Test fixture, signal testing method, and electronic device

Abstract

The application discloses a test fixture, a signal test method and electronic equipment, and relates to the technical field of signal testing.The application introduces an input signal routing unit composed of a first all-multiple relay and a plurality of first multiple-all relay, and an output signal routing unit composed of a plurality of second all-multiple relay and a second multiple-all relay, forms a two-stage dynamic switching architecture, and then realizes routing of signals to any channel and independent selection of a signal source for each channel, breaks through the limitation of single-channel fixed testing of related fixtures, and based on the structure, integrates and realizes three modes of non-crosstalk reference testing, multi-channel full-crosstalk testing and single-channel directional interference testing on a single fixture, can simulate a complex crosstalk scene when a high-speed bus works in a multi-channel parallel mode, improves the comprehensiveness of test coverage and the reliability of test results, and improves test efficiency through electric control switching.

Description

Technical Field

[0001] This application relates to the field of signal testing technology, and in particular to a test fixture, a signal testing method, and an electronic device. Background Technology

[0002] With the development of AI (artificial intelligence) computing and data centers, the speed of high-speed buses such as PCIe (high-speed serial bus standard) and high-speed Ethernet is constantly increasing, and the channel density is increasing day by day. This leads to an exponential increase in crosstalk between differential pairs, which has become a key factor affecting signal integrity. At present, compliance test fixtures are commonly used to connect the device under test (DUT) and instruments such as oscilloscopes for verification. However, these fixtures usually bring out each channel separately, and the cables need to be replaced manually during testing. This process is cumbersome and inefficient. Moreover, most test schemes are single-channel independent tests, which are difficult to simulate the crosstalk environment when multiple channels work in parallel in actual applications. Although external crosstalk sources can be injected, there are problems such as complex test environment setup and difficulty in signal acquisition and control. This results in a significant deviation between laboratory test results and actual application scenarios, making it impossible to fully evaluate the performance of devices under real electromagnetic interference. Summary of the Invention

[0003] This application provides test fixtures, signal testing methods, and electronic devices to at least solve the problems of low testing efficiency and low accuracy of test results in related technologies.

[0004] This application provides a test fixture, including a relay switching module;

[0005] The relay switching module is equipped with a first input interface, a second input interface, an output interface, an input signal routing unit, an output signal routing unit, and an interface adapter component;

[0006] The input signal routing unit is used to route the signal received by the first input interface to any first signal channel of the interface adapter component, and select a target input signal source from a variety of input signal sources to connect with any first signal channel. The input signal sources include the signal of the second signal channel corresponding to the first signal channel, the signal received by the first input interface, the signal of the second input interface, and the termination load.

[0007] The output signal routing unit is used to route the signal of any second signal channel output by the interface adapter component to the output interface, and select the target output source from a variety of output sources to connect the signal of any second signal channel. The output sources include the output interface, the input signal routing unit, and the termination load.

[0008] This application also provides a signal testing method, including:

[0009] Based on the relay switching module in the test fixture, the target input signal source is dynamically selected and connected for at least one first signal channel, and the target output source is selected and connected for at least one second signal channel to construct the target test environment.

[0010] Based on the target test environment, signal transmission tests are performed on the device under test connected to the test fixture.

[0011] This application also provides an electronic device, comprising: a memory for storing a computer program; and a processor for implementing the following steps of the signal testing method when executing the computer program:

[0012] Based on the relay switching module in the test fixture, the target input signal source is dynamically selected and connected for at least one first signal channel, and the target output source is selected and connected for at least one second signal channel to construct the target test environment.

[0013] Based on the target test environment, signal transmission tests are performed on the device under test connected to the test fixture.

[0014] This application also provides a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the following steps of a signal testing method:

[0015] Based on the relay switching module in the test fixture, the target input signal source is dynamically selected and connected for at least one first signal channel, and the target output source is selected and connected for at least one second signal channel to construct the target test environment.

[0016] Based on the target test environment, signal transmission tests are performed on the device under test connected to the test fixture.

[0017] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the following steps of a signal testing method:

[0018] Based on the relay switching module in the test fixture, the target input signal source is dynamically selected and connected for at least one first signal channel, and the target output source is selected and connected for at least one second signal channel to construct the target test environment.

[0019] Based on the target test environment, signal transmission tests are performed on the device under test connected to the test fixture.

[0020] This application introduces an input signal routing unit consisting of a first multi-relay unit and multiple first multi-to-one relays, and an output signal routing unit consisting of multiple second multi-relay units and second multi-to-one relays, forming a two-level dynamic switching architecture. This architecture enables the routing of signals to any channel and allows each channel to independently select and connect a signal source, overcoming the limitations of fixed single-channel testing in related fixtures. Based on this structure, three modes—no-crosstalk benchmark testing, multi-channel full crosstalk testing, and single-channel directional interference testing—are integrated and implemented on a single fixture. This architecture can realistically simulate the complex crosstalk scenario when multiple channels of a high-speed bus are working in parallel, improving the comprehensiveness of test coverage and the reliability of results. At the same time, the testing efficiency is improved through electronically controlled switching. Attached Figure Description

[0021] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This application provides an overall structural diagram of a relay switching module in a test fixture.

[0023] Figure 2 This is a schematic diagram of the overall structure of the test fixture provided in the embodiments of this application;

[0024] Figure 3 This is a schematic diagram of the switching logic of the relay switching module provided in an embodiment of this application;

[0025] Figure 4 This is a schematic diagram of the relay switching module provided in an embodiment of this application;

[0026] Figure 5 This application provides an overall flowchart of a signal testing method.

[0027] Figure 6 This is a schematic diagram of the Tx signal crosstalk-free input single-channel test mode switching provided in the embodiments of this application;

[0028] Figure 7 This is a schematic diagram of the Tx signal multi-channel crosstalk coupling test mode switching provided in the embodiments of this application;

[0029] Figure 8 This is a schematic diagram of single-channel directional interference test mode switching provided in an embodiment of this application;

[0030] Figure 9 This is a schematic diagram illustrating the switching between Rx input pressure test and differential impedance test modes provided in an embodiment of this application.

[0031] Figure 10 This is a schematic diagram of the switching logic of the PCIe signal test relay switching module provided in an embodiment of this application;

[0032] Figure 11 This is a diagram of the internal structure of an electronic device in one embodiment. Detailed Implementation

[0033] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0034] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.

[0035] It should be noted that the terms "S1," "S2," etc., are used only for descriptive purposes and do not specifically refer to the order or sequence, nor are they intended to limit this application. They are merely for the convenience of describing the method of this application and should not be construed as indicating the sequential order of the steps. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed in this application.

[0036] As the background technology indicates, high-speed buses (such as PCIe 4.0 / 5.0, high-speed Ethernet, USB 3.2, etc.) are widely used in AI computing, data centers, and other scenarios, making signal integrity a core challenge. With the increase in high-speed bus speeds, the channel density of high-speed connectors (such as QSFP112G) and chip interfaces increases. Differential pair crosstalk (electromagnetic interference between adjacent signal lines) increases exponentially with the speed, making electromagnetic interference (EMI) during signal transmission increasingly significant. Crosstalk is a key factor affecting signal integrity. When multiple channels transmit in parallel, electromagnetic coupling between adjacent channels degrades signal quality, leading to an increase in the bit error rate. Currently, high-speed buses often use conformance test fixtures to connect the device under test (DUT) to an oscilloscope, non-destructively extracting physical layer signals to verify whether they meet the electrical specifications of the bus standard. High-speed bus test fixtures typically bring out each Tx (transmit) and Rx (receive) channel individually, requiring manual channel switching during testing. This results in high repeatability, and most test schemes involve single-channel independent testing. Simulating multi-channel parallel operation crosstalk scenarios using crosstalk source injection presents challenges such as complex test environment setup and difficulty in acquiring external crosstalk sources. Consequently, high-speed bus test scenarios are often conventional, leading to discrepancies between test results and actual application scenarios. Therefore, high-speed bus test schemes face the dual bottlenecks of cumbersome dynamic crosstalk injection and insufficient adaptability to various scenarios. Furthermore, with signal rates entering the GHz era (e.g., PCIe high-speed serial computer expansion bus standard, DDR double data rate synchronous dynamic random access memory, USB universal serial bus), even a tiny wire or pad exhibits significant parasitic effects (resistance, capacitance, inductance), causing loss, reflection, and distortion of high-speed signals.When testing the signal integrity of a chip, it's impossible to directly point the probe of a measuring instrument (such as an oscilloscope or vector network analyzer, VNA) onto the chip's core die. It's necessary to use: a test fixture (to solder or mount the chip onto a PCB); cables and probes (to connect the fixture and the measuring equipment); and PCB traces (to route the signal from the chip pins to the connector). These additional parts are collectively called "fixtures" or "embedded networks," which severely degrade signal quality, resulting in a very small eye diagram opening and severe waveform distortion. Judging chip performance directly based on this distortion is completely wrong. Therefore, de-embedding techniques must be used to see the chip's true signal integrity. The actual signal performance at the chip pins is not considered. Related high-speed bus test fixtures bring out each differential pair of the Tx and Rx channels separately, such as PCIe test fixtures (CBB, CLB) and high-speed Ethernet test fixtures (HCB, MCB). When testing different channels, manual replacement is required. Crosstalk injection test scenarios are difficult to set up. The test results of related test solutions are not adaptable to multiple scenarios. At present, more technical solutions focus on the automation of the test process and use relay switch modules to achieve the automation of the test process. However, they ignore the crosstalk scenario when multiple channels work in parallel in actual application scenarios. Test solutions based on related test fixtures do not cover the test scenarios comprehensively. Manually replacing test cables is cumbersome and the test efficiency is low.

[0037] To address the aforementioned technical issues, this application provides a method, apparatus, equipment, and storage medium for evaluating the value of a learning management platform. It establishes a monitoring and evaluation system for the content or applications of the learning management platform to enable the elimination or iterative updating of platform content and applications, optimize resource utilization, and ensure user experience, thereby effectively improving the platform's operational and management efficiency.

[0038] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0039] The test fixture, signal testing method, and electronic equipment provided in this application form a two-level dynamic switching architecture by introducing an input signal routing unit composed of a first multi-relay and multiple first multi-to-one relays, and an output signal routing unit composed of multiple second multi-relay and second multi-to-one relays. This architecture enables the routing of signals to any channel and the independent selection and connection of signal sources for each channel, overcoming the limitations of fixed single-channel testing in related fixtures. Based on this structure, three modes—no crosstalk benchmark testing, multi-channel full crosstalk testing, and single-channel directional interference testing—are integrated and implemented on a single fixture. This can realistically simulate the complex crosstalk scenario when multiple channels of a high-speed bus are working in parallel, improving the comprehensiveness of test coverage and the reliability of results. At the same time, the testing efficiency is improved through electronically controlled switching.

[0040] like Figure 1 As shown, an embodiment of this application provides a test fixture, including a relay switching module 1;

[0041] The relay switching module 1 is provided with a first input interface 101, a second input interface 102, an output interface 103, an input signal routing unit 100, an output signal routing unit 200, and an interface adapter component 104. The interface adapter component 104 can be a gold finger / connector. The first input interface 101 is an Rx input interface, the second input interface 102 is a crosstalk input interface, and the output interface 103 is a Tx output interface.

[0042] The input signal routing unit 100 is used to route the signal received by the first input interface 101 to any first signal channel of the interface adapter component 104, and select a target input signal source from a variety of input signal sources to connect to any first signal channel. The input signal source includes the signal of the second signal channel corresponding to the first signal channel, the signal received by the first input interface 101, the signal of the second input interface 102, and the termination load 105. The termination load 105 is a single-ended 50Ω termination. The signal of the second input interface 102 is the external crosstalk input. The signal of the second signal channel is the Tx signal input of the channel. The signal received by the first input interface 101 is the external Rx signal input. The first signal channel is the Rx channel connected to the receiving pin of the device under test 2 (DUT), and the second signal channel is the Tx channel connected to the transmitting pin of the device under test 2 (DUT).

[0043] The output signal routing unit 200 is used to route the signal of any second signal channel output by the interface adapter component 104 to the output interface 103, and select the target output source from a variety of output sources to connect the signal of any second signal channel. The output source includes the output interface 103, the input signal routing unit 100, and the termination load 105. The output interface 103 is the relay for selecting the output of the multiple-to-one Tx channel, the input signal routing unit 100 is the Rx of the channel, and the termination load 105 is a single-ended 50Ω termination.

[0044] In the above implementation, by defining the functions of each interface, signal channel, and routing unit, a highly flexible and controllable crosstalk testing environment is constructed, realizing dynamic decoupling between the test channel and the signal source. It supports rapid switching between various complex scenarios such as crosstalk-free benchmark testing, multi-channel full crosstalk coupling testing, and single-channel directional interference testing. This not only improves the coverage and realism of high-speed bus signal testing, but also replaces manual cable replacement with hardware-level automatic routing, significantly improving testing efficiency and consistency, and providing a reliable foundation for accurately evaluating the performance of devices in real electromagnetic environments.

[0045] In some specific implementations, the following are included:

[0046] The input signal routing unit 100 includes a first multi-relay 201 and a plurality of first multi-switching relays 202. The input terminal of the first multi-relay 201 is connected to the first input interface 101, and the plurality of output terminals of the first multi-relay 201 are connected to a plurality of first signal channels respectively. The input terminal of the first multi-switching relay 202 is connected to the corresponding first signal channel, the output terminal of the first multi-relay 201, the termination load 105 and the second input interface 102 respectively. The output terminal of the first multi-switching relay 202 is connected to the interface adapter component 104.

[0047] Among them, the first multi-switching relay 201 and the first multi-switching relay 202 are both coaxial relays.

[0048] In some specific implementations, the following are included:

[0049] The output signal routing unit 200 includes multiple second multi-switching relays 203 and second multi-switching relays 204. The input terminal of the second multi-switching relay 203 is connected to the interface adapter component 104, the input terminal of the second multi-switching relay 204 is connected to the output terminal of the second multi-switching relay 203, and the output terminal of the second multi-switching relay 204 is connected to the output interface 103.

[0050] Among them, the second multi-switching relay 203 and the second multi-switching relay 204 are both coaxial relays.

[0051] In some specific implementations, the following are included:

[0052] The first input interface 101, the second input interface 102, and the output interface 103 are all differential interfaces. The schematic diagram of the relay switching module 1 is shown below. Figure 4 As shown, the relay switching module 1 has three pairs of differential interfaces: Rx signal input (Rx+, Rx-), crosstalk signal input (Crosstalk+, Crosstalk-), and Tx signal output (Tx+, Tx-).

[0053] The first input interface 101 is an Rx signal input interface, the second input interface 102 is a crosstalk signal input interface, and the output interface 103 constitutes a Tx signal output interface 103.

[0054] The first signal channel is the Rx channel connected to the receive pin of the device under test 2, and the second signal channel is the Tx channel connected to the transmit pin of the device under test 2. The device under test 2 is a DUT.

[0055] Specifically, such as Figure 3 As shown, the relay switching module implementation steps are as follows:

[0056] (1) The Rx input interface is connected to an all-in-one relay, which can select different Rx channels and connect the signal input by the Rx input interface to the corresponding channel;

[0057] (2) After selecting the corresponding Rx channel, connect the multi-to-one relay to the corresponding Rx channel. The multi-to-one relay can select different Rx signal sources to enter the gold finger / connector, thereby connecting to the device under test. There are four types of Rx signal sources, namely the Tx signal input of the channel, the external Rx signal input in step (1), the single-ended 50Ω termination, and the external crosstalk input.

[0058] (3) The gold finger / connector receives the Rx signal source in (2) and connects to the Rx channel of the device under test;

[0059] (4) The Tx signal output from the gold finger / connector of each channel first enters the multi-relay, which can select the output source of the Tx signal. The output sources are the Rx output to the channel, the multi-Tx channel output selected relay, and the single-ended 50Ω termination.

[0060] (5) Connect the Tx signals output from different channels in step (4) to a multi-channel relay, which can select different channels of Tx signals to output to the Tx output interface.

[0061] Based on the aforementioned relay switching module, during Tx signal testing, by setting different relay switching module states, it is possible to manually connect and measure the Tx signals of all channels in one operation. During Tx signal testing, by setting different relay switching module states, the Tx signals of untested channels can be input into the corresponding Rx channels to simulate the crosstalk environment of multi-channel parallel operation. Alternatively, the Tx signals of specific untested channels can be input into the Rx channels, with other Tx signals terminated, to simulate the interference environment of the channel under test for a directional channel. During Rx stress testing, by setting different relay switching module states, it is possible to manually connect and measure the Rx input tolerance of all channels in one operation. During impedance testing, by setting different relay switching module states, it is possible to manually connect and measure all Tx and Rx channels twice.

[0062] In the above embodiments, by introducing an input signal routing unit composed of a first multi-relay and multiple first multi-to-one relays, and an output signal routing unit composed of multiple second multi-relay and second multi-to-one relays, a two-level dynamic switching architecture is formed. This enables the signal to be routed to any channel and the signal source to be selected and connected independently for each channel, breaking through the limitation of fixed single-channel testing of related fixtures. Based on this structure, three modes—no crosstalk benchmark testing, multi-channel full crosstalk testing, and single-channel directional interference testing—are integrated and implemented on a single fixture. This can realistically simulate the complex crosstalk scenario when multiple channels of a high-speed bus are working in parallel, improving the comprehensiveness of test coverage and the reliability of results. At the same time, the testing efficiency is improved through electronic switching.

[0063] In some specific embodiments, the test fixture also includes a test control module 3, a communication interface module 4, and a power supply module 5;

[0064] The test control module 3 is electrically connected to the relay switching module 1 and is used to send control signals to the relays in the relay switching module 1 to switch their on / off states.

[0065] Power module 5 is used to supply power to test control module 3 and relay switching module 1;

[0066] The communication interface module 4 is connected to the test control module 3 to enable communication between the test control module 3 and external control devices.

[0067] Specifically, such as Figure 2 As shown, the test fixture of this application consists of four parts: a relay switching module 1, a test control module 3, a communication interface module 4, and a power supply module 5. The relay switching module 1 is composed of multiple coaxial relays. By controlling different on / off states of the relays, different connection methods of the test fixture can be achieved, thereby enabling the switching of different test modes and test cables. The test control module 3 is implemented by an MCU and provides control signals to the relay switching module 1. The power supply module 5 supplies power to both the test control module 3 and the relay switching module 1. The communication interface module 4 provides a communication interface between the test control module 3 and the computer, enabling automated testing. Specifically, in this application, the computer communicates with the test control module 3 through the communication interface module 4 on the test fixture board, transmitting different test scenarios to the test control module 3. The test control module 3 then switches the states of each relay in the relay switching module 1 according to the different test scenarios, thereby achieving the switching of different test scenarios. Furthermore, fully automated testing can be achieved through automatic control of the oscilloscope, the device under test (DUT), the oscilloscope, and the test fixture, improving testing efficiency.

[0068] The test fixture also includes a status monitoring module, which comprises a current sensor, a voltage detection circuit, and a microprocessor. The current sensor is connected in series with each relay coil to collect the current signal when the relay is switched on and off. The voltage detection circuit is connected in parallel across the relay contacts to detect the contact voltage. The microprocessor communicates with the current sensor, the voltage detection circuit, and the test control module to convert the monitored current and voltage data into relay status information. If contact sticking (abnormal current) or poor contact (voltage surge) occurs, a fault signal is immediately sent to the test control module and fed back to external equipment through the communication interface module.

[0069] In the above implementation, by monitoring the relay coil current and contact voltage in real time, online diagnosis and fault warning of the relay health status are realized. Potential faults such as contact adhesion and poor contact can be detected in time, effectively avoiding misjudgment of test results due to abnormal fixture conditions, improving the reliability and accuracy of high-speed testing. At the same time, the early warning mechanism reduces system downtime for troubleshooting, ensuring the continuity and stability of the automated testing process.

[0070] The descriptions of the features in the embodiments corresponding to the above-described test fixture can be found in the relevant descriptions of the embodiments corresponding to the signal testing method, and will not be repeated here. Each module in the above-described test fixture can be implemented entirely or partially through software, hardware, or a combination thereof. Each module can be embedded in or independent of the processor in the electronic device in hardware form, or stored in the memory of the electronic device in software form, so that the processor can call and execute the operations corresponding to each module.

[0071] like Figure 5 As shown, an embodiment of this application provides a signal testing method, which is illustrated using an application to a test fixture as an example. The method includes the following steps:

[0072] S1: Based on the relay switching module in the test fixture, dynamically select and connect the target input signal source for at least one first signal channel, and simultaneously select and connect the target output source for at least one second signal channel to construct the target test environment.

[0073] It should be noted that the target test environment includes a crosstalk-free benchmark test environment, a multi-channel full crosstalk test environment, and a single-channel directional interference test environment.

[0074] S2: Based on the target test environment, perform signal transmission tests on the device under test connected to the test fixture.

[0075] In the above implementation, by dynamically configuring the relay network, three types of test environments—no crosstalk, full crosstalk, and directional interference—can be quickly constructed on a single fixture, breaking through the limitations of single-channel testing. This can realistically simulate the complex crosstalk scenario when multiple channels of a high-speed bus are working in parallel, improving the comprehensiveness of test coverage and the authenticity of results. At the same time, by replacing manual operation with automatic hardware switching, test efficiency and consistency are improved.

[0076] In some specific implementations, dynamically selecting and activating a target input signal source for at least one first signal channel includes:

[0077] Control the first multi-relay to select and connect the target first signal channel, and control the first multi-to-one relay corresponding to the target first signal channel to select and connect the signal at the output terminal of the first multi-relay; or,

[0078] Control the first multiple-to-one relay corresponding to the first signal channel to select and connect the signal of the second signal channel corresponding to the first signal channel; or,

[0079] Control the first multiple-to-one relay corresponding to the first signal channel to select and connect the signal of the second input interface; or,

[0080] The first multi-switch relay corresponding to the first signal channel is selected and connected to the load.

[0081] In some specific implementations, dynamically selecting and activating a target output source for the signal of at least one second signal channel includes:

[0082] The second multi-channel relay corresponding to the second signal channel of the control target is selected and connected to the input terminal of the second multi-channel relay, and the signal of the second multi-channel relay is selected and connected to the second signal channel of the target; or,

[0083] Control the second signal channel corresponding to the second multi-relay selection and connect it to the input signal routing unit; or,

[0084] The second signal channel is controlled to select and connect the second multi-relay to the terminated load.

[0085] In the above implementation, by defining the control logic of the relay combination, the flexible matching of four input sources and three output targets is realized. The dynamic reconfiguration of the test channel function is realized in a hardware programmable manner, enabling the same fixture to quickly switch between multiple crosstalk scenarios. This not only ensures the integrity of the test mode coverage, but also improves test efficiency and repeatability by eliminating manual operation steps.

[0086] In some specific implementations, constructing the target test environment includes:

[0087] Identify the channel under test and the channels not under test, and connect the channel under test to the corresponding external test interface. The external test interface is either the first input interface or the output interface; and...

[0088] Connect the non-test channel to the terminated load to build a crosstalk-free benchmark environment; or,

[0089] Configure the non-test channel as a crosstalk source to construct a multi-channel full crosstalk test environment. The crosstalk source signal is the Tx signal loopback of the non-test channel or the external crosstalk signal received based on the second input interface; or,

[0090] The target non-test channel is configured as a crosstalk source, and the other non-test channels are connected to the termination load to construct a single-channel directional interference test environment. The crosstalk source signal is either the Tx signal loopback of the target non-test channel or the external crosstalk signal received based on the second input interface.

[0091] Specifically, constructing a crosstalk-free benchmark test environment includes: If the channel under test is the first signal channel (Rx channel): control the first multi-to-one relay corresponding to this channel to connect to the first input interface (external test interface), control the first multi-to-one relay corresponding to all other non-tested first signal channels to connect to the terminating load, and control the second multi-to-one relay corresponding to all other non-tested second signal channels to connect to the terminating load, thereby achieving signal isolation of non-tested channels and avoiding crosstalk interference. If the channel under test is the second signal channel (Tx channel): control the second multi-to-one relay and the second multi-to-one relay corresponding to this channel to connect to the output interface (external test interface), and control the first multi-to-one relay corresponding to all other non-tested first signal channels to connect to the terminating load, thereby achieving signal isolation of non-tested channels and avoiding crosstalk interference. The second multi-relay corresponding to the non-tested second signal channel is connected to the terminating load, and the first multi-switch relay corresponding to all non-tested first signal channels is connected to the terminating load to ensure the purity of the tested channel signal; the construction of a multi-channel full crosstalk test environment includes: (1) the crosstalk source is its own Tx signal loopback: the second multi-relay corresponding to all non-tested second signal channels is connected to the input signal routing unit, and then the Tx signal of the non-tested second signal channel is connected to the tested first signal channel through the corresponding first multi-switch relay; the first multi-switch relay corresponding to all non-tested first signal channels is connected to the terminating load, and the tested first signal channel is connected to the first input signal routing unit. The input interface is used to realize the internal multi-channel crosstalk simulation; (2) The crosstalk source is the external crosstalk signal: control all the first multi-to-one relays corresponding to the non-tested first signal channel to be connected to the second input interface, and access the external crosstalk signal through the second input interface; control all the second multi-to-one relays corresponding to the non-tested second signal channel to be connected to the termination load, and connect the tested first signal channel to the first input interface to realize the external multi-channel crosstalk simulation; the construction of a single-channel directional interference test environment includes: (1) The crosstalk source is its own Tx signal loopback: select a specific non-tested second signal channel, control its corresponding second multi-to-one relay to be connected to the input signal routing unit, and then access the corresponding first multi-to-one relay through the second input interface. (1) A multi-switch relay connects the Tx signal of the channel to the first signal channel under test; controls all other relays corresponding to the non-tested first and second signal channels to connect to the terminated load, and connects the tested first signal channel to the first input interface to realize single-channel directional internal interference; (2) The crosstalk source is an external crosstalk signal: select a specific non-tested first signal channel, control its corresponding first multi-switch relay to connect to the second input interface, and connect the external directional interference signal through the second input interface; control all other relays corresponding to the non-tested first and second signal channels to connect to the terminated load, and connects the tested first signal channel to the first input interface to realize single-channel directional external interference.

[0092] More specifically, the relay switching module is applied to the high-speed Ethernet test fixture. Taking the 200GAUI-4 C2M test as an example, according to... Figure 4The schematic diagram shown illustrates the design, and the logic for implementing the single-channel test mode with no crosstalk input of the Tx signal is as follows: Figure 6 As shown, taking the test of the Tx1 channel signal as an example, the switching steps after the test fixture is powered on are as follows:

[0093] (1) After the test fixture board is powered on, reset relays S1-S20, and all relays are in the open state;

[0094] (2) Contact point 3 of the Com terminal of relays S14-S16 and contact point 3 of S18-S20, that is, the single-ended signals of Tx2, Tx3 and Tx4 are terminated with 50Ω;

[0095] (3) The Com terminal contact point 2 of relays S13 and S17 is used to select the Tx1 signal for output;

[0096] (4) Contact point 1 of the Com terminal of relays S3 and S4, i.e. select Tx1 as the Tx signal output of the fixture, and connect the Tx output signal on the fixture board to the oscilloscope;

[0097] (5) The test piece Tx1 outputs PRBS code, and at this time the electrical parameters such as eye diagram and jitter of channel 1 Tx signal can be measured.

[0098] According to such Figure 4 The schematic diagram shown illustrates the design principle. The logic for implementing the multi-channel crosstalk coupling test mode for the Tx signal is as follows: Figure 7 As shown, taking the test of the Tx1 channel signal as an example, the switching steps after the test fixture is powered on are as follows:

[0099] (1) After the test fixture board is powered on, reset relays S1-S20, and all relays are in the open state;

[0100] (2) Different crosstalk source injection methods can be selected by setting different relay switches;

[0101] (a) The Tx signal is connected to the corresponding Rx channel, and the Tx signal is used as a crosstalk source input: the Com terminal contact 1 of relays S6-S8, the contact 1 of S10-S12, that is, the input source of Rx2, Rx3, and Rx4 is selected as Tx2, Tx3, and Tx4 respectively; the Com terminal contact 1 of relays S14-S16, the contact 1 of S18-S20, that is, the output of Tx2, Tx3, and Tx4 is connected to Rx2, Rx3, and Rx4.

[0102] (b) Input crosstalk signals through the crosstalk signal input (Crosstalk+, Crosstalk-) interface. These input signals can be generated by instruments such as bit error rate testers: Contact point 4 of the Com terminal of relays S6-S8 and Contact point 4 of S10-S12, that is, select the input source of Rx2, Rx3, and Rx4 as the external input crosstalk signal; Contact point 3 of the Com terminal of relays S14-S16 and Contact point 3 of S18-S20, that is, terminate the single-ended signals of Tx2, Tx3, and Tx4 with 50Ω;

[0103] (3) The Com terminal contact point 2 of relays S13 and S17 is used to select the Tx1 signal for output;

[0104] (4) Contact point 1 of the Com terminal of relays S3 and S4, i.e. select Tx1 as the Tx signal output of the fixture, and connect the Tx output signal on the fixture board to the oscilloscope;

[0105] (5) The test components Tx1, Tx2, Tx3 and Tx4 output PRBS code patterns. At this time, electrical parameters such as eye diagram and jitter of channel Tx1 signal can be measured.

[0106] According to such Figure 4 The schematic diagram shown illustrates the design principle. The logic for implementing the single-channel directional interference test mode for the Tx signal is as follows: Figure 8 As shown, taking test channels Tx1 and 2 as interference sources as an example, the switching steps after the test fixture is powered on are as follows:

[0107] (1) After the test fixture board is powered on, reset relays S1-S20, and all relays are in the open state;

[0108] (2) Select different crosstalk source injection methods by setting different relay switches:

[0109] (a) The Tx signal is connected to the corresponding channel Rx, and the Tx signal is used as a crosstalk source input: the Com terminal contact point 1 of relays S6 and S10, that is, the input source of Rx2 is selected as Tx2; the Com terminal contact point 1 of relays S14 and S18, and the Com terminal contact point 3 of S15, S16, S19 and S20, that is, the output of Tx2 is connected to Rx2, and the single-ended signals of Tx3 and Tx4 are terminated at 50Ω.

[0110] (b) Input crosstalk signals through the crosstalk signal input (Crosstalk+, Crosstalk-) interface. These input signals can be generated by instruments such as bit error rate testers: contact point 4 of the Com terminal of relays S6 and S10, that is, select the input source of Rx2 as the external input crosstalk signal; contact point 3 of the Com terminal of relays S14-S16, and contact point 3 of S18-S20, that is, terminate the single-ended signals of Tx2, Tx3, and Tx4 with 50Ω;

[0111] (3) Contact point 2 of the Com terminal of relays S13 and S17, that is, outputting the Tx1 signal;

[0112] (4) Contact point 1 of the Com terminal of relays S3 and S4, i.e. select Tx1 as the Tx signal output of the fixture, and connect the Tx output signal on the fixture board to the oscilloscope;

[0113] (5) The test pieces Tx1 and Tx2 output PRBS code patterns. At this time, electrical parameters such as eye diagram and jitter of channel 1 Tx signal can be measured.

[0114] By employing the three switching methods described above, full coverage of high-speed Ethernet Tx signal testing scenarios can be achieved. Furthermore, for high-speed Ethernet Rx pressure input testing and differential impedance testing, this application can be used to achieve automatic switching of test channels, eliminating the need for manual cable replacement and improving testing efficiency. Figure 4 The schematic diagram shown illustrates the design of high-speed Ethernet Rx pressure input testing and differential impedance testing. Taking the Rx1 channel as an example, ... Figure 9 As shown, after the test fixture is powered on, the switching steps are as follows:

[0115] (1) After the test fixture board is powered on, reset relays S1-S20, and all relays are in the open state;

[0116] (2) The Com terminal contact point 2 of relays S5 and S9, i.e., Rx1 selects the external Rx signal input; the Com terminal contact point 1 of relays S1 and S12, i.e., the Rx signal input on the fixture board is connected to Rx1. At this time, the externally generated signal (the test code with jitter generated by BERT-bit error meter or the step signal generated by TDR-time domain reflectometer, etc.) can be injected into Rx1 to realize the input pressure test of Rx1 or the differential impedance test of Rx1.

[0117] Furthermore, the relay switching module is applied to the PCIe test fixture. Taking the PCIe 4.0 Add-in-card test fixture as an example, the switching logic of the PCIe test relay switching module is as follows: Figure 10As shown, unlike high-speed Ethernet signal testing, PCIe signal testing requires the addition of a clock module. During PCIe Rx signal compliance testing, a 100MHz clock signal is provided via BERT. During Tx signal testing, a 100MHz clock signal is provided to excite the switching rate and pre-emphasis parameters. Additionally, the PCIe test fixture is designed with a bandwidth of x16, requiring a relay switching module with 16 differential pairs for backward compatibility. PCIe 4.0 Add-in-card Tx signal testing differs from high-speed Ethernet signal testing in that the corresponding Rx channel of the channel under test needs to be connected to a 1ms 100MHz clock signal pulse from the clock module to excite the DUT switching rate and pre-emphasis parameters. PCIe Rx signal testing requires the corresponding channel's Tx signal to be output to a BERT or oscilloscope; other switching logic is the same as for high-speed Ethernet signal testing.

[0118] In the above embodiments, this application overcomes the limitations of single-channel testing by adding a test scheme to address crosstalk in the test scenario, realizing a three-level test system of "reference-interference-location" and covering a more comprehensive range of test scenarios. This application is compatible with high-speed Ethernet signals, PCIe signals, USB and other high-speed bus signals, and is also compatible with different bus speeds, thus improving compatibility. This application can automatically switch test cables by controlling the on / off state of relays, improving test efficiency and achieving full automation of testing, thereby reducing the repetitiveness of test work.

[0119] In the aforementioned signal testing method, this application introduces an input signal routing unit composed of a first multi-relay and multiple first multi-to-one relays, and an output signal routing unit composed of multiple second multi-relay and second multi-to-one relays, forming a two-level dynamic switching architecture. This enables the signal to be routed to any channel and the signal source to be independently selected and connected for each channel, breaking through the limitations of fixed single-channel testing of related fixtures. Based on this structure, three modes—no crosstalk benchmark testing, multi-channel full crosstalk testing, and single-channel directional interference testing—are integrated and implemented on a single fixture. This can realistically simulate the complex crosstalk scenario when multiple channels of a high-speed bus are working in parallel, improving the comprehensiveness of test coverage and the reliability of results. At the same time, the testing efficiency is improved through electronic switching.

[0120] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method.

[0121] It should be understood that, although Figures 5-10The steps in the flowchart are shown sequentially as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order in which these steps are executed, and they can be performed in other orders. Figures 5-10 At least some of the steps in the process may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least some of the sub-steps or stages of other steps.

[0122] In one embodiment, an electronic device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 11 As shown, the electronic device includes a processor, memory, network interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage medium. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a signal testing method. The display screen can be a liquid crystal display (LCD) or an e-ink display. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the device's casing, or an external keyboard, touchpad, or mouse.

[0123] Those skilled in the art will understand that Figure 11 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the electronic device to which the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0124] Embodiments of this application provide an electronic device, including a memory and a processor. The memory stores a computer program, and the processor is configured to run the computer program to perform the steps in the signal testing method embodiments, including:

[0125] S1: Based on the relay switching module in the test fixture, dynamically select and connect the target input signal source for at least one first signal channel, and simultaneously select and connect the target output source for at least one second signal channel to construct the target test environment;

[0126] S2: Based on the target test environment, perform signal transmission tests on the device under test connected to the test fixture.

[0127] Embodiments of this application also provide a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in the signal testing method embodiments at runtime, including:

[0128] S1: Based on the relay switching module in the test fixture, dynamically select and connect the target input signal source for at least one first signal channel, and simultaneously select and connect the target output source for at least one second signal channel to construct the target test environment;

[0129] S2: Based on the target test environment, perform signal transmission tests on the device under test connected to the test fixture.

[0130] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0131] Embodiments of this application also provide a computer program product, which includes a computer program. When executed by a processor, the computer program implements the steps in the signal testing method embodiments, including:

[0132] S1: Based on the relay switching module in the test fixture, dynamically select and connect the target input signal source for at least one first signal channel, and simultaneously select and connect the target output source for at least one second signal channel to construct the target test environment;

[0133] S2: Based on the target test environment, perform signal transmission tests on the device under test connected to the test fixture.

[0134] Embodiments of this application also provide another computer program product, including a non-volatile computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the steps in the signal testing method embodiments, including:

[0135] S1: Based on the relay switching module in the test fixture, dynamically select and connect the target input signal source for at least one first signal channel, and simultaneously select and connect the target output source for at least one second signal channel to construct the target test environment;

[0136] S2: Based on the target test environment, perform signal transmission tests on the device under test connected to the test fixture.

[0137] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0138] The signal testing method, apparatus, electronic device, and storage medium provided in this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are only intended to help understand the method and core ideas of this application. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of this application.

Claims

1. A test fixture, characterized in that, Includes a relay switching module (1); The relay switching module (1) is provided with a first input interface (101), a second input interface (102), an output interface (103), an input signal routing unit (100), an output signal routing unit (200), and an interface adapter component (104). The input signal routing unit (100) is used to route the signal received by the first input interface (101) to any first signal channel of the interface adapter component (104), and select a target input signal source from a variety of input signal sources to connect with any first signal channel. The input signal source includes the signal of the second signal channel corresponding to the first signal channel, the signal received by the first input interface (101), the signal of the second input interface (102), and the termination load (105). The second input interface (102) is a crosstalk signal input interface. The output signal routing unit (200) is used to route the signal of any second signal channel output by the interface adapter component (104) to the output interface (103), and select a target output source from a variety of output sources to connect the signal of any second signal channel. The output source includes the output interface (103), the input signal routing unit (100), and the termination load (105). The input signal routing unit (100) includes a first multi-relay (201) and a plurality of first multi-switching relays (202). The input terminal of the first multi-relay (201) is connected to the first input interface (101). The plurality of output terminals of the first multi-relay (201) are connected to a plurality of first signal channels respectively. The input terminal of the first multi-switching relay (202) is connected to the corresponding first signal channel, the output terminal of the first multi-relay (201), the termination load (105), and the second input interface (102) respectively. The output terminal of the first multi-switching relay (202) is connected to the interface adapter component (104). The output signal routing unit (200) includes multiple second multi-socket relays (203) and second multi-switching relays (204). The input terminal of the second multi-socket relay (203) is connected to the interface adapter component (104), the input terminal of the second multi-switching relay (204) is connected to the output terminal of the second multi-socket relay (203), and the output terminal of the second multi-switching relay (204) is connected to the output interface (103).

2. The test fixture according to claim 1, characterized in that, include: Both the first multi-relay (201) and the first multi-switching relay (202) are coaxial relays.

3. The test fixture according to claim 1, characterized in that, include: Both the second multi-socket relay (203) and the second multi-switching relay (204) are coaxial relays.

4. The test fixture according to claim 1, characterized in that, include: The first input interface (101), the second input interface (102), and the output interface (103) are all differential interfaces; The first input interface (101) is an Rx signal input interface, and the output interface (103) constitutes a Tx signal output interface (103). The first signal channel is the Rx channel connected to the receiving pin of the device under test (2), and the second signal channel is the Tx channel connected to the transmitting pin of the device under test (2).

5. The test fixture according to claim 1, characterized in that, It also includes a test control module (3), a communication interface module (4), and a power supply module (5); The test control module (3) is electrically connected to the relay switching module (1) and is used to send control signals to the relays in the relay switching module (1) to switch their on / off states. The power module (5) is used to supply power to the test control module (3) and the relay switching module (1); The communication interface module (4) is connected to the test control module (3) and is used to realize communication between the test control module (3) and external control devices.

6. A signal testing method applied to the test fixture as described in any one of claims 1-5, characterized in that, include: Based on the relay switching module in the test fixture, the target input signal source is dynamically selected and connected for at least one first signal channel, and the target output source is selected and connected for at least one second signal channel to construct the target test environment. Based on the target test environment, the signal transmission test is performed on the device under test connected to the test fixture.

7. The signal testing method according to claim 6, characterized in that, Dynamically selecting and activating a target input signal source for at least one first signal channel includes: Control the first multi-relay to select and connect the target first signal channel, and control the first multi-to-one relay corresponding to the target first signal channel to select and connect the signal at the output terminal of the first multi-relay; or, Control the first multiple-to-one relay corresponding to the first signal channel to select and connect the signal of the second signal channel corresponding to the first signal channel; or, The signal corresponding to the first multiple-to-one relay of the first signal channel is selected and connected to the second input interface; or, The first multi-switch relay corresponding to the first signal channel is controlled to select and connect the load.

8. The signal testing method according to claim 6, characterized in that, The dynamic selection and connection of the target output source for at least one second signal channel includes: The second multi-channel relay corresponding to the target's second signal channel is selected and connected to the input terminal of the second multi-channel relay, and the second multi-channel relay is controlled to select and connect the signal of the target's second signal channel; or, Control the second signal channel corresponding to the second multi-relay selection and connect it to the input signal routing unit; or, The second signal channel corresponding to the second multi-relay selects and connects to the terminated load.

9. The signal testing method according to claim 6, characterized in that, Build the target test environment, including: Identify the channel under test and the channels not under test, and connect the channel under test to the corresponding external test interface, wherein the external test interface is a first input interface or an output interface; and... Connect the non-test channel to a terminated load to construct a crosstalk-free benchmark test environment; or, The non-test channel is configured as a crosstalk source to construct a multi-channel full crosstalk test environment. The signal of the crosstalk source is the Tx signal loopback of the non-test channel or an external crosstalk signal received based on the second input interface; or, The target non-test channel is configured as a crosstalk source, and the other non-test channels are connected to the termination load to construct a single-channel directional interference test environment. The crosstalk source signal is either the Tx signal loopback of the target non-test channel or an external crosstalk signal received based on the second input interface.

10. An electronic device, characterized in that, include: Memory, used to store computer programs; A processor, configured to implement the steps of the signal testing method as described in any one of claims 6 to 9 when executing the computer program.

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