Multi-dimensional verification method and device for DPS board card and medium

Abstract

The invention discloses a multi-dimensional verification method and device for a DPS board card and a medium, and is applied to the field of integrated circuit verification. The method comprises the following steps: acquiring multi-dimensional parameters output by the DPS board card under different programs and / or different configuration parameters; judging whether each dimension parameter in the multi-dimension parameters meets a corresponding setting standard or not, and generating a comprehensive report according to a judgment result; obtaining corresponding dimension parameters which do not conform to the setting standard in the comprehensive report, and determining a corresponding verification result grade according to the corresponding dimension parameters which do not conform to the setting standard; and determining a DPS board card design optimization suggestion corresponding to the verification result grade based on an optimization standard so as to construct the DPS board card according to the optimized DPS board card design requirements. According to the method, by obtaining multi-dimensional parameters, comprehensive verification of the DPS board card is achieved, and the performance and stability of the board card are evaluated; in addition, optimization suggestions are provided, and powerful support is provided for design optimization and quality assurance of the DPS board card.

Description

Technical Field

[0001] This application relates to the field of integrated circuit verification, and in particular to a multi-dimensional verification method, device and medium for DPS boards. Background Technology

[0002] With the continuous expansion of integrated circuit design scale and the increasing complexity of devices, the role of testing systems in product development and mass production is becoming increasingly critical. As one of the core functional modules of automated test equipment, the DPS (Device Power Supply / System) board is responsible for providing stable and controllable power and measurement functions to the device under test (DUT) during the testing process, and its performance directly affects the accuracy and reliability of the test results.

[0003] However, due to the diversity of test objects and the complexity of application scenarios, single-dimensional verification methods are often insufficient to comprehensively evaluate the performance and stability of DPS boards. Traditional DPS verification methods mostly focus on basic measurement indicators such as voltage and current, lacking a systematic examination of dynamic response characteristics, long-term stability, and boundary operating conditions. This may not only lead to potential software and hardware vulnerabilities being exposed during mass production, but also reduce the overall efficiency of the testing platform.

[0004] Given the aforementioned technologies, finding a systematic verification method for DPS that covers multiple dimensions and scenarios is an urgent problem for those skilled in the art to solve. Summary of the Invention

[0005] The purpose of this application is to provide a multi-dimensional verification method, device, and medium for DPS boards. This addresses the problem that existing single-dimensional verification methods are often insufficient to comprehensively evaluate the performance and stability of DPS boards, leading to potential software and hardware vulnerabilities being exposed during mass production and reducing the overall efficiency of the testing platform.

[0006] To address the aforementioned technical problems, this application provides a multi-dimensional verification method for DPS boards, including:

[0007] Obtain multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters. These multi-dimensional parameters include current and voltage parameters, resolution parameters, output capability parameters, scanning parameters, and API interface capability parameters.

[0008] Determine whether each dimension parameter in the multi-dimensional parameters meets the corresponding setting criteria, and generate a comprehensive report based on the determination results;

[0009] acquire each dimension parameter corresponding to the non-compliance setting standard in the comprehensive report, and determine the corresponding verification result level according to the dimension parameter corresponding to the non-compliance setting standard;

[0010] Determine the DPS board card design optimization suggestion corresponding to the verification result level based on the optimization standard, so as to construct the DPS board card according to the optimized DPS board card design requirement.

[0011] Preferably, the current-voltage dimension parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including:

[0012] Acquire the forced voltage output by the DPS board card under the current-voltage detection program corresponding to the current-voltage dimension parameter issued by the upper computer;

[0013] Under the current-voltage detection program and the forced voltage, the single-point current sampling mode and the multi-point current sampling mode are used to acquire a plurality of initial forced currents output by the DPS board card, so as to construct the forced current according to the plurality of initial forced currents; wherein the forced voltage and the forced current both constitute the current-voltage dimension parameter.

[0014] Preferably, whether the current-voltage dimension parameter meets the corresponding setting standard is judged, including:

[0015] When the current-voltage dimension parameter is the forced voltage, it is judged whether the forced voltage is within the voltage accuracy range, if the forced voltage is within the voltage accuracy range, the forced voltage in the current-voltage dimension parameter meets the corresponding setting standard, if the forced voltage is outside the voltage accuracy range, the forced voltage in the current-voltage dimension parameter does not meet the corresponding setting standard;

[0016] When the current-voltage dimension parameter is the forced current, it is judged whether the forced current difference corresponding to each group of initial forced currents in the forced current is within the current accuracy range, if each forced current difference is within the current accuracy range, the forced current in the current-voltage dimension parameter meets the corresponding setting standard, if any one of the forced current differences is outside the current accuracy range, the forced current in the current-voltage dimension parameter does not meet the corresponding setting standard.

[0017] Preferably, the resolution dimension parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including:

[0018] Acquire two voltage resolutions output by the DPS board card under the resolution detection program corresponding to the resolution dimension parameter issued by the upper computer and two different forced voltages;

[0019] The single-point current sampling mode and the multi-point current sampling mode are used to obtain a plurality of initial current resolutions output by the DPS board card under a resolution detection procedure of the DPS board card, so as to construct the current resolution according to the plurality of initial current resolutions; and the voltage resolution and the current resolution constitute the resolution dimension parameter.

[0020] Preferably, the judgment of whether the resolution dimension parameter meets the corresponding setting standard comprises:

[0021] When the resolution dimension parameter is the voltage resolution, a voltage resolution difference of the two voltage resolutions is obtained, and if the voltage resolution difference is within the voltage resolution accuracy range, the voltage resolution in the resolution dimension parameter meets the corresponding setting standard;

[0022] When the resolution dimension parameter is the current resolution, average current resolutions of each group of initial current resolutions collected under the single-point current sampling mode and the multi-point current sampling mode are obtained respectively, and if a difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within the current resolution accuracy range, the current resolution in the resolution dimension parameter meets the corresponding setting standard, and if the difference between the average current resolution corresponding to any one single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, the current resolution in the resolution dimension parameter does not meet the corresponding setting standard.

[0023] Preferably, the output capability dimension parameter output by the DPS board card under different procedures and / or different configuration parameters is obtained, comprising:

[0024] The voltage parameter group and the current parameter group constituting the output capability dimension parameter are obtained, which are output by the DPS board card under an output capability detection procedure corresponding to the output capability dimension parameter issued by the upper computer;

[0025] Correspondingly, the judgment of whether the output capability dimension parameter meets the corresponding setting standard comprises:

[0026] The current parameters corresponding to the voltage parameters in the current parameter group are determined respectively;

[0027] It is judged whether each group of voltage parameters and the corresponding current parameters are within the capability fluctuation accuracy range;

[0028] If each group of voltage parameters and the corresponding current parameters are within the capability fluctuation accuracy range, the output capability dimension parameter meets the corresponding setting standard;

[0029] If any one group of voltage parameters and the corresponding current parameters are outside the capability fluctuation accuracy range, the output capability dimension parameter does not meet the corresponding setting standard.

[0030] Preferably, the method comprises the following steps of:

[0031] The method comprises the following steps of:

[0032] Correspondingly, the method comprises the following steps of:

[0033] The method comprises the following steps of:

[0034] If all the measurement currents are within the scanning current accuracy range, the scanning dimension parameter meets the corresponding setting standard.

[0035] If any one of the measurement currents is outside the scanning current accuracy range, the scanning dimension parameter does not meet the corresponding setting standard.

[0036] Preferably, the method comprises the following steps of:

[0037] The method comprises the following steps of:

[0038] Correspondingly, the method comprises the following steps of:

[0039] The method comprises the following steps of:

[0040] If all the continuous issuing times are less than the issuing threshold, the API interface capability dimension parameter meets the corresponding setting standard.

[0041] If any one of the continuous issuing times is not less than the issuing threshold, the API interface capability dimension parameter does not meet the corresponding setting standard.

[0042] On the other hand, the application also provides an electronic device comprising a memory for storing a computer program.

[0043] A processor is configured to execute the computer program to implement the steps of the multi-dimension verification method of the DPS board card.

[0044] In another aspect, the present application also provides a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the multi-dimension verification method of the DPS board card.

[0045] The multi-dimension verification method of the DPS board card provided by the present application, in which multi-dimension parameters output by the DPS board card under different programs and / or different configuration parameters are acquired, so as to comprehensively verify the multi-dimension of the DPS board card, so as to comprehensively evaluate the performance and stability of the DPS board card. In the multi-dimension verification method provided by the present application, optimization suggestions are also provided for each dimension parameter that does not meet the corresponding set standard, so as to realize a closed loop of multi-dimension verification-analysis-feedback optimization, thereby providing strong support for the design optimization and quality assurance of the DPS board card. BRIEF DESCRIPTION OF DRAWINGS

[0046] In order to more clearly illustrate the embodiments of the present application, the drawings required to be used in the embodiments will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0047] Figure 1 A flow chart of the multi-dimension verification method of the DPS board card provided by the embodiments of the present application;

[0048] Figure 2 An interaction function diagram corresponding to the system architecture provided by the embodiments of the present application;

[0049] Figure 3 A structure diagram of the electronic device provided by another embodiment of the present application. DETAILED DESCRIPTION

[0050] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the protection scope of the present application.

[0051] The core of the present application is to provide a multi-dimension verification method, device and medium of a DPS board card.

[0052] In order to enable those skilled in the art to better understand the present application, the present application will be further described in detail in combination with the drawings and specific embodiments.

[0053] Figure 1A flowchart of a multi-dimension verification method of a DPS board card provided by an embodiment of the present application is shown in Figure 1 , and includes the following processes:

[0054] S10: Obtain multi-dimension parameters output by the DPS board card under different programs and / or different configuration parameters, wherein the multi-dimension parameters include current-voltage dimension parameters, resolution dimension parameters, output capacity dimension parameters, scanning dimension parameters, and API interface capacity dimension parameters.

[0055] S11: Determine whether each dimension parameter in the multi-dimension parameters meets a corresponding setting standard, and generate a comprehensive report according to the determination result.

[0056] S12: Obtain each dimension parameter that does not meet the setting standard in the comprehensive report, and determine a corresponding verification result level according to the dimension parameter that does not meet the setting standard.

[0057] S13: Determine a DPS board card design optimization suggestion corresponding to the verification result level based on an optimization standard, so as to construct a DPS board card according to the optimized DPS board card design requirement.

[0058] In a specific embodiment, the multi-dimension verification method of the DPS board card provided by the present application is specifically applied to a system architecture of software and hardware collaboration. The architecture is composed of two parts of hardware layer and software layer, forming a closed-loop verification system covering “test execution-result collection-data analysis-feedback optimization”. The connection relationship between each level is as follows: the software layer is responsible for strategy and scheduling (process / data management); the DSP (Device Power Supply) is responsible for high-speed real-time calculation and control; the load module is an interface and environment simulator of the measured object; the automatic test equipment (ATE) unifies each part as a platform to ensure timing, communication and synchronization. The DPS board card interfaces with the ATE as a measured object, the DPS is connected with the ATE system through a standardized interface, and supports input and output of multiple channel signals such as voltage, current, and protection mechanism. The load module is used to simulate the power load characteristics under different working conditions, and verify the performance of the DPS under dynamic and extreme conditions. The software layer test management module is responsible for the configuration and scheduling of the test plan, including the selection of multi-dimension test cases, the control of execution order and the handling of abnormal situations. The specific interaction function is shown in Figure 2 , where the PC end refers to the software part of the ATE, which includes multiple CMD (command line); the DPS end refers to the DPS board card, which includes multiple DUT (Device Under Test, measured device), and the two are connected through command strings (Command) and return strings (show) for data interaction, transmission, etc.

[0059] In a specific implementation, the preliminary preparation work is as follows:

[0060] 1. First, obtain the safety range of various books output by the DPS board card.

[0061] 2. DPS board card information function analysis. Multi-channel parallel: synchronous triggering, time alignment, cross-card synchronization (external triggering / backplane clock); automatic range switching (Auto Range) and integral sampling (NPLC / average); four-wire Kelvin measurement (optional Relay Matrix); DUT protection: soft start (Slew limit), soft turn-off, surge / surge suppression; read back: actual output voltage, current read back (closed-loop diagnosis).

[0062] 3. Software and interface state monitoring. Host computer API: programming language (C / C++ & Python) binding; provide command sequences (such as SET_V, MEAS_I, SWEEP_V, RANGE_AUTO, CAL*); Pattern integration: provide TPAT / PatternHook (Hook Method in Template Method Pattern) and hardware triggering (TRIG-IN / OUT); data channel: DMA (Direct Memory Access) / PCIe (Peripheral Component Interconnect Express) or Gigabit Ethernet to the host.

[0063] In practical applications, the programming language C++ is suitable for developing such test and verification programs due to its high performance, low occupancy, and extensive support library.

[0064] 4. The system supports users to configure code through the application end and send test instructions, and the server sets parameters, task allocation, and other operations on the DPS board card equipment according to the instructions. At the same time, the application end also has task calling function, according to the code definition, resistance allocation, calling scanning resistance test under different ranges, measuring related results, and scheduling related API (Application Programming Interface) according to test requirements and board card equipment state, verifying the required test task.

[0065] 5. The system log library will store board card information and test data to ensure data integrity and consistency. At the same time, the system also provides data backup and recovery functions, regularly backing up data in the log library to designated storage media to prevent data loss or damage.

[0066] In summary, it can be understood as two parts, one part is system deployment, and the other part is output management. For system deployment, before the system deployment, the corresponding hardware environment and software environment need to be prepared, the hardware environment includes test machine DPS board card, network equipment, source table (Source Measure Unit, SMU) and digital multimeter; the software environment includes ubuntu operating system and necessary development library. When deploying, each component needs to be installed to the specified location according to the system architecture and configuration requirements, and necessary configuration and optimization are needed. At the same time, it is also necessary to ensure the network connectivity and security of the system, to avoid potential security risks. The DPS board card device runs UDPServer (the server program / object based on UDP protocol (User Datagram Protocol)), uses the network port and network cable to connect the PC, ensures that the DPS and PC are in the same network segment, can ping the relevant gateway address, tests whether the communication is successful, and when the DPS board card recognizes a specific signal, it will send its own board card information to the PC end.

[0067] For output management, the results measured by the DPS board card need to be analyzed and compared. The DPS board card measurement result output includes: DUT information, Measure_points (a measure point definition), interval_time (us) (the minimum idle time forced to leave between two consecutive measurements), Expect_Measure_Current (mA) (the current value that we expect to read at this measure point), Actual_Measure_Current (mA) (the current value actually sampled back by the instrument at this measure point), Diff (uA) (the difference between Actual_Measure_Current and Expect_Measure_Current), Measure_result (the final "conclusion record" given after "sending command-reading actual measurement-calculating Diff-judging limit" for a measure point), etc.; through outputting the specified directory into an excel table, the data is further processed, including result analysis, problem tracking, system optimization, code implementation, and improving the accuracy of the DPS board card verification method.

[0068] In a specific step of multi-dimensionally analyzing and verifying the parameters output by the DPS board card, multi-dimension parameters output by the DPS board card under different programs and / or different configuration parameters are acquired, wherein the multi-dimension parameters include current-voltage dimension parameters, resolution dimension parameters, output capacity dimension parameters, scanning dimension parameters, and API interface capacity dimension parameters. It should be noted that these dimension parameters provided in the present application are the minimum, and can be added as needed. Then, it is determined whether each dimension parameter in the multi-dimension parameters meets the corresponding setting standard, and a comprehensive report is generated according to the determination result. It should be noted that the multi-dimensionally verifying the DPS board card does not ultimately result in a "good" or "bad" standard, but a comprehensive report in which the specific values of each dimension parameter are described, and then it can be determined which dimension parameters meet the setting standard and which dimension parameters do not meet the setting standard based on the setting standard (which can also be understood as the safe use standard) of each dimension parameter itself. The corresponding verification result level can be obtained by comprehensively analyzing the dimension parameters that do not meet the setting standard. For example, when three dimension parameters do not meet the corresponding setting standard, the current verification result is level one; when five dimension parameters do not meet the corresponding setting standard, the current verification result is level two, and so on. After obtaining the verification result level, the DPS board card design optimization suggestion corresponding to the verification result level is determined based on the optimization standard, so that the final DPS board card can be obtained by referring to the optimization suggestion in the subsequent process of designing the DPS board card.

[0069] The multi-dimension verification method of the DPS board card provided in the present application includes: acquiring multi-dimension parameters output by the DPS board card under different programs and / or different configuration parameters, wherein the multi-dimension parameters include current-voltage dimension parameters, resolution dimension parameters, output capacity dimension parameters, scanning dimension parameters, and API interface capacity dimension parameters; determining whether each dimension parameter in the multi-dimension parameters meets the corresponding setting standard, and generating a comprehensive report according to the determination result; acquiring each dimension parameter that does not meet the corresponding setting standard in the comprehensive report, and determining the corresponding verification result level according to the dimension parameter that does not meet the setting standard; determining the DPS board card design optimization suggestion corresponding to the verification result level based on the optimization standard, so as to construct the DPS board card according to the optimized DPS board card design requirement. In the method, the multi-dimension parameters output by the DPS board card under different programs and / or different configuration parameters are acquired, so that the multi-dimension comprehensive verification of the DPS board card is realized, so as to comprehensively evaluate the performance and stability of the DPS board card. Moreover, the multi-dimension verification method provided in the present application also provides optimization suggestions for each dimension parameter that does not meet the setting standard, realizes the closed loop of multi-dimension verification-analysis-feedback optimization, and thus provides strong support for the design optimization and quality assurance of the DPS board card.

[0070] In the above embodiments, if the multi-dimensional parameter is a current-voltage dimensional parameter, the current-voltage dimensional parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including:

[0071] The forced voltage output by the DPS board card under the current-voltage detection program corresponding to the current-voltage dimensional parameter issued by the upper computer is acquired.

[0072] Under the current-voltage detection program and the forced voltage, a single-point current sampling mode and a multi-point current sampling mode are used to acquire a plurality of groups of initial forced currents output by the DPS board card, so as to construct a forced current according to the plurality of groups of initial forced currents. The forced voltage and the forced current both constitute the current-voltage dimensional parameter.

[0073] Correspondingly, whether the current-voltage dimensional parameter meets the corresponding setting standard is determined, including:

[0074] When the current-voltage dimensional parameter is the forced voltage, it is determined whether the forced voltage is within the voltage accuracy range. If the forced voltage is within the voltage accuracy range, the forced voltage in the current-voltage dimensional parameter meets the corresponding setting standard. If the forced voltage is outside the voltage accuracy range, the forced voltage in the current-voltage dimensional parameter does not meet the corresponding setting standard.

[0075] When the current-voltage dimensional parameter is the forced current, it is determined whether the forced current difference corresponding to each group of initial forced currents in the forced current is within the current accuracy range. If each forced current difference is within the current accuracy range, the forced current in the current-voltage dimensional parameter meets the corresponding setting standard. If any one of the forced current differences is outside the current accuracy range, the forced current in the current-voltage dimensional parameter does not meet the corresponding setting standard.

[0076] In specific embodiments, for the forced voltage, the DPS board card is used as a hardware interface to output the forced voltage (Force Voltage range) after being issued under the corresponding program. The SMU (Source Measure Unit, source measurement unit) measuring instrument is used to measure whether the forced voltage issued by the DPS is within the Spec (Specification, specification) accuracy range (0V~4V±(1%)), and a comparison is made on the client side to determine whether it meets or does not meet. For example, the Force Voltage range output by the DPS is 4V, but the SMU measurement result is 3.865V, which is within 0V~4V±(1%), and it is determined to meet.

[0077] In a specific embodiment, for the forced current (Current measure range), the DUT on the DPS board card to be tested is selected, the SMU is used to measure the current based on the Force Voltage range output by the DPS board card, two kinds of API (Application Programming Interface, application programming interface) are used to measure, i.e., the instruction (SML_MEAS_DPS) is used to sample once with an interval of 0 us and the instruction (SML_MEAS_DPS2) is used to sample 1000 times with an interval of 15 us each time, the measured current result needs to run the program for 10 cycles, and each measurement result is compared with the expected result to analyze whether it is within the spec accuracy range. When the Current measure range is ±1 mA, the current accuracy range is ±(0.2%+1.5uA); when the Current measure range is ±400 mA, the current accuracy range is ±(2%+2mA). Different ranges are judged based on different ranges.

[0078] In the above embodiment, if the multi-dimensional parameter is a resolution dimension parameter, the resolution dimension parameter output by the DPS board card under different programs and / or different configuration parameters is obtained, including:

[0079] The two voltage resolutions output by the DPS board card under the resolution detection program corresponding to the resolution dimension parameter issued by the host computer and under two different forced voltages are obtained.

[0080] Under the resolution detection program received by the DPS board card, a single-point current sampling method and a multi-point current sampling method are used to obtain a plurality of groups of initial current resolutions output by the DPS board card, so as to construct a current resolution according to the plurality of groups of initial current resolutions; wherein the voltage resolution and the current resolution constitute the resolution dimension parameter.

[0081] Correspondingly, whether the resolution dimension parameter meets the corresponding setting standard is judged, including:

[0082] When the resolution dimension parameter is a voltage resolution, the voltage resolution difference of the two voltage resolutions is obtained, and if the voltage resolution difference is within the voltage resolution accuracy range, the voltage resolution in the resolution dimension parameter meets the corresponding setting standard.

[0083] When the resolution dimension parameter is the current resolution, the average current resolution of each group of initial current resolution collected in the single-point current sampling mode and the multi-point current sampling mode is obtained respectively, if the difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within the current resolution accuracy range, the current resolution in the resolution dimension parameter meets the corresponding setting standard, if the difference between the average current resolution corresponding to any single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, the current resolution in the resolution dimension parameter does not meet the corresponding setting standard.

[0084] In a specific embodiment, for the voltage resolution Force Voltage resolution, the DPS board card is used as a hardware interface, based on the resolution detection program, when the Force Voltage range is 0V~4V±(1%), the voltage resolution Force Voltage Resolution:2.44mV, the first measurement result is recorded by using the SMU in the case of DPS Force 0DAC Voltage; the second measurement result is recorded by using the SMU in the case of DPS Force 1DAC Voltage, the difference between the two results is calculated, at this time the result is equal to a voltage resolution difference resolution, whether it is around 2.44Mv is judged, if the result is twice different, it is judged that it does not meet the setting standard.

[0085] For the current resolution Current measure resolution, the SMU as a current output, sends different DAC currents, measures the current using the DPS board card, and programs to use the instruction (SML_MEAS_DPS) to sample once for an interval of 0us and the instruction (SML_MEAS_DPS2) to sample 1000 times for an interval of 15us to measure two kinds of API, and finally the results are averaged 100 times. Then, in the case of SMU Force 0DAC Current, the first measurement result is recorded using the DPS; in the case of DPS Force 1DAC Current, the second measurement result is recorded using the DPS. The difference between the two results is equal to a current resolution difference, and it is determined whether the 1Ma range is around 91.6nA (current resolution accuracy range). If the difference is twice the result, it is determined that it does not meet the set standard. It is determined whether the 400Ma range is around 36.6nA, and if the difference is twice the result, it is determined that it does not meet the set standard.

[0086] In the above embodiment, if the multi-dimensional parameter is an output capability dimension parameter, the output capability dimension parameter output by the DPS board card under different programs and / or different configuration parameters is obtained, including:

[0087] The voltage parameter group and the current parameter group output by the DPS board card under the output capability detection program corresponding to the output capability dimension parameter received by the upper computer are obtained, wherein the voltage parameter group and the current parameter group constitute the output capability dimension parameter;

[0088] Correspondingly, whether the output capability dimension parameter meets the corresponding set standard is determined, including:

[0089] The current parameters corresponding to each voltage parameter in the voltage parameter group and the current parameter group are determined respectively;

[0090] Whether each group of voltage parameters and corresponding current parameters are within the capability fluctuation accuracy range is determined;

[0091] If each group of voltage parameters and corresponding current parameters are within the capability fluctuation accuracy range, the output capability dimension parameter meets the corresponding set standard;

[0092] If any one group of voltage parameters and corresponding current parameters are outside the capability fluctuation accuracy range, the output capability dimension parameter does not meet the corresponding set standard.

[0093] In a specific embodiment, the corresponding pin of the DPS board card, the 7.5-ohm resistor, and the SMU are connected in series. A voltage is applied, and the current is measured using the SMU, and the voltage output by the DPS is measured using the DMM. The output capability dimension parameter OutputCurrent: 3.8V-4V, 340mA / ch; 0V-3.8V, 400mA / ch. When the voltage parameter DPS Force is 3V~3.8, the SMU measures a current of up to 400Ma / ch. When the voltage parameter DPS Force is 3.8V~4V, the SMU measures a current of up to 340Ma / ch.

[0094] In the above embodiment, if the multi-dimension parameter is a scanning dimension parameter, the scanning dimension parameter output by the DPS board card under different programs and / or different configuration parameters is obtained, including:

[0095] The scanning detection program corresponding to the scanning dimension parameter issued by the host computer and the measurement current of each scanning point output by the pre-set resistor under different scanning point voltages are obtained; wherein each measurement current constitutes the scanning dimension parameter.

[0096] Correspondingly, the scanning dimension parameter is determined whether it conforms to the corresponding setting standard, including:

[0097] It is determined whether the measurement current corresponding to each scanning point is within the scanning current accuracy range.

[0098] If each measurement current is within the scanning current accuracy range, the scanning dimension parameter conforms to the corresponding setting standard.

[0099] If any one of the measurement currents is outside the scanning current accuracy range, the scanning dimension parameter does not conform to the corresponding setting standard.

[0100] In a specific implementation, the DPS Module Resistance Sweep Testing function performs a resistance equivalent frequency sweep test. Here, "frequency sweep" doesn't refer to frequency, but rather to sweeping voltage points. The code progressively increases the voltage from 0V to 4V (in 2.44mV steps). Each voltage point corresponds to a current. This is equivalent to simulating a fixed-resistance load and verifying the linearity of the IV relationship (current-voltage) point by point. The program verifies the correctness of these currents point by point. For current measurement, select the Sweep test with a current range of 0~1mA, a voltage range of 0V~4V, and a minimum adjustable voltage step (resolution step) of 2.44mV for output (or quantization). With an external resistor of 4KΩ, determine whether the current measured by the DPS board at each scan point is within the scanning current accuracy range (Spec Current measure range: ±1mA ±(0.2%+1.5uA)). For current measurement, select the Sweep test with a current range of 0~400mA, a voltage range of 0V~4V, and a step of 2.44mV. With an external resistor of 10Ω, determine whether the current measured by the DPS board at each scan point is within the scanning current accuracy range (Spec Current measure range: ±400mA: ±(2%+2mA)).

[0101] In the above embodiments, if the multi-dimensional parameters are API interface capability dimension parameters, then the API interface capability dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0102] The API interface capability detection program corresponding to the API interface capability dimension parameters sent by the host computer to the DPS board is obtained, as well as the continuous sending time of each API interface under different sampling periods; where the continuous sending time of each API interface constitutes the API interface capability dimension parameters.

[0103] Accordingly, it is necessary to determine whether the API interface capability parameters meet the corresponding setting standards, including:

[0104] Determine whether each continuous delivery time is less than the delivery threshold;

[0105] If all continuous delivery times are less than the delivery threshold, then the API interface capability dimension parameters meet the corresponding setting standards.

[0106] If any continuous delivery time is not less than the delivery threshold, then the API interface capability dimension parameter does not meet the corresponding setting standard.

[0107] In specific embodiments, the DPS board card verifies each API, the instruction (SML_MEAS_DPS2) API verifies the combination of the sampling number (n) and the time interval (t), n is from 1-4096, step is 100, t is from 14us-32767us, step is 1ms, Sweep time-consuming test, verification needs the DPS board card to run for a long time (continuous working time up to 12h or higher) and continuously provide test; through the instruction (SML_MEAS_DPS_RAW) API, n and t are used in combination, n is from 1-4096, step is 100, t is from 14us-32767us, step is 1ms, Sweep test, verification needs the DPS board card to run for a long time (continuous working time up to 12h or higher) and continuously provide test; in the test (DPS Module Obtain Measurement Raw Data Testing), the DPS single-point test pin VS pin 300 times, using the instruction (SML_MEAS_DPS_RAW) of the DPS to measure the pin VS pin 300 points, and then using the instruction (SML_GET_VS_RAW) to pull out 300 data, whether the test data of the above two cases will appear data jump. Verify the average value of the test VS pin under various conditions, whether the test result jumps (Match). Test 100 times, use the instruction "SML_MEAS_VS2(300, 10US)" to measure the average value, use the instruction "SML_READ_VS(DPS)" to read the measured value. Use the instruction "SML_MEAS_DPS_RAW(300, 10US)" to measure the average value, use the instruction "SML_READ_VS(DPS)" to read the measured value. Use the instruction "SML_MEAS_DPS_RAW(300, 10US)" to measure, use the instruction "SML_GET_VS_RAW, DPS_RAW)" to obtain the raw data, add 300 data and divide by 300 to obtain the average value. In the above process, use the instruction "MEAS_DPS_DUT_LOOP(CN, 300, 10US)" to measure, use the instruction "SML_GET_VS_RAW, DPS_RAW)" to obtain the raw data. For the DPS resource, multiple API interfaces are involved, the time is read before and after the verification of each API interface, and it is confirmed (check) whether the time meets the expectation (that is, it is judged that the continuous issuing time is less than the issuing threshold), generally the issuing time of an API is 2ms, and the value is too large. If there is an exception, it means that it does not meet the setting standard.

[0108] It should be noted that the embodiments provided in the present application are only one possible implementation, but are not limited to only this implementation. The user can set it up according to the user's needs.

[0109] In summary, the multi-dimensional verification method of the DPS board card provided in the present application has the following beneficial effects:

[0110] 1. Integrity: using the VSIM (Voltage Source & Current Measure, working mode) characteristics of the DPS board card, covering the function dimensions, basic Force / Measure (voltage source mode working), protection mechanism, communication interface, and other function correctness verification. Performance dimension: verifying accuracy, resolution, single point, and multi-point stability under different voltage / current ranges. Reliability dimension: verifying the robustness of the test verification system through long-time operation, overload protection. Interaction dimension: timing, response delay, and data consistency when interacting with the ATE pattern (test vector) and DUT.

[0111] 2. Extent of coverage scenarios: stability verification under normal working conditions and standard voltage / current ranges. Boundary conditions, extreme voltage / current, burst pulse, and load switching performance. Noise environment: measurement accuracy and anti-interference ability under interference. Isolation and non-interference when multiple channels are running simultaneously.

[0112] 3. Diversity: VSIM fast verification algorithm logic and measurement method. Verify high-precision instruments for comparison, verify hardware real performance. ATE debugging runs patterns in real production environment, verifies compatibility with production system.

[0113] 4. Data and decision-making: multi-dimensional verification generates more comprehensive data: raw measurement data, statistical analysis, and comparison differences. Potential risks such as channel drift and batch consistency issues can be discovered in advance through data mining. It can support quality certification (such as ISO and customer acceptance testing).

[0114] Figure 3 The structural diagram of the electronic device provided in another embodiment of the present application is shown in Figure 3 As shown in the figure, the electronic device includes a memory 20 for storing a computer program.

[0115] A processor 21 is configured to implement the steps of the multi-dimensional verification method of the DPS board card mentioned in the above embodiments when executing the computer program.

[0116] The electronic device provided in the present embodiment can include but is not limited to a smartphone, a tablet computer, a notebook computer, or a desktop computer, etc.

[0117] The processor 21 can include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The processor 21 can be implemented in at least one of a hardware form of a digital signal processor (DSP), a field-programmable gate array (FPGA), a programmable logic array (PLA), and the like. The processor 21 can also include a main processor and a coprocessor. The main processor is a processor for processing data in an awake state, also known as a central processing unit (CPU), and the coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor 21 can be integrated with a graphics processor (GPU) for rendering and drawing content required to be displayed by the display screen. In some embodiments, the processor 21 can further include an artificial intelligence (AI) processor for processing machine learning-related computing operations.

[0118] The memory 20 can include one or more computer-readable storage media, which can be non-transitory. The memory 20 can also include a high-speed random access memory, and a nonvolatile memory such as one or more disk storage devices, flash storage devices. In the present embodiment, the memory 20 is at least used to store the following computer program 201, wherein the computer program is loaded and executed by the processor 21, and can implement the related steps of the multi-dimensional verification method of the DPS board disclosed in any of the preceding embodiments. In addition, the resources stored by the memory 20 can also include an operating system 202 and data 203, and the storage mode can be temporary storage or permanent storage. The operating system 202 can include Windows, Unix, Linux, and the like.

[0119] In some embodiments, the electronic device can further include a display screen 22, an input / output interface 23, a communication interface 24, a power supply 25, and a communication bus 26.

[0120] Those skilled in the art can understand that, Figure 3 The structure shown in the figure does not constitute a limitation on the electronic device, and can include more or fewer components than those shown.

[0121] The electronic device provided by the embodiments of the present application comprises a memory and a processor. The processor can implement the multi-dimension verification method of the DPS board card described above when executing the program stored in the memory, and has the same beneficial effects.

[0122] Finally, the present application also provides an embodiment corresponding to a computer readable storage medium. The computer readable storage medium stores a computer program. The computer program is executed by a processor to implement the steps described in the above method embodiments.

[0123] It can be understood that if the method in the above embodiments is implemented in the form of a software function unit and sold or used as an independent product, it can be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or the whole or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium, and executes all or part of the steps of the methods described in the embodiments of the present application. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and various media that can store program codes.

[0124] The above describes in detail a multi-dimension verification method of a DPS board card, an apparatus and a medium provided by the present application. The embodiments in the specification are described in a progressive manner. Each embodiment mainly describes the differences from other embodiments. The same or similar parts of each embodiment can be understood by referring to each other. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple, and the related parts can be understood by referring to the method part. It should be pointed out that, for those skilled in the art, without departing from the principles of the present application, the present application can be improved and modified in several ways. These improvements and modifications also fall within the protection scope of the claims of the present application.

[0125] It also needs to be explained that in the present specification, the relational terms such as first and second and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus. An element proceeded by "comprises... a" does not, without more constraints, exclude the existence of additional identical elements in the process, method, article, or apparatus that comprises the element.

Claims

1. A multi-dimension verification method of a DPS board card, characterized in that, The method comprises the following steps: acquiring multi-dimension parameters output by a DPS board card under different programs and / or different configuration parameters, wherein the multi-dimension parameters comprise current-voltage dimension parameters, resolution dimension parameters, output capacity dimension parameters, scanning dimension parameters, and API interface capacity dimension parameters; judging whether each dimension parameter in the multi-dimension parameters meets a corresponding setting standard, and generating a comprehensive report according to a judgment result; acquiring each dimension parameter in the comprehensive report that does not meet the setting standard, and determining a corresponding verification result level according to the dimension parameter that does not meet the setting standard; determining a DPS board card design optimization suggestion corresponding to the verification result level based on an optimization standard, so as to construct the DPS board card according to a design requirement of the optimized DPS board card.

2. The method of claim 1, wherein, The method for acquiring the current-voltage dimension parameters output by the DPS board card under different programs and / or different configuration parameters comprises the following steps: acquiring a forced voltage output by the DPS board card under a current-voltage detection program corresponding to the current-voltage dimension parameters issued by an upper computer; acquiring a plurality of groups of initial forced currents output by the DPS board card under the current-voltage detection program and the forced voltage by using a single-point current sampling mode and a multi-point current sampling mode, so as to construct a forced current according to the plurality of groups of initial forced currents; wherein the forced voltage and the forced current both constitute the current-voltage dimension parameters. 3.The method of claim 2, wherein, The method for judging whether the current-voltage dimension parameters meet the corresponding setting standard comprises the following steps: when the current-voltage dimension parameters are the forced voltage, judging whether the forced voltage is within a voltage accuracy range, if the forced voltage is within the voltage accuracy range, the forced voltage in the current-voltage dimension parameters meets the corresponding setting standard, if the forced voltage is outside the voltage accuracy range, the forced voltage in the current-voltage dimension parameters does not meet the corresponding setting standard; when the current-voltage dimension parameters are the forced current, judging whether each group of initial forced currents in the forced current meets a forced current difference, if each forced current difference is within a current accuracy range, the forced current in the current-voltage dimension parameters meets the corresponding setting standard, if any one of the forced current differences is outside the current accuracy range, the forced current in the current-voltage dimension parameters does not meet the corresponding setting standard.

4. The method of claim 2, wherein, The method for acquiring the resolution dimension parameters output by the DPS board card under different programs and / or different configuration parameters comprises the following steps: acquiring two voltage resolutions output by the DPS board card under a resolution detection program corresponding to the resolution dimension parameters issued by the upper computer and two forced voltages with different values; Under the resolution detection procedure received by the DPS board card, a plurality of groups of initial current resolutions output by the DPS board card are acquired by using the single-point current sampling mode and the multi-point current sampling mode, so as to construct a current resolution according to the plurality of groups of initial current resolutions; wherein the voltage resolution and the current resolution constitute the resolution dimension parameter.

5. The method of claim 4, wherein, The resolution dimension parameter is judged whether it conforms to the corresponding setting standard, comprising: When the resolution dimension parameter is the voltage resolution, a voltage resolution difference of two voltage resolutions is acquired, if the voltage resolution difference is within a voltage resolution accuracy range, then the voltage resolution in the resolution dimension parameter conforms to the corresponding setting standard; When the resolution dimension parameter is the current resolution, average current resolutions of each group of initial current resolutions acquired under the single-point current sampling mode and the multi-point current sampling mode are respectively acquired, if a difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within a current resolution accuracy range, then the current resolution in the resolution dimension parameter conforms to the corresponding setting standard, if the difference between the average current resolution corresponding to any one of the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, then the current resolution in the resolution dimension parameter does not conform to the corresponding setting standard.

6. The method of claim 1, wherein, The output capability dimension parameter output by the DPS board card under different procedures and / or different configuration parameters is acquired, comprising: The voltage parameter group and the current parameter group output by the DPS board card under the output capability detection procedure corresponding to the output capability dimension parameter issued by the upper computer are acquired, wherein the voltage parameter group and the current parameter group constitute the output capability dimension parameter; Correspondingly, whether the output capability dimension parameter conforms to the corresponding setting standard is judged, comprising: The current parameter corresponding to each voltage parameter in the voltage parameter group is determined respectively; Whether each group of voltage parameters and the corresponding current parameters are within a capability fluctuation accuracy range is judged; If each group of voltage parameters and the corresponding current parameters are within the capability fluctuation accuracy range, then the output capability dimension parameter conforms to the corresponding setting standard; If any one group of voltage parameters and the corresponding current parameters are outside the capability fluctuation accuracy range, then the output capability dimension parameter does not conform to the corresponding setting standard.

7. The method of claim 1, wherein, The scanning dimension parameter output by the DPS board card under different procedures and / or different configuration parameters is acquired, comprising: The measurement current corresponding to each scanning point output through a preset resistor under the scanning detection procedure corresponding to the scanning dimension parameter and different scanning point voltages is acquired by the DPS board card after receiving the scanning dimension parameter issued by the upper computer; wherein each measurement current constitutes the scanning dimension parameter; Correspondingly, judging whether the scanning dimension parameter meets the corresponding setting standard comprises: judging whether the measurement current corresponding to each scanning point is within a scanning current accuracy range; if all the measurement currents are within the scanning current accuracy range, the scanning dimension parameter meets the corresponding setting standard; if any one of the measurement currents is outside the scanning current accuracy range, the scanning dimension parameter does not meet the corresponding setting standard.

8. The method of claim 1, wherein, obtaining the API interface capability dimension parameter output by the DPS board card under different programs and / or different configuration parameters comprises: obtaining the continuous issuing time corresponding to each API interface output by the DPS board card under different sampling periods and the API interface capability detection program corresponding to the API interface capability dimension parameter issued by the host computer; wherein the continuous issuing time corresponding to each API interface constitutes the API interface capability dimension parameter; Correspondingly, judging whether the API interface capability dimension parameter meets the corresponding setting standard comprises: judging whether each continuous issuing time is less than an issuing threshold; if each continuous issuing time is less than the issuing threshold, the API interface capability dimension parameter meets the corresponding setting standard; if any one of the continuous issuing times is not less than the issuing threshold, the API interface capability dimension parameter does not meet the corresponding setting standard.

9. An electronic device, comprising: a memory for storing a computer program; a processor for executing the computer program to implement the steps of the multi-dimension verification method of the DPS board card according to any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that, The computer program is stored on the computer readable storage medium and is executed by the processor to implement the steps of the multi-dimension verification method of the DPS board card according to any one of claims 1 to 8.

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