Method and device for detecting quality of storage device and storage medium
By testing storage devices at multiple temperatures and combining the evaluation values with weighted coefficients, the problem of incomplete quality testing of storage devices in existing technologies is solved, and a more accurate and comprehensive quality assessment is achieved.
Patent Information
- Application Number
- CN202511685672.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-17
- Publication Date
- 2026-02-24
AI Technical Summary
Existing technologies cannot fully assess the reliability of storage devices, resulting in inaccurate and incomplete quality testing.
By testing storage devices at multiple temperatures to obtain various parameters, combining them with weighting coefficients to calculate evaluation values, and comparing them with preset evaluation thresholds, the quality of the storage devices can be determined.
It improves the comprehensiveness and accuracy of storage device quality testing, reduces the impact of accidental factors, and achieves a more comprehensive quality assessment.
Smart Images
Figure CN121565231A_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of storage technology, and more particularly to a method, apparatus, and storage medium for detecting the quality of storage devices. Background Technology
[0002] Typically, storage device manufacturers and users conduct quality tests to ensure product quality. These tests usually involve checking whether a few key parameters of the storage device meet standards. If all or most parameters meet the standards, the storage device is considered to be free of defects; if some parameters fail to meet the standards, the storage device is considered to have defects. This testing method often only assesses a portion of the storage device's performance and cannot comprehensively evaluate its reliability. Summary of the Invention
[0003] This disclosure provides a method, apparatus, and storage medium for detecting the quality of storage devices.
[0004] In a first aspect, embodiments of this disclosure provide a method for detecting the quality of a storage device, comprising: acquiring test parameters of the storage device to be tested, the test parameters including multiple parameters obtained by testing the storage device to be tested at multiple temperatures; determining an evaluation value for evaluating the quality of the storage device to be tested based on the test parameters and a predetermined weighting coefficient; comparing the evaluation value with a predetermined evaluation threshold to determine whether the quality of the storage device to be tested is qualified, thereby obtaining a quality detection result of the storage device to be tested.
[0005] Secondly, embodiments of this disclosure provide an apparatus for testing the quality of a storage device, comprising: an insulated box for housing the storage device under test, used to provide various temperature environments required for testing; an interface for interacting with the storage device under test, used to transmit data and instructions required for testing to the storage device under test; an information acquisition module connected to the storage device under test, used to monitor test parameters of the storage device under test during testing; and an evaluation module connected to the information acquisition module, used to output the quality test result of the storage device under test through the method for testing the quality of the storage device described in the above embodiments.
[0006] Thirdly, this disclosure provides a non-transient computer storage medium, which stores a computer program that, when executed by a processor, implements the method for detecting the quality of a storage device as described in the above embodiments.
[0007] The method for detecting the quality of storage devices disclosed in this embodiment includes multiple parameters obtained from testing the storage device under test at various temperatures, which can cover the operating status of the storage device under test under different operating conditions. The evaluation value obtained by fusing the test parameters based on weighting coefficients can comprehensively reflect the quality of the storage device while also taking into account the importance of key parameters to the quality of the storage device. The quality of the storage device under test is then determined based on the evaluation value and an evaluation threshold. This reduces the adverse impact of random factors on the test results, thereby improving the comprehensiveness and accuracy of storage device quality testing.
[0008] Other features and advantages of this disclosure will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the disclosure. Other advantages of this disclosure may be realized and obtained by means of the methods described in the description and the accompanying drawings. Attached Figure Description
[0009] The accompanying drawings are used to provide an understanding of the technical solutions of this disclosure and form part of the specification. They are used together with the embodiments of this disclosure to explain the technical solutions of this disclosure and do not constitute a limitation on the technical solutions of this disclosure.
[0010] Figure 1 This is a schematic flowchart of an embodiment of the method for detecting the quality of a storage device disclosed herein; Figure 2 This is a schematic flowchart illustrating the process of determining an evaluation value in one embodiment of the method for detecting the quality of a storage device disclosed herein; Figure 3 This is a schematic flowchart of an embodiment of the method for detecting the quality of a storage device disclosed herein; Figure 4 This is a schematic diagram of one embodiment of the device for detecting the quality of storage devices disclosed herein. Detailed Implementation
[0011] To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. It should be noted that, unless otherwise specified, the embodiments and features described in this disclosure can be arbitrarily combined with each other.
[0012] The embodiments disclosed herein are not necessarily limited to the dimensions shown in the drawings, and the shapes and sizes of the components in the drawings do not reflect actual proportions. Furthermore, the drawings schematically illustrate ideal examples, and the embodiments of this disclosure are not limited to the shapes or values shown in the drawings.
[0013] The ordinal numbers such as "first" and "second" in this disclosure are used to avoid confusion among the constituent elements and do not indicate any order, quantity, or importance.
[0014] In this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linkage" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; a mechanical connection or an electrical connection; a direct connection, an indirect connection via an intermediate component, or a connection within two components. Those skilled in the art can understand the specific meaning of these terms in this disclosure according to the specific circumstances.
[0015] Figure 1 A flowchart illustrating one embodiment of the method for detecting the quality of storage devices disclosed herein is shown, as follows: Figure 1 As shown, the process may include the following steps.
[0016] Step 110: Obtain the test parameters of the storage device to be tested.
[0017] The test parameters include multiple parameters obtained by testing the storage device under test at multiple temperatures.
[0018] In this embodiment, the test parameters can reflect the operating status of the storage device under test under different operating conditions from multiple dimensions. For example, the storage device can be a hard drive, a removable storage device, or a memory card. The test parameters can include multiple parameters such as the number of bad blocks, write cycles, error rate, temperature, and number of errors detected when the storage device under test is running at normal and high temperatures.
[0019] Step 120: Based on the test parameters and predetermined weighting coefficients, determine the evaluation value used to assess the quality of the storage device under test.
[0020] In this embodiment, the weighting coefficients include the weight values corresponding to each parameter in the test parameters, used to characterize the importance of different parameters to the quality of the storage device. Here, the weighting coefficients can be determined based on experience or experimental data. For example, if a parameter is negatively correlated with the quality of the storage device (i.e., the larger the parameter value, the worse the storage device quality), then the weight value of that parameter is negative; conversely, if a parameter is positively correlated with the quality of the storage device (i.e., the larger the parameter value, the better the storage device quality), then the weight value of that parameter is positive. If a parameter has a significant impact on the quality of the storage device, then the weight value of that parameter is larger; conversely, if a parameter has a small impact on the quality of the storage device, then the weight value of that parameter is smaller.
[0021] As an example, test parameters and weighting coefficients can be presented in matrix form, with each parameter in the test parameters corresponding to a weight value in the weighting coefficients. The weighted sum of the test parameters and weighting coefficients can be obtained through matrix multiplication and used as the evaluation value. In this way, the evaluation value can not only fully reflect the quality of the storage device, but also take into account the degree of influence of different parameters on the quality of the storage device.
[0022] Step 130: Compare the evaluation value with the predetermined evaluation threshold to determine whether the quality of the storage device under test is qualified, and obtain the quality test result of the storage device under test.
[0023] As an example, an evaluation threshold can be determined by statistically analyzing the test parameters of qualified and unqualified storage devices; alternatively, the evaluation threshold can be determined based on experience. If the evaluation value is greater than or equal to the evaluation threshold, the storage device under test is determined to be of qualified quality; if the evaluation value is less than the evaluation threshold, the storage device under test is determined to be of unqualified quality.
[0024] The following is an illustrative example using a specific scenario. Storage device manufacturers can randomly select a certain number of storage devices from a batch as the storage devices to be tested. These devices are then tested at various temperatures using specialized testing equipment to obtain and save the test parameters. An electronic device (e.g., a computer or computing module) running the method for testing storage device quality according to this embodiment can obtain the test parameters of the storage devices to be tested through a data interface, and then execute steps 120 and 130 above to determine whether the storage devices to be tested are qualified and output the quality test results.
[0025] The method for detecting the quality of storage devices disclosed in this embodiment includes multiple parameters obtained from testing the storage device under test at various temperatures, which can cover the operating status of the storage device under test under different operating conditions. The evaluation value obtained by fusing the test parameters based on weighting coefficients can comprehensively reflect the quality of the storage device while also taking into account the importance of key parameters to the quality of the storage device. The quality of the storage device under test is then determined based on the evaluation value and an evaluation threshold. This reduces the adverse impact of random factors on the test results, thereby improving the comprehensiveness and accuracy of storage device quality testing.
[0026] In some embodiments, step 110 above can obtain the test parameters of the storage device under test by running a predetermined load at a first preset temperature and a second preset temperature, and monitoring multiple parameters of the storage device under test at each temperature to obtain the test parameters.
[0027] In this embodiment, the first preset temperature can represent room temperature, such as 25°C. The second preset temperature is higher than the first preset temperature and can represent a high temperature, such as 75°C. By detecting various parameters of the storage device under test during operation in both room temperature and high temperature environments, the obtained test parameters can characterize the quality of the storage device under test under different operating conditions, which helps to improve the accuracy of storage device quality testing.
[0028] In some optional implementations of this embodiment, monitoring multiple parameters of the storage device under test at each temperature may include the following: monitoring the overall circuit quality of the storage device under test at each temperature to obtain a first type of parameter; monitoring the data processing quality of the storage device under test at each temperature to obtain a second type of parameter; monitoring the state of key electronic components of the storage device under test at each temperature to obtain a third type of parameter; monitoring the temperature change of the storage device under test at each temperature to obtain a fourth type of parameter; and monitoring the lifetime change of the storage device under test at each temperature to obtain a fifth type of parameter.
[0029] In this embodiment, the first type of parameter can characterize the overall circuit quality of the storage device under test at different temperatures; the second type of parameter can characterize the reliability of the storage device under test in processing data at different temperatures; the third type of parameter can characterize the reliability of the key electronic components of the storage device under test; the fourth type of parameter can characterize the effect of ambient temperature on the temperature of the storage device under test; and the fifth type of parameter can characterize the reliability of the storage device under test's lifespan. The test parameters can include some or all of the above-mentioned types of parameters, reflecting the quality of the storage device under test from multiple dimensions, thereby providing more comprehensive, richer, and more effective data for storage device quality testing.
[0030] In one example of this implementation, the parameters of the first type include at least one of the following: Power-On Hours Count; Ungraceful Shutdown Count (number of times the address mapping table (e.g., a mapping table from logical addresses to physical addresses) is rebuilt due to abnormal power outages; SATA Physical Layer (SATA phy error count) is also included.
[0031] In one example of this implementation, the second type of parameters includes at least one of the following: the count of N-bit errors occurring when accessing data in a cache (e.g., SRAM (Static Random-Access Memory)), where N is 1 or 2; the count of N-bit errors occurring when accessing data in memory (e.g., DDR (Double Data Rate Synchronous Dynamic Random-Access Memory)); the cumulative number of protocol-end errors (SATA PHY Error Count); program / erase cycles; the cumulative number of failed physical block writes to flash memory (e.g., NAND); the cumulative number of failed physical block erases to flash memory (Erase Failed Count); the cumulative number of end-to-end errors; and the cumulative number of reported uncorrectable errors (i.e., ECC (Error Correction Code) correction failures). Errors; the cumulative number of Frame Information Structure (FIS) errors (Cyclic Redundancy Check, CRC) in the read or write protocol (Ultra-DMA CRC Error Count); the number of times the Redundant Array of Independent Nodes (RAIN) has been recovered; the number of available reserved spaces; the number of bad blocks; and the read / write error rate.
[0032] In one example of this implementation, the third type of parameters includes at least one of the following: the health status of the supercapacitor used for power loss protection (PLP); the voltage value of the supercapacitor; and the status of the temperature sensor used to measure the overall temperature of the storage device.
[0033] In this example, the overall temperature of the storage device can include the current temperature, the lowest temperature, and the highest temperature.
[0034] Compared to the SMART (Self-Monitoring Analysis and Reporting Technology) parameters for storage devices in related technologies, which of the parameters in the above examples contains richer information and can more comprehensively reflect the quality of storage devices, providing more detailed and comprehensive data support for storage device quality testing?
[0035] In some embodiments, step 120 may include Figure 2 The process shown is as follows: Figure 2 As shown, the process may include the following steps.
[0036] Step 210: Normalize each parameter in the test parameters to obtain the processed parameters.
[0037] Step 220: Determine the weighted average of the processed parameters and weight coefficients as the evaluation value.
[0038] In a specific example, each parameter in the test parameters can be normalized in various ways to obtain the processed parameters in the interval [0, 1]. For example, min-max normalization, arctangent normalization, or other methods can be used. Different parameters can use different normalization methods. For example, the first type of parameters can use min-max normalization, and the second type of parameters can use arctangent normalization. Then, the weighted average of the processed parameters and the weight coefficients can be determined by the following formula (1). S , as an evaluation value.
[0039] (1) In the formula, Indicates the first i Item parameters, Indicates the first i The weighting coefficients of the item parameters.
[0040] In this embodiment, the test parameters are normalized and then the weighted average of the test parameters and weight coefficients is used as the evaluation value. This can eliminate the interference of dimensions and thus more accurately reflect the impact of the parameters on the quality of the storage device, which helps to improve the accuracy of storage device quality testing.
[0041] Figure 3A flowchart of yet another embodiment of the method for detecting the quality of a storage device according to embodiments of the present disclosure is shown, as follows: Figure 3 As shown, the process may include the following steps.
[0042] Step 310: Obtain the test parameters of the storage device to be tested.
[0043] Step 320: Based on the test parameters, dynamically determine the weight value corresponding to each parameter in the test parameters to obtain the weight coefficient.
[0044] As an example, the entropy weight method or the analytic hierarchy process (AHP) can be used to analyze each parameter in the test parameters and dynamically determine the weight coefficient corresponding to each parameter.
[0045] Step 330: Based on the test parameters and predetermined weighting coefficients, determine the evaluation value used to assess the quality of the storage device under test.
[0046] Step 340: Compare the evaluation value with the predetermined evaluation threshold to determine whether the quality of the storage device under test is qualified, and obtain the quality test result of the storage device under test.
[0047] In this embodiment, the weight value corresponding to each parameter can be dynamically determined according to the test parameters, so that the weight coefficient can more accurately represent the importance of the parameter to the quality of the storage device, thereby improving the accuracy of storage device quality testing.
[0048] like Figure 4 As shown, embodiments of this disclosure also provide an apparatus for detecting the quality of storage devices, such as... Figure 4 As shown, the device may include: an insulated box 410 for housing the storage device under test, providing various temperature environments required for testing; an interface 420 for interacting with the storage device under test, transmitting data and instructions required for testing to the storage device under test; an information acquisition module 430 connected to the storage device under test, for monitoring test parameters during testing of the storage device under test; and an evaluation module 440 connected to the information acquisition module 430, for outputting the quality test result of the storage device under test through the method for detecting the quality of the storage device in any of the above embodiments.
[0049] As an example, when testing the quality of a storage device, the storage device under test can be placed in an insulated box 410. The interface 420 is connected to the host CPU to receive the data and instructions required for testing sent by the host and transmit them to the storage device under test. The temperature of the insulated box 410 is then set to a predetermined temperature. The information acquisition module 430 monitors the operating status of the storage device under test and obtains multiple parameters at that temperature. The insulated box 410 is then adjusted, and the information acquisition module 430 acquires the multiple parameters of the storage device under test at that temperature again. These parameters, monitored at multiple temperatures, are transmitted as test parameters to the evaluation module 440. The evaluation module 440 can determine an evaluation value based on predetermined weighting coefficients and test parameters. The evaluation value is then compared with an evaluation threshold to determine whether the storage device under test is qualified and outputs the quality test result.
[0050] The device for detecting the quality of storage devices in this embodiment automates the process from acquiring test parameters to outputting quality detection results, which helps improve the efficiency of storage device quality detection. Furthermore, the method for detecting the quality of storage devices described in the above embodiment is used to comprehensively evaluate the quality of storage devices, which helps improve the accuracy of storage device quality detection.
[0051] Thirdly, this disclosure provides a non-transient computer storage medium, which stores a computer program that, when executed by a processor, implements the method for detecting the quality of a storage device as described in the above embodiments.
[0052] It will be understood by those skilled in the art that all or some of the steps, systems, or apparatuses disclosed above, and their functional modules / units, can be implemented as software, firmware, hardware, or suitable combinations thereof. In hardware implementations, the division between functional modules / units mentioned above does not necessarily correspond to the division of physical components; for example, a physical component may have multiple functions, or a function or step may be performed collaboratively by several physical components. Some or all components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit (ASIC). Such software may be distributed on a computer-readable medium, which may include computer storage media (or non-transitory media) and communication media (or transient media). As is known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disc (DVD) or other optical disc storage, magnetic cartridges, magnetic tape, disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically contain computer-readable instructions, data structures, program modules, or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery medium.
Claims
1. A method for detecting the quality of a storage device, characterized in that, include: Acquire test parameters for the storage device under test, the test parameters including multiple parameters obtained by testing the storage device under test at multiple temperatures; Based on the test parameters and predetermined weighting coefficients, an evaluation value is determined to assess the quality of the storage device under test. By comparing the evaluation value with a predetermined evaluation threshold, it is determined whether the quality of the storage device under test is qualified, and the quality test result of the storage device under test is obtained.
2. The method according to claim 1, characterized in that, Obtain the test parameters of the storage device under test, including: The storage device under test is subjected to a predetermined load at a first preset temperature and a second preset temperature, and multiple parameters of the storage device under test are monitored at each temperature to obtain the test parameters; wherein, the first preset temperature represents room temperature, and the second preset temperature is higher than the first preset temperature.
3. The method according to claim 2, characterized in that, Monitoring multiple parameters of the storage device under test at each temperature, including the following: Monitor the overall circuit quality of the storage device under test at each temperature to obtain parameters of the first type; By monitoring the data processing quality of the storage device under test at each temperature, a second type of parameter is obtained; By monitoring the state of key electronic components of the storage device under test at each temperature, a third type of parameter is obtained; By monitoring the temperature change of the storage device under test at each temperature, a fourth type of parameter is obtained; By monitoring the lifespan variation of the storage device under test at each temperature, a fifth type of parameter is obtained.
4. The method according to claim 3, characterized in that, The parameters of the first type include at least one of the following: Power-on time; number of times the address mapping table was rebuilt due to abnormal power outages; SATA physical layer error count.
5. The method according to claim 3, characterized in that, The parameters of the second type include at least one of the following: The count of N-bit errors that occur when accessing data in the cache, where N is 1 or 2; The count of N-bit errors that occur when accessing data in memory; The cumulative number of protocol errors that occurred; Erasing / writing cycles; The cumulative number of failed write attempts to physical blocks in flash memory; The cumulative number of failed attempts to erase physical block data in the flash memory; The cumulative number of end-to-end data errors; The total number of uncorrectable errors reported cumulatively; The cumulative number of data packet errors transmitted by the read or write protocol end; Number of recovery attempts for redundant arrays; The number of reserved blocks; Number of bad blocks; Read / write error rate.
6. The method according to claim 3, characterized in that, The third type of parameter includes at least one of the following: The health status of supercapacitors used for power failure protection; The voltage value of the supercapacitor; The status of a temperature sensor used to measure overall issues with storage devices.
7. The method according to claim 1, characterized in that, Based on the test parameters and predetermined weighting coefficients, an evaluation value is determined to assess the quality of the storage device under test, including: Each parameter in the test parameters is normalized to obtain the processed parameters; The weighted average of the processed parameters and the weighting coefficients is determined as the evaluation value.
8. The method according to claim 1, characterized in that, After obtaining the test parameters of the storage device under test, and before determining the evaluation value used to assess the quality of the storage device under test, the method further includes: Based on the test parameters, the weight value corresponding to each parameter in the test parameters is dynamically determined to obtain the weight coefficient.
9. An apparatus for detecting the quality of a storage device, characterized in that, include: An insulated box for housing the storage device to be tested, used to provide the various temperature environments required for testing; An interface for interacting with the storage device under test, used to transmit data and instructions required for testing to the storage device under test; An information acquisition module connected to the storage device under test is used to monitor the test parameters of the storage device under test during testing. The evaluation module connected to the information acquisition module is used to output the quality test result of the storage device under test by means of the method for detecting the quality of the storage device as described in any one of claims 1 to 8.
10. A non-transient computer storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method for detecting the quality of a storage device as described in any one of claims 1 to 8.