Equipment conduction test method and device
By integrating instruments and switching modules, the complexity of expanding node capacity in existing equipment is solved, enabling convenient and efficient continuity testing and simplifying the testing process.
Patent Information
- Application Number
- CN202511156498.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-18
- Publication Date
- 2025-11-21
AI Technical Summary
When existing equipment is in mass production, the switching board system requires customized design and complex connection adapters to expand node capacity, which makes testing operations cumbersome and inconvenient.
A combination of host computer, integrated instruments and switching modules is used to achieve automated continuity testing through communication programmable interface and signal routing bus, which simplifies equipment design and optimizes the testing process.
No additional setup or cable adapters are required when expanding test nodes, making operation more convenient and efficient, simplifying the testing process, and improving the reliability and efficiency of testing.
Smart Images
Figure CN120993271A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the field of automation testing technology, in particular to a method and device for continuity testing of equipment. BACKGROUND
[0002] In the production process of electronic products, especially in mass production, the production testing link is crucial. In order to ensure product quality, test engineers need to perform continuity testing on wire harness cables, module system ports, etc. in electronic products.
[0003] Currently, the commonly used test equipment usually performs testing based on a switching board system, which connects wire harnesses or module ports through electrical routing by a front connector. However, this kind of equipment has obvious limitations when facing large-capacity node switching. When expanding the node capacity, the switching board system needs to realize additional routing connection through customized design of connection adapter tooling and connection lines, which not only increases the design complexity of the equipment, but also makes the operation of the testing process cumbersome and inconvenient. SUMMARY
[0004] The present application provides a method and device for continuity testing of equipment, aiming to simplify equipment design, reduce design complexity, and optimize the testing process to make it more convenient and efficient.
[0005] In order to achieve the above-mentioned purpose, the present application provides the following technical solutions:
[0006] A continuity testing device for equipment, comprising: an upper computer, an integrated instrument, and a switching module;
[0007] The communication program control interface of the integrated instrument is connected with the upper computer; the upper computer is used to generate a test command;
[0008] The instrument interface of the switching module is connected with the multimeter test interface of the integrated instrument; the switching module is used to perform continuity testing on the equipment under test when receiving the test command, and the integrated instrument is used to perform impedance measurement after receiving the test command;
[0009] The communication interface of the switching module is connected with the upper computer, and the switching module is connected with the equipment under test.
[0010] Optionally, the device further comprises a power supply;
[0011] The power supply interface of the integrated instrument is connected with the power supply, and the power supply interface of the upper computer is connected with the power supply.
[0012] Optionally, the device further comprises a stabilized DC power supply;
[0013] The input end of the stable voltage DC power supply is connected with the power supply, and the output end of the stable voltage DC power supply is connected with the power interface of the switching module; the stable voltage DC power supply is used for converting AC into DC.
[0014] Optionally, the device further comprises a switch;
[0015] The communication program control interface of the integrated instrument is connected with the first communication interface of the switch;
[0016] The communication interface of the switching module is connected with the second communication interface of the switch;
[0017] The third communication interface of the switch is connected with the host computer.
[0018] Optionally, the switching module comprises a processing board, a mother board and a switching board;
[0019] The communication interface of the processing board is connected with the host computer, and the processing board is connected with the bus of the mother board; the processing board sends a test command to the switching board; the mother board is used for transmitting signals between the processing board and the switching board;
[0020] The bus of the mother board is connected with the switching board, and the switching board is connected with the device under test; the switching board is used for testing according to the test command.
[0021] Optionally, the processing board is specifically an ARM processor.
[0022] Optionally, the switching board is specifically a voltage-resistant relay.
[0023] Optionally, the integrated instrument is specifically a multimeter.
[0024] A conduction test method of a device, applied to the conduction test device of any of the above devices, comprising:
[0025] The host computer sends a conduction test command to the switching module; the conduction test command comprises a switching command of short circuit test and open circuit test;
[0026] When the switching module receives the conduction test command, the switching module performs switching signal routing processing on the device under test according to the conduction test command;
[0027] After the signal routing switching is completed, the integrated instrument performs impedance measurement to obtain test data;
[0028] After the conduction test command test is completed, the integrated instrument generates a test result based on the test data;
[0029] The integrated instrument sends the test result to the host computer.
[0030] Optionally, before the host computer sends the turn-on test command to the switching module, the method further comprises:
[0031] The host computer sends an inspection command to the switching module; the switching module comprises at least a switching board and a processing board;
[0032] When the switching module receives the inspection command, the processing board performs a state inspection on the switching board to obtain an inspection result;
[0033] The switching module sends the inspection result to the host computer.
[0034] The technical scheme provided in the application comprises the following steps: a communication program control interface of an integrated instrument is connected with a host computer; the host computer is used to generate a test command; an instrument interface of a switching module is connected with a multimeter test interface of the integrated instrument; the switching module is used to perform a turn-on test on a device under test when receiving the test command; the integrated instrument is used to perform impedance measurement after receiving the test command; a communication interface of the switching module is connected with the host computer, and the switching module is connected with the device under test. The switching module has integrated the instrument and a signal routing bus internally, so that when a test node needs to be expanded, a new module or device can be directly inserted without additional settings, external conversion cables or other tooling. This makes the expansion more convenient and efficient without complex additional configuration, thereby optimizing the test process and making the operation more convenient and efficient. BRIEF DESCRIPTION OF DRAWINGS
[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0036] Figure 1 A first architecture schematic diagram of a turn-on test device of a device provided by the embodiment of the present application;
[0037] Figure 2 A second architecture schematic diagram of a turn-on test device of a device provided by the embodiment of the present application;
[0038] Figure 3 A third architecture schematic diagram of a turn-on test device of a device provided by the embodiment of the present application;
[0039] Figure 4 A fourth architecture schematic diagram of a turn-on test device of a device provided by the embodiment of the present application;
[0040] Figure 5 This is a fifth architecture diagram of a continuity testing device for a device provided in an embodiment of this application;
[0041] Figure 6 A flowchart illustrating a continuity testing method for a device provided in an embodiment of this application.
[0042] Figure label:
[0043] 11-Host computer; 12-Integrated instrument; 13-Switching module; 21-Power supply; 31-Regulated DC power supply; 41-Switcher; 51-Processing board; 52-Main board; 53-Switching board; 14-Device under test. Detailed Implementation
[0044] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0045] In this application, the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
[0046] like Figure 1 The diagram shown is a schematic of the architecture of a continuity testing device for a device provided in an embodiment of this application. The continuity testing device includes: a host computer 11, an integrated instrument 12, and a switching module 13.
[0047] The communication control interface of the integrated instrument 12 is connected to the host computer 11.
[0048] Among them, the host computer 11 is used to generate test commands.
[0049] Optionally, the integrated instrument is a multimeter, and the host computer includes, but is not limited to, PCs, industrial computers, and laptops.
[0050] Understandably, during continuity testing, the host computer translates connected component information and edits switching instructions to perform short-circuit and open-circuit tests, thereby generating test commands.
[0051] The connected domain information is a set of nodes having a short circuit relationship with each other.
[0052] The meter interface of the switching module 13 is connected with the multimeter test interface of the integrated meter 12.
[0053] The switching module 13 is configured to perform a turn-on test on the device under test 14 when receiving a test command, and the integrated meter 12 is configured to receive the test command and feed back a test result.
[0054] It should be noted that the integrated meter 12 is further configured to perform impedance measurement reading.
[0055] The communication interface of the switching module 13 is connected with the host computer 11, and the switching module 13 is connected with the device under test 14.
[0056] The switching module 13 receives a test command sent by the host computer through the communication interface, and performs a test on the device under test according to the test command.
[0057] Optionally, the communication interface of the switching module 13 is an M12 network port, and the switching module 13 communicates with the host computer 11 and the integrated meter 12 through a TCP protocol.
[0058] In combination with the content shown in the drawings, it can be seen from Figure 1 that the turn-on test device further includes a power supply 21. Figure 2 The power supply interface of the integrated meter 12 is connected with the power supply 21, and the power supply interface (i.e., AC220V) of the host computer 11 is connected with the power supply 21.
[0059] It can be understood that the power supply 21 is used to supply power to each device in the turn-on test device. Specifically, the power supply is 220V alternating current (i.e., AC220V).
[0060] In combination with the content shown in the drawings, it can be seen from
[0061] that the turn-on test device further includes a stabilized DC power supply 31. Figure 2 Figure 3 The input end of the stabilized DC power supply 31 is connected with the power supply 21, and the output end of the stabilized DC power supply 31 is connected with the power supply interface (i.e., DC12V in the drawings) of the switching module 13.
[0062] The stabilized DC power supply 31 is configured to convert alternating current into direct current.
[0063] Specifically, the stabilized DC power supply 31 is used to supply power to the switching module 13.
[0064] In combination with the content shown in the drawings, it can be seen from
[0065] that the turn-on test device further includes a stabilized DC power supply 31. Figure 3 Figure 4 The continuity test device also includes: switch 41.
[0066] The communication control interface of the integrated instrument 12 is connected to the first communication interface of the switch 41.
[0067] Optionally, the communication control interface of the integrated instrument 12 is an RJ45 network port, and the first communication interface of the switch 41 is an RJ45 network port. Communication between the integrated instrument 12 and the switch 41 is achieved through the TCP protocol.
[0068] The communication interface of the switching module 13 is connected to the second communication interface of the switch 41.
[0069] The third communication interface of switch 41 is connected to host computer 11.
[0070] Optionally, the second and third communication interfaces of switch 41 are both RJ45 network ports.
[0071] In addition, the power interface of switch 41 is connected to power supply 21, so that power supply 21 supplies power to switch 41.
[0072] Specifically, the power interface of switch 41 is AC220V.
[0073] Combination Figure 4 For the content shown, please refer to [link / reference]. Figure 5 The switching module 13 includes a processing board 51, a motherboard 52, and a switching board 53.
[0074] The communication interface of the processing board 51 is connected to the host computer 11, and the processing board 51 is connected to the bus of the motherboard 52.
[0075] Specifically, the communication interface of the processing board 51 is the M12 network port.
[0076] The processing board 51 sends test commands to the switching board 53; the motherboard 52 is used to transmit signals between the processing board 51 and the switching board 53.
[0077] Understandably, the processing board 51 receives and parses the test commands sent by the host computer, and sends the test commands to the switching board 53 through the bus of the motherboard 52.
[0078] Specifically, the bus is the RS-485 internal communication bus.
[0079] It should be noted that the motherboard 52, as a routing bridging center for the chassis / cage, typically uses fixed connectors to fix other circuit boards to the motherboard 52, realizing signal routing (connecting signals from one place to another) for various circuit boards (such as the processing board 51 and the switching board 53). In other words, the motherboard 52 acts as a signal routing bridging center in the system, connecting other circuit boards together through fixed connectors to achieve signal transmission between them. Specifically, the motherboard 52 is responsible for transmitting signals from one location to another, playing a role in signal distribution and connection.
[0080] In addition, motherboard 52 can also import external interfaces into various circuit boards.
[0081] It should be noted that the signal routing design is integrated into the motherboard. After the switchboard is inserted, the signals are automatically routed and configured throughout the system, eliminating the need for manual patch cord connections at the front end. In other words, the built-in routing function of the motherboard enables automated signal transmission without the need for additional cable connections or manual settings.
[0082] Optionally, the processing board 51 is specifically an ARM processor, through which network and serial port resources are configured.
[0083] The bus of motherboard 52 is connected to switchboard 53, and switchboard 53 is connected to device under test 14.
[0084] The switching board 53 is used to perform tests according to test commands.
[0085] Optionally, the switching board 53 is a voltage-resistant relay.
[0086] Understandably, by selecting high-voltage, small-package, and low-cost relays, it is possible to achieve continuity and withstand voltage tests for large-capacity nodes while maintaining a low cost.
[0087] Specifically, the switching board 53 controls the relays according to the received test commands, thereby changing the routing path of the connection nodes and ultimately realizing the testing of the device under test. In other words, the switching board selects different test points by switching different connection paths, ensuring that various parts of the device can be tested.
[0088] In summary, the switching module integrates instrumentation and signal routing buses, so when expanding test nodes, new modules or devices can be directly inserted without additional setup, external adapter cables, or other tooling. This makes system expansion more convenient and faster, eliminating the need for complex additional configurations.
[0089] like Figure 6 The diagram shown is a flowchart of a continuity testing method for a device provided in an embodiment of this application. The method applies the above-described... Figures 1 to 5The on test device of any one of the devices shown comprises the following steps:
[0090] S601: sending an on test command to the switching module by the host computer.
[0091] The on test command comprises switching commands for short circuit test and open circuit test.
[0092] It can be understood that when the on test is performed, the host computer will translate the connectivity domain information and edit the switching commands for short circuit test and open circuit test, thereby generating the on command. If wiring errors (i.e. mixed wiring) occur during the test, the test will not be accurately performed because the results of the short circuit test or the open circuit test are inconsistent with the declared connectivity domain information, which may result in inaccurate test results or incorrect judgment of the state of the device.
[0093] It should be noted that when there are multiple devices under test, they need to be sorted to generate a sequence of devices under test, each device having a corresponding index. Then, the on test command is sent to the switching module by the host computer in the index order.
[0094] Optionally, before step S601, the state of the switching module needs to be checked to ensure that the switching module is in a normal working state before the on test is performed. If the state of the switching module is incorrect or has a fault, it may result in errors or inaccurate results during the on test. Therefore, in another embodiment of the present application, a checking method of the switching module is provided, comprising processes A1 to A3.
[0095] A1: sending a checking command to the switching module by the host computer.
[0096] The switching module comprises at least a switching board and a processing board.
[0097] Specifically, the checking command refers to a command for checking the state of the switching board.
[0098] A2: when the switching module receives the checking command, the state of the switching board is checked by the processing board to obtain a checking result.
[0099] The checking result comprises that the switching board is in a normal state or the switching board is in an abnormal state.
[0100] A3: sending the checking result to the host computer by the switching module.
[0101] S602: when the switching module receives the on test command, the switching signal routing of the device under test is processed by the switching module according to the on test command.
[0102] It can be understood that the switching module switches the routing of the signal according to the turn-on test command, so as to transmit the test signal to different devices under test. Specifically, the switching module is responsible for adjusting the transmission path of the signal according to the test instruction, and routing the signal to the corresponding device under test for turn-on test.
[0103] Specifically, usually in the turn-on test process, the content to be tested usually has an expected turn-on relationship, for example, a certain DB9 cable. See Table 1.
[0104] Table 1
[0105] Serial number Signal I Signal II 1 DB9.1-1 DB9.2-1 2 DB9.1-2 DB9.2-2 3 DB9.1-3, DB9.1-4 DB9.2-3, DB9.2-4 4 DB9.1-5 DB9.2-5 5 DB9.1-6 DB9.2-6 6 DB9.1-7 DB9.2-7
[0106] As can be seen from Table 1, according to the turn-on relationship, it can be divided into 6 connected domains, wherein the connected domain with serial number 3 has 4 nodes, and the rest are 2 nodes. When testing the short circuit relationship, the nodes in the connected domain 3 are tested 3 times, and the nodes in the remaining 5 connected domains are tested 1 time each. When testing the open circuit relationship, the nodes in the connected domains are tested 6 times each. A total of 14 times.
[0107] The above test scheme satisfies the following model scheme. For X nodes divided into n connected domains, assuming that each domain has y(n) nodes, then Σy(n)=X, and the number of short circuit test sequences in each domain is y(n)-1, and the number of open circuit test sequences between each domain is n, then the total test sequence number is Σ[y(n)-1]+n=Σy(n)-n+n=X.
[0108] In summary, according to the electrical connection relationship of the connected domain, the open and short circuit test is performed, and X nodes need to be tested X times regardless of the number of connected domains.
[0109] S603: After the signal routing is switched, impedance measurement is performed through the integrated instrument to obtain test data.
[0110] Optionally, the integrated instrument includes but is not limited to a multimeter and an insulation resistance tester.
[0111] It should be noted that in the turn-on test, the resistance value between different nodes is measured by using the resistance scale of the integrated instrument. The integrated instrument can accurately display the resistance value, and the test personnel can judge the turn-on state (i.e., whether the circuit is closed) according to the resistance value. At the same time, the virtual short and virtual open experience value is based on previous test experience or standard circuit design to help the test personnel judge whether the circuit is normally turned on according to the resistance value. Virtual short and virtual open are usually used to represent the state of some ideal conditions in the circuit, to help accurately judge the connection of the circuit.
[0112] S604: After the turn-on test command test is completed, the integrated instrument generates a test result based on the test data.
[0113] It can be understood that when there are multiple devices under test, it is judged whether the index of the device under test is the last index, if yes, the test result is generated based on all test data; if not, the turn-on test step is continued to be executed in the index order until the last device under test is tested.
[0114] S605: The test result is sent to the upper computer through the integrated instrument.
[0115] Optionally, the test result includes but is not limited to the resistance voltage and current measured by the multimeter, and the leakage current under high voltage excitation measured by the insulation withstand voltage meter.
[0116] It should be noted that based on the above-mentioned S601-S605 process, the embodiment can achieve the following beneficial effects:
[0117] 1. Only the node names and connection methods need to be declared, and the upper computer can automatically convert them into the node switching state sequence required for turn-on test, without manual editing.
[0118] 2. The turn-on test is mainly completed by using standard test instruments such as integrated instruments, and the switching module only provides a stable connection to ensure the reliability of the load state during the test. The test is essentially based on the resistance test principle of the integrated instrument, so this method is more reliable.
[0119] Each embodiment in the specification is described in a progressive manner, and each embodiment focuses on the difference from other embodiments. The same or similar parts of each embodiment can be referred to each other, and each embodiment focuses on the difference from other embodiments. Especially, for the system or system embodiment, since it is basically similar to the method embodiment, it is described more simply, and the related part can be referred to the part of the method embodiment. The above-described system and system embodiment are only illustrative, and the units described as separate components can be or can not be physically separated, and the components displayed as units can be or can not be physical units, that is, they can be located in one place, or can be distributed on multiple network units. According to the actual needs, part or all of the modules can be selected to achieve the purpose of the embodiment. Those skilled in the art can understand and implement without creative labor.
[0120] Those skilled in the art will further realize that the mechanisms of the various examples described herein are capable of being implemented using any number of combinations of the described features. Accordingly, these examples are not limited to the mechanisms described herein, but rather, the intent is to cover all modifications and alternatives equivalent thereto. The preceding description of the examples is illustrative, and not restrictive. Many other examples will be apparent to those of skill in the art upon reviewing the above description. The scope of the examples should, therefore, be determined not with reference to the above description, but instead should be given to the appended claims, along with their full scope of equivalents.
[0121] The above description of disclosed examples is intended to be illustrative, and not restrictive. Many other examples will be apparent to those of skill in the art upon reviewing the above description. The scope of examples should, therefore, be determined not with reference to the above description, but instead should be given to the appended claims, along with their full scope of equivalents.
Claims
1. A continuity testing device for a device, characterized in that, The continuity testing device includes: a host computer, an integrated instrument, and a switching module; The communication control interface of the integrated instrument is connected to the host computer; the host computer is used to generate test commands. The instrument interface of the switching module is connected to the multimeter test interface of the integrated instrument; the switching module is used to perform a continuity test on the device under test when a test command is received, and the integrated instrument is used to perform impedance measurement after receiving the test command. The communication interface of the switching module is connected to the host computer, and the switching module is connected to the device under test.
2. The apparatus according to claim 1, characterized in that, The device also includes a power supply; The power interface of the integrated instrument is connected to the power supply, and the power interface of the host computer is connected to the power supply.
3. The apparatus according to claim 2, characterized in that, The device also includes a regulated DC power supply; The input terminal of the regulated DC power supply is connected to the power source, and the output terminal of the regulated DC power supply is connected to the power interface of the switching module; the regulated DC power supply is used to convert AC power into DC power.
4. The apparatus according to claim 1, characterized in that, The device also includes a switch; The communication control interface of the integrated instrument is connected to the first communication interface of the switch; The communication interface of the switching module is connected to the second communication interface of the switch. The third communication interface of the switch is connected to the host computer.
5. The apparatus according to claim 1, characterized in that, The switching module includes: a processing board, a motherboard, and a switching board; The processing board's communication interface is connected to the host computer, and the processing board is connected to the motherboard via a bus; the processing board sends test commands to the switching board; the motherboard is used to transmit signals between the processing board and the switching board. The bus of the motherboard is connected to the switching board, and the switching board is connected to the device under test; the switching board is used to perform tests according to test commands.
6. The apparatus according to claim 5, characterized in that, The processing board is specifically an ARM processor.
7. The apparatus according to claim 5, characterized in that, The switching board is specifically a voltage-resistant relay.
8. The apparatus according to claim 1, characterized in that, The integrated instrument is specifically a multimeter.
9. A continuity test method for a device, characterized in that, A continuity testing apparatus for use with any of the devices described in claims 1 to 8, comprising: The host computer sends a continuity test command to the switching module; the continuity test command includes a switching command for short circuit test and open circuit test; When the switching module receives the continuity test command, it performs switching signal routing processing on the device under test according to the continuity test command. After the signal routing switch is completed, impedance measurement is performed using an integrated instrument to obtain test data; After the continuity test command is completed, the integrated instrument generates test results based on the test data. The test results are sent to the host computer via the integrated instrument.
10. The method according to claim 9, characterized in that, Before sending the continuity test command to the switching module via the host computer, the process also includes: The host computer sends a check command to the switching module; the switching module includes at least a switching board and a processing board. When the switching module receives the inspection command, it performs a status check on the switching board through the processing board and obtains the inspection result. The inspection results are sent to the host computer through the switching module.