channels can be filled with a filler material 130, which can increase the mechanical stability of the connection of the electronic circuit layer 120 to the radiation absorption layer 110. Other bonding techniques can connect the electronic system 121 to the pixels 150 without using the interconnect channels 131.

[0042] When radiation from a radiation source (not shown) strikes the radiation absorbing layer 110, which includes diodes, radiation particles can be absorbed and one or more charge carriers (e.g., electrons, holes) can be generated by a variety of mechanisms. The charge carriers can drift under an electric field to an electrode of one of the diodes. The electric field can be an external electric field. The electrical contact 119B can include a plurality of discrete portions, each in electrical contact with a discrete region 114. The term "electrical contact" can be used interchangeably with the word "electrode." In one embodiment, the charge carriers can drift in a plurality of directions and such that substantially none of the charge carriers generated by a single radiation particle are shared by two different discrete regions 114 (where "substantially none" means that less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of the charge carriers flow to a different discrete region 114 than other portions of the charge carriers). The charge carriers generated by a radiation particle incident on the footprint of one of the discrete regions 114 are substantially not shared with another one of the discrete regions 114. A pixel 150 associated with a discrete region 114 can be an area around the discrete region 114 in which substantially all (greater than 98%, greater than 99.5%, greater than 99.9%, or greater than 99.99%) of the charge carriers generated by a radiation particle incident therein flow to the discrete region 114. That is, less than 2%, less than 1%, less than 0.1%, or less than 0.01% of the charge carriers flow out of the pixel 150.

[0043] Figure 17 A detailed cross-sectional view of the detector of FIG. 1 along line 2-2 is shown schematically in accordance with an alternative embodiment. Figure 14 The radiation absorbing layer 110 can include a resistor of a semiconductor material such as silicon, germanium, GaAs, CdTe, CdZnTe, or combinations thereof, but not a diode. The semiconductor material can have a high mass attenuation coefficient for the radiation of interest. In one embodiment, the semiconductor material can be doped with a dopant of a first type to form a first type of charge carrier (e.g., electrons) and a dopant of a second type to form a second type of charge carrier (e.g., holes). The first type of charge carrier can be majority carriers and the second type of charge carrier can be minority carriers. The first type of charge carrier can be electrons and the second type of charge carrier can be holes. The first type of charge carrier can be holes and the second type of charge carrier can be electrons. Figure 17 The electronic circuit layer 120 of FIG. 1 can be similar in structure and function to the electronic circuit layer 120 of FIG. 2. Figure 16 The electronic circuit layer 120 of FIG. 1 can be similar in structure and function to the electronic circuit layer 120 of FIG. 2.

[0044] When radiation strikes the radiation-absorbing layer 110, which includes a resistor but not a diode, it can be absorbed and generate one or more charge carriers through a variety of mechanisms. A radiation particle can generate 10 to 100,000 charge carriers. The charge carriers can drift under an electric field to the electrical contacts 119A and 119B. The electric field can be an external electric field. The electrical contact 119B can include multiple discrete portions. In one embodiment, the charge carriers can drift in multiple directions and such that substantially none of the charge carriers generated by a single radiation particle are shared by two different discrete portions of the electrical contact 119B (by "substantially none" is meant that less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of the charge carriers flow to a different discrete portion compared to the rest of the charge carriers). The charge carriers generated by a radiation particle that strikes within the footprint of one of the discrete portions of the electrical contact 119B are substantially not shared with another of the discrete portions of the electrical contact 119B. A pixel 150 associated with one of the discrete portions of the electrical contact 119B can be an area around that discrete portion in which substantially all (greater than 98%, greater than 99.5%, greater than 99.9%, or greater than 99.99%) of the charge carriers generated by a radiation particle that strikes into that area flow to that discrete portion of the electrical contact 119B. That is, less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of the charge carriers flow out of the pixel associated with that one of the discrete portions of the electrical contact 119B.

[0045] For further technical details of the detector 41, please refer to the granted patent CN108271415B of the present applicant.

[0046] As shown in Figures 1-4 , Figure 9 , the diffractive stress analyzer 1 provided by one of the embodiments of the present application comprises a shell 2, an X-ray source 3 and a detection device 4. The shell 2 is provided with a containing cavity 201 and a detection opening 202, the detection opening 202 is in communication with the containing cavity 201, the X-ray source 3 is accommodated in the containing cavity 201, the X-ray source 3 is used to emit X-rays to the detection opening 202, the X-rays are emitted to the outside of the shell 2 through the detection opening 202 and are diffracted by a measured object located outside the shell 2 to form diffracted X-rays. The detection device 4 is exposedly arranged through the detection opening 202, the detection device 4 is used to detect the diffracted X-rays and convert the diffracted X-rays into electrical signals.

[0047] In this way, the detection device 4 can directly detect the diffracted X-rays and convert them into electrical signals, so that the stress condition of the detection site of the measured object can be quickly obtained, the stress detection time is shortened, and the stress detection efficiency is improved.

[0048] It is to be noted that the shape and specific structure of the housing 2 can be set as needed, and are not limited to the shape shown in the drawings, as long as the housing 2 has the accommodation cavity 201 for accommodating the X-ray source 3 and the detection opening 202 for allowing the X-rays emitted by the X-ray source 3 to pass through. Figures 1-4 In the present embodiment, the housing 2 includes a housing body 21 provided with the accommodation cavity 201 and the detection opening 202, and a housing cover 22 detachably mounted on the housing body 21 and covering the accommodation cavity 201 to protect the components, devices, modules and mechanisms accommodated in the accommodation cavity 201.

[0049] In some embodiments, as shown in Figure 3 Figure 4 The detection device 4 includes a plurality of detectors 41 spaced apart around the travel path L of the X-rays and not intersecting the travel path L of the X-rays, so that the detectors 41 detect the diffracted X-rays formed by the X-rays diffracted after traveling to the measured object. The travel path L of the X-rays is the path traveled by the X-rays from the emission of the X-ray source 3 to the diffraction, and does not include the path traveled by the X-rays inside the X-ray source 3. The area surrounded by the plurality of detectors 41 is the transmission area 401 through which the X-rays pass.

[0050] As shown in Figure 5 Figure 14 The detector 41 has an effective detection area 41a (array of pixels 150) for detecting the diffracted X-rays incident on the surface thereof and converting the diffracted X-rays into electrical signals. Figure 3 Figure 4 As shown in

[0051] ​​​It can be understood that the plurality of detectors 41 are spaced around the travel path L of the X-rays and do not intersect the travel path L of the X-rays, i.e. the detectors 41 are not arranged on the travel path L of the X-rays, so as to avoid the X-rays emitted by the X-ray source 3 being blocked by the detectors 41 and affecting the stress detection. The area surrounded by the plurality of detectors 41 is defined as a transmission area 401 through which the X-rays pass, and after the X-rays pass through the transmission area 401 without being blocked by the plurality of detectors 41, the X-rays are emitted out of the shell 2 from the detection opening 202. Then, the X-rays are diffracted at the detection site of the measured object to form diffracted X-rays. The diffracted X-rays travel to the detection device 4, and an X-ray diffraction ring is formed on the surface of the active detection area 41a of the plurality of detectors 41. Since there is a gap between the plurality of detectors 41, the diffraction ring is usually discontinuous. The active detection area 41a converts the diffracted X-rays incident on the surface thereof into electrical signals, and analyzes the electrical signals, so as to obtain the shape and size of the diffraction ring. Then, by analyzing the shape and size of the diffraction ring, the stress condition of the detection site of the measured object can be obtained.

[0052] In some embodiments, the plurality of detectors 41 can rotate around the travel path L of the X-ray source. Thus, the detectors 41 can detect the diffracted X-rays that travel into the gap between the surfaces of the active detection areas 41a of the detectors 41 before rotation, so as to detect more diffracted X-rays and obtain more accurate stress detection results.

[0053] In some embodiments, as shown in Figure 6a , Figure 6b , Figure 6c , Figure 6d and Figure 6e , the surfaces of the active detection areas 41a of the plurality of detectors 41 are located in the same plane, and the travel path L of the X-rays is perpendicular to the plane, i.e. the surfaces of the active detection areas 41a of the plurality of detectors 41 are all perpendicular to the travel path L of the X-rays, so as to ensure that the diffracted X-rays form a diffraction ring with the center located on the travel path L of the X-rays on the surfaces of the active detection areas 41a of the plurality of detectors 41, and more accurate stress detection results are obtained.

[0054] In some embodiments, as shown in Figure 6f , the surfaces of the active detection areas 41a of the plurality of detectors 41 are not coplanar, and the area of the surface of the active detection area 41a away from the transmission area 401 is closer to the detection opening 202 than the area of the surface of the active detection area 41a adjacent to the transmission area 401, i.e. at least one detector 41 is in an inclined state, as shown in Figure 6f , the surfaces of the active detection areas 41a of the plurality of detectors 41 shown in the figure are not coplanar, and the plurality of detectors 41 are all in an inclined state.

[0055] In some embodiments, as shown inFigure 6a 、 6b 、 Figure 6c 、 Figure 6d 、 Figure 6e 、 Figure 6f As shown in FIG. 21, the surfaces of the effective detection regions 41a of the plurality of detectors 41 are arranged to be rotationally symmetrical, and the rotational center of the surfaces of the effective detection regions 41a of the plurality of detectors 41 is located on the travel path L of the X-rays.

[0056] In some embodiments, as shown in FIG. 22, the surfaces of the effective detection regions 41a of the plurality of detectors 41 are arranged to be axially symmetrical, and the axis of symmetry of the surfaces of the effective detection regions 41a of the plurality of detectors 41 intersects the travel path L of the X-rays. Figure 6a 、 Figure 6b 、 Figure 6c As shown in FIG. 22, the surfaces of the effective detection regions 41a of the plurality of detectors 41 are arranged to be axially symmetrical, and the axis of symmetry of the surfaces of the effective detection regions 41a of the plurality of detectors 41 intersects the travel path L of the X-rays.

[0057] In some embodiments, the number of detectors 41 is at least four, and the at least four detectors 41 are distributed at intervals around the travel path L of the X-rays. The specific interval distribution of the at least four detectors 41 can be set as needed, as long as the diffracted X-rays can be detected.

[0058] For ease of understanding, the specific distribution of the plurality of detectors 41 is described below as an example, but this does not mean that the distribution of the same number of detectors 41 in the specific examples below is limited to this distribution, and the distribution can be adjusted as needed, as long as the diffracted X-rays can be detected.

[0059] In some embodiments, as shown in FIG. 23, the number of detectors 41 shown in the figure is four, and the surfaces of the effective detection regions 41a of the four detectors 41 are distributed around the travel path L of the X-rays, and the transmission region 401 is in a rectangular shape. The surfaces of the effective detection regions 41a of the four detectors 41 are arranged to be rotationally symmetrical and axially symmetrical, and the rotational center is located on the travel path L of the X-rays and the axis of symmetry intersects the travel path L of the X-rays. Figure 6a In some embodiments, as shown in FIG. 24, the number of detectors 41 is six, and the surfaces of the effective detection regions 41a of the six detectors 41 are distributed around the travel path L of the X-rays, and the transmission region 401 is in a rectangular shape. The surfaces of the effective detection regions 41a of the six detectors 41 are arranged to be rotationally symmetrical and axially symmetrical, and the rotational center is located on the travel path L of the X-rays and the axis of symmetry intersects the travel path L of the X-rays.

[0060] Figure 6b In some embodiments, as shown in FIG. 24, the number of detectors 41 is six, and the surfaces of the effective detection regions 41a of the six detectors 41 are distributed around the travel path L of the X-rays, and the transmission region 401 is in a rectangular shape. The surfaces of the effective detection regions 41a of the six detectors 41 are arranged to be rotationally symmetrical and axially symmetrical, and the rotational center is located on the travel path L of the X-rays and the axis of symmetry intersects the travel path L of the X-rays.

[0061] In some embodiments, as shown in FIG. 25, the number of detectors 41 is eight, and the surfaces of the effective detection regions 41a of the eight detectors 41 are distributed around the travel path L of the X-rays, and the transmission region 401 is in a rectangular shape. The surfaces of the effective detection regions 41a of the eight detectors 41 are arranged to be rotationally symmetrical and axially symmetrical, and the rotational center is located on the travel path L of the X-rays and the axis of symmetry intersects the travel path L of the X-rays. Figure 6c ​As shown, the number of the detectors 41 is six, and the surfaces of the effective detection regions 41a of the six detectors 41 are equiangularly distributed around the travel path L of the X-rays, and the penetration region 401 is in the shape of a regular hexagon. The surfaces of the effective detection regions 41a of the six detectors 41 are arranged in rotational symmetry and axial symmetry, and the rotational center is located at the travel path L of the X-rays, and the symmetry axis intersects the travel path L of the X-rays.

[0062] In some embodiments, as shown in FIG. 2, the number of the detectors 41 is seven, and the surfaces of the effective detection regions 41a of the seven detectors 41 are equiangularly distributed around the travel path L of the X-rays, and the penetration region 401 is in the shape of a regular heptagon. The surfaces of the effective detection regions 41a of the seven detectors 41 are arranged in rotational symmetry, and the rotational center is located at the travel path L of the X-rays. Figure 6d In some embodiments, as shown in FIG. 3, the number of the detectors 41 is eight, and the surfaces of the effective detection regions 41a of the eight detectors 41 are arranged in a square around the travel path L of the X-rays, and the penetration region 401 is located at the geometric center region of the square. In this way, the gaps between the surfaces of the effective detection regions 41a of the detectors 41 are small, which is conducive to more detection of the diffracted X-rays (diffraction ring), so as to obtain more accurate stress detection results.

[0063] Figure 4 In some embodiments, as shown in FIG. 4, the number of the detectors 41 is eight, and the surfaces of the effective detection regions 41a of the eight detectors 41 are in the shape of a rectangle, and the eight detectors 41 are grouped into four detection groups 42, each detection group 42 including two detectors 41, and the arrangement direction of the two detectors 41 of each detection group 42 is perpendicular to the arrangement direction of the two detectors 41 of the adjacent detection group 42. The surfaces of the effective detection regions 41a of the eight detectors 41 are arranged in a square, and the penetration region 401 is located at the geometric center region of the square. In this way, the gaps between the surfaces of the effective detection regions 41a of the detectors 41 are small, which is conducive to more detection of the diffracted X-rays (diffraction ring), so as to obtain more accurate stress detection results. Figure 13 In some embodiments, the detection device 4 can include only one detector 41. In this case, the single detector 41 does not intersect the travel path L of the X-rays, and can only detect a part of the diffracted X-rays, i.e., the diffracted X-rays form an X-ray diffraction circular arc on the surface of the effective detection region 41a of the single detector 41.

[0064] Figure 6e In some embodiments, as shown in FIG. 5, the number of the detectors 41 is eight, and the surfaces of the effective detection regions 41a of the eight detectors 41 are in the shape of a rectangle, and the eight detectors 41 are grouped into four detection groups 42, each detection group 42 including two detectors 41, and the arrangement direction of the two detectors 41 of each detection group 42 is perpendicular to the arrangement direction of the two detectors 41 of the adjacent detection group 42. The surfaces of the effective detection regions 41a of the eight detectors 41 are arranged in a square, and the penetration region 401 is located at the geometric center region of the square. In this way, the gaps between the surfaces of the effective detection regions 41a of the detectors 41 are small, which is conducive to more detection of the diffracted X-rays (diffraction ring), so as to obtain more accurate stress detection results.

[0065] In some embodiments, the detection device 4 can include only one detector 41. In this case, the single detector 41 does not intersect the travel path L of the X-rays, and can only detect a part of the diffracted X-rays, i.e., the diffracted X-rays form an X-ray diffraction circular arc on the surface of the effective detection region 41a of the single detector 41.

[0066] In some embodiments, as shown in FIG. 6, the number of the detectors 41 is eight, and the surfaces of the effective detection regions 41a of the eight detectors 41 are in the shape of a rectangle, and the eight detectors 41 are grouped into four detection groups 42, each detection group 42 including two detectors 41, and the arrangement direction of the two detectors 41 of each detection group 42 is perpendicular to the arrangement direction of the two detectors 41 of the adjacent detection group 42. The surfaces of the effective detection regions 41a of the eight detectors 41 are arranged in a square, and the penetration region 401 is located at the geometric center region of the square. In this way, the gaps between the surfaces of the effective detection regions 41a of the detectors 41 are small, which is conducive to more detection of the diffracted X-rays (diffraction ring), so as to obtain more accurate stress detection results. Figures 7-9 ​​As shown, the diffractometer 1 further comprises an integrated plate 5 accommodated in the accommodating cavity 201. The integrated plate 5 is located between the detection device 4 and the X-ray source 3, and a plurality of detectors 41 are mounted on the surface of the integrated plate 5 facing the detection opening 202, wherein the integrated plate 5 is provided with a first through hole 51 for the X-rays to pass through before passing through the transmission area 401. Under the action of the integrated plate 5, the plurality of detectors 41 of the detection device 4 are concentratedly mounted and fixed, and the surfaces of the effective detection areas 41a of the plurality of detectors 41 are located in the same plane. During assembly, the plurality of detectors 41 can be indirectly fixed by fixing the integrated plate 5, which is conducive to improving the assembly efficiency of the diffractometer 1.

[0067] In some embodiments, as shown in Figures 7-9 As shown, the diffractometer 1 further comprises a circuit board 6 accommodated in the accommodating cavity 201, and the plurality of detectors 41 of the detection device 4 are electrically connected with the circuit board 6. The circuit board 6 is provided with a through hole 61, and the integrated plate 5 is arranged in the through hole 61 of the circuit board 6. In this way, the integrated plate 5 and the circuit board 6 do not need to be arranged in an overlapping manner, thereby reducing the space occupied by the integrated plate 5 and the circuit board 6 in the thickness direction, which is conducive to reducing the height of the diffractometer 1 and reducing the volume of the diffractometer 1.

[0068] In some embodiments, as shown in Figures 7-9 As shown, the diffractometer 1 further comprises a main support plate 7 accommodated in the accommodating cavity 201. The main support plate 7 is located between the integrated plate 5, the circuit board 6 and the X-ray source 3, and the main support plate 7 is fixedly connected with the shell 2. The integrated plate 5 and the circuit board 6 are both mounted on the surface of the main support plate 7 facing the detection opening 202, i.e., the circuit board 6 and the integrated plate 5 are both mounted on the surface of the main support plate 7 facing away from the X-ray source 3. At this time, the detection device 4 is mounted on the surface of the main support plate 7 facing the detection opening 202 via the integrated plate 5. The main support plate 7 is provided with a second through hole 71 for the X-rays to pass through before passing through the first through hole 51. That is, when the X-ray source 3 emits X-rays, the X-rays first pass through the second through hole 71 and then pass through the first through hole 51, and then pass through the transmission area 401 to exit the shell 2. In this way, the integrated plate 5 and the circuit board 6 are indirectly fixed by fixing the main support plate 7 in the shell 2. During assembly, the integrated plate 5 and the circuit board 6 can be fixed to the main support plate 7 first, and then the main support plate 7 is fixed in the shell 2, which is conducive to improving the assembly efficiency.

[0069] In some embodiments, as shown in Figure 7 and Figure 9As shown, the diffraction stress analyzer 1 further comprises a heat-conducting insulating piece 8, which is arranged between the main support plate 7 and the integrated plate 5 and covers the surface of the integrated plate 5 facing away from the detection opening 202. The heat-conducting insulating piece 8 is provided with a third through hole 81 for the X-rays to pass through, and the X-rays pass through the third through hole 81 after passing through the second through hole 71 and before passing through the first through hole 51, that is, the X-rays pass through the second through hole 71, the third through hole 81, the first through hole 51 and the penetration area 401 in sequence. The detector 41 of the detection device 4 generates heat during work, which causes the temperature to rise, and the detector 41 may not be able to work stably if the temperature is too high. The heat-conducting insulating piece 8 is arranged to not only ensure the insulation between the integrated plate 5 and the main support plate 7 for mounting the detection device 4, but also to conduct the heat generated by the detection device 4 (conducted to the heat-conducting insulating piece 8 by the integrated plate 5) to the main support plate 7, and dissipate the heat by the main support plate 7, which is conducive to heat dissipation and cooling of the detection device 4 and ensures stable work of the detection device 4.

[0070] The heat-conducting insulating piece 8 can be a heat-conducting silica gel sheet or other heat-conducting insulating materials, which can be arranged as needed.

[0071] In some embodiments, as shown in Figure 7 With Figure 9 As shown, the diffraction stress analyzer 1 further comprises a collimator 9 for adjusting the X-rays emitted by the X-ray source 3 into a straight line shape. In the present embodiment, the collimator 9 comprises a cylindrical portion 91 and a flange portion 92 connected to the outer periphery of one end of the cylindrical portion 91. The other end of the cylindrical portion 91 is farther away from the X-ray source 3 than the one end of the cylindrical portion 91, and the other end of the cylindrical portion 91 is thinner than the one end of the cylindrical portion 91, so that the X-rays emitted by the X-ray source 3 can be adjusted into a thinner straight line shape by the other end of the cylindrical portion 91. The flange portion 92 is mounted to the main support plate 7, and the cylindrical portion 91 passes through the second through hole 71, the third through hole 81, the first through hole 51 and the penetration area 401 in sequence. In use, the X-rays emitted by the X-ray source 3 enter from the one end of the cylindrical portion 91 of the collimator 9 and exit from the other end of the cylindrical portion 91. That is, the travel path of the X-rays passes through the cylindrical portion 91.

[0072] In some embodiments, as shown in Figure 9 The cylindrical portion 91 of the collimator 9 is provided with a lateral opening 911.

[0073] In some embodiments, as shown in Figure 9 As shown, the main support plate 7 is further provided with a positioning recess 72 located on the surface of the main support plate 7 facing away from the detection opening 202, the positioning recess 72 communicates with the second through hole 71, and the flange portion 92 abuts against the positioning recess 72. By abutting the flange portion 92 against the positioning recess 72, it is conducive to rapid positioning and installation between the collimator 9 and the main support plate 7, and conducive to improving the installation efficiency.

[0074] In some embodiments, as shown in Figures 9-10 The diffractometer 1 further comprises a calibration system 10, which comprises an extension rod 101, as shown in Figure 11 and Figure 12 A calibration light source 1011 is mounted at one end of the extension rod 101. In Figure 11 and Figure 12 , the calibration light source 1011 is mounted on the lower surface of the extension rod 101. In some embodiments, the calibration light source 1011 is a visible light source. The extension rod 101 is movable so that the calibration light source 1011 can move between a first position and a second position.

[0075] When the calibration light source 1011 moves to the first position, the end of the extension rod 101 and the calibration light source 1011 do not enter the cylindrical portion 91 of the collimator 9 or exit from the cylindrical portion 91 via the lateral opening 911, and the calibration light source 1011 is not located in the travel path L of the X-rays.

[0076] When the calibration light source 1011 moves to the second position, the end of the extension rod 101 and the calibration light source 1011 can enter the cylindrical portion 91 via the lateral opening 911, and the calibration light source 1011 is located in the travel path L of the X-rays. When the calibration light source 1011 is located in the travel path L of the X-rays, the calibration light source 1011 can emit calibration light along the travel path L of the X-rays. At this time, the calibration light enters the cylindrical portion 91 and is emitted to the object to be detected through the detection opening 202. In this way, when the calibration light source 1011 emits calibration light along the travel path L of the X-rays, the position and orientation of the object to be detected relative to the diffractometer 1 can be calibrated, ensuring that the X-rays emitted by the X-ray source 3 after calibration are emitted along the travel path L to the detection site of the object to be detected, and ensuring that the detection device 4 can detect the diffracted X-rays. In some embodiments, as shown in Figure 11 and Figure 12 The calibration system 10 further comprises a driving mechanism 102 housed in the receiving cavity 201, which is connected to the calibration light source 1011 and is used to drive the calibration light source 1011 to move. In this embodiment, the driving mechanism 102 is connected to the extension rod 101, and the driving mechanism 102 indirectly drives the calibration light source 1011 to move between the first position and the second position by driving the extension rod 101 to move.

[0077] In some embodiments, as shown in Figure 10As shown, the calibration system 10 also includes an image capturing device 103 housed in the receiving cavity 201. The housing 2 is provided with a capturing window 204. The image capturing device 103 is exposed through the capturing window 204. The image capturing device 103 is used to capture images of the object to be tested illuminated by the calibration light emitted by the calibration light source 1011.

[0078] Thus, when calibration is required, the extension rod 101 can be moved by the drive mechanism 102 to drive the calibration light source 1011 into the cylindrical part 91 through the side opening 911. At this time, the calibration light source 1011 is in the second position, and the calibration light source 1011 emits calibration light along the X-ray travel path L. At this time, the X-ray source 3 does not emit X-rays. The calibration light irradiates the detection area of ​​the object to be tested, forming a light spot. At this time, the image capturing device 103 captures the image of the object to be tested irradiated by the calibration light source 1011 and the light spot. By analyzing the image and the light spot, it can be determined whether the current position and orientation of the object to be tested relative to the diffraction stress analyzer 1 are conducive to stress detection. If it is not conducive to stress detection, the position and orientation of the object to be tested relative to the diffraction stress analyzer 1 are adjusted until they are conducive to stress detection. Subsequently, when stress detection of the object to be tested is required, the drive mechanism 102 drives the extension rod 101 to move, thereby driving the calibration light source 1011 to the first position. At this time, the calibration light source 1011 has already left the cylindrical part 91 through the lateral opening 911 and is no longer located in the X-ray travel path L. The X-ray source 3 is then activated. The X-rays emitted by the X-ray source 3 enter the cylindrical part 91 and pass through the detection opening 202 towards the object to be tested, where they are then diffracted to form diffracted X-rays. The detector 41 of the detection device 4 detects the diffracted X-rays, thereby determining the stress condition of the detection area of ​​the object.

[0079] In some embodiments, such as Figure 11 and Figure 12 As shown, the drive mechanism 102 includes a drive motor 1021, a lead screw 1022, and a driven part 1023. The output end of the drive motor 1021 is connected to one end of the lead screw 1022. The driven part 1023 connects the lead screw 1022 to the other end of the extension rod 101. The drive motor 1021 drives the lead screw 1022 to rotate, thereby driving the driven part 1023 to move. This causes the driven part 1023 to move the extension rod 101, which in turn moves the calibration light source 1011 between a first position and a second position.

[0080] In some embodiments, the driven part 1023 comprises a connecting piece 10231 and a transmission piece 10232 connected to each other, the screw rod 1022 is connected to the transmission piece 10232, and the connecting piece 10231 is connected to the other end of the extension rod. In the present embodiment, the transmission piece 10232 is a block-shaped body with a threaded hole, and the threaded hole of the block-shaped body is screwed with the thread at the surface of the screw rod 1022, so that the rotation of the screw rod 1022 can be used to drive the block-shaped body to move.

[0081] In some embodiments, the screw rod 1022 is directly connected to the other end of the extension rod 101, at this time, the driven part can be omitted, the extension rod 101 is provided with a threaded hole screwed with the thread at the surface of the screw rod 1022, and the extension rod 101 is directly screwed with the screw rod 1022 through the threaded hole.

[0082] It should be noted that the driving mechanism 102 herein is only an example of one of the cases, and the driving mechanism 102 can also be other configurations as long as it can achieve the driving of the calibration light source 1011 to move between the first position and the second position.

[0083] Exemplarily, the driving mechanism 102 comprises a driving motor 1021, a worm gear, a worm, and a driving block, the output end of the driving motor 1021 is connected to the worm gear, the worm is connected to the worm gear, the worm is connected to the driving block through a thread, and the driving block is connected to the other end of the extension rod 101. In this way, the driving motor 1021 drives the worm gear to rotate to drive the worm to rotate, so as to achieve the driving of the driving block to move the extension rod 101 to change the position of the calibration light source 1011.

[0084] In some embodiments, as shown in Figure 11 As shown in Figure 12 The calibration system 10 further comprises a position detection device 104, which is used to detect whether the calibration light source 1011 moves to the first position or the second position. In the present embodiment, the position detection device 104 comprises a shielding piece 1041, a first infrared sensor 1042, and a second infrared sensor 1043, wherein the first infrared sensor 1042 is farther away from the travel path L of the X-rays than the second infrared sensor 1043. The shielding piece 1041 is connected to the connecting piece 10231 of the driven part 1023, and the shielding piece 1041 moves together with the connecting piece 1023. When the shielding piece 1041 shields the first infrared sensor 1042, the calibration light source 1011 moves to the first position; when the shielding piece 1041 shields the second infrared sensor 1043, the calibration light source 1011 moves to the second position.

[0085] Thus, according to whether the infrared light emitted by the emitting ends of the first infrared sensor 1042 and the second infrared sensor 1043 is received by the receiving end, the position of the shielding piece 1041 can be determined, and thus it can be determined indirectly whether the calibration light source 1011 reaches the first position or the second position.

[0086] In some embodiments, the shielding piece 1041 can be connected to the extension rod 101 or the transmission member 1024 of the driven part, and moves together with the extension rod 101 or the transmission member 1024 of the driven part.

[0087] In some embodiments, as shown in Figure 11 As shown in Figure 12 The calibration system 10 further comprises a mounting block 105, which is connected to the driving motor 1021 and connected to the other end of the lead screw 1022. Thus, the mounting block 105 can further support the lead screw 1022, so as to avoid the bending of the lead screw 1022 due to the suspension, and facilitate to improve the stability of the driving mechanism 102.

[0088] In some embodiments, as shown in Figure 11 As shown in Figure 12 The calibration mechanism further comprises at least one guide rod 106. In the present embodiment, the number of the guide rods 106 is two. The two ends of the guide rods 106 are respectively connected to the two ends of the mounting block 105. The transmission member 1024 is provided with guide holes 10241 in the same number as the guide rods 106, and the guide rods 106 are respectively arranged in the guide holes 10241. Thus, under the action of the guide rods 106, the directional movement of the transmission member 1024 is facilitated, so as to ensure that the connecting member 1023 drives the extension rod 101 to move, so as to drive the calibration light source 1011 to move stably between the first position and the second position.

[0089] It can be understood that the driving mechanism 102 can be directly connected to the housing 2, or can be mounted on other parts (for example, the driving mechanism 102 is directly or indirectly mounted on the main support plate 7), as long as the driving mechanism 102 can drive the calibration light source 1011 to move between the first position and the second position.

[0090] In some embodiments, as shown in Figures 11-13As shown, the diffractometer 1 further comprises a sub-support plate 11, the sub-support plate 11 is connected to the main support plate 7 and the driving mechanism 102 is installed on the sub-support plate 11, at this time, the driving mechanism 102 is installed on the main support plate 7 through the sub-support plate 11, in this way, it is beneficial to install the driving mechanism 102 on the sub-support plate 11 and then install the sub-support plate 11 and the driving mechanism 102 on the main support plate 7 together, which is beneficial to improve the assembly efficiency. In this embodiment, the driving mechanism 102 is installed on the surface of the sub-support plate 11 facing the X-ray source 3, and the main support plate 7 is provided with a through region 73, and at least a part of the driving mechanism 102 is located in the through region 73. In this way, the space occupied by the sub-support plate 11 and the driving mechanism 102 installed on the sub-support plate 11 in the thickness direction is reduced, which is beneficial to reduce the height of the diffractometer 1 and reduce the volume of the diffractometer 1.

[0091] Heat dissipation scheme The X-ray source 3 generates heat during work, which causes the temperature to rise. If the temperature is too high, the X-ray source 3 may not work stably. In some embodiments, please refer to Figure 8 With Figure 9 , the diffractometer 1 further comprises a heat dissipation system 12, the heat dissipation system 12 is accommodated in the accommodating cavity 201, and the heat dissipation system 12 is used for dissipating heat of the X-ray source 3. In this way, the temperature of the X-ray source 3 can be reduced, and the stable work of the X-ray source 3 can be ensured.

[0092] In some embodiments, the heat dissipation system 12 comprises a heat sink 121 and a blower 122, the heat sink 121 surrounds the X-ray source 3, and the heat sink 121 is used for dissipating heat of the X-ray source 3, and the air outlet end of the blower 122 faces the heat sink 121. Among them, the heat sink 121 has a first groove 121a for guiding air flow, and the blower 122 is used for blowing air to the first groove 121a. In this way, at least a part of the air blown by the blower 122 to the heat sink 121 will flow along a predetermined path under the action of the first groove 121a, thereby taking away the heat conducted from the X-ray source 3 to the heat sink 121, and reducing the temperature of the X-ray source 3 during work.

[0093] In some embodiments, as Figure 8 shown, the opening of one end of the first groove 121a faces the detection device 4, in this way, it is beneficial to guide a part of the air blown by the blower 122 to the heat sink 121 to the main support plate 7, thereby accelerating the speed of air flow around the periphery of the main support plate 7, taking away the heat generated by the detection device 4 and conducted to the main support plate 7 by the integrated plate 5 and the heat-conducting insulation 8, and beneficial to dissipate heat and cool the detection device 4, reduce the risk of excessive heating of the detection device 4 during work, and ensure the stable work of the diffractometer.

[0094] In some embodiments, asFigure 8 As shown, the diffraction stress analyzer 1 further comprises a power module 13 accommodated in the accommodating cavity 201, the power module 13 is electrically connected with the X-ray source 3, the power module 13 is used for supplying power to the X-ray source 3, both the X-ray source 3 and the heat dissipation system 12 are arranged between the power module 13 and the main support plate 7, and the opening of the other end of the first groove 121a faces the power module 13. In this way, under the action of the first groove 121a, a part of the air blown by the air blower 122 towards the radiator 121 is guided to the power module 13, so as to accelerate the speed of air flow around the power module 13, take away the heat generated by the power module 13 during work, facilitate heat dissipation and cooling of the power module 13, reduce the risk of excessive heating of the power module 13 during work, and ensure stable work of the power module 13.

[0095] In some embodiments, the power module 13 is arranged outside the shell 2 and is not accommodated in the accommodating cavity 201. In this case, the volume of the shell 2 can be further reduced.

[0096] In some embodiments, the power module 13 can be an adapter for converting external voltage into working voltage of the X-ray source 3, or can be an electric energy storage device such as a lithium battery.

[0097] In some embodiments, as shown in FIG. 6, the power module 13 is arranged outside the shell 2 and is not accommodated in the accommodating cavity 201. Figure 8 As shown in FIG. 6, the heat dissipation system 12 further comprises a radiator 121 arranged on the main support plate 7 and electrically connected with the X-ray source 3, the air blower 122 is arranged on the main support plate 7 and is used for blowing air towards the radiator 121. Figure 9 As shown, the radiator 121 further has a second groove 121b for guiding air flow, the second groove 121b is cross-communicated with the first groove 121a, and the air blower 122 is further used for blowing air towards the second groove 121b. In this way, under the joint action of the first groove 121a and the second groove 121b, the air blown by the air blower 122 towards the radiator 121 is transported in multiple directions, so as to accelerate the heat conduction from the X-ray source 3 to the radiator 121 and accelerate the reduction of the temperature of the X-ray source 3 during work. It should be noted that the specific shape and structure of the radiator 121 can be arranged as needed as long as the heat dissipation of the X-ray source 3 can be realized. For example, the radiator 121 can be arranged in a circular arch shape, a C shape or other shapes.

[0098] In some embodiments, as shown in FIG. 6, the power module 13 is arranged outside the shell 2 and is not accommodated in the accommodating cavity 201. Figure 9As shown, the heat sink 121 includes a cover body part 1211 and a fin part 1212, the cover body part 1211 covers the X-ray source 3, the fin part 1212 includes a plurality of fins for heat dissipation, the plurality of fins are arranged on the surface of the cover body part 1211 away from the X-ray source 3, and the gaps between the plurality of fins constitute the first grooves 121a and the second grooves 121b. In this embodiment, the shape of the cover body part 1211 is arc-shaped. The plurality of first grooves 121a and the second grooves 121b formed by the fin part 1212 can make the air delivered by the air blower 122 flow in multiple directions, so as to improve the heat dissipation efficiency.

[0099] In some embodiments, the number of air blowers 122 is two, and the two air blowers 122 are arranged on the two opposite sides of the heat sink 121 respectively. The air outlet ends of the two air blowers 122 are both directed towards the heat sink 121. Under the joint action of the two air blowers 122, the heat conducted from the X-ray source 3 to the heat sink 121 can be quickly taken away, and the power module 13 and the main support plate 7 can be cooled at the same time under the guidance of the first grooves 121a.

[0100] In some embodiments, the diffractive stress analyzer 1 further includes a first support plate (not shown in the figure) and a second support plate (not shown in the figure), one end of the first support plate is connected to the main support plate 7, the other end of the first support plate is connected to one end of the second support plate, the other end of the second support plate is connected to the shell 2, and the power module 13 is arranged on the second support plate. In this way, the power module 13 is supported, and the overall strength of the diffractive stress analyzer 1 is enhanced, and the risk of damage to the X-ray source 3 caused by external force is reduced.

[0101] In some embodiments, referring again to Figure 1 , the diffractive stress analyzer 1 further includes a display screen 16, the display screen 16 is accommodated in the accommodating cavity 201 and connected to the shell 2, and the display screen 16 is electrically connected to the circuit board 6. The shell 2 is provided with a display opening 203, the display screen 16 is exposed through the display opening 203, and the display screen 16 is used to display various parameters when the diffractive stress analyzer 1 is working.

[0102] In some embodiments, referring again to Figure 7 , the diffractive stress analyzer 1 further includes a main control board 17, the main control board 17 is accommodated in the accommodating cavity 201 and connected to the shell 2, the main control board 17 is electrically connected to the power module 13, the X-ray source 3 and the air blower 122 respectively, and the main control board 17 is used to control the power module 13 to supply power to the X-ray source 3 and control the power of the air blower 122.

[0103] In some embodiments, referring again to Figure 1 , Figure 2 and Figure 7The diffracted stress analyzer 1 further comprises a working indicator lamp 18 and an emergency brake switch 19, both of which are electrically connected to the main control board 17 and arranged on the outer surface of the shell 2, the working indicator lamp 18 is used to display whether the diffracted stress analyzer 1 is in working state, and the emergency brake switch 19 is used to make the diffracted stress analyzer 1 stop working in emergency.

[0104] In some embodiments, referring to Figures 1-2 The diffracted stress analyzer 1 further comprises a handle 20 connected to the shell 2. By arranging the handle 20, the user can conveniently carry the diffracted stress analyzer 1. In some embodiments, referring to Figures 1-2 The diffracted stress analyzer 1 further comprises a mechanical arm 30, one end of which is connected to the shell 2, and the other end of which can be connected to a wall surface, a ground surface or a table surface, thereby providing support for the shell 2. By adjusting the mechanical arm 30, the irradiation direction of the X-rays emitted by the X-ray source 3 in the shell 2 can be adjusted, thereby enabling stress detection of multiple detection sites of the object to be detected.

[0105] The diffracted stress analyzer 1 provided by the embodiments of the present application comprises a shell 2, an X-ray source 3 and a detection device 4, the shell 2 is provided with a containing cavity 201 and a detection opening 202, the detection opening 202 is in communication with the containing cavity 201; the X-ray source 3 is accommodated in the containing cavity 201, the X-ray source 3 is used to emit X-rays to the detection opening 202, the X-rays are emitted to outside the shell 2 via the detection opening 202 and are diffracted, forming diffracted X-rays; the detection device 4 is accommodated in the containing cavity 201 and is arranged to be exposed via the detection opening 202, the detection device 4 is used to detect the diffracted X-rays and convert the diffracted X-rays into electrical signals. In this way, the diffracted X-rays can be directly detected by the detection device 4 and converted into electrical signals, thereby enabling the stress condition of the detection site of the object to be measured to be quickly obtained, the time for stress detection is shortened, and the efficiency of stress detection is improved.

[0106] The above is only the embodiment of the present application, and does not limit the patent scope of the present application, any equivalent structure or equivalent flow transformation by using the content of the specification and drawings of the present application, or direct or indirect application in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A diffractive stress analyzer characterized by, The diffraction stress analyzer comprises: a housing provided with a receiving cavity and a detection opening in communication with the receiving cavity; an X-ray source accommodated in the receiving cavity, the X-ray source being configured to emit X-rays to the detection opening, wherein the X-rays are emitted out of the housing via the detection opening and diffracted to form diffracted X-rays; a detection device accommodated in the receiving cavity and exposed through the detection opening, the detection device being configured to detect the diffracted X-rays and convert the diffracted X-rays into electrical signals.

2. The diffractive stress analyzer of claim 1, wherein, The detection device comprises a plurality of detectors, the plurality of detectors being spaced around a path of travel of the X-rays and not intersecting the path of travel of the X-rays, wherein the path of travel of the X-rays is a path traveled by the X-rays from being emitted by the X-ray source to being diffracted, an area surrounded by the plurality of detectors is a transmission area through which the X-rays pass, and surfaces of effective detection areas of the plurality of detectors are all directed towards and exposed through the detection opening, the effective detection areas being configured to detect the diffracted X-rays.

3. The diffractive stress analyzer of claim 2, wherein, The plurality of detectors are rotatable around the path of travel of the X-rays.

4. The diffractive stress analyzer of claim 2, wherein, The detection device comprises at least four detectors.

5. The diffractive stress analyzer of claim 2, wherein, Surfaces of the effective detection areas of the plurality of detectors are arranged in rotational symmetry, and a center of rotation of the surfaces of the effective detection areas of the plurality of detectors is located on the path of travel of the X-rays.

6. The diffractive stress analyzer of claim 2, wherein, The surfaces of the effective detection areas of the plurality of detectors are located on a same plane, and the path of travel of the X-rays is perpendicular to the plane.

7. The diffractive stress analyzer of claim 2, wherein, Surfaces of the effective detection areas of the plurality of detectors are arranged in axial symmetry, and an axis of symmetry of the surfaces of the effective detection areas of the plurality of detectors intersects the path of travel of the X-rays.

8. The diffractive stress analyzer of any one of claims 2 to 7, wherein, The detection device comprises eight detectors, surfaces of effective detection areas of the eight detectors are arranged in a square, and the transmission area is located in a geometric center region of the square.

9. The diffractive stress analyzer of any one of claims 2 to 6, wherein, The detection device comprises eight detectors, the eight detectors form four detection groups, each detection group comprises two detectors, an arrangement direction of the two detectors of each detection group is perpendicular to an arrangement direction of the two detectors of an adjacent detection group, surfaces of effective detection areas of the eight detectors are arranged in a square, and the transmission area is located in a geometric center region of the square.

10. The diffractive stress analyzer of any one of claims 2 to 5, wherein, Surfaces of the effective detection areas of the plurality of detectors are not coplanar, and regions of the surfaces of the effective detection areas away from the transmission area are closer to the detection opening than regions of the surfaces of the effective detection areas adjacent to the transmission area.

11. The diffractive stress analyzer of claim 2, wherein, The diffraction stress analyzer further comprises an integrated board accommodated in the receiving cavity, the plurality of detectors of the detection device are mounted on a surface of the integrated board directed towards the detection opening, wherein the integrated board is provided with a first through hole for the X-rays to pass through before passing through the transmission area.

12. The diffractive stress analyzer of claim 11, wherein, The diffraction stress analyzer further comprises a circuit board accommodated in the receiving cavity, the plurality of detectors of the detection device are electrically connected to the circuit board, the circuit board is provided with a through opening, and the integrated board is arranged in the through opening of the circuit board.

13. The diffractive stress analyzer of claim 12, wherein, The diffractometer further comprises a main support plate accommodated in the accommodating cavity, the integrated plate and the circuit board are both mounted on a surface of the main support plate facing the detection opening, the main support plate is provided with a second through hole for the X-rays to pass through, and the X-rays pass through the second through hole before passing through the first through hole.

14. The diffractive stress analyzer of claim 13, wherein, The diffractometer further comprises a heat-conducting insulating member arranged between the main support plate and the integrated plate, and covering a surface of the integrated plate away from the detection opening, wherein the heat-conducting insulating member is provided with a third through hole for the X-rays to pass through, and the X-rays pass through the second through hole, the third through hole, the first through hole and the penetration area in sequence.

15. The diffractive stress analyzer of claim 13, wherein, The diffractometer further comprises a collimator for adjusting the X-rays emitted by the X-ray source into a straight line shape, the collimator comprises a cylindrical portion and a flange portion connected to the outer periphery of one end of the cylindrical portion, the other end of the cylindrical portion is farther away from the X-ray source than the one end of the cylindrical portion, the flange portion is mounted on the main support plate, and the cylindrical portion passes through the second through hole, the first through hole and the penetration area in sequence, and the X-rays pass through the cylindrical portion.

16. The diffractive stress analyzer according to claim 15, characterized in that The main support plate is further provided with a positioning recess on a surface thereof away from the detection opening, the positioning recess is in communication with the second through hole, and the flange portion abuts against the positioning recess.

17. The diffractive stress analyzer of claim 15, wherein, The diffractometer further comprises a heat-conducting insulating member arranged between the main support plate and the integrated plate, and covering a surface of the integrated plate away from the detection opening, wherein the heat-conducting insulating member is provided with a third through hole for the X-rays to pass through, and the cylindrical portion passes through the second through hole, the third through hole, the first through hole and the penetration area in sequence, and the X-rays pass through the cylindrical portion.

18. The diffractive stress analyzer of claim 15, wherein, The cylindrical portion of the collimator is provided with a lateral opening; The diffractometer further comprises a calibration system, the calibration system comprises a calibration light source, the calibration light source can enter or exit the cylindrical portion through the lateral opening, and the calibration light source can emit calibration light along the travel path of the X-rays when the calibration light source is located in the cylindrical portion.

19. The diffractive stress analyzer of claim 1, wherein, Further comprising a power supply module accommodated in the accommodating cavity or arranged outside the shell, the power supply module is electrically connected with the X-ray source for supplying power to the X-ray source.

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