Work mechanism, test device, and work machine

Abstract

The invention discloses a working mechanism, a testing device and a working machine, the working mechanism comprises a bearing device, a first unit and a second unit, and the bearing device is provided with a contact part for contacting an electronic component; the first unit is provided with a temperature generator on the bearing device, so that the contact part has a first temperature; the second unit is provided with at least one coil and at least one magnetic induction piece, the at least one coil is arranged on one of the bearing device and the first unit and can generate electromagnetic waves through current, and the at least one magnetic induction piece is assembled on the other one of the bearing device and the first unit and can electromagnetically induce the electromagnetic waves of the coil. Therefore, the temperature of the contact part can be rapidly raised to the preset operation temperature, thereby improving the temperature conduction efficiency and shortening the temperature control operation time.

Description

Technical Field

[0001] This invention relates to a working mechanism that can improve temperature conduction efficiency and save energy costs, a testing device using it, and a working machine. Background Technology

[0002] In today's world, electronic components will be used in low-temperature or high-temperature environments. To ensure product quality, electronic components must undergo cold or hot testing in testing equipment to eliminate defective products. Please refer to [link to relevant documentation]. Figure 1 The testing device is equipped with an electrically connected circuit board 11 and a test socket 12 for testing electronic components. A crimping mechanism is arranged above the test socket 12. The crimping mechanism is mounted on a transfer arm 13 with a body 14. The body 14 has a flow channel 141 inside. The two ends of the flow channel 141 are connected to an input pipe 151 and an output pipe 152 to input and output low-temperature water liquid respectively. A ceramic heater 16 is arranged below the body 14. A pressing fixture 17 is arranged at the bottom of the heater 16 for crimping the electronic components of the test socket 12. During cold testing, the crimping mechanism uses the low-temperature water liquid in the body 14 in conjunction with the heater 16 to simulate the low-temperature environment of future use for the temperature control electronic components to perform cold testing.

[0003] However, the body 14 of the crimping mechanism and the heater 16 are arranged vertically. The low temperature of the low-temperature liquid in the body 14 must be conducted to the lower pressure fixture 17 through the heater 16. However, the heater 16 is made of ceramic, and its own temperature conduction efficiency is limited, which reduces the cold conductivity. As a result, the operator must spend energy to inject even lower temperature liquid into the body 14 so that the lower pressure fixture 17 can perform cold testing with preset low temperature crimping electronic components, resulting in poor cold conductivity and increased energy costs. Summary of the Invention

[0004] The present invention provides a working mechanism, testing device and working machine that can improve temperature conduction efficiency and save energy costs.

[0005] This invention provides a working mechanism comprising a support, a first unit, and a second unit. The support is provided with at least one contact component for contacting electronic components. The first unit is mounted on the support and is provided with a temperature generator, which enables the contact component to have a first temperature. The second unit is provided with at least one coil and at least one magnetic sensing element. The at least one coil is disposed in one of the support and the first unit and is capable of generating electromagnetic waves through current. The at least one magnetic sensing element is mounted in the other of the support and the first unit, which uses electromagnetic induction of the electromagnetic waves from the coil to raise the temperature of the contact component to a preset working temperature. Thus, the temperature generator of the first unit can quickly conduct low temperature to the contact component through the magnetic sensing element of the second unit, thereby improving the cold conductivity and reducing the temperature control operation time, achieving the benefits of improved temperature control efficiency and energy cost savings.

[0006] The present invention also provides a working mechanism in which the magnetic sensing element of the second unit can be assembled inside the base of the support near the bottom surface or in contact with the component, or the bottom surface of the magnetic sensing element can be used as the contact component, thereby effectively reducing the overall volume of the working mechanism, so as to facilitate space configuration and improve the efficiency of use.

[0007] The present invention also provides a testing device, comprising a testing mechanism and an operating mechanism of the present invention; the testing mechanism is provided with at least one tester for testing electronic components; the operating mechanism of the present invention includes a support, a first unit and a second unit for temperature control and contact with the electronic components of the tester, so as to improve testing efficiency.

[0008] The present invention also provides a working machine, comprising a machine base, a feeding device, a receiving device, the testing device of the present invention, a conveying device, and a central control device. The feeding device is disposed on the machine base and is provided with at least one feeder for accommodating at least one electronic component to be tested. The receiving device is disposed on the machine base and is provided with at least one receiving device for accommodating at least one tested electronic component. The testing device of the present invention is disposed on the machine base and is provided with a testing mechanism and a working mechanism for testing, temperature control, and contacting electronic components. The conveying device is disposed on the machine base and is provided with at least one conveyor for conveying at least one electronic component. The central control device is used to control and integrate the actions of each device to perform automated operation. Attached Figure Description

[0009] Figure 1 This is a schematic diagram illustrating the use of an existing testing setup.

[0010] Figure 2 This is a diagram of the first embodiment of the working mechanism of the present invention.

[0011] Figure 3 This is a schematic diagram of the first embodiment of the present invention applied to the testing device.

[0012] Figure 4 This is a diagram of a second embodiment of the working mechanism of the present invention.

[0013] Figure 5 This is a diagram of the third embodiment of the working mechanism of the present invention.

[0014] Figure 6 This is a diagram of the fourth embodiment of the working mechanism of the present invention.

[0015] Figure 7 This is a diagram of the fifth embodiment of the working mechanism of the present invention.

[0016] Figure 8 This is a diagram of the sixth embodiment of the working mechanism of the present invention.

[0017] Figure 9 This is a configuration diagram of the test device of the present invention applied to a work machine.

[0018] Explanation of reference numerals in the attached drawings: 11-Circuit board; 12-Test holder; 13-Transfer arm; 14-Body; 141-Flow channel; 151-Input pipe; 152-Output pipe; 16-Heater; 17-Pressure fixture; 20-Test device; 211-Transfer arm; 212-Base; 2121-Top surface; 213-Contact component; 214-Flow channel; 2141-Water inlet section; 2142-Water outlet section; 215-Input pipe; 216-Output pipe ; 217-Contact component; 218-Accommodation space; 221-Coil; 222-Magnetic sensing component; 2221-First mounting surface; 2222-Second mounting surface; 231-Circuit board; 232-Test socket; 241-Support plate; 242-Conductive component; 30-Electronic component; 40-Machinery; 50-Feeding device; 60-Receiving device; 70-Conveying device; 71-First conveyor; 72-Second conveyor; 73-Third conveyor. Detailed Implementation

[0019] To provide a further understanding of the present invention, a preferred embodiment is described in detail below with reference to the accompanying drawings:

[0020] Please see Figure 2 This is a first embodiment of the working mechanism of the present invention, which includes a support, a first unit and a second unit.

[0021] The mount is provided with at least one contact component for contacting at least one electronic component. Furthermore, the mount can be fixed or displaced in at least one direction; for example, the base of the mount is mounted on a fixture for a fixed configuration, and the tester (not shown) can be displaced relative to the mount; for example, the base of the mount is mounted on a transfer arm and can be displaced in at least one direction and relative to the tester.

[0022] Depending on the operational requirements, the support can be a presser, a stage, a pressure transfer device, or a preheater; the contact component can be a block or at least one side, etc.; for example, the support is a presser that can press down contact and temperature control electronic components; for example, the support is a stage that can hold contact, temperature control, and transport electronic components; for example, the support is a pressure transfer device and is provided with a suction hole for pressing down contact, temperature control, and transferring electronic components.

[0023] In this embodiment, the support is a crimping device, comprising a transfer arm 211, a base 212, and at least one contact component 213. The transfer arm 211 is driven by a transfer drive source (not shown) to move in the Z direction. The base 212 is fitted with the transfer arm 211 on its top surface 2121, and the transfer arm 211 drives synchronous movement. The at least one contact component 213 may be an independent component or a part of the base 212. For example, the contact component 213 may be an independent crimping fixture, fitted below the base 212; for example, the contact component 213 may be the bottom surface of the base 212. In this embodiment, the bottom surface of the base 212 is defined as the contact component 213 for pressing down on electronic components (not shown).

[0024] The first unit is assembled in the holder and is provided with at least one temperature generator, which enables the contact component 213 to have a first temperature.

[0025] Depending on the operational requirements, the temperature generator can be a cooling chip or include a flow channel and a fluid. The fluid can be a refrigerant or water, and the fluid has a preset first temperature. In this embodiment, the temperature generator of the first unit has a flow channel 214 inside the base 212. One end of the flow channel 214 is connected to the input pipe 215 to allow the input of water with a first temperature and a low temperature. The low temperature of the water can be conducted through the base 212 to the contact member 213, so that the contact member 213 has a preset first temperature. The other end of the flow channel 214 is connected to the output pipe 216 to allow the output of the water after heat exchange and heating.

[0026] The second unit is provided with at least one coil and at least one magnetic sensing element. The at least one coil is disposed in one of the holder and the first unit and is capable of generating electromagnetic waves through current. The at least one magnetic sensing element is assembled in one of the holder and the first unit to raise the temperature of the contact component to a preset operating temperature by electromagnetically inducing the electromagnetic waves of the coil.

[0027] Depending on the operational requirements, at least one coil may be disposed on the outer peripheral surface of the holder (e.g., the top surface or the outer ring surface) or disposed in the flow channel of the first unit.

[0028] Depending on the operational requirements, the bottom surface of the magnetic sensing element can serve as a contact component of the holder for contacting electronic components.

[0029] In this embodiment, coil 221 is made of metal to generate electromagnetic waves by allowing current to pass through it. The number of turns of the coil can be a single turn or multiple turns, depending on the operational requirements. Coil 221 is disposed on the top surface of base 212, and its two ends are connected to a current supply device (not shown in the figure).

[0030] At least one magnetic sensing element 222 may be a silicon steel sheet or iron wire, etc., and is disposed inside the base 212 and near the contact member 213 on the bottom surface, that is, the magnetic sensing element 222 is located between the flow channel 214 and the contact member 213. When current flows through the coil 221, the magnetic sensing element 222 generates eddy currents and heats up through the thermal effect of the current.

[0031] Please see Figure 3 The testing device 20 includes a testing mechanism and the working mechanism of the present invention. The testing mechanism is provided with at least one tester for performing testing operations on electronic components. In this embodiment, the tester is provided with an electrically connected circuit board 231 and a test socket 232. The test socket 232 has probes for holding and testing electronic components. The working mechanism of the present invention is disposed above the testing mechanism for pressing down on and temperature-controlling the electronic components of the test socket 232.

[0032] During cold testing, the first unit of the operating mechanism inputs low-temperature water into the flow channel 214 inside the base 212 via the input pipe 215. Since the bottom surface of the base 212 is defined as the contact component 213, and a magnetic sensing element 222 made of magnetic sensing metal is arranged between the flow channel 214 and the contact component 213, when the water flows along the flow channel 214, the low temperature can be quickly conducted to the contact component 213 via the magnetic sensing element 222, so that the contact component 213 has a first temperature and the cold conductivity is improved; the water that has undergone heat exchange in the flow channel 214 is output through the output pipe 216. To ensure that the contact component 213 can accurately reach the preset test temperature, a first unit is used in conjunction with a second unit. The coil 221 and the magnetic sensing element 222 of the second unit are arranged in different positions. When current flows through the coil 221 on the top surface 2121 of the base 212, a magnetic field is generated around it, emitting electromagnetic waves. Since the magnetic sensing element 222, which is arranged inside the base 212, is located within the magnetic field range, the magnetic sensing element 222 generates eddy currents and heats up through the thermal effect of the current. With the magnetic sensing element 222 positioned close to the contact component 213, the heat can be quickly conducted to the contact component 213, causing the contact component 213 to change from the first temperature to the preset operating temperature. Thus, the transfer arm 211 of the holder drives the base 212, the first unit, the second unit and the contact component 213 to move in the Z direction, so that the contact component 213 presses down on the electronic component 30 of the test seat 232. Since the contact component 213 has a preset test low temperature (i.e. preset operating temperature), the electronic component 30 can be subjected to cold testing in a simulated low temperature environment for future use, thereby improving the test quality.

[0033] Please see Figure 4The design of the second embodiment of the working mechanism of the present invention is generally the same as that of the first embodiment. The difference between the second embodiment and the first embodiment is that the support can be configured with at least one independent contact member 217 below the base 212. The second unit includes a coil 221 and a magnetic sensing element 222. The magnetic sensing element 222 is disposed inside the contact member 217 of the support and is located within the magnetic field range of the coil 221. When current passes through the coil 221, the magnetic sensing element 222 can heat the contact member 217 to a preset operating temperature (i.e., a preset test temperature) to facilitate the execution of the test operation.

[0034] Please see Figure 5 The design of the third embodiment of the working mechanism of the present invention is generally the same as that of the second embodiment. The difference between the third embodiment and the second embodiment is that the support can be configured with at least one independent contact member 217 below the base 212. The second unit includes a coil 221 and a magnetic sensing element 222. The magnetic sensing element 222 has a first mounting surface 2221 and a second mounting surface 2222. The first mounting surface 2221 is mounted on the bottom surface of the base 212, and the second mounting surface 2222 is mounted on the top surface of the contact member 217. Since the magnetic sensing element 222 is a magnetic metal and thin, the magnetic sensing element 222 is disposed between the base 212 and the contact member 217. Compared with a ceramic heater, the magnetic sensing element 222 has a smaller volume and is more space-efficient. The magnetic sensing element 222 is located in the magnetic field range of the coil 221. When current flows through the coil 221, the magnetic sensing element 222 can heat the contact member 217 to a preset operating temperature (i.e., a preset test temperature) to facilitate the execution of the test operation.

[0035] Please see Figure 6 The design of the fourth embodiment of the working mechanism of the present invention is generally the same as that of the third embodiment. The difference between the fourth embodiment and the third embodiment is that the second unit includes a coil 221 and a magnetic sensing element 222. The coil 221 is configured to be sleeved on the outer peripheral surface of the base 212 of the holder and close to the magnetic sensing element 222, which further ensures that the magnetic sensing element 222 is within the magnetic field range of the coil 221. When current passes through the coil 221, the magnetic sensing element 222 can heat the contact component 217 to the preset operating temperature (i.e., the preset test temperature) to facilitate the execution of the test operation.

[0036] Please see Figure 7The design of the fifth embodiment of the working mechanism of the present invention is generally the same as that of the third embodiment. The difference between the fifth embodiment and the third embodiment is that the temperature generator of the first unit has a flow channel 214 inside the base 212 for conveying fluid with a first temperature, and at least one coil 221 of the second unit is disposed in the flow channel 214 of the base 212. Furthermore, at least one magnetic sensing element 222 can be disposed in the base 212 or the contact member 217, or disposed between the base 212 and the contact member 217; for example, the bottom surface of the base 212 defines the contact member of the holder, and at least one magnetic sensing element 222 is disposed inside the base 212 of the holder and is located close to the contact member; for example, the holder has an independent contact member 217 disposed below the base 212, and at least one magnetic sensing element 222 can be disposed between the base 212 of the holder and the contact member 217, or disposed inside the contact member 217. In this embodiment, the coil 221 of the second unit is disposed in the flow channel 214 of the first unit; depending on the operation requirements, a non-conductive component may be added to the contact part between the coil 221 and the flow channel 214; the magnetic sensing component 222 of the second unit is disposed between the base 212 of the holder and the contact component 217, and is located within the magnetic field range of the coil 221. When current flows through the coil 221, the magnetic sensing component 222 can heat the contact component 217 to a preset operating temperature (i.e., a preset test temperature) to facilitate the execution of the test operation.

[0037] Please see Figure 8The design of the sixth embodiment of the working mechanism of the present invention is generally the same as that of the fifth embodiment. The difference between the sixth embodiment and the fifth embodiment is that the temperature generator of the first unit includes a flow channel 214 and a conductive structure, the conductive structure being disposed between the flow channel 214 and the contact member 217, and at least one coil 221 of the second unit being disposed on the conductive structure. Furthermore, the conductive structure includes at least one support plate 241 and at least one conductive member 242, the conductive member 242 being erected on the support plate 241, and the conductive member 242 may be columnar or sheet-like. In this embodiment, the temperature generator of the first unit has a flow channel 214 on the base 212, and a communicating accommodating space 218 is provided below the flow channel 214. The conductive structure includes a support plate 241 and a plurality of conductive elements 242. The support plate 241 is horizontally arranged on the bottom surface of the base 212 and closes the accommodating space 218. The plurality of conductive elements 242 are sheet-shaped and uprightly formed on the top surface of the support plate 241, located in the accommodating space 218, and communicating with the flow channel 214 so that water from the water inlet section 2141 of the flow channel 214 can flow in. Between the accommodating space 218 and the plurality of conductive elements 242, the heat-exchanged water is then transported to the outlet section 2142 of the flow channel 214 for output; the coil 221 of the second unit is disposed between the plurality of conductive elements 242 of the conductive structure, and the magnetic sensing element 222 is disposed inside the support plate 241 of the conductive structure and is located within the magnetic field range of the coil 221. When current flows through the coil 221, the magnetic sensing element 222 can heat the contact component 217 to the preset operating temperature (i.e., the preset test temperature) to facilitate the execution of the test operation.

[0038] Please see Figure 2 , Figure 3 , Figure 9The testing device 20 of this invention is applied to an electronic component processing machine, comprising a machine base 40, a testing device 20, a feeding device 50, a receiving device 60, a conveying device 70, and a central control device (not shown). In this embodiment, the feeding device 50 is disposed on the machine base 40 and is provided with at least one feeder for holding the electronic component to be tested; the receiving device 60 is disposed on the machine base 40 and is provided with at least one receiving device for holding the tested electronic component; the testing device 20 is disposed on the machine base 40 and includes at least one testing mechanism and at least one working mechanism of this invention for testing, contacting, and temperature-controlling electronic components; the conveying device 70 is disposed on the machine base 40 and is provided with at least one conveyor for conveying electronic components. In this embodiment, the conveying device 70 is provided with a first conveyor 71 that performs XYZ direction displacement. The feeding device 50 takes out the electronic component to be tested and transfers it to the second conveyor 72. The third conveyor 73 of the conveying device 70 picks up and places the electronic component to be tested and the tested electronic component between the second conveyor 72 and the test seat 232 of the testing device 20. The test seat 232 tests the electronic component. The working mechanism presses down on the electronic component in contact with the test seat 232 with the contact part 213 of the holder, and uses the first unit and the second unit to quickly and accurately temperature control the electronic component to perform the test operation at the preset test temperature. The first conveyor 71 of the conveying device 70 then takes out the tested electronic component from the second conveyor 72 and transfers the tested electronic component to the receiving device 60 for sorting and storage according to the test results. The central control device is used to control and integrate the actions of each device to perform automated operation and achieve the practical benefits of improving work efficiency.

Claims

1. A working mechanism, characterized in that, Include: A holder is provided with at least one contact component for contacting at least one electronic component; First unit: assembled on the support and provided with at least one temperature generator, which enables the contact component to have a first temperature; Second unit: It is provided with at least one coil and at least one magnetic sensing element. The at least one coil is disposed in one of the holder and the first unit and can generate electromagnetic waves through current. The at least one magnetic sensing element is assembled in one of the holder and the first unit to electromagnetically sense the electromagnetic waves of the coil and heat the contact component to a preset operating temperature.

2. The working mechanism as described in claim 1, characterized in that, The at least one coil of the second unit is disposed on the outer peripheral surface of the holder.

3. The working mechanism as described in claim 1, characterized in that, The holder includes a base and the at least one contact member, the bottom surface of the base being defined as the at least one contact member, and the at least one magnetic sensing element of the second unit being disposed inside the base and close to the at least one contact member.

4. The working mechanism as described in claim 1, characterized in that, The holder includes a base and the at least one contact member disposed below the base.

5. The working mechanism as described in claim 4, characterized in that, The at least one magnetic sensing element of the second unit is disposed inside the at least one contact member.

6. The working mechanism as described in claim 4, characterized in that, The at least one magnetic sensing element of the second unit is provided with a first mounting surface and a second mounting surface. The first mounting surface is disposed on the bottom surface of the base, and the second mounting surface is disposed on the top surface of the at least one contact member.

7. The working mechanism as described in any one of claims 3 to 6, characterized in that, The temperature generator of the first unit has a flow channel inside the base for conveying fluid with the first temperature.

8. The working mechanism as described in claim 7, characterized in that, The at least one coil of the second unit is disposed in the flow channel of the base.

9. The working mechanism as described in claim 7, characterized in that, The temperature generator of the first unit also includes a conductive structure disposed between the flow channel and the contact member, and the at least one coil of the second unit is disposed in the conductive structure.

10. The working mechanism as described in any one of claims 1 to 6, characterized in that, The support is either fixed or can be displaced in at least one direction.

11. A testing apparatus, characterized in that, Include: Testing facility: Equipped with at least one tester to perform testing on electronic components; At least one operating mechanism as described in claim 1: for temperature control and contact with the electronic components of the tester.

12. A work machine, characterized in that, Include: Machine tool; Feeding device: disposed on the machine and equipped with at least one feeder for accommodating at least one electronic component to be tested; Material receiving device: disposed on the machine and equipped with at least one material receiving device for accommodating at least one measured electronic component; At least one testing apparatus as described in claim 11: configured on the machine tool for performing testing operations on electronic components; Conveying device: disposed on the machine and equipped with at least one conveyor for conveying at least one electronic component; Central control unit: Used to control and integrate the actions of various devices to perform automated operations.

Images