Connector buckling state detection method, device and test system

Abstract

The invention discloses a connector buckling state detection method and device and a test system. The connector buckling state detection method comprises the steps of obtaining device impedance corresponding to a detection channel on a to-be-detected connector based on a first excitation signal; comparing the device impedance with a preset impedance threshold value; under the condition that the impedance of the device is smaller than a preset impedance threshold value, according to the aging degree parameter and the environment temperature parameter of the connector to be tested, a preset reference voltage is dynamically adjusted, and a current threshold voltage is obtained; based on the second excitation signal, obtaining a detection voltage corresponding to a detection channel on the to-be-detected connector; wherein the second excitation signal is different from the first excitation signal; comparing the detection voltage with a threshold voltage; and under the condition that the detection voltage is greater than the threshold voltage, determining that the to-be-detected connector is normally buckled. According to the embodiment of the invention, the buckling state of the connector is determined through dual detection of impedance and level, so that detection interference caused by external factors is avoided, and the detection accuracy is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of device testing, and in particular to a connector fastening state detection method, device and testing system. BACKGROUND

[0002] Connectors are commonly used to connect electronic components, devices or systems in a circuit for current, signal and data transmission. In the field of electronic device testing, the reliability of the fastening state of the connector is crucial to the accuracy of the testing of the electronic device.

[0003] In the prior art, the fastening state of the connector is mostly determined by the high and low levels of the pin signal of the connector.

[0004] However, the determination method by the high and low levels of the pin signal is susceptible to external factors such as noise or mechanical vibration, and the detection accuracy of the fastening state of the connector is low. SUMMARY

[0005] The present application provides a connector fastening state detection method, device and testing system to solve the problem of low detection accuracy of the fastening state of the connector.

[0006] According to an aspect of the present application, a connector fastening state detection method is provided, wherein a to-be-tested connector is provided with at least one detection channel; the connector fastening state detection method comprises the following steps:

[0007] Based on a first excitation signal, a device impedance corresponding to the detection channel on the to-be-tested connector is obtained;

[0008] The device impedance is compared with a preset impedance threshold value to obtain an impedance comparison result;

[0009] In a case where the impedance comparison result indicates that the device impedance is less than the preset impedance threshold value, a preset reference voltage is dynamically adjusted according to an aging degree parameter and an environmental temperature parameter of the to-be-tested connector to obtain a current threshold voltage;

[0010] Based on a second excitation signal, a detection voltage corresponding to the detection channel on the to-be-tested connector is obtained; wherein the second excitation signal is different from the first excitation signal;

[0011] The detection voltage is compared with the threshold voltage to obtain a voltage comparison result;

[0012] In a case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, it is determined that the to-be-tested connector is normally fastened.

[0013] Optionally, the to-be-tested connector is provided with a first detection channel and a second detection channel; after the device impedance is compared with the preset impedance threshold value to obtain an impedance comparison result, the method further comprises:

[0014] In a case where the impedance comparison result indicates that the device impedance is greater than or equal to the preset impedance threshold value, determining the detection channel of the device impedance according to a current detection number of the device impedance and a first preset number;

[0015] In a case where the current detection number of the device impedance is less than or equal to the first preset number, detecting the device impedance through the first detection channel;

[0016] In a case where the current detection number of the device impedance is greater than the first preset number, switching to the second detection channel to detect the device impedance in response to a user instruction.

[0017] Optionally, after the detection voltage is compared with the threshold voltage to obtain a voltage comparison result, the method further comprises:

[0018] In a case where the detection voltage comparison result indicates that the detection voltage is less than or equal to the threshold voltage, determining whether to reacquire the device impedance according to a current acquisition number of the detection voltage and a second preset number;

[0019] In a case where the current acquisition number of the detection voltage is less than or equal to the second preset number, reacquiring the device impedance;

[0020] In a case where the current acquisition number of the detection voltage is greater than the second preset number, determining that the to-be-tested connector is abnormally buckled.

[0021] Optionally, a specific method for dynamically adjusting a preset reference voltage to obtain a current threshold voltage according to an aging degree parameter and an environmental temperature parameter of the to-be-tested connector comprises:

[0022] Calculating a resistance change amount according to a contact resistance of the to-be-tested connector at a current temperature and a contact resistance of the to-be-tested connector at a rated temperature;

[0023] Calculating an environmental temperature parameter according to the resistance change amount, the contact resistance at the rated temperature, and an environmental temperature change amount between the current temperature and the rated temperature;

[0024] Calculating an aging degree parameter according to the resistance change amount, the contact resistance at the rated temperature, and a historical buckling number of the to-be-tested connector;

[0025] Calculating the current threshold voltage according to the environmental temperature parameter, the aging degree parameter, and a preset reference voltage.

[0026] Optionally, before the obtaining the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal, the method further comprises:

[0027] exciting a standard resistance with a standard current;

[0028] calculating an impedance compensation coefficient according to the voltage of the standard resistance under the standard current excitation, the standard current, and the resistance value of the standard resistance;

[0029] The specific method of obtaining the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal comprises:

[0030] obtaining the device impedance based on the first excitation signal and the impedance compensation coefficient.

[0031] Optionally, the specific method of obtaining the detection voltage corresponding to the detection channel on the connector under test based on the second excitation signal comprises:

[0032] obtaining a plurality of groups of initial voltage signals based on the second excitation signal;

[0033] filtering and amplifying each group of the initial voltage signals;

[0034] performing data noise processing on each group of the filtered and amplified initial voltage signals based on a preset statistical analysis algorithm to obtain the detection voltage.

[0035] Optionally, after determining that the connector under test is normally mated in the case that the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, the method further comprises:

[0036] generating a connector locking instruction in the case that the mating state of the connector under test is normal;

[0037] performing a locking operation on the connector under test in response to the connector locking instruction.

[0038] According to another aspect of the present application, a connector mating state detection device is also provided, which comprises:

[0039] a first obtaining module configured to obtain a device impedance corresponding to the detection channel on the connector under test based on a first excitation signal;

[0040] a first comparison module configured to compare the device impedance with a preset impedance threshold to obtain an impedance comparison result;

[0041] a dynamic threshold calculation module, configured to, in a case where the impedance comparison result indicates that the device impedance is less than the preset impedance threshold, dynamically adjust a preset reference voltage according to an aging degree parameter and an environmental temperature parameter of the to-be-tested connector, to obtain a current threshold voltage;

[0042] a second acquisition module, configured to acquire a detection voltage corresponding to the detection channel on the to-be-tested connector based on a second excitation signal; the second excitation signal is different from the first excitation signal;

[0043] a second comparison module, configured to determine the mating state of the to-be-tested connector according to the detection voltage and the threshold voltage;

[0044] a state detection module, configured to, in a case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, determine that the to-be-tested connector is normally mated.

[0045] According to still another aspect of the present application, a test system is also provided, which comprises a probe module, an acquisition module and a control module;

[0046] The to-be-tested connector is connected with the probe module, and the to-be-tested connector is connected with a to-be-tested device through a patch cord; the acquisition module is connected between the to-be-tested connector and the control module;

[0047] The to-be-tested connector is used to bridge the probe module and the to-be-tested device; the probe module is used to establish an electrical connection with the to-be-tested device; the acquisition module is used to acquire a voltage signal of a detection channel of the to-be-tested connector; and the control module is used to execute the connector mating state detection method according to any one of the above embodiments.

[0048] Optionally, the test system further comprises a human-computer interaction module, an indication module and a fastening module;

[0049] The human-computer interaction module, the indication module and the fastening module are all connected with the control module;

[0050] The human-computer interaction module is used to acquire a user instruction; the indication module is used to indicate the mating state of the to-be-tested connector; and the fastening module is used to lock the to-be-tested connector.

[0051] According to still another aspect of the present application, a computer readable storage medium is also provided, which stores computer instructions for causing a processor to execute the connector mating state detection method according to any one of the above embodiments.

[0052] According to another aspect of the present application, there is also provided a computer program product comprising a computer program which, when executed by a processor, implements the connector mating state detection method according to any of the embodiments of the present application.

[0053] The embodiment of the present application obtains the device impedance corresponding to the detection channel on the connector to be tested based on the first excitation signal, compares the device impedance with the preset impedance threshold to obtain an impedance comparison result, dynamically adjusts the preset reference voltage according to the aging degree parameter and the environmental temperature parameter of the connector to be tested in the case where the impedance comparison result indicates that the device impedance is less than the preset impedance threshold to obtain a current threshold voltage, obtains the detection voltage corresponding to the detection channel on the connector to be tested based on the second excitation signal, compares the detection voltage with the threshold voltage to obtain a voltage comparison result, and determines that the connector to be tested is normally mated in the case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage. The embodiment of the present application determines the connector mating state through the dual detection of impedance and level, which is conducive to avoiding the detection interference of external factors and improving the detection accuracy.

[0054] It should be understood that the content described in this part is not intended to identify key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent through the following description. BRIEF DESCRIPTION OF DRAWINGS

[0055] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0056] Figure 1 is a flowchart of a connector mating state detection method provided by an embodiment of the present application;

[0057] Figure 2 is a flowchart of another connector mating state detection method provided by an embodiment of the present application;

[0058] Figure 3 is a flowchart of another connector mating state detection method provided by an embodiment of the present application;

[0059] Figure 4 is a flowchart of another connector mating state detection method provided by an embodiment of the present application;

[0060] Figure 5 is a flowchart of another connector mating state detection method provided by an embodiment of the present application;

[0061] Figure 6 is a schematic diagram of a connector buckling state detection device provided by an embodiment of the present application;

[0062] Figure 7 is a schematic diagram of a test system provided by an embodiment of the present application;

[0063] Figure 8 is a schematic diagram of a multiplexing circuit provided by an embodiment of the present application;

[0064] Figure 9 is a schematic diagram of a voltage detection circuit provided by an embodiment of the present application;

[0065] Figure 10 is a cross-sectional schematic diagram of a connector provided by an embodiment of the present application. DETAILED DESCRIPTION

[0066] In order to make the personnel in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor should belong to the scope of protection of the present application.

[0067] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0068] The embodiments of the present application provide a connector buckling state detection method. The connector buckling state detection method is applied to a test device to detect the buckling state of a connector before testing an electronic device. Figure 1 is a flowchart of a connector buckling state detection method provided by an embodiment of the present application. The test device is provided with a connector, and the connector has at least one detection channel. Referring to Figure 1 , the connector buckling state detection method comprises:

[0069] S110, obtain a device impedance corresponding to a detection channel on the to-be-tested connector based on the first excitation signal.

[0070] Exemplarily, the device impedance of the to-be-tested connector can be measured by a four-wire method, and the first excitation signal can be a current. The first excitation signal is used to excite the device impedance of the to-be-tested connector. Specifically, the first excitation signal is input to the to-be-tested connector through the detection channel of the to-be-tested connector, so that the to-be-tested connector generates a voltage based on the detection channel. At this time, the voltage signal generated by the to-be-tested connector under the first excitation signal can be detected through the detection channel of the to-be-tested connector. In actual application, the current size for exciting the to-be-tested connector to generate the voltage signal can be set according to actual needs, for example, it can be set to 10 milliamperes.

[0071] S120, compare the device impedance with a preset impedance threshold to obtain an impedance comparison result.

[0072] Specifically, the preset impedance threshold is a maximum contact impedance of the to-be-tested connector which is set in advance. When the device impedance is less than the preset impedance threshold, it indicates that the pins and the sockets in the to-be-tested connector have reliable contact at this time. At this time, the to-be-tested connector can be further determined by the voltage to determine the mating state of the to-be-tested connector. When the device impedance is greater than or equal to the preset impedance threshold, it indicates that the contact between the pins and the sockets in the to-be-tested connector is unreliable or suspended at this time. At this time, the to-be-tested connector needs to be re-mated, and the device impedance needs to be re-acquired to re-detect the mating state of the to-be-tested connector.

[0073] S130, in the case that the impedance comparison result indicates that the device impedance is less than the preset impedance threshold, dynamically adjust a preset reference voltage according to an aging degree parameter and an environmental temperature parameter of the to-be-tested connector to obtain a current threshold voltage.

[0074] Specifically, the electrical characteristics of the connector are affected by the environmental temperature and the aging of the connector during use, thereby causing changes in the voltage signal of the connector. Therefore, in actual application, the current threshold voltage of the to-be-tested connector should be dynamically calculated based on the preset reference voltage in combination with the aging degree parameter and the environmental temperature parameter of the to-be-tested connector. The preset reference voltage can be the minimum voltage of the connector that has not aged under the rated temperature and the first excitation signal when the contact is good.

[0075] In actual application, the aging degree parameter of the to-be-tested connector can be an aging attenuation coefficient of the to-be-tested connector, and the environmental temperature parameter of the to-be-tested connector can be a temperature compensation coefficient of the to-be-tested connector.

[0076] The temperature compensation coefficient of the to-be-tested connector can be designed based on the contact resistance of the detection channel of the to-be-tested connector when the first excitation signal is input to the to-be-tested connector. Since the size of the contact resistance is related to the temperature, the size of the contact resistance is different at different temperatures. Therefore, when calculating the temperature compensation coefficient, the resistance change amount between the contact resistance of the to-be-tested connector at the current temperature and the contact resistance of the to-be-tested connector at the rated temperature can be combined with the environmental temperature change amount between the current temperature and the rated temperature. The temperature compensation coefficient of the to-be-tested connector can be calculated by the following formula:

[0077]

[0078] wherein, is the temperature compensation coefficient; is the change amount between the contact resistance of the to-be-tested connector at the current temperature and the contact resistance of the to-be-tested connector at the rated temperature; is the contact resistance of the to-be-tested connector at the rated temperature; is the environmental temperature change amount.

[0079] The parameters of the aging attenuation coefficient can also be designed based on the contact resistance of the detection channel of the to-be-tested connector when the first excitation signal is input to the to-be-tested connector. Since the aging of the to-be-tested connector is positively correlated with the number of times of engagement of the to-be-tested connector, when calculating the aging attenuation coefficient of the to-be-tested connector, the resistance change amount between the contact resistance of the to-be-tested connector at the current temperature and the contact resistance of the to-be-tested connector at the rated temperature can be combined with the historical number of times of engagement of the to-be-tested connector. The aging attenuation coefficient can be calculated by the following formula:

[0080]

[0081] wherein, is the aging attenuation coefficient; is the change amount between the contact resistance of the to-be-tested connector at the current temperature and the contact resistance of the to-be-tested connector at the rated temperature; is the contact resistance of the to-be-tested connector at the rated temperature; is the historical number of times of engagement of the to-be-tested connector.

[0082] On the basis of the above, the dynamic calculation of the threshold voltage of the to-be-tested connector based on the preset reference voltage combined with the aging degree parameter and the environmental temperature parameter of the to-be-tested connector can be realized by the following formula:

[0083]

[0084] wherein, is a current threshold voltage; is a preset reference voltage; is a temperature compensation coefficient; is an ambient temperature change amount; is an aging attenuation coefficient; is a historical number of times of plugging of the to-be-tested connector.

[0085] Exemplarily, in the calculation, the temperature compensation coefficient can be 0.0015, and the aging attenuation coefficient can be 0.03.

[0086] S140, based on the second excitation signal, obtaining a detection voltage corresponding to a detection channel on the to-be-tested connector; wherein the second excitation signal and the first excitation signal are different.

[0087] Specifically, a plurality of groups of voltage signals are obtained based on the detection channel of the to-be-tested connector, and each group of voltage signals is filtered and amplified to filter out noise in the voltage signal and enhance the power of the voltage signal. The plurality of groups of voltage signals after filtering and amplification are subjected to data noise processing based on a preset statistical analysis algorithm to obtain the detection voltage. The preset statistical analysis algorithm is a data processing method for removing interference terms in the voltage signal, and the preset statistical analysis algorithm may, for example, be variance. In actual application, different data processing methods can be selected to remove interference terms in the voltage signal, that is, different statistical analysis algorithms are preset, which is not limited in the embodiment. It should be noted that the second excitation signal is different from the first excitation signal, and the second excitation signal can be a voltage. The second excitation signal is used to excite the to-be-tested device to generate a voltage signal.

[0088] Exemplarily, 10 groups of voltage signals are obtained, and the preset statistical analysis algorithm is variance. The 10 groups of voltage signals are all signals after filtering and amplification.

[0089] The average values of the 10 groups of voltage signals are calculated, and the mean square deviation is calculated based on the average values of the 10 groups of voltage signals.

[0090]

[0091] wherein, is the mean square deviation of the voltage signal, which can be the first voltage; is the i-th group of voltage signals, 1≤i≤10; is the average value of the voltage signal.

[0092] In the range, the normal voltage signal is filtered out and the average value is calculated again to obtain the final detection voltage.

[0093] S150, comparing the detection voltage with the threshold voltage to obtain a voltage comparison result.

[0094] Specifically, the size of the detection voltage is related to the buckling state of the to-be-tested connector. When the detection voltage is greater than the threshold voltage, it indicates that the to-be-tested connector is in good contact at this time, and the buckling state of the to-be-tested connector is normal; when the detection voltage is less than or equal to the threshold voltage, it indicates that the to-be-tested connector is in poor contact at this time, and the buckling state of the to-be-tested connector is abnormal.

[0095] S160, in the case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, it is determined that the to-be-tested connector is normally buckled.

[0096] Exemplarily, in actual application, the user can also be prompted based on the buckling state of the to-be-tested connector to inform the user of the buckling state of the connector. For example, the way of prompting the user can be sound prompt, light prompt or text information prompt.

[0097] In the embodiment of the application, based on the first excitation signal, the device impedance corresponding to the detection channel on the to-be-tested connector is obtained, the device impedance is compared with the preset impedance threshold to obtain an impedance comparison result, in the case where the impedance comparison result indicates that the device impedance is less than the preset impedance threshold, the preset reference voltage is dynamically adjusted according to the aging degree parameter and the environmental temperature parameter of the to-be-tested connector to obtain the current threshold voltage, based on the second excitation signal, the detection voltage corresponding to the detection channel on the to-be-tested connector is obtained, the detection voltage is compared with the threshold voltage to obtain a voltage comparison result, and in the case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, it is determined that the to-be-tested connector is normally buckled. The embodiment of the application determines the buckling state of the connector through the dual detection of impedance and level, which is conducive to avoiding the interference of external factors on the detection and improving the detection accuracy.

[0098] Figure 2 is a flowchart of another connector buckling state detection method provided by the embodiment of the application. On the basis of the above-mentioned embodiments, optionally, the to-be-tested connector is provided with a first detection channel and a second detection channel. For details, refer to Figure 2 After the device impedance is compared with the preset impedance threshold to obtain an impedance comparison result, it further includes:

[0099] S170, in the case where the impedance comparison result indicates that the device impedance is greater than or equal to the preset impedance threshold, the detection channel of the device impedance is determined according to the current detection number of the device impedance and the first preset number.

[0100] Specifically, the connector to be tested can have two or more detection channels. If the connector to be tested appears unreliable contact or suspended situation multiple times, i.e., the device impedance of the connector to be tested is greater than or equal to the preset impedance threshold multiple times, the detection channel of the connector to be tested can be switched to obtain the device impedance of the connector to be tested, so as to exclude the influence of detection channel failure on detection. The first preset number can be set according to actual needs, and the embodiment does not limit this.

[0101] Taking the detection channel used when the detection of the connector to be tested starts as the first detection channel as an example. When the current detection number of the device impedance is less than or equal to the first preset number, the device impedance is still detected through the first detection channel; when the current detection number of the device impedance is greater than the first preset number, the second detection channel is switched to detect the device impedance in response to a user instruction.

[0102] S171, when the current detection number of the device impedance is less than or equal to the first preset number, the device impedance is detected through the first detection channel.

[0103] S172, when the current detection number of the device impedance is greater than the first preset number, the second detection channel is switched to detect the device impedance in response to a user instruction.

[0104] Specifically, when the current detection number of the device impedance is greater than the first preset number, the user instruction is obtained. If the user instruction is received, the second detection channel is switched to detect the device impedance. In addition, it should be noted that when the current detection number of the device impedance is greater than the first preset number, if the user instruction is not received, the detection of the connector to be tested is terminated, i.e., the detection is ended.

[0105] Figure 3 is a flowchart of another connector fastening state detection method provided by the embodiment of the application. On the basis of the above-mentioned embodiments, optionally, referring to Figure 3 , after comparing the detection voltage with the threshold voltage to obtain the voltage comparison result, the method further comprises:

[0106] S180, in the case where the detection voltage comparison result indicates that the detection voltage is less than or equal to the threshold voltage, it is determined whether to re-obtain the device impedance according to the current acquisition number of the detection voltage and the second preset number.

[0107] Specifically, the size of the detection voltage is related to the fastening state of the connector to be tested. When the detection voltage is less than or equal to the threshold voltage, it indicates that the connector to be tested is in poor contact at this time, and the fastening state of the connector to be tested is abnormal.

[0108] In the detection process, if the buckling state of the to-be-tested connector is abnormal, that is, the detection voltage is less than or equal to the threshold voltage, the to-be-tested connector can be buckled again, and the to-be-tested connector can be re-inspected. When the buckling state of the to-be-tested connector is abnormal, that is, the detection voltage is less than or equal to the threshold voltage, the buckling state of the to-be-tested connector is determined to be abnormal. The second preset number can be set according to actual needs, and the second preset number can be the same as the first preset number. The embodiment does not limit this.

[0109] S181, when the current acquisition number of the detection voltage is less than or equal to the second preset number, the device impedance is re-acquired.

[0110] Specifically, when the current acquisition number of the detection voltage is less than or equal to the second preset number, the to-be-tested connector is buckled again, and the device impedance of the to-be-tested connector after buckling is acquired, so as to re-detect the buckling state of the to-be-tested connector.

[0111] S182, when the current acquisition number of the detection voltage is greater than the second preset number, it is determined that the to-be-tested connector is abnormally buckled.

[0112] Specifically, when the current acquisition number of the detection voltage is greater than the second preset number, it is determined that the to-be-tested connector is abnormally buckled. In actual application, the user can also be prompted based on the buckling state of the to-be-tested connector to inform the user of the buckling state of the connector. For example, the user can be prompted in the form of sound, light or text information.

[0113] Figure 4 is a flowchart of another connector buckling state detection method provided by the embodiment of the application. Based on the above embodiments, optionally, referring to Figure 4 Before acquiring the device impedance corresponding to the detection channel on the to-be-tested connector based on the first excitation signal, the method further comprises:

[0114] S210, exciting the standard resistance based on the standard current.

[0115] Specifically, according to Ohm's law, the device impedance can be calculated based on the voltage signal and the preset current. The collection accuracy of the voltage signal directly affects the size of the device impedance. Therefore, before the device impedance of the to-be-tested connector is calculated, the impedance compensation coefficient can be calculated based on the standard resistance and the standard current to compensate or calibrate the deviation of the device impedance. The size of the standard resistance and the standard current can be set according to actual needs. For example, the standard resistance can be 1 ohm, and the standard current can be 1 ampere.

[0116] S220, calculating the impedance compensation coefficient according to the voltage of the standard resistance under the standard current excitation, the standard current and the resistance value of the standard resistance.

[0117] Specifically, the impedance compensation coefficient can be calculated by the following formula:

[0118]

[0119] wherein, is the impedance compensation coefficient; is the resistance value of the standard resistance; is the standard current; is the detected voltage value between the standard resistance.

[0120] wherein, continuing to refer to Figure 4 , based on the first excitation signal, the specific method for obtaining the device impedance corresponding to the detection channel on the to-be-tested connector comprises:

[0121] S111, obtaining the device impedance based on the first excitation signal and the impedance compensation coefficient.

[0122] Specifically, the voltage signal between the two ends of the to-be-tested connector is obtained on the basis of the first excitation signal, and the initial device impedance of the to-be-tested connector is calculated based on the voltage signal between the two ends of the to-be-tested connector and the first excitation signal, and the initial device impedance is compensated by using the impedance compensation coefficient to obtain the device impedance.

[0123] The device impedance can be calculated by the following formula:

[0124]

[0125] wherein, is the device impedance; is the impedance compensation coefficient; is the voltage signal; is the first excitation signal.

[0126] Figure 5 is a flowchart of another connector buckling state detection method provided by the embodiment of the application. On the basis of the above-mentioned embodiments, optionally, referring to Figure 5 , in the case where the voltage comparison result indicates that the detection voltage is greater than the threshold voltage, after determining that the to-be-tested connector is normally buckled, the method further comprises:

[0127] S191, generating a connector locking instruction in the case where the buckling state of the to-be-tested connector is normal.

[0128] Specifically, when the connector is in the normal mated state, it indicates that the connector under test is in good contact. At this time, a connector locking instruction is generated. Optionally, when applied to the test of the device, the locking of the connector can be used as a precondition for the test of the device.

[0129] S192, in response to the connector locking instruction, performing a locking operation on the connector under test.

[0130] Exemplarily, the locking operation of the connector under test can be implemented by a locking device, for example, a pneumatic system. The locking device responds to the connector locking instruction and locks the connector under test.

[0131] The embodiment of the present application also provides a connector mated state detection device. Figure 6 is a schematic diagram of a connector mated state detection device provided by the embodiment of the present application. Referring to Figure 6 The connector mated state detection device 10 comprises a first acquisition module 1, a first comparison module 2, a dynamic threshold calculation module 3, a second acquisition module 4, a second comparison module 5 and a state detection module 6.

[0132] The first acquisition module 1 is configured to acquire the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal; the first comparison module 2 is configured to compare the device impedance with a preset impedance threshold to obtain an impedance comparison result; the dynamic threshold calculation module 3 is configured to dynamically adjust the preset reference voltage according to the aging degree parameter and the environmental temperature parameter of the connector under test to obtain a current threshold voltage in the case that the impedance comparison result indicates that the device impedance is less than the preset impedance threshold; the second acquisition module 4 is configured to acquire the detection voltage corresponding to the detection channel on the connector under test based on the second excitation signal; wherein the second excitation signal is different from the first excitation signal; the second comparison module 5 is configured to determine the mated state of the connector under test according to the detection voltage and the threshold voltage; and the state detection module 6 is configured to determine that the connector under test is normally mated in the case that the voltage comparison result indicates that the detection voltage is greater than the threshold voltage.

[0133] The connector mated state detection device 10 provided by the embodiment of the present application can execute the connector mated state detection method provided by any embodiment of the present application, and has the function modules and beneficial effects corresponding to the execution method.

[0134] The embodiment of the present application also provides a test system. Figure 7 is a schematic diagram of a test system provided by the embodiment of the present application. Referring to Figure 7 The test system comprises a probe module 120, an acquisition module 130 and a control module 140.

[0135] The test connector 110 is connected with the probe module 120, the test connector 110 is connected with the test equipment 200 through the patch cord, and the acquisition module 130 is connected between the test connector 110 and the control module 140.

[0136] The test connector 110 is used for bridging the probe module 120 and the test equipment 200, the probe module 120 is used for establishing electrical connection with the test equipment 200, the acquisition module 130 is used for acquiring the voltage signal of the detection channel of the test connector 120, and the control module 140 is used for executing the connector clamping state detection method provided in any of the above embodiments.

[0137] The control module 140 is connected with the test connector 110 through the acquisition module 130. The control module 140 acquires the voltage signal of the detection channel of the test connector 110 through the acquisition module 130, and acquires the device impedance of the test connector 110 based on the voltage signal of the detection channel of the test connector 110 acquired by the acquisition module 130.

[0138] The acquisition module 130 is provided with a multiplexing circuit and a voltage detection circuit. The voltage detection circuit is connected with the test connector 110 through the multiplexing circuit. The acquisition module 130 selects the detection channel of the test connector 110 through the multiplexing circuit, so as to acquire the voltage signal of the test connector 110 based on different detection channels, and then the control module 140 acquires the device impedance and the voltage signal of the test connector 110 based on different detection channels.

[0139] The test system provided in the embodiment has the beneficial effects of the connector clamping state detection method provided in any of the above embodiments, which will not be repeated here.

[0140] On the basis of the above embodiments, optionally, continuing to refer to Figure 7 The test system further comprises a man-machine interaction module 150, an indication module 160 and a fastening module 170.

[0141] The man-machine interaction module 150, the indication module 160 and the fastening module 170 are all connected with the control module 140. The man-machine interaction module 150 is used for acquiring user instructions, the indication module 160 is used for indicating the clamping state of the test connector 110, and the fastening module 170 is used for locking the test connector 110.

[0142] The human-computer interaction module 150 acquires the user instruction in a manner such as voice acquisition. The indication module 160 can be an indication light or the like, for example, and when the fastening state of the connector under test 110 is normal, the indication module is constantly on in a first color; when the fastening state of the connector under test 110 is abnormal, the indication module flashes in a second color. The fastening module 170 can be a pneumatic system, for example, and when the fastening state of the connector under test 110 is normal, the cylinder of the fastening module 170 extends to fasten the connector 110.

[0143] Exemplarily, in actual application, the human-computer interaction module 150 can also evaluate the service life of the connector under test 110 based on a prediction model based on the device impedance of the connector under test 110. The prediction model is a model for evaluating the service life of the connector under test 110 based on the device impedance. The prediction model can be obtained by training a neural network model for service life evaluation.

[0144] Figure 8 is a schematic diagram of a multiplexing circuit provided by an embodiment of the present application. Referring to Figure 8 , the multiplexing circuit comprises: a first multiplexer U1, a second multiplexer U2, a third multiplexer U3, a fourth multiplexer U4, a first interface CH1, a second interface CH2, a third interface CH3, a fourth interface CH4, a fifth interface PP1, and a sixth interface CC1.

[0145] The first input pin NO1 of the first multiplexer U1, the second multiplexer U2, the third multiplexer U3, and the fourth multiplexer U4 is coupled to the connector under test 110 through a first interface J1; the second input pin NO2 of the first multiplexer U1, the second multiplexer U2, the third multiplexer U3, and the fourth multiplexer U4 is coupled to the connector under test 110 through a second interface J1; the third input pin NO3 of the first multiplexer U1, the second multiplexer U2, the third multiplexer U3, and the fourth multiplexer U4 is coupled to the connector under test 110 through a third interface J1; the fourth input pin NO4 of the first multiplexer U1, the second multiplexer U2, the third multiplexer U3, and the fourth multiplexer U4 is coupled to the connector under test 110 through a fourth interface J1; the common pin COM of the first multiplexer U1 and the second multiplexer U2 is coupled to the voltage detection circuit through a fifth interface J1; and the common pin COM of the third multiplexer U3 and the fourth multiplexer U4 is coupled to the control module 140 through a sixth interface CC1.

[0146] Figure 9 is a schematic diagram of a voltage detection circuit provided by an embodiment of the present application. Referring to Figure 9The voltage detection circuit is provided with an operational amplifier U5 and an analog-to-digital converter U6 connected in series. The operational amplifier U5 amplifies the voltage signal of the detection channel of the connector 110 to be detected through a multiplexing circuit 131. The analog-to-digital converter U6 collects the amplified voltage signal and outputs to the control module 140.

[0147] On the basis of the above-mentioned embodiments, optionally, the connector 110 to be detected has at least one detection channel, and each detection channel includes two detection probes. Figure 10 is a cross-sectional view of a connector provided by an embodiment of the present application. Referring to Figure 10 The detection probes 111 of each detection channel are diagonally arranged in the connector 110 to be detected.

[0148] The embodiment diagonally arranges the detection probes 111 to detect the contact condition of the connector 110 to be detected in different directions, which is conducive to avoiding single-point failure in the detection of the latching state of the connector 110 to be detected.

[0149] It should be understood that the various forms of flow shown above can be reordered, added, or deleted steps. For example, each step described in the present application can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions of the present application can be achieved, which is not limited herein.

[0150] The above detailed description does not constitute a limitation on the scope of protection of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A method for detecting the engagement state of a connector, characterized in that, The connector under test must have at least one detection channel; The connector engagement state detection method includes: Based on the first excitation signal, the device impedance corresponding to the detection channel on the connector under test is obtained; The impedance of the device is compared with a preset impedance threshold to obtain the impedance comparison result; If the impedance comparison result indicates that the device impedance is less than the preset impedance threshold, the preset reference voltage is dynamically adjusted according to the aging degree parameter of the connector under test and the ambient temperature parameter to obtain the current threshold voltage. Based on the second excitation signal, the detection voltage corresponding to the detection channel on the connector under test is obtained; wherein the second excitation signal is different from the first excitation signal; The detected voltage is compared with the threshold voltage to obtain a voltage comparison result; If the voltage comparison result indicates that the detected voltage is greater than the threshold voltage, it is determined that the connector under test is properly engaged.

2. The connector engagement state detection method according to claim 1, characterized in that, The connector under test is provided with a first detection channel and a second detection channel; After comparing the device impedance with a preset impedance threshold to obtain the impedance comparison result, the method further includes: If the impedance comparison result indicates that the device impedance is greater than or equal to the preset impedance threshold, the detection channel of the device impedance is determined based on the current number of device impedance detections and the first preset number of detections. When the current number of times the device impedance is detected is less than or equal to the first preset number, the device impedance is detected through the first detection channel; When the current number of times the device impedance is detected exceeds the first preset number, in response to a user command, the system switches to the second detection channel to detect the device impedance.

3. The connector engagement state detection method according to claim 1, characterized in that, After comparing the detected voltage with the threshold voltage to obtain a voltage comparison result, the method further includes: If the detection voltage comparison result indicates that the detection voltage is less than or equal to the threshold voltage, it is determined whether to re-acquire the device impedance based on the current number of times the detection voltage has been acquired and the second preset number of times. When the current number of times the detection voltage is acquired is less than or equal to the second preset number, the device impedance is acquired again; If the current number of times the detection voltage is acquired is greater than the second preset number, it is determined that the connector under test is abnormally engaged.

4. The connector engagement state detection method according to claim 1, characterized in that, The specific method for dynamically adjusting the preset reference voltage to obtain the current threshold voltage based on the aging degree parameters and ambient temperature parameters of the connector under test includes: The change in resistance is calculated based on the contact resistance of the connector under test at the current temperature and the contact resistance of the connector under test at the rated temperature; The ambient temperature parameters are calculated based on the resistance change, the contact resistance at the rated temperature, and the ambient temperature change between the current temperature and the rated temperature. The aging parameters are calculated based on the resistance change, the contact resistance at the rated temperature, and the historical number of engagements of the connector under test. The current threshold voltage is calculated based on the ambient temperature parameter, the aging degree parameter, and the preset reference voltage.

5. The connector engagement state detection method according to claim 1, characterized in that, Before obtaining the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal, the method further includes: Based on standard current excitation of standard resistors; The impedance compensation coefficient is calculated based on the voltage across the standard resistor under the standard current excitation, the standard current, and the resistance value of the standard resistor. The specific method for obtaining the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal includes: The impedance of the device is obtained based on the first excitation signal and the impedance compensation coefficient.

6. The connector engagement state detection method according to claim 1, characterized in that, The specific method for obtaining the detection voltage corresponding to the detection channel on the connector under test based on the second excitation signal includes: Multiple sets of initial voltage signals are obtained based on the second excitation signal; The initial voltage signals of each group are filtered and amplified; Based on a preset statistical analysis algorithm, the filtered and amplified initial voltage signals of each group are subjected to data noise processing to obtain the detection voltage.

7. The connector engagement state detection method according to claim 1, characterized in that, After determining that the connector under test is properly engaged when the voltage comparison result indicates that the detected voltage is greater than the threshold voltage, the method further includes: If the connector under test is in a normal engagement state, a connector locking command is generated. In response to the connector locking command, a locking operation is performed on the connector under test.

8. A connector engagement status detection device, characterized in that, include: The first acquisition module is used to acquire the device impedance corresponding to the detection channel on the connector under test based on the first excitation signal. The first comparison module is used to compare the impedance of the device with a preset impedance threshold to obtain an impedance comparison result. The dynamic threshold calculation module is used to dynamically adjust the preset reference voltage according to the aging degree parameter and the ambient temperature parameter of the connector under test when the impedance comparison result indicates that the impedance of the device is less than the preset impedance threshold, so as to obtain the current threshold voltage. The second acquisition module is used to acquire the detection voltage corresponding to the detection channel on the connector under test based on the second excitation signal; wherein the second excitation signal is different from the first excitation signal; The second comparison module is used to determine the engagement state of the connector under test based on the detected voltage and the threshold voltage; The status detection module is used to determine that the connector under test is properly engaged when the voltage comparison result indicates that the detected voltage is greater than the threshold voltage.

9. A testing system, characterized in that, The testing system includes: a probe module, a data acquisition module, and a control module; The connector under test is connected to the probe module, and the connector under test is connected to the device under test via a connector cable. The acquisition module is connected between the connector under test and the control module. The connector under test is used to bridge the probe module and the device under test; the probe module is used to establish an electrical connection with the device under test; the acquisition module is used to acquire the voltage signal of the detection channel of the connector under test; the control module is used to execute the connector engagement state detection method according to any one of claims 1-7.

10. The testing system according to claim 9, characterized in that, Also includes: Human-computer interaction module, indicator module, and fastening module; The human-computer interaction module, the indicator module, and the fastening module are all connected to the control module; The human-computer interaction module is used to acquire user commands; the indicator module is used to indicate the engagement state of the connector under test; and the fastening module is used to lock the connector under test.

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