Test system capable of modulating attenuation and operation method thereof

Abstract

The invention provides a test system capable of modulating attenuation and an operation method thereof. The test system comprises an adjustable and variable attenuation circuit, a control circuit and a device under test (DUT). The tested device is connected to the adjustable attenuation circuit and the control circuit. The tested device comprises a transmitting end and a receiving end. The variable attenuation circuit has a variable impedance. When the device under test executes a built-in self-test (Built-in Self-Test, BIST), the device under test outputs test pattern data (Test Pattern) from a sending end. The device under test generates a determination result based on the test pattern data received from the receiving end. The control circuit receives the judgment result and generates and outputs an attenuation control signal to the adjustable attenuation circuit based on the judgment result. The variable attenuation circuit adjusts the variable impedance based on the attenuation control signal.

Description

Technical Field

[0001] This invention relates to a high-speed automated test equipment (ATE), and more particularly to an adjustable attenuation test system and its operating method. Background Technology

[0002] Current high-speed serial transmission circuits include various specifications, such as PCIe Gen 5 and USB 4.0, which use eye diagram packets of high-speed signals to transmit data. For example, USB 4.0 supports multiple specifications with various attenuations, meaning that USB 4.0 connectors can be used to connect a wide variety of peripheral devices. These peripheral devices also adjust their frequencies according to the applicable data bandwidth. Therefore, in high-speed transmission architectures, different frequencies will produce different attenuations, requiring adjustments to the production testing environment for different frequencies.

[0003] In semiconductor mass production, high-speed ATE (Automatic Test Equipment) environments are used. During testing, different electrical environments are required to accommodate varying attenuation levels. Current ATE testing environments employ fixed, precise designs to maintain reliable electrical conditions. However, this approach struggles to adapt to diverse attenuation requirements and necessitates repeated testing to verify the accuracy of results, consuming significant testing time. Summary of the Invention

[0004] In view of this, the present invention provides an adjustable attenuation test system and its operation method, which can adjust the attenuation capability by changing the resistance value of the circuit path to meet various test requirements.

[0005] The adjustable attenuation test system of the present invention includes an adjustable attenuation circuit, a control circuit, and a device under test (DUT). The DUT is connected to the adjustable attenuation circuit and the control circuit. The DUT includes a transmitting end and a receiving end. The adjustable attenuation circuit has a variable impedance. When the DUT performs a built-in self-test, the DUT outputs test pattern data from the transmitting end. The DUT generates a judgment result based on the test pattern data received from the receiving end. The control circuit receives the judgment result and generates and outputs an attenuation control signal to the adjustable attenuation circuit based on the judgment result. The adjustable attenuation circuit adjusts the variable impedance based on the attenuation control signal.

[0006] The operation method of the adjustable attenuation test system of the present invention includes: when the device under test performs a built-in self-test, outputting test pattern data from the transmitting end of the device under test; generating a judgment result based on the test pattern data received from the receiving end of the device under test; receiving the judgment result through a control circuit, and generating and outputting an attenuation control signal to the adjustable attenuation circuit based on the judgment result; and adjusting the variable impedance through the adjustable attenuation circuit based on the attenuation control signal.

[0007] Based on the above, the adjustable attenuation test system and its operation method provided by this invention can generate a judgment result based on the received test pattern data using a self-lookback mechanism, thereby determining whether it is necessary to adjust the variable impedance of the adjustable attenuation circuit. Accordingly, the adjustable attenuation test system and its operation method provided by this invention can adapt to the attenuation requirements of different devices under test by adjusting the variable impedance, thus providing a reliable electrical testing environment.

[0008] To make the above features and advantages of the present invention more apparent and understandable, specific embodiments are described below in conjunction with the accompanying drawings. Attached Figure Description

[0009] The above-described features, other objects, and advantages of the present invention will become clearer from the following description of embodiments of the invention with reference to the accompanying drawings, in which:

[0010] Figure 1 A schematic diagram of a test system with adjustable attenuation according to an embodiment of the present invention is shown.

[0011] Figure 2 This diagram illustrates an adjustable T-type attenuator according to an embodiment of the present invention.

[0012] Figure 3 A schematic diagram of an adjustable attenuation circuit according to an embodiment of the present invention is shown.

[0013] Figure 4 A schematic diagram of an adjustable attenuation circuit according to another embodiment of the present invention is shown;

[0014] Figure 5 A flowchart illustrating the operation method of an adjustable attenuation test system according to an embodiment of the present invention is shown. Detailed Implementation

[0015] Reference will now be made in detail to exemplary embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same element symbols are used in the drawings and description to denote the same or similar parts.

[0016] Figure 1 A schematic diagram of a test system with adjustable attenuation according to an embodiment of the present invention is shown. Figure 2 This diagram illustrates an adjustable T-type attenuator according to an embodiment of the present invention. Please refer to... Figure 1 and Figure 2The test system 100 includes a device under test (DUT) 110, a control circuit 120, and an adjustable attenuation circuit 130. The DUT 110 includes a transmitter 111 and a receiver 112. The DUT 110 is connected to the control circuit 120 and the adjustable attenuation circuit 130. The control circuit 120 may be, for example, any programmable digital circuit well known to those skilled in the art. The adjustable attenuation circuit 130 is connected to ground (GND). The adjustable attenuation circuit 130 has a variable impedance (Zp).

[0017] In this embodiment, the adjustable attenuation circuit 130, signal input terminal E1, and signal output terminal E2 constitute an adjustable T-type attenuator 200. The adjustable T-type attenuator 200 may, for example, be disposed on a substrate B. The substrate B may, for example, be a circuit board with characteristic impedance Z0 or various types of low-loss board materials with characteristic impedance Z0. The signal input terminal E1 is connected to the transmitting terminal 111 of the device under test 110, and the signal output terminal E2 is connected to the receiving terminal 112 of the device under test 110.

[0018] Generally, known T-type attenuators use fixed resistance values, making it difficult to meet various attenuation requirements. Furthermore, since high-speed signal transmission is easily affected by parasitic capacitance and inductance effects in the transmission circuit, this invention provides an adjustable T-type attenuator 200. The adjustable T-type attenuator 200 utilizes the characteristic impedance Z0 of the substrate B to replace the impedance at both ends of a known T-type attenuator, eliminating the need for additional resistors at both ends as in known T-type attenuators, thus reducing the complexity of the adjustable T-type attenuator 200. In addition, the adjustable T-type attenuator 200 of this invention can also meet the attenuation requirements of various devices under test 110 through the adjustable impedance Zp of the adjustable attenuation circuit 130, providing a diverse and reliable electrical testing environment.

[0019] When the device under test (DUT) 110 performs a built-in self-test (BIST), the DUT 110 can output test pattern data PT from the transmitter 111. In this embodiment, the test pattern data PT can be transmitted to the receiver 112 of the DUT 110 via the signal input terminal E1 and the signal output terminal E2. That is, the DUT 110 outputs and receives the test pattern data PT through a self-backtracking reception mechanism under high-speed signal transmission. During the transmission process from the transmitter 111 to the receiver 112, the test pattern data PT undergoes modulation by the characteristic impedance Z0 and the variable impedance Zp.

[0020] The device under test (DUT) 110 can generate a judgment result R based on the test pattern data PT received from the receiver 112. Specifically, the DUT 110 can determine whether the test pattern data PT received from the receiver 112, after being modulated by the characteristic impedance Z0 and the variable impedance Zp, is acceptable or unacceptable, and generate and output the judgment result R to the control circuit 120. For example, if the test pattern data PT after being modulated by the characteristic impedance Z0 and the variable impedance Zp is acceptable, it means that the attenuation of the current test environment meets the requirements of the DUT 110. For example, if the test pattern data PT after being modulated by the characteristic impedance Z0 and the variable impedance Zp is unacceptable, it means that the attenuation of the current test environment does not meet the requirements of the DUT 110. Therefore, the variable impedance Zp of the adjustable attenuation circuit 130 needs to be adjusted to facilitate subsequent test operations.

[0021] The control circuit 120 can receive the judgment result R and generate an attenuation control signal CON based on the judgment result R to the adjustable attenuation circuit 130. In this embodiment, the judgment result R is used to indicate whether the control circuit 120 needs to further adjust the variable impedance Zp of the adjustable attenuation circuit 130 and / or the required value (or range) of the variable impedance Zp. The control circuit 120 can generate the attenuation control signal CON based on the judgment result R to control the adjustable attenuation circuit 130 to adjust the variable impedance Zp.

[0022] The adjustable attenuation circuit 130 can adjust the variable impedance Zp based on the attenuation control signal CON. Specifically, Figure 3 The diagram shows an adjustable attenuation circuit according to an embodiment of the present invention. Please refer to [the diagram]. Figures 1 to 3 In this embodiment, the adjustable attenuation circuit 130 includes multiple resistors R1~RN and multiple switches GATE_1~GATE_N. Switches GATE_1~GATE_N are connected in series with resistors R1~RN respectively.

[0023] The switches GATE_1 to GATE_N can be, for example, any form of microelectromechanical system (MEMS) switch known to those skilled in the art. Similarly, the resistors R1 to RN can be, for example, any form of miniature resistor known to those skilled in the art.

[0024] Switches GATE_1 to GATE_N can be turned on or off respectively based on the attenuation control signal CON. In this embodiment, resistors R1 to RN differ by orders of magnitude from each other; for example, resistor R1 has a resistance of 0.1 MΩ, resistor R2 has a resistance of 1 MΩ, resistor R3 has a resistance of 10 MΩ, and resistor RN has a resistance of 100 MΩ. The adjustable attenuation circuit 130 can adjust the variable impedance Zp of the adjustable attenuation circuit 130 by turning on at least one of switches GATE_1 to GATE_N based on the attenuation control signal CON.

[0025] In this way, the adjustable T-type attenuator 200 of the present invention can adjust the variable impedance Zp based on the attenuation control signal CON to meet the attenuation requirements of various devices under test 110 and provide a reliable electrical test environment.

[0026] In addition, the test system 100 of the present invention can also avoid parasitic capacitance caused by the external environment by reducing the size of components (i.e., using microelectromechanical switches GATE_1~GATE_N and miniature resistors R1~RN), so as to eliminate electrical interference to the greatest extent.

[0027] In one embodiment, the adjustable attenuation circuit 130 may also be as follows: Figure 4 As shown, Figure 4 A schematic diagram of an adjustable attenuation circuit according to another embodiment of the present invention is shown. Please refer to... Figure 1 and Figure 4 In this embodiment, the adjustable attenuation circuit 130 includes multiple resistors R1~RN and multiple switches GATE_1~GATE_N. Switches GATE_1~GATE_N are connected in parallel with resistors R1~RN respectively.

[0028] Switches GATE_1 to GATE_N can be turned on or off respectively based on the attenuation control signal CON. Specifically, the adjustable attenuation circuit 130 can turn on at least one of the switches GATE_1 to GATE_N based on the attenuation control signal CON to adjust the variable impedance Zp of the adjustable attenuation circuit 130 to meet the attenuation requirements of various devices under test 110.

[0029] The various micro-components in the adjustable attenuation circuit 130 can be connected, for example, in series and / or in parallel, to provide a variety of different attenuation levels.

[0030] Figure 5 This diagram illustrates a flowchart of an operation method for an adjustable attenuation test system according to an embodiment of the present invention. The operation method of this embodiment can be... Figure 1 The test system 100 was executed. Please refer to... Figure 1 and Figure 5In step S501, when the device under test 110 performs its built-in self-test, it outputs test pattern data PT from its transmitter 111. In step S502, the device under test 110 generates a judgment result R based on the test pattern data PT received from its receiver 112. In step S503, the control circuit 120 receives the judgment result R and generates an attenuation control signal CON based on the judgment result R, which is sent to the adjustable attenuation circuit 130. In step S504, the adjustable attenuation circuit 130 adjusts the variable impedance Zp based on the attenuation control signal CON.

[0031] The implementation details of steps S501 to S504 have been described in detail in the foregoing embodiments, and therefore will not be repeated here.

[0032] In summary, the adjustable attenuation test system and its operating method provided by this invention can utilize the characteristic impedance of the substrate to replace the impedance at both ends of a known T-type attenuator, and complete the variable impedance adjustment through a self-feedback circuit design to meet the attenuation requirements of various devices under test, providing a reliable electrical testing environment. Furthermore, the adjustable attenuation test system and its operating method provided by this invention can also avoid the influence of parasitic capacitance and inductance effects caused by the external environment by reducing component size (i.e., using microelectromechanical switches and miniature resistors), thereby minimizing electrical interference.

[0033] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test system for adjustable attenuation, characterized in that, include: Adjustable attenuation circuit with variable impedance; Control circuit; as well as The device under test is connected to the adjustable attenuation circuit and the control circuit. The device under test includes: Sending end; as well as The receiving end, among which When the device under test (DUT) performs its built-in self-test, the DUT outputs test pattern data from the transmitting end, and generates a judgment result based on the test pattern data received from the receiving end. The control circuit receives the judgment result, and generates and outputs an attenuation control signal to the adjustable attenuation circuit based on the judgment result. The adjustable attenuation circuit adjusts the variable impedance based on the attenuation control signal.

2. The adjustable attenuation test system according to claim 1, characterized in that, The adjustable attenuation circuit, together with the signal input terminal and the signal output terminal, forms an adjustable T-type attenuator. The signal input terminal is connected to the transmitting terminal, and the signal output terminal is connected to the receiving terminal.

3. The adjustable attenuation test system according to claim 2, characterized in that, The adjustable T-type attenuator is disposed on a substrate having characteristic impedance.

4. The adjustable attenuation test system according to claim 1, characterized in that, The adjustable attenuation circuit includes: Multiple resistors; and Multiple switches are connected in series with the multiple resistors, and the multiple switches are respectively turned on or off based on the attenuation control signal.

5. The adjustable attenuation test system according to claim 1, characterized in that, The adjustable attenuation circuit includes: Multiple resistors; and Multiple switches are connected in parallel with the multiple resistors, and the multiple switches are respectively turned on or off based on the attenuation control signal.

6. The adjustable attenuation test system according to claim 4 or 5, characterized in that, The multiple switches are microelectromechanical systems (MEMS) switches.

7. The adjustable attenuation test system according to claim 4 or 5, characterized in that, The plurality of resistors are miniature resistors, and the plurality of resistors differ from each other by orders of magnitude.

8. The adjustable attenuation test system according to claim 4 or 5, characterized in that, The adjustable attenuation circuit, based on the attenuation control signal, turns on at least one of the plurality of switches to adjust the variable impedance of the adjustable attenuation circuit.

9. A method for operating a test system with adjustable attenuation, characterized in that, include: When the device under test performs a built-in self-test, test pattern data is output through the self-transmitter of the device under test. The device under test generates a judgment result based on the test pattern data received from the receiving end. The control circuit receives the judgment result and generates and outputs an attenuation control signal to the adjustable attenuation circuit based on the judgment result. as well as The adjustable attenuation circuit adjusts the variable impedance based on the attenuation control signal.

10. The operating method according to claim 9, characterized in that, The step of adjusting the variable impedance based on the attenuation control signal includes: The variable impedance of the adjustable attenuation circuit is adjusted by turning on at least one of a plurality of switches in the adjustable attenuation circuit based on the attenuation control signal.

Images