Test model determination method and device, communication equipment and storage medium

Abstract

The invention relates to the technical field of communication, in particular to a test model determination method and device, communication equipment and a storage medium, and the test model determination method comprises the following steps: determining a first test model, the first test model meets at least one of the following conditions: the number of clusters of the first test model is less than the number of clusters of a traditional test model; the number of rays included in the cluster of the first test model is less than the number of rays included in the cluster of the conventional test model. According to the method and the device, under the condition that the total amount of the rays in the model is reduced, the number of the probes required in the test environment is reduced, so that the number of the probes required to be set can be reduced and the test complexity can be reduced when the test is performed based on the first test model determined by the method and the device.

Description

Test model determination method and apparatus, communication device, and storage medium TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of communications, and in particular, to a test model determination method, a test model determination apparatus, a communication device, and a storage medium. BACKGROUND

[0002] A test device can test a device under test, for example, by performing over the air (OTA) testing. For beam management based on artificial intelligence (AI), a fading channel model can be applied for OTA testing. However, there are still some technical problems to be solved for the application of the model.

[0003] SUMMARY

[0004] Embodiments of the present disclosure provide a test model determination method, apparatus, communication device, and storage medium to solve the technical problems in the related art.

[0005] According to a first aspect of embodiments of the present disclosure, a test model determination method is provided. The method comprises determining a first test model, wherein the first test model satisfies at least one of: a number of clusters of the first test model is less than a number of clusters of a traditional test model; and a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the traditional test model.

[0006] According to a second aspect of embodiments of the present disclosure, a test model determination apparatus is provided. The apparatus comprises a processing module configured to determine a first test model, wherein the first test model satisfies at least one of: a number of clusters of the first test model is less than a number of clusters of a traditional test model; and a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the traditional test model.

[0007] According to a third aspect of embodiments of the present disclosure, a communication device is provided. The communication device comprises one or more processors. The communication device is configured to perform the test model determination method according to the first aspect.

[0008] According to a fourth aspect of embodiments of the present disclosure, a storage medium is provided. The storage medium stores instructions. When the instructions are executed on a communication device, the communication device is caused to perform the test model determination method according to the first aspect.

[0009] According to a fifth aspect of embodiments of the present disclosure, a program product is provided. When the program product is executed on a communication device, the communication device is caused to perform the test model determination method according to the first aspect.

[0010] According to an embodiment of the present disclosure, the number of clusters of the first test model is less than the number of clusters of the conventional test model, and in the case that the number of rays corresponding to the clusters is the same, the total number of rays corresponding to the clusters in the first test model is less than the total number of rays corresponding to the clusters in the conventional test model; or the number of rays of the first test model is less than the number of rays of the conventional test model.

[0011] On this basis, since a probe is needed to simulate the signal from each ray, in the case that the total number of rays in the model is reduced, the number of probes needed in the test environment is also reduced. Therefore, the first test model determined based on the embodiment of the present disclosure can reduce the number of probes needed to be set and reduce the complexity of the test when the test (for example, OTA test) is performed. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present disclosure, and other drawings can also be obtained by those skilled in the art without creative labor.

[0013] FIG. 1 is a schematic architecture diagram of a communication system according to an embodiment of the present disclosure.

[0014] FIG. 2 is an interaction schematic diagram of a test model determination method according to an embodiment of the present disclosure.

[0015] FIG. 3 is a schematic flowchart of a test model determination method according to an embodiment of the present disclosure.

[0016] FIG. 4 is a schematic block diagram of a test model determination apparatus according to an embodiment of the present disclosure.

[0017] FIG. 5A is a structural schematic diagram of a communication device according to an embodiment of the present disclosure.

[0018] FIG. 5B is a structural schematic diagram of a chip according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0019] Embodiments of the present disclosure propose a test model determination method, apparatus, communication device and storage medium.

[0020] In a first aspect, embodiments of the present disclosure propose a test model determination method, which comprises: determining a first test model, wherein the first test model satisfies at least one of the following: the number of clusters of the first test model is less than the number of clusters of a conventional test model; and the number of rays included in the clusters of the first test model is less than the number of rays included in the clusters of the conventional test model.

[0021] In the above embodiment, the number of clusters of the first test model is less than the number of clusters of the conventional test model, and in the case that the number of rays corresponding to the clusters is the same, the total number of rays corresponding to the clusters in the first test model is less than the total number of rays corresponding to the clusters in the conventional test model; or the number of rays of the first test model is less than the number of rays of the conventional test model.

[0022] On this basis, since a probe is needed to simulate the signal from each ray, in the case that the total number of rays in the model is reduced, the number of probes needed in the test environment is also reduced, and therefore, the test (for example, OTA test) based on the first test model determined according to the embodiments of the present disclosure can reduce the number of probes needed to be set and reduce the complexity of the test.

[0023] In combination with some embodiments of the first aspect. In some embodiments, the determining the first test model comprises one of the following: simplifying the clusters of the conventional test model and / or the rays included in the clusters to obtain the first test model; or generating the first test model based on a required channel spatial distribution.

[0024] In combination with some embodiments of the first aspect. In some embodiments, the simplifying the rays included in the clusters of the conventional test model comprises: modeling a single cluster in the conventional test model as a ray.

[0025] In combination with some embodiments of the first aspect. In some embodiments, the simplifying the rays included in the clusters of the conventional test model comprises: determining the difference of the angles of arrival corresponding to each cluster in the conventional test model; and merging a plurality of clusters corresponding to the differences less than a difference threshold into one cluster.

[0026] In combination with some embodiments of the first aspect. In some embodiments, the conventional test model and / or the first test model is one of the following: a cluster delay line (CDL-A) channel model; a CDL-B channel model; a CDL-C channel model.

[0027] In combination with some embodiments of the first aspect. In some embodiments, the simplifying the rays included in the clusters of the conventional test model comprises: determining the power corresponding to each cluster in the conventional test model; and ignoring the cluster corresponding to the power less than a power threshold.

[0028] In combination with some embodiments of the first aspect. In some embodiments, the conventional test model and / or the first test model is one of the following: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

[0029] In a second aspect, embodiments of the present disclosure provide a test model determination apparatus, the apparatus comprising: a processing module configured to determine a first test model, wherein the first test model satisfies at least one of: a number of clusters of the first test model is less than a number of clusters of a legacy test model; a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the legacy test model.

[0030] In some embodiments in combination with the second aspect. In some embodiments, the processing module is configured to perform one of: simplifying a cluster of the legacy test model and / or a ray included in the cluster to obtain the first test model; or generating the first test model based on a required channel spatial distribution.

[0031] In some embodiments in combination with the second aspect. In some embodiments, the processing module is configured to model a single cluster of the legacy test model as a ray.

[0032] In some embodiments in combination with the second aspect. In some embodiments, the processing module is configured to determine a difference of an angle of arrival corresponding to each cluster of the legacy test model; and merge a plurality of clusters corresponding to a difference less than a difference threshold into one cluster.

[0033] In some embodiments in combination with the second aspect. In some embodiments, the legacy test model and / or the first test model is one of: a cluster delay line, CDL-A, channel model; a CDL-B channel model; a CDL-C channel model.

[0034] In some embodiments in combination with the second aspect. In some embodiments, the processing module is configured to determine a power corresponding to each cluster of the legacy test model; and ignore a cluster corresponding to a power less than a power threshold.

[0035] In some embodiments in combination with the second aspect. In some embodiments, the legacy test model and / or the first test model is one of: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

[0036] In a third aspect, embodiments of the present disclosure provide a communication device, comprising: one or more processors; wherein the communication device is configured to perform the test model determination method of the first aspect, any one of the optional embodiments of the first aspect.

[0037] In a fourth aspect, embodiments of the present disclosure provide a storage medium having instructions stored therein, when the instructions are run on a communication device, the instructions cause the communication device to perform the test model determination method of the first aspect, any one of the optional embodiments of the first aspect.

[0038] In a fifth aspect, embodiments of the present disclosure provide a program product, which, when executed by a communication device, causes the communication device to perform the method of the first aspect or any one of the optional embodiments of the first aspect.

[0039] In a sixth aspect, embodiments of the present disclosure provide a computer program, which, when executed on a computer, causes the computer to perform the method described in the first aspect or any one of the optional embodiments of the first aspect.

[0040] It can be understood that the test model determination apparatus, the communication device, the storage medium, the program product, and the computer program are all used to perform the method proposed in the embodiments of the present disclosure. Therefore, the beneficial effects that can be achieved by them can refer to the beneficial effects in the corresponding method, which will not be described here again.

[0041] Embodiments of the present disclosure propose a test model determination method, apparatus, communication device, and storage medium. In some embodiments, the terms of the test model determination method and information processing method, communication method, etc. can be replaced with each other, the terms of the test model determination apparatus and information processing apparatus, communication apparatus, etc. can be replaced with each other, and the terms of the information processing system and communication system, etc. can be replaced with each other.

[0042] Embodiments of the present disclosure are not exhaustive, but are only a part of the embodiments, and are not specific limitations on the protection scope of the present disclosure. In the case of no contradiction, each step in an embodiment can be implemented as an independent embodiment, and the steps can be combined arbitrarily, for example, the scheme after removing some steps in an embodiment can also be implemented as an independent embodiment, and the order of the steps in an embodiment can be exchanged arbitrarily, in addition, the optional implementation manners in an embodiment can be combined arbitrarily; in addition, the embodiments can be combined arbitrarily, for example, the steps of different embodiments or part or all of the steps of different embodiments can be combined arbitrarily, an embodiment can be combined with the optional implementation manners of other embodiments.

[0043] In each embodiment of the present disclosure, the terms and / or descriptions of the embodiments are consistent and can be referred to each other if there is no special description and logical conflict, and the technical features in different embodiments can be combined to form a new embodiment according to their inherent logical relationship.

[0044] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments, and not as a limitation on the present disclosure.

[0045] In the embodiments of the present disclosure, an element represented in singular form, such as "a", "an", "the", "said", "the aforementioned", "the foregoing", "this", and the like, unless otherwise specified, can represent "one and only one", or can represent "one or more", "at least one", and the like.

[0046] For example, in the case of using an article such as "a", "an", "the" in English in translation, the noun after the article can be understood as a singular expression, or can be understood as a plural expression.

[0047] In the embodiments of the present disclosure, "plurality" means two or more.

[0048] In some embodiments, the terms "at least one of", "one or more", "a plurality of", "multiple", and the like can be replaced with each other.

[0049] In some embodiments, the description manner such as "at least one of A, B", "A and / or B", "A in one case and B in another case", "responding to a case A, responding to another case B", and the like can include the following technical solutions according to the case: A in some embodiments (A is executed regardless of B); B in some embodiments (B is executed regardless of A); A and B are selectively executed in some embodiments (A and B are selected to be executed); A and B are executed in some embodiments (A and B are both executed). When there are more branches such as A, B, C, and the like, it is similar to the above.

[0050] In some embodiments, the description manner such as "A or B" and the like can include the following technical solutions according to the case: A in some embodiments (A is executed regardless of B); B in some embodiments (B is executed regardless of A); A and B are selectively executed in some embodiments (A and B are selected to be executed). When there are more branches such as A, B, C, and the like, it is similar to the above.

[0051] The prefix words "first", "second", and the like in the embodiments of the present disclosure are only used to distinguish different description objects, and do not constitute a limitation on the position, order, priority, quantity, or content of the description objects. The description of the description objects should be referred to the description in the context of the claims or embodiments, and should not constitute an unnecessary limitation because of the use of the prefix words.

[0052] For example, the ordinal numbers before the description object "field" in "the first field" and "the second field" do not limit the positions or orders between the "fields", and "the first" and "the second" do not limit whether the "fields" they modify are in the same message or not, nor do they limit the order of "the first field" and "the second field". For another example, the ordinal numbers before the description object "level" in "the first level" and "the second level" do not limit the priorities between the "levels". For another example, the quantity of the description object is not limited by the ordinal numbers, and can be one or more. For example, "the first device", where the quantity of the description object "device" can be one or more. In addition, the description objects modified by different prefix words can be the same or different. For example, the description object is "device", and "the first device" and "the second device" can be the same device or different devices, and their types can be the same or different. For another example, the description object is "information", and "the first information" and "the second information" can be the same information or different information, and their contents can be the same or different.

[0053] In some embodiments, "comprising A", "including A", "for indicating A", "carrying A" can be interpreted as directly carrying A, or indirectly indicating A.

[0054] In some embodiments, the terms "in response to", "in response to determining", "in the case of", "when", "when", "if", "if" and the like can be replaced with each other.

[0055] In some embodiments, the terms "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not lower than", "above" and the like can be replaced with each other, and the terms "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "not more than", "lower than", "lower than or equal to", "not higher than", "below" and the like can be replaced with each other.

[0056] In some embodiments, the device and the like can be interpreted as physical or virtual, and the name is not limited to the name recorded in the embodiments. The terms "device", "equipment", "device", "circuit", "network element", "node", "function", "unit", "section", "system", "network", "chip", "chip system", "entity", "subject" and the like can be replaced with each other.

[0057] In some embodiments, "network" can be interpreted as a device (for example, access network device, core network device, etc.) contained in the network.

[0058] In some embodiments, the terms “access network device (AN device),” “radio access network device (RAN device),” “base station (BS),” “radio base station,” “fixed station,” “node,” “access point,” “transmission point (TP),” “reception point (RP),” “transmission / reception point (TRP),” “panel,” “antenna panel,” “antenna array,” “cell,” “macro cell,” “small cell,” “femto cell,” “pico cell,” “sector,” “cell group,” “serving cell,” “carrier,” “component carrier,” “bandwidth part (BWP),” and the like can be used interchangeably.

[0059] In some embodiments, the terms "terminal," "terminal device," "user equipment (UE)," "user terminal," "mobile station (MS)," "mobile terminal (MT)," "subscriber station," "mobile unit," "subscriber unit," "wireless unit," "remote unit," "mobile device," "wireless device," "wireless communication device," "remote device," "mobile subscriber station," "access terminal," "mobile terminal," "wireless terminal," "remote terminal," "handset," "user agent," "mobile client," "client," and so on can be replaced with each other.

[0060] In some embodiments, the access network device, the core network device, or the network device can be replaced with a terminal. For example, the embodiments of the present disclosure can also be applied to a structure in which communication between the access network device, the core network device, or the network device and the terminal is replaced with communication between a plurality of terminals (e.g., device-to-device (D2D), vehicle-to-everything (V2X), etc.). In this case, the terminal can also be configured to have all or part of the functions of the access network device. In addition, the terms "uplink," "downlink," and the like can also be replaced with terms corresponding to the inter-terminal communication (e.g., "side"). For example, the uplink channel, the downlink channel, and the like can be replaced with the side channel, and the uplink, the downlink, and the like can be replaced with the sidelink.

[0061] In some embodiments, the terminal can be replaced with the access network device, the core network device, or the network device. In this case, the access network device, the core network device, or the network device can also be configured to have all or part of the functions of the terminal.

[0062] In some embodiments, the data, information, etc. can be obtained in compliance with the laws and regulations of the country in which the location is situated.

[0063] In some embodiments, the data, information, etc. can be obtained after obtaining the consent of the user.

[0064] In addition, each element, each row, or each column in the table of the embodiments of the present disclosure can be implemented as an independent embodiment, and any combination of any element, any row, or any column can also be implemented as an independent embodiment.

[0065] FIG. 1 is an architecture schematic diagram of a communication system according to an embodiment of the present disclosure.

[0066] As shown in FIG. 1, the communication system 100 includes a test device 101 and a device under test 102, where the device under test can be a terminal or an access network device, and the test device can also be a terminal or an access network device. The test device can test the device under test, for example, through over the air (OTA) testing.

[0067] In some embodiments, the terminal 101 includes at least one of a mobile phone, a wearable device, an Internet of Things device, a communication-enabled car, a smart car, a Pad, a computer with wireless transceiver function, a virtual reality (VR) terminal device, an augmented reality (AR) terminal device, a wireless terminal device in industrial control, a wireless terminal device in self-driving, a wireless terminal device in remote medical surgery, a wireless terminal device in smart grid, a wireless terminal device in transportation safety, a wireless terminal device in smart city, a wireless terminal device in smart home, and the like, but is not limited thereto.

[0068] In some embodiments, the access network device is, for example, a node or device that accesses a terminal to a wireless network, and the access network device can include at least one of an evolved NodeB (eNB) in a 5G communication system, a next generation eNB (ng-eNB), a next generation NodeB (gNB), a node B (NB), a home node B (HNB), a home evolved node B (HeNB), a wireless backhaul device, a radio network controller (RNC), a base station controller (BSC), a base transceiver station (BTS), a base band unit (BBU), a mobile switching center, a base station in a 6G communication system, an open base station (Open RAN), a cloud base station (Cloud RAN), a base station in other communication systems, an access node in a Wi-Fi system, but is not limited thereto.

[0069] In some embodiments, the core network device can be one device including one or more network elements, or can be multiple devices or device groups including all or part of the one or more network elements described above. The network element can be virtual or physical. The core network includes, for example, at least one of an evolved packet core (EPC), a 5G core network (5GCN), and a next generation core (NGC).

[0070] In some embodiments, the technical solutions of the present disclosure can be applied to an Open RAN architecture, at which time the interfaces between or within the access network devices involved in the embodiments of the present disclosure can become internal interfaces of the Open RAN, and the processes and information interactions between these internal interfaces can be realized through software or programs.

[0071] In some embodiments, the access network device can be composed of a central unit (CU) and a distributed unit (DU), where the CU can also be referred to as a control unit. The CU-DU structure can split the protocol layers of the access network device, and some of the protocol layers are controlled by the CU, and the remaining part or all of the protocol layers are distributed in the DU and controlled by the CU, but is not limited thereto.

[0072] It can be understood that the communication system described in the embodiments of the present disclosure is for more clearly illustrating the technical solutions of the embodiments of the present disclosure, and does not constitute a limitation on the technical solutions proposed by the embodiments of the present disclosure. Those skilled in the art can know that, with the evolution of system architecture and the appearance of new business scenarios, the technical solutions proposed by the embodiments of the present disclosure are also applicable to similar technical problems.

[0073] The following embodiments of the present disclosure can be applied to the communication system 100 shown in FIG. 1 or part of the subjects, but are not limited thereto. The subjects shown in FIG. 1 are exemplary, and the communication system can include all or part of the subjects in FIG. 1, or other subjects other than FIG. 1. The number and form of each subject is arbitrary, each subject can be physical or virtual, the connection relationship between each subject is exemplary, each subject can not be connected or can be connected, the connection can be in any way, can be direct connection or indirect connection, can be wired connection or wireless connection.

[0074] Embodiments of the present disclosure can be applied to Long Term Evolution (LTE), LTE-Advanced (LTE-A), LTE-Beyond (LTE-B), SUPER 3G, IMT-Advanced, 4th generation mobile communication system (4G), 5th generation mobile communication system (5G), 5G new radio (NR), Future Radio Access (FRA), New-Radio Access Technology (RAT), New Radio (NR), New radio access (NX), Future generation radio access (FX), Global System for Mobile communications (GSM (registered trademark)), CDMA2000, Ultra Mobile Broadband (UMB), IEEE 802.11 (Wi-Fi (registered trademark)), IEEE 802.16 (WiMAX (registered trademark)), IEEE 802.20, Ultra-WideBand (UWB), Bluetooth (Bluetooth (registered trademark)), Public Land Mobile Network (PLMN) network, Device-to-Device (D2D) system, Machine to Machine (M2M) system, Internet of Things (IoT) system, Vehicle-to-Everything (V2X), system using other communication methods, next-generation system expanded based on them, or the like. Further, a plurality of systems can be combined (for example, combination of LTE or LTE-A and 5G, or the like), and applied.

[0075] In some embodiments, the test equipment can test the device under test, for example, perform over the air (OTA) testing, and the result of the testing can be used for beam management, for example.

[0076] In a conventional OTA test for beam management, the accuracy of the reference signal receiving power of layer 1 (L1-RSRP) is verified, generally based on an Additive White Gaussian Noise (AWGN) channel model.

[0077] However, for Artificial Intelligence (AI) based beam management, the prediction function of the beam needs to be tested, such as predicting the beam index, the beam quality, etc., which cannot be tested based on the AWGN channel model any more, but needs to apply a fading channel model, such as a Cluster Delay Line (CDL) channel model.

[0078] For the CDL channel model, there are multiple clusters, and for each cluster, multiple rays need to be modeled. The signals from each ray and cluster will arrive from different directions (e.g., to the device under test). In the OTA test, a probe is needed for each ray to simulate the signal, and if the number of rays and clusters is too large, it means that a large number of probes need to be set in the test environment (e.g., a darkroom or chamber).

[0079] However, for the test device where the probes are located, there are difficulties in increasing the number of probes, and if the far field distance is applied to multiple directions at the same time, it can also cause uncontrollable darkroom size. Therefore, it is necessary to reduce the number of probes required for testing in some simplified way.

[0080] FIG. 2 is an interaction diagram illustrating a test model determination method according to an embodiment of the present disclosure.

[0081] In some embodiments, the model determination device performing the test model determination method can include a device in the test (e.g., OTA test) process, such as a test device, a device under test, etc., or a device outside the test process, such as a server.

[0082] As shown in FIG. 2, the test model determination method can include the following steps:

[0083] In step S201, a conventional test model is determined.

[0084] In some embodiments, the conventional test model can be stored in the test device and / or the device under test, and the test device and / or the device under test can indicate the conventional test model to the model determination device for the model determination device to determine the conventional test model.

[0085] The embodiment shown in FIG. 2 mainly takes the test equipment and / or the DUT indicating the conventional test model to the model determination equipment as an example to exemplarily illustrate the technical solutions of the present disclosure. However, the manner in which the model determination equipment determines the conventional test model is not limited to the test equipment and / or the DUT indicating the conventional test model to the model determination equipment, and there can be other manners for the model determination equipment to determine the conventional test model, which is not limited by the present disclosure. For example, a user can input the related parameters of the conventional test model in the model determination equipment, so as to determine the conventional test model by the model determination equipment.

[0086] In step S202, the first test model is determined.

[0087] In some embodiments, the first test model satisfies at least one of the following:

[0088] The number of clusters of the first test model is less than the number of clusters of the conventional test model;

[0089] The number of rays included in the cluster of the first test model is less than the number of rays included in the cluster of the conventional test model.

[0090] In some embodiments, after the model determination apparatus determines the first test model, the model determination apparatus can output the related parameters of the first test model, for example, through an output device (such as a display device, an audio device, etc.) on the model determination apparatus, so that the user can adjust the probe according to the related parameters of the first test model.

[0091] Alternatively, the model determination apparatus can indicate the first test model to the test equipment and / or the DUT, and the test equipment and / or the DUT can output the related parameters of the first test model through an output device (such as a display device, an audio device, etc.) on the model determination apparatus, so that the user can adjust the probe according to the related parameters of the first test model.

[0092] Alternatively, the model determination apparatus can indicate the first test model to the test equipment (for example, directly indicating the test equipment, or indicating the test equipment through other equipment (such as the DUT)), and the test equipment can automatically adjust the probe based on the related parameters of the first test model, for example, turn off part of the probe.

[0093] According to the embodiments of the present disclosure, the number of clusters of the first test model is less than the number of clusters of the conventional test model, in the case that the number of rays corresponding to the cluster is the same, the total amount of rays corresponding to the cluster in the first test model is less than the total amount of rays corresponding to the cluster in the conventional test model; or the number of rays of the first test model is less than the number of rays of the conventional test model.

[0094] On this basis, since the signal from each ray needs a probe for simulation, in the case of a reduction in the total number of rays in the model, the number of probes required in the test environment is also reduced. Therefore, testing (for example, OTA testing) based on the first test model determined by the embodiments of the present disclosure can reduce the number of probes required to be set and reduce the complexity of testing.

[0095] In some embodiments, the determining the first test model comprises one of the following:

[0096] simplifying the clusters of the conventional test model and / or the rays included in the clusters to obtain the first test model;

[0097] Alternatively, the first test model is generated based on a required channel spatial distribution.

[0098] In some embodiments, the first test model can be obtained based on the conventional test model, for example, by simplifying the clusters of the conventional test model and / or the rays included in the clusters to obtain the first test model. How to simplify the conventional test model will be described in subsequent embodiments.

[0099] In some embodiments, the first test model can be a regenerated model, and the number of clusters in the first test model and / or the number of rays included in the clusters in the first test model is less than the number of rays included in the clusters of the conventional test model. For example, the conventional test model can include 23 clusters, each cluster having 20 rays. The number of clusters included in the first test model can be less than 23, and / or the number of rays included in each cluster can be less than 20.

[0100] Moreover, the generated first test model needs to ensure that the channel spatial distribution is met, wherein the channel spatial distribution can be as described in 38.901 of the 3GPP protocol, which will not be described herein again.

[0101] In some embodiments, the test scenario can include a line of sight (LOS) scenario and a non-line of sight (NLOS) scenario.

[0102] The model (conventional test model, first test model, etc.) used for testing in the embodiments of the present disclosure can include a fading channel model, wherein the fading channel model can include a CDL channel model, for example, and can also include other models. Subsequent embodiments will mainly take the CDL channel model as an example to exemplarily describe the technical solutions of the present disclosure.

[0103] In some embodiments, simplifying the rays included in a cluster of a conventional test model includes: determining a power corresponding to each cluster in the conventional test model; and ignoring a cluster corresponding to a power less than a power threshold.

[0104] It should be noted that when the power corresponding to the cluster is equal to the power threshold, the cluster can be ignored or not ignored, which can be set according to actual needs, and the present disclosure is not limited.

[0105] The present embodiment can be applied to a LOS scenario and can also be applied to a NLOS scenario. Taking the model in the present embodiment as an example, the model can include a CDL channel model, which can include five models, namely a CDL-A channel model, a CDL-B channel model, a CDL-C channel model, a CDL-D channel model, and a CDL-E channel model.

[0106] Among them, the CDL-D channel model and the CDL-E channel model can be applied to a LOS scenario, and the CDL-A channel model, the CDL-B channel model, and the CDL-C channel model can be applied to a NLOS scenario.

[0107] Taking the CDL-D channel model as an example, the related parameters can be as shown in Table 1:

[0108] Table 1

[0109] Based on Table 1, the CDL-D channel model includes 13 clusters, and each cluster corresponds to a plurality of parameters, such as a power angular spectrum (PAS), a normalized delay, a power in, an angle of arrival, and an angle of departure. Among them, the angle of arrival can include an AOA and a ZAO, and the angle of departure can include an AOD and a ZOD. The AOA refers to the angle of arrival in the azimuth angle, the AOD refers to the angle of departure in the azimuth angle, the ZOA refers to the angle of arrival in the zenith angle, and the ZOD refers to the angle of departure in the zenith angle.

[0110] In some embodiments, the power threshold can be artificially set, for example, a model determination device is artificially input, or the power threshold is pre-stored in the to-be-tested device and / or the test device, and then sent to the model determination device by the to-be-tested device and / or the test device. Of course, the determination method of the power threshold is not limited to the several methods described in the present embodiment, and the power threshold can be determined according to actual needs, and the present disclosure is not limited.

[0111] For example, taking the power threshold value of -10 dB as an example, in the CDL-D channel model, only the power (for example, the input power shown in Table 1) corresponding to the Specular (LOS path) of cluster #1 is greater than the power threshold value, that is, -0.2 dB, and other clusters corresponding to the power can be ignored, so that the related parameters of the CDL-D channel model can be simplified as shown in Table 2 below:

[0112] Table 2

[0113] It can be seen that according to the embodiment, by ignoring the clusters corresponding to the power less than the power threshold value, the number of clusters in the first test model can be ensured to be less than the number of clusters in the traditional test model. For example, by comparing Table 1 and Table 2, it can be determined that the first test model is based on the parameters in Table 2, and the first test model only includes one cluster, which reduces 12 clusters (clusters #2 to #13) and the Laplacian path corresponding to cluster #1 relative to the traditional CDL-D model. Then, under the condition that the number of rays corresponding to the clusters does not change, the number of rays included in the model can be effectively reduced, and the number of probes required to be set when testing based on the first test model can be effectively reduced.

[0114] It should be noted that the above embodiment can also be applied to the NLOS scene, but the object to be simplified, that is, the traditional test model to be simplified, becomes one of the CDL-A channel model, the CDL-B channel model and the CDL-C channel model.

[0115] Taking the CDL-A channel model as an example, the related parameters can be as shown in Table 3:

[0116] Table 3

[0117] Based on Table 1, the CDL-D channel model includes 23 clusters, each cluster corresponds to multiple parameters, for example, Normalized Delay, Power in, angle of arrival, angle of departure, etc., wherein AOA refers to the angle of arrival in the azimuth angle, AOD refers to the angle of departure in the azimuth angle, ZOA refers to the angle of arrival in the zenith angle, and ZOD refers to the angle of departure in the zenith angle.

[0118] For example, taking the power threshold value of -10 dB as an example, in the CDL-D channel model, the power (for example, the input power shown in Table 3) corresponding to clusters #2 to #7, and clusters #9 and #11 is greater than the power threshold value, and other clusters corresponding to the power can be ignored, so that the related parameters of the CDL-D channel model can be simplified as shown in Table 4 below:

[0119] Table 4

[0120] It can be seen that according to the present embodiment, by ignoring the clusters corresponding to the power less than the power threshold, the number of clusters in the first test model can be ensured to be less than the number of clusters in the conventional test model. For example, by comparing the above table 3 and table 4, it can be determined that the first test model is based on the parameters in table 4, and the first test model only contains 8 clusters, which reduces 15 clusters compared with the conventional CDL-A channel model. Then, in the case that the number of rays corresponding to the clusters does not change, the number of rays included in the model can be effectively reduced, and in turn, the number of probes required to be set can be effectively reduced when testing based on the first test model.

[0121] In some embodiments, the simplifying the rays included in the clusters of the conventional test model comprises: modeling one ray for a single cluster in the conventional test model.

[0122] For the conventional test model, a plurality of rays can be modeled for a single cluster, for example, 20 rays are modeled, in this case, one cluster corresponds to 20 rays, and in the case that the number of clusters is large, the number of rays included in the model will also be large. For example, for the above CDL-A channel model, in the case that the model includes 23 clusters, each cluster corresponds to 20 rays, and 23 clusters correspond to 460 rays, then when testing based on the CDL-A channel model, 460 probes need to be set.

[0123] According to the present embodiment, only one ray can be modeled for a single cluster. For the above CDL-A channel model, in the case that the model includes 23 clusters, it can be adjusted to model 1 ray for a single cluster, so that each cluster corresponds to 1 ray, and 23 clusters correspond to 23 rays, then when testing based on the first test model obtained by adjusting the CDL-A channel model, only 23 probes need to be set, effectively reducing the number of probes required to be set.

[0124] In some embodiments, the simplifying the rays included in the clusters of the conventional test model comprises: determining the difference value (the absolute value of the difference value can also be calculated) of the angle of arrival corresponding to each cluster in the conventional test model; and merging a plurality of clusters corresponding to the difference value less than the difference value threshold (when calculating the absolute value of the difference value, the absolute value of the difference value can be compared with the difference value threshold here) into one cluster.

[0125] It should be noted that when the difference value of the angle of arrival corresponding to the cluster is equal to the power difference threshold, the plurality of clusters corresponding to the difference value can be merged into one cluster, or the plurality of clusters corresponding to the difference value can not be merged into one cluster, which can be set according to the need, and the present disclosure is not limited.

[0126] In some embodiments, the difference threshold value can be manually set or determined based on the capability of the device under test (e.g., the angular resolution of the receiving antenna of the device under test). The determination of the difference threshold value is not limited to the several manners described in the embodiments, and can be determined as needed, and the disclosure is not limited.

[0127] For example, taking model CDL-A, a difference threshold value of 0.1° (which can also be an interval, e.g., -0.1° to 0.1°), and an angle of arrival of AOA as examples. In the CDL-A channel model described above, the difference between the angles of arrival corresponding to cluster #2 to cluster #4 is 0, which is less than the difference threshold value, and the difference between the angles of arrival corresponding to cluster #5 to cluster #7 is 0, which is less than the difference threshold value. Then, cluster #2 to cluster #4 can be merged into one cluster, and cluster #5 to cluster #7 can be merged into one cluster.

[0128] In some embodiments, since the parameters corresponding to the clusters are different, the manner of merging multiple clusters into one cluster includes but is not limited to:

[0129] Taking any one of the multiple clusters as the merged cluster;

[0130] Taking a cluster with a specific sequence number (e.g., the smallest sequence number or the largest sequence number) in the multiple clusters as the merged cluster;

[0131] Retaining one cluster according to a parameter other than the angle of arrival corresponding to the multiple clusters as the merged cluster, for example, taking the cluster corresponding to the smallest normalized delay in the multiple clusters as the merged cluster, or taking the cluster corresponding to the largest input power in the multiple clusters as the merged cluster. The specific manner is not limited to the two manners, and can be determined as needed, and the disclosure is not limited.

[0132] It should be noted that the manner of merging multiple clusters into one cluster is not limited to the several manners exemplified in the embodiments, and can be determined as needed, and the disclosure is not limited.

[0133] For example, taking the manner of merging multiple clusters into one cluster as an example of taking the cluster with the smallest sequence number in the multiple clusters as the merged cluster, the related parameters of the CDL-A channel model can be simplified as shown in Table 5:

[0134] Table 5

[0135] It can be seen that, according to the embodiment, by merging the plurality of clusters corresponding to the difference values less than the difference threshold value into one cluster, it can be ensured that the number of clusters in the first test model is less than the number of clusters in the conventional test model. For example, by comparing Table 3 and Table 5, it can be determined that the first test model is determined based on the parameters in Table 5, and the first test model only contains 19 clusters, which is reduced by 4 clusters compared with the conventional CDL-A channel model. Then, in the case that the number of rays corresponding to the clusters does not change, the number of rays included in the model can be effectively reduced, and then when the test is performed based on the first test model, the number of probes required to be set can be effectively reduced.

[0136] It should be noted that the above several simplification methods of the conventional test model can be independently implemented, or can be combined as needed.

[0137] For example, the cluster corresponding to the power less than the power threshold value can be ignored, and the plurality of clusters corresponding to the difference values less than the difference threshold value can be merged into one cluster, and the two simplification methods are combined to simplify the conventional test model.

[0138] Taking the CDL-A model as an example, for example, the difference threshold value is -15° to 15°, and the power threshold value is -15 dB. For the CDL-A model, the clusters #{10, 12, 14, 18-23} correspond to the power less than the power threshold value, and thus these clusters can be ignored. The clusters #{1, 11}, the clusters #{2, 3, 4}, the clusters #{5, 6, 7}, the clusters #{8, 15}, and the clusters #{9, 17} correspond to the difference values of the angles of arrival less than the difference threshold value, and thus the clusters #{1, 11} can be merged, the clusters #{2, 3, 4} can be merged, the clusters #{5, 6, 7} can be merged, and the clusters #{8, 15} can be merged. Then, the related parameters of the first test model obtained can be as shown in Table 6:

[0139] Table 6

[0140] It can be seen that, according to the embodiment, by ignoring the cluster corresponding to the power less than the power threshold value, and merging the plurality of clusters corresponding to the difference values less than the difference threshold value into one cluster, it can be ensured that the number of clusters in the first test model is less than the number of clusters in the conventional test model. For example, by comparing Table 3 and Table 6, it can be determined that the first test model is determined based on the parameters in Table 6, and the first test model only contains 7 clusters, which is reduced by 16 clusters compared with the conventional CDL-A model. Then, in the case that the number of rays corresponding to the clusters does not change, the number of rays included in the model can be effectively reduced, and then when the test is performed based on the first test model, the number of probes required to be set can be effectively reduced.

[0141] It should be noted that the above embodiment simplifies the example of the conventional test model based on the parameters shown in Table 1 and Table 3, and when the parameters of the model change, the simplified result can also change accordingly, and the present disclosure does not limit this.

[0142] The communication method related to the embodiments of the present disclosure can include at least one of steps S201-S202. For example, step S201 can be implemented as an independent embodiment, step S202 can be implemented as an independent embodiment, step S201+S202 can be implemented as an independent embodiment, but not limited thereto.

[0143] In some embodiments, steps S201 and S202 can be exchanged in order or executed simultaneously.

[0144] In some embodiments, step S201 is optional, and one or more of these steps can be omitted or replaced in different embodiments.

[0145] In some embodiments, step S202 is optional, and one or more of these steps can be omitted or replaced in different embodiments.

[0146] In some embodiments, other optional implementations described before or after the description corresponding to FIG. 2 can be referred to.

[0147] In a first aspect, the embodiments of the present disclosure propose a test model determination method. FIG. 3 is a schematic flowchart of a test model determination method according to an embodiment of the present disclosure. The test model determination method shown in the present embodiment can be executed by a terminal.

[0148] As shown in FIG. 3, the test model determination method can include the following steps:

[0149] In step S301, a first test model is determined, wherein the first test model satisfies at least one of the following: the number of clusters of the first test model is less than the number of clusters of a conventional test model; the number of rays included in the cluster of the first test model is less than the number of rays included in the cluster of the conventional test model.

[0150] It should be noted that the embodiment shown in FIG. 3 can be independently implemented, or can be implemented in combination with at least one other embodiment of the present disclosure. The specific implementation can be selected as needed, and the present disclosure does not limit it.

[0151] In some embodiments, the determination of the first test model includes one of the following: simplifying the clusters and / or rays included in the clusters of the conventional test model to obtain the first test model; or generating the first test model based on a required channel spatial distribution.

[0152] In some embodiments, the simplifying the rays included in the clusters of the legacy test model comprises: modeling a single ray for each cluster in the legacy test model.

[0153] In some embodiments, the simplifying the rays included in the clusters of the legacy test model comprises: determining a difference of the angles of arrival corresponding to each cluster in the legacy test model; merging the clusters corresponding to the differences less than a difference threshold into one cluster.

[0154] In some embodiments, the legacy test model and / or the first test model is one of: a cluster delay line CDL-A channel model; a CDL-B channel model; a CDL-C channel model.

[0155] In some embodiments, the simplifying the rays included in the clusters of the legacy test model comprises: determining a power corresponding to each cluster in the legacy test model; ignoring the cluster corresponding to the power less than a power threshold.

[0156] In some embodiments, the legacy test model and / or the first test model is one of: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

[0157] The optional implementation of the first aspect and the optional implementation of the optional embodiments of the first aspect can refer to the optional implementation of the embodiments shown in FIG. 2 and other related parts in the embodiments related to FIG. 2, which will not be repeated here.

[0158] In some embodiments, the names of information and the like are not limited to the names described in the embodiments, and the terms such as "information", "message", "signal", "signaling", "report", "configuration", "indication", "instruction", "command", "channel", "parameter", "domain", "field", "symbol", "symbol", "codebook", "codeword", "code point", "bit", "data", "program", "chip", and the like can be replaced with each other.

[0159] In some embodiments, "acquire", "obtain", "get", "receive", "transmit", "bidirectional transmission", "send and / or receive" can be replaced with each other, which can be interpreted as receiving from other subjects, acquiring from protocols, acquiring from higher layers, obtaining by self-processing, autonomously implementing, and the like.

[0160] In some embodiments, the terms "send", "transmit", "report", "issue", "transmit", "bidirectional transmission", "send and / or receive" can be replaced with each other.

[0161] In some embodiments, the terms "certain", "preset", "preset", "set", "indicated", "certain", "arbitrary", "first" and the like can be replaced with each other. "Certain A", "preset A", "preset A", "set A", "indicated A", "certain A", "arbitrary A", "first A" can be interpreted as A specified in advance in protocols and the like, A obtained by setting, configuration, or indication, and the like, A specific, certain, arbitrary, or first A, but not limited thereto.

[0162] Corresponding to the foregoing embodiments of the test model determination method, the present disclosure also provides embodiments of a test model determination device.

[0163] FIG. 4 is a schematic block diagram of a test model determination device according to an embodiment of the present disclosure. As shown in FIG. 4, the test model determination device includes a processing module 401.

[0164] In some embodiments, the processing module is configured to determine a first test model, wherein the first test model satisfies at least one of: a number of clusters of the first test model is less than a number of clusters of a conventional test model; a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the conventional test model.

[0165] In some embodiments, the processing module is configured to one of: simplify a cluster of a conventional test model and / or a ray included in the cluster to obtain the first test model; or generate the first test model based on a required channel spatial distribution.

[0166] In some embodiments, the processing module is configured to model a single cluster in the conventional test model as a ray.

[0167] In some embodiments, the processing module is configured to determine a difference value of an angle of arrival corresponding to each cluster in the conventional test model; and merge a plurality of clusters corresponding to difference values less than a difference value threshold into one cluster.

[0168] In some embodiments, the legacy test model and / or the first test model is one of: a cluster delay line CDL-A channel model; a CDL-B channel model; a CDL-C channel model.

[0169] In some embodiments, the processing module is configured to determine power corresponding to each cluster in the legacy test model; and ignore the cluster corresponding to the power less than a power threshold.

[0170] In some embodiments, the legacy test model and / or the first test model is one of: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

[0171] For the apparatus embodiments, since they basically correspond to the method embodiments, the relevant parts are described in the part of the method embodiments. The apparatus embodiments described above are merely illustrative, wherein the modules described as separate components can or can not be physically separated, and the components displayed as modules can or can not be physical modules, i.e., can be located in one place or distributed to multiple network modules. Part or all of the modules can be selected to achieve the purpose of the present embodiment scheme according to actual needs. Those skilled in the art can understand and implement it without creative labor.

[0172] The embodiments of the present disclosure also propose a device for implementing any of the above methods, for example, a device comprising units or modules for implementing each step performed by a terminal in any of the above methods. For another example, another device is proposed, comprising units or modules for implementing each step performed by a network device (such as an access network device, a core network function node, a core network device, etc.) in any of the above methods.

[0173] It should be understood that the division of each unit or module in the above apparatus is only a logical function division, and all or part of them can be integrated into a physical entity or physically separated in actual implementation. In addition, the units or modules in the apparatus can be implemented in the form of processor calling software: for example, the apparatus includes a processor connected with a memory, the memory stores instructions, and the processor calls the instructions stored in the memory to implement any of the above methods or realize the functions of each unit or module of the above apparatus, wherein the processor is, for example, a general processor such as a central processing unit (CPU) or a microprocessor, and the memory is a memory within the apparatus or a memory outside the apparatus. Alternatively, the units or modules in the apparatus can be implemented in the form of hardware circuit, and the functions of part or all of the units or modules can be realized by the design of the hardware circuit. The above hardware circuit can be understood as one or more processors; for example, in one implementation, the above hardware circuit is an application-specific integrated circuit (ASIC), and the functions of part or all of the above units or modules are realized by the design of the logical relationship of the elements in the circuit; for example, in another implementation, the above hardware circuit is a programmable logic device (PLD), and a field programmable gate array (FPGA) is taken as an example, which can include a large number of logic gate circuits, and the connection relationship between the logic gate circuits is configured by a configuration file, so as to realize the functions of part or all of the above units or modules. All units or modules of the above apparatus can be implemented in the form of processor calling software, or all units or modules can be implemented in the form of hardware circuit, or part of the units or modules are implemented in the form of processor calling software, and the remaining part is implemented in the form of hardware circuit.

[0174] In the embodiments of the present disclosure, the processor is a circuit with signal processing capability. In one implementation, the processor can be a circuit with instruction reading and running capability, such as a central processing unit (CPU), a microprocessor, a graphics processing unit (GPU) (which can be understood as a microprocessor), a digital signal processor (DSP), and the like. In another implementation, the processor can implement certain functions through a logical relationship of a hardware circuit, and the logical relationship of the hardware circuit is fixed or reconfigurable. For example, the processor is a hardware circuit implemented by an application-specific integrated circuit (ASIC) or a programmable logic device (PLD), such as an FPGA. In the reconfigurable hardware circuit, the processor loads a configuration document to implement the configuration of the hardware circuit. It can be understood that the processor loads instructions to implement the functions of the above part or all units or modules. In addition, the hardware circuit can also be designed for artificial intelligence, which can be understood as an ASIC, such as a neural network processing unit (NPU), a tensor processing unit (TPU), a deep learning processing unit (DPU), and the like.

[0175] FIG. 5A is a structural schematic diagram of a communication device 5100 according to an embodiment of the present disclosure. The communication device 5100 can be a network device (for example, an access network device, a core network device, and the like), or a terminal (for example, a user equipment, and the like), or a chip, a chip system, or a processor supporting the network device to implement any of the above methods, or a chip, a chip system, or a processor supporting the terminal to implement any of the above methods. The communication device 5100 can be used to implement the methods described in the above method embodiments, and details can be referred to the descriptions in the above method embodiments.

[0176] As shown in FIG. 5A, the communication device 5100 includes one or more processors 5101. The processor 5101 can be a general processor or a special-purpose processor, etc., for example, a baseband processor or a central processing unit. The baseband processor can be used to process communication protocols and communication data, the central processing unit can be used to control a communication apparatus (e.g., a base station, a baseband chip, a terminal device, a terminal device chip, a DU or a CU, etc.), execute programs, and process data of the programs. Optionally, the communication device 5100 is configured to perform any of the above methods. Optionally, the one or more processors 5101 are configured to invoke instructions to cause the communication device 5100 to perform any of the above methods.

[0177] In some embodiments, the communication device 5100 further includes one or more transceivers 5102. When the communication device 5100 includes one or more transceivers 5102, the transceiver 5102 performs at least one of the communication steps (e.g., steps S201, S202, but not limited to) in the above methods, and the processor 5101 performs at least one of the other steps (e.g., steps S201, S202, but not limited to). In optional embodiments, the transceiver can include a receiver and / or a transmitter, which can be separate or integrated together. Optionally, the terms transceiver, transceiving unit, transceiver, transceiving circuit, interface circuit, interface, etc. can be replaced with each other, and the terms transmitter, transmitting unit, transmitter, transmitting circuit, etc. can be replaced with each other, and the terms receiver, receiving unit, receiver, receiving circuit, etc. can be replaced with each other.

[0178] In some embodiments, the communication device 5100 further includes one or more memories 5103 for storing data. Optionally, all or part of the memory 5103 can also be outside the communication device 5100. In optional embodiments, the communication device 5100 can include one or more interface circuits 5104. Optionally, the interface circuit 5104 is connected to the memory 5102, and the interface circuit 5104 can be used to receive data from the memory 5102 or other devices, and can be used to send data to the memory 5102 or other devices. For example, the interface circuit 5104 can read data stored in the memory 5102 and send the data to the processor 5101.

[0179] The communication device 5100 described in the above embodiments can be a network device or a terminal, but the scope of the communication device 5100 described in the present disclosure is not limited thereto, and the structure of the communication device 5100 can not be limited by FIG. 5A. The communication device can be a standalone device or can be part of a larger device. For example, the communication device can be: 1) a standalone integrated circuit (IC), or a chip, or a chip system or subsystem; (2) a set of one or more ICs, which can optionally also include storage components for storing data, programs; (3) an ASIC, such as a modem; (4) a module that can be embedded in other devices; (5) a receiver, a terminal device, a smart terminal device, a cellular phone, a wireless device, a handset, a mobile unit, a vehicle-mounted device, a network device, a cloud device, an artificial intelligence device, and the like; (6) other devices, and the like.

[0180] FIG. 5B is a structural schematic diagram of a chip 5200 according to an embodiment of the present disclosure. For the case where the communication device 5100 is a chip or a chip system, the structural schematic diagram of the chip 5200 shown in FIG. 5B can be referred to, but is not limited thereto.

[0181] The chip 5200 includes one or more processors 5201. The chip 5200 is configured to perform any of the above methods.

[0182] In some embodiments, the chip 5200 further includes one or more interface circuits 5202. Optionally, the terms interface circuit, interface, transceiver pin, and the like can be replaced with each other. In some embodiments, the chip 5200 further includes one or more memories 5203 for storing data. Optionally, all or part of the memory 5203 can be outside the chip 5200. Optionally, the interface circuit 5202 is connected to the memory 5203, and the interface circuit 5202 can be configured to receive data from the memory 5203 or other devices, and the interface circuit 5202 can be configured to send data to the memory 5203 or other devices. For example, the interface circuit 5202 can read data stored in the memory 5203 and send the data to the processor 5201.

[0183] In some embodiments, the interface circuit 5202 performs at least one of the communication steps (such as steps S201, S202, but not limited thereto) of transmitting and / or receiving in the above methods. The interface circuit 5202 performing the communication steps such as transmitting and / or receiving in the above methods means that the interface circuit 5202 performs data interaction between the processor 5201, the chip 5200, the memory 5203, or a transceiver device. In some embodiments, the processor 5201 performs at least one of the other steps (such as steps S201, S202, but not limited thereto).

[0184] The modules and / or devices described in various embodiments of the virtual device, the physical device, the chip, etc. can be combined or separated according to circumstances. Alternatively, part or all of the steps can also be performed by a plurality of modules and / or devices in cooperation, which is not limited here.

[0185] The disclosure further provides a storage medium having instructions stored thereon, which, when executed on the communication device 5100, causes the communication device 5100 to perform any of the above methods. Alternatively, the storage medium is an electronic storage medium. Alternatively, the storage medium is a computer readable storage medium, but is not limited to this, and it can also be a storage medium readable by other devices. Alternatively, the storage medium can be a non-transitory storage medium, but is not limited to this, and it can also be a transitory storage medium.

[0186] The disclosure further provides a program product, which, when executed by the communication device 5100, causes the communication device 5100 to perform any of the above methods. Alternatively, the program product is a computer program product.

[0187] The disclosure further provides a computer program, which, when executed on a computer, causes the computer to perform any of the above methods.

Claims

1. A test model determination method characterized by, The method comprises: determining a first test model, wherein the first test model satisfies at least one of the following: a number of clusters of the first test model is less than a number of clusters of a conventional test model; a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the conventional test model.

2. The method of claim 1, wherein, The determination of the first test model comprises one of the following: simplifying a cluster of the conventional test model and / or a ray included in the cluster to obtain the first test model; or, generating the first test model based on a required channel spatial distribution.

3. The method of claim 2, wherein, The simplification of the ray included in the cluster of the conventional test model comprises: modeling a single cluster in the conventional test model as a ray.

4. The method according to claim 2 or 3, characterized in that, The simplification of the ray included in the cluster of the conventional test model comprises: determining a difference of an angle of arrival corresponding to each cluster in the conventional test model; merging a plurality of clusters corresponding to a difference less than a difference threshold into one cluster.

5. The method according to claim 3 or 4, characterized in that, The conventional test model and / or the first test model is one of the following models: a cluster delay line CDL-A channel model; a CDL-B channel model; a CDL-C channel model.

6. The method according to any one of claims 2 to 4, characterized in that, The simplification of the ray included in the cluster of the conventional test model comprises: determining a power corresponding to each cluster in the conventional test model; ignoring a cluster corresponding to a power less than a power threshold.

7. The method of claim 6, wherein, The conventional test model and / or the first test model is one of the following models: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

8. A test model determination apparatus characterized by comprising: The apparatus comprises: a processing module configured to determine a first test model, wherein the first test model satisfies at least one of the following: a number of clusters of the first test model is less than a number of clusters of a conventional test model; a number of rays included in a cluster of the first test model is less than a number of rays included in a cluster of the conventional test model.

9. The apparatus of claim 8, wherein, The processing module is configured to one of the following: simplifying a cluster of the conventional test model and / or a ray included in the cluster to obtain the first test model; or, generating the first test model based on a required channel spatial distribution.

10. The apparatus of claim 9, wherein, The processing module is configured to model a single cluster in the conventional test model as a ray.

11. The apparatus of claim 8 or 9, wherein, The processing module is configured to determine a difference of an angle of arrival corresponding to each cluster in the conventional test model; and merge a plurality of clusters corresponding to a difference less than a difference threshold into one cluster.

12. The apparatus of claim 10 or 11, wherein, The conventional test model and / or the first test model is one of the following models: a cluster delay line CDL-A channel model; a CDL-B channel model; a CDL-C channel model.

13. The apparatus of any one of claims 9-11, wherein, The processing module is configured to determine a power corresponding to each cluster in the conventional test model; and ignore a cluster corresponding to a power less than a power threshold.

14. The apparatus of claim 13, wherein, The conventional test model and / or the first test model is one of the following models: a CDL-A channel model; a CDL-B channel model; a CDL-C channel model; a CDL-D channel model; a CDL-E channel model.

15. A communication device, characterized by comprise: one or more processors; The communication device is configured to perform the test model determination method of any one of claims 1-7.

16. A storage medium, the storage medium storing instructions, wherein, The instructions, when executed on the communication device, cause the communication device to perform the test model determination method of any one of claims 1-7.

17. A program product, characterized by The program product, when executed by the communication device, causes the communication device to perform the test model determination method of any one of claims 1-7.

Images