Component anti-electromagnetic interference test method under complex working condition

By extracting EMI and PD signal components under complex operating conditions, constructing a distribution feature matrix, and performing compensation and correction, the accuracy problem of electromagnetic interference testing of components is solved, achieving higher precision test results and component selection criteria.

CN121164801AActive Publication Date: 2025-12-19THREE GORGES INTELLIGENT CONTROL TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202511722397.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-11-21
Publication Date
2025-12-19
Estimated Expiration
2045-11-21

AI Technical Summary

Technical Problem

Existing technologies are not accurate enough in testing the electromagnetic interference resistance of components under complex working conditions, and cannot accurately capture the performance degradation mechanism of components under multi-physics coupling environment, resulting in low accuracy of test results.

Method used

By acquiring partial discharge signals and mixed electromagnetic signals at the sensor location, EMI and PD signal components are extracted, a distribution feature matrix is ​​constructed, compensation parameters are used to correct the partial discharge signals, and the electromagnetic interference immunity of the components is determined by combining the EMI signal components.

Benefits of technology

This improves the accuracy of electromagnetic interference test results for components, allows for the selection of components with high reliability and strong anti-interference capabilities, and enhances the stability and lifespan of electronic systems in complex environments.

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Abstract

The invention relates to the technical field of anti-electromagnetic interference testing, in particular to a component anti-electromagnetic interference testing method under complex working conditions. The method comprises the following steps: acquiring a partial discharge signal and a hybrid electromagnetic signal of each sensor position for monitoring a reference component in a test environment; eMI signal components and PD signal components are extracted from the mixed electromagnetic signals; according to fluctuation characteristics and position distribution of partial discharge signals of different sensor positions of the monitoring reference component and fluctuation characteristics and position distribution of PD signal components of different sensor positions of the monitoring reference component, compensation parameters corresponding to the sensor positions are obtained; compensating and correcting the partial discharge signals of the positions of the sensors for monitoring the to-be-detected component by using the compensation parameters; and judging the anti-electromagnetic interference capability of the to-be-detected component according to the compensated and corrected signal and the corresponding EMI signal component. According to the invention, the accuracy of the anti-electromagnetic interference capability test result of the component is improved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of anti-electromagnetic interference test, in particular to a component anti-electromagnetic interference test method under complex working conditions. BACKGROUND

[0002] With the rapid development of industrial automation, new energy and smart grid fields, key electronic components are increasingly complex and operate in harsh industrial environments. These environments generally exist in strong electromagnetic interference, extreme temperature and humidity changes, mechanical vibration and chemical corrosion and other multiple factors coupling challenges. Especially in smart grid, water and electricity network, new energy frequency converter and other application scenarios, the complexity and strength of the electromagnetic environment are constantly improving, and the reliability requirements of the components have reached an unprecedented height.

[0003] A series of electromagnetic compatibility (EMC) test standards have been established, however, these traditional standards mainly aim at single environmental factor test evaluation, and lack comprehensive simulation capability for multi-physical field coupling environment. In actual industrial scenarios, components often face the synergistic effect of temperature sudden change, mechanical stress and electromagnetic interference, which may cause the performance degradation speed of the components to increase several times, and the existing test method cannot accurately capture this compound degradation mechanism.

[0004] The current anti-electromagnetic interference test method for components can be divided into three categories: laboratory test, field monitoring and simulation. Laboratory test is usually carried out in a controlled electromagnetic environment, using various professional equipment to generate specific electromagnetic field types to evaluate the anti-interference performance of the components. However, in complex working conditions with multiple environmental factors, rapid heating may exacerbate local discharge, affecting the accuracy of electromagnetic field testing; although commonly used anti-interference test equipment with strong anti-interference ability is used to optimize the test environment and improve the test precision, under rapid heating, internal shell discharge will generate high-frequency electromagnetic pulses, which will overlap with external electromagnetic interference (EMI) signals, causing inaccurate interference test, and thus leading to low accuracy of the anti-interference test results of the components. SUMMARY

[0005] In order to solve the problem of low accuracy of test results when testing the anti-electromagnetic interference of components by the existing method, the purpose of the present application is to provide a component anti-electromagnetic interference test method under complex working conditions, and the technical solution adopted is as follows: The present application provides a component anti-electromagnetic interference test method under complex working conditions, which comprises the following steps: Obtaining the local discharge signal and mixed electromagnetic signal of each sensor position of the reference component under test environment monitoring, and the local discharge signal and mixed electromagnetic signal of each sensor position of the component to be tested; extracting the EMI signal component and the PD signal component from the mixed electromagnetic signal; obtaining a first distribution characteristic matrix according to fluctuation characteristics and position distribution of partial discharge signals of different sensor positions of a reference component under monitoring; obtaining a second distribution characteristic matrix according to fluctuation characteristics and position distribution of PD signal components of different sensor positions of the reference component under monitoring; combining the first distribution characteristic matrix and the second distribution characteristic matrix to obtain a compensation parameter corresponding to each sensor position; and compensating and correcting partial discharge signals of each sensor position of a component under monitoring by using the compensation parameter; judging the anti-electromagnetic interference capability of the component under monitoring according to the compensated and corrected signals and the corresponding EMI signal components.

[0006] Preferably, the extracting the EMI signal component and the PD signal component from the mixed electromagnetic signal comprises: performing wavelet transform on the mixed electromagnetic signal to obtain a processed signal; inputting the processed signal into a trained adaptive filter LMS to obtain the EMI signal component; subtracting the EMI signal component from the processed signal to obtain the PD signal component.

[0007] Preferably, the obtaining the first distribution characteristic matrix according to fluctuation characteristics and position distribution of partial discharge signals of different sensor positions of a reference component under monitoring comprises: for any sensor of the reference component under monitoring, obtaining a first pulse amplitude based on amplitude distribution of partial discharge signals of the any sensor position, and obtaining a characteristic angle of the any sensor based on relative position distribution of the any sensor and the reference component; constructing a first distribution characteristic matrix based on first characteristic parameters of all sensors of the reference component under monitoring, wherein each row of the first distribution characteristic matrix is the first characteristic parameters of a same sensor, and each column is a same first characteristic parameter; the first characteristic parameters include the characteristic angle, the first pulse amplitude, a first target rise time, a first target fall time, a first rise parameter and a first fall parameter; the first target rise time is a time length of a rising stage before and adjacent to a maximum amplitude in the partial discharge signal; and the first target fall time is a time length of a falling stage after and adjacent to the maximum amplitude in the partial discharge signal; the first rise parameter is an average value of a second derivative of a signal of the rising stage before and adjacent to the maximum amplitude in the partial discharge signal; and the first fall parameter is an average value of a second derivative of a signal of the falling stage after and adjacent to the maximum amplitude in the partial discharge signal.

[0008] Preferably, the first pulse amplitude is obtained based on the amplitude distribution of the partial discharge signal at any sensor position, and the first pulse amplitude comprises: taking the maximum amplitude of the partial discharge signal at any sensor position as the first pulse amplitude.

[0009] Preferably, the characteristic angle of any sensor is obtained based on the relative position distribution of any sensor and the reference element, and the characteristic angle of any sensor comprises: taking the direction from the reference element to any sensor as the first direction of any sensor; and taking the included angle between the first direction and a preset direction as the characteristic angle of any sensor.

[0010] Preferably, the second distribution characteristic matrix is obtained according to the fluctuation characteristics and position distribution of the PD signal components of different sensor positions of the monitoring reference element, and the second distribution characteristic matrix comprises: The second distribution characteristic matrix is constructed based on the second characteristic parameters of all sensors of the monitoring reference element, wherein each row of the second distribution characteristic matrix is the second characteristic parameters of a same sensor, and each column is a same second characteristic parameter; the second characteristic parameters comprise the characteristic angle, the second pulse amplitude, the second target rise time, the second target fall time, the second rise parameter and the second fall parameter; The second target rise time is the time length of the rising stage before and adjacent to the maximum amplitude in the PD signal component; and the second target fall time is the time length of the falling stage after and adjacent to the maximum amplitude in the PD signal component; The second rise parameter is the average value of the second derivative of the signal in the rising stage before and adjacent to the maximum amplitude in the PD signal component; and the second fall parameter is the average value of the second derivative of the signal in the falling stage after and adjacent to the maximum amplitude in the PD signal component.

[0011] Preferably, the second pulse amplitude is obtained by: taking the maximum amplitude of the PD signal component at any sensor position of the monitoring reference element as the second pulse amplitude.

[0012] Preferably, the compensation parameters corresponding to each sensor position are obtained by combining the first distribution characteristic matrix and the second distribution characteristic matrix, and the compensation parameters corresponding to each sensor position comprise: The difference between the second distribution characteristic matrix and the first distribution characteristic matrix is calculated to obtain the compensation parameters corresponding to each sensor position.

[0013] Preferably, the partial discharge signals of each sensor position of the monitoring to-be-tested element are compensated and corrected by using the compensation parameters, and the compensation and correction of the partial discharge signals of each sensor position of the monitoring to-be-tested element comprises: The partial discharge signals of each sensor position monitoring the to-be-tested component are decomposed, a fluctuation signal is extracted, the compensation parameters are used to re-fit the curves of the rising section and the falling section of the fluctuation signal and to fuse, so that a compensated and corrected signal is obtained.

[0014] Preferably, the anti-electromagnetic interference capability of the to-be-tested component is judged according to the compensated and corrected signal and the corresponding EMI signal component, including: The test level of the radiation radio frequency electromagnetic field immunity is divided according to the EMI signal component; The apparent charge quantity of the decomposed pulse is obtained based on the compensated and corrected signal and the corresponding test level; The size relationship between the apparent charge quantity and the preset threshold value is compared, and the judgment result of the anti-electromagnetic interference capability of the to-be-tested component is obtained.

[0015] The present application has at least the following beneficial effects: The present application firstly extracts the EMI signal component and the PD signal component from the mixed electromagnetic signal according to the signal characteristics of the EMI signal component and the PD signal component in the mixed electromagnetic signal, then analyzes the fluctuation characteristics and the position distribution of the partial discharge signals of different sensor positions monitoring the reference component and the fluctuation characteristics and the position distribution of the PD signal components of different sensor positions monitoring the reference component, since the interference received by different sensor positions during signal acquisition may be different, the compensation parameters corresponding to each sensor position are determined by combining the first distribution characteristic matrix and the second distribution characteristic matrix, then the partial discharge signals of different sensor positions monitoring the to-be-tested component are compensated and corrected to different degrees, the anti-electromagnetic interference capability of the to-be-tested component is judged based on the compensated and corrected signal and the corresponding EMI signal component, the method provided by the present application improves the accuracy of the test result of the anti-electromagnetic interference capability of the component, can screen out components with high reliability and strong anti-interference capability, improves the stability and the life of the entire electronic system in a complex environment, and provides a selection basis for key components in the fields of industrial automation, smart grid and new energy. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, and the advantages thereof, a brief introduction will be given to the drawings needed in the embodiments or the prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0017] Figure 1 A flowchart of a component anti-electromagnetic interference test method under complex working conditions provided by the embodiments of the present application. DETAILED DESCRIPTION

[0018] In order to further illustrate the technical means and effects taken by the present application to achieve the predetermined object, a complex working condition component anti-electromagnetic interference test method according to the present application is described in detail below in combination with the drawings and preferred embodiments.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs.

[0020] The specific scheme of the complex working condition component anti-electromagnetic interference test method provided by the present application is described below in combination with the drawings.

[0021] An embodiment of a complex working condition component anti-electromagnetic interference test method: The present embodiment proposes a complex working condition component anti-electromagnetic interference test method, as shown in Figure 1 The complex working condition component anti-electromagnetic interference test method of the present embodiment includes the following steps: Step S1, obtaining the partial discharge signals and mixed electromagnetic signals of each sensor position of the monitoring reference component in the test environment, and the partial discharge signals and mixed electromagnetic signals of each sensor position of the to-be-tested component.

[0022] In order to simulate the complex working conditions in the working process of the component, the present embodiment will first set up a component experiment field, which should have the following functions: (1) temperature control: rapid heating can be achieved, such as heating more than 10°C per minute, alternating wet and hot cycle; (2) electromagnetic environment: controllable intensity electromagnetic interference can be applied, such as generating specific frequency band EMI through antenna or coil; (3) vibration simulation: vibration table can be selected to simulate mechanical vibration environment; (4) shielding and grounding: the test room should have good electromagnetic shielding and grounding system to avoid external interference. Then, the component is fixed on an insulating frame to avoid contact with metal and introduce additional interference; an infrared heater or a high-power resistance heating body is used as a temperature control device to achieve heating control of the component, thereby simulating the rapid heating of the complex working condition; a standard EMI antenna or coil is used to generate a controllable electromagnetic field around the component to simulate the electromagnetic interference in the complex working condition; the frequency range of the coil covers the typical industrial interference frequency band. A high-voltage pulse generator or a point electromagnetic source is used to simulate the local partial discharge signals of the shell in the complex working condition; a plurality of magnetic field sensors are arranged at different positions around the component to collect mixed electromagnetic signals. It should be noted that all the above devices are fixed by non-magnetic clamps to avoid electromagnetic interference. The total number and arrangement position of the magnetic field sensors are set according to the specific circumstances, which will not be described in detail here.

[0023] After the experimental field is set up, the experimental data is collected. Specifically, all noise sources are closed, the initial temperature of the temperature control system is set to 25℃; the temperature control system is started to set the temperature rising rate for temperature rising; the EMI electromagnetic signal interference source is started to apply electromagnetic interference signals; the PD simulation device is started to generate intermittent or continuous partial discharge; the mixed electromagnetic signals are collected by connecting the high-speed oscilloscope or spectrum analyzer through the above-mentioned sensors. After a certain period of time, the EMI electromagnetic signal interference source is closed, only the PD signal source is retained, and the signal collection is continued to obtain pure partial discharge signals. It should be noted that the partial discharge signals and the mixed electromagnetic signals are collected at each magnetic field sensor position. It should be noted that the partial discharge signals and the mixed electromagnetic signals of each sensor position of the monitoring reference component are collected, and the partial discharge signals and the mixed electromagnetic signals of each sensor position of the monitoring to-be-tested component are collected. When the partial discharge signals and the mixed electromagnetic signals of each sensor position of the monitoring reference component are collected, the components placed in the experimental field are reference components, and when the to-be-tested component is tested, the to-be-tested component is placed.

[0024] At this point, the partial discharge signals and the mixed electromagnetic signals of each sensor position of the monitoring reference component, and the partial discharge signals and the mixed electromagnetic signals of each sensor position of the monitoring to-be-tested component are collected.

[0025] Step S2, extracting the EMI signal component and the PD signal component from the mixed electromagnetic signal; obtaining a first distribution characteristic matrix according to the fluctuation characteristics and position distribution of the partial discharge signals of different sensor positions of the monitoring reference component; obtaining a second distribution characteristic matrix according to the fluctuation characteristics and position distribution of the PD signal components of different sensor positions of the monitoring reference component.

[0026] The partial discharge signal has a very wide frequency spectrum range, which can extend from several megahertz to several gigahertz. The external electromagnetic interference (EMI) signal in the experimental field is also wide-band, and its core interference frequency band is also concentrated in the range of several hundred kilohertz to several hundred megahertz. Therefore, under complex working conditions, rapid temperature rising leads to the intensification of partial discharge phenomenon, which causes the partial discharge signal to overlap and couple with the electromagnetic interference signal during the electromagnetic interference test of the component, thereby affecting the accuracy of the electromagnetic field test.

[0027] The purpose of the anti-electromagnetic interference test of the component is to determine whether the component itself can work normally in the external EMI environment. When the component generates a partial discharge signal in a complex working condition, the partial discharge signal and the external electromagnetic interference (EMI) signal are overlapped and coupled, which can cause errors in the judgment of the external electromagnetic interference, thereby affecting the judgment of the anti-electromagnetic interference capability of the component. Therefore, by decomposing the partial discharge signal in the mixed electromagnetic signal, the real test environment and external interference of the component in the anti-electromagnetic experiment can be better measured, thereby improving the accuracy and stability of the anti-electromagnetic interference test of the component in a complex working condition.

[0028] In order to obtain more accurate anti-electromagnetic interference test results of the component, it is necessary to separate the PD signal component and the EMI signal component in the mixed electromagnetic signal. In the processed signal obtained above, in addition to the partial discharge signal and the electromagnetic interference signal, there can be other channel noise, so it is necessary to eliminate this part of noise first.

[0029] Since the wavelet transform has the multi-resolution analysis characteristic, it can better capture the transient pulse characteristics of the PD and suppress the wideband EMI noise and other channel noise, so the wavelet transform is used for noise elimination, and the wavelet base is selected as DB4. The wavelet transform is performed on the processed mixed electromagnetic signal to obtain a processed signal; the processed signal eliminates obvious noise, and it can be considered that the mixed signal at this time is the superposition signal of the PD signal and the EMI signal, so it is necessary to decompose the PD signal and the EMI signal in the processed signal. Since the PD signal is unstable and is a pulse signal, and the EMI signal is continuous and relatively stable, the PD signal is regarded as noise, and the processed signal is regarded as an expected signal, which is input into the trained adaptive filter LMS to output the EMI signal component; the training process of the adaptive filter LMS is a prior art, and when it is trained, the adaptive filter LMS is trained until the weight is converged; this embodiment will not be described in more detail.

[0030] The PD signal component is obtained by subtracting the EMI signal component from the processed signal. At this time, the mixed signal is decomposed by the wavelet transform and the adaptive filter to obtain the EMI signal component and the PD signal component.

[0031] In a complex working condition, when the component generates a partial discharge in a fast heating and electromagnetic interference (EMI) environment, mutual impedance coupling occurs between the electromagnetic interference source and the partial discharge source, thereby causing the waveform distortion of the EMI and the partial discharge signal. Since the above signal decomposition process regards the processed signal as an expected signal, the above waveform distortion will be concentrated in the partial discharge signal, thereby causing the waveform distortion of the partial discharge signal.

[0032] The partial discharge signal is a transient current pulse generated by a micro-breakdown in an insulating medium, which has a high-frequency characteristic and an anisotropy in the direction of the radiation field. Therefore, the anisotropy of the signal can be collected by the plurality of magnetic field sensors in the above arrangement, and the waveform characteristic of the partial discharge signal can be analyzed. Then, the distortion analysis and compensation can be performed in combination with the PD signal components obtained by the above decomposition.

[0033] The partial discharge signal is generated by a micro-breakdown in an insulating medium, in which the current pulse breaks down in a specific direction in the medium to form a dipole. Therefore, the distribution of the electromagnetic field radiated by the partial discharge signal in space has strong directivity. This directivity is mainly reflected in the time-domain waveform of the signal.

[0034] Since the high-frequency components in different directions attenuate differently, the direction of the sensor not only affects the amplitude but also affects the specific waveform received, resulting in changes in the rise time and fall time of the pulse, and the specific waveform also changes accordingly.

[0035] Based on the above characteristics, for any sensor monitoring the reference component: the maximum amplitude of the partial discharge signal at the sensor position is taken as the first pulse amplitude. The direction from the reference component to the sensor is taken as the first direction of the sensor; and the included angle between the first direction and the preset direction is taken as the characteristic angle of the sensor. In the embodiment, the preset direction is the horizontal right direction. By using the above method, the characteristic angle of each sensor monitoring the reference component can be obtained.

[0036] Based on the first characteristic parameters of all sensors monitoring the reference component, a first distribution characteristic matrix is constructed, i.e., the elements in the first distribution characteristic matrix are the first characteristic parameters, wherein each row of the first distribution characteristic matrix is the first characteristic parameters of the same sensor, and each column is the same first characteristic parameter; the first characteristic parameters include the characteristic angle, the first pulse amplitude, the first target rise time, the first target fall time, the first rise parameter and the first fall parameter. The number of rows of the first distribution characteristic matrix is equal to the number of sensors monitoring the reference component, and the number of columns of the first distribution characteristic matrix is 6, in the embodiment, in the order from left to right, the characteristic angle, the first pulse amplitude, the first target rise time, the first target fall time, the first rise parameter and the first fall parameter.

[0037] The first target rising time is a time length of a rising stage before and adjacent to a maximum amplitude in the partial discharge signal; the first target falling time is a time length of a falling stage after and adjacent to the maximum amplitude in the partial discharge signal; the first rising parameter is an average value of a second derivative of a signal of the rising stage before and adjacent to the maximum amplitude in the partial discharge signal; and the first falling parameter is an average value of the second derivative of the signal of the falling stage after and adjacent to the maximum amplitude in the partial discharge signal. It should be noted that the second derivative is used to represent a change speed of the amplitude.

[0038] For any sensor monitoring the reference component, a maximum amplitude of a PD signal component at the sensor position is taken as a second pulse amplitude. There is a corresponding second pulse amplitude for each sensor.

[0039] A second distribution feature matrix is constructed based on second feature parameters of all sensors monitoring the reference component, wherein each row of the second distribution feature matrix is a second feature parameter of a same sensor, and each column is a same second feature parameter; and the second feature parameters include a feature angle, a second pulse amplitude, a second target rising time, a second target falling time, a second rising parameter, and a second falling parameter.

[0040] The second target rising time is a time length of a rising stage before and adjacent to a maximum amplitude in the PD signal component; the second target falling time is a time length of a falling stage after and adjacent to the maximum amplitude in the PD signal component; the second rising parameter is an average value of a second derivative of a signal of the rising stage before and adjacent to the maximum amplitude in the PD signal component; and the second falling parameter is an average value of the second derivative of the signal of the falling stage after and adjacent to the maximum amplitude in the PD signal component. Since the second distribution feature matrix is decomposed from the mixed signal, the second distribution feature matrix contains waveform distortion features of the PD signal.

[0041] It should be noted that a same row of the second distribution feature matrix and the first distribution feature matrix represents parameters of a same sensor. The number of rows of the second distribution feature matrix is equal to the number of sensors monitoring the reference component, and the number of columns of the second distribution feature matrix is 6. In this embodiment, in a sequence from left to right, the columns are a feature angle, a second pulse amplitude, a second target rising time, a second target falling time, a second rising parameter, and a second falling parameter.

[0042] Thus, the first distribution feature matrix and the second distribution feature matrix are obtained in this embodiment.

[0043] Step S3, combine the first distribution feature matrix and the second distribution feature matrix to obtain the compensation parameter corresponding to each sensor position; and use the compensation parameter to compensate and correct the partial discharge signal of each sensor position for monitoring the to-be-tested component.

[0044] In the above steps, the first distribution feature matrix and the second distribution feature matrix are obtained, and then the difference between the second distribution feature matrix and the first distribution feature matrix is calculated to obtain the compensation parameter corresponding to each sensor position.

[0045] Further, the partial discharge signal of each sensor position for monitoring the to-be-tested component is subjected to empirical mode decomposition (EMD) to extract a fluctuation signal, the compensation parameter is used to re-fit the rising section and the falling section of the curve of the fluctuation signal, and the fitting result is fused to obtain the compensated and corrected signal. The empirical mode decomposition is a prior art, and thus will not be described in detail here.

[0046] Thus far, the compensation and correction of the partial discharge signal of each sensor position for monitoring the to-be-tested component are completed by using the method provided in the embodiment.

[0047] Step S4, judging the anti-electromagnetic interference capability of the to-be-tested component according to the compensated and corrected signal and the corresponding EMI signal component.

[0048] In the above steps, the compensation and correction of the partial discharge signal of each sensor position are completed to obtain the compensated and corrected signal, and then the anti-electromagnetic interference capability of the to-be-tested component is judged according to the compensated and corrected signal and the EMI signal component corresponding to each sensor position of the to-be-tested component.

[0049] Specifically, the radiation frequency electromagnetic field immunity test level is divided according to the EMI signal component; the apparent charge quantity of the decomposed pulse is obtained based on the compensated and corrected signal and the corresponding test level; the immunity threshold is set, and then the judgment result of the anti-electromagnetic interference capability of the to-be-tested component is obtained by comparing the size relationship between the apparent charge quantity and the preset threshold. This process is a prior art, and thus will not be described in detail here. The judgment result of the anti-electromagnetic interference capability of the to-be-tested component obtained above is summarized and counted, and the component under complex working conditions is input into a safe and reliable component library to provide data support for component selection in hardware design.

[0050] Thus far, the detection of the anti-electromagnetic interference capability of the component is completed by using the method provided in the embodiment.

[0051] The embodiment first extracts the EMI signal component and the PD signal component from the mixed electromagnetic signal according to the signal characteristics of the EMI signal component and the PD signal component in the mixed electromagnetic signal, then analyzes the fluctuation characteristics and position distribution of the partial discharge signals of different sensor positions of the monitoring reference component and the fluctuation characteristics and position distribution of the PD signal component of different sensor positions of the monitoring reference component, since the interference received by different sensor positions during signal collection may be different, the first distribution characteristic matrix and the second distribution characteristic matrix are combined to determine the compensation parameters corresponding to each sensor position, then the partial discharge signals of different sensor positions of the monitoring component under test are compensated and corrected to different degrees, and the anti-electromagnetic interference ability of the component under test is judged based on the compensated and corrected signals and the corresponding EMI signal component, the method provided in the embodiment improves the accuracy of the test result of the anti-electromagnetic interference ability of the component under test, can screen out components with high reliability and strong anti-interference ability, improves the stability and service life of the entire electronic system in a complex environment, and provides a selection basis for key components in the fields of industrial automation, smart power grids, new energy and the like.

[0052] It should be noted that the above only describes the preferred embodiments of the present application, and is not intended to limit the present application. Any modification, equivalent replacement, improvement, etc. within the principles of the present application shall be included in the protection scope of the present application.

Claims

1. A method for testing the anti-electromagnetic interference of components under complex conditions, characterized in that, The method includes the following steps: Acquire partial discharge signals and mixed electromagnetic signals at each sensor location of the reference component under test environment, as well as partial discharge signals and mixed electromagnetic signals at each sensor location of the component under test. EMI signal components and PD signal components are extracted from the mixed electromagnetic signal; a first distribution feature matrix is ​​obtained based on the fluctuation characteristics and position distribution of the partial discharge signals at different sensor locations of the monitoring reference component; a second distribution feature matrix is ​​obtained based on the fluctuation characteristics and position distribution of the PD signal components at different sensor locations of the monitoring reference component. By combining the first distribution feature matrix and the second distribution feature matrix, compensation parameters corresponding to each sensor position are obtained; the compensation parameters are then used to compensate and correct the partial discharge signals at each sensor position of the device under test. The electromagnetic interference immunity of the component under test is judged based on the compensated and corrected signal and the corresponding EMI signal components. 2.The component anti-electromagnetic interference test method under complex working conditions according to claim 1, characterized in that, The extraction of EMI signal components and PD signal components from the mixed electromagnetic signals includes: Wavelet transform is performed on the hybrid electromagnetic signal to obtain the processed signal; The processed signal is input into the trained adaptive filter LMS to obtain the EMI signal components; The PD signal component is obtained by subtracting the EMI signal component from the processed signal. 3.The component anti-electromagnetic interference test method under complex working conditions of claim 1, wherein, The first distribution feature matrix is ​​obtained based on the fluctuation characteristics and location distribution of partial discharge signals at different sensor locations of the monitoring reference component, including: For any sensor monitoring the reference component: based on the amplitude distribution of the partial discharge signal at the location of the sensor, obtain the first pulse amplitude; based on the relative position distribution between the sensor and the reference component, obtain the characteristic angle of the sensor. A first distribution feature matrix is ​​constructed based on the first feature parameters of all sensors of the monitoring reference component. Each row of the first distribution feature matrix contains the first feature parameter of the same sensor, and each column contains the same first feature parameter. The first feature parameter includes feature angle, first pulse amplitude, first target rise time, first target fall time, first rise parameter, and first fall parameter. The first target rise time is the duration of the rise phase before and adjacent to the maximum amplitude value in the partial discharge signal; the first target fall time is the duration of the fall phase after and adjacent to the maximum amplitude value in the partial discharge signal. The first rising parameter is the average of the second derivatives of the signal during the rising phase before and adjacent to the maximum amplitude in the partial discharge signal; the first falling parameter is the average of the second derivatives of the signal during the falling phase after and adjacent to the maximum amplitude in the partial discharge signal.

4. The method of claim 3, wherein the method further comprises: Obtaining the first pulse amplitude based on the amplitude distribution of the partial discharge signal at any of the sensor locations includes: taking the maximum amplitude of the partial discharge signal at any of the sensor locations as the first pulse amplitude.

5. The method of claim 3, wherein the method further comprises: The feature angle of the any sensor is obtained based on the relative position distribution of the any sensor and the reference element, including: recording a direction pointed by the reference element to the any sensor as a first direction of the any sensor; and taking an included angle between the first direction and a preset direction as the feature angle of the any sensor.

6. The method of claim 1, wherein, The second distribution feature matrix is obtained according to the fluctuation characteristics and position distribution of the PD signal components of different sensor positions of the monitoring reference element, including: The second distribution feature matrix is constructed based on the second feature parameters of all sensors of the monitoring reference element, wherein each row of the second distribution feature matrix is the second feature parameters of a same sensor, and each column is a same second feature parameter; the second feature parameters include the feature angle, the second pulse amplitude, the second target rise time, the second target fall time, the second rise parameter and the second fall parameter; The second target rise time is a time length of a rising stage before and adjacent to a maximum amplitude in the PD signal component; and the second target fall time is a time length of a falling stage after and adjacent to the maximum amplitude in the PD signal component. The second rise parameter is an average value of a second derivative of a signal in the rising stage before and adjacent to the maximum amplitude in the PD signal component; and the second fall parameter is an average value of a second derivative of a signal in the falling stage after and adjacent to the maximum amplitude in the PD signal component.

7. The method of claim 6, wherein the method further comprises: The second pulse amplitude is obtained by taking a maximum amplitude of the PD signal component at a position of any sensor of the monitoring reference element as the second pulse amplitude. 8.The component anti-electromagnetic interference test method under complex working conditions of claim 1, wherein, The compensation parameters corresponding to each sensor position are obtained by combining the first distribution feature matrix and the second distribution feature matrix, including: The compensation parameters corresponding to each sensor position are obtained by calculating a difference between the second distribution feature matrix and the first distribution feature matrix.

9. The method of claim 1, wherein, The partial discharge signals at each sensor position of the monitoring to-be-tested element are compensated and corrected by using the compensation parameters, including: The partial discharge signals at each sensor position of the monitoring to-be-tested element are decomposed to extract fluctuation signals, and the compensation parameters are used to re-fit curves of rising sections and falling sections of the fluctuation signals and to fuse the rising sections and the falling sections, so as to obtain the compensated and corrected signals.

10. The method of claim 1, wherein, The anti-electromagnetic interference capability of the to-be-tested element is judged according to the compensated and corrected signals and the corresponding EMI signal components, including: The radiation radio frequency electromagnetic field immunity test level is divided according to the EMI signal components; The apparent charge quantity of the decomposed pulse is obtained based on the compensated and corrected signals and the corresponding test level; The size relationship between the apparent charge quantity and a preset threshold value is compared to obtain a judgment result of the anti-electromagnetic interference capability of the to-be-tested element.

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