Cooperative arm and environmental test box integrated device
By designing an integrated device that combines a collaborative arm with an environmental test chamber, the shortcomings of optical test chambers in terms of humidity and vibration loading are solved, enabling high-precision automated testing of electronic packaging structures, simplifying the debugging process, and improving testing efficiency.
Patent Information
- Application Number
- CN202511109736.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-08
- Publication Date
- 2025-11-28
AI Technical Summary
Existing optical test chambers cannot meet the humidity and vibration environment loading requirements of micro-interconnect structures, and the position adjustment of the specimen and the observation device is not accurate during optical measurement, resulting in a time-consuming and labor-intensive debugging process.
Design an integrated device combining a collaborative arm and an environmental test chamber, integrating a temperature and humidity control system, a vibration control system, and an optical measurement system to achieve automated loading of temperature, humidity, and vibration environments on electronic packaging structures, and to achieve high-precision optical measurement through the collaborative arm.
It enables reliability testing of electronic packaging structures, provides high-precision online observation and automated debugging, simplifies the testing process, and improves testing efficiency.
Smart Images
Figure CN121027648A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of online testing technology, specifically relating to an integrated device of a collaborative arm and an environmental test chamber. Background Technology
[0002] As instruments and equipment become increasingly miniaturized and high-density, the size of electronic packaging structures is also decreasing. Micro-interconnect structures are critical components of electronic devices and are key to ensuring overall reliability. According to statistics from the U.S. Air Force's avionics integrity research, the vast majority of electronic device failures are caused by environmental factors such as temperature, humidity, and vibration. Currently, common micro-interconnect structures have reached the millimeter scale. Taking BGA packages as an example, common solder ball diameters include 0.6mm and 0.8mm. Literature review shows that high-precision optical measurement technologies, represented by DIC (Digital Interconnect), can effectively meet the displacement and strain measurement requirements of micro-interconnect structures. To understand the displacement and strain of microstructures under various loads, research is needed on complex load simulation technologies suitable for optical measurement, and the development of complex load environment test chambers suitable for optical measurement is required. While test chambers suitable for optical measurement have been developed by institutions such as the University of Maryland, they only have temperature loading capabilities and cannot meet the environmental loading requirements for humidity and vibration. Furthermore, the optical measurement process requires high precision in adjusting the relative position of the specimen and the observation device, and manual adjustment is uncontrollable, making the debugging process time-consuming and labor-intensive. Summary of the Invention
[0003] The purpose of this invention is to solve the problems existing in the prior art. For the reliability research of electronic packaging structures, this invention provides an integrated device of collaborative arm and environmental test chamber, which combines collaborative arm technology with optical testing functions. It has the function of applying temperature, humidity and vibration environmental loads to the test piece and performing online high-precision automated observation, thus providing test means and technical support for the reliability research of electronic packaging structures.
[0004] This invention provides an integrated device for a collaborative arm and an environmental test chamber, comprising a temperature and humidity control system, a vibration control system, a collaborative arm system, and an optical measurement system. The integrated environmental chamber is a testing environment for electronic packaging structures, where temperature, humidity, and vibration stress are applied. The electronic packaging test piece is fixed using a specially designed clamp, which is fixed to a cylindrical platform at the bottom of the environmental chamber.
[0005] The environmental chamber is equipped with viewing windows on the top, front, and right sides. These windows are made of 300*300*4mm single-layer quartz glass with a light transmittance exceeding 90%. Two adjustable-brightness ultraviolet light sources and two adjustable-brightness white light sources are located outside the windows. This ensures a clear optical path from the LDV (Light Detection and Display) and micro-DIC (Distributed Indicator Microscope) instruments to the specimen during environmental loading. The LDV and micro-DIC instruments are connected to a 1.8m long collaborative arm with a repeatability accuracy within 0.04mm.
[0006] The beneficial effects of this invention are as follows:
[0007] 1. This invention is used for reliability testing of electronic packaging structures. By designing a mechanical test loading device, test fixture, and circuit board cutting equipment for circuit boards, it facilitates observation of the test and realizes the simulation loading of single / comprehensive environments such as temperature, humidity, and vibration of electronic packaging structures.
[0008] 2. This invention combines collaborative arm technology with optical testing capabilities, providing experimental methods and technical support for reliability research of electronic packaging structures. The collaborative arm is integrated with an environmental test chamber. Attached Figure Description
[0009] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.
[0010] Figure 1 This is an integrated device of a collaborative arm and an environmental test chamber according to an embodiment of the present invention. Detailed Implementation
[0011] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.
[0012] This embodiment provides an integrated device for a collaborative arm and an environmental test chamber, comprising a temperature and humidity control system, a vibration control system, a collaborative arm system, and an optical measurement system. Figure 1 As shown, the integrated environmental chamber is a testing environment for electronic packaging structures, where temperature, humidity, and vibration stresses are applied. The electronic packaging test pieces are fixed using specially designed fixtures, which are fixed to a cylindrical platform at the bottom of the environmental chamber.
[0013] The environmental chamber is equipped with viewing windows on the top, front, and right sides. These windows are made of 300*300*4mm single-layer quartz glass with a light transmittance exceeding 90%. Two adjustable-brightness ultraviolet light sources and two adjustable-brightness white light sources are located outside the windows. This ensures a clear optical path from the LDV (Light Detection and Display) and micro-DIC (Distributed Indicator Microscope) instruments to the specimen during environmental loading. The LDV and micro-DIC instruments can be connected to a 1.8m long collaborative arm with a repeatability accuracy within 0.04mm.
[0014] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. An integrated device for a collaborative arm and an environmental test chamber, characterized in that, The collaborative arm and environmental test chamber are integrated into one unit. The device includes a temperature and humidity control system, a vibration control system, a collaborative arm system, and an optical measurement system. The test specimen is fixed inside the environmental test chamber for reliability testing, and can apply environmental stresses such as temperature, humidity, and vibration.
2. The integrated device for a collaborative arm and an environmental test chamber according to claim 1, characterized in that, Viewing windows are installed on the top, front, and right sides of the environmental test chamber.
3. The integrated device for a collaborative arm and an environmental test chamber according to claim 2, characterized in that, Two adjustable ultraviolet light sources and two adjustable white light sources are installed outside the viewing window.
4. The integrated device for a collaborative arm and an environmental test chamber according to claim 1, characterized in that, The test specimen is fixed to a cylindrical platform at the bottom of the inner cavity of the environmental test chamber by a clamp.
5. The integrated device for a collaborative arm and an environmental test chamber according to claim 2, characterized in that, The viewing window is made of single-layer quartz glass with a light transmittance of over 90%.
6. The integrated device for a collaborative arm and an environmental test chamber according to claim 1, characterized in that, The optical instruments in the optical measurement system are connected to the cooperating arm.
7. The integrated device for a collaborative arm and an environmental test chamber according to claim 1, characterized in that, The collaborative arm is 1.8m long.
8. The integrated device for a collaborative arm and an environmental test chamber according to claim 1, characterized in that, The repeatability of the collaborative arm is less than 0.04 mm.