Delay test system and method based on hall switch devices

Abstract

The application provides a delay test system and method based on a Hall switch device, comprising: a magnetic field generation module containing a programmable current source and a coil to generate a precisely controlled magnetic field change; a temperature control module integrating a temperature sensor and a heating / cooling device to realize constant temperature or temperature scanning test; a signal acquisition module using a high-frequency sampling device to collect Hall device output signals; a data processing module using an embedded processor to realize automatic threshold detection and delay calculation; a general test interface using a test seat with replaceable probes to adapt to different packaged devices; a digital communication interface using an SPI or I2C interface to output test results; in the application, the main structures include a magnetic field generation module, a temperature control module, a signal acquisition module, a data processing module, a general test interface, a digital communication interface and a threshold calibration module, and these modules cooperate with each other to provide a solid foundation for precisely testing the delay characteristics of the Hall switch device.

Description

Technical Field

[0001] This invention belongs to the field of Hall effect switching devices, specifically a delay testing system and method based on Hall effect switching devices. Background Technology

[0002] In practical applications of Hall effect switching devices, accurate testing of their performance is crucial. Hall current sensors are mainly suitable for isolating and converting complex signals such as AC, DC, and pulse. Through the Hall effect principle, the converted signal can be directly acquired and received by various acquisition devices such as AD, DSP, PLC, and secondary instruments. They have fast response time, wide current measurement range, high accuracy, strong overload capacity, good linearity, and strong anti-interference ability.

[0003] However, existing testing systems and methods have many shortcomings. Some systems struggle to precisely control magnetic field changes, significantly reducing the accuracy of test results. Some testing methods cannot effectively address the impact of different temperature environments on the delay characteristics of Hall effect switching devices, resulting in a lack of comprehensiveness and reliability in the test results. Currently, most Hall effect switching device manufacturers do not test delay parameters at the factory, typically relying on design specifications, which cannot accurately detect the switching delay of actual products. Testing requires changing the magnetic field strength to exceed the switching threshold, but the matching between the magnetic field change interval and the Hall effect device delay time affects measurement accuracy. Traditional methods require manual adjustment of a dual-trace oscilloscope, resulting in slow measurement speed and significant subjective influence. The sensitivity of Hall effect devices varies with temperature, and existing testing systems lack effective temperature compensation mechanisms. Different package sizes of Hall effect devices require different test sockets, increasing testing costs.

[0004] In summary, this invention provides a delay testing system and method based on Hall effect switching devices to solve the above-mentioned problems. Summary of the Invention

[0005] To address the aforementioned technical problems, this invention provides a delay testing system and method based on Hall effect switching devices, thereby solving the problems of existing testing systems lacking effective temperature compensation mechanisms, requiring different test sockets for Hall effect devices with different package specifications, and increasing testing costs.

[0006] The delay testing system based on Hall effect switching devices includes:

[0007] Magnetic field generating module: includes a programmable current source and coils to generate precisely controlled magnetic field changes;

[0008] Temperature control module: integrates temperature sensor and heating / cooling device to achieve constant temperature or temperature scanning test;

[0009] Signal acquisition module: High-frequency sampling equipment acquires the output signal of the Hall effect device;

[0010] Data processing module: The embedded processor enables automatic threshold detection and delay calculation;

[0011] Universal test interface: The test socket with replaceable probes is compatible with different packaged devices;

[0012] Digital communication interface: SPI or I2C interface outputs test results;

[0013] Threshold calibration module: Apply a slowly changing magnetic field to accurately determine the actual switching threshold of the Hall device.

[0014] Furthermore, in the signal acquisition module, the sampling rate of the high-frequency sampling device is not less than 100 MSPS.

[0015] Furthermore, in the threshold calibration module, the rate of change of the magnetic field is less than 1 mT / s.

[0016] A test method for a delay test system based on Hall effect switching devices includes the following steps:

[0017] Signal receiving stage: On the one hand, the signal processing circuit board receives the measurement signal from the Hall sensor, processes it into a standard signal and transmits it to the microcontroller. On the other hand, based on the data transmitted by the microcontroller, it generates corresponding control signals to enable the Hall sensor to work under specified conditions. The microcontroller transmits the measurement signal to the computer through a general test interface and receives the control signal.

[0018] Delay testing phase: Apply a rapidly changing magnetic field (rate of change > 1T / s) and record the time difference between the theoretical action time and the actual action time;

[0019] Temperature compensation phase: Repeated tests at different temperatures to establish a delay time-temperature characteristic model;

[0020] Results output stage: Automatically calculates and outputs parameters such as delay time, switching threshold and its temperature coefficient.

[0021] Furthermore, when outputting control signals, the Hall sensor is made to operate under a fixed magnetic field strength and different excitation currents, or under a fixed excitation current and different magnetic field strengths. The sensor will output a series of no-load Hall potentials. Through computer calculation, the sensitivity KH under different conditions is calculated. Under a fixed magnetic field strength and excitation current, the voltage of the electric heater and the ambient temperature signal of the measurement and testing system are changed by the control signal to measure the temperature coefficient of the Hall potential of the sensor.

[0022] Furthermore, in the signal receiving stage, the data transmission between the microcontroller and the computer is achieved through a general-purpose test interface. The computer transmits control commands and data to the microcontroller, which then transmits the signals to the signal processing circuit board. The output signal of the signal processing circuit board is then measured and transmitted back to the computer through the general-purpose test interface.

[0023] Furthermore, the potentiometer for adjusting the magnetic field strength is a digital potentiometer, which precisely adjusts the field strength. Before use, a field strength meter with a higher precision is used to measure the magnetic field strength of the digital potentiometer at different resistance values, and the corresponding data is stored in the computer as the basis for adjusting the magnetic field strength.

[0024] Furthermore, in the temperature compensation stage, a thermistor is used as a temperature sensor, and the electric heater uses a resistance wire powered by 220V AC. In order to reduce the thermal inertia of the heater and facilitate temperature control, the resistance wire is wound on a plane and a small fan is used to make the temperature distribution in the test system uniform and to make the temperature of the Hall sensor reach a stable state relatively quickly. A single-loop closed-loop control system is adopted.

[0025] Compared with the prior art, the present invention has the following beneficial effects:

[0026] 1. The main structure of this invention includes a magnetic field generation module, a temperature control module, a signal acquisition module, a data processing module, a general test interface, a digital communication interface, and a threshold calibration module. These modules work together to provide a solid foundation for accurately testing the delay characteristics of Hall switch devices.

[0027] 2. This invention utilizes a programmable current source and coil in the magnetic field generation module to generate precisely controlled magnetic field changes, significantly improving test accuracy. The temperature control module integrates a temperature sensor and heating / cooling device, enabling constant temperature or temperature scanning tests, effectively addressing the impact of different temperature environments on test results. The high-frequency sampling device in the signal acquisition module accurately acquires the Hall effect device's output signal, while the embedded processor in the data processing module performs automatic threshold detection and delay calculation, improving test efficiency and accuracy. The universal test interface with replaceable probes adapts to different packaged devices, enhancing system versatility. The digital communication interface outputs test results via SPI or I2C, offering convenience and speed. The threshold calibration module applies a slowly changing magnetic field to accurately determine the actual switching threshold of the Hall effect device, further improving test accuracy. In terms of testing methodology, the design of each stage is scientifically sound and reasonable, comprehensively and systematically ensuring the reliability and comprehensiveness of the test results, from signal reception and delay testing to temperature compensation and result output.

[0028] 3. This invention improves measurement accuracy by employing dual-mode magnetic field control technology, combining slow magnetic field (for precise threshold determination) and fast magnetic field (for delay measurement) control; the dynamic temperature compensation algorithm eliminates the influence of temperature on test results through real-time temperature monitoring and compensation; it adopts a replaceable probe and needle sleeve design to adapt to Hall devices of different package specifications and adaptive test interface; it integrates a high-speed ADC and digital filter to improve signal acquisition accuracy and anti-interference capability; and it simultaneously acquires multiple parameters such as delay time, switching threshold, and temperature characteristics during a single test. Attached Figure Description

[0029] Figure 1 This is a flowchart of the method of the present invention. Detailed Implementation

[0030] The embodiments of the present invention will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and should not be construed as limiting the scope of the invention.

[0031] like Figure 1 As shown, the present invention provides a delay testing system based on Hall effect switching devices, comprising:

[0032] Magnetic field generating module: includes a programmable current source and coils to generate precisely controlled magnetic field changes;

[0033] Temperature control module: integrates temperature sensor and heating / cooling device to achieve constant temperature or temperature scanning test;

[0034] Signal acquisition module: High-frequency sampling equipment acquires the output signal of the Hall effect device;

[0035] Data processing module: The embedded processor enables automatic threshold detection and delay calculation;

[0036] Universal test interface: The test socket with replaceable probes is compatible with different packaged devices;

[0037] Digital communication interface: SPI or I2C interface outputs test results;

[0038] Threshold calibration module: Apply a slowly changing magnetic field to accurately determine the actual switching threshold of the Hall device.

[0039] In one embodiment of the present invention, the sampling rate of the high-frequency sampling device in the signal acquisition module is not less than 100 MSPS.

[0040] In one embodiment of the present invention, the rate of change of the magnetic field in the threshold calibration module is less than 1 mT / s.

[0041] A test method for a delay test system based on Hall effect switching devices includes the following steps:

[0042] Signal receiving stage: On the one hand, the signal processing circuit board receives the measurement signal from the Hall sensor, processes it into a standard signal and transmits it to the microcontroller. On the other hand, based on the data transmitted by the microcontroller, it generates corresponding control signals to enable the Hall sensor to work under specified conditions. The microcontroller transmits the measurement signal to the computer through a general test interface and receives the control signal.

[0043] Delay testing phase: Apply a rapidly changing magnetic field (rate of change > 1T / s) and record the time difference between the theoretical action time and the actual action time;

[0044] Temperature compensation phase: Repeated tests at different temperatures to establish a delay time-temperature characteristic model;

[0045] Results output stage: Automatically calculates and outputs parameters such as delay time, switching threshold and its temperature coefficient.

[0046] As one embodiment of the present invention, when outputting the control signal, the Hall sensor is made to operate under a certain fixed magnetic field strength and different excitation currents, or under a certain fixed excitation current and different magnetic field strengths, the sensor will output a series of no-load Hall potentials. Through computer calculation, the sensitivity KH under different conditions is calculated. Under a certain fixed magnetic field strength and excitation current, the voltage of the electric heater and the ambient temperature signal of the measurement and testing system are changed by the control signal to measure the temperature coefficient of the Hall potential of the sensor.

[0047] In one embodiment of the present invention, during the signal receiving stage, the data transmission between the microcontroller and the computer is achieved through a general-purpose test interface. The computer transmits control commands and data to the microcontroller, which then transmits the signals to the signal processing circuit board. The output signal of the signal processing circuit board is then measured and transmitted back to the computer through the general-purpose test interface.

[0048] As one embodiment of the present invention, the potentiometer for adjusting the magnetic field strength is a digital potentiometer, which can accurately adjust the field strength. Before use, a field strength meter with a higher precision is used to measure the magnetic field strength of the digital potentiometer at different resistance values, and the corresponding data are stored in the computer as the basis for adjusting the magnetic field strength.

[0049] In one embodiment of the present invention, during the temperature compensation stage, a thermistor is used as a temperature sensor, and the electric heater uses a resistance wire powered by 220V AC. In order to reduce the thermal inertia of the heater and facilitate temperature control, the resistance wire is wound on a plane and a small fan is used to make the temperature distribution in the test system uniform and to make the temperature of the Hall sensor reach a stable state relatively quickly. A single-loop closed-loop control system is adopted.

[0050] A temperature compensation mechanism is adopted because the sensitivity of existing Hall effect devices is greatly affected by temperature. Introducing a temperature compensation circuit improves the accuracy of testing.

[0051] Improved testing efficiency and optimized magnetic field generator control algorithm enable faster batch testing.

[0052] Miniaturization and integration are achieved through the design of a dedicated test socket structure to accommodate Hall effect devices with different packaging specifications.

[0053] Digital interface and signal processing, combined with digital signal processing technology to improve anti-interference capability.

[0054] Multi-parameter synchronous testing detects other key parameters such as switching threshold and temperature characteristics while performing delay testing.

[0055] The delay testing system and method based on Hall effect switching devices of this invention will demonstrate stronger competitiveness in practical applications. By employing a temperature compensation mechanism, the influence of temperature on the sensitivity of Hall effect devices can be effectively reduced, resulting in more accurate and reliable test results and providing strong support for the performance evaluation of Hall effect switching devices under different temperature environments.

[0056] In terms of improving testing efficiency, optimizing the magnetic field generator control algorithm can reduce the time for each test, enabling faster batch testing. For Hall effect switch manufacturers, this can significantly improve production efficiency, reduce production costs, and gain a competitive edge in the market.

[0057] The miniaturized and integrated design allows the test system to adapt to Hall effect devices in different package sizes, eliminating the need for separate test sockets for each package size and significantly reducing testing costs. At the same time, the miniaturized design also makes it easy to carry and use, improving the flexibility and applicability of the test system.

[0058] The combination of digital interface and signal processing technology enhances the system's anti-interference capability. In complex electromagnetic environments, it can accurately acquire and process the output signals of Hall devices, avoiding the influence of interference signals on test results, and further improving the accuracy and stability of the test.

[0059] The multi-parameter synchronous testing function can detect other key parameters, such as switching threshold and temperature characteristics, while performing delay testing. This makes the test results more comprehensive, providing richer information for the performance evaluation of Hall switch devices. It helps users better understand the performance characteristics of the devices and provides a reference for their selection and use in practical applications.

[0060] In the future, as the application of Hall effect switching devices continues to expand in various fields, the requirements for their performance testing will become increasingly stringent. The delay testing system and method based on Hall effect switching devices of this invention will be continuously optimized and improved to meet market demands and provide higher-quality testing solutions for the research, development, production, and application of Hall effect switching devices.

[0061] The delay testing system and method based on Hall effect switching devices of this invention have broad development prospects and application potential. Through continuous innovation and improvement, it will provide a more efficient, accurate, and comprehensive solution for the performance testing of Hall effect switching devices, promoting the widespread application of Hall effect switching devices in various fields.

[0062] The system achieves comprehensive testing of the delay characteristics of Hall effect switching devices through modular design and precise control. The magnetic field generation module utilizes a programmable current source and coil to ensure high precision and stability of magnetic field changes, meeting the needs of various testing conditions. The temperature control module, through the integration of sensors and heating / cooling devices, enables isothermal or gradient testing over a wide temperature range, eliminating the impact of temperature fluctuations on test results. The signal acquisition module employs high-frequency sampling technology to capture subtle changes in the Hall effect device's output signal, providing reliable data support for subsequent analysis. The embedded processor in the data processing module features automatic threshold detection and, combined with intelligent algorithms, performs precise calculations of the delay time. Furthermore, the design of a universal test interface and a digital communication interface enhances the system's compatibility and scalability, making it suitable for Hall effect devices in various package sizes and supporting the digital transmission and storage of test results. These modules work together to significantly improve testing efficiency and accuracy, providing a scientific basis for the performance evaluation of Hall effect switching devices.

[0063] In practical applications, this system can meet the needs of various complex testing scenarios. For example, in the field of industrial automation, Hall effect switches are often used to detect the motion state of machinery, and their delay characteristics directly affect the system's response speed and stability. Through the precise testing of this system, users can fully understand the performance indicators of the devices, thereby optimizing system design and improving overall operating efficiency. Furthermore, in the field of automotive electronics, Hall effect switches are widely used in key areas such as engine control and vehicle speed detection, where their reliability and accuracy are crucial. This system, through multi-parameter synchronous testing and temperature compensation mechanisms, can complete a comprehensive evaluation under simulated real-world conditions, providing a scientific basis for device selection and quality control.

[0064] To further enhance the system's practical value, artificial intelligence technology can be incorporated to conduct in-depth analysis of test data. For example, machine learning algorithms can be used to model a large number of test results, predicting the performance of Hall effect switches under different operating conditions and providing users with more intuitive decision support. Simultaneously, with the development of IoT technology, the testing system can also achieve remote monitoring and data analysis via the network, allowing users to easily grasp test progress and results in real time, improving work efficiency. This intelligent and networked upgrade direction will make the system more competitive in the future.

[0065] The embodiments of the present invention are given for the purposes of illustration and description. Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A delay test system based on Hall switch devices, characterized in that, include: Magnetic field generating module: includes a programmable current source and coils to generate precisely controlled magnetic field changes; Temperature control module: integrates temperature sensor and heating / cooling device to achieve constant temperature or temperature scanning test; Signal acquisition module: High-frequency sampling equipment acquires the output signal of the Hall effect device; Data processing module: The embedded processor enables automatic threshold detection and delay calculation; Universal test interface: The test socket with replaceable probes is compatible with different packaged devices; Digital communication interface: SPI or I2C interface outputs test results; Threshold calibration module: Apply a slowly changing magnetic field to accurately determine the actual switching threshold of the Hall device; In the signal acquisition module, the sampling rate of the high-frequency sampling device is not less than 100 MSPS; In the threshold calibration module, the rate of change of the magnetic field is less than 1 mT / s; The heating / cooling device is a resistance wire electric heater powered by 220V AC. The resistance wire is wound on a plane and equipped with a small fan to ensure uniform temperature distribution in the test system. The data processing module also includes a signal processing circuit board and a microcontroller; The signal processing circuit board is used to receive the measurement signal from the Hall sensor, process it into a standard signal and transmit it to the microcontroller, and generate corresponding control signals based on the data transmitted by the microcontroller. The microcontroller is used to transmit data to the computer through the general test interface; in the magnetic field generating module, the potentiometer for adjusting the magnetic field strength is a digital potentiometer, which can accurately adjust the field strength. Before use, a field strength meter with a higher precision is used to measure the magnetic field strength of the digital potentiometer at different resistance values, and the corresponding data is stored in the computer as the basis for adjusting the magnetic field strength. The testing method includes the following steps: Signal receiving stage: On the one hand, the signal processing circuit board receives the measurement signal from the Hall sensor, processes it into a standard signal and transmits it to the microcontroller. On the other hand, based on the data transmitted by the microcontroller, it generates corresponding control signals to enable the Hall sensor to work under specified conditions. The microcontroller transmits the measurement signal to the computer through a general test interface and receives the control signal. Delay testing phase: Apply a rapidly changing magnetic field and record the time difference between the theoretical action time and the actual action time; Temperature compensation phase: Repeated tests at different temperatures to establish a time delay-temperature characteristic model; Results output stage: Automatically calculates and outputs parameters such as delay time, switching threshold and its temperature coefficient.

2. The test method of the delay test system based on the Hall switching device according to claim 1, wherein, When outputting control signals, the Hall sensor is made to operate under a fixed magnetic field strength and different excitation currents, or under a fixed excitation current and different magnetic field strengths. The sensor will output a series of no-load Hall potentials. Through computer calculation, the sensitivity KH under different conditions is calculated. Under a fixed magnetic field strength and excitation current, the voltage of the electric heater and the ambient temperature signal of the measurement and testing system are changed by the control signal to measure the temperature coefficient of the Hall potential of the sensor.

3. The test method for the delay test system based on Hall switch devices as described in claim 1, characterized in that, During the signal receiving phase, data transmission between the microcontroller and the computer is achieved through a general-purpose test interface. The computer sends control commands and data to the microcontroller, which then transmits the signals to the signal processing circuit board. The output signal of the signal processing circuit board is then measured and sent back to the computer through the general-purpose test interface.

4. The test method of the delay test system based on the Hall switching device according to claim 1, wherein, In the temperature compensation stage, a thermistor is used as a temperature sensor, and the electric heater uses a resistance wire powered by 220V AC. In order to reduce the thermal inertia of the heater and facilitate temperature control, the resistance wire is wound on a plane and a small fan is used to make the temperature distribution in the test system uniform and to make the temperature of the Hall sensor reach a stable state relatively quickly. A single-loop closed-loop control system is adopted.

5. The test method of the delay test system based on the Hall switching device according to claim 1, wherein, During the delay test phase, the applied rapidly changing magnetic field has a change rate greater than 1 T / s.

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