Power supply circuit board level application verification system and method
By designing a power circuit board-level application verification system and integrating control software and relay arrays, the high cost and low efficiency problems of power circuit verification were solved, and comprehensive verification and efficient testing of power devices were achieved.
Patent Information
- Application Number
- CN202511663320.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-13
- Publication Date
- 2026-02-27
AI Technical Summary
The lack of a power circuit board-level application verification system in the current technology results in the need for separate design and fabrication of DUT boards for each power circuit verification test, which is costly, time-consuming, inefficient, and difficult for multiple people to work together.
Design a power circuit board-level application verification system, including a host computer, a slave computer, a motherboard, a DUT board, a dual-channel function generator, and a dual-channel oscilloscope. It can realize multiple types of tests through integrated control software and relay array, support high and low temperature environment verification, and flexibly switch load types.
It enables comprehensive verification of power supply devices, improves the convenience and data reliability of verification work, shortens the verification cycle, reduces test costs, and adapts to various test conditions.
Smart Images
Figure CN121578173A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of microelectronic device reliability, specifically relating to a power supply circuit board-level application verification system and method. Background Technology
[0002] With the continuous development of military equipment such as aerospace, the requirements for the performance, reliability, and environmental adaptability of the components used are becoming increasingly stringent. Component application verification, based on the current component industry and focusing on users, is an important task to address the issues of components being unusable, undesirable, or poorly performed, ensuring that components meet equipment performance requirements and achieving independent control over equipment components. Its main objectives are to identify "unusable" issues such as product design, manufacturing defects, and quality risks as early as possible through system verification and analysis of components, providing timely feedback to research and development units for improvement and refinement, thus promoting product maturity; and to provide users with a basis for selection through scientific evaluation of components, addressing the "undesirable" issue of users hesitant to use components due to a lack of application support data and unclear application risks, thereby promoting the widespread application of components in military engineering such as aerospace.
[0003] Power supply circuits are a crucial component in the overall system. Verification projects are numerous, and testing requirements are stringent. However, the lack of a usable application verification system necessitates separate scheme design and DUT board fabrication for each model's verification testing. Different power supply circuit models require different test plans based on the test items. The testing involves a wide variety of equipment and instruments, and the DUT board and supporting test circuit boards need to be remade and reassembled, resulting in high testing costs, long preparation and verification cycles, cumbersome testing processes, difficulties in multi-person collaborative work, low production efficiency, and significant waste. Summary of the Invention
[0004] The purpose of this invention is to solve the problems in the prior art and provide a power circuit board-level application verification system and method.
[0005] To achieve the above objectives, the present invention employs the following technical solution: The present invention proposes a power circuit board-level application verification system, comprising: a host computer, a slave computer, a motherboard, a DUT board, a dual-channel function generator, a dual-channel oscilloscope, and a load; The host computer and the slave computer are communicatively connected, and the slave computer is electrically connected to the motherboard. The motherboard is equipped with interfaces for connecting a dual-channel function generator, a dual-channel oscilloscope, and a load, respectively. The DUT board is movably connected to the motherboard, and the device under test (DUT) is mounted on the DUT board. The host computer sends test commands to the slave computer, which converts the test commands and sends them to the motherboard. The dual-channel function generator generates the signals required for the test and sends them to the motherboard. The motherboard receives the commands sent by the slave computer and the dual-channel function generator, and tests the DUT on the DUT board. The dual-channel oscilloscope acquires the waveforms of the DUT on the DUT board in real time and transmits the acquired test data and waveform signals to the host computer for real-time storage.
[0006] Preferably, the host computer is an industrial control computer, which is equipped with dual-channel function generator control software, dual-channel oscilloscope control software, and motherboard control software. The dual-channel function generator control software sets the parameters of the dual-channel function generator, the dual-channel function generator generates corresponding signals, and sends them to the motherboard. The dual-channel oscilloscope control software sets the key acquisition parameters of the dual-channel oscilloscope, and the dual-channel oscilloscope sends the acquired data to the host computer. The motherboard control software has built-in switching logic for several verification tests, receives user input test item selection instructions and test voltage parameters, and synchronizes the instructions to the lower-level computer.
[0007] Preferably, the motherboard integrates a control unit, a relay array, and a function switching module containing several test circuits; the lower-level machine includes a signal conversion unit and a drive unit; the signal conversion unit converts the digital instructions sent by the upper-level machine into analog control signals, and the drive unit drives the control unit on the motherboard after receiving the analog control signals. The control unit on the motherboard is electrically connected to the relay array, and the control unit controls the on / off state of the relay array. The test circuit is switched through the function switching module to test the device under test on the DUT board.
[0008] Preferably, the relay array comprises a plurality of relays, each corresponding to a test circuit of the function switching module.
[0009] Preferably, the test circuits of the function switching module are respectively a startup characteristic test circuit, an input surge current test circuit, an input / output transmission characteristic test circuit, an input step voltage response characteristic test circuit, a load current transient response characteristic test circuit, an overload power consumption test and short-circuit power consumption test circuit, and a short-circuit recovery characteristic test circuit for testing the device under test.
[0010] Preferably, the DUT board includes a connector, a PCB board, and copper pillars; the test device is soldered onto the PCB board, the copper pillars are used to support the PCB board, the connector is located at the edge of the PCB board, and the DUT board is plugged into and plugged into the interface on the motherboard through the connector to realize the electrical connection between the test device and the motherboard test circuit.
[0011] Preferably, the motherboard is provided with an external expansion interface. When high and low temperature board-level verification tests are required, the test device is placed in the oven along with the DUT board. The connector of the DUT board in the oven is connected to the external interface of the motherboard through an external cable. The short-circuit state of the relay array is switched by the control unit to realize the test circuit control and verification test under high and low temperature environments.
[0012] Preferably, the dual-channel function generator generates the switching signal required for the test according to the parameters set by the industrial control computer, and transmits the signal to the VDMOSFET of the test circuit on the motherboard. The VDMOSFET controls the switching of the test circuit to test the test device on the DUT board. The test circuit on the motherboard is equipped with a BNC interface, which is used to connect to the signal acquisition terminal of the dual-channel oscilloscope.
[0013] Preferably, the load includes a resistive load cell and a constant current electronic load. The motherboard is provided with a load switching interface. The resistive load cell and the constant current electronic load are selectively connected to the test circuit of the function switching module through the load switching interface. If the resistive load cell is selected, the control unit drives the relay corresponding to the resistive load and the test circuit to close, and simultaneously drives the relay corresponding to the constant current electronic load and the test circuit to open, so that the resistive load cell is connected to the test circuit through the load switching interface. If the constant current electronic load is selected, the relay corresponding to the constant current load is closed, and the relay corresponding to the resistive load is opened, so that the constant current electronic load is connected. The control software of the host computer displays load type selection options. The user sets the load type and load parameters required for the test through the options, or manually adjusts the physical knob of the load to set the load parameters.
[0014] This invention proposes a power supply board-level application verification method, comprising: Install the test device on the PCB of the DUT board. After installing the connector, connect the connector of the DUT board to the motherboard interface to ensure that the DUT board is connected to the motherboard. Turn on the power supply of the system, dual-channel function generator, dual-channel oscilloscope and load to complete the initialization preparation of the test equipment. Select the target board-level verification test item through the host computer human-machine interface, set the initial parameters of the dual-channel function generator, the test voltage of the power supply, and the type and parameters of the load on the host computer; the host computer sends the start test command to the slave computer, the slave computer converts the command into a motherboard control command, drives the control unit to switch the opening and closing state of the relay corresponding to the target test item, and drives the function switching module to switch the test circuit. The dual-channel function generator generates a switching signal according to the set parameters. The switching signal is transmitted to the motherboard through the interface of the dual-channel function generator on the motherboard. The dual-channel oscilloscope acquires the test data and waveforms of the DUT board and saves the data to the host computer. After the test is completed, the host computer interface clicks the test end command, the control unit controls the relay array to reset, and the test circuit returns to the initial state.
[0015] Compared with the prior art, the present invention has the following beneficial effects: This invention integrates dedicated control software on a host computer to set parameters for the function generator, oscilloscope, and load. This, combined with a slave computer, enables instruction conversion and driving. The function switching module incorporates various test circuits and, with precise control of the relay array, performs multiple tests, including startup characteristics and surge current, meeting the comprehensive verification needs of power supply devices. The motherboard's external expansion interface supports high and low temperature environment verification, broadening the system's applicability. The load can be flexibly switched between resistive and constant current types via software or manual adjustment to adapt to different test conditions. A dual-channel oscilloscope acquires waveform data in real time, which is stored on the host computer, providing complete data support for subsequent analysis and significantly improving the convenience, comprehensiveness, and data reliability of the verification process. Attached Figure Description
[0016] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of a power circuit board-level application verification system framework according to the present invention; Figure 2 This is a schematic diagram of the host computer software principle framework; Figure 3 This is a motherboard workflow diagram; Figure 4 This is a schematic diagram of the DUT board; Figure 5 This is a schematic diagram of a power circuit board-level application verification system according to the present invention; Figure 6 This is a schematic diagram for testing the startup characteristics of the experimental device; Figure 7 This is a schematic diagram for testing the input surge current characteristics of the test device; Figure 8 This is a schematic diagram for testing the input / output transmission characteristics of the experimental device; Figure 9 This is a schematic diagram for testing the input step voltage (transient) response characteristics of the test device; Figure 10 This is a schematic diagram for testing the transient response characteristics of the test device under load current. Figure 11 This is a schematic diagram for testing the overload power consumption of the experimental device; Figure 12 This is a schematic diagram for testing the short-circuit power consumption and short-circuit recovery characteristics of the experimental device.
[0018] Among them, 1--connector, 2--PCB board, 3--copper pillar, 4--test device. Detailed Implementation
[0019] In the following description, only certain exemplary embodiments are briefly described. As those skilled in the art will recognize, the described embodiments can be modified in various ways without departing from the spirit or scope of the invention. Therefore, the drawings and description are considered to be exemplary in nature and not restrictive.
[0020] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.
[0021] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.
[0022] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a communication connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0023] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0024] The present invention will now be described in further detail with reference to the accompanying drawings: See Figure 1 This invention discloses a power circuit board-level application verification system, including: a host computer, a slave computer, a motherboard, a DUT board, a dual-channel function generator, a dual-channel oscilloscope, and a load; The host computer and the slave computer are communicatively connected, and the slave computer is electrically connected to the motherboard. The motherboard has interfaces for connecting a dual-channel function generator, a dual-channel oscilloscope, and a load, respectively. The DUT board is movably connected to the motherboard, and the device under test (DUT) is mounted on the DUT board. The host computer sends test commands to the slave computer, which converts the test commands and sends them to the motherboard. The dual-channel function generator generates the signals required for the test and sends them to the motherboard. The motherboard receives the commands sent by the slave computer and the dual-channel function generator, and tests the DUT on the DUT board. The dual-channel oscilloscope acquires the waveforms of the DUT on the DUT board in real time and transmits the acquired test data and waveform signals to the host computer for real-time storage. The power supply provides power to the motherboard.
[0025] See Figure 2The host computer is an industrial control computer, equipped with dual-channel function generator control software, dual-channel oscilloscope control software, and motherboard control software. The dual-channel function generator control software sets the parameters of the dual-channel function generator, which generates corresponding signals and sends them to the motherboard. The dual-channel oscilloscope control software sets the key acquisition parameters of the dual-channel oscilloscope, which then sends the acquired data to the host computer. The motherboard control software has built-in switching logic for several verification tests, receives user-input test item selection commands and test voltage parameters, and synchronizes the commands to the slave computer. The slave computer and the motherboard are electrically connected via an RS485 communication unit.
[0026] See Figure 3 The motherboard integrates a control unit, a relay array, and a function switching module containing several test circuits. The lower-level machine includes a signal conversion unit and a drive unit. The signal conversion unit converts digital instructions sent by the upper-level machine into analog control signals. The drive unit receives the analog control signals and drives the control unit on the motherboard. The control unit on the motherboard is electrically connected to the relay array. The control unit controls the on / off state of the relay array and switches the test circuits through the function switching module to test the device under test on the DUT board.
[0027] The relay array contains several relays, each corresponding to a test circuit of the function switching module.
[0028] The test circuits of the function switching module are respectively the startup characteristic test circuit, input surge current test circuit, input / output transmission characteristic test circuit, input step voltage response characteristic test circuit, load current transient response characteristic test circuit, overload power consumption test and short circuit power consumption test circuit, and short circuit recovery characteristic test circuit for testing the device under test.
[0029] See Figure 4 The DUT board includes a connector 1, a PCB board 2, and copper pillars 3; the test device is soldered onto the PCB board 2, the copper pillars 3 are used to support the PCB board 2, the connector 1 is located at the edge of the PCB board 2, and the DUT board 2 is plugged into and disconnected from the interface on the motherboard through the connector 1 to realize the electrical connection between the test device 4 and the motherboard test circuit.
[0030] The motherboard is equipped with an external expansion interface. When high and low temperature board-level verification tests are required, the test device is placed in the oven along with the DUT board. The external interface of the motherboard is connected to the connector of the DUT board in the oven through an external cable. The short-circuit state of the relay array is switched by the control unit to realize the test circuit control and verification test under high and low temperature environment.
[0031] The dual-channel function generator generates the switching signals required for the test according to the parameters set by the industrial control computer, and transmits the signals to the VDMOSFET of the test circuit on the motherboard. The VDMOSFET controls the switching of the test circuit to test the test devices on the DUT board. The test circuit on the motherboard is equipped with a BNC interface, which is used to connect to the signal acquisition terminal of the dual-channel oscilloscope.
[0032] The load includes a resistive load box and a constant current electronic load. The motherboard is equipped with a load switching interface. The resistive load box and the constant current electronic load are selectively connected to the test circuit of the function switching module through the load switching interface. If the resistive load box is selected, the control unit drives the relay corresponding to the resistive load and the test circuit to close, and simultaneously drives the relay corresponding to the constant current electronic load and the test circuit to open, so that the resistive load box is connected to the test circuit through the load switching interface. If the constant current electronic load is selected, the relay corresponding to the constant current load is closed, and the relay corresponding to the resistive load is opened, so that the constant current electronic load is connected. The control software of the host computer displays load type selection options. The user sets the load type and load parameters required for the test through the options, or manually adjusts the physical knob of the load to set the load parameters.
[0033] This invention proposes a power supply board-level application verification method, comprising: Install the test device on the PCB of the DUT board. After installing the connector, connect the connector of the DUT board to the motherboard interface to ensure that the DUT board is connected to the motherboard. Turn on the power supply of the system, dual-channel function generator, dual-channel oscilloscope and load to complete the initialization preparation of the test equipment. Select the target board-level verification test item through the host computer human-machine interface, set the initial parameters of the dual-channel function generator, the test voltage of the power supply, and the type and parameters of the load on the host computer; the host computer sends the start test command to the slave computer, the slave computer converts the command into a motherboard control command, drives the control unit to switch the opening and closing state of the relay corresponding to the target test item, and drives the function switching module to switch the test circuit. The dual-channel function generator generates a switching signal according to the set parameters. The switching signal is transmitted to the motherboard through the interface of the dual-channel function generator on the motherboard. The dual-channel oscilloscope acquires the test data and waveforms of the DUT board and saves the data to the host computer. After the test is completed, the host computer interface clicks the test end command, the control unit controls the relay array to reset, and the test circuit returns to the initial state.
[0034] See Figure 5 , Figure 5The auxiliary test circuit and the main test circuit are connected by their respective function switching modules. The main test circuit includes a power supply, a DUT board, and basic test circuits. The DUT board only serves as a tooling for the test sample and provides electrical connections. The auxiliary test circuit is the test circuit corresponding to the relay array. During the test, the test item to be performed is selected in the host computer test software, and the test voltage is set. The control unit on the lower computer control motherboard switches the test circuit of the function switching module on the motherboard to the required test circuit and adjusts the required voltage. At this point, the selected test preparation is complete. Subsequently, a dual-channel function generator and a dual-channel oscilloscope are set according to the test requirements. The motherboard transmits the signal generated by the function generator to the VDMOSFET in each test circuit. The VDMOSFET controls the switching of the test circuit. The test data and waveforms are measured by the oscilloscope and saved to the host computer.
[0035] See Figure 6 When performing startup characteristic tests on the test device, the host computer is used to operate and control the startup test unit's function switching module, signal input switching module, signal output switching module, and load switching module to enable... Figure 5 The startup test unit is connected to the main test circuit. A dual-channel function generator provides the switching signal. The two sets of waveforms on the front and back of the DUT board are transmitted to the oscilloscope via a coaxial cable. The load can be selected according to the requirements. At this time, the required test data is acquired and saved through the oscilloscope's built-in software.
[0036] The specific method is as follows: Select the required test item "Startup Characteristic Test" in the industrial computer's human-machine interface, and set the initial parameters of the function generator and the required power supply voltage on the industrial computer. Manually set load A as the required load on the system. Then click "Start Test" in the software interface. The signal acquired at the initial frequency can be observed on the oscilloscope and saved on the industrial computer. After the test is completed, click "End Test". The test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0037] See Figure 7 When testing the input surge current characteristics of the test device, the host computer is used to operate and control the activation of the test unit function switching module, signal input switching module, signal output switching module, and load switching module. Figure 5 The startup test unit is connected to the main test circuit. A dual-channel function generator provides the switching signal, and the waveforms on both sides of the sampling resistor are transmitted to the oscilloscope via a coaxial cable. The load can be selected according to requirements. At this time, the required test data can be acquired and saved through the oscilloscope's built-in software, and the surge current can be calculated.
[0038] The specific method is as follows: In the industrial computer's human-machine interface, select the required test item "Input Surge Current Test", and set the initial parameters of the function generator and the power supply voltage required for the test on the industrial computer. Manually set load A as the required load for the test. Then click "Start Test" in the software interface. The signal collected at the initial frequency can be observed on the oscilloscope and saved on the industrial computer. After the test is completed, click "End Test". The test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0039] See Figure 8 During the input / output transmission characteristic test of the experimental device, the host computer is used to operate and control the audio signal unit function switching module, signal input switching module, signal output switching module, and load switching module to enable... Figure 5 The high-power switching circuit and power supply 2 are connected to the main test circuit. The function generator provides the switching signal. The two sets of waveforms on the front and back of the DUT board are transmitted to the oscilloscope via coaxial cable. The load can be selected according to the requirements. At this time, the required test data can be acquired and saved through the oscilloscope's built-in software, and the audio suppression ratio can be calculated.
[0040] The specific method is as follows: In the industrial control computer's human-machine interface, select the test item to be performed, "Input / Output Transmission Characteristics (Audio Signal Suppression Characteristics) Test", set the power supply to the required test voltage, set power supply 2 to the required superimposed test voltage, set the initial parameters of the function generator, and set load A to the required test load. Then, click "Start Test" in the human-machine interface. The signal acquired at the initial frequency can be observed in the oscilloscope. After saving, adjust the function generator parameters and adjust the oscilloscope to acquire and save signals at different frequencies. Repeat the test until the amount of data meets the test requirements. After the test is completed, click "End Test". The test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0041] See Figure 9 When testing the input step voltage (transient) response characteristics of the test device, the host computer controls the audio signal unit function switching module, signal input switching module, signal output switching module, and load switching module to enable... Figure 5 The high-power switching circuit and power supply 2 are connected to the main test circuit. The function generator provides the switching signal. The two sets of waveforms on the front and back of the DUT board are transmitted to the oscilloscope via a coaxial cable. The load can be selected according to the requirements. At this time, the required test data are acquired and saved through the oscilloscope's built-in software.
[0042] The specific method is as follows: Select the test item to be performed, "Input Step Voltage (Transient) Response Characteristic Test", in the human-machine interface of the industrial control computer, set the power supply to the test requirement voltage, set power supply 2 to the test requirement superimposed voltage, set the initial parameters of the function generator, and then click "Start Test" in the human-machine interface. The signal collected at the initial frequency can be observed in the oscilloscope and saved on the industrial control computer. After the test is completed, click "End Test", and the test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0043] See Figure 10 When testing the load current transient response characteristics of the test device, the host computer is used to operate the signal input switching module, signal output switching module, and load switching module to enable... Figure 5 The load test unit is connected to the main test circuit. The function generator provides the switching signal, and the waveforms before and after the DUT board are transmitted to the oscilloscope via a coaxial cable. The load can be selected according to requirements. At this time, the required test data is acquired and saved through the oscilloscope's built-in software.
[0044] Specifically, in the industrial computer's human-machine interface, select the required test item "Load Current Transient Response Characteristic Test", set the power supply to the required test voltage, set the initial parameters of the function generator, and set load B to the required test load. Then, click "Start Test" in the human-machine interface. The signal acquired at the initial frequency can be observed in the oscilloscope. After saving, adjust the function generator parameters and adjust the oscilloscope to acquire and save signals at different frequencies. Repeat the test until the data volume meets the test requirements. After the test is completed, click "End Test". The test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0045] See Figure 11 When performing overload power consumption tests on the test device, the host computer controls the input switching module, output switching module, and load switching module to enable... Figure 5 The load test unit is connected to the main test circuit. The two sets of waveforms on the front and back of the DUT board are transmitted to the oscilloscope via coaxial cable. The load can be selected according to the requirements. At this time, the required test data is acquired and saved through the oscilloscope's built-in software.
[0046] The specific method is as follows: Select the test item "Overload Power Consumption Test" in the human-machine interface of the industrial control computer, set the power supply to the test requirement voltage, and load A to the test requirement load. Then click "Start Test" in the human-machine interface. The signal collected at the initial frequency can be observed in the oscilloscope and saved on the industrial control computer. After the test is completed, click "End Test". The test circuit will automatically reset and the power supply and equipment will automatically disconnect.
[0047] See Figure 12When testing the short-circuit power consumption and short-circuit recovery characteristics of the experimental device, the host computer is used to control the input switching module, signal output switching module, and load switching module to enable... Figure 5 The load test unit is connected to the main test circuit. Two loads are connected in parallel. One load is periodically switched by a square wave signal provided by a function generator, while the other load is adjusted to its rated current. Two sets of waveforms from the front and back of the DUT board are transmitted to the oscilloscope via a coaxial cable. The load can be selected according to requirements. The necessary test data is then acquired and saved using the oscilloscope's built-in software.
[0048] The specific method is as follows: In the industrial control computer's human-machine interface, select the required test item "Short-circuit power consumption and short-circuit recovery characteristic test," set the power supply to the required test voltage, set the initial parameters of the function generator, set load A to the rated load, and load B to 0Ω. Then, click "Start Test" on the human-machine interface. The signal acquired at the initial frequency can be observed on the oscilloscope. After saving, adjust the function generator parameters and the oscilloscope to acquire and save signals at different frequencies. Repeat the test until the data volume meets the test requirements. After the test, click "End Test," and the test circuit will automatically reset and the power supply and equipment will automatically disconnect. After all tests are completed, export the test data through the corresponding interface for processing.
[0049] The present invention has the following advantages: 1) The test system of the present invention adopts a mother-daughter board design, and the test devices can be replaced by replacing the DUT board; 2) The test system has no oven and provides an external interface. The test devices can be placed in the oven and connected by external cables to realize high and low temperature board-level verification tests; 3) The test content covers DUT board input audio control, output audio control, and DUT board input monitoring. If the test scheme changes, the software can still be adjusted to achieve the required test circuit to the greatest extent and meet multiple schemes; 4) No hardware connection changes or manual measurement are required when testing the same model. The test circuit can be switched quickly and the test efficiency is high; 5) The learning cost is low and no specific personnel are required to conduct the test.
[0050] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.
Claims
1. A power supply board level application verification system, characterized by, The application relates to a test system for testing a device under test (DUT), which comprises an upper computer, a lower computer, a mainboard, a DUT board, a double-channel function generator, a double-channel oscilloscope and a load. The upper computer is in communication connection with the lower computer, the lower computer is in electric connection with the mainboard, the mainboard is provided with interfaces for connecting the double-channel function generator, the double-channel oscilloscope and the load, and the double-channel function generator, the double-channel oscilloscope and the load are connected respectively, the DUT board is in movable connection with the mainboard, and the DUT board is provided with a device to be tested; the upper computer sends a test instruction to the lower computer, the lower computer converts the test instruction and sends the mainboard, the double-channel function generator generates a signal required by the test and sends the mainboard, the mainboard receives the instructions sent by the lower computer and the double-channel function generator, and tests the device to be tested on the DUT board, the double-channel oscilloscope collects the waveform of the device to be tested on the DUT board in real time, and transmits the collected test data and the waveform signal to the upper computer, which stores the data in real time. The upper computer is an industrial computer, the industrial computer is provided with double-channel function generator control software, double-channel oscilloscope control software and mainboard control software; the double-channel function generator control software sets the parameters of the double-channel function generator, the double-channel function generator generates corresponding signals and sends the mainboard, the double-channel oscilloscope control software sets the key collection parameters of the double-channel oscilloscope, and the double-channel oscilloscope sends the collected data to the upper computer; the mainboard control software is internally provided with a plurality of switching logics of verification tests, receives a test item selection instruction and a test voltage parameter input by a user, and synchronously sends the instruction to the lower computer.
2. The power supply circuit board level application verification system of claim 1, wherein, The mainboard is integrated with a control unit, a relay array and a function switching module containing a plurality of test circuits; the lower computer comprises a signal conversion unit and a driving unit; the signal conversion unit converts the digital instruction sent by the upper computer into an analog control signal, the driving unit drives the control unit on the mainboard after receiving the analog control signal, the control unit on the mainboard is in electric connection with the relay array, the control unit controls the on-off state of the relay array, the function switching module is used for switching the test circuits, and the device to be tested on the DUT board is tested.
3. The power supply circuit board level application verification system of claim 1, wherein, The relay array contains a plurality of relays, which are in one-to-one correspondence with the test circuits of the function switching module.
4. The power supply circuit board level application verification system of claim 3, wherein, The test circuits of the function switching module are respectively a start-up characteristic test test circuit, an input surge current test test circuit, an input / output transmission characteristic test test circuit, an input step voltage response characteristic test test circuit, a load current transient response characteristic test test circuit, an overload power consumption test and short-circuit power consumption test circuit and a short-circuit recovery characteristic test test circuit.
5. The power supply circuit board level application verification system of claim 3, wherein, The DUT board comprises a connector, a PCB board and a copper column; the test device is welded on the PCB board, the copper column is used for supporting the PCB board, the connector is arranged at the edge of the PCB board, the DUT board is in plug-in connection with the interface on the mainboard through the connector, and the test device and the test circuit of the mainboard are electrically connected.
6. The power supply circuit board level application verification system of claim 1, wherein, 7. The power supply circuit board level application verification system of claim 6, wherein, The main board is provided with an external expansion interface, when high and low temperature board level verification test is needed, the test device is placed in an oven with the DUT board, the connector of the DUT board in the oven is connected to the external interface of the main board through an external cable, the short circuit state of the relay array is switched by the control unit, and test circuit control and verification test under high and low temperature environment are realized.
8. The power supply circuit board level application verification system of claim 1, wherein, The double-channel function generator generates the switch signal required by the test according to the parameters set by the industrial computer, and transmits the signal to the VDMOSFET of the test circuit in the main board, so that the switch of the test circuit is controlled by the VDMOSFET, and the test device on the DUT board is tested; the test circuit on the main board is provided with a BNC interface, and the BNC interface is used for connecting the signal acquisition end of the double-channel oscilloscope.
9. The power supply circuit board level application verification system of claim 1, wherein, The load includes a resistive load box and a constant current electronic load, the main board is provided with a load switching interface, the resistive load box and the constant current electronic load are selectively connected to the test circuit of the function switching module through the load switching interface; if the resistive load box is selected, the control unit drives the corresponding relay of the resistive load and the test circuit to close, and simultaneously drives the corresponding relay of the constant current electronic load and the test circuit to open, so that the resistive load box is connected to the test circuit through the load switching interface; if the constant current electronic load is selected, the corresponding relay of the constant current load is closed, and the corresponding relay of the resistive load is opened, so that the constant current electronic load is connected; the control software of the upper computer displays the load type selection option, and the user sets the load type and load parameters required by the test through the option, or manually adjusts the physical knob of the load to set the load parameters.
10. A power supply board level application validation method, characterized by, The power circuit board level application verification system realized based on any one of claims 1-9 comprises: The test device is installed on the PCB of the DUT board, the connector of the DUT board is connected to the interface of the main board after the connector is installed, and the DUT board is connected to the main board; the power supply of the system, the double-channel function generator, the double-channel oscilloscope and the load are turned on, and the test equipment initialization preparation is completed; The target board level verification test project is selected through the man-machine interface of the upper computer, the initial parameters of the double-channel function generator, the test voltage of the power supply, and the type and parameters of the load are set on the upper computer; the upper computer sends the test start instruction to the lower computer, the lower computer converts the instruction into the main board control instruction, drives the control unit to switch the opening and closing state of the relay corresponding to the target test project, and drives the function switching module to switch the test circuit; The double-channel function generator generates the switch signal according to the set parameters, the switch signal is transmitted to the main board through the interface of the double-channel function generator of the main board, the double-channel oscilloscope collects the data and waveform of the DUT board to be tested, and saves the data to the upper computer; after the test is completed, the test end instruction on the upper computer interface is clicked, the control unit controls the relay array to reset, and the test circuit returns to the initial state.