Preparation method and device of iridium oxide electrode

Abstract

The invention relates to the technical field of electrode preparation, and discloses a preparation method and device of an iridium oxide electrode, and the method comprises the steps: preparing an iridium oxide electrode substrate, carrying out the quality detection through a cleaning difference analysis method, obtaining a first quality score, carrying out the classification processing of the substrate according to the first quality score, and preparing a transition layer based on a qualified substrate. Detecting through a viscosity separation analysis method to obtain a second quality score; classifying and processing the electrode base material according to the second quality score; preparing an iridium oxide coating based on a qualified base material; detecting through a ray test evaluation method to obtain a third quality score; through the steps, the quality consistency and the high performance of each layer of the iridium oxide electrode can be ensured, the stability and the reliability of the electrode are improved, the production efficiency is improved, the rate of unqualified products is reduced, and the problem that potential defects of the iridium oxide electrode cannot be recognized in time in the prior art is solved.

Description

Technical Field

[0001] This invention relates to the technical field of electrode preparation, and more particularly to a method and apparatus for preparing an iridium oxide electrode. Background Technology

[0002] An iridium oxide electrode is composed of three parts: a substrate, a transition layer, and an iridium oxide coating. All three parts affect the quality of the iridium oxide electrode. In current technology, the quality of the iridium oxide electrode is usually tested after its preparation is completed. This preparation method is prone to missing potential defects in the iridium oxide electrode and cannot correct defects in the preparation and manufacturing process in a timely manner. Summary of the Invention

[0003] The purpose of this invention is to provide a method and apparatus for preparing an iridium oxide electrode, which aims to solve the problem that the potential defects of iridium oxide electrodes cannot be identified in a timely manner in the prior art.

[0004] The present invention is implemented as follows: In a first aspect, the present invention provides a method for preparing an iridium oxide electrode, the iridium oxide electrode comprising a substrate, a transition layer, and an iridium oxide coating, comprising: The substrate for the iridium oxide electrode is prepared, and the prepared substrate is subjected to quality testing by a preset cleaning difference analysis method to obtain a substrate quality score. The substrate is classified into qualified substrates and unqualified substrates based on the substrate quality score. The transition layer of the iridium oxide electrode is prepared based on the qualified substrate to obtain an electrode substrate composed of the substrate and the transition layer. The quality of the transition layer of the prepared electrode substrate is tested by a preset adhesive separation analysis method to obtain a quality score of the transition layer. The electrode substrate is classified into qualified substrates and unqualified substrates based on the quality score of the transition layer. The iridium oxide coating of the iridium oxide electrode is prepared based on the qualified substrate to obtain an iridium oxide electrode composed of the electrode substrate and the iridium oxide coating. The quality of the iridium oxide coating of the prepared iridium oxide electrode is tested by a preset X-ray testing and evaluation method to obtain a quality score of the iridium oxide coating. The iridium oxide electrodes are classified into qualified electrodes and unqualified electrodes based on the iridium oxide coating quality score. The electrode quality score of the qualified electrodes is generated by combining the substrate quality score, transition layer quality score, and iridium oxide coating quality score.

[0005] In a second aspect, the present invention provides an apparatus for preparing an iridium oxide electrode, used to implement the method for preparing an iridium oxide electrode as described in any one of the first aspects, comprising: The first evaluation module is used to prepare the substrate of the iridium oxide electrode and to perform quality testing on the prepared substrate using a preset cleaning difference analysis method to obtain a substrate quality score. The first classification module is used to classify the substrate according to the substrate quality score, so as to classify the substrate into qualified substrates and unqualified substrates. The second evaluation module is used to prepare the transition layer of the iridium oxide electrode based on the qualified substrate to obtain an electrode substrate composed of the substrate and the transition layer, and to perform quality testing on the transition layer of the prepared electrode substrate by a preset adhesive separation analysis method to obtain a quality score of the transition layer. The second classification module is used to classify the electrode substrate according to the quality score of the transition layer, so as to classify the electrode substrate into qualified substrate and unqualified substrate. The third evaluation module is used to prepare an iridium oxide coating for the iridium oxide electrode based on the qualified substrate, so as to obtain an iridium oxide electrode composed of the electrode substrate and the iridium oxide coating, and to perform quality testing on the iridium oxide coating of the prepared iridium oxide electrode by a preset X-ray testing evaluation method to obtain a quality score of the iridium oxide coating. The third classification module is used to classify the iridium oxide electrode according to the iridium oxide coating quality score, so as to classify the iridium oxide electrode into qualified electrodes and unqualified electrodes, and generate the electrode quality score of the qualified electrode based on the substrate quality score, transition layer quality score and iridium oxide coating quality score of the qualified electrode.

[0006] This invention provides a method for preparing an iridium oxide electrode, which has the following beneficial effects: This invention prepares an iridium oxide electrode substrate and performs quality testing using a cleaning difference analysis method to obtain a first quality score. Based on the first quality score, the substrate is classified into qualified and unqualified substrates. A transition layer is prepared based on the qualified substrate and tested using an adhesive separation analysis method to obtain a second quality score. Based on the second quality score, the electrode substrate is classified into qualified and unqualified substrates. An iridium oxide coating is prepared based on the qualified substrate and tested using a radiographic testing method to obtain a third quality score. The iridium oxide electrode is then classified based on the third quality score, and the final electrode quality score is generated by combining the quality scores of each layer. Through these steps, the consistency and high performance of the iridium oxide electrode across all layers can be ensured, improving the stability and reliability of the electrode, increasing production efficiency, reducing the defect rate, and solving the problem in existing technologies where potential defects in iridium oxide electrodes cannot be identified in a timely manner. Attached Figure Description

[0007] Figure 1 This is a schematic diagram of the steps in a method for preparing an iridium oxide electrode according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of an iridium oxide electrode preparation apparatus provided in an embodiment of the present invention. Detailed Implementation

[0008] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0009] The implementation of the present invention will be described in detail below with reference to specific embodiments.

[0010] Reference Figure 1 , Figure 2 The diagram shows a preferred embodiment of the present invention.

[0011] In a first aspect, the present invention provides a method for preparing an iridium oxide electrode, the iridium oxide electrode comprising a substrate, a transition layer, and an iridium oxide coating, comprising: S1: The substrate for the iridium oxide electrode is prepared, and the prepared substrate is subjected to quality testing by a preset cleaning difference analysis method to obtain a substrate quality score; S2: Classify the substrate according to the substrate quality score to classify the substrate into qualified substrates and unqualified substrates; S3: Based on the qualified substrate, prepare the transition layer of the iridium oxide electrode to obtain an electrode substrate composed of the substrate and the transition layer, and perform quality testing on the transition layer of the prepared electrode substrate by a preset adhesive separation analysis method to obtain a quality score of the transition layer. S4: The electrode substrate is classified according to the quality score of the transition layer to classify the electrode substrate into qualified substrate and unqualified substrate; S5: Based on the qualified substrate, prepare the iridium oxide coating of the iridium oxide electrode to obtain an iridium oxide electrode composed of the electrode substrate and the iridium oxide coating, and perform quality testing on the iridium oxide coating of the prepared iridium oxide electrode by a preset X-ray testing and evaluation method to obtain a quality score of the iridium oxide coating. S6: The iridium oxide electrodes are classified according to the iridium oxide coating quality score to classify them into qualified electrodes and unqualified electrodes. The electrode quality score of the qualified electrodes is generated by combining the substrate quality score, transition layer quality score, and iridium oxide coating quality score. Specifically, in step S1 of the embodiment provided by the present invention, the substrate of the iridium oxide electrode is prepared, and the prepared substrate is subjected to quality testing by a preset cleaning difference analysis method to obtain a substrate quality score.

[0012] Specifically, in step S2 of the embodiment provided by the present invention, the substrate is classified according to the substrate quality score to classify the substrate into qualified substrates and unqualified substrates.

[0013] It should be noted that the iridium oxide electrode consists of three parts: a substrate, a transition layer, and an iridium oxide coating. These three parts are prepared sequentially. In the traditional preparation process, they are usually prepared continuously, and the final iridium oxide electrode is subjected to quality testing.

[0014] It is understandable that in this preparation method, only the iridium oxide coating of the iridium oxide electrode can be detected, but the internal substrate and transition layer cannot be detected, which may lead to hidden defects. However, in the embodiment provided by the present invention, the products at each stage are quality tested during the preparation of the iridium oxide electrode, which can detect defective products in advance and eliminate them, thereby avoiding the occurrence of products with hidden defects.

[0015] More specifically, this method of testing at each stage can employ either sampling testing or comprehensive testing.

[0016] More specifically, the substrate is used to provide mechanical support for the entire electrode, ensuring the structural integrity and stability of the electrode. The substrate is usually made of conductive materials, such as metals or conductive ceramics, to ensure that the current can be effectively conducted to the active layer of the electrode. The substrate needs to provide good surface conditions to ensure that the transition layer and iridium oxide coating can adhere firmly. During the preparation of the substrate, surface deposits will remain on the substrate. These surface deposits need to be cleaned to remove them. Therefore, the cleaning difference analysis method is used to assess the quality of the substrate and assign a first quality score to the substrate based on the test results.

[0017] More specifically, the cleaning difference analysis method analyzes the differences between the substrate before and after cleaning to inspect the substrate quality and determine the impact of the substrate condition on the quality of the iridium oxide electrode.

[0018] More specifically, non-conforming substrates are removed based on the first quality score, while conforming substrates are retained for subsequent manufacturing.

[0019] Specifically, in step S3 of the embodiment provided by the present invention, a transition layer of an iridium oxide electrode is prepared based on a qualified substrate to obtain an electrode substrate composed of a substrate and a transition layer. The quality of the transition layer of the prepared electrode substrate is tested by a preset adhesive separation analysis method to obtain a quality score of the transition layer.

[0020] Specifically, in step S4 of the embodiment provided by the present invention, the electrode substrate is classified according to the quality score of the transition layer to classify the electrode substrate into qualified substrate and unqualified substrate.

[0021] More specifically, a transition layer for an iridium oxide electrode is prepared on a qualified substrate to obtain an electrode substrate consisting of a substrate and a transition layer. The electrode substrate can be used for subsequent fabrication of an iridium oxide coating, thereby preparing a material for manufacturing an iridium oxide electrode.

[0022] More specifically, the electrode substrate needs to undergo quality inspection to remove unqualified electrode substrates and retain qualified electrode substrates for subsequent iridium oxide coating manufacturing.

[0023] More specifically, the transition layer acts as a transition between the substrate and the iridium oxide coating, enhancing the adhesion between the layers and preventing peeling or detachment. The material selection of the transition layer needs to be compatible with the substrate and the iridium oxide coating to reduce the difference in thermal expansion coefficients, reduce thermal stress and interfacial reactions. The transition layer can buffer the stress caused by the difference in thermal expansion coefficients, prevent the coating from cracking or detaching, and improve the stability and lifespan of the electrode.

[0024] Therefore, the adhesive separation analysis method is used to inspect the quality of the transition layer. The adhesive separation analysis method evaluates the quality of the transition layer by performing adhesive and separation operations on the transition layer and analyzing the separated parts.

[0025] More specifically, a second quality score is obtained based on the quality assessment results, and the electrode substrates are classified according to the second quality score. Unqualified electrode substrates are removed, and qualified electrode substrates proceed to the next preparation process.

[0026] It should be noted that the quality of each component in the preparation of iridium oxide electrodes depends on the quality of the preparation equipment. Therefore, by sampling and testing the products, the condition of the preparation equipment can be obtained to determine whether the equipment meets the operating standards and whether it can mass-produce products that meet the standards.

[0027] In other words, in some testing cases, the test results directly exclude unqualified products. In other cases, the test results show that there is a problem with the preparation device, which needs to be adjusted. The adjustments include the setting parameters of the preparation device, and if the preparation device itself has defects, it needs to be repaired or replaced.

[0028] Specifically, in step S5 of the embodiment provided by the present invention, an iridium oxide coating of an iridium oxide electrode is prepared based on a qualified substrate to obtain an iridium oxide electrode composed of an electrode substrate and an iridium oxide coating. The quality of the iridium oxide coating of the prepared iridium oxide electrode is tested by a preset X-ray testing and evaluation method to obtain a quality score of the iridium oxide coating. Specifically, in step S6 of the embodiment provided by the present invention, the iridium oxide electrode is classified according to the iridium oxide coating quality score to classify the iridium oxide electrode into qualified electrodes and unqualified electrodes, and the electrode quality score of the qualified electrode is generated by combining the substrate quality score, the transition layer quality score and the iridium oxide coating quality score.

[0029] More specifically, an iridium oxide coating is prepared on an electrode substrate, and the iridium oxide coating is subjected to quality inspection to obtain a corresponding iridium oxide coating quality score. Unqualified products are removed based on the third quality score. For qualified products, a comprehensive performance evaluation can be performed on the first, second, and third quality scores corresponding to each component to obtain a more specific electrode quality score.

[0030] This invention provides a method for preparing an iridium oxide electrode, which has the following beneficial effects: This invention prepares an iridium oxide electrode substrate and performs quality testing using a cleaning difference analysis method to obtain a first quality score. Based on the first quality score, the substrate is classified into qualified and unqualified substrates. A transition layer is prepared based on the qualified substrate and tested using an adhesive separation analysis method to obtain a second quality score. Based on the second quality score, the electrode substrate is classified into qualified and unqualified substrates. An iridium oxide coating is prepared based on the qualified substrate and tested using a radiographic testing method to obtain a third quality score. The iridium oxide electrode is then classified based on the third quality score, and the final electrode quality score is generated by combining the quality scores of each layer. Through these steps, the consistency and high performance of the iridium oxide electrode across all layers can be ensured, improving the stability and reliability of the electrode, increasing production efficiency, reducing the defect rate, and solving the problem in existing technologies where potential defects in iridium oxide electrodes cannot be identified in a timely manner.

[0031] Preferably, the step of performing quality testing on the prepared substrate using a preset cleaning difference analysis method to obtain a substrate quality score includes: S11: Perform preliminary identification processing on the prepared substrate to obtain preliminary identification information of the substrate; wherein, the preliminary identification processing includes laser scanning identification and ultrasonic identification; S12: Analyze and process the preliminary identification information of the substrate to obtain the cleaning strategy for the substrate; S13: Perform corresponding cleaning processing on the substrate according to the cleaning strategy, and perform re-identification processing on the substrate after the cleaning processing to obtain the re-identification information of the substrate; S14: Perform a quality assessment on the substrate based on the cleaning strategy, the preliminary identification information, and the re-identification information to obtain a substrate quality score.

[0032] Specifically, laser scanning technology is used to perform high-precision scanning on the substrate surface to obtain the surface morphology and structural information of the substrate, generating preliminary identification information; ultrasonic technology is used to scan the internal structure of the substrate to identify internal defects and inhomogeneities, generating preliminary identification information.

[0033] More specifically, based on the preliminary identification information obtained from laser scanning and ultrasonic identification, the surface and internal conditions of the substrate are analyzed, such as the distribution of surface contaminants, the size and location of internal defects, etc. Based on the spectral analysis results, a cleaning strategy for the substrate is formulated, and parameters such as cleaning method, time, temperature, cleaning solvent or ultrasonic frequency are determined.

[0034] More specifically, according to the established cleaning strategy, the substrate is cleaned accordingly to ensure that the cleaning process can effectively remove contaminants from the substrate surface and improve the internal structure. The cleaned substrate is then subjected to laser scanning and ultrasonic identification to generate re-identification information.

[0035] More specifically, by comparing the initial identification information and the re-identification information, the effectiveness of the cleaning treatment is evaluated, the degree of contaminant removal and the improvement of internal defects are determined, and based on the cleaning effectiveness evaluation results, combined with the cleaning strategy, initial identification information and re-identification information, the substrate quality is assessed and a substrate quality score is generated.

[0036] Understandably, laser scanning and ultrasonic identification technologies can accurately identify the surface and internal condition of the substrate, providing a comprehensive understanding of its quality. Personalized cleaning strategies can be developed based on the specific substrate conditions to improve cleaning effectiveness and ensure the substrate reaches its optimal state. Implementing precise cleaning strategies effectively removes surface contaminants and improves the internal structure, enhancing the overall quality of the substrate. By comparing initial and re-identification information, the cleaning effect is scientifically evaluated, generating accurate quality scores to ensure the substrate meets quality requirements. Through this series of steps, efficient quality control can be achieved during production, reducing the generation of substandard substrates and improving production efficiency and product quality stability.

[0037] Preferably, the step of analyzing and processing the preliminary identification information of the substrate to obtain the cleaning strategy for the substrate includes: S121: The preliminary identification information is analyzed and processed to obtain the surface adhesion information of the substrate; wherein, the surface adhesion information is used to describe the adhesion type and degree of adhesion of the substrate at various locations on the surface before cleaning. S122: Based on the surface adhesion information, an adaptability evaluation process is performed on several preset cleaning items to obtain the item adaptability of several preset cleaning items to the surface adhesion information; wherein, the preset cleaning item includes a cleaning method, a cleaning intensity corresponding to the cleaning method, and a cleaning time corresponding to the cleaning method, and the item adaptability is used to describe the degree of suitability of the preset cleaning item to the surface adhesion information. S123: The cleaning strategy is to use the preset cleaning project with the best adaptability to the project as the base.

[0038] Specifically, the preliminary identification information is analyzed to determine the type (such as dust, oil, oxides, etc.) and degree (light, moderate, heavy) of the adhering substances at various locations on the substrate surface.

[0039] More specifically, based on the analysis results, a surface adhesion information map of the substrate is generated to describe the type and degree of adhesion on the substrate surface before cleaning treatment.

[0040] More specifically, several cleaning items are listed, including different cleaning methods (such as ultrasonic cleaning, chemical cleaning, mechanical cleaning, etc.), cleaning intensity, cleaning time, etc. Based on the surface adhesion information, the adaptability of each preset cleaning item is evaluated, assessing the cleaning effect of each cleaning method on different types and degrees of adhesion, and generating item adaptability data. For example, ultrasonic cleaning is suitable for removing particulate matter, chemical cleaning is suitable for removing oil stains, and mechanical cleaning is suitable for removing oxide layers. High-intensity cleaning is suitable for heavy adhesions, low-intensity cleaning is suitable for light adhesions, long-term cleaning is suitable for stubborn adhesions, and short-time cleaning is suitable for slight adhesions.

[0041] More specifically, based on project adaptability data, select the cleaning project with the best adaptability, and comprehensively consider the cleaning effect, efficiency and cost to form a base cleaning strategy. Develop a detailed cleaning strategy, including the selected cleaning method, specific cleaning intensity and cleaning time, etc.

[0042] Understandably, by analyzing the preliminary identification information, different types and degrees of deposits on the substrate surface can be accurately identified, ensuring the targeted nature of the cleaning strategy. By evaluating the adaptability of various preset cleaning items, the cleaning method and parameters most suitable for the characteristics of the deposits on the substrate surface can be selected, improving the cleaning effect and efficiency. By evaluating adaptability and selecting the best cleaning strategy, the cleaning time and material consumption can be reduced while ensuring the cleaning effect, thereby reducing the cleaning cost.

[0043] Preferably, the step of performing a quality assessment on the substrate based on the cleaning strategy, the preliminary identification information, and the re-identification information to obtain a substrate quality score includes: S141: The re-identification information is analyzed and processed to obtain the remaining adhesion information of the substrate; wherein, the remaining adhesion information is used to describe the adhesion type and degree of adhesion of the substrate at various locations on the surface after cleaning. S142: Perform difference analysis processing based on the remaining adhesion information and the surface adhesion information to obtain the actual effect characteristics corresponding to the cleaning strategy; S143: Based on the cleaning strategy, perform a prediction and estimation process on the surface adhesion information to determine the cleaning effect, so as to obtain the theoretical effect characteristics of the cleaning strategy. S144: Based on the theoretical and actual effect characteristics of the cleaning strategy, the remaining adhesion information is subjected to adhesion feature correction processing to obtain the corrected surface adhesion information corresponding to the remaining adhesion information; wherein, the corrected surface adhesion information is used to describe the adhesion type and degree of adhesion of the adhering material at each position on the surface of the substrate after the cleaning process. S145: Analyze the impact of the corrected surface adhesion information on the subsequent production process to obtain the substrate quality score; wherein, the first quality score is used to describe the degree of influence of the substrate on the quality of the subsequent production of the iridium oxide electrode.

[0044] Specifically, the cleaned substrate is subjected to laser scanning and ultrasonic identification again to generate re-identification information. The re-identification information is analyzed to determine the type and degree of adhesion of the adhering substances at various locations on the surface of the cleaned substrate, and to generate a residual adhesion information map.

[0045] More specifically, the remaining attachment information is compared and analyzed with the surface attachment information to assess the removal of attachments before and after cleaning, quantify the cleaning effect, and determine the actual cleaning effect based on the difference analysis results, including the types of attachments removed, the degree of removal, and the characteristics and location of the residues.

[0046] More specifically, based on the cleaning strategy, the ideal cleaning effect should be estimated, generating theoretical effect characteristic data of the cleaning strategy, comparing the actual cleaning effect with the theoretical cleaning effect, identifying possible deficiencies or deviations in the cleaning process, and correcting the remaining adhesion information based on the difference between the actual and theoretical effect characteristics to obtain corrected surface adhesion information, describing the type and degree of adhesion at various locations on the substrate surface after cleaning.

[0047] It should be noted that if the identification of the substrate surface attachments is correct, the difference between the actual effect characteristics and the theoretical effect characteristics should be kept within a certain range. If the difference between the actual effect characteristics and the theoretical effect characteristics is not kept within a certain range, it can be inferred that there is a deviation in the identification of the substrate surface attachments. In other words, the surface attachment information and the remaining attachment information deviate from the actual situation.

[0048] More specifically, by analyzing the degree and specific condition of the deviation between the actual effect characteristics and the theoretical effect characteristics, the identification status of the surface attachments of the substrate is corrected to obtain corrected surface attachment information.

[0049] More specifically, based on the corrected surface adhesion information, the potential impact of the substrate on the quality of the iridium oxide electrode in subsequent production is analyzed, including the impact of residual deposits on coating uniformity, adhesion, and electrical properties. Taking into account the corrected residual deposit situation and its potential impact on electrode performance, the overall quality of the substrate is evaluated, and a first quality score is obtained to describe the impact of the substrate on the quality of subsequent electrode production.

[0050] Understandably, by comparing the actual cleaning effect with the theoretical cleaning effect, the effectiveness of the cleaning process can be accurately evaluated, shortcomings can be identified, and data support can be provided for further optimization of the cleaning strategy. The corrected surface adhesion information map accurately describes the state of the substrate after cleaning, which helps to control the impact of residual adhesions and ensure that the substrate surface is suitable for subsequent processes.

[0051] Preferably, the step of performing quality testing on the transition layer of the prepared electrode substrate using a preset adhesion analysis method to obtain a quality score for the transition layer includes: S31: Use a transparent film to perform pressure bonding treatment on the electrode substrate, so that the transition layer between the transparent film and the electrode substrate is in an adhesive state; S32: Perform a rapid separation process on the transparent film that is in an adhesive state with the electrode substrate, so that the transition layer between the transparent film and the electrode substrate switches from an adhesive state to a separated state; S33: Identify coating residues on the transparent film in the separated state, and generate adhesion parameters of the transition layer of the electrode substrate based on the degree of coating residue residues on the transparent film in the separated state. S34: Perform a thickness test on the transition layer of the electrode substrate in the separated state to obtain the thickness characteristic distribution of the transition layer of the electrode substrate, and generate morphology quality parameters of the transition layer of the electrode substrate based on the thickness characteristic distribution of the transition layer of the electrode substrate; wherein, the thickness characteristic distribution is used to describe the thickness of the transition layer of the electrode substrate at various locations. S35: Analyze the impact of the transition layer on subsequent production based on the adhesion parameters and morphology parameters of the transition layer of the electrode substrate to obtain a quality score for the transition layer; wherein, the second quality score is used to describe the degree of influence of the transition layer on the quality of the subsequent production of the iridium oxide electrode.

[0052] Specifically, a transparent film is used to pressure-bond the transition layer of the electrode substrate to ensure that the transparent film is in complete contact with the transition layer and is in an adhesive state.

[0053] More specifically, a rapid separation process is performed on the transparent film in an adhesive state, so that the transition layer between the film and the electrode substrate changes from an adhesive state to a separated state.

[0054] More specifically, the presence of coating residues on the transparent film is examined, the type and quantity of residues are analyzed, and adhesion parameters of the electrode substrate transition layer are generated based on the degree of residue residues on the transparent film to evaluate the adhesion strength of the transition layer.

[0055] More specifically, the thickness of the transition layer of the separated electrode substrate is tested, the thickness of the transition layer at various locations is measured, and a thickness characteristic distribution map of the transition layer is generated based on the measurement results to describe the thickness uniformity of the transition layer. Based on the thickness characteristic distribution, the morphological quality of the transition layer is analyzed, morphological quality parameters are generated, and the surface flatness and uniformity of the transition layer are evaluated.

[0056] More specifically, based on adhesion parameters and morphology parameters, the influence of the transition layer on the quality of subsequent iridium oxide electrode production is analyzed, including the adhesion, uniformity, and electrical properties of the coating. By combining the adhesion parameters and morphology parameters, a quality score for the transition layer is obtained, which is used to describe the influence of the transition layer on the quality of subsequent iridium oxide electrode production.

[0057] Understandably, the adhesion of the transition layer can be effectively assessed through the bonding and separation of transparent films, ensuring that it can firmly adhere to the substrate and provide a reliable foundation for subsequent coatings. Thickness testing and the generation of thickness characteristic distribution maps help to detect the thickness uniformity of the transition layer, ensuring the consistency of the coating thickness and avoiding problems of local over-thickness or under-thinness. Morphology parameter analysis can identify surface flatness and uniformity issues of the transition layer, ensuring that the coating surface quality meets the requirements and avoiding affecting electrode performance.

[0058] Preferably, the step of rapidly separating the transparent film that is in an adhesive state with the electrode substrate, so that the transition layer between the transparent film and the electrode substrate changes from an adhesive state to a separated state, includes: S321: The transparent film that is in an adhesive state to the electrode substrate is cut to separate the portion of the transparent film that is in an adhesive state to the electrode substrate from the portion that is not in an adhesive state to the electrode substrate. The transparent film that remains in an adhesive state to the electrode substrate after the cutting process is marked as the film to be tested, and the transparent film that does not remain in an adhesive state to the electrode substrate after the cutting process is marked as the film to be used. The film to be used is used for subsequent adhesion processing of the remaining electrode substrate. S322: The film to be tested is fixed by a clamping mechanism, and the electrode substrate is driven rapidly by a driving mechanism, so that the transition layer between the film to be tested and the electrode substrate is switched from an adhesive state to a separated state.

[0059] Specifically, using a cutting tool (such as a laser cutter or precision cutter), the transparent film is cut along the edge of the electrode substrate surface, dividing the transparent film into two parts. One part is in an adhesive state with the electrode substrate and is marked as the film to be tested; the other part is not in an adhesive state with the electrode substrate and is marked as the film to be used.

[0060] More specifically, the film to be tested is separated from the film to be used. The film to be used is reserved for subsequent use. It should be noted that these mechanisms are all implemented using automated equipment. The film to be used can be a film roll containing a large number of films. The film to be used is continuously extended by the selection of automated equipment to be bonded to the electrode substrate to achieve automated detection.

[0061] More specifically, a clamping mechanism (such as a mechanical clamp or vacuum adsorption device) is used to fix the film to be tested, ensuring that it will not slip or shift during the separation process. The position of the clamping mechanism is adjusted according to the size and shape of the electrode substrate to ensure that the film to be tested remains stable throughout the separation process. A driving mechanism (such as an electric slide or pneumatic push rod) is prepared, and the electrode substrate is placed on the driving mechanism. The driving mechanism rapidly drives the electrode substrate, moving it quickly in a direction perpendicular to the adhesive direction of the transparent film, causing the transition layer between the film to be tested and the electrode substrate to switch from an adhesive state to a separated state.

[0062] Understandably, the transparent film is precisely cut using a cutting tool to ensure that the film under test remains adhered to the electrode substrate after cutting, thus avoiding damage to the transition layer. The film under test and the film to be used are marked to ensure clarity and operability in subsequent operations and to avoid confusion. The film under test is fixed using a clamping mechanism to ensure its stability during the separation process and to prevent the test results from being affected by slippage or displacement.

[0063] Preferably, the step of performing quality testing on the iridium oxide coating of the prepared iridium oxide electrode using a preset X-ray testing and evaluation method to obtain a quality score for the iridium oxide coating includes: S51: Perform X-ray photoelectron spectroscopy analysis on the iridium oxide coating of the iridium oxide electrode to obtain the X-ray photoelectron spectrum of the iridium oxide coating of the iridium oxide electrode; wherein, the X-ray photoelectron spectrum is used to evaluate the material purity and oxidation state of the iridium oxide coating. S52: Perform X-ray diffraction analysis on the iridium oxide coating of the iridium oxide electrode to obtain the X-ray diffraction pattern of the iridium oxide coating of the iridium oxide electrode; wherein, the X-ray diffraction pattern is used to evaluate the crystal structure and phase composition of the iridium oxide coating; S53: Conductivity prediction processing is performed based on the X-ray photoelectron energy spectrum and the X-ray diffraction pattern to obtain the iridium oxide coating quality score of the iridium oxide electrode.

[0064] Specifically, the prepared iridium oxide electrode sample is placed in the sample chamber of an X-ray photoelectron spectrometer, ensuring that the sample surface is clean and free of contamination. X-ray photoelectron spectroscopy analysis is performed on the sample to obtain the XPS spectrum of the iridium oxide coating. By analyzing the elemental peaks in the XPS spectrum, the elemental composition, chemical bonding state, and oxidation state of the iridium oxide coating are determined.

[0065] More specifically, the prepared iridium oxide electrode sample is placed on the sample stage of an X-ray diffractometer, ensuring that the sample surface is flat and free of impurities. X-ray diffraction analysis is performed on the sample to obtain the XRD pattern of the iridium oxide coating. By analyzing the diffraction peaks in the XRD pattern, the crystal structure, grain size and phase composition of the iridium oxide coating are determined.

[0066] More specifically, by combining XPS and XRD spectral data, the material purity, oxidation state, crystal structure and phase composition of the iridium oxide coating are analyzed. Based on the coating composition and structural information obtained from the XPS and XRD spectra, the conductivity characteristics of the iridium oxide coating are inferred. By combining the XPS and XRD analysis results, the overall quality of the iridium oxide coating is evaluated and a quality score for the iridium oxide coating is generated.

[0067] Understandably, elemental analysis using XPS spectra can determine the purity of the iridium oxide coating, detect the presence of impurity elements, and provide chemical state information of the elements in the iridium oxide coating, helping to determine its oxidation state and uniformity. The positions and intensities of diffraction peaks in XRD spectra can reveal the crystal structure of the iridium oxide coating, helping to determine if it possesses the expected crystal phase. XRD spectra can also determine the phase composition of the iridium oxide coating and assess the presence of other unexpected phases. Combining XPS and XRD data allows for a comprehensive evaluation of the chemical composition, oxidation state, crystal structure, and phase composition of the iridium oxide coating, inferring its conductivity. Based on the comprehensive evaluation results, an iridium oxide coating quality score is generated, providing a quantitative indicator of coating quality to guide subsequent production and quality control.

[0068] Preferably, the step of generating the electrode quality score of the qualified electrode based on the substrate quality score, transition layer quality score, and iridium oxide coating quality score of the qualified electrode includes: S61: Retrieve several types of analysis items and the corresponding weight allocation formulas for these analysis items; S62: According to the weight allocation formula corresponding to the analysis item, the first quality score, the second quality score and the third quality score are weighted and then superimposed to obtain the weighted quality score corresponding to the analysis item. S63: The weighted quality scores corresponding to several of the analysis items are used together as the electrode quality score.

[0069] Specifically, the analytical items that need to be evaluated are identified, including the quality scores of the substrate, transition layer, and iridium oxide coating. The weighting formulas for each analytical item are retrieved, and these formulas will be used to calculate the contribution of each item to the total score.

[0070] More specifically, the substrate quality score is weighted according to the weighting formula, and its weighted quality score in the total score is calculated. The transition layer quality score is weighted according to the weighting formula, and its weighted quality score in the total score is calculated. The iridium oxide coating quality score is weighted according to the weighting formula, and its weighted quality score in the total score is calculated.

[0071] More specifically, the first quality score, the second quality score, and the third quality score after weight allocation are superimposed to obtain the total quality score of the electrode.

[0072] More specifically, the weighted quality scores of several analytical items are combined to form the final quality score of the electrode. Through comprehensive scoring, the overall quality of the electrode is evaluated to ensure that it meets the expected quality standards and performance requirements.

[0073] Understandably, different analytical items represent the analysis of the quality of the iridium oxide electrode in a specific aspect. For different specific aspects of quality analysis, the proportion of influence of the quality score of each component is different. Therefore, different weighting formulas are used for different analytical items.

[0074] Reference Figure 2 As shown, in a second aspect, the present invention provides an apparatus for preparing an iridium oxide electrode, used to implement the method for preparing an iridium oxide electrode as described in any one of the first aspects, comprising: The first evaluation module is used to prepare the substrate of the iridium oxide electrode and to perform quality testing on the prepared substrate using a preset cleaning difference analysis method to obtain a substrate quality score. The first classification module is used to classify the substrate according to the substrate quality score, so as to classify the substrate into qualified substrates and unqualified substrates. The second evaluation module is used to prepare the transition layer of the iridium oxide electrode based on the qualified substrate to obtain an electrode substrate composed of the substrate and the transition layer, and to perform quality testing on the transition layer of the prepared electrode substrate by a preset adhesive separation analysis method to obtain a quality score of the transition layer. The second classification module is used to classify the electrode substrate according to the quality score of the transition layer, so as to classify the electrode substrate into qualified substrate and unqualified substrate. The third evaluation module is used to prepare an iridium oxide coating for the iridium oxide electrode based on the qualified substrate, so as to obtain an iridium oxide electrode composed of the electrode substrate and the iridium oxide coating, and to perform quality testing on the iridium oxide coating of the prepared iridium oxide electrode by a preset X-ray testing evaluation method to obtain a quality score of the iridium oxide coating. The third classification module is used to classify the iridium oxide electrode according to the iridium oxide coating quality score, so as to classify the iridium oxide electrode into qualified electrodes and unqualified electrodes, and generate the electrode quality score of the qualified electrode based on the substrate quality score, transition layer quality score and iridium oxide coating quality score of the qualified electrode.

[0075] In this embodiment, the specific implementation of each module in the above device embodiment is described in the above method embodiment, and will not be repeated here.

[0076] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for producing an iridium oxide electrode, characterized by, The iridium oxide electrode comprises a substrate, a transition layer and an iridium oxide coating layer, comprising: The substrate is prepared and quality detection is performed on the substrate by a cleaning difference analysis method to obtain a substrate quality score; The substrate is classified into a qualified substrate and an unqualified substrate according to the substrate quality score; The transition layer is prepared based on the qualified substrate to obtain an electrode substrate, and quality detection is performed on the transition layer of the electrode substrate by a sticking separation analysis method to obtain a transition layer quality score; The electrode substrate is classified into a qualified substrate and an unqualified substrate according to the transition layer quality score; The iridium oxide coating layer is prepared based on the qualified substrate to obtain an iridium oxide electrode.

2. The method for producing an iridium oxide electrode according to claim 1, wherein The step of performing quality detection on the prepared substrate by a preset cleaning difference analysis method to obtain the substrate quality score comprises: The prepared substrate is subjected to preliminary identification processing to obtain preliminary identification information of the substrate; wherein the preliminary identification processing mode comprises laser scanning identification and ultrasonic identification; Analysis processing is performed according to the preliminary identification information of the substrate to obtain a cleaning strategy of the substrate; The substrate is subjected to corresponding cleaning processing according to the cleaning strategy, and the substrate subjected to the cleaning processing is subjected to re-identification processing to obtain re-identification information of the substrate; Quality evaluation processing is performed on the substrate according to the cleaning strategy, the preliminary identification information and the re-identification information to obtain the substrate quality score.

3. The method for producing an iridium oxide electrode according to claim 2, wherein The step of performing analysis processing according to the preliminary identification information of the substrate to obtain a cleaning strategy of the substrate comprises: Analysis processing is performed on the preliminary identification information to obtain surface attachment information of the substrate; wherein the surface attachment information is used to describe the attachment type and attachment degree of the attachments at each position on the surface of the substrate before cleaning processing; Adaptive evaluation processing is performed on a plurality of preset cleaning items according to the surface attachment information to obtain item adaptability of the plurality of preset cleaning items corresponding to the surface attachment information; The preset cleaning item with the best item adaptability is taken as the cleaning strategy of the substrate.

4. The method for producing an iridium oxide electrode according to claim 2, wherein The step of performing quality evaluation processing on the substrate according to the cleaning strategy, the preliminary identification information and the re-identification information to obtain the substrate quality score comprises: Analysis processing is performed on the re-identification information to obtain residual attachment information of the substrate; wherein the residual attachment information is used to describe the attachment type and attachment degree of the attachments at each position on the surface of the substrate after cleaning processing; Difference analysis processing is performed according to the residual attachment information and the surface attachment information to obtain actual effect characteristics corresponding to the cleaning strategy; Speculative estimation processing is performed on the surface attachment information according to the cleaning strategy to obtain theoretical effect characteristics of the cleaning strategy; According to the theoretical effect characteristics and the actual effect characteristics of the cleaning strategy, the remaining attachment information is subjected to attachment feature correction processing to obtain corrected surface attachment information corresponding to the remaining attachment information, wherein the corrected surface attachment information is used to describe the attachment type and the attachment degree of the attachments at each position on the surface of the substrate after the cleaning processing. According to the corrected surface attachment information, the influence degree of subsequent production is analyzed and processed to obtain the substrate quality score, wherein the first quality score is used to describe the quality influence degree of the substrate on the subsequent production of the iridium oxide electrode.

5. The method for producing an iridium oxide electrode according to claim 1, wherein The quality detection of the transition layer of the electrode substrate prepared by the preset adhesion analysis method includes: The transparent film is subjected to pressure adhesion processing on the electrode substrate, so that the transparent film and the transition layer of the electrode substrate are in an adhesion state; The transparent film in the adhesion state with the electrode substrate is subjected to rapid separation processing, so that the transparent film and the transition layer of the electrode substrate are switched from the adhesion state to the separation state; The transparent film in the separation state is subjected to identification processing of the coating residue, and the adhesion force parameters of the transition layer of the electrode substrate are generated according to the residual degree of the coating residue of the transparent film in the separation state; The transition layer of the electrode substrate in the separation state is subjected to thickness testing to obtain the thickness characteristic distribution of the transition layer of the electrode substrate, and the topographic parameters of the transition layer of the electrode substrate are generated according to the thickness characteristic distribution of the transition layer of the electrode substrate; wherein the thickness characteristic distribution is used to describe the thickness of each position of the transition layer of the electrode substrate. According to the adhesion force parameters and the topographic parameters of the transition layer of the electrode substrate, the influence degree of subsequent production is analyzed and processed to obtain the transition layer quality score; wherein the second quality score is used to describe the quality influence degree of the transition layer on the subsequent production of the iridium oxide electrode.

6. The method for producing an iridium oxide electrode according to claim 5, wherein The transparent film in the adhesion state with the electrode substrate is subjected to rapid separation processing, so that the transparent film and the transition layer of the electrode substrate are switched from the adhesion state to the separation state, which includes: The transparent film in the adhesion state with the electrode substrate is subjected to cutting processing to separate the part of the transparent film in the adhesion state with the electrode substrate from the part not in the adhesion state with the electrode substrate, the transparent film remaining in the adhesion state with the electrode substrate after cutting processing is marked as a test film, and the transparent film not remaining in the adhesion state with the electrode substrate after cutting processing is marked as a standby film; wherein the standby film is used for subsequent adhesion processing on the remaining electrode substrate; The test film is fixed by a clamping mechanism, and the electrode substrate is rapidly driven by a driving mechanism, so that the test film and the transition layer of the electrode substrate are switched from the adhesion state to the separation state.

7. The method for producing an iridium oxide electrode according to claim 1, wherein Also includes: The quality of the iridium oxide coating of the iridium oxide electrode is detected by a preset ray test evaluation method to obtain an iridium oxide coating quality score, the iridium oxide electrode is classified into a qualified electrode and an unqualified electrode according to the iridium oxide coating quality score, and an electrode quality score of the qualified electrode is generated according to the substrate quality score, the transition layer quality score and the iridium oxide coating quality score.

8. The method for producing an iridium oxide electrode according to claim 7, wherein The step of detecting the quality of the iridium oxide coating of the prepared iridium oxide electrode by a preset ray test evaluation method to obtain an iridium oxide coating quality score comprises: The X-ray photoelectron spectroscopy of the iridium oxide coating of the iridium oxide electrode is analyzed to obtain an X-ray photoelectron spectroscopy spectrum of the iridium oxide coating of the iridium oxide electrode; The X-ray diffraction of the iridium oxide coating of the iridium oxide electrode is analyzed to obtain an X-ray diffraction spectrum of the iridium oxide coating of the iridium oxide electrode; The quality score of the iridium oxide coating of the iridium oxide electrode is obtained by inferring the conductive performance according to the X-ray photoelectron spectroscopy spectrum and the X-ray diffraction spectrum.

9. An apparatus for producing an iridium oxide electrode, characterized by comprising: A preparation method of an iridium oxide electrode according to any one of claims 1-8, comprising: A first evaluation module is configured to prepare a substrate of the iridium oxide electrode, and detect the quality of the prepared substrate by a preset cleaning difference analysis method to obtain a substrate quality score; A first classification module is configured to classify the substrate according to the substrate quality score to classify the substrate into a qualified substrate and an unqualified substrate; A second evaluation module is configured to prepare a transition layer of the iridium oxide electrode based on the qualified substrate to obtain an electrode substrate composed of the substrate and the transition layer, and detect the quality of the transition layer of the prepared electrode substrate by a preset adhesion separation analysis method to obtain a transition layer quality score; A second classification module is configured to classify the electrode substrate according to the transition layer quality score to classify the electrode substrate into a qualified electrode substrate and an unqualified electrode substrate; A coating preparation module is configured to prepare an iridium oxide coating of the iridium oxide electrode based on the qualified electrode substrate to obtain an iridium oxide electrode composed of the electrode substrate and the iridium oxide coating.

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