Hall failure detection circuit, controller and electric vehicle

Abstract

The invention discloses a Hall failure detection circuit, a controller and an electric vehicle. The Hall failure detection circuit comprises a failure detection unit, a signal output unit and a control unit, wherein one failure detection unit accesses a Hall signal of the motor; the failure detection unit is used for detecting whether an open circuit abnormity occurs in the accessed Hall signal; the signal output unit is electrically connected with the failure detection unit and the control unit, and is used for sending a failure signal to the control unit when the failure detection unit detects that the accessed Hall signal has an open circuit abnormity; and the control unit is used for performing hardware and / or software protection on the motor according to the failure signal. According to the scheme provided by the invention, the open circuit abnormity of the Hall signal can be quickly detected through a hardware circuit, and the motor is protected when the open circuit abnormity occurs, so that the safety of the electric vehicle is improved.

Description

Technical Field

[0001] This invention relates to the field of electrical control safety technology, and in particular to a Hall effect failure detection circuit, controller, and electric vehicle. Background Technology

[0002] With the continuous development of new energy technologies, electric vehicles are gradually becoming an important tool for urban transportation. Among them, Hall effect sensors, as key components connecting the mechanical rotor and the electronic control system, operate continuously in the complex vibration, temperature change, and electromagnetic interference environment of vehicles, and have become one of the devices with a high failure rate in the drive system.

[0003] Common Hall effect failures include, but are not limited to: open signal lines, short circuits to power or ground, signals continuously locked at high / low levels, and abnormal signal transitions due to device aging or interference. The most common cause is an open signal line. Once a Hall effect failure occurs, the driver's control logic will be based on incorrect rotor position information, leading to commutation loss, severe motor vibration, a sharp drop in output torque, or even complete loss of torque. In severe cases, this can cause dangerous conditions such as runaway or sudden stop, posing a direct threat to the rider's safety. Therefore, detecting Hall effect failures is crucial for improving vehicle safety.

[0004] However, most current Hall failure detection methods are based on software algorithms, which require a lot of system resources, and some algorithms rely on historical data, lacking real-time performance and having a slow failure response rate. Summary of the Invention

[0005] This invention provides a Hall failure detection circuit, controller, and electric vehicle, which can quickly detect Hall signal open circuit anomalies through hardware circuitry and protect the motor when an open circuit anomaly occurs, thereby improving the safety of electric vehicles.

[0006] According to one aspect of the present invention, a Hall failure detection circuit is provided, comprising: a failure detection unit, a signal output unit, and a control unit; wherein, a failure detection unit is connected to one Hall signal of a motor; the failure detection unit is used to detect whether an open circuit abnormality occurs in the connected Hall signal; the signal output unit is electrically connected to the failure detection unit and the control unit respectively, and is used to send a failure signal to the control unit when the failure detection unit detects an open circuit abnormality in the connected Hall signal; the control unit is used to perform hardware and / or software protection on the motor according to the failure signal.

[0007] Optionally, the control unit includes: a microcontroller unit (MCU), a drive protection module, and a drive chip; wherein, the MCU is electrically connected to the signal output unit and is used to stop the motor drive for protection based on the failure signal; the drive protection module is electrically connected to the MCU and the drive chip respectively, and is used to stop supplying power to the drive chip based on the protection signal sent by the MCU, so that the drive chip no longer drives the back-end inverter circuit to work, thereby stopping the motor drive.

[0008] Optionally, the number of failure detection units is less than or equal to the total number of Hall signals output by the motor. When the MCU does not have Hall self-repair function, or the number of failure detection units is 1, the signal output unit includes only one output module, and each failure detection unit is electrically connected to the output module. The output module is used to send a failure signal to the control unit when at least one failure detection unit detects an open circuit abnormality in the accessed Hall signal. When the MCU has Hall self-repair function and the number of failure detection units is greater than or equal to 2, the signal output unit includes at least two output modules and one back-end judgment module. One output module is electrically connected to one failure detection unit, and each output module is electrically connected to the back-end judgment module. The output module is used to send an abnormal signal to the back-end judgment module when the corresponding failure detection unit detects an open circuit abnormality in the accessed Hall signal. The back-end judgment module is used to determine the number of abnormal signals and send a failure signal to the control unit when the number of abnormal signals is greater than or equal to 2.

[0009] Optionally, it also includes: a signal reading unit; wherein, one signal reading unit is electrically connected to one failure detection unit, and all signal reading units are electrically connected to the MCU; when the corresponding failure detection unit detects that the accessed Hall signal does not have an open circuit abnormality, the reading signal output by the signal reading unit to the MCU is logically opposite to the Hall signal accessed by the corresponding failure detection unit.

[0010] Optionally, the failure detection unit includes: a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, a first capacitor, a first diode, a second diode, a third diode, a fourth diode, a first field-effect transistor, a first transistor, a second transistor, and a third transistor; one end of the first resistor, the source of the first field-effect transistor, and the emitter of the first transistor are all connected to a Hall signal from the motor; the base of the first transistor is electrically connected to one end of the second resistor; the collector of the first transistor is electrically connected to the gate of the first field-effect transistor and one end of the third resistor; the other ends of the first resistor and the second resistor are both electrically connected to the cathode of the first diode; the other end of the third resistor and the anode of the first diode are both grounded. The drain of the first field-effect transistor is electrically connected to the cathode of the second diode, one end of the fifth resistor, and one end of the sixth resistor; one end of the fourth resistor and one end of the seventh resistor are connected to the first power supply; the other end of the fourth resistor is electrically connected to the anode of the second diode; the other end of the fifth resistor is electrically connected to the base of the second transistor; the other end of the seventh resistor is electrically connected to the collector of the second transistor and the emitter of the third transistor; the emitter of the second transistor is grounded; the other end of the sixth resistor is electrically connected to the cathode of the third diode, one end of the first capacitor, the cathode of the fourth diode, and the collector of the third transistor; the other end of the first capacitor is grounded; the anode of the third diode is electrically connected to the base of the third transistor; the anode of the fourth diode is electrically connected to the signal output unit.

[0011] Optionally, the output module includes: an eighth resistor, a ninth resistor, and a fourth transistor; one end of the eighth resistor is electrically connected to the failure detection unit, and the other end of the eighth resistor is electrically connected to the base of the fourth transistor; the emitter of the fourth transistor is connected to a second power supply, the collector of the fourth transistor is electrically connected to one end of the ninth resistor, and the other end of the ninth resistor is grounded; the collector of the fourth transistor is electrically connected to the control unit or to the back-end judgment module.

[0012] Optionally, when the number of failure detection units is 3, the back-end judgment module includes: a 10th resistor, an 11th resistor, a 12th resistor, a 13th resistor, a 14th resistor, a 15th resistor, a 16th resistor, a comparator, a second capacitor, and a third capacitor; one end of the 10th resistor, one end of the 11th resistor, and one end of the 12th resistor are electrically connected to the collector of the fourth transistor of each output module; the other ends of the 10th resistor, the 11th resistor, and the 12th resistor are electrically connected to one end of the 13th resistor; the other end of the 13th resistor is electrically connected to one end of the second capacitor and the negative input terminal of the comparator; the other end of the second capacitor is grounded; the positive input terminal of the comparator is electrically connected to one end of the 14th resistor and one end of the 15th resistor; the other end of the 14th resistor is grounded, and the other end of the 15th resistor is connected to the second power supply; the output terminal of the comparator is electrically connected to one end of the 16th resistor; the other end of the 16th resistor is electrically connected to one end of the third capacitor and the control unit; the other end of the third capacitor is grounded.

[0013] Optionally, the drive protection module includes: a seventeenth resistor, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, a fourth capacitor, a fifth transistor, and a second field-effect transistor; one end of the seventeenth resistor is electrically connected to the MCU, and the other end of the seventeenth resistor is electrically connected to one end of the eighteenth resistor, one end of the fourth capacitor, and the base of the fifth transistor; the other end of the eighteenth resistor, the other end of the fourth capacitor, and the emitter of the fifth transistor are all grounded; the collector of the fifth transistor is electrically connected to one end of the nineteenth resistor, and the other end of the nineteenth resistor is electrically connected to one end of the twentieth resistor and the gate of the second field-effect transistor; the other end of the twentieth resistor and the source of the second field-effect transistor are connected to a third power supply; the drain of the second field-effect transistor is electrically connected to the drive chip.

[0014] Optionally, the signal reading unit includes: a 21st resistor, a 22nd resistor, a 5th capacitor, a 6th capacitor, and a 5th diode; the cathode of the 5th diode is electrically connected to the failure detection unit, and the anode of the 5th diode is electrically connected to one end of the 21st resistor, one end of the 22nd resistor, and one end of the 5th capacitor; the other end of the 21st resistor is connected to a second power supply; the other end of the 22nd resistor is electrically connected to one end of the 6th capacitor and the MCU; the other ends of the 5th capacitor and the 6th capacitor are both grounded.

[0015] According to one aspect of the present invention, a controller is provided, including the Hall failure detection circuit of any of the above embodiments.

[0016] According to another aspect of the present invention, an electric vehicle is provided, including the controller of any of the above embodiments.

[0017] The technical solution of this invention, through the design of a Hall failure detection circuit, includes a failure detection unit, a signal output unit, and a control unit. One failure detection unit receives one Hall signal from the motor and is used to detect whether an open-circuit anomaly occurs in the received Hall signal. The signal output unit sends a failure signal to the control unit when the failure detection unit detects an open-circuit anomaly in the received Hall signal. The control unit performs hardware and / or software protection on the motor based on the failure signal. Compared with existing solutions based on software algorithms for Hall failure detection, firstly, this invention achieves rapid detection of open-circuit anomalies in Hall signals through hardware circuitry, eliminating the need for software algorithm processing and relying on historical data, thus saving system resources and offering cost advantages. Secondly, using hardware circuitry to detect Hall signals enables microsecond (μs) level response, improving the failure response rate. Thirdly, after the signal output unit sends a failure signal to the control unit, the control unit can also perform hardware and / or software protection on the motor, further enhancing vehicle safety. Moreover, the Hall failure detection circuit provided by this invention is compatible with both open-drain and push-pull Hall sensors, exhibiting strong applicability, reliability, and integration.

[0018] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the structure of a Hall failure detection circuit provided in Embodiment 1 of the present invention;

[0021] Figure 2 This is a schematic diagram of another Hall failure detection circuit provided in Embodiment 1 of the present invention;

[0022] Figure 3 This is a schematic diagram of another Hall failure detection circuit provided in Embodiment 1 of the present invention;

[0023] Figure 4 This is a schematic diagram of a Hall failure detection circuit with one failure detection unit provided in Embodiment 1 of the present invention;

[0024] Figure 5 This is a schematic diagram of a Hall failure detection circuit with three failure detection units and an MCU that does not have Hall self-repair function, provided in Embodiment 1 of the present invention.

[0025] Figure 6 This is a schematic diagram of a Hall failure detection circuit with three failure detection units and an MCU having Hall self-repair function, provided in Embodiment 1 of the present invention.

[0026] Figure 7 This is a circuit structure diagram of a failure detection unit provided in Embodiment 1 of the present invention;

[0027] Figure 8 This is a circuit structure diagram of a signal reading unit provided in Embodiment 1 of the present invention;

[0028] Figure 9 This is a circuit structure diagram of an output module provided in Embodiment 1 of the present invention;

[0029] Figure 10 This is a circuit structure diagram of a back-end judgment module provided in Embodiment 1 of the present invention;

[0030] Figure 11 This is a circuit structure diagram of a drive protection module provided in Embodiment 1 of the present invention;

[0031] Figure 12 This is a schematic diagram of the Hall failure detection test results under static conditions provided in Embodiment 1 of the present invention;

[0032] Figure 13 This is a schematic diagram of the Hall failure detection test results under dynamic conditions provided in Embodiment 1 of the present invention. Detailed Implementation

[0033] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0034] It should be noted that the terms "first," "second," "third," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0035] Example 1

[0036] Figure 1 This is a schematic diagram of a Hall failure detection circuit provided in Embodiment 1 of the present invention. Figure 1 As shown, the Hall failure detection circuit includes: a failure detection unit 10, a signal output unit 20, and a control unit 30.

[0037] A failure detection unit 10 is connected to one Hall signal from the motor. The failure detection unit 10 is used to detect whether an open circuit abnormality occurs in the connected Hall signal. In this invention, the number of failure detection units 10 can be configured according to actual needs. The number of failure detection units 10 is less than or equal to the total number of Hall signals output by the motor. That is, a failure detection unit 10 can be configured for each Hall signal output by the motor to ensure open circuit failure detection of all Hall ports; or, failure detection units 10 can be configured only for some Hall signals output by the motor to prioritize the detection of open circuit failures of the main Hall ports while controlling production costs.

[0038] For example, the motor outputs three Hall signals, denoted as HALL-A, HALL-B, and HALL-C. When there is one failure detection unit 10, it can be connected to HALL-A, HALL-B, or HALL-C. When there are two failure detection units 10, they can be connected to HALL-A and HALL-B, HALL-A and HALL-C, or HALL-B and HALL-C respectively. When there are three failure detection units 10, they are connected to HALL-A, HALL-B, and HALL-C respectively.

[0039] The signal output unit 20 is electrically connected to the failure detection unit 10 and the control unit 30, respectively. The signal output unit 20 is used to send a failure signal to the control unit 30 when the failure detection unit 10 detects an open circuit abnormality in the connected Hall signal. The failure signal is used to indicate that an open circuit abnormality has occurred in the current Hall signal line. Its purpose is to trigger the system's protection mechanism to avoid equipment damage, safety accidents, or loss of control risks.

[0040] The control unit 30 is used to provide hardware and / or software protection for the motor based on the failure signal.

[0041] Based on the above embodiments, Figure 2 This is a schematic diagram of another Hall failure detection circuit provided in Embodiment 1 of the present invention. Figure 2 As shown, the control unit 30 includes: a microcontroller unit (MCU) 31, a drive protection module 32, and a drive chip 33.

[0042] MCU 31 is electrically connected to signal output unit 20. Specifically, signal output unit 20 is electrically connected to one pin of MCU 31. Signal output unit 20 sends a failure signal to MCU 31, so that MCU 31 can shut down the motor drive for protection based on the failure signal. For example, protection actions implemented through preset program logic (such as software instruction control instead of hardware power-off); or alarms triggered by devices such as the instrument panel, indicator lights, and buzzers to remind the user to pay attention to driving safety.

[0043] Alternatively, the MCU 31 can be used to perform different protection actions for motor drive shutdown protection based on the current vehicle status, thereby making fault handling more flexible.

[0044] The drive protection module 32 is electrically connected to both the MCU 31 and the drive chip 33. Based on a protection signal sent by the MCU 31, the drive protection module 32 can stop supplying power to the drive chip 33, preventing the drive chip 33 from driving the downstream inverter circuit and thus stopping the motor drive. The protection signal sent by the MCU 31 is generated by the MCU 31 based on a failure signal. In this way, the power supply to the drive chip 33 can be directly cut off in hardware, thereby protecting the motor. This hardware protection does not rely on the MCU or software program, and the response time of the hardware circuit (μs level) is much faster than that of the software program (ms level), making it more suitable for handling emergency faults.

[0045] A hardware-plus-software protection scheme can maximize system security. Understandably, if only hardware / software protection for the motor is required, the software program configured in the aforementioned drive protection module 32 / MCU 31 can be omitted, thereby achieving protection while reducing production costs.

[0046] Based on the above embodiments, Figure 3 This is a schematic diagram of another Hall failure detection circuit provided in Embodiment 1 of the present invention. Figure 3 As shown, the Hall failure detection circuit also includes a signal reading unit 40.

[0047] Specifically, one signal reading unit 40 is electrically connected to one failure detection unit 10, and there is a one-to-one correspondence between the signal reading unit 40 and the failure detection unit 10, that is, the number of signal reading units 40 is the same as the number of failure detection units 10. All signal reading units 40 are electrically connected to MCU 31.

[0048] The signal reading unit 40 can fulfill the function of MCU 31 reading Hall signals. When the corresponding failure detection unit 10 detects that the input Hall signal does not have an open circuit abnormality, the reading signal output by the signal reading unit 40 to MCU 31 is logically opposite to the Hall signal input to the corresponding failure detection unit 10. That is, when the Hall signal is high, the reading signal is low; when the Hall signal is low, the reading signal is high.

[0049] In one embodiment, since the number of failure detection units 10 can be one or more, and some MCUs 31 may be configured with Hall self-repair function (which refers to a protection and emergency function that, when only one Hall signal has an open circuit abnormality, the system reconstructs the failed Hall signal according to the other two Hall signals through a preset software algorithm or hardware redundancy design, automatically replaces and compensates the fault signal, and avoids the motor from stopping or losing control immediately), the signal output unit 20 can have different designs.

[0050] In the first possible implementation, Figure 4 This is a schematic diagram of a Hall effect failure detection circuit with one failure detection unit, provided in Embodiment 1 of the present invention. Figure 4 As shown, when the number of failure detection units 10 is 1, the Hall failure detection circuit only detects one Hall signal (e.g., Figure 4 (HALL-IN shown). At this time, the signal output unit 20 includes only one output module 21, and the failure detection unit 10 is electrically connected to the output module 21. The output module 21 is used to send a signal to the control unit 30 (e.g., when the failure detection unit 10 detects an open circuit abnormality in the input Hall signal) when the failure detection unit 10 detects an open circuit abnormality in the input Hall signal. Figure 4The MCU31 shown sends a failure signal.

[0051] In the second possible implementation, Figure 5 This is a schematic diagram of a Hall failure detection circuit with three failure detection units and an MCU that does not have Hall self-repair function, as provided in Embodiment 1 of the present invention. Figure 5 As shown, when the number of failure detection units 10 is 3 and the MCU does not have Hall self-repair function, the Hall failure detection circuit detects three Hall signals (such as...). Figure 5 (HALL-A-IN, HALL-B-IN, and HALL-C-IN are shown). An alarm is triggered if any Hall signal experiences an open-circuit fault; therefore, the signal output unit 20 only needs one output module 21, and all three failure detection units 10 are electrically connected to the output module 21. The output module 21 is used to send an alarm to the control unit 30 (e.g., when at least one failure detection unit 10 detects an open-circuit fault in the input Hall signal) when the fault occurs. Figure 5 The MCU 31 shown sends a failure signal.

[0052] In the third possible implementation, Figure 6 This is a schematic diagram of a Hall failure detection circuit with three failure detection units and an MCU having Hall self-repair function, as provided in Embodiment 1 of the present invention. Figure 6 As shown, when the number of failure detection units 10 is 3 and the MCU has Hall self-repair function, the Hall failure detection circuit detects three Hall signals (such as...). Figure 6 (HALL-A-IN, HALL-B-IN, and HALL-C-IN are shown). When only one Hall signal has an open-circuit fault, the MCU 31 can automatically repair it using the Hall self-repair function without alarming. Self-repair is only possible when two or more Hall signals have open-circuit faults. Therefore, the signal output unit 20 includes three output modules 21 and one back-end judgment module 22. One output module 21 is electrically connected to one failure detection unit 10, and all three output modules 21 are electrically connected to the back-end judgment module 22. The output module 21 is used to send an abnormal signal to the back-end judgment module 22 when the corresponding failure detection unit 10 detects an open-circuit fault in the input Hall signal. The back-end judgment module 22 is used to determine the number of abnormal signals and, when the number of abnormal signals is greater than or equal to 2, to send an abnormal signal to the control unit 30 (e.g., ...). Figure 6 The MCU 31 shown sends a failure signal.

[0053] In one embodiment, reference Figures 1-6 , Figure 7 This is a circuit structure diagram of a failure detection unit provided in Embodiment 1 of the present invention. Figure 7As shown, the failure detection unit 10 includes: a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, a first capacitor C1, a first diode D1, a second diode D2, a third diode D3, a fourth diode D4, a first field-effect transistor Qm, a first transistor Q1, a second transistor Q2, and a third transistor Q3.

[0054] Specifically, one end of the first resistor R1, the source of the first field-effect transistor Qm, and the emitter of the first transistor Q1 are all connected to one Hall signal of the motor. The base of the first transistor Q1 is electrically connected to one end of the second resistor R2, and the collector of the first transistor Q1 is electrically connected to the gate of the first field-effect transistor Qm and one end of the third resistor R3. The other ends of the first resistor R1 and the second resistor R2 are both electrically connected to the cathode of the first diode D1, and the other end of the third resistor R3 and the anode of the first diode D1 are both grounded. The drain of the first field-effect transistor Qm is electrically connected to the cathode of the second diode D2, one end of the fifth resistor R5, and one end of the sixth resistor R6. One end of the fourth resistor R4 and one end of the seventh resistor R7 are connected to the first power supply VCC1. The other end of the fourth resistor R4 is electrically connected to the anode of the second diode D2. The other end of the fifth resistor R5 is electrically connected to the base of the second transistor Q2. The other end of the seventh resistor R7 is electrically connected to the collector of the second transistor Q2 and the emitter of the third transistor Q3. The emitter of the second transistor Q2 is grounded. The other end of the sixth resistor R6 is electrically connected to the cathode of the third diode D3, one end of the first capacitor C1, the cathode of the fourth diode D4, and the collector of the third transistor Q3. The other end of the first capacitor C1 is grounded. The anode of the third diode D3 is electrically connected to the base of the third transistor Q3. The anode of the fourth diode D4 is electrically connected to the signal output unit 20. The emitter of the third transistor Q3 is electrically connected to the signal reading unit 40.

[0055] The failure detection unit 10 can convert the Hall signal into a logic signal that can be read by the MCU 31. The failure detection unit 10 is compatible with both open-drain and push-pull Hall sensors, and has strong applicability.

[0056] In one embodiment, the first resistor R1 has a resistance of 47kΩ, the second resistor R2 has a resistance of 4.7kΩ, the third resistor R3 has a resistance of 10kΩ, the fourth resistor R4 has a resistance of 20kΩ, the sixth resistor R6 has a resistance of 100kΩ, the seventh resistor R7 has a resistance of 2kΩ, and the first capacitor C1 has a capacitance of 4.7nF. When adapting to an open-drain Hall sensor, the value of the fifth resistor R5 needs to be determined based on the value of the pull-up resistor of the Hall sensor's open-drain output. Generally, when the pull-up resistor is 8.2kΩ, the value of the fifth resistor R5 can be 10kΩ; when adapting to a push-pull Hall sensor, the value of the fifth resistor R5 can be 1kΩ. The first power supply VCC1 is consistent with the Hall sensor power supply and can be a +5V power supply.

[0057] The first field-effect transistor Qm can be a P-channel field-effect transistor, the first transistor Q1 and the third transistor Q3 can be PNP transistors, and the second transistor Q2 can be an NPN transistor. The first diode D1 can be a Zener diode; by setting the Zener voltage of the first diode D1, the first field-effect transistor Qm can shut down the circuit when the Hall signal voltage exceeds the Zener voltage, thus meeting the high-voltage protection requirements of the input port. Additionally, the third diode D3 plays a protective role in the circuit; its anode is connected to the third transistor Q3 to protect the emitter and base of Q3. The second diode D2 prevents reverse current flow, protecting the 5V power supply to the Hall sensor. The first capacitor C1 is a hardware filter to avoid switching noise interference from the Hall sensor during switching.

[0058] In one embodiment, reference Figures 1-6 , Figure 8 This is a circuit structure diagram of a signal reading unit provided in Embodiment 1 of the present invention. Figure 8 As shown, the signal reading unit 40 includes: a twenty-first resistor R21, a twenty-second resistor R22, a fifth capacitor C5, a sixth capacitor C6, and a fifth diode D5.

[0059] Specifically, the cathode of the fifth diode D5 is electrically connected to the failure detection unit 10, and the anode of the fifth diode D5 is electrically connected to one end of the twenty-first resistor R21, one end of the twenty-second resistor R22, and one end of the fifth capacitor C5; the other end of the twenty-first resistor R21 is connected to the second power supply VCC2; the other end of the twenty-second resistor R22 is electrically connected to one end of the sixth capacitor C6 and the MCU31; the other ends of the fifth capacitor C5 and the sixth capacitor C6 are both grounded.

[0060] In one embodiment, the resistance of the twenty-first resistor R21 is 1kΩ, the resistance of the twenty-second resistor R22 is 3.3kΩ, the capacitance of the fifth capacitor C5 is 1nF, and the capacitance of the sixth capacitor C6 is 10nF. The second power supply VCC2 can be a +3.3V power supply.

[0061] The Hall signal is at a 5V level, which is pulled up to 3.3V through the 21st resistor R21. The 5th capacitor C5, the 6th capacitor C6, and the 22nd resistor R22 form a second-order low-pass filter. The 5th diode D5 is used to protect the MCU 31 identification port.

[0062] In one embodiment, reference Figures 1-6 , Figure 9 This is a circuit structure diagram of an output module provided in Embodiment 1 of the present invention. Figure 9 As shown, the output module 21 includes: an eighth resistor R8, a ninth resistor R9, and a fourth transistor Q4.

[0063] Specifically, one end of the eighth resistor R8 is electrically connected to the failure detection unit 10, and the other end of the eighth resistor R8 is electrically connected to the base of the fourth transistor Q4; the emitter of the fourth transistor Q4 is connected to the second power supply VCC2, the collector of the fourth transistor Q4 is electrically connected to one end of the ninth resistor R9, and the other end of the ninth resistor R9 is grounded; the collector of the fourth transistor Q4 is electrically connected to the control unit 30 (outputting the FAULT signal), or electrically connected to the back-end judgment module 22 (outputting the FAULT-A / FAULT-B / FAULT-C signal).

[0064] In one embodiment, the eighth resistor R8 has a resistance of 10kΩ and the ninth resistor R9 has a resistance of 10kΩ. The fourth transistor Q4 can be a PNP transistor.

[0065] In one embodiment, reference Figures 1-6 Taking a failure detection unit of 3 as an example, Figure 10 This is a circuit structure diagram of a back-end judgment module provided in Embodiment 1 of the present invention. Figure 10 As shown, the back-end judgment module 22 includes: tenth resistor R10, eleventh resistor R11, twelfth resistor R12, thirteenth resistor R13, fourteenth resistor R14, fifteenth resistor R15, sixteenth resistor R16, comparator U1, second capacitor C2, and third capacitor C3.

[0066] Specifically, one end of the tenth resistor R10, one end of the eleventh resistor R11, and one end of the twelfth resistor R12 are electrically connected to the collector of the fourth transistor Q4 of each output module 21; the other ends of the tenth resistor R10, the eleventh resistor R11, and the twelfth resistor R12 are electrically connected to one end of the thirteenth resistor R13; the other end of the thirteenth resistor R13 is electrically connected to one end of the second capacitor C2 and the negative input terminal of comparator U1; the other end of the second capacitor C2 is grounded. The positive input terminal of comparator U1 is electrically connected to one end of the fourteenth resistor R14 and one end of the fifteenth resistor R15; the other end of the fourteenth resistor R14 is grounded, and the other end of the fifteenth resistor R15 is connected to the second power supply VCC2; the output terminal of comparator U1 is electrically connected to one end of the sixteenth resistor R16; the other end of the sixteenth resistor R16 is electrically connected to one end of the third capacitor C3 and the control unit 30 (outputting the FAULT signal); the other end of the third capacitor C3 is grounded.

[0067] In one embodiment, the resistance of the tenth resistor R10 is 1kΩ, the resistance of the eleventh resistor R11 is 1kΩ, the resistance of the twelfth resistor R12 is 1kΩ, the resistance of the thirteenth resistor R13 is 100kΩ, the resistance of the fourteenth resistor R14 is 10kΩ±1%, the resistance of the fifteenth resistor R15 is 2.7kΩ±1%, and the resistance of the sixteenth resistor R16 is 100kΩ. The capacitance of the second capacitor C2 is 1nF, and the capacitance of the third capacitor C3 is 1nF. At this time, the comparison voltage set by the fourteenth resistor R14 and the fifteenth resistor R15 is approximately 2.6V, meaning that the FAULT signal is triggered only when two or more Hall effect sensors fail. It is worth noting that the comparison point voltage should be set within a suitable range to ensure stable triggering of the output FAULT signal.

[0068] Taking an open-drain Hall sensor as an example, the open-circuit anomaly of the Hall signal involved in this invention refers to the situation where the signal received by the MCU31 is in a high-impedance state. When the Hall signal is low, the second transistor Q2 is cut off, and the third transistor Q3 is turned on. Current loop 1 is from the first power supply through the cathode of the second diode D2, the source of the first field-effect transistor Qm, to the GND of the Hall sensor; current loop 2 is from the first power supply through the collector of the third transistor Q3, resistor R6, the source of the first field-effect transistor Qm, to the GND of the Hall sensor; current loop 3 is from the first power supply through the base of the third transistor Q3, the cathode of the third diode D3, resistor R6, the source of the first field-effect transistor Qm, to the GND of the Hall sensor. At this time, the cathode voltage of the fourth diode D4 is approximately 4.3V, the fourth transistor Q4 is not turned on, and the FAULT-A / FAULT-B / FAULT-C signals are low.

[0069] When the Hall signal is high, the second transistor Q2 is turned on, and the third transistor Q3 is turned off. Current loop 1 runs from the power supply of the Hall sensor through the internal pull-up resistor, the first field-effect transistor Qm, the fifth resistor R5, the base of the second transistor Q2, to ground. Current loop 2 runs from the first power supply through the cathode of the second diode D2, the fifth resistor R5, the base of the second transistor Q2, to ground. Current loop 3 runs from the first power supply through the seventh resistor R7, the emitter of the second transistor Q2, to ground. At this time, the cathode voltage of the fourth diode D4 is approximately 3.3V, the fourth transistor Q4 is not turned on, and the FAULT-A / FAULT-B / FAULT-C signals are low.

[0070] When an open-circuit abnormality occurs in the Hall signal, only the second transistor Q2 is turned on. Current loop 1 runs from the first power supply through the cathode of the second diode D2, the fifth resistor R5, the base of the second transistor Q2, and to ground; current loop 2 runs from the first power supply through the seventh resistor R7, the emitter of the second transistor Q2, and to ground. At this time, the voltage of the fourth diode D4 is approximately 2.5V, the fourth transistor Q4 is turned on, and the FAULT-A / FAULT-B / FAULT-C signals are at a high level.

[0071] Therefore, when the Hall failure detection circuit includes only one failure detection unit 10, the final output FAULT signal is a high-level signal, which is considered to be a failure signal output; while when the Hall failure detection circuit includes at least two failure detection units 10, the FAULT-A / FAULT-B / FAULT-C signals are high-level, and after... Figure 10 The back-end judgment module 22 processes the signal, and the final output FAULT signal is a low-level signal, which means that a failure signal has been output.

[0072] In one embodiment, reference Figures 1-6 , Figure 11 This is a circuit structure diagram of a drive protection module provided in Embodiment 1 of the present invention. Figure 11 As shown, the drive protection module 32 includes: a seventeenth resistor R17, an eighteenth resistor R18, a nineteenth resistor R19, a twentieth resistor R20, a fourth capacitor C4, a fifth transistor Q5, and a second field-effect transistor Qn.

[0073] Specifically, one end of the seventeenth resistor R17 is electrically connected to MCU 31, and the other end of the seventeenth resistor R17 is electrically connected to one end of the eighteenth resistor R18, one end of the fourth capacitor C4, and the base of the fifth transistor Q5; the other end of the eighteenth resistor R18, the other end of the fourth capacitor C4, and the emitter of the fifth transistor Q5 are all grounded; the collector of the fifth transistor Q5 is electrically connected to one end of the nineteenth resistor R19, and the other end of the nineteenth resistor R19 is electrically connected to one end of the twentieth resistor R20 and the gate of the second field-effect transistor Qn; the other end of the twentieth resistor R20 and the source of the second field-effect transistor Qn are connected to the third power supply VCC3; the drain of the second field-effect transistor Qn is electrically connected to the driver chip 33.

[0074] In one embodiment, the seventeenth resistor R17 has a resistance of 10kΩ, the eighteenth resistor R18 has a resistance of 100kΩ, the nineteenth resistor R19 has a resistance of 20kΩ, the twentieth resistor R20 has a resistance of 27kΩ, and the fourth capacitor C4 has a capacitance of 100nF.

[0075] The function of transistor Q5 is to control the power supply of driver chip 33. When MCU 31 receives a failure signal, it can generate and send a protection signal to driver protection module 32 (i.e., Figure 11 The FAULT-PROTECT signal is low. When the FAULT-PROTECT signal is low, the fifth transistor Q5 is cut off and the second field-effect transistor Qn is cut off, thus cutting off the drive power supply in time.

[0076] Figure 12 This is a schematic diagram of the Hall failure detection test results under static conditions provided in Embodiment 1 of the present invention. Figure 12 As shown, taking the static Hall failure detection test on a motor with an open-drain Hall sensor as an example, Figure 12 The horizontal axis represents time, and the vertical axis represents voltage. The blue line represents the Hall signal, and the green line represents the FAULT signal. One of the Hall signals is open-circuited to control the motor via an external relay. In a static state, the Hall signal is high, and the FAULT signal is low, indicating no operation. When the relay is disconnected, the Hall signal becomes open-circuited, the FAULT signal is pulled high, and the motor is controlled by... Figure 12 It can be seen that the time from Hall failure to FAULT response is only on the order of microseconds.

[0077] Figure 13 This is a schematic diagram of the Hall failure detection test results under dynamic conditions provided in Embodiment 1 of the present invention. Figure 13 As shown, taking the dynamic Hall failure detection test on a motor with an open-drain Hall sensor as an example, Figure 13 The horizontal axis represents time, the vertical axis represents voltage, the blue line represents the Hall signal, the red line represents the read signal, and the green line represents the FAULT signal. From... Figure 13 As can be seen, the Hall signal and the read signal have opposite logic. During the operation of the motor, the Hall signal of this phase changes continuously. The FAULT signal is stable at the signal transition edge. When the Hall signal is open-circuited, the FAULT signal can respond in time.

[0078] The technical solution of this invention, through the design of a Hall failure detection circuit, includes a failure detection unit, a signal output unit, and a control unit. One failure detection unit receives one Hall signal from the motor and is used to detect whether an open-circuit anomaly occurs in the received Hall signal. The signal output unit sends a failure signal to the control unit when the failure detection unit detects an open-circuit anomaly in the received Hall signal. The control unit performs hardware and / or software protection on the motor based on the failure signal. Compared with existing solutions based on software algorithms for Hall failure detection, firstly, this invention achieves rapid detection of open-circuit anomalies in Hall signals through hardware circuitry, eliminating the need for software algorithm processing and relying on historical data, thus saving system resources and offering cost advantages. Secondly, using hardware circuitry to detect Hall signals enables microsecond (μs) level response, improving the failure response rate. Thirdly, after the signal output unit sends a failure signal to the control unit, the control unit can also perform hardware and / or software protection on the motor, further enhancing vehicle safety. Moreover, the Hall failure detection circuit provided by this invention is compatible with both open-drain and push-pull Hall sensors, exhibiting strong applicability, reliability, and integration.

[0079] Example 2

[0080] This invention also provides a controller, including the Hall failure detection circuit of any of the above embodiments.

[0081] In one embodiment, the controller may be located in an electric vehicle.

[0082] This invention also provides an electric vehicle, including a controller according to any of the above embodiments. The controller includes a Hall effect failure detection circuit according to any of the above embodiments.

[0083] In one embodiment, the electric vehicle may further include a motor, and the Hall signal output from the motor is input to the Hall failure detection circuit of the controller for detection. The driver chip drives the motor to operate by driving the inverter bridge.

[0084] In one embodiment, the electric vehicle can be an electric two-wheeler or an electric three-wheeler.

[0085] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A Hall effect failure detection circuit, characterized in that, include: Failure detection unit, signal output unit, and control unit; among which, A failure detection unit is connected to one Hall signal of the motor; the failure detection unit is used to detect whether the connected Hall signal has an open circuit abnormality. The signal output unit is electrically connected to the failure detection unit and the control unit respectively, and is used to send a failure signal to the control unit when the failure detection unit detects an open circuit abnormality in the accessed Hall signal; The control unit is used to provide hardware and / or software protection for the motor based on the failure signal.

2. The Hall failure detection circuit according to claim 1, characterized in that, The control unit includes: a microcontroller unit (MCU), a drive protection module, and a drive chip; wherein... The MCU is electrically connected to the signal output unit and is used to provide shutdown protection for the motor drive based on the failure signal. The drive protection module is electrically connected to the MCU and the drive chip respectively, and is used to stop supplying power to the drive chip according to the protection signal sent by the MCU, so that the drive chip no longer drives the back-end inverter circuit to work, thereby stopping the motor drive.

3. The Hall failure detection circuit according to claim 2, characterized in that, The number of failure detection units is less than or equal to the total number of Hall signals output by the motor; When the MCU does not have Hall self-repair function, or when the number of failure detection units is 1, the signal output unit includes only one output module, and each failure detection unit is electrically connected to the output module; the output module is used to send a failure signal to the control unit when at least one failure detection unit detects an open circuit abnormality in the accessed Hall signal. When the MCU has Hall self-healing function and the number of failure detection units is greater than or equal to 2, the signal output unit includes at least two output modules and a back-end judgment module. Each output module is electrically connected to a failure detection unit, and each output module is electrically connected to the back-end judgment module. The output module is used to send an abnormal signal to the back-end judgment module when the corresponding failure detection unit detects an open circuit abnormality in the accessed Hall signal. The back-end judgment module is used to determine the number of abnormal signals and send a failure signal to the control unit when the number of abnormal signals is greater than or equal to 2.

4. The Hall failure detection circuit according to claim 2, characterized in that, Also includes: Signal reading unit; wherein, One signal reading unit is electrically connected to one failure detection unit, and all signal reading units are electrically connected to the MCU. When the corresponding failure detection unit detects that the accessed Hall signal does not have an open circuit abnormality, the read signal output by the signal reading unit to the MCU is logically opposite to the Hall signal accessed by the corresponding failure detection unit.

5. The Hall failure detection circuit according to claim 1, characterized in that, The failure detection unit includes: a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, a first capacitor, a first diode, a second diode, a third diode, a fourth diode, a first field-effect transistor, a first transistor, a second transistor, and a third transistor; One end of the first resistor, the source of the first field-effect transistor, and the emitter of the first transistor are all connected to one Hall signal of the motor. The base of the first transistor is electrically connected to one end of the second resistor, and the collector of the first transistor is electrically connected to the gate of the first field-effect transistor and one end of the third resistor. The other end of the first resistor and the other end of the second resistor are both electrically connected to the cathode of the first diode, and the other end of the third resistor and the anode of the first diode are both grounded; The drain of the first field-effect transistor is electrically connected to the cathode of the second diode, one end of the fifth resistor, and one end of the sixth resistor; one end of the fourth resistor and one end of the seventh resistor are connected to the first power supply. The other end of the fourth resistor is electrically connected to the anode of the second diode; the other end of the fifth resistor is electrically connected to the base of the second transistor; the other end of the seventh resistor is electrically connected to the collector of the second transistor and the emitter of the third transistor; the emitter of the second transistor is grounded. The other end of the sixth resistor is electrically connected to the cathode of the third diode, one end of the first capacitor, the cathode of the fourth diode, and the collector of the third transistor; the other end of the first capacitor is grounded; the anode of the third diode is electrically connected to the base of the third transistor; and the anode of the fourth diode is electrically connected to the signal output unit.

6. The Hall failure detection circuit according to claim 3, characterized in that, The output module includes: an eighth resistor, a ninth resistor, and a fourth transistor; One end of the eighth resistor is electrically connected to the failure detection unit, and the other end of the eighth resistor is electrically connected to the base of the fourth transistor. The emitter of the fourth transistor is connected to the second power supply, the collector of the fourth transistor is electrically connected to one end of the ninth resistor, and the other end of the ninth resistor is grounded. The collector of the fourth transistor is electrically connected to the control unit or the back-end judgment module.

7. The Hall failure detection circuit according to claim 6, characterized in that, When the number of failure detection units is 3, the back-end judgment module includes: a tenth resistor, an eleventh resistor, a twelfth resistor, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, a sixteenth resistor, a comparator, a second capacitor, and a third capacitor; One end of the tenth resistor, one end of the eleventh resistor, and one end of the twelfth resistor are respectively electrically connected to the collector of the fourth transistor of each output module; The other ends of the tenth resistor, the eleventh resistor, and the twelfth resistor are electrically connected to one end of the thirteenth resistor; the other end of the thirteenth resistor is electrically connected to one end of the second capacitor and the negative input terminal of the comparator; the other end of the second capacitor is grounded. The positive input terminal of the comparator is electrically connected to one end of the fourteenth resistor and one end of the fifteenth resistor; the other end of the fourteenth resistor is grounded, and the other end of the fifteenth resistor is connected to a second power supply; the output terminal of the comparator is electrically connected to one end of the sixteenth resistor; the other end of the sixteenth resistor is electrically connected to one end of the third capacitor and the control unit; the other end of the third capacitor is grounded.

8. The Hall failure detection circuit according to claim 2, characterized in that, The drive protection module includes: a seventeenth resistor, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, a fourth capacitor, a fifth transistor, and a second field-effect transistor; One end of the seventeenth resistor is electrically connected to the MCU, and the other end of the seventeenth resistor is electrically connected to one end of the eighteenth resistor, one end of the fourth capacitor, and the base of the fifth transistor; the other end of the eighteenth resistor, the other end of the fourth capacitor, and the emitter of the fifth transistor are all grounded; The collector of the fifth transistor is electrically connected to one end of the nineteenth resistor, and the other end of the nineteenth resistor is electrically connected to one end of the twentieth resistor and the gate of the second field-effect transistor; the other end of the twentieth resistor and the source of the second field-effect transistor are connected to a third power supply; the drain of the second field-effect transistor is electrically connected to the driver chip.

9. The Hall failure detection circuit according to claim 4, characterized in that, The signal reading unit includes: a twenty-first resistor, a twenty-second resistor, a fifth capacitor, a sixth capacitor, and a fifth diode; The cathode of the fifth diode is electrically connected to the failure detection unit, and the anode of the fifth diode is electrically connected to one end of the twenty-first resistor, one end of the twenty-second resistor, and one end of the fifth capacitor. The other end of the 21st resistor is connected to the second power supply; the other end of the 22nd resistor is electrically connected to one end of the 6th capacitor and the MCU; the other ends of the 5th capacitor and the 6th capacitor are both grounded.

10. A controller, characterized in that, Includes the Hall failure detection circuit as described in any one of claims 1-9.

11. An electric vehicle, characterized in that, Includes the controller as described in claim 10.

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